TW251352B - - Google Patents
Info
- Publication number
- TW251352B TW251352B TW083110219A TW83110219A TW251352B TW 251352 B TW251352 B TW 251352B TW 083110219 A TW083110219 A TW 083110219A TW 83110219 A TW83110219 A TW 83110219A TW 251352 B TW251352 B TW 251352B
- Authority
- TW
- Taiwan
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
- G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
- G01R31/318558—Addressing or selecting of subparts of the device under test
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US08/173,732 US5535222A (en) | 1993-12-23 | 1993-12-23 | Method and apparatus for controlling a plurality of systems via a boundary-scan port during testing |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| TW251352B true TW251352B (cg-RX-API-DMAC7.html) | 1995-07-11 |
Family
ID=22633248
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW083110219A TW251352B (cg-RX-API-DMAC7.html) | 1993-12-23 | 1994-11-04 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US5535222A (cg-RX-API-DMAC7.html) |
| EP (1) | EP0661551A3 (cg-RX-API-DMAC7.html) |
| JP (1) | JPH08226954A (cg-RX-API-DMAC7.html) |
| KR (1) | KR0163967B1 (cg-RX-API-DMAC7.html) |
| CA (1) | CA2135680C (cg-RX-API-DMAC7.html) |
| TW (1) | TW251352B (cg-RX-API-DMAC7.html) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI383692B (zh) * | 2008-10-17 | 2013-01-21 | Wistron Corp | 電子裝置之麥克風測試方法與系統 |
Families Citing this family (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100502123B1 (ko) * | 1996-08-30 | 2005-11-08 | 텍사스 인스트루먼츠 인코포레이티드 | 다중테스트억세스포트환경에서테스트억세스포트의선택적억세싱 |
| EP0826974B1 (en) * | 1996-08-30 | 2005-10-19 | Texas Instruments Incorporated | Device for testing integrated circuits |
| DE69832605T2 (de) | 1997-06-02 | 2006-08-17 | Duaxes Corp. | Schnittstellenabtastungselement und kommunikationsvorrichtung die dieses verwendet |
| GB9818377D0 (en) | 1998-08-21 | 1998-10-21 | Sgs Thomson Microelectronics | An integrated circuit with multiple processing cores |
| US6636891B1 (en) * | 1998-11-06 | 2003-10-21 | Seiko Epson Corporation | Methods and apparatus for controlling an input or output device over the internet |
| US6988123B2 (en) * | 1998-11-06 | 2006-01-17 | Seiko Epson Corporation | Methods and apparatus for remote execution of an application over the internet |
| US7058862B2 (en) | 2000-05-26 | 2006-06-06 | Texas Instruments Incorporated | Selecting different 1149.1 TAP domains from update-IR state |
| US8516316B2 (en) * | 2009-03-26 | 2013-08-20 | Taiwan Semiconductor Manufacturing Company, Ltd. | Method and apparatus for diagnosing an integrated circuit |
| WO2020065407A1 (en) * | 2018-09-28 | 2020-04-02 | Marvell Israel (M.I.S.L) Ltd. | Method and apparatus for testing a multi-die integrated circuit device |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4701921A (en) * | 1985-10-23 | 1987-10-20 | Texas Instruments Incorporated | Modularized scan path for serially tested logic circuit |
| US4947395A (en) * | 1989-02-10 | 1990-08-07 | Ncr Corporation | Bus executed scan testing method and apparatus |
| JP2676169B2 (ja) * | 1989-12-27 | 1997-11-12 | 三菱電機株式会社 | スキャンパス回路 |
| US5198759A (en) * | 1990-11-27 | 1993-03-30 | Alcatel N.V. | Test apparatus and method for testing digital system |
| US5400345A (en) * | 1992-03-06 | 1995-03-21 | Pitney Bowes Inc. | Communications system to boundary-scan logic interface |
| US5416783A (en) * | 1993-08-09 | 1995-05-16 | Motorola, Inc. | Method and apparatus for generating pseudorandom numbers or for performing data compression in a data processor |
-
1993
- 1993-12-23 US US08/173,732 patent/US5535222A/en not_active Expired - Lifetime
-
1994
- 1994-11-04 TW TW083110219A patent/TW251352B/zh active
- 1994-11-14 CA CA002135680A patent/CA2135680C/en not_active Expired - Fee Related
- 1994-12-07 EP EP94309107A patent/EP0661551A3/en not_active Withdrawn
- 1994-12-13 KR KR1019940033844A patent/KR0163967B1/ko not_active Expired - Fee Related
- 1994-12-22 JP JP6335318A patent/JPH08226954A/ja active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI383692B (zh) * | 2008-10-17 | 2013-01-21 | Wistron Corp | 電子裝置之麥克風測試方法與系統 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH08226954A (ja) | 1996-09-03 |
| KR950019756A (ko) | 1995-07-24 |
| KR0163967B1 (ko) | 1999-03-20 |
| CA2135680C (en) | 1999-02-02 |
| EP0661551A3 (en) | 1999-03-03 |
| CA2135680A1 (en) | 1995-06-24 |
| US5535222A (en) | 1996-07-09 |
| EP0661551A2 (en) | 1995-07-05 |