TW202314642A - 塵埃測量裝置、塵埃測量方法及程式 - Google Patents

塵埃測量裝置、塵埃測量方法及程式 Download PDF

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Publication number
TW202314642A
TW202314642A TW111130929A TW111130929A TW202314642A TW 202314642 A TW202314642 A TW 202314642A TW 111130929 A TW111130929 A TW 111130929A TW 111130929 A TW111130929 A TW 111130929A TW 202314642 A TW202314642 A TW 202314642A
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Taiwan
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TW111130929A
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Chinese (zh)
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大柿聡
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日商Agc股份有限公司
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/06Investigating concentration of particle suspensions

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  • Chemical & Material Sciences (AREA)
  • Dispersion Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
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  • Pathology (AREA)
  • Sampling And Sample Adjustment (AREA)
  • Studio Devices (AREA)
TW111130929A 2021-08-18 2022-08-17 塵埃測量裝置、塵埃測量方法及程式 TW202314642A (zh)

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JP2021-133344 2021-08-18
JP2021133344 2021-08-18

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TW202314642A true TW202314642A (zh) 2023-04-01

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JP (1) JPWO2023022117A1 (https=)
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WO (1) WO2023022117A1 (https=)

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0637750U (ja) * 1992-10-21 1994-05-20 日新製鋼株式会社 粉塵分布計測装置
JP3605579B2 (ja) * 2001-06-29 2004-12-22 インターナショナル・ビジネス・マシーンズ・コーポレーション クリーンルーム用の塵埃検出装置、塵埃検出システム、微粒子測定器および塵埃検出方法
JP2003075353A (ja) * 2001-09-03 2003-03-12 Moritex Corp ダストカウンタとその部品
CN201724881U (zh) * 2010-06-08 2011-01-26 王旗 煮糖罐晶粒形态在线监测装置
JP2014048100A (ja) * 2012-08-30 2014-03-17 Sharp Corp 粒子検出装置
JP2015190958A (ja) * 2014-03-28 2015-11-02 大日本印刷株式会社 異物測定方法及び異物測定装置
JP6486643B2 (ja) * 2014-10-16 2019-03-20 国立大学法人電気通信大学 粉粒体の流量計測方法とそのプログラム
CN110383038B (zh) * 2016-10-21 2022-09-23 第一前沿有限公司 用于对空气样本进行自动分析的系统和方法
JP6549747B2 (ja) * 2017-04-14 2019-07-24 リオン株式会社 粒子測定装置および粒子測定方法
US12326391B2 (en) * 2019-07-29 2025-06-10 Hitachi High-Tech Corporation Particle quantifying device

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JPWO2023022117A1 (https=) 2023-02-23

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