TW361630U - Improved structure for the testing point of PCB - Google Patents

Improved structure for the testing point of PCB

Info

Publication number
TW361630U
TW361630U TW087204254U TW87204254U TW361630U TW 361630 U TW361630 U TW 361630U TW 087204254 U TW087204254 U TW 087204254U TW 87204254 U TW87204254 U TW 87204254U TW 361630 U TW361630 U TW 361630U
Authority
TW
Taiwan
Prior art keywords
pcb
improved structure
testing point
testing
point
Prior art date
Application number
TW087204254U
Other languages
Chinese (zh)
Inventor
yu-qiang Zheng
Original Assignee
Mitac Int Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitac Int Corp filed Critical Mitac Int Corp
Priority to TW087204254U priority Critical patent/TW361630U/en
Publication of TW361630U publication Critical patent/TW361630U/en

Links

TW087204254U 1998-03-23 1998-03-23 Improved structure for the testing point of PCB TW361630U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW087204254U TW361630U (en) 1998-03-23 1998-03-23 Improved structure for the testing point of PCB

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW087204254U TW361630U (en) 1998-03-23 1998-03-23 Improved structure for the testing point of PCB

Publications (1)

Publication Number Publication Date
TW361630U true TW361630U (en) 1999-06-11

Family

ID=54645033

Family Applications (1)

Application Number Title Priority Date Filing Date
TW087204254U TW361630U (en) 1998-03-23 1998-03-23 Improved structure for the testing point of PCB

Country Status (1)

Country Link
TW (1) TW361630U (en)

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