TW289090B - - Google Patents
Info
- Publication number
- TW289090B TW289090B TW84107841A TW84107841A TW289090B TW 289090 B TW289090 B TW 289090B TW 84107841 A TW84107841 A TW 84107841A TW 84107841 A TW84107841 A TW 84107841A TW 289090 B TW289090 B TW 289090B
- Authority
- TW
- Taiwan
Links
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP22097794A JP3502450B2 (ja) | 1994-08-22 | 1994-08-22 | パターン発生器 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| TW289090B true TW289090B (zh) | 1996-10-21 |
Family
ID=16759540
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW84107841A TW289090B (zh) | 1994-08-22 | 1995-07-28 |
Country Status (2)
| Country | Link |
|---|---|
| JP (1) | JP3502450B2 (zh) |
| TW (1) | TW289090B (zh) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3547059B2 (ja) * | 1995-06-30 | 2004-07-28 | 株式会社アドバンテスト | 半導体メモリ試験方法およびこの方法を実施する装置 |
| US6457148B1 (en) | 1998-02-09 | 2002-09-24 | Advantest Corporation | Apparatus for testing semiconductor device |
| DE60200289T2 (de) * | 2002-09-24 | 2005-02-17 | Agilent Technologies Inc., A Delaware Corp., Palo Alto | Übergangsanpassung |
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1994
- 1994-08-22 JP JP22097794A patent/JP3502450B2/ja not_active Expired - Fee Related
-
1995
- 1995-07-28 TW TW84107841A patent/TW289090B/zh active
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0862304A (ja) | 1996-03-08 |
| JP3502450B2 (ja) | 2004-03-02 |