TW283237B - - Google Patents

Info

Publication number
TW283237B
TW283237B TW084107133A TW84107133A TW283237B TW 283237 B TW283237 B TW 283237B TW 084107133 A TW084107133 A TW 084107133A TW 84107133 A TW84107133 A TW 84107133A TW 283237 B TW283237 B TW 283237B
Authority
TW
Taiwan
Application number
TW084107133A
Other languages
Chinese (zh)
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP14867794A external-priority patent/JPH07334999A/ja
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Application granted granted Critical
Publication of TW283237B publication Critical patent/TW283237B/zh

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/70—Masking faults in memories by using spares or by reconfiguring
    • G11C29/78—Masking faults in memories by using spares or by reconfiguring using programmable devices
    • G11C29/80—Masking faults in memories by using spares or by reconfiguring using programmable devices with improved layout
    • G11C29/816—Masking faults in memories by using spares or by reconfiguring using programmable devices with improved layout for an application-specific layout
    • G11C29/82—Masking faults in memories by using spares or by reconfiguring using programmable devices with improved layout for an application-specific layout for EEPROMs
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/70—Masking faults in memories by using spares or by reconfiguring
    • G11C29/72—Masking faults in memories by using spares or by reconfiguring with optimized replacement algorithms
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/70—Masking faults in memories by using spares or by reconfiguring
    • G11C29/78—Masking faults in memories by using spares or by reconfiguring using programmable devices
    • G11C29/785—Masking faults in memories by using spares or by reconfiguring using programmable devices with redundancy programming schemes
    • G11C29/789—Masking faults in memories by using spares or by reconfiguring using programmable devices with redundancy programming schemes using non-volatile cells or latches
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/70—Masking faults in memories by using spares or by reconfiguring
    • G11C29/78—Masking faults in memories by using spares or by reconfiguring using programmable devices
    • G11C29/80—Masking faults in memories by using spares or by reconfiguring using programmable devices with improved layout
    • G11C29/808—Masking faults in memories by using spares or by reconfiguring using programmable devices with improved layout using a flexible replacement scheme
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/70—Masking faults in memories by using spares or by reconfiguring
    • G11C29/78—Masking faults in memories by using spares or by reconfiguring using programmable devices
    • G11C29/84—Masking faults in memories by using spares or by reconfiguring using programmable devices with improved access time or stability
TW084107133A 1994-06-07 1995-07-10 TW283237B (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14867794A JPH07334999A (ja) 1994-06-07 1994-06-07 不揮発性半導体記憶装置及びデータプロセッサ

Publications (1)

Publication Number Publication Date
TW283237B true TW283237B (ja) 1996-08-11

Family

ID=49381523

Family Applications (1)

Application Number Title Priority Date Filing Date
TW084107133A TW283237B (ja) 1994-06-07 1995-07-10

Country Status (2)

Country Link
KR (1) KR100353346B1 (ja)
TW (1) TW283237B (ja)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100574478B1 (ko) * 1999-03-31 2006-04-27 주식회사 하이닉스반도체 메모리장치의 리페어 회로
KR100933839B1 (ko) * 2008-03-10 2009-12-24 주식회사 하이닉스반도체 불휘발성 메모리 소자 및 그 동작 방법

Also Published As

Publication number Publication date
KR100353346B1 (ko) 2003-01-15
KR960002361A (ko) 1996-01-26

Similar Documents

Publication Publication Date Title
TW256973B (ja)
DK105996A (ja)
BR9508234A (ja)
DK0677466T3 (ja)
EP0669395A3 (ja)
EP0666470A3 (ja)
FR2725621B1 (ja)
DE69535748D1 (ja)
BR9509661A (ja)
EP0667627A3 (ja)
ITMI952257A0 (ja)
TW283237B (ja)
IN185473B (ja)
ITMI952677A0 (ja)
DK0685247T3 (ja)
FR2725848B1 (ja)
AR255595A1 (ja)
ECSDI940181S (ja)
ECSDI940182S (ja)
ECSDI940203S (ja)
ECSDI940187S (ja)
ECSMU940034U (ja)
IN183394B (ja)
ECSDI940193S (ja)
CU22450A3 (ja)

Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees