TW318959B - - Google Patents

Download PDF

Info

Publication number
TW318959B
TW318959B TW85110437A TW85110437A TW318959B TW 318959 B TW318959 B TW 318959B TW 85110437 A TW85110437 A TW 85110437A TW 85110437 A TW85110437 A TW 85110437A TW 318959 B TW318959 B TW 318959B
Authority
TW
Taiwan
Prior art keywords
signal
voltage
differential
data line
patent application
Prior art date
Application number
TW85110437A
Other languages
English (en)
Chinese (zh)
Original Assignee
Texas Instruments Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Texas Instruments Inc filed Critical Texas Instruments Inc
Application granted granted Critical
Publication of TW318959B publication Critical patent/TW318959B/zh

Links

Landscapes

  • Read Only Memory (AREA)
TW85110437A 1995-07-25 1996-08-28 TW318959B (enExample)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US319595P 1995-07-25 1995-07-25

Publications (1)

Publication Number Publication Date
TW318959B true TW318959B (enExample) 1997-11-01

Family

ID=51566945

Family Applications (1)

Application Number Title Priority Date Filing Date
TW85110437A TW318959B (enExample) 1995-07-25 1996-08-28

Country Status (1)

Country Link
TW (1) TW318959B (enExample)

Similar Documents

Publication Publication Date Title
TW385441B (en) Synchronous semiconductor memory device with less power consumed in a standby mode
TW302520B (enExample)
JPH02306492A (ja) ダイナミック・ランダム・アクセス・メモリ
JPH02201797A (ja) 半導体メモリ装置
CN1685438B (zh) 对dram感测操作中阈值电压进行偏置的装置及方法
JP2002157876A (ja) 半導体装置
JPH0713857B2 (ja) 半導体記憶装置
TW409461B (en) Semiconductor memory device
TW396344B (en) Memory device using direct access mode test and method of testing the same
US6347059B2 (en) Integrated memory having a bit line reference voltage, and a method for producing the bit line reference voltage
TW508902B (en) A delay circuit with voltage compensation
TW318959B (enExample)
JPS63288497A (ja) 半導体メモリ装置のレベルシフト回路
US6426906B1 (en) Read-out circuit
KR950001862A (ko) 반도체 집적 회로 장치
US7983080B2 (en) Non-body contacted sense amplifier with negligible history effect
US7539064B2 (en) Precharge circuit of semiconductor memory apparatus
JPH11238383A (ja) 電荷再活用センスアンプ
TWI287793B (en) Increasing a refresh period in a semiconductor memory device
TW421839B (en) Integrated circuit devices with mode-selective external signal routing capabilities and methods of operation therefor
US6188601B1 (en) Ferroelectric memory device having single bit line coupled to at least one memory cell
US5818774A (en) Apparatus and method for a data path implemented using non-differential, current mode techniques
TW439066B (en) Circuit apparatus for evaluating the data content of memory cells
TW384478B (en) Semiconductor memory device having I/O positioning circuit
KR100529394B1 (ko) 테스트 구현을 위한 반도체메모리장치의 데이터 압축 회로

Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees