TW283237B - - Google Patents

Info

Publication number
TW283237B
TW283237B TW084107133A TW84107133A TW283237B TW 283237 B TW283237 B TW 283237B TW 084107133 A TW084107133 A TW 084107133A TW 84107133 A TW84107133 A TW 84107133A TW 283237 B TW283237 B TW 283237B
Authority
TW
Taiwan
Application number
TW084107133A
Other languages
Chinese (zh)
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP14867794A external-priority patent/JPH07334999A/ja
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Application granted granted Critical
Publication of TW283237B publication Critical patent/TW283237B/zh

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/70—Masking faults in memories by using spares or by reconfiguring
    • G11C29/78—Masking faults in memories by using spares or by reconfiguring using programmable devices
    • G11C29/80—Masking faults in memories by using spares or by reconfiguring using programmable devices with improved layout
    • G11C29/816—Masking faults in memories by using spares or by reconfiguring using programmable devices with improved layout for an application-specific layout
    • G11C29/82—Masking faults in memories by using spares or by reconfiguring using programmable devices with improved layout for an application-specific layout for EEPROMs
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/70—Masking faults in memories by using spares or by reconfiguring
    • G11C29/72—Masking faults in memories by using spares or by reconfiguring with optimized replacement algorithms
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/70—Masking faults in memories by using spares or by reconfiguring
    • G11C29/78—Masking faults in memories by using spares or by reconfiguring using programmable devices
    • G11C29/785—Masking faults in memories by using spares or by reconfiguring using programmable devices with redundancy programming schemes
    • G11C29/789—Masking faults in memories by using spares or by reconfiguring using programmable devices with redundancy programming schemes using non-volatile cells or latches
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/70—Masking faults in memories by using spares or by reconfiguring
    • G11C29/78—Masking faults in memories by using spares or by reconfiguring using programmable devices
    • G11C29/80—Masking faults in memories by using spares or by reconfiguring using programmable devices with improved layout
    • G11C29/808—Masking faults in memories by using spares or by reconfiguring using programmable devices with improved layout using a flexible replacement scheme
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/70—Masking faults in memories by using spares or by reconfiguring
    • G11C29/78—Masking faults in memories by using spares or by reconfiguring using programmable devices
    • G11C29/84—Masking faults in memories by using spares or by reconfiguring using programmable devices with improved access time or stability
TW084107133A 1994-06-07 1995-07-10 TW283237B (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14867794A JPH07334999A (ja) 1994-06-07 1994-06-07 不揮発性半導体記憶装置及びデータプロセッサ

Publications (1)

Publication Number Publication Date
TW283237B true TW283237B (fr) 1996-08-11

Family

ID=49381523

Family Applications (1)

Application Number Title Priority Date Filing Date
TW084107133A TW283237B (fr) 1994-06-07 1995-07-10

Country Status (2)

Country Link
KR (1) KR100353346B1 (fr)
TW (1) TW283237B (fr)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100574478B1 (ko) * 1999-03-31 2006-04-27 주식회사 하이닉스반도체 메모리장치의 리페어 회로
KR100933839B1 (ko) * 2008-03-10 2009-12-24 주식회사 하이닉스반도체 불휘발성 메모리 소자 및 그 동작 방법

Also Published As

Publication number Publication date
KR100353346B1 (ko) 2003-01-15
KR960002361A (ko) 1996-01-26

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees