TW216829B - Manufacturing method for complementary bipolar CMOS - Google Patents

Manufacturing method for complementary bipolar CMOS

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Publication number
TW216829B
TW216829B TW82106284A TW82106284A TW216829B TW 216829 B TW216829 B TW 216829B TW 82106284 A TW82106284 A TW 82106284A TW 82106284 A TW82106284 A TW 82106284A TW 216829 B TW216829 B TW 216829B
Authority
TW
Taiwan
Prior art keywords
well
forms
bipolar transistor
lateral
implants
Prior art date
Application number
TW82106284A
Other languages
Chinese (zh)
Inventor
Sheng-Teng Shyu
Original Assignee
Ind Tech Res Inst
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ind Tech Res Inst filed Critical Ind Tech Res Inst
Priority to TW82106284A priority Critical patent/TW216829B/en
Application granted granted Critical
Publication of TW216829B publication Critical patent/TW216829B/en

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  • Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)

Abstract

A manufacturing method for complementary bipolar CMOS to manufacture a PMOS, a NMOS, a lateral NPN bipolar, a lateral PNP bipolar and a vertical NPN bipolar transistors on a substrate, consists of the following steps: - Seperates the active regions of the NMOS and PMOS transistors and forms P-well and N-well on the substrate. - Forms the NMOS and PMOS transistors on the P-well and N-well respectively. - Forms the NPN and PNP bipolar transistor on the N-well. - Implants conductivity modifier to the N-well of the NPN bipolar transistor to form the base of the lateral NPN bipolar transistor. - Forms the N-base of the lateral PNP bipolar transistor. - Grows the gate oxidation. - Forms an opening on the gate oxidation for the base contact and burying contact. - Deposits polysilicon. - Implants conductivity modifier to the polysilicon to form N+ polysilicon and P+ polysilicon. - Forms un-doped oxidation. - Forms side wall spacer. - Implants conductivity modifier to form the source/drain of the NMOS transistor, the collector of the lateral NPN bipolar transistor, the emitter of the vertical NPN bipolar transistor and the N-well contact. - Implants conductivity modifier to form the source/drain of the PMOS transistor, the collector of the lateral PNP bipolar transistor, the emitter of the vertical PNP bipolar transistor and the P-well contact.
TW82106284A 1993-08-05 1993-08-05 Manufacturing method for complementary bipolar CMOS TW216829B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW82106284A TW216829B (en) 1993-08-05 1993-08-05 Manufacturing method for complementary bipolar CMOS

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW82106284A TW216829B (en) 1993-08-05 1993-08-05 Manufacturing method for complementary bipolar CMOS

Publications (1)

Publication Number Publication Date
TW216829B true TW216829B (en) 1993-12-01

Family

ID=51357287

Family Applications (1)

Application Number Title Priority Date Filing Date
TW82106284A TW216829B (en) 1993-08-05 1993-08-05 Manufacturing method for complementary bipolar CMOS

Country Status (1)

Country Link
TW (1) TW216829B (en)

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