TW353211B - Probe and method for inspection of electronic circuit board - Google Patents

Probe and method for inspection of electronic circuit board

Info

Publication number
TW353211B
TW353211B TW086118389A TW86118389A TW353211B TW 353211 B TW353211 B TW 353211B TW 086118389 A TW086118389 A TW 086118389A TW 86118389 A TW86118389 A TW 86118389A TW 353211 B TW353211 B TW 353211B
Authority
TW
Taiwan
Prior art keywords
electrodes
base plate
group
inspection
electronic circuit
Prior art date
Application number
TW086118389A
Other languages
English (en)
Inventor
Koichi Yamazaki
Hiroto Komatsu
Original Assignee
Shinetsu Polymer Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP08169338A external-priority patent/JP3128199B2/ja
Priority claimed from JP08258473A external-priority patent/JP3128200B2/ja
Application filed by Shinetsu Polymer Co Ltd filed Critical Shinetsu Polymer Co Ltd
Application granted granted Critical
Publication of TW353211B publication Critical patent/TW353211B/zh

Links

Landscapes

  • Measuring Leads Or Probes (AREA)
TW086118389A 1996-06-28 1997-12-06 Probe and method for inspection of electronic circuit board TW353211B (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP08169338A JP3128199B2 (ja) 1996-06-28 1996-06-28 検査用プローブ
JP08258473A JP3128200B2 (ja) 1996-09-30 1996-09-30 電子回路基板の検査方法

Publications (1)

Publication Number Publication Date
TW353211B true TW353211B (en) 1999-02-21

Family

ID=57940117

Family Applications (1)

Application Number Title Priority Date Filing Date
TW086118389A TW353211B (en) 1996-06-28 1997-12-06 Probe and method for inspection of electronic circuit board

Country Status (1)

Country Link
TW (1) TW353211B (zh)

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees