TW329041B - Super density ROM - Google Patents

Super density ROM

Info

Publication number
TW329041B
TW329041B TW086100883A TW86100883A TW329041B TW 329041 B TW329041 B TW 329041B TW 086100883 A TW086100883 A TW 086100883A TW 86100883 A TW86100883 A TW 86100883A TW 329041 B TW329041 B TW 329041B
Authority
TW
Taiwan
Prior art keywords
type
rom
memory cell
super density
lines
Prior art date
Application number
TW086100883A
Other languages
English (en)
Inventor
Rong-Maw Uen
Jyh-Wenn Jou
Original Assignee
United Microelectronics Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by United Microelectronics Corp filed Critical United Microelectronics Corp
Priority to TW086100883A priority Critical patent/TW329041B/zh
Priority to US08/851,545 priority patent/US5825069A/en
Priority to US09/013,468 priority patent/US5904526A/en
Application granted granted Critical
Publication of TW329041B publication Critical patent/TW329041B/zh

Links

Classifications

    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10B—ELECTRONIC MEMORY DEVICES
    • H10B20/00—Read-only memory [ROM] devices
    • H10B20/10—ROM devices comprising bipolar components
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S257/00—Active solid-state devices, e.g. transistors, solid-state diodes
    • Y10S257/91—Diode arrays, e.g. diode read-only memory array

Landscapes

  • Semiconductor Memories (AREA)
  • Read Only Memory (AREA)
TW086100883A 1997-01-27 1997-01-27 Super density ROM TW329041B (en)

Priority Applications (3)

Application Number Priority Date Filing Date Title
TW086100883A TW329041B (en) 1997-01-27 1997-01-27 Super density ROM
US08/851,545 US5825069A (en) 1997-01-27 1997-05-05 High-density semiconductor read-only memory device
US09/013,468 US5904526A (en) 1997-01-27 1998-01-26 Method of fabricating high density semiconductor read-only memory device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW086100883A TW329041B (en) 1997-01-27 1997-01-27 Super density ROM

Publications (1)

Publication Number Publication Date
TW329041B true TW329041B (en) 1998-04-01

Family

ID=21626347

Family Applications (1)

Application Number Title Priority Date Filing Date
TW086100883A TW329041B (en) 1997-01-27 1997-01-27 Super density ROM

Country Status (2)

Country Link
US (2) US5825069A (zh)
TW (1) TW329041B (zh)

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US6143610A (en) * 1997-01-06 2000-11-07 United Microelectronics Corp. Method for fabricating high-density semiconductor read-only memory device
TW377496B (en) * 1997-01-15 1999-12-21 United Microelectronics Corp Method of manufacturing read-only memory structure
KR19980084469A (ko) * 1997-05-23 1998-12-05 문정환 마스크 롬 및 그의 제조방법
US6316807B1 (en) * 1997-12-05 2001-11-13 Naoto Fujishima Low on-resistance trench lateral MISFET with better switching characteristics and method for manufacturing same
TW406419B (en) * 1998-01-15 2000-09-21 Siemens Ag Memory-cells arrangement and its production method
US5998267A (en) * 1998-09-18 1999-12-07 National Semiconductor Corporation Process to manufacture high density ULSI ROM array
US6235592B1 (en) * 1999-09-21 2001-05-22 Mosel Vitelic Inc. Type of high density vertical Mask ROM cell
KR100487523B1 (ko) * 2002-04-15 2005-05-03 삼성전자주식회사 부유트랩형 비휘발성 메모리 소자 및 그 제조방법
US7205614B2 (en) * 2004-01-06 2007-04-17 Faraday Technology Corp. High density ROM cell
US9123572B2 (en) 2004-05-06 2015-09-01 Sidense Corporation Anti-fuse memory cell
KR101144218B1 (ko) * 2004-05-06 2012-05-10 싸이던스 코포레이션 분리 채널 안티퓨즈 어레이 구조
US8735297B2 (en) 2004-05-06 2014-05-27 Sidense Corporation Reverse optical proximity correction method
US7755162B2 (en) * 2004-05-06 2010-07-13 Sidense Corp. Anti-fuse memory cell
US7671441B2 (en) * 2005-04-05 2010-03-02 International Rectifier Corporation Trench MOSFET with sidewall spacer gates
US7821080B2 (en) * 2005-07-15 2010-10-26 Guobiao Zhang N-ary three-dimensional mask-programmable read-only memory
US7301828B2 (en) * 2006-02-27 2007-11-27 Agere Systems Inc. Decoding techniques for read-only memory
US7324364B2 (en) * 2006-02-27 2008-01-29 Agere Systems Inc. Layout techniques for memory circuitry
US7785965B2 (en) * 2006-09-08 2010-08-31 Spansion Llc Dual storage node memory devices and methods for fabricating the same
US8564070B2 (en) 2010-05-24 2013-10-22 Chengdu Haicun Ip Technology Llc Large bit-per-cell three-dimensional mask-programmable read-only memory
US8890300B2 (en) 2011-09-01 2014-11-18 Chengdu Haicun Ip Technology Llc Discrete three-dimensional memory comprising off-die read/write-voltage generator
US9305604B2 (en) 2011-09-01 2016-04-05 HangZhou HaiCun Information Technology Co., Ltd. Discrete three-dimensional vertical memory comprising off-die address/data-translator
US9305605B2 (en) 2011-09-01 2016-04-05 Chengdu Haicun Ip Technology Llc Discrete three-dimensional vertical memory
US9117493B2 (en) 2011-09-01 2015-08-25 Chengdu Haicun Ip Technology Llc Discrete three-dimensional memory comprising off-die address/data translator
US9396764B2 (en) 2011-09-01 2016-07-19 HangZhou HaiCun Information Technology Co., Ltd. Discrete three-dimensional memory
US9024425B2 (en) 2011-09-01 2015-05-05 HangZhou HaiCun Information Technology Co., Ltd. Three-dimensional memory comprising an integrated intermediate-circuit die
US9093129B2 (en) 2011-09-01 2015-07-28 Chengdu Haicun Ip Technology Llc Discrete three-dimensional memory comprising dice with different BEOL structures
US9558842B2 (en) 2011-09-01 2017-01-31 HangZhou HaiCun Information Technology Co., Ltd. Discrete three-dimensional one-time-programmable memory
US8699257B2 (en) 2011-09-01 2014-04-15 HangZhou HaiCun Information Technology Co., Ltd. Three-dimensional writable printed memory
US9508395B2 (en) 2011-09-01 2016-11-29 HangZhou HaiCun Information Technology Co., Ltd. Three-dimensional one-time-programmable memory comprising off-die read/write-voltage generator
US8921991B2 (en) 2011-09-01 2014-12-30 Chengdu Haicun Ip Technology Llc Discrete three-dimensional memory
US9123393B2 (en) 2011-09-01 2015-09-01 HangZhou KiCun nformation Technology Co. Ltd. Discrete three-dimensional vertical memory
US9299390B2 (en) 2011-09-01 2016-03-29 HangZhou HaiCun Informationa Technology Co., Ltd. Discrete three-dimensional vertical memory comprising off-die voltage generator
US9559082B2 (en) 2011-09-01 2017-01-31 HangZhou HaiCun Information Technology Co., Ltd. Three-dimensional vertical memory comprising dice with different interconnect levels
US9666300B2 (en) 2011-09-01 2017-05-30 XiaMen HaiCun IP Technology LLC Three-dimensional one-time-programmable memory comprising off-die address/data-translator
US9190412B2 (en) 2011-09-01 2015-11-17 HangZhou HaiCun Information Technology Co., Ltd. Three-dimensional offset-printed memory
US9001555B2 (en) 2012-03-30 2015-04-07 Chengdu Haicun Ip Technology Llc Small-grain three-dimensional memory
US9293509B2 (en) 2013-03-20 2016-03-22 HangZhou HaiCun Information Technology Co., Ltd. Small-grain three-dimensional memory
CN104978990B (zh) 2014-04-14 2017-11-10 成都海存艾匹科技有限公司 紧凑型三维存储器
US10304553B2 (en) 2014-04-14 2019-05-28 HangZhou HaiCun Information Technology Co., Ltd. Compact three-dimensional memory with an above-substrate decoding stage
US10199432B2 (en) 2014-04-14 2019-02-05 HangZhou HaiCun Information Technology Co., Ltd. Manufacturing methods of MOSFET-type compact three-dimensional memory
US10446193B2 (en) 2014-04-14 2019-10-15 HangZhou HaiCun Information Technology Co., Ltd. Mixed three-dimensional memory
US10304495B2 (en) 2014-04-14 2019-05-28 Chengdu Haicun Ip Technology Llc Compact three-dimensional memory with semi-conductive address line portion
US10211258B2 (en) 2014-04-14 2019-02-19 HangZhou HaiCun Information Technology Co., Ltd. Manufacturing methods of JFET-type compact three-dimensional memory
US10079239B2 (en) 2014-04-14 2018-09-18 HangZhou HaiCun Information Technology Co., Ltd. Compact three-dimensional mask-programmed read-only memory
CN104979352A (zh) 2014-04-14 2015-10-14 成都海存艾匹科技有限公司 混合型三维印录存储器
CN107301878B (zh) 2016-04-14 2020-09-25 成都海存艾匹科技有限公司 多位元三维一次编程存储器
US11170863B2 (en) 2016-04-14 2021-11-09 Southern University Of Science And Technology Multi-bit-per-cell three-dimensional resistive random-access memory (3D-RRAM)
US10559574B2 (en) 2016-04-16 2020-02-11 HangZhou HaiCun Information Technology Co., Ltd. Three-dimensional vertical one-time-programmable memory comprising Schottky diodes
CN107316869A (zh) 2016-04-16 2017-11-03 成都海存艾匹科技有限公司 三维纵向一次编程存储器
US10490562B2 (en) 2016-04-16 2019-11-26 HangZhou HaiCun Information Technology Co., Ltd. Three-dimensional vertical one-time-programmable memory comprising multiple antifuse sub-layers
US10566388B2 (en) 2018-05-27 2020-02-18 HangZhou HaiCun Information Technology Co., Ltd. Three-dimensional vertical memory
US12063794B2 (en) 2020-11-24 2024-08-13 Southern University Of Science And Technology High-density three-dimensional vertical memory

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JPH0613627A (ja) * 1991-10-08 1994-01-21 Semiconductor Energy Lab Co Ltd 半導体装置およびその作製方法
US5453637A (en) * 1994-05-18 1995-09-26 United Microelectronics Corp. Read-only memory cell configuration with steep trenches
DE4437581C2 (de) * 1994-10-20 1996-08-08 Siemens Ag Verfahren zur Herstellung einer Festwertspeicherzellenanordnung mit vertikalen MOS-Transistoren
US5846865A (en) * 1996-11-12 1998-12-08 United Microelectronics Corp. Method of fabricating flat-cell mask read-only memory (ROM) devices

Also Published As

Publication number Publication date
US5825069A (en) 1998-10-20
US5904526A (en) 1999-05-18

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