TW234172B - Method and apparatus for testing the functionality of a microprocessor - Google Patents

Method and apparatus for testing the functionality of a microprocessor

Info

Publication number
TW234172B
TW234172B TW83101161A TW83101161A TW234172B TW 234172 B TW234172 B TW 234172B TW 83101161 A TW83101161 A TW 83101161A TW 83101161 A TW83101161 A TW 83101161A TW 234172 B TW234172 B TW 234172B
Authority
TW
Taiwan
Prior art keywords
phase
microprocessor
micro
test
results
Prior art date
Application number
TW83101161A
Other languages
Chinese (zh)
Inventor
B Whitted Graham Iii
A Kane James
Hsiao-Shia Chang
Original Assignee
Keridian Semiconductor Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Keridian Semiconductor Inc filed Critical Keridian Semiconductor Inc
Application granted granted Critical
Publication of TW234172B publication Critical patent/TW234172B/en

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
    • G06F11/2236—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test CPU or processors
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/273—Tester hardware, i.e. output processing circuits
    • G06F11/2736—Tester hardware, i.e. output processing circuits using a dedicated service processor for test
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/28—Error detection; Error correction; Monitoring by checking the correct order of processing

Abstract

An apparatus and method test the functionality of a microprocessor. The microprocessor performs a two-phase self-test. In the first phase, the microprocessor sequentially executes every micro-instruction, without allowing any micro-instruction jumps. A number of the first micro-instructions substantially initialize the microprocessor circuitry to a known state so that outputs generated by the microprocessor are deterministic. During this first phase, a number of output pins are driven so that an optional external test unit can monitor the output pins and compare the output values against expected values. In addition, cyclical redundancy registers monitor other circuits within the microprocessor. After successful completion of the first phase, the results of the first phase are reported and the second phase begins. The second phase comprises comprehensive micro-diagnostic testing. The second phase of the self test ends with the reporting of the results of the micro-diagnostic tests.
TW83101161A 1994-02-08 1994-02-15 Method and apparatus for testing the functionality of a microprocessor TW234172B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US19329294A 1994-02-08 1994-02-08

Publications (1)

Publication Number Publication Date
TW234172B true TW234172B (en) 1994-11-11

Family

ID=22713016

Family Applications (1)

Application Number Title Priority Date Filing Date
TW83101161A TW234172B (en) 1994-02-08 1994-02-15 Method and apparatus for testing the functionality of a microprocessor

Country Status (2)

Country Link
TW (1) TW234172B (en)
WO (1) WO1995022107A1 (en)

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4439827A (en) * 1981-12-28 1984-03-27 Raytheon Company Dual fetch microsequencer
US4920538A (en) * 1985-06-28 1990-04-24 International Business Machines Corporation Method of checking the execution of microcode sequences
US5058007A (en) * 1987-11-05 1991-10-15 Raytheon Company Next microinstruction generator in a microprogram control unit
JPH0719215B2 (en) * 1989-06-01 1995-03-06 三菱電機株式会社 Microprocessor
US5151981A (en) * 1990-07-13 1992-09-29 International Business Machines Corporation Instruction sampling instrumentation

Also Published As

Publication number Publication date
WO1995022107A1 (en) 1995-08-17

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