TW246734B - - Google Patents

Info

Publication number
TW246734B
TW246734B TW081109365A TW81109365A TW246734B TW 246734 B TW246734 B TW 246734B TW 081109365 A TW081109365 A TW 081109365A TW 81109365 A TW81109365 A TW 81109365A TW 246734 B TW246734 B TW 246734B
Authority
TW
Taiwan
Application number
TW081109365A
Other languages
Chinese (zh)
Original Assignee
Kaisei Kotei Kk
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP3306296A external-priority patent/JPH05142204A/ja
Priority claimed from JP31696991A external-priority patent/JPH05149923A/ja
Application filed by Kaisei Kotei Kk filed Critical Kaisei Kotei Kk
Application granted granted Critical
Publication of TW246734B publication Critical patent/TW246734B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
    • G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
    • G01N27/9073—Recording measured data
    • G01N27/9086—Calibrating of recording device
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
    • G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
    • G01N27/904—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents with two or more sensors

Landscapes

  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
TW081109365A 1991-11-21 1992-11-23 TW246734B (OSRAM)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP3306296A JPH05142204A (ja) 1991-11-21 1991-11-21 電磁誘導型検査装置
JP31696991A JPH05149923A (ja) 1991-11-29 1991-11-29 周波数位相変化による電磁誘導検査装置及びその検査方法

Publications (1)

Publication Number Publication Date
TW246734B true TW246734B (OSRAM) 1995-05-01

Family

ID=26564655

Family Applications (1)

Application Number Title Priority Date Filing Date
TW081109365A TW246734B (OSRAM) 1991-11-21 1992-11-23

Country Status (4)

Country Link
US (1) US5548214A (OSRAM)
EP (1) EP0543648A1 (OSRAM)
KR (1) KR930010556A (OSRAM)
TW (1) TW246734B (OSRAM)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI627399B (zh) * 2015-03-31 2018-06-21 Nisshin Steel Co Ltd 熔融鍍覆鋼板的表面缺陷檢查裝置及表面缺陷檢查方法

Families Citing this family (29)

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US6400146B1 (en) 2000-09-12 2002-06-04 Her Majesty The Queen In Right Of Canada As Represented By The Ministry Of Natural Resources Sensor head for ACFM based crack detection
KR100868085B1 (ko) * 2002-05-29 2008-11-10 주식회사 포스코 입도 선별기의 막힘 방지장치
DE10313766B4 (de) * 2003-03-22 2021-04-29 Hilti Aktiengesellschaft Handgeführtes Arbeitsgerät
US7674994B1 (en) * 2004-10-21 2010-03-09 Valerio Thomas A Method and apparatus for sorting metal
GB2423366B (en) * 2005-02-16 2010-02-24 Cintex Ltd Metal detector
CN100592006C (zh) * 2005-08-25 2010-02-24 Ntn株式会社 空气循环冷冻冷却用汽轮机组件
US7659486B2 (en) * 2005-10-20 2010-02-09 Valerio Thomas A Method and apparatus for sorting contaminated glass
EP1960111A4 (en) * 2005-10-24 2013-11-20 Thomas Valerio SORTING PROCESS, SYSTEM AND DEVICE FOR DIFFERENT MATERIALS
JP4809039B2 (ja) * 2005-11-07 2011-11-02 偕成エンジニア株式会社 電磁誘導型検査装置および電磁誘導型検査方法
ES2294924B1 (es) * 2006-04-07 2009-02-16 Universidad De Salamanca Metodo y aparato para medir la conductividad electrica asi como para efectuar una caracterizacion estructural y dimensional de muestras metalicas cilindricas por tecnicas inductivas.
AU2008205361B2 (en) * 2007-01-05 2012-06-14 Thomas A. Valerio System and method for sorting dissimilar materials
JP4998820B2 (ja) * 2007-03-14 2012-08-15 住友金属工業株式会社 渦流検査方法及び該渦流検査方法を実施するための渦流検査装置
JP2010524663A (ja) * 2007-04-18 2010-07-22 トーマス エイ． バレリオ、 リサイクル材料を選別して処理する方法およびシステム
US7732726B2 (en) * 2008-04-03 2010-06-08 Valerio Thomas A System and method for sorting dissimilar materials using a dynamic sensor
JP2011525144A (ja) 2008-06-11 2011-09-15 トーマス エイ． バレリオ、 処理したリサイクル材料から金属を回収する方法およびシステム
WO2010011671A1 (en) * 2008-07-21 2010-01-28 Blyth Peter C Method and system for removing polychlorinated biphenyls from plastics
WO2010117363A1 (en) * 2009-04-09 2010-10-14 Michelin Recherche Et Technique, S.A. Tire metallic cable anomaly detection method and apparatus
US8627960B2 (en) * 2009-04-28 2014-01-14 Mtd America Ltd (Llc) Apparatus and method for separating materials using air
WO2011011523A1 (en) * 2009-07-21 2011-01-27 Velerio Thomas A Method and system for separating and recovering like-type materials from an electronic waste system
US8757523B2 (en) 2009-07-31 2014-06-24 Thomas Valerio Method and system for separating and recovering wire and other metal from processed recycled materials
AU2010278693A1 (en) * 2009-07-31 2012-03-01 Thomas A. Valerio Method and system for separating and recovering wire and other metal from processed recycled materials
DE102010012356B4 (de) 2010-03-22 2021-04-29 Sew-Eurodrive Gmbh & Co Kg System zur berührungslosen Energieübertragung an ein Fahrzeug
CN102859351B (zh) * 2010-04-27 2015-05-27 丰田自动车株式会社 涡流计测用传感器
US20140099663A1 (en) * 2010-11-15 2014-04-10 Regents Of The University Of Minnesota Gmr sensor
DE102011104848A1 (de) * 2011-06-20 2012-12-20 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Vorrichtung zur zerstörungsfreien Prüfung von metallischem Langgut sowie Verwendung der Vorrichtung
US9411017B2 (en) 2013-11-26 2016-08-09 General Electric Company Method for inspecting wye ring
DE102015016831A1 (de) * 2015-12-28 2017-06-29 Haimer Gmbh Schrumpfgerät mit Heizkontrolle
CN114088771A (zh) * 2021-11-09 2022-02-25 衡阳镭目科技有限责任公司 检测极耳质量的方法和装置
KR102811605B1 (ko) * 2022-11-09 2025-05-21 한국기계연구원 비접촉식 전계 발광을 이용한 자체발광 소자의 결함 검사 장치

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3576489A (en) * 1969-03-13 1971-04-27 J K Law Engineers Inc Phase detection and comparison apparatus for determining the phase derivative with respect to frequency of an eddy current test signal
US3686564A (en) * 1970-10-08 1972-08-22 Westinghouse Electric Corp Multiple frequency magnetic field technique for differentiating between classes of metal objects
US4079312A (en) * 1976-08-17 1978-03-14 Allegheny Ludlum Industries, Inc. Continuous testing method and apparatus for determining the magnetic characteristics of a strip of moving material, including flux inducing and pick-up device therefor
CA1194177A (en) * 1981-02-09 1985-09-24 Kerr (Goring) Limited Metal detection apparatus
GB2109112A (en) * 1981-10-06 1983-05-25 Pantatron Systems Limited Eddy current test probe
SE430545B (sv) * 1982-04-01 1983-11-21 Asea Ab Anordning for detektering av metallforemal i ett materialflode
CA1212997A (fr) * 1983-12-16 1986-10-21 Gerard Durou Methode et systeme de test non destructif a courants de foucault utilisant un balayage en frequences
JPS6166958A (ja) * 1984-09-10 1986-04-05 Sumitomo Light Metal Ind Ltd 絶対値式渦流探傷装置
JPS62501991A (ja) * 1985-02-15 1987-08-06 ザ　ブロ−クン　ヒル　プロプライエタリイ　カンパニ−　リミテツド 鋼鉄の分類
US5017869A (en) * 1989-12-14 1991-05-21 General Electric Company Swept frequency eddy current system for measuring coating thickness

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI627399B (zh) * 2015-03-31 2018-06-21 Nisshin Steel Co Ltd 熔融鍍覆鋼板的表面缺陷檢查裝置及表面缺陷檢查方法

Also Published As

Publication number Publication date
KR930010556A (ko) 1993-06-22
EP0543648A1 (en) 1993-05-26
US5548214A (en) 1996-08-20

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