TW202331267A - Probe capable of improving the inspection accuracy of a connector - Google Patents

Abstract

The present disclosure provides a probe 1 for testing a connector 100 having a plurality of contacts 1001, which includes a conductive plunger 4 having a tip portion 42 provided therein a plurality of probe pins 3 to correspond to the plurality of contacts 1001; a conductive housing 8 arranged in such a way that the tip portion 42 is included therein, configured to extend in opposite to the tip surface 423 of the tip portion 42 at the inner bottom surface 823 of an end portion 84, and provided with a bottom portion 82 with a plurality of openings 82H for exposing the plurality of probe pins 3 to the outside; and a conductive abutting auxiliary portion arranged between the tip surface 423 of the tip portion 42 and the inner bottom surface 823 of the bottom portion 82, and capable of being in contact with both the tip surface 423 and the inner bottom surface 823 between at least the plurality of probe pins 3.

Description

probe

The disclosure relates to a probe for inspecting connectors.

Patent Document 1 discloses a probe in which a fixed plunger is brought into contact with a conductive shell of the connector and grounded to connect a plurality of probe pins to each contact point of the connector when inspecting the connector. [Prior Art Literature]

Patent Document 1: International Publication No. 2019/069576

In the probe as exemplified in Patent Document 1, since grounding is not ensured in the area between the probe pins, signals between the probe pins may interfere with each other. As a result, in the conventional probe, high-precision inspection of the connector is hindered.

Therefore, the present disclosure provides a probe that improves the inspection accuracy of the connector.

A probe according to an aspect of the present disclosure is a probe for inspecting a connector having a plurality of contacts, and includes: a conductive plunger having a plurality of inner packages corresponding to the plurality of contacts. The front end of the probe pin; the conductive shell, which is arranged to enclose the front end, and has: the bottom, which extends the inner bottom surface in the end to face the front end of the front end, forming a A plurality of openings for exposing a plurality of probe pins to the outside; and a conductive contact auxiliary part, which is provided between the front end surface of the front end and the inner bottom surface of the bottom, and is formed between at least a plurality of probe pins It can be in contact with both the front end surface and the inner bottom surface.

In the probe according to one aspect of the present disclosure, between the plurality of probe pins, the abutting auxiliary portion is configured to be in contact with both the front end surface of the front end portion and the inner bottom surface of the bottom portion (ground contact). This prevents a gap (interval) from being generated between at least a plurality of probes, between the front end and the bottom, and a state where grounding cannot be ensured. Thereby, it is possible to suppress the interference of signals between the plurality of probe pins which is a problem when the grounding cannot be ensured among the plurality of probe pins. As a result, the inspection accuracy of the connector can be improved.

According to the present disclosure, it is possible to provide a probe that improves the inspection accuracy of a connector.

Hereinafter, the embodiment will be described in detail with reference to the drawings. In the description, the same symbol is marked for the same element or the element with the same function, and repeated explanations are omitted.

[First Embodiment] Fig. 1 is a diagram showing the appearance of a probe 1 according to the first embodiment. Fig. 1 (a) is a plan view, Fig. 1 (b) is a perspective view, Fig. 1 (c) is a side view, and Fig. 1 (d) is a bottom view. The shape of the probe 1 in a top view (see FIG. 1( a )) and the shape of the probe 1 in a bottom view (see FIG. 1( d )) are both approximately rectangular. Hereinafter, the direction along the long sides of the rectangle is referred to as the X-axis direction, and the direction along the short sides of the rectangle is referred to as the Y-axis direction. The direction perpendicular to the X-axis and the Y-axis, that is, the height direction is referred to as the Z-axis direction. The X axis, the Y axis, and the Z axis are orthogonal to each other. The probe 1 has a substantially columnar shape extending in the Z-axis direction as a whole.

FIG. 2 is a diagram showing the appearance of the probe 1 and the connector 100 . Fig. 2(a) is a side view, and Fig. 2(b) is a perspective view. The probe 1 is a tool for inspecting the connector 100 . The connector 100 is a multi-core connector provided with a plurality of contacts 1001, 1001 (see FIG. 3). A plurality of contacts 1001, 1001 are arranged along a plurality of rows, for example. In the present embodiment, the connector 100 includes: two contacts 1001, 1001 arranged in two rows; and an insulating case 1003 which fixes the contacts 1001, 1001. Also, the connector 100 has a shell 1002 surrounding the outer periphery of an insulating shell 1003 and dividing a plurality of contacts 1001, 1001 (see FIG. 3 ). Case 1002 functions as a ground connection. The connector 100 is disposed on a printed substrate (not shown), and the connector 100 is electrically connected to the printed substrate. Moreover, the connector 100 is electrically connected to the probe 1 during inspection. Various components other than the connector 100 may be arranged on the printed circuit board.

The probe 1 and the connector 100 are electrically connected by the probe 1 moving in the Z-axis direction. Hereinafter, in the Z-axis direction, the direction in which the connector 100 is located viewed from the probe 1 is referred to as "down", and the direction in which the probe 1 is located viewed from the connector 100 is referred to as "up". The probe 1 is arranged upwardly as viewed from the connector 100 . When the probe 1 is connected to the connector 100 , an upward pressing force (hereinafter referred to as “pressing force”) is applied to the probe 1 as a reaction to the downward pressing force on the probe 1 . The state where no pressing force is applied to the probe 1 is called an initial state, and the state where a pressing force is applied is called a stroke state.

Referring to FIG. 3 , the structure of the probe 1 will be described. FIG. 3 is a cross-sectional view along line A-A of FIG. The probe 1 includes a conductive part 2, a probe pin 3, a plunger 4, a substrate 5, a flange 6, a spring 7, a case 8, a cap 9, and a spacer 10 (abutting auxiliary part).

The conductive part 2 is electrically connected to the probe pin 3 . "Electrical connection" here refers to the case of electrically connecting the conductive part 2 and the probe pin 3 by physically directly connecting the conductive part 2 to the probe pin 3, including the case of disposing the conductive part 2 on the conductive part 2. The conductive part (such as the substrate 5 ) between the probe pins 3 indirectly connects the conductive part 2 to the probe pins 3 , thereby electrically connecting the conductive part 2 to the probe pins 3 . In addition, the conductive part 2 is electrically connected to external inspection equipment and the like, for example.

For example, the conductive part 2 has a plurality (for example, two) of coaxial cables 21 and a plurality of (for example, two) of conductive members 22 . The coaxial cable 21 is a conductor covered with an insulator extending in the Z-axis direction. The conductive member 22 is a conductive part (such as a metal-containing conductor or wiring) extending in the Z-axis direction. The coaxial cable 21 is electrically connected to the conductive member 22 . The conductive part 2 may also consist of only at least one of the coaxial cable 21 and the conductive member 22 .

The probe pin 3 is a needle-shaped conductive part, such as a pogo pin. The probe pins 3 are provided in a plurality (for example, two) corresponding to the plurality of contact points 1001, 1001 of the connector 100 one-to-one, and extend along the Z-axis direction. The front end of the probe pin 3 faces the connector 100 in the Z-axis direction. In the present embodiment, "facing" means also including the case where there are other members or the like between objects facing each other.

The substrate 5 is a roughly cylindrical part that electrically connects the conductive part 2 and the plurality of probe pins 3 to each other. The substrate 5 has a first main surface 51 and a second main surface 52 facing the first main surface 51 . The substrate 5 is electrically connected to the conductive portion 2 on the first main surface 51 . The substrate 5 is electrically connected to the plurality of probe pins 3 on the second main surface 52 . Details of the substrate 5 will be described later.

The plunger 4 is a conductive part having a main body 41 and a front end 42 . The main body portion 41 is formed in a substantially cylindrical shape and includes at least a part of the conductive portion 2 . Specifically, the main body portion 41 includes a part of the plurality of coaxial cables 21 and the plurality of conductive members 22, and extends in the Z-axis direction along these configurations. The main body 41 has an upper surface 411 , a bottom surface 412 , and a side surface 413 disposed in the Z-axis direction across the upper surface 411 and the bottom surface 412 , forming a cylindrical shape. A plurality of through-holes 41H along the Z-axis direction are formed in the body portion 41 from the upper surface 411 to the bottom surface 412 . The insulators D each enclosing the conductive member 22 and the like constituting the duct portion 2 are arranged in the plurality of through holes 41H. For example, in the plurality of through-holes 41H, the coaxial cable 21 is inserted from the upper surface 411 along the Z-axis direction, and the gap of the insertion part of the coaxial cable 21 is filled by the collar C. The bottom surface 412 faces the substrate 5 in the Z-axis direction. The front end of the conductive part 2 (for example, the conductive member 22 ) is exposed from the bottom surface 412 .

A protruding portion 416 in the shape of an annular plate is formed on the lower portion 415 of the main body portion 41 . In addition, the lower part 415 here refers not only to the lower end of the main body part 41, but also includes the vicinity of the lower end (the region near the lower end). The protruding portion 416 protrudes outward in the X-axis direction with the side surface 413 as a base end. The upper surface 4161 of the annular plate-shaped protruding portion 416 faces the lower surface 622 of the annular portion 62 described later in the Z direction. The lower surface 4162 of the protruding portion 416 faces the upper surface 821 of the bottom 82 described later in the Z-axis direction.

The front end portion 42 is formed in a columnar shape, is disposed on the lower portion 415 of the main body portion 41 , and is fixed to the main body portion 41 . The front end portion 42 includes a plurality of probe pins 3 , accommodates the substrate 5 , and extends in the Z-axis direction along the plurality of probe pins 3 . The substrate 5 is disposed so as to be sandwiched between the main body portion 41 and the front end portion 42 .

The front end portion 42 , the substrate 5 and the probe pins 3 will be described with reference to FIGS. 4 to 6 . FIG. 4 is a diagram showing the appearance of a state where the substrate 5 is housed in the front end portion 42 . Figure 4(a) is a plan view, Figure 4(b) is a perspective view, and Figure 4(c) is a side view. The front end portion 42 has a support portion 421 and a holding portion 422 . The support portion 421 is formed in a bottomed cylindrical shape, and accommodates the substrate 5 . The holding part 422 is formed in a columnar shape, extends in the Z-axis direction (downward) with a portion connected to the supporting part 421 as a base end (upper end), and encloses a plurality of probe pins 3 therein. In addition, the front end portion 42 has a front end surface 423 which is a lower end surface in the Z-axis direction. Furthermore, the holding portion 422 holds the plurality of probe pins 3 so that the front ends (lower ends) of the plurality of probe pins 3 are exposed from the front end surface 423 , respectively.

FIG. 5 is an exploded perspective view showing the appearance of the state before the substrate 5 is accommodated in the front end portion 42 . The substrate 5 has a signal conductive portion 53 and a ground conductive portion 54 . The signal conductive portion 53 is provided across from the first main surface 51 to the second main surface. The signal conductive part 53 is electrically connected to the conductive part 2 and the plurality of probe pins 3 by contacting the plurality of conductive members 22 on the first main surface 51 and contacting the plurality of probe pins 3 on the second main surface 52 . The ground conductive portion 54 is a conductive layered body provided on each of the first main surface 51 and the second main surface 52 .

The supporting portion 421 has: an upper surface 4211 ; a concave portion 4212 formed in such a manner that the upper surface 4211 is depressed; and an inner bottom surface 4213 which is the bottom surface of the concave portion 4212 . The recess 4212 accommodates the substrate 5 . In other words, the concave portion 4212 functions as a tray for the substrate 5 . The inner bottom surface 4213 faces the second main surface of the substrate 5 . On the inner bottom surface 4213, the upper ends (other ends) of the plurality of probe pins 3 are exposed.

Fig. 6 is a sectional view showing a section along line B-B of Fig. 4(a). The substrate 5 of this embodiment is a buildup substrate. For example, the substrate 5 is composed of a base layer BL and a plurality of buildup layers UL forming the first main surface 51 and the second main surface 52 with the base layer BL interposed therebetween.

The signal conduction part 53 has the 1st signal conduction part 531 provided in the buildup layer UL, and the 2nd signal conduction part 532 provided in the base layer BL. The first signal conductive portion 531 provided on the buildup layer UL forming the first main surface 51 is electrically connected to the conductive member 22 . The first signal conductive portion 531 provided on the buildup layer UL forming the second main surface 52 is electrically connected to the probe pins 3 . The second signal conductive part 532 is between the first signal conductive part 531 provided on the buildup layer UL forming the first main surface 51 and the first signal conductive part 531 provided on the buildup layer UL forming the second main surface 52 Relay connection.

The substrate 5 converts the distance between the conductive parts 2 and the distance between the plurality of probe pins 3 . For example, the distance between the plurality of conductive members 22 is greater than the distance between the plurality of probe pins 3 . Corresponding to the difference in pitch, the distance between the first signal conductive portions 531 on the first main surface 51 is greater than the distance between the first signal conductive portions 531 on the second main surface 52 . That is, the first signal conducting part 531 corresponds to the position of the first main surface 51 and the position of the second main surface 52 , and changes the distance between the conducting parts 2 and the distance between the plurality of probe pins 3 .

The diameter of the first signal conducting portion 531 is smaller than the diameter of the second signal conducting portion 532 . For example, the diameter of the second signal conductive portion 532 of the base layer BL is formed by a through hole. Moreover, the diameter of the first signal conductive portion 531 of the buildup layer UL is formed by a laser via. The laser guide hole can be formed with a smaller diameter than the through hole.

As a comparative example, a substrate formed only with through-holes will be described. In this case, holes with the same pitch are formed on each surface of the substrate. Afterwards, since wiring with a variable pitch is provided on one side of the substrate, unnecessary parts (remaining parts) are generated on one side. On the other hand, since the substrate 5 of the present embodiment is a stacked substrate, it can be manufactured without generating any residue. For example, as shown in FIG. 6 , in the substrate 5 of the present embodiment, residual portions are not generated at the positions of the range S, but residual portions are generated at positions corresponding to the range S in the substrate of the comparative example. The substrate 5 of this embodiment improves the reflection characteristics (Return Loss: circuit loss) of signals in a high-frequency (for example, 5 GHz or higher) region than the substrate of the comparative example.

The ground conductive part 54 has a first ground conductive part 541 exposed on the first main surface 51 and a second ground conductive part 542 exposed on the second main surface 52 . The first ground conductive part 541 and the second ground conductive part 542 have a multilayer structure formed by, for example, plating. The first ground conductive portion 541 surrounds the signal conductive portion 53 (the first signal conductive portion 531 ) of the first main surface 51 . For example, when the substrate 5 is viewed from above as shown in FIG. It is provided so as to surround the periphery of the first signal conductive portion 531 . Also, the second ground conductive portion 542 surrounds the signal conductive portion 53 (first signal conductive portion 531 ) of the second main surface 52 . For example, when the substrate 5 is viewed from above, on the second main surface 52, a plurality of (for example, two) first signal conductive parts 531 are arranged near both ends in the X-axis direction, and the second ground conductive part 542 surrounds the first signal conductive part 542. The signal conducting portion 531 is arranged around the periphery (not shown).

As shown in FIG. 6 , the height of the substrate 5 is greater than the depth of the concave portion 4212 of the supporting portion 421 . More specifically, the distance H1 between the first main surface 51 and the second main surface 52 of the substrate 5 is greater than the distance H2 between the upper surface 4211 and the inner bottom surface 4213 of the supporting portion 421 . Therefore, if the substrate 5 is accommodated in the concave portion 4212 , the first main surface 5 of the substrate 5 is exposed more than the upper surface 4211 of the supporting portion 421 .

Returning to FIG. 3 , the flange 6 has a plate-shaped member 61 and an annular portion 62 formed separately from the plate-shaped member 61 . The plate-shaped member 61 is a plate-shaped part for fixing the probe 1 to the inspection equipment. The shape of the planar member 61 is substantially rectangular. The plate member 61 has an upper surface 611 and a lower surface 612 . A through hole 61H is formed in the plate member 61 from the center of the upper surface 611 to the center of the lower surface 612 . When the upper surface 611 is viewed from above or the lower surface 612 is viewed from below, the region where the through hole 61H is formed penetrates in a circular shape. In addition, a pair of holes 61W are formed in the plate-shaped member 61 so as to sandwich the through-hole 61H from the upper surface 611 to the lower surface 612 at both end portions along the X-axis direction. The flange 6 fixes the probe 1 to the inspection equipment by fastening through the hole 61W. In addition, the hole 61W may be a so-called threaded hole (see FIG. 1( a ), ( d )).

A bar-shaped pin P formed separately from the plate-like member 61 is fixed to the upper surface 611 of the plate-like member 61 . The pin P has an upper end P1 and a lower end P2 fixed on the upper surface 611 .

The annular portion 62 is an annular plate-shaped part, and is made of, for example, a highly slidable member such as polyacetal resin. The ring portion 62 has an upper surface 621 and a lower surface 622 . The annular portion 62 is disposed on the lower surface 612 of the plate member 61 along the outer periphery of the through hole 61H of the plate member 61 . In addition, the ring portion 62 surrounds the side surface 413 on the upper portion 414 of the main body portion 41 .

A through hole 62H is formed in the annular portion 62 from the upper surface 621 to the lower surface 622 . The through holes 62H are formed in plural (for example, four) at predetermined intervals along the circumferential direction of the annular portion 62 (see FIG. 2( b )). A rib 83 of the case 8 described later is inserted into the through hole 62H from the lower surface 622 .

The spring 7 has a first spring 71 and a second spring 72 . The first spring 71 is a coil spring. The first spring 71 is disposed between the annular portion 62 of the flange 6 and the protruding portion 416 of the plunger 4 . Specifically, the first spring 71 is disposed so as to be sandwiched between the lower surface 622 of the annular portion 62 and the upper surface 4161 of the protruding portion 416 . The first spring 71 energizes the plunger 4 in the direction away from the flange 6 by energizing the protruding portion 416 in the direction away from the annular portion 62 . In the initial state, the first spring 71 exerts downward force on the plunger 4 from the lower surface 622 of the annular portion 62 . By means of the first spring 71 , the plunger 4 is held at the initial position with a certain distance from the flange 6 . In the stroke state, the first spring 71 is contracted in the Z-axis direction.

The second spring 72 is a coil spring. The second spring 72 is disposed between the protruding portion 416 of the plunger 4 and the bottom portion 82 of the housing 8 which will be described later. Specifically, the second spring 72 is arranged to be sandwiched between the lower surface 4162 of the protruding portion 416 and the upper surface 821 of the bottom portion 82 which will be described later. The second spring 72 energizes the housing 8 in a direction away from the plunger 4 by energizing the bottom 82 in a direction away from the protrusion 416 . In the initial state, the second spring 72 exerts downward force on the bottom 82 from the lower surface 4162 of the protruding portion 416 . By means of the second spring 72 , the housing 8 is held in the initial position with a certain distance from the plunger 4 . In the stroke state, the second spring 72 is contracted in the Z-axis direction.

The first spring 71 and the second spring 72 surround the side surface 413 of the main body 41 and are disposed on a concentric shaft. Here, "on the concentric axis" means that the radial center of the first spring 71 and the radial center of the second spring 72 are on the same axial line. Axis straight line means a straight line along the Z-axis direction.

The case 8 is a substantially cylindrical conductive member extending along the Z-axis direction. The case 8 accommodates the plunger 4 , the first spring 71 and the second spring 72 . The housing 8 has a base 81 , a bottom 82 , and ribs 83 .

The base 81 is formed in a substantially bottomed cylindrical shape, and has a bottom 811 in one direction (downward) of the extending direction. A hole 81H is formed near the center of the bottom surface 811 . The bottom 82 is provided so that the end 84 (one end) in one direction (downward) of the extending direction of the housing 8 passes through the hole 81H of the base 81 from the plate-like member 822 extending along the bottom surface 811 of the base 81 , along the The Z-axis direction extends the corner tube downward. The bottom 82 has an upper surface 821 which is an opposite side to the surface on which the corner cylinder is disposed. The upper surface 821 is opposite to the lower surface 4162 of the protruding portion 416 and sandwiches the second spring 72 . The bottom portion 82 has an inner bottom surface 823 extending in the one end portion 84 so as to face the front end surface 423 of the front end portion 42 . Also, a plurality of openings 82H for exposing the front ends of the plurality of probe pins 3 to the outside are formed in the bottom portion 82 . The portion between the plurality of openings 82H of the bottom 82 is in contact with the housing 1002 that divides the plurality of contacts 1001 , 1001 of the connector 100 . Through this contact, the ground contact of the connector 100 and the housing 8 is made.

The housing 8 is provided so as to enclose the front end portion 42 , and further has a guide portion 86 for positioning the connector 100 at the end portion 84 . The guide portion 86 fits into the connector 100 . The front end (lower end) portion of the guide portion 86 has a tapered shape so that the thickness becomes thinner (the opening shape becomes larger) as the front end becomes thinner. For example, the guide portion 86 has a pair of tapered shapes in the X-axis direction, and a pair of tapered shapes in the Y-axis direction. When the guide portion 86 approaches the connector 100 in the Z-axis direction, the position of the connector 100 is adjusted along the inclination of the tapered shape.

The end portion 85 of the rib portion 83 in the other direction (upper direction) of the extending direction of the casing 8 is continuously provided on the base plate 81 . For example, the rib 83 is a plate-shaped protrusion provided so as to extend upward along the Z-axis direction with the base 81 as a base end. A plurality of ribs 83 (for example, four) are provided at predetermined intervals along the circumferential direction of the base 81 (see FIG. 2( b )). The rib 83 is inserted into the through hole 62H from the lower surface 622 of the annular portion 62 .

Cap 9 is a roughly cube-shaped part. The cap 9 is disposed so as to surround the periphery of the rib 83 of the case 8 . The cap 9 has an upper surface 91 and a bottom surface 92 . A hole 9H along the Z-axis direction is formed in the cap 9 from the center of the upper surface 91 to the center of the bottom surface 92 . When the top surface 91 is viewed from above or the bottom surface 92 is viewed from below, the region where the hole 9H is formed penetrates in a circular shape. The diameter of the hole 9H of the upper surface 91 is smaller than the diameter of the hole 9H of the bottom surface 92 . The bottom surface 92 faces the upper surface 611 of the plate member 61 . The hole 9H of the bottom surface 92 communicates with the through hole 61H of the upper surface 611 of the plate member 61 . In the hole 9H, the rib 83 of the casing 8 is inserted from the bottom surface 92, and is in contact with the lower end 93 of the upper surface 91. The insulator E attached to the rib 83 may also be in contact with the rib 83 indirectly by contacting the lower end 93 .

On the bottom surface 92 of the cap 9 , a plurality of (for example, two) pin holes 92H are formed at both ends in the X-axis direction. The pin hole 92H is formed from the bottom surface 92 in the upper surface 91 direction (upward direction), but does not reach the upper surface 91 (does not penetrate). A hole bottom 94 is formed at the deepest portion of the pin hole 92H. The pin P is arranged on the upper surface 611 of the plate member 61 so as to correspond to the pin hole 92H. In the stroke state, the upper end P1 of the pin P leaves the hole bottom 94 .

The spacer 10 disposed below the probe 1 is a conductive part made of an elastically deformable plate-shaped member. The spacer 10 is a member different (independent) from the plunger 4 and the housing 8 . The spacer 10 is disposed between the front end surface 423 of the front end portion 42 and the inner bottom surface 823 of the bottom portion 82 . The spacer 10 is configured to be able to contact both the front end surface 423 and the inner bottom surface 823 between at least a plurality of probe pins 3 (a region sandwiched between the probe pins 3 in the X-axis direction). For example, the front end surface 423 of the spacer 10 is in electrical contact with the inner bottom surface 823 in the stroke state of the probe 1 . In other words, the spacer 10 is an abutment assisting portion that assists the abutment between the front end surface 423 and the inner bottom surface 823 .

FIG. 7 is a diagram showing the appearance of the spacer 10 . Figure 7(a) is a plan view, Figure 7(b) is a perspective view, and Figure 7(c) is a side view. The shape (see FIG. 7( a )) of the spacer 10 in plan view is approximately rectangular. A plurality of openings 10H through which a plurality of probe pins 3 are inserted are provided in the spacer 10 . The spacer 10 has an upper surface 101 and a lower surface 102 . The upper surface 101 faces the front end surface 423 of the front end portion 42 . The lower surface 102 is opposite to the inner bottom surface 823 of the bottom 82 . The upper surface 101 is in contact with the front end surface 423 in the stroke state of the probe 1 . The upper surface 101 is not in contact with the front end surface 423 in the initial state of the probe 1 . The lower surface 102 is in contact with the inner bottom surface 823 in the initial state and stroke state of the probe 1 .

[journey] Next, the initial state and stroke state of the probe 1 will be described with reference to FIGS. 8 and 9 . FIG. 8 is a cross-sectional view along the line A-A of FIG. 1( a ) in the state where the connector 100 abuts against the probe 1 . In FIG. 8 , the probe 1 is not pressed against the connector 100 . That is, FIG. 8 shows the initial state of the probe 1 .

The plunger 4 is configured so that the front end of the probe pin 3 is not exposed from the opening 82H of the bottom 82 of the housing 8 at the first position according to the elastic force of the second spring 72, and the front end of the probe pin 3 is lifted from the housing. Between the second position where the opening 82H of the bottom 82 of the body 8 is exposed. In the initial state, the plunger 4 is configured at the first position.

In the initial state, the upper end P1 of the pin P abuts against the hole bottom 94 . Thereby, the flange 6 is fastened with the cap 9 . Since the movement of the probe 1 in the X-axis, Y-axis, and Z-axis directions is fixed, the initial position of the probe 1 is determined. Specifically, at the initial position of the probe 1, the position of the cap 9 relative to the flange 6 is determined. Also, the initial position of the housing 8 is determined because the movement of the rib 83 of the housing 8 directly or indirectly connected to the lower end 93 of the cap 9 is restricted.

Fig. 9 is a sectional view showing a section along line A-A of Fig. 1(a) in a stroke state. FIG. 9 shows a state in which a pressing force is applied so that the probe 1 is pressed against the connector 100 from the state shown in FIG. 8 .

In the stroke state, the spring 4 moves downward in the Z-axis direction. In this state, the plunger 4 moves from the opening 82H of the bottom 82 of the housing 8 to the second position where the front end of the probe pin 3 is exposed. In other words, when the plunger 4 moves to the second position, the front end of the probe pin 3 is exposed to the outside through the opening 82H. And, the probe pin 3 is connected to the connector 100 .

In the stroke state, the casing 8 moves upward. Because the rib 83 of the housing 8 is not in direct or indirect contact with the lower end 93 of the cap 9, the cap 9 is pressed against the rib 83, and the cap 9 moves upward. In addition, the upper end P1 of the pin P is separated from the hole bottom 94, and a space is formed inside the pin hole 92H. Thereby, the probe 1 becomes movable in the X-axis, Y-axis, and Z-axis directions. Thereby, the probe 1 can adjust the axis offset between the probe 1 and the connector 100 .

In this embodiment, the spring constant of the first spring 71 is smaller than that of the second spring 72 . When a pressing force is applied to the probe 1 , the first spring 71 elastically deforms earlier than the second spring 72 . In other words, the first spring 71 contracts in the Z-axis direction earlier than the second spring 72 . When the first spring 71 is elastically deformed and the second spring 72 is not elastically deformed, the plunger 4 is in the first position where the front end of the probe pin 3 is not exposed from the opening 82H of the bottom 82 of the housing 8 . The first spring 71 adjusts the axis offset between the probe 1 and the connector 100 in the state of shrinking in the Z-axis direction. Thereafter, when a pressing force is further applied to the probe 1 , the second spring 72 contracts in the Z-axis direction. At this time, the plunger 4 moves to the second position, and the front end of the probe pin 3 is exposed to the outside. By elastically deforming the first spring 71 and the second spring 72 in this order, the axial deviation can be adjusted in a state where the front end of the probe pin 3 is protected.

[ground contact] FIG. 10 is an enlarged cross-sectional view of the range F shown in FIG. 9 with respect to the structure of the probe 1 .

The spacer 10 is disposed on substantially the entire area where the front end surface 423 and the inner bottom surface 823 face each other. The spacer 10 is configured to be in contact with both the front end surface 423 and the inner bottom surface 823 at positions surrounding the plurality of probe pins 3 in addition to between the plurality of probe pins 3 . For example, the spacer 10 is clamped by the front end surface 423 and the inner bottom surface 823 in the stroke state, and elastically deforms along the respective surfaces. Through the spacer 10 , the area A1 between the plurality of probe pins 3 on the front end surface 423 and the inner bottom surface 823 is grounded. In addition, the spacer 10 is used to connect the ground to the area A2 surrounding the plurality of probe pins 3 on the front end surface 423 and the inner bottom surface 823 .

Moving upward, the body portion 41 further has a first ground contact portion 417 located between the conductive portions 2 and in contact with the first ground conductive portion 541 . The first ground contact portion 417 is formed integrally with the main body portion 41 . Through the first ground contact portion 417 , the ground connection is performed in the region A3 between the conductive portions 2 of the first ground conductive portion 541 .

The front end portion 42 further has a second ground contact portion 424 located between the plurality of probe pins 3 and in contact with the second ground conductive portion 542 . The second ground contact portion 424 is formed integrally with the front end portion 42 . For example, the second ground contact portion 424 can also be a part of the inner bottom surface 4213 . Through the second ground contact portion 424 , the ground connection is performed in the area A4 between the plurality of probe pins 3 of the second ground conductive portion 542 . In addition, through the inner bottom surface 4213 , the ground contact is made in the area A5 surrounding the plurality of probe pins 3 of the second ground conductive portion 542 .

The first ground contact portion 417 and the second ground contact portion 424 are in contact with the first ground conductive portion 541 and the second ground conductive portion 542 respectively in the initial state and the stroke state of the probe 1 .

[Effects of this embodiment] The probe 1 of one aspect of this embodiment is a probe 1 for inspecting a connector 100 with a plurality of contacts 1001, 1001, and has: a conductive plunger 4, which has an inner package corresponding to the plural The front end 42 of a plurality of probe pins 3 arranged in a manner of contact points 1001, 1001; the conductive housing 8 is arranged in a manner of enclosing the front end 42, and has: a guide portion 86 at the end 84 The positioning of the connector 100 is carried out; and the bottom 82 extends the inner bottom surface 823 in the end portion 84 so as to face the front end surface 423 of the front end portion 42, and is formed to expose a plurality of probe pins 3 to the outside. A plurality of openings 82H; and a conductive spacer 10, which is arranged between the front end surface 423 of the front end portion 42 and the inner bottom surface 823 of the bottom 82, and is configured to be between at least a plurality of probe pins 3 and can be connected to the front end. Both the surface 423 and the inner bottom surface 823 are in contact.

In the probe 1 according to one aspect of the present embodiment, the spacer 10 is configured to be in contact with both the front end surface 423 of the front end portion 42 and the inner bottom surface 823 of the bottom portion 82 between the plurality of probe pins 3 (grounded). touch). Thereby, a gap (interval) is prevented from being generated between at least a plurality of probe pins 3 between the front end portion 42 and the bottom portion 82 , and a state in which grounding is not ensured can be prevented. Thereby, the interference of the mutual signal between several probe pins 3 which becomes a problem when grounding is not ensured among several probe pins 3 can be suppressed. As a result, the inspection accuracy of the connector 100 can be improved.

In the probe 1 described above, the spacer 10 is composed of an elastically deformable member. According to such a structure, even when the parallelism of each component which comprises the probe 1 deviates, the spacer 10 can change shape flexibly, and can make stable ground contact. Thereby, the inspection accuracy of the connector 100 can be further improved.

In the above-mentioned probe 1, the spacer 10 is provided in substantially the entire area where the front end surface 423 and the inner bottom surface 823 face each other. In contact, the front end surface 423 is in contact with the inner bottom surface 823 . According to such a configuration, ground contact is further performed so as to surround the probe pin 3 . Since the multi-point contact can be reliably grounded, the inspection accuracy of the connector can be further improved.

In the probe 1 described above, the spacer 10 is a member different from the plunger 4 and the housing 8 . According to this structure, since the spacer 10 becomes a member independent from the plunger 4 and the case 8, the design of the spacer 10 becomes easy.

In the probe 1 described above, the portion between the plurality of openings 82H of the bottom 82 is in contact with the shell 1002 that divides the plurality of contacts 1001 , 1001 of the connector 100 . According to such a configuration, since the ground contact between the connector 100 and the housing 8 is performed, the inspection accuracy of the connector can be further improved.

[Second Embodiment] Fig. 11 is a sectional view showing a section of a probe 1A of the second embodiment. Hereinafter, points different from the probe 1 of the first embodiment will be mainly described. The probe 1A has a protrusion 10A (abutment auxiliary portion) in place of the spacer 10 in the probe 1 .

The protrusion 10A is integrally formed with the front end portion 42 and protrudes from the front end surface 423 toward the inner bottom surface 823 . For example, the protrusion 10A is configured to protrude from the front end surface 423 toward the inner bottom surface 823 between at least a plurality of probe pins 3 , and can contact the inner bottom surface 823 in a stroke state. The protrusion 10A may be elastically deformable. The protrusion 10A can also be provided substantially over the entire area where the front end surface 423 and the inner bottom surface 823 are opposed to each other. The protrusion 10A can also be configured to protrude from the front end surface 423 toward the inner bottom surface 823 at a position surrounding a plurality of probe pins 3 , and can contact the inner bottom surface 823 in a stroke state.

According to the probe 1A, the ground contact is made by the portion where the plurality of probe pins 3 protrude from each other. Due to the stable ground contact, the inspection accuracy of the connector can be further improved. Also, since the number of parts is reduced, it becomes a simple structure.

[Third Embodiment] Fig. 12 is a sectional view showing a section of a probe 1B according to the third embodiment. Hereinafter, points different from the probe 1 of the first embodiment will be mainly described. The probe 1A has a protrusion 10B (abutment auxiliary portion) in place of the spacer 10 in the probe 1 .

The protrusion 10B is integrally formed with the bottom 82 and protrudes from the inner bottom surface 823 toward the front end surface 423 . For example, the protrusion 10B is configured to protrude from the inner bottom surface 823 toward the front end surface 423 between at least a plurality of probe pins 3 , and can contact the front end surface 423 in a stroke state. The protrusion 10B may also be elastically deformable. The protrusion 10B can also be provided substantially over the entire area where the front end surface 423 and the inner bottom surface 823 are opposed to each other. The protrusion 10B can also be configured to protrude from the inner bottom surface 823 toward the front end surface 423 at a position surrounding a plurality of probe pins 3 , and can contact the front end surface 423 in a stroke state.

According to the probe 1B, the ground contact is made by the portion where the plurality of probe pins 3 protrude from each other. Due to the stable ground contact, the inspection accuracy of the connector can be further improved. Also, since the number of parts is reduced, it becomes a simple structure.

[variation example] As mentioned above, although embodiment was described, this indication is not limited to the said embodiment, Various changes are possible in the range which does not deviate from the summary.

In this embodiment, although the connector 100 is provided with two contacts 1001, 1001 arranged in two rows, multiple rows of contacts may be provided in the X-axis direction and the Y-axis direction respectively. In addition, the case 1002 that divides between a plurality of contacts 1001 and 1001 may also be used to divide between a plurality of rows of contacts.

In the above-mentioned embodiment, although it is described that the pin P is fixed on the upper surface 611 of the flange 6 , the pin P may also be provided on the cap 9 .

In the above-mentioned embodiment, although it was described that the substrate 5 is accommodated in the front end portion 42 , the substrate 5 may also be accommodated in the main body portion 41 . For example, the recessed portion 4212 for accommodating the substrate 5 may also be provided in such a manner that the lower portion 415 of the main body portion 41 is recessed.

In the state where the probe pin 3 is exposed to the outside of the housing 8, the front end surface 423 and the inner bottom surface 823 can also be contacted by the abutting auxiliary part. Since it is only necessary to make ground contact in a state where the probe pins 3 are exposed to the outside of the housing 8 (the state in which the connector 100 can be inspected), the abutment assisting portion can be configured to be miniaturized.

1: Probe 1A: Probe 1B: Probe 2: Conductive part 3: Probe pin 4: plunger 5: Substrate 6: Flange 7: Spring 8: Housing 9: cap 9H: hole 10: spacer 10A: Protrusion 10B: Protrusion 10H: opening 21: coaxial cable 22: Conductive member 41: Body Department 41H: through hole 42: front end 51: The first main surface 52: The second main side 53: Signal conduction part 54: Grounding conductive part 61: upper surface 61H: through hole 61W: hole 62: lower surface 62H: through hole 71: First spring 72:Second spring 81: base 81H: hole 82: bottom 82H: opening 83: Rib 84: end 85: end 86: Guidance department 91: upper surface 92: lower surface 92H: pin hole 93: lower end 94: hole bottom 100: Connector 101: upper surface 102: lower surface 411: upper surface 412: Bottom 413: side 414: upper part 415: lower part 416: protrusion 417: 1st ground contact part 421: Support Department 422: Keeping Department 423: front face 424: 2nd ground contact part 531: The first signal conduction part 532: The second signal conduction part 541: The first grounding conductive part 542: The second grounding conductive part 611: upper surface 612: lower surface 621: upper surface 622: lower surface 811: Bottom 821: Plate member 822: front end 823: inner bottom surface 1001: Contact 1002: Shell 1003: insulating shell 4161: upper surface 4162: lower surface 4211: upper surface 4212: Concave 4213: inner bottom surface A1～A5: area BL: basal layer C: Collar D: insulator E: insulator F: range H1: Distance H2: Distance P: pin P1: upper end P2: lower end S: range UL: Buildup layer

Fig. 1 is a diagram showing the appearance of a probe according to the first embodiment. Fig. 1 (a) is a plane view, Fig. 1 (b) is a perspective view, Fig. 1 (c) is a side view, and Fig. 1 (d) is a bottom view. Fig. 2 is a diagram showing the appearance of probes and connectors. Fig. 2(a) is a side view, and Fig. 2(b) is a perspective view. Fig. 3 is a cross-sectional view along line A-A of Fig. 1(a) showing the state where the probe is abutted against the connector. Fig. 4 is a diagram showing the appearance of a state where the substrate is housed in the front end. Figure 4(a) is a plan view, Figure 4(b) is a perspective view, and Figure 4(c) is a side view. Fig. 5 is an exploded perspective view showing the appearance of a state in which the substrate is stored in front of the front end. Fig. 6 is a sectional view showing a section along line B-B of Fig. 4(a). Fig. 7 is a diagram showing the appearance of a spacer (abutting auxiliary part). Figure 7(a) is a plan view, Figure 7(b) is a perspective view, and Figure 7(c) is a side view. FIG. 8 is a cross-sectional view along the line A-A of FIG. 1( a ) showing a state where the probes are abutted against the connector. Fig. 9 is a sectional view showing a section along line A-A of Fig. 1(a) in a stroke state. FIG. 10 is an enlarged cross-sectional view showing the range F in FIG. 9 . Fig. 11 is a sectional view showing a section of a probe of the second embodiment. Fig. 12 is a sectional view showing a section of a probe of a third embodiment.

1: Probe

2: Conductive part

3: Probe pin

4: plunger

5: Substrate

6: Flange

7: Spring

8: Housing

9: cap

9H: hole

10: spacer

21: coaxial cable

22: Conductive member

41: Body Department

41H: through hole

42: front end

51: The first main surface

52: The second main side

61: upper surface

61H: through hole

61W: hole

62: lower surface

62H: through hole

71: First spring

72:Second spring

81: base

81H: hole

82: bottom

82H: opening

83: Rib

84: end

85: end

86: Guidance department

91: upper surface

92: lower surface

92H: pin hole

93: lower end

94: hole bottom

100: Connector

411: upper surface

412: Bottom

413: side

414: upper part

415: lower part

416: protrusion

423: front face

611: upper surface

612: lower surface

621: upper surface

622: lower surface

811: Bottom

821: Plate member

822: front end

823: inner bottom surface

1001: Contact

1002: Shell

1003: insulating shell

4161: upper surface

4162: lower surface

C: Collar

D: insulator

E: insulator

P: pin

P1: upper end

P2: lower end

Claims (7)

A probe, which is used to inspect a connector with a plurality of contacts, and has: A conductive plunger having a front end portion containing a plurality of probe pins arranged in a manner corresponding to the plurality of contacts; The conductive case is provided in such a way as to enclose the front end, and the inner bottom surface of the end extends so as to face the front end of the front end, and has a shape for exposing the plurality of probe pins the bottom of the exterior plurality of openings; and The conductive contact auxiliary part is provided between the front end surface of the front end part and the inner bottom surface of the bottom part, and is configured to be able to contact the front end surface and the inner bottom surface between at least the plurality of probe pins. The two sides of the bottom surface are in contact. The probe according to claim 1, wherein the abutting auxiliary part is formed of an elastically deformable member. The probe according to claim 1, wherein the above-mentioned abutting auxiliary part is provided in substantially the entire area where the above-mentioned front end surface and the above-mentioned inner bottom face face, and is configured to surround the above-mentioned plurality of probe pins, and can also be connected to the above-mentioned The two sides of the front end surface and the above-mentioned inner bottom surface are in contact. The probe according to claim 1, wherein the abutting auxiliary part is a member different from the plunger and the housing. The probe according to claim 1, wherein the abutment auxiliary part is integrally formed with the front end part, and protrudes from the front end surface toward the inner bottom surface. The probe according to claim 1, wherein the abutting auxiliary part is integrally formed with the bottom, protruding from the inner bottom surface toward the front end surface. The probe according to claim 1, wherein the portion between the plurality of openings at the bottom is in contact with the shell that divides the plurality of contacts of the connector.