TW261692B - Membrane probing of circuits - Google Patents

Membrane probing of circuits

Info

Publication number
TW261692B
TW261692B TW83108719A TW83108719A TW261692B TW 261692 B TW261692 B TW 261692B TW 83108719 A TW83108719 A TW 83108719A TW 83108719 A TW83108719 A TW 83108719A TW 261692 B TW261692 B TW 261692B
Authority
TW
Taiwan
Prior art keywords
pad
contact
bumps
substrate
tester
Prior art date
Application number
TW83108719A
Other languages
English (en)
Inventor
Kuang-Fu Liu Ken
Byoung-Youl
Kunio Sano Sano
Takashi Sato
Original Assignee
Micromodule Systems Inc
Tokyo Electron Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Micromodule Systems Inc, Tokyo Electron Ltd filed Critical Micromodule Systems Inc
Priority to TW83108719A priority Critical patent/TW261692B/zh
Application granted granted Critical
Publication of TW261692B publication Critical patent/TW261692B/zh

Links

Landscapes

  • Measuring Leads Or Probes (AREA)
TW83108719A 1994-09-22 1994-09-22 Membrane probing of circuits TW261692B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW83108719A TW261692B (en) 1994-09-22 1994-09-22 Membrane probing of circuits

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW83108719A TW261692B (en) 1994-09-22 1994-09-22 Membrane probing of circuits

Publications (1)

Publication Number Publication Date
TW261692B true TW261692B (en) 1995-11-01

Family

ID=51401948

Family Applications (1)

Application Number Title Priority Date Filing Date
TW83108719A TW261692B (en) 1994-09-22 1994-09-22 Membrane probing of circuits

Country Status (1)

Country Link
TW (1) TW261692B (zh)

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