TW270233B - - Google Patents

Info

Publication number
TW270233B
TW270233B TW084104516A TW84104516A TW270233B TW 270233 B TW270233 B TW 270233B TW 084104516 A TW084104516 A TW 084104516A TW 84104516 A TW84104516 A TW 84104516A TW 270233 B TW270233 B TW 270233B
Authority
TW
Taiwan
Application number
TW084104516A
Other languages
Chinese (zh)
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Application granted granted Critical
Publication of TW270233B publication Critical patent/TW270233B/zh

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D64/00Electrodes of devices having potential barriers
    • H10D64/60Electrodes characterised by their materials
    • H10D64/66Electrodes having a conductor capacitively coupled to a semiconductor by an insulator, e.g. MIS electrodes
    • H10D64/661Electrodes having a conductor capacitively coupled to a semiconductor by an insulator, e.g. MIS electrodes the conductor comprising a layer of silicon contacting the insulator, e.g. polysilicon having vertical doping variation
    • H10D64/662Electrodes having a conductor capacitively coupled to a semiconductor by an insulator, e.g. MIS electrodes the conductor comprising a layer of silicon contacting the insulator, e.g. polysilicon having vertical doping variation the conductor further comprising additional layers, e.g. multiple silicon layers having different crystal structures
    • H10D64/663Electrodes having a conductor capacitively coupled to a semiconductor by an insulator, e.g. MIS electrodes the conductor comprising a layer of silicon contacting the insulator, e.g. polysilicon having vertical doping variation the conductor further comprising additional layers, e.g. multiple silicon layers having different crystal structures the additional layers comprising a silicide layer contacting the layer of silicon, e.g. polycide gates
TW084104516A 1994-03-17 1995-05-06 TW270233B (enrdf_load_stackoverflow)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6046674A JPH07263674A (ja) 1994-03-17 1994-03-17 電界効果型半導体装置とその製造方法

Publications (1)

Publication Number Publication Date
TW270233B true TW270233B (enrdf_load_stackoverflow) 1996-02-11

Family

ID=12753928

Family Applications (1)

Application Number Title Priority Date Filing Date
TW084104516A TW270233B (enrdf_load_stackoverflow) 1994-03-17 1995-05-06

Country Status (3)

Country Link
JP (1) JPH07263674A (enrdf_load_stackoverflow)
KR (1) KR0185461B1 (enrdf_load_stackoverflow)
TW (1) TW270233B (enrdf_load_stackoverflow)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5958508A (en) * 1997-03-31 1999-09-28 Motorlola, Inc. Process for forming a semiconductor device
JPH10308454A (ja) * 1997-05-02 1998-11-17 Mitsubishi Electric Corp 半導体装置およびその製造方法
US6284636B1 (en) * 2000-01-21 2001-09-04 Advanced Micro Devices, Inc. Tungsten gate method and apparatus
US6277744B1 (en) 2000-01-21 2001-08-21 Advanced Micro Devices, Inc. Two-level silane nucleation for blanket tungsten deposition
US6274472B1 (en) 2000-01-21 2001-08-14 Advanced Micro Devices, Inc. Tungsten interconnect method
KR100745604B1 (ko) * 2006-07-03 2007-08-02 삼성전자주식회사 반도체 소자 및 그 형성 방법

Also Published As

Publication number Publication date
KR950028175A (ko) 1995-10-18
JPH07263674A (ja) 1995-10-13
KR0185461B1 (ko) 1999-03-20

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