TW351796B - Photo identification apparatus by employing light cutting method - Google Patents

Photo identification apparatus by employing light cutting method

Info

Publication number
TW351796B
TW351796B TW085115616A TW85115616A TW351796B TW 351796 B TW351796 B TW 351796B TW 085115616 A TW085115616 A TW 085115616A TW 85115616 A TW85115616 A TW 85115616A TW 351796 B TW351796 B TW 351796B
Authority
TW
Taiwan
Prior art keywords
photo
linear light
shutter
light
information
Prior art date
Application number
TW085115616A
Other languages
English (en)
Inventor
Toshiyuki Ooenoki
Toshiro Ootani
Original Assignee
Komatsu Mfg Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Komatsu Mfg Co Ltd filed Critical Komatsu Mfg Co Ltd
Application granted granted Critical
Publication of TW351796B publication Critical patent/TW351796B/zh

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/24Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/02Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/026Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by measuring distance between sensor and object
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/50Depth or shape recovery
    • G06T7/521Depth or shape recovery from laser ranging, e.g. using interferometry; from the projection of structured light

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Optics & Photonics (AREA)
  • Theoretical Computer Science (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Image Input (AREA)
  • Image Processing (AREA)
  • Image Analysis (AREA)
TW085115616A 1996-02-20 1996-12-18 Photo identification apparatus by employing light cutting method TW351796B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP03238796A JP3494518B2 (ja) 1996-02-20 1996-02-20 光切断法による画像認識装置

Publications (1)

Publication Number Publication Date
TW351796B true TW351796B (en) 1999-02-01

Family

ID=12357552

Family Applications (1)

Application Number Title Priority Date Filing Date
TW085115616A TW351796B (en) 1996-02-20 1996-12-18 Photo identification apparatus by employing light cutting method

Country Status (7)

Country Link
US (1) US6298152B1 (zh)
EP (1) EP0882946A4 (zh)
JP (1) JP3494518B2 (zh)
KR (1) KR970062968A (zh)
CA (1) CA2245844A1 (zh)
TW (1) TW351796B (zh)
WO (1) WO1997031240A1 (zh)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20030123707A1 (en) * 2001-12-31 2003-07-03 Park Seujeung P. Imaging-based distance measurement and three-dimensional profiling system
US7643966B2 (en) * 2004-03-10 2010-01-05 Leica Geosystems Ag Identification of 3D surface points using context-based hypothesis testing
DE102008043148A1 (de) * 2008-10-24 2010-04-29 Robert Bosch Gmbh Steuereinrichtung, Aufnahmeeinrichtung und Verfahren zur Projektion und Bildaufnahme
JP6758062B2 (ja) * 2016-03-22 2020-09-23 株式会社東洋精機製作所 試験片の伸び追跡装置および引張試験装置
CN113375559B (zh) * 2021-07-06 2022-09-09 中国工程物理研究院机械制造工艺研究所 基于多源传感的在线测量定心装置、系统及方法

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3774162A (en) * 1972-03-01 1973-11-20 Magnaflux Corp Laser scan testing system having pattern recognition means
DE2711660C3 (de) * 1977-03-17 1981-06-04 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V., 8000 München Optisches Verfahren zur Schweißbahnverfolgung
JPS58170220A (ja) * 1982-03-31 1983-10-06 Anritsu Corp 光電式検出センサ
JPS6124616U (ja) * 1984-07-20 1986-02-14 株式会社山武 光学式ロ−タリ−エンコ−ダ
US5949056A (en) * 1986-09-10 1999-09-07 Norand Corporation Method and apparatus for optically reading an information pattern
DE3850840T2 (de) * 1987-10-14 1995-02-09 Hitachi Ltd Vorrichtung und Verfahren zur Fehlerinspektion in befestigten Bauteilen, unter Verwendung eines Lichtschlitzes.
EP0462289B1 (en) * 1989-12-28 1994-11-02 Kabushiki Kaisha Toyota Chuo Kenkyusho Apparatus for measuring three-dimensional coordinates
JPH0526638A (ja) * 1991-07-23 1993-02-02 Mitsubishi Heavy Ind Ltd 三次元形状認識装置
US5270780A (en) * 1991-09-13 1993-12-14 Science Applications International Corporation Dual detector lidar system and method
US5756981A (en) * 1992-02-27 1998-05-26 Symbol Technologies, Inc. Optical scanner for reading and decoding one- and-two-dimensional symbologies at variable depths of field including memory efficient high speed image processing means and high accuracy image analysis means

Also Published As

Publication number Publication date
EP0882946A4 (en) 2000-03-22
WO1997031240A1 (fr) 1997-08-28
US6298152B1 (en) 2001-10-02
EP0882946A1 (en) 1998-12-09
CA2245844A1 (en) 1997-08-28
JP3494518B2 (ja) 2004-02-09
JPH09229641A (ja) 1997-09-05
KR970062968A (ko) 1997-09-12

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