TW283262B - - Google Patents

Info

Publication number
TW283262B
TW283262B TW084101933A TW84101933A TW283262B TW 283262 B TW283262 B TW 283262B TW 084101933 A TW084101933 A TW 084101933A TW 84101933 A TW84101933 A TW 84101933A TW 283262 B TW283262 B TW 283262B
Authority
TW
Taiwan
Application number
TW084101933A
Other languages
Chinese (zh)
Original Assignee
Seikosya Kk
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seikosya Kk filed Critical Seikosya Kk
Application granted granted Critical
Publication of TW283262B publication Critical patent/TW283262B/zh

Links

Classifications

    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D30/00—Field-effect transistors [FET]
    • H10D30/60—Insulated-gate field-effect transistors [IGFET]
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D30/00—Field-effect transistors [FET]
    • H10D30/01—Manufacture or treatment
    • H10D30/021—Manufacture or treatment of FETs having insulated gates [IGFET]
    • H10D30/0223—Manufacture or treatment of FETs having insulated gates [IGFET] having source and drain regions or source and drain extensions self-aligned to sides of the gate
    • H10D30/0227—Manufacture or treatment of FETs having insulated gates [IGFET] having source and drain regions or source and drain extensions self-aligned to sides of the gate having both lightly-doped source and drain extensions and source and drain regions self-aligned to the sides of the gate, e.g. lightly-doped drain [LDD] MOSFET or double-diffused drain [DDD] MOSFET
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
    • H10D84/01—Manufacture or treatment
    • H10D84/0123—Integrating together multiple components covered by H10D12/00 or H10D30/00, e.g. integrating multiple IGBTs
    • H10D84/0126—Integrating together multiple components covered by H10D12/00 or H10D30/00, e.g. integrating multiple IGBTs the components including insulated gates, e.g. IGFETs
    • H10D84/0147—Manufacturing their gate sidewall spacers
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
    • H10P14/40—Formation of materials, e.g. in the shape of layers or pillars of conductive or resistive materials
    • H10P14/416—Formation of materials, e.g. in the shape of layers or pillars of conductive or resistive materials of highly doped semiconductor materials, e.g. polysilicon layers or amorphous silicon layers
TW084101933A 1994-02-02 1995-02-28 TW283262B (OSRAM)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6011240A JPH07221291A (ja) 1994-02-02 1994-02-02 半導体装置及びその製造方法

Publications (1)

Publication Number Publication Date
TW283262B true TW283262B (OSRAM) 1996-08-11

Family

ID=11772420

Family Applications (1)

Application Number Title Priority Date Filing Date
TW084101933A TW283262B (OSRAM) 1994-02-02 1995-02-28

Country Status (3)

Country Link
JP (1) JPH07221291A (OSRAM)
KR (1) KR950034841A (OSRAM)
TW (1) TW283262B (OSRAM)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3854290B2 (ja) 2004-06-17 2006-12-06 株式会社東芝 半導体装置およびその製造方法
JP5280056B2 (ja) * 2008-01-10 2013-09-04 シャープ株式会社 Mos電界効果トランジスタ
JP5582030B2 (ja) * 2010-12-28 2014-09-03 富士通セミコンダクター株式会社 Mosトランジスタおよびその製造方法
JP6318786B2 (ja) 2014-04-04 2018-05-09 セイコーエプソン株式会社 半導体装置及びその製造方法

Also Published As

Publication number Publication date
JPH07221291A (ja) 1995-08-18
KR950034841A (ko) 1995-12-28

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees