TW234172B - Method and apparatus for testing the functionality of a microprocessor - Google Patents

Method and apparatus for testing the functionality of a microprocessor

Info

Publication number
TW234172B
TW234172B TW83101161A TW83101161A TW234172B TW 234172 B TW234172 B TW 234172B TW 83101161 A TW83101161 A TW 83101161A TW 83101161 A TW83101161 A TW 83101161A TW 234172 B TW234172 B TW 234172B
Authority
TW
Taiwan
Prior art keywords
phase
microprocessor
micro
test
results
Prior art date
Application number
TW83101161A
Other languages
Chinese (zh)
Inventor
B Whitted Graham Iii
A Kane James
Hsiao-Shia Chang
Original Assignee
Keridian Semiconductor Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Keridian Semiconductor Inc filed Critical Keridian Semiconductor Inc
Application granted granted Critical
Publication of TW234172B publication Critical patent/TW234172B/en

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
    • G06F11/2236—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test CPU or processors
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/273—Tester hardware, i.e. output processing circuits
    • G06F11/2736—Tester hardware, i.e. output processing circuits using a dedicated service processor for test
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/28—Error detection; Error correction; Monitoring by checking the correct order of processing

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Microcomputers (AREA)

Abstract

An apparatus and method test the functionality of a microprocessor. The microprocessor performs a two-phase self-test. In the first phase, the microprocessor sequentially executes every micro-instruction, without allowing any micro-instruction jumps. A number of the first micro-instructions substantially initialize the microprocessor circuitry to a known state so that outputs generated by the microprocessor are deterministic. During this first phase, a number of output pins are driven so that an optional external test unit can monitor the output pins and compare the output values against expected values. In addition, cyclical redundancy registers monitor other circuits within the microprocessor. After successful completion of the first phase, the results of the first phase are reported and the second phase begins. The second phase comprises comprehensive micro-diagnostic testing. The second phase of the self test ends with the reporting of the results of the micro-diagnostic tests.
TW83101161A 1994-02-08 1994-02-15 Method and apparatus for testing the functionality of a microprocessor TW234172B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US19329294A 1994-02-08 1994-02-08

Publications (1)

Publication Number Publication Date
TW234172B true TW234172B (en) 1994-11-11

Family

ID=22713016

Family Applications (1)

Application Number Title Priority Date Filing Date
TW83101161A TW234172B (en) 1994-02-08 1994-02-15 Method and apparatus for testing the functionality of a microprocessor

Country Status (2)

Country Link
TW (1) TW234172B (en)
WO (1) WO1995022107A1 (en)

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4439827A (en) * 1981-12-28 1984-03-27 Raytheon Company Dual fetch microsequencer
US4920538A (en) * 1985-06-28 1990-04-24 International Business Machines Corporation Method of checking the execution of microcode sequences
US5058007A (en) * 1987-11-05 1991-10-15 Raytheon Company Next microinstruction generator in a microprogram control unit
JPH0719215B2 (en) * 1989-06-01 1995-03-06 三菱電機株式会社 Microprocessor
US5151981A (en) * 1990-07-13 1992-09-29 International Business Machines Corporation Instruction sampling instrumentation

Also Published As

Publication number Publication date
WO1995022107A1 (en) 1995-08-17

Similar Documents

Publication Publication Date Title
US7644333B2 (en) Restartable logic BIST controller
US6516432B1 (en) AC scan diagnostic method
US4519078A (en) LSI self-test method
CN107544017B (en) Low-power-consumption weighted pseudo-random test method based on vector compression and related equipment
DK456087D0 (en) PROCEDURE FOR INSULATING ERRORS IN A DIGITAL LOGICAL CIRCUIT.
US7934134B2 (en) Method and apparatus for performing logic built-in self-testing of an integrated circuit
IE880956L (en) A software verification apparatus
EP1360513A4 (en) Multiple-capture dft system for detecting or locating crossing clock-domain faults during self-test or scan test
US4680761A (en) Self diagnostic Cyclic Analysis Testing System (CATS) for LSI/VLSI
EP0415614A2 (en) Method and apparatus for generating control signals
EP0737337A4 (en) Apparatus and method for testing integrated circuits
EP0140205A2 (en) Method and apparatus for fault testing a clock distribution network of a processor
US6128754A (en) Tester having event generation circuit for acquiring waveform by supplying strobe events for waveform acquisition rather than using strobe events specified by the test program
JPH07168767A (en) Apparatus and method for built-in self-checking of smart memory
US6615379B1 (en) Method and apparatus for testing a logic device
US7761764B2 (en) System and method for self-test of integrated circuits
CN115877182A (en) Chip aging test device and method
TW234172B (en) Method and apparatus for testing the functionality of a microprocessor
Chan An improved technique for circuit board interconnect test
US20050080583A1 (en) Device testing control
JPH04186176A (en) Integrated circuit testing device
Pomeranz et al. On methods to match a test pattern generator to a circuit-under-test
JPS61241672A (en) Ic testing device
JPS54151478A (en) Pin connection checking system of integrated circuits being tested in integrated circuit testing apparatus
SU723575A1 (en) Discrete unit testing device

Legal Events

Date Code Title Description
MK4A Expiration of patent term of an invention patent