TW288201B - Process of fabricating high-density memory integrated circuit - Google Patents

Process of fabricating high-density memory integrated circuit

Info

Publication number
TW288201B
TW288201B TW84111078A TW84111078A TW288201B TW 288201 B TW288201 B TW 288201B TW 84111078 A TW84111078 A TW 84111078A TW 84111078 A TW84111078 A TW 84111078A TW 288201 B TW288201 B TW 288201B
Authority
TW
Taiwan
Prior art keywords
insulator
conductive layer
ladder
shaped hole
gap
Prior art date
Application number
TW84111078A
Other languages
Chinese (zh)
Inventor
Horng-Huei Jeng
Original Assignee
Vanguard Int Semiconduct Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Vanguard Int Semiconduct Corp filed Critical Vanguard Int Semiconduct Corp
Priority to TW84111078A priority Critical patent/TW288201B/en
Application granted granted Critical
Publication of TW288201B publication Critical patent/TW288201B/en

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  • Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)

Abstract

A process of fabricating Y-shaped conductor comprises the steps of: (1) forming one first insulator on semiconductor substrate; (2) etching the above first insulator to form ladder-shaped hole which has wider top and narrower bottom geometry shape; (3) depositing one conductive layer to fill the narrower bottom of the above ladder-shaped hole, but not to fill wider top of the above ladder-shaped hole, therefore there will leave gap between the above conductive layer of wider top of the above ladder-shaped hole; (4) depositing one second insulator to fill the gap between the above conductive layer of wider top of the above ladder-shaped hole; (5) removing the above second insulator of the above conductive layer, but reserving the second insulator in the above gap so as to form insulator plug constituted by second insulator in the above gap; (6) removing the above conductive layer on the above first insulator, but reserving conductive layer in the above hole; (7) by chemical solution removing the above insulator plug and second insulator, therefore Y-shaped conductive layer is formed.
TW84111078A 1995-10-18 1995-10-18 Process of fabricating high-density memory integrated circuit TW288201B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW84111078A TW288201B (en) 1995-10-18 1995-10-18 Process of fabricating high-density memory integrated circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW84111078A TW288201B (en) 1995-10-18 1995-10-18 Process of fabricating high-density memory integrated circuit

Publications (1)

Publication Number Publication Date
TW288201B true TW288201B (en) 1996-10-11

Family

ID=51398116

Family Applications (1)

Application Number Title Priority Date Filing Date
TW84111078A TW288201B (en) 1995-10-18 1995-10-18 Process of fabricating high-density memory integrated circuit

Country Status (1)

Country Link
TW (1) TW288201B (en)

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