TW202334654A - Module handler, and transfer tool therefor - Google Patents

Module handler, and transfer tool therefor Download PDF

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Publication number
TW202334654A
TW202334654A TW112106806A TW112106806A TW202334654A TW 202334654 A TW202334654 A TW 202334654A TW 112106806 A TW112106806 A TW 112106806A TW 112106806 A TW112106806 A TW 112106806A TW 202334654 A TW202334654 A TW 202334654A
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module
loading
modules
test
buffer
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TW112106806A
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Chinese (zh)
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柳弘俊
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南韓商宰體有限公司
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Publication of TW202334654A publication Critical patent/TW202334654A/en

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer

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  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

The present invention relates to a module handler and a transfer tool installed therein and, more particularly, to a module handler for inspecting modules such as DRAM, SSD, and the like, and a transfer tool installed in the module handler. The present invention relates to a module handler comprising: a loading part (100) for loading a plurality of modules (20) onto a tray (10); a first buffer part (330) for receiving the plurality of modules (20) from the loading part (100) and temporarily storing same; a test part (200) installed at a test position arranged on a preset travel path (L) to perform a preset test after the modules (20) are inserted; at least one shuttle part (310) arranged to shuttle along the traveling path (L) between a loading position, the testing position, and an unloading position that are set on the traveling path (L), to receive the plurality of modules (20) from the first buffer part (330) and deliver same to the test part (200); a second buffer part (340) for receiving the plurality of modules (20) that have been inspected from the shuttle part (310) at the unloading position and temporarily storing same; and an unloading part (400) for receiving the plurality of modules (20) from the second buffer part (340) and unloading same onto a tray (10) according to preset sorting criteria.

Description

模組處理器及設置在該模組處理器的傳送工具Module processor and transmission tool provided in the module processor

本發明涉及一種模組處理器及設置在該模組處理器的傳送工具,更詳言之,涉及執行DRAM、SSD等模組的檢查的模組處理器及設置在該模組處理器的傳送工具The present invention relates to a module processor and a transmission tool provided in the module processor. More specifically, it relates to a module processor that performs inspection of DRAM, SSD and other modules and a transmission tool provided in the module processor. tool

SDRM等的儲存模組、快閃記憶體等的NAND RAM模組、M.2、MVMe等的SSD等模組(以下,統稱為「模組」)為電子零部件,在預定規格的PCB的兩面中的至少一面固定一個以上的記憶體等器件。Storage modules such as SDRM, NAND RAM modules such as flash memory, and SSD modules such as M.2 and MVMe (hereinafter collectively referred to as "modules") are electronic components that are installed on a PCB of predetermined specifications. At least one of the two sides is fixed with more than one memory device and other devices.

另一方面,隨著記憶體等的集成度提高、超薄型結構變得高價,會經過預先設定的測試之後出廠。On the other hand, as the integration level of memory and other devices increases, ultra-thin structures become more expensive, and they are shipped from the factory after undergoing preset tests.

然而,為了測試模組,在實際使用環境下通過供電及施加訊號執行,但是模組的端子配置在側方端部,而不是上面及底面,因此存在用於測試模組的處理變得困難,且模組傳送繁瑣的問題。However, in order to test the module, power supply and signal application are performed in the actual use environment. However, the terminals of the module are arranged at the side ends instead of the top and bottom, so the handling of the test module becomes difficult. And the module transmission is cumbersome.

更進一步地,在模組處理困難且模組傳送困難的情況下,降低了模組測試速度,因此存在降低模組生産率的問題。Furthermore, when module processing is difficult and module transportation is difficult, the module testing speed is reduced, so there is a problem of reducing module productivity.

《要解決的問題》"Problems to be Solved"

本發明的目的是為了解決如上所述的問題,提供一種可大幅度提高模組測試速度的模組處理器及設置在該模組處理器的傳送工具。 《解決問題的手段》 The purpose of the present invention is to solve the above-mentioned problems and provide a module processor that can greatly increase the module testing speed and a transmission tool provided in the module processor. "Methods to Solve Problems"

本發明是為了達到如上所述的目的而提出的,本發明提供一種模組處理器,包括:裝載部,用於在托盤裝載複數個模組;第一緩衝部,從所述裝載部接收複數個模組來暫時裝載;測試部,設置在測試位置,並在插入模組之後執行預先設定的檢查,所述測試位置設定在預先設定的動作路徑上;一個以上的往返部,可移動地設置,以沿所述動作路徑循環於在所述動作路徑上設定的裝載位置、所述測試及卸載位置,並從所述第一緩衝部接收複數個模組來傳遞至所述測試部;第二緩衝部,用於在所述卸載位置從所述往返部接收完成檢查的複數個模組來暫時裝載;卸除部,用於從所述第二緩衝部接收複數個模組,按照預先設定的分類標準卸除於托盤。The present invention is proposed to achieve the above objects. The present invention provides a module processor, which includes: a loading part for loading a plurality of modules on a pallet; a first buffer part for receiving a plurality of modules from the loading part. A module is temporarily loaded; the test part is set at a test position, and performs preset inspections after inserting the module, and the test position is set on a preset action path; more than one shuttle part is movably set , to cycle along the action path at the loading position, the test and the unloading position set on the action path, and receive a plurality of modules from the first buffer part and transfer them to the test part; second The buffer part is used to receive a plurality of modules that have been inspected from the shuttle part at the unloading position and temporarily load them; the unloading part is used to receive a plurality of modules from the second buffer part and load them according to the preset Sorting standards are unloaded on pallets.

所述模組可以是DIMM規格的DRAM或者so-DIMM規格的DRAM。The module may be a DRAM with DIMM specifications or a DRAM with so-DIMM specifications.

所述模組以其板面朝向水平方向地移動;所述托盤間隔第一間距地配置各個模組,所述測試部的測試插座間隔第二間距配置;所述第一緩衝部將裝載槽之間間隔第一間距,以所述第一間距從所述裝載部接收模組,並改變裝載槽之間的間距,以使裝載槽之間間隔第二間距,進而將模組間隔第二間距地傳遞至所述往返部;所述第二緩衝部將裝載槽之間間隔第一間距,進而將模組間隔所述第一間距地傳遞至所述卸除部,並可改變裝載槽之間的間距,以使裝載槽間隔第二間距,進而在所述卸載位置從所述往返部間隔第二間距地傳遞模組。The module moves with its board surface in the horizontal direction; the tray arranges each module at a first spacing, and the test sockets of the test part are arranged at a second spacing; the first buffer portion places the loading slot between space a first spacing between each other, receive the modules from the loading part at the first spacing, and change the spacing between the loading slots so that the loading slots are spaced apart by a second spacing, and then the modules are spaced apart by the second spacing. Passed to the shuttle part; the second buffer part separates the loading slots by a first spacing, and then passes the module to the removal part at the first spacing, and can change the distance between the loading slots. The spacing is such that the loading slots are spaced apart by a second spacing, and the modules are transferred from the shuttle portion at a second spacing in the unloading position.

所述往返部可設置有加熱部,以在向所述測試部傳遞模組之前進行加熱。The shuttle part may be provided with a heating part to heat the module before transferring it to the test part.

所述往返部將放置第一規格的模組的第一裝載槽及與所述第一裝載槽相鄰設置並放置第二規格的模組的第二裝載槽組成小組,沿移動方向配置n個以上的所述小組來組成中間組;所述中間組的小組為,相鄰的中間組的小組間隔的間距可配置成與所述測試部的測試插座的間距相對應的第二間距。The reciprocating part is composed of a first loading slot for placing the module of the first specification and a second loading slot adjacent to the first loading slot for placing the module of the second specification, and n are arranged along the moving direction. The above-mentioned sub-groups are used to form a middle group; the sub-groups of the middle group are such that the spacing between the sub-groups of adjacent middle groups can be configured to be a second spacing corresponding to the spacing of the test sockets of the test part.

本發明還提供一種模組處理器,包括:裝載部,用於在托盤裝載複數個模組;卸除部,用於接收完成檢查的複數個模組,按照預先設定的分類標準卸除於托盤;測試部,位於第三基線上,對於複數個模組執行預先設定的檢查,所述第三基線以垂直方向間隔於連接所述裝載部及所述卸除部的第一基線;第一緩衝部,往返移動至裝載位置與第一交換位置之間,以在所述裝載位置從所述裝載部接收複數個模組,在所述第三基線上設定的所述第一交換位置將複數個模組傳遞至所述測試部;第二緩衝部,往返移動至卸載位置與第二交換位置之間,以在所述第三基線上設定的所述第二交換位置從所述測試部接收完成檢查的複數個模組來移動至卸載位置,以將完成檢查的複數個模組傳遞至所述卸除部。The present invention also provides a module processor, which includes: a loading part for loading a plurality of modules on a pallet; and an unloading part for receiving a plurality of modules that have been inspected and unloading them on the pallet according to preset classification standards. ; The test section is located on a third baseline, which performs preset inspections on a plurality of modules. The third baseline is vertically spaced from the first baseline connecting the loading section and the unloading section; the first buffer part, moving back and forth between the loading position and the first exchange position to receive a plurality of modules from the loading part at the loading position, and the first exchange position set on the third baseline will The module is transferred to the test part; the second buffer part moves back and forth between the unloading position and the second exchange position to complete the reception from the test part at the second exchange position set on the third baseline. The inspected plurality of modules are moved to the unloading position, so as to transfer the inspected plurality of modules to the unloading part.

所述測試部可位於所述第一緩衝部的動作路徑與所述第二緩衝部的動作路徑之間。The test part may be located between an action path of the first buffer part and an action path of the second buffer part.

所述第一緩衝部及所述第二緩衝部可包括一對緩衝托盤,所述一對緩衝托盤以所述第一基線的方向平行配置。The first buffer part and the second buffer part may include a pair of buffer trays, the pair of buffer trays being arranged in parallel in the direction of the first baseline.

本發明的模組處理器可包括:第一模組傳送部,用於從所述裝載部的托盤拾取複數個模組,將拾取的複數個模組裝載於位在所述裝載位置的所述第一緩衝部;第二模組傳送部,用於從位於所述卸載位置的所述第二緩衝部拾取複數個模組,將拾取的複數個模組裝載於所述卸除部的托盤;第一傳送工具,用於從位於所述第一交換位置的所述第一緩衝部拾取複數個模組,將拾取的複數個模組裝載於所述測試部的測試插座;第二傳送工具,用於從所述測試部的測試插座拾取完成檢查的複數個模組,以將拾取的複數個模組裝載於位在所述第二交換位置的所述第一緩衝部。The module handler of the present invention may include: a first module transfer part for picking up a plurality of modules from a tray of the loading part, and loading the picked up plurality of modules into the loading position. a first buffer part; a second module transfer part for picking up a plurality of modules from the second buffer part located at the unloading position, and loading the picked up plural modules onto the tray of the unloading part; The first transfer tool is used to pick up a plurality of modules from the first buffer part located at the first exchange position, and load the picked up plural modules into the test socket of the test part; the second transfer tool, The method is used to pick up the plurality of modules that have been inspected from the test socket of the test part, and load the picked up plurality of modules into the first buffer part located at the second exchange position.

所述模組以其板面朝向水平方向地移動;所述托盤以X軸方向間隔第一間距地配置各個模組,所述測試部的測試插座以X軸方向間隔第二間距地配置;所述第一緩衝部及所述第二緩衝部包括複數個裝載組,所述複數個裝載組包括以X軸方向間隔第二間距地配置的複數個裝載部,所述複數個裝載組的各個裝載組的裝載部與其他裝載組中的相鄰的裝載部可間隔第一間距地配置。The module moves with its board surface in the horizontal direction; the tray arranges each module at a first interval in the X-axis direction, and the test socket of the test part is arranged at a second interval in the X-axis direction; so The first buffer part and the second buffer part include a plurality of loading groups, the plurality of loading groups include a plurality of loading sections arranged at a second interval in the X-axis direction, and each load of the plurality of loading groups The loading portion of a group may be arranged at a first distance from adjacent loading portions in other loading groups.

所述第一傳送工具及所述第二傳送工具包括n個(n為2以上的自然數)拾取部,所述拾取部以X軸方向間隔所述第二間距地配置;所述複數個裝載組的X軸方向的數量為m(m為1以上的自然數)。The first transfer tool and the second transfer tool include n (n is a natural number of 2 or more) pick-up parts, and the pick-up parts are arranged at the second pitch in the X-axis direction; the plurality of loaders The number of groups in the X-axis direction is m (m is a natural number greater than 1).

所述測試插座的X軸方向的數量為n個,所述測試插座能够以X軸方向間隔所述第二間距地配置。The number of the test sockets in the X-axis direction is n, and the test sockets can be arranged at the second spacing in the X-axis direction.

所述第一傳送工具及所述第二傳送工具可包括:線性移動部件,沿X軸方向進行線性移動;上下移動部件,可上下移動地結合於所述線性移動部件;一個以上的拾取部,包括一對夾持器,所述一對夾持器結合於所述上下移動部件,以模組的長度方向彼此朝向相反的方向移動來夾持模組的兩端部;線性驅動部,結合於所述上下移動部件,以夾持及解除夾持的方向移動所述一對夾持器;主上下移動部,上下移動所述上下移動部件。The first conveying tool and the second conveying tool may include: a linear moving part that moves linearly along the It includes a pair of clamps, which are combined with the up and down moving parts, and move in opposite directions in the length direction of the module to clamp both ends of the module; a linear drive part, combined with The vertical moving part moves the pair of clampers in clamping and releasing directions; the main vertical moving part moves the vertical moving part up and down.

所述第一傳送工具及所述第二傳送工具可包括:加壓部,設置在所述一對夾持器之間,通過上下移動向下側加壓模組;輔助上下移動部,上下移動所述加壓部。The first transfer tool and the second transfer tool may include: a pressurizing part disposed between the pair of clampers, which presses the module module downward by moving up and down; and an auxiliary up and down moving part, which moves up and down. The pressurizing part.

所述線性驅動部可包括:螺絲部,通過旋轉使所述一對夾持器的移動部件以模組的長度方向彼此朝向相反的方向移動;旋轉驅動部,直接或者間接旋轉所述螺絲部。The linear driving part may include: a screw part that rotates to move the moving parts of the pair of clamps in opposite directions in the length direction of the module; and a rotational driving part that directly or indirectly rotates the screw part.

所述旋轉驅動部通過旋轉力傳遞工具可旋轉驅動螺絲部。The rotational driving part can rotationally drive the screw part through a rotational force transmission tool.

以模組的長度方向設置複數個所述拾取部。A plurality of the pickup parts are arranged in the length direction of the module.

透過一個旋轉驅動部可旋轉驅動所述複數個拾取部的螺絲部。The screw portions of the plurality of pickup portions can be rotationally driven by one rotational driving portion.

所述複數個拾取部的螺絲部與相鄰的螺絲部形成一體,或者通過連接器相互連接,可被一個旋轉驅動部旋轉驅動。The screw parts of the plurality of pickup parts are integrated with adjacent screw parts, or are connected to each other through connectors, and can be rotationally driven by one rotation driving part.

所述模組可以是DIMM規格的DRAM或者so-DIMM規格的DRAM。The module may be a DRAM with DIMM specifications or a DRAM with so-DIMM specifications.

本發明還提供一種傳送工具,用以傳送模組,所述模組形成直角四邊形形狀並處於板面朝向X軸方向的狀態,包括:線性移動部件,沿X軸方向進行線性移動;上下移動部件,可上下移動地結合於所述線性移動部件;一個以上的拾取部,包括一對夾持器,所述一對夾持器結合於所述上下移動部件,以模組的長度方向彼此朝向相反的方向移動來夾持模組的兩端部;線性驅動部,結合於所述上下移動部件,以夾持及解除夾持方向移動所述一對夾持器;主上下移動部,上下移動所述上下移動部件。 《發明的效果》 The present invention also provides a transmission tool for transporting modules. The modules form a right-angled quadrilateral shape and are in a state where the board surface faces the X-axis direction. It includes: a linear moving component for linear movement along the X-axis direction; and an up and down moving component. , can be coupled to the linear moving component up and down; more than one pick-up part includes a pair of clamps, the pair of grippers is coupled to the vertical moving component, with the length direction of the module facing opposite to each other. move in the direction to clamp both ends of the module; the linear drive part, combined with the up and down moving parts, moves the pair of clampers in the clamping and releasing directions; the main up and down moving part moves the up and down The above-mentioned up and down moving parts. "The Effect of Invention"

根據本發明一特徵,模組處理器及設置在該模組處理器的傳送工具為,在從托盤向測試部的測試插座傳遞模組時,利用調整托盤上的模組之間的間距及測試部的測試插座之間的間距的緩衝部進行傳遞,進而流暢且快速傳送模組,具有能够更加快速檢查模組的優點。According to a feature of the present invention, the module processor and the transfer tool provided on the module processor are used to adjust the spacing between the modules on the tray and test when transferring the module from the tray to the test socket of the test part. The module is transmitted smoothly and quickly through the buffer portion of the spacing between the test sockets, which has the advantage of being able to inspect the module more quickly.

更進一步地,在模組傳送過程中,在緩衝部與測試部之間還配置用於暫時裝載及充分加熱模組的往返部,進而具有能够靈活營造檢查模組的條件及快速檢查模組的優點。Furthermore, during the module transfer process, a reciprocating part for temporarily loading and fully heating the module is disposed between the buffer part and the test part, thereby having the ability to flexibly create conditions for inspecting the module and quickly inspect the module. advantage.

根據本發明的另一特徵,模組處理器及設置在該模組處理器的傳送工具為,測試部以i×j(i為2以上的自然數,j為1以上的自然數)的排列配置測試插座,以該測試部為中心配置一對緩衝部,以裝載待執行測試的模組及/或者卸除完成測試的模組,進而具有對於DIMM規格的DRAM或者so-DIMM規格等的模組能够更加快速執行測試的優點。According to another feature of the present invention, the module processor and the transfer tool provided in the module processor are such that the test sections are arranged in an i×j (i is a natural number of 2 or more, and j is a natural number of 1 or more) Configure a test socket, and configure a pair of buffer parts with the test part as the center to load the module to be tested and/or remove the module that has completed the test, and then have a module for DIMM specification DRAM or so-DIMM specification, etc. The advantage is that the group can perform tests more quickly.

尤其是,將以所述測試部為中心配置在一側的緩衝部靈活用作執行待執行測試的模組的裝載的裝載緩衝部,將配置在另一側的緩衝部靈活用作執行完成測試的模組的卸除的卸除緩衝部,進而具有能够更加有效執行模組的裝載、測試及卸除的優點。 In particular, the buffer section arranged on one side with the test section as the center can be flexibly used as a load buffer section for loading the module to be tested, and the buffer section arranged on the other side can be flexibly used as a load buffer section for executing the completed test. The removal buffer portion for removal of the module has the advantage of being able to perform loading, testing and removal of the module more efficiently.

下面,參照附圖,進行本發明的模組處理器及設置在該模組處理器的傳送工具的相關說明。Next, the module processor of the present invention and the transfer tool provided in the module processor will be described with reference to the accompanying drawings.

如圖1至圖10b所示,本發明第一實施例的模組處理器包括:裝載部100,用於在托盤10裝載複數個模組20;第一緩衝部330,用於從所述裝載部100接收複數個模組20來暫時裝載;測試部200,設置在測試位置,用於在插入模組20之後執行預先設定的檢查,所述測試位置設定在預先設定的動作路徑L上;一個以上的往返部310,可移動地設置,以沿所述動作路徑L循環於在所述動作路徑L上設定的裝載位置、所述測試位置及卸載位置,並從所述第一緩衝部330接收複數個模組20來傳遞至所述測試部200;第二緩衝部340,用於在所述卸載位置從所述往返部310接收完成檢查的複數個模組20來暫時裝載;卸除部400,用於從所述第二緩衝部340接收複數個模組20,按照預先設定的分類標準卸除於托盤10。As shown in Figures 1 to 10b, the module processor according to the first embodiment of the present invention includes: a loading part 100 for loading a plurality of modules 20 on the pallet 10; a first buffer part 330 for loading The part 100 receives a plurality of modules 20 for temporary loading; the test part 200 is set at a test position for performing preset inspections after inserting the modules 20, and the test position is set on the preset action path L; one The above reciprocating part 310 is movably provided to circulate along the action path L at the loading position, the test position and the unloading position set on the action path L, and receives data from the first buffer part 330. The plurality of modules 20 are transferred to the testing part 200; the second buffer part 340 is used to receive the plurality of inspected modules 20 from the shuttle part 310 at the unloading position for temporary loading; the unloading part 400 , used to receive a plurality of modules 20 from the second buffer part 340 and unload them to the tray 10 according to preset classification standards.

在此,所述模組20為SDRM等的儲存模組、快閃記憶體等的NAND RAM模組、M.2等的SSD等模組(以下,統稱為「模組」),作為在預定規格的PCB的兩面中的至少一面固定一個以上的記憶體等的電子産品,只要是電檢查對象都可以是所述模組20。Here, the module 20 is a storage module such as an SDRM, a NAND RAM module such as a flash memory, an SSD such as an M.2 module (hereinafter collectively referred to as a "module"), and is used as a predetermined Any electronic product such as a memory that has one or more electronic products fixed on at least one of the two sides of a standard PCB can be the module 20 as long as it is an electrical inspection target.

尤其是,所述模組20可以是DIMM規格的DRAM或者so-DIMM規格的DRAM。In particular, the module 20 may be a DRAM with DIMM specifications or a DRAM with so-DIMM specifications.

另一方面,所述模組20形成為具有相對更長的長邊的直角四邊形形狀,諸如DIMM規格的DRAM或者so-DIMM規格的DRAM,為了能够安裝在諸如主機板的插座使用,在長邊的一側中的上面及底面形成端子連接部分。On the other hand, the module 20 is formed into a right-angled quadrilateral shape with a relatively longer long side, such as a DIMM standard DRAM or an so-DIMM standard DRAM. In order to be installed in a socket such as a motherboard, the long side is The upper and lower surfaces of one side form the terminal connection portion.

據此,本發明的模組處理器為,將模組20垂直豎立以使端子連接部分位於下側,亦即在使板面朝向水平方向地裝載於托盤10的狀態下裝載/卸除模組20。Accordingly, in the module handler of the present invention, the module 20 is erected vertically so that the terminal connection portion is located on the lower side, that is, the module is loaded/unloaded on the tray 10 with the board surface facing the horizontal direction. 20.

然後,如圖2a及圖2b所示,所述托盤10為放置在模組20一側的上面及底面中的至少一面所形成的端子連接部分以進行傳送的結構,根據模組20的規格,只要是能够以豎立的狀態放置模組20的結構均可,可以是任何一種結構。Then, as shown in Figures 2a and 2b, the tray 10 is placed on the terminal connection portion formed on at least one of the upper and bottom surfaces of the module 20 for transportation. According to the specifications of the module 20, Any structure may be used as long as the module 20 can be placed in an upright state.

另外,所述模組20使板面朝向水平方向進行傳送時,所述托盤10可使各個模組20間隔第一間距P1配置。In addition, when the module 20 transports the board surface in the horizontal direction, the pallet 10 can arrange each module 20 at a first distance P1.

所述裝載部100為用以在托盤10裝載複數個模組20的結構,可實現為各種結構。The loading part 100 is a structure used to load a plurality of modules 20 on the tray 10, and can be implemented in various structures.

作為一示例,如圖1至圖2b所示,所述裝載部100能够以在主體的前方側暴露一個以上的托盤10(例如三個托盤10)的狀態配置。As an example, as shown in FIGS. 1 to 2 b , the loading portion 100 can be configured in a state in which one or more trays 10 (for example, three trays 10 ) are exposed on the front side of the main body.

在此,考慮測試部200的檢查速度等,可決定所述裝載部100裝載的數量(諸如三個等)。Here, the number (such as three, etc.) loaded by the loading part 100 may be determined by considering the inspection speed of the testing part 200 and the like.

然後,根據放置複數個模組20的托盤10的供應結構,所述裝載部100可實現各種結構;如圖2a至圖2b所示,所述裝載部100可具有托盤堆棧器500,所述托盤堆棧器500上下層疊托盤10並依次向上側上升托盤10。Then, according to the supply structure of the pallets 10 on which the plurality of modules 20 are placed, the loading part 100 can realize various structures; as shown in FIG. 2a to FIG. 2b , the loading part 100 can have a pallet stacker 500. The stacker 500 stacks the pallets 10 up and down and sequentially lifts the pallets 10 upward.

所述托盤堆棧器500為上下層疊托盤10並依次向上側上升托盤10的結構,可包括:引導部520,引導層疊的托盤10的上下移動;以及升降部510,沿所述引導部520升降所述托盤10。The pallet stacker 500 has a structure in which pallets 10 are stacked up and down and the pallets 10 are sequentially lifted upward. The pallet stacker 500 may include: a guide part 520 that guides the stacked pallets 10 to move up and down; and a lifting part 510 that lifts and lowers the stacked pallets 10 along the guide part 520. The tray 10.

所述引導部520為與平面形狀為直角四邊形的托盤10的各個頂點相對應設置以引導托盤10的上下移動的結構,可實現為各種結構。The guide portion 520 is a structure provided corresponding to each vertex of the pallet 10 having a right-angled planar shape to guide the up and down movement of the pallet 10 , and can be implemented in various structures.

所述升降部510為沿所述引導部520升降所述托盤10的結構,可包括托盤放置部及升降驅動部,所述托盤放置部放置托盤10,所述升降驅動部升降驅動所述托盤放置部。The lifting part 510 is a structure that lifts and lowers the tray 10 along the guide part 520, and may include a tray placing part and a lifting driving part. The tray placing part places the tray 10, and the lifting driving part lifts and drives the tray to be placed. department.

另一方面,如圖1所示,所述裝載部100以主體為準可在前方排成一列,此時可設置托盤傳送器(未顯示)來傳送托盤10,以供應裝有待檢查的模組20的新托盤10,或者將拾取模組20而空置的托盤10傳送至後述的的空托盤放置部410等。On the other hand, as shown in FIG. 1 , the loading sections 100 can be arranged in a row in front of the main body. At this time, a pallet conveyor (not shown) can be set up to convey the pallets 10 to supply the modules to be inspected. 20 of new pallets 10, or the empty pallets 10 picked up by the module 20 are transferred to the empty pallet placing part 410 described later.

所述第一緩衝部330為從所述裝載部100接收複數個模組20來暫時裝載的結構,可實現為各種結構。The first buffer portion 330 has a structure that receives a plurality of modules 20 from the loading portion 100 and temporarily loads them, and can be implemented in various structures.

作為一示例,如圖5a及圖5b所示,所述第一緩衝部330可由緩衝板331構成,所述緩衝板331具有放置模組20的複數個裝載槽332、333。As an example, as shown in FIG. 5a and FIG. 5b , the first buffer part 330 may be composed of a buffer plate 331 having a plurality of loading slots 332 and 333 for placing the module 20 .

所述緩衝板331為具有放置模組20的複數個裝載槽332、333的結構,根據複數個裝載槽332、333的配置結構,可實現為各種結構。The buffer plate 331 has a structure having a plurality of loading slots 332 and 333 for placing the module 20. It can be implemented in various structures according to the arrangement structure of the plurality of loading slots 332 and 333.

另一方面,所述緩衝板331可具有溫度控制部,所述溫度控制部按照後述的測試部200中的測試溫度條件加熱或者冷却模組20。On the other hand, the buffer plate 331 may have a temperature control part that heats or cools the module 20 according to the test temperature conditions in the test part 200 described later.

所述溫度控制部為按照對模組20的測試溫度條件預先加熱或者冷却模組20的結構,根據溫度控制方式,可實現為各種結構,諸如加熱器、熱介質循環管、熱電模組等。The temperature control part is a structure that preheats or cools the module 20 according to the test temperature condition of the module 20. According to the temperature control method, it can be implemented as various structures, such as a heater, a heat medium circulation tube, a thermoelectric module, etc.

另一方面,後述測試部200的測試插座210可間隔第二間距P2配置,為了形成測試條件,所述第二間距P2設定成不同於在所述托盤10上的模組20間隔的第一間距P1,例如可大於第一間距P1。On the other hand, the test sockets 210 of the test part 200 described later can be arranged at a second spacing P2. In order to form a test condition, the second spacing P2 is set to be different from the first spacing between the modules 20 on the tray 10. P1, for example, may be greater than the first distance P1.

據此,有必要在從所述托盤10接收的模組20傳遞至測試部200之前將模組20間隔距離,即間距調整為第二間距P2。Accordingly, it is necessary to adjust the distance between the modules 20 received from the tray 10 to the second pitch P2 before the modules 20 are transferred to the test part 200 .

據此,如圖5a及圖5b所示,所述第一緩衝部330的裝載槽332、333之間間隔第一間距P1,進而以所述第一間距P1從所述裝載部100接收模組20,並可改變裝載槽332、333之間的間距,以使裝載槽332、333之間間隔第二間距P2,進而可將模組20間隔第二間距P2地傳遞至位於裝載位置的所述往返部310。Accordingly, as shown in FIGS. 5a and 5b , the loading grooves 332 and 333 of the first buffer part 330 are spaced apart by a first distance P1, and the modules are received from the loading part 100 at the first distance P1. 20, and the distance between the loading slots 332 and 333 can be changed so that the loading slots 332 and 333 are separated by a second distance P2, and then the module 20 can be transferred to the loading position at a second distance P2. Shuttle 310.

據此,所述緩衝板331可具有用於調整裝載槽332、333之間的間距的間距調整部(未顯示)。Accordingly, the buffer plate 331 may have a spacing adjustment portion (not shown) for adjusting the spacing between the loading slots 332 and 333 .

另一方面,作為檢查對象的模組20,根據DIMM規格的DRAM、so-DIMM規格的DRAM等規格,可具有不同的尺寸,例如長邊的長度不同。On the other hand, the module 20 to be inspected may have different sizes, such as different lengths of long sides, depending on standards such as DIMM standard DRAM and so-DIMM standard DRAM.

據此,所述緩衝板331可具有第一規格的第一裝載槽332與第二規格的第二裝載槽333,所述第二裝載槽333與所述第一裝載槽332相鄰設置,所述第二規格不同於所述第一規格。Accordingly, the buffer plate 331 may have a first loading slot 332 of a first specification and a second loading slot 333 of a second specification. The second loading slot 333 is arranged adjacent to the first loading slot 332, so The second specification is different from the first specification.

另一方面,可配置複數個所述第一裝載槽332(例如配置八個所述第一裝載槽332),在與托盤10交換模組時,以模組20的配置方向(例如X軸方向)形成托盤10上的間距(即第一間距P1)。On the other hand, a plurality of first loading slots 332 can be configured (for example, eight first loading slots 332 are configured). When exchanging modules with the pallet 10 , the module 20 can be configured in the direction of arrangement (for example, the X-axis direction). ) forms the spacing on the pallet 10 (ie, the first spacing P1).

另外,可配置複數個與所述第一裝載槽332相鄰設置的第二裝載槽333(例如配置八個第二裝載槽333),在與托盤10交換模組時,以模組20的配置方向(例如X軸方向)形成托盤10上的間距(即第一間距P1)。In addition, a plurality of second loading slots 333 adjacent to the first loading slot 332 can be configured (for example, eight second loading slots 333 are configured). When exchanging modules with the pallet 10 , the module 20 can be configured according to the configuration of the module 20 . The direction (for example, the X-axis direction) forms the pitch on the tray 10 (ie, the first pitch P1).

作為一示例,所述第一裝載槽332及所述第二裝載槽333以X軸方向配置的數量可以是後述的測試部200的測試插座210的數量的N倍(N為1以上的自然數)。As an example, the number of the first loading slots 332 and the second loading slots 333 arranged in the X-axis direction may be N times the number of test sockets 210 of the test unit 200 described later (N is a natural number greater than 1. ).

另一方面,所述第一緩衝部330與後述的第二緩衝部340一同以X軸方向排成一列。On the other hand, the first buffer portion 330 and the second buffer portion 340 described below are aligned in the X-axis direction.

亦即,以主體的正面為準,所述裝載部100及所述卸除部400以X軸方向排成第一列,在這後方的所述第一緩衝部330及所述第二緩衝部340排成第二列,最後後述的往返部310及測試部200沿動作路徑L配置(即排成第三列)。That is, based on the front side of the main body, the loading part 100 and the unloading part 400 are arranged in the first row in the X-axis direction, and the first buffer part 330 and the second buffer part behind this 340 is arranged in the second row, and finally the reciprocating part 310 and the test part 200, which will be described later, are arranged along the operation path L (that is, arranged in the third row).

另一方面,在所述裝載部100與所述第一緩衝部330之間傳送模組20可透過第一模組傳送部610執行。On the other hand, transferring the module 20 between the loading part 100 and the first buffer part 330 may be performed through the first module transferring part 610 .

所述第一模組傳送部610為從裝載部100的托盤10拾取模組20傳送至第一緩衝部330的裝載槽332、333來進行裝載的結構,根據模組20的拾取及放置結構,可實現為各種結構。The first module transfer part 610 is a structure that picks up the module 20 from the tray 10 of the loading part 100 and transfers it to the loading slots 332 and 333 of the first buffer part 330 for loading. According to the pick-up and placement structure of the module 20, Can be implemented in various structures.

作為一示例,如圖3a至圖4所示,所述第一模組傳送部610可包括:移動支撐部615,設置成在裝載部100及第一緩衝部330上移動,例如以X軸方向及Y軸方向移動;以及複數個拾取部,結合於所述移動支撐部615,托盤10上的模組20以配置方向間隔第一間距P1地配置。As an example, as shown in FIGS. 3 a to 4 , the first module transfer part 610 may include: a moving support part 615 configured to move on the loading part 100 and the first buffer part 330 , for example, in the X-axis direction. and Y-axis direction movement; and a plurality of pick-up parts, coupled to the moving support part 615, the modules 20 on the tray 10 are arranged with a first spacing P1 in the arrangement direction.

所述移動支撐部615設置成在裝載部100及第一緩衝部330上移動,例如以X軸方向及Y軸方向移動的結構,可實現為各種結構。The moving support part 615 is configured to move on the loading part 100 and the first buffer part 330, for example, in the X-axis direction and the Y-axis direction, and may be implemented in various structures.

所述拾取部為結合於所述移動支撐部615並且托盤10上的模組20以配置方向間隔第一間距P1地配置的結構,可實現為各種結構。The pickup part is coupled to the moving support part 615 and has a structure in which the modules 20 on the tray 10 are arranged at a first pitch P1 in the arrangement direction, and may be implemented in various structures.

作為一示例,所述拾取部可包括:一對夾持器611,結合於所述移動支撐部615,以模組20的長度方向彼此朝向相反的方向移動來夾持模組20的兩端部;線性驅動部614,以夾持及解除夾持的方向移動所述夾持器611。As an example, the pick-up part may include: a pair of clampers 611 coupled to the moving support part 615 to clamp both ends of the module 20 by moving in opposite directions along the length of the module 20 ; Linear drive portion 614 moves the clamper 611 in the direction of clamping and releasing.

然後,所述拾取部為形成N×M(N為1以上的自然數,M為1以上的自然數)的排列,可配置成各種排列結構,進而能够拾取並傳送複數個模組20。Then, the pickup unit forms an arrangement of N×M (N is a natural number equal to or greater than 1, and M is a natural number equal to or equal to 1), and can be arranged in various arrangement structures, thereby being able to pick up and transport a plurality of modules 20 .

另一方面,作為拾取對象的模組20的規格可有所不同,為了能够處理二種以上的模組20,如圖3a及圖3b所示,本發明的模組處理器可將所述拾取部構成為可調整一對夾持器611之間的間距D 1及D 2On the other hand, the specifications of the modules 20 that are picked up may be different. In order to be able to process two or more types of modules 20, as shown in FIG. 3a and FIG. 3b, the module processor of the present invention can process the picked up modules 20. The structure is such that the distances D 1 and D 2 between the pair of clamps 611 can be adjusted.

然後,所述一對夾持器611可具有緩衝部件,所述緩衝部件具有伸縮性的合成樹脂等的材料,以靈活夾持模組20的兩端部。Then, the pair of clampers 611 may have a buffer member made of a material such as stretchable synthetic resin to flexibly clamp both ends of the module 20 .

所述測試部200為設置於在預先設定的動作路徑L上設定的測試位置並在插入模組20之後執行預先設定的檢查的結構,根據用於測試模組20的測試模組(未顯示)的結構,可實現為各種結構。The test unit 200 is configured to be installed at a test position set on a preset action path L and perform a preset inspection after inserting the module 20 . According to the test module (not shown) used to test the module 20 The structure can be implemented in various structures.

作為一示例,如上所述,所述測試部200可包括:複數個測試插座210,間隔第二間距P2地配置;測試模組(未顯示),通過所述測試插座210對於模組20施加電訊號以對於模組20執行檢查;模組工具640,對於所述測試插座拾取或者放置模組20。As an example, as mentioned above, the test part 200 may include: a plurality of test sockets 210, arranged at a second interval P2; a test module (not shown), and the test socket 210 applies telecommunications to the module 20. No. 640 is used to perform inspection on the module 20; a module tool 640 is used to pick up or place the module 20 on the test socket.

所述測試插座210為通過模組工具640放置模組20之後將由測試模組産生的電訊號傳輸至模組20的結構,可實現為各種結構。The test socket 210 is a structure that transmits electrical signals generated by the test module to the module 20 after placing the module 20 through the module tool 640, and can be implemented in various structures.

作為一示例,所述測試插座210可包括:測試槽211,插入模組20的端子部分;鈎部219,對測試插座210固定模組20,或者在分離時解除掛鈎。As an example, the test socket 210 may include: a test slot 211, which is inserted into the terminal part of the module 20; and a hook 219, which fixes the module 20 to the test socket 210 or releases the hook when separated.

所述測試模組為通過所述測試插座210對模組20施加電訊號來對模組20執行檢查的結構,根據對模組20的測試方式,可實現為各種結構,並可由可確認在實際安裝環境下是否驅動的模組構成。The test module is a structure that applies electrical signals to the module 20 through the test socket 210 to perform inspection on the module 20. It can be implemented in various structures according to the test method of the module 20, and can be confirmed in actual use. Whether the driver module is configured in the installation environment.

所述模組工具640為對所述測試插座拾取或者放置及加壓模組20的結構,根據拾取模組20的結構,可實現為各種結構。The module tool 640 is a structure for picking up or placing the test socket and pressing the module 20, and can be implemented in various structures according to the structure of the pickup module 20.

作為一示例,如圖9a至圖9f所示,所述模組工具640可包括:工具主體,被支撐構件支撐;複數個拾取工具648,以對應於所述複數個測試插座210的數量及間距配置,並結合於所述工具主體。As an example, as shown in FIGS. 9a to 9f , the module tool 640 may include: a tool body supported by a support member; and a plurality of picking tools 648 corresponding to the number and spacing of the plurality of test sockets 210 configured and coupled to the tool body.

所述拾取工具648為以對應於所述複數個測試插座210的數量及間距配置並結合於所述工具主體的結構,可具有與上述的第一模組傳送部610類似的結構。The pickup tool 648 is configured in a number and spacing corresponding to the plurality of test sockets 210 and is coupled to the tool body, and may have a similar structure to the first module transfer part 610 described above.

具體地說,所述拾取工具648為結合於所述工具主體,拾取往返部310上的模組20來放置於測試插座210,在執行測試之後從測試插座210拾取模組20來放置於後述的卸除往返部320的裝載槽322, 323, 324, 325的結構,可實現為各種結構。Specifically, the picking tool 648 is combined with the tool body, picks up the module 20 on the reciprocating part 310 and places it in the test socket 210, and after performing the test, picks up the module 20 from the test socket 210 and places it in the test socket 210 as described later. The structure in which the loading grooves 322, 323, 324, 325 of the reciprocating part 320 are removed can be implemented in various structures.

作為一示例,所述拾取工具648可包括:一對夾持器641,結合於所述工具主體,以模組20的長度方向彼此朝向相反的方向移動來夾持模組20的兩端部;線性驅動部(未顯示),以夾持及解除夾持的方向移動所述夾持器641。As an example, the picking tool 648 may include: a pair of clampers 641, coupled to the tool body, moving in opposite directions along the length of the module 20 to clamp both ends of the module 20; The linear driving part (not shown) moves the clamper 641 in the direction of clamping and releasing.

然後,所述拾取工具648為對應於測試插座210的配置成N×M(N為1以上的自然數,M為1以上的自然數)的排列,例如2×8、4×8等的排列配置,以拾取並傳送複數個模組20。Then, the pick-up tool 648 is configured in an N×M (N is a natural number above 1, M is a natural number above 1) arrangement corresponding to the test socket 210 , such as a 2×8, 4×8, etc. arrangement. Configured to pick up and deliver multiple modules20.

另一方面,作為拾取對象的模組20的規格可有所不同,為了能够處理二種以上的模組20,如圖9a及圖9b所示,所述拾取工具648可調整一對夾持器611間隔的間距。On the other hand, the specifications of the modules 20 to be picked up may be different. In order to be able to handle two or more types of modules 20, as shown in Figures 9a and 9b, the picking tool 648 can adjust a pair of grippers. 611 interval spacing.

然後,所述一對夾持器641可具有緩衝部件,所述緩衝部件為具有伸縮性的合成樹脂等材料,以靈活夾持模組20的兩端部。Then, the pair of clamps 641 may have buffer members made of stretchable synthetic resin or other materials to flexibly clamp both ends of the module 20 .

另一方面,如圖9b所示,所述一對夾持器641在從測試插座210分離模組20時下降來加壓鈎部219,進而可解除對於模組20結合測試插座210的狀態。On the other hand, as shown in FIG. 9 b , when the module 20 is separated from the test socket 210 , the pair of holders 641 descends to press the hook 219 , thereby releasing the module 20 from being coupled to the test socket 210 .

在此,在所述鈎部219被加壓時,可向上側彈出模組20,為了防止該現象,加壓部649下降可防止模組20過度向上側彈出。Here, when the hook portion 219 is pressurized, the module set 20 can be ejected upward. To prevent this phenomenon, the pressing portion 649 is lowered to prevent the module set 20 from being excessively ejected upward.

然後,若解除測試插座210結合所述模組20的狀態,則經過在圖9c及圖9d顯示的過程,拾取工具648可針對測試插座210拾取模組20。Then, if the state of the test socket 210 combined with the module 20 is released, the picking tool 648 can pick up the module 20 for the test socket 210 through the processes shown in FIG. 9 c and FIG. 9 d.

另一方面,所述拾取工具648經過在圖10a至圖10c顯示的過程可將模組20放置,亦即安裝於測試插座210。On the other hand, the picking tool 648 can place the module 20 through the process shown in FIGS. 10 a to 10 c , that is, install it on the test socket 210 .

此時,所述拾取工具648可包括加壓部649,所述加壓部649通過上下移動向測試插座210加壓模組20,以在模組20放置於測試插座210時可使模組20穩定地安裝在測試插座210。At this time, the pick-up tool 648 may include a pressurizing part 649 that presses the module 20 to the test socket 210 by moving up and down, so that when the module 20 is placed on the test socket 210, the module 20 can Stably mounted on test socket 210.

所述加壓部649為通過上下移動向測試插座210加壓模組20以在模組20放置於測試插座210時可使模組20穩定地安裝在測試插座210的結構,可實現為各種結構。The pressurizing part 649 is a structure that presses the module 20 to the test socket 210 by moving up and down so that the module 20 can be stably installed on the test socket 210 when the module 20 is placed in the test socket 210. It can be implemented in various structures. .

所述往返部310為可移動地設置以依次循環於在所述動作路徑L上設定的裝載位置、測試及卸載位置,並從所述第一緩衝部330接收複數個模組20來傳遞至所述測試部200結構,可實現為各種結構。The shuttle part 310 is movably disposed to sequentially cycle through the loading position, test and unloading position set on the action path L, and receives a plurality of modules 20 from the first buffer part 330 and delivers them to the desired location. The structure of the test unit 200 described above can be implemented in various structures.

在此,所述裝載位置是為了從上述的第一緩衝部330接收模組20而設定在往返部310所在的位置,卸載位置是為了向後述的第二緩衝部340傳遞模組20而設定在往返部310所在的位置。Here, the loading position is set at the position where the reciprocating part 310 is located in order to receive the module 20 from the first buffer part 330 mentioned above, and the unloading position is set at the position where the module 20 is transferred to the second buffer part 340 (described later). The location of the shuttle 310.

然後,所述測試部設定在從測試插座210拾取模組20的模組工具640的拾取工具648可接收模組20的位置,亦即從測試部200傳遞待檢查的模組20並接收完成檢查的模組20的位置。Then, the test part is set at a position where the picking tool 648 of the module tool 640 that picks up the module 20 from the test socket 210 can receive the module 20 , that is, the module 20 to be inspected is transferred from the test part 200 and received to complete the inspection. The location of module 20.

另一方面,所述往返部310可具有與上述第一緩衝部330類似的結構。On the other hand, the shuttle portion 310 may have a similar structure to the first buffer portion 330 described above.

作為一示例,如圖6及圖7所示,所述往返部310可由往返板311構成,所述往返板311具有放置模組20的複數個裝載槽312、313。As an example, as shown in FIGS. 6 and 7 , the shuttle portion 310 may be composed of a shuttle plate 311 having a plurality of loading slots 312 and 313 for placing the module 20 .

所述往返板311為具有放置模組20的複數個裝載槽312、313的結構,根據複數個裝載槽312、313的配置結構,可實現為各種結構。The shuttle plate 311 has a structure having a plurality of loading slots 312 and 313 for placing the module 20, and can be implemented in various structures according to the arrangement structure of the plurality of loading slots 312 and 313.

另一方面,所述往返板311可具有溫度控制部,以按照測試部200中的測試溫度條件加熱或者冷却模組20。On the other hand, the shuttle plate 311 may have a temperature control part to heat or cool the module 20 according to the test temperature condition in the test part 200 .

所述溫度控制部為按照對模組20的測試溫度條件預先加熱或者冷却模組20的結構,根據溫度控制方式,可實現為各種結構,諸如加熱器、熱介質循環管、熱電模組等。The temperature control part is a structure that preheats or cools the module 20 according to the test temperature condition of the module 20. According to the temperature control method, it can be implemented as various structures, such as a heater, a heat medium circulation tube, a thermoelectric module, etc.

亦即,所述往返部310可設置加熱部作為溫度控制部,可在向所述測試部200傳遞模組20之前進行加熱。That is, the reciprocating part 310 may be provided with a heating part as a temperature control part, and may be heated before transferring the module 20 to the testing part 200 .

另一方面,所述測試部200的測試插座210可間隔第二間距P2地配置,此時為了營造測試條件,所述第二間距P2可設定為不同於在所述托盤10上的模組20間隔的第一間距P1,例如可大於第一間距P1。On the other hand, the test sockets 210 of the test part 200 can be arranged at a second spacing P2. At this time, in order to create a test condition, the second spacing P2 can be set to be different from the module 20 on the tray 10. The first pitch P1 of the interval may be greater than the first pitch P1, for example.

據此,與上述的第一緩衝部330類似,所述往返部310可將各個裝載槽312、313間隔的間距變為第一間距P1及第二間距P2,或者考慮在上述的第一緩衝部330中間距發生變化,也可間隔與測試部200的測試插座210的間距,亦即第二間距P2相同的間距配置。Accordingly, similar to the above-mentioned first buffer part 330, the reciprocating part 310 can change the spacing between the loading slots 312 and 313 into the first pitch P1 and the second spacing P2, or consider the above-mentioned first buffer part If the pitch changes in 330, the spacing may be the same as the pitch of the test socket 210 of the test part 200, that is, the second pitch P2.

另一方面,如上所述,作為檢查對象的模組20為,根據DIMM規格的DRAM、so-DIMM規格的DRAM等的規格,可具有不同的尺寸,諸如長邊的長度不同。On the other hand, as described above, the module 20 to be inspected may have different sizes, such as different lengths of long sides, depending on the specifications of DIMM standard DRAM, so-DIMM standard DRAM, or the like.

據此,所述緩衝板331可具有第一規格的第一裝載槽312及第二規格的第二裝載槽313,所述第二裝載槽313與所述第一裝載槽312相鄰設置,所述第二規格不同於所述第一規格。Accordingly, the buffer plate 331 may have a first loading slot 312 of a first specification and a second loading slot 313 of a second specification. The second loading slot 313 is arranged adjacent to the first loading slot 312, so The second specification is different from the first specification.

另一方面,所述第一裝載槽312及第二裝載槽313為對應於測試插座210的配置,可配置成N×M(N為1以上的自然數,M為1以上的自然數)的排列,例如2×8、4×8等的排列。On the other hand, the first loading slot 312 and the second loading slot 313 correspond to the configuration of the test socket 210 and can be configured in N×M (N is a natural number above 1, M is a natural number above 1) Arrangements, such as 2×8, 4×8, etc.

另一方面,對於所述測試部200執行檢查的模組20,較佳為在傳遞至測試部200之前檢查條件,例如檢查溫度條件下執行檢查。On the other hand, for the module 20 that is inspected by the test unit 200 , it is preferable to perform inspection under inspection conditions, such as inspection temperature conditions, before being transferred to the test unit 200 .

尤其是,所述檢查溫度條件通常在80℃等高溫條件下執行檢查的情況較多,有必要將模組20的溫度控制在檢查溫度條件(亦即加熱模組20)。In particular, the inspection temperature condition is often performed under high temperature conditions such as 80° C., so it is necessary to control the temperature of the module 20 to the inspection temperature condition (that is, to heat the module 20 ).

然而,從所述裝載部100向測試部200傳送模組20的傳送時間短而無法充分加熱,在該狀態下將模組20傳遞至測試部200時存在降低對於模組20的檢查可靠性的問題。However, the transfer time of the module 20 from the loading part 100 to the test part 200 is short and the module 20 cannot be heated sufficiently. In this state, when the module 20 is transferred to the test part 200 , the reliability of the inspection of the module 20 may be reduced. problem.

據此,所述往返部310較佳構成為具有加熱部,亦即控制溫度的同時為了確保充分的溫度控制時間而放置相對更多數量的模組20。Accordingly, the reciprocating part 310 is preferably configured to have a heating part, that is, while controlling the temperature, a relatively larger number of modules 20 are placed in order to ensure sufficient temperature control time.

據此,所述往返部310將間隔第二間距P2配置的裝載槽312、313、314、315作為一個裝載槽組,可配置複數個裝載槽組。Accordingly, the shuttle 310 uses the loading slots 312, 313, 314, and 315 arranged at the second distance P2 as one loading slot group, and a plurality of loading slot groups can be arranged.

作為一示例,所述往返部310將放置第一規格的模組20的第一裝載槽312及與所述第一裝載槽312相鄰設置並放置第二規格的模組20的第二裝載槽313組成小組,沿移動方向配置n個以上(n為2以上的自然數)的所述小組來構成中間組,所述中間組的小組與相鄰的中間組的小組間隔的間距可配置成與所述測試部200的測試插座210的間距相對應的第二間距P2。As an example, the shuttle 310 has a first loading slot 312 for placing the module 20 of the first specification and a second loading slot adjacent to the first loading slot 312 for placing the module 20 of the second specification. 313 is formed into small groups, and more than n (n is a natural number of 2 or more) of the small groups are arranged along the moving direction to form an intermediate group. The distance between the small groups of the intermediate group and the adjacent intermediate group can be configured to be equal to The distance between the test sockets 210 of the test part 200 corresponds to the second distance P2.

通過如上所述的結構,將在所述往返部310預先放置的模組20傳遞至測試部200,在測試部200進行測試中加熱放置於剩餘裝載槽的模組20,進而可確保充分的加熱時間。With the above structure, the modules 20 placed in the shuttle part 310 are transferred to the test part 200, and the modules 20 placed in the remaining loading slots are heated during the test by the test part 200, thereby ensuring sufficient heating. time.

另一方面,如圖8e及圖8a所示,所述往返部310放置在測試位置中由模組工具640拾取的完成檢查的模組20,之後通過模組工具640拾取待檢查的模組20。On the other hand, as shown in FIGS. 8e and 8a , the shuttle 310 is placed in the test position after the inspected module 20 picked up by the module tool 640 , and then the module 20 to be inspected is picked up by the module tool 640 .

此時,為了在卸載位置向第二緩衝部340有效地傳遞模組20,所述往返部310較佳為預先設定放置完成檢查的模組20的位置。At this time, in order to effectively transfer the module 20 to the second buffer part 340 at the unloading position, the reciprocating part 310 is preferably preset at a position where the inspected module 20 is placed.

據此,所述往返部310可設定卸除裝載槽314、315,以放置在測試部200完成檢查的模組20。Accordingly, the reciprocating portion 310 can be configured to remove the loading slots 314 and 315 to place the modules 20 that have been inspected in the testing portion 200 .

如圖6所示,所述卸除裝載槽314、315為在往返部310上的複數個裝載槽中為了放置由測試部200完成檢查的模組20而設定位置的裝載槽,可設定在指定位置,無關於處理製程順序或者時間。As shown in FIG. 6 , the unloading loading slots 314 and 315 are loading slots whose positions are set among the plurality of loading slots on the shuttle part 310 to place the module 20 that has been inspected by the testing part 200 , and can be set at a specified location. Position, regardless of processing sequence or time.

另外,對於所述卸除裝載槽314、315,通過在往返部310中的加熱時間及在測試部200的拾取等可隨機設定位置。 In addition, the positions of the unloading loading slots 314 and 315 can be randomly set by heating time in the shuttle part 310 and picking up in the test part 200 .

亦即,所述卸除裝載槽314、315、324、325為配置在往返部310上並根據模組20的種類配置,放置由測試部200完成檢查的模組20中需要單獨分開的(諸如不合格等)模組20,只有位置與其他裝載槽不同,其餘的與其他裝載槽相同。That is, the unloading loading slots 314, 315, 324, 325 are configured on the shuttle part 310 and are configured according to the type of the module 20, and are placed in the modules 20 that need to be separated (such as Unqualified, etc.) Module 20, only the position is different from other loading slots, the rest is the same as other loading slots.

另一方面,所述往返部310將在所述卸載位置完成檢查的模組20傳遞至第二緩衝部340。On the other hand, the shuttle portion 310 transfers the module 20 that has been inspected at the unloading position to the second buffer portion 340 .

另一方面,可如圖5a至圖8e執行在所述往返部310與測試部200之間拾取及放置模組20、在所述卸載位置的所述測試部200與所述往返部310之間拾取及卸除模組20。On the other hand, picking and placing the module 20 between the shuttle part 310 and the test part 200, and between the test part 200 and the shuttle part 310 in the unloading position may be performed as shown in FIGS. 5a to 8e. Picking up and removing modules20.

具體地說,如圖8a所示,所述往返部310在裝載位置從第一緩衝部330接收模組20。Specifically, as shown in Fig. 8a, the shuttle portion 310 receives the module 20 from the first buffer portion 330 in the loading position.

另一方面,如圖8b所示,所述往返部310移動至測試插座210與模組工具640之間。此時,所述模組工具640處於從測試插座210拾取完成檢查的模組20的狀態。On the other hand, as shown in FIG. 8 b , the shuttle portion 310 moves between the test socket 210 and the module tool 640 . At this time, the module tool 640 is in a state of picking up the inspected module 20 from the test socket 210 .

然後,如圖8c所示,所述模組工具640拾取充分加熱的模組20。Then, as shown in Figure 8c, the mold tool 640 picks up the fully heated mold set 20.

然後,如圖8d所示,所述往返部310為了卸除完成檢查的模組20而移動至卸載位置,之後所述模組工具640下降以將模組20放置於測試插座210之後如圖8e上升,對於放置於測試插座210的模組20執行測試。Then, as shown in FIG. 8d , the reciprocating part 310 moves to the unloading position in order to unload the inspected module 20 , and then the module tool 640 descends to place the module 20 in the test socket 210 as shown in FIG. 8e Rising, the module 20 placed in the test socket 210 is tested.

另一方面,所述往返部310在卸載位置將模組20傳遞至第二緩衝部340之後移動至裝載位置,從第一緩衝部330接收待檢查的新模組20。On the other hand, the shuttle portion 310 transfers the module 20 to the second buffer portion 340 at the unloading position and then moves to the loading position to receive the new module 20 to be inspected from the first buffer portion 330 .

所述第二緩衝部340為在所述卸載位置從所述往返部310接收複數個模組20來暫時裝載的結構,可實現為各種結構。The second buffer portion 340 has a structure that receives a plurality of modules 20 from the shuttle portion 310 at the unloading position and temporarily loads them, and can be implemented in various structures.

作為一示例,如圖5a及圖5b所示,所述第二緩衝部340可由緩衝板341構成,所述緩衝板341配置有用於放置模組20的複數個裝載槽342、343。As an example, as shown in FIG. 5a and FIG. 5b , the second buffer part 340 may be composed of a buffer plate 341 configured with a plurality of loading slots 342 and 343 for placing the module 20 .

所述緩衝板341為配置有用於放置模組20的複數個裝載槽342、343的結構,根據複數個裝載槽342、343的配置結構,可實現為各種結構。The buffer plate 341 is configured with a plurality of loading slots 342 and 343 for placing the module 20, and can be implemented in various structures according to the arrangement of the plurality of loading slots 342 and 343.

另一方面,所述往返部310中的模組20的配置間距為第二間距P2,卸除部400中的托盤10的模組20的配置間距為第一間距P1,在所述卸載位置中,所述往返部310的模組的配置間距及卸除部400的托盤10的模組的配置間距可相互不同。On the other hand, the arrangement pitch of the modules 20 in the reciprocating part 310 is the second pitch P2, and the arrangement pitch of the modules 20 of the tray 10 in the unloading part 400 is the first pitch P1. In the unloading position , the arrangement pitch of the modules of the reciprocating part 310 and the arrangement pitch of the modules of the tray 10 of the removal part 400 may be different from each other.

據此,如圖5a及圖5b所示,所述第二緩衝部340中的裝載槽342、343之間間隔第一間距P1,以使模組20間隔所述第一間距P1地傳遞至所述卸除部400,在所述卸載位置可改變裝載槽342、343之間的間距,使所述裝載槽342、343之間間隔第二間距P2,進而將模組20間隔第二間距P2地傳遞至所述往返部310。Accordingly, as shown in FIG. 5a and FIG. 5b , the loading slots 342 and 343 in the second buffer part 340 are spaced apart by a first spacing P1, so that the module 20 can be transferred to the required space at the first spacing P1. The unloading part 400 can change the distance between the loading slots 342 and 343 in the unloading position, so that the loading slots 342 and 343 are spaced apart by a second distance P2, and thereby the modules 20 are spaced apart by the second distance P2. passed to the shuttle 310.

據此,所述緩衝板341可配置有間距調整部(未顯示),用於調整裝載槽342、343之間的間距。Accordingly, the buffer plate 341 may be configured with a spacing adjustment portion (not shown) for adjusting the spacing between the loading slots 342 and 343 .

另一方面,如上所述,作為檢查對象的模組20,根據DIMM規格的DRAM、so-DIMM規格的DRAM等規格,可具有不同的尺寸,諸如長邊的長度不同。On the other hand, as mentioned above, the module 20 to be inspected may have different sizes, such as different lengths of the long sides, according to standards such as DIMM standard DRAM and so-DIMM standard DRAM.

據此,所述緩衝板341可具有第一規格的第一裝載槽342及第二規格的第二裝載槽343,所述第二裝載槽343與所述第一裝載槽342相鄰設置,所述第二規格不同於所述第一規格。Accordingly, the buffer plate 341 may have a first loading slot 342 of a first specification and a second loading slot 343 of a second specification. The second loading slot 343 is arranged adjacent to the first loading slot 342, so The second specification is different from the first specification.

另一方面,可配置複數個所述第一裝載槽342,例如配置八個所述第一裝載槽342,在與托盤10交換模組時,以模組20的配置方向(例如X軸方向)形成托盤10上的間距(即第一間距P1)。On the other hand, a plurality of first loading slots 342 may be configured, for example, eight first loading slots 342 may be configured. When exchanging modules with the pallet 10 , the configuration direction of the module 20 (for example, the X-axis direction) The pitch on the tray 10 (ie, the first pitch P1) is formed.

另外,可配置複數個與所述第一裝載槽342相鄰設置的第二裝載槽343(例如配置八個第二裝載槽343),在與托盤10交換模組時,以模組20的配置方向(例如X軸方向)形成托盤10上的間距(即第一間距P1)。In addition, a plurality of second loading slots 343 adjacent to the first loading slot 342 can be configured (for example, eight second loading slots 343 are configured). When exchanging modules with the pallet 10 , the module 20 can be configured according to the configuration of the module 20 . The direction (for example, the X-axis direction) forms the pitch on the tray 10 (ie, the first pitch P1).

作為一示例,所述第一裝載槽342及所述第二裝載槽343以X軸方向配置的數量可以是後述測試部200的測試插座210的數量的N倍(N為1以上的自然數)。As an example, the number of the first loading slots 342 and the second loading slots 343 arranged in the X-axis direction may be N times the number of test sockets 210 of the test unit 200 described later (N is a natural number greater than 1). .

所述卸除部400為從所述第二緩衝部340接收複數個模組20以按照預先設定的分類標準卸除於托盤10的結構,可實現為各種結構。The unloading part 400 is a structure that receives a plurality of modules 20 from the second buffer part 340 and unloads them to the tray 10 according to preset classification standards, and can be implemented in various structures.

作為一示例,如圖1至圖2b所示,所述卸除部400能够以在主體的前方側暴露一個以上的托盤10(例如三個托盤10)的狀態配置。As an example, as shown in FIGS. 1 to 2 b , the removal part 400 can be arranged in a state in which one or more trays 10 (for example, three trays 10 ) are exposed on the front side of the main body.

在此,對於所述卸除部400,可考慮測試部200的檢查速度等決定所述的數量,諸如三個等。Here, for the removal part 400 , the number may be determined by taking into account the inspection speed of the test part 200 and the like, such as three.

作為一示例,所述卸除部400可實現為各種結構,例如將在測試部200檢查之後為合格品的模組20裝載於合格品的托盤10、根據檢查結果放置於按照複檢、不合格等分類等級區分的托盤10。As an example, the unloading unit 400 can be implemented in various structures. For example, the module 20 that is a qualified product after being inspected by the testing unit 200 is loaded on the pallet 10 of the qualified product, and is placed on a re-inspection or unqualified product according to the inspection results. 10 pallets with equal classification levels.

為此,所述卸除部400以橫向配置,可由合格品托盤、第一分類托盤、第二分類托盤等構成。For this purpose, the removal part 400 is arranged in a transverse direction, and may be composed of a qualified product tray, a first classification tray, a second classification tray, and the like.

然後,所述卸除部400的結構可與裝載部100類似,如圖2a至圖2b所示,根據裝載複數個模組20的托盤10的供應結構,可實現為各種結構,可具有托盤堆棧器500,所述托盤堆棧器500上下層疊托盤10並依次向上側上升托盤10。Then, the structure of the unloading part 400 can be similar to that of the loading part 100, as shown in Figures 2a to 2b. According to the supply structure of the pallet 10 for loading a plurality of modules 20, it can be implemented in various structures, and can have a pallet stack. The pallet stacker 500 stacks the pallets 10 up and down and sequentially lifts the pallets 10 upward.

所述托盤堆棧器500為上下層疊托盤10並依次向上側上升托盤10的結構,可包括引導部520及升降部510,所述引導部520引導層疊的托盤10上下移動,所述升降部510沿所述引導部520升降所述托盤10。The pallet stacker 500 has a structure in which pallets 10 are stacked up and down and the pallets 10 are lifted upward sequentially. The pallet stacker 500 may include a guide part 520 and a lifting part 510. The guide part 520 guides the stacked pallets 10 to move up and down. The lifting part 510 moves along the The guide part 520 lifts and lowers the tray 10 .

所述引導部520為對應於平面形狀為直角四邊形的托盤10的各個頂點設置以引導托盤10的上下移動的結構,可實現為各種結構。The guide portion 520 is a structure provided corresponding to each vertex of the pallet 10 having a right-angled planar shape to guide the up and down movement of the pallet 10 , and can be implemented in various structures.

所述升降部510為沿所述引導部520升降所述托盤10的結構,可包括托盤放置部及升降驅動部,所述托盤放置部放置托盤10,所述升降驅動部升降驅動所述托盤放置部。The lifting part 510 is a structure that lifts and lowers the tray 10 along the guide part 520, and may include a tray placing part and a lifting driving part. The tray placing part places the tray 10, and the lifting driving part lifts and drives the tray to be placed. department.

另一方面,在所述第二緩衝部340與卸除部400之間傳送模組20可透過第二模組傳送部620執行。On the other hand, transferring the module 20 between the second buffer part 340 and the removal part 400 may be performed through the second module transfer part 620 .

所述第二模組傳送部620為用於在所述第二緩衝部340與卸除部400之間傳送模組20的結構,所述結構與第一模組傳送部610相同或者類似,因此省略詳細說明。The second module transfer part 620 is a structure used to transfer the module 20 between the second buffer part 340 and the removal part 400. The structure is the same as or similar to the first module transfer part 610. Therefore, Detailed description is omitted.

另一方面,在所述裝載部100與卸除部400之間可配置空托盤放置部410,以放置在裝載部100拾取模組20而空置的托盤10。On the other hand, an empty pallet placing part 410 may be disposed between the loading part 100 and the unloading part 400 to place the empty pallets 10 after the loading part 100 picks up the modules 20 .

所述空托盤放置部410為設置在所述裝載部100與卸除部400之間以放置在裝載部100拾取模組20而空置的托盤10的結構,可具有上述的托盤堆棧器500。The empty pallet placing part 410 is provided between the loading part 100 and the unloading part 400 to place the empty pallets 10 picked up by the module 20 in the loading part 100 , and may include the above-mentioned pallet stacker 500 .

另一方面,在所述裝載部100、卸除部400與所述空托盤放置部410之間可相互傳送托盤10,為此,如上所述,可通過托盤傳送器傳送。On the other hand, the pallets 10 can be transferred to each other between the loading part 100, the unloading part 400 and the empty pallet placing part 410, and for this purpose, as mentioned above, they can be transferred by a pallet conveyor.

另一方面,從所述第一緩衝部330向所述往返部310傳送模組20、在所述卸載位置從所述往返部310向第二緩衝部340傳送模組20分別可通過第三模組傳送部630及第四模組傳送部650執行。On the other hand, the module 20 can be transported from the first buffer part 330 to the shuttle part 310 and from the shuttle part 310 to the second buffer part 340 at the unloading position through the third mold respectively. The group transfer part 630 and the fourth module transfer part 650 are executed.

所述第三模組傳送部630及第四模組傳送部650分別為執行從所述第一緩衝部330至所述往返部310傳送模組20、在所述卸載位置從所述往返部310向第二緩衝部340傳送模組20的結構,可實現為各種結構。The third module transfer part 630 and the fourth module transfer part 650 are respectively configured to transfer the module 20 from the first buffer part 330 to the shuttle part 310 and from the shuttle part 310 to the unloading position. The structure of transferring the module 20 to the second buffer part 340 can be implemented in various structures.

作為一示例,所述第三模組傳送部630及第四模組傳送部650結構可與上述的第一模組傳送部610類似。As an example, the structures of the third module transfer part 630 and the fourth module transfer part 650 may be similar to the above-mentioned first module transfer part 610.

但是,考慮往返部310的裝載槽部間隔第二間距P2地配置,所述第三模組傳送部630及第四模組傳送部650較佳為以拾取部的水平方向(即X軸方向)間隔第二間距P2地配置。However, considering that the loading grooves of the reciprocating part 310 are arranged at a second distance P2, the third module transfer part 630 and the fourth module transfer part 650 are preferably arranged in the horizontal direction of the pickup part (ie, the X-axis direction) They are arranged at a second distance P2.

另外,所述第三模組傳送部630及第四模組傳送部650的排列與第一模組傳送部610的拾取部的排列相同,或者可具有各種排列,諸如1×8、2×8、4×8等。In addition, the arrangement of the third module transfer part 630 and the fourth module transfer part 650 is the same as the arrangement of the pickup part of the first module transfer part 610, or may have various arrangements, such as 1×8, 2×8 , 4×8, etc.

另一方面,如圖1所示,本發明的模組處理器還可具有模組緩衝部420,以暫時裝載模組20。On the other hand, as shown in FIG. 1 , the module processor of the present invention may also have a module buffer 420 to temporarily load the module 20 .

所述模組緩衝部420為暫時裝載模組20的結構,亦即為了消除模組20的物流過程中的瓶頸而暫時裝載的結構,可實現為各種結構。The module buffer 420 is a structure for temporarily loading the modules 20 , that is, a structure for temporarily loading the modules 20 in order to eliminate bottlenecks in the logistics process, and can be implemented in various structures.

作為一示例,所述模組緩衝部420暫時裝載由測試部200檢查為合格品的模組20,根據需求,由模組緩衝部420在上述卸除部400中裝載合格品的模組20的托盤10拾取模組可裝載於卸除部400的托盤10。As an example, the module buffer 420 temporarily loads the modules 20 that are inspected as qualified products by the testing part 200 , and upon demand, the module buffer 420 loads the modules 20 that are qualified products into the unloading part 400 . The tray 10 picking module can be loaded on the tray 10 of the unloading part 400 .

另一方面,根據用於以執行模組測試的測試部為中心進行模組的裝載、卸除的結構的配置,可實現為各種結構。On the other hand, various structures can be implemented depending on the arrangement of the structure for loading and unloading the module centered on the test unit that performs the module test.

作為一示例,本發明的模組處理器可構成為,配置有一對緩衝部,所述一對緩衝部以測試部為中心執行裝載待執行測試的模組及/或卸除完成測試的模組,其中所述測試部以i×j(i為2以上的自然數,j為1以上的自然數)的排列配置測試插座。As an example, the module processor of the present invention may be configured to be configured with a pair of buffer parts. The pair of buffer parts center on the test part to load the module to be tested and/or remove the module that has completed the test. , wherein the test section configures the test sockets in an arrangement of i×j (i is a natural number greater than 2, and j is a natural number greater than 1).

尤其是,以所述測試部為中心,可將配置在一側的緩衝部作為執行裝載待執行測試的模組的裝載緩衝部,可將配置在另一側的緩衝部作為執行卸除完成測試的模組的卸除緩衝部。In particular, with the test part as the center, the buffer part arranged on one side can be used as a loading buffer part for loading the module to be tested, and the buffer part arranged on the other side can be used as a buffer part for executing the removal and completion test. Remove the buffer part of the module.

以下,參照附圖,進行本發明的第二實施例的模組處理器的相關說明。Hereinafter, the module processor according to the second embodiment of the present invention will be described with reference to the accompanying drawings.

如圖11至圖12c所示,本發明的第二實施例的模組處理器可包括:裝載部100,在托盤10裝載複數個模組20;卸除部400,接收完成檢查的複數個模組20,按照預先設定的分類標準卸除於托盤10;測試部200,位於第三基線L3上,對於複數個模組20執行預先設定的檢查,所述第三基線L3以垂直方向間隔於連接所述裝載部100及所述卸除部400的第一基線L1;第一緩衝部350,在第二基線L2上往返移動至裝載位置與第一交換位置之間,以在所述裝載位置從所述裝載部100接收複數個模組20,在所述第三基線L3上設定的所述第一交換位置向所述測試部200傳遞複數個模組20;第二緩衝部360,往返移動至卸載位置與第二交換位置之間,以在所述第三基線L3上設定的所述第二交換位置從所述測試部200接收完成檢查的複數個模組20,向所述卸載位置移動,進而向所述卸除部400傳遞完成檢查的複數個模組20。As shown in Figures 11 to 12c, the module processor of the second embodiment of the present invention may include: a loading part 100, which loads a plurality of modules 20 on the pallet 10; and a removal part 400, which receives a plurality of modules that have been inspected. The group 20 is unloaded on the pallet 10 according to the preset classification standards; the test part 200 is located on the third baseline L3, and performs preset inspections on the plurality of modules 20. The third baseline L3 is spaced vertically from the connection The first baseline L1 of the loading part 100 and the unloading part 400; the first buffer part 350 moves back and forth on the second baseline L2 to between the loading position and the first exchange position, so as to move from the loading position to the first exchange position. The loading part 100 receives a plurality of modules 20 and transfers a plurality of modules 20 to the test part 200 at the first exchange position set on the third baseline L3; the second buffer part 360 moves back and forth to Between the unloading position and the second exchange position, the plurality of modules 20 that have been inspected are received from the test unit 200 at the second exchange position set on the third baseline L3 and moved toward the unloading position, Then, the plurality of modules 20 that have been inspected are delivered to the removal unit 400 .

在此,如圖12a所示,本發明的模組處理器的檢查對象的模組20及裝載所述模組20的托盤10與本發明的第一實施例的相同或類似,因此省略該詳細說明。Here, as shown in FIG. 12a , the module 20 to be inspected by the module processor of the present invention and the tray 10 on which the module 20 is loaded are the same as or similar to those in the first embodiment of the present invention, so the details are omitted. instruction.

以供參考,對於所述托盤10可設定不同的模組的尺寸、裝載數量等。For reference, different module sizes, loading quantities, etc. can be set for the pallet 10 .

所述裝載部100為將複數個模組20裝載於托盤10的結構,可實現為各種結構。The loading part 100 is a structure for loading a plurality of modules 20 on the tray 10, and can be implemented in various structures.

所述卸除部400為接收完成檢查的複數個模組20以按照預先設定的分類標準卸除於托盤10的結構,可實現為各種結構。The unloading unit 400 is a structure that receives a plurality of modules 20 that have been inspected and removes them from the tray 10 according to preset classification standards, and can be implemented in various structures.

所述裝載部100及所述卸除部400與本發明的第一實施例類似或者相同,因此省略該詳細說明。The loading part 100 and the unloading part 400 are similar or identical to the first embodiment of the present invention, so the detailed description is omitted.

如圖12c所示,所述測試部200為位於以垂直方向間隔於連接所述裝載部100及所述卸除部400的第一基線L1的第三基線L3上以對於複數個模組20執行預先設定的檢查的結構,根據用於測試模組20的測試模組(未顯示)的結構,可實現為各種結構。As shown in FIG. 12c , the test part 200 is located on a third baseline L3 spaced in a vertical direction from the first baseline L1 connecting the loading part 100 and the unloading part 400 to perform execution on a plurality of modules 20 The preset inspection structure can be implemented in various structures according to the structure of the test module (not shown) used for the test module 20 .

作為一示例,如上所述,所述測試部200可包括:複數個測試插座210,間隔第二間距P2地配置;測試模組(未顯示),通過所述測試插座210對於模組20施加電訊號以對於模組20執行檢查。As an example, as mentioned above, the test part 200 may include: a plurality of test sockets 210, arranged at a second interval P2; a test module (not shown), and the test socket 210 applies telecommunications to the module 20. No. to perform a check on module 20.

所述測試插座210為在通過後述的第一傳送工具700放置模組20之後將由測試模組産生的電訊號傳輸至模組20的結構,可實現為各種結構。The test socket 210 is a structure that transmits electrical signals generated by the test module to the module 20 after the module 20 is placed through the first transmission tool 700 described below, and can be implemented in various structures.

作為一示例,如顯示上述第一實施例的圖9a至圖9d所示,所述測試插座210可包括:測試槽211,插入模組20的端子部分;鈎部219,對於測試槽211固定模組20,或者在分離時解除掛鈎。As an example, as shown in FIGS. 9a to 9d showing the above-mentioned first embodiment, the test socket 210 may include: a test slot 211 inserted into the terminal part of the module 20; and a hook 219 for fixing the mold in the test slot 211. Group 20, or unhook upon detachment.

另一方面,如圖12a所示,所述托盤10裝載各個模組20,所述模組20以X軸方向間隔第一間距P1,如圖12c所示,所述測試部200的測試插座210以X軸方向間隔第二間距P2地配置。On the other hand, as shown in Figure 12a, the tray 10 is loaded with each module 20. The modules 20 are spaced apart by a first distance P1 in the X-axis direction. As shown in Figure 12c, the test socket 210 of the test part 200 They are arranged at a second pitch P2 in the X-axis direction.

此時,所述第二間距P2大於第一間距P1,但是需要適當應對於以裝載部100的托盤10→第一緩衝托盤351→測試部200→第二緩衝托盤361→卸除部400的托盤10的順序傳送模組20的傳送過程。At this time, the second pitch P2 is larger than the first pitch P1, but it needs to be appropriately responded to the order of the tray 10 of the loading part 100 → the first buffer tray 351 → the test part 200 → the second buffer tray 361 → the tray of the unloading part 400 10. The transmission process of the sequential transmission module 20.

據此,所述第二間距P2可設定為是第一間距P1的k倍(k為2以上的自然數)。Accordingly, the second pitch P2 can be set to k times the first pitch P1 (k is a natural number greater than 2).

對於所述k,可通過因為測試插座210的結構及尺寸而限制相鄰的測試插座210之間的間距的限制因素、可裝載於托盤10的模組20數量、在緩衝托盤351、361及測試部200之間移動模組20的效率等決定。For k, the limiting factors that limit the spacing between adjacent test sockets 210 due to the structure and size of the test sockets 210, the number of modules 20 that can be loaded on the tray 10, the buffer trays 351, 361 and the test The efficiency of moving the module 20 between the units 200 is determined.

作為一實施例,可裝載於所述托盤10的模組20的數量為十二個時,所述k可以是3。As an embodiment, when the number of modules 20 that can be loaded on the pallet 10 is twelve, the k may be 3.

所述測試模組為透過所述測試插座210對於模組20施加電訊號以對於模組20執行檢查的結構,根據對模組20的測試方式,可實現為各種結構,並可由可確認在實際安裝環境下是否驅動的模組構成。The test module is a structure that applies electrical signals to the module 20 through the test socket 210 to perform inspection on the module 20. It can be implemented in various structures according to the test method of the module 20, and can be confirmed in actual use. Whether the driver module is configured in the installation environment.

另一方面,所述測試部200可位於後述第一緩衝部350的動作路徑與所述第二緩衝部360的動作路徑之間。On the other hand, the test part 200 may be located between the operation path of the first buffer part 350 and the operation path of the second buffer part 360 which will be described later.

所述第一緩衝部350為往返移動至裝載位置與第一交換位置之間,以在所述裝載位置從所述裝載部100接收複數個模組20,在所述第三基線L3上設定的所述第一交換位置向所述測試部200傳遞複數個模組20的結構,可實現為各種結構。The first buffer part 350 moves back and forth between the loading position and the first exchange position to receive a plurality of modules 20 from the loading part 100 at the loading position, and is set on the third baseline L3 The first exchange position transmits the structure of the plurality of modules 20 to the test part 200 and can be implemented in various structures.

所述第二緩衝部360為往返移動至卸載位置與第二交換位置之間,以在所述第三基線L3上設定的所述第二交換位置從所述測試部200接收完成檢查的複數個模組20向所述卸載位置移動,進而向所述卸除部400傳遞完成檢查的複數個模組20的結構,可實現為各種結構。The second buffer part 360 moves back and forth between the unloading position and the second exchange position to receive a plurality of completed inspections from the test part 200 at the second exchange position set on the third baseline L3. The structure in which the modules 20 move to the unloading position and then transfer the inspected plurality of modules 20 to the unloading part 400 can be implemented in various structures.

所述第一緩衝部350及所述第二緩衝部360以所述測試部200為準可分別配置在一側及另一側,較佳為,除了位置以外,實際上具有相同的結構。在此,所述第一緩衝部350及所述第二緩衝部360的位置為測試部200的相對位置,當然可位於不同的位置。The first buffer part 350 and the second buffer part 360 may be respectively disposed on one side and the other side of the test part 200 , and preferably have the same structure except for the position. Here, the positions of the first buffer part 350 and the second buffer part 360 are relative positions of the test part 200, and of course they may be located at different positions.

作為一示例,如圖11、圖12b、圖13a及圖13b所示,所述第一緩衝部350及所述第二緩衝部360分別可包括:一個以上的緩衝托盤351,與所述第一基線L1垂直,在裝載位置與第一交換位置之間以Y軸方向進行往返移動;以及一個以上的緩衝托盤361,與所述第一基線L1垂直,在卸載位置與第二交換位置之間進行往返移動。As an example, as shown in FIGS. 11 , 12 b , 13 a and 13 b , the first buffer part 350 and the second buffer part 360 may respectively include: one or more buffer trays 351 , and the first buffer part 350 and the second buffer part 360 . The base line L1 is vertical and moves back and forth in the Y-axis direction between the loading position and the first exchange position; and more than one buffer tray 361 is perpendicular to the first base line L1 and moves between the unloading position and the second exchange position. Move back and forth.

尤其是,為了快速執行裝載待執行測試的模組20、卸除完成測試的模組20,所述第一緩衝部350及所述第二緩衝部360較佳包括以所述第一基線L1的方向平行配置的一對緩衝托盤351、361。In particular, in order to quickly load the module 20 to be tested and remove the module 20 that has completed testing, the first buffer part 350 and the second buffer part 360 preferably include a buffer with the first baseline L1 A pair of buffer trays 351 and 361 arranged in parallel directions.

尤其是,如圖11及圖13a和圖13b所示,所述一對緩衝托盤351、361可具有各種配置,諸如以X軸方向平行配置或者上下配置等。In particular, as shown in FIG. 11 and FIGS. 13a and 13b , the pair of buffer trays 351 and 361 may have various configurations, such as parallel configuration in the X-axis direction or up and down configuration.

另一方面,根據模組20的種類、規格、裝載結構,所述緩衝托盤351、361可實現為各種結構,如圖13a及圖13b所示,所述緩衝托盤351、361可由移動板351b、361b組成,所述移動板351b、361b具有裝載模組20的複數個裝載部351a、361a。On the other hand, depending on the type, specification, and loading structure of the module 20, the buffer trays 351 and 361 can be implemented in various structures. As shown in Figures 13a and 13b, the buffer trays 351 and 361 can be composed of movable plates 351b, The moving plates 351b and 361b have a plurality of loading parts 351a and 361a for loading the modules 20.

為了裝載或者拾取由第一模組傳送部610及第二模組傳送部620傳送的模組20,所述複數個裝載部351a、361a較佳配置以間隔模組20在托盤10上以X軸方向間隔的第一間距P1。In order to load or pick up the modules 20 transported by the first module transport part 610 and the second module transport part 620, the plurality of loading parts 351a, 361a are preferably configured to space the modules 20 on the pallet 10 along the X-axis. The first pitch P1 of the directional spacing.

另一方面,為了便於所述複數個裝載部351a、361a裝載或者拾取由第一模組傳送部610及第二模組傳送部620傳送的模組20,所述複數個裝載部351a、361a可通過諸如簡單插入方式、通過如圖9a至圖9d的結構裝載的方式等的各種方法裝載模組20。On the other hand, in order to facilitate the plurality of loading portions 351a and 361a to load or pick up the modules 20 conveyed by the first module conveying portion 610 and the second module conveying portion 620, the plurality of loading portions 351a and 361a can The module 20 is loaded through various methods, such as a simple insertion method, a loading method through a structure as shown in Figure 9a to Figure 9d, and the like.

作為一示例,所述第一緩衝部350及所述第二緩衝部360可包括複數個裝載組,所述裝載組包括以X軸方向間隔第二間距P2配置的複數個裝載部351a、361a。As an example, the first buffer part 350 and the second buffer part 360 may include a plurality of loading groups, and the loading groups include a plurality of loading parts 351a and 361a arranged at a second interval P2 in the X-axis direction.

所述複數個裝載組為由裝載模組20的裝載部351a、361a組成的群組,所述複數個裝載組的各個裝載組的裝載部351a、361a與另一裝載組中相鄰的裝載部351a、361a間隔第一間距P1配置。The plurality of loading groups are a group composed of the loading parts 351a and 361a of the loading module 20, and the loading parts 351a and 361a of each loading group of the plurality of loading groups are the same as the adjacent loading parts of another loading group. 351a and 361a are arranged at a first pitch P1.

然後,所述複數個裝載組的X軸方向的數量可以是m個(m為1以上的自然數)。Then, the number of the plurality of loading groups in the X-axis direction may be m (m is a natural number greater than 1).

此時,所述測試插座210的X軸方向的數量為n個,所述測試插座210能够以X軸方向間隔所述第二間距P2地配置。At this time, the number of the test sockets 210 in the X-axis direction is n, and the test sockets 210 can be arranged at intervals of the second pitch P2 in the X-axis direction.

另一方面,通過適當組合所述一對緩衝托盤351、361上的裝載部351a、361a的配置、所述測試插座210的配置及第一傳送工具700和第二傳送工具800的拾取部720、820以X軸方向的配置,可更加快速執行模組20的傳送。On the other hand, by appropriately combining the configuration of the loading portions 351a and 361a on the pair of buffer trays 351 and 361, the configuration of the test socket 210, and the pickup portions 720 of the first and second transfer tools 700 and 800, The 820 is configured in the X-axis direction to execute the transmission of the module 20 more quickly.

首先,以X軸方向間隔第二間距P2地配置所述測試部200的測試插座210,所述第二間距P2可具有由托盤10及緩衝托盤351、361的裝載部351a、361a形成的X軸方向的第一間距P1的m倍(m為2以上的自然數)的大小。First, the test sockets 210 of the test part 200 are arranged at a second distance P2 in the X-axis direction. The second distance P2 may have an X-axis formed by the loading parts 351a and 361a of the tray 10 and the buffer trays 351 and 361. The size of the first distance P1 in the direction is m times (m is a natural number greater than 2).

然後,在測試部200的測試插座210的X軸方向的數量為n(n為2以上的自然數)時,所述緩衝托盤351、361的裝載部351a、361a的X軸方向總數量較佳為n×m。Then, when the number of test sockets 210 in the test unit 200 in the X-axis direction is n (n is a natural number greater than or equal to 2), the total number of the loading portions 351a and 361a of the buffer trays 351 and 361 in the X-axis direction is preferably is n×m.

此時,所述第一傳送工具700及第二傳送工具800的拾取部720、820的X軸方向的數量也可以是n個。At this time, the number of the pickup parts 720 and 820 of the first transfer tool 700 and the second transfer tool 800 in the X-axis direction may be n.

圖13a及圖13b顯示了所述緩衝托盤351、361的裝載部351a、361a的X軸方向的總數量為二十四個,所述第一傳送工具700及第二傳送工具800的拾取部720、820的X軸方向的數量為八個的情況。13a and 13b show that the total number of loading portions 351a and 361a of the buffer trays 351 and 361 in the X-axis direction is twenty-four, and the pickup portions 720 of the first conveying tool 700 and the second conveying tool 800 , the case where the number of 820 in the X-axis direction is eight.

在此,在形成一對所述緩衝托盤351、361的情況下,各個緩衝托盤351、361的X軸方向的數量可以是(n×m)/2(n為偶數)。Here, when forming a pair of the buffer trays 351 and 361, the number of each buffer tray 351 and 361 in the X-axis direction may be (n×m)/2 (n is an even number).

此時,如圖13a及圖13b所示,所述第一傳送工具700及第二傳送工具800的拾取部720、820可從緩衝托盤351、361各拾取n/2個模組20。At this time, as shown in FIGS. 13a and 13b , the pickup portions 720 and 820 of the first transfer tool 700 and the second transfer tool 800 can respectively pick up n/2 modules 20 from the buffer trays 351 and 361 .

在此,如圖11所示,所述一對緩衝托盤351、361中的一個位於第一交換位置或者第二交換位置,而剩餘一個位於裝載位置或者卸載位置。Here, as shown in FIG. 11 , one of the pair of buffer trays 351 and 361 is located at the first exchange position or the second exchange position, and the remaining one is located at the loading position or the unloading position.

另一方面,通過如上所述的裝載部351a、361a的配置,可更加靈活執行對於位在裝載位置的第一緩衝部350通過第一模組傳送部610裝載模組20、對於位在第一交換位置的第一緩衝部350通過第一傳送工具700拾取模組20、對於位在第二交換位置的第二緩衝部360通過第二傳送工具800裝載模組20、對於位在卸載位置的第二緩衝部360通過第二模組傳送部620拾取模組20的工作。On the other hand, through the configuration of the loading parts 351a and 361a as described above, it is possible to more flexibly load the module 20 to the first buffer part 350 at the loading position through the first module transfer part 610 and load the module 20 to the first buffer part 350 at the loading position. The first buffer part 350 in the exchange position picks up the module 20 through the first transfer tool 700, the second buffer part 360 in the second exchange position loads the module 20 through the second transfer tool 800, and the third buffer part 360 in the unloading position loads the module 20. The second buffer part 360 picks up the work of the module 20 through the second module transmission part 620 .

然後,如圖12b及圖13a、圖13b所示,所述裝載部351a、361a為以X軸方向設置有複數個的同時能够以Y軸方向排成多列。Then, as shown in FIGS. 12 b and 13 a and 13 b , a plurality of the loading portions 351 a and 361 a are provided in the X-axis direction and can be arranged in multiple rows in the Y-axis direction.

另外,所述緩衝托盤351、361可通過引導軌道352、362與Y軸方向移動部353、363以Y軸方向進行移動,其中所述引導軌道352、362引導Y軸方向的移動,所述Y軸方向移動部353、363沿引導軌道352、362移動所述緩衝托盤351、361。In addition, the buffer trays 351 and 361 can move in the Y-axis direction through guide rails 352 and 362 and the Y-axis direction moving parts 353 and 363, wherein the guide rails 352 and 362 guide the movement in the Y-axis direction. The axial moving parts 353 and 363 move the buffer trays 351 and 361 along the guide rails 352 and 362.

另一方面,為了有效傳送模組20,本發明的模組處理器可包括:第一模組傳送部610,從所述裝載部100的托盤10拾取複數個模組20,將拾取的複數個模組20裝載於位在所述裝載位置的所述第一緩衝部350;第二模組傳送部620,從位於所述卸載位置的所述第二緩衝部360拾取複數個模組20,將拾取的複數個模組20裝載於所述卸除部400的托盤10;第一傳送工具700,從位於所述第一交換位置的所述第一緩衝部350拾取複數個模組20,將拾取的複數個模組20裝載於所述測試部200的測試插座210;第二傳送工具800,從所述測試部200的測試插座210拾取完成檢查的複數個模組20,將拾取的複數個模組20裝載於位在所述第二交換位置的所述第一緩衝部350。On the other hand, in order to effectively transfer the modules 20, the module processor of the present invention may include: a first module transfer part 610, which picks up a plurality of modules 20 from the tray 10 of the loading part 100, and transfers the picked up plurality of modules 20. The modules 20 are loaded into the first buffer part 350 at the loading position; the second module transfer part 620 picks up a plurality of modules 20 from the second buffer part 360 at the unloading position and transfers them The plurality of picked modules 20 are loaded on the tray 10 of the unloading part 400; the first transfer tool 700 picks up the plurality of modules 20 from the first buffer part 350 located at the first exchange position, and then picks up the plurality of modules 20. The plurality of modules 20 are loaded into the test socket 210 of the test part 200; the second transfer tool 800 picks up the plurality of modules 20 that have been inspected from the test socket 210 of the test part 200, and transfers the picked up plurality of modules 20. The group 20 is loaded in the first buffer portion 350 in the second exchange position.

所述第一模組傳送部610為從所述裝載部100的托盤10拾取複數個模組20,將拾取的複數個模組20裝載於位在所述裝載位置的所述第一緩衝部350的結構,可實現為各種結構,可具有在上述的第一實施例的圖3a至圖4顯示的結構。The first module transfer part 610 picks up a plurality of modules 20 from the tray 10 of the loading part 100, and loads the picked up modules 20 into the first buffer part 350 located at the loading position. The structure may be implemented in various structures, and may have the structure shown in FIGS. 3a to 4 of the above-mentioned first embodiment.

所述第二模組傳送部620為從位於所述卸載位置的所述第二緩衝部360拾取複數個模組20,將拾取的複數個模組20裝載於所述卸除部400的托盤10的結構,可實現為各種結構,可具有在上述的第一實施例的圖3a至圖4顯示的結構。The second module transfer part 620 picks up a plurality of modules 20 from the second buffer part 360 located in the unloading position, and loads the picked up modules 20 onto the tray 10 of the unloading part 400 The structure may be implemented in various structures, and may have the structure shown in FIGS. 3a to 4 of the above-mentioned first embodiment.

所述第一傳送工具700為從位於所述第一交換位置的所述第一緩衝部350拾取複數個模組20,將拾取的複數個模組20裝載於所述測試部200的測試插座210的結構,可實現為各種結構。The first transfer tool 700 picks up a plurality of modules 20 from the first buffer part 350 at the first exchange position, and loads the picked up modules 20 into the test socket 210 of the test part 200 The structure can be implemented in various structures.

所述第二傳送工具800為從所述測試部200的測試插座210拾取完成檢查的複數個模組20,將拾取的複數個模組20裝載於位在所述第二交換位置的所述第一緩衝部350的結構,可實現為各種結構。The second transfer tool 800 picks up the plurality of modules 20 that have been inspected from the test socket 210 of the test part 200, and loads the picked up plurality of modules 20 into the second exchange position. The structure of the buffer portion 350 can be implemented in various structures.

另一方面,所述第一傳送工具700及第二傳送工具800只是拾取位置及裝載位置、拾取及裝載工作不同,實際上結構可以是相同的。On the other hand, the first conveying tool 700 and the second conveying tool 800 only have different pickup positions, loading positions, and picking and loading operations. In fact, the structures may be the same.

具體地說,所述第一傳送工具700為在第一交換位置從第一緩衝部350拾取模組20,向測試部200的上部移動,將模組20分別裝載於測試部200的測試插座210。Specifically, the first transfer tool 700 picks up the modules 20 from the first buffer part 350 at the first exchange position, moves to the upper part of the test part 200, and loads the modules 20 into the test sockets 210 of the test part 200 respectively. .

然後,作為相反的過程,所述第二傳送工具800在測試部200的上部從測試部200的測試插座210拾取模組20,在第一交換位置將模組20裝載於第二緩衝部360。Then, as a reverse process, the second transfer tool 800 picks up the module 20 from the test socket 210 of the test part 200 at the upper part of the test part 200, and loads the module 20 into the second buffer part 360 at the first exchange position.

然後,所述第一傳送工具700及所述第二傳送工具800可包括以X軸方向間隔所述第二間距P2地配置的n個(n為2以上的自然數)拾取部720、820。Then, the first transfer tool 700 and the second transfer tool 800 may include n (n is a natural number greater than or equal to 2) pickup parts 720 and 820 arranged at intervals of the second pitch P2 in the X-axis direction.

作為具體的實施例,所述第一傳送工具700及所述第二傳送工具800可包括:線性移動部件710、810,沿X軸方向進行線性移動;上下移動部件740、840,可上下移動地結合於所述線性移動部件710、810;一個以上的拾取部720、820,包括一對夾持器721、821,所述一對夾持器721、821結合於所述上下移動部件740、840,以模組20的長度方向彼此朝向相反的方向移動來夾持模組20的兩端部;線性驅動部730、830,結合於所述上下移動部件740、840,以夾持及解除夾持的方向移動所述一對夾持器721、821;以及主上下移動部750、850,上下移動所述上下移動部件740、840。As a specific embodiment, the first transfer tool 700 and the second transfer tool 800 may include: linear moving parts 710 and 810 that move linearly along the X-axis direction; and up and down moving parts 740 and 840 that can move up and down. Combined with the linear moving parts 710 and 810; one or more pickup parts 720 and 820 include a pair of clamps 721 and 821, and the pair of clamps 721 and 821 are combined with the up and down moving parts 740 and 840 , to clamp both ends of the module 20 by moving the length directions of the module 20 in opposite directions; the linear driving parts 730 and 830 are combined with the up and down moving parts 740 and 840 to clamp and release the clamping. The pair of clampers 721 and 821 are moved in the direction; and the main vertical moving parts 750 and 850 are used to move the vertical moving parts 740 and 840 up and down.

所述線性移動部件710、810為沿X軸方向進行線性移動的結構,可實現為各種結構,諸如構成為沿橫跨所述第一交換位置、測試部200的上部、第二交換位置設置的引導軌道進行線性移動。The linear moving parts 710 and 810 are structures that move linearly along the Guide rails for linear movement.

作為一示例,所述第一傳送工具700的線性移動部件710可設置成在所述第一交換位置與測試部200的上部之間進行往返移動。As an example, the linear moving part 710 of the first transfer tool 700 may be configured to move back and forth between the first exchange position and the upper part of the testing part 200 .

此時,所述第一傳送工具700的線性移動部件710被單獨的線性驅動部驅動以進行X軸方向的線性移動。At this time, the linear moving component 710 of the first conveying tool 700 is driven by a separate linear driving part to perform linear movement in the X-axis direction.

然後,所述第二傳送工具800的線性移動部件810可設置成在所述測試部200的上部與第二交換位置之間進行往返移動。Then, the linear moving part 810 of the second transfer tool 800 may be configured to move back and forth between the upper part of the testing part 200 and the second exchange position.

此時,所述第二傳送工具800的線性移動部件810可被單獨的線性驅動部驅動以進行X軸方向的線性移動。At this time, the linear moving component 810 of the second conveying tool 800 can be driven by a separate linear driving part to perform linear movement in the X-axis direction.

另一方面,所述線性移動部件710、810為用於支撐上下移動部件740、840、線性驅動部730、830等的結構,根據上下移動部件740、840、線性驅動部730、830等的支撐結構,可實現為各種結構。On the other hand, the linear moving members 710 and 810 are structures for supporting the vertical moving members 740 and 840 and the linear driving parts 730 and 830. According to the support of the vertical moving members 740 and 840 and the linear driving parts 730 and 830, etc. Structure, can be implemented as various structures.

作為一示例,所述線性移動部件710、810可包括:上部板711、811及下部板713、813,以上下方向間隔間距地配置;以及一個以上的側面板712、812,上下連接上部板711、811及下部板713、813。As an example, the linear moving parts 710 and 810 may include: upper plates 711 and 811 and lower plates 713 and 813 arranged at intervals in the up and down direction; and one or more side plates 712 and 812 connected up and down to the upper plate 711 , 811 and lower plate 713, 813.

所述上部板711、811及下部板713、813為用於穩定支撐上下移動部件740、840、線性驅動部730、830等的部件,可實現為各種結構。The upper plates 711 and 811 and the lower plates 713 and 813 are members for stably supporting the vertical moving parts 740 and 840, the linear drive parts 730 and 830, etc., and may be implemented in various structures.

作為一示例,所述上部板711、811設置在上側以直接或者間接支撐後述的主上下移動部750、850。As an example, the upper plates 711 and 811 are provided on the upper side to directly or indirectly support the main vertical moving parts 750 and 850 described below.

具體地說,所述上部板711、811可設置成用於支撐驅動部支撐部714、814,所述驅動部支撐部714、814被複數個支撐桿715、815支撐的同時支撐後述的主上下移動部750、850。Specifically, the upper plates 711 and 811 may be provided to support the drive part support parts 714 and 814 which are supported by a plurality of support rods 715 and 815 and support the main upper and lower parts described below. Moving parts 750,850.

在此,所述驅動部支撐部714、814被複數個支撐桿715、815支撐並設置在所述上部板711、811,且支撐主旋轉驅動部751、851,可旋轉地設置上下驅動部件753、853。Here, the driving part support parts 714 and 814 are supported by a plurality of support rods 715 and 815 and are provided on the upper plates 711 and 811, and support the main rotation driving parts 751 and 851, and the upper and lower driving parts 753 are rotatably provided. ,853.

所述下部板713、813在下側間隔於所述上部板711、811設置,並可設置成直接或者間接支撐後述的輔助上下移動部760、860。The lower plates 713 and 813 are spaced from the upper plates 711 and 811 on the lower side, and may be provided to directly or indirectly support the auxiliary vertical movement parts 760 and 860 described below.

作為一示例,所述下部板713、813支撐主旋轉驅動部751、851設置,並支撐後述的輔助旋轉驅動部761、861,可旋轉地支撐所述螺絲部件762、862。As an example, the lower plates 713 and 813 are provided to support the main rotation driving parts 751 and 851, support the auxiliary rotation driving parts 761 and 861 described later, and rotatably support the screw members 762 and 862.

另一方面,在所述下部板713、813中在與後述的主上下移動部750、850的結合桿754、854及輔助上下移動部760、860的結合桿764、864相對應的位置設置貫通孔,以上下移動後述的主上下移動部750、850的結合桿754、854及輔助上下移動部760、860的結合桿764、864,並可設置用於引導該上下移動的導向襯套。On the other hand, penetrations are provided in the lower plates 713 and 813 at positions corresponding to the coupling rods 754 and 854 of the main vertical movement parts 750 and 850 and the coupling rods 764 and 864 of the auxiliary vertical movement parts 760 and 860 which will be described later. The hole can move the coupling rods 754 and 854 of the main vertical movement parts 750 and 850 described later and the coupling rods 764 and 864 of the auxiliary vertical movement parts 760 and 860 up and down, and guide bushings for guiding the vertical movement may be provided.

所述一個以上的側面板712、812為上下連接所述上部板711、811及下部板713、813的結構,根據連接結構,可實現為各種結構。The one or more side panels 712 and 812 have a structure that connects the upper panels 711 and 811 and the lower panels 713 and 813 up and down, and can be implemented in various structures depending on the connection structure.

作為一示例,所述側面板712、812上下連接所述上部板711、811及下部板713、813的同時可旋轉地支撐主上下移動部750、850的螺絲部件752、852及輔助上下移動部760、860的螺絲部件762、862。As an example, the side panels 712 and 812 vertically connect the upper plates 711 and 811 and the lower plates 713 and 813 while rotatably supporting the screw members 752 and 852 of the main vertical moving parts 750 and 850 and the auxiliary vertical moving part. Screw parts 762, 862 of 760, 860.

所述上下移動部件740、840為可上下移動地結合於所述線性移動部件710、810的結構,根據與後述的拾取部720、820的結合結構及針對所述線性移動部件710、810的線性移動結構,可實現為各種結構。The vertical movement members 740 and 840 are coupled to the linear movement members 710 and 810 so as to be capable of vertical movement. Mobile structures can be implemented as various structures.

作為一示例,所述上下移動部件740、840可由結合於底面以使後述夾持器721、821能够以Y軸方向進行線性移動的板部件構成。As an example, the vertical movement members 740 and 840 may be composed of plate members coupled to the bottom surface so that the clampers 721 and 821 described below can linearly move in the Y-axis direction.

所述拾取部720、820為包括一對夾持器721、821的結構,其中所述一對夾持器721、821結合於所述上下移動部件740、840以模組20的長度方向(亦即Y軸方向)彼此朝向相反的方向移動來夾持模組20的兩端部,所述拾取部720、820可實現為各種結構。The pickup parts 720 and 820 are structured to include a pair of clamps 721 and 821, wherein the pair of clamps 721 and 821 are coupled to the up and down moving parts 740 and 840 to move in the length direction of the module 20 (also That is, the Y-axis direction) move in opposite directions to clamp the two ends of the module 20 . The pickup portions 720 and 820 can be implemented in various structures.

作為一示例,所述一對夾持器721、821可構成為結合於所述上下移動部件740、840的底面,並且與設置在上面的線性驅動部結合來結合於所述上下移動部件740、840,進而能够以模組20的長度方向(亦即Y軸方向)彼此朝向相反的方向移動。As an example, the pair of clamps 721 and 821 may be configured to be coupled to the bottom surfaces of the up-and-down moving parts 740 and 840 and to be coupled to the up-and-down moving parts 740 and 840 in conjunction with a linear driving part provided above. 840, and further can move in opposite directions to each other in the length direction of the module 20 (that is, the Y-axis direction).

此時,所述上下移動部件740、840可設置引導軌道,所述引導軌道結合於與所述一對夾持器721、821結合的移動塊以引導X軸方向的線性移動。At this time, the up and down moving parts 740 and 840 may be provided with guide rails that are combined with the moving blocks combined with the pair of grippers 721 and 821 to guide the linear movement in the X-axis direction.

另一方面,對於所述一對夾持器721、821,只要是可夾持板面朝向X軸方向的模組20的兩末端側面的結構均可,可以是任意一種結構。On the other hand, the pair of clampers 721 and 821 may have any structure as long as they can clamp both end side surfaces of the module 20 with the plate surfaces facing the X-axis direction.

另外,所述一對夾持器721、821可構成為在夾持時可夾持一個以上,例如四個模組20,並可包括板狀的部件。In addition, the pair of clampers 721 and 821 may be configured to clamp more than one, for example, four module sets 20 during clamping, and may include plate-shaped components.

所述線性驅動部730、830為結合於所述上下移動部件740、840以夾持及解除夾持的方向移動所述一對拾取部720、820的結構,根據一對夾持器721、821的線性移動結構,可實現為各種結構。The linear driving parts 730 and 830 are coupled to the vertical moving parts 740 and 840 to move the pair of pickup parts 720 and 820 in clamping and releasing directions. According to the pair of clampers 721 and 821 The linear moving structure can be realized in various structures.

作為一示例,所述線性驅動部730、830可包括:螺絲部734、834,通過旋轉將所述一對夾持器721、821的移動部件733、833以模組20的長度方向彼此朝向相反的方向移動;旋轉驅動部731、831,直接或者間接旋轉所述螺絲部734、834。As an example, the linear driving parts 730 and 830 may include: screw parts 734 and 834, which rotate the moving parts 733 and 833 of the pair of clamps 721 and 821 toward opposite directions in the length direction of the module 20 to move in the direction; the rotation driving parts 731 and 831 directly or indirectly rotate the screw parts 734 and 834.

所述螺絲部734、834為通過旋轉將所述一對夾持器721、821的移動部件733、833以模組20的長度方向彼此朝向相反的方向移動的結構,可實現為各種結構。The screw portions 734 and 834 are configured to move the moving members 733 and 833 of the pair of clamps 721 and 821 in opposite directions in the longitudinal direction of the module 20 by rotation, and can be implemented in various structures.

作為一示例,所述螺絲部734、834可旋轉地支撐在所述上下移動部件740、840的上面,並可旋轉驅動地設置在後述的旋轉驅動部731、831。As an example, the screw portions 734 and 834 are rotatably supported on the upper surfaces of the vertical movement members 740 and 840 and are rotatably and drivably provided on rotation drive portions 731 and 831 described below.

此時,在所述螺絲部734、834中,在與夾持器721、821結合的部分可形成相反方向的螺紋,以在旋轉時使一對夾持器721、821彼此朝向相反的方向移動。At this time, in the screw portions 734 and 834, threads in opposite directions may be formed in the portions coupled with the clamps 721 and 821, so that the pair of clamps 721 and 821 move in opposite directions when rotated. .

亦即,在所述螺絲部734、834中,在分別結合於一對夾持器721、821的部分形成相互朝向不同方向的螺紋,進而在所述螺絲部734、834旋轉時一對夾持器721、821彼此可朝向相反的方向進行移動。That is, in the screw portions 734 and 834 , threads facing in different directions are formed in the portions respectively coupled to the pair of clampers 721 and 821 , so that when the screw portions 734 and 834 rotate, the pair clamps The devices 721 and 821 can move in opposite directions to each other.

另一方面,所述螺絲部734、834及一對夾持器721、821在所述上下移動部件740、840中分別可設置在各種位置,諸如分別設置在所述上下移動部件740、840的上面及底面、全部設置在底面等。On the other hand, the screw portions 734 and 834 and the pair of clamps 721 and 821 can be disposed at various positions in the up and down moving parts 740 and 840, respectively, such as being disposed on the up and down moving parts 740 and 840 respectively. The top and bottom surfaces are all set on the bottom surface, etc.

所述旋轉驅動部731、831為直接或者間接旋轉所述螺絲部734、834的結構,只要是用於旋轉的結構均可,可以是任意一種結構。The rotation drive portions 731 and 831 are configured to directly or indirectly rotate the screw portions 734 and 834, and may be any structure as long as they are used for rotation.

所述旋轉驅動部731、831由旋轉馬達構成,並通過連接器等可在驅動軸直接結合所述螺絲部734、834。The rotation drive parts 731 and 831 are composed of rotation motors, and the screw parts 734 and 834 can be directly connected to the drive shaft through a connector or the like.

另外,如圖14a及圖14b所示,所述旋轉驅動部731、831通過旋轉力傳遞工具732、832可旋轉驅動螺絲部734、834。In addition, as shown in FIGS. 14a and 14b , the rotational driving parts 731 and 831 can rotationally drive the screw parts 734 and 834 through the rotational force transmission tools 732 and 832.

所述旋轉力傳遞工具732、832根據旋轉力傳遞結構可實現為各種結構,可具有諸如皮帶及滑輪結構、齒輪結合結構、線及滑輪結構等的各種結構。The rotational force transmission tools 732 and 832 can be implemented in various structures according to the rotational force transmission structure, and can have various structures such as a belt and pulley structure, a gear combination structure, a wire and pulley structure, and the like.

另一方面,如圖14a及圖14b所示,所述旋轉驅動部731、831較佳為以旋轉力傳遞工具732、832為準在Y軸方向上與所述螺絲部734、834位於同一側,以防止對所述上下移動部件740、840以Y軸方向延伸。On the other hand, as shown in FIGS. 14a and 14b , the rotation driving parts 731 and 831 are preferably located on the same side as the screw parts 734 and 834 in the Y-axis direction based on the rotation force transmission tools 732 and 832. , to prevent the vertical moving parts 740 and 840 from extending in the Y-axis direction.

具體地說,所述旋轉驅動部731、831的驅動軸的末端部及所述螺絲部734、834的末端部在Y軸方向上位於同一位置,在這些末端部可結合旋轉力傳遞工具732、832。Specifically, the end portions of the drive shafts of the rotation drive portions 731 and 831 and the end portions of the screw portions 734 and 834 are located at the same position in the Y-axis direction, and the rotation force transmission tool 732 and the rotation force transmission tool 732 can be coupled to these end portions. 832.

另一方面,以模組20的長度方向可設置有複數個,例如四個所述拾取部720、820,此時所述複數個拾取部720、820的螺絲部734、834可被一個旋轉驅動部731、831旋轉驅動。On the other hand, a plurality of, for example, four pick-up parts 720 and 820 may be provided in the length direction of the module 20. In this case, the screw parts 734 and 834 of the plurality of pick-up parts 720 and 820 may be driven by one rotation. The parts 731 and 831 are driven to rotate.

具體地說,以Y軸方向配置複數個所述複數個拾取部720、820,與此相對應地,所述螺絲部734、834由以Y軸方向延伸成一體的一個螺栓部件構成或者透過一個以上的連接器連接的複數個螺絲部件構成等,可實現為各種結構。Specifically, a plurality of the plurality of pickup parts 720 and 820 are arranged in the Y-axis direction. Correspondingly, the screw parts 734 and 834 are composed of one bolt member extending integrally in the Y-axis direction or through a The above connector can be realized in various structures including a plurality of screw parts for connection.

此時,所述螺絲部734、834的兩個末端中的一端與旋轉驅動部731、831直接或者間接結合,透過一個旋轉驅動部731、831可旋轉驅動所述複數個拾取部720、820的螺絲部734、834。At this time, one end of the two ends of the screw portions 734 and 834 is directly or indirectly coupled to the rotation driving portion 731 and 831, and the plurality of pickup portions 720 and 820 can be rotationally driven through one rotation driving portion 731 and 831. Screw parts 734, 834.

然後,所述螺絲部734、834可由螺絲部件及連接器構成,所述螺絲部件對應結合於各個拾取部720、820並且被所述上下移動部件740、840可旋轉地支撐,所述連接器依次連接所述螺絲部件。Then, the screw parts 734 and 834 may be composed of screw parts and connectors. The screw parts are correspondingly combined with the respective pickup parts 720 and 820 and are rotatably supported by the up and down moving parts 740 and 840. The connectors are in turn Attach the screw parts.

亦即,所述複數個拾取部720、820的螺絲部734、834與相鄰的螺絲部734、834形成一體或者通過連接器相互連接,可被一個旋轉驅動部731、831旋轉驅動。That is, the screw portions 734 and 834 of the plurality of pickup portions 720 and 820 are integrated with the adjacent screw portions 734 and 834 or connected to each other through connectors, and can be rotationally driven by one rotation driving portion 731 and 831 .

另一方面,所述螺絲部件形成有螺紋(相互不同方向的螺紋,例如右螺紋、左螺紋)來結合於所述拾取部720、820的一對夾持器721、821,通過旋轉能够以Y軸方向線性移動一對夾持器721、821。On the other hand, the screw member is formed with threads (threads in different directions from each other, such as right threads and left threads) to be coupled to a pair of clamps 721 and 821 of the pickup parts 720 and 820, and can be rotated in Y A pair of clampers 721 and 821 are linearly moved in the axial direction.

然後,所述螺絲部件不僅是針對模組20的夾持動作,如圖14a及圖14b所示,還能够以Y軸方向調節一對夾持器721、821的寬度以夾持Y軸方向的長度不同的規格的模組20。Then, the screw component is not only for clamping the module 20, as shown in Figures 14a and 14b, but also can adjust the width of the pair of clampers 721, 821 in the Y-axis direction to clamp the Y-axis direction. Modules 20 in different lengths.

所述主上下移動部750、850為上下移動所述上下移動部件740、840的結構,可實現為各種結構。The main vertical movement parts 750 and 850 are configured to move the vertical movement members 740 and 840 vertically, and can be implemented in various structures.

作為一示例,所述主上下移動部750、850可包括:上下驅動部件753、853,與所述上下移動部件740、840結合,使所述上下移動部740、840對於所述線性移動部件710、810可進行上下移動;以及主上下驅動部,結合於所述線性移動部件710、810,以上下移動所述上下驅動部件753、853。As an example, the main up and down moving parts 750 and 850 may include: up and down driving parts 753 and 853, which are combined with the up and down moving parts 740 and 840 to make the up and down moving parts 740 and 840 move relative to the linear moving part 710. , 810 can move up and down; and the main up and down driving part is combined with the linear moving parts 710 and 810 to move the up and down driving parts 753 and 853 up and down.

所述上下驅動部件753、853為與所述上下移動部件740、840結合,使所述上下移動部740、840對於所述線性移動部件710、810可進行上下移動的結構,可實現為各種結構。The vertical driving members 753 and 853 are combined with the vertical moving members 740 and 840 to allow the vertical moving parts 740 and 840 to move up and down relative to the linear moving members 710 and 810, and may be implemented in various structures. .

作為一示例,所述上下驅動部件753、853可由通過複數個結合桿754、854與所述上下移動部件740、840結合的驅動板構成。As an example, the up and down driving components 753 and 853 may be composed of a driving plate coupled to the up and down moving components 740 and 840 through a plurality of coupling rods 754 and 854.

所述主上下驅動部為結合於所述線性移動部件710、810,以上下移動所述上下驅動部件753、853的結構,根據上下驅動方式,可實現為各種結構。The main vertical driving part is coupled to the linear moving members 710 and 810 and moves the vertical driving members 753 and 853 vertically. It can be implemented in various structures according to the vertical driving method.

作為一示例,所述主上下驅動部可包括:螺絲部件752、852,與結合於所述上下驅動部件753、853的螺母結合;以及主旋轉驅動部751、851,直接或者間接旋轉驅動所述螺絲部件752、852。As an example, the main up and down driving parts may include: screw parts 752, 852, which are combined with nuts combined with the up and down driving parts 753, 853; and main rotation driving parts 751, 851, which directly or indirectly drive the rotation of the Screw components 752, 852.

所述螺絲部件752、852為與結合於所述上下驅動部件753、853的螺母結合的結構,可實現為各種結構。The screw members 752 and 852 are coupled to nuts coupled to the upper and lower driving members 753 and 853, and can be implemented in various structures.

作為一示例,所述螺絲部件752、852與結合於所述上下驅動部件753、853的螺母結合,並可旋轉地被支撐且設置在所述線性移動部件710、810。As an example, the screw components 752 and 852 are coupled to nuts coupled to the upper and lower driving components 753 and 853, and are rotatably supported and provided on the linear moving components 710 and 810.

所述主旋轉驅動部751、851為直接或者間接旋轉驅動所述螺絲部件752、852的結構,可實現為各種結構。The main rotation driving parts 751 and 851 are configured to directly or indirectly rotate the screw members 752 and 852, and may be implemented in various structures.

作為一示例,所述主旋轉驅動部751、851可由固定設置在所述線性移動部件710、810的旋轉馬達構成。As an example, the main rotation driving parts 751 and 851 may be composed of rotation motors fixedly provided on the linear moving parts 710 and 810 .

另一方面,所述主旋轉驅動部751、851為,驅動軸直接結合於所述螺絲部件752、852或者通過旋轉力傳遞工具可與所述螺絲部件752、852間接結合。On the other hand, in the main rotation drive portions 751 and 851, the drive shaft can be directly coupled to the screw members 752, 852 or indirectly coupled to the screw members 752, 852 through a rotational force transmission tool.

如圖14a及圖14b所示,所述旋轉力傳遞工具可具有各種結構,諸如皮帶及滑輪結構、齒輪結合結構、線及滑輪結構等。As shown in Figures 14a and 14b, the rotational force transmission tool may have various structures, such as a belt and pulley structure, a gear combination structure, a wire and pulley structure, and the like.

另一方面,對於所述模組20,有必要在以裝載部100的托盤10→第一緩衝托盤351→測試部200→第二緩衝托盤361→卸除部400的托盤10順序傳送模組20的過程中在上側加壓模組20來進行裝載,或者在拾取時按壓鈎部的過程中防止在上側彈出所述模組20。On the other hand, the module 20 must be transported in the order of the tray 10 of the loading unit 100 → the first buffer tray 351 → the test unit 200 → the second buffer tray 361 → the tray 10 of the unloading unit 400 During the process, the module 20 is pressed on the upper side for loading, or the module 20 is prevented from being ejected on the upper side during the process of pressing the hook portion when picking up.

具體地說,有必要在圖9a至圖9d所示的模組20的拾取過程中防止向上側彈出模組20,並且在如圖10a至圖10d所示的模組20裝載過程中將模組20加壓於插座。Specifically, it is necessary to prevent the module 20 from being ejected to the upper side during the picking up process of the module 20 shown in FIGS. 20 pressurized socket.

據此,所述第一傳送工具700及第二傳送工具800可包括:加壓部722、822,設置在所述一對夾持器721、821之間,通過上下移動向下側加壓模組20;以及輔助上下移動部760、860,上下移動所述加壓部722、822。Accordingly, the first transfer tool 700 and the second transfer tool 800 may include: pressurizing parts 722 and 822, which are provided between the pair of clampers 721 and 821 and move up and down to pressurize the mold to the lower side. Group 20; and auxiliary vertical moving parts 760, 860, which move the pressurizing parts 722, 822 up and down.

所述加壓部722、822為設置在所述一對夾持器721、821之間,通過上下移動向下側加壓模組20的結構,根據模組20的加壓方式,可實現為各種結構。The pressurizing parts 722 and 822 are arranged between the pair of clampers 721 and 821 and pressurize the module 20 downward by moving up and down. Depending on the pressurizing method of the module 20, it can be implemented as various structures.

另一方面,在設置複數個所述拾取部720、820的情況下,所述加壓部722、822對應於各個拾取部720、820設置在所述一對夾持器721、821的中心部分。On the other hand, when a plurality of the pickup portions 720 and 820 are provided, the pressing portions 722 and 822 are provided at the center portions of the pair of grippers 721 and 821 corresponding to the respective pickup portions 720 and 820 , respectively. .

此時,對應於模組20的Y軸方向長度,所述一對夾持器721、821的寬度可發生變化,因此所述一對夾持器721、821較佳為具有不妨礙該變化的Y軸方向的長度。At this time, corresponding to the length of the module 20 in the Y-axis direction, the width of the pair of clamps 721 and 821 can change. Therefore, the pair of clamps 721 and 821 preferably have a width that does not hinder the change. The length in the Y-axis direction.

所述輔助上下移動部760、860為上下移動所述加壓部722、822的結構,根據所述加壓部722、822的上下移動,可實現為各種結構。The auxiliary vertical movement parts 760 and 860 are configured to move the pressurizing parts 722 and 822 up and down, and may be implemented in various structures according to the vertical movement of the pressurizing parts 722 and 822.

作為一示例,所述輔助上下移動部760、860可包括:輔助上下驅動部件765、865,與所述加壓部722、822結合,對於所述線性移動部件710、810可進行上下移動;以及輔助上下驅動部,結合於所述線性移動部件710、810以上下移動所述輔助上下驅動部件765、865。As an example, the auxiliary up and down moving parts 760 and 860 may include: auxiliary up and down driving parts 765 and 865, combined with the pressurizing parts 722 and 822, for the linear moving parts 710 and 810 to move up and down; and The auxiliary vertical driving part is coupled to the linear moving parts 710 and 810 to move the auxiliary vertical driving parts 765 and 865 up and down.

所述輔助上下驅動部件765、865為與所述加壓部722、822結合並對於所述線性移動部件710、810可進行上下移動的結構,可實現為各種結構。The auxiliary vertical driving members 765 and 865 are coupled to the pressurizing parts 722 and 822 and can move up and down with respect to the linear moving members 710 and 810, and can be implemented in various structures.

作為一示例,所述輔助上下驅動部件765、865可由通過複數個結合桿764、864與所述加壓部722、822連接的驅動板構成。As an example, the auxiliary up and down driving components 765 and 865 may be composed of a driving plate connected to the pressurizing parts 722 and 822 through a plurality of coupling rods 764 and 864.

所述輔助上下驅動部為結合於所述線性移動部件710、810以上下移動所述輔助上下驅動部件765、865的結構,可實現為各種結構。The auxiliary vertical driving unit is coupled to the linear moving members 710 and 810 to move the auxiliary vertical driving members 765 and 865 vertically, and may be implemented in various structures.

作為一示例,所述輔助上下驅動部可包括:螺絲部件762、862,與結合於所述輔助上下驅動部件765、865的螺母結合;以及輔助旋轉驅動部761、861,直接或者間接旋轉驅動所述螺絲部件762、862。As an example, the auxiliary up and down driving parts may include: screw parts 762, 862, which are combined with nuts combined with the auxiliary up and down driving parts 765, 865; and auxiliary rotation driving parts 761, 861, which directly or indirectly drive the rotation of the The screw components 762 and 862 are described.

所述螺絲部件762、862為與結合於所述輔助上下驅動部件765、865的螺母結合的結構,可實現為各種結構。The screw members 762 and 862 are configured to be coupled to nuts coupled to the auxiliary vertical driving members 765 and 865, and may be implemented in various structures.

作為一示例,所述螺絲部件762、862與結合於所述輔助上下驅動部件765、865的螺母結合並可旋轉地被支撐且設置在所述線性移動部件710、810。As an example, the screw components 762 and 862 are coupled to nuts coupled to the auxiliary up and down driving components 765 and 865 and are rotatably supported and provided on the linear moving components 710 and 810 .

所述輔助旋轉驅動部761、861為直接或者間接旋轉驅動所述螺絲部件762、862的結構,可實現為各種結構。The auxiliary rotation driving parts 761 and 861 are configured to directly or indirectly rotate the screw members 762 and 862, and may be implemented in various structures.

作為一示例,所述輔助旋轉驅動部761、861可由固定設置在所述線性移動部件710、810的旋轉馬達構成。As an example, the auxiliary rotation driving parts 761 and 861 may be composed of rotation motors fixedly provided on the linear moving parts 710 and 810 .

另一方面,所述輔助旋轉驅動部761、861為,驅動軸直接結合於所述螺絲部件762、862,或者通過旋轉力傳遞工具可與所述螺絲部件762、862間接結合。On the other hand, the auxiliary rotation drive portions 761 and 861 have a drive shaft that is directly coupled to the screw members 762 and 862 or that is indirectly coupled to the screw members 762 and 862 through a rotational force transmission tool.

所述旋轉力傳遞工具可具有各種結構,諸如在圖14a及圖14b顯示的皮帶及滑輪結構、齒輪結合結構、線及滑輪結構等。The rotational force transmission tool may have various structures, such as a belt and pulley structure, a gear combination structure, a wire and pulley structure, etc. shown in Figures 14a and 14b.

另一方面,所述輔助上下驅動部的螺絲部件762、862可設置成與上述的主上下驅動部的所述螺絲部件752、852相互分開的狀態下構成同軸。On the other hand, the screw members 762 and 862 of the auxiliary vertical drive part may be provided coaxially with the screw members 752 and 852 of the main vertical drive part described above in a state of being separated from each other.

具有如上所述結構的第一傳送工具700可快速且靈活執行從第一緩衝部350拾取模組20、對測試部200裝載模組20,所述第二傳送工具800可快速且靈活執行從測試部200拾取模組20、對第二緩衝部360裝載模組20的過程。The first transfer tool 700 with the above structure can quickly and flexibly pick up the module 20 from the first buffer part 350 and load the module 20 into the test part 200. The second transfer tool 800 can quickly and flexibly execute the test from The module 200 picks up the module 20 and loads the module 20 into the second buffer part 360 .

另一方面,對於所述第一傳送工具700及第二傳送工具800、在圖9a至圖10d顯示的模組工具640,只要是傳送具有直角四邊形形狀並且板面朝向X軸方向的狀態的模組20的傳送工具,不論其餘結構,當然也可靈活用作用於拾取及裝載模組的傳送工具的獨立結構。On the other hand, as for the first transfer tool 700 and the second transfer tool 800, as well as the mold tool 640 shown in FIGS. 9a to 10d, as long as the mold has a right rectangular shape and the plate surface faces the X-axis direction, The transfer tool of group 20, regardless of the other structures, can of course also be flexibly used as an independent structure of the transfer tool for picking up and loading modules.

另一方面,在所述裝載部100及卸除部400之間可配置空托盤放置部410,所述空托盤放置部410放置從裝載部100拾取模組20而空置的托盤10。On the other hand, an empty pallet placing part 410 may be disposed between the loading part 100 and the unloading part 400, and the empty pallet placing part 410 may place the empty pallet 10 after picking up the module 20 from the loading part 100.

所述空托盤放置部410為設置在所述裝載部100與卸除部400之間以放置從裝載部100拾取模組20而空置的托盤10的結構,可具有上述的托盤堆棧器500。The empty pallet placing part 410 is provided between the loading part 100 and the unloading part 400 to place empty pallets 10 after picking up the modules 20 from the loading part 100 , and may include the above-mentioned pallet stacker 500 .

然後,在所述裝載部100、卸除部400與所述空托盤放置部410之間可相互傳送托盤10,為此,如上所述可透過托盤傳送器傳送托盤10。Then, the pallets 10 can be transferred to each other between the loading part 100, the unloading part 400 and the empty pallet placing part 410. To this end, the pallets 10 can be transferred through the pallet conveyor as mentioned above.

另一方面,本發明的第二實施例的模組處理器為,裝載部100及卸除部400以X軸方向排成一列,所述測試部200可位於以Y軸方向間隔於裝載部100及卸除部400的位置。On the other hand, in the module processor of the second embodiment of the present invention, the loading part 100 and the unloading part 400 are arranged in a row in the X-axis direction, and the test part 200 can be located at a distance from the loading part 100 in the Y-axis direction. and the position of the removal part 400.

然後,所述第一緩衝部350及第二緩衝部360以Y軸方向可往返移動地設置在測試部200的X軸方向的兩側,進而如上所述可從裝載部100向測試部200傳遞模組20,或者可從測試部200向卸除部400傳遞模組20。Then, the first buffer part 350 and the second buffer part 360 are disposed on both sides of the test part 200 in the X-axis direction so as to be reciprocally movable in the Y-axis direction, and can be transferred from the loading part 100 to the test part 200 as described above. The module 20 may be transferred from the testing part 200 to the removal part 400 .

另一方面,根據在所述測試部200檢查的模組20中的不合格中的完全不合格的情況等檢查結果,重新傳遞至測試部200執行複檢或者在卸除部400卸除可使用的模組20,並且單獨導出完全不合格的模組20。On the other hand, based on the inspection results such as complete failure among the failures in the module 20 inspected by the testing unit 200, the module 20 is re-transmitted to the testing unit 200 for re-inspection or can be removed and used in the removal unit 400. of module 20, and export completely unqualified module 20 separately.

具體地說,本發明的第二實施例的模組處理器為,在所述裝載部100及卸除部400、測試部200之間以Y軸方向還可包括複檢往返部440、次品部430等。Specifically, the module processor of the second embodiment of the present invention may further include a re-inspection shuttle part 440 and a defective product between the loading part 100, the unloading part 400 and the testing part 200 in the Y-axis direction. Department 430 etc.

所述複檢往返部440為以Y軸方向配置在所述裝載部100及卸除部400、測試部200之間,從第二緩衝部360接收作為複檢對象檢查的模組20進行裝載,之後若裝載預先設定的數量的模組20,則將模組20傳遞至所述第一緩衝部350的結構,可實現為各種結構。The re-inspection reciprocating part 440 is arranged in the Y-axis direction between the loading part 100, the unloading part 400, and the testing part 200, and receives and loads the module 20 inspected as the re-inspection object from the second buffer part 360. Afterwards, if a predetermined number of modules 20 are loaded, the structure of transferring the modules 20 to the first buffer part 350 can be implemented in various structures.

作為一示例,所述複檢往返部440的結構可與第一緩衝部350及第二緩衝部360類似。但是,不同於以Y軸方向移動的第一緩衝部350及第二緩衝部360,所述複檢往返部440的移動方向可設置成以X軸方向移動。As an example, the structure of the rechecking shuttle part 440 may be similar to the first buffer part 350 and the second buffer part 360 . However, unlike the first buffer part 350 and the second buffer part 360 which move in the Y-axis direction, the moving direction of the rechecking and reciprocating part 440 may be set to move in the X-axis direction.

在此,從所述第二緩衝部360向複檢往返部440的傳遞可透過第二模組傳送部620傳送,從複檢往返部440向第一緩衝部350傳送模組20可透過第二模組傳送部620傳送。Here, the transmission from the second buffer part 360 to the re-test shuttle part 440 can be transmitted through the second module transmission part 620, and the module 20 can be transmitted from the re-test shuttle part 440 to the first buffer part 350 through the second module transmission part 620. The module transfer unit 620 transfers.

所述次品部430為以Y軸方向配置在所述裝載部100及卸除部400、測試部200之間單獨導出完全不合格的模組20的結構,可實現為各種結構。The defective part 430 is arranged in the Y-axis direction between the loading part 100, the unloading part 400, and the testing part 200, and is configured to individually export completely defective modules 20, and may be implemented in various structures.

作為一示例,所述次品部430可與所述複檢往返部440排成一列,並包括裝載模組20的托盤10,若全部被完全不合格的模組20填滿,則以X軸方向移動,在附圖中向右側移動可匯出至外部。As an example, the defective part 430 may be arranged in line with the re-inspection shuttle part 440 and include the tray 10 loading the module 20. If all are filled with completely unqualified modules 20, then the X-axis Move in the direction, move to the right in the attached picture to export to the outside.

另一方面,對於本發明的第二實施例的模組處理器說明了以測試部200為中心,在一側裝載模組20,在另一側卸除模組20,但是第一緩衝部350及第二緩衝部360、第一傳送工具700及第二傳送工具800的結構實際上可以是相同的,因此當然也可在測試部200的兩側交替執行裝載過程及卸除過程。On the other hand, the module processor according to the second embodiment of the present invention has been described with the test unit 200 as the center, loading the module 20 on one side, and removing the module 20 on the other side. However, the first buffer unit 350 The structures of the second buffer part 360 , the first transfer tool 700 and the second transfer tool 800 may actually be the same, so of course the loading process and the unloading process may be alternately performed on both sides of the test part 200 .

以上僅是可通過本發明實現的較佳實施例的一部分的相關說明,因此衆所周知不得限於上述的實施例來解釋本發明的範圍,以上說明的本發明的技術思想及其根本的技術思想可全部包含在本發明的範圍內。The above is only a relevant description of a part of the preferred embodiments that can be implemented by the present invention. Therefore, it is well known that the scope of the present invention should not be limited to the above-mentioned embodiments. The technical ideas and fundamental technical ideas of the present invention described above are not limited to the above-mentioned embodiments. All are included in the scope of the present invention.

10:托盤 20:模組 100:裝載部 200:測試部 210:測試插座 211:測試槽 219:鈎部 310:往返部 311:往返板 312:第一裝載槽(裝載槽) 313:第二裝載槽(裝載槽) 314,315:卸除裝載槽 330:第一緩衝部 331,341:緩衝板 332,342:第一裝載槽(裝載槽) 333,343:第二裝載槽(裝載槽) 340:第二緩衝部 350:第一緩衝部 351:第一緩衝托盤(緩衝托盤) 351a,361a:裝載部 351b,361b:移動板 352,362:引導軌道 353,363:Y軸方向移動部 360:第二緩衝部 361:第二緩衝托盤(緩衝托盤) 400:卸除部 410:空托盤放置部 420:模組緩衝部 430:次品部 440:複檢往返部 500:堆棧器 510:升降部 520:引導部 610:第一模組傳送部 611:夾持器 614:線性驅動部 615:移動支撐部 620:第二模組傳送部 630:第三模組傳送部 640:模組工具 641:夾持器 648:拾取工具 649:加壓部 650:第四模組傳送部 700:第一傳送工具 710,810:線性移動部件 711,811:上部板 712,812:側面板 713,813:下部板 714,814:驅動部支撐部 715,815:支撐桿 720,820:拾取部 721,821:夾持器 722,822:加壓部 730,830:線性驅動部 731,831:旋轉驅動部 732,832:旋轉力傳遞工具 733,833:移動部件 734,834:螺絲部 740,840:上下移動部件 750,850:主上下移動部 751,851:主旋轉驅動部 752,852:螺絲部件 753,853:上下驅動部件 754,854:結合桿 760,860:輔助上下移動部 761,861:輔助旋轉驅動部 762,862:螺絲部件 764,864:結合桿 765,865:輔助上下驅動部件 800:第二傳送工具 D 1,D 2:間距 L:動作路徑 L1:第一基線 L2:第二基線 L3:第三基線 P1:第一間距 P2:第二間距 10: Tray 20: Module 100: Loading part 200: Test part 210: Test socket 211: Test slot 219: Hook part 310: Shuttle part 311: Shuttle plate 312: First loading slot (loading slot) 313: Second loading Slot (loading slot) 314, 315: Unloading loading slot 330: First buffer portion 331, 341: Buffer plate 332, 342: First loading slot (loading slot) 333, 343: Second loading slot (loading slot) 340: Second buffer portion 350: Second One buffer part 351: first buffer tray (buffer tray) 351a, 361a: loading part 351b, 361b: moving plate 352, 362: guide rail 353, 363: Y-axis direction moving part 360: second buffer part 361: second buffer tray (buffer tray) Pallet) 400: Unloading part 410: Empty pallet placing part 420: Module buffer part 430: Defective part 440: Reinspection and shuttle part 500: Stacker 510: Elevating part 520: Guide part 610: First module transfer part 611: Holder 614: Linear drive part 615: Moving support part 620: Second module transfer part 630: Third module transfer part 640: Module tool 641: Holder 648: Picking tool 649: Pressure part 650: Fourth module transfer part 700: First transfer tool 710, 810: Linear moving part 711, 811: Upper plate 712, 812: Side plate 713, 813: Lower plate 714, 814: Drive part support part 715, 815: Support rod 720, 820: Pickup part 721, 821: Clamp 722, 822: Pressure part 730, 830: Linear drive part 731, 831: Rotary drive part 732, 832: Rotary force transmission tool 733, 833: Moving part 734, 834: Screw part 740, 840: Up and down moving part 750, 850: Main up and down moving part 751, 851: Main rotation driving part 752, 852: Screw part 753, 853: Vertical drive member 754, 854: Coupling rod 760, 860: Auxiliary vertical movement part 761, 861: Auxiliary rotation drive part 762, 862: Screw member 764, 864: Coupling rod 765, 865: Auxiliary vertical drive member 800: Second transfer tool D 1 , D 2 : Distance L: Action path L1: first baseline L2: second baseline L3: third baseline P1: first distance P2: second distance

圖1是顯示本發明第一實施例的模組處理器的平面圖; 圖2a是顯示構成圖1中的裝載部及卸除部的托盤堆棧器的一示例的平面圖; 圖2b是圖2a的托盤堆棧器的前視圖; 圖3a是顯示圖1中用於裝載部與第一緩衝部之間的傳送模組、第二緩衝部與卸除部之間的傳送模組的模組傳送部的一示例的側視圖; 圖3b是顯示圖3a的模組傳送部調整夾持模組的一對夾持器之間的間距以拾取及傳送規格不同的模組的側視圖; 圖4是圖3a的模組傳送部的前視圖; 圖5a及圖5b分別顯示第一緩衝部及第二緩衝部的平面圖;其中,圖5a是顯示為了與裝載部/卸除部交換模組,裝載槽部間隔第一間距的狀態的平面圖;圖5b是顯示為了與裝載往返部/卸除往返部交換模組,裝載槽部間隔第二間距的平面圖; 圖6是顯示圖1中的第一緩衝部及裝載往返部或者第二緩衝部及卸除往返部的配置的平面圖; 圖7是顯示圖1中的裝載往返部/卸除往返部及測試部之間的傳送及配置的平面圖; 圖8a至圖8e是顯示裝載往返部/卸除往返部及測試部之間傳送模組及測試過程的示意圖; 圖9a至圖9d是顯示對於測試部分離模組的過程的示意圖; 圖10a至圖10d是顯示對於測試部放置模組的過程的示意圖; 圖11是顯示本發明第二實施例的模組處理器的平面圖; 圖12a是顯示在圖11的模組處理器使用的托盤的一示例的平面圖; 圖12b是顯示在圖11的模組處理器使用的緩衝托盤的一示例的平面圖; 圖12c是顯示在圖11的模組處理器使用的測試部側的一示例的平面圖; 圖13a及圖13b是顯示在圖11的模組處理器中透過裝載往返部/卸除往返部拾取模組的過程的一示例的示意圖; 圖14a及圖14b為顯示圖13a及圖13b的裝載往返部/卸除往返部的一示例的圖,分別顯示用於拾取DIMM規格的DRAM或者so-DIMM規格的DRAM的狀態; 圖15a是將圖14a中的A部分放大的放大圖; 圖15b是將圖14b中的B部分尺放大的放大圖;以及 圖16是從另一側面看圖13a及圖13b的裝載往返部/卸除往返部的側視圖。 Figure 1 is a plan view showing a module processor according to a first embodiment of the present invention; Figure 2a is a plan view showing an example of the pallet stacker constituting the loading section and the unloading section in Figure 1; Figure 2b is a front view of the pallet stacker of Figure 2a; FIG. 3a is a side view showing an example of the module transfer part used for transferring modules between the loading part and the first buffer part and between the second buffer part and the removal part in FIG. 1; Figure 3b is a side view showing that the module transfer section of Figure 3a adjusts the distance between a pair of clampers holding the module to pick up and transfer modules with different specifications; Figure 4 is a front view of the module transfer section of Figure 3a; 5a and 5b respectively show plan views of the first buffer part and the second buffer part; wherein, FIG. 5a is a plan view showing the state in which the loading groove part is spaced apart by a first distance in order to exchange the module with the loading part/unloading part; FIG. 5b is a plan view showing that in order to exchange the module with the loading shuttle/unloading shuttle, the loading grooves are spaced at a second distance; Fig. 6 is a plan view showing the arrangement of the first buffer portion and the loading shuttle portion or the second buffer portion and the unloading shuttle portion in Fig. 1; Figure 7 is a plan view showing the transfer and arrangement between the loading shuttle/unloading shuttle and the test section in Figure 1; Figures 8a to 8e are schematic diagrams showing the transfer module and testing process between the loading shuttle part/unloading shuttle part and the test part; Figures 9a to 9d are schematic diagrams showing the process of separating the module for the test part; Figures 10a to 10d are schematic diagrams showing the process of placing the module on the test section; Figure 11 is a plan view showing a module processor according to a second embodiment of the present invention; Figure 12a is a plan view showing an example of a tray used by the module processor of Figure 11; Figure 12b is a plan view showing an example of a buffer tray used in the module processor of Figure 11; Figure 12c is a plan view showing an example of the test section side used by the module processor of Figure 11; 13a and 13b are schematic diagrams illustrating an example of a process of picking up a module by loading/unloading the shuttle in the module processor of FIG. 11; Figures 14a and 14b are diagrams showing an example of the loading shuttle/unloading shuttle of Figures 13a and 13b, respectively showing the state of picking up DIMM-standard DRAM or so-DIMM-standard DRAM; Figure 15a is an enlarged view of part A in Figure 14a; Figure 15b is an enlarged view of part B in Figure 14b; and Fig. 16 is a side view of the loading shuttle/unloading shuttle of Figs. 13a and 13b seen from another side.

10:托盤 10: Tray

100:裝載部 100:Loading Department

200:測試部 200:Testing Department

210:測試插座 210:Test socket

310:往返部 310: Round trip department

330:第一緩衝部 330: First buffer part

340:第二緩衝部 340: Second buffer part

350:第一緩衝部 350: First buffer part

400:卸除部 400:Removal part

410:空托盤放置部 410: Empty pallet placement department

420:模組緩衝部 420:Module buffer part

610:第一模組傳送部 610: First module transmission department

620:第二模組傳送部 620: Second module transmission department

630:第三模組傳送部 630:Third module transmission department

650:第四模組傳送部 650: The fourth module transmission department

L:動作路徑 L: action path

L1:第一基線 L1: first baseline

L2:第二基線 L2: second baseline

L3:第三基線 L3: third baseline

Claims (26)

一種模組處理器,包括: 一裝載部(100),用以在一托盤(10)裝載複數個模組(20); 一第一緩衝部(330),從所述裝載部(100)接收所述複數個模組(20)以暫時裝載; 一測試部(200),設置在一測試位置,並在插入所述模組(20)之後執行預先設定的檢查,所述測試位置設定在預先設定的一動作路徑(L)上; 一個以上的往返部(310),可移動地設置,以沿所述動作路徑(L)循環於在所述動作路徑(L)上設定的一裝載位置、所述測試位置及一卸載位置,並從所述第一緩衝部(330)接收所述複數個模組(20)來傳遞至所述測試部(200); 一第二緩衝部(340),在所述卸載位置從所述往返部(310)接收完成檢查的所述複數個模組(20)以暫時裝載;以及 一卸除部(400),從所述第二緩衝部(340)接收所述複數個模組(20),按照預先設定的分類標準卸除於所述托盤(10)。 A module processor including: A loading part (100) for loading a plurality of modules (20) on a pallet (10); A first buffer part (330) receives the plurality of modules (20) from the loading part (100) for temporary loading; A test part (200) is set at a test position, and performs preset inspections after inserting the module (20). The test position is set on a preset action path (L); More than one shuttle part (310) is movably provided to circulate along the action path (L) at a loading position, the test position and an unloading position set on the action path (L), and Receive the plurality of modules (20) from the first buffer part (330) and transfer them to the test part (200); a second buffer part (340) that receives the plurality of modules (20) that have completed inspection from the shuttle part (310) at the unloading position for temporary loading; and A removal part (400) receives the plurality of modules (20) from the second buffer part (340), and removes them to the tray (10) according to preset classification standards. 根據請求項1所述的模組處理器,其中,所述模組(20)為DIMM規格的DRAM或者so-DIMM規格的DRAM。The module processor according to claim 1, wherein the module (20) is a DRAM with DIMM specifications or a DRAM with so-DIMM specifications. 根據請求項1所述的模組處理器,其中,所述模組(20)以其板面朝向水平方向地移動; 其中,所述托盤(10)以間隔一第一間距(P1)地配置各個所述模組(20),所述測試部(200)的一測試插座(210)以間隔一第二間距(P2)配置; 其中,所述第一緩衝部(330)在一裝載槽(332、333)之間間隔所述第一間距(P1),以所述第一間距(P1)從所述裝載部(100)接收所述模組(20),並改變所述裝載槽(332、333)之間的間距,以使所述裝載槽(332、333)之間間隔所述第二間距(P2),進而將所述模組(20)間隔所述第二間距(P2)地傳遞至所述往返部(310);以及 其中,所述第二緩衝部(340)在所述裝載槽(342、343)之間間隔所述第一間距(P1),進而將所述模組(20)間隔所述第一間距(P1)地傳遞至所述卸除部(400),並改變所述裝載槽(342、343)之間的間距,以使所述裝載槽(342、343)間隔所述第二間距(P2),進而在所述卸載位置從所述往返部(310)間隔所述第二間距(P2)地傳遞所述模組(20)。 The module processor according to claim 1, wherein the module (20) moves with its board surface facing the horizontal direction; The tray (10) arranges each of the modules (20) at a first spacing (P1), and a test socket (210) of the test part (200) is spaced at a second spacing (P2). ) configuration; Wherein, the first buffer part (330) is spaced by the first spacing (P1) between a loading slot (332, 333), and receives data from the loading part (100) at the first spacing (P1). The module (20), and changes the spacing between the loading slots (332, 333), so that the loading slots (332, 333) are separated by the second spacing (P2), and then all the loading slots (332, 333) are separated by the second spacing (P2). The module (20) is delivered to the shuttle portion (310) at a distance of the second spacing (P2); and Wherein, the second buffer part (340) is spaced by the first spacing (P1) between the loading slots (342, 343), and further separates the module (20) by the first spacing (P1). ) to the removal part (400), and change the distance between the loading grooves (342, 343) so that the loading grooves (342, 343) are spaced apart by the second distance (P2), Furthermore, the module (20) is transferred from the reciprocating part (310) at the unloading position by the second pitch (P2). 根據請求項1所述的模組處理器,其中,所述往返部(310)設置有一加熱部,以在向所述測試部(200)傳遞所述模組(20)之前進行加熱。The module processor according to claim 1, wherein the shuttle part (310) is provided with a heating part to heat the module (20) before transferring it to the testing part (200). 根據請求項1所述的模組處理器,其中,所述往返部(310)將放置第一規格的所述模組(20)的一第一裝載槽及與所述第一裝載槽相鄰設置並放置第二規格的所述模組(20)的一第二裝載槽組成一小組,並沿移動方向配置n個以上的所述小組來組成一中間組; 其中,所述中間組的所述小組為,相鄰的所述中間組的所述小組間隔的間距配置成一第二間距(P2),所述第二間距(P2)與所述測試部(200)的一測試插座(210)的間距相對應。 The module processor according to claim 1, wherein the shuttle portion (310) will place a first loading slot of the module (20) of the first specification and be adjacent to the first loading slot. Set and place a second loading slot of the module (20) of the second specification to form a small group, and arrange more than n of the small groups along the moving direction to form an intermediate group; Wherein, the small groups of the middle group are arranged such that the spacing between the small groups of the adjacent middle group is configured as a second spacing (P2), and the second spacing (P2) is connected to the test part (200). ) corresponds to the spacing of a test socket (210). 一種模組處理器,包括: 一裝載部(100),在一托盤(10)裝載複數個模組(20); 一卸除部(400),接收完成檢查的所述複數個模組(20),以按照預先設定的分類標準卸除於所述托盤(10); 一測試部(200),位於一第三基線(L3)上,對於所述複數個模組(20)執行預先設定的檢查,所述第三基線(L3)以垂直方向間隔於連接所述裝載部(100)及所述卸除部(400)的一第一基線(L1); 一第一緩衝部(350),往返移動至一裝載位置與第一交換位置之間,以在所述裝載位置從所述裝載部(100)接收所述複數個模組(20),在所述第三基線(L3)上設定的所述第一交換位置將所述複數個模組(20)傳遞至所述測試部(200);以及 一第二緩衝部(360),往返移動至一卸載位置與一第二交換位置之間,以在所述第三基線(L3)上設定的所述第二交換位置從所述測試部(200)接收完成檢查的所述複數個模組(20)來移動至所述卸載位置,將完成檢查的所述複數個模組(20)傳遞至所述卸除部(400)。 A module processor including: A loading part (100) loads a plurality of modules (20) on a pallet (10); A removal part (400) receives the plurality of modules (20) that have been inspected and removes them from the tray (10) according to preset classification standards; A test part (200) is located on a third baseline (L3), which performs preset inspections on the plurality of modules (20). The third baseline (L3) is vertically spaced to connect the load. part (100) and a first baseline (L1) of the removal part (400); A first buffer part (350) moves back and forth between a loading position and a first exchange position to receive the plurality of modules (20) from the loading part (100) at the loading position, where The first exchange position set on the third baseline (L3) transfers the plurality of modules (20) to the test part (200); and A second buffer part (360) moves back and forth between an unloading position and a second exchange position, so as to move from the test part (200) to the second exchange position set on the third baseline (L3). ) receives the plurality of modules (20) that have been inspected and moves them to the unloading position, and transfers the plurality of modules (20) that have been inspected to the unloading part (400). 根據請求項6所述的模組處理器,其中,所述測試部(200)位於所述第一緩衝部(350)的動作路徑與所述第二緩衝部(360)的動作路徑之間。The module processor according to claim 6, wherein the test part (200) is located between the action path of the first buffer part (350) and the action path of the second buffer part (360). 根據請求項6所述的模組處理器,其中,所述第一緩衝部(350)及所述第二緩衝部(360)包括一對緩衝托盤(351、361),所述一對緩衝托盤(351、361)以所述第一基線(L1)的方向平行配置。The module processor according to claim 6, wherein the first buffer part (350) and the second buffer part (360) include a pair of buffer trays (351, 361), and the pair of buffer trays (351, 361) are arranged parallel to the direction of the first baseline (L1). 根據請求項6至8中任意一項所述的模組處理器,還包括: 一第一模組傳送部(610),從所述裝載部(100)的所述托盤(10)拾取所述複數個模組(20),以將拾取的所述複數個模組(20)裝載於位在所述裝載位置的所述第一緩衝部(350); 一第二模組傳送部(620),從位於所述卸載位置的所述第二緩衝部(360)拾取所述複數個模組(20),以將拾取的所述複數個模組(20)裝載於所述卸除部(400)的所述托盤(10); 一第一傳送工具(700),從位於所述第一交換位置的所述第一緩衝部(350)拾取所述複數個模組(20),以將拾取的所述複數個模組(20)裝載於所述測試部(200)的一測試插座(210);以及 一第二傳送工具(800),從所述測試部(200)的所述測試插座(210)拾取完成檢查的所述複數個模組(20),以將拾取的所述複數個模組(20)裝載於位在所述第二交換位置的所述第一緩衝部(350)。 The module processor according to any one of claims 6 to 8, further comprising: A first module transfer part (610) picks up the plurality of modules (20) from the tray (10) of the loading part (100), so as to transfer the picked up plurality of modules (20) Loaded on the first buffer portion (350) located in the loading position; A second module transfer part (620) picks up the plurality of modules (20) from the second buffer part (360) located at the unloading position, so as to transfer the picked up plurality of modules (20) ) the pallet (10) loaded on the unloading part (400); A first transfer tool (700) picks up the plurality of modules (20) from the first buffer portion (350) located at the first exchange position, so as to transfer the picked up plurality of modules (20) ) is mounted on a test socket (210) of the test part (200); and A second transfer tool (800) picks up the plurality of modules (20) that have been inspected from the test socket (210) of the test part (200), so as to transfer the picked up plurality of modules (20) 20) Loaded in the first buffer portion (350) located in the second exchange position. 根據請求項9所述的模組處理器,其中,所述模組(20)以其板面朝向水平方向地移動; 其中,所述托盤(10)為以X軸方向間隔一第一間距(P1)地配置各個所述模組(20),所述測試部(200)的所述測試插座(210)以X軸方向間隔一第二間距(P2)地配置;以及 其中,所述第一緩衝部(350)及所述第二緩衝部(360)包括複數個裝載組,所述複數個裝載組包括以X軸方向間隔第二間距(P2)配置的複數個裝載部(351a、361a),所述複數個裝載組的各個裝載組的裝載部(351a、361a)與其他裝載組中的相鄰的裝載部(351a、361a)間隔所述第一間距(P1)地配置。 The module processor according to claim 9, wherein the module (20) moves with its board surface facing the horizontal direction; Wherein, the tray (10) arranges each of the modules (20) at a first spacing (P1) in the X-axis direction, and the test socket (210) of the test part (200) The directions are spaced apart by a second spacing (P2); and Wherein, the first buffer part (350) and the second buffer part (360) include a plurality of loading groups, and the plurality of loading groups include a plurality of loads arranged at a second spacing (P2) in the X-axis direction. parts (351a, 361a), the loading parts (351a, 361a) of each loading group of the plurality of loading groups are separated from adjacent loading parts (351a, 361a) in other loading groups by the first spacing (P1) configured locally. 根據請求項10所述的模組處理器,其中,所述第一傳送工具(700)及所述第二傳送工具(800)包括n個(n為2以上的自然數)拾取部(720、820),所述拾取部(720、820)以X軸方向間隔所述第二間距(P2)地配置;以及 其中,所述複數個裝載組的X軸方向的數量為m個(m為1以上的自然數)。 The module processor according to claim 10, wherein the first transfer tool (700) and the second transfer tool (800) include n (n is a natural number above 2) pickup parts (720, 820), the pick-up portions (720, 820) are arranged at intervals in the X-axis direction by the second spacing (P2); and Wherein, the number of the plurality of loading groups in the X-axis direction is m (m is a natural number greater than 1). 根據請求項10所述的模組處理器,其中,所述測試插座(210)的X軸方向的數量為n個,所述測試插座(210)以X軸方向間隔所述第二間距(P2)地配置。The module processor according to claim 10, wherein the number of the test sockets (210) in the X-axis direction is n, and the test sockets (210) are spaced apart by the second spacing (P2) in the X-axis direction. ) to configure. 根據請求項10所述的模組處理器,其中,所述第一傳送工具(700)及所述第二傳送工具(800)包括: 一線性移動部件(710、810),沿X軸方向進行線性移動; 一上下移動部件(740、840),可上下移動地結合於所述線性移動部件(710、810); 一個以上的拾取部(720、820),包括一對夾持器(721、821),所述一對夾持器(721、821)結合於所述上下移動部件(740、840),以所述模組(20)的長度方向彼此朝向相反的方向移動來夾持所述模組(20)的兩端部; 一線性驅動部(730、830),結合於所述上下移動部件(740、840),以夾持及解除夾持的方向移動所述一對夾持器(721、821);以及 一主上下移動部(750、850),用以上下移動所述上下移動部件(740、840)。 The module processor according to claim 10, wherein the first transfer tool (700) and the second transfer tool (800) include: A linear moving component (710, 810) that moves linearly along the X-axis direction; An up-and-down moving component (740, 840), which is coupled to the linear moving component (710, 810) to move up and down; More than one pick-up part (720, 820) includes a pair of clamps (721, 821), and the pair of clamps (721, 821) is combined with the up and down moving parts (740, 840), so The length directions of the module (20) move in opposite directions to clamp both ends of the module (20); A linear drive part (730, 830), combined with the up and down moving parts (740, 840), moves the pair of clampers (721, 821) in the direction of clamping and releasing; and A main up-and-down moving part (750, 850) is used to move the up-and-down moving part (740, 840) up and down. 根據請求項13所述的模組處理器,其中,所述第一傳送工具(700)及所述第二傳送工具(800)包括: 一加壓部(722、822),設置在所述一對夾持器(721、821)之間,通過上下移動向下側加壓所述模組(20);以及 一輔助上下移動部(760、860),用以上下移動所述加壓部(722、822)。 The module processor according to claim 13, wherein the first transfer tool (700) and the second transfer tool (800) include: A pressurizing part (722, 822) is provided between the pair of clampers (721, 821) and presses the module (20) downward by moving up and down; and An auxiliary upward and downward moving part (760, 860) is used to move the pressurizing part (722, 822) up and down. 根據請求項13所述的模組處理器,其中,所述線性驅動部(730、830)包括: 一螺絲部(734、834),通過旋轉使所述一對夾持器(721、821)的一移動部件(733、833)以所述模組(20)的長度方向彼此朝向相反的方向移動;以及 一旋轉驅動部(731、831),直接或者間接旋轉所述螺絲部(734、834)。 The module processor according to claim 13, wherein the linear driving part (730, 830) includes: A screw part (734, 834) rotates to move a moving part (733, 833) of the pair of clamps (721, 821) in opposite directions in the length direction of the module (20). ;as well as A rotation driving part (731, 831) directly or indirectly rotates the screw part (734, 834). 根據請求項15所述的模組處理器,其中,所述旋轉驅動部(731、831)通過一旋轉力傳遞工具(732、832)旋轉驅動所述螺絲部(734、834)。The module processor according to claim 15, wherein the rotational driving part (731, 831) rotationally drives the screw part (734, 834) through a rotational force transmission tool (732, 832). 根據請求項15所述的模組處理器,其中,以所述模組(20)的長度方向設置複數個所述拾取部(720、820);以及 其中,通過一個所述旋轉驅動部(731、831)旋轉驅動所述複數個拾取部(720、820)的所述螺絲部(734、834)。 The module processor according to claim 15, wherein a plurality of the pickup parts (720, 820) are provided in the length direction of the module (20); and Among them, the screw parts (734, 834) of the plurality of pickup parts (720, 820) are rotationally driven by one of the rotation driving parts (731, 831). 根據請求項17所述的模組處理器,其中,所述複數個拾取部(720、820)的所述螺絲部(734、834)與相鄰的所述螺絲部(734、834)形成一體,或者通過連接器相互連接,以被一個所述旋轉驅動部(731、831)旋轉驅動。The module processor according to claim 17, wherein the screw parts (734, 834) of the plurality of pickup parts (720, 820) are integrated with the adjacent screw parts (734, 834) , or connected to each other through connectors to be rotationally driven by one of the rotation driving parts (731, 831). 根據請求項10所述的模組處理器,其中,所述模組(20)為DIMM規格的DRAM或者so-DIMM規格的DRAM。The module processor according to claim 10, wherein the module (20) is a DRAM with DIMM specifications or a DRAM with so-DIMM specifications. 一種傳送工具,用以傳送一模組(20),所述模組(20)形成直角四邊形形狀並處於板面朝向X軸方向的狀態,包括: 一線性移動部件(710、810),沿X軸方向進行線性移動; 一上下移動部件(740、840),可上下移動地結合於所述線性移動部件(710、810); 一個以上的拾取部(720、820),包括一對夾持器(721、821),所述一對夾持器(721、821)結合於所述上下移動部件(740、840),以所述模組(20)的長度方向彼此朝向相反的方向移動來夾持模組(20)的兩端部; 一線性驅動部(730、830),結合於所述上下移動部件(740、840),以夾持及解除夾持方向移動所述一對夾持器(721、821);以及 一主上下移動部(750、850),用以上下移動所述上下移動部件(740、840)。 A conveying tool used to convey a module (20). The module (20) forms a right-angled quadrilateral shape and is in a state where the board surface faces the X-axis direction, including: A linear moving component (710, 810) that moves linearly along the X-axis direction; An up-and-down moving component (740, 840), which is coupled to the linear moving component (710, 810) to move up and down; More than one pick-up part (720, 820) includes a pair of clamps (721, 821), and the pair of clamps (721, 821) is combined with the up and down moving parts (740, 840), so The length directions of the module (20) move in opposite directions to clamp both ends of the module (20); A linear drive part (730, 830), combined with the up and down moving parts (740, 840), moves the pair of clampers (721, 821) in the clamping and releasing direction; and A main up-and-down moving part (750, 850) is used to move the up-and-down moving part (740, 840) up and down. 根據請求項20所述的傳送工具,還包括: 一加壓部(722、822)設置在所述一對夾持器(721、821)之間,通過上下移動向下側加壓所述模組(20);以及 一輔助上下移動部(760、860),用以上下移動所述加壓部(722、822)。 The delivery tool according to claim 20, further comprising: A pressurizing part (722, 822) is provided between the pair of clampers (721, 821), and presses the module (20) downward by moving up and down; and An auxiliary upward and downward moving part (760, 860) is used to move the pressurizing part (722, 822) up and down. 根據請求項20所述的傳送工具,其中,所述線性驅動部(730、830)包括: 一螺絲部(734、834),通過旋轉使所述一對夾持器(721、821)的一移動部件(733、833)以所述模組(20)的長度方向彼此朝向相反的方向移動;以及 一旋轉驅動部(731、831),直接或者間接旋轉所述螺絲部(734、834)。 The conveying tool according to claim 20, wherein the linear drive part (730, 830) includes: A screw part (734, 834) rotates to move a moving part (733, 833) of the pair of clamps (721, 821) in opposite directions in the length direction of the module (20). ;as well as A rotation driving part (731, 831) directly or indirectly rotates the screw part (734, 834). 根據請求項22所述的傳送工具,其中,所述旋轉驅動部(731、831)通過一旋轉力傳遞工具(732、832)旋轉驅動所述螺絲部(734、834)。The transmission tool according to claim 22, wherein the rotational driving part (731, 831) rotationally drives the screw part (734, 834) through a rotational force transmission tool (732, 832). 根據請求項22所述的傳送工具,其中,以所述模組(20)的長度方向設置複數個所述拾取部(720、820);以及 其中,通過一個旋轉驅動部(731、831)旋轉驅動所述複數個拾取部(720、820)的所述螺絲部(734、834)。 The transfer tool according to claim 22, wherein a plurality of the pickup parts (720, 820) are provided in the length direction of the module (20); and Among them, the screw parts (734, 834) of the plurality of pickup parts (720, 820) are rotationally driven by one rotation driving part (731, 831). 根據請求項24所述的傳送工具,其中,所述複數個拾取部(720、820)的所述螺絲部(734、834)與相鄰的所述螺絲部(734、834)形成一體,或者通過連接器相互連接,以被一個所述旋轉驅動部(731、831)旋轉驅動。The transfer tool according to claim 24, wherein the screw parts (734, 834) of the plurality of pickup parts (720, 820) are integrated with the adjacent screw parts (734, 834), or They are connected to each other through connectors to be rotationally driven by one of the rotation driving parts (731, 831). 根據請求項20所述的傳送工具,其中,所述模組(20)為DIMM規格的DRAM或者so-DIMM規格的DRAM。The transfer tool according to claim 20, wherein the module (20) is a DRAM with DIMM specifications or a DRAM with so-DIMM specifications.
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