TW202324518A - Cutting device, and method for manufacturing cut product - Google Patents

Cutting device, and method for manufacturing cut product Download PDF

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Publication number
TW202324518A
TW202324518A TW111143339A TW111143339A TW202324518A TW 202324518 A TW202324518 A TW 202324518A TW 111143339 A TW111143339 A TW 111143339A TW 111143339 A TW111143339 A TW 111143339A TW 202324518 A TW202324518 A TW 202324518A
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Taiwan
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tank
state
water
cut
discharge mechanism
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TW111143339A
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Chinese (zh)
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井口晴貴
細見隆也
坂本凜
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日商Towa股份有限公司
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Publication of TW202324518A publication Critical patent/TW202324518A/en

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    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23QDETAILS, COMPONENTS, OR ACCESSORIES FOR MACHINE TOOLS, e.g. ARRANGEMENTS FOR COPYING OR CONTROLLING; MACHINE TOOLS IN GENERAL CHARACTERISED BY THE CONSTRUCTION OF PARTICULAR DETAILS OR COMPONENTS; COMBINATIONS OR ASSOCIATIONS OF METAL-WORKING MACHINES, NOT DIRECTED TO A PARTICULAR RESULT
    • B23Q3/00Devices holding, supporting, or positioning work or tools, of a kind normally removable from the machine
    • B23Q3/02Devices holding, supporting, or positioning work or tools, of a kind normally removable from the machine for mounting on a work-table, tool-slide, or analogous part
    • B23Q3/06Work-clamping means
    • B23Q3/08Work-clamping means other than mechanically-actuated
    • B23Q3/088Work-clamping means other than mechanically-actuated using vacuum means
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23QDETAILS, COMPONENTS, OR ACCESSORIES FOR MACHINE TOOLS, e.g. ARRANGEMENTS FOR COPYING OR CONTROLLING; MACHINE TOOLS IN GENERAL CHARACTERISED BY THE CONSTRUCTION OF PARTICULAR DETAILS OR COMPONENTS; COMBINATIONS OR ASSOCIATIONS OF METAL-WORKING MACHINES, NOT DIRECTED TO A PARTICULAR RESULT
    • B23Q3/00Devices holding, supporting, or positioning work or tools, of a kind normally removable from the machine
    • B23Q3/02Devices holding, supporting, or positioning work or tools, of a kind normally removable from the machine for mounting on a work-table, tool-slide, or analogous part
    • B23Q3/06Work-clamping means
    • B23Q3/08Work-clamping means other than mechanically-actuated
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B27/00Other grinding machines or devices
    • B24B27/06Grinders for cutting-off
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B41/00Component parts such as frames, beds, carriages, headstocks
    • B24B41/06Work supports, e.g. adjustable steadies
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B41/00Component parts such as frames, beds, carriages, headstocks
    • B24B41/06Work supports, e.g. adjustable steadies
    • B24B41/061Work supports, e.g. adjustable steadies axially supporting turning workpieces, e.g. magnetically, pneumatically
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B55/00Safety devices for grinding or polishing machines; Accessories fitted to grinding or polishing machines for keeping tools or parts of the machine in good working condition
    • B24B55/06Dust extraction equipment on grinding or polishing machines
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B28WORKING CEMENT, CLAY, OR STONE
    • B28DWORKING STONE OR STONE-LIKE MATERIALS
    • B28D1/00Working stone or stone-like materials, e.g. brick, concrete or glass, not provided for elsewhere; Machines, devices, tools therefor
    • B28D1/22Working stone or stone-like materials, e.g. brick, concrete or glass, not provided for elsewhere; Machines, devices, tools therefor by cutting, e.g. incising
    • B28D1/24Working stone or stone-like materials, e.g. brick, concrete or glass, not provided for elsewhere; Machines, devices, tools therefor by cutting, e.g. incising with cutting discs
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B28WORKING CEMENT, CLAY, OR STONE
    • B28DWORKING STONE OR STONE-LIKE MATERIALS
    • B28D7/00Accessories specially adapted for use with machines or devices of the preceding groups
    • B28D7/02Accessories specially adapted for use with machines or devices of the preceding groups for removing or laying dust, e.g. by spraying liquids; for cooling work
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B28WORKING CEMENT, CLAY, OR STONE
    • B28DWORKING STONE OR STONE-LIKE MATERIALS
    • B28D7/00Accessories specially adapted for use with machines or devices of the preceding groups
    • B28D7/04Accessories specially adapted for use with machines or devices of the preceding groups for supporting or holding work or conveying or discharging work
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26

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  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Mining & Mineral Resources (AREA)
  • Physics & Mathematics (AREA)
  • Dicing (AREA)
  • Jigs For Machine Tools (AREA)
  • Constituent Portions Of Griding Lathes, Driving, Sensing And Control (AREA)
  • Grinding-Machine Dressing And Accessory Apparatuses (AREA)
  • Processing Of Stones Or Stones Resemblance Materials (AREA)
  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)

Abstract

This cutting device comprises a table, a cutting mechanism, a holding mechanism, and a water isolation/discharge mechanism. The table or the holding mechanism is connected to a dry vacuum pump through a suction path. The water isolation/discharge mechanism is positioned on the suction path and discharges water through a water discharge path. The water isolation/discharge mechanism includes a first tank, a second tank, and a valve mechanism. The first tank includes a partition plate for partitioning the tank into a region where a connection opening leading to the vacuum pump is positioned and a region where a connection opening leading to the table or the holding mechanism is positioned. A space is formed in the first tank above the partition plate. The valve mechanism changes between a first state, in which water flowing from the first tank into the second tank is reserved in the second tank, and a second state, in which water is reserved in the first tank and the water reserved in the second tank is discharged.

Description

切斷裝置、及切斷品的製造方法Cutting device, and method of manufacturing cut product

本發明關於一種切斷裝置、及切斷品的製造方法。The present invention relates to a cutting device and a method for manufacturing a cut product.

日本特開2019-202353號公報(專利文獻1),揭露一種切削裝置,以切削被加工物。此切削裝置中,設置有吸附單元以吸引保持被加工物。吸附單元具備吸盤台(chuck table),藉由吸盤台來吸引保持被加工物。在吸附單元,連接有吸引泵。此切削裝置中,使用水封式真空泵來作為吸引泵,該水封式真空泵即便吸引水也不會降低吸引力(參照專利文獻1)。Japanese Patent Application Publication No. 2019-202353 (Patent Document 1) discloses a cutting device for cutting a workpiece. In this cutting device, a suction unit is provided to suck and hold the workpiece. The adsorption unit has a chuck table, and the workpiece is sucked and held by the chuck table. In the adsorption unit, a suction pump is connected. In this cutting device, a water-sealed vacuum pump is used as a suction pump, and the water-sealed vacuum pump does not lower the suction force even if it sucks water (see Patent Document 1).

[先前技術文獻] (專利文獻) 專利文獻1:日本特開2019-202353號公報 [Prior Art Literature] (patent documents) Patent Document 1: Japanese Patent Laid-Open No. 2019-202353

[發明所欲解決的問題] 當為了進行切斷對象物(例如,基板)的吸附而使用水封式真空泵時,為了抑制封入的水的溫度上升,必須持續地往真空泵內供給新的水。亦即,若使用水封式真空泵,則會消費大量的水。為了解決這種問題,考慮使用乾式真空泵來取代水封式真空泵。此時,必須在例如對切斷對象物噴射的步驟等中抑制水浸入真空泵內。又,必須持續地實行切斷對象物的吸附。然而,上述專利文獻1中沒有揭露用以解決這種問題之技術手段。 [Problem to be solved by the invention] When a water-sealed vacuum pump is used to adsorb the object to be cut (for example, a substrate), it is necessary to continuously supply new water into the vacuum pump in order to suppress the temperature rise of the sealed water. That is, if a water-sealed vacuum pump is used, a large amount of water will be consumed. In order to solve this problem, it is considered to use a dry vacuum pump instead of a water-sealed vacuum pump. In this case, it is necessary to prevent water from entering the vacuum pump during, for example, the step of spraying the object to be cut. In addition, it is necessary to continuously perform suction of the object to be cut. However, the above-mentioned Patent Document 1 does not disclose a technical means for solving this problem.

本發明為了解決這種問題而完成,其目的在於在一種使用乾式真空泵之切斷裝置、及切斷品的製造方法中,一邊維持對切斷對象物的吸附,一邊抑制水浸入真空泵內。The present invention was made to solve such a problem, and an object of the present invention is to suppress water intrusion into the vacuum pump while maintaining adsorption of objects to be cut in a cutting device using a dry vacuum pump and a method of manufacturing a cut product.

[解決問題的技術手段] 依據本發明的一局面的切斷裝置,具備:台、切斷機構、保持機構、及水分離排出機構。台,藉由吸附切斷對象物來保持切斷對象物。切斷機構,藉由切斷在台上的切斷對象物來將切斷對象物加以個片化。保持機構,藉由吸附個片化了的切斷對象物來保持切斷對象物。台或保持機構,通過吸引通道來連接於乾式真空泵。水分離排出機構,位在吸引通道上,並通過排水通道來將水排出。水分離排出機構,包含第一槽和第二槽。第二槽,位於在排水通道中的比第一槽更下游的位置。第一槽,包含分隔板,以分隔與真空泵的連接口的所在區域、及與台或保持機構的連接口的所在區域。第一槽中,在分隔板的上方形成有間隙。水分離排出機構,進一步包含閥門機構。閥門機構,可改變成第一狀態及第二狀態,該第一狀態會將自第一槽流入了第二槽的水儲藏在第二槽,該第二狀態會將儲藏在第一槽和儲藏在第二槽的水排出。 [Technical means to solve the problem] A cutting device according to one aspect of the present invention includes a table, a cutting mechanism, a holding mechanism, and a water separation and discharge mechanism. The stage holds the object to be cut by suctioning the object to be cut. The cutting mechanism separates the object to be cut into pieces by cutting the object to be cut on the table. The holding mechanism holds the object to be cut by sucking the object to be cut into pieces. The table or holding mechanism is connected to the dry vacuum pump through the suction channel. The water separation and discharge mechanism is located on the suction passage and discharges water through the drainage passage. The water separation and discharge mechanism includes a first tank and a second tank. The second groove is located further downstream than the first groove in the drain passage. The first tank includes a partition plate to separate the area where the connection port with the vacuum pump is located and the area where the connection port with the stage or the holding mechanism is located. In the first groove, a gap is formed above the partition plate. The water separation and discharge mechanism further includes a valve mechanism. The valve mechanism can be changed into a first state and a second state. The first state will store the water flowing from the first tank into the second tank in the second tank. The second state will store the water in the first tank and the water stored in the second tank. The water in the second tank is drained.

依據本發明的其他局面的切斷品的製造法,使用上述切斷裝置。此切斷品的製造方法,包含由切斷機構來切斷在台上的切斷對象物,藉此將切斷對象物加以個片化之步驟。A method of manufacturing a cut product according to another aspect of the present invention uses the cutting device described above. This method of manufacturing a cut product includes a step of cutting the object to be cut on the table by a cutting mechanism, thereby dividing the object to be cut into individual pieces.

[發明的效果] 依據本發明,能夠在一種使用乾式真空泵之切斷裝置、及切斷品的製造方法中,一邊維持對切斷對象物的吸附,一邊抑制水浸入真空泵內。 [Effect of the invention] According to the present invention, in a cutting device using a dry vacuum pump and a method of manufacturing a cut product, it is possible to suppress water intrusion into the vacuum pump while maintaining adsorption of the object to be cut.

以下,使用圖式來詳細說明關於本發明的一側面的實施形態(以下,也稱為「本實施形態」)。另外,對圖中的相同或相當部分賦予相同符號並且不重複其說明。又,為了容易理解,對適當對象以省略或誇張的方式示意地描繪各圖式。Hereinafter, an embodiment (hereinafter also referred to as "the present embodiment") related to one aspect of the present invention will be described in detail using the drawings. In addition, the same code|symbol is attached|subjected to the same or corresponding part in a figure, and the description is not repeated. In addition, for easy understanding, appropriate objects are omitted or exaggerated and schematically drawn in each drawing.

[1.構成] <1-1.切斷裝置的整體構成> 第1圖是示意地表示使用依據本實施形態的切斷裝置1的平面圖。切斷裝置1,構成為藉由對切斷對象物(本實施形態中為封裝基板)進行切斷來將該切斷對象物加以個片化成複數個切斷品(當切斷對象物為封裝基板時,是電子零件(封裝零件))。封裝基板中,樹脂密封有安裝了半導體晶片之基板或導線架。 [1. Composition] <1-1. Overall configuration of cutting device> Fig. 1 is a plan view schematically showing a cutting device 1 according to the present embodiment. The cutting device 1 is configured to cut the object to be cut (in this embodiment, a package substrate) so that the object to be cut is individually cut into a plurality of cut products (when the object to be cut is a package substrate). In the case of a substrate, it is an electronic part (package part)). In the package substrate, a substrate on which a semiconductor chip is mounted or a lead frame is sealed with resin.

作為切斷對象物的一例舉例有基板,包含對基板沒有進行樹脂密封之基板(包含晶圓)及進行了樹脂密封後之基板(封裝基板)。作為封裝基板的一例,舉例有BGA(球柵陣列,Ball Grid Array)封裝基板、LGA(柵格陣列,Land Grid Array)封裝基板、CSP(晶片尺寸封裝,Chip Size Package)封裝基板、LED(發光二極體,Light Emitting Diode)封裝基板、及QFN(四方平面無引腳,Quad Flat No-leaded)封裝基板。An example of an object to be cut includes a substrate, including a substrate (including a wafer) that has not been resin-sealed and a substrate that has been resin-sealed (package substrate). As an example of the package substrate, there are BGA (Ball Grid Array, Ball Grid Array) package substrate, LGA (Line Grid Array, Land Grid Array) package substrate, CSP (Chip Size Package) package substrate, LED (Light-Emitting Package) package substrate, etc. Diode, Light Emitting Diode) package substrate, and QFN (Quad Flat No-leaded) package substrate.

在此例中,使用封裝基板P1來作為切斷對象物,藉由切斷裝置1來將封裝基板P1加以個片化成複數個電子零件S1(未圖示)。以下中,將封裝基板P1的兩面之中的被樹脂密封的一面稱為封膠面,並將與封膠面相反的一面稱為焊球/導線面。另外,當切斷對象物為沒有進行樹脂密封之基板時,本實施形態的焊球/導線面,相當於在切斷時朝向上方的一面(切斷面);本實施形態的封膠面相當於與切斷面相反的一面。In this example, the package substrate P1 is used as the object to be cut, and the package substrate P1 is sliced into a plurality of electronic components S1 (not shown) by the cutting device 1 . Hereinafter, the resin-sealed side of the package substrate P1 is referred to as the sealing surface, and the side opposite to the sealing surface is referred to as the solder ball/wire surface. In addition, when the object to be cut is a substrate that is not sealed with resin, the solder ball/wire surface of this embodiment corresponds to the side (cut surface) facing upward during cutting; the sealing surface of this embodiment corresponds to On the side opposite to the cut surface.

如第1圖所示,切斷裝置1,包含切斷模組A1、及檢查和收納模組B1來作為構成要素。切斷模組A1,構成為藉由切斷封裝基板P1來製造複數個電子零件S1(切斷品)。檢查和收納模組B1,構成為檢查各個已製造的複數個電子零件S1,其後將電子零件S1收納於托盤。切斷裝置1中,可將各構成要素對於其他構成要素進行安裝和拆下且進行交換。As shown in FIG. 1 , the cutting device 1 includes a cutting module A1 and an inspection and storage module B1 as constituent elements. The cutting module A1 is configured to manufacture a plurality of electronic components S1 (cut products) by cutting the package substrate P1. The inspection and storage module B1 is configured to inspect each of a plurality of manufactured electronic components S1, and then store the electronic components S1 in a tray. In the cutting device 1, each component can be attached to and detached from another component and exchanged.

切斷模組A1,主要包含基板供給部3、定位部4、切斷台5、芯軸部6、及搬送部7。又,切斷模組A1,包含第二水分離排出機構42、第三水分離排出機構43、第一水分離排出機構41的一部分、真空泵D2,D3、及真空泵D1的一部分。The cutting module A1 mainly includes a substrate supply unit 3 , a positioning unit 4 , a cutting table 5 , a mandrel unit 6 , and a transfer unit 7 . Furthermore, the cutting module A1 includes a second water separation and discharge mechanism 42, a third water separation and discharge mechanism 43, a part of the first water separation and discharge mechanism 41, vacuum pumps D2 and D3, and a part of the vacuum pump D1.

基板供給部3,自收容有複數個封裝基板P1之卡匣M1來將封裝基板P1一次一個地推出,藉此將封裝基板P1一次一個地往定位部4供給。此時,將封裝基板P1配置成焊球/導線面朝向上面。The substrate supply unit 3 pushes out the package substrates P1 one at a time from the cassette M1 accommodating a plurality of package substrates P1 , thereby supplying the package substrates P1 one at a time to the positioning unit 4 . At this time, the package substrate P1 is arranged such that the solder ball/lead surface faces upward.

定位部4,將自基板供給部3推出了的封裝基板P1配置在軌道部4a上,藉此實行封裝基板P1的定位。其後,定位部4,將已定位的封裝基板P1往切斷台5搬送。The positioning section 4 arranges the package substrate P1 pushed out from the substrate supply section 3 on the rail section 4a, thereby positioning the package substrate P1. Thereafter, the positioning unit 4 transports the positioned package substrate P1 to the cutting table 5 .

切斷台5,保持要切斷的封裝基板P1。此例中,例示為具有2個切斷台5之雙(twin)切斷台構成的切斷裝置1。在一方的切斷台5,通過吸引通道VR2連接有真空泵D2;在另一方的切斷台5,通過吸引通道VR3連接有真空泵D3。各個真空泵D2,D3為乾式真空泵。各切斷台5,藉由真空泵D2或真空泵D3的吸引來吸附封裝基板P1。在吸引通道VR2設置有第二水分離排出機構42,在吸引通道VR3設置有第三水分離排出機構43。針對各個第二水分離排出機構42及第三水分離排出機構43,詳細說明於後。The cutting table 5 holds the package substrate P1 to be cut. In this example, the cutting apparatus 1 which has the twin (twin) cutting stage structure which has two cutting stages 5 is illustrated. A vacuum pump D2 is connected to one cutting table 5 through a suction passage VR2, and a vacuum pump D3 is connected to the other cutting table 5 through a suction passage VR3. Each vacuum pump D2, D3 is a dry vacuum pump. Each cutting table 5 absorbs the package substrate P1 by suction of the vacuum pump D2 or the vacuum pump D3. The second water separation and discharge mechanism 42 is provided in the suction passage VR2, and the third water separation and discharge mechanism 43 is provided in the suction passage VR3. The details of each of the second water separation and discharge mechanism 42 and the third water separation and discharge mechanism 43 will be described later.

各切斷台5,包含保持構件5a、旋轉機構5b、及移動機構5c。保持構件5a,自下方吸附藉由定位部4來搬送的封裝基板P1,以保持封裝基板P1。旋轉機構5b,可使保持構件5a在圖的θ1方向上旋轉。移動機構5c,可使保持構件5a沿著圖的Y軸移動。Each cutting table 5 includes a holding member 5a, a rotating mechanism 5b, and a moving mechanism 5c. The holding member 5 a sucks the package substrate P1 conveyed by the positioning unit 4 from below, and holds the package substrate P1 . The rotation mechanism 5b can rotate the holding member 5a in the θ1 direction in the figure. The moving mechanism 5c can move the holding member 5a along the Y-axis in the drawing.

芯軸部6,藉由切斷封裝基板P1來將該封裝基板P1加以個片化成複數個電子零件S1。此例中,例示為具有2個芯軸部6之雙芯軸構成的切斷裝置1。芯軸部6,可沿著圖的X軸和Z軸移動。另外,切斷裝置1,也可以是具有1個芯軸部6之單(single)芯軸構成。The mandrel part 6 separates the package substrate P1 into a plurality of electronic components S1 by cutting the package substrate P1. In this example, a double-spindle cutting device 1 having two core shaft parts 6 is exemplified. The core shaft portion 6 is movable along the X-axis and Z-axis in the figure. In addition, the cutting device 1 may have a single (single) mandrel configuration having one mandrel part 6 .

芯軸部6,包含刀刃6a和旋轉軸6c。刀刃6a,藉由高速旋轉來切斷封裝基板P1,以將封裝基板P1加以個片化成複數個電子零件S1。刀刃6a,在受到未圖示的第一凸緣和第二凸緣挾持的狀態下,被安裝於旋轉軸6c。第一凸緣和第二凸緣,藉由螺帽等的未圖示的緊固構件而被固定於旋轉軸6c。第一凸緣也被稱為內凸緣,第二凸緣也被稱為外凸緣。The core portion 6 includes a blade 6a and a rotating shaft 6c. The blade 6a cuts the packaging substrate P1 by rotating at a high speed, so that the packaging substrate P1 is sliced into a plurality of electronic components S1. The blade 6a is attached to the rotating shaft 6c in a state of being pinched by a first flange and a second flange not shown. The first flange and the second flange are fixed to the rotation shaft 6c by fastening members, such as nuts, which are not shown in the figure. The first flange is also called the inner flange and the second flange is also called the outer flange.

在芯軸部6,設置有切削水用噴嘴、冷卻水用噴嘴、及洗淨水用噴嘴(任一者都未圖示)等。切削水用噴嘴,朝向高速旋轉的刀刃6a噴射切削水。冷卻水用噴嘴,噴射冷卻水。洗淨水用噴嘴,噴射可洗淨切斷碎屑等的洗淨水。The spindle portion 6 is provided with nozzles for cutting water, nozzles for cooling water, nozzles for washing water (none of which are shown), and the like. The cutting water nozzle sprays cutting water toward the high-speed rotating blade 6a. Cooling water nozzles spray cooling water. The nozzle for washing water sprays washing water that can wash away cut chips, etc.

再次參照第1圖,若在切斷台5上載置有封裝基板P1,則切斷台5吸附封裝基板P1。其後,藉由第一位置確認相機5d來對封裝基板P1進行攝像,以確認封裝基板P1的位置。使用第一位置確認相機5d進行的確認,也稱為對準。使用第一位置確認相機5d進行的確認中,例如對設置在封裝基板P1上的標記的位置進行確認。該標記,例如表示封裝基板P1的切斷位置。Referring again to FIG. 1 , when the package substrate P1 is placed on the cutting table 5 , the cutting table 5 absorbs the package substrate P1 . Thereafter, the package substrate P1 is photographed by the first position confirmation camera 5d to confirm the position of the package substrate P1. Confirmation using the first position confirmation camera 5d is also referred to as alignment. In the confirmation using the first position confirmation camera 5d, for example, the position of a mark provided on the package substrate P1 is confirmed. This mark indicates, for example, the cutting position of the package substrate P1.

其後,切斷台5是沿著圖的Y軸並朝向芯軸部6移動。在切斷台5移動到芯軸部6的下方之後,藉由使切斷台5與芯軸部6相對地移動來切斷封裝基板P1。此時,封裝基板P1的焊球/導線面朝向上方,所以焊球/導線面成為切斷面。其後,對應於需要並藉由第二位置確認相機6b來對封裝基板P1進行攝像,以確認封裝基板P1的位置等。使用第二位置確認相機6b進行的確認中,例如對封裝基板P1的切斷位置和切斷寬度進行確認。Thereafter, the cutting table 5 moves toward the mandrel 6 along the Y-axis in the figure. After the cutting table 5 moves below the mandrel part 6 , the package substrate P1 is cut by relatively moving the cutting table 5 and the mandrel part 6 . At this time, since the solder ball/wire surface of the package substrate P1 faces upward, the solder ball/wire surface becomes a cut surface. Thereafter, the package substrate P1 is photographed by the second position confirmation camera 6 b according to the need, so as to confirm the position of the package substrate P1 and the like. In the confirmation using the second position confirmation camera 6b, for example, the cutting position and the cutting width of the package substrate P1 are confirmed.

切斷台5,在完成了封裝基板P1的切斷之後,在吸附了個片化而成的複數個電子零件S1的狀態下,沿著圖的Y軸並往自芯軸部6遠離的方向移動。此移動過程中,藉由第一洗淨器5e來實行電子零件S1的上面(焊球/導線面)的洗淨(清潔,cleaning)和乾燥。另外,電子零件S1的洗淨中,使用洗淨水。The cutting table 5 moves in a direction away from the core shaft portion 6 along the Y-axis of the figure in a state where the plurality of electronic components S1 formed by suction are absorbed after the cutting of the package substrate P1 is completed. move. During this moving process, the upper surface (solder ball/wire surface) of the electronic component S1 is cleaned (cleaning) and dried by the first cleaner 5e. In addition, washing water is used for washing the electronic component S1.

搬送部7,自上方吸附被保持於切斷台5之電子零件S1。在搬送部7,通過吸引通道VR1連接有真空泵D1。真空泵D1為乾式真空泵。搬送部7,藉由真空泵D1的吸引來吸附電子零件S1。在吸引通道VR1設置有第一水分離排出機構41。針對第一水分離排出機構41,詳細說明於後。搬送部7,吸附電子零件S1並往檢查和收納模組B1的檢查台11搬送。此搬送過程中,藉由第二洗淨器7a來實行電子零件S1的下面(封膠面)的洗淨和乾燥。在吸附有電子零件S1之搬送部7順著圖的Z軸方向下降且電子零件S1靠近第二洗淨器7a的狀態下,實行電子零件S1的洗淨和乾燥。若電子零件S1的洗淨和乾燥完成,則吸附有電子零件S1之搬送部7在Z軸方向上升。另外,在電子零件S1的洗淨中,使用洗淨水。The transfer unit 7 sucks the electronic component S1 held on the cutting table 5 from above. A vacuum pump D1 is connected to the conveyance unit 7 through a suction passage VR1. The vacuum pump D1 is a dry vacuum pump. The conveyance part 7 adsorb|sucks the electronic component S1 by suction of the vacuum pump D1. A first water separation and discharge mechanism 41 is provided in the suction passage VR1. The first water separation and discharge mechanism 41 will be described in detail later. The transport unit 7 absorbs the electronic component S1 and transports it to the inspection table 11 of the inspection and storage module B1. During this transfer process, the lower surface (sealant surface) of the electronic component S1 is cleaned and dried by the second washer 7a. The electronic component S1 is washed and dried in a state where the conveying unit 7 holding the electronic component S1 descends in the Z-axis direction in the drawing and the electronic component S1 approaches the second washer 7a. When the washing and drying of the electronic component S1 are completed, the conveyance part 7 to which the electronic component S1 was adsorbed will rise in the Z-axis direction. In addition, washing water is used for washing the electronic component S1.

檢查和收納模組B1,主要包含檢查台11、第一光學檢查相機12、第二光學檢查相機13、配置部14、及抽出部15。另外,第一光學檢查相機12,也可以設置於切斷模組A1。又,檢查和收納模組B1,包含第一水分離排出機構41的一部分、及真空泵D1的一部分。第一水分離排出機構41及真空泵D1,跨越切斷模組A1、及檢查和收納模組B1的兩方而存在。The inspection and storage module B1 mainly includes an inspection table 11 , a first optical inspection camera 12 , a second optical inspection camera 13 , an arrangement unit 14 , and an extraction unit 15 . In addition, the first optical inspection camera 12 may also be installed in the cutting module A1. In addition, the inspection and storage module B1 includes a part of the first water separation and discharge mechanism 41 and a part of the vacuum pump D1. The first water separation and discharge mechanism 41 and the vacuum pump D1 exist across both the cutting module A1 and the inspection and storage module B1.

檢查台11,為了對電子零件S1進行光學檢查而保持電子零件S1。檢查台11,可沿著圖的X軸移動。又,檢查台11,能夠上下倒轉。在檢查台11設置有保持構件,以藉由吸附電子零件S1來保持電子零件S1。在檢查台11,通過吸引通道VR1連接有真空泵D1。檢查台11,藉由真空泵D1的吸引來將電子零件S1吸附在保持構件上。The inspection stand 11 holds the electronic component S1 for optical inspection of the electronic component S1. The inspection table 11 is movable along the X-axis in the figure. Also, the inspection table 11 can be turned upside down. The inspection table 11 is provided with a holding member for holding the electronic component S1 by suctioning the electronic component S1. A vacuum pump D1 is connected to the inspection table 11 through a suction channel VR1. The inspection table 11 attracts the electronic component S1 to the holding member by suction of the vacuum pump D1.

第一光學檢查相機12和第二光學檢查相機13,對電子零件S1的兩面(焊球/導線面、及封膠面)進行攝像。基於藉由第一光學檢查相機12和第二光學檢查相機13生成的畫像資料來實行電子零件S1的各種檢查。各個第一光學檢查相機12和第二光學檢查相機13,被配置在檢查台11的附近並對上方進行攝像。The first optical inspection camera 12 and the second optical inspection camera 13 take images of both surfaces of the electronic component S1 (solder ball/wire surface, and sealing surface). Various inspections of the electronic component S1 are performed based on the image data generated by the first optical inspection camera 12 and the second optical inspection camera 13 . Each of the first optical inspection camera 12 and the second optical inspection camera 13 is arranged near the inspection table 11 and takes an image of the upper side.

第一光學檢查相機12,對藉由搬送部7往檢查台11搬送的電子零件S1的封膠面進行攝像。其後,搬送部7將電子零件S1載置在檢查台11的保持構件上。在保持構件吸附了電子零件S1之後,使檢查台11上下倒轉。在檢查台11往第二光學檢查相機13的上方移動之後,藉由第二光學檢查相機13來對電子零件S1的焊球/導線面進行攝像。The first optical inspection camera 12 takes an image of the sealing surface of the electronic component S1 conveyed to the inspection table 11 by the conveying unit 7 . Thereafter, the transport unit 7 places the electronic component S1 on the holding member of the inspection table 11 . After the electronic component S1 is adsorbed by the holding member, the inspection table 11 is turned upside down. After the inspection table 11 moves above the second optical inspection camera 13 , the second optical inspection camera 13 takes an image of the solder ball/wire surface of the electronic component S1 .

在配置部14配置有檢查完成的電子零件S1。在配置部14,通過吸引通道VR1連接有真空泵D1。配置部14,藉由真空泵D1的吸引來對檢查完成的電子零件S1進行吸附。配置部14,可沿著圖的Y軸移動。檢查台11,將檢查完成的電子零件S1配置於配置部14。The inspected electronic component S1 is arranged in the arrangement unit 14 . A vacuum pump D1 is connected to the arrangement part 14 through the suction passage VR1. The placement unit 14 sucks the inspected electronic component S1 by suction of the vacuum pump D1. The placement unit 14 is movable along the Y-axis in the figure. The inspection table 11 arranges the inspected electronic component S1 on the arrangement unit 14 .

抽出部15,將已配置於配置部14之電子零件S1往托盤移送。電子零件S1,基於使用了第一光學檢查相機12和第二光學檢查相機13的檢查結果,被區別為「良品」或「不良品」。抽出部15,基於區別結果,將各電子零件S1移送到良品用托盤15a或不良品用托盤15b。亦即,將良品收納在良品用托盤15a,將不良品收納在不良品用托盤15b。若各個良品用托盤15a和不良品用托盤15b,裝滿了電子零件S1,則交換為新的托盤。The extraction part 15 transfers the electronic component S1 already arranged in the arrangement|positioning part 14 to a tray. The electronic component S1 is classified as "good product" or "defective product" based on inspection results using the first optical inspection camera 12 and the second optical inspection camera 13 . The extraction part 15 transfers each electronic component S1 to the tray 15a for good products or the tray 15b for defective products based on the discrimination result. That is, good products are accommodated in the tray 15a for good products, and defective products are accommodated in the tray 15b for defective products. When the trays 15a for good products and the trays 15b for defective products are filled with electronic components S1, they are replaced with new ones.

切斷裝置1,進一步包含電腦50、監視器20、及聲音輸出部25。監視器20,構成為表示畫像。監視器20,例如以液晶監視器或有機EL(電致發光,Electro Luminescence)監視器等的表示裝置來構成。聲音輸出部25,構成為輸出聲音。聲音輸出部25,例如構成為揚聲器、蜂鳴器或電鈴(bell)等的聲音輸出裝置。The cutting device 1 further includes a computer 50 , a monitor 20 , and an audio output unit 25 . The monitor 20 is configured to display images. The monitor 20 is constituted by, for example, a display device such as a liquid crystal monitor or an organic EL (Electro Luminescence) monitor. The sound output unit 25 is configured to output sound. The sound output unit 25 is configured as a sound output device such as a speaker, a buzzer, or a bell, for example.

電腦50,例如控制切斷模組A1及檢查和收納模組B1的各部的動作。電腦50,例如控制基板供給部3、定位部4、切斷台5、芯軸部6、搬送部7、檢查台11、第一光學檢查相機12、第二光學檢查相機13、配置部14、抽出部15、第一水分離排出機構41、第二水分離排出機構42、第三水分離排出機構43、真空泵D1,D2,D3、監視器20、及聲音輸出部25。The computer 50 controls the operation of each part of the cutting module A1 and the inspection and storage module B1, for example. The computer 50, for example, controls the substrate supply unit 3, the positioning unit 4, the cutting table 5, the mandrel unit 6, the conveying unit 7, the inspection table 11, the first optical inspection camera 12, the second optical inspection camera 13, the placement unit 14, Extraction unit 15 , first water separation and discharge mechanism 41 , second water separation and discharge mechanism 42 , third water separation and discharge mechanism 43 , vacuum pumps D1 , D2 , D3 , monitor 20 , and sound output unit 25 .

<1-2.各水分離排出機構的構成> 如上述,在各切斷台5,連接有真空泵D2或真空泵D3;各個搬送部7、檢查台11及配置部14,連接有真空泵D1。各切斷台5,例如當進行封裝基板P1的切斷時,曝露在噴射的切削水、冷卻水及洗淨水下,以及當藉由第一洗淨器5e來進行電子零件S1的洗淨時,曝露在使用的洗淨水下。藉由真空泵D2,D3的吸引,例如使得這些水個別地浸入吸引通道VR2,VR3。又,搬送部7,當藉由第二洗淨器7a來進行電子零件S1的洗淨時,曝露在使用的洗淨水下。藉由真空泵D1的吸引,例如使得此水浸入吸引通道VR1。 <1-2. Configuration of each water separation and discharge mechanism> As described above, the vacuum pump D2 or the vacuum pump D3 is connected to each cutting table 5 , and the vacuum pump D1 is connected to each of the conveyance unit 7 , inspection table 11 and arrangement unit 14 . Each cutting table 5 is exposed to sprayed cutting water, cooling water, and washing water when, for example, cutting the package substrate P1, and when cleaning the electronic component S1 by the first washer 5e. When exposed to the washing water used. By the suction of the vacuum pumps D2, D3, for example, the water is individually immersed into the suction channels VR2, VR3. Moreover, the conveyance part 7 is exposed to the wash water used when washing|cleaning the electronic component S1 with the 2nd washer 7a. By the suction of the vacuum pump D1, for example, this water is immersed into the suction channel VR1.

假設當各個真空泵D1,D2,D3為水封式真空泵時,即便水浸入各真空泵中也不會產生問題。然而,當使用水封式真空泵時,為了抑制封入的水的溫度上升,必須持續地往真空泵內供給新的水。亦即,若使用水封式真空泵,則會消費大量的水。為了解決這種問題,依據本實施形態的切斷裝置1中,對各個真空泵D1,D2,D3採用乾式真空泵。Assuming that each of the vacuum pumps D1, D2, and D3 is a water-sealed vacuum pump, no problem will arise even if water soaks into each of the vacuum pumps. However, when using a water-sealed vacuum pump, it is necessary to continuously supply new water into the vacuum pump in order to suppress the temperature rise of the sealed water. That is, if a water-sealed vacuum pump is used, a large amount of water will be consumed. In order to solve such a problem, in the cutting device 1 according to the present embodiment, a dry vacuum pump is used for each of the vacuum pumps D1, D2, and D3.

為了使水不浸入各個乾式真空泵D1,D2,D3,在吸引通道VR1,VR2,VR3上,個別地配置有第一水分離排出機構41、第二水分離排出機構42及第三水分離排出機構43。各個第一水分離排出機構41、第二水分離排出機構42及第三水分離排出機構43,構成為對浸入吸引通道之水進行分離,並通過排水通道來將分離後的水往切斷裝置1的外部排出。藉由各個第一水分離排出機構41、第二水分離排出機構42及第三水分離排出機構43來實行排水,藉此可抑制水浸入各個真空泵D1,D2,D3。In order to prevent water from entering the dry vacuum pumps D1, D2, and D3, the first water separation and discharge mechanism 41, the second water separation and discharge mechanism 42, and the third water separation and discharge mechanism are individually arranged on the suction channels VR1, VR2, and VR3. 43. Each of the first water separation and discharge mechanism 41, the second water separation and discharge mechanism 42 and the third water separation and discharge mechanism 43 are configured to separate the water immersed in the suction channel, and to send the separated water to the cutting device through the drainage channel. 1's external discharge. Drainage is performed by each of the first water separation and discharge mechanism 41 , the second water separation and discharge mechanism 42 , and the third water separation and discharge mechanism 43 , thereby preventing water from entering the respective vacuum pumps D1 , D2 , and D3 .

如上述,第一水分離排出機構41,位於各個搬送部7、檢查台11及配置部14與真空泵D1之間的吸引通道VR1上。第二水分離排出機構42,位於一方的切斷台5與真空泵D2間的吸引通道VR2上。第三水分離排出機構43,位於另一方的切斷台5與真空泵D3間的吸引通道VR3上。各個第一水分離排出機構41、第二水分離排出機構42及第三水分離排出機構43,其配置的場所彼此不同,卻具有實質上相同的構成。各個第一水分離排出機構41、第二水分離排出機構42及第三水分離排出機構43,可在第一狀態與第二狀態之間改變。針對第一狀態和第二狀態,說明於後。以下,以第一水分離排出機構41為代表來進行說明。As described above, the first water separation and discharge mechanism 41 is located on the suction passage VR1 between the respective conveyance parts 7 , the inspection table 11 , and the arrangement part 14 and the vacuum pump D1 . The second water separation and discharge mechanism 42 is located on the suction passage VR2 between the one cutting table 5 and the vacuum pump D2. The third water separation and discharge mechanism 43 is located on the suction passage VR3 between the other cutting table 5 and the vacuum pump D3. Each of the first water separation and discharge mechanism 41 , the second water separation and discharge mechanism 42 , and the third water separation and discharge mechanism 43 has substantially the same configuration although they are arranged in different locations. Each of the first water separation and discharge mechanism 41 , the second water separation and discharge mechanism 42 and the third water separation and discharge mechanism 43 can be changed between the first state and the second state. The first state and the second state will be described later. Hereinafter, the first water separation and discharge mechanism 41 will be described as a representative.

第2圖是示意地表示在第一狀態的第一水分離排出機構41的圖。第3圖是示意地表示在第二狀態的第一水分離排出機構41的圖。如第2圖和第3圖所示,第一水分離排出機構41,包含第一槽410、第二槽420、液面位準感測器430、及閥門V1,V2,V3。Fig. 2 is a diagram schematically showing the first water separation and discharge mechanism 41 in the first state. Fig. 3 is a diagram schematically showing the first water separation and discharge mechanism 41 in the second state. As shown in Figure 2 and Figure 3, the first water separation and discharge mechanism 41 includes a first tank 410, a second tank 420, a liquid level sensor 430, and valves V1, V2, V3.

第一槽410,位於吸引通道VR1上。第一槽410,通過配管來與在吸引通道VR1位於上游的各個搬送部7、檢查台11及配置部14連接。第一槽410,構成為對通過吸引通道VR1流入了的水加以儲藏。又,第一槽410,通過配管來與在吸引通道VR1位於下游的真空泵D1連接。又,第一槽410,通過配管來與在排水通道DR1位於下游的第二槽420連接。第一槽410,構成為將已儲藏的水往第二槽420排出。The first groove 410 is located on the suction channel VR1. The first tank 410 is connected to each of the transport unit 7 , the inspection table 11 , and the arrangement unit 14 located upstream of the suction passage VR1 through piping. The first tank 410 is configured to store water that has flowed in through the suction passage VR1. In addition, the first tank 410 is connected to the vacuum pump D1 located downstream of the suction passage VR1 through piping. Also, the first tank 410 is connected to the second tank 420 located downstream of the drain passage DR1 through piping. The first tank 410 is configured to discharge the stored water to the second tank 420 .

在第一槽410,安裝有液面位準感測器430。液面位準感測器430,構成為檢測在第一槽410的液面(水面)的高度。作為液面位準感測器430,能夠使用水位計等的習知的各種感測器。In the first tank 410, a liquid level sensor 430 is installed. The liquid level sensor 430 is configured to detect the height of the liquid surface (water surface) in the first tank 410 . Various well-known sensors such as a water level gauge can be used as the liquid level sensor 430 .

第4圖是示意地表示第一槽410的平面的圖。第5圖是示意地表示沿著第4圖的V-V剖面的圖。第6圖是示意地表示沿著第4圖的VI-VI剖面的圖。如第4圖、第5圖及第6圖所示,第一槽410,包含第一槽本體411、連接口412,413,414、及分隔板415。FIG. 4 is a diagram schematically showing the plane of the first groove 410 . Fig. 5 is a diagram schematically showing a V-V cross section in Fig. 4 . Fig. 6 is a diagram schematically showing a section along VI-VI in Fig. 4 . As shown in FIG. 4 , FIG. 5 and FIG. 6 , the first tank 410 includes a first tank body 411 , connecting ports 412 , 413 , 414 , and a partition plate 415 .

第一槽本體411,例如是金屬製且具有圓柱形狀。在第一槽本體411的頂面,貫通有連接口412。在連接口412,連接有與各個搬送部7、檢查台11和配置部14連接的配管。此配管,構成為吸引通道VR1的一部分。另外,連接口412,不一定要設置在第一槽本體411的頂面,例如也可以設置在第一槽本體411的側面。又,各個第二水分離排出機構42和第三水分離排出機構43中,將與切斷台5連接了的配管連接於連接口412。The first tank body 411 is, for example, made of metal and has a cylindrical shape. A connecting port 412 penetrates through the top surface of the first tank body 411 . To the connection port 412 , piping connected to each of the conveyance unit 7 , the inspection table 11 , and the arrangement unit 14 is connected. This piping constitutes a part of the suction channel VR1. In addition, the connection port 412 is not necessarily provided on the top surface of the first tank body 411 , for example, it may also be provided on the side of the first tank body 411 . In addition, in each of the second water separation and discharge mechanism 42 and the third water separation and discharge mechanism 43 , the pipe connected to the cutting table 5 is connected to the connection port 412 .

在第一槽本體411的側面,貫穿有連接口413。在連接口413,連接有與真空泵D1連接的配管。此配管,構成為吸引通道VR1的一部分。另外,連接口413,不一定要設置在第一槽本體411的側面,例如也可以設置在第一槽本體411的頂面。又,第二水分離排出機構42和第三水分離排出機構43中,將與真空泵D2連接了的配管及與真空泵D3連接了的配管,分別地連接於連接口413。On the side of the first tank body 411 , a connecting port 413 is penetrated. A pipe connected to the vacuum pump D1 is connected to the connection port 413 . This piping constitutes a part of the suction channel VR1. In addition, the connection port 413 does not have to be provided on the side of the first tank body 411 , for example, it can also be provided on the top surface of the first tank body 411 . In addition, in the second water separation and discharge mechanism 42 and the third water separation and discharge mechanism 43 , the pipes connected to the vacuum pump D2 and the pipes connected to the vacuum pump D3 are respectively connected to the connection port 413 .

在第一槽本體411的底面,貫穿有連接口414。在連接口414,連接有與第二槽420連接的配管。此配管,構成為排水通道DR1的一部分。第一槽410,通過連接口414往第二槽420排水。A connecting port 414 penetrates through the bottom surface of the first tank body 411 . A pipe connected to the second tank 420 is connected to the connection port 414 . This piping constitutes a part of the drain passage DR1. The first tank 410 drains water to the second tank 420 through the connection port 414 .

分隔板415,例如是金屬製且具有矩形形狀。分隔板415,當俯視時立設於通過第一槽本體411的中心的位置,且自第一槽本體411的底面朝向上方延伸。分隔板415,隔著複數個熔接部W1來接合於第一槽本體411的各個內側側面及內側底面。分隔板415,在第一槽410內,對連接口413的所在區域、及連接口412的所在區域加以分隔。亦即,連接口413位於藉由分隔板415分隔的一方的區域,連接口412位於藉由分隔板415分隔的另一方的區域。另外,在彼此相鄰的2個熔接部W15之間形成有間隙,所以自連接口412浸入且往下方落下的水,儲藏在藉由分隔板415來分隔的2個區域的兩方中。The partition plate 415 is, for example, made of metal and has a rectangular shape. The partition plate 415 is erected at a position passing through the center of the first tank body 411 in plan view, and extends upward from the bottom surface of the first tank body 411 . The partition plate 415 is joined to each inner side surface and inner bottom surface of the first tank body 411 via a plurality of welded portions W1. The partition plate 415 separates the area where the connection port 413 is located and the area where the connection port 412 is located in the first groove 410 . That is, the connection port 413 is located in one area partitioned by the partition plate 415 , and the connection port 412 is located in the other area partitioned by the partition plate 415 . In addition, since a gap is formed between two adjacent welded portions W15 , the water that enters from the connection port 412 and falls downward is stored in both of the two regions partitioned by the partition plate 415 .

第一槽410中,在分隔板415的上方形成有間隙。此例中,間隙的長度為X1。在分隔板415的上方形成間隙,藉此確保由真空泵D1的吸引產生的氣流的通道。又,連接口412的下端,存在於比分隔板415的上端更低的位置。此例中,連接口412的下端(當連接口412設置在側面時,為連接口412的前端的上端部分),存在於比分隔板415的上端更低的長度為X2的位置。藉此,成為自連接口412浸入的水不易被吸引到連接口413。In the first groove 410 , a gap is formed above the partition plate 415 . In this example, the length of the gap is X1. A gap is formed above the partition plate 415 , whereby the passage of the airflow generated by the suction of the vacuum pump D1 is ensured. Also, the lower end of the connection port 412 exists at a lower position than the upper end of the partition plate 415 . In this example, the lower end of the connection port 412 (when the connection port 412 is provided on the side, the upper end portion of the front end of the connection port 412 ) exists at a position lower than the upper end of the partition plate 415 by a length X2. Thereby, the water that has entered from the connection port 412 is less likely to be sucked to the connection port 413 .

再次參照第2圖和第3圖,第二槽420,位於在排水通道DR1中的第一槽410的下游的位置。第二槽420,在高度方向(Z軸方向(第1圖))配置在比第一槽410更低的位置。因此,流入了吸引通道VR1的水,順著重力自第一槽410往第二槽420流入。第二槽420,構成為儲藏自第一槽410流入的水。Referring to FIGS. 2 and 3 again, the second groove 420 is located downstream of the first groove 410 in the drainage channel DR1. The second groove 420 is arranged at a lower position than the first groove 410 in the height direction (Z-axis direction (FIG. 1)). Therefore, the water flowing into the suction channel VR1 flows from the first groove 410 to the second groove 420 by gravity. The second tank 420 is configured to store water flowing in from the first tank 410 .

排水通道DR1中,在第一槽410與第二槽420之間設置有閥門V1。閥門V1可開閉。當閥門V1為打開狀態時,儲藏在第一槽410的水往第二槽420流入。當閥門V1為關閉狀態時,水儲藏在第一槽410且停止水自第一槽410往第二槽420流入。In the drain passage DR1 , a valve V1 is provided between the first tank 410 and the second tank 420 . Valve V1 can be opened and closed. When the valve V1 is in an open state, the water stored in the first tank 410 flows into the second tank 420 . When the valve V1 is in the closed state, the water is stored in the first tank 410 and the flow of water from the first tank 410 to the second tank 420 is stopped.

在閥門V1與第二槽420之間,使排水通道DR1分歧。分歧去處,隔著閥門V2連通到大氣。閥門V2可開閉。當閥門V2為打開狀態時,排水通道DR1內的壓力成為大氣壓。排水通道DR1中,在第二槽420的下游,設置有閥門V3。閥門V3,是排水用閥門且構成為逆止閥。Between the valve V1 and the second tank 420, the drain passage DR1 is branched. The divergent place is connected to the atmosphere through the valve V2. Valve V2 can be opened and closed. When the valve V2 is in an open state, the pressure in the drain passage DR1 becomes atmospheric pressure. In the drain passage DR1, downstream of the second tank 420, a valve V3 is provided. The valve V3 is a valve for drainage and is configured as a check valve.

例如,當閥門V1為打開狀態且閥門V2為關閉狀態時,包含排水通道DR1、第二槽420及閥門V3的範圍Z1成為真空狀態,所以閥門V3自動成為關閉狀態。此時,流入了吸引通道VR1的水,通過第一槽410且儲藏在第二槽420。上述第一狀態,是指此狀態,就是閥門V1為打開狀態且閥門V2和閥門V3為關閉狀態之狀態(參照第2圖)。For example, when the valve V1 is open and the valve V2 is closed, the area Z1 including the drainage channel DR1, the second tank 420 and the valve V3 is in a vacuum state, so the valve V3 is automatically closed. At this time, the water flowing into the suction channel VR1 passes through the first tank 410 and is stored in the second tank 420 . The above-mentioned first state refers to this state, that is, the state in which the valve V1 is in the open state and the valves V2 and V3 are in the closed state (see FIG. 2 ).

另一方面,當閥門V1為關閉狀態且閥門V2為打開狀態時,成為真空狀態的範圍Z2不包含排水通道DR1、第二槽420及閥門V3,所以閥門V3自動成為打開狀態。此時,流入了吸引通道VR1的水,就是儲藏在第一槽410和儲藏在第二槽420的水,通過水排出口往切斷裝置1的外部排出。上述第二狀態,是指此狀態,就是閥門V1為關閉狀態且閥門V2和閥門V3為打開狀態之狀態(參照第3圖)。On the other hand, when the valve V1 is closed and the valve V2 is opened, the vacuum range Z2 does not include the drain passage DR1, the second groove 420 and the valve V3, so the valve V3 is automatically opened. At this time, the water flowing into the suction channel VR1, that is, the water stored in the first tank 410 and the second tank 420, is discharged to the outside of the cutting device 1 through the water discharge port. The above-mentioned second state refers to this state, that is, the state in which the valve V1 is in the closed state and the valves V2 and V3 are in the open state (see FIG. 3 ).

如上述,第一水分離排出機構41,可在第一狀態與第二狀態之間改變。由各閥門的控制而在適當的時序實行在第一狀態與第二狀態之間的改變,藉此能夠在由真空泵D1來維持電子零件S1的吸引狀態下,適當地實行排水。針對在第一狀態與第二狀態之間的改變的時序,說明於後。As mentioned above, the first water separation and discharge mechanism 41 can be changed between the first state and the second state. The change between the first state and the second state is performed at an appropriate timing by the control of each valve, whereby drainage can be appropriately performed while maintaining the suction state of the electronic component S1 by the vacuum pump D1. The timing of the change between the first state and the second state will be described later.

<1-3.電腦的硬體構成> 第7圖是示意地表示電腦50的硬體構成的圖。如第7圖所示,電腦50,包含控制部70、輸入輸出I/F(介面,interface)90、受理部95、及記憶部80,且各構成是經由匯流排來電性連接。 <1-3. Computer hardware configuration> FIG. 7 is a diagram schematically showing the hardware configuration of the computer 50 . As shown in FIG. 7, the computer 50 includes a control unit 70, an input/output I/F (interface, interface) 90, a receiving unit 95, and a memory unit 80, and each component is electrically connected via a bus bar.

控制部70,包含CPU(中央處理單元,Central Processing Unit)72、RAM(隨機存取記憶體,Random Access Memory)74及ROM(唯讀記憶體,Read Only Memory)76等。控制部70,構成為對應於資訊處理來控制電腦50內的各構成構件及切斷裝置1內的各構成構件。The control unit 70 includes a CPU (Central Processing Unit, Central Processing Unit) 72, a RAM (Random Access Memory, Random Access Memory) 74, a ROM (Read Only Memory, Read Only Memory) 76, and the like. The control unit 70 is configured to control each component in the computer 50 and each component in the cutting device 1 in accordance with information processing.

輸入輸出I/F90,構成為經由信號線來與切斷裝置1中包含的各構成構件進行通信。輸入輸出I/F90,用於自電腦50往切斷裝置1內的各構成構件的資料的傳送,自切斷裝置1內的各構成構件往電腦50傳送的資料的接收。受理部95,構成為受理來自使用者的指示。受理部95,例如以觸碰面板、鍵盤、滑鼠及麥克風的一部分或全部來構成。The input/output I/F 90 is configured to communicate with each component included in the cutting device 1 via a signal line. The input/output I/F 90 is used to transmit data from the computer 50 to each component in the cutting device 1 and to receive data transmitted from each component in the cutting device 1 to the computer 50 . The accepting unit 95 is configured to accept instructions from the user. The receiving unit 95 is constituted by, for example, a part or all of a touch panel, a keyboard, a mouse, and a microphone.

記憶部80,例如是硬碟驅動器、固態驅動器等的輔助記憶裝置。記憶部80,例如構成為記憶控制程式81。控制程式81由控制部70來實行,藉此實現在切斷裝置1中的各種動作。當由控制部70來實行控制程式81時,控制程式81在RAM74中展開。再者,控制部70,藉由CPU72來解釋和實行在RAM74中展開的控制程式81,以控制各構成構件。The storage unit 80 is, for example, an auxiliary storage device such as a hard disk drive or a solid state drive. The storage unit 80 is configured to store a control program 81, for example. The control program 81 is executed by the control unit 70 to realize various operations in the cutting device 1 . When the control program 81 is executed by the control unit 70 , the control program 81 is expanded in the RAM 74 . Furthermore, the control unit 70 interprets and executes the control program 81 developed in the RAM 74 via the CPU 72 to control each component.

[2.動作] <2-1.在第一水分離排出機構中的排水動作> 第8圖是表示在第一水分離排出機構41中的排水程序的一例的流程圖。此流程圖表示的處理,是當第一水分離排出機構41為第二狀態(第3圖)時藉由電腦50的控制部70來實行。另外,此流程圖中表示的處理,每當1片的封裝基板P1的處理完成時實行。 [2. Action] <2-1. Drain operation in the first water separation and discharge mechanism> FIG. 8 is a flowchart showing an example of a drainage routine in the first water separation and discharge mechanism 41 . The processing shown in this flowchart is executed by the control unit 70 of the computer 50 when the first water separation and discharge mechanism 41 is in the second state (FIG. 3). Note that the processing shown in this flowchart is executed every time the processing of one package substrate P1 is completed.

參照第8圖,控制部70,判定吸附於切斷台5之電子零件S1的焊球/導線面的由第一洗淨器5e進行的清潔(洗淨)是否完成(步驟S100)。若判定為焊球/導線面的清潔尚未完成(步驟S100中的否),則控制部70待機直到焊球/導線面的清潔完成。Referring to FIG. 8 , the control unit 70 determines whether cleaning (cleaning) of the solder ball/lead surface of the electronic component S1 attracted to the cutting table 5 by the first cleaner 5 e is completed (step S100 ). If it is determined that the cleaning of the solder ball/lead surface has not been completed (NO in step S100 ), the control unit 70 waits until the cleaning of the solder ball/lead surface is completed.

另一方面,若判定為焊球/導線面的清潔已完成(步驟S100中的是),則控制部70控制各個閥門V1,V2以使第一水分離排出機構41自第二狀態變更為第一狀態(步驟S110)。亦即,控制部70,控制閥門V1自關閉狀態切換成打開狀態,並且控制閥門V2自打開狀態切換成關閉狀態。藉此,使閥門V3成為關閉狀態,能夠在由第二洗淨器7a進行清潔而使水自搬送部7浸入吸引通道VR1之前,在藉由真空泵D1來維持吸引電子零件S1的狀態下,增加可儲藏在第一水分離排出機構41中的水的量。另外,閥門V1的狀態切換與閥門V2的狀態切換是同時實行。On the other hand, if it is determined that the cleaning of the solder ball/lead surface has been completed (Yes in step S100), the control unit 70 controls each valve V1, V2 so that the first water separation and discharge mechanism 41 changes from the second state to the first state. A state (step S110). That is, the control unit 70 controls the valve V1 to switch from the closed state to the open state, and controls the valve V2 to switch from the open state to the closed state. Thereby, the valve V3 is closed, and before the second washer 7a cleans and water enters the suction passage VR1 from the conveying part 7, the vacuum pump D1 maintains the suction state of the electronic component S1. The amount of water that can be stored in the first water separation and discharge mechanism 41 . In addition, the state switching of the valve V1 and the state switching of the valve V2 are implemented simultaneously.

其後,控制部70,判定由第二洗淨器7a對吸附於搬送部7之電子零件S1的封膠面(與切斷面相反的一面)的清潔、及搬送部7在Z軸(第1圖)方向的上升是否都完成(步驟S120)。若判定由第二洗淨器7a進行的清潔、及搬送部7的上升尚未完成(步驟S120中的否),則控制部70待機直到由第二洗淨器7a進行的清潔、及搬送部7的上升都完成了。在由第二洗淨器7a進行的清潔、及搬送部7的上升都完成後的時序,是在第一水分離排出機構41中,第二槽420中積存最多水且第一槽410不易積存水的時序。Thereafter, the control unit 70 judges the cleaning of the sealing surface (the side opposite to the cut surface) of the electronic component S1 adsorbed by the conveying unit 7 by the second cleaner 7 a and the cleaning of the conveying unit 7 on the Z-axis (the second side). 1) whether the ascent in the direction has been completed (step S120). If it is determined that the cleaning by the second washer 7a and the lifting of the conveying unit 7 have not been completed (NO in step S120), the control unit 70 waits until the cleaning by the second washer 7a and the lifting of the conveying unit 7 are completed. The ascent is complete. In the sequence after the cleaning by the second washer 7a and the lifting of the transfer unit 7 are completed, in the first water separation and discharge mechanism 41, the second tank 420 accumulates the most water and the first tank 410 is difficult to accumulate. water timing.

另一方面,若判定由第二洗淨器7a進行的清潔、及搬送部7的上升都完成了(步驟S120中的是),則控制部70控制各個閥門V1,V2以使第一水分離排出機構41自第一狀態變更為第二狀態(步驟S130)。亦即,控制部70,控制閥門V1自打開狀態切換成關閉狀態,並且控制閥門V2自關閉狀態切換成打開狀態。藉此,使閥門V3成為打開狀態,能夠在吸附於搬送部7的狀態下使用水來對電子零件S1實行最後處理之後,在藉由真空泵D1來維持吸引電子零件S1的狀態下,將儲藏在第二槽420的水往切斷裝置1的外部排出。另外,閥門V1的狀態切換與閥門V2的狀態切換是同時實行。On the other hand, if it is judged that the cleaning by the second washer 7a and the lifting of the transfer unit 7 are completed (Yes in step S120), the control unit 70 controls the valves V1, V2 to separate the first water The discharge mechanism 41 changes from the first state to the second state (step S130). That is, the control unit 70 controls the valve V1 to switch from the open state to the closed state, and controls the valve V2 to switch from the closed state to the open state. Thereby, the valve V3 is opened, and the electronic component S1 can be stored in the vacuum pump D1 while the electronic component S1 is kept suctioned by the vacuum pump D1 after finishing the electronic component S1 with water in the state of being adsorbed by the conveyance unit 7. The water in the second tank 420 is discharged to the outside of the cutting device 1 . In addition, the state switching of the valve V1 and the state switching of the valve V2 are implemented simultaneously.

<2-2.在第二和第三水分離排出機構中的排水動作> 第二水分離排出機構42和第三水分離排出機構43的排水程序實質上相同。以下,代表性地以在第二水分離排出機構42中的排水動作來進行說明。 <2-2. Drain operation in the second and third water separation and discharge mechanisms> The drainage procedures of the second water separation and discharge mechanism 42 and the third water separation and discharge mechanism 43 are substantially the same. Hereinafter, the drainage operation in the second water separation and discharge mechanism 42 will be representatively described.

第9圖是表示在第二水分離排出機構42中的排水程序的一例的流程圖。在此流程圖表示的處理,是在第二水分離排出機構42為第二狀態時,藉由控制部70來實行。另外,在此流程圖表示的處理,每當1片封裝基板P1的處理完成就會實行。FIG. 9 is a flowchart showing an example of a drainage routine in the second water separation and discharge mechanism 42 . The processing shown in this flowchart is executed by the control unit 70 when the second water separation and discharge mechanism 42 is in the second state. In addition, the processing shown in this flowchart is executed every time the processing of one package substrate P1 is completed.

參照第9圖,控制部70,判定封裝基板P1是否已載置在切斷台5上(步驟S200)。若判定封裝基板P1尚未載置在切斷台5上(步驟S200中的否),則控制部70待機直到封裝基板P1已載置在切斷台5上。Referring to FIG. 9 , the control unit 70 determines whether the package substrate P1 is placed on the cutting table 5 (step S200 ). If it is determined that the package substrate P1 has not been placed on the cutting table 5 (NO in step S200 ), the control unit 70 waits until the package substrate P1 is placed on the cutting table 5 .

另一方面,若判定封裝基板P1已載置在切斷台5上(步驟S200中的是),則控制部70控制各個閥門V1,V2以使第二水分離排出機構42自第二狀態變更為第一狀態(步驟S210)。亦即,控制部70,控制閥門V1自關閉狀態切換成打開狀態,並且控制閥門V2自打開狀態切換成關閉狀態。藉此,使閥門V3成為關閉狀態,能夠在切削水、冷卻水及洗淨水自切斷台5浸入吸引通道VR2之前,在藉由真空泵D2來維持吸引電子零件S1的狀態下,增加可儲藏在第二水分離排出機構42中的水的量。另外,閥門V1的狀態切換與閥門V2的狀態切換是同時實行。On the other hand, if it is determined that the package substrate P1 has been placed on the cutting table 5 (Yes in step S200), the control unit 70 controls the valves V1, V2 so that the second water separation and discharge mechanism 42 changes from the second state to the second state. It is the first state (step S210). That is, the control unit 70 controls the valve V1 to switch from the closed state to the open state, and controls the valve V2 to switch from the open state to the closed state. With this, the valve V3 is closed, and before the cutting water, cooling water, and washing water enter the suction passage VR2 from the cutting table 5, the vacuum pump D2 maintains the suction state of the electronic component S1, increasing the storage capacity. The amount of water in the second water separation and discharge mechanism 42 . In addition, the state switching of the valve V1 and the state switching of the valve V2 are implemented simultaneously.

其後,控制部70,判定由第一洗淨器5e對吸附於切斷台5之電子零件S1的焊球/導線面的清潔(洗淨)是否完成(步驟S220)。若判定焊球/導線面的清潔尚未完成(步驟S220中的否),則控制部70待機直到焊球/導線面的清潔完成。在由第一洗淨器5e對焊球/導線面的清潔進行的清潔完成後的時序,是在第二水分離排出機構42中,第二槽420積存最多水且第一槽410不易積存水的時序。Thereafter, the control unit 70 determines whether cleaning (cleaning) of the solder ball/lead surface of the electronic component S1 adsorbed on the cutting table 5 by the first cleaner 5e is completed (step S220). If it is determined that the cleaning of the solder ball/wire surface has not been completed (NO in step S220 ), the control unit 70 waits until the cleaning of the solder ball/wire surface is completed. After the cleaning of the solder ball/wire surface by the first cleaner 5e is completed, in the second water separation and discharge mechanism 42, the second tank 420 accumulates the most water and the first tank 410 is not easy to accumulate water timing.

另一方面,若判定焊球/導線面的清潔完成了(步驟S220中的是),則控制部70控制各個閥門V1,V2以使第二水分離排出機構42自第一狀態變更為第二狀態(步驟S230)。亦即,控制部70,控制閥門V1自打開狀態切換成關閉狀態,並且控制閥門V2自關閉狀態切換成打開狀態。藉此,使閥門V3成為打開狀態,能夠在吸附於切斷台5的狀態下使用水來對電子零件S1實行最後處理之後,在藉由真空泵D2來維持吸引電子零件S1的狀態下,將儲藏在第二槽420的水往切斷裝置1的外部排出。另外,閥門V1的狀態切換與閥門V2的狀態切換是同時實行。On the other hand, if it is determined that the cleaning of the solder ball/wire surface is completed (Yes in step S220), the control unit 70 controls the respective valves V1, V2 so that the second water separation and discharge mechanism 42 is changed from the first state to the second state. state (step S230). That is, the control unit 70 controls the valve V1 to switch from the open state to the closed state, and controls the valve V2 to switch from the closed state to the open state. Thereby, the valve V3 is opened, and after the final treatment of the electronic component S1 with water in the state of being adsorbed on the cutting table 5, the electronic component S1 can be kept in the state of being sucked by the vacuum pump D2, and the stored The water in the second tank 420 is discharged to the outside of the cutting device 1 . In addition, the state switching of the valve V1 and the state switching of the valve V2 are implemented simultaneously.

<2-3.排水不良時的動作> 各個第一水分離排出機構41、第二水分離排出機構42及第三水分離排出機構43,產生排水不良時會實行共通的動作。以下,代表性地以第一水分離排出機構41中的排水不良時的動作來進行說明。 <2-3. Operation in case of poor drainage> Each of the first water separation and discharge mechanism 41 , the second water separation and discharge mechanism 42 , and the third water separation and discharge mechanism 43 performs a common operation when drainage failure occurs. Hereinafter, the operation when the drainage in the first water separation and discharge mechanism 41 fails is representatively described.

第10圖是表示在第一水分離排出機構41中的排水不良時的動作程序的一例的流程圖。在此流程圖表示的處理,當切斷裝置1的動作時藉由電腦50的控制部70來實行。FIG. 10 is a flowchart showing an example of an operation program in the case of a drainage failure in the first water separation and discharge mechanism 41 . The processing shown in this flowchart is executed by the control unit 70 of the computer 50 when the cutting device 1 is operated.

參照第10圖,控制部70,參照液面位準感測器430的輸出,藉此判定在第一槽410中的液面(水面)的高度是否在規定高度以上(步驟S300)。若判定為在第一槽410中的液面的高度未滿規定高度(步驟S310的否),則控制部70持續進行在步驟S300中的判定。Referring to FIG. 10, the control unit 70 refers to the output of the liquid level sensor 430 to determine whether the liquid level (water level) in the first tank 410 is above a predetermined height (step S300). If it is determined that the height of the liquid surface in the first tank 410 is less than the predetermined height (No in step S310), the control unit 70 continues the determination in step S300.

另一方面,若判定為在第一槽410中的液面的高度在規定高度以上(步驟S310的是),則控制部70控制聲音輸出部25以輸出警告音。藉由聽到警告音,作業者能夠察覺到在第一水分離排出機構41中產生排水不良。On the other hand, when it is determined that the height of the liquid surface in the first tank 410 is equal to or higher than the predetermined height (Yes in step S310 ), the control unit 70 controls the sound output unit 25 to output a warning sound. By hearing the warning sound, the operator can perceive that drainage failure has occurred in the first water separation and discharge mechanism 41 .

[3.特徵] 如以上,依據本實施形態的切斷裝置1中,各個第一水分離排出機構41、第二水分離排出機構42及第三水分離排出機構43,可在第一狀態及第二狀態之間改變,該第一狀態會將自第一槽410流入了第二槽420的水儲藏在第二槽420,該第二狀態會將儲藏在第一槽410和儲藏在第二槽420的水排出到切斷裝置1的外部。因此,依據此切斷裝置1,能夠適當地改變各水分離排出機構的狀態,藉此一邊維持電子零件S1等的基板的吸附,一邊抑制水浸入各真空泵。 [3. Features] As above, in the cutting device 1 according to the present embodiment, each of the first water separation and discharge mechanism 41, the second water separation and discharge mechanism 42, and the third water separation and discharge mechanism 43 can be set between the first state and the second state. Change, the first state will store the water flowing into the second tank 420 from the first tank 410 in the second tank 420, and the second state will discharge the water stored in the first tank 410 and the second tank 420 to the outside of the cutting device 1. Therefore, according to this cutting device 1 , it is possible to appropriately change the state of each water separation and discharge mechanism, thereby suppressing water from entering each vacuum pump while maintaining the adsorption of the substrate such as the electronic component S1 .

又,第一槽410中,利用分隔板415來對連接口413的所在區域、及連接口412的所在區域加以分隔,且可在分隔板415的兩區域中儲水,該連接口413連通於真空泵D1,D2或D3,該連接口412連通於用以吸附封裝基板P1或封裝基板P1的通道。再者,在分隔板415的上方形成有間隙。依據本實施形態的切斷裝置1,能夠藉由這種簡單的構成來將水自吸氣中分離。進一步,每當1片封裝基板P1的處理完成就會在各個第一水分離排出機構41、第二水分離排出機構42及第三水分離排出機構43中實行排水處理,藉此能夠盡量縮小第一槽410和第二槽420的容量。Also, in the first tank 410, the partition plate 415 is used to separate the area where the connection port 413 is located and the area where the connection port 412 is located, and water can be stored in the two areas of the partition plate 415. The connection port 413 Connected to the vacuum pump D1 , D2 or D3 , the connection port 412 is connected to the channel for absorbing the package substrate P1 or the package substrate P1 . Furthermore, a gap is formed above the partition plate 415 . According to the cutting device 1 of the present embodiment, water can be separated from the suction air with such a simple structure. Further, every time the processing of one package substrate P1 is completed, the water discharge treatment is performed in each of the first water separation and discharge mechanism 41, the second water separation and discharge mechanism 42, and the third water separation and discharge mechanism 43, thereby reducing the size of the first water separation and discharge mechanism as much as possible. The capacity of the first tank 410 and the second tank 420.

另外,各個封裝基板P1和電子零件S1,是本發明中的「切斷對象物」的一例。切斷台5,是本發明中的「台」的一例。芯軸部6,是本發明中的「切斷機構」的一例。搬送部7,是本發明中的「保持機構」的一例。各個吸引通道VR1,VR2,VR3,是本發明中的「吸引通道」的一例。各個真空泵D1,D2,D3,是本發明中的「真空泵」的一例。排水通道DR1,是本發明中的「排水通道」的一例。各個第一水分離排出機構41、第二水分離排出機構42及第三水分離排出機構43,是本發明中的「水分離排出機構」的一例。第一槽410,是本發明中的「第一槽」的一例;第二槽420,是本發明中的「第二槽」的一例。分隔板415,是本發明中的「分隔板」的一例。包含各個閥門V1,V2,V3之構成,是本發明中的「閥門機構」的一例。電腦50的控制部70,是本發明中的「控制部」的一例。閥門V3,是本發明中的「排水用閥門」的一例。In addition, each of the package substrate P1 and the electronic component S1 is an example of the "object to be cut" in the present invention. The cutting stage 5 is an example of the "stage" in the present invention. The core shaft portion 6 is an example of the "cutting mechanism" in the present invention. The transport unit 7 is an example of the "holding mechanism" in the present invention. Each of the suction channels VR1, VR2, and VR3 is an example of the "suction channel" in the present invention. Each of the vacuum pumps D1, D2, and D3 is an example of a "vacuum pump" in the present invention. The drainage channel DR1 is an example of the "drainage channel" in the present invention. Each of the first water separation and discharge mechanism 41 , the second water separation and discharge mechanism 42 , and the third water separation and discharge mechanism 43 is an example of the "water separation and discharge mechanism" in the present invention. The first groove 410 is an example of the "first groove" in the present invention; the second groove 420 is an example of the "second groove" in the present invention. The partition plate 415 is an example of the "partition plate" in the present invention. The configuration including the respective valves V1, V2, and V3 is an example of the "valve mechanism" in the present invention. The control unit 70 of the computer 50 is an example of the "control unit" in the present invention. The valve V3 is an example of the "valve for drainage" in the present invention.

[4.其他實施形態] 上述實施形態的思想,不限定於上述說明的實施形態。以下,針對能夠適用上述實施形態的思想之其他實施形態進行說明。 [4. Other Embodiments] The idea of the above-mentioned embodiment is not limited to the above-described embodiment. Hereinafter, other embodiments to which the ideas of the above-mentioned embodiments can be applied will be described.

<4-1> 依據上述實施形態的切斷裝置1中,各個第一水分離排出機構41、第二水分離排出機構42及第三水分離排出機構43,包含閥門V1,V2。然而,各個第一水分離排出機構41、第二水分離排出機構42及第三水分離排出機構43,不一定要包含閥門V1,V2。例如,各個第一水分離排出機構41、第二水分離排出機構42及第三水分離排出機構43,只要包含閥門機構,該閥門機構可改變成第一狀態及第二狀態即可,該第一狀態會將自第一槽410流入了第二槽420的水儲藏在第二槽420,該第二狀態會將儲藏在第一槽410和儲藏在第二槽420的水排出。作為這種閥門機構,舉例有三方閥。以下針對第一水分離排出機構41的其他例進行說明。 <4-1> In the cutting device 1 according to the above-mentioned embodiment, each of the first water separation and discharge mechanism 41 , the second water separation and discharge mechanism 42 , and the third water separation and discharge mechanism 43 includes valves V1 and V2 . However, each of the first water separation and discharge mechanism 41 , the second water separation and discharge mechanism 42 and the third water separation and discharge mechanism 43 does not necessarily include the valves V1 and V2 . For example, each of the first water separation and discharge mechanism 41, the second water separation and discharge mechanism 42, and the third water separation and discharge mechanism 43, as long as it includes a valve mechanism, the valve mechanism can be changed into the first state and the second state. The first state stores the water flowing from the first tank 410 into the second tank 420 in the second tank 420 , and the second state discharges the water stored in the first tank 410 and the second tank 420 . As such a valve mechanism, a tripartite valve is exemplified. Another example of the first water separation and discharge mechanism 41 will be described below.

第11圖是示意地表示在第一狀態的水分離排出機構41A的圖。第12圖是示意地表示在第二狀態的水分離排出機構41A的圖。如第11圖和第12圖所示,水分離排出機構41A中,在第一槽410與第二槽420之間設置三方閥VA。三方閥VA,能夠改變成貫通第一槽410和第二槽420的狀態(第11圖)、及貫通第二槽420與大氣的狀態(第12圖)。亦即,三方閥VA,能夠改變成第一狀態(第11圖)及第二狀態(第12圖),該第一狀態會將自第一槽410往第二槽420排出的水儲藏在第二槽420,該第二狀態會將儲藏在第一槽410和儲藏在第二槽420的水排出。在依據上述實施形態的切斷裝置1中,也可以使用三方閥VA來取代閥門V1,V2。另外,第一狀態中的範圍Z3成為真空狀態,第二狀態中的範圍Z4成為真空狀態。Fig. 11 is a diagram schematically showing the water separation and discharge mechanism 41A in the first state. Fig. 12 is a diagram schematically showing the water separation and discharge mechanism 41A in the second state. As shown in FIGS. 11 and 12 , in the water separation and discharge mechanism 41A, a three-way valve VA is provided between the first tank 410 and the second tank 420 . The three-way valve VA can be changed to a state passing through the first groove 410 and the second groove 420 ( FIG. 11 ), and a state passing through the second groove 420 and the atmosphere ( FIG. 12 ). That is, the three-way valve VA can be changed into a first state (FIG. 11) and a second state (FIG. 12). The first state will store the water discharged from the first tank 410 to the second tank 420 in the second state. The second tank 420 , the second state will discharge the water stored in the first tank 410 and the second tank 420 . In the cutting device 1 according to the above-mentioned embodiment, a three-way valve VA may be used instead of the valves V1 and V2. In addition, the range Z3 in the first state is in a vacuum state, and the range Z4 in the second state is in a vacuum state.

<4-2> 又,依據上述實施形態的切斷裝置1中,將第一水分離排出機構41、第二水分離排出機構42及第三水分離排出機構43,個別地設置於吸引通道VR1,VR2,VR3。然而,在各吸引通道,不一定要設置有水分離排出機構。例如,也可以使用水封式真空泵來作為真空泵D2,D3,並在各個吸引通道VR2,VR3,不設置水分離排出機構。又,例如也可以使用水封式真空泵來作為真空泵D1,並在吸引通道VR1,不設置水分離排出機構。 <4-2> In addition, in the cutting device 1 according to the above-mentioned embodiment, the first water separation and discharge mechanism 41, the second water separation and discharge mechanism 42, and the third water separation and discharge mechanism 43 are individually provided in the suction channels VR1, VR2, and VR3. However, it is not necessary to provide a water separation and discharge mechanism in each suction channel. For example, a water-sealed vacuum pump may be used as the vacuum pumps D2 and D3, and the water separation and discharge mechanism may not be provided in the respective suction channels VR2 and VR3. In addition, for example, a water-sealed vacuum pump may be used as the vacuum pump D1, and a water separation and discharge mechanism may not be provided in the suction passage VR1.

<4-3> 又,依據上述實施形態的切斷裝置1中,使用逆止閥來作為各個第一水分離排出機構41、第二水分離排出機構42及第三水分離排出機構43所包含的閥門V3。然而,閥門V3不一定要是逆止閥。閥門V3,也可以構成為雙位閥(所謂的停止閥)。此時,例如當要將水儲藏於第二槽420時,控制閥門V3成為關閉狀態;當要將水自第二槽420排出時,控制閥門V3成為打開狀態。 <4-3> Also, in the shutoff device 1 according to the above-mentioned embodiment, a check valve is used as the valve V3 included in each of the first water separation and discharge mechanism 41 , the second water separation and discharge mechanism 42 , and the third water separation and discharge mechanism 43 . However, valve V3 does not have to be a check valve. The valve V3 can also be designed as a two-position valve (so-called stop valve). At this time, for example, when water is to be stored in the second tank 420 , the control valve V3 is in a closed state; when water is to be discharged from the second tank 420 , the control valve V3 is in an open state.

<4-4> 又,連通於大氣的閥門V2,設置在自閥門V1與第二槽420之間的排水通道DR1分岐的通道上。然而,閥門V2,不一定要設置成自排水通道DR1分岐,也可以設置在排水通道DR1中的能夠使閥門V1的下游(更具體來說,在第二槽420內)成為大氣壓的處所。例如,也可以將配管連接於第二槽420的頂面,且在此配管中具備閥門V2。 <4-4> Also, the valve V2 that communicates with the atmosphere is provided on a passage branched from the drain passage DR1 between the valve V1 and the second tank 420 . However, the valve V2 does not have to be provided to branch off from the drain passage DR1, and may be provided in a place in the drain passage DR1 where the downstream of the valve V1 (more specifically, inside the second tank 420 ) becomes atmospheric pressure. For example, a pipe may be connected to the top surface of the second tank 420, and the valve V2 may be provided in this pipe.

<4-5> 又,依據上述實施形態的切斷裝置1中,當在第一槽410中的水面的高度成為規定高度以上時,發出警告音。然而,當在第一槽410中的水面的高度成為規定高度以上時,不一定要發出警告音。例如,當在第一槽410中的水面的高度成為規定高度以上時,也可以使切斷裝置1強制停止。藉此,能夠抑制在第一槽410中的水溢出的事態的發生。 <4-5> In addition, in the cutting device 1 according to the above-mentioned embodiment, when the height of the water surface in the first tank 410 becomes higher than or equal to a predetermined height, a warning sound is emitted. However, when the height of the water surface in the first tank 410 becomes higher than or equal to a predetermined height, it is not necessary to generate a warning sound. For example, the cutting device 1 may be forcibly stopped when the height of the water surface in the first tank 410 becomes higher than or equal to a predetermined height. Thereby, it is possible to suppress the occurrence of a situation where the water in the first tank 410 overflows.

<4-6> 又,上述實施形態中,在第8圖的步驟S100中,判定由第一洗淨器5e進行的清潔(洗淨)是否完成。然而,也可以在第8圖的步驟S100中,判定由第一洗淨器5e進行的乾燥是否完成。接著,當判定乾燥完成時,則使第一水分離排出機構41自第二狀態變更為第一狀態。又,也可以在第8圖的步驟S120中,判定由第二洗淨器7a進行的乾燥是否完成。接著,當判定乾燥完成時,則使第一水分離排出機構41自第一狀態變更為第二狀態。又,在第9圖的步驟S220中,判定由第一洗淨器5e對電子零件S1的焊球/導線面的清潔(洗淨)是否完成。然而,也可以在第9圖的步驟S220中,判定由第一洗淨器5e進行的乾燥是否完成。接著,當判定乾燥完成時,也可以使第一水分離排出機構41自第一狀態變更為第二狀態。 <4-6> In addition, in the above-mentioned embodiment, in step S100 of FIG. 8, it is determined whether or not the cleaning (washing) by the first washer 5e is completed. However, in step S100 of FIG. 8, it may be determined whether or not the drying by the first washer 5e is completed. Next, when it is determined that the drying is completed, the first water separation and discharge mechanism 41 is changed from the second state to the first state. In addition, in step S120 of FIG. 8, it may be determined whether or not the drying by the second washer 7a is completed. Next, when it is determined that the drying is completed, the first water separation and discharge mechanism 41 is changed from the first state to the second state. In addition, in step S220 of FIG. 9, it is determined whether the cleaning (cleaning) of the solder ball/lead surface of the electronic component S1 by the first cleaner 5e is completed. However, in step S220 of FIG. 9, it may be determined whether or not the drying by the first washer 5e is completed. Next, when it is determined that the drying is completed, the first water separation and discharge mechanism 41 may be changed from the first state to the second state.

<4-7> 又,依據上述實施形態的切斷裝置1中,當要切換各水分離排出機構所包含的閥門V1,V2的狀態時,是同時地切換閥門V1,V2的狀態。然而,閥門V1,V2的狀態,也可以不一定要同時地切換。例如,當將各水分離排出機構的狀態自第一狀態切換成第二狀態時,也可以將閥門V1自打開狀態切換成關閉狀態,其後將閥門V2自關閉狀態切換成打開狀態。又,例如,當將各水分離排出機構的狀態自第二狀態切換成第一狀態時,也可以將閥門V2自打開狀態切換成關閉狀態,其後將閥門V1自關閉狀態切換成打開狀態。 <4-7> Furthermore, in the shutoff device 1 according to the above-mentioned embodiment, when the state of the valves V1 and V2 included in each water separation and discharge mechanism is to be switched, the states of the valves V1 and V2 are simultaneously switched. However, the states of the valves V1 and V2 may not necessarily be switched simultaneously. For example, when the state of each water separation and discharge mechanism is switched from the first state to the second state, the valve V1 can also be switched from the open state to the closed state, and then the valve V2 can be switched from the closed state to the open state. Also, for example, when the state of each water separation and discharge mechanism is switched from the second state to the first state, the valve V2 may be switched from the open state to the closed state, and then the valve V1 may be switched from the closed state to the open state.

以上,例示說明了本發明的實施形態。亦即,為了例示說明,揭露了詳細說明和附加圖式。因此,在記載於詳細說明和附加圖式之構成要素中,會包含有對解決問題為非必要的構成要素。所以,雖然在詳細說明和附加圖式之構成要素中記載了這些非必要的構成要素,也不應該將這些非必要的構成要素,直接地認定為是必要的。As mentioned above, the embodiment of this invention was illustrated and described. That is, the detailed description and the attached drawings are disclosed for the purpose of illustration. Therefore, among the constituent elements described in the detailed description and the attached drawings, constituent elements not necessary for solving the problem may be included. Therefore, although these unnecessary constituent elements are described in the constituent elements of the detailed description and attached drawings, these unnecessary constituent elements should not be directly regarded as essential.

又,上述實施形態,在各種觀點中僅是本發明的例示。上述實施形態,在本發明的範圍中可進行各種改良和變更。對本發明的實施,能夠對應於實施形態來適當地採用具體構成。In addition, the above-mentioned embodiments are merely illustrations of the present invention from various viewpoints. Various improvements and changes can be made to the above-described embodiments within the scope of the present invention. For implementation of the present invention, specific configurations can be appropriately adopted in accordance with the embodiments.

1:切斷裝置 3:基板供給部 4:定位部 4a:軌道部 5:切斷台 5a:保持構件 5b:旋轉機構 5c:移動機構 5d:第一位置確認相機 5e:第一洗淨器 6:芯軸部 6a:刀刃 6b:第二位置確認相機 6c:旋轉軸 7:搬送部 7a:第二洗淨器 11:檢查台 12:第一光學檢查相機 13:第二光學檢查相機 14:配置部 15:選取部 15a:良品用托盤 15b:不良品用托盤 20:監視器 25:聲音輸出部 41,41A:第一水分離排出機構 42:第二水分離排出機構 43:第三水分離排出機構 50:電腦 70:控制部 72:CPU 74:RAM 76:ROM 80:記憶部 81:控制程式 90:輸入輸出I/F 95:受理部 410:第一槽 411:第一槽本體 412,413,414:連接口 415:分隔板 420:第二槽 430:液面位準感測器 A1:切斷模組 B1:檢查和收納模組 D1,D2,D3:真空泵 DR1:排水通道 M1:卡匣 P1:封裝基板 S1:電子零件 V1,V2,V3:閥門 VA:三方閥 VR1,VR3,VR3:吸引通道 W1:熔接部 Z1,Z2,Z3,Z4:範圍 1: cutting device 3: Substrate supply part 4: Positioning Department 4a: track part 5: Cutting table 5a: Holding member 5b: Rotary mechanism 5c: Mobile Mechanism 5d: First position confirmation camera 5e: First Scrubber 6: mandrel part 6a: blade 6b:Second position confirmation camera 6c: axis of rotation 7:Transportation department 7a: Second scrubber 11: Examination table 12: The first optical inspection camera 13: Second optical inspection camera 14:Configuration Department 15: selection part 15a: Trays for good products 15b: Tray for defective products 20: Monitor 25: Sound output unit 41, 41A: the first water separation and discharge mechanism 42: The second water separation and discharge mechanism 43: The third water separation and discharge mechanism 50: computer 70: Control Department 72:CPU 74: RAM 76:ROM 80: memory department 81: Control program 90: Input and output I/F 95: Reception Department 410: first slot 411: The first slot body 412, 413, 414: connection ports 415: Partition board 420: second slot 430: liquid level sensor A1: cut off module B1: Inspection and storage module D1, D2, D3: vacuum pump DR1: drainage channel M1: Cassette P1: Package substrate S1: Electronic parts V1, V2, V3: valves VA: three-way valve VR1, VR3, VR3: attraction channel W1: welding part Z1,Z2,Z3,Z4: range

第1圖是示意地表示切斷裝置的平面圖。 第2圖是示意地表示在第一狀態的第一水分離排出機構的圖。 第3圖是示意地表示在第二狀態的第一水分離排出機構的圖。 第4圖是示意地表示第一槽的平面的圖。 第5圖是示意地表示沿著第4圖的V-V剖面的圖。 第6圖是示意地表示沿著第4圖的VI-VI剖面的圖。 第7圖是示意地表示電腦的硬體構成的圖。 第8圖是表示第一水分離排出機構中的排水程序的一例的流程圖。 第9圖是表示第二水分離排出機構中的排水程序的一例的流程圖。 第10圖是表示第一水分離排出機構中的排水不順時的動作程序的一例的流程圖。 第11圖是示意地表示在第一狀態的第一水分離排出機構的其他例的圖。 第12圖是示意地表示在第二狀態的第一水分離排出機構的其他例的圖。 Fig. 1 is a plan view schematically showing a cutting device. Fig. 2 is a diagram schematically showing the first water separation and discharge mechanism in the first state. Fig. 3 is a diagram schematically showing the first water separation and discharge mechanism in the second state. Fig. 4 is a diagram schematically showing the plane of the first groove. Fig. 5 is a diagram schematically showing a V-V cross section in Fig. 4 . Fig. 6 is a diagram schematically showing a section along VI-VI in Fig. 4 . Fig. 7 is a diagram schematically showing the hardware configuration of a computer. Fig. 8 is a flowchart showing an example of a drainage routine in the first water separation and discharge mechanism. Fig. 9 is a flowchart showing an example of a drainage routine in the second water separation and discharge mechanism. Fig. 10 is a flowchart showing an example of an operation program when drainage is not smooth in the first water separation and discharge mechanism. Fig. 11 is a diagram schematically showing another example of the first water separation and discharge mechanism in the first state. Fig. 12 is a diagram schematically showing another example of the first water separation and discharge mechanism in the second state.

國內寄存資訊 (請依寄存機構、日期、號碼順序註記) 無 Domestic deposit information (please note in order of depositor, date, and number) none

國外寄存資訊 (請依寄存國家、機構、日期、號碼順序註記) 無 Overseas storage information (please note in order of storage country, organization, date, and number) none

1:切斷裝置 1: cutting device

3:基板供給部 3: Substrate supply part

4:定位部 4: Positioning Department

4a:軌道部 4a: track part

5:切斷台 5: Cutting table

5a:保持構件 5a: Holding member

5b:旋轉機構 5b: Rotary mechanism

5c:移動機構 5c: Mobile Mechanism

5d:第一位置確認相機 5d: First position confirmation camera

5e:第一洗淨器 5e: First Scrubber

6:芯軸部 6: mandrel part

6a:刀刃 6a: blade

6b:第二位置確認相機 6b:Second position confirmation camera

6c:旋轉軸 6c: axis of rotation

7:搬送部 7:Transportation department

7a:第二洗淨器 7a: Second scrubber

11:檢查台 11: Examination table

12:第一光學檢查相機 12: The first optical inspection camera

13:第二光學檢查相機 13: Second optical inspection camera

14:配置部 14:Configuration department

15:選取部 15: selection part

15a:良品用托盤 15a: Trays for good products

15b:不良品用托盤 15b: Tray for defective products

20:監視器 20: Monitor

25:聲音輸出部 25: Sound output unit

41:第一水分離排出機構 41: The first water separation and discharge mechanism

42:第二水分離排出機構 42: The second water separation and discharge mechanism

43:第三水分離排出機構 43: The third water separation and discharge mechanism

50:電腦 50: computer

A1:切斷模組 A1: cut off module

B1:檢查和收納模組 B1: Inspection and storage module

D1,D2,D3:真空泵 D1, D2, D3: vacuum pump

M1:卡匣 M1: Cassette

VR1,VR3,VR3:吸引通道 VR1, VR3, VR3: attraction channel

Claims (6)

一種切斷裝置,具備: 台,藉由吸附切斷對象物來保持前述切斷對象物; 切斷機構,藉由切斷在前述台上的前述切斷對象物來將前述切斷對象物加以個片化;及 保持機構,藉由吸附個片化了的前述切斷對象物來保持前述切斷對象物; 前述台或前述保持機構,通過吸引通道來連接於乾式真空泵; 該切斷裝置,進一步具備水分離排出機構,位在前述吸引通道上,並通過排水通道來將水排出; 前述水分離排出機構,包含第一槽、及位於前述排水通道中的比前述第一槽更下游的位置的第二槽; 前述第一槽,包含分隔板,以分隔與前述真空泵的連接口的所在區域、及與前述台或前述保持機構的連接口的所在區域; 在前述第一槽中,在前述分隔板的上方形成有間隙; 前述水分離排出機構,進一步包含閥門機構,該閥門機構可改變成第一狀態及第二狀態,該第一狀態會將自前述第一槽流入了前述第二槽的水儲藏在前述第二槽,該第二狀態會將儲藏在前述第一槽和儲藏在前述第二槽的水排出。 A cutting device comprising: a table for holding the cutting target object by absorbing the cutting target object; a cutting mechanism that separates the object to be cut into pieces by cutting the object to be cut on the table; and a holding mechanism for holding the object to be cut by absorbing the object to be cut into pieces; The aforementioned table or the aforementioned holding mechanism is connected to a dry vacuum pump through a suction channel; The cutting device is further equipped with a water separation and discharge mechanism, which is located on the aforementioned suction channel and discharges water through the drainage channel; The water separation and discharge mechanism includes a first tank and a second tank located downstream of the first tank in the drainage channel; The aforementioned first tank includes a partition plate to separate the area where the connection port with the aforementioned vacuum pump is located and the area where the connection port with the aforementioned platform or the aforementioned holding mechanism is located; In the first groove, a gap is formed above the partition plate; The water separation and discharge mechanism further includes a valve mechanism that can be changed into a first state and a second state. The first state stores the water that has flowed from the first tank into the second tank in the second tank. , the second state will discharge the water stored in the first tank and the second tank. 如請求項1所述之切斷裝置,進一步具備控制部,每當1片前述切斷對象物的處理完成,則該控制部控制前述閥門機構自前述第一狀態改變成前述第二狀態; 前述控制部,在前述切斷對象物吸附於前述台或前述保持機構的狀態下使用水來對前述切斷對象物實行最後處理之後,控制前述閥門機構自前述第一狀態改變成前述第二狀態。 The cutting device according to claim 1, further comprising a control unit, the control unit controls the valve mechanism to change from the first state to the second state every time the processing of one piece of the object to be cut is completed; The control unit controls the valve mechanism to change from the first state to the second state after the object to be cut is subjected to final treatment with water in a state in which the object to be cut is adsorbed on the table or the holding mechanism. . 如請求項2所述之切斷裝置,其中,前述吸引通道,連接前述保持機構和前述真空泵; 前述控制部,在前述切斷對象物保持在前述保持機構的狀態下,使用水來對前述切斷對象物的與切斷面相反的一面進行的清潔完成之後,控制前述閥門機構自前述第一狀態改變成前述第二狀態。 The cutting device according to claim 2, wherein the suction channel is connected to the holding mechanism and the vacuum pump; The control unit controls the valve mechanism from the first to the first position after cleaning the object to be cut with water on the surface opposite to the cut surface while the object to be cut is held by the holding mechanism. The state changes to the aforementioned second state. 如請求項2所述之切斷裝置,其中,前述吸引通道,連接前述台和前述真空泵; 前述控制部,在前述切斷對象物保持在前述台的狀態下,使用水來對前述切斷對象物的切斷面進行的清潔完成之後,控制前述閥門機構自前述第一狀態改變成前述第二狀態。 The cutting device according to claim 2, wherein the suction channel is connected to the table and the vacuum pump; The control unit controls the valve mechanism to change from the first state to the second state after cleaning the cut surface of the object to be cut with water while the object to be cut is held on the table. Two states. 如請求項1至4中任一項所述之切斷裝置,其中,前述閥門機構,包含在前述排水通道中位於比前述第二槽更下游的排水用閥門; 前述排水用閥門是逆止閥。 The shutoff device according to any one of claims 1 to 4, wherein the valve mechanism includes a valve for draining in the drain passage located downstream of the second tank; The aforementioned drain valve is a check valve. 一種切斷品的製造方法,使用請求項1至5中任一項所述之切斷裝置; 該製造方法,包含由前述切斷機構來切斷在前述台上的前述切斷對象物,藉此將前述切斷對象物加以個片化,以製造前述切斷品之步驟。 A method of manufacturing a cut product, using the cutting device described in any one of Claims 1 to 5; This manufacturing method includes the step of cutting the object to be cut on the table by the cutting mechanism, whereby the object to be cut is divided into pieces to manufacture the cut product.
TW111143339A 2021-12-14 2022-11-14 Cutting device, and method for manufacturing cut product TW202324518A (en)

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