TW202311406A - Joined body manufacturing method, semiconductor device manufacturing method, and resin composition - Google Patents

Joined body manufacturing method, semiconductor device manufacturing method, and resin composition Download PDF

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TW202311406A
TW202311406A TW111115992A TW111115992A TW202311406A TW 202311406 A TW202311406 A TW 202311406A TW 111115992 A TW111115992 A TW 111115992A TW 111115992 A TW111115992 A TW 111115992A TW 202311406 A TW202311406 A TW 202311406A
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中村敦
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日商富士軟片股份有限公司
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    • H—ELECTRICITY
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    • H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L24/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
    • H01L24/31—Structure, shape, material or disposition of the layer connectors after the connecting process
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    • C08K3/00—Use of inorganic substances as compounding ingredients
    • C08K3/01—Use of inorganic substances as compounding ingredients characterized by their specific function
    • C08K3/013—Fillers, pigments or reinforcing additives
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Abstract

Provided are: a joined body manufacturing method including a step for preparing a substrate A having a surface with projection parts and a substrate B having a wiring terminal, a step for forming a filler-containing layer which includes a binder and a filler on the surface of the substrate A with the projection parts, a step for planarizing the filler-containing layer together with the projection parts and exposing at least a portion of the projection parts from the filler-containing layer, and thereby obtaining a laminate, and a step for joining the surface of the laminate having the filler-containing layer and at least a portion of the wiring terminal of the substrate B; a method for manufacturing a semiconductor device comprising the joined body obtained by the manufacturing method; and a resin composition for use in the manufacturing method.

Description

接合體之製造方法、半導體器件之製造方法及樹脂組成物Method for manufacturing junction, method for manufacturing semiconductor device, and resin composition

本發明有關一種接合體之製造方法、半導體器件之製造方法及樹脂組成物。The present invention relates to a manufacturing method of a bonding body, a manufacturing method of a semiconductor device and a resin composition.

行動電話或平板電腦型終端等電子設備逐漸小型化，另一方面其功能逐漸多樣化。為了應對該需求，對組裝到電子設備之電子電路要求進一步小型化·高積體化·高密度安裝。作為實現多功能且維持高性能和可靠性並且小型化的技術，SIP（System in Package：封裝體系）、MCM（Multi Chip Module：多晶片模組）、POP（Package on Package：封裝堆疊）等安裝技術受到關注。依據該等技術，能夠減少零件數量並簡化半導體製造步驟，因此從降低電子設備成本的觀點考慮亦可期待。While electronic devices such as mobile phones and tablet-type terminals are becoming smaller in size, their functions are becoming more diversified. In order to meet this demand, further miniaturization, high volume, and high-density mounting are required for electronic circuits incorporated in electronic equipment. As a technology to achieve multi-function while maintaining high performance and reliability and miniaturization, SIP (System in Package: packaging system), MCM (Multi Chip Module: multi-chip module), POP (Package on Package: package stacking) and other mounting Technology gets attention. According to these techniques, the number of parts can be reduced and the semiconductor manufacturing steps can be simplified, so it is also expected from the viewpoint of reducing the cost of electronic equipment.

其中，在SIP中藉由銲線將各晶片之間進行連接，因此難以獲得與以往的SOC（System on Chip：系統晶片）相同的處理速度。又，在製造步驟中藉由銲線的連接亦係複雜者，希望亦對產品成本或產品質量進行改善。作為與這種問題對應者，已開發COC（Chip on Chip：晶片上晶片）的安裝技術。在COC中，由於能夠藉由倒裝晶片接合來連接晶片之間並縮短傳輸距離，因此能夠獲得與SOC相同的速度性能。圖1係表示通常的COC的結構的剖面圖。該例子中的COC係藉由具備子芯片（第1基板）1及母芯片（第2基板）2而成。在母芯片2上形成電子電路（未圖示）及倒裝晶片電極（未圖示），子芯片1經由焊錫電極（凸塊）93來支撐並連接。焊錫電極93的周圍被底部填充劑94填充以確保絕緣性。母芯片2藉由黏合膜91接著於底板98而維持絕緣性地的同時進行搭載。該電連接經由銲線盤97b、銲線96及基板電極97a來進行。這種COC結構被密封樹脂95密封而構成半導體器件90。該半導體器件90中設置有焊球99，並經由該焊球組裝到電子設備中。又，研究了有關進一步應用該倒裝晶片安裝的技術，並且使用了TSV（Through silicon via：矽穿孔）之三維安裝之技術及其材料（非專利文獻1）。Among them, in SIP, each chip is connected by bonding wire, so it is difficult to obtain the same processing speed as the conventional SOC (System on Chip: system chip). In addition, the connection by wire bonding in the manufacturing process is also complicated, and it is desired to improve product cost and product quality. As a response to such a problem, COC (Chip on Chip: chip on chip) mounting technology has been developed. In COC, since chips can be connected by flip-chip bonding and the transmission distance can be shortened, it is possible to obtain the same speed performance as SOC. FIG. 1 is a cross-sectional view showing the structure of a general COC. The COC in this example is formed by including a daughter chip (first substrate) 1 and a mother chip (second substrate) 2 . An electronic circuit (not shown) and flip-chip electrodes (not shown) are formed on the mother chip 2 , and the daughter chip 1 is supported and connected via solder electrodes (bumps) 93 . The periphery of the solder electrode 93 is filled with an underfill 94 to ensure insulation. The mother chip 2 is mounted on the base plate 98 with the adhesive film 91 maintained while maintaining the insulating ground. This electrical connection is made via the bonding pad 97b, the bonding wire 96, and the substrate electrode 97a. Such a COC structure is sealed with a sealing resin 95 to constitute a semiconductor device 90 . Solder balls 99 are disposed in the semiconductor device 90 and assembled into electronic equipment via the solder balls. In addition, the technology for further applying the flip-chip mounting was studied, and the technology and materials for three-dimensional mounting using TSV (Through silicon via) were studied (Non-Patent Document 1).

[非專利文獻1]Using Permanent and Temporary Polyimide Adhesives in 3D-TSV Processing to Avoid Thin Wafer Handling（Journal of Microelectronics and Electronic Packaging （2010） 7, pp.214-219[Non-Patent Document 1] Using Permanent and Temporary Polyimide Adhesives in 3D-TSV Processing to Avoid Thin Wafer Handling (Journal of Microelectronics and Electronic Packaging (2010) 7, pp.214-219

在如上述圖1那樣的結構的COC結構的元件中，在用焊錫凸塊93連接並固定子芯片1和母芯片2之後，在其間隙中填充底部填充劑94。故，在構成底部填充劑之材料中採用具有流動性之樹脂，在填充於焊錫凸塊間之後，藉由硬化而成形。然而，在COC的周圍具有銲線盤97b等構件，在全然不污染該等表面之狀態下填充底部填充劑並不容易。另外，隨著電路的高積體化，焊錫凸塊逐漸窄間距化。變得難以在其間可靠地填充底部填充劑。 又，這種底部填充劑僅用於減輕物理損失等以提高連接的可靠性。 在此，從抑制所搭載之半導體等元件的異常動作、抑制性能的降低及延長壽命等觀點考慮，在電子設備中將由電子電路等產生之熱量進行散熱是非常重要的。亦即，在以往使用之底部填充劑中，關於基於底部填充劑的散熱性能的提高，具有進一步研究之空間。 In the COC device having the structure shown in FIG. 1 , after the daughter chip 1 and the mother chip 2 are connected and fixed by solder bumps 93 , an underfill 94 is filled in the gap. Therefore, a fluid resin is used as a material constituting the underfill, and after being filled between the solder bumps, it is formed by hardening. However, there are components such as the bonding pad 97b around the COC, and it is not easy to fill the underfill without contaminating the surface at all. In addition, as circuits become more integrated, the pitch of solder bumps becomes narrower. It becomes difficult to reliably fill the underfill therebetween. Also, this underfill is only used to alleviate physical loss and the like to improve connection reliability. Here, it is very important to dissipate heat generated by electronic circuits and the like in electronic equipment from the viewpoint of suppressing abnormal operation of components such as semiconductors mounted thereon, suppressing performance degradation, and prolonging life. That is, among the underfills used in the past, there is room for further research on the improvement of the heat dissipation performance by the underfill.

因此，本發明的目的為提供一種具備導熱性優異之含填充劑層之接合體之製造方法、具備藉由上述製造方法而獲得之接合體之半導體器件之製造方法及在上述製造方法中所使用之樹脂組成物。Therefore, an object of the present invention is to provide a method of manufacturing a junction body having a filler-containing layer excellent in thermal conductivity, a method of manufacturing a semiconductor device having a junction body obtained by the above manufacturing method, and a method for use in the above manufacturing method. resin composition.

以下，示出本發明的具體態樣的例子。 ＜1＞一種接合體之製造方法，其包括： 準備具備具有凸部之面之基板A，及具有配線端子之基板B之步驟； 在上述基板A的具有上述凸部之面上，形成包含黏合劑及填充劑之含填充劑層之步驟； 將上述含填充劑層與上述凸部一起進行平坦化來使上述凸部中的至少一部分從上述含填充劑層露出而獲得積層體之步驟；及 上述積層體的具有含填充劑層之面與上述基板B所具有之上述配線端子的至少一部分接合之步驟。 ＜2＞如＜1＞所述之接合體之製造方法，其中， 形成上述含填充劑層之步驟係包括如下步驟：將包含選自包括黏合劑及黏合劑的前驅物之群組中的至少一種樹脂和填充劑之樹脂組成物適用於前述基板A的具有上述凸部之面上。 ＜3＞如＜2＞所述之接合體之製造方法，其中，形成上述含填充劑層之步驟包括在上述適用後以150～300℃的溫度加熱組成物。 ＜4＞如＜2＞或＜3＞所述之接合體之製造方法，其中，上述樹脂組成物包含選自包括環化樹脂及其前驅物之群組中的至少一種樹脂作為上述樹脂。 ＜5＞如＜1＞至＜4＞之任一項所述之接合體之製造方法，其中，上述積層體中的含填充劑層的TTV係10μm以下，上述TTV係指，從含填充劑層的邊緣部向1mm以上的內側的區域分割為2mm見方的分區，測量每個分區中的一個表面與另一個表面之間的最大厚度（T1）和一個表面與另一個表面之間的最小厚度（T2），按每個分區算出膜厚差（T1-T2），在各分區按膜厚差（T1-T2）從大到小的順序設置排序，將從最上位分區按膜厚差從大到小的順序的相當於總分區數的10%的個數的分區組及從最低位分區按膜厚差從小到大的順序的相當於總分區數的10%的個數的分區組除外，剩餘的分區組的各膜厚差（T1-T2）的算術平均值。 ＜6＞如＜1＞至＜5＞之任一項所述之接合體之製造方法，其中，上述凸部包含金屬。 ＜7＞如＜6＞所述之接合體之製造方法，其中，上述金屬包含選自包括銅、錫及鎳之群組中的至少一種金屬。 ＜8＞如＜1＞至＜7＞之任一項所述之接合體之製造方法，其中，上述凸部係藉由至少含有包含銅之層及包含錫之層而成之凸部。 ＜9＞如＜1＞至＜8＞之任一項所述之接合體之製造方法，其中，上述含填充劑層中所包含之上述黏合劑係絕緣性黏合劑。 ＜10＞如＜1＞至＜9＞之任一項所述之接合體之製造方法，其中，上述含填充劑層中所包含之上述黏合劑包含選自包括乙烯基、丙烯酸基及甲基丙烯酸基之群組中的至少一種基團。 ＜11＞如＜1＞至＜10＞之任一項所述之接合體之製造方法，其中，上述填充劑包含選自包括氮化硼、氮化鋁、氮化矽、氧化鋁、氧化鎂、氧化鋅及氧化鈹之群組中的至少一種。 ＜12＞如＜1＞至＜11＞之任一項所述之接合體之製造方法，其中，上述填充劑的體積電阻率係1.0X10 11Ω·cm以上。 ＜13＞如＜1＞至＜12＞之任一項所述之接合體之製造方法，其中，上述填充劑的平均粒徑係10μm以下，上述平均粒徑係相對各粒子的表觀輪廓的最小包含圓的直徑的平均值。 ＜14＞如＜1＞至＜13＞之任一項所述之接合體之製造方法，其中，獲得上述積層體之步驟中的上述平坦化藉由切割來進行。 ＜15＞如＜1＞至＜14＞之任一項所述之接合體之製造方法，其中，上述接合步驟中的接合溫度係300℃以下。 ＜16＞如＜1＞至＜15＞之任一項所述之接合體之製造方法，其中，所獲得之接合體中的含填充劑層的熱擴散率係2.0×10 -7m 2s -1以上。 ＜17＞一種半導體器件之製造方法，其係具備藉由＜1＞至＜16＞之任一項所述之接合體之製造方法而獲得之接合體。 ＜18＞一種樹脂組成物，其使用＜1＞至＜16＞之任一項所述之接合體之製造方法中的上述含填充劑層的形成。 [發明效果] Examples of specific aspects of the present invention are shown below. <1> A method of manufacturing a bonded body, comprising: a step of preparing a substrate A having a surface having protrusions, and a substrate B having wiring terminals; A step of a filler-containing layer of an agent and a filler; a step of flattening the filler-containing layer together with the protrusions to expose at least a part of the protrusions from the filler-containing layer to obtain a laminate; and A step of bonding the surface of the laminate having the filler-containing layer to at least a part of the wiring terminals of the substrate B. <2> The method for producing a bonded body according to <1>, wherein the step of forming the filler-containing layer includes the step of adding at least one compound selected from the group consisting of binders and binder precursors. A resin composition of a resin and a filler is suitable for use on the surface of the aforementioned substrate A having the aforementioned protrusions. <3> The method for producing a bonded body according to <2>, wherein the step of forming the filler-containing layer includes heating the composition at a temperature of 150 to 300° C. after the above application. <4> The method for producing a bonded body according to <2> or <3>, wherein the resin composition contains, as the resin, at least one resin selected from the group consisting of cyclized resins and their precursors. <5> The method for producing a bonded body according to any one of <1> to <4>, wherein the TTV of the filler-containing layer in the laminate is 10 μm or less, and the TTV refers to the filler-containing layer The edge of the layer is divided into 2mm square partitions in the area more than 1mm inward, and the maximum thickness (T1) between one surface and the other surface and the minimum thickness between one surface and the other surface in each partition are measured. (T2), calculate the film thickness difference (T1-T2) according to each partition, set the sorting order in each partition according to the order of film thickness difference (T1-T2) from large to small. Except for the number of subdivision groups corresponding to 10% of the total number of subdivisions in the order of smallest and the number of subdivision groups equivalent to 10% of the total number of subdivisions in the order of film thickness difference from the lowest subdivision to the largest, The arithmetic mean value of each film thickness difference (T1-T2) of the remaining partition groups. <6> The method for producing a bonded body according to any one of <1> to <5>, wherein the protrusions include metal. <7> The method for producing a bonded body according to <6>, wherein the metal includes at least one metal selected from the group consisting of copper, tin, and nickel. <8> The method for producing a bonded body according to any one of <1> to <7>, wherein the protrusion is a protrusion formed by at least including a layer containing copper and a layer containing tin. <9> The method for producing a bonded body according to any one of <1> to <8>, wherein the binder contained in the filler-containing layer is an insulating binder. <10> The method for producing a bonded body according to any one of <1> to <9>, wherein the binder contained in the filler-containing layer contains a compound selected from the group consisting of vinyl, acrylic and methyl. at least one group in the group of acrylic groups. <11> The method for producing a joined body according to any one of <1> to <10>, wherein the filler contains a material selected from the group consisting of boron nitride, aluminum nitride, silicon nitride, aluminum oxide, and magnesium oxide. , at least one of the group of zinc oxide and beryllium oxide. <12> The method for producing a bonded body according to any one of <1> to <11>, wherein the filler has a volume resistivity of 1.0×10 11 Ω·cm or more. <13> The method for producing a bonded body according to any one of <1> to <12>, wherein the filler has an average particle diameter of 10 μm or less, and the average particle diameter is the average particle diameter relative to the apparent profile of each particle. Average of the diameters of the smallest containing circles. <14> The method for producing a bonded body according to any one of <1> to <13>, wherein the flattening in the step of obtaining the laminate is performed by dicing. <15> The method for producing a joined body according to any one of <1> to <14>, wherein the joining temperature in the joining step is 300° C. or lower. <16> The method for producing a joined body according to any one of <1> to <15>, wherein the thermal diffusivity of the filler-containing layer in the obtained joined body is 2.0×10 -7 m 2 s -1 or more. <17> A method of manufacturing a semiconductor device comprising a junction body obtained by the method for manufacturing a junction body according to any one of <1> to <16>. <18> A resin composition using the formation of the filler-containing layer in the method for producing a bonded body according to any one of <1> to <16>. [Invention effect]

依本發明，提供一種具備導熱性優異之含填充劑層之接合體之製造方法、具備藉由上述製造方法而獲得之接合體之半導體器件之製造方法及在上述製造方法中所使用之樹脂組成物。According to the present invention, there are provided a method of manufacturing a bonded body having a filler-containing layer excellent in thermal conductivity, a method of manufacturing a semiconductor device having a bonded body obtained by the above-mentioned manufacturing method, and a resin composition used in the above-mentioned manufacturing method. things.

以下，對本發明的內容進行詳細說明。 以下所記載之本發明中的構成要件的說明有時基於本發明的代表性實施形態來進行，但本發明並不限制於這種實施形態。 本說明書中的基團（原子團）的標記中，未標註經取代及未經取代之標記包含不具有取代基者及具有取代基者。例如，“烷基”係指，不僅包含不具有取代基之烷基（未經取代之烷基），而且還包含具有取代基之烷基（經取代之烷基）。 在本說明書中，所謂“曝光”，只要無特別說明，則不僅包括使用了光之曝光，使用了電子束、離子束等粒子束之描繪亦包括在曝光中。又，作為曝光中所使用之光，通常可以舉出以水銀燈的明線光譜、準分子雷射為代表之遠紫外線、極紫外線（EUV光）、X射線、電子束等光化射線或放射線。 在本說明書中，使用“～”表示之數值範圍係指包含記載於“～”的前後之數值作為下限值及上限值之範圍。 在本說明書中，“（甲基）丙烯酸酯”表示“丙烯酸酯”及“丙烯酸甲酯”兩者或任一者，“（甲基）丙烯酸”表示“丙烯酸”及“甲基丙烯酸”兩者或任一者，“（甲基）丙烯醯基”表示“丙烯醯基”及“甲基丙烯醯基”兩者或任一者。 在本說明書中，“步驟”這一詞不僅在獨立的步驟，即使在無法與其他步驟明確區別之情況下，只要實現該步驟的預期作用，則亦包含於本術語中。 在本說明書中，固體成分係除溶劑以外之其他成分相對於組成物的總質量的質量百分比。又，只要沒有特別說明，則固體成分濃度是指在25℃下的濃度。 只要沒有特別說明，則本發明中的溫度設為25℃。 在本說明書中，只要沒有特別說明，則重量平均分子量（Mw）及數量平均分子量（Mn）基於凝膠滲透層析法（GPC測量），被定義為聚苯乙烯換算值。在本說明書中，重量平均分子量（Mw）及數量平均分子量（Mn）例如能夠利用HLC-8220（TOSOH CO Ar PORATION製造），並使用保護管柱HZ-L、TSKgel Super HZM-M、TSKgel Super HZ4000、TSKgel Super HZ3000、TSKgel Super HZ2000（TOSOH CORPORATION製造）中的任一個作為管柱來求出。溶析液只要沒有特別說明，則設為使用THF（四氫呋喃）測量者。又，只要沒有特別說明，則檢測使用UV線（紫外線）的波長254nm檢測器。 Hereinafter, the content of the present invention will be described in detail. The description of the constituent requirements in the present invention described below may be based on representative embodiments of the present invention, but the present invention is not limited to such embodiments. In the notation of a group (atomic group) in this specification, the notation of substituted and unsubstituted includes those without a substituent and those with a substituent. For example, "alkyl" includes not only an alkyl group having no substituent (unsubstituted alkyl group) but also an alkyl group having a substituent (substituted alkyl group). In this specification, "exposure" includes not only exposure using light but also drawing using particle beams such as electron beams and ion beams, unless otherwise specified. In addition, light used for exposure generally includes bright line spectra of mercury lamps, extreme ultraviolet rays, extreme ultraviolet rays (EUV light), X-rays, electron beams, and other actinic rays or radiation represented by excimer lasers. In this specification, the numerical range represented using "-" means the range which includes the numerical value described before and after "-" as a lower limit and an upper limit. In this specification, "(meth)acrylate" means both "acrylate" and "methyl acrylate" or either one, and "(meth)acrylic acid" means both "acrylic acid" and "methacrylic acid". Or either, "(meth)acryl" means both or either of "acryl" and "methacryl". In this specification, the word "step" is not only used in an independent step, but also included in this term as long as the intended effect of the step is achieved even if it cannot be clearly distinguished from other steps. In this specification, the solid content is the percentage by mass of components other than the solvent relative to the total mass of the composition. Moreover, unless otherwise specified, the solid content concentration means the density|concentration at 25 degreeC. Unless otherwise specified, the temperature in the present invention is set to 25°C. In this specification, unless otherwise specified, weight average molecular weight (Mw) and number average molecular weight (Mn) are defined as values in terms of polystyrene based on gel permeation chromatography (GPC measurement). In this specification, the weight average molecular weight (Mw) and the number average molecular weight (Mn) can be HLC-8220 (manufactured by TOSOH CO Ar PORATION), for example, and guard columns HZ-L, TSKgel Super HZM-M, TSKgel Super HZ4000 can be used , TSKgel Super HZ3000, and TSKgel Super HZ2000 (manufactured by TOSOH CORPORATION) were used as a column to obtain the value. Unless otherwise specified, the eluate was measured using THF (tetrahydrofuran). In addition, unless otherwise specified, a detector with a wavelength of 254 nm of UV rays (ultraviolet rays) was used for detection.

（接合體之製造方法） 本發明的接合體之製造方法包括：準備具備具有凸部之面之基板A，及具有配線端子之基板B之步驟；在上述基板A的具有上述凸部之面上，形成包含黏合劑及填充劑之含填充劑層之步驟；將上述含填充劑層與上述凸部一起進行平坦化來使上述凸部中的至少一部分從於上述含填充劑層露出而獲得積層體之步驟；及上述積層體的具有含填充劑層之面與上述基板B所具有之上述配線端子的至少一部分接合之步驟。 (Manufacturing method of joint body) The manufacturing method of the bonded body of the present invention includes: the steps of preparing a substrate A having a surface having a convex portion, and a substrate B having wiring terminals; A step of forming a filler-containing layer; a step of flattening the filler-containing layer together with the protrusions to expose at least a part of the protrusions from the filler-containing layer to obtain a laminate; and the laminate A step of bonding the surface of the body having the filler-containing layer to at least a part of the wiring terminals of the substrate B.

在本發明中，能夠藉由使樹脂層含有填充劑以作為含填充劑層而形成熱擴散性優異之層。 又，認為亦可以藉由含有填充劑而獲得能夠降低含填充劑層的CTE（熱膨脹係數）且能夠使基板的CTE和含填充劑層的CTE靠近，並且抑制接合體的翹曲且抑制接合體的剝離等效果。 進而，以往研究了使用NCF（Non Conductive Film：非導電膜）之製程。具體而言，可以舉出藉由NCF將子芯片中的焊錫電極預先層壓，然後接合到母芯片。例如，係使子芯片（第1基板）抵接於母芯片（第2基板）上，然後進行加熱，使焊錫熔融而與母芯片（第2基板）側的電極連接，與此同時加熱並軟化接著膜以接著固定兩者之方法。然而，例如，在母芯片中電極高度具有偏差之情況下等，有時發生由NCF的流動不充分等而引起孔隙、子芯片與母芯片之間的接合不良等情況。 又，藉由微影步驟還進行去除柱子上的樹脂層，但存在步驟數量增加等問題。又，由於柱狀基板上的柱子等的凸部的高度並不相同，因此存在在凸部低的位置發生孔隙（或者需要用於填充孔隙的材料等，需要某種準備）等問題。 在本發明中，藉由平坦化能夠在某種程度上調齊凸部與樹脂層（含填充劑層）的高度之後進行接合。藉此，推測能夠製造難以剝離，並且孔隙的發生得到抑制之接合體。 以下，對本發明的接合體之製造方法中進行之各步驟進行說明。 In the present invention, a layer excellent in thermal diffusibility can be formed by making the resin layer contain a filler as a filler-containing layer. In addition, it is considered that the CTE (coefficient of thermal expansion) of the filler-containing layer can be reduced and the CTE of the substrate and the CTE of the filler-containing layer can be brought closer by containing the filler, and the warpage of the bonded body can be suppressed and the bonded body can be suppressed. peeling effect. Furthermore, conventionally, a process using NCF (Non Conductive Film: non-conductive film) has been studied. Specifically, the solder electrodes in the daughter chip are laminated in advance by NCF, and then bonded to the mother chip. For example, the daughter chip (first substrate) is brought into contact with the mother chip (second substrate) and then heated to melt the solder and connect to the electrodes on the mother chip (second substrate) side, while heating and softening Then the film is followed by the method of fixing the two. However, for example, when the electrode height varies in the mother chip, voids may occur due to insufficient NCF flow or the like, and poor bonding between the daughter chip and the mother chip may occur. In addition, the removal of the resin layer on the pillar is also carried out by a lithography step, but there are problems such as an increase in the number of steps. Also, since the heights of protrusions such as pillars on the columnar substrate are not the same, there is a problem that voids occur at positions where the protrusions are low (or a material for filling the voids is required, and some kind of preparation is required). In the present invention, the heights of the protrusions and the resin layer (filler-containing layer) can be adjusted to some extent by planarization before joining. Thereby, it is presumed that a bonded body that is difficult to peel off and whose generation of voids is suppressed can be manufactured. Hereinafter, each step performed in the manufacturing method of the bonded body of this invention is demonstrated.

＜準備步驟＞ 本發明的接合體之製造方法包括準備具備具有凸部之面之基板A及具有配線端子之基板B之步驟（準備步驟）。 在準備步驟中，可以製造基板A及基板B，亦可以藉由購入等方法來獲得。 ＜Preparation steps＞ The manufacturing method of the junction body of this invention includes the process (preparation process) of preparing the board|substrate A provided with the surface which has a convex part, and the board|substrate B provided with a wiring terminal. In the preparatory step, the substrate A and the substrate B may be manufactured, or may be obtained by purchasing or the like.

〔基板A〕 基板A具備具有凸部之面。 基板A的形狀並沒有特別限定，例如，可以舉出多邊形平板狀、圓盤狀、多面體狀等。 基板A的厚度係0.1～5mm為較佳，0.2～1mm為更佳。 基板A中的凸部係柱狀電極為較佳。 又，上述凸部包含金屬為較佳，包含選自包括錫（Sn）、金（Au）、銀（Ag）、銅（Cu）、鈀（Pd）、鉑（Pt）、鈷（Co）、鎳（Ni）、鋅（Zn）、釕（Ru）、銥（Ir）、銠（Rh）、鉛（Pb）、鉍（Bi）及銦（In）之群組中的至少一種金屬為更佳，包含選自包括銅、錫及鎳之群組中的至少一種金屬為更佳。在本說明書中，將包含金屬X或包含其金屬之合金中的至少一者統稱並簡單記載為“包含金屬X”。另外，合金可以包含除了在上述中例示以外的元素。例如，銅合金可以包含矽原子而形成卡遜合金。又，可以存在不可避免地溶解之氧或在析出時混合存在之原料化合物的有機殘基等。 上述凸部可以係包含複數個不同構件而成之凸部。 例如，在基板上具有用作由銅、銀、金或包含該等中的任一種或複數種合金等金屬構成之電極之部分（以下，亦稱為“電極”），在銅等的金屬層上形成有用作由鎳、錫、鉛或包含該等中的任一種或複數種之合金等金屬構成之焊錫之部分（以下，亦稱為“導通路”），電極和導通路可以串聯地存在而形成1個凸部。 在該等之中，上述凸部係藉由至少含有包含銅之層及包含錫之層而成之凸部為較佳。作為具有這種凸部之基板A的例子，可以舉出本申請的實施例中使用之基板b）的例子。在基板b）中，由銅構成之電極上形成有由錫構成之導通路。 〔Substrate A〕 The board|substrate A has the surface which has a convex part. The shape of the substrate A is not particularly limited, and examples thereof include a polygonal plate shape, a disk shape, and a polyhedron shape. The thickness of the substrate A is preferably 0.1-5 mm, more preferably 0.2-1 mm. It is preferable that the protrusions in the substrate A are columnar electrodes. In addition, it is preferable that the above-mentioned protrusions contain a metal selected from tin (Sn), gold (Au), silver (Ag), copper (Cu), palladium (Pd), platinum (Pt), cobalt (Co), At least one metal selected from the group of nickel (Ni), zinc (Zn), ruthenium (Ru), iridium (Ir), rhodium (Rh), lead (Pb), bismuth (Bi) and indium (In) is more preferable , comprising at least one metal selected from the group consisting of copper, tin and nickel is more preferable. In this specification, at least one of the alloys containing the metal X or the metal thereof is collectively referred to and simply described as "containing the metal X". In addition, the alloy may contain elements other than those exemplified above. For example, copper alloys can contain silicon atoms to form Carson alloys. In addition, unavoidable dissolved oxygen, organic residues of raw material compounds present in admixture at the time of precipitation, and the like may be present. The above-mentioned convex part may be a convex part including a plurality of different members. For example, on the substrate, there is a part (hereinafter also referred to as "electrode") used as an electrode composed of copper, silver, gold, or a metal containing any one or a plurality of alloys of these, and a metal layer such as copper A part (hereinafter, also referred to as "conduction path") is formed on which is used as a solder composed of nickel, tin, lead, or an alloy containing any one or a plurality of these, and the electrode and the conduction path may exist in series. Thus, one convex portion is formed. Among these, it is preferable that the above-mentioned convex part is a convex part containing at least a layer containing copper and a layer containing tin. As an example of the board|substrate A which has such a convex part, the example of the board|substrate b) used in the Example of this application is mentioned. In the substrate b), conductive paths made of tin are formed on electrodes made of copper.

又，電極中所使用之材料並沒有特別限定，可以舉出錫、金、銀、銅、鈀、鉑、鈷、鎳、鋅、釕、銥、銠或該等合金。其中，作為電極而包含銅之金屬、包含鋁之金屬、包含鎢之金屬、包含鎳之金屬或者包含金之金屬為較佳，包含銅之金屬為更佳，銅為進一步較佳。 作為電極中所使用之金屬，使用在接合步驟中亦不熔融之金屬為較佳。作為電極中所使用之金屬的熔點，500℃以上為較佳，700℃以上為更佳，800℃以上為進一步較佳。上限並沒有特別限定，例如，設為3000℃以下為較佳。 導通路中所使用之材料並沒有特別限定，可以舉出錫、鉛、銀、銅、鋅、鉍或銦、或者該等合金。其中，在本發明中，錫或錫合金（包含錫之金屬）的焊錫為較佳。進來，不使用鉛之無鉛焊錫的技術亦在進步，選擇這種材料亦較佳。 作為導通路中所使用之金屬，在接合步驟中熔融之金屬為較佳。銅通路中所使用之金屬的熔點係400℃以下為較佳，300℃以下為更佳，250℃以下為進一步較佳。關於上述熔點的下限，只要在室溫下係固體，則下限並沒有特別限定，例如，150℃以上為較佳。 凸部形成複數個為較佳。 Moreover, the material used for an electrode is not specifically limited, Tin, gold, silver, copper, palladium, platinum, cobalt, nickel, zinc, ruthenium, iridium, rhodium, or these alloys are mentioned. Among them, metals containing copper, metals containing aluminum, metals containing tungsten, metals containing nickel, or metals containing gold are preferable as electrodes, metals containing copper are more preferable, and copper is still more preferable. As the metal used for the electrodes, it is preferable to use a metal that does not melt even in the bonding step. The melting point of the metal used in the electrode is preferably 500°C or higher, more preferably 700°C or higher, and still more preferably 800°C or higher. Although the upper limit is not specifically limited, For example, it is preferable to set it as 3000 degreeC or less. The material used in the conduction path is not particularly limited, and examples include tin, lead, silver, copper, zinc, bismuth or indium, or alloys thereof. Among them, in the present invention, solder of tin or tin alloy (metal containing tin) is preferable. In the future, the technology of lead-free solder that does not use lead is also improving, and it is better to choose this material. As the metal used in the conductive path, a metal melted in the bonding step is preferable. The melting point of the metal used in the copper via is preferably 400°C or lower, more preferably 300°C or lower, and still more preferably 250°C or lower. The lower limit of the melting point is not particularly limited as long as it is a solid at room temperature. For example, 150° C. or higher is preferable. It is preferable to form a plural number of convex parts.

基板A中所使用之材料並沒有特別限定，如矽、氮化矽、多晶矽、氧化矽、非晶矽等半導體製作基板、石英、玻璃、光學膜、陶瓷材料、蒸鍍膜、磁性膜、反射膜、Ni、Cu、Cr、Fe等金屬基板、紙、SOG（Spin On Glass：旋塗玻璃）、TFT（薄膜電晶體）陣列基板、等電漿顯示面板（PDP）的電極板等，並不受特別制約。在本發明中，尤其，半導體製作基板為較佳，矽基板（矽晶圓）為更佳。基板A可以具有包含電子電路之電子電路區域。又，上述電子電路可以具有半導體等元件。又，上述電子電路與上述凸部電接合為較佳。 作為基板A的尺寸（例如，晶圓尺寸），能夠將直徑（基板A不是圓形時為最大直徑）設為100mm以上。又，作為大型基板，例如，200mm以上為較佳，250mm以上為更佳。上限並沒有特別限定，2,000mm以下為較佳。 The materials used in substrate A are not particularly limited, such as silicon, silicon nitride, polysilicon, silicon oxide, amorphous silicon and other semiconductor substrates, quartz, glass, optical film, ceramic material, evaporated film, magnetic film, reflective film , Ni, Cu, Cr, Fe and other metal substrates, paper, SOG (Spin On Glass: spin-on glass), TFT (thin film transistor) array substrates, electrode plates of isoplasmic display panels (PDP), etc., are not subject to special restrictions. In the present invention, especially, a semiconductor manufacturing substrate is preferable, and a silicon substrate (silicon wafer) is more preferable. Substrate A may have an electronic circuit area containing electronic circuits. In addition, the above-mentioned electronic circuit may have elements such as semiconductors. Moreover, it is preferable that the said electronic circuit is electrically connected with the said convex part. The size of the substrate A (for example, wafer size) can be set to a diameter (maximum diameter when the substrate A is not circular) of 100 mm or more. Moreover, as a large board|substrate, for example, 200 mm or more are preferable, and 250 mm or more are more preferable. The upper limit is not particularly limited, but is preferably 2,000 mm or less.

〔基板B〕 基板B具有配線端子。 基板B的厚度係0.1～5mm為較佳，0.2～1mm為更佳。 基板B可以係晶圓，亦可以係單面晶片，亦可以係雙面晶片。 在藉由本發明的接合體之製造方法而獲得之接合體中，上述配線端子的至少一部分與上述基板A中的凸部電接合。 〔Substrate B〕 The substrate B has wiring terminals. The thickness of the substrate B is preferably 0.1-5 mm, more preferably 0.2-1 mm. The substrate B can be a wafer, a single-sided wafer, or a double-sided wafer. In the bonded body obtained by the method for producing a bonded body of the present invention, at least a part of the wiring terminal is electrically bonded to the protrusion on the substrate A.

基板B中所使用之材料並沒有特別限定，可以較佳地舉出與上述基板A相同的材料。基板A可以具有包含電子電路之電子電路區域。又，上述電子電路可以具有半導體等元件。又，上述電子電路與上述配線端子電接合為較佳。 作為基板B的尺寸（例如，晶圓尺寸），能夠將直徑（基板B不是圓形時係最大直徑）設為100mm以上。又，作為大型基板，例如，200mm以上為較佳，250mm以上為更佳。上限並沒有特別限定，2,000mm以下為較佳。 The material used for the board|substrate B is not specifically limited, Preferably, the same material as the board|substrate A mentioned above is mentioned. Substrate A may have an electronic circuit area containing electronic circuits. In addition, the above-mentioned electronic circuit may have elements such as semiconductors. Moreover, it is preferable that the said electronic circuit and the said wiring terminal are electrically connected. The size of the substrate B (eg, wafer size) can be set to a diameter (maximum diameter when the substrate B is not circular) of 100 mm or more. Moreover, as a large board|substrate, for example, 200 mm or more are preferable, and 250 mm or more are more preferable. The upper limit is not particularly limited, but is preferably 2,000 mm or less.

＜含填充劑層形成步驟＞ 本發明的接合體之製造方法包括在上述基板A的具有上述凸部之面上形成包含黏合劑及填充劑之含填充劑層之步驟（含填充劑層形成步驟）。 含填充劑層已與上述凸部接觸的方式形成為較佳，已填充凸部與凸部之間的凹部的方式形成為更佳。 又，含填充劑層只要形成於上述凸部中的至少一部分上即可，例如，形成於所有的上述凸部上之態樣亦係本發明的較佳態樣之一。 ＜Filler-containing layer formation process＞ The method for producing a bonded body according to the present invention includes a step of forming a filler-containing layer containing an adhesive and a filler on the surface of the substrate A having the protrusions (filler-containing layer forming step). The filler-containing layer is preferably formed in contact with the above-mentioned protrusions, and more preferably formed to fill the recesses between the protrusions. In addition, the filler-containing layer may be formed on at least a part of the above-mentioned convex portions, for example, an aspect in which it is formed on all of the above-mentioned convex portions is also one of the preferred aspects of the present invention.

形成含填充劑層之步驟係包括將包含選自包括如下步驟為較佳：黏合劑及黏合劑的前驅物之群組中的至少一種樹脂和填充劑之樹脂組成物適用於上述基板A的具有上述凸部之面上。The step of forming the filler-containing layer includes applying a resin composition comprising at least one resin and a filler selected from the group consisting of an adhesive and a precursor of the adhesive to the above-mentioned substrate A having on the surface of the above-mentioned convex portion.

〔黏合劑〕 含填充劑層中所包含之黏合劑係絕緣性黏合劑為較佳。 在本發明中，絕緣性黏合劑係指，體積電阻率為1×10 15Ω·cm以上者，體積電阻率係1×10 16Ω·cm以上者為較佳。上限並無特別限定，例如，1×10 18Ω·cm以下者為較佳。 又，上述黏合劑的絕緣破壤電壓係1kV/mm以上為較佳，10kV/mm以上為更佳。上限並沒有特別限定，例如，1000kV/mm以下為較佳。 在本說明書中，體積電阻率及絕緣破壤電壓能夠依據JIS（Japanese Industrial Standards：日本工業標準） C2151：2006、JISC2318：2007來測量。 [Binder] The binder contained in the filler-containing layer is preferably an insulating binder. In the present invention, the insulating adhesive refers to one having a volume resistivity of 1×10 15 Ω·cm or higher, preferably 1×10 16 Ω·cm or higher. The upper limit is not particularly limited, but, for example, 1×10 18 Ω·cm or less is preferable. In addition, the insulation breaking voltage of the above-mentioned adhesive is preferably 1 kV/mm or higher, more preferably 10 kV/mm or higher. The upper limit is not particularly limited, for example, it is preferably 1000 kV/mm or less. In this specification, the volume resistivity and the insulation breakdown voltage can be measured in accordance with JIS (Japanese Industrial Standards: Japanese Industrial Standards) C2151:2006 and JISC2318:2007.

作為黏合劑，並沒有特別限定，可以舉出包含聚醯亞胺、聚苯并㗁唑、聚醯胺醯亞胺、酚醛樹脂、聚醯胺、環氧樹脂、聚矽氧烷、矽氧烷結構之樹脂、（甲基）丙烯酸樹脂、（甲基）丙烯醯胺樹脂、胺基甲酸酯樹脂、縮丁醛樹脂、苯乙烯樹脂、聚醚樹脂、聚酯樹脂等。 該等可以單獨使用1種，亦可以併用2種以上。 在該等之中，含填充劑層包含聚醯亞胺、聚苯并㗁唑或聚醯胺醯亞胺為較佳，包含聚醯亞胺為進一步較佳。 關於該等樹脂的詳細內容，作為後述之樹脂組成物中所包含之成分進行說明。 The binder is not particularly limited, and examples include polyimide, polybenzoxazole, polyamideimide, phenolic resin, polyamide, epoxy resin, polysiloxane, silicone Structural resins, (meth)acrylic resins, (meth)acrylamide resins, urethane resins, butyral resins, styrene resins, polyether resins, polyester resins, etc. These may be used individually by 1 type, and may use 2 or more types together. Among these, the filler-containing layer preferably contains polyimide, polybenzoxazole, or polyamideimide, and further preferably contains polyimide. The details of these resins will be described as components contained in the resin composition described later.

又，含填充劑層中所包含之黏合劑包含聚合性基為較佳，包含自由基聚合性基為更佳，包含具有乙烯性不飽和鍵之基團為進一步較佳，包含選自包括乙烯基、丙烯酸基及甲基丙烯酸基之群組中的至少一種基團為特佳。 黏合劑藉由具有這種基團，能夠進一步提高基板A與基板B的接著性。 In addition, the binder contained in the filler-containing layer preferably contains a polymerizable group, more preferably contains a radical polymerizable group, further preferably contains a group having an ethylenically unsaturated bond, and contains a group selected from the group consisting of ethylene. At least one group selected from the group consisting of acryl group, acryl group and methacryl group is particularly preferred. By having such a group, the adhesive can further improve the adhesion between the substrate A and the substrate B.

黏合劑的含量相對於含填充劑層的總質量，係5質量%以上為較佳，10質量%以上為更佳，15質量%以上為進一步較佳。上述含量的上限並沒有特別限定，例如，能夠設為50質量%以下。 含填充劑層包含2種以上的黏合劑之情況下，該等的合計量在上述範圍內為較佳。 The content of the binder is preferably at least 5% by mass, more preferably at least 10% by mass, and still more preferably at least 15% by mass, based on the total mass of the filler-containing layer. The upper limit of the said content is not specifically limited, For example, it can be 50 mass % or less. When the filler-containing layer contains two or more types of binders, the total amount of these is preferably within the above-mentioned range.

〔填充劑〕 含填充劑層包含填充劑。 填充劑具有導熱性為較佳。填充劑可以具有電絕緣性，亦可以係半導體或具有導電性。電絕緣性及導電性的程度可以依據設計或目的而適當選擇。 例如，在電絕緣性填充劑之情況下，其填充劑的體積電阻率的下限為1.0×10 11Ω·cm以上為較佳，3.0×10 11Ω·cm以上為更佳，1.0×10 12Ω·cm以上為特佳。又，體積電阻率的上限並沒有特別限定，例如，1.0×10 18以下Ω·cm為較佳。 另一方面，半導體或導電性填充劑之情況下，其填充劑的體積電阻率的下限並沒有特別限定，實際上係1.0×10 -7Ω·cm以上。又，體積電阻率的上限小於1.0×10 11Ω·cm為較佳。 [Filler] The filler-containing layer contains a filler. It is preferable that the filler has thermal conductivity. The filler may be electrically insulating, semiconducting or conductive. The degree of electrical insulation and conductivity can be appropriately selected depending on design or purpose. For example, in the case of an electrically insulating filler, the lower limit of the volume resistivity of the filler is preferably 1.0×10 11 Ω·cm or more, more preferably 3.0×10 11 Ω·cm or more, and 1.0×10 12 More than Ω·cm is particularly preferred. Also, the upper limit of the volume resistivity is not particularly limited, for example, 1.0×10 18 or less Ω·cm is preferable. On the other hand, in the case of a semiconductor or conductive filler, the lower limit of the volume resistivity of the filler is not particularly limited, but is actually 1.0×10 -7 Ω·cm or more. Also, the upper limit of the volume resistivity is preferably less than 1.0×10 11 Ω·cm.

填充劑的熱擴散率例如係5.0×10 -7m 2s -1以上為較佳，1.0×10 -6m 2s -1以上為更佳，2.0×10 -6m 2s -1以上為進一步較佳，3.0×10 -6m 2s -1以上為特佳。又，填充劑的熱擴散率的上限並沒有特別限定，例如，1.0×10 -4m 2s -1以下為較佳。 The thermal diffusivity of the filler is, for example, preferably not less than 5.0×10 -7 m 2 s -1 , more preferably not less than 1.0×10 -6 m 2 s -1 , more preferably not less than 2.0×10 -6 m 2 s -1 More preferably, 3.0×10 -6 m 2 s -1 or more is particularly preferred. Also, the upper limit of the thermal diffusivity of the filler is not particularly limited, for example, it is preferably 1.0×10 -4 m 2 s -1 or less.

填充劑的密度例如係4.0g/cm 3以下為較佳，3.0g/cm 3以下為更佳。又，填充劑的密度的下限並沒有特別限定，例如，1.0g/cm 3以上為較佳。另外，填充劑係多孔質或中空粒子等具有空隙部或孔洞部者之情況下，本說明書中填充劑的密度表示構成填充劑之成分中固體成分的密度。 The density of the filler is, for example, preferably below 4.0 g/cm 3 , more preferably below 3.0 g/cm 3 . Also, the lower limit of the density of the filler is not particularly limited, for example, it is preferably 1.0 g/cm 3 or more. In addition, when the filler is porous or hollow particles having voids or holes, the density of the filler in this specification means the density of the solid content of the components constituting the filler.

較佳為填充劑包含電絕緣性的材料。電絕緣性的填充劑材料例如係由氮化合物、氧化合物、矽化合物、硼化合物、碳化合物及該等複合化合物構成之電絕緣性的陶瓷。作為氮化合物，例如，可以舉出氮化硼、氮化鋁、氮化矽等。作為氧化合物，可以舉出氧化鋁（Alumina）、氧化鎂（Magnesia）、氧化鋅、氧化矽（Silica ）、氧化鈹、氧化鈦（Titania）、氧化銅、氧化亞銅等金屬氧化物。作為矽化合物及碳化合物，可以舉出碳化矽。作為硼化合物，例如，可以舉出硼化鈦等金屬硼化物。作為其他碳化合物，例如係金剛石等以σ鍵為主導的碳基底材料。而且，作為上述複合化合物，可以舉出菱鎂礦（碳酸鎂）、鈣鈦礦（鈦酸鈣）、滑石、雲母、高嶺土、皂土、焦鐵氧體等礦物類陶瓷。又，電絕緣性的填充劑材料可以係氫氧化鎂、氫氧化鋁等金屬氫氧化物。Preferably, the filler contains an electrically insulating material. Electrically insulating filler materials are, for example, electrically insulating ceramics composed of nitrogen compounds, oxygen compounds, silicon compounds, boron compounds, carbon compounds, and these composite compounds. Examples of nitrogen compounds include boron nitride, aluminum nitride, silicon nitride, and the like. Examples of the oxygen compound include metal oxides such as aluminum oxide, magnesium oxide (Magnesia), zinc oxide, silicon oxide (Silica), beryllium oxide, titanium oxide (Titania), copper oxide, and cuprous oxide. Examples of the silicon compound and the carbon compound include silicon carbide. Examples of the boron compound include metal borides such as titanium boride. As another carbon compound, for example, a carbon-based material mainly composed of σ bonds such as diamond is used. Furthermore, examples of the composite compound include mineral ceramics such as magnesite (magnesium carbonate), perovskite (calcium titanate), talc, mica, kaolin, bentonite, and pyroferrite. In addition, the electrically insulating filler material may be a metal hydroxide such as magnesium hydroxide or aluminum hydroxide.

在該等之中，從導熱性等觀點考慮，填充劑材料包含由氮化合物構成之陶瓷、由金屬氧化物構成之陶瓷及金屬氫氧化物中的至少一種為較佳。而且，填充劑材料例如包含選自包括氮化硼、氮化鋁、氮化矽、氧化鋁、氧化鎂、氧化鋅及氧化鈹以及氫氧化鋁之群組中的至少一種為較佳。尤其，填充劑材料包含選自包括氮化硼、氮化鋁、氮化矽、氧化鋁、氧化鎂、氧化鋅及氧化鈹之群組中的至少一種為特佳，包含氮化硼、氮化鋁、氮化矽及氧化鋁中的至少一種為進一步較佳。另外，氮化硼可以係c-BN（立方結構）、w-BN（纖鋅礦結構）、h-BN（六角形結構）、r-BN（菱面體晶結構）、t-BN（無規層結構）等任意結構。氮化硼的形狀具有球狀、鱗片狀、奈米軟管狀等形狀，但能夠使用任一種。又，亦能夠較佳地使用NIPPON SHOKUBAI CO., LTD.製造之IX-3系列等。Among them, it is preferable that the filler material contains at least one of ceramics composed of nitrogen compounds, ceramics composed of metal oxides, and metal hydroxides from the viewpoint of thermal conductivity and the like. Furthermore, it is preferable that the filler material includes at least one selected from the group consisting of boron nitride, aluminum nitride, silicon nitride, aluminum oxide, magnesium oxide, zinc oxide, beryllium oxide, and aluminum hydroxide. In particular, it is particularly preferred that the filler material comprises at least one selected from the group consisting of boron nitride, aluminum nitride, silicon nitride, aluminum oxide, magnesium oxide, zinc oxide, and beryllium oxide, including boron nitride, At least one of aluminum, silicon nitride, and aluminum oxide is further preferred. In addition, boron nitride can be c-BN (cubic structure), w-BN (wurtzite structure), h-BN (hexagonal structure), r-BN (rhombohedral crystal structure), t-BN (no regulatory layer structure) and other arbitrary structures. The shape of boron nitride has spherical shape, scale shape, nanotube shape, etc., but any of them can be used. In addition, the IX-3 series manufactured by NIPPON SHOKUBAI CO., LTD. and the like can also be preferably used.

作為導電性的填充劑材料，例如，可以舉出石墨、碳黑、石墨、碳纖維（PITCH系、PAN系）、碳奈米管（CNT）、碳奈米纖維（CNF）等以π鍵為主的碳基底材料。又，作為這種填充劑材料，可以係銀、銅、鐵、鎳、鋁、鈦等金屬及不鏽鋼（SUS）等合金。另外，作為這種填充劑材料，亦能夠使用摻雜有不同種元素之氧化鋅等導電性金屬氧化物或鐵磁體等導電性陶瓷。Examples of conductive filler materials include graphite, carbon black, graphite, carbon fiber (PITCH-based, PAN-based), carbon nanotube (CNT), carbon nanofiber (CNF), etc. carbon base material. In addition, as such a filler material, metals such as silver, copper, iron, nickel, aluminum, titanium, and alloys such as stainless steel (SUS) can be used. In addition, as such a filler material, conductive metal oxides such as zinc oxide doped with different kinds of elements, or conductive ceramics such as ferromagnets can also be used.

填充劑可以係用二氧化矽等電絕緣性材料被覆或表面處理了半導體或導電性的導熱性粒子之構成。由於依據這種態樣，變得容易分別控制導熱性及電絕緣性，因此變得容易調整導熱性及電絕緣性。例如，作為在表面形成二氧化矽的膜之方法，可以舉出水玻璃法和溶膠凝膠法。The filler may be composed of semiconductor or conductive heat-conducting particles coated or surface-treated with an electrically insulating material such as silicon dioxide. According to this aspect, since it becomes easy to separately control thermal conductivity and electrical insulation, it becomes easy to adjust thermal conductivity and electrical insulation. For example, the water glass method and the sol-gel method are mentioned as a method of forming a silicon dioxide film on the surface.

該等填充劑能夠組合使用1種或2種以上。又，關於填充劑的形狀，並沒有特別限定，能夠使用各種形狀的填充劑，例如，可以舉出纖維狀、板狀、鱗片狀、棒狀、球狀、軟管狀、彎曲板狀、針狀等。These fillers can be used alone or in combination. Also, the shape of the filler is not particularly limited, and fillers of various shapes can be used, for example, fibrous, plate-shaped, scale-shaped, rod-shaped, spherical, tube-shaped, curved plate-shaped, needle-shaped, etc. status etc.

填充劑可以實施矽烷偶合處理、鈦酸酯偶合處理、環氧處理、胺基甲酸酯處理、氧化處理等表面處理。表面處理中所使用之表面處理劑例如係多元醇、氧化鋁、氫氧化鋁、二氧化矽（氧化矽）、含水二氧化矽、烷醇胺、硬脂酸、有機矽氧烷、氧化鋯、氫化二甲基矽油、矽烷偶合劑、鈦酸酯偶合劑等。其中，矽烷偶合劑為較佳。The filler can be subjected to surface treatments such as silane coupling treatment, titanate coupling treatment, epoxy treatment, urethane treatment, and oxidation treatment. The surface treatment agents used in surface treatment are polyols, aluminum oxide, aluminum hydroxide, silicon dioxide (silicon oxide), hydrous silicon dioxide, alkanolamine, stearic acid, organosiloxane, zirconia, Hydrogenated dimethyl silicone oil, silane coupling agent, titanate coupling agent, etc. Among them, silane coupling agents are preferred.

關於填充劑的大小，填充劑的平均粒徑係30μm以下為較佳，20μm以下為更佳，10μm以下為進一步較佳。 又，填充劑的平均粒徑係0.01μm以上為較佳，0.05μm以上為更佳，0.1μm以上為進一步較佳，0.3μm以上為特佳。 填充劑的“平均粒徑”能夠藉由用掃描式電子顯微鏡（SEM）來觀察含填充劑層中的填充劑，並且觀測填充劑的粒子未凝聚的部分（一次粒子）來求出。 平均粒徑能夠作為最小包含圓的直徑相對藉由SEM來觀察之各粒子的表觀輪廓的的平均值來算出。 具體而言，能夠藉由後述之實施例中記載之方法來記載。 Regarding the size of the filler, the average particle diameter of the filler is preferably 30 μm or less, more preferably 20 μm or less, and still more preferably 10 μm or less. Also, the average particle diameter of the filler is preferably 0.01 μm or more, more preferably 0.05 μm or more, still more preferably 0.1 μm or more, and particularly preferably 0.3 μm or more. The “average particle diameter” of the filler can be obtained by observing the filler in the filler-containing layer with a scanning electron microscope (SEM), and observing the part (primary particle) where the particles of the filler are not aggregated. The average particle diameter can be calculated as the average value of the diameter of the smallest containing circle relative to the apparent profile of each particle observed by SEM. Specifically, it can be described by the method described in the Example mentioned later.

填充劑可以包含混合有粒徑不同之至少2種粒子群組之顆粒狀混合物。某粒子組的“粒徑”亦藉由與填充劑的“粒徑”的情況相同的方法來求出。當設為這種構成時，由於在大粒子彼此之間填充小粒子而與僅包含單一直徑的填充劑的情況相比，填充劑彼此的間隔減小，進而接觸點增加，因此導熱性提高。例如，粒徑不同之2種粒子組被混合之情況下，在包含該等粒子組之填充劑的粒度分布中，觀測到2個峰。故，能夠藉由確認填充劑的粒度分布的峰數來確認在填充劑亦即粒子狀混合物中包含有幾種粒徑不同之粒子組。 又，填充劑可以係包含球狀、板狀、彎曲板狀或鱗片狀等縱橫比較小的粒子和纖維狀、棒狀、軟管狀、針狀等縱橫比較大的粒子之混合物。 依據這種態樣，有時能夠大幅提高熱擴散性。 The filler may include a granular mixture in which at least two particle groups having different particle diameters are mixed. The "particle size" of a certain particle group is also obtained by the same method as in the case of the "particle size" of the filler. With such a configuration, since small particles are filled between large particles, the distance between the fillers is reduced and contact points are increased compared with a case where only a single-diameter filler is included, thereby improving thermal conductivity. For example, when two types of particle groups having different particle diameters are mixed, two peaks are observed in the particle size distribution of the filler containing these particle groups. Therefore, by confirming the number of peaks in the particle size distribution of the filler, it can be confirmed that the filler, that is, the particulate mixture contains several particle groups with different particle diameters. Furthermore, the filler may be a mixture of spherical, plate-shaped, curved plate-shaped, or scale-shaped particles with a small aspect ratio and fibrous, rod-shaped, tube-shaped, needle-shaped, etc. particles with a large aspect ratio. According to such an aspect, thermal diffusivity can be greatly improved in some cases.

填充劑的粒度分布中的峰數存在複數個之情況下，在至少2個峰之間，峰值粒徑比（相當於峰頂點之粒徑彼此之比）係1.5～50為較佳。下限係2以上為較佳，4以上為更佳。上限係40以下為較佳，20以下為更佳。若上述峰值比在上述範圍內，則抑制大直徑填充劑成為粗大粒子，並且小直徑填充劑容易佔據大直徑填充劑的間隙的空間。 又，關於至少2個峰之間，粒度大的峰相對於粒度小的峰的峰強度比，係0.2～5.0為較佳。下限係0.2以上為較佳，0.5以上為更佳。上限係5.0以下為較佳，3.0以下為更佳。 When there are plural peaks in the particle size distribution of the filler, it is preferable that the peak particle diameter ratio (ratio of particle diameters corresponding to peak apexes) be 1.5 to 50 among at least two peaks. The lower limit is preferably 2 or more, more preferably 4 or more. The upper limit is preferably 40 or less, more preferably 20 or less. When the peak ratio is within the above range, the large-diameter filler is suppressed from becoming coarse particles, and the small-diameter filler tends to occupy the interstitial spaces of the large-diameter filler. Moreover, the peak intensity ratio of the peak with a large particle size to the peak with a small particle size among at least two peaks is preferably 0.2 to 5.0. The lower limit is preferably 0.2 or more, more preferably 0.5 or more. The upper limit is preferably 5.0 or less, more preferably 3.0 or less.

含填充劑層中的填充劑的含量相對於含填充劑層的體積係1體積%以上為較佳，10體積%以上為更佳，20體積%以上為特佳，50體積%以上為最佳。 又，從提高基板A與基板B的接著性之觀點考慮，相對於含填充劑層的體積係85體積%以下為更佳，81體積%以下進一步較佳，75體積%以下為最佳。 又，含填充劑層中的填充劑的含量相對於含填充劑層的總質量係10質量%以上為較佳，30質量%以上為更佳。 上述含量的上限並沒有特別限定，從基於微影步驟的加工性之觀點考慮，90質量%以下為較佳，75質量%以下為更佳。 The content of the filler in the filler-containing layer is preferably at least 1% by volume, more preferably at least 10% by volume, particularly preferably at least 20% by volume, and most preferably at least 50% by volume, based on the volume of the filler-containing layer. . Also, from the viewpoint of improving the adhesion between the substrate A and the substrate B, the volume of the filler-containing layer is more preferably 85% by volume or less, more preferably 81% by volume or less, and most preferably 75% by volume or less. Also, the content of the filler in the filler-containing layer is preferably 10% by mass or more, more preferably 30% by mass or more, based on the total mass of the filler-containing layer. The upper limit of the content is not particularly limited, but is preferably 90% by mass or less, more preferably 75% by mass or less, from the viewpoint of processability in the lithography process.

所有填充劑中的粒徑為0.5～15μm的粒子組的比例係50質量%以上為較佳，80質量%以上為更佳。該比例的上限能夠設為100質量%，亦能夠設為99質量%以下。該比例係99質量%以下為較佳，95質量%以下為進一步較佳。The ratio of the particle group with a particle size of 0.5 to 15 μm in all the fillers is preferably 50% by mass or more, more preferably 80% by mass or more. The upper limit of this ratio can be set to 100 mass %, and can also be set to 99 mass % or less. The ratio is preferably at most 99% by mass, and more preferably at most 95% by mass.

如上所述，填充劑能夠組合使用1種或2種以上，包含2種以上的填充劑之情況下，該等的合計量在上述範圍內為較佳。As mentioned above, one type or two or more types of fillers can be used in combination, and when containing two or more types of fillers, it is preferable that the total amount of these is within the said range.

〔其他成分〕 含填充劑層可以包含其他成分。 作為其他成分，可以舉出後述之樹脂組成物中包含之、黏合劑及其前驅物、以及除了填充劑以外的成分。 [other ingredients] The filler-containing layer may contain other components. Examples of other components include those contained in the resin composition described later, binders and precursors thereof, and components other than fillers.

〔含填充劑層的形成方法〕 形成含填充劑層之步驟係包括將包含選自包括如下步驟為較佳：黏合劑及黏合劑的前驅物之群組中的至少一種樹脂和填充劑之樹脂組成物適用於上述基板A的具有上述凸部之面上。 又，含填充劑層係藉由硬化上述樹脂組成物而成之層為較佳。 [Method for forming filler-containing layer] The step of forming the filler-containing layer includes applying a resin composition comprising at least one resin and a filler selected from the group consisting of an adhesive and a precursor of the adhesive to the above-mentioned substrate A having on the surface of the above-mentioned convex portion. Also, the filler-containing layer is preferably a layer formed by curing the above-mentioned resin composition.

-樹脂組成物- 樹脂組成物中所使用之黏合劑與上述含填充劑層中所包含之黏合劑同義，較佳態樣亦相同。 樹脂組成物中所包含之黏合劑的前驅物係指，例如藉由後述的加熱或其他操作而成為上述黏合劑之化合物，可以舉出後述的聚醯亞胺前驅物、聚苯并㗁唑前驅物、聚醯胺醯亞胺前驅物等。 作為樹脂組成物中所包含之填充劑，可以舉出上述含填充劑層中所包含之填充劑。 此外，對樹脂組成物的詳細內容，如後述。 -Resin composition- The binder used in the resin composition is synonymous with the binder contained in the above-mentioned filler-containing layer, and the preferable aspect is also the same. The precursor of the binder contained in the resin composition means, for example, a compound that becomes the above-mentioned binder by heating or other operations described later, and examples include polyimide precursors and polybenzoxazole precursors described later. substances, polyamideimide precursors, etc. As a filler contained in a resin composition, the filler contained in the said filler containing layer is mentioned. In addition, the details of the resin composition will be described later.

-適用方法- 作為將樹脂組成物適用於基材上之方法，可以例示出浸塗法、氣刀塗佈法、簾式塗佈法、線棒塗佈法、凹版塗佈法、擠壓塗佈法、噴塗法、旋塗法、狹縫塗佈法及噴墨法等。 -Applicable method- Examples of methods for applying the resin composition to the substrate include dip coating, air knife coating, curtain coating, wire bar coating, gravure coating, extrusion coating, and spray coating. method, spin coating method, slit coating method and inkjet method, etc.

又，樹脂組成物包含溶劑之情況下，可以包括在將樹脂組成物適用於基材之後，使由樹脂組成物構成之層乾燥之步驟（乾燥步驟）。 乾燥步驟中的膜的乾燥溫度係50～150℃為較佳，70℃～130℃為更佳，90℃～110℃為進一步較佳。又，可以藉由減壓來進行乾燥。作為乾燥時間，可以例示出30秒～20分鐘，1分鐘～10分鐘為較佳，2分鐘～7分鐘為更佳。 Moreover, when the resin composition contains a solvent, after applying the resin composition to a base material, the process (drying process) of drying the layer which consists of a resin composition may be included. The drying temperature of the film in the drying step is preferably from 50°C to 150°C, more preferably from 70°C to 130°C, and still more preferably from 90°C to 110°C. Moreover, drying can be performed by reducing pressure. As a drying time, 30 seconds - 20 minutes can be illustrated, Preferably it is 1 minute - 10 minutes, More preferably, it is 2 minutes - 7 minutes.

剛適用後的厚度（進行乾燥步驟之情況下，乾燥後的厚度）並沒有特別限定，只要適當調整為所獲得之含填充劑層的厚度成為後述的厚度即可。The thickness immediately after application (when the drying step is performed, the thickness after drying) is not particularly limited, as long as it is appropriately adjusted so that the thickness of the obtained filler-containing layer becomes the thickness described later.

又，在含填充劑層形成步驟中，不僅是在基板A還是在基板B上（較佳為在基板B的具有上述配線端子之面上）亦可以形成含填充劑層。 在基板B上形成含填充劑層之方法並沒有特別限定，例如，可以舉出與在基板A上形成含填充劑層之方法相同的方法。 亦即，在基板B上形成含填充劑層之步驟係包括如下步驟為較佳：將包含選自包括黏合劑及黏合劑的前驅物之群組中的至少一種樹脂及填充劑之樹脂組成物適用於上述基板B的具有上述配線端子之面上。 在該情況下，基板A上的含填充劑層與基板B上的含填充劑層接合為較佳。 又，在該情況下，基板B上的含填充劑層亦藉由後述之平坦化步驟而被平坦化為較佳。平坦化的方法與基板A上的含填充劑層的平坦化的方法相同。 In addition, in the step of forming the filler-containing layer, the filler-containing layer may be formed not only on the substrate A but also on the substrate B (preferably on the surface of the substrate B having the above-mentioned wiring terminals). The method of forming the filler-containing layer on the substrate B is not particularly limited, and for example, the same method as the method of forming the filler-containing layer on the substrate A can be used. That is, it is preferable that the step of forming the filler-containing layer on the substrate B includes the step of: forming a resin composition comprising at least one resin and a filler selected from the group consisting of binders and binder precursors. It is applied to the surface of the above-mentioned substrate B having the above-mentioned wiring terminals. In this case, the filler-containing layer on the substrate A and the filler-containing layer on the substrate B are preferably bonded. Also in this case, it is preferable that the filler-containing layer on the substrate B is planarized by a planarization step described later. The method of planarization is the same as that of the filler-containing layer on the substrate A.

含填充劑層形成步驟可以包括將由樹脂組成物構成之層進行圖案化之步驟。作為樹脂組成物而使用了包含後述之光聚合起始劑等感光性化合物者之情況下，能夠藉由曝光和顯影該圖案來進行。 在形成含填充劑層之後，該表面被平坦化。平坦化的詳細內容，如後述。另外，在進行了圖案化之情況下，藉由顯影等而去除之部分的厚度不使用於後述之膜厚差（T1-T2）的算出。 The step of forming the filler-containing layer may include a step of patterning the layer made of the resin composition. When a photosensitive compound such as a photopolymerization initiator described later is used as the resin composition, it can be performed by exposing and developing the pattern. After forming the filler-containing layer, the surface is planarized. Details of flattening will be described later. In addition, when patterning is performed, the thickness of the part removed by development etc. is not used for the calculation of the film thickness difference (T1-T2) mentioned later.

-曝光步驟- 在本發明之製造方法中，可以包括將由樹脂組成物構成之層進行曝光之曝光步驟。曝光量只要能夠感光由樹脂組成物構成之層，則並沒有特別規定，例如，以波長365nm下的曝光能量換算計，照射100～10000mJ/cm 2為較佳，照射200～8000mJ/cm 2照射為更佳。 曝光波長能夠在190～1000nm的範圍內適當設定，240～550nm為較佳。 若以與光源的關係來說明曝光波長，則可以舉出（1）半導體雷射（波長830nm、532nm、488nm、405nm等）、（2）金屬鹵化物燈、（3）高壓水銀燈、g射線（波長436nm）、h射線（波長405nm）、i射線（波長365nm）、寬（g、h、i射線的3種波長）、（4）準分子雷射、KrF準分子雷射（波長248nm）、ArF準分子雷射（波長193nm）、F 2準分子雷射（波長157nm）、（5）極紫外線；EUV（波長13.6nm）、（6）電子束等。關於本發明的由樹脂組成物構成之層，尤其係基於高壓水銀燈之曝光為較佳，其中，基於i射線之曝光為較佳。藉此，尤其可獲得高的曝光靈敏度。 -Exposure Step- In the production method of the present invention, an exposure step of exposing a layer composed of a resin composition may be included. The exposure amount is not particularly specified as long as it can be sensitive to the layer made of resin composition. For example, in terms of exposure energy conversion at a wavelength of 365nm, it is better to irradiate from 100 to 10000mJ/ cm2 , and to irradiate from 200 to 8000mJ/ cm2 . for better. The exposure wavelength can be appropriately set within the range of 190 to 1000 nm, preferably 240 to 550 nm. If the exposure wavelength is described in relation to the light source, (1) semiconductor laser (wavelength 830nm, 532nm, 488nm, 405nm, etc.), (2) metal halide lamp, (3) high-pressure mercury lamp, g-ray ( Wavelength 436nm), h-ray (wavelength 405nm), i-ray (wavelength 365nm), wide (3 wavelengths of g, h, i-ray), (4) excimer laser, KrF excimer laser (wavelength 248nm), ArF excimer laser (wavelength 193nm), F 2 excimer laser (wavelength 157nm), (5) extreme ultraviolet; EUV (wavelength 13.6nm), (6) electron beam, etc. Regarding the layer made of the resin composition of the present invention, exposure by a high-pressure mercury lamp is particularly preferable, and among them, exposure by i-rays is preferable. Thereby, especially high exposure sensitivity can be obtained.

-顯影步驟- 在本發明之製造方法中，可以包括對由被曝光之樹脂組成物構成之層進行顯影處理之顯影處理步驟。藉由進行顯影而未曝光之部分（非曝光部）或被曝光之部分（曝光部）被去除。顯影方法只要能夠形成所希望的圖案，則並無特別限制，例如，能夠採用槳法、噴霧法、浸漬法、超音波法等顯影方法。顯影使用顯影液來進行。關於顯影液，只要未被曝光之部分（非曝光部）或被曝光之部分（曝光部）可以被去除，則能夠並無特別限制地使用。顯影液包含有機溶劑為較佳。 作為顯影時間，10秒～5分鐘為較佳。顯影時的溫度並沒有特別規定，通常能夠在20～40℃下進行。在進行使用顯影液之處理之後，可以進一步進行沖洗。用與顯影液不同之溶劑進行沖洗為較佳。例如，能夠使用樹脂組成物中所包含之溶劑進行沖洗。沖洗時間係5秒～1分鐘為較佳。 -Development step- In the production method of the present invention, a development treatment step of performing development treatment on the layer composed of the exposed resin composition may be included. The portion not exposed (non-exposed portion) or the portion exposed (exposed portion) by developing is removed. The developing method is not particularly limited as long as a desired pattern can be formed, and for example, developing methods such as a paddle method, a spray method, a dipping method, and an ultrasonic method can be employed. Image development is performed using a developer. As for the developer, it can be used without particular limitation as long as the unexposed portion (non-exposed portion) or the exposed portion (exposed portion) can be removed. It is preferable that the developing solution contains an organic solvent. As developing time, 10 seconds - 5 minutes are preferable. The temperature at the time of image development is not specifically defined, Usually, it can carry out at 20-40 degreeC. Rinsing may be further performed after processing with a developing solution. It is better to wash with a solvent different from that of the developer. For example, washing can be performed using a solvent contained in the resin composition. The flushing time is preferably 5 seconds to 1 minute.

-加熱步驟- 上述含填充劑層形成步驟包括在上述適用後以150～300℃的溫度加熱組成物（加熱步驟）亦較佳。 能夠藉由上述加熱而進行例如將黏合劑的前驅物設為黏合劑（例如，環化樹脂的前驅物閉環而成為環化樹脂）或進行聚合性化合物彼此或聚合性化合物與黏合劑之間的聚合等。 在本發明中，將該含填充劑層形成步驟中的加熱亦稱為“追加烘烤”。 作為加熱步驟中的加熱溫度（最高加熱溫度），150～300℃為較佳，150～250℃為更佳，160～250℃為更進一步較佳，160～230℃為特佳。 -Heating step- It is also preferable that the above step of forming the filler-containing layer includes heating the composition at a temperature of 150 to 300° C. after the above application (heating step). For example, the precursor of the binder can be used as the binder (for example, the precursor of the cyclized resin is ring-closed to form the cyclized resin) or the polymerizable compounds or the polymerizable compound and the binder can be carried out by the above-mentioned heating. Aggregation etc. In the present invention, the heating in the step of forming the filler-containing layer is also referred to as "additional baking". The heating temperature (maximum heating temperature) in the heating step is preferably from 150 to 300°C, more preferably from 150 to 250°C, still more preferably from 160 to 250°C, and particularly preferably from 160 to 230°C.

從加熱開始時的溫度至最高加熱溫度為止，加熱步驟中之加熱以1～12℃/分鐘的升溫速度進行為較佳。上述升溫速度係2～10℃/分鐘為更佳，3～10℃/分鐘為進一步較佳。藉由將升溫速度設為1℃/分鐘以上，能夠確保生產性，同時防止酸或溶劑的過度揮發，藉由將升溫速度設為12℃/分鐘以下，能夠減輕硬化物的殘餘應力。 而且，在能夠快速加熱之烘箱之情況下，從加熱開始時的溫度至最高加熱溫度為止以1～8℃/秒的升溫速度進行為較佳，2～7℃/秒為更佳，3～6℃/秒為進一步較佳。 The heating in the heating step is preferably performed at a rate of temperature increase of 1 to 12° C./minute from the temperature at the start of heating to the highest heating temperature. The above-mentioned heating rate is more preferably 2 to 10° C./minute, and more preferably 3 to 10° C./minute. By setting the temperature increase rate at 1° C./minute or more, while ensuring productivity, excessive volatilization of acids or solvents can be prevented, and by setting the temperature increase rate at 12° C./minute or less, residual stress in cured products can be reduced. Moreover, in the case of an oven capable of rapid heating, it is better to carry out the temperature increase rate from the temperature at the beginning of heating to the highest heating temperature at a rate of 1 to 8°C/second, more preferably 2 to 7°C/second, and 3 to 7°C/second. 6° C./second is more preferable.

加熱開始時的溫度係20℃～150℃為較佳，20℃～130℃為更佳，25℃～120℃為進一步較佳。加熱開始時的溫度係指開始進行加熱至最高加熱溫度之步驟時的溫度。例如，將本發明的樹脂組成物適用於基材上之後進行乾燥之情況下，係指該乾燥後的膜（層）的溫度，例如從比本發明的樹脂組成物中所包含之溶劑的沸點低30～200℃的溫度升溫為較佳。The temperature at the start of heating is preferably from 20°C to 150°C, more preferably from 20°C to 130°C, and still more preferably from 25°C to 120°C. The temperature at the start of heating refers to the temperature at which the step of heating to the highest heating temperature is started. For example, when the resin composition of the present invention is applied to a substrate and then dried, it refers to the temperature of the dried film (layer), for example, from the boiling point of the solvent contained in the resin composition of the present invention It is better to raise the temperature lower than 30-200°C.

加熱時間（在最高加熱溫度下之加熱時間）係5～360分鐘為較佳，10～300分鐘為更佳，15～240分鐘為進一步較佳。The heating time (heating time at the highest heating temperature) is preferably from 5 to 360 minutes, more preferably from 10 to 300 minutes, and still more preferably from 15 to 240 minutes.

加熱可以分階段進行。作為例子，可以進行如下步驟：從25℃至120℃為止以3℃/分鐘升溫，在120℃下保持60分鐘，從120℃至180℃為止以2℃/分鐘升溫，在180℃下保持120分鐘。又，如美國專利第9159547號說明書中所記載，一邊照射紫外線一邊進行處理亦較佳。藉由該種預處理步驟，能夠提高膜的特性。以10秒～2小時左右的短時間進行預處理步驟即可，15秒～30分鐘為更佳。預處理亦可以設為2個階段以上的步驟，例如可以在100～150℃的範圍內進行第1階段的預處理步驟，其後，在150～200℃的範圍內進行第2階段的預處理步驟。 進而，可以在加熱之後進行冷卻，作為該情況下的冷卻速度，1～5℃/分鐘為較佳。 Heating can be done in stages. As an example, the following steps can be performed: from 25°C to 120°C at 3°C/min, at 120°C for 60 minutes, at 120°C to 180°C at 2°C/min, at 180°C for 120 minutes minute. In addition, as described in US Patent No. 9159547, it is also preferable to perform the treatment while irradiating ultraviolet rays. By such a pretreatment step, the properties of the membrane can be improved. The pretreatment step can be carried out in a short time of about 10 seconds to 2 hours, more preferably 15 seconds to 30 minutes. The pretreatment may be performed in two or more steps. For example, the first stage of pretreatment may be performed at a temperature ranging from 100 to 150°C, followed by the second stage of pretreatment at a temperature ranging from 150 to 200°C. step. Furthermore, cooling may be performed after heating, and the cooling rate in this case is preferably 1 to 5° C./min.

在防止樹脂的分解之觀點上，藉由在減壓下流放氮、氦、氬等非活性氣體等而在低氧濃度的氣氛中進行加熱步驟為較佳。氧濃度係50ppm（體積比）以下為較佳，20ppm（體積比）以下為更佳。 作為加熱步驟中的加熱機構並沒有特別限定，例如可以舉出加熱板、紅外爐、電熱式烘箱、熱風式烘箱、紅外線烘箱等。 From the viewpoint of preventing decomposition of the resin, it is preferable to perform the heating step in an atmosphere with a low oxygen concentration by flowing an inert gas such as nitrogen, helium, or argon under reduced pressure. The oxygen concentration is preferably 50 ppm (volume ratio) or less, more preferably 20 ppm (volume ratio) or less. It does not specifically limit as a heating mechanism in a heating process, For example, a hot plate, an infrared oven, an electric oven, a hot-air oven, an infrared oven, etc. are mentioned.

〔含填充劑層的物性〕 含填充劑層的厚度並沒有特別限定，從發揮該物性的效果之觀點考慮，以剛進行後述之平坦化步驟之前的狀態的厚度係100nm以上為較佳，300nm以上為更佳，500nm以上為進一步較佳，1μm以上為更進一步較佳，2μm以上為進而更進一步較佳。上限並沒有特別限定，1mm以下為較佳，500μm以下為更佳，200μm以下為進一步較佳。膜的厚度能夠使用公知的膜厚測量裝置來測量。 [Physical properties of filler-containing layer] The thickness of the filler-containing layer is not particularly limited. From the viewpoint of exerting the effect of the physical properties, the thickness of the state immediately before the planarization step described later is preferably 100 nm or more, more preferably 300 nm or more, and 500 nm or more. More preferably, 1 μm or more is still more preferred, and 2 μm or more is still more preferred. The upper limit is not particularly limited, but is preferably 1 mm or less, more preferably 500 μm or less, and still more preferably 200 μm or less. The thickness of the film can be measured using a known film thickness measuring device.

後述之接合體中的含填充劑層的熱擴散率係2.0×10 -7m 2s -1以上為較佳，3.0×10 -7m 2s -1以上為更佳，5.0×10 -7m 2s -1以上為進一步較佳。 上述含填充劑層的熱擴散率例如能夠藉由填充劑的材料種類、填充劑的粒徑（包含2種以上的填充劑時為其粒徑的組合）、填充劑的熱擴散率、填充劑的含量、黏合劑的材料種類、黏合劑的熱擴散率、黏合劑的含量等的設計來調整。 The thermal diffusivity of the filler-containing layer in the bonded body described later is preferably 2.0×10 -7 m 2 s -1 or more, more preferably 3.0×10 -7 m 2 s -1 or more, and 5.0×10 -7 More preferably, m 2 s -1 or more. The thermal diffusivity of the above-mentioned filler-containing layer can be determined by, for example, the type of material of the filler, the particle size of the filler (combination of particle sizes when two or more fillers are included), the thermal diffusivity of the filler, the filler The content of the adhesive, the material type of the adhesive, the thermal diffusivity of the adhesive, the content of the adhesive, etc. are designed to be adjusted.

含填充劑層係絕緣性層為較佳。含填充劑層的絕緣性（電阻）並沒有特別限定，以體積電阻率計係1×10 15Ω·cm以上為較佳，1×10 16Ω·cm以上為更佳。並沒有上限，實際上係1×10 19Ω·cm以下。絕緣破壤電壓係1kV/mm以上為較佳，10kV/mm以上為更佳。上限並沒有特別限定，實際上係1000kV/mm以下。在本說明書中，低體積效率和絕緣破壤電壓的測量等依據JIS C2151：2006、JIS C2318：2007來進行。 A filler-containing layer is preferably an insulating layer. The insulation (resistance) of the filler-containing layer is not particularly limited, but it is preferably 1×10 15 Ω·cm or more, more preferably 1×10 16 Ω·cm or more in terms of volume resistivity. There is no upper limit, but actually it is 1×10 19 Ω·cm or less. It is better if the insulation breaking voltage is above 1kV/mm, more preferably above 10kV/mm. The upper limit is not particularly limited, but is actually 1000 kV/mm or less. In this specification, the measurement of low volumetric efficiency and insulation breakdown voltage etc. are performed based on JIS C2151:2006, JIS C2318:2007.

＜積層體製造步驟＞ 本發明的接合體之製造方法包括將上述含填充劑層與上述凸部一起進行平坦化以使上述凸部中的至少一部分從上述含填充劑層露出，並且獲得積層體之步驟（積層體製造步驟）。 關於上述積層體，在具有凸部之基板A上積層有含填充劑層，並且在含填充劑層的露出面的一部分成為上述凸部露出之形態。 ＜Laminate production process＞ The method for producing a bonded body according to the present invention includes a step of flattening the above-mentioned filler-containing layer together with the above-mentioned protrusions so that at least a part of the above-mentioned protrusions are exposed from the above-mentioned filler-containing layer, and obtaining a laminate (manufacturing of a laminate). step). In the above laminate, the filler-containing layer is laminated on the substrate A having the protrusions, and the protrusions are exposed on a part of the exposed surface of the filler-containing layer.

上述平坦化藉由包括切割、機械研磨、化學研磨、研磨、電漿處理、雷射剝蝕中的任意步驟來進行為較佳，藉由切割進行為更佳。 又，在切割後可以進行化學研磨等，組合該等方法。 具體而言，例如，可以舉出用金剛石刀具切削含填充劑層的表面，並且使含填充劑層的新的表面和凸部露出之態樣。藉由對基板A中的凸部和含填充劑層進行平坦化處理以使凸部露出，從而能夠基於凸部和含填充劑層的一併平坦化而使凸部冒頭。 例如，能夠藉由平面刨床（Surface Planer）來進行平坦化。作為平面刨床，例如，例示出在主軸上安裝金剛石刀具者，並且例示出DISCO Corporation製造之DFS8910、DFS8960、DAS8920、DAS8930（均為產品名稱）。作為其他平坦化的方法，可以舉出化學機械研磨（CMP）。 The above-mentioned planarization is preferably performed by any step including dicing, mechanical polishing, chemical polishing, grinding, plasma treatment, and laser ablation, more preferably by dicing. In addition, chemical polishing or the like may be performed after dicing, and these methods may be combined. Specifically, for example, an aspect in which the surface of the filler-containing layer is cut with a diamond tool to expose a new surface and convex portions of the filler-containing layer is mentioned. By planarizing the protrusions and the filler-containing layer in the substrate A to expose the protrusions, it is possible to make the protrusions rise based on the simultaneous planarization of the protrusions and the filler-containing layer. For example, planarization can be performed by a surface planer. As a surface planer, for example, one in which a diamond cutter is attached to a spindle is exemplified, and DFS8910, DFS8960, DAS8920, and DAS8930 (all are product names) manufactured by DISCO Corporation are exemplified. As another planarization method, chemical mechanical polishing (CMP) is mentioned.

〔TTV〕 在積層體製造步驟中，含填充劑層與凸部一起被平坦化。作為上述平坦化的程度，積層體中的含填充劑層及凸部的TTV（Total Thickness Variation：總厚度變異）係10μm以下為較佳，5μm以下為更佳，3μm以下為進一步較佳。 在本發明中，TTV係指，從含填充劑層的邊緣部向1mm以上的內側的區域分割為2mm見方的分區（含填充劑層的面積微小等不能夠分割成2mm見方的分區時，將從含填充劑層的邊緣部向1mm以上的內側的所有區域設為一個分區），測量每個分區中的一個表面與另一個表面之間的最大厚度（T1）和一個表面與另一個表面之間的最小厚度（T2），按每個分區算出膜厚差（T1-T2），在各分區按膜厚差（T1-T2）從大到小的順序設置排序，將從最上位分區（膜厚差最大）按膜厚差從大到小的順序的相當於總分區數的10%（存在小數點以下時捨去）的個數的分區組及從最低位分區（膜厚差最小）按膜厚差從小到大的順序的相當於總分區數的10%（存在小數點以下時捨去）的個數的分區組除外，剩餘的分區組的各膜厚差（T1-T2）的算術平均值。 在本說明書中，特指在此定義之積層體中的含填充劑層的TTV之情況下，有時稱為“分區評價TTV”。其他測量方法的詳細內容設為係基於後述實施例中示出之測量方法。藉由將積層體中的含填充劑層的TTV設為上述上限值以下，膜厚變得大致均勻，與基板B的接著性提高。 〔TTV〕 In the laminate production step, the filler-containing layer is planarized together with the protrusions. As the degree of planarization, the TTV (Total Thickness Variation) of the filler-containing layer and the convex portion in the laminate is preferably 10 μm or less, more preferably 5 μm or less, and still more preferably 3 μm or less. In the present invention, TTV refers to dividing into 2 mm square divisions from the edge of the filler-containing layer to the inside of 1 mm or more (when the area of the filler-containing layer cannot be divided into 2 mm square divisions, etc., divide All areas from the edge of the filler-containing layer to the inside of 1 mm or more are set as one division), and the maximum thickness (T1) between one surface and the other surface in each division and the distance between one surface and the other surface are measured. The minimum thickness (T2) between them, calculate the film thickness difference (T1-T2) according to each partition, and set the sorting order in each partition according to the order of the film thickness difference (T1-T2) from large to small, and will start from the top partition (film The largest thickness difference) according to the order of film thickness difference from large to small, the number of partition groups equivalent to 10% of the total number of partitions (rounded down when there are below the decimal point) and the partition from the lowest position (the film thickness difference is the smallest) by The film thickness difference is equivalent to 10% of the total number of partitions (rounded off when there is a decimal point) in order of small to large, except for the number of film thickness differences (T1-T2) of the remaining partition groups. average value. In this specification, when specifically referring to the TTV of the filler layer in the laminate defined here, it may be called "regional evaluation TTV". The details of other measurement methods are based on the measurement methods shown in Examples described later. By making TTV of the filler containing layer in a laminated body below the said upper limit, a film thickness becomes substantially uniform, and the adhesiveness with the board|substrate B improves.

〔Ra〕 本發明的含填充劑層中，與基板A相反的一側的面的表面粗糙度亦即Ra係10nm以上且1.5μm以下為較佳。作為上限，1μm以下為較佳，500nm以下為更佳，300nm以下為進一步較佳，200nm以下為更進一步較佳，150nm以下為更進一步較佳，120nm以下為進而更進一步較佳。 本發明的含填充劑層的表面粗糙度（Ra）設為基於後述記載之實施例中示出之測量方法而獲得。 藉由將含填充劑層的表面粗糙度設為上述下限值以上，黏固（anchor）效果發揮作用而能夠提高與基板的接著性。 又，藉由將表面粗糙度設為上述上限值以下，能夠在與基板B接合時，有效地抑制由包含氣泡等而接合引起之孔隙等缺陷的發生。 〔Ra〕 In the filler-containing layer of the present invention, the surface roughness of the surface opposite to the substrate A, that is, Ra, is preferably 10 nm or more and 1.5 μm or less. The upper limit is preferably 1 μm or less, more preferably 500 nm or less, still more preferably 300 nm or less, still more preferably 200 nm or less, still more preferably 150 nm or less, and still more preferably 120 nm or less. The surface roughness (Ra) of the filler-containing layer of the present invention is obtained based on the measurement method shown in Examples described later. By setting the surface roughness of the filler-containing layer to be equal to or greater than the above-mentioned lower limit value, an anchor effect works and the adhesiveness with the substrate can be improved. In addition, by making the surface roughness below the above upper limit, it is possible to effectively suppress the occurrence of defects such as voids caused by bonding including air bubbles and the like when bonding to the substrate B.

＜接合步驟＞ 本發明的接合體之製造方法包括將上述積層體的具有含填充劑層之面和上述基板B進行接合之步驟。 藉由接合而基板A中的凸部與基板B中的配線端子被電接合。 藉由包括加熱及加壓中的至少一者之方法來進行接合為較佳，藉由包括加熱及加壓之方法來進行為更佳。 接合時的溫度係100℃以上為較佳，150℃以上為更佳，180℃以上為進一步較佳。作為上限，450℃以下為較佳，400℃以下為更佳，350℃以下為進一步較佳，300℃以下為更進一步較佳，280℃以下為更進一步較佳，260℃以下為進而更進一步較佳，250℃以下為進而更進一步較佳。如上所述，考慮到使導通路熔融且能夠與電極之間接合，該溫度係導通路的熔點附近的溫度為較佳。由於依據本發明的接合體之製造方法，能夠降低該接合溫度，因此能夠降低製造成本，並且在不損害元件的各構件的觀點上是有效的。 接合步驟中的加熱時間並沒有特別限定，30秒以上為較佳，1分鐘以上為更佳，2分鐘以上為進一步較佳。作為上限，實際上為30分鐘以下。 加熱時的環境並沒有特別限定，在減壓環境下，一邊將含填充劑層機械加壓一邊進行為較佳。作為環境壓力，1×10 -5mbar以上為較佳，1×10 -4mbar以上為更佳，5×10 -4mbar以上為進一步較佳。作為上限，0.1mbar以下為較佳，1×10 -2mbar以下為更佳，5×10 -3mbar以下為進一步較佳。 夾持2個基板（基板A及基板B）來進行接合為較佳，此時對基板施加壓力為較佳。施加到基板的壓力係1kN以上為較佳，5kN以上為更佳，10kN以上為進一步較佳。作為上限，實際上為100kN以下。接合步驟中所使用之裝置並沒有特別限定，能夠較佳地利用在電子零件的回流中所使用之裝置。 <Joining Step> The method for producing a bonded body of the present invention includes the step of bonding the surface of the laminate having the filler-containing layer and the substrate B above. The protrusions on the substrate A and the wiring terminals on the substrate B are electrically joined by bonding. Bonding is preferably performed by a method including at least one of heating and pressure, and more preferably performed by a method including heating and pressure. The temperature at the time of bonding is preferably 100°C or higher, more preferably 150°C or higher, and still more preferably 180°C or higher. The upper limit is preferably 450°C or lower, more preferably 400°C or lower, still more preferably 350°C or lower, still more preferably 300°C or lower, still more preferably 280°C or lower, still more preferably 260°C or lower. Preferably, 250° C. or less is further more preferably. As described above, this temperature is preferably a temperature near the melting point of the conduction passage in consideration of melting the conduction passage and enabling bonding between electrodes. According to the method of manufacturing a bonded body of the present invention, since the bonding temperature can be lowered, the manufacturing cost can be reduced, and it is effective from the viewpoint of not damaging each member of the device. The heating time in the bonding step is not particularly limited, but is preferably at least 30 seconds, more preferably at least 1 minute, and still more preferably at least 2 minutes. As an upper limit, it is actually 30 minutes or less. The environment at the time of heating is not particularly limited, and it is preferable to perform the heating while mechanically pressing the filler-containing layer under a reduced pressure environment. The ambient pressure is preferably at least 1×10 -5 mbar, more preferably at least 1×10 -4 mbar, and still more preferably at least 5×10 -4 mbar. The upper limit is preferably at most 0.1 mbar, more preferably at most 1×10 -2 mbar, and still more preferably at most 5×10 -3 mbar. It is preferable to clamp two substrates (substrate A and substrate B) to join, and it is preferable to apply pressure to the substrates at this time. The pressure applied to the substrate is preferably 1 kN or higher, more preferably 5 kN or higher, and still more preferably 10 kN or higher. As an upper limit, it is actually 100 kN or less. The device used in the bonding step is not particularly limited, and a device used for reflow of electronic components can be preferably used.

＜其他步驟＞ 另外，本發明的接合體之製造方法並不妨礙在上述中規定之各步驟之間插入其他步驟。又，作為接合步驟，以將基板A和基板B面對面地對峙接合之例子為中心進行了說明，但亦可以設為將複數個基板B相對於基板A並聯地配置並接著之形態。或者，亦可以舉出並列設置具有相應厚度的基板A和基板B並將其側面彼此進行接合之形態等。 ＜Other steps＞ In addition, the method for producing a bonded body of the present invention does not prevent other steps from being inserted between the steps specified above. In addition, as the bonding step, the example in which the substrate A and the substrate B are face-to-face and face-to-face is described, but a plurality of substrates B may be arranged in parallel with respect to the substrate A and bonded. Alternatively, a form in which the substrate A and the substrate B having corresponding thicknesses are arranged in parallel and their side surfaces are bonded to each other, etc. may also be mentioned.

＜接合體之製造方法的例子＞ 以下，使用圖對接合體之製造方法的一例進行說明。 圖2係示意性地用剖面圖表示藉由本發明的一實施形態之接合體之製造方法接著基板時之步驟（一部分）之步驟說明圖。首先，準備在矽晶圓1x中配設電子電路區域8，並且在其中附帶電極3及導通路31（凸部30）之基板A（基底基板）1（圖2的（a））。在基板A1的電子電路區域8的內部已形成有由導體或者半導體構成之電子電路81。形成電子電路之方法並沒有特別限制，能夠藉由指定方法來形成。又，電子電路的結構或構件亦並沒有特別限定，例如，可以舉出電晶體及使其導通到電極之配線結構。 ＜Example of manufacturing method of joint body＞ Hereinafter, an example of a method of manufacturing a bonded body will be described with reference to the drawings. FIG. 2 is a process explanatory view schematically showing a step (part) of bonding a substrate by a method of manufacturing a bonded body according to an embodiment of the present invention in a cross-sectional view. First, a substrate A (base substrate) 1 in which an electronic circuit region 8 is arranged on a silicon wafer 1 x and electrodes 3 and conduction paths 31 (protrusions 30 ) are provided therein is prepared ( FIG. 2( a )). An electronic circuit 81 made of a conductor or a semiconductor is formed inside the electronic circuit region 8 of the substrate A1. The method of forming an electronic circuit is not particularly limited, and it can be formed by a specified method. Also, the structure or components of the electronic circuit are not particularly limited, for example, a transistor and a wiring structure for conducting it to an electrode can be mentioned.

在上述基板A1的配置電極之面（具有電子電路區域之面）P0上適用樹脂組成物而形成由樹脂組成物構成之層（樹脂組成物層）4（圖2的（b））。在本實施形態中，作為在樹脂組成物層中使用聚醯亞胺前驅物之例子而示出。可以以該狀態加熱並乾燥樹脂組成物層（乾燥步驟）。又，在預烘烤之後，可以藉由光微影或離子濺射等而圖案化樹脂組成物層4。A layer (resin composition layer) 4 made of the resin composition is formed by applying a resin composition to the electrode-arranged surface (the surface having the electronic circuit region) P0 of the substrate A1 ( FIG. 2( b )). In this embodiment, an example of using a polyimide precursor in the resin composition layer is shown. The resin composition layer may be heated and dried in this state (drying step). Also, after the prebaking, the resin composition layer 4 can be patterned by photolithography or ion sputtering.

然後，在本實施形態中，照射紫外線並將聚合物前驅物進行交聯和加熱（加熱步驟2）而促進環化並作為經硬化之含填充劑層41（圖2的（c））。藉此，在基板A1中形成配設有含填充劑層41之含填充劑層配設基板1y。如該例所示，含填充劑層41可以藉由硬化而與樹脂組成物層4比較來收縮。雖然在圖式中稍微誇張地表示，但收縮率並沒有特別限定，可以係更小的收縮率，或者不藉由硬化而收縮。另外，可以在硬化之前圖案化而在圖案化部藉由電鍍等製作導通路。Then, in the present embodiment, cyclization is promoted by irradiating ultraviolet rays to cross-link and heat the polymer precursor (heating step 2) to form a hardened filler-containing layer 41 ( FIG. 2( c )). Thereby, the filler-containing layer arrangement|positioning board|substrate 1y in which the filler-containing layer 41 is arrange|positioned is formed in the board|substrate A1. As shown in this example, the filler-containing layer 41 can shrink compared with the resin composition layer 4 by curing. Although shown in a slightly exaggerated manner in the drawings, the shrinkage rate is not particularly limited, and may be a smaller shrinkage rate or shrink without hardening. In addition, patterning may be performed before curing, and conductive paths may be formed in the patterned portion by plating or the like.

在本實施形態的含填充劑層配設基板1y中，導通路31的高度h1、h2存在偏差。又，含填充劑層的表面4a亦呈波浪狀，不是平坦的狀態。在本實施形態中，為了消除這種導通路31的高度的偏差，使其前端表面露出，並且將含填充劑層的表面設為平坦而進行平坦化。In the filler-containing layer arrangement substrate 1y of this embodiment, the heights h1 and h2 of the conduction paths 31 vary. In addition, the surface 4a of the filler-containing layer is also wavy and not flat. In the present embodiment, in order to eliminate such variations in the height of the conduction path 31 , the front end surface is exposed, and the surface of the filler-containing layer is flattened for planarization.

圖3中示出平坦化後的含填充劑層配設基板（積層體）1z。在該含填充劑層的表面4b，導通路31的前端31a露出，在含填充劑層的表面4b的整體被平坦化。FIG. 3 shows a planarized filler-containing layer arrangement substrate (laminated body) 1z. On the surface 4b of the filler-containing layer, the tip 31a of the conductive path 31 is exposed, and the entirety of the surface 4b of the filler-containing layer is flattened.

對於積層體（被平坦化之含填充劑層配設基板）1z，另外準備基板B（圖4的（a））。基板B2具備具有通孔電極2y之矽晶圓2x、具有在其中配設之電路配線81之電路配線區域8及形成於電路配線區域8內之電極32。此時，定位（對準）成積層體的導通路31的部分與設置於基板B2上之電極32一致。For the laminate (planarized filler-containing layer arrangement substrate) 1z, a substrate B is separately prepared ( FIG. 4( a )). The substrate B2 includes a silicon wafer 2x having a through-hole electrode 2y, a circuit wiring region 8 having a circuit wiring 81 arranged therein, and an electrode 32 formed in the circuit wiring region 8 . At this time, the portion of the conduction path 31 that is positioned (aligned) in the laminate coincides with the electrode 32 provided on the substrate B2.

接著，在本實施形態中，經由含填充劑層41使被定位之基板B2與積層體1z在接合面P1抵接而接合（圖4的（b））。 藉此，形成2個基板接合之接合體100。藉由以該狀態進行加熱處理（回流）而能夠熔融導通路31，並且經由導通路31使基板A側的電極3與基板B側的電極32電連接（接合步驟）。 與此同時，藉由上述加熱而使含填充劑層41軟化，並且使積層體1z的含填充劑層表面4b與基板B的表面（具有電子電路區域之面）2a接著而形成接合體100。 藉此，能夠進行基板A與基板B之間的電連接，並且實現兩者牢固的固定狀態。 在本說明書中，有時將上述電極3與導通路31一併稱為凸部30。有時將基板B的電極32稱為焊盤。 Next, in the present embodiment, the positioned substrate B2 and the laminate 1z are brought into contact on the bonding surface P1 via the filler-containing layer 41 to be bonded ( FIG. 4( b )). Thus, a bonded body 100 in which two substrates are bonded is formed. By performing heat treatment (reflow) in this state, the conductive path 31 can be melted, and the electrode 3 on the substrate A side and the electrode 32 on the substrate B side can be electrically connected via the conductive path 31 (bonding step). At the same time, the filler-containing layer 41 is softened by the heating, and the filler-containing layer surface 4 b of the laminate 1 z is bonded to the surface 2 a of the substrate B (the surface having the electronic circuit region) to form the bonded body 100 . Thereby, the electrical connection between the substrate A and the substrate B can be performed, and both can be firmly fixed. In this specification, the electrode 3 and the conduction path 31 may be collectively referred to as the convex portion 30 . The electrodes 32 of the substrate B are sometimes referred to as pads.

本發明的較佳實施形態中，由於含填充劑層41包含填充劑，因此導熱性優異。故，例如，從電子電路區域8產生之熱量能夠經由含填充劑層41來散熱。 又，在本發明的較佳的實施形態中，由於積層體1z的含填充劑層表面P1的平坦度高，因此能夠獲得在抵接面的與基板B2的緻密且準確的抵接狀態。藉由實現更緻密且準確的抵接狀態，能夠有效地抑制容易在抵接面產生之孔隙。 In a preferred embodiment of the present invention, since the filler-containing layer 41 contains a filler, it is excellent in thermal conductivity. Therefore, for example, heat generated from the electronic circuit region 8 can be dissipated via the filler-containing layer 41 . Also, in a preferred embodiment of the present invention, since the filler-containing layer surface P1 of the laminate 1z has high flatness, a dense and accurate contact state with the substrate B2 can be obtained on the contact surface. By realizing a denser and more accurate contact state, it is possible to effectively suppress pores that are easily generated on the contact surface.

（半導體器件之製造方法） 本發明的半導體器件具備藉由本發明的接合體之製造方法而獲得之接合體。 作為半導體器件，例如，可以舉出半導體新技術研究會編“圖解 所有最先進半導體封裝技術”Kogyo Chosakai Publishing Co.,Ltd.pp.8-19、110-114、160-165、關東學院大學表面光學研究所編“圖解 所有表面處理技術”Kogyo Chosakai Publishing Co.,Ltd.pp.32-41、56-59中記載之各半導體器件等。 具體而言，可以舉出將上述含填充劑層用作代替為晶片間的底部填充劑之接著薄膜之態樣，或將上述含填充劑層用作固定晶片之晶粒黏合膜之態樣。 此外，本發明的接合體之製造方法能夠在LED（LightEmittingDiode：發光二極體）的元件的安裝、平板顯示器的光學元件的安裝、功率半導體封裝的安裝等，多種領域中應用。 又，例如，本發明的接合體之製造方法還能夠較佳地利用於設置了貫通電極（TSV：Through silicon via，矽穿孔）之半導體元件的三維安裝中。 圖5係示意性地表示三維安裝器件的剖面圖。在本實施形態中，積層了複數個半導體元件（半導體晶片）101a～101d之積層體101配置於配線基板120上。複數個半導體元件101a～101d均由矽基板等半導體晶圓構成。積層體101具有將不具有貫通電極之半導體元件101a和具有貫通電極102b～102d之半導體元件101b～101d進行倒裝晶片接合之結構。具有貫通電極之半導體元件側的連接焊盤用焊錫凸塊等金屬凸塊103a、103b、103c連接。在各半導體元件101a～101d的間隙中，形成有樹脂層110。作為該積層體之製造方法，能夠利用本發明的接合體之製造方法。亦即，例如，能夠將樹脂層110中的至少一個（較佳為全部）設為上述含填充劑層。配線基板120的一個面上設置有表面電極120a。在配線基板120與積層體（基板/基板積層體）101之間，配置有形成有重新配線層105之絕緣層115。重新配線層105的一端經由焊錫凸塊等金屬凸塊103d而連接到在半導體元件101d的重新配線層105側的面上形成之電極焊盤（electrode pad）。又，重新配線層105的另一端經由焊錫凸塊等金屬凸塊103e而與配線基板的表面電極120a連接。在絕緣層115與積層體101之間，形成有樹脂層110a。在接合該絕緣層115與積層體101時亦能夠使用本發明的接合體之製造方法。亦即，例如，能夠將樹脂層110a設為上述含填充劑層。又，在絕緣層115與配線基板120之間，形成有樹脂層110b。在接合該絕緣層115與配線基板120時亦能夠使用本發明的接合體之製造方法。亦即，例如，能夠將樹脂層110b設為上述含填充劑層。 (Manufacturing method of semiconductor device) The semiconductor device of the present invention includes a bonded body obtained by the method for producing a bonded body of the present invention. As semiconductor devices, for example, "Illustrating All State-of-the-Art Semiconductor Packaging Technology" edited by the Society for Advanced Semiconductor Technology, Kogyo Chosakai Publishing Co., Ltd.pp.8-19, 110-114, 160-165, Kanto Gakuin University Surface Semiconductor devices, etc. described in "Illustrating All Surface Treatment Technologies" Kogyo Chosakai Publishing Co., Ltd. pp. 32-41, 56-59 edited by the Institute of Optics. Specifically, an aspect in which the above-mentioned filler-containing layer is used as an adhesive film instead of an underfill between chips, or an aspect in which the above-mentioned filler-containing layer is used as a die bonding film for fixing a chip can be mentioned. In addition, the manufacturing method of the junction body of the present invention can be applied to various fields such as mounting of LED (Light Emitting Diode: Light Emitting Diode) elements, mounting of optical elements of flat panel displays, and mounting of power semiconductor packages. Also, for example, the method for manufacturing a bonded body of the present invention can also be suitably utilized in three-dimensional mounting of a semiconductor element provided with a through electrode (TSV: Through silicon via). Fig. 5 is a cross-sectional view schematically showing a three-dimensionally mounted device. In the present embodiment, the laminated body 101 in which a plurality of semiconductor elements (semiconductor wafers) 101 a to 101 d are laminated is arranged on a wiring board 120 . The plurality of semiconductor elements 101a to 101d are all composed of semiconductor wafers such as silicon substrates. The laminated body 101 has a structure in which a semiconductor element 101a having no penetration electrodes and semiconductor elements 101b to 101d having penetration electrodes 102b to 102d are flip-chip bonded. Connection pads on the side of the semiconductor element having through electrodes are connected by metal bumps 103a, 103b, 103c such as solder bumps. A resin layer 110 is formed in the gaps between the respective semiconductor elements 101a to 101d. As a method for producing this laminate, the method for producing a bonded body of the present invention can be utilized. That is, for example, at least one (preferably all) of the resin layers 110 can be used as the aforementioned filler-containing layer. A surface electrode 120 a is provided on one surface of the wiring board 120 . Between the wiring board 120 and the laminate (substrate/substrate laminate) 101, the insulating layer 115 on which the rewiring layer 105 is formed is arranged. One end of the rewiring layer 105 is connected to an electrode pad formed on the surface of the semiconductor element 101d on the rewiring layer 105 side via a metal bump 103d such as a solder bump. In addition, the other end of the rewiring layer 105 is connected to the surface electrode 120a of the wiring board via a metal bump 103e such as a solder bump. A resin layer 110 a is formed between the insulating layer 115 and the laminate 101 . The method for producing a bonded body of the present invention can also be used when bonding the insulating layer 115 and the laminated body 101 . That is, for example, the resin layer 110a can be used as the filler-containing layer described above. Furthermore, a resin layer 110 b is formed between the insulating layer 115 and the wiring board 120 . The method for producing a bonded body of the present invention can also be used when bonding the insulating layer 115 and the wiring board 120 . That is, for example, the resin layer 110b can be used as the filler-containing layer described above.

（樹脂組成物） 本發明的樹脂組成物係使用於本發明的接合體之製造方法中的上述含填充劑層的形成之樹脂組成物。 以下，對本發明的接合體之製造方法中的使用於上述含填充劑層的形成之樹脂組成物（亦即，本發明的樹脂組成物）的詳細內容進行說明。 (resin composition) The resin composition of the present invention is a resin composition used in the formation of the above-mentioned filler-containing layer in the method for producing a bonded body of the present invention. Hereinafter, the details of the resin composition used in the formation of the above-mentioned filler-containing layer (that is, the resin composition of the present invention) in the method for producing a bonded body of the present invention will be described.

本發明的樹脂組成物包含選自包括黏合劑及黏合劑的前驅物之群組中的至少一種樹脂及填充劑。 關於填充劑，如上述本發明的樹脂組成物所示。其中，將相對於含填充劑層的總質量這一記載換作相對於樹脂組成物的總固體成分。 The resin composition of the present invention includes at least one resin and a filler selected from the group including binders and binder precursors. The filler is as described above for the resin composition of the present invention. Here, the description relative to the total mass of the filler-containing layer is replaced with relative to the total solid content of the resin composition.

作為黏合劑，可以舉出下述環化樹脂或其前驅物、或者其他樹脂，但是包含選自包括環化樹脂及其前驅物之群組中的至少一種樹脂（以下，亦稱為“特定樹脂”）為較佳，包含環化樹脂的前驅物為更佳。As the binder, the following cyclized resins or their precursors, or other resins can be mentioned, but at least one resin selected from the group including cyclized resins and their precursors (hereinafter also referred to as "specific resins") is included. ”) is preferred, and a precursor comprising a cyclized resin is more preferred.

＜特定樹脂＞ 本發明的樹脂組成物包含選自包括環化樹脂及其前驅物之群組中的至少一種樹脂（特定樹脂）為較佳。 環化樹脂係在主鏈結構中包含醯亞胺環結構或㗁唑環結構之樹脂為較佳。 在本發明中，主鏈係指在樹脂分子中相對最長的結合鏈。 作為環化樹脂，可以舉出聚醯亞胺、聚苯并㗁唑、聚醯胺醯亞胺等。 環化樹脂的前驅物係指藉由外部刺激而化學結構發生變化以成為環化樹脂之樹脂，藉由熱量而化學結構發生變化以成為環化樹脂之樹脂為較佳，藉由熱量而發生閉環反應而形成環結構以成為環化樹脂之樹脂為更佳。 作為環化樹脂的前驅物，可以舉出聚醯亞胺前驅物、聚苯并㗁唑前驅物、聚醯胺醯亞胺前驅物等。 亦即，本發明的樹脂組成物作為特定樹脂而包含選自包括聚醯亞胺、聚醯亞胺前驅物、聚苯并㗁唑、聚苯并㗁唑前驅物、聚醯胺醯亞胺及聚醯胺醯亞胺前驅物之群組中的至少一種樹脂（特定樹脂）為較佳。 本發明的樹脂組成物作為特定樹脂而包含聚醯亞胺或聚醯亞胺前驅物為較佳。 又，特定樹脂具有聚合性基為較佳，包含自由基聚合性基為更佳。 特定樹脂具有自由基聚合性基之情況下，本發明的樹脂組成物包含後述的自由基聚合起始劑為較佳，包含後述的自由基聚合起始劑並且包含後述的自由基交聯劑為更佳。此外，能夠依據需要而包含後述的敏化劑。由這種本發明的樹脂組成物例如形成負型感光膜。 又，特定樹脂可以具有酸分解性基等極性轉換基。 特定樹脂具有酸分解性基之情況下，本發明的樹脂組成物包含後述光酸產生劑為較佳。由這種本發明的樹脂組成物例如形成化學增幅型的正型感光膜或負型感光膜。 ＜Specific resin＞ The resin composition of the present invention preferably contains at least one resin (specific resin) selected from the group consisting of cyclized resins and their precursors. The cyclized resin is preferably a resin containing an imide ring structure or an oxazole ring structure in the main chain structure. In the present invention, the main chain refers to the relatively longest bonded chain in the resin molecule. Examples of the cyclized resin include polyimide, polybenzoxazole, polyamideimide, and the like. The precursor of the cyclized resin refers to the resin whose chemical structure is changed by external stimuli to become a cyclized resin. The resin whose chemical structure is changed by heat to become a cyclized resin is better, and the ring is closed by heat. It is more preferable to react to form a ring structure to become a cyclized resin. Examples of the precursor of the cyclized resin include polyimide precursors, polybenzoxazole precursors, polyamideimide precursors, and the like. That is, the resin composition of the present invention contains, as a specific resin, selected from the group consisting of polyimide, polyimide precursor, polybenzoxazole, polybenzoxazole precursor, polyamideimide, and At least one resin (specific resin) in the group of polyamideimide precursors is preferable. It is preferable that the resin composition of this invention contains polyimide or a polyimide precursor as a specific resin. Moreover, it is preferable that a specific resin has a polymerizable group, and it is more preferable that it contains a radical polymerizable group. When the specific resin has a radical polymerizable group, it is preferable that the resin composition of the present invention contains the radical polymerization initiator described later, and the radical polymerization initiator described later and the radical crosslinking agent described later are better. Moreover, the sensitizer mentioned later can be contained as needed. A negative photosensitive film is formed from such a resin composition of the present invention, for example. In addition, the specific resin may have a polarity conversion group such as an acid decomposable group. When a specific resin has an acid-decomposable group, it is preferable that the resin composition of this invention contains the photoacid generator mentioned later. From the resin composition of the present invention, for example, a chemically amplified positive photosensitive film or a negative photosensitive film is formed.

〔聚醯亞胺前驅物〕 關於本發明中使用之聚醯亞胺前驅物，其種類等並沒有特別規定，但包含下述式（2）所表示之重複單元為較佳。 [化學式1]

Figure 02_image001
式（2）中，A 1及A 2分別獨立地表示氧原子或-NH-，R 111表示2價的有機基團，R 115表示4價的有機基團，R 113及R 114分別獨立地表示氫原子或1價的有機基團。 [Polyimide Precursor] The type of the polyimide precursor used in the present invention is not particularly limited, but it preferably contains a repeating unit represented by the following formula (2). [chemical formula 1]
Figure 02_image001
In formula (2), A 1 and A 2 independently represent an oxygen atom or -NH-, R 111 represents a divalent organic group, R 115 represents a tetravalent organic group, R 113 and R 114 independently represents a hydrogen atom or a monovalent organic group.

式（2）中的A 1及A 2分別獨立地表示氧原子或-NH-，氧原子為較佳。 式（2）中的R 111表示2價的有機基團。作為2價的有機基團，可以例示出包含直鏈或支鏈的脂肪族基、環狀的脂肪族基及芳香族基之基團，碳數2～20的直鏈或支鏈的脂肪族基、碳數3～20的環狀的脂肪族基、碳數3～20的芳香族基或由該等的組合構成之基團為較佳，包含碳數6～20的芳香族基之基團為更佳。上述直鏈或支鏈的脂肪族基的鏈中的烴基可以被包含雜原子之基團取代，上述環狀的脂肪族基及芳香族基的環員的烴基可以被包含雜原子之基團取代。作為本發明的較佳實施形態，可以例示出-Ar-及-Ar-L-Ar-所表示之基團，特佳為-Ar-L-Ar-所表示之基團。其中，Ar分別獨立地係芳香族基，L係單鍵、或可以被氟原子取代之碳數1～10的脂肪族烴基、-O-、-CO-、-S-、-SO 2-或-NHCO-或由上述中的2個以上的組合構成之基團。該等的較佳範圍如上所述。 A 1 and A 2 in the formula (2) each independently represent an oxygen atom or -NH-, preferably an oxygen atom. R 111 in formula (2) represents a divalent organic group. Examples of divalent organic groups include straight-chain or branched aliphatic groups, cyclic aliphatic groups, and aromatic groups, and straight-chain or branched aliphatic groups having 2 to 20 carbon atoms. group, a cyclic aliphatic group with 3 to 20 carbons, an aromatic group with 3 to 20 carbons, or a combination of these groups is preferred, and a group including an aromatic group with 6 to 20 carbons Group is better. The hydrocarbon group in the chain of the above-mentioned linear or branched aliphatic group may be substituted by a group containing a heteroatom, and the hydrocarbon group of the above-mentioned cyclic aliphatic group and aromatic group may be substituted by a group containing a heteroatom . As a preferred embodiment of the present invention, groups represented by -Ar- and -Ar-L-Ar- can be exemplified, and groups represented by -Ar-L-Ar- are particularly preferred. Among them, Ar is independently an aromatic group, L is a single bond, or an aliphatic hydrocarbon group with 1 to 10 carbons that may be substituted by a fluorine atom, -O-, -CO-, -S-, -SO 2 - or -NHCO- or a group consisting of a combination of two or more of the above. Such preferred ranges are as described above.

R 111衍生自二胺為較佳。作為聚醯亞胺前驅物的製造中所使用之二胺，可以舉出直鏈或支鏈脂肪族、環狀脂肪族或芳香族二胺等。二胺可以僅使用1種，亦可以使用2種以上。 具體而言，包含碳數2～20的直鏈或支鏈的脂肪族基、碳數3～20的環狀的脂肪族基、碳數3～20的芳香族基或由該等的組合構成之基團之二胺為較佳，包含碳數6～20的芳香族基之二胺為更佳。上述直鏈或支鏈的脂肪族基的鏈中的烴基可以被包含雜原子之基團取代，上述環狀的脂肪族基及芳香族基的環員的烴基可以被包含雜原子之基團取代。作為包含芳香族基之基的例子，可以舉出如下。 R 111 is preferably derived from a diamine. Examples of the diamine used in the production of the polyimide precursor include linear or branched aliphatic, cyclic aliphatic, or aromatic diamines. Diamine may use only 1 type, and may use 2 or more types. Specifically, it includes a straight-chain or branched aliphatic group having 2 to 20 carbons, a cyclic aliphatic group having 3 to 20 carbons, an aromatic group having 3 to 20 carbons, or a combination thereof The diamine of the group is preferable, and the diamine containing the aromatic group of 6-20 carbons is more preferable. The hydrocarbon group in the chain of the above-mentioned linear or branched aliphatic group may be substituted by a group containing a heteroatom, and the hydrocarbon group of the above-mentioned cyclic aliphatic group and aromatic group may be substituted by a group containing a heteroatom . Examples of groups containing aromatic groups include the following.

[化學式2]

Figure 02_image003
式中，A表示單鍵或2價的連接基，係單鍵或選自可以被氟原子取代之碳數1～10的脂肪族烴基、-O-、-C（=O）-、-S-、-SO 2-、-NHCO-或該等的組合中之基團為較佳，單鍵或選自可以被氟原子取代之碳數1～3的伸烷基、-O-、-C（=O）-、-S-或-SO 2-中之基圖為更佳，-CH 2-、-O-、-S-、-SO 2-、-C（CF 3） 2-或-C（CH 3） 2-為進一步較佳。 式中，*表示與其他結構的鍵結部位。 [chemical formula 2]
Figure 02_image003
In the formula, A represents a single bond or a divalent linking group, which is a single bond or is selected from aliphatic hydrocarbon groups with 1 to 10 carbons that may be substituted by fluorine atoms, -O-, -C(=O)-, -S -, -SO 2 -, -NHCO- or the combination of these groups are preferred, single bond or selected from C1-3 alkylene groups which may be substituted by fluorine atoms, -O-, -C (=O)-, -S- or -SO 2 - is better, -CH 2 -, -O-, -S-, -SO 2 -, -C(CF 3 ) 2 - or - C(CH 3 ) 2 - is further preferred. In the formula, * represents a bonding site with other structures.

作為二胺，具體而言，可以舉出選自1,2-二胺基乙烷、1,2-二胺基丙烷、1,3-二胺基丙烷、1,4-二胺基丁烷或1,6-二胺基己烷；1,2-或1,3-二胺基環戊烷、1,2-、1,3-或1,4-二胺基環己烷、1,2-、1,3-或1,4-雙（胺基甲基）環己烷、雙-（4-胺基環己基）甲烷、雙-（3-胺基環己基）甲烷、4,4’-二胺基-3,3’-二甲基環己基甲烷或異氟爾酮二胺；間苯二胺或對苯二胺、二胺基甲苯、4,4’-或3,3’-二胺基聯苯、4,4’-二胺基二苯醚、3,3-二胺基二苯醚、4,4’-或3,3’-二胺基二苯基甲烷、4,4’-或3,3’-二胺基二苯基碸、4,4’-或3,3’-二胺基二苯硫醚、4,4’-或3,3’-二胺基二苯甲酮、3,3’-二甲基-4,4’-二胺基聯苯、2,2’-二甲基-4,4’-二胺基聯苯、3,3’-二甲氧基-4,4’-二胺基聯苯、2,2-雙（4-胺基苯基）丙烷、2,2-雙（4-胺基苯基）六氟丙烷、2,2-雙（3-羥基-4-胺基苯基）丙烷、2,2-雙（3-羥基-4-胺基苯基）六氟丙烷、2,2-雙（3-胺基-4-羥基苯基）丙烷、2,2-雙（3-胺基-4-羥基苯基）六氟丙烷、雙（3-胺基-4-羥基苯基）碸、雙（4-胺基-3-羥基苯基）碸、4,4’-二胺基對聯三苯、4,4’-雙（4-胺基苯氧基）聯苯、雙[4-（4-胺基苯氧基）苯基]碸、雙[4-（3-胺基苯氧基）苯基]碸、雙[4-（2-胺基苯氧基）苯基]碸、1,4-雙（4-胺基苯氧基）苯、9,10-雙（4-胺基苯基）蒽、3,3’-二甲基-4,4’-二胺基二苯基碸、1,3-雙（4-胺基苯氧基）苯、1,3-雙（3-胺基苯氧基）苯、1,3-雙（4-胺基苯基）苯、3,3’-二乙基-4,4’-二胺基二苯基甲烷、3,3’-二甲基-4,4’-二胺基二苯甲烷、4,4’-二胺基八氟聯苯、2,2-雙[4-（4-胺基苯氧基）苯基]丙烷、2,2-雙[4-（4-胺基苯氧基）苯基]六氟丙烷、9,9-雙（4-胺基苯基）-10-氫蒽、3,3’,4,4’-四胺基聯苯、3,3’,4,4’-四胺基二苯醚、1,4-二胺基蒽醌、1,5-二胺基蒽醌、3,3-二羥基-4,4’-二胺基聯苯、9,9’-雙（4-胺基苯基）茀、4,4’-二甲基-3,3’-二胺基二苯基碸、3,3’,5,5’-四甲基-4,4’-二胺基二苯基甲烷、2,4-或2,5-二胺基異丙苯、2,5-二甲基-對苯二胺、乙胍𠯤、2,3,5,6-四甲基-對苯二胺、2,4,6-三甲基-間苯二胺、雙（3-胺基丙基）四甲基二矽氧烷、雙（對胺基苯基）八甲基五矽氧烷、2,7-二胺基茀、2,5-二胺基吡啶、1,2-雙（4-胺基苯基）乙烷、二胺基苯甲醯苯胺、二胺基苯甲酸的酯、1,5-二胺基萘、二胺基三氟甲苯、1,3-雙（4-胺基苯基）六氟丙烷、1,4-雙（4-胺基苯基）八氟丁烷、1,5-雙（4-胺基苯基）十氟戊烷、1,7-雙（4-胺基苯基）十四氟庚烷、2,2-雙[4-（3-胺基苯氧基）苯基]六氟丙烷、2,2-雙[4-（2-胺基苯氧基）苯基]六氟丙烷、2,2-雙[4-（4-胺基苯氧基）-3,5-二甲基苯基]六氟丙烷、2,2-雙[4-（4-胺基苯氧基）-3,5-雙（三氟甲基）苯基]六氟丙烷、對雙（4-胺基-2-三氟甲基苯氧基）苯、4,4’-雙（4-胺基-2-三氟甲基苯氧基）聯苯、4,4’-雙（4-胺基-3-三氟甲基苯氧基）聯苯、4,4’-雙（4-胺基-2-三氟甲基苯氧基）二苯基碸、4,4’-雙（3-胺基-5-三氟甲基苯氧基）二苯基碸、2,2-雙[4-（4-胺基-3-三氟甲基苯氧基）苯基]六氟丙烷、3,3’,5,5’-四甲基-4,4’-二胺基聯苯、4,4’-二胺基-2,2’-雙（三氟甲基）聯苯、2,2’,5,5’,6,6’-六氟三𠯤及4,4’-二胺基對聯四苯中的至少一種二胺。As the diamine, specifically, 1,2-diaminoethane, 1,2-diaminopropane, 1,3-diaminopropane, 1,4-diaminobutane or 1,6-diaminohexane; 1,2- or 1,3-diaminocyclopentane, 1,2-, 1,3- or 1,4-diaminocyclohexane, 1, 2-, 1,3- or 1,4-bis(aminomethyl)cyclohexane, bis-(4-aminocyclohexyl)methane, bis-(3-aminocyclohexyl)methane, 4,4 '-Diamino-3,3'-dimethylcyclohexylmethane or isophoronediamine; m- or p-phenylenediamine, diaminotoluene, 4,4'- or 3,3' -Diaminobiphenyl, 4,4'-diaminodiphenyl ether, 3,3-diaminodiphenyl ether, 4,4'- or 3,3'-diaminodiphenylmethane, 4 ,4'- or 3,3'-diaminodiphenylsulfide, 4,4'- or 3,3'-diaminodiphenylsulfide, 4,4'- or 3,3'-diamine benzophenone, 3,3'-dimethyl-4,4'-diaminobiphenyl, 2,2'-dimethyl-4,4'-diaminobiphenyl, 3,3' -Dimethoxy-4,4'-diaminobiphenyl, 2,2-bis(4-aminophenyl)propane, 2,2-bis(4-aminophenyl)hexafluoropropane, 2 ,2-bis(3-hydroxy-4-aminophenyl)propane, 2,2-bis(3-hydroxy-4-aminophenyl)hexafluoropropane, 2,2-bis(3-amino- 4-hydroxyphenyl)propane, 2,2-bis(3-amino-4-hydroxyphenyl)hexafluoropropane, bis(3-amino-4-hydroxyphenyl)propane, bis(4-amino -3-Hydroxyphenyl) p-terphenyl, 4,4'-diamino-terphenyl, 4,4'-bis(4-aminophenoxy)biphenyl, bis[4-(4-aminophenoxy base) phenyl] phenyl], bis[4-(3-aminophenoxy)phenyl] phenyl, bis[4-(2-aminophenoxy)phenyl] -Aminophenoxy)benzene, 9,10-bis(4-aminophenyl)anthracene, 3,3'-dimethyl-4,4'-diaminodiphenyl anthracene, 1,3- Bis(4-aminophenoxy)benzene, 1,3-bis(3-aminophenoxy)benzene, 1,3-bis(4-aminophenoxy)benzene, 3,3'-diethyl Base-4,4'-diaminodiphenylmethane, 3,3'-dimethyl-4,4'-diaminodiphenylmethane, 4,4'-diaminooctafluorobiphenyl, 2 ,2-bis[4-(4-aminophenoxy)phenyl]propane, 2,2-bis[4-(4-aminophenoxy)phenyl]hexafluoropropane, 9,9-bis (4-aminophenyl)-10-hydroanthracene, 3,3',4,4'-tetraaminobiphenyl, 3,3',4,4'-tetraaminodiphenyl ether, 1,4 -Diaminoanthraquinone, 1,5-diaminoanthraquinone, 3,3-dihydroxy-4,4'-diaminobiphenyl, 9,9'-bis(4-aminophenyl) terpine , 4,4'-Dimethyl-3,3'-diaminodiphenylmethane, 3,3',5,5'-tetramethyl-4,4'-diaminodiphenylmethane, 2,4- or 2,5-diaminocumene, 2,5-dimethyl-p-phenylenediamine, ethylguanidine, 2,3,5,6-tetramethyl-p-phenylenediamine, 2,4,6-Trimethyl-m-phenylenediamine, bis(3-aminopropyl)tetramethyldisiloxane, bis(p-aminophenyl)octamethylpentasiloxane, 2, 7-Diaminostilbene, 2,5-diaminopyridine, 1,2-bis(4-aminophenyl)ethane, diaminobenzanilide, esters of diaminobenzoic acid, 1, 5-Diaminonaphthalene, diaminotrifluorotoluene, 1,3-bis(4-aminophenyl)hexafluoropropane, 1,4-bis(4-aminophenyl)octafluorobutane, 1 ,5-bis(4-aminophenyl)decafluoropentane, 1,7-bis(4-aminophenyl)tetrafluoroheptane, 2,2-bis[4-(3-aminophenyl) oxy)phenyl]hexafluoropropane, 2,2-bis[4-(2-aminophenoxy)phenyl]hexafluoropropane, 2,2-bis[4-(4-aminophenoxy) )-3,5-dimethylphenyl]hexafluoropropane, 2,2-bis[4-(4-aminophenoxy)-3,5-bis(trifluoromethyl)phenyl]hexafluoro Propane, p-bis(4-amino-2-trifluoromethylphenoxy)benzene, 4,4'-bis(4-amino-2-trifluoromethylphenoxy)biphenyl, 4,4 '-bis(4-amino-3-trifluoromethylphenoxy)biphenyl, 4,4'-bis(4-amino-2-trifluoromethylphenoxy)diphenylene, 4 ,4'-bis(3-amino-5-trifluoromethylphenoxy)diphenylphenoxide, 2,2-bis[4-(4-amino-3-trifluoromethylphenoxy) Phenyl]hexafluoropropane, 3,3',5,5'-tetramethyl-4,4'-diaminobiphenyl, 4,4'-diamino-2,2'-bis(trifluoro At least one diamine of methyl)biphenyl, 2,2',5,5',6,6'-hexafluorotriphenyl and 4,4'-diamino-p-tetraphenyl.

又，國際公開第2017/038598號的0030～0031段中所記載之二胺（DA-1）～（DA-18）亦較佳。Moreover, the diamines (DA-1)-(DA-18) described in paragraph 0030-0031 of International Publication No. 2017/038598 are also preferable.

又，亦可以較佳地使用國際公開第2017/038598號的0032～0034段中所記載之在主鏈中具有2個以上的伸烷基二醇單元之二胺。Moreover, the diamine which has 2 or more alkylene glycol units in a main chain as described in paragraph 0032-0034 of International Publication No. 2017/038598 can also be used preferably.

從所獲得之有機膜的柔軟性的觀點考慮，R 111由-Ar-L-Ar-表示為較佳。其中，Ar分別獨立地係芳香族基，L係可以被氟原子取代之碳數1～10的脂肪族烴基、-O-、-CO-、-S-、-SO 2-或-NHCO-或由上述中的2個以上的組合構成之基團。Ar係伸苯基為較佳，L係可以被氟原子取代之碳數1或2的脂肪族烴基、-O-、-CO-、-S-或-SO 2-為較佳。此處的脂肪族烴基係伸烷基為較佳。 From the viewpoint of the flexibility of the obtained organic film, R 111 is preferably represented by -Ar-L-Ar-. Among them, Ar is independently an aromatic group, L is an aliphatic hydrocarbon group with 1 to 10 carbons which may be substituted by fluorine atoms, -O-, -CO-, -S-, -SO 2 - or -NHCO- or A group consisting of a combination of two or more of the above. Ar is preferably a phenylene group, and L is preferably an aliphatic hydrocarbon group with 1 or 2 carbons which may be substituted by a fluorine atom, -O-, -CO-, -S- or -SO 2 -. Here, the aliphatic hydrocarbon-based alkylene group is preferable.

又，從i射線透射率的觀點考慮，R 111係下述式（51）或式（61）所表示之2價的有機基團為較佳。尤其，從i射線透射率、易獲得性的觀點考慮，式（61）所表示之2價的有機基團為更佳。 式（51） [化學式3]

Figure 02_image005
式（51）中，R 50～R 57分別獨立地係氫原子、氟原子或1價的有機基團，R 50～R 57中的至少1個係氟原子、甲基或三氟甲基，*分別獨立地表示與式（2）中的氮原子的鍵結部位。 作為R 50～R 57的1價的有機基團，可以舉出碳數1～10（較佳為碳數1～6）的未經取代之烷基、碳數1～10（較佳為碳數1～6）的氟化烷基等。 [化學式4]
Figure 02_image007
式（61）中，R 58及R 59分別獨立地係氟原子、甲基或三氟甲基，*分別獨立地表示與式（2）中的氮原子的鍵結部位。 作為提供式（51）或（61）的結構之二胺，可以舉出2,2’-二胺基聯苯胺、2,2’-雙（三氟甲基）-4,4’-二胺基聯苯、2,2’-雙（氟）-4,4’-二胺基聯苯、4,4’-二胺基八氟聯苯等。該等可以使用1種或者組合使用2種以上。 Also, from the viewpoint of i-ray transmittance, R 111 is preferably a divalent organic group represented by the following formula (51) or formula (61). In particular, a divalent organic group represented by formula (61) is more preferable from the viewpoint of i-ray transmittance and availability. Formula (51) [Chemical Formula 3]
Figure 02_image005
In formula (51), R 50 to R 57 are each independently a hydrogen atom, a fluorine atom or a monovalent organic group, and at least one of R 50 to R 57 is a fluorine atom, a methyl group or a trifluoromethyl group, * Each independently represents a bonding site with a nitrogen atom in formula (2). Examples of monovalent organic groups of R 50 to R 57 include unsubstituted alkyl groups having 1 to 10 carbons (preferably 1 to 6 carbons), unsubstituted alkyl groups having 1 to 10 carbons (preferably carbon 1 to 6) fluorinated alkyl groups, etc. [chemical formula 4]
Figure 02_image007
In formula (61), R 58 and R 59 are each independently a fluorine atom, a methyl group or a trifluoromethyl group, and * each independently represent a bonding site with a nitrogen atom in formula (2). Examples of diamines providing the structure of formula (51) or (61) include 2,2'-diaminobenzidine, 2,2'-bis(trifluoromethyl)-4,4'-diamine Biphenyl, 2,2'-bis(fluoro)-4,4'-diaminobiphenyl, 4,4'-diaminooctafluorobiphenyl, etc. These can be used 1 type or in combination of 2 or more types.

式（2）中的R 115表示4價的有機基團。作為4價的有機基團，包含芳香環之4價的有機基團為較佳，下述式（5）或式（6）所表示之基團為更佳。 式（5）或式（6）中，*分別獨立地表示與其他結構的鍵結部位。 [化學式5]

Figure 02_image009
式（5）中，R 112係單鍵或2價的連接基，單鍵或選自可以被氟原子取代之碳數1～10的脂肪族烴基、-O-、-CO-、-S-、-SO 2-及-NHCO-以及該等的組合中之基圖為較佳，單鍵、選自可以被氟原子取代之碳數1～3的伸烷基、-O-、-CO-、-S-及-SO 2-中之基圖為更佳，選自包括-CH 2-、-C（CF 3） 2-、-C（CH 3） 2-、-O-、-CO-、-S-及-SO 2-之群組中的2價的基團為進一步較佳。 R 115 in formula (2) represents a tetravalent organic group. As the tetravalent organic group, a tetravalent organic group including an aromatic ring is preferable, and a group represented by the following formula (5) or formula (6) is more preferable. In formula (5) or formula (6), * each independently represents a bonding site with another structure. [chemical formula 5]
Figure 02_image009
In formula (5), R 112 is a single bond or a divalent linking group, a single bond or an aliphatic hydrocarbon group with 1 to 10 carbons that can be substituted by a fluorine atom, -O-, -CO-, -S- , -SO 2 - and -NHCO- and their combinations are preferred, single bond, selected from C1-3 alkylene groups which may be substituted by fluorine atoms, -O-, -CO- , -S- and -SO 2 - are more preferably selected from the group consisting of -CH 2 -, -C(CF 3 ) 2 -, -C(CH 3 ) 2 -, -O-, -CO- A divalent group in the group of , -S- and -SO 2 - is further preferred.

具體而言，R 115可以舉出從四羧酸二酐中去除酐基之後殘存之四羧酸殘基等。聚醯亞胺前驅物中作為相當於R 115之結構，可以僅包含1種四羧酸二酐殘基，亦可以包含2種以上。 四羧酸二酐由下述式（O）表示為較佳。 [化學式6]

Figure 02_image011
式（O）中，R 115表示4價的有機基團。R 115與式（2）中的R 115同義，較佳範圍亦相同。 Specifically, R 115 includes tetracarboxylic acid residues remaining after removing anhydride groups from tetracarboxylic dianhydrides, and the like. The structure corresponding to R 115 in the polyimide precursor may contain only one type of tetracarboxylic dianhydride residue, or may contain two or more types. Tetracarboxylic dianhydride is preferably represented by the following formula (O). [chemical formula 6]
Figure 02_image011
In formula (O), R 115 represents a tetravalent organic group. R 115 has the same meaning as R 115 in the formula (2), and the preferred range is also the same.

作為四羧酸二酐的具體例，可以舉出均苯四甲酸二酐（PMDA）、3,3’,4,4’-聯苯四羧酸二酐、3,3’,4,4’-二苯硫醚四羧酸二酐、3,3’,4,4’-二苯基碸四羧酸二酐、3,3’,4,4’-二苯甲酮四羧酸二酐、3,3’,4,4’-二苯基甲烷四羧酸二酐、2,2’,3,3’-二苯基甲烷四羧酸二酐、2,3,3’,4’-聯苯四羧酸二酐、2,3,3’,4’-二苯甲酮四羧酸二酐、4,4’-氧基二鄰苯二甲酸二酐、2,3,6,7-萘四羧酸二酐、1,4,5,7-萘四羧酸二酐、2,2-雙（3,4-二羧基苯基）丙烷二酐、2,2-雙（2,3-二羧基苯基）丙烷二酐、2,2-雙（3,4-二羧基苯基）六氟丙烷二酐、1,3-二苯基六氟丙烷-3,3,4,4-四羧酸二酐、1,4,5,6-萘四羧酸二酐、2,2’,3,3’-二苯基四羧酸二酐、3,4,9,10-苝四羧酸二酐、1,2,4,5-萘四羧酸二酐、1,4,5,8-萘四羧酸二酐、1,8,9,10-菲四羧酸二酐、1,1-雙（2,3-二羧基苯基）乙烷二酐、1,1-雙（3,4-二羧基苯基）乙烷二酐、1,2,3,4-苯四羧酸二酐以及該等的碳數1～6的烷基及碳數1～6的烷氧基衍生物。Specific examples of tetracarboxylic dianhydride include pyromellitic dianhydride (PMDA), 3,3',4,4'-biphenyltetracarboxylic dianhydride, 3,3',4,4' -Diphenylsulfide tetracarboxylic dianhydride, 3,3',4,4'-diphenylsulfide tetracarboxylic dianhydride, 3,3',4,4'-benzophenone tetracarboxylic dianhydride , 3,3',4,4'-diphenylmethane tetracarboxylic dianhydride, 2,2',3,3'-diphenylmethane tetracarboxylic dianhydride, 2,3,3',4' -Biphenyl tetracarboxylic dianhydride, 2,3,3',4'-benzophenone tetracarboxylic dianhydride, 4,4'-oxydiphthalic dianhydride, 2,3,6, 7-naphthalene tetracarboxylic dianhydride, 1,4,5,7-naphthalene tetracarboxylic dianhydride, 2,2-bis(3,4-dicarboxyphenyl)propane dianhydride, 2,2-bis(2 ,3-dicarboxyphenyl)propane dianhydride, 2,2-bis(3,4-dicarboxyphenyl)hexafluoropropane dianhydride, 1,3-diphenylhexafluoropropane-3,3,4, 4-tetracarboxylic dianhydride, 1,4,5,6-naphthalene tetracarboxylic dianhydride, 2,2',3,3'-diphenyltetracarboxylic dianhydride, 3,4,9,10- Perylene tetracarboxylic dianhydride, 1,2,4,5-naphthalene tetracarboxylic dianhydride, 1,4,5,8-naphthalene tetracarboxylic dianhydride, 1,8,9,10-phenanthrene tetracarboxylic dianhydride anhydride, 1,1-bis(2,3-dicarboxyphenyl)ethanedianhydride, 1,1-bis(3,4-dicarboxyphenyl)ethanedianhydride, 1,2,3,4- Phenylenetetracarboxylic dianhydride and these alkyl groups having 1 to 6 carbons and alkoxy derivatives having 1 to 6 carbons.

又，作為較佳例，亦可以舉出國際公開第2017/038598號的0038段中所記載之四羧酸二酐（DAA-1）～（DAA-5）。Moreover, tetracarboxylic dianhydride (DAA-1) - (DAA-5) described in paragraph 0038 of International Publication No. 2017/038598 can also be mentioned as a preferable example.

在式（2）中，R 111與R 115中的至少一者亦能夠具有OH基。更具體而言，作為R 111，可以舉出雙胺基苯酚衍生物的殘基。 In formula (2), at least one of R 111 and R 115 may also have an OH group. More specifically, R 111 includes a residue of a bisaminophenol derivative.

式（2）中的R 113及R 114分別獨立地表示氫原子或1價的有機基團。作為1價的有機基團，包含直鏈或支鏈的烷基、環狀烷基、芳香族基或聚伸烷氧基為較佳。又，R 113及R 114中的至少一者包含聚合性基為較佳，兩者包含聚合性基為更佳。R 113及R 114中的至少一者包含2個以上的聚合性基亦較佳。作為聚合性基，係能夠藉由熱、自由基等的作用而進行交聯反應之基團，自由基聚合性基為較佳。作為聚合性基的具體例，可以舉出具有乙烯性不飽和鍵之基團、烷氧基甲基、羥基甲基、醯氧基甲基、環氧基、氧環丁基、苯并㗁唑基、嵌段異氰酸酯基、胺基。作為聚醯亞胺前驅物所具有之自由基聚合性基，具有乙烯性不飽和鍵之基圖為較佳。 作為具有乙烯性不飽和鍵之基團，可以舉出乙烯基、烯丙基、異烯丙基、2-甲基烯丙基、具有與乙烯基直接鍵結之芳香環之基團（例如，乙烯基苯基等）、（甲基）丙烯醯胺基、（甲基）丙烯醯氧基、下述式（III）所表示之基團等，下述式（III）所表示之基團為較佳。 R 113 and R 114 in formula (2) each independently represent a hydrogen atom or a monovalent organic group. As a monovalent organic group, it is preferable to contain a linear or branched alkyl group, a cyclic alkyl group, an aromatic group, or a polyalkyleneoxy group. Also, it is preferable that at least one of R 113 and R 114 contains a polymerizable group, and it is more preferable that both contain a polymerizable group. It is also preferable that at least one of R 113 and R 114 contains two or more polymerizable groups. The polymerizable group is a group capable of undergoing a crosslinking reaction by the action of heat, free radicals, etc., and a radical polymerizable group is preferred. Specific examples of the polymerizable group include a group having an ethylenically unsaturated bond, an alkoxymethyl group, a hydroxymethyl group, an acyloxymethyl group, an epoxy group, an oxetanyl group, and a benzoxazole group. group, blocked isocyanate group, amine group. As the radical polymerizable group possessed by the polyimide precursor, a group having an ethylenically unsaturated bond is preferable. As the group having an ethylenically unsaturated bond, vinyl, allyl, isoallyl, 2-methallyl, and a group having an aromatic ring directly bonded to a vinyl group (for example, vinylphenyl, etc.), (meth)acrylamide, (meth)acryloxy, groups represented by the following formula (III), etc., the group represented by the following formula (III) is better.

[化學式7]

Figure 02_image013
[chemical formula 7]
Figure 02_image013

式（III）中，R 200表示氫原子、甲基、乙基或羥甲基，氫原子或甲基為較佳。 式（III）中，*表示與其他結構的鍵結部位。 式（III）中，R 201表示碳數2～12的伸烷基、-CH 2CH（OH）CH 2-、伸環烷基或聚伸烷氧基。 較佳的R 201的例子可以舉出伸乙基、伸丙基、三亞甲基、四亞甲基、五亞甲基、六亞甲基、八亞甲基、十二亞甲基等伸烷基、1,2-丁二基、1,3-丁二基、-CH 2CH（OH）CH 2-、聚伸烷氧基，伸乙基、伸丙基等伸烷基、-CH 2CH（OH）CH 2-、環己基、聚伸烷氧基為更佳，伸乙基、伸丙基等伸烷基或聚伸烷氧基為進一步較佳。 在本發明中，聚伸烷氧基係指2個以上的伸烷氧基直接鍵結而成之基團。聚伸烷氧基中所包含之複數個伸烷氧基中之伸烷基分別可以相同亦可以不同。 聚伸烷氧基包含不同伸烷基的複數種伸烷氧基之情況下，聚伸烷氧基中之伸烷氧基的排列可以為無規排列，亦可以為具有嵌段之排列，亦可以為具有交替等圖案之排列。 上述伸烷基的碳數（伸烷基具有取代基之情況下，包括取代基的碳數）係2以上為較佳，2～10為更佳，2～6為更佳，2～5為進一步較佳，2～4為進一步較佳，2或3為特佳，2為最佳。 又，上述伸烷基可以具有取代基。作為較佳的取代基，可以舉出烷基、芳基、鹵素原子等。 又，聚伸烷氧基中所包含之伸烷氧基的數量（聚伸烷氧基的重複數）係2～20為較佳，2～10為更佳，2～6為進一步較佳。 作為聚伸烷氧基，從溶劑溶解性及耐溶劑性的觀點考慮，聚伸乙氧基、聚伸丙氧基、聚三亞甲氧基、聚四亞甲氧基或由複數個伸乙氧基和複數個伸丙氧基鍵結而成之基團為較佳，聚伸乙氧基或聚伸丙氧基為更佳，聚伸乙氧基為進一步較佳。在由上述複數個伸乙氧基和複數個伸丙氧基鍵結而成之基團中，伸乙氧基和伸丙氧基可以無規排列，亦可以形成嵌段而排列，亦可以排列成交替等圖案狀。該等基中之伸乙氧基等的重複數的較佳態樣如上所述。 In formula (III), R 200 represents a hydrogen atom, a methyl group, an ethyl group or a hydroxymethyl group, preferably a hydrogen atom or a methyl group. In formula (III), * represents a bonding site with other structures. In the formula (III), R 201 represents an alkylene group having 2 to 12 carbon atoms, -CH 2 CH(OH)CH 2 -, a cycloalkylene group, or a polyalkylene group. Preferred examples of R201 can include alkane groups such as ethylene, propylene, trimethylene, tetramethylene, pentamethylene, hexamethylene, octamethylene, dodecamethylene, etc. Base, 1,2-butanediyl, 1,3-butanediyl, -CH 2 CH(OH)CH 2 -, polyalkylene, ethylidene, propylene and other alkylene, -CH 2 CH(OH)CH 2 -, cyclohexyl, and polyalkyleneoxy are more preferred, and alkylene or polyalkylene such as ethylene and propylene are still more preferred. In the present invention, a polyalkyleneoxy group refers to a group in which two or more alkyleneoxy groups are directly bonded. The alkylene groups in the plural alkyleneoxy groups included in the polyalkyleneoxy group may be the same or different. When the polyalkyleneoxy group contains multiple types of alkyleneoxy groups with different alkylene groups, the arrangement of the alkyleneoxy groups in the polyalkyleneoxy group may be a random arrangement, or a block arrangement, or Arrangements with alternating etc. patterns are possible. The carbon number of the above-mentioned alkylene group (in the case of the alkylene group having a substituent, including the carbon number of the substituent) is preferably 2 or more, more preferably 2-10, more preferably 2-6, and 2-5. More preferably, 2 to 4 are still more preferable, 2 or 3 are particularly preferable, and 2 is most preferable. Moreover, the said alkylene group may have a substituent. As a preferable substituent, an alkyl group, an aryl group, a halogen atom, etc. are mentioned. Moreover, the number of the alkyleneoxy groups contained in a polyalkyleneoxy group (repetition number of a polyalkyleneoxy group) is 2-20 preferably, 2-10 are more preferable, 2-6 are still more preferable. As the polyalkoxyl group, from the viewpoint of solvent solubility and solvent resistance, polyethoxyl, polyoxyl, polytrimethyleneoxy, polytetramethyleneoxy, or a plurality of ethoxyl groups A group formed by bonding a plurality of propoxyl groups to a plurality of propoxyl groups is preferred, polyethoxyl or polyoxyl groups are more preferred, and polyoxyl groups are still more preferred. In the group formed by the above-mentioned plural ethoxyl groups and plural propenyloxy groups, the ethoxyl groups and propenyloxy groups can be arranged randomly, or arranged in blocks, or arranged in a Alternate isopatterns. The preferable aspect of the repetition number of the ethoxyl group etc. in these groups is as above-mentioned.

式（2）中，R 113係氫原子時或者R 114係氫原子之情況下，聚醯亞胺前驅物可以與具有乙烯性不飽和鍵之三級胺化合物形成共軛鹼。作為該種具有乙烯性不飽和鍵之三級胺化合物的例子，可以舉出甲基丙烯酸N,N-二甲基胺基丙酯。 In formula (2), when R 113 is a hydrogen atom or R 114 is a hydrogen atom, the polyimide precursor can form a conjugate base with a tertiary amine compound having an ethylenically unsaturated bond. An example of such a tertiary amine compound having an ethylenically unsaturated bond includes N,N-dimethylaminopropyl methacrylate.

式（2）中，R 113及R 114中的至少一者可以為酸分解性基等極性轉換基。作為酸分解性基，只要係在酸的作用下分解而產生酚性羥基、羧基等鹼溶性基者，則並沒有特別限定，縮醛基、縮酮基、甲矽烷基、甲矽烷基醚基、三級烷基酯基等為較佳，從曝光靈敏度的觀點考慮，縮醛基或縮酮基為更佳。 作為酸分解性基的具體例，可以舉出第三丁氧基羰基、異丙氧基羰基、四氫吡喃基、四氫呋喃基、乙氧基乙基、甲氧基乙基、乙氧基甲基、三甲基甲矽烷基、第三丁氧基羰基甲基、三甲基甲矽烷基醚基等。從曝光靈敏度的觀點考慮，乙氧基乙基或四氫呋喃基為較佳。 In formula (2), at least one of R 113 and R 114 may be a polarity switching group such as an acid decomposable group. The acid-decomposable group is not particularly limited as long as it decomposes under the action of acid to produce alkali-soluble groups such as phenolic hydroxyl group and carboxyl group. Acetal group, ketal group, silyl group, and silyl ether group A tertiary alkyl ester group, etc. are preferable, and an acetal group or a ketal group is more preferable from a viewpoint of exposure sensitivity. Specific examples of acid-decomposable groups include tert-butoxycarbonyl, isopropoxycarbonyl, tetrahydropyranyl, tetrahydrofuranyl, ethoxyethyl, methoxyethyl, ethoxymethyl group, trimethylsilyl group, tertiary butoxycarbonylmethyl group, trimethylsilyl ether group, etc. From the viewpoint of exposure sensitivity, an ethoxyethyl group or a tetrahydrofuryl group is preferable.

又，聚醯亞胺前驅物在結構中具有氟原子亦較佳。聚醯亞胺前驅物中的氟原子含量係10質量%以上為較佳，又，20質量%以下為較佳。Moreover, it is also preferable that the polyimide precursor has a fluorine atom in the structure. The content of fluorine atoms in the polyimide precursor is preferably 10% by mass or more, and more preferably 20% by mass or less.

又，以提高與基板的密接性為目的，聚醯亞胺前驅物可以與具有矽氧烷結構之脂肪族基共聚。具體而言，作為二胺，可以舉出使用雙（3-胺基丙基）四甲基二矽氧烷、雙（對胺基苯基）八甲基五矽氧烷等態樣。Also, the polyimide precursor may be copolymerized with an aliphatic group having a siloxane structure for the purpose of improving the adhesion to the substrate. Specifically, examples of the diamine include the use of bis(3-aminopropyl)tetramethyldisiloxane, bis(p-aminophenyl)octamethylpentasiloxane, and the like.

式（2）所表示之重複單元係式（2-A）所表示之重複單元為較佳。亦即，本發明中所使用之聚醯亞胺前驅物中的至少一種係具有式（2-A）所表示之重複單元之前驅物為較佳。聚醯亞胺前驅物藉由包含式（2-A）所表示之重複單元而能夠進一步擴大曝光寬容度的寬度。 式（2-A） [化學式8]

Figure 02_image015
式（2-A）中，A 1及A 2表示氧原子，R 111及R 112分別獨立地表示2價的有機基團，R 113及R 114分別獨立地表示氫原子或1價的有機基團，R 113及R 114中的至少一者係包含聚合性基之基團，兩者係包含聚合性基之基團為較佳。 The repeating unit represented by formula (2) is preferably the repeating unit represented by formula (2-A). That is, at least one of the polyimide precursors used in the present invention is preferably a precursor having a repeating unit represented by formula (2-A). The polyimide precursor can further expand the width of the exposure latitude by including the repeating unit represented by the formula (2-A). Formula (2-A) [Chemical Formula 8]
Figure 02_image015
In formula (2-A), A 1 and A 2 represent an oxygen atom, R 111 and R 112 independently represent a divalent organic group, and R 113 and R 114 independently represent a hydrogen atom or a monovalent organic group At least one of R 113 and R 114 is a group containing a polymerizable group, and both are preferably groups containing a polymerizable group.

A 1、A 2、R 111、R 113及R 114分別獨立地與式（2）中的A 1、A 2、R 111、R 113及R 114同義，較佳範圍亦相同。 R 112與式（5）中的R 112同義，較佳範圍亦相同。 A 1 , A 2 , R 111 , R 113 and R 114 are independently synonymous with A 1 , A 2 , R 111 , R 113 and R 114 in formula (2), and their preferred ranges are also the same. R 112 has the same meaning as R 112 in the formula (5), and the preferred range is also the same.

聚醯亞胺前驅物可以包含一種式（2）所表示之重複單元，亦可以包含2種以上。又，亦可以包含式（2）所表示之重複單元的結構異構物。又，聚醯亞胺前驅物除了上述式（2）的重複單元以外，當然亦可以包含其他種類的重複單元。The polyimide precursor may contain one kind of repeating unit represented by formula (2), or may contain two or more kinds. Moreover, the structural isomer of the repeating unit represented by formula (2) may also be contained. In addition, the polyimide precursor may of course contain other types of repeating units other than the repeating unit of the above-mentioned formula (2).

作為本發明中的聚醯亞胺前驅物的一實施形態，可以舉出式（2）所表示之重複單元的含量係所有重複單元的50莫耳%以上之態樣。上述合計含量係70莫耳%以上為更佳，90莫耳%以上為進一步較佳，大於90莫耳%為特佳。上述合計含量的上限並沒有特別限定，除了末端之聚醯亞胺前驅物的所有的重複單元可以係式（2）所表示之重複單元。As one embodiment of the polyimide precursor in the present invention, an aspect in which the content of the repeating unit represented by formula (2) is 50 mol% or more of all the repeating units is mentioned. The above-mentioned total content is more than 70 mol %, more preferably 90 mol %, and more than 90 mol % is particularly preferred. The upper limit of the above total content is not particularly limited, except that all the repeating units of the terminal polyimide precursor can be the repeating units represented by formula (2).

聚醯亞胺前驅物的重量平均分子量（Mw）較佳為5,000～100,000，更佳為10,000～50,000，進一步較佳為15,000～40,000。又，數量平均分子量（Mn）較佳為2,000～40,000，更佳為3,000～30,000，進一步較佳為4,000～20,000。 上述聚醯亞胺前驅物的分子量的分散度係1.5以上為較佳，1.8以上為更佳，2.0以上為進一步較佳。聚醯亞胺前驅物的分子量的分散度的上限值並沒有特別規定，例如係7.0以下為較佳，6.5以下為更佳，6.0以下為進一步較佳。 在本說明書中，分子量的分散度係由重量平均分子量/數量平均分子量算出之值。 又，樹脂組成物包含作為特定樹脂之複數種聚醯亞胺前驅物之情況下，至少一種聚醯亞胺前驅物的重量平均分子量、數量平均分子量及分散度在上述範圍內為較佳。又，將上述複數種聚醯亞胺前驅物作為1種樹脂而算出之重量平均分子量、數量平均分子量及分散度分別在上述範圍內亦較佳。 The weight average molecular weight (Mw) of the polyimide precursor is preferably from 5,000 to 100,000, more preferably from 10,000 to 50,000, even more preferably from 15,000 to 40,000. Moreover, the number average molecular weight (Mn) becomes like this. Preferably it is 2,000-40,000, More preferably, it is 3,000-30,000, More preferably, it is 4,000-20,000. The molecular weight dispersion of the polyimide precursor is preferably at least 1.5, more preferably at least 1.8, and still more preferably at least 2.0. The upper limit of the molecular weight dispersion of the polyimide precursor is not particularly specified, for example, it is preferably 7.0 or less, more preferably 6.5 or less, and still more preferably 6.0 or less. In this specification, the degree of dispersion of molecular weight is a value calculated from weight average molecular weight/number average molecular weight. Also, when the resin composition includes a plurality of polyimide precursors as specific resins, it is preferable that the weight average molecular weight, number average molecular weight, and degree of dispersion of at least one polyimide precursor are within the above-mentioned ranges. Furthermore, it is also preferable that the weight average molecular weight, the number average molecular weight, and the degree of dispersion calculated by using the plurality of polyimide precursors described above as one type of resin are within the above ranges, respectively.

〔聚醯亞胺〕 本發明中所使用之聚醯亞胺可以為鹼可溶性聚醯亞胺，亦可以為可溶於以有機溶劑為主成分之顯影液之聚醯亞胺。 在本說明書中，鹼可溶性聚醯亞胺係指相對於100g的2.38質量%四甲基銨水溶液在23℃下溶解0.1g以上之聚醯亞胺，從圖案形成性的觀點考慮，溶解0.5g以上之聚醯亞胺為較佳，溶解1.0g以上之聚醯亞胺為進一步較佳。上述溶解量的上限並沒有特別限定，100g以下為較佳。 又，從所獲得之有機膜的膜強度及絕緣性的觀點考慮，聚醯亞胺係在主鏈中具有複數個醯亞胺結構之聚醯亞胺為較佳。 在本說明書中，“主鏈”係指在構成樹脂之高分子化合物的分子中相對最長的鍵結鏈，“側鏈”係指除此以外的鍵結鏈。 〔Polyimide〕 The polyimide used in the present invention may be an alkali-soluble polyimide, or may be a polyimide soluble in a developing solution mainly composed of an organic solvent. In this specification, an alkali-soluble polyimide refers to a polyimide that dissolves 0.1 g or more at 23°C with respect to 100 g of a 2.38 mass % tetramethylammonium aqueous solution. From the viewpoint of pattern formation, 0.5 g is dissolved. The above polyimides are preferred, and it is further preferred to dissolve 1.0 g or more of the polyimides. The upper limit of the above-mentioned dissolved amount is not particularly limited, but is preferably 100 g or less. Also, from the viewpoint of film strength and insulating properties of the obtained organic film, polyimide is preferably a polyimide having a plurality of imide structures in the main chain. In this specification, a "main chain" means the relatively longest bonded chain among molecules of a polymer compound constituting a resin, and a "side chain" means other bonded chains.

-氟原子- 從所獲得之有機膜的膜強度的觀點考慮，聚醯亞胺具有氟原子亦較佳。 氟原子例如包含於後述之式（4）所表示之重複單元中之R 132或後述之式（4）所表示之重複單元中之R 131中為較佳，作為氟化烷基而包含於後述之式（4）所表示之重複單元中之R 132或後述之式（4）所表示之重複單元中之R 131中為更佳。 氟原子的量相對於聚醯亞胺的總質量，係5質量%以上為較佳，又，20質量%以下為較佳。 -Fluorine atom- It is also preferable that polyimide has a fluorine atom from the viewpoint of the film strength of the obtained organic film. Fluorine atoms, for example, are included in R 132 in the repeating unit represented by the formula (4) described later or R 131 in the repeating unit represented by the formula (4) described later, and are included as a fluorinated alkyl group in the following R 132 in the repeating unit represented by formula (4) or R 131 in the repeating unit represented by formula (4) described later is more preferable. The amount of fluorine atoms is preferably at least 5% by mass, and more preferably at most 20% by mass, based on the total mass of the polyimide.

-矽原子- 從所獲得之有機膜的膜強度的觀點考慮，聚醯亞胺具有矽原子亦較佳。 矽原子例如包含於後述之式（4）所表示之重複單元中之R 131中為較佳，作為後述之有機改質（聚）矽氧烷結構而包含於後述之式（4）所表示之重複單元中之R 131中為更佳。 又，上述矽原子或上述有機改質（聚）矽氧烷結構亦可以包含於聚醯亞胺的側鏈中，但包含於聚醯亞胺的主鏈中為較佳。 矽原子的量相對於聚醯亞胺的總質量，係1質量%以上為較佳，20質量%以下為更佳。 -Silicon atom- It is also preferable that the polyimide has a silicon atom from the viewpoint of the film strength of the obtained organic film. For example, the silicon atom is contained in R 131 in the repeating unit represented by the formula (4) described below, which is included in the formula (4) represented by the organic modified (poly)siloxane structure described below. R131 in the repeating unit is more preferred. Moreover, the above-mentioned silicon atom or the above-mentioned organomodified (poly)siloxane structure may also be included in the side chain of polyimide, but it is preferably included in the main chain of polyimide. The amount of silicon atoms is preferably at least 1% by mass, more preferably at most 20% by mass, based on the total mass of the polyimide.

-乙烯性不飽和鍵- 從所獲得之有機膜的膜強度的觀點考慮，聚醯亞胺具有乙烯性不飽和鍵為較佳。 聚醯亞胺可以在主鏈末端具有乙烯性不飽和鍵，亦可以在側鏈中具有乙烯性不飽和鍵，但在側鏈中具有乙烯性不飽和鍵為較佳。 上述乙烯性不飽和鍵具有自由基聚合性為較佳。 乙烯性不飽和鍵包含於後述之式（4）所表示之重複單元中之R 132或後述之式（4）所表示之重複單元中之R 131中為較佳，作為具有乙烯性不飽和鍵之基團而包含於後述之式（4）所表示之重複單元中之R 132或後述之式（4）所表示之重複單元中之R 131中為更佳。 在該等之中，乙烯性不飽和鍵包含於後述之式（4）所表示之重複單元中之R 131中為較佳，作為具有乙烯性不飽和鍵之基團而包含於後述之式（4）所表示之重複單元中之R 131中為更佳。 作為具有乙烯性不飽和鍵之基團，可以舉出乙烯基、烯丙基、乙烯基苯基等直接鍵結於芳香環且可以被取代之具有乙烯基之基團、（甲基）丙烯醯基、（甲基）丙烯醯氧基、下述式（IV）所表示之基團等。 -Ethylenically unsaturated bond- It is preferable that polyimide has an ethylenically unsaturated bond from the viewpoint of the film strength of the obtained organic film. Polyimide may have an ethylenically unsaturated bond at a main chain terminal, or may have an ethylenically unsaturated bond in a side chain, but preferably has an ethylenically unsaturated bond in the side chain. It is preferable that the said ethylenically unsaturated bond has radical polymerizability. It is preferable that the ethylenic unsaturated bond is contained in R 132 in the repeating unit represented by the formula (4) described later or R 131 in the repeating unit represented by the formula (4) described later, as the It is more preferable to include R 132 in the repeating unit represented by the formula (4) described later or R 131 in the repeating unit represented by the formula (4) described below. Among them, it is preferable that an ethylenically unsaturated bond is contained in R 131 in the repeating unit represented by the formula (4) described later, and it is contained in the formula ( 4) R131 in the repeating unit represented is more preferred. Examples of groups having ethylenically unsaturated bonds include groups having vinyl groups that are directly bonded to aromatic rings and may be substituted, such as vinyl, allyl, and vinylphenyl, and (meth)acryl groups. group, (meth)acryloyloxy group, a group represented by the following formula (IV), etc.

[化學式9]

Figure 02_image017
[chemical formula 9]
Figure 02_image017

式（IV）中，R 20表示氫原子、甲基、乙基或羥甲基，氫原子或甲基為較佳。 In formula (IV), R 20 represents a hydrogen atom, a methyl group, an ethyl group or a hydroxymethyl group, preferably a hydrogen atom or a methyl group.

式（IV）中，R 21表示碳數2～12的伸烷基、-O-CH 2CH（OH）CH 2-、-C（=O）O-、-O（C=O）NH-、碳數2～30的（聚）伸烷氧基（伸烷基的碳數係2～12為較佳，2～6為更佳，2或3為特佳；重複數係1～12為較佳，1～6為更佳，1～3為特佳）或將該等中的2個以上組合而成之基團。 又，作為上述碳數2～12的伸烷基，直鏈狀、支鏈狀、環狀或藉由該等組合表示之伸烷基中的任一種。 作為上述碳數2～12的伸烷基，碳數2～8的伸烷基為較佳，碳數2～4的伸烷基為更佳。 In formula (IV), R 21 represents an alkylene group with 2 to 12 carbons, -O-CH 2 CH(OH)CH 2 -, -C(=O)O-, -O(C=O)NH- , a (poly)alkyleneoxy group with 2 to 30 carbons (the carbon number of the alkylene group is preferably 2 to 12, more preferably 2 to 6, especially preferably 2 or 3; the repeating number is 1 to 12 Preferably, 1 to 6 are more preferred, and 1 to 3 are particularly preferred) or a combination of two or more of these. In addition, as the above-mentioned alkylene group having 2 to 12 carbon atoms, any one of alkylene groups represented by linear, branched, cyclic, or a combination thereof. As the above-mentioned alkylene group having 2 to 12 carbons, an alkylene group having 2 to 8 carbons is preferable, and an alkylene group having 2 to 4 carbons is more preferable.

在該等之中，R 21係下述式（R1）～式（R3）中的任一個所表示之基團為較佳，式（R1）所表示之基團為更佳。 [化學式10]

Figure 02_image019
式（R1）～（R3）中，L表示單鍵或碳數2～12的伸烷基、碳數2～30的（聚）伸烷氧基或將該等中的2個以上鍵結而成之基團，X表示氧原子或硫原子，*表示與其他結構的鍵結部位，●表示與式（IV）中的R 21所鍵結之氧原子的鍵結部位。 式（R1）～（R3）中，L中的碳數2～12的伸烷基或碳數2～30的（聚）伸烷氧基的較佳態樣與上述的R 21中的碳數2～12的伸烷基或碳數2～30的（聚）伸烷氧基的較佳態樣相同。 在式（R1）中，X係氧原子為較佳。 式（R1）～（R3）中，*與式（IV）中的*同義，較佳態樣亦相同。 由式（R1）表示之結構例如可藉由使酚性羥基等具有羥基之聚醯亞胺與具有異氰酸酯基及乙烯性不飽和鍵之化合物（例如，甲基丙烯酸2-異氰酸基乙酯等）進行反應來獲得。 由式（R2）表示之結構例如可藉由使具有羧基之聚醯亞胺與具有羥基及乙烯性不飽和鍵之化合物（例如，甲基丙烯酸2-羥基乙酯等）進行反應來獲得。 由式（R3）表示之結構例如可藉由使酚性羥基等具有羥基之聚醯亞胺與具有縮水甘油基及乙烯性不飽和鍵之化合物（例如，甲基丙烯酸環氧丙酯等）進行反應來獲得。 Among them, R 21 is preferably a group represented by any one of the following formulas (R1) to formula (R3), more preferably a group represented by formula (R1). [chemical formula 10]
Figure 02_image019
In the formulas (R1) to (R3), L represents a single bond, an alkylene group having 2 to 12 carbons, a (poly)alkyleneoxy group having 2 to 30 carbons, or a combination of two or more of these. X represents an oxygen atom or a sulfur atom, * represents a bonding site with other structures, ● represents a bonding site with an oxygen atom bonded to R 21 in formula (IV). In the formulas (R1) to (R3), the preferred aspect of the alkylene group with 2 to 12 carbons or the (poly)alkoxyl group with 2 to 30 carbons in L is the same as the carbon number in the above R21 Preferred aspects of the alkylene group of 2 to 12 or the (poly)alkyleneoxy group of 2 to 30 carbon atoms are the same. In formula (R1), X is preferably an oxygen atom. In the formulas (R1) to (R3), * has the same meaning as * in the formula (IV), and preferred embodiments are also the same. The structure represented by the formula (R1) can be obtained by, for example, combining polyimide having a hydroxyl group such as a phenolic hydroxyl group with a compound having an isocyanate group and an ethylenically unsaturated bond (for example, 2-isocyanatoethyl methacrylate etc.) to react to obtain. The structure represented by the formula (R2) can be obtained, for example, by reacting polyimide having a carboxyl group with a compound having a hydroxyl group and an ethylenically unsaturated bond (for example, 2-hydroxyethyl methacrylate, etc.). The structure represented by the formula (R3) can be formed, for example, by making a polyimide having a hydroxyl group such as a phenolic hydroxyl group and a compound having a glycidyl group and an ethylenically unsaturated bond (for example, glycidyl methacrylate, etc.) response to get.

式（IV）中，*表示與其他結構的鍵結部位，與聚醯亞胺的主鏈的鍵結部位為較佳。In formula (IV), * represents a bonding site with other structures, and the bonding site with the main chain of polyimide is preferable.

乙烯性不飽和鍵的量相對於聚醯亞胺的總質量，係0.0001～0.1mol/g為較佳，0.0005～0.05mol/g為更佳。The amount of ethylenically unsaturated bonds is preferably 0.0001 to 0.1 mol/g, more preferably 0.0005 to 0.05 mol/g, relative to the total mass of the polyimide.

-除了具有乙烯性不飽和鍵之基團以外的聚合性基- 聚醯亞胺可以具有除了具有乙烯性不飽和鍵之基團以外的聚合性基。 作為除了具有乙烯性不飽和鍵之基團以外的聚合性基，可以舉出環氧基、氧環丁基等環狀醚基、甲氧基甲基等烷氧基甲基、羥甲基等。 除了具有乙烯性不飽和鍵之基團以外的聚合性基例如包含於後述之式（4）所表示之重複單元中的R 131為較佳。 除了具有乙烯性不飽和鍵之基團以外的聚合性基的量相對於聚醯亞胺的總質量，係0.0001～0.1mol/g為較佳，0.001～0.05mol/g為更佳。 -Polymerizable group other than a group having an ethylenically unsaturated bond- The polyimide may have a polymerizable group other than a group having an ethylenically unsaturated bond. Examples of polymerizable groups other than groups having ethylenically unsaturated bonds include cyclic ether groups such as epoxy groups and oxetanyl groups, alkoxymethyl groups such as methoxymethyl groups, and methylol groups. . A polymerizable group other than a group having an ethylenically unsaturated bond, for example, R 131 contained in a repeating unit represented by formula (4) described later is preferable. The amount of polymerizable groups other than groups having an ethylenically unsaturated bond is preferably 0.0001 to 0.1 mol/g, more preferably 0.001 to 0.05 mol/g, based on the total mass of the polyimide.

-極性轉換基- 聚醯亞胺可以具有酸分解性基等極性轉換基。聚醯亞胺中之酸分解性基與在上述式（2）中的R 113及R 114中所說明之酸分解性基相同，較佳態樣亦相同。 極性轉換基例如包含於後述之式（4）所表示之重複單元中的R 131、R 132、聚醯亞胺的末端等。 -Polarity conversion group- The polyimide may have a polarity conversion group, such as an acid-decomposable group. The acid-decomposable groups in the polyimide are the same as the acid-decomposable groups described for R 113 and R 114 in the above formula (2), and preferred aspects are also the same. The polarity switching group includes, for example, R 131 , R 132 , the terminal of polyimide, etc. in the repeating unit represented by the formula (4) described later.

-酸值- 將聚醯亞胺供於鹼顯影之情況下，從提高顯影性之觀點考慮，聚醯亞胺的酸值係30mgKOH/g以上為較佳，50mgKOH/g以上為更佳，70mgKOH/g以上為進一步較佳。 又，上述酸值係500mgKOH/g以下為較佳，400mgKOH/g以下為更佳，200mgKOH/g以下為進一步較佳。 又，在將聚醯亞胺供於使用了以有機溶劑係主成分之顯影液之顯影（例如，後述之“溶劑顯影”）之情況下，聚醯亞胺的酸值係1～35mgKOH/g為較佳，2～30mgKOH/g為更佳，5～20mgKOH/g為進一步較佳。 上述酸值藉由公知的方法測量，例如，藉由記載於JIS K 0070：1992中的方法測量。 又，作為聚醯亞胺中所包含之酸基，從兼顧保存穩定性及顯影性之觀點考慮，pKa係0～10的酸基為較佳，3～8的酸基為更佳。 pKa係考慮由氧釋放氫離子之解離反應並藉由其負的常用對數pKa表示其平衡常數Ka者。在本說明書中，只要沒有特別說明，則將pKa設為基於ACD/ChemSketch（註冊商標）的計算值。或者，可以參閱日本化學會編“改訂5版 化學便覽 基礎篇”中所記載的值。 又，酸基例如係磷酸等多元酸之情況下，上述pKa係第一解離常數。 作為該種酸基，聚醯亞胺包含選自包括羧基及酚性羥基之群組中的至少一種為較佳，包含酚性羥基為更佳。 -acid value- In the case of using polyimide for alkali development, from the viewpoint of improving developability, the acid value of polyimide is preferably 30 mgKOH/g or more, more preferably 50 mgKOH/g or more, and 70 mgKOH/g or more. Further better. In addition, the above-mentioned acid value is preferably not more than 500 mgKOH/g, more preferably not more than 400 mgKOH/g, and still more preferably not more than 200 mgKOH/g. In addition, when polyimide is used for development using a developer mainly composed of an organic solvent (for example, "solvent development" described later), the acid value of polyimide is 1 to 35 mgKOH/g More preferably, 2-30 mgKOH/g is more preferred, and 5-20 mgKOH/g is still more preferred. The above acid value is measured by a known method, for example, by the method described in JIS K 0070:1992. Moreover, as an acid group contained in polyimide, the acid group with a pKa of 0-10 is preferable, and the acid group of 3-8 is more preferable from the viewpoint of both storage stability and developability. pKa considers the dissociation reaction of releasing hydrogen ions from oxygen and expresses its equilibrium constant Ka by its negative common logarithm pKa. In this specification, unless otherwise specified, pKa is a calculated value based on ACD/ChemSketch (registered trademark). Alternatively, the values described in "Chemical Handbook, Basic Edition, Revised 5th Edition" edited by the Chemical Society of Japan can be referred to. Also, when the acid group is a polybasic acid such as phosphoric acid, the above-mentioned pKa is the first dissociation constant. As such an acid group, the polyimide preferably contains at least one selected from the group consisting of a carboxyl group and a phenolic hydroxyl group, and more preferably contains a phenolic hydroxyl group.

-酚性羥基- 從使基於鹼顯影液之顯影速度成為適當者之觀點考慮，聚醯亞胺具有酚性羥基為較佳。 聚醯亞胺可以在主鏈末端中具有酚性羥基，亦可以在側鏈中具有酚性羥基。 酚性羥基例如包含於後述之式（4）所表示之重複單元中之R 132或後述之式（4）所表示之重複單元中之R 131中為較佳。 酚性羥基相對於聚醯亞胺的總質量之量，係0.1～30mol/g為較佳，1～20mol/g為更佳。 -Phenolic hydroxyl group- It is preferable that polyimide has a phenolic hydroxyl group from a viewpoint of making the developing speed by alkali developing solution suitable. Polyimide may have a phenolic hydroxyl group at a main chain terminal, or may have a phenolic hydroxyl group at a side chain. The phenolic hydroxyl group is preferably included in, for example, R 132 in the repeating unit represented by formula (4) described later or R 131 in the repeating unit represented by formula (4) described below. The amount of phenolic hydroxyl groups relative to the total mass of polyimide is preferably 0.1-30 mol/g, more preferably 1-20 mol/g.

作為本發明中使用之聚醯亞胺，只要係具有醯亞胺結構之高分子化合物，則並沒有特別限定，包含下述式（4）所表示之重複單元為較佳。 [化學式11]

Figure 02_image021
式（4）中，R 131表示2價的有機基團，R 132表示4價的有機基團。 具有聚合性基之情況下，聚合性基可以位於R 131及R 132中的至少一者上，如下述式（4-1）或式（4-2）所示，亦可以位於聚醯亞胺的末端。 式（4-1） [化學式12]
Figure 02_image023
式（4-1）中，R 133係聚合性基，其他基團與式（4）同義。 式（4-2） [化學式13]
Figure 02_image025
R 134及R 135中的至少一者係聚合性基，不是聚合性基時係有機基團，其他基團與式（4）同義。 The polyimide used in the present invention is not particularly limited as long as it is a polymer compound having an imide structure, but preferably includes a repeating unit represented by the following formula (4). [chemical formula 11]
Figure 02_image021
In formula (4), R 131 represents a divalent organic group, and R 132 represents a tetravalent organic group. In the case of having a polymerizable group, the polymerizable group can be located on at least one of R 131 and R 132 , as shown in the following formula (4-1) or formula (4-2), or it can be located on polyimide the end. Formula (4-1) [Chemical Formula 12]
Figure 02_image023
In formula (4-1), R 133 is a polymerizable group, and other groups have the same meaning as in formula (4). Formula (4-2) [Chemical Formula 13]
Figure 02_image025
At least one of R 134 and R 135 is a polymerizable group, and when it is not a polymerizable group, it is an organic group, and the other groups have the same meaning as in formula (4).

作為聚合性基，可以舉出包含上述乙烯性不飽和鍵之基團或除了具有上述乙烯性不飽和鍵之基團以外的交聯性基團。 R 131表示2價的有機基團。作為2價的有機基團，可以例示出與式（2）中的R 111相同者，較佳範圍亦相同。 又，作為R 131，可以舉出去除二胺的胺基之後殘存之二胺殘基。作為二胺，可以舉出脂肪族、環式脂肪族或芳香族二胺等。作為具體例，可以舉出聚醯亞胺前驅物的式（2）中的R 111的例子。 As a polymeric group, the group containing the said ethylenically unsaturated bond, or the crosslinkable group other than the group which has the said ethylenically unsaturated bond is mentioned. R 131 represents a divalent organic group. Examples of the divalent organic group include the same ones as R 111 in the formula (2), and the preferred range is also the same. In addition, as R 131 , diamine residue remaining after removing the amine group of diamine can be mentioned. Examples of diamines include aliphatic, cycloaliphatic, or aromatic diamines. As a specific example, an example of R 111 in the formula (2) of the polyimide precursor can be given.

在更有效地抑制煅燒時產生翹曲之觀點上，R 131係在主鏈中具有至少2個伸烷基二醇單元之二胺殘基為較佳。更佳為在1個分子中合計包含2個以上的乙二醇鏈、丙二醇鏈中的任一者或兩者之二胺殘基，進一步較佳為上述二胺，其為不包含芳香環之二胺殘基。 From the viewpoint of more effectively suppressing warpage during calcination, R 131 is preferably a diamine residue having at least 2 alkylene glycol units in the main chain. More preferably, it is a diamine residue containing a total of two or more of ethylene glycol chains, propylene glycol chains, or both in one molecule, and more preferably the above-mentioned diamines, which do not contain an aromatic ring. diamine residues.

作為在1個分子中合計包含2個以上的乙二醇鏈、丙二醇鏈中的任一者或兩者之二胺，可以舉出JEFFAMINE（註冊商標）KH-511、ED-600、ED-900、ED-2003、EDR-148、EDR-176、D-200、D-400、D-2000、D-4000（以上為產品名稱，HUNTSMAN公司製造）、1-（2-（2-（2-胺基丙氧基）乙氧基）丙氧基）丙烷-2-胺、1-（1-（1-（2-胺基丙氧基）丙烷-2-基）氧基）丙烷-2-胺等，但並不限定於該等。Examples of diamines containing a total of two or more ethylene glycol chains, propylene glycol chains, or both in one molecule include JEFFAMINE (registered trademark) KH-511, ED-600, and ED-900 , ED-2003, EDR-148, EDR-176, D-200, D-400, D-2000, D-4000 (the above are product names, manufactured by HUNTSMAN), 1-(2-(2-(2- Aminopropoxy)ethoxy)propoxy)propane-2-amine, 1-(1-(1-(2-aminopropoxy)propan-2-yl)oxy)propane-2- Amines, etc., are not limited to these.

R 132表示4價的有機基團。作為4價的有機基團，可以例示出與式（2）中的R 115相同者，較佳範圍亦相同。 例如，作為R 115而例示之4價的有機基團的4個鍵結子與上述式（4）中的4個-C（=O）-部分鍵結而形成縮合環。 R 132 represents a tetravalent organic group. As a tetravalent organic group, the same thing as R115 in formula (2) can be illustrated, and the preferable range is also the same. For example, four linkers of a tetravalent organic group exemplified as R 115 are bonded to four -C(=O)- moieties in the above formula (4) to form a condensed ring.

又，R 132可以舉出從四羧酸二酐中去除酐基之後殘存之四羧酸殘基等。作為具體例，可以舉出聚醯亞胺前驅物的式（2）中的R 115的例子。從有機膜的強度的觀點考慮，R 132係具有1～4個芳香環之芳香族二胺殘基為較佳。 Moreover, R132 can mention the tetracarboxylic acid residue which remained after removing an anhydride group from tetracarboxylic dianhydride, etc. As a specific example, an example of R 115 in the formula (2) of the polyimide precursor can be given. From the viewpoint of the strength of the organic film, R 132 is preferably an aromatic diamine residue having 1 to 4 aromatic rings.

在R 131和R 132中的至少一者中具有OH基亦較佳。更具體而言，作為R 131，作為較佳例可以舉出2,2-雙（3-羥基-4-胺基苯基）丙烷、2,2-雙（3-羥基-4-胺基苯基）六氟丙烷、2,2-雙（3-胺基-4-羥基苯基）丙烷、2,2-雙（3-胺基-4-羥基苯基）六氟丙烷、上述（DA-1）～（DA-18），作為R 132，作為更佳例可以舉出上述（DAA-1）～（DAA-5）。 It is also preferable to have an OH group in at least one of R 131 and R 132 . More specifically, as R 131 , preferred examples include 2,2-bis(3-hydroxy-4-aminophenyl)propane, 2,2-bis(3-hydroxy-4-aminophenyl) base) hexafluoropropane, 2,2-bis(3-amino-4-hydroxyphenyl)propane, 2,2-bis(3-amino-4-hydroxyphenyl)hexafluoropropane, the above (DA- 1) to (DA-18), and as R 132 , more preferable examples include the aforementioned (DAA-1) to (DAA-5).

又，聚醯亞胺在結構中具有氟原子亦較佳。聚醯亞胺中的氟原子的含量係10質量%以上為較佳，又，20質量%以下為較佳。Moreover, it is also preferable that polyimide has a fluorine atom in a structure. The content of fluorine atoms in the polyimide is preferably at least 10% by mass, and more preferably at most 20% by mass.

又，以提高與基板的密接性為目的，聚醯亞胺可以與具有矽氧烷結構之脂肪族基共聚。具體而言，作為二胺成分，可以舉出雙（3-胺基丙基）四甲基二矽氧烷、雙（對胺基苯基）八甲基五矽氧烷等。Also, polyimide may be copolymerized with an aliphatic group having a siloxane structure for the purpose of improving the adhesion to the substrate. Specifically, examples of the diamine component include bis(3-aminopropyl)tetramethyldisiloxane, bis(p-aminophenyl)octamethylpentasiloxane, and the like.

又，為了提高樹脂組成物的保存穩定性，聚醯亞胺的主鏈末端藉由單胺、酸酐、單羧酸、單醯氯化合物、單活性酯化合物等藉由封端劑密封為較佳。在該等之中，使用單胺為更佳，作為單胺的較佳化合物，可以舉出苯胺、2-乙炔基苯胺、3-乙炔基苯胺、4-乙炔基苯胺、5-胺基-8-羥基喹啉、1-羥基-7-胺基萘、1-羥基-6-胺基萘、1-羥基-5-胺基萘、1-羥基-4-胺基萘、2-羥基-7-胺基萘、2-羥基-6-胺基萘、2-羥基-5-胺基萘、1-羧基-7-胺基萘、1-羧基-6-胺基萘、1-羧基-5-胺基萘、2-羧基-7-胺基萘、2-羧基-6-胺基萘、2-羧基-5-胺基萘、2-胺基苯甲酸、3-胺基苯甲酸、4-胺基苯甲酸、4-胺基水楊酸、5-胺基水楊酸、6-胺基水楊酸、2-胺基苯磺酸、3-胺基苯磺酸、4-胺基苯磺酸、3-胺基-4,6-二羥基嘧啶、2-胺基苯酚、3-胺基苯酚、4-胺基苯酚、2-胺基苯硫酚、3-胺基苯硫酚、4-胺基苯硫酚等。該等可以使用2種以上，藉由使複數種封端劑進行反應，可以導入複數個不同之末端基。Also, in order to improve the storage stability of the resin composition, it is better to seal the end of the main chain of the polyimide with a monoamine, acid anhydride, monocarboxylic acid, monoacyl chloride compound, monoactive ester compound, etc. . Among these, it is more preferable to use a monoamine, and examples of preferable compounds of the monoamine include aniline, 2-ethynylaniline, 3-ethynylaniline, 4-ethynylaniline, 5-amino-8 -Hydroxyquinoline, 1-hydroxy-7-aminonaphthalene, 1-hydroxy-6-aminonaphthalene, 1-hydroxy-5-aminonaphthalene, 1-hydroxy-4-aminonaphthalene, 2-hydroxy-7 -aminonaphthalene, 2-hydroxy-6-aminonaphthalene, 2-hydroxy-5-aminonaphthalene, 1-carboxy-7-aminonaphthalene, 1-carboxy-6-aminonaphthalene, 1-carboxy-5 -aminonaphthalene, 2-carboxy-7-aminonaphthalene, 2-carboxy-6-aminonaphthalene, 2-carboxy-5-aminonaphthalene, 2-aminobenzoic acid, 3-aminobenzoic acid, 4 -Aminobenzoic acid, 4-aminosalicylic acid, 5-aminosalicylic acid, 6-aminosalicylic acid, 2-aminobenzenesulfonic acid, 3-aminobenzenesulfonic acid, 4-aminobenzenesulfonic acid Benzenesulfonic acid, 3-amino-4,6-dihydroxypyrimidine, 2-aminophenol, 3-aminophenol, 4-aminophenol, 2-aminothiophenol, 3-aminothiophenol , 4-aminothiophenol, etc. Two or more of these can be used, and a plurality of different end groups can be introduced by reacting a plurality of end-capping agents.

-醯亞胺化率（閉環率）- 從所獲得之有機膜的膜強度、絕緣性等觀點考慮，聚醯亞胺的醯亞胺化率（亦稱為“閉環率”）係70%以上為較佳，80%以上為更佳，90%以上為更佳。 上述醯亞胺化率的上限並沒有特別限定，只要係100%以下即可。 上述醯亞胺化率例如藉由下述方法來進行測量。 測量聚醯亞胺的紅外吸收光譜，求出作為源自醯亞胺結構之吸收峰之1377cm -1附近的峰強度P1。接著，將該聚醯亞胺在350℃下熱處理1小時之後，再次測量紅外吸收光譜，求出1377cm -1附近的峰強度P2。使用所獲得之峰強度P1、P2，依據下述式能夠求出聚醯亞胺的醯亞胺化率。 醯亞胺化率（%）=（峰強度P1/峰強度P2）×100 -Imidation rate (loop closure rate)- From the viewpoint of film strength and insulation properties of the obtained organic film, the imidization rate (also called "loop closure rate") of polyimide is 70% or more More than 80% is more preferable, and more than 90% is more preferable. The upper limit of the above-mentioned imidization rate is not particularly limited, as long as it is 100% or less. The said imidization rate is measured by the following method, for example. The infrared absorption spectrum of polyimide was measured, and the peak intensity P1 around 1377 cm -1 which is an absorption peak derived from the imide structure was obtained. Next, after heat-treating this polyimide at 350° C. for 1 hour, the infrared absorption spectrum was measured again, and the peak intensity P2 around 1377 cm −1 was obtained. Using the obtained peak intensities P1 and P2, the imidization rate of polyimide can be calculated from the following formula. Amide imidization rate (%) = (peak intensity P1/peak intensity P2) × 100

聚醯亞胺可以全部都含有包含一種R 131或R 132之上述式（4）所表示之重複單元，亦可以含有包含2個以上的不同種類的R 131或R 132之上述式（4）所表示之重複單元。又，聚醯亞胺除了上述式（4）所表示之重複單元以外，亦可以包含其他種類的重複單元。作為其他種類的重複單元，例如，可以舉出上述式（2）所表示之重複單元等。 Polyimides may all contain repeating units represented by the above formula (4) containing one R 131 or R 132 , or may contain two or more different types of R 131 or R 132 represented by the above formula (4). Represents the repeating unit. In addition, the polyimide may contain other types of repeating units other than the repeating unit represented by the above formula (4). As another kind of repeating unit, the repeating unit represented by said formula (2), etc. are mentioned, for example.

聚醯亞胺例如能夠利用如下方法來進行合成：在低溫下使四羧酸二酐與二胺（將一部分置換為單胺封端劑）進行反應之方法；在低溫下使四羧酸二酐（將一部分置換為酸酐或單醯氯化合物或單活性酯化合物封端劑）與二胺進行反應之方法；藉由四羧酸二酐和醇來獲得二酯，然後使其與二胺（將一部分置換為單胺封端劑）在縮合劑的存在下進行反應之方法；利用藉由四羧酸二酐和醇獲得二酯，然後使剩餘的二羧酸進行醯氯化，並使其與二胺（將一部分置換為單胺封端劑）進行反應之方法等方法獲得聚醯亞胺前驅物，並且使用已知的醯亞胺化反應法使其完全醯亞胺化之方法；或者，在中途停止醯亞胺化反應，導入一部分醯亞胺結構之方法；以及藉由混合完全醯亞胺化之聚合物和該聚醯亞胺前驅物而導入一部分醯亞胺結構之方法。又，亦能夠適用其他公知的聚醯亞胺的合成方法。Polyimide can be synthesized by, for example, the method of reacting tetracarboxylic dianhydride and diamine (replacing a part with monoamine end-capping agent) at low temperature; making tetracarboxylic dianhydride (replacing a part with an acid anhydride or a monoacyl chloride compound or a monoactive ester compound end-capping agent) is a method of reacting with a diamine; a diester is obtained by tetracarboxylic dianhydride and alcohol, and then it is combined with a diamine (the A method of reacting in the presence of a condensing agent; using a tetracarboxylic dianhydride and an alcohol to obtain a diester, then making the remaining dicarboxylic acid acyl chlorinated, and making it with A method of reacting a diamine (replacing a part with a monoamine end-capping agent) to obtain a polyimide precursor, and using a known imidization reaction method to completely imidize it; or, A method for introducing a part of imide structure by stopping the imidization reaction in the middle; and a method for introducing a part of the imide structure by mixing a completely imidized polymer and the polyimide precursor. In addition, other known polyimide synthesis methods can also be applied.

聚醯亞胺的重量平均分子量（Mw）較佳為5,000～100,000，更佳為10,000～50,000，進一步較佳為15,000～40,000。藉由將重量平均分子量設為5,000以上，能夠提高硬化後的膜的耐折性。為了獲得機械特性（例如，斷裂伸長率）優異之有機膜，重量平均分子量係15,000以上為特佳。 又，聚醯亞胺的數量平均分子量（Mn）較佳為2,000～40,000，更佳為3,000～30,000，進一步較佳為4,000～20,000。 上述聚醯亞胺的分子量的分散度係1.5以上為較佳，1.8以上為更佳，2.0以上為進一步較佳。聚醯亞胺的分子量的分散度的上限值並沒有特別規定，例如係7.0以下為較佳，6.5以下為更佳，6.0以下為進一步較佳。 又，樹脂組成物作為特定樹脂而包含複數種聚醯亞胺之情況下，至少一種聚醯亞胺的重量平均分子量、數量平均分子量及分散度在上述範圍內為較佳。又，將上述複數種聚醯亞胺作為1種樹脂而算出之重量平均分子量、數量平均分子量及分散度分別在上述範圍內亦較佳。 The weight average molecular weight (Mw) of polyimide becomes like this. Preferably it is 5,000-100,000, More preferably, it is 10,000-50,000, More preferably, it is 15,000-40,000. By making the weight average molecular weight 5,000 or more, the folding resistance of the cured film can be improved. In order to obtain an organic film excellent in mechanical properties (for example, elongation at break), it is particularly preferable that the weight average molecular weight is 15,000 or more. Moreover, the number average molecular weight (Mn) of polyimide becomes like this. Preferably it is 2,000-40,000, More preferably, it is 3,000-30,000, More preferably, it is 4,000-20,000. The molecular weight dispersion of the polyimide is preferably at least 1.5, more preferably at least 1.8, and still more preferably at least 2.0. The upper limit of the molecular weight dispersion of polyimide is not specifically defined, for example, it is preferably 7.0 or less, more preferably 6.5 or less, and still more preferably 6.0 or less. Also, when the resin composition contains a plurality of polyimides as the specific resin, it is preferable that the weight average molecular weight, number average molecular weight, and degree of dispersion of at least one polyimide are within the above-mentioned ranges. Moreover, it is also preferable that the weight average molecular weight, the number average molecular weight, and the degree of dispersion calculated using the above-mentioned plural kinds of polyimides as one type of resin are within the above-mentioned ranges, respectively.

〔聚苯并㗁唑前驅物〕 關於本發明中所使用之聚苯并㗁唑前驅物，其結構等並沒有特別規定，較佳為包含下述式（3）所表示之重複單元。 [化學式14]

Figure 02_image027
式（3）中，R 121表示2價的有機基團，R 122表示4價的有機基團，R 123及R 124分別獨立地表示氫原子或1價的有機基團。 [Polybenzoxazole precursor] The structure of the polybenzoxazole precursor used in the present invention is not particularly limited, but preferably includes a repeating unit represented by the following formula (3). [chemical formula 14]
Figure 02_image027
In formula (3), R 121 represents a divalent organic group, R 122 represents a tetravalent organic group, and R 123 and R 124 each independently represent a hydrogen atom or a monovalent organic group.

式（3）中，R 123及R 124分別與式（2）中的R 113同義，較佳範圍亦相同。亦即，至少一者係聚合性基為較佳。 式（3）中，R 121表示2價的有機基團。作為2價的有機基團，包含脂肪族基及芳香族基中的至少一者之基團為較佳。作為脂肪族基，直鏈脂肪族基為較佳。R 121係二羧酸殘基為較佳。二羧酸殘基可以僅使用1種，亦可以使用2種以上。 In formula (3), R 123 and R 124 are respectively synonymous with R 113 in formula (2), and their preferred ranges are also the same. That is, at least one of them is preferably a polymerizable group. In formula (3), R 121 represents a divalent organic group. As the divalent organic group, a group containing at least one of an aliphatic group and an aromatic group is preferable. As the aliphatic group, a straight-chain aliphatic group is preferred. R 121 is preferably a dicarboxylic acid residue. As for dicarboxylic acid residues, only 1 type may be used, and 2 or more types may be used.

作為二羧酸殘基，包含脂肪族基之二羧酸及包含芳香族基之二羧酸殘基為較佳，包含芳香族基之二羧酸殘基為更佳。 作為包含脂肪族基之二羧酸，包含直鏈或支鏈（較佳為直鏈）脂肪族基之二羧酸為較佳，由直鏈或支鏈（較佳為直鏈）脂肪族基和2個-COOH構成之二羧酸為更佳。直鏈或支鏈（較佳為直鏈）脂肪族基的碳數係2～30為較佳，2～25為更佳，3～20為進一步較佳，4～15為進一步較佳，5～10為特佳。直鏈脂肪族基係伸烷基為較佳。 作為包含直鏈脂肪族基之二羧酸，可以舉出丙二酸、二甲基丙二酸、乙基丙二酸、異丙基丙二酸、二正丁基丙二酸、丁二酸、四氟丁二酸、甲基丁二酸、2,2-二甲基丁二酸、2,3-二甲基丁二酸、二甲基甲基丁二酸、戊二酸、六氟戊二酸、2-甲基戊二酸、3-甲基戊二酸、2,2-二甲基戊二酸、3,3-二甲基戊二酸、3-乙基-3-甲基戊二酸、己二酸、八氟己二酸、3-甲基己二酸、庚二酸、2,2,6,6-四甲基庚二酸、辛二酸、十二氟辛二酸、壬二酸、癸二酸、十六氟癸二酸、1,9-壬二酸、十二烷二酸、十三烷二酸、十四烷二酸、十五烷二酸、十六烷二酸、十七烷二酸、十八烷二酸、十九烷二酸、二十烷二酸、二十一烷二酸、二十二烷二酸、二十三烷二酸、二十四烷二酸、二十五烷二酸、二十六烷二酸、二十七烷二酸、二十八烷二酸、二十九烷二酸、三十烷二酸、三十一烷二酸、三十二烷二酸、二乙醇酸（diglycolic acid）以及下述式所表示之二羧酸等。 As the dicarboxylic acid residue, an aliphatic group-containing dicarboxylic acid residue and an aromatic group-containing dicarboxylic acid residue are preferable, and an aromatic group-containing dicarboxylic acid residue is more preferable. As dicarboxylic acids containing aliphatic groups, dicarboxylic acids containing straight-chain or branched (preferably straight-chain) aliphatic groups are preferred, and straight-chain or branched (preferably straight-chain) aliphatic groups A dicarboxylic acid composed of 2 -COOH is more preferable. The carbon number of the straight-chain or branched (preferably straight-chain) aliphatic group is preferably 2-30, more preferably 2-25, more preferably 3-20, more preferably 4-15, and 5 ~10 is particularly good. Straight-chain aliphatic-based alkylene is preferred. Examples of dicarboxylic acids containing straight-chain aliphatic groups include malonic acid, dimethylmalonic acid, ethylmalonic acid, isopropylmalonic acid, di-n-butylmalonic acid, and succinic acid. , tetrafluorosuccinic acid, methylsuccinic acid, 2,2-dimethylsuccinic acid, 2,3-dimethylsuccinic acid, dimethylmethylsuccinic acid, glutaric acid, hexafluoro Glutaric acid, 2-methylglutaric acid, 3-methylglutaric acid, 2,2-dimethylglutaric acid, 3,3-dimethylglutaric acid, 3-ethyl-3-methanoic acid Glutaric acid, adipic acid, octafluoroadipic acid, 3-methyladipic acid, pimelic acid, 2,2,6,6-tetramethylpimelic acid, suberic acid, dodecafluorooctanoic acid Diacid, Azelaic Acid, Sebacic Acid, Hexadecafluorosebacic Acid, 1,9-Azelaic Acid, Dodecanedioic Acid, Tridecanedioic Acid, Tetradecanedioic Acid, Pentadecanedioic Acid, Hexadecanedioic acid, heptadecanedioic acid, octadecanedioic acid, nonadecanedioic acid, eicosanedioic acid, hexadecanedioic acid, docosanedioic acid, tricosanedioic acid , tetracosanedioic acid, pentadecanedioic acid, hexacanedioic acid, heptacanedioic acid, octadecanedioic acid, nonacanedioic acid, triacanedioic acid, three Undecanedioic acid, docosanedioic acid, diglycolic acid (diglycolic acid), and dicarboxylic acids represented by the following formulae, etc.

[化學式15]

Figure 02_image029
（式中，Z係碳數1～6的烴基，n係1～6的整數。） [chemical formula 15]
Figure 02_image029
(In the formula, Z is a hydrocarbon group with 1 to 6 carbons, and n is an integer of 1 to 6.)

作為包含芳香族基之二羧酸，以下的具有芳香族基之二羧酸為較佳，以下的僅由具有芳香族基之基團和2個-COOH構成之二羧酸為更佳。As the dicarboxylic acid containing an aromatic group, the following dicarboxylic acids having an aromatic group are preferable, and the following dicarboxylic acids consisting only of a group having an aromatic group and two -COOH are more preferable.

[化學式16]

Figure 02_image031
式中，A表示選自包括-CH 2-、-O-、-S-、-SO 2-、-CO-、-NHCO-、-C（CF 3） 2-及-C（CH 3） 2-之群組中的2價的基團，*分別獨立地表示與其他結構的鍵結部位。 [chemical formula 16]
Figure 02_image031
In the formula, A represents the group consisting of -CH 2 -, -O-, -S-, -SO 2 -, -CO-, -NHCO-, -C(CF 3 ) 2 - and -C(CH 3 ) 2 The divalent groups in the group of - and * each independently represent a bonding site with another structure.

作為包含芳香族基之二羧酸的具體例，可以舉出4,4’-羰基二苯甲酸及4,4’-二羧基二苯醚、鄰苯二甲酸。Specific examples of dicarboxylic acids containing aromatic groups include 4,4'-carbonyldibenzoic acid, 4,4'-dicarboxydiphenyl ether, and phthalic acid.

式（3）中，R 122表示4價的有機基團。作為4價的有機基團，與上述式（2）中的R 115同義，較佳範圍亦相同。 又，R 122係源自雙胺基苯酚衍生物之基團亦較佳，作為源自雙胺基苯酚衍生物之基團，例如可以舉出3,3’-二胺基-4,4’-二羥基聯苯、4,4’-二胺基-3,3’-二羥基聯苯、3,3’-二胺基-4,4’-二羥基二苯碸、4,4’-二胺基-3,3’-二羥基二苯碸、雙-（3-胺基-4-羥基苯基）甲烷、2,2-雙（3-胺基-4-羥基苯基）丙烷、2,2-雙-（3-胺基-4-羥基苯基）六氟丙烷、2,2-雙-（4-胺基-3-羥基苯基）六氟丙烷、雙-（4-胺基-3-羥基苯基）甲烷、2,2-雙-（4-胺基-3-羥基苯基）丙烷、4,4’-二胺基-3,3’-二羥基二苯甲酮、3,3’-二胺基-4,4’-二羥基二苯甲酮、4,4’-二胺基-3,3’-二羥基二苯醚、3,3’-二胺基-4,4’-二羥基二苯醚、1,4-二胺基-2,5-二羥基苯、1,3-二胺基-2,4-二羥基苯、1,3-二胺基-4,6-二羥基苯等。該等雙胺基苯酚可以單獨使用或者混合使用。 In formula (3), R 122 represents a tetravalent organic group. As a tetravalent organic group, it has the same meaning as R 115 in the above formula (2), and the preferable range is also the same. In addition, R122 is also preferably a group derived from a bisaminophenol derivative. As a group derived from a bisaminophenol derivative, for example, 3,3'-diamino-4,4' -Dihydroxybiphenyl, 4,4'-diamino-3,3'-dihydroxybiphenyl, 3,3'-diamino-4,4'-dihydroxydiphenyl, 4,4'- Diamino-3,3'-dihydroxydiphenylene, bis-(3-amino-4-hydroxyphenyl)methane, 2,2-bis(3-amino-4-hydroxyphenyl)propane, 2,2-bis-(3-amino-4-hydroxyphenyl)hexafluoropropane, 2,2-bis-(4-amino-3-hydroxyphenyl)hexafluoropropane, bis-(4-amine 3-hydroxyphenyl)methane, 2,2-bis-(4-amino-3-hydroxyphenyl)propane, 4,4'-diamino-3,3'-dihydroxybenzophenone , 3,3'-diamino-4,4'-dihydroxybenzophenone, 4,4'-diamino-3,3'-dihydroxydiphenyl ether, 3,3'-diamino -4,4'-dihydroxydiphenyl ether, 1,4-diamino-2,5-dihydroxybenzene, 1,3-diamino-2,4-dihydroxybenzene, 1,3-diamine Base-4,6-dihydroxybenzene, etc. These bisaminophenols can be used alone or in combination.

在雙胺基苯酚衍生物之中，下述具有芳香族基之雙胺基苯酚衍生物為較佳。Among the bisaminophenol derivatives, the following bisaminophenol derivatives having an aromatic group are preferred.

[化學式17]

Figure 02_image033
式中，X 1表示-O-、-S-、-C（CF 3） 2-、-CH 2-、-SO 2-、-NHCO-，*及#分別表示與其他結構的鍵結部位。R表示氫原子或1價的取代基，氫原子或烴基為較佳，氫原子或烷基為更佳。又，R 122係由上述式表示之結構亦較佳。R 122係由上述式表示之結構之情況下，在共計4個*及#中，任意2個係與式（3）中的R 122所鍵結之氮原子的鍵結部位且其他2個係與式（3）中的R 122所鍵結之氧原子的鍵結部位為較佳，2個*係與式（3）中的R 122所鍵結之氧原子的鍵結部位且2個#係與式（3）中的R 122所鍵結之氮原子的鍵結部位，或者2個*係與式（3）中的R 122所鍵結之氮原子的鍵結部位且2個#係與式（3）中的R 122所鍵結之氧原子的鍵結部位為更佳，2個*係與式（3）中的R 122所鍵結之氧原子的鍵結部位且2個#係與式（3）中的R 122所鍵結之氮原子的鍵結部位為進一步較佳。 [chemical formula 17]
Figure 02_image033
In the formula, X 1 represents -O-, -S-, -C(CF 3 ) 2 -, -CH 2 -, -SO 2 -, -NHCO-, and * and # represent bonding sites with other structures, respectively. R represents a hydrogen atom or a monovalent substituent, preferably a hydrogen atom or a hydrocarbon group, more preferably a hydrogen atom or an alkyl group. In addition, it is also preferable that R 122 is a structure represented by the above formula. In the case where R 122 is a structure represented by the above formula, among the total 4 * and #, any 2 are bonding sites to the nitrogen atom to which R 122 in formula (3) is bonded and the other 2 are The bonding position of the oxygen atom bonded to the R 122 in the formula (3) is preferred, and the 2 * are the bonding sites of the oxygen atom bonded to the R 122 in the formula (3) and 2 # is the bonding site of the nitrogen atom bonded to R 122 in formula (3), or 2 * are bonded sites of the nitrogen atom bonded to R 122 in formula (3) and 2 # are The bonding position of the oxygen atom bonded to R 122 in formula (3) is more preferable, and 2 * are the bonding sites of the oxygen atom bonded to R 122 in formula (3) and 2 # The bonding site to the nitrogen atom to which R 122 in formula (3) is bonded is further preferred.

雙胺基苯酚衍生物係式（A-s）所表示之化合物亦較佳。 [化學式18]

Figure 02_image035
The bisaminophenol derivative is also preferably a compound represented by the formula (As). [chemical formula 18]
Figure 02_image035

式（A-s）中，R 1係氫原子、伸烷基、取代伸烷基、-O-、-S-、-SO 2-、-CO-、-NHCO-、單鍵或選自下述式（A-sc）的群組中之有機基團。R 2係氫原子、烷基、烷氧基、醯氧基、環狀烷基中的任一個，其可以相同亦可以不同。R 3係氫原子、直鏈或支鏈烷基、烷氧基、醯氧基、環狀烷基中的任一個，其可以相同亦可以不同。 In the formula (As), R 1 is a hydrogen atom, an alkylene group, a substituted alkylene group, -O-, -S-, -SO 2 -, -CO-, -NHCO-, a single bond or selected from the following formulae Organic groups in the group of (A-sc). R 2 is any one of a hydrogen atom, an alkyl group, an alkoxy group, an acyloxy group, and a cyclic alkyl group, which may be the same or different. R 3 is any one of a hydrogen atom, a linear or branched alkyl group, an alkoxy group, an acyloxy group, and a cyclic alkyl group, which may be the same or different.

[化學式19]

Figure 02_image037
（式（A-sc）中，*表示鍵結於上述式（A-s）所表示之雙胺基苯酚衍生物的胺基苯酚基的芳香環。） [chemical formula 19]
Figure 02_image037
(In the formula (A-sc), * represents an aromatic ring bonded to the aminophenol group of the bisaminophenol derivative represented by the above formula (As).)

上述式（A-s）中，認為在酚性羥基的鄰位亦即R 3上亦具有取代基會使醯胺鍵的羰基碳與羥基的距離更靠近，在低溫下硬化時成為高環化率之效果進一步獲得提高之觀點上為特佳。 In the above formula (As), it is considered that there is also a substituent on the ortho position of the phenolic hydroxyl group, that is, R3 , which will make the distance between the carbonyl carbon of the amide bond and the hydroxyl group closer, and become one of high cyclization rates when hardened at low temperature. It is particularly preferable from the viewpoint of further improving the effect.

又，上述式（A-s）中，R 2係烷基且R 3係烷基時能夠維持對i射線的高透明性和在低溫下硬化時為高環化率這樣的效果，因此為較佳。 In addition, in the above formula (As), when R 2 is an alkyl group and R 3 is an alkyl group, the effects of high transparency to i-rays and high cyclization rate when cured at low temperature can be maintained are preferable.

又，上述式（A-s）中，R 1係伸烷基或取代伸烷基為進一步較佳。作為R 1之伸烷基及取代伸烷基的具體例，可以舉出碳數1～8的直鏈狀或支鏈狀烷基，其中，在維持對i射線的高透明性和在低溫下硬化時係為高環化率這樣的效果，並且能夠獲得對溶劑具有充分的溶解性之平衡優異之聚苯并㗁唑前驅物之觀點上，-CH 2-、-CH（CH 3）-、-C（CH 3） 2-為更佳。 Also, in the above formula (As), it is further preferred that R 1 is an alkylene group or a substituted alkylene group. Specific examples of the alkylene group and substituted alkylene group for R1 include straight-chain or branched-chain alkyl groups having 1 to 8 carbon atoms, among which, while maintaining high transparency to i-rays and low temperature From the viewpoint of the effect of high cyclization rate during curing and the ability to obtain a polybenzoxazole precursor with sufficient solubility in solvents and an excellent balance, -CH 2 -, -CH(CH 3 )-, -C(CH 3 ) 2 - is more preferred.

作為上述式（A-s）所表示之雙胺基苯酚衍生物之製造方法，例如能夠參閱日本特開2013-256506號公報的段落號0085～0094及實施例1（段落號0189～0190），該等內容被編入本說明書中。As a method for producing the bisaminophenol derivative represented by the above formula (A-s), for example, paragraphs 0085 to 0094 and Example 1 (paragraphs 0189 to 0190) of JP-A-2013-256506 can be referred to. The contents are incorporated into this manual.

作為上述式（A-s）所表示之雙胺基苯酚衍生物的結構的具體例，可以舉出日本特開2013-256506號公報的段落號0070～0080中所記載者，該等內容被編入本說明書中。當然並不限定於該等。Specific examples of the structure of the bisaminophenol derivative represented by the above-mentioned formula (A-s) include those described in paragraphs 0070 to 0080 of JP-A-2013-256506, which are incorporated herein. middle. Of course, it is not limited to these.

聚苯并㗁唑前驅物除了上述式（3）的重複單元以外，亦可以包含其他種類的重複單元。 在能夠抑制伴隨閉環而產生翹曲之觀點上，聚苯并㗁唑前驅物包含下述式（SL）所表示之二胺殘基作為其他種類的重複單元為較佳。 The polybenzoxazole precursor may also contain other types of repeating units in addition to the repeating units of the above formula (3). It is preferable that the polybenzoxazole precursor contains a diamine residue represented by the following formula (SL) as another type of repeating unit from the viewpoint of being able to suppress warpage accompanying ring closure.

[化學式20]

Figure 02_image039
式（SL）中，Z具有a結構和b結構，R 1s係氫原子或碳數1～10的烴基，R 2s係碳數1～10的烴基，R 3s、R 4s、R 5s、R 6s中的至少1個係芳香族基，其餘係氫原子或碳數1～30的有機基團，其分別可以相同亦可以不同。a結構及b結構的聚合可以係嵌段聚合，亦可以係無規聚合。關於Z部分的莫耳%，a結構係5～95莫耳%、b結構係95～5莫耳%，a+b係100莫耳%。 [chemical formula 20]
Figure 02_image039
In formula (SL), Z has structure a and structure b, R 1s is a hydrogen atom or a hydrocarbon group with 1 to 10 carbons, R 2s is a hydrocarbon group with 1 to 10 carbons, R 3s , R 4s , R 5s , R 6s Among them, at least one is an aromatic group, and the rest is a hydrogen atom or an organic group having 1 to 30 carbon atoms, which may be the same or different. The polymerization of structure a and structure b may be block polymerization or random polymerization. The molar % of the Z part is 5-95 molar % for a structure, 95-5 molar % for b structure, and 100 molar % for a+b.

式（SL）中，作為較佳的Z，可以舉出b結構中的R 5s及R 6s係苯基者。又，式（SL）所示之結構的分子量係400～4,000為較佳，500～3,000為更佳。藉由將上述分子量設在上述範圍內，能夠更有效地減小聚苯并㗁唑前驅物的脫水閉環後的彈性模數，能夠兼顧可抑制翹曲之效果和提高溶劑溶解性之效果。 In formula (SL), preferred Z includes those in which R 5s and R 6s in structure b are phenyl groups. In addition, the molecular weight of the structure represented by the formula (SL) is preferably 400-4,000, more preferably 500-3,000. By setting the above molecular weight within the above range, the elastic modulus of the polybenzoxazole precursor after dehydration and ring closure can be reduced more effectively, and both the effect of suppressing warpage and the effect of improving solvent solubility can be achieved.

包含式（SL）所表示之二胺殘基作為其他種類的重複單元之情況下，進一步包含從四羧酸二酐中去除酐基之後殘存之四羧酸殘基作為重複單元亦較佳。作為該種四羧酸殘基的例子，可以舉出式（2）中的R 115的例子。 When including the diamine residue represented by formula (SL) as another type of repeating unit, it is also preferable to further include, as a repeating unit, a tetracarboxylic acid residue remaining after removing an anhydride group from tetracarboxylic dianhydride. An example of such a tetracarboxylic acid residue includes an example of R 115 in formula (2).

例如，聚苯并㗁唑前驅物的重量平均分子量（Mw）較佳為18,000～30,000，更佳為20,000～29,000，進一步較佳為22,000～28,000。又，數量平均分子量（Mn）較佳為7,200～14,000，更佳為8,000～12,000，進一步較佳為9,200～11,200。 上述聚苯并㗁唑前驅物的分子量的分散度係1.4以上為較佳，1.5以上為更佳，1.6以上為進一步較佳。聚苯并㗁唑前驅物的分子量的分散度的上限值並沒有特別規定，例如，2.6以下為較佳，2.5以下為更佳，2.4以下為進一步較佳，2.3以下為進一步較佳，2.2以下為更進一步較佳。 又，樹脂組成物作為特定樹脂而包含複數種聚苯并㗁唑前驅物之情況下，至少一種聚苯并㗁唑前驅物的重量平均分子量、數量平均分子量及分散度在上述範圍內為較佳。又，將上述複數種聚苯并㗁唑前驅物作為1種樹脂而算出之重量平均分子量、數量平均分子量及分散度分別在上述範圍內亦較佳。 For example, the weight average molecular weight (Mw) of the polybenzoxazole precursor is preferably 18,000-30,000, more preferably 20,000-29,000, further preferably 22,000-28,000. Moreover, the number average molecular weight (Mn) becomes like this. Preferably it is 7,200-14,000, More preferably, it is 8,000-12,000, More preferably, it is 9,200-11,200. The molecular weight dispersion of the polybenzoxazole precursor is preferably at least 1.4, more preferably at least 1.5, and still more preferably at least 1.6. The upper limit of the molecular weight dispersion of the polybenzoxazole precursor is not particularly specified, for example, 2.6 or less is preferred, 2.5 or less is more preferred, 2.4 or less is further preferred, 2.3 or less is still more preferred, and 2.2 The following are further preferred. In addition, when the resin composition contains plural kinds of polybenzoxazole precursors as a specific resin, it is preferable that the weight average molecular weight, number average molecular weight and dispersity of at least one polybenzoxazole precursor are within the above-mentioned ranges. . Moreover, it is also preferable that the weight average molecular weight, the number average molecular weight, and the degree of dispersion calculated by using the above-mentioned plurality of polybenzoxazole precursors as one resin are within the above-mentioned ranges, respectively.

〔聚苯并㗁唑〕 作為聚苯并㗁唑，只要為具有苯并㗁唑環之高分子化合物，則沒有特別限定，下述式（X）所表示之化合物為較佳，下述式（X）所表示且具有聚合性基之化合物為更佳。作為上述聚合性基，自由基聚合性基為較佳。又，亦可以係下述式（X）所表示且具有酸分解性基等極性轉換基之化合物。 [化學式21]

Figure 02_image041
式（X）中，R 133表示2價的有機基團，R 134表示4價的有機基團。 具有聚合性基或酸分解性基等極性轉換基之情況下，聚合性基或酸分解性基等極性轉換基可以位於R 133及R 134中的至少一者上，如下述式（X-1）或式（X-2）所示，亦可以位於聚苯并㗁唑的末端。 式（X-1） [化學式22]
Figure 02_image043
式（X-1）中，R 135及R 136中的至少一者係聚合性基或酸分解性基等極性轉換基，當不是聚合性基或酸分解性基等極性轉換基時係有機基團，其他基團與式（X）同義。 式（X-2） [化學式23]
Figure 02_image045
式（X-2）中，R 137係聚合性基或酸分解性基等極性轉換基，其他係取代基，其他基團與式（X）同義。 [Polybenzoxazole] The polybenzoxazole is not particularly limited as long as it is a polymer compound having a benzoxazole ring, but a compound represented by the following formula (X) is preferable, and the following formula ( A compound represented by X) and having a polymerizable group is more preferable. As said polymerizable group, a radical polymerizable group is preferable. Also, it may be a compound represented by the following formula (X) and having a polarity conversion group such as an acid decomposable group. [chemical formula 21]
Figure 02_image041
In formula (X), R 133 represents a divalent organic group, and R 134 represents a tetravalent organic group. In the case of having a polarity conversion group such as a polymerizable group or an acid decomposable group, the polarity conversion group such as a polymerizable group or an acid decomposable group can be located on at least one of R 133 and R 134 , as shown in the following formula (X-1 ) or formula (X-2), it can also be located at the end of polybenzoxazole. Formula (X-1) [Chemical Formula 22]
Figure 02_image043
In formula (X-1), at least one of R 135 and R 136 is a polarity conversion group such as a polymerizable group or an acid decomposable group, and is an organic group when it is not a polarity conversion group such as a polymerizable group or an acid decomposable group group, other groups are synonymous with formula (X). Formula (X-2) [Chemical Formula 23]
Figure 02_image045
In formula (X-2), R 137 is a polarity conversion group such as a polymerizable group or an acid decomposable group, and other groups are substituents, and the other groups have the same meaning as in formula (X).

聚合性基或酸分解性基等極性轉換基與在上述聚醯亞胺前驅物所具有之聚合性基中敘述之聚合性基同義。The polarity converting group such as a polymerizable group or an acid-decomposable group has the same meaning as the polymerizable group described in the above-mentioned polymerizable group of the polyimide precursor.

R 133表示2價的有機基團。作為2價的有機基團，可以舉出脂肪族基或芳香族基。作為具體例，可以舉出聚苯并㗁唑前驅物的式（3）中的R 121的例子。又，其較佳例與R 121相同。 R 133 represents a divalent organic group. As a divalent organic group, an aliphatic group or an aromatic group is mentioned. As a specific example, the example of R 121 in the formula (3) of the polybenzoxazole precursor can be mentioned. Also, preferred examples thereof are the same as for R121 .

R 134表示4價的有機基團。作為4價的有機基團，可以舉出聚苯并㗁唑前驅物的式（3）中的R 122的例子。又，其較佳例與R 122相同。 例如，作為R 122而例示之4價的有機基團的4個鍵結子與上述式（X）中的氮原子、氧原子鍵結而形成縮合環。例如，R 134係下述有機基團之情況下，形成下述結構。下述結構中，*分別表示式（X）中的與氮原子或氧原子的鍵結部位。 [化學式24]

Figure 02_image047
R 134 represents a tetravalent organic group. Examples of the tetravalent organic group include R 122 in the formula (3) of the polybenzoxazole precursor. Also, preferred examples thereof are the same as R122 . For example, four linkers of the tetravalent organic group exemplified as R 122 are bonded to the nitrogen atom and the oxygen atom in the above formula (X) to form a condensed ring. For example, when R134 is the following organic group, the following structure is formed. In the following structures, * respectively represents a bonding site with a nitrogen atom or an oxygen atom in the formula (X). [chemical formula 24]
Figure 02_image047

聚苯并㗁唑的㗁唑化率係85%以上為較佳，90%以上為更佳。上限並沒有特別限定，可以係100%。藉由㗁唑化率係85%以上，由藉由加熱而㗁唑化時所產生之閉環所引起之膜收縮減少，能夠更有效地抑制產生翹曲。 上述㗁唑化率例如藉由下述方法來測量。 測量聚苯并㗁唑的紅外吸收光譜，求出源自前驅物的醯胺結構之吸收峰亦即1650cm -1附近的峰強度Q1。接著，以在1490cm -1附近觀察到之芳香環的吸收強度來進行標準化。在350℃下對其聚苯并㗁唑熱處理1小時之後，再次測量紅外吸收光譜，求出1650cm -1附近的峰強度Q2，並且以1490cm -1附近觀察到之芳香環的吸收強度進行標準化。能夠使用所獲得之峰強度Q1、Q2的標準值，並且基於下述式來求出聚苯并㗁唑的㗁唑化率。 㗁唑化率（%）=（峰強度Q1的標準值/峰強度Q2的標準值）×100 The oxazolization rate of polybenzoxazole is preferably 85% or more, more preferably 90% or more. The upper limit is not particularly limited, and may be 100%. Since the oxazolization rate is 85% or more, shrinkage of the film caused by closed rings generated during oxazoleization by heating is reduced, and warpage can be more effectively suppressed. The aforementioned oxazolization rate is measured, for example, by the following method. Measure the infrared absorption spectrum of polybenzoxazole, and obtain the peak intensity Q1 around 1650 cm -1 which is the absorption peak derived from the amide structure of the precursor. Next, normalization was performed by the absorption intensity of the aromatic ring observed around 1490 cm -1 . After the polybenzoxazole was heat-treated at 350°C for 1 hour, the infrared absorption spectrum was measured again, and the peak intensity Q2 around 1650cm - 1 was obtained, and normalized by the absorption intensity of the aromatic ring observed around 1490cm -1 . Using the obtained standard values of the peak intensities Q1 and Q2, the oxazole conversion rate of polybenzoxazole can be calculated based on the following formula. Ozolization rate (%) = (standard value of peak intensity Q1/standard value of peak intensity Q2) × 100

聚苯并㗁唑可以全部都含有包含一種R 131或R 132之上述式（X）的重複單元，亦可以含有包含2個以上的不同種類的R 131或R 132之上述式（X）的重複單元。又，聚苯并㗁唑除了上述式（X）的重複單元以外，亦可以包含其他種類的重複單元。 All polybenzoxazoles may contain repeating units of the above formula (X) containing one type of R 131 or R 132 , or may contain repeating units of the above formula (X) containing two or more different types of R 131 or R 132 unit. In addition, the polybenzoxazole may contain other types of repeating units other than the repeating unit of the above-mentioned formula (X).

聚苯并㗁唑例如藉由使雙胺基苯酚衍生物與包含R 133之二羧酸或選自上述二羧酸的二羧酸二醯氯（dicarboxylic acid dichloride）及二羧酸衍生物等中之化合物進行反應而獲得聚苯并㗁唑前驅物，並利用已知的㗁唑化反應法使其㗁唑化而獲得。 另外，在二羧酸的情況下，為了提高反應產率等，可以使用使1-羥基-1,2,3-苯并三唑等預先反應而獲得之活性酯型二羧酸衍生物。 Polybenzoxazole, for example, is obtained by mixing a diaminophenol derivative with a dicarboxylic acid containing R 133 or a dicarboxylic acid dichloride (dicarboxylic acid dichloride) and a dicarboxylic acid derivative selected from the above-mentioned dicarboxylic acids. The compound is reacted to obtain a polybenzoxazole precursor, which is obtained by oxazolization using a known oxazole reaction method. In addition, in the case of a dicarboxylic acid, an active ester type dicarboxylic acid derivative obtained by previously reacting 1-hydroxy-1,2,3-benzotriazole or the like can be used in order to improve the reaction yield or the like.

聚苯并㗁唑的重量平均分子量（Mw）係5,000～70,000為較佳，8,000～50,000為更佳，10,000～30,000為進一步較佳。藉由將重量平均分子量設為5,000以上，能夠提高硬化後的膜的耐折性。為了獲得機械特性優異之有機膜，重量平均分子量係20,000以上為特佳。又，含有2種以上的聚苯并㗁唑之情況下，至少一種聚苯并㗁唑的重量平均分子量在上述範圍內為較佳。 又，聚苯并㗁唑的數量平均分子量（Mn）較佳為7,200～14,000，更佳為8,000～12,000，進一步較佳為9,200～11,200。 上述聚苯并㗁唑的分子量的分散度係1.4以上為較佳，1.5以上為更佳，1.6以上為進一步較佳。聚苯并㗁唑的分子量的分散度的上限值並沒有特別規定，例如2.6以下為較佳，2.5以下為更佳，2.4以下為進一步較佳，2.3以下為進一步較佳，2.2以下為更進一步較佳。 又，樹脂組成物作為特定樹脂而包含複數種聚苯并㗁唑之情況下，至少一種聚苯并㗁唑的重量平均分子量、數量平均分子量及分散度在上述範圍內為較佳。又，將上述複數種聚苯并㗁唑作為1種樹脂而算出之重量平均分子量、數量平均分子量及分散度分別在上述範圍內亦較佳。 The weight average molecular weight (Mw) of polybenzoxazole is preferably 5,000 to 70,000, more preferably 8,000 to 50,000, and still more preferably 10,000 to 30,000. By making the weight average molecular weight 5,000 or more, the folding resistance of the cured film can be improved. In order to obtain an organic film having excellent mechanical properties, it is particularly preferable that the weight average molecular weight is 20,000 or more. Moreover, when containing 2 or more types of polybenzoxazoles, it is preferable that the weight average molecular weight of at least 1 type of polybenzoxazoles exists in the said range. Moreover, the number average molecular weight (Mn) of polybenzoxazole becomes like this. Preferably it is 7,200-14,000, More preferably, it is 8,000-12,000, More preferably, it is 9,200-11,200. The molecular weight dispersion of the polybenzoxazole is preferably at least 1.4, more preferably at least 1.5, and still more preferably at least 1.6. The upper limit of the dispersion degree of the molecular weight of polybenzoxazole is not specifically defined, for example, 2.6 or less is preferable, 2.5 or less is more preferable, 2.4 or less is still more preferable, 2.3 or less is still more preferable, 2.2 or less is still more preferable. Further better. Also, when the resin composition contains a plurality of polybenzoxazoles as the specific resin, it is preferable that the weight average molecular weight, number average molecular weight, and degree of dispersion of at least one polybenzoxazole are within the above-mentioned ranges. Moreover, it is also preferable that the weight average molecular weight, the number average molecular weight, and the degree of dispersion calculated by using the above-mentioned plural kinds of polybenzoxazoles as one type of resin are within the above-mentioned ranges, respectively.

〔聚醯胺醯亞胺前驅物〕 聚醯胺醯亞胺前驅物包含下述式（PAI-2）所表示之重複單元為較佳。 [化學式25]

Figure 02_image049
式（PAI-2）中，R 117表示3價的有機基團，R 111表示2價的有機基團，A 2表示氧原子或-NH-，R 113表示氫原子或1價的有機基團。 [Polyamideimide Precursor] The polyamideimide precursor preferably contains a repeating unit represented by the following formula (PAI-2). [chemical formula 25]
Figure 02_image049
In the formula (PAI-2), R 117 represents a trivalent organic group, R 111 represents a divalent organic group, A 2 represents an oxygen atom or -NH-, R 113 represents a hydrogen atom or a monovalent organic group .

式（PAI-2）中，例示出R 117係直鏈狀或支鏈狀的脂肪族基、環狀的脂肪族基及芳香族基、雜芳族基或藉由單鍵或連接基而將該等連接2種以上而成之基團，碳數2～20的直鏈的脂肪族基、碳數3～20的支鏈的脂肪族基、碳數3～20的環狀的脂肪族基、碳數6～20的芳香族基或藉由單鍵或連接基而將該等組合2種以上而成之基團為較佳，碳數6～20的芳香族基或藉由單鍵或連接基而將碳數6～20的芳香族基組合2種以上而成之基團為更佳。 作為上述連接基，-O-、-S-、-C（=O）-、-S（=O） 2-、伸烷基、鹵化伸烷基、伸芳基或將該等鍵結2種以上而成之連接基為較佳，-O-、-S-、伸烷基、鹵化伸烷基、伸芳基或將該等鍵結2種以上而成之連接基為更佳。 作為上述伸烷基，碳數1～20的伸烷基為較佳，碳數1～10的伸烷基為更佳，碳數1～4的伸烷基為進一步較佳。 作為上述鹵化伸烷基，碳數1～20的鹵化伸烷基為較佳，碳數1～10的鹵化伸烷基為更佳，碳數1～4的鹵化伸烷基為更佳。又，作為上述鹵化伸烷基中的鹵素原子，可以舉出氟原子、氯原子、溴原子、碘原子等，氟原子為較佳。上述鹵化伸烷基可以具有氫原子，所有的氫原子亦可以被鹵素原子取代，但所有的氫原子被鹵素原子取代為較佳。作為較佳的鹵化伸烷基的例子，可以舉出（二三氟甲基）亞甲基等。 作為上述伸芳基，伸苯基或伸萘基為較佳，伸苯基為更佳，1,3-伸苯基或1,4-伸苯基為進一步較佳。 In the formula (PAI-2), R 117 is exemplified as a linear or branched aliphatic group, a cyclic aliphatic group, an aromatic group, a heteroaromatic group, or a single bond or a linking group. A group formed by linking two or more of these, a straight-chain aliphatic group with 2 to 20 carbons, a branched aliphatic group with 3 to 20 carbons, and a cyclic aliphatic group with 3 to 20 carbons , an aromatic group with 6 to 20 carbons or a combination of two or more of these through a single bond or a linking group is preferred, and an aromatic group with 6 to 20 carbons or a single bond or a linking group As the linking group, a combination of two or more aromatic groups having 6 to 20 carbon atoms is more preferable. As the above-mentioned linking group, -O-, -S-, -C(=O)-, -S(=O) 2 -, alkylene group, halogenated alkylene group, arylylene group, or a combination of these two types The above linking group is preferred, and -O-, -S-, alkylene, halogenated alkylene, arylylene, or a linking group in which two or more of these are bonded is more preferred. As the above-mentioned alkylene group, an alkylene group having 1 to 20 carbon atoms is preferable, an alkylene group having 1 to 10 carbon atoms is more preferable, and an alkylene group having 1 to 4 carbon atoms is still more preferable. As the alkylene halide, a alkylene halide having 1 to 20 carbons is preferable, an alkylene halide having 1 to 10 carbons is more preferable, and an alkylene halide having 1 to 4 carbons is more preferable. Moreover, examples of the halogen atom in the above-mentioned halogenated alkylene group include fluorine atom, chlorine atom, bromine atom, iodine atom and the like, among which fluorine atom is preferable. The above halogenated alkylene group may have hydrogen atoms, and all hydrogen atoms may be replaced by halogen atoms, but all hydrogen atoms are preferably replaced by halogen atoms. Examples of preferable alkylene halides include (bistrifluoromethyl)methylene and the like. As said aryl group, phenylene or naphthylene is preferable, phenylene is more preferable, and 1,3-phenylene or 1,4-phenylene is still more preferable.

又，R 117中至少一個羧基衍生自可以被鹵化之三羧酸化合物為較佳。作為上述鹵化，氯化為較佳。 在本發明中，將具有3個羧基之化合物稱為三羧酸化合物。 上述三羧酸化合物的3個羧基中的2個羧基可以被酸酐化。 作為聚醯胺醯亞胺前驅物的製造中所使用之可以被鹵化之三羧酸化合物，可以舉出支鏈狀脂肪族、環狀脂肪族或芳香族的三羧酸化合物等。 該等三羧酸化合物可以僅使用1種，亦可以使用2種以上。 Also, it is preferable that at least one carboxyl group in R 117 is derived from a tricarboxylic acid compound which may be halogenated. As the above-mentioned halogenation, chlorination is preferable. In the present invention, a compound having three carboxyl groups is called a tricarboxylic acid compound. Two of the three carboxyl groups of the tricarboxylic acid compound may be anhydrided. Examples of the tricarboxylic acid compound that may be halogenated used in the production of the polyamideimide precursor include branched aliphatic, cycloaliphatic, or aromatic tricarboxylic acid compounds. These tricarboxylic acid compounds may be used only by 1 type, and may use 2 or more types.

具體而言，作為三羧酸化合物，碳數2～20的直鏈脂肪族基、碳數3～20的支鏈脂肪族基、碳數3～20的環狀脂肪族基、碳數6～20的芳香族基或包含藉由單鍵或連接基而將該等組合2種以上而成之基團之三羧酸化合物為較佳，碳數6～20芳香族基或包含藉由單鍵或連接基而將碳數6～20的芳香族基組合2種以上而成之基團之三羧酸化合物為更佳。Specifically, as the tricarboxylic acid compound, a straight-chain aliphatic group having 2 to 20 carbons, a branched aliphatic group having 3 to 20 carbons, a cyclic aliphatic group having 3 to 20 carbons, a cyclic aliphatic group having 6 to 20 carbons, An aromatic group of 20 or a tricarboxylic acid compound comprising a combination of two or more of these through a single bond or a linking group is preferred, and an aromatic group with 6 to 20 carbons or an aromatic group containing Or a tricarboxylic acid compound in which two or more aromatic groups having 6 to 20 carbon atoms are combined as a linking group is more preferable.

又，作為三羧酸化合物的具體例，可以舉出1,2,3-丙烷三羧酸、1,3,5-戊烷三羧酸、檸檬酸、偏苯三甲酸、2,3,6-萘三甲酸、鄰苯二甲酸（或者鄰苯二甲酸酐）與苯甲酸藉由單鍵、-O-、-CH 2-、-C（CH 3） 2-、-C（CF 3） 2-、-SO 2-或伸苯基連接而成之化合物等。 該等化合物可以係2個羧基被酸酐化而成之化合物（例如，偏苯三酸酐），亦可以係至少一個羧基被鹵化而成之化合物（例如，氯化偏苯三酸酐）。 Moreover, specific examples of tricarboxylic acid compounds include 1,2,3-propanetricarboxylic acid, 1,3,5-pentanetricarboxylic acid, citric acid, trimellitic acid, 2,3,6 -Naphthalenetricarboxylic acid, phthalic acid (or phthalic anhydride) and benzoic acid through single bond, -O-, -CH 2 -, -C(CH 3 ) 2 -, -C(CF 3 ) 2 -, -SO 2 - or compounds formed by linking phenylene groups, etc. These compounds may be compounds in which two carboxyl groups are anhydrided (for example, trimellitic anhydride), or compounds in which at least one carboxyl group is halogenated (for example, trimellitic anhydride).

式（PAI-2）中，R 111、A 2、R 113分別與上述式（2）中的R 111、A 2、R 113同義，較佳態樣亦相同。 In formula (PAI-2), R 111 , A 2 , and R 113 have the same meanings as R 111 , A 2 , and R 113 in formula (2), respectively, and preferred embodiments are also the same.

聚醯胺醯亞胺前驅物可以進一步包含其他重複單元。 作為其他重複單元，可以舉出上述式（2）所表示之重複單元、下述式（PAI-1）所表示之重複單元等。 [化學式26]

Figure 02_image051
The polyamideimide precursor may further comprise other repeating units. As another repeating unit, the repeating unit represented by said formula (2), the repeating unit represented by following formula (PAI-1), etc. are mentioned. [chemical formula 26]
Figure 02_image051

式（PAI-1）中，R 116表示2價的有機基團，R 111表示2價的有機基團。 式（PAI-1）中，例示出R 116係直鏈狀或支鏈狀的脂肪族基、環狀的脂肪族基及芳香族基、雜芳族基或藉由單鍵或連接基而將該等連接2種以上而成之基團，碳數2～20的直鏈的脂肪族基、碳數3～20的支鏈的脂肪族基、碳數3～20的環狀的脂肪族基、碳數6～20的芳香族基或藉由單鍵或連接基而將該等組合2種以上而成之基團為較佳，碳數6～20的芳香族基或藉由單鍵或連接基而將碳數6～20的芳香族基組合2種以上而成之基團為更佳。 作為上述連接基，-O-、-S-、-C（=O）-、-S（=O） 2-、伸烷基、鹵化伸烷基、伸芳基或將該等鍵結2種以上而成之連接基為較佳，-O-、-S-、伸烷基、鹵化伸烷基、伸芳基或將該等鍵結2種以上而成之連接基為更佳。 作為上述伸烷基，碳數1～20的伸烷基為較佳，碳數1～10的伸烷基為更佳，碳數1～4的伸烷基為進一步較佳。 作為上述鹵化伸烷基，碳數1～20的鹵化伸烷基為較佳，碳數1～10的鹵化伸烷基為更佳，碳數1～4的鹵化伸烷基為更佳。又，作為上述鹵化伸烷基中的鹵素原子，可以舉出氟原子、氯原子、溴原子、碘原子等，氟原子為較佳。上述鹵化伸烷基可以具有氫原子，所有的氫原子亦可以被鹵素原子取代，但所有的氫原子被鹵素原子取代為較佳。作為較佳的鹵化伸烷基的例子，可以舉出（二三氟甲基）亞甲基等。 作為上述伸芳基，伸苯基或伸萘基為較佳，伸苯基為更佳，1,3-伸苯基或1,4-伸苯基為進一步較佳。 In the formula (PAI-1), R 116 represents a divalent organic group, and R 111 represents a divalent organic group. In the formula (PAI-1), R 116 is exemplified as a linear or branched aliphatic group, a cyclic aliphatic group, an aromatic group, a heteroaromatic group, or a single bond or a linking group. A group formed by linking two or more of these, a straight-chain aliphatic group with 2 to 20 carbons, a branched aliphatic group with 3 to 20 carbons, and a cyclic aliphatic group with 3 to 20 carbons , an aromatic group with 6 to 20 carbons or a combination of two or more of these through a single bond or a linking group is preferred, and an aromatic group with 6 to 20 carbons or a single bond or a linking group As the linking group, a combination of two or more aromatic groups having 6 to 20 carbon atoms is more preferable. As the above-mentioned linking group, -O-, -S-, -C(=O)-, -S(=O) 2 -, alkylene group, halogenated alkylene group, arylylene group, or a combination of these two types The above linking group is preferred, and -O-, -S-, alkylene, halogenated alkylene, arylylene, or a linking group in which two or more of these are bonded is more preferred. As the above-mentioned alkylene group, an alkylene group having 1 to 20 carbon atoms is preferable, an alkylene group having 1 to 10 carbon atoms is more preferable, and an alkylene group having 1 to 4 carbon atoms is still more preferable. As the alkylene halide, a alkylene halide having 1 to 20 carbons is preferable, an alkylene halide having 1 to 10 carbons is more preferable, and an alkylene halide having 1 to 4 carbons is more preferable. Moreover, examples of the halogen atom in the above-mentioned halogenated alkylene group include fluorine atom, chlorine atom, bromine atom, iodine atom and the like, among which fluorine atom is preferred. The above halogenated alkylene group may have hydrogen atoms, and all hydrogen atoms may be replaced by halogen atoms, but all hydrogen atoms are preferably replaced by halogen atoms. Examples of preferable alkylene halides include (bistrifluoromethyl)methylene and the like. As said aryl group, phenylene or naphthylene is preferable, phenylene is more preferable, and 1,3-phenylene or 1,4-phenylene is still more preferable.

又，R 116衍生自二羧酸化合物或二羧酸二鹵化物為較佳。 在本發明中，將具有2個羧基之化合物稱為二羧酸化合物，將具有2個被鹵化之羧基之化合物稱為二羧酸二鹵化物。 二羧酸二鹵化物中的羧基只要被鹵化即可，例如，被氯化為較佳。亦即，二羧酸二鹵化物係二羧酸二氯化合物為較佳。 作為聚醯胺醯亞胺前驅物的製造中所使用之可以被鹵化之二羧酸化合物或二羧酸二鹵化物，可以舉出直鏈狀或支鏈狀的脂肪族、環狀的脂肪族或芳香族二羧酸化合物或二羧酸二鹵化物等。 該等二羧酸化合物或二羧酸二鹵化物可以僅使用1種，亦可以使用2種以上。 Also, R 116 is preferably derived from a dicarboxylic acid compound or a dicarboxylic acid dihalide. In the present invention, a compound having two carboxyl groups is called a dicarboxylic acid compound, and a compound having two halogenated carboxyl groups is called a dicarboxylic acid dihalide. The carboxyl group in the dicarboxylic acid dihalide may be halogenated, for example, it is preferably chlorinated. That is, dicarboxylic acid dihalide-based dicarboxylic acid dichloro compounds are preferable. Examples of dicarboxylic acid compounds or dicarboxylic acid dihalides that may be halogenated used in the production of polyamideimide precursors include linear or branched aliphatic and cyclic aliphatic Or aromatic dicarboxylic acid compound or dicarboxylic acid dihalide, etc. These dicarboxylic acid compounds or dicarboxylic acid dihalides may be used only by 1 type, and may use 2 or more types.

具體而言，作為二羧酸化合物或二羧酸二鹵化物，碳數2～20的直鏈的脂肪族基、碳數3～20的支鏈的脂肪族基、碳數3～20的環狀的脂肪族基、碳數6～20的芳香族基或包含藉由單鍵或連接基而將該等組合2種以上而成之基團之二羧酸化合物或二羧酸二鹵化物為較佳，碳數6～20的芳香族基或包含藉由單鍵或連接基而將碳數6～20的芳香族基組合2種以上而成之基團之二羧酸化合物或二羧酸二鹵化物為更佳。Specifically, as a dicarboxylic acid compound or a dicarboxylic acid dihalide, a straight-chain aliphatic group having 2 to 20 carbons, a branched aliphatic group having 3 to 20 carbons, a ring having 3 to 20 carbons, A dicarboxylic acid compound or a dicarboxylic acid dihalide containing an aliphatic group, an aromatic group having 6 to 20 carbon atoms, or a combination of two or more of them through a single bond or a linking group is Preferably, an aromatic group having 6 to 20 carbon atoms or a dicarboxylic acid compound or dicarboxylic acid containing a combination of two or more aromatic groups having 6 to 20 carbon atoms via a single bond or a linking group Dihalides are more preferred.

又，作為二羧酸化合物的具體例，可以舉出丙二酸、二甲基丙二酸、乙基丙二酸、異丙基丙二酸、二正丁基丙二酸、丁二酸、四氟丁二酸、甲基丁二酸、2,2-二甲基丁二酸、2,3-二甲基丁二酸、二甲基甲基丁二酸、戊二酸、六氟戊二酸、2-甲基戊二酸、3-甲基戊二酸、2,2-二甲基戊二酸、3,3-二甲基戊二酸、3-乙基-3-甲基戊二酸、己二酸、八氟己二酸、3-甲基己二酸、庚二酸、2,2,6,6-四甲基庚二酸、辛二酸、十二氟辛二酸、壬二酸、癸二酸、十六氟癸二酸、1,9-壬二酸、十二烷二酸、十三烷二酸、十四烷二酸、十五烷二酸、十六烷二酸、十七烷二酸、十八烷二酸、十九烷二酸、二十烷二酸、二十一烷二酸、二十二烷二酸、二十三烷二酸、二十四烷二酸、二十五烷二酸、二十六烷二酸、二十七烷二酸、二十八烷二酸、二十九烷二酸、三十烷二酸、三十一烷二酸、三十二烷二酸、二乙醇酸、鄰苯二甲酸、間苯二甲酸、對苯二甲酸、4,4’-聯苯羧酸、4,4’-聯苯羧酸、4,4’-二羧基二苯醚、二苯甲酮-4,4’-二羧酸等。 作為二羧酸二鹵化物的具體例，可以舉出在上述二羧酸化合物的具體例中的將2個羧基鹵化而成之結構的化合物。 Further, specific examples of dicarboxylic acid compounds include malonic acid, dimethylmalonic acid, ethylmalonic acid, isopropylmalonic acid, di-n-butylmalonic acid, succinic acid, Tetrafluorosuccinic acid, methylsuccinic acid, 2,2-dimethylsuccinic acid, 2,3-dimethylsuccinic acid, dimethylmethylsuccinic acid, glutaric acid, hexafluoropentanedioic acid Diacid, 2-methylglutaric acid, 3-methylglutaric acid, 2,2-dimethylglutaric acid, 3,3-dimethylglutaric acid, 3-ethyl-3-methylglutaric acid Glutaric acid, adipic acid, octafluoroadipic acid, 3-methyladipic acid, pimelic acid, 2,2,6,6-tetramethylpimelic acid, suberic acid, dodecafluorooctanedi Azelaic acid, azelaic acid, sebacic acid, hexadecafluorosebacic acid, 1,9-azelaic acid, dodecanedioic acid, tridecanedioic acid, tetradecanedioic acid, pentadecanedioic acid, Hexadecanedioic acid, heptadecanedioic acid, octadecanedioic acid, nonadecanedioic acid, eicosanedioic acid, hexadecanedioic acid, docosanedioic acid, tricosanedioic acid, Tetracosanedioic acid, pentadecanedioic acid, hexacanedioic acid, heptacanedioic acid, octadecanedioic acid, nonacanedioic acid, triacanedioic acid, thirty Alkanedioic acid, docosanedioic acid, diglycolic acid, phthalic acid, isophthalic acid, terephthalic acid, 4,4'-biphenylcarboxylic acid, 4,4'-biphenylcarboxylic acid , 4,4'-dicarboxydiphenyl ether, benzophenone-4,4'-dicarboxylic acid, etc. Specific examples of dicarboxylic acid dihalides include compounds having structures in which two carboxyl groups are halogenated in the specific examples of the dicarboxylic acid compound described above.

式（PAI-1）中，R 111與上述式（2）中的R 111同義，較佳態樣亦相同。 In the formula (PAI-1), R 111 has the same meaning as R 111 in the above formula (2), and preferred embodiments are also the same.

又，聚醯胺醯亞胺前驅物在結構中具有氟原子亦較佳。聚醯胺醯亞胺前驅物中的氟原子含量係10質量%以上為較佳，又，20質量%以下為較佳。Also, it is preferable that the polyamideimide precursor has a fluorine atom in its structure. The content of fluorine atoms in the polyamideimide precursor is preferably 10% by mass or more, and more preferably 20% by mass or less.

又，以提高與基板的密接性為目的，聚醯胺醯亞胺前驅物可以與具有矽氧烷結構之脂肪族基共聚。具體而言，作為二胺成分，可以舉出使用雙（3-胺基丙基）四甲基二矽氧烷、雙（對胺基苯基）八甲基五矽氧烷等態樣。Also, for the purpose of improving the adhesion to the substrate, the polyamideimide precursor may be copolymerized with an aliphatic group having a siloxane structure. Specifically, examples of the diamine component include the use of bis(3-aminopropyl)tetramethyldisiloxane, bis(p-aminophenyl)octamethylpentasiloxane, and the like.

作為本發明中的聚醯胺醯亞胺前驅物的一實施形態，可以舉出式（PAI-2）所表示之重複單元、式（PAI-1）所表示之重複單元及式（2）所表示之重複單元的合計含量係所有重複單元的50莫耳%以上的態樣。上述合計含量係70莫耳%以上為更佳，90莫耳%以上為進一步較佳，大於90莫耳%為特佳。上述合計含量的上限並沒有特別限定，除了末端之聚醯胺醯亞胺前驅物中的所有的重複單元可以係式（PAI-2）所表示之重複單元、式（PAI-1）所表示之重複單元及式（2）所表示之重複單元中的任一種。 又，作為本發明中的聚醯胺醯亞胺前驅物的另一實施形態，可以舉出式（PAI-2）所表示之重複單元及式（PAI-1）所表示之重複單元的合計含量係所有重複單元的50莫耳%以上之態樣。上述合計含量係70莫耳%以上為更佳，90莫耳%以上為進一步較佳，大於90莫耳%為特佳。上述合計含量的上限並沒有特別限定，除了末端之聚醯胺醯亞胺前驅物中的所有的重複單元可以係式（PAI-2）所表示之重複單元或式（PAI-1）所表示之重複單元中的任一種。 As an embodiment of the polyamide imide precursor in the present invention, the repeating unit represented by the formula (PAI-2), the repeating unit represented by the formula (PAI-1) and the compound represented by the formula (2) can be mentioned. The total content of the repeating units indicated is an aspect of 50 mol% or more of all the repeating units. The above-mentioned total content is more than 70 mol %, more preferably 90 mol %, and more than 90 mol % is particularly preferred. The upper limit of the above-mentioned total content is not particularly limited, except that all repeating units in the polyamide imide precursor at the end can be represented by the repeating unit of formula (PAI-2), the repeating unit represented by formula (PAI-1) Any one of repeating units and repeating units represented by formula (2). In addition, as another embodiment of the polyamideimide precursor in the present invention, the total content of the repeating unit represented by the formula (PAI-2) and the repeating unit represented by the formula (PAI-1) can be mentioned. It is the form of more than 50 mol% of all repeating units. The above-mentioned total content is more than 70 mol %, more preferably 90 mol %, and more than 90 mol % is particularly preferred. The upper limit of the above-mentioned total content is not particularly limited, except that all repeating units in the terminal polyamide imide precursor can be represented by the repeating unit represented by formula (PAI-2) or represented by formula (PAI-1) any of the repeating units.

聚醯胺醯亞胺前驅物的重量平均分子量（Mw）較佳為2,000～500,000，更佳為5,000～100,000，進一步較佳為10,000～50,000。又，數量平均分子量（Mn）較佳為800～250,000，更佳為2,000～50,000，進一步較佳為4,000～25,000。 聚醯胺醯亞胺前驅物的分子量的分散度係1.5以上為較佳，1.8以上為更佳，2.0以上為進一步較佳。聚醯胺醯亞胺前驅物的分子量的分散度的上限值並沒有特別規定，例如係7.0以下為較佳，6.5以下為更佳，6.0以下為進一步較佳。又，樹脂組成物作為特定樹脂而包含複數種聚醯胺醯亞胺前驅物之情況下，至少一種聚醯胺醯亞胺前驅物的重量平均分子量、數量平均分子量及分散度在上述範圍內為較佳。又，將上述複數種聚醯胺醯亞胺前驅物作為1種樹脂而算出之重量平均分子量、數量平均分子量及分散度分別在上述範圍內亦較佳。 The weight average molecular weight (Mw) of the polyamideimide precursor is preferably 2,000-500,000, more preferably 5,000-100,000, further preferably 10,000-50,000. Moreover, the number average molecular weight (Mn) becomes like this. Preferably it is 800-250,000, More preferably, it is 2,000-50,000, More preferably, it is 4,000-25,000. The molecular weight dispersion of the polyamideimide precursor is preferably at least 1.5, more preferably at least 1.8, and still more preferably at least 2.0. The upper limit of the molecular weight dispersion of the polyamideimide precursor is not particularly specified, for example, it is preferably 7.0 or less, more preferably 6.5 or less, and even more preferably 6.0 or less. Also, when the resin composition contains a plurality of polyamide imide precursors as a specific resin, the weight average molecular weight, number average molecular weight, and degree of dispersion of at least one polyamide imide precursor are within the above-mentioned range. better. Moreover, it is also preferable that the weight average molecular weight, the number average molecular weight, and the degree of dispersion calculated by using the above-mentioned plural kinds of polyamideimide precursors as one resin are within the above-mentioned ranges, respectively.

〔聚醯胺醯亞胺〕 本發明中所使用之聚醯胺醯亞胺可以為鹼可溶性聚醯胺醯亞胺，亦可以為可溶於以有機溶劑為主成分之顯影液之聚醯胺醯亞胺。 在本說明書中，鹼可溶性聚醯胺醯亞胺係指相對於100g的2.38質量%四甲基銨水溶液在23℃下溶解0.1g以上之聚醯胺醯亞胺，從圖案形成性的觀點考慮，溶解0.5g以上之聚醯胺醯亞胺為較佳，溶解1.0g以上之聚醯胺醯亞胺為進一步較佳。上述溶解量的上限並沒有特別限定，100g以下為較佳。 又，從所獲得之有機膜的膜強度及絕緣性的觀點考慮， 聚醯胺醯亞胺在主鏈具有複數個醯胺鍵及複數個醯亞胺結構之聚醯胺醯亞胺為較佳。 〔Polyamideimide〕 The polyamide-imide used in the present invention may be alkali-soluble polyamide-imide, or may be a polyamide-imide soluble in a developing solution mainly composed of an organic solvent. In this specification, the term "alkali-soluble polyamide imide" refers to a polyamide imide that dissolves 0.1 g or more in 100 g of a 2.38% by mass tetramethylammonium aqueous solution at 23°C, and is considered from the viewpoint of pattern formation. It is preferred to dissolve more than 0.5 g of polyamide imide, and it is still more preferable to dissolve more than 1.0 g of polyamide imide. The upper limit of the above-mentioned dissolved amount is not particularly limited, but is preferably 100 g or less. Also, from the viewpoint of film strength and insulating properties of the obtained organic film, polyamide imide having a plurality of amide bonds and a plurality of amide structures in the main chain is preferred. .

-氟原子- 從所獲得之有機膜的膜強度的觀點考慮，聚醯胺醯亞胺具有氟原子為較佳。 氟原子例如，包含於後述之式（PAI-3）所表示之重複單元中的R 117或R 111中為較佳，作為氟基烷基而包含於後述之式（PAI-3）所表示之重複單元中的R 117或R 111中為更佳。 氟原子的量相對於聚醯胺醯亞胺的總質量，係5質量%以上為較佳，又，20質量%以下為較佳。 -Fluorine atoms- From the viewpoint of the film strength of the obtained organic film, it is preferable that the polyamideimide has a fluorine atom. The fluorine atom, for example, is preferably contained in R 117 or R 111 in the repeating unit represented by the formula (PAI-3) described below, and is contained in the repeating unit represented by the formula (PAI-3) described below as a fluoroalkyl group. R 117 or R 111 in the repeating unit is more preferred. The amount of fluorine atoms is preferably at least 5% by mass, and more preferably at most 20% by mass, based on the total mass of polyamideimide.

-乙烯性不飽和鍵- 從所獲得之有機膜的膜強度的觀點考慮，聚醯胺醯亞胺可以具有乙烯性不飽和鍵。 聚醯胺醯亞胺可以在主鏈末端具有乙烯性不飽和鍵，亦可以在側鏈中具有乙烯性不飽和鍵，但在側鏈中具有乙烯性不飽和鍵為較佳。 上述乙烯性不飽和鍵具有自由基聚合性為較佳。 乙烯性不飽和鍵包含於後述之式（PAI-3）所表示之重複單元中的R 117或R 111中為較佳，作為具有乙烯性不飽和鍵之基團而包含於後述之式（PAI-3）所表示之重複單元中的R 117或R 111為更佳。 具有乙烯性不飽和鍵之基團的較佳態樣與上述聚醯亞胺中的具有乙烯性不飽和鍵之基團的較佳態樣相同。 -Ethylenically unsaturated bond- From the viewpoint of the film strength of the obtained organic film, polyamideimide may have an ethylenically unsaturated bond. Polyamideimide may have an ethylenically unsaturated bond at the main chain terminal or may have an ethylenically unsaturated bond in the side chain, but preferably has an ethylenically unsaturated bond in the side chain. It is preferable that the said ethylenically unsaturated bond has radical polymerizability. It is preferable that the ethylenically unsaturated bond is contained in R 117 or R 111 in the repeating unit represented by the formula (PAI-3) described below, and it is contained in the formula (PAI-3) described below as a group having an ethylenically unsaturated bond. R 117 or R 111 in the repeating unit represented by -3) is more preferred. The preferable aspect of the group which has an ethylenically unsaturated bond is the same as the preferable aspect of the group which has an ethylenically unsaturated bond in the said polyimide.

乙烯性不飽和鍵的量相對於聚醯胺醯亞胺的總質量，係0.0001～0.1mol/g為較佳，0.001～0.05mol/g為更佳。The amount of ethylenically unsaturated bonds is preferably 0.0001 to 0.1 mol/g, more preferably 0.001 to 0.05 mol/g, based on the total mass of polyamideimide.

-除了乙烯性不飽和鍵以外的聚合性基- 聚醯胺醯亞胺可以具有除了乙烯性不飽和鍵以外的聚合性基。 作為聚醯胺醯亞胺中的除了乙烯性不飽和鍵以外的聚合性基，可以舉出與上述聚醯亞胺中的除了乙烯性不飽和鍵以外的聚合性基相同的基團。 除了乙烯性不飽和鍵以外的聚合性基例如包含於後述之式（PAI-3）所表示之重複單元中的R 111為較佳。 乙烯性不飽和鍵以外的聚合性基相對於聚醯胺醯亞胺的總質量之量，係0.05～10mol/g為較佳，0.1～5mol/g為更佳。 -Polymerizable group other than ethylenically unsaturated bond- The polyamideimide may have a polymerizable group other than ethylenically unsaturated bond. Examples of the polymerizable group other than the ethylenically unsaturated bond in the polyimide include the same groups as the polymerizable groups other than the ethylenically unsaturated bond in the above-mentioned polyimide. A polymerizable group other than an ethylenically unsaturated bond, for example, R 111 contained in a repeating unit represented by formula (PAI-3) described later is preferable. The amount of polymerizable groups other than ethylenically unsaturated bonds is preferably 0.05 to 10 mol/g, more preferably 0.1 to 5 mol/g, based on the total mass of the polyamideimide.

-極性轉換基- 聚醯胺醯亞胺可以具有酸分解性基等極性轉換基。聚醯胺醯亞胺中之酸分解性基與在上述式（2）中的R 113及R 114中所說明之酸分解性基相同，較佳態樣亦相同。 -Polarity conversion group- The polyamideimide may have a polarity conversion group, such as an acid-decomposable group. The acid-decomposable group in the polyamideimide is the same as the acid-decomposable group described for R 113 and R 114 in the above formula (2), and the preferred aspects are also the same.

-酸值- 將聚醯胺醯亞胺供於鹼顯影之情況下，從提高顯影性之觀點考慮，聚醯胺醯亞胺的酸值係30mgKOH/g以上為較佳，50mgKOH/g以上為更佳，70mgKOH/g以上為進一步較佳。 又，上述酸值係500mgKOH/g以下為較佳，400mgKOH/g以下為更佳，200mgKOH/g以下為進一步較佳。 又，將聚醯胺醯亞胺供於使用了以有機溶劑係主成分之顯影液之顯影（例如，後述之“溶劑顯影”）之情況下，聚醯胺醯亞胺的酸值係2～35mgKOH/g為較佳，3～30mgKOH/g為更佳，5～20mgKOH/g為進一步較佳。 上述酸值藉由公知的方法測量，例如，藉由記載於JIS K 0070：1992中的方法測量。 又，作為聚醯胺醯亞胺中所包含之酸基，可以舉出與上述聚醯亞胺中的酸基相同的基團，較佳態樣亦相同。 -acid value- In the case of using polyamideimide for alkali development, from the viewpoint of improving developability, the acid value of polyamideimide is preferably 30mgKOH/g or more, more preferably 50mgKOH/g or more, and 70mgKOH /g or more is further preferred. In addition, the above-mentioned acid value is preferably not more than 500 mgKOH/g, more preferably not more than 400 mgKOH/g, and still more preferably not more than 200 mgKOH/g. In addition, when polyamide imide is used for development using a developer mainly composed of an organic solvent (for example, "solvent development" described later), the acid value of polyamide imide is 2 to 10%. 35 mgKOH/g is preferable, 3-30 mgKOH/g is more preferable, 5-20 mgKOH/g is still more preferable. The above acid value is measured by a known method, for example, by the method described in JIS K 0070:1992. Moreover, as an acidic group contained in a polyimide, the thing similar to the acidic group in the said polyimide is mentioned, and a preferable aspect is also the same.

-酚性羥基- 從使基於鹼顯影液之顯影速度成為適當者之觀點考慮，聚醯胺醯亞胺具有酚性羥基為較佳。 聚醯胺醯亞胺可以在主鏈末端中具有酚性羥基，亦可以在側鏈中具有酚性羥基。 酚性羥基例如包含於後述之式（PAI-3）所表示之重複單元中的R 117或R 111為較佳。 酚性羥基相對於聚醯胺醯亞胺的總質量之量，係0.1～30mol/g為較佳，1～20mol/g為更佳。 -Phenolic hydroxyl group- It is preferable that polyamide imide has a phenolic hydroxyl group from a viewpoint of making the developing speed by alkali developing solution suitable. Polyamideimide may have a phenolic hydroxyl group at a main chain terminal, or may have a phenolic hydroxyl group at a side chain. The phenolic hydroxyl group, for example, is preferably R 117 or R 111 included in the repeating unit represented by the formula (PAI-3) described later. The amount of the phenolic hydroxyl group is preferably 0.1-30 mol/g, more preferably 1-20 mol/g, relative to the total mass of the polyamideimide.

作為本發明中使用之聚醯胺醯亞胺，只要係具有醯亞胺結構及醯胺鍵之高分子化合物，則並沒有特別限定，包含下述式（PAI-3）所表示之重複單元為較佳。 [化學式27]

Figure 02_image053
式（PAI-3）中，R 111及R 117分別與式（PAI-2）中的R 111及R 117同義，較佳態樣亦相同。 具有聚合性基之情況下，聚合性基可以位於R 111及R 117中的至少一者中，亦可以位於聚醯胺醯亞胺的末端。 The polyamidoimide used in the present invention is not particularly limited as long as it is a polymer compound having an imide structure and an amide bond, including the repeating unit represented by the following formula (PAI-3): better. [chemical formula 27]
Figure 02_image053
In formula (PAI-3), R 111 and R 117 are respectively synonymous with R 111 and R 117 in formula (PAI-2), and preferred embodiments are also the same. In the case of having a polymerizable group, the polymerizable group may be located in at least one of R 111 and R 117 , or may be located at a terminal of polyamideimide.

又，為了提高樹脂組成物的保存穩定性，用單胺、酸酐、單羧酸、單醯氯化合物、單活性酯化合物等封端劑密封聚醯胺醯亞胺的主鏈末端為較佳。封端劑的較佳態樣與上述聚醯亞胺中的封端劑的較佳態樣相同。Also, in order to improve the storage stability of the resin composition, it is better to seal the end of the main chain of polyamideimide with an end-capping agent such as monoamine, acid anhydride, monocarboxylic acid, monoacyl chloride compound, and monoactive ester compound. A preferred aspect of the end-blocking agent is the same as that of the above-mentioned end-blocking agent in polyimide.

-醯亞胺化率（閉環率）- 從所獲得之有機膜的膜強度、絕緣性等觀點考慮，聚醯胺醯亞胺的醯亞胺化率（亦稱為“閉環率”）係70%以上為較佳，80%以上為更佳，90%以上為更佳。 上述醯亞胺化率的上限並沒有特別限定，只要係100%以下即可。 上述醯亞胺化率藉由與上述聚醯亞胺的閉環率相同的方法來測量。 -Imidation rate (ring closure rate)- From the viewpoints of film strength and insulation of the obtained organic film, the imidization rate (also called "ring closure rate") of polyamide imide is preferably 70% or more, and 80% or more is more preferable. Good, more than 90% is better. The upper limit of the above-mentioned imidization rate is not particularly limited, as long as it is 100% or less. The above-mentioned imidization rate is measured by the same method as the ring-closure rate of the above-mentioned polyimide.

聚醯胺醯亞胺可以全部都含有包含1種R 111或R 117之上述式（PAI-3）所表示之重複單元，亦可以含有包含2個以上的不同種類的R 131或R 132之上述式（PAI-3）所表示之重複單元。又，聚醯胺醯亞胺除了上述式（PAI-3）所表示之重複單元以外，亦可以包含其他種類的重複單元。作為其他種類的重複單元，可以舉出上述式（PAI-1）或式（PAI-2）所表示之重複單元等。 Polyamide imides may all contain repeating units represented by the above formula (PAI-3) containing one R 111 or R 117 , or may contain two or more different types of R 131 or R 132 . The repeating unit represented by the formula (PAI-3). In addition, the polyamideimide may contain other types of repeating units other than the repeating unit represented by the above formula (PAI-3). Examples of other types of repeating units include repeating units represented by the above-mentioned formula (PAI-1) or formula (PAI-2), and the like.

聚醯胺醯亞胺例如能夠利用如下方法來合成，該方法係藉由公知的方法獲得聚醯胺醯亞胺前驅物，使用已知的醯亞胺化反應法使其完全醯亞胺化之方法、或者在中途停止醯亞胺化反應並導入局部醯亞胺結構之方法、進而將經完全醯亞胺化之聚合物和其聚醯胺醯亞胺前驅物進行混合而導入局部醯亞胺結構之方法。Polyamidoimide can be synthesized, for example, by a method in which a polyamidoimide precursor is obtained by a known method and completely imidized using a known imidization reaction method. method, or the method of stopping the imidization reaction in the middle and introducing a local imide structure, and then mixing the fully imidized polymer and its polyamidoimide precursor to introduce a local imide method of structure.

聚醯胺醯亞胺的重量平均分子量（Mw）係5,000～70,000為較佳，8,000～50,000為更佳，10,000～30,000為進一步較佳。藉由將重量平均分子量設為5,000以上，能夠提高硬化後的膜的耐折性。為了獲得機械特性優異之有機膜，重量平均分子量係20,000以上為特佳。 又，聚醯胺醯亞胺的數量平均分子量（Mn）較佳為800～250,000，更佳為2,000～50,000，進一步較佳為4,000～25,000. 聚醯胺醯亞胺的分子量的分散度係1.5以上為較佳，1.8以上為更佳，2.0以上為進一步較佳。聚醯胺醯亞胺的分子量的分散度的上限值並沒有特別規定，例如係7.0以下為較佳，6.5以下為更佳，6.0以下為進一步較佳。 又，樹脂組成物作為特定樹脂而包含複數種聚醯胺醯亞胺之情況下，至少一種聚醯胺醯亞胺的重量平均分子量、數量平均分子量及分散度在上述範圍內為較佳。又，將上述複數種聚醯胺醯亞胺作為1種樹脂而算出之重量平均分子量、數量平均分子量及分散度分別在上述範圍內亦較佳。 The weight average molecular weight (Mw) of polyamideimide is preferably 5,000-70,000, more preferably 8,000-50,000, and still more preferably 10,000-30,000. By making the weight average molecular weight 5,000 or more, the folding resistance of the cured film can be improved. In order to obtain an organic film having excellent mechanical properties, it is particularly preferable that the weight average molecular weight is 20,000 or more. Also, the number average molecular weight (Mn) of the polyamideimide is preferably 800 to 250,000, more preferably 2,000 to 50,000, further preferably 4,000 to 25,000. The molecular weight dispersion of polyamideimide is preferably 1.5 or higher, more preferably 1.8 or higher, and still more preferably 2.0 or higher. The upper limit of the molecular weight dispersion of polyimide is not specifically defined, for example, it is preferably 7.0 or less, more preferably 6.5 or less, and still more preferably 6.0 or less. Also, when the resin composition contains a plurality of polyamideimides as the specific resin, it is preferable that the weight average molecular weight, number average molecular weight, and degree of dispersion of at least one polyamideimide are within the above-mentioned ranges. Moreover, it is also preferable that the weight average molecular weight, the number average molecular weight, and the degree of dispersion calculated by using the above-mentioned plural kinds of polyamideimides as one resin are within the above-mentioned ranges, respectively.

〔聚醯亞胺前驅物等之製造方法〕 聚醯亞胺前驅物等例如能夠利用如下方法來獲得，該方法係在低溫中使四羧酸二酐與二胺反應之方法、在低溫中使四羧酸二酐與二胺反應而獲得聚醯胺酸，並且使用縮合劑或烷基化劑進行酯化之方法、藉由四羧酸二酐和醇而獲得二酯，然後在二胺和縮合劑的存在下進行反應之方法、藉由四羧酸二酐和醇而獲得二酯，然後使用鹵化劑將剩餘的二羧酸進行酸鹵化並使其與二胺反應之方法等。在上述製造方法中，藉由四羧酸二酐和醇而獲得二酯，然後使用鹵化劑將剩餘的二羧酸進行酸鹵化並使其與二胺反應之方法為更佳。 作為上述縮合劑，例如，可以舉出二環己基碳二亞胺、二異丙基碳二亞胺、1-乙氧基羰基-2-乙氧基-1,2-二氫喹啉、1,1-羰基二氧基-二-1,2,3-苯並三唑、N,N’-二琥珀醯亞胺碳酸酯、三氟乙酸酐等。 作為上述烷基化劑，可以舉出N,N-二甲基甲醯胺二甲基縮醛、N,N-二甲基甲醯胺二乙基縮醛、N,N-二烷基甲醯胺二烷基縮醛、原甲酸三甲酯、原甲酸三乙酯等。 作為上述鹵化劑，可以舉出亞硫醯氯、草醯氯、氯化磷醯等。 在聚醯亞胺前驅物等之製造方法中，在進行反應時，使用有機溶劑為較佳。有機溶劑可以為1種，亦可以為2種以上。 作為有機溶劑，能夠依據原料而適當規定，例示出吡啶、二乙二醇二甲醚（二甘二甲醚）、N-甲基吡咯啶酮、N-乙基吡咯啶酮、丙酸乙酯、二甲基乙醯胺、二甲基甲醯胺、四氫呋喃、γ-丁內酯等。 在聚醯亞胺前驅物等的製造方法中，在反應時添加鹼性化合物為較佳。鹼性化合物可以係1種，亦可以係2種以上。 鹼性化合物能夠依據原料而適當規定，例示出三乙胺、二異丙基乙胺、吡啶、1,8-二氮雜雙環[5.4.0]十一烷基-7-烯、N,N-二甲基-4-胺基吡啶等。 〔Manufacturing method of polyimide precursor etc.〕 The polyimide precursor and the like can be obtained, for example, by a method of reacting tetracarboxylic dianhydride and diamine at low temperature, and obtaining polyimide by reacting tetracarboxylic dianhydride and diamine at low temperature. Amic acid, and a method of esterifying using a condensing agent or an alkylating agent, a method of obtaining a diester by tetracarboxylic dianhydride and an alcohol, and then reacting in the presence of a diamine and a condensing agent, by Tetracarboxylic dianhydride and alcohol to obtain a diester, and then use a halogenating agent to acid-halogenate the remaining dicarboxylic acid and react it with a diamine, etc. Among the above production methods, a method of obtaining a diester from a tetracarboxylic dianhydride and an alcohol, and then acid-halogenating the remaining dicarboxylic acid using a halogenating agent to react with a diamine is more preferable. As the above-mentioned condensing agent, for example, dicyclohexylcarbodiimide, diisopropylcarbodiimide, 1-ethoxycarbonyl-2-ethoxy-1,2-dihydroquinoline, 1 , 1-carbonyldioxy-di-1,2,3-benzotriazole, N,N'-disuccinimide carbonate, trifluoroacetic anhydride, etc. Examples of the alkylating agent include N,N-dimethylformamide dimethyl acetal, N,N-dimethylformamide diethyl acetal, N,N-dialkylformamide Amide dialkyl acetal, trimethyl orthoformate, triethyl orthoformate, etc. Examples of the halogenating agent include thionyl chloride, oxalyl chloride, and phosphoryl chloride. In the production method of polyimide precursor etc., it is preferable to use an organic solvent when carrying out a reaction. The organic solvent may be one type, or two or more types. As the organic solvent, it can be appropriately specified depending on the raw material, and examples include pyridine, diglyme (diglyme), N-methylpyrrolidone, N-ethylpyrrolidone, and ethyl propionate. , Dimethylacetamide, dimethylformamide, tetrahydrofuran, γ-butyrolactone, etc. In the production method of polyimide precursor etc., it is preferable to add a basic compound at the time of reaction. The basic compound may be one type, or two or more types. The basic compound can be specified appropriately depending on the raw material, and examples include triethylamine, diisopropylethylamine, pyridine, 1,8-diazabicyclo[5.4.0]undecyl-7-ene, N,N -Dimethyl-4-aminopyridine and the like.

-封端劑- 在製造聚醯亞胺前驅物等時，為了進一步提高保存穩定性，將聚醯亞胺前驅物等樹脂末端殘留之羧酸酐、酸酐衍生物或胺基進行密封為較佳。在將殘留於樹脂末端之羧酸酐及酸酐衍生物進行密封時，作為封端劑，可以舉出單醇、苯酚、硫醇、苯硫酚、單胺等，從反應性、膜的穩定性之觀點考慮，使用單醇、酚類或單胺為更佳。作為單醇的較佳化合物，可以舉出甲醇、乙醇、丙醇、丁醇、己醇、辛醇、十二烷醇、苯甲醇、2-苯乙醇、2-甲氧基乙醇、2-氯甲醇、糠醇等一級醇、異丙醇、2-丁醇、環己醇、環戊醇、1-甲氧基-2-丙醇等二級醇、三級丁醇、金剛烷醇等三級醇。作為酚類的較佳化合物，可以舉出苯酚、甲氧基苯酚、甲基苯酚、萘-1-醇、萘-2-醇、羥基苯乙烯等酚類等。又，作為單胺的較佳化合物，可以舉出苯胺、2-乙炔基苯胺、3-乙炔基苯胺、4-乙炔基苯胺、5-胺基-8-羥基喹啉、1-羥基-7-胺基萘、1-羥基-6-胺基萘、1-羥基-5-胺基萘、1-羥基-4-胺基萘、2-羥基-7-胺基萘、2-羥基-6-胺基萘、2-羥基-5-胺基萘、1-羧基-7-胺基萘、1-羧基-6-胺基萘、1-羧基-5-胺基萘、2-羧基-7-胺基萘、2-羧基-6-胺基萘、2-羧基-5-胺基萘、2-胺基苯甲酸、3-胺基苯甲酸、4-胺基苯甲酸、4-胺基水楊酸、5-胺基水楊酸、6-胺基水楊酸、2-胺基苯磺酸、3-胺基苯磺酸、4-胺基苯磺酸、3-胺基-4,6-二羥基嘧啶、2-胺基苯酚、3-胺基苯酚、4-胺基苯酚、2-胺基苯硫酚、3-胺基苯硫酚、4-胺基苯硫酚等。該等可以使用2種以上，藉由使複數種封端劑進行反應，可以導入複數個不同之末端基。 又，在封端密封樹脂末端的胺基時，能夠使用具有能夠與胺基反應之官能基之化合物進行密封。對胺基的較佳的封端劑係羧酸酐、羧酸氯化物、羧酸溴化物、磺酸氯化物、磺酸酐、磺酸羧酸酐等為較佳，羧酸酐、羧酸氯化物為更佳。作為羧酸酐的較佳的化合物，可以舉出乙酸酐、丙酸酐、草酸酐、琥珀酸酐、鄰苯二甲酸酐、鄰苯二甲酸酐、苯甲酸酐、5-降莰烯-2,3-二羧酸酐等。又，作為羧酸氯化物的較佳的化合物，可以舉出乙醯氯、丙烯醯氯、丙醯氯、甲基丙烯醯氯、新戊醯氯、環己烷甲醯氯、2-乙基己醯氯、肉桂醯氯、1-金剛烷甲醯氯、七氟丁醯氯、硬脂醯氯、苯甲醯氯等。 -Encapping agent- When producing polyimide precursors, etc., in order to further improve storage stability, it is better to seal the carboxylic anhydride, acid anhydride derivative, or amine group remaining at the end of resins such as polyimide precursors. When sealing the carboxylic acid anhydride and acid anhydride derivatives remaining at the end of the resin, monoalcohols, phenols, mercaptans, thiophenols, monoamines, etc. can be used as end-capping agents. From a viewpoint, it is more preferable to use monoalcohols, phenols, or monoamines. Preferred compounds of the monoalcohol include methanol, ethanol, propanol, butanol, hexanol, octanol, dodecanol, benzyl alcohol, 2-phenylethyl alcohol, 2-methoxyethanol, 2-chloro Methanol, furfuryl alcohol and other primary alcohols, isopropanol, 2-butanol, cyclohexanol, cyclopentanol, 1-methoxy-2-propanol and other secondary alcohols, tertiary butanol, adamantanol and other tertiary alcohols alcohol. Preferable compounds of phenols include phenols such as phenol, methoxyphenol, methylphenol, naphthalene-1-ol, naphthalene-2-ol, and hydroxystyrene. In addition, preferred compounds of monoamines include aniline, 2-ethynylaniline, 3-ethynylaniline, 4-ethynylaniline, 5-amino-8-hydroxyquinoline, 1-hydroxy-7- Aminonaphthalene, 1-hydroxy-6-aminonaphthalene, 1-hydroxy-5-aminonaphthalene, 1-hydroxy-4-aminonaphthalene, 2-hydroxy-7-aminonaphthalene, 2-hydroxy-6- Aminonaphthalene, 2-hydroxy-5-aminonaphthalene, 1-carboxy-7-aminonaphthalene, 1-carboxy-6-aminonaphthalene, 1-carboxy-5-aminonaphthalene, 2-carboxy-7- Aminonaphthalene, 2-carboxy-6-aminonaphthalene, 2-carboxy-5-aminonaphthalene, 2-aminobenzoic acid, 3-aminobenzoic acid, 4-aminobenzoic acid, 4-aminobenzoic acid Cylic acid, 5-aminosalicylic acid, 6-aminosalicylic acid, 2-aminobenzenesulfonic acid, 3-aminobenzenesulfonic acid, 4-aminobenzenesulfonic acid, 3-amino-4, 6-dihydroxypyrimidine, 2-aminophenol, 3-aminophenol, 4-aminophenol, 2-aminothiophenol, 3-aminothiophenol, 4-aminothiophenol, and the like. Two or more of these can be used, and a plurality of different end groups can be introduced by reacting a plurality of end-capping agents. Also, when the amine group at the end of the sealing resin is blocked, a compound having a functional group capable of reacting with the amine group can be used for sealing. The preferred end-capping agent for amino groups is carboxylic acid anhydride, carboxylic acid chloride, carboxylic acid bromide, sulfonic acid chloride, sulfonic anhydride, sulfonic acid carboxylic anhydride, etc., and carboxylic anhydride and carboxylic acid chloride are more preferred. good. Preferred compounds of carboxylic anhydride include acetic anhydride, propionic anhydride, oxalic anhydride, succinic anhydride, phthalic anhydride, phthalic anhydride, benzoic anhydride, 5-norbornene-2,3- Dicarboxylic anhydride, etc. Furthermore, as preferred compounds of carboxylic acid chlorides, acetyl chloride, acryl chloride, propionyl chloride, methacryl chloride, pivalyl chloride, cyclohexaneformyl chloride, 2-ethyl Caproyl chloride, cinnamyl chloride, 1-adamantaneformyl chloride, heptafluorobutyryl chloride, stearyl chloride, benzoyl chloride, etc.

-固體析出- 在製造聚醯亞胺前驅物等時，可以包括使固體析出之步驟。具體而言，能夠依據需要濾出在反應液中共存之脫水縮合劑的吸水副產物之後，在水、脂肪族低級醇或其混合液等的不良溶劑中投入所獲得之聚合物成分，並且析出聚合物成分，使固體析出並乾燥，從而獲得聚醯亞胺前驅物等。為了提高純化度，可以重複進行將聚醯亞胺前驅物等進行再溶解、再沉澱析出、乾燥等操作。另外，可以包括使用離子交換樹脂來去除離子性雜質之步驟。 -Solid precipitation- When producing a polyimide precursor and the like, a step of precipitating a solid may be included. Specifically, after filtering out the water-absorbing by-products of the dehydration condensing agent coexisting in the reaction liquid as required, the obtained polymer component can be thrown into a poor solvent such as water, aliphatic lower alcohol, or a mixture thereof, and precipitated Polymer components are precipitated and dried to obtain polyimide precursors and the like. In order to improve the degree of purification, operations such as redissolving polyimide precursors, reprecipitation, and drying can be repeated. In addition, a step of removing ionic impurities using an ion exchange resin may be included.

〔含量〕 本發明的樹脂組成物中的特定樹脂的含量相對於從樹脂組成物的總固體成分中去除了填充劑之總質量，係20質量%以上為較佳，30質量%以上為更佳，40質量%以上為進一步較佳，50質量%以上為更進一步較佳。又，本發明的樹脂組成物中的樹脂的含量相對於從樹脂組成物的總固體成分中去除了填充劑之總質量，係99.5質量%以下為較佳，99質量%以下為更佳，98質量%以下為進一步較佳，97質量%以下為更進一步較佳，95質量%以下為進而更進一步較佳。 本發明的樹脂組成物可以僅包含一種特定樹脂，亦可以包含2種以上。包含2種以上之情況下，合計量在上述範圍為較佳。 〔content〕 The content of the specific resin in the resin composition of the present invention is preferably 20% by mass or more, more preferably 30% by mass or more, and 40% by mass relative to the total mass of the total solid content of the resin composition except the filler. % or more is more preferable, and 50 mass % or more is still more preferable. Furthermore, the content of the resin in the resin composition of the present invention is preferably 99.5% by mass or less, more preferably 99% by mass or less, with respect to the total mass of the total solid content of the resin composition except the filler, more preferably 98% by mass or less. It is still more preferable that it is not more than 97 mass %, and it is still more preferable that it is not more than 95 mass %. The resin composition of this invention may contain only 1 type of specific resin, and may contain 2 or more types. When including 2 or more types, it is preferable that the total amount is in the said range.

又，本發明的樹脂組成物包含至少2種樹脂亦較佳。 具體而言，本發明的樹脂組成物可以包含合計2種以上的特定樹脂和後述之其他樹脂，亦可以包含2種以上的特定樹脂，但包含2種以上的特定樹脂為較佳。 本發明的樹脂組成物包含2種以上的特定樹脂之情況下，例如，包含聚醯亞胺前驅物亦即源自二酐之結構（上述式（2）所示之R 115）不同之2種以上的聚醯亞胺前驅物為較佳。 Moreover, it is also preferable that the resin composition of this invention contains at least 2 types of resins. Specifically, the resin composition of the present invention may contain a total of two or more specific resins and other resins described below, or may contain two or more specific resins, but preferably contains two or more specific resins. When the resin composition of the present invention contains two or more specific resins, for example, it contains two different types of polyimide precursors, that is, structures derived from dianhydrides (R 115 represented by the above formula (2)) The above polyimide precursors are preferred.

＜其他樹脂＞ 本發明的樹脂組成物可以包含上述特定樹脂和與特定樹脂不同之其他樹脂（以下，亦簡稱為“其他樹脂”）。 作為其他樹脂，可以舉出酚樹脂、聚醯胺、環氧樹脂、聚矽氧烷、包含矽氧烷結構之樹脂、（甲基）丙烯酸樹脂、（甲基）丙烯醯胺樹脂、胺酯樹脂、縮丁醛樹脂、苯乙烯樹脂、聚醚樹脂、聚酯樹脂等。 例如，藉由進一步加入（甲基）丙烯酸樹脂，可獲得塗佈性優異之樹脂組成物，又，可獲得耐溶劑性優異之圖案（硬化物）。 例如，藉由代替後述的聚合性化合物或除了後述的聚合性化合物以外，將重量平均分子量係20,000以下的聚合性基值高的（例如，樹脂1g中之聚合性基的含有莫耳量為1×10 -3莫耳/g以上）（甲基）丙烯酸樹脂添加到樹脂組成物中，能夠提高樹脂組成物的塗佈性、圖案（硬化物）的耐溶劑性等。 又，亦能夠將其他樹脂作為填充劑的分散劑而添加到樹脂組成物中。在這種態樣中，作為其他樹脂，能夠並沒有特別限制地使用公知的填充劑的分散劑。 <Other resins> The resin composition of the present invention may contain the above-mentioned specific resins and other resins different from the specific resins (hereinafter also simply referred to as “other resins”). Examples of other resins include phenol resins, polyamides, epoxy resins, polysiloxanes, resins containing siloxane structures, (meth)acrylic resins, (meth)acrylamide resins, and urethane resins. , butyral resin, styrene resin, polyether resin, polyester resin, etc. For example, by further adding a (meth)acrylic resin, a resin composition excellent in applicability can be obtained, and a pattern (cured product) excellent in solvent resistance can be obtained. For example, by substituting for or in addition to the polymerizable compound described later, a polymerizable group having a weight average molecular weight of 20,000 or less (for example, the molar content of the polymerizable group in 1 g of resin is 1 ×10 -3 mol/g or more) (meth)acrylic resin can be added to the resin composition to improve the coatability of the resin composition, the solvent resistance of the pattern (cured product), and the like. In addition, other resins can also be added to the resin composition as a dispersant for the filler. In this aspect, as other resins, known filler dispersants can be used without particular limitation.

本發明的樹脂組成物包含其他樹脂之情況下，其他樹脂的含量相對於從樹脂組成物的總固體成分中去除了填充劑之總質量，係0.01質量%以上為較佳，0.05質量%以上為更佳，1質量%以上為進一步較佳，2質量%以上為進一步較佳，5質量%以上為更進一步較佳，10質量%以上為再進一步較佳。 又，本發明的樹脂組成物中的其他樹脂的含量相對於從樹脂組成物的總固體成分中去除了填充劑之總質量，係80質量%以下為較佳，75質量%以下為更佳，70質量%以下為進一步較佳，60質量%以下為進一步較佳，50質量%以下為更進一步較佳。 又，作為本發明的樹脂組成物的較佳的一態樣，亦能夠設為其他樹脂的含量為低含量的態樣。在上述態樣中，其他樹脂的含量相對於從樹脂組成物的總固體成分中去除了填充劑之總質量，係20質量%以下為較佳，15質量%以下為更佳，10質量%以下為進一步較佳，5質量%以下為進一步較佳，1質量%以下為更進一步較佳。上述含量的下限並沒有特別限定，只要為0質量%以上即可。 本發明的樹脂組成物可以僅包含一種其他樹脂，亦可以包含2種以上。包含2種以上之情況下，合計量在上述範圍為較佳。 When the resin composition of the present invention contains other resins, the content of the other resins is preferably at least 0.01% by mass, and at least 0.05% by mass relative to the total mass of the total solid content of the resin composition except the filler. More preferably, it is more preferably 1 mass % or more, 2 mass % or more is still more preferable, 5 mass % or more is still more preferable, and 10 mass % or more is still more preferable. In addition, the content of other resins in the resin composition of the present invention is preferably 80% by mass or less, more preferably 75% by mass or less, based on the total mass of the resin composition excluding fillers from the total solid content of the resin composition. It is still more preferably 70 mass % or less, 60 mass % or less is still more preferable, and 50 mass % or less is still more preferable. Moreover, as a preferable aspect of the resin composition of this invention, it can also be set as the aspect which makes content of other resin into low content. In the above aspect, the content of other resins is preferably not more than 20% by mass, more preferably not more than 15% by mass, and not more than 10% by mass relative to the total mass of the total solid content of the resin composition except the filler. It is more preferable that it is 5 mass % or less, and it is still more preferable that it is 1 mass % or less. The lower limit of the said content is not specifically limited, What is necessary is just to be 0 mass % or more. The resin composition of this invention may contain only 1 type of other resins, and may contain 2 or more types. When including 2 or more types, it is preferable that the total amount is in the said range.

＜聚合性化合物＞ 本發明的樹脂組成物包含聚合性化合物為較佳。 作為聚合性化合物，可以舉出自由基交聯劑或其他交聯劑。 ＜Polymerizable compound＞ It is preferable that the resin composition of this invention contains a polymeric compound. Examples of the polymerizable compound include radical crosslinking agents and other crosslinking agents.

〔自由基交聯劑〕 本發明的樹脂組成物包含自由基交聯劑為較佳。 自由基交聯劑係具有自由基聚合性基之化合物。作為自由基聚合性基，包含乙烯性不飽和鍵之基團為較佳。作為上述包含乙烯性不飽和鍵之基團，可以舉出乙烯基、烯丙基、乙烯基苯基、（甲基）丙烯醯基、順丁烯二醯亞胺基、（甲基）丙烯醯胺基等具有乙烯性不飽和鍵之基團。 在該等之中，作為上述包含乙烯性不飽和鍵之基團，（甲基）丙烯醯基、（甲基）丙烯醯胺基、乙烯基苯基為較佳，從反應性的觀點考慮，（甲基）丙烯醯基為更佳。 〔Free radical crosslinking agent〕 It is preferable that the resin composition of the present invention contains a radical crosslinking agent. The free radical crosslinking agent is a compound having a free radical polymerizable group. As the radical polymerizable group, a group containing an ethylenically unsaturated bond is preferable. Examples of the group containing an ethylenically unsaturated bond include vinyl, allyl, vinylphenyl, (meth)acryl, maleimide, (meth)acryl A group having an ethylenically unsaturated bond such as an amino group. Among them, (meth)acryl, (meth)acrylamide, and vinylphenyl are preferable as the above-mentioned group containing an ethylenically unsaturated bond. From the viewpoint of reactivity, (Meth)acryloyl is more preferred.

自由基交聯劑係具有1個以上乙烯性不飽和鍵之化合物為較佳，但具有2個以上乙烯性不飽和鍵之化合物為更佳。自由基交聯劑亦可以具有3個以上乙烯性不飽和鍵。 作為上述具有2個以上乙烯性不飽和鍵之化合物，具有2～15個乙烯性不飽和鍵之化合物為較佳，具有2～10個乙烯性不飽和鍵之化合物為更佳，具有2～6個之化合物為進一步較佳。 又，從所獲得之圖案（硬化物）的膜強度的觀點考慮，本發明的樹脂組成物包含具有2個乙烯性不飽和鍵之化合物和上述具有3個以上乙烯性不飽和鍵之化合物亦較佳。 The radical crosslinking agent is preferably a compound having one or more ethylenically unsaturated bonds, and more preferably a compound having two or more ethylenically unsaturated bonds. The radical crosslinking agent may have three or more ethylenically unsaturated bonds. As the above-mentioned compound having 2 or more ethylenically unsaturated bonds, compounds having 2 to 15 ethylenically unsaturated bonds are preferred, compounds having 2 to 10 ethylenically unsaturated bonds are more preferred, compounds having 2 to 6 Compounds of these are further preferred. Also, from the viewpoint of the film strength of the obtained pattern (cured product), the resin composition of the present invention contains a compound having two ethylenically unsaturated bonds or a compound having three or more ethylenically unsaturated bonds. good.

自由基交聯劑的分子量係2,000以下為較佳，1,500以下為更佳，900以下為進一步較佳。自由基交聯劑的分子量的下限係100以上為較佳。The molecular weight of the radical crosslinking agent is preferably 2,000 or less, more preferably 1,500 or less, and still more preferably 900 or less. The lower limit of the molecular weight of the radical crosslinking agent is preferably 100 or more.

作為自由基交聯劑的具體例，可以舉出不飽和羧酸（例如，丙烯酸、甲基丙烯酸、衣康酸、巴豆酸、異巴豆酸、鄰苯二甲酸等）或其酯類、醯胺類，較佳為不飽和羧酸與多元醇化合物的酯及不飽和羧酸與多元胺化合物的醯胺類。又，還可較佳地使用具有羥基、胺基、氫硫基等親和性取代基之不飽和羧酸酯或醯胺類與單官能或多官能異氰酸酯類或環氧類的加成反應物、與單官能或多官能羧酸的脫水縮合反應物等。又，亦可以較佳地使用具有異氰酸酯基或環氧基等親電子性取代基之不飽和羧酸酯或醯胺類與單官能或多官能醇類、胺類、硫醇類的加成反應物、以及具有鹵代基（halogeno group）或甲苯磺醯氧基（tosyloxy group）等脫離性取代基之不飽和羧酸酯或醯胺類與單官能或多官能醇類、胺類、硫醇類的取代反應物。又，作為另一例，亦能夠使用代替上述不飽和羧酸而替換為不飽和膦酸、苯乙烯等乙烯苯衍生物、乙烯醚、烯丙醚等之化合物群組。作為具體例，能夠參閱日本特開2016-027357號公報的段落0113～0122的記載，該等內容被編入本說明書中。Specific examples of radical crosslinking agents include unsaturated carboxylic acids (for example, acrylic acid, methacrylic acid, itaconic acid, crotonic acid, isocrotonic acid, phthalic acid, etc.) or their esters, amides Classes, preferably esters of unsaturated carboxylic acids and polyhydric alcohol compounds and amides of unsaturated carboxylic acids and polyamine compounds. In addition, addition reactants of unsaturated carboxylic acid esters or amides having affinity substituents such as hydroxyl groups, amino groups, and sulfhydryl groups with monofunctional or polyfunctional isocyanates or epoxides can also be preferably used. Dehydration condensation reaction products with monofunctional or polyfunctional carboxylic acids, etc. Also, the addition reaction of unsaturated carboxylic acid esters or amides having electrophilic substituents such as isocyanate groups or epoxy groups with monofunctional or polyfunctional alcohols, amines, and thiols can also be preferably used. substances, and unsaturated carboxylic acid esters or amides with dissociative substituents such as halogeno group or tosyloxy group, and monofunctional or polyfunctional alcohols, amines, thiols class of substitution reactants. In addition, as another example, a compound group in which unsaturated phosphonic acid, vinylbenzene derivatives such as styrene, vinyl ether, allyl ether, etc. are used instead of the above-mentioned unsaturated carboxylic acid can also be used. As specific examples, descriptions in paragraphs 0113 to 0122 of JP-A-2016-027357 can be referred to, and these contents are incorporated in this specification.

又，自由基交聯劑係在常壓下具有100℃以上的沸點之化合物亦較佳。作為其例子，能夠舉出使環氧乙烷或環氧丙烷加成在聚乙二醇二（甲基）丙烯酸酯、三羥甲基乙烷三（甲基）丙烯酸酯、新戊二醇二（甲基）丙烯酸酯、新戊四醇三（甲基）丙烯酸酯、新戊四醇四（甲基）丙烯酸酯、二新戊四醇五（甲基）丙烯酸酯、二新戊四醇六（甲基）丙烯酸酯、己二醇二（甲基）丙烯酸酯、三羥甲基丙烷三（丙烯醯氧丙基）醚、三（丙烯醯氧乙基）異氰脲酸酯、甘油或三羥甲基乙烷等多官能醇上之後進行了（甲基）丙烯酸酯化之化合物、如日本特公昭48-041708號公報、日本特公昭50-006034號公報、日本特開昭51-037193號各公報中所記載之胺基甲酸酯（甲基）丙烯酸酯類、日本特開昭48-064183號、日本特公昭49-043191號、日本特公昭52-030490號各公報中所記載之聚酯丙烯酸酯類、作為環氧樹脂與（甲基）丙烯酸的反應產物的環氧丙烯酸酯類等多官能丙烯酸酯或甲基丙烯酸酯及該等的混合物。又，日本特開2008-292970號公報的0254～0257段中所記載之化合物亦較佳。又，亦能夠舉出使多官能羧酸與（甲基）丙烯酸縮水甘油酯等具有環狀醚基及乙烯性不飽和鍵之化合物進行反應而獲得的多官能（甲基）丙烯酸酯等。Moreover, it is also preferable that a radical crosslinking agent is a compound which has a boiling point of 100 degreeC or more under normal pressure. Examples thereof include adding ethylene oxide or propylene oxide to polyethylene glycol di(meth)acrylate, trimethylolethane tri(meth)acrylate, neopentyl glycol di (meth)acrylate, neopentylthritol tri(meth)acrylate, neopentylthritol tetra(meth)acrylate, diperythritol penta(meth)acrylate, diperythritol hexa(meth)acrylate (meth)acrylate, hexanediol di(meth)acrylate, trimethylolpropane tris(acryloxypropyl)ether, tris(acryloxyethyl)isocyanurate, glycerin or tris(acryloxypropyl)ether Compounds that have been (meth)acrylated on polyfunctional alcohols such as methylolethane, such as Japanese Patent Publication No. 48-041708, Japanese Patent Publication No. 50-006034, and Japanese Patent Application No. 51-037193 Urethane (meth)acrylates described in each gazette, polymers described in each gazette of Japanese Patent Application Laid-Open No. 48-064183, Japanese Patent Publication No. 49-043191, and Japanese Patent Publication No. 52-030490 Polyfunctional acrylates such as ester acrylates, epoxy acrylates which are reaction products of epoxy resins and (meth)acrylic acid, or methacrylates, and mixtures thereof. Also, compounds described in paragraphs 0254 to 0257 of JP-A-2008-292970 are also preferred. Moreover, the polyfunctional (meth)acrylate obtained by making polyfunctional carboxylic acid and the compound which has a cyclic ether group and an ethylenically unsaturated bond, such as glycidyl (meth)acrylate, react, etc. are also mentioned.

又，作為上述以外的較佳的自由基交聯劑，亦能夠使用日本特開2010-160418號公報、日本特開2010-129825號公報、日本專利第4364216號公報等中所記載之具有茀環且具有2個以上含有乙烯性不飽和鍵之基團之化合物或卡多（cardo）樹脂。In addition, as preferred radical crosslinking agents other than those mentioned above, those described in JP-A-2010-160418, JP-A-2010-129825, and JP-A-4364216 can also be used. Compounds or cardo resins having two or more groups containing ethylenically unsaturated bonds.

進而，作為其他例子，亦能夠舉出日本特公昭46-043946號公報、日本特公平01-040337號公報、日本特公平01-040336號公報中記載之特定的不飽和化合物、日本特開平02-025493號公報中記載之乙烯基膦酸系化合物等。又，亦能夠使用日本特開昭61-022048號公報中記載之包含全氟烷基的化合物。進而，亦能夠使用“Journal of the Adhesion Society of Japan”vol.20、No.7、300～308頁（1984年）中作為光聚合性單體及寡聚物所介紹者。Furthermore, as other examples, specific unsaturated compounds described in Japanese Patent Publication No. 46-043946, Japanese Patent Publication No. 01-040337, Japanese Patent Publication No. 01-040336, Japanese Patent Laid-Open No. 02- Vinylphosphonic acid-based compounds described in Publication No. 025493, etc. In addition, a compound containing a perfluoroalkyl group described in JP-A-61-022048 can also be used. Furthermore, those introduced as photopolymerizable monomers and oligomers in "Journal of the Adhesion Society of Japan" vol. 20, No. 7, pages 300 to 308 (1984) can also be used.

除了上述以外，亦能夠較佳地使用日本特開2015-034964號公報的0048～0051段中記載之化合物、國際公開第2015/199219號的0087～0131段中記載之化合物，該等內容編入本說明書中。In addition to the above, compounds described in paragraphs 0048 to 0051 of JP-A-2015-034964 and compounds described in paragraphs 0087 to 0131 of International Publication No. 2015/199219 can also be preferably used, and these contents are incorporated herein. in the manual.

又，在日本特開平10-062986號公報中作為式（1）及式（2）而與其具體例一同記載之、使環氧乙烷或環氧丙烷加成在多官能醇上之後進行了（甲基）丙烯酸酯化之化合物亦能夠用作自由基交聯劑。Also, in Japanese Patent Application Laid-Open No. 10-062986, it is described as formula (1) and formula (2) together with specific examples thereof, after adding ethylene oxide or propylene oxide to the polyfunctional alcohol ( Meth)acrylated compounds can also be used as free-radical crosslinkers.

另外，日本特開2015-187211號公報的0104～0131段中所記載之化合物亦能夠用作自由基交聯劑，該等內容被編入本說明書中。In addition, the compounds described in paragraphs 0104 to 0131 of JP-A-2015-187211 can also be used as radical crosslinking agents, and these contents are incorporated in this specification.

作為自由基交聯劑，二新戊四醇三丙烯酸酯（作為市售品為KAYARAD D-330（Nippon Kayaku Co.,Ltd.製造））、二新戊四醇四丙烯酸酯（作為市售品為KAYARAD D-320（Nippon Kayaku Co.,Ltd.製造），A-TMMT（Shin-Nakamura Chemical Co.,Ltd.製造））、二新戊四醇五（甲基）丙烯酸酯（作為市售品為KAYARAD D-310（Nippon Kayaku Co.,Ltd.製造））、二新戊四醇六（甲基）丙烯酸酯（作為市售品為KAYARAD DPHA；Nippon Kayaku Co.,Ltd.製造，A-DPH（Shin-Nakamura Chemical Co.,Ltd.製造））及該等的（甲基）丙烯醯基經由乙二醇殘基或丙二醇殘基鍵結之結構為較佳。亦能夠使用該等寡聚物類型。As a radical crosslinking agent, diperythritol triacrylate (as a commercial item is KAYARAD D-330 (manufactured by Nippon Kayaku Co., Ltd.)), diperythritol tetraacrylate (as a commercial item KAYARAD D-320 (manufactured by Nippon Kayaku Co., Ltd.), A-TMMT (manufactured by Shin-Nakamura Chemical Co., Ltd.)), diperythritol penta(meth)acrylate (commercially available KAYARAD D-310 (manufactured by Nippon Kayaku Co., Ltd.), dipenteoerythritol hexa(meth)acrylate (as commercially available as KAYARAD DPHA; manufactured by Nippon Kayaku Co., Ltd., A-DPH (manufactured by Shin-Nakamura Chemical Co., Ltd.)) and a structure in which (meth)acryloyl groups are bonded via ethylene glycol residues or propylene glycol residues is preferable. These oligomer types can also be used.

作為自由基交聯劑的市售品，例如可以舉出Sartomer Company, Inc.製造之作為具有4個乙烯氧基鏈之4官能丙烯酸酯之SR-494、作為具有4個乙烯氧基鏈之2官能甲基丙烯酸酯的Sartomer Company, Inc.製造之SR-209、231、239、Nippon Kayaku Co.,Ltd.製造之作為具有6個戊烯氧基鏈之6官能丙烯酸酯的DPCA-60、作為具有3個異丁烯氧基鏈之3官能丙烯酸酯的TPA-330、胺基甲酸酯寡聚物UAS-10、UAB-140（Nippon Paper Industries Co.,Ltd.製造）、NK Ester M-40G、NK Ester 4G、NK Ester M-9300、NK Ester A-9300、UA-7200（Shin-Nakamura Chemical Co.,Ltd.製造）、DPHA-40H（Nippon Kayaku Co.,Ltd.製造）、UA-306H、UA-306T、UA-306I、AH-600、T-600、AI-600（以上為Kyoeisha chemical Co.,Ltd.製造）、BLEMMER PME400（NOF CORPORATION製造）等。Commercially available radical crosslinking agents include, for example, SR-494 manufactured by Sartomer Company, Inc. as a tetrafunctional acrylate having four ethyleneoxy chains, SR-494 as a 2-functional acrylate having four ethyleneoxy chains, SR-209, 231, 239 manufactured by Sartomer Company, Inc. of functional methacrylates, DPCA-60 manufactured by Nippon Kayaku Co., Ltd. as a hexafunctional acrylate having 6 pentenoxy chains, as TPA-330 of trifunctional acrylate having 3 isobutyleneoxy chains, urethane oligomer UAS-10, UAB-140 (manufactured by Nippon Paper Industries Co., Ltd.), NK Ester M-40G, NK Ester 4G, NK Ester M-9300, NK Ester A-9300, UA-7200 (manufactured by Shin-Nakamura Chemical Co., Ltd.), DPHA-40H (manufactured by Nippon Kayaku Co., Ltd.), UA-306H, UA-306T, UA-306I, AH-600, T-600, AI-600 (manufactured by Kyoeisha Chemical Co., Ltd.), BLEMMER PME400 (manufactured by NOF CORPORATION), etc.

作為自由基交聯劑，如日本特公昭48-041708號公報、日本特開昭51-037193號公報、日本特公平02-032293號公報、日本特公平02-016765號公報中所記載之胺基甲酸酯丙烯酸酯類、或日本特公昭58-049860號公報、日本特公昭56-017654號公報、日本特公昭62-039417號公報、日本特公昭62-039418號公報中所記載之具有環氧乙烷系骨架之胺基甲酸酯化合物類亦較佳。進而，作為自由基交聯劑，亦能夠使用日本特開昭63-277653號公報、日本特開昭63-260909號公報、日本特開平01-105238號公報中所記載之在分子內具有胺基結構或硫化物結構之化合物。As a free radical crosslinking agent, such as the amine group described in Japanese Patent Publication No. 48-041708, Japanese Patent Application Publication No. 51-037193, Japanese Patent Publication No. 02-032293, and Japanese Patent Publication No. 02-016765 Formate acrylates, or Japanese Patent Publication No. 58-049860, Japanese Patent Publication No. 56-017654, Japanese Patent Publication No. 62-039417, and Japanese Patent Publication No. 62-039418. Urethane compounds with an ethane-based skeleton are also preferred. Furthermore, as a radical crosslinking agent, it is also possible to use those having an amino group in the molecule described in JP-A-63-277653, JP-A-63-260909, and JP-01-105238. Compounds with structure or sulfide structure.

自由基交聯劑亦可以為具有羧基、磷酸基等酸基之自由基交聯劑。具有酸基之自由基交聯劑係脂肪族多羥基化合物與不飽和羧酸的酯為較佳，使非芳香族羧酸酐與脂肪族多羥基化合物的未反應的羥基進行反應而具有酸基之自由基交聯劑為更佳。特佳為，在使非芳香族羧酸酐與脂肪族多羥基化合物的未反應的羥基進行反應而具有酸基之自由基交聯劑中，脂肪族多羥基化合物為新戊四醇或二新戊四醇的化合物。作為市售品，例如，作為TOAGOSEI CO.,Ltd.製多元酸改質丙烯酸類寡聚物，可以舉出M-510、M-520等。The free radical crosslinking agent may also be a free radical crosslinking agent having acid groups such as carboxyl groups and phosphoric acid groups. The free radical cross-linking agent with acid groups is preferably an ester of aliphatic polyhydroxy compound and unsaturated carboxylic acid, which reacts non-aromatic carboxylic acid anhydride and unreacted hydroxyl group of aliphatic polyhydroxy compound to have an acid group. Free radical crosslinking agents are more preferred. Particularly preferably, in the radical crosslinking agent having an acid group by reacting a non-aromatic carboxylic acid anhydride with an unreacted hydroxyl group of an aliphatic polyol, the aliphatic polyol is neopentyl glycol or dipentyl Tetrol compounds. As a commercial item, M-510, M-520, etc. are mentioned, for example as TOAGOSEI CO., Ltd. polyacid-modified acrylic oligomer.

具有酸基之自由基交聯劑的較佳酸值係0.1～300mgKOH/g，特佳為1～100mgKOH/g。若自由基交聯劑的酸值在上述範圍內，則製造上的操作性優異，進而，顯影性優異。又，聚合性良好。上述酸值依據JIS K 0070：1992的記載進行測量。The preferred acid value of the free radical crosslinking agent with acid groups is 0.1-300 mgKOH/g, particularly preferably 1-100 mgKOH/g. When the acid value of a radical crosslinking agent exists in the said range, it will be excellent in workability|operativity in manufacture, and also will be excellent in developability. Also, the polymerizability is good. The said acid value is measured based on description of JISK0070:1992.

從圖案的解析性和膜的伸縮性的觀點考慮，樹脂組成物使用2官能甲基丙烯酸酯或丙烯酸酯為較佳。 作為具體化合物，能夠使用三乙二醇二丙烯酸酯、三乙二醇二甲基丙烯酸酯、四乙二醇二甲基丙烯酸酯、四乙二醇二丙烯酸酯、PEG200二丙烯酸酯、PEG200二甲基丙烯酸酯、PEG600二丙烯酸酯、PEG600二甲基丙烯酸酯、聚四乙二醇二丙烯酸酯、聚四乙二醇二甲基丙烯酸酯、新戊二醇二丙烯酸酯、新戊二醇二甲基丙烯酸酯、3-甲基-1,5-戊二醇二丙烯酸酯、1,6-己二醇二丙烯酸酯、1,6己二醇二甲基丙烯酸酯、二羥甲基-三環癸烷二丙烯酸酯、二羥甲基-三環癸烷二甲基丙烯酸酯、雙酚A的EO（環氧乙烷）加成物二丙烯酸酯、雙酚A的EO加成物二甲基丙烯酸酯、雙酚A的PO（環氧丙烷）加成物二丙烯酸酯、雙酚A的PO加成物二甲基丙烯酸酯、2-羥基-3-丙烯醯氧基丙基甲基丙烯酸酯、異氰脲酸EO改質二丙烯酸酯、異氰脲酸改質二甲基丙烯酸酯、以及具有胺甲酸乙酯鍵之2官能丙烯酸酯、具有胺甲酸乙酯鍵之2官能的甲基丙烯酸酯。該等依據需要能夠混合使用2種以上。 另外，例如PEG200二丙烯酸酯係指聚乙二醇二丙烯酸酯且聚乙二醇鏈的式量為200左右者。 在本發明的樹脂組成物中，從抑制伴隨圖案（硬化物）的彈性模數控制之翹曲之觀點考慮，能夠較佳地使用單官能自由基交聯劑作為自由基交聯劑。作為單官能自由基交聯劑，可以較佳地使用（甲基）丙烯酸正丁酯、（甲基）丙烯酸2-乙基己酯、（甲基）丙烯酸2-羥基乙酯、（甲基）丙烯酸丁氧基乙酯、（甲基）丙烯酸卡必醇酯、（甲基）丙烯酸環己酯、（甲基）丙烯酸苄酯、（甲基）丙烯酸苯氧基乙酯、N-羥甲基（甲基）丙烯醯胺、（甲基）丙烯酸縮水甘油酯、聚乙二醇單（甲基）丙烯酸酯、聚丙二醇單（甲基）丙烯酸酯等（甲基）丙烯酸衍生物、N-乙烯基吡咯啶酮、N-乙烯基己內醯胺等N-乙烯基化合物類、烯丙基縮水甘油醚等。作為單官能自由基交聯劑，為了抑制曝光前的揮發，在常壓下具有100℃以上的沸點之化合物亦較佳。 此外，作為2官能以上的自由基交聯劑，可以舉出鄰苯二甲酸二烯丙酯、偏苯三酸三烯丙酯等烯丙基化合物類。 From the viewpoint of pattern resolution and film stretchability, it is preferable to use bifunctional methacrylate or acrylate for the resin composition. As specific compounds, triethylene glycol diacrylate, triethylene glycol dimethacrylate, tetraethylene glycol dimethacrylate, tetraethylene glycol diacrylate, PEG200 diacrylate, PEG200 dimethyl Acrylate, PEG600 Diacrylate, PEG600 Dimethacrylate, Polytetraethylene Glycol Diacrylate, Polytetraethylene Glycol Dimethacrylate, Neopentyl Glycol Diacrylate, Neopentyl Glycol Dimethacrylate methacrylate, 3-methyl-1,5-pentanediol diacrylate, 1,6-hexanediol diacrylate, 1,6-hexanediol dimethacrylate, dimethylol-tricyclic Decane diacrylate, dimethylol-tricyclodecane dimethacrylate, EO (ethylene oxide) adduct of bisphenol A diacrylate, EO adduct of bisphenol A dimethyl Acrylate, PO (propylene oxide) adduct of bisphenol A diacrylate, PO adduct of bisphenol A dimethacrylate, 2-hydroxy-3-acryloxypropyl methacrylate , isocyanuric acid EO modified diacrylate, isocyanuric acid modified dimethacrylate, bifunctional acrylate with urethane bond, bifunctional methacrylic acid with urethane bond ester. These can mix and use 2 or more types as needed. In addition, for example, PEG200 diacrylate refers to polyethylene glycol diacrylate having a formula weight of about 200 polyethylene glycol chains. In the resin composition of the present invention, a monofunctional radical crosslinking agent can be preferably used as the radical crosslinking agent from the viewpoint of suppressing warpage accompanying elastic modulus control of the pattern (cured product). As a monofunctional radical crosslinking agent, n-butyl (meth)acrylate, 2-ethylhexyl (meth)acrylate, 2-hydroxyethyl (meth)acrylate, (meth) Butoxyethyl acrylate, carbitol (meth)acrylate, cyclohexyl (meth)acrylate, benzyl (meth)acrylate, phenoxyethyl (meth)acrylate, N-methylol (Meth)acrylic acid derivatives such as (meth)acrylamide, glycidyl (meth)acrylate, polyethylene glycol mono(meth)acrylate, polypropylene glycol mono(meth)acrylate, etc., N-ethylene N-vinyl compounds such as ylpyrrolidone and N-vinylcaprolactam, allyl glycidyl ether, and the like. As the monofunctional radical crosslinking agent, in order to suppress volatilization before exposure, a compound having a boiling point of 100° C. or higher under normal pressure is also preferable. Moreover, allyl compounds, such as diallyl phthalate and triallyl trimellitate, are mentioned as a difunctional or more radical crosslinking agent.

含有自由基交聯劑之情況下，其含量相對於從本發明的樹脂組成物的總固體成分中去除了填充劑之總質量，係大於0質量%且60質量%以下為較佳。下限為5質量%以上為更佳。上限為50質量%以下為更佳，30質量%以下為進一步較佳。When a radical crosslinking agent is contained, its content is preferably greater than 0% by mass and not more than 60% by mass relative to the total mass of the resin composition of the present invention excluding fillers from the total solid content. The lower limit is more preferably at least 5% by mass. The upper limit is more preferably at most 50% by mass, and more preferably at most 30% by mass.

自由基交聯劑可以單獨使用1種，但亦可以混合使用2種以上。同時使用2種以上時，其合計量成為上述範圍為較佳。A radical crosslinking agent may be used individually by 1 type, but may mix and use 2 or more types. When using 2 or more types simultaneously, it is preferable that the total amount becomes the said range.

〔其他交聯劑〕 本發明的樹脂組成物包含與上述自由基交聯劑不同之其他交聯劑亦較佳。 在本發明中，其他交聯劑係指上述自由基交聯劑以外的交聯劑，在分子內具有複數個藉由上述光酸產生劑或光鹼產生劑的感光而促進在與組成物中的其他化合物或其反應產物之間形成共價鍵之反應之基團之化合物為較佳，在分子內具有複數個藉由酸或鹼的作用而促進在與組成物中的其他化合物或其反應產物之間形成共價鍵之反應之基團之化合物為更佳。 上述酸或鹼係在曝光步驟中由光酸產生劑或光鹼產生劑產生之酸或鹼為較佳。 作為其他交聯劑，具有選自包括醯氧基甲基、羥甲基及烷氧基甲基之群組中的至少一種基團之化合物為較佳，具有選自包括醯氧基甲基、羥甲基及烷氧基甲基之群組中的至少一種基團直接鍵結於氮原子之結構之化合物為更佳。 作為其他交聯劑，例如可以舉出具有使甲醛或甲醛和醇與三聚氰胺、甘脲、脲、伸烷基脲、苯并胍胺等含有胺基之化合物進行反應而用醯氧基甲基、羥甲基或烷氧基甲基取代了上述胺基的氫原子之結構之化合物。該等化合物之製造方法並沒有特別限定，只要為具有與藉由上述方法製造的化合物相同結構之化合物即可。又，亦可以為該等化合物的羥甲基彼此自縮合而成之寡聚物。 將作為上述含有胺基之化合物而使用了三聚氰胺之交聯劑稱為三聚氰胺系交聯劑，將使用了甘脲、脲或伸烷基脲之交聯劑稱為脲系交聯劑，將使用了伸烷基脲之交聯劑稱為伸烷基脲系交聯劑，將使用了苯并胍胺之交聯劑稱為苯并胍胺系交聯劑。 在該等之中，本發明的樹脂組成物包含選自包括脲系交聯劑及三聚氰胺系交聯劑之群組中的至少一種化合物為較佳，包含選自包括後述之甘脲系交聯劑及三聚氰胺系交聯劑之群組中的至少一種化合物為更佳。 〔Other crosslinking agents〕 It is also preferable that the resin composition of the present invention contains other crosslinking agents different from the above radical crosslinking agents. In the present invention, other cross-linking agents refer to cross-linking agents other than the above-mentioned radical cross-linking agents, which have a plurality of cross-linking agents in the molecule that are promoted by the photosensitization of the above-mentioned photoacid generator or photobase generator in the composition. The compound that forms a covalent bond reaction group between other compounds or their reaction products is preferred. There are multiple compounds in the molecule that promote the reaction with other compounds or their reactions in the composition through the action of acids or bases Compounds of reactive groups that form covalent bonds between products are more preferred. The above-mentioned acid or base is preferably an acid or base generated by a photoacid generator or a photobase generator in the exposure step. As other crosslinking agents, compounds having at least one group selected from the group consisting of acyloxymethyl, hydroxymethyl and alkoxymethyl groups are preferred. A compound having a structure in which at least one group of a hydroxymethyl group and an alkoxymethyl group is directly bonded to a nitrogen atom is more preferable. As other crosslinking agents, for example, formaldehyde or formaldehyde and alcohol can be used to react with amine-containing compounds such as melamine, glycoluril, urea, alkylene urea, and benzoguanamine, and use acyloxymethyl, A compound in which a hydrogen atom of the above-mentioned amino group is substituted with a methylol or alkoxymethyl group. The production method of these compounds is not particularly limited, as long as it is a compound having the same structure as the compound produced by the above-mentioned method. Moreover, it may be an oligomer formed by self-condensing the methylol groups of these compounds. A cross-linking agent using melamine as the above-mentioned amine group-containing compound is called a melamine-based cross-linking agent, and a cross-linking agent using glycoluril, urea, or alkylene urea is called a urea-based cross-linking agent. A crosslinking agent using alkylene urea is called an alkylene urea-based crosslinking agent, and a crosslinking agent using benzoguanamine is called a benzoguanamine-based crosslinking agent. Among them, it is preferable that the resin composition of the present invention contains at least one compound selected from the group consisting of urea-based cross-linking agents and melamine-based cross-linking agents, including glycoluril-based cross-linking agents described later. More preferably, at least one compound selected from the group of crosslinking agents and melamine-based crosslinking agents.

作為本發明中之含有烷氧基甲基及醯氧基甲基中的至少1個之化合物，作為結構例能夠舉出烷氧基甲基或醯氧基甲基在芳香族基或下述脲結構的氮原子上或三𠯤上直接取代之化合物。 上述化合物所具有之烷氧基甲基或醯氧基甲基係碳數2～5為較佳，碳數2或3為較佳，碳數2為更佳。 上述化合物所具有之烷氧基甲基及醯氧基甲基的總數係1～10為較佳，更佳為2～8，特佳為3～6。 上述化合物的分子量較佳為1500以下，180～1200為更佳。 As a compound containing at least one of an alkoxymethyl group and an acyloxymethyl group in the present invention, examples of the structure include an alkoxymethyl group or an acyloxymethyl group in an aromatic group or the following urea A compound directly substituted on the nitrogen atom of the structure or on the three 𠯤. The alkoxymethyl group or acyloxymethyl group of the above compounds preferably has 2 to 5 carbon atoms, more preferably 2 or 3 carbon atoms, and more preferably 2 carbon atoms. The total number of alkoxymethyl groups and acyloxymethyl groups in the above compounds is preferably 1-10, more preferably 2-8, particularly preferably 3-6. The molecular weight of the above compound is preferably 1500 or less, more preferably 180-1200.

[化學式28]

Figure 02_image055
[chemical formula 28]
Figure 02_image055

R 100表示烷基或醯基。 R 101及R 102分別獨立地表示一價的有機基團，可以相互鍵結而形成環。 R 100 represents an alkyl or acyl group. R 101 and R 102 each independently represent a monovalent organic group, which may be bonded to each other to form a ring.

作為烷氧基甲基或醯氧基甲基直接被芳香族基取代之化合物，例如能夠舉出如下述通式那樣的化合物。Examples of compounds in which an alkoxymethyl group or an acyloxymethyl group is directly substituted with an aromatic group include compounds represented by the following general formula.

[化學式29]

Figure 02_image057
[chemical formula 29]
Figure 02_image057

式中，X表示單鍵或2價的有機基團，每個R 104分別獨立地表示烷基或醯基，R 103表示氫原子、烷基、烯基、芳基、芳烷基或藉由酸的作用而分解並生成鹼溶性基之基團（例如，藉由酸的作用而脫離之基團、-C（R 4） 2COOR 5所表示之基團（R 4分別獨立地表示氫原子或碳數1～4的烷基，R 5表示藉由酸的作用而脫離之基團。））。 R 105各自獨立地表示烷基或烯基，a、b及c各自獨立地係1～3，d係0～4，e係0～3，f係0～3，a+d係5以下，b+e係4以下，c+f係4以下。 關於藉由酸的作用而分解並產生鹼溶性基之基團、藉由酸的作用而脫離之基團、-C（R 4） 2COOR 5所表示之基團中之R 5，例如能夠舉出-C（R 36）（R 37）（R 38）、-C（R 36）（R 37）（OR 39）、-C（R 01）（R 02）（OR 39）等。 式中，R 36～R 39分別獨立地表示烷基、環烷基、芳基、芳烷基或烯基。R 36與R 37可以相互鍵結而形成環。 作為上述烷基，碳數1～10的烷基為較佳，碳數1～5的烷基為更佳。 上述烷基可以係直鏈狀、支鏈狀中的任一種。 作為上述環烷基，碳數3～12的環烷基為較佳，碳數3～8的環烷基為更佳。 上述環烷基可以係單環結構，亦可以係縮合環等多環結構。 上述芳基係碳數6～30的芳香族烴基為較佳，苯基為更佳。 作為上述芳烷基，碳數7～20的芳烷基為較佳，碳數7～16的芳烷基為更佳。 上述芳烷基係指被烷基取代之芳基，該等烷基及芳基的較佳態樣與上述烷基及芳基的較佳態樣相同。 上述烯基係碳數3～20的烯基為較佳，碳數3～16的烯基為更佳。 又，該等基可以在可獲得本發明的效果之範圍內進一步具有公知的取代基。 In the formula, X represents a single bond or a divalent organic group, each R 104 independently represents an alkyl or acyl group, and R 103 represents a hydrogen atom, an alkyl, an alkenyl, an aryl, an aralkyl group or by A group decomposed by the action of an acid to form an alkali-soluble group (for example, a group detached by the action of an acid, a group represented by -C(R 4 ) 2 COOR 5 (R 4 each independently represents a hydrogen atom Or an alkyl group with 1 to 4 carbons, R 5 represents a group that is detached by the action of an acid.)). R 105 each independently represents an alkyl or alkenyl group, a, b and c are each independently 1 to 3, d is 0 to 4, e is 0 to 3, f is 0 to 3, a+d is 5 or less, b+e is 4 or less, c+f is 4 or less. With regard to the group decomposed by the action of an acid to produce an alkali-soluble group, the group detached by the action of an acid, and R 5 in the group represented by -C(R 4 ) 2 COOR 5 , for example, -C(R 36 )(R 37 )(R 38 ), -C(R 36 )(R 37 )(OR 39 ), -C(R 01 )(R 02 )(OR 39 ), etc. In the formula, R 36 to R 39 each independently represent an alkyl group, a cycloalkyl group, an aryl group, an aralkyl group or an alkenyl group. R 36 and R 37 may be bonded to each other to form a ring. As the above-mentioned alkyl group, an alkyl group having 1 to 10 carbon atoms is preferable, and an alkyl group having 1 to 5 carbon atoms is more preferable. The above-mentioned alkyl group may be either linear or branched. As the cycloalkyl group, a cycloalkyl group having 3 to 12 carbon atoms is preferable, and a cycloalkyl group having 3 to 8 carbon atoms is more preferable. The above-mentioned cycloalkyl group may be a monocyclic structure, or may be a polycyclic structure such as a condensed ring. The above-mentioned aryl group is an aromatic hydrocarbon group having 6 to 30 carbon atoms is preferable, and phenyl group is more preferable. As the above-mentioned aralkyl group, an aralkyl group having 7 to 20 carbon atoms is preferable, and an aralkyl group having 7 to 16 carbon atoms is more preferable. The aforementioned aralkyl group refers to an aryl group substituted with an alkyl group, and preferred aspects of the alkyl group and aryl group are the same as those of the aforementioned alkyl group and aryl group. The aforementioned alkenyl group is preferably an alkenyl group having 3 to 20 carbon atoms, more preferably an alkenyl group having 3 to 16 carbon atoms. In addition, these groups may further have known substituents within the range in which the effects of the present invention can be obtained.

R 01及R 02分別獨立地表示氫原子、烷基、環烷基、芳基、芳烷基或烯基。 R 01 and R 02 each independently represent a hydrogen atom, an alkyl group, a cycloalkyl group, an aryl group, an aralkyl group or an alkenyl group.

作為藉由酸的作用而分解並產生鹼溶性基之基團或藉由酸的作用而脫離之基團，較佳為三級烷基酯基、縮醛基、枯基酯基、烯醇酯基等。進一步較佳為三級烷基酯基、縮醛基。As a group that is decomposed by the action of an acid to generate an alkali-soluble group or a group that is detached by the action of an acid, tertiary alkyl ester groups, acetal groups, cumyl ester groups, and enol esters are preferred Base etc. Further preferred are tertiary alkyl ester groups and acetal groups.

作為具有烷氧基甲基之化合物，具體而言，能夠舉出以下結構。具有醯氧基甲基之化合物能夠舉出將下述化合物的烷氧基甲基變更為醯氧基甲基之化合物。作為在分子內具有烷氧基甲基或醯氧基甲基之化合物，能夠舉出如以下那樣的化合物，但並不限定於該等。As a compound which has an alkoxymethyl group, the following structure can be mentioned specifically. Examples of the compound having an acyloxymethyl group include compounds in which the alkoxymethyl group of the following compounds is changed to an acyloxymethyl group. Examples of compounds having an alkoxymethyl group or an acyloxymethyl group in the molecule include the following compounds, but are not limited thereto.

[化學式30]

Figure 02_image059
[chemical formula 30]
Figure 02_image059

[化學式31]

Figure 02_image061
[chemical formula 31]
Figure 02_image061

含有烷氧基甲基及醯氧基甲基中的至少1個之化合物可以使用市售者，亦可以使用藉由公知的方法合成者。 在耐熱性的觀點上，烷氧基甲基或醯氧基甲基在芳香環或三𠯤環上直接取代之化合物為較佳。 As the compound containing at least one of an alkoxymethyl group and an acyloxymethyl group, a commercially available compound may be used, or a compound synthesized by a known method may be used. From the viewpoint of heat resistance, a compound in which an alkoxymethyl group or an acyloxymethyl group is directly substituted on an aromatic ring or a trioxyl ring is preferable.

作為三聚氰胺系交聯劑的具體例，可以舉出六甲氧基甲基三聚氰胺、六乙氧基甲基三聚氰胺、六丙氧基甲基三聚氰胺、六丁氧基丁基三聚氰胺等。Specific examples of the melamine-based crosslinking agent include hexamethoxymethylmelamine, hexaethoxymethylmelamine, hexapropoxymethylmelamine, hexabutoxybutylmelamine, and the like.

作為脲系交聯劑的具體例，例如可以舉出：單羥基甲基化甘脲、二羥基甲基化甘脲、三羥基甲基化甘脲、四羥基甲基化甘脲、單甲氧基甲基化甘脲、二甲氧基甲基化甘脲、三甲氧基甲基化甘脲、四甲氧基甲基化甘脲、單乙氧基甲基化甘脲、二乙氧基甲基化甘脲、三乙氧基甲基化甘脲、四乙氧基甲基化甘脲、單丙氧基甲基化甘脲、二丙氧基甲基化甘脲、三丙氧基甲基化甘脲、四丙氧基甲基化甘脲、單丁氧基甲基化甘脲、二丁氧基甲基化甘脲、三丁氧基甲基化甘脲或四丁氧基甲基化甘脲等甘脲系交聯劑； 雙甲氧基甲基脲、雙乙氧基甲基脲、雙丙氧基甲基脲、雙丁氧基甲基脲等脲系交聯劑； 單羥基甲基化伸乙脲或二羥基甲基化伸乙脲、單甲氧基甲基化伸乙脲、二甲氧基甲基化伸乙脲、單乙氧基甲基化伸乙脲、二乙氧基甲基化伸乙脲、單丙氧基甲基化伸乙脲、二丙氧基甲基化伸乙脲、單丁氧基甲基化伸乙脲或二丁氧基甲基化伸乙脲等伸乙脲系交聯劑； 單羥基甲基化伸丙脲、二羥基甲基化伸丙脲、單甲氧基甲基化伸丙脲、二甲氧基甲基化伸丙脲、單乙氧基甲基化伸丙脲、二乙氧基甲基化伸丙脲、單丙氧基甲基化伸丙脲、二丙氧基甲基化伸丙脲、單丁氧基甲基化伸丙脲或二丁氧基甲基化伸丙脲等伸丙脲系交聯劑； 1,3-二（甲氧基甲基）4,5-二羥基-2-咪唑啶酮、1,3-二（甲氧基甲基）-4,5-二甲氧基-2-咪唑啶酮等。 Specific examples of urea-based crosslinking agents include, for example, monohydroxymethylated glycoluril, dihydroxymethylated glycoluril, trishydroxymethylated glycoluril, tetrahydroxymethylated glycoluril, monomethoxy methylated glycoluril, dimethoxymethylated glycoluril, trimethoxymethylated glycoluril, tetramethoxymethylated glycoluril, monoethoxymethylated glycoluril, diethoxy Methylated glycoluril, Triethoxymethylated glycoluril, Tetraethoxymethylated glycoluril, Monopropoxymethylated glycoluril, Dipropoxymethylated glycoluril, Tripropoxymethylated glycoluril Methylated glycoluril, tetrapropoxymethylated glycoluril, monobutoxymethylated glycoluril, dibutoxymethylated glycoluril, tributoxymethylated glycoluril, or tetrabutoxymethylated glycoluril Methylated glycoluril and other glycoluril cross-linking agents; Bismethoxymethylurea, bisethoxymethylurea, bispropoxymethylurea, bisbutoxymethylurea and other urea-based crosslinking agents; Monohydroxymethylated ethylurea or dihydroxymethylated ethylurea, monomethoxymethylated ethylurea, dimethoxymethylated ethylurea, monoethoxymethylated ethylurea , diethoxymethylated ethyl urea, monopropoxymethylated ethyl urea, dipropoxymethylated ethyl urea, monobutoxymethylated ethyl urea or dibutoxymethyl ethyl urea ethylidene urea-based cross-linking agent such as methylated ethylurea; Monohydroxymethylated propylene urea, dihydroxymethylated propylene urea, monomethoxymethylated propylene urea, dimethoxymethylated propylene urea, monoethoxymethylated propylene urea , diethoxymethylated propylene urea, monopropoxymethylated propylene urea, dipropoxymethylated propylene urea, monobutoxymethylated propylene urea or dibutoxymethyl Propylene urea-based cross-linking agents such as alkylated propylene urea; 1,3-bis(methoxymethyl)4,5-dihydroxy-2-imidazolidinone, 1,3-bis(methoxymethyl)-4,5-dimethoxy-2-imidazole pyridone etc.

作為苯并胍胺系交聯劑的具體例，例如可以舉出單羥基甲基化苯并胍胺、二羥基甲基化苯并胍胺、三羥基甲基化苯并胍胺、四羥基甲基化苯并胍胺、單甲氧基甲基化苯并胍胺、二甲氧基甲基化苯并胍胺、三甲氧基甲基化苯并胍胺、四甲氧基甲基化苯并胍胺、單乙氧基甲基化苯并胍胺、二乙氧基甲基化苯并胍胺、三乙氧基甲基化苯并胍胺、四乙氧基甲基化苯并胍胺、單丙氧基甲基化苯并胍胺、二丙氧基甲基化苯并胍胺、三丙氧基甲基化苯并胍胺、四丙氧基甲基化苯并胍胺、單丁氧基甲基化苯并胍胺、二丁氧基甲基化苯并胍胺、三丁氧基甲基化苯并胍胺、四丁氧基甲基化苯并胍胺等。Specific examples of benzoguanamine-based crosslinking agents include monohydroxymethylated benzoguanamine, dihydroxymethylated benzoguanamine, trishydroxymethylated benzoguanamine, tetrahydroxymethylated benzoguanamine, and tetrahydroxymethylated benzoguanamine. methylated benzoguanamine, monomethoxymethylated benzoguanamine, dimethoxymethylated benzoguanamine, trimethoxymethylated benzoguanamine, tetramethoxymethylated benzoguanamine Benzoguanamine, monoethoxymethylated benzoguanamine, diethoxymethylated benzoguanamine, triethoxymethylated benzoguanamine, tetraethoxymethylated benzoguanamine Amine, Monopropoxymethylated Benzoguanamine, Dipropoxymethylated Benzoguanamine, Tripropoxymethylated Benzoguanamine, Tetrapropoxymethylated Benzoguanamine, Monobutoxymethylated benzoguanamine, dibutoxymethylated benzoguanamine, tributoxymethylated benzoguanamine, tetrabutoxymethylated benzoguanamine, and the like.

此外，作為具有選自包括羥甲基及烷氧基甲基之群組中的至少一種基團之化合物，亦可以較佳地使用在芳香環（較佳為苯環）上直接鍵結有選自包括羥甲基及烷氧基甲基之群組中的至少一種基團之化合物。 作為該種化合物的具體例，可以舉出對苯二甲醇、雙（羥甲基）甲酚、雙（羥甲基）二甲氧基苯、雙（羥甲基）二苯醚、雙（羥甲基）二苯甲酮、羥甲基苯甲酸羥甲基苯、雙（羥甲基）聯苯、二甲基雙（羥甲基）聯苯、雙（甲氧基甲基）苯、雙（甲氧基甲基）甲酚、雙（甲氧基甲基）二甲氧基苯、雙（甲氧基甲基）二苯醚、雙（甲氧基甲基）二苯甲酮、甲氧基甲基苯甲酸甲氧基甲基苯、雙（甲氧基甲基）聯苯、二甲基雙（甲氧基甲基）聯苯、4,4’,4’’-亞乙基三[2,6-雙（甲氧基甲基）苯酚]、5,5’-[2,2,2‐三氟‐1‐（三氟甲基）亞乙基]雙[2‐羥基‐1,3‐苯二甲醇]、3,3’,5,5’-四（甲氧基甲基）-1,1’-聯苯-4,4’-二醇等。 In addition, as a compound having at least one group selected from the group consisting of hydroxymethyl group and alkoxymethyl group, it is also preferable to use an optional compound directly bonded to an aromatic ring (preferably a benzene ring). A compound of at least one group selected from the group consisting of hydroxymethyl and alkoxymethyl. Specific examples of such compounds include terephthalamide, bis(hydroxymethyl)cresol, bis(hydroxymethyl)dimethoxybenzene, bis(hydroxymethyl)diphenyl ether, bis(hydroxymethyl) Methyl)benzophenone, hydroxymethylbenzene hydroxybenzoate, bis(hydroxymethyl)biphenyl, dimethylbis(hydroxymethyl)biphenyl, bis(methoxymethyl)benzene, bis(methoxymethyl)benzene (methoxymethyl)cresol, bis(methoxymethyl)dimethoxybenzene, bis(methoxymethyl)diphenyl ether, bis(methoxymethyl)benzophenone, methyl Oxymethylbenzoate Methoxymethylbenzene, Bis(methoxymethyl)biphenyl, Dimethylbis(methoxymethyl)biphenyl, 4,4',4''-Ethylene Tris[2,6-bis(methoxymethyl)phenol], 5,5'-[2,2,2-trifluoro-1-(trifluoromethyl)ethylidene]bis[2-hydroxy- 1,3‐benzenedimethanol], 3,3',5,5'-tetrakis(methoxymethyl)-1,1'-biphenyl-4,4'-diol, etc.

作為其他交聯劑，亦可以使用市售品，作為較佳的市售品，可以舉出46DMOC、46DMOEP（以上為ASAHI YUKIZAI CORPORATION製造）、DML-PC、DML-PEP、DML-OC、DML-OEP、DML-34X、DML-PTBP、DML-PCHP、DML-OCHP、DML-PFP、DML-PSBP、DML-POP、DML-MBOC、DML-MBPC、DML-MTrisPC、DML-BisOC-Z、DML-BisOCHP-Z、DML-BPC、DMLBisOC-P、DMOM-PC、DMOM-PTBP、DMOM-MBPC、TriML-P、TriML-35XL、TML-HQ、TML-BP、TML-pp-BPF、TML-BPE、TML-BPA、TML-BPAF、TML-BPAP、TMOM-BP、TMOM-BPE、TMOM-BPA、TMOM-BPAF、TMOM-BPAP、HML-TPPHBA、HML-TPHAP、HMOM-TPPHBA、HMOM-TPHAP（以上為Honshu Chemical Industry Co.,Ltd.製造）、NIKARAC（註冊商標，以下相同）MX-290、NIKARAC MX-280、NIKARAC MX-270、NIKARAC MX-279、NIKARAC MW-100LM、NIKARAC MX-750LM（以上為Sanwa Chemical Co.,Ltd.製造）等。As other crosslinking agents, commercially available products can also be used, and preferred commercially available products include 46DMOC, 46DMOEP (manufactured by ASAHI YUKIZAI CORPORATION above), DML-PC, DML-PEP, DML-OC, DML- OEP, DML-34X, DML-PTBP, DML-PCHP, DML-OCHP, DML-PFP, DML-PSBP, DML-POP, DML-MBOC, DML-MBPC, DML-MTrisPC, DML-BisOC-Z, DML- BisOCHP-Z, DML-BPC, DMLBisOC-P, DMOM-PC, DMOM-PTBP, DMOM-MBPC, TriML-P, TriML-35XL, TML-HQ, TML-BP, TML-pp-BPF, TML-BPE, TML-BPA, TML-BPAF, TML-BPAP, TMOM-BP, TMOM-BPE, TMOM-BPA, TMOM-BPAF, TMOM-BPAP, HML-TPPHBA, HML-TPHAP, HMOM-TPPHBA, HMOM-TPHAP (the above are Honshu Chemical Industry Co., Ltd.), NIKARAC (registered trademark, the same below) MX-290, NIKARAC MX-280, NIKARAC MX-270, NIKARAC MX-279, NIKARAC MW-100LM, NIKARAC MX-750LM (above Sanwa Chemical Co., Ltd.), etc.

又，本發明的樹脂組成物包含選自包括環氧化合物、氧雜環丁烷化合物及苯并㗁𠯤化合物之群組中的至少一種化合物作為其他交聯劑亦較佳。Furthermore, it is also preferable that the resin composition of the present invention contains at least one compound selected from the group consisting of epoxy compounds, oxetane compounds, and benzodiazepine compounds as other crosslinking agents.

-環氧化合物（具有環氧基之化合物）- 作為環氧化合物，在1個分子中具有2個以上的環氧基之化合物為較佳。環氧基在200℃以下進行交聯反應，且不產生源自交聯之脫水反應，因此不易產生膜收縮。因此，含有環氧化合物對於本發明的樹脂組成物的低溫硬化及翹曲的抑制是有效的。 -Epoxy compounds (compounds with epoxy groups)- As an epoxy compound, the compound which has 2 or more epoxy groups in 1 molecule is preferable. The epoxy group undergoes cross-linking reaction below 200°C, and does not produce dehydration reaction from cross-linking, so film shrinkage is not easy to occur. Therefore, containing an epoxy compound is effective for the low-temperature hardening of the resin composition of this invention, and suppression of warpage.

環氧化合物含有聚環氧乙烷基為較佳。藉此，彈性模數進一步降低，並且能夠抑制翹曲。聚環氧乙烷基係指環氧乙烷的重複單元數為2以上者，重複單元數係2～15為較佳。The epoxy compound preferably contains a polyethylene oxide group. Thereby, the modulus of elasticity is further reduced, and warpage can be suppressed. The polyethylene oxide group refers to those having 2 or more repeating units of ethylene oxide, preferably 2-15 repeating units.

作為環氧化合物的例子，能夠舉出雙酚A型環氧樹脂；雙酚F型環氧樹脂；丙二醇二縮水甘油醚、新戊二醇二縮水甘油醚、乙二醇二縮水甘油醚、丁二醇二縮水甘油醚、六亞甲基二醇二縮水甘油醚、三羥甲基丙烷三縮水甘油醚等伸烷基二醇型環氧樹脂或多元醇烴型環氧樹脂；聚丙二醇二縮水甘油醚等聚伸烷基二醇型環氧樹脂；聚甲基（縮水甘油氧基丙基）矽氧烷等含有環氧基之矽酮等，但並不限定於該等。具體而言，可以舉出EPICLON（註冊商標）850-S、EPICLON（註冊商標）HP-4032、EPICLON（註冊商標）HP-7200、EPICLON（註冊商標）HP-820、EPICLON（註冊商標）HP-4700、EPICLON（註冊商標）HP-4770、EPICLON（註冊商標）EXA-830LVP、EPICLON（註冊商標）EXA-8183、EPICLON（註冊商標）EXA-8169、EPICLON（註冊商標）N-660、EPICLON（註冊商標）N-665-EXP-S、EPICLON（註冊商標）N-740（以上為產品名稱，DIC Corporation製造）、Rika Resin（註冊商標）BEO-20E、Rika Resin（註冊商標）BEO-60E、Rika Resin（註冊商標）HBE-100、Rika Resin（註冊商標）DME-100、Rika Resin（註冊商標）L-200（產品名稱，New Japan Chemical Co.,Ltd.製造）、EP-4003S、EP-4000S、EP-4088S、EP-3950S（以上為產品名稱，ADEKA CORPORATION製造）、CELLOXIDE（註冊商標）2021P、CELLOXIDE（註冊商標）2081、CELLOXIDE（註冊商標）2000、EHPE3150、EPOLEAD（註冊商標）GT401、EPOLEAD（註冊商標）PB4700、EPOLEAD（註冊商標）PB3600（以上為產品名稱，Daicel Corporation製造）、NC-3000、NC-3000-L、NC-3000-H、NC-3000-FH-75M、NC-3100、CER-3000-L、NC-2000-L、XD-1000、NC-7000L、NC-7300L、EPPN-501H、EPPN-501HY、EPPN-502H、EOCN-1020、EOCN-102S、EOCN-103S、EOCN-104S、CER-1020、EPPN-201、BREN-S、BREN-10S（以上為產品名稱，Nippon Kayaku Co.,Ltd.製造）等。又，亦可以較佳地使用以下化合物。Examples of epoxy compounds include bisphenol A type epoxy resin; bisphenol F type epoxy resin; propylene glycol diglycidyl ether, neopentyl glycol diglycidyl ether, ethylene glycol diglycidyl ether, butyl Diol diglycidyl ether, hexamethylene glycol diglycidyl ether, trimethylolpropane triglycidyl ether, etc., alkylene glycol type epoxy resin or polyol hydrocarbon type epoxy resin; polypropylene glycol diglycidyl ether Polyalkylene glycol-type epoxy resins such as glyceryl ether; silicones containing epoxy groups such as polymethyl(glycidyloxypropyl) siloxane, etc., but not limited to these. Specifically, EPICLON (registered trademark) 850-S, EPICLON (registered trademark) HP-4032, EPICLON (registered trademark) HP-7200, EPICLON (registered trademark) HP-820, EPICLON (registered trademark) HP- 4700, EPICLON (registered trademark) HP-4770, EPICLON (registered trademark) EXA-830LVP, EPICLON (registered trademark) EXA-8183, EPICLON (registered trademark) EXA-8169, EPICLON (registered trademark) N-660, EPICLON (registered trademark) Trademark) N-665-EXP-S, EPICLON (registered trademark) N-740 (the above are product names, manufactured by DIC Corporation), Rika Resin (registered trademark) BEO-20E, Rika Resin (registered trademark) BEO-60E, Rika Resin (registered trademark) HBE-100, Rika Resin (registered trademark) DME-100, Rika Resin (registered trademark) L-200 (product name, manufactured by New Japan Chemical Co., Ltd.), EP-4003S, EP-4000S , EP-4088S, EP-3950S (the above are product names, manufactured by ADEKA CORPORATION), CELLOXIDE (registered trademark) 2021P, CELLOXIDE (registered trademark) 2081, CELLOXIDE (registered trademark) 2000, EHPE3150, EPOLEAD (registered trademark) GT401, EPOLEAD (registered trademark) PB4700, EPOLEAD (registered trademark) PB3600 (the above are product names, manufactured by Daicel Corporation), NC-3000, NC-3000-L, NC-3000-H, NC-3000-FH-75M, NC-3100 , CER-3000-L, NC-2000-L, XD-1000, NC-7000L, NC-7300L, EPPN-501H, EPPN-501HY, EPPN-502H, EOCN-1020, EOCN-102S, EOCN-103S, EOCN -104S, CER-1020, EPPN-201, BREN-S, BREN-10S (the above are product names, manufactured by Nippon Kayaku Co., Ltd.), etc. Moreover, the following compounds can also be preferably used.

[化學式32]

Figure 02_image063
[chemical formula 32]
Figure 02_image063

式中，n係1～5的整數，m係1～20的整數。In the formula, n is an integer of 1-5, and m is an integer of 1-20.

在上述結構中，從兼顧提高耐熱性和伸長率之觀點考慮，n係1～2，且m係3～7為較佳。Among the above-mentioned structures, from the standpoint of improving both heat resistance and elongation, n-systems 1-2 and m-systems 3-7 are preferable.

-氧雜環丁烷化合物（具有氧雜環丁基之化合物）- 作為氧雜環丁烷化合物，能夠舉出在一分子中具有2個以上的氧雜環丁烷環之化合物、3-乙基-3-羥甲氧雜環丁烷、1,4-雙{[（3-乙基-3-氧雜環丁基）甲氧基]甲基}苯、3-乙基-3-（2-乙基己基甲基）氧雜環丁烷、1,4-苯二羧酸-雙[（3-乙基-3-氧雜環丁基）甲基]酯等。作為具體例，能夠較佳地使用TOAGOSEI CO.,LTD.製造之ARON OXETANE系列（例如，OXT-121、OXT-221），該等可以單獨使用或者混合2種以上。 -Oxetane compounds (compounds having an oxetane group)- Examples of the oxetane compound include compounds having two or more oxetane rings in one molecule, 3-ethyl-3-hydroxymethoxetane, 1,4-bis{ [(3-Ethyl-3-oxetanyl)methoxy]methyl}benzene, 3-ethyl-3-(2-ethylhexylmethyl)oxetane, 1,4- Benzene dicarboxylic acid-bis[(3-ethyl-3-oxetanyl)methyl]ester, etc. As a specific example, ARON OXETANE series manufactured by TOAGOSEI CO., LTD. (for example, OXT-121, OXT-221) can be preferably used, and these can be used alone or in combination of two or more.

-苯并㗁𠯤化合物（具有苯并㗁𠯤基之化合物）- 苯并㗁𠯤化合物由於源自開環加成反應之交聯反應而在硬化時不產生脫氣，且進一步減少熱收縮而抑制產生翹曲，因此為較佳。 -Benzo 㗁 𠯤 compounds (compounds with benzo 㗁 𠯤 group)- The benzodiazepine compound is preferable because it does not generate outgassing during hardening due to a crosslinking reaction derived from a ring-opening addition reaction, and further reduces heat shrinkage to suppress warpage.

作為苯并㗁𠯤化合物的較佳例，可以舉出P-d型苯并㗁𠯤、F-a型苯并㗁𠯤（以上為產品名稱，SHIKOKU CHEMICALS CORPORATION製造）、多羥基苯乙烯樹脂的苯并㗁𠯤加成物、苯酚酚醛清漆型二氫苯并㗁𠯤化合物。該等可以單獨使用，或者可以混合2種以上。Preferable examples of benzophenone compounds include P-d type benzophenone, F-a type benzophenone (the above are product names, manufactured by SHIKOKU CHEMICALS CORPORATION), polyhydroxystyrene resin benzophenoxide Resultant, phenol novolak type dihydrobenzo 㗁 𠯤 compound. These can be used individually or in mixture of 2 or more types.

其他交聯劑的含量相對於從本發明的樹脂組成物的總固體成分中去除了填充劑之總質量，係0.1～30質量%為較佳，0.1～20質量%為更佳，0.5～15質量%為進一步較佳，1.0～10質量%為特佳。其他交聯劑可以僅含有一種，亦可以含有2種以上。當含有2種以上其他交聯劑時，其合計在上述範圍內為較佳。The content of other crosslinking agents is preferably 0.1 to 30% by mass, more preferably 0.1 to 20% by mass, and 0.5 to 15% by mass relative to the total mass of the total solids of the resin composition of the present invention except the filler. The mass % is still more preferable, and 1.0-10 mass % is especially preferable. Other crosslinking agents may contain only 1 type, and may contain 2 or more types. When two or more other crosslinking agents are contained, it is preferable that the total thereof is within the above range.

〔聚合起始劑〕 本發明的樹脂組成物包含能夠藉由光及/或熱而引發聚合之聚合起始劑為較佳。尤其包含熱聚合起始劑為較佳。 〔polymerization initiator〕 The resin composition of the present invention preferably includes a polymerization initiator capable of initiating polymerization by light and/or heat. In particular, it is preferable to include a thermal polymerization initiator.

-熱聚合起始劑- 本發明之樹脂組成物包含熱聚合起始劑亦較佳。 作為熱聚合起始劑，能夠依據聚合性化合物的種類而選擇，但熱自由基聚合起始劑為較佳。熱自由基聚合起始劑係藉由熱能而產生自由基來引發或促進具有聚合性之化合物的聚合反應之化合物。 又，上述光聚合起始劑亦有時具有藉由熱而引發聚合之功能，從而有時能夠作為熱聚合起始劑而添加。 -Thermal polymerization initiator- It is also preferable that the resin composition of the present invention contains a thermal polymerization initiator. As a thermal polymerization initiator, it can be selected according to the kind of polymerizable compound, but a thermal radical polymerization initiator is preferable. Thermal free radical polymerization initiators are compounds that generate free radicals by thermal energy to initiate or accelerate the polymerization reaction of polymerizable compounds. Moreover, the said photoinitiator may also have the function of initiating polymerization by heat, and may be added as a thermal polymerization initiator.

作為熱聚合起始劑，可以舉出公知的偶氮系化合物、公知的過氧化物系化合物等。作為偶氮系化合物，能夠舉出雙偶氮系化合物。偶氮系化合物可以係具有氰基之化合物，亦可以係不具有氰基之化合物。作為過氧化物系化合物，能夠舉出過氧化酮、過氧化縮酮、過氧化氫、過氧化二烷、過氧化二醯、過氧化二碳酸酯、過氧化酯等。 作為熱聚合起始劑，亦能夠使用市售品，可以舉出FUJIFILM Wako Pure Chemical Corporation製造之V-40、V-601、VF-096、NOF CORPORATION製造之PERHEXIL O、PERHEXIL D、PERHEXIL I、PERHEXA 25O、PERHEXA 25Z、PERCUMYL D、PERCUMYL D-40、PERCUMYL D-40MB、PERCUMYL H、PERCUMYL P、PERCUMYL ND等。 又，作為熱自由基聚合起始劑，具體而言，可以舉出日本特開2008-063554號公報的0074～0118段中所記載之化合物，該內容被編入本說明書中。 Examples of the thermal polymerization initiator include known azo compounds, known peroxide compounds, and the like. Examples of the azo compound include disazo compounds. The azo compound may be a compound having a cyano group or a compound not having a cyano group. Examples of peroxide-based compounds include ketone peroxide, peroxyketal, hydrogen peroxide, dioxane peroxide, diacyl peroxide, peroxydicarbonate, peroxyester, and the like. Commercially available products can also be used as the thermal polymerization initiator, and examples thereof include V-40, V-601, VF-096 manufactured by FUJIFILM Wako Pure Chemical Corporation, and PERHEXIL O, PERHEXIL D, PERHEXIL I, and PERHEXA manufactured by NOF CORPORATION. 25O, PERHEXA 25Z, PERCUMYL D, PERCUMYL D-40, PERCUMYL D-40MB, PERCUMYL H, PERCUMYL P, PERCUMYL ND, etc. Moreover, as a thermal radical polymerization initiator, the compound described in paragraph 0074-0118 of Unexamined-Japanese-Patent No. 2008-063554 is mentioned specifically, The content is incorporated in this specification.

作為樹脂組成物中的熱聚合起始劑的含量，相對於從組成物的總固體成分中去除了填充劑之總質量，係0.05質量%以上10質量%以下為較佳，0.1質量%以上10質量%以下為更佳，0.1質量%以上5質量%以下為進一步較佳，0.5質量%以上3質量%以下為特佳。 樹脂組成物（尤其，第2樹脂組成物）可以單獨包含1種熱聚合起始劑，亦可以包含2種以上。包含2種以上之情況下，其合計量在上述範圍內為較佳。 The content of the thermal polymerization initiator in the resin composition is preferably 0.05% by mass to 10% by mass, and 0.1% by mass to 10% by mass relative to the total mass of the total solid content of the composition except the filler. Mass % or less is more preferable, 0.1 mass % or more and 5 mass % or less are still more preferable, 0.5 mass % or more and 3 mass % or less are especially preferable. The resin composition (especially, the second resin composition) may contain one type of thermal polymerization initiator alone, or may contain two or more types. When containing 2 or more types, it is preferable that the total amount is in the said range.

-光聚合起始劑- 光聚合起始劑係光自由基聚合起始劑為較佳。作為光自由基聚合起始劑並沒有特別限制，能夠從公知的光自由基聚合起始劑中適當地選擇。例如，對紫外線區域至可見區域的光線具有感光性之光自由基聚合起始劑為較佳。又，可以為與經光激發之敏化劑產生一些作用並生成活性自由基之活性劑。 -Photopolymerization Initiator- The photopolymerization initiator is preferably a photoradical polymerization initiator. It does not specifically limit as a photoradical polymerization initiator, It can select suitably from well-known photoradical polymerization initiators. For example, a photoradical polymerization initiator having photosensitivity to rays from an ultraviolet region to a visible region is preferable. In addition, it may be an active agent that has some interaction with the photoexcited sensitizer to generate active radicals.

光自由基聚合起始劑含有至少一種在波長約240～800nm（較佳為330～500nm）的範圍內具有至少約50L·mol -1·cm -1的莫耳吸光係數之化合物為較佳。化合物的莫耳吸光係數能夠使用公知的方法進行測量。例如，藉由紫外可見分光光度計（Varian公司製造Cary-5 spectrophotometer），並使用乙酸乙酯溶劑而於0.01g/L的濃度下進行測量為較佳。 The photoradical polymerization initiator preferably contains at least one compound having a molar absorption coefficient of at least about 50 L·mol -1 ·cm -1 in the wavelength range of about 240-800 nm (preferably 330-500 nm). The molar absorptivity of a compound can be measured using a known method. For example, it is preferable to perform measurement at a concentration of 0.01 g/L with an ultraviolet-visible spectrophotometer (Cary-5 spectrophotometer manufactured by Varian Corporation) using ethyl acetate solvent.

作為光自由基聚合起始劑，能夠任意地使用公知的化合物。例如，可以舉出鹵化烴衍生物（例如，具有三𠯤骨架之化合物、具有㗁二唑骨架之化合物、具有三鹵甲基之化合物等）、醯基氧化膦等醯基膦化合物、六芳基聯咪唑、肟衍生物等肟化合物、有機過氧化物、硫化合物、酮化合物、芳香族鎓鹽、酮肟醚、胺基苯乙酮等α-胺基酮化合物、羥基苯乙酮等α-羥基酮化合物、偶氮系化合物、疊氮化合物、茂金屬化合物、有機硼化合物、鐵芳烴錯合物等。關於該等的詳細內容，能夠參閱日本特開2016-027357號公報的0165～0182段、國際公開第2015/199219號的0138～0151段的記載，該內容編入本說明書中。又，可以舉出日本特開2014-130173號公報的0065～0111段、日本專利第6301489號公報中所記載之化合物、MATERIAL STAGE 37～60p，vol.19，No.3，2019中所記載之過氧化物系光聚合起始劑、國際公開第2018/221177號中所記載之光聚合起始劑、國際公開第2018/110179號中所記載之光聚合起始劑、日本特開2019-043864號公報中所記載之光聚合起始劑、日本特開2019-044030號公報中所記載之光聚合起始劑、日本特開2019-167313號公報中所記載之過氧化物系起始劑，該等內容亦被編入本說明書中。As the photoradical polymerization initiator, any known compound can be used arbitrarily. For example, halogenated hydrocarbon derivatives (for example, compounds having a trioxadiazole skeleton, compounds having a oxadiazole skeleton, compounds having a trihalomethyl group, etc.), acylphosphine compounds such as acylphosphine oxide, hexaaryl Biimidazole, oxime derivatives and other oxime compounds, organic peroxides, sulfur compounds, ketone compounds, aromatic onium salts, ketoxime ethers, aminoacetophenone and other α-amino ketone compounds, hydroxyacetophenone and other α- Hydroxy ketone compounds, azo compounds, azide compounds, metallocene compounds, organoboron compounds, iron arene complexes, etc. For such details, reference can be made to the descriptions in paragraphs 0165 to 0182 of JP-A-2016-027357 and descriptions in paragraphs 0138 to 0151 of International Publication No. 2015/199219, which are incorporated in this specification. In addition, examples include paragraphs 0065 to 0111 of JP-A-2014-130173, compounds described in JP-A-6301489, and those described in MATERIAL STAGE 37-60p, vol.19, No.3, 2019. Peroxide-based photopolymerization initiator, photopolymerization initiator described in International Publication No. 2018/221177, photopolymerization initiator described in International Publication No. 2018/110179, Japanese Patent Laid-Open No. 2019-043864 The photopolymerization initiator described in the Publication No. 2019-044030, the photopolymerization initiator described in the Japanese Patent Application Publication No. 2019-044030, and the peroxide-based initiator described in the Japanese Patent Application Publication No. 2019-167313, These contents are also incorporated into this manual.

作為酮化合物，例如，可以例示出日本特開2015-087611號公報的0087段中記載之化合物，該內容編入本說明書中。在市售品中，亦可以較佳地使用KAYACURE DETX-S（Nippon Kayaku Co.,Ltd.製造）。As the ketone compound, for example, compounds described in paragraph 0087 of JP-A-2015-087611 can be exemplified, and the content is incorporated in this specification. Among commercially available products, KAYACURE DETX-S (manufactured by Nippon Kayaku Co., Ltd.) can also be preferably used.

在本發明的一實施態樣中，作為光自由基聚合起始劑，能夠較佳地使用羥基苯乙酮化合物、胺基苯乙酮化合物及醯基膦化合物。更具體而言，例如能夠使用日本特開平10-291969號公報中所記載之胺基苯乙酮系起始劑、日本專利第4225898號中所記載之醯基氧化膦系起始劑，該內容被編入本說明書中。In one embodiment of the present invention, as photoradical polymerization initiators, hydroxyacetophenone compounds, aminoacetophenone compounds, and acylphosphine compounds can be preferably used. More specifically, for example, an aminoacetophenone-based initiator described in JP-A-10-291969 and an acylphosphine oxide-based initiator described in Japanese Patent No. 4225898 can be used. are included in this manual.

作為α-羥基酮系起始劑，能夠使用Omnirad 184、Omnirad 1173、Omnirad 2959、Omnirad 127（以上為IGM Resins B.V.公司製造）、IRGACURE 184（IRGACURE為註冊商標）、DAROCUR 1173、IRGACURE 500、IRGACURE-2959、IRGACURE 127（產品名稱：均為BASF公司製造）。As the α-hydroxy ketone initiator, Omnirad 184, Omnirad 1173, Omnirad 2959, Omnirad 127 (the above are manufactured by IGM Resins B.V.), IRGACURE 184 (IRGACURE is a registered trademark), DAROCUR 1173, IRGACURE 500, IRGACURE- 2959, IRGACURE 127 (product name: both manufactured by BASF).

作為α-胺基酮系起始劑，能夠使用Omnirad 907、Omnirad 369、Omnirad 369E、Omnirad 379EG（以上為IGM Resins B.V.公司製造）、IRGACURE 907、IRGACURE 369及IRGACURE 379（產品名稱：均為BASF公司製造）。As the α-aminoketone-based initiator, Omnirad 907, Omnirad 369, Omnirad 369E, Omnirad 379EG (manufactured by IGM Resins B.V.), IRGACURE 907, IRGACURE 369, and IRGACURE 379 (product names: all from BASF) can be used. manufacture).

作為胺基苯乙酮系起始劑，亦能夠使用極大吸收波長與365nm或405nm等波長光源匹配之日本特開2009-191179號公報中所記載之化合物，該內容被編入本說明書中。As the aminoacetophenone-based initiator, compounds described in Japanese Patent Application Laid-Open No. 2009-191179 whose maximum absorption wavelength matches a light source with a wavelength of 365 nm or 405 nm can also be used, and the content is incorporated in this specification.

作為醯基氧化膦系起始劑，可以舉出2,4,6-三甲基苯甲醯基-二苯基-氧化膦等。又，能夠使用Omnirad 819、Omnirad TPO（以上為IGM Resins B.V.公司製造）、IRGACURE-819或IRGACURE-TPO（產品名稱：均為BASF公司製造）。Examples of the acylphosphine oxide-based initiator include 2,4,6-trimethylbenzoyl-diphenyl-phosphine oxide and the like. In addition, Omnirad 819, Omnirad TPO (the above are manufactured by IGM Resins B.V.), IRGACURE-819, or IRGACURE-TPO (product names: both are manufactured by BASF Corporation) can be used.

作為茂金屬化合物，可以例示出IRGACURE-784、IRGACURE-784EG（均為BASF公司製造）、Keycure VIS 813（King Brother Chem公司製造）等。Examples of the metallocene compound include IRGACURE-784, IRGACURE-784EG (both manufactured by BASF), Keycure VIS 813 (manufactured by King Brother Chem), and the like.

作為光自由基聚合起始劑，可以更佳地舉出肟化合物。藉由使用肟化合物，能夠進一步有效地提高曝光寬容度。肟化合物中，曝光寬容度（曝光餘量）較廣，且還作為光硬化促進劑而發揮功能，因此特佳。More preferably, an oxime compound is mentioned as a photoradical polymerization initiator. By using an oxime compound, exposure latitude can be improved more effectively. Among the oxime compounds, since the exposure latitude (exposure margin) is wide and also functions as a photocuring accelerator, it is particularly preferable.

作為肟化合物的具體例，可以舉出日本特開2001-233842號公報中所記載之化合物、日本特開2000-080068號公報中所記載之化合物、日本特開2006-342166號公報中所記載之化合物、J.C.S.Perkin II（1979年，第1653-1660頁）中所記載之化合物、J.C.S.Perkin II（1979年，第156-162頁）中所記載之化合物、Journal of Photopolymer Science and Technology（1995年，第202-232頁）中所記載之化合物、日本特開2000-066385號公報中所記載之化合物、日本特表2004-534797號公報中所記載之化合物、日本特開2017-019766號公報中所記載之化合物、日本專利第6065596號公報中所記載之化合物、國際公開第2015/152153號中所記載之化合物、國際公開第2017/051680號中所記載之化合物、日本特開2017-198865號公報中所記載之化合物、國際公開第2017/164127號的段落號0025～0038中所記載之化合物、國際公開第2013/167515號中所記載之化合物等，該內容被編入本說明書中。Specific examples of oxime compounds include compounds described in JP-A-2001-233842, compounds described in JP-A-2000-080068, and compounds described in JP-A-2006-342166. Compounds, Compounds described in J.C.S.Perkin II (1979, pp. 1653-1660), Compounds described in J.C.S.Perkin II (1979, pp. 156-162), Journal of Photopolymer Science and Technology (1995, pp. 202-232), the compound described in JP-A-2000-066385, the compound described in JP-A-2004-534797, the compound described in JP-A-2017-019766 Compounds described, compounds described in Japanese Patent No. 6065596, compounds described in International Publication No. 2015/152153, compounds described in International Publication No. 2017/051680, Japanese Patent Application Publication No. 2017-198865 The compounds described in, the compounds described in paragraphs 0025 to 0038 of International Publication No. 2017/164127, the compounds described in International Publication No. 2013/167515, etc. are incorporated in this specification.

作為較佳的肟化合物，例如，可以舉出下述結構的化合物或3-（苯甲醯氧基（亞胺基））丁烷-2-酮、3-（乙醯氧基（亞胺基））丁烷-2-酮、3-（丙醯氧基（亞胺基））丁烷-2-酮、2-（乙醯氧基（亞胺基））戊烷-3-酮、2-（乙醯氧基（亞胺基））-1-苯基丙烷-1-酮、2-（苯甲醯氧基（亞胺基））-1-苯基丙烷-1-酮、3-（（4-甲苯磺醯氧基）亞胺基）丁烷-2-酮及2-（乙氧基羰氧基（亞胺基））-1-苯基丙烷-1-酮等。在本發明的樹脂組成物中，尤其使用肟化合物（肟系的光自由基聚合起始劑）作為光自由基聚合起始劑為較佳。肟系的光自由基聚合起始劑在分子內具有＞C=N-O-C（=O）-的連接基。As preferred oxime compounds, for example, compounds of the following structure or 3-(benzoyloxy(imino))butan-2-one, 3-(acetyloxy(imino) )) butan-2-one, 3-(propionyloxy(imino))butan-2-one, 2-(acetyloxy(imino))pentan-3-one, 2 -(Acetyloxy(imino))-1-phenylpropan-1-one, 2-(Benzyloxy(imino))-1-phenylpropan-1-one, 3- ((4-toluenesulfonyloxy)imino)butan-2-one and 2-(ethoxycarbonyloxy(imino))-1-phenylpropan-1-one, etc. In the resin composition of the present invention, it is particularly preferable to use an oxime compound (an oxime-based radical photopolymerization initiator) as a radical photopolymerization initiator. The oxime-based photoradical polymerization initiator has a >C=N-O-C(=O)- linking group in the molecule.

[化學式33]

Figure 02_image065
[chemical formula 33]
Figure 02_image065

在市售品中，亦可以較佳地使用IRGACURE OXE 01、IRGACURE OXE 02、IRGACURE OXE 03、IRGACURE OXE 04（以上為BASF公司製造）、Adeka Optomer N-1919（ADEKA CORPORATION製造，日本特開2012-014052號公報中所記載之光自由基聚合起始劑2）。又，亦能夠使用TR-PBG-304、TR-PBG-305（Changzhou Tronly New Electronic Materials CO.,LTD.製造）、ADEKA ARKLS NCI-730、NCI-831及ADEKA ARKLS NCI-930（ADEKA CORPORATION製造）。又，能夠使用DFI-091（DAITO CHEMIX Co.,Ltd.製造）、SpeedCure PDO（SARTOMER ARKEMA製造）。又，亦能夠使用下述結構的肟化合物。 [化學式34]

Figure 02_image067
Among commercially available products, IRGACURE OXE 01, IRGACURE OXE 02, IRGACURE OXE 03, IRGACURE OXE 04 (the above are manufactured by BASF Corporation), Adeka Optomer N-1919 (manufactured by ADEKA CORPORATION, JP 2012- Photoradical polymerization initiator 2) described in Gazette No. 014052). In addition, TR-PBG-304, TR-PBG-305 (manufactured by Changzhou Tronly New Electronic Materials CO., LTD.), ADEKA ARKLS NCI-730, NCI-831, and ADEKA ARKLS NCI-930 (manufactured by ADEKA CORPORATION) can also be used. . Also, DFI-091 (manufactured by DAITO CHEMIX Co., Ltd.) and SpeedCure PDO (manufactured by Sartomer Arkema) can be used. Moreover, the oxime compound of the following structures can also be used. [chemical formula 34]
Figure 02_image067

作為光自由基聚合起始劑，亦能夠使用具有茀環之肟化合物。作為具有茀環之肟化合物的具體例，可以舉出日本特開2014-137466號公報中所記載之化合物、日本專利06636081號中所記載之化合物，該內容被編入本說明書中。An oxime compound having an oxene ring can also be used as a photoradical polymerization initiator. Specific examples of the oxime compound having an oxene ring include compounds described in JP-A-2014-137466 and compounds described in JP-A-06636081, the contents of which are incorporated herein.

作為光自由基聚合起始劑，亦能夠使用具有咔唑環的至少1個苯環成為萘環之骨架之肟化合物。作為這種肟化合物的具體例，可以舉出國際公開第2013/083505號中所記載之化合物，該內容被編入本說明書中。As a photoradical polymerization initiator, the oxime compound which has at least one benzene ring which has a carbazole ring as a skeleton of a naphthalene ring can also be used. Specific examples of such oxime compounds include compounds described in International Publication No. 2013/083505, and the content is incorporated in this specification.

亦能夠使用具有氟原子之肟化合物。作為這種肟化合物的具體例，可以舉出日本特開2010-262028號公報中所記載之化合物、日本特表2014-500852號公報的0345段中所記載之化合物24、36～40、日本特開2013-164471號公報的0101段中所記載之化合物（C-3）等，該內容被編入本說明書中。Oxime compounds having fluorine atoms can also be used. Specific examples of such oxime compounds include compounds described in JP 2010-262028 A, compounds 24, 36 to 40 described in paragraph 0345 of JP 2014-500852 A, JP Compound (C-3) and the like described in Paragraph 0101 of Publication No. 2013-164471 are incorporated into this specification.

作為光聚合起始劑，亦能夠使用具有硝基之肟化合物。具有硝基之肟化合物設為二聚體亦較佳。作為具有硝基之肟化合物的具體例，可以舉出日本特開2013-114249號公報的段落號0031～0047、日本特開2014-137466號公報的段落號0008～0012、0070～0079中所記載之化合物、日本專利4223071號公報的段落號0007～0025中所記載之化合物，該內容被編入本說明書中。又，作為具有硝基之肟化合物，亦可以舉出ADEKA ARKLS NCI-831（ADEKA CORPORATION製造）。An oxime compound having a nitro group can also be used as a photopolymerization initiator. It is also preferred that the oxime compound having a nitro group be a dimer. Specific examples of oxime compounds having a nitro group include those described in paragraphs 0031 to 0047 of JP-A-2013-114249 and paragraphs 0008-0012 and 0070-0079 of JP-A-2014-137466 The compounds described in paragraphs 0007 to 0025 of Japanese Patent No. 4223071 are incorporated in this specification. Moreover, ADEKA ARKLS NCI-831 (manufactured by ADEKA CORPORATION) is also mentioned as an oxime compound which has a nitro group.

作為光自由基聚合起始劑，亦能夠使用具有苯并呋喃骨架之肟化合物。作為具體例，可以舉出國際公開第2015/036910號中所記載之OE-01～OE-75。An oxime compound having a benzofuran skeleton can also be used as a photoradical polymerization initiator. Specific examples include OE-01 to OE-75 described in International Publication No. 2015/036910.

作為光自由基聚合起始劑，亦能夠使用在咔唑骨架上鍵結有具有羥基之取代基之肟化合物。作為這種光聚合起始劑，可以舉出國際公開第2019/088055號中所記載之化合物等，該內容被編入本說明書中。An oxime compound in which a substituent having a hydroxyl group is bonded to the carbazole skeleton can also be used as the photoradical polymerization initiator. Examples of such a photopolymerization initiator include compounds described in International Publication No. 2019/088055, and the contents thereof are incorporated in this specification.

作為光聚合起始劑，亦能夠使用具有向芳香族環中導入了拉電子基團之芳香族環基Ar OX1之肟化合物（以下，亦稱為肟化合物OX）。作為上述芳香族環基Ar OX1所具有之拉電子基團，可以舉出醯基、硝基、三氟甲基、烷基亞磺醯基、芳基亞磺醯基、烷基磺醯基、芳基磺醯基、氰基，較佳為醯基及硝基，出於容易形成耐光性優異之膜之原因，醯基為更佳，苯甲醯基為進一步較佳。苯甲醯基可以具有取代基。作為取代基，鹵素原子、氰基、硝基、羥基、烷基、烷氧基、芳基、芳氧基、雜環基、雜環氧基、烯基、烷基硫基、芳基硫基、醯基或胺基為較佳，烷基、烷氧基、芳基、芳氧基、雜環氧基、烷基硫基、芳基硫基或胺基為更佳，烷氧基、烷基硫基或胺基為進一步較佳。 As the photopolymerization initiator, an oxime compound (hereinafter also referred to as an oxime compound OX) having an aromatic ring group Ar OX1 having an electron-withdrawing group introduced into an aromatic ring can also be used. Examples of the electron-withdrawing group included in the aromatic ring group Ar OX1 include an acyl group, a nitro group, a trifluoromethyl group, an alkylsulfinyl group, an arylsulfinyl group, an alkylsulfonyl group, The arylsulfonyl group and the cyano group are preferably an acyl group and a nitro group, and the acyl group is more preferable, and the benzoyl group is still more preferable because it is easy to form a film having excellent light resistance. The benzoyl group may have a substituent. As a substituent, a halogen atom, a cyano group, a nitro group, a hydroxyl group, an alkyl group, an alkoxy group, an aryl group, an aryloxy group, a heterocyclic group, a heterocyclic epoxy group, an alkenyl group, an alkylthio group, an arylthio group , acyl group or amino group is preferred, alkyl group, alkoxy group, aryl group, aryloxy group, heterocyclic epoxy group, alkylthio group, arylthio group or amino group are more preferred, alkoxy group, alkyl group A thio group or an amino group is further preferred.

肟化合物OX係選自式（OX1）所表示之化合物及式（OX2）所表示之化合物中的至少一種為較佳，式（OX2）所表示之化合物為更佳。 [化學式35]

Figure 02_image069
式中，R X1表示烷基、烯基、烷氧基、芳基、芳氧基、雜環基、雜環氧基、烷基氫硫基、芳基氫硫基、烷基亞磺醯基、芳基亞磺醯基、烷基磺醯基、芳基磺醯基、醯基、醯氧基、胺基、亞膦醯基（phosphinoyl gruop）、胺甲醯基或胺磺醯基， R X2表示烷基、烯基、烷氧基、芳基、芳氧基、雜環基、雜環氧基、烷基氫硫基、芳基氫硫基、烷基亞磺醯基、芳基亞磺醯基、烷基磺醯基、芳基磺醯基、醯氧基或胺基， R X3～R X14分別獨立地表示氫原子或取代基； 其中，R X10～R X14中的至少一個為拉電子基團。 The oxime compound OX is preferably at least one selected from the compounds represented by the formula (OX1) and the compound represented by the formula (OX2), and the compound represented by the formula (OX2) is more preferable. [chemical formula 35]
Figure 02_image069
In the formula, R X1 represents an alkyl group, an alkenyl group, an alkoxyl group, an aryl group, an aryloxy group group, a heterocyclic group, a heterocyclic epoxy group group, an alkyl mercapto group, an aryl mercapto group, an alkyl sulfinyl group , arylsulfinyl, alkylsulfonyl, arylsulfonyl, acyl, acyloxy, amine, phosphinoyl group (phosphinoyl gruop), carbamoyl or sulfamoyl, R X2 represents an alkyl group, an alkenyl group, an alkoxy group, an aryl group, an aryloxy group, a heterocyclic group, a heterocyclic epoxy group, an alkyl mercapto group, an aryl mercapto group, an alkyl sulfinyl group, an aryl sulfide group Sulfonyl group, alkylsulfonyl group, arylsulfonyl group, acyloxy group or amino group, R X3 ~ R X14 independently represent a hydrogen atom or a substituent; wherein, at least one of R X10 ~ R X14 is Electron pulling group.

上述式中，R X12係拉電子基團，且R X10、R X11、R X13、R X14係氫原子為較佳。 In the above formula, R X12 is an electron-withdrawing group, and R X10 , R X11 , R X13 , and R X14 are preferably hydrogen atoms.

作為肟化合物OX的具體例，可以舉出日本專利第4600600號公報的段落號0083～0105中所記載之化合物，該內容被編入本說明書中。Specific examples of the oxime compound OX include compounds described in paragraphs 0083 to 0105 of Japanese Patent No. 4600600, and the contents thereof are incorporated in the present specification.

作為最佳之肟化合物，可以舉出日本特開2007-269779號公報所示之具有特定取代基之肟化合物或日本特開2009-191061號公報所示之具有硫代芳基之肟化合物等，該內容被編入本說明書中。As the most suitable oxime compound, the oxime compound having a specific substituent shown in JP-A-2007-269779 or the oxime compound having a thioaryl group shown in JP-A-2009-191061 can be mentioned. This content is incorporated into this manual.

從曝光靈敏度的觀點考慮，光自由基聚合起始劑係選自包括三鹵甲基三𠯤化合物、苄基二甲基縮酮化合物、α-羥基酮化合物、α-胺基酮化合物、醯基膦化合物、氧化膦化合物、茂金屬化合物、肟化合物、三芳基咪唑二聚物、鎓鹽化合物、苯并噻唑化合物、二苯甲酮化合物、苯乙酮化合物及其衍生物、環戊二烯-本-鐵錯合物及其鹽、鹵甲基㗁二唑化合物、3-芳基取代香豆素化合物之群組中的化合物為較佳。From the viewpoint of exposure sensitivity, photoradical polymerization initiators are selected from the group consisting of trihalomethyl tristannium compounds, benzyl dimethyl ketal compounds, α-hydroxy ketone compounds, α-amino ketone compounds, acyl Phosphine compounds, phosphine oxide compounds, metallocene compounds, oxime compounds, triaryl imidazole dimers, onium salt compounds, benzothiazole compounds, benzophenone compounds, acetophenone compounds and their derivatives, cyclopentadiene- Compounds in the group of this-iron complexes and their salts, halomethyl oxadiazole compounds, and 3-aryl-substituted coumarin compounds are preferred.

進一步較佳之光自由基聚合起始劑係三鹵甲基三𠯤化合物、α-胺基酮化合物、醯基膦化合物、氧化膦化合物、茂金屬化合物、肟化合物、三芳基咪唑二聚物、鎓鹽化合物、二苯甲酮化合物、苯乙酮化合物，選自包括三鹵甲基三𠯤化合物、α-胺基酮化合物、茂金屬化合物、肟化合物、三芳基咪唑二聚物、二苯甲酮化合物之群組中的至少一種化合物為進一步較佳，使用茂金屬化合物或肟化合物為更進一步較佳。Further preferred photoradical polymerization initiators are trihalomethyl trisulfone compounds, α-aminoketone compounds, acylphosphine compounds, phosphine oxide compounds, metallocene compounds, oxime compounds, triaryl imidazole dimers, onium Salt compounds, benzophenone compounds, and acetophenone compounds, selected from the group consisting of trihalomethyl trisulfone compounds, α-aminoketone compounds, metallocene compounds, oxime compounds, triaryl imidazole dimers, benzophenone It is more preferable to use at least one compound in the group of compounds, and it is still more preferable to use a metallocene compound or an oxime compound.

又，光自由基聚合起始劑亦能夠使用二苯甲酮、N,N’-四甲基-4,4’-二胺基二苯甲酮（米其勒酮）等N,N’-四烷基-4,4’-二胺基二苯甲酮、2-苄基-2-二甲基胺基-1-（4-嗎啉基苯基）-丁酮-1,2-甲基-1-[4-（甲硫基）苯基]-2-嗎啉基-丙酮-1等芳香族酮、烷基蒽醌等與芳香環縮環之醌類、苯偶姻烷基醚等苯偶姻醚化合物、苯偶姻、烷基苯偶姻等苯偶姻化合物、苄基二甲基縮酮等苄基衍生物等。又，亦能夠使用由下述式（I）表示之化合物。In addition, as the photoradical polymerization initiator, N,N'- Tetraalkyl-4,4'-diaminobenzophenone, 2-benzyl-2-dimethylamino-1-(4-morpholinophenyl)-butanone-1,2-methanone Aromatic ketones such as base-1-[4-(methylthio)phenyl]-2-morpholino-acetone-1, quinones such as alkyl anthraquinones condensed with aromatic rings, benzoin alkyl ethers Benzoin ether compounds such as benzoin, benzoin compounds such as benzoin and alkyl benzoin, benzyl derivatives such as benzyl dimethyl ketal, etc. Moreover, the compound represented by following formula (I) can also be used.

[化學式36]

Figure 02_image071
[chemical formula 36]
Figure 02_image071

式（I）中，R I00係碳數1～20的烷基、被1個以上的氧原子中斷之碳數2～20的烷基、碳數1～12的烷氧基、苯基或碳數1～20的烷基、碳數1～12的烷氧基、鹵素原子、環戊基、環己基、碳數2～12的烯基、被1個以上的氧原子中斷之碳數2～18的烷基及被碳數1～4的烷基中的至少1個取代之苯基或聯苯基，R I01係式（II）所表示之基團或係與R I00相同之基團，R I02～R I04各自獨立地係碳數1～12的烷基、碳數1～12的烷氧基或鹵素原子。 In formula (I), R I00 is an alkyl group with 1 to 20 carbons, an alkyl group with 2 to 20 carbons interrupted by one or more oxygen atoms, an alkoxy group with 1 to 12 carbons, phenyl or carbon Alkyl with 1 to 20 carbons, alkoxy with 1 to 12 carbons, halogen atom, cyclopentyl, cyclohexyl, alkenyl with 2 to 12 carbons, 2 to 2 carbons interrupted by one or more oxygen atoms 18 alkyl and phenyl or biphenyl substituted by at least one of the alkyl groups with 1 to 4 carbons, R I01 is the group represented by formula (II) or the same group as R I00 , R I02 to R I04 are each independently an alkyl group having 1 to 12 carbons, an alkoxy group having 1 to 12 carbons, or a halogen atom.

[化學式37]

Figure 02_image073
[chemical formula 37]
Figure 02_image073

式中，R I05～R I07與上述式（I）的R I02～R I04相同。 In the formula, R I05 to R I07 are the same as R I02 to R I04 in the above formula (I).

又，光自由基聚合起始劑亦能夠使用國際公開第2015/125469號的0048～0055段中所記載之化合物，該內容被編入本說明書中。In addition, as the photoradical polymerization initiator, compounds described in paragraphs 0048 to 0055 of International Publication No. 2015/125469 can also be used, and the content is incorporated in this specification.

作為光自由基聚合起始劑，可以使用2官能或3官能以上的光自由基聚合起始劑。藉由使用這樣的光自由基聚合起始劑，由於光自由基聚合起始劑的1分子產生2個以上的自由基，因此可獲得良好的靈敏度。又，使用非對稱結構的化合物之情況下，結晶性下降而在溶劑等中之溶解性獲得提高，因此難以經時析出，從而能夠提高樹脂組成物的經時穩定性。作為2官能或3官能以上的光自由基聚合起始劑的具體例，可以舉出日本特表2010-527339號公報、日本特表2011-524436號公報、國際公開第2015/004565號、日本特表2016-532675號公報的段落號0407～0412、國際公開第2017/033680號的段落號0039～0055中所記載之肟化合物的二聚體、日本特表2013-522445號公報中所記載之化合物（E）及化合物（G）、國際公開第2016/034963號中所記載之Cmpd1～7、日本特表2017-523465號公報的段落號0007中所記載之肟酯類光起始劑、日本特開2017-167399號公報的段落號0020～0033中所記載之光起始劑、日本特開2017-151342號公報的段落號0017～0026中所記載之光聚合起始劑（A）、日本專利第6469669號公報中所記載之肟酯光起始劑等，該內容被編入本說明書中。As the radical photopolymerization initiator, a difunctional or trifunctional or more photoradical polymerization initiator can be used. By using such a radical photopolymerization initiator, since 1 molecule of a radical photopolymerization initiator generates 2 or more radicals, favorable sensitivity can be acquired. In addition, when a compound with an asymmetric structure is used, the crystallinity is lowered and the solubility in a solvent or the like is improved, so that it is difficult to precipitate over time, and the temporal stability of the resin composition can be improved. Specific examples of photoradical polymerization initiators with bifunctional or trifunctional or higher functions include JP 2010-527339 A, JP 2011-524436 A, International Publication No. 2015/004565, JP Dimers of oxime compounds described in paragraphs 0407 to 0412 of Table No. 2016-532675, paragraphs 0039 to 0055 of International Publication No. 2017/033680, and compounds described in Japanese Patent Application Publication No. 2013-522445 (E) and compound (G), Cmpd 1-7 described in International Publication No. 2016/034963, the oxime ester photoinitiator described in paragraph number 0007 of JP 2017-523465, JP Photoinitiator described in paragraphs 0020 to 0033 of JP-A-2017-167399, photoinitiator (A) described in paragraphs 0017-0026 of JP-A-2017-151342, Japanese patent The oxime ester photoinitiator etc. which are described in the 6469669 gazette are incorporated in this specification.

包含光聚合起始劑之情況下，其含量相對於從本發明的樹脂組成物的總固體成分中去除了填充劑之總質量，係0.1～30質量%為較佳，更佳為0.1～20質量%，進一步較佳為0.5～15質量%，更進一步較佳為1.0～10質量%。光聚合起始劑可以僅含有一種，亦可以含有2種以上。當含有2種以上光聚合起始劑時，其合計量在上述範圍內為較佳。 另外，光聚合起始劑有時還作為熱聚合起始劑發揮作用，因此有時藉由烘箱或加熱板等的加熱而進一步進行基於光聚合起始劑之交聯。 When a photopolymerization initiator is included, its content is preferably 0.1 to 30% by mass, more preferably 0.1 to 20% by mass, relative to the total mass of the resin composition of the present invention excluding the filler from the total solid content. % by mass is more preferably 0.5 to 15% by mass, still more preferably 1.0 to 10% by mass. A photoinitiator may contain only 1 type, and may contain 2 or more types. When containing 2 or more types of photoinitiators, it is preferable that the total amount exists in the said range. Moreover, since a photoinitiator may function also as a thermal polymerization initiator, the crosslinking by a photoinitiator may further progress by heating, such as an oven or a hot plate.

〔敏化劑〕 樹脂組成物可以包含敏化劑。敏化劑吸收特定的光化射線而成為電子激發狀態。成為電子激發狀態之敏化劑與熱自由基聚合起始劑、光自由基聚合起始劑等接觸而產生電子轉移、能量轉移、發熱等作用。藉此，熱自由基聚合起始劑、光自由基聚合起始劑發生化學變化而分解，並生成自由基、酸或鹼。 作為能夠使用之敏化劑，能夠使用二苯甲酮系、米其勒酮系、香豆素系、吡唑偶氮系、苯胺基偶氮系、三苯基甲烷系、蒽醌系、蒽系、蒽吡啶酮（anthrapyridone）系、亞苄基（benzylidene）系、氧雜菁（oxonol）系、吡唑并三唑偶氮系、吡啶酮偶氮系、花青系、啡噻𠯤系、吡咯并吡唑次甲基偶氮系、口山口星系、酞菁系、苯并吡喃系、靛藍系等的化合物。 作為敏化劑，例如可以舉出米其勒酮、4,4’-雙（二乙胺基）二苯甲酮、2，5-雙（4’-二乙胺基亞苄基）環戊烷、2,6-雙（4’-二乙胺基亞苄基）環己酮、2,6-雙（4’-二乙胺基亞苄基）-4-甲基環己酮、4,4’-雙（二甲基胺基）查耳酮、4,4’-雙（二乙胺基）查耳酮、對二甲基胺基苯亞烯丙基（cinnamylidene）二氫茚酮、對二甲基胺基亞苄基二氫茚酮、2-（對二甲基胺基苯基亞聯苯基）-苯并噻唑、2-（對二甲基胺基苯基亞乙烯基）苯并噻唑、2-（對二甲基胺基苯基亞乙烯基）異萘并噻唑、1,3-雙（4’-二甲基胺基亞苄基）丙酮、1,3-雙（4’-二乙胺基亞苄基）丙酮、3,3’-羰基-雙（7-二乙胺基香豆素）、3-乙醯基-7-二甲基胺基香豆素、3-乙氧基羰基-7-二甲基胺基香豆素、3-苄氧基羰基-7-二甲基胺基香豆素、3-甲氧基羰基-7-二乙胺基香豆素、3-乙氧基羰基-7-二乙胺基香豆素（7-（二乙胺基）香豆素-3-羧酸乙酯）、N-苯基-N’-乙基乙醇胺、N-苯基二乙醇胺、N-對甲苯基二乙醇胺、N-苯基乙醇胺、4-嗎啉基二苯甲酮、二甲基胺基苯甲酸異戊酯、二乙胺基苯甲酸異戊酯、2-巰基苯并咪唑、1-苯基-5-巰基四唑、2-巰基苯并噻唑、2-（對二甲基胺基苯乙烯基）苯并㗁唑、2-（對二甲基胺基苯乙烯基）苯并噻唑、2-（對二甲基胺基苯乙烯基）萘并（1,2-d）噻唑、2-（對二甲基胺基苯甲醯基）苯乙烯、二苯基乙醯胺、苯甲醯苯胺、N-甲基乙醯苯胺、3’,4’-二甲基乙醯苯胺等。 又，亦可以使用其他敏化色素。 關於敏化色素的詳細內容，能夠參閱日本特開2016-027357號公報的0161～0163段的記載，該內容被編入本說明書中。 〔Sensitizer〕 The resin composition may contain a sensitizer. A sensitizer absorbs a specific actinic ray and becomes an electronically excited state. The sensitizer in an electronically excited state contacts with thermal radical polymerization initiators, photoradical polymerization initiators, etc. to produce electron transfer, energy transfer, and heat generation. Thereby, the thermal radical polymerization initiator and the photoradical polymerization initiator chemically change and decompose to generate radicals, acids, or bases. As sensitizers that can be used, benzophenone-based, Michelerone-based, coumarin-based, pyrazole-based azo-based, anilino-based azo-based, triphenylmethane-based, anthraquinone-based, anthracene-based series, anthrapyridone series, benzylidene series, oxonol series, pyrazolotriazole azo series, pyridone azo series, cyanine series, thiophene thiol series, Compounds such as pyrrolopyrazolemethine azo-based, guchi-based, phthalocyanine-based, benzopyran-based, and indigo-based. Examples of sensitizers include Michelerone, 4,4'-bis(diethylamino)benzophenone, 2,5-bis(4'-diethylaminobenzylidene)cyclopentadiene alkane, 2,6-bis(4'-diethylaminobenzylidene)cyclohexanone, 2,6-bis(4'-diethylaminobenzylidene)-4-methylcyclohexanone, 4 ,4'-bis(dimethylamino)chalcone, 4,4'-bis(diethylamino)chalcone, p-dimethylaminophenylallylidene (cinnamylidene)indanone , p-dimethylaminobenzylidene indanone, 2-(p-dimethylaminophenylbiphenylene)-benzothiazole, 2-(p-dimethylaminophenylvinylidene ) benzothiazole, 2-(p-dimethylaminophenylvinylidene) isonaphthothiazole, 1,3-bis(4'-dimethylaminobenzylidene)acetone, 1,3-bis (4'-diethylaminobenzylidene)acetone, 3,3'-carbonyl-bis(7-diethylaminocoumarin), 3-acetyl-7-dimethylaminocoumarin , 3-ethoxycarbonyl-7-dimethylaminocoumarin, 3-benzyloxycarbonyl-7-dimethylaminocoumarin, 3-methoxycarbonyl-7-diethylaminocoumarin Coumarin, 3-ethoxycarbonyl-7-diethylaminocoumarin (7-(diethylamino)coumarin-3-carboxylate ethyl ester), N-phenyl-N'-ethyl Ethanolamine, N-phenyldiethanolamine, N-p-tolyldiethanolamine, N-phenylethanolamine, 4-morpholinobenzophenone, isoamyl dimethylaminobenzoate, diethylaminobenzene Isoamyl formate, 2-mercaptobenzimidazole, 1-phenyl-5-mercaptotetrazole, 2-mercaptobenzothiazole, 2-(p-dimethylaminostyryl)benzoxazole, 2- (p-Dimethylaminostyryl)benzothiazole, 2-(p-Dimethylaminostyryl)naphtho(1,2-d)thiazole, 2-(p-Dimethylaminobenzyl Acyl) styrene, diphenylacetamide, benzamide, N-methylacetamide, 3',4'-dimethylacetamide, etc. In addition, other sensitizing dyes can also be used. For details of the sensitizing dye, reference can be made to the description in paragraphs 0161 to 0163 of JP-A-2016-027357, which is incorporated in this specification.

樹脂組成物包含敏化劑之情況下，敏化劑的含量相對於從樹脂組成物的總固體成分中去除了填充劑之總質量，係0.01～20質量%為較佳，0.1～15質量%為更佳，0.5～10質量%為進一步較佳。敏化劑可以單獨使用1種，亦可以同時使用2種以上。When the resin composition contains a sensitizer, the content of the sensitizer is preferably 0.01 to 20% by mass, 0.1 to 15% by mass relative to the total mass of the total solid content of the resin composition except the filler. More preferably, 0.5 to 10% by mass is further more preferable. A sensitizer may be used individually by 1 type, and may use 2 or more types together.

〔鏈轉移劑〕 本發明的樹脂組成物可以含有鏈轉移劑。鏈轉移劑例如在高分子詞典第三版（高分子學會（The Society of Polymer Science，Japan）編，2005年）683-684頁中被定義。作為鏈轉移劑，例如可以使用在分子內具有-S-S-、-SO 2-S-、-N-O-、SH、PH、SiH及GeH之化合物群組、RAFT（Reversible Addition Fragmentation chain Transfer：可逆加成斷裂鏈轉移聚合）聚合中所使用之具有硫代羰基硫基之二硫代苯甲酸酯、三硫代碳酸酯、二硫代胺基甲酸酯、黃原酸酯化合物等。該等向低活性自由基供給氫而生成自由基，或者經氧化之後，藉由去質子而可生成自由基。尤其，能夠較佳地使用硫醇化合物。 [Chain Transfer Agent] The resin composition of the present invention may contain a chain transfer agent. Chain transfer agents are defined, for example, in Polymer Dictionary 3rd Edition (ed. The Society of Polymer Science, Japan, 2005) pp. 683-684. As the chain transfer agent, for example, a group of compounds having -SS-, -SO 2 -S-, -NO-, SH, PH, SiH, and GeH in the molecule, RAFT (Reversible Addition Fragmentation chain Transfer: Reversible Addition Fragmentation Chain Transfer Polymerization) Dithiobenzoate, trithiocarbonate, dithiocarbamate, xanthate compounds, etc., which have a thiocarbonylthio group used in polymerization. These can generate free radicals by donating hydrogen to low-activity free radicals, or can generate free radicals by deprotonation after oxidation. In particular, thiol compounds can be preferably used.

又，鏈轉移劑亦能夠使用國際公開第2015/199219號的0152～0153段中所記載之化合物，該內容被編入本說明書中。In addition, as the chain transfer agent, compounds described in paragraphs 0152 to 0153 of International Publication No. 2015/199219 can also be used, and the content is incorporated in this specification.

本發明的樹脂組成物具有鏈轉移劑之情況下，將從本發明的樹脂組成物的總固體成分中去除了填充劑之總質量設為100質量份之情況下，鏈轉移劑的含量係0.01～20質量份為較佳，0.1～10質量份為更佳，0.5～5質量份為進一步較佳。鏈轉移劑可以係僅1種，亦可以係2種以上。鏈轉移劑係2種以上時，其合計在上述範圍為較佳。When the resin composition of the present invention has a chain transfer agent, the content of the chain transfer agent is 0.01 when the total mass of the total solid content of the resin composition of the present invention excluding the filler is 100 parts by mass. -20 mass parts are preferable, 0.1-10 mass parts are more preferable, and 0.5-5 mass parts are still more preferable. The chain transfer agent may be only one type, or two or more types may be used. When the chain transfer agent is two or more types, it is preferable that the total is within the above-mentioned range.

〔光酸產生劑〕 本發明的樹脂組成物包含光酸產生劑為較佳。 光酸產生劑表示藉由200nm～900nm的光照射而產生布忍斯特酸及路易斯酸中的至少一者之化合物。所照射之光較佳為波長300nm～450nm的光，更佳為330nm～420nm的光。當單獨使用光酸產生劑或與敏化劑併用時，係能夠感光而產生酸之光酸產生劑為較佳。 作為所產生之酸的例子，可以較佳地舉出鹵化氫、羧酸、磺酸、亞磺酸、硫代亞磺酸、磷酸、磷酸單酯、磷酸二酯、硼衍生物、磷衍生物、銻衍生物、過氧化鹵（halogen peroxide）、磺醯胺等。 〔Photoacid generator〕 It is preferable that the resin composition of this invention contains a photoacid generator. The photoacid generator means a compound that generates at least one of Brenest's acid and Lewis acid by irradiation with light of 200 nm to 900 nm. The light to be irradiated is preferably light having a wavelength of 300 nm to 450 nm, more preferably light having a wavelength of 330 nm to 420 nm. When the photoacid generator is used alone or in combination with a sensitizer, it is preferably a photoacid generator capable of generating acid by being exposed to light. Examples of the generated acid include preferably hydrogen halides, carboxylic acids, sulfonic acids, sulfinic acids, thiosulfinic acids, phosphoric acid, phosphoric acid monoesters, phosphoric acid diesters, boron derivatives, phosphorus derivatives , antimony derivatives, halogen peroxide (halogen peroxide), sulfonamide, etc.

作為用於本發明的樹脂組成物中之光酸產生劑，例如可以舉出醌二疊氮化合物、肟磺酸鹽化合物、有機鹵化化合物、有機硼酸鹽化合物、二碸化合物、鎓鹽化合物等。 從靈敏度、保存穩定性的觀點考慮，有機鹵素化合物、肟磺酸鹽化合物、鎓鹽化合物為較佳，從所形成之膜的機械特性等考慮，肟酯為較佳。 Examples of the photoacid generator used in the resin composition of the present invention include quinone diazide compounds, oxime sulfonate compounds, organic halogenated compounds, organic borate compounds, dioxane compounds, onium salt compounds, and the like. From the viewpoint of sensitivity and storage stability, organic halogen compounds, oxime sulfonate compounds, and onium salt compounds are preferable, and oxime esters are preferable from the viewpoint of mechanical properties of the formed film.

作為醌二疊氮化合物，可以舉出醌二疊氮的磺酸以酯鍵結於1價或多價的羥基化合物者、醌二疊氮的磺酸以磺醯胺鍵結於1價或多價的胺基化合物者、醌二疊氮的磺酸以酯鍵結及/或以磺醯胺鍵結於多羥基多胺基化合物者等。該等多羥基化合物、多胺基化合物、多羥基多胺基化合物的所有官能基可以不被醌二疊氮取代，但以平均計官能基整體的40莫耳%以上被醌二疊氮取代為較佳。藉由含有這種醌二疊氮化合物，能夠獲得對作為通常的紫外線之水銀燈的i射線（波長365nm）、h射線（波長405nm）、g射線（波長436nm）感光之樹脂組成物。Examples of the quinonediazide compound include those in which the sulfonic acid of quinonediazide is ester-bonded to a monovalent or polyvalent hydroxy compound, and the sulfonic acid of quinonediazide is bonded to a monovalent or polyvalent hydroxy compound with a sulfonamide bond. Valence amine compounds, sulfonic acid of quinone diazide bonded with ester and/or bonded with polyhydroxypolyamine compound with sulfonamide, etc. All functional groups of these polyhydroxy compounds, polyamine compounds, and polyhydroxy polyamine compounds may not be substituted by quinone diazide, but on average, more than 40 mol% of the functional groups as a whole are substituted by quinone diazide as better. By containing such a quinonediazide compound, a resin composition sensitive to i-rays (wavelength 365nm), h-rays (wavelength 405nm), and g-rays (wavelength 436nm) of mercury lamps, which are common ultraviolet rays, can be obtained.

作為羥基化合物，具體而言，能夠舉出苯酚、三羥基二苯甲酮、4-甲氧基苯酚、異丙醇、辛醇、三級丁醇、環己醇、萘酚、Bis-Z、BisP-EZ、TekP-4HBPA、TrisP-HAP、TrisP-PA、TrisP-SA、TrisOCR-PA、BisOCHP-Z、BisP-MZ、BisP-PZ、BisP-IPZ、BisOCP-IPZ、BisP-CP、BisRS-2P、BisRS-3P、BisP-OCHP、亞甲基三-FR-CR、BisRS-26X、DML-MBPC、DML-MBOC、DML-OCHP、DML-PCHP、DML-PC、DML-PTBP、DML-34X、DML-EP、DML-POP、二羥甲基-BisOC-P、DML-PFP、DML-PSBP、DML-MTrisPC、TriML-P、TriML-35XL、TML-BP、TML-HQ、TML-pp-BPF、TML-BPA、TMOM-BP、HML-TPPHBA、HML-TPHAP（以上為產品名稱，Honshu Chemical Industry Co.,Ltd.製造）、BIR-OC、BIP-PC、BIR-PC、BIR-PTBP、BIR-PCHP、BIP-BIOC-F、4PC、BIR-BIPC-F、TEP-BIP-A、46DMOC、46DMOEP、TM-BIP-A（以上為產品名稱，ASAHI YUKIZAI CORPORATION製造）、2,6-二甲氧基甲基-4-三級丁基苯酚、2,6-二甲氧基甲基-對甲酚、2,6-二乙醯氧基甲基-對甲酚、萘酚、四羥基二苯甲酮、沒食子酸甲酯、雙酚A、雙酚E、亞甲基雙酚、BisP-AP（產品名稱，Honshu Chemical Industry Co.,Ltd.製造）、酚醛清漆樹脂等，但並不限定於該等。Specific examples of the hydroxy compound include phenol, trihydroxybenzophenone, 4-methoxyphenol, isopropanol, octanol, tertiary butanol, cyclohexanol, naphthol, Bis-Z, BisP-EZ, TekP-4HBPA, TrisP-HAP, TrisP-PA, TrisP-SA, TrisOCR-PA, BisOCHP-Z, BisP-MZ, BisP-PZ, BisP-IPZ, BisOCP-IPZ, BisP-CP, BisRS- 2P, BisRS-3P, BisP-OCHP, Methylenetri-FR-CR, BisRS-26X, DML-MBPC, DML-MBOC, DML-OCHP, DML-PCHP, DML-PC, DML-PTBP, DML-34X , DML-EP, DML-POP, Dimethylol-BisOC-P, DML-PFP, DML-PSBP, DML-MTrisPC, TriML-P, TriML-35XL, TML-BP, TML-HQ, TML-pp- BPF, TML-BPA, TMOM-BP, HML-TPPHBA, HML-TPHAP (the above are product names, manufactured by Honshu Chemical Industry Co., Ltd.), BIR-OC, BIP-PC, BIR-PC, BIR-PTBP, BIR-PCHP, BIP-BIOC-F, 4PC, BIR-BIPC-F, TEP-BIP-A, 46DMOC, 46DMOEP, TM-BIP-A (the above are product names, manufactured by ASAHI YUKIZAI CORPORATION), 2,6-two Methoxymethyl-4-tertiary butylphenol, 2,6-dimethoxymethyl-p-cresol, 2,6-diacetyloxymethyl-p-cresol, naphthol, tetrahydroxy Benzophenone, methyl gallate, bisphenol A, bisphenol E, methylene bisphenol, BisP-AP (product name, manufactured by Honshu Chemical Industry Co., Ltd.), novolac resin, etc., but is not limited to such.

作為胺基化合物，具體而言，能夠舉出苯胺、甲基苯胺、二乙胺、丁胺、1,4-伸苯基二胺、1,3-伸苯基二胺、4,4’-二胺基二苯醚、4,4’-二胺基二苯基甲烷、4,4’-二胺基二苯基碸、4,4’-二胺基二苯硫醚等，但並不限定於該等。As the amino compound, specifically, aniline, methylaniline, diethylamine, butylamine, 1,4-phenylenediamine, 1,3-phenylenediamine, 4,4'- Diaminodiphenyl ether, 4,4'-diaminodiphenylmethane, 4,4'-diaminodiphenylsulfide, 4,4'-diaminodiphenylsulfide, etc., but not limited to such.

又，作為多羥基多胺基化合物，具體而言，能夠舉出2,2-雙（3-胺基-4-羥基苯基）六氟丙烷、3,3’-二羥基聯苯胺等，但並不限定於該等。Moreover, as a polyhydroxypolyamine-based compound, specifically, 2,2-bis(3-amino-4-hydroxyphenyl)hexafluoropropane, 3,3'-dihydroxybenzidine, etc. can be mentioned, but is not limited to such.

在該等之中，作為醌二疊氮化合物，包含酚化合物及與4-萘醌二疊氮磺醯基的酯為較佳。藉此，能夠獲得對i射線曝光之更高的靈敏度和更高的解析度。Among them, as the quinonediazide compound, an ester containing a phenol compound and a 4-naphthoquinonediazidesulfonyl group is preferable. Thereby, higher sensitivity and higher resolution for i-ray exposure can be obtained.

用於本發明的樹脂組成物中之醌二疊氮化合物的含量相對於樹脂100質量份，係1～50質量份為較佳，10～40質量份為更佳。藉由將醌二疊氮化合物的含量設在該範圍內，可獲得曝光部與未曝光部的對比度，從而能夠實現更高的靈敏度化。另外，依據需要可以添加敏化劑等。The content of the quinonediazide compound used in the resin composition of the present invention is preferably 1 to 50 parts by mass, more preferably 10 to 40 parts by mass, relative to 100 parts by mass of the resin. By setting the content of the quinonediazide compound within this range, the contrast between the exposed portion and the unexposed portion can be obtained, and higher sensitivity can be achieved. Moreover, a sensitizer etc. can be added as needed.

光酸產生劑係包含肟磺酸鹽基之化合物（以下，亦簡稱為“肟磺酸鹽化合物”）為較佳。 肟磺酸鹽化合物只要具有肟磺酸鹽基，則沒有特別限制，但下述式（OS-1）、後述之式（OS-103）、式（OS-104）或式（OS-105）所表示之肟磺酸鹽化合物為較佳。 The photoacid generator is preferably a compound containing an oxime sulfonate group (hereinafter also simply referred to as an "oxime sulfonate compound"). The oxime sulfonate compound is not particularly limited as long as it has an oxime sulfonate group, but the following formula (OS-1), the following formula (OS-103), the formula (OS-104) or the formula (OS-105) The indicated oxime sulfonate compounds are preferred.

[化學式38]

Figure 02_image075
[chemical formula 38]
Figure 02_image075

式（OS-1）中，X 3表示烷基、烷氧基或鹵素原子。在存在複數個X 3之情況下，可以各自相同，亦可以不同。上述X 3中之烷基及烷氧基可以具有取代基。作為上述X 3中的烷基，碳數1～4的直鏈狀或支鏈狀烷基為較佳。作為上述X 3中之烷氧基，碳數1～4的直鏈狀或支鏈狀烷氧基為較佳。作為上述X 3中的鹵素原子，氯原子或氟原子為較佳。 式（OS-1）中，m3表示0～3的整數，0或1為較佳。當m3為2或3時，複數個X 3可以相同亦可以不同。 式（OS-1）中，R 34表示烷基或芳基，碳數1～10的烷基、碳數1～10的烷氧基、碳數1～5的鹵化烷基、碳數1～5的鹵化烷氧基、可以被W取代之苯基、可以被W取代之萘基或可以被W取代之蒽基為較佳。W表示鹵素原子、氰基、硝基、碳數1～10的烷基、碳數1～10的烷氧基、碳數1～5的鹵化烷基或碳數1～5的鹵化烷氧基、碳數6～20的芳基、碳數6～20的鹵化芳基。 In formula (OS-1), X 3 represents an alkyl group, an alkoxy group or a halogen atom. When there are a plurality of X 3 , each may be the same or different. The alkyl and alkoxy groups in X3 above may have substituents. As the alkyl group in the aforementioned X3 , a linear or branched alkyl group having 1 to 4 carbon atoms is preferred. As the alkoxy group in X3 above, a straight-chain or branched alkoxy group having 1 to 4 carbon atoms is preferable. As the halogen atom in the above-mentioned X3 , chlorine atom or fluorine atom is preferable. In formula (OS-1), m3 represents the integer of 0-3, 0 or 1 is preferable. When m3 is 2 or 3, a plurality of X3 may be the same or different. In the formula (OS-1), R 34 represents an alkyl group or an aryl group, an alkyl group with 1 to 10 carbons, an alkoxy group with 1 to 10 carbons, a halogenated alkyl group with 1 to 5 carbons, or an alkyl group with 1 to 5 carbons 5 is preferably a halogenated alkoxy group, a phenyl group which may be substituted by W, a naphthyl group which may be substituted by W or an anthracenyl group which may be substituted by W. W represents a halogen atom, a cyano group, a nitro group, an alkyl group with 1 to 10 carbons, an alkoxy group with 1 to 10 carbons, a halogenated alkyl group with 1 to 5 carbons or a halogenated alkoxy group with 1 to 5 carbons , an aryl group having 6 to 20 carbon atoms, and a halogenated aryl group having 6 to 20 carbon atoms.

式（OS-1）中，m3係3、X 3係甲基、X 3的取代位置係鄰位、R 34係碳數1～10的直鏈狀烷基、7,7-二甲基-2-氧代降崁基甲基或對甲苯基的化合物為特佳。 In the formula (OS-1), m3 is 3, X 3 is a methyl group, the substitution position of X 3 is an ortho position, R 34 is a linear alkyl group with 1 to 10 carbons, 7,7-dimethyl- 2-Oxonorylmethyl or p-tolyl compounds are particularly preferred.

作為式（OS-1）所表示之肟磺酸鹽化合物的具體例，可以例示出日本特開2011-209692號公報的段落號0064～0068、日本特開2015-194674號公報的段落號0158～0167中所記載之以下的化合物，該等內容被編入本說明書中。Specific examples of the oxime sulfonate compound represented by the formula (OS-1) include paragraphs 0064 to 0068 of JP-A-2011-209692 and paragraphs 0158-0068 of JP-A-2015-194674. The following compounds described in 0167 are incorporated in this specification.

[化學式39]

Figure 02_image077
[chemical formula 39]
Figure 02_image077

式（OS-103）～式（OS-105）中，R s1表示烷基、芳基或雜芳基，有時存在複數個之R s2分別獨立地表示氫原子、烷基、芳基或鹵素原子，有時存在複數個之R s6分別獨立地表示鹵素原子、烷基、烷氧基、磺酸基、胺基磺醯基或烷氧基磺醯基，Xs表示O或S，ns表示1或2，ms表示0～6的整數。 式（OS-103）～式（OS-105）中，R s1所表示之烷基（碳數1～30為較佳）、芳基（碳數6～30為較佳）或雜芳基（碳數4～30為較佳）可以在可獲得本發明的效果的範圍內具有公知的取代基。 In the formulas (OS-103) to (OS-105), R s1 represents an alkyl group, an aryl group or a heteroaryl group, and sometimes there are multiple R s2 independently representing a hydrogen atom, an alkyl group, an aryl group or a halogen Atoms, sometimes there are a plurality of R s6 independently represent a halogen atom, an alkyl group, an alkoxy group, a sulfonic acid group, an aminosulfonyl group or an alkoxysulfonyl group, Xs represents O or S, and ns represents 1 Or 2, ms represents an integer from 0 to 6. In formula (OS-103) ~ formula (OS-105), R s1 represents the alkyl group (preferably 1-30 carbon number), aryl group (preferably 6-30 carbon number) or heteroaryl group ( C4-30 is preferable) may have a known substituent within the range which can acquire the effect of this invention.

式（OS-103）～式（OS-105）中，R s2係氫原子、烷基（碳數1～12為較佳）或芳基（碳數6～30為較佳）為較佳，氫原子或烷基為更佳。有時在化合物中存在2個以上之R s2中1個或2個係烷基、芳基或鹵素原子為較佳，1個係烷基、芳基或鹵素原子為更佳，1個係烷基且剩餘部分係氫原子為特佳。R s2所表示之烷基或芳基可以在可獲得本發明的效果之範圍內具有公知的取代基。 式（OS-103）、式（OS-104）或式（OS-105）中，Xs表示O或S，O為較佳。上述式（OS-103）～（OS-105）中，包含Xs作為環員之環係5員環或6員環。 In formula (OS-103) ~ formula (OS-105), R s2 is a hydrogen atom, an alkyl group (preferably with 1 to 12 carbons) or an aryl group (preferably with 6 to 30 carbons), A hydrogen atom or an alkyl group is more preferable. Sometimes there are more than 2 R s2 in the compound, one or two of which are alkyl, aryl or halogen atoms is better, one is alkyl, aryl or halogen atom is more preferable, one is alkane It is particularly preferred that the remaining part is a hydrogen atom. The alkyl or aryl group represented by R s2 may have a known substituent within the range in which the effect of the present invention can be obtained. In formula (OS-103), formula (OS-104) or formula (OS-105), Xs represents O or S, and O is preferred. In the above formulas (OS-103) to (OS-105), the ring containing Xs as a ring member is a 5-membered ring or a 6-membered ring.

式（OS-103）～式（OS-105）中，ns表示1或2，Xs係O之情況下，ns係1為較佳，又，Xs係S之情況下，ns係2為較佳。 式（OS-103）～式（OS-105）中，R s6所表示之烷基（碳數1～30為較佳）及烷氧基（碳數1～30為較佳）可以具有取代基。 式（OS-103）～式（OS-105）中，ms表示0～6的整數，0～2的整數為較佳，0或1為更佳，0為特佳。 In the formula (OS-103) ~ formula (OS-105), ns represents 1 or 2, when Xs is O, ns is 1 is better, and when Xs is S, ns is 2 is better . In the formula (OS-103) to the formula (OS-105), the alkyl group (preferably 1-30 carbon number) and alkoxy group (preferably 1-30 carbon number) represented by R s6 may have substituents . In Formula (OS-103) to Formula (OS-105), ms represents an integer of 0 to 6, preferably an integer of 0 to 2, more preferably 0 or 1, and particularly preferably 0.

又，上述式（OS-103）所表示之化合物係下述式（OS-106）、式（OS-110）或式（OS-111）所表示之化合物為特佳，上述式（OS-104）所表示之化合物係下述式（OS-107）所表示之化合物為特佳，上述式（OS-105）所表示之化合物係下述式（OS-108）或式（OS-109）所表示之化合物為特佳。 [化學式40]

Figure 02_image079
Also, the compound represented by the above-mentioned formula (OS-103) is a compound represented by the following formula (OS-106), formula (OS-110) or formula (OS-111) is particularly preferred, and the above-mentioned formula (OS-104 ) represented by the compound represented by the following formula (OS-107) is particularly preferred, and the compound represented by the above formula (OS-105) is represented by the following formula (OS-108) or formula (OS-109) The indicated compounds are particularly preferred. [chemical formula 40]
Figure 02_image079

式（OS-106）～式（OS-111）中，R t1表示烷基、芳基或雜芳基，R t7表示氫原子或溴原子，R t8表示氫原子、碳數1～8的烷基、鹵素原子、氯甲基、溴甲基、溴乙基、甲氧基甲基、苯基或氯苯基，R t9表示氫原子、鹵素原子、甲基或甲氧基，R t2表示氫原子或甲基。 式（OS-106）～式（OS-111）中，R t7表示氫原子或溴原子，氫原子為較佳。 In the formula (OS-106) to the formula (OS-111), R t1 represents an alkyl group, an aryl group or a heteroaryl group, R t7 represents a hydrogen atom or a bromine atom, R t8 represents a hydrogen atom, or an alkane with 1 to 8 carbons group, halogen atom, chloromethyl, bromomethyl, bromoethyl, methoxymethyl, phenyl or chlorophenyl, R t9 represents hydrogen atom, halogen atom, methyl or methoxy, R t2 represents hydrogen atom or methyl. In the formula (OS-106) to the formula (OS-111), R t7 represents a hydrogen atom or a bromine atom, preferably a hydrogen atom.

式（OS-106）～式（OS-111）中，R t8表示氫原子、碳數1～8的烷基、鹵素原子、氯甲基、溴甲基、溴乙基、甲氧基甲基、苯基或氯苯基，碳數1～8的烷基、鹵素原子或苯基為較佳，碳數1～8的烷基為更佳，碳數1～6的烷基為進一步較佳，甲基為特佳。 In formula (OS-106) to formula (OS-111), R t8 represents a hydrogen atom, an alkyl group with 1 to 8 carbons, a halogen atom, chloromethyl, bromomethyl, bromoethyl, methoxymethyl , phenyl or chlorophenyl, preferably an alkyl group with 1 to 8 carbons, a halogen atom or a phenyl group, more preferably an alkyl group with 1 to 8 carbons, and even more preferably an alkyl group with 1 to 6 carbons , methyl is particularly preferred.

式（OS-106）～式（OS-111）中，R t9表示氫原子、鹵素原子、甲基或甲氧基，氫原子為較佳。 R t2表示氫原子或甲基，氫原子為較佳。 又，在上述肟磺酸鹽化合物中，關於肟的立體結構（E，Z），可以為其中任一者，亦可以為混合物。 作為上述式（OS-103）～式（OS-105）所表示之肟磺酸鹽化合物的具體例，可以例示出日本特開2011-209692號公報的段落號0088～0095、日本特開2015-194674號公報的段落號0168～0194中所記載之化合物，該等內容被編入本說明書中。 In the formula (OS-106) to the formula (OS-111), R t9 represents a hydrogen atom, a halogen atom, a methyl group or a methoxy group, and a hydrogen atom is preferred. R t2 represents a hydrogen atom or a methyl group, preferably a hydrogen atom. In addition, among the above-mentioned oxime sulfonate compounds, the three-dimensional structure (E, Z) of the oxime may be any of them, or may be a mixture. Specific examples of the oxime sulfonate compounds represented by the above formulas (OS-103) to (OS-105) include paragraphs 0088 to 0095 of JP-A-2011-209692, JP-A 2015- Compounds described in paragraphs 0168 to 0194 of Publication No. 194674, the content of which is incorporated in the present specification.

作為包含至少1個肟磺酸鹽基之肟磺酸鹽化合物的較佳的其他態樣，可以舉出下述式（OS-101）、式（OS-102）所表示之化合物。Other preferred aspects of the oxime sulfonate compound containing at least one oxime sulfonate group include compounds represented by the following formula (OS-101) and formula (OS-102).

[化學式41]

Figure 02_image081
[chemical formula 41]
Figure 02_image081

式（OS-101）或式（OS-102）中，R u9表示氫原子、烷基、烯基、烷氧基、烷氧基羰基、醯基、胺甲醯基、胺磺醯基、磺基、氰基、芳基或雜芳基。R u9係氰基或芳基之態樣為更佳，R u9係氰基、苯基或萘基之態樣為進一步較佳。 式（OS-101）或式（OS-102）中，R u2a表示烷基或芳基。 式（OS-101）或式（OS-102）中，Xu表示-O-、-S-、-NH-、-NR u5-、-CH 2-、-CR u6H-或CR u6R u7-，R u5～R u7分別獨立地表示烷基或芳基。 In formula (OS-101) or formula (OS-102), R u9 represents a hydrogen atom, alkyl, alkenyl, alkoxy, alkoxycarbonyl, acyl, carbamoyl, sulfamoyl, sulfonyl group, cyano, aryl or heteroaryl. It is more preferable that R u9 is a cyano group or an aryl group, and it is still more preferable that R u9 is a cyano group, a phenyl group or a naphthyl group. In formula (OS-101) or formula (OS-102), R u2a represents an alkyl group or an aryl group. In formula (OS-101) or formula (OS-102), Xu represents -O-, -S-, -NH-, -NR u5 -, -CH 2 -, -CR u6 H- or CR u6 R u7 - , R u5 to R u7 each independently represent an alkyl group or an aryl group.

式（OS-101）或式（OS-102）中，R u1～R u4分別獨立地表示氫原子、鹵素原子、烷基、烯基、烷氧基、胺基、烷氧基羰基、烷基羰基、芳基羰基、醯胺基、磺基、氰基或芳基。R u1～R u4中的2個可以各自相互鍵結而形成環。此時，環可以縮合而與苯環一起形成縮合環。作為R u1～R u4，氫原子、鹵素原子或烷基為較佳，又，R u1～R u4中的至少2個相互鍵結而形成芳基之態樣亦較佳。其中，R u1～R u4均係氫原子的態樣為較佳。上述取代基均可以進一步具有取代基。 In formula (OS-101) or formula (OS-102), R u1 ~ R u4 independently represent hydrogen atom, halogen atom, alkyl, alkenyl, alkoxy, amino, alkoxycarbonyl, alkyl Carbonyl, arylcarbonyl, amido, sulfo, cyano or aryl. Two of R u1 to R u4 may be bonded to each other to form a ring. At this time, the rings may be condensed to form a condensed ring together with the benzene ring. As R u1 to R u4 , a hydrogen atom, a halogen atom or an alkyl group is preferable, and an aspect in which at least two of R u1 to R u4 are bonded to each other to form an aryl group is also preferable. Among them, it is preferable that all of R u1 to R u4 are hydrogen atoms. All of the above substituents may further have a substituent.

上述式（OS-101）所表示之化合物係式（OS-102）所表示之化合物為更佳。 又，在上述肟磺酸鹽化合物中，關於肟或苯并噻唑環的立體結構（E，Z等），分別可以係其中任一者，亦可以係混合物。 作為式（OS-101）所表示之化合物的具體例，可以例示出日本特開2011-209692號公報的段落號0102～0106、日本特開2015-194674號公報的段落號0195～0207中所記載的化合物，該等內容被編入本說明書中。 在上述化合物之中，下述b-9、b-16、b-31、b-33為較佳。 [化學式42]

Figure 02_image083
作為市售品，能夠舉出WPAG-336（FUJIFILM Wako Pure Chemical Corporation製造）、WPAG-443（FUJIFILM Wako Pure Chemical Corporation製造）、MBZ-101（Midori Kagaku Co.,Ltd.製造）等。 More preferably, the compound represented by the above formula (OS-101) is a compound represented by the formula (OS-102). In addition, in the above-mentioned oxime sulfonate compound, the three-dimensional structure (E, Z, etc.) of the oxime or benzothiazole ring may be either one or a mixture thereof. Specific examples of the compound represented by the formula (OS-101) include those described in paragraphs 0102 to 0106 of JP-A-2011-209692 and in paragraphs 0195-0207 of JP-A-2015-194674 compounds, the contents of which are incorporated into this description. Among the above-mentioned compounds, the following b-9, b-16, b-31 and b-33 are preferable. [chemical formula 42]
Figure 02_image083
Examples of commercially available products include WPAG-336 (manufactured by FUJIFILM Wako Pure Chemical Corporation), WPAG-443 (manufactured by FUJIFILM Wako Pure Chemical Corporation), MBZ-101 (manufactured by Midori Kagaku Co., Ltd.), and the like.

又，作為較佳例，亦可以舉出下述結構式所表示之化合物。 [化學式43]

Figure 02_image085
Moreover, the compound represented by the following structural formula can also be mentioned as a preferable example. [chemical formula 43]
Figure 02_image085

作為有機鹵化化合物，具體而言，可以舉出若林等“Bull Chem.Soc Japan”42、2924（1969）、美國專利第3,905,815號說明書、日本特公昭46-4605號、日本特開昭48-36281號公報、日本特開昭55-32070號公報、日本特開昭60-239736號公報、日本特開昭61-169835號公報、日本特開昭61-169837號公報、日本特開昭62-58241號公報、日本特開昭62-212401號公報、日本特開昭63-70243號公報、日本特開昭63-298339號公報、M.P.Hutt“Jurnal of Heterocyclic Chemistry”1（No3），（1970）等中所記載之化合物，該等內容被編入本說明書中。尤其，作為較佳例，可以舉出三鹵甲基取代之㗁唑化合物：S-三𠯤化合物。 更佳地，可以舉出至少1個單、二或三鹵素取代甲基鍵結於s-三𠯤環之s-三𠯤衍生物，具體而言，例如可以舉出2,4,6-三（單氯甲基）-s-三𠯤、2,4,6-三（二氯甲基）-s-三𠯤、2,4,6-三（三氯甲基）-s-三𠯤、2-甲基-4,6-雙（三氯甲基）-s-三𠯤、2-正丙基-4,6-雙（三氯甲基）-s-三𠯤、2-（α,α,β-三氯乙基）-4,6-雙（三氯甲基）-s-三𠯤、2-苯基-4,6-雙（三氯甲基）-s-三𠯤、2-（對甲氧基苯基）-4,6-雙（三氯甲基）-s-三𠯤、2-（3,4-環氧苯基）-4、6-雙（三氯甲基）-s-三𠯤、2-（對氯苯基）-4,6-雙（三氯甲基）-s-三𠯤、2-〔1-（對甲氧基苯基）-2,4-丁二烯基〕-4,6-雙（三氯甲基）-s-三𠯤、2-苯乙烯基-4,6-雙（三氯甲基）-s-三𠯤、2-（對甲氧基苯乙烯基）-4,6-雙（三氯甲基）-s-三𠯤、2-（對異丙氧基苯乙烯基）-4、6-雙（三氯甲基）-s-三𠯤、2-（對甲苯基）-4,6-雙（三氯甲基）-s-三𠯤、2-（4-萘氧基萘基）-4,6-雙（三氯甲基）-s-三𠯤、2-苯硫基-4,6-雙（三氯甲基）-s-三𠯤、2-苄硫基-4,6-雙（三氯甲基）-s-三𠯤、2,4,6-三（二溴甲基）-s-三𠯤、2,4,6-三（三溴甲基）-s-三𠯤、2-甲基-4,6-雙（三溴甲基）-s-三𠯤、2-甲氧基-4,6-雙（三溴甲基）-s-三𠯤等。 Specific examples of organic halogenated compounds include Wakabayashi et al. "Bull Chem. Soc Japan" 42, 2924 (1969), US Pat. Publication No. 55-32070, 60-239736, 61-169835, 61-169837, 62-58241 Publication No. 62-212401, JP-A-63-70243, JP-A-63-298339, M.P. Hutt "Jurnal of Heterocyclic Chemistry" 1 (No3), (1970), etc. The compounds described in , these contents are incorporated into this specification. In particular, as a preferable example, a trihalomethyl-substituted oxazole compound: S-trioxazole compound. More preferably, there can be mentioned s-tris-one derivatives in which at least one mono-, di- or trihalogen-substituted methyl group is bonded to the s-tris-one ring, specifically, 2,4,6-tris (Monochloromethyl)-s-trimethanone, 2,4,6-tris(dichloromethyl)-s-trimethalone, 2,4,6-tris(trichloromethyl)-s-trimethalone, 2-Methyl-4,6-bis(trichloromethyl)-s-trichloromethyl, 2-n-propyl-4,6-bis(trichloromethyl)-s-trichloromethyl, 2-(α, α,β-Trichloroethyl)-4,6-bis(trichloromethyl)-s-trichloromethyl, 2-phenyl-4,6-bis(trichloromethyl)-s-trifluoromethyl, 2 -(p-methoxyphenyl)-4,6-bis(trichloromethyl)-s-trichloromethyl, 2-(3,4-epoxyphenyl)-4,6-bis(trichloromethyl) )-s-three 𠯤, 2-(p-chlorophenyl)-4,6-bis(trichloromethyl)-s-three 𠯤, 2-[1-(p-methoxyphenyl)-2,4 -Butadienyl]-4,6-bis(trichloromethyl)-s-trichloromethyl, 2-styryl-4,6-bis(trichloromethyl)-s-trichloromethyl, 2-( p-methoxystyryl)-4,6-bis(trichloromethyl)-s-trichloromethyl, 2-(p-isopropoxystyryl)-4,6-bis(trichloromethyl) -s-trimethanone, 2-(p-tolyl)-4,6-bis(trichloromethyl)-s-trimethalone, 2-(4-naphthyloxynaphthyl)-4,6-bis(trichloromethyl) Chloromethyl)-s-trichloromethyl, 2-phenylthio-4,6-bis(trichloromethyl)-s-trichloromethyl, 2-benzylthio-4,6-bis(trichloromethyl) -s-tribromomethyl, 2,4,6-tri(dibromomethyl)-s-tribromomethyl, 2,4,6-tri(tribromomethyl)-s-tribromomethyl, 2-methyl-4 , 6-bis(tribromomethyl)-s-three 𠯤, 2-methoxy-4,6-bis(tribromomethyl)-s-three 𠯤, etc.

作為有機硼酸鹽化合物，作為具體例例如可以舉出日本特開昭62-143044號公報、日本特開昭62-150242號公報、日本特開平9-188685號公報、日本特開平9-188686號公報、日本特開平9-188710號公報、日本特開2000-131837號公報、日本特開2002-107916號公報、日本專利第2764769號公報、日本特開2002-116539號公報等及Kunz，Martin“Rad Tech'98.Proceeding April 19-22，1998，Chicago”等中所記載之有機硼酸鹽、日本特開平6-157623號公報、日本特開平6-175564號公報、日本特開平6-175561號公報中所記載之有機硼鋶錯合物或有機硼氧代鋶錯合物、日本特開平6-175554號公報、日本特開平6-175553號公報中所記載之有機硼錪錯合物、日本特開平9-188710號公報中所記載之有機硼鏻錯合物、日本特開平6-348011號公報、日本特開平7-128785號公報、日本特開平7-140589號公報、日本特開平7-306527號公報、日本特開平7-292014號公報等中所記載之有機硼過渡金屬配位錯合物等，該等內容被編入本說明書中。As an organic borate compound, specific examples include JP-A-62-143044, JP-A-62-150242, JP-9-188685, JP-9-188686 , Japanese Patent Application Publication No. 9-188710, Japanese Patent Application Publication No. 2000-131837, Japanese Patent Application Publication No. 2002-107916, Japanese Patent Application Publication No. 2764769, Japanese Patent Application Publication No. 2002-116539, etc., and Kunz, Martin "Rad Organic borates described in Tech'98.Proceeding April 19-22, 1998, Chicago", etc., in Japanese Patent Application Publication No. 6-157623, Japanese Patent Application Publication No. 6-175564, and Japanese Patent Application Publication No. 6-175561 Organoboronium complexes or organoboroxoconium complexes, Japanese Patent Application Publication No. 6-175554, organoboronium complexes described in Japanese Patent Application Publication No. 6-175553, Japanese Patent Application Publication No. 6-175553, Japanese Patent Application Publication No. 6-175553 Organoboronphosphonium complexes described in Gazette No. 9-188710, JP-A-6-348011, JP-7-128785, JP-7-140589, JP-7-306527 Gazette, JP-A-7-292014, etc., are incorporated into the present specification.

作為二碸化合物，可以舉出日本特開昭61-166544號公報、日本特願2001-132318公報等中所記載之化合物及重氮二碸化合物。Examples of diazide compounds include compounds described in JP-A-61-166544, JP-A-2001-132318, and diazo-diazo compounds.

作為上述鎓鹽化合物，例如可以舉出S.I.Schlesinger，Photogr.Sci.Eng.，18，387（1974）、T.S.Bal等人，Polymer，21,423（1980）中所記載之重氮鹽、美國專利第4,069,055號說明書、日本特開平4-365049號公報等中所記載之銨鹽、美國專利第4,069,055號、美國專利第4,069,056號的各說明書中所記載之鏻鹽、歐洲專利第104,143號、美國專利第339,049號、美國專利第410,201號的各說明書、日本特開平2-150848號、日本特開平2-296514號公報中所記載之錪鹽、歐洲專利第370,693號、歐洲專利第390,214號、歐洲專利第233,567號、歐洲專利第297,443號、歐洲專利第297,442號、美國專利第4,933,377號、美國專利第161,811號、美國專利第410,201號、美國專利第339,049號、美國專利第4,760,013號、美國專利第4,734,444號、美國專利第2,833,827號、德國專利第2,904,626號、德國專利第3,604,580號、德國專利第3,604,581號的各說明書中所記載之鋶鹽、J.V.Crivello等人，Macromolecules，10（6），1307（1977）、J.V.Crivello等人，J.Polymer Sci.，Polymer Chem.Ed.，17，1047（1979）中所記載之硒鹽、C.S.Wen等人，Teh，Proc.Conf.Rad.Curing ASIA，p478 Tokyo，Oct（1988）中所記載之砷鹽、吡啶鎓鹽等鎓鹽等，該等內容被編入本說明書中。Examples of the above-mentioned onium salt compounds include diazonium salts described in S.I.Schlesinger, Photogr.Sci.Eng., 18, 387 (1974), T.S.Bal et al., Polymer, 21,423 (1980), U.S. Patent No. 4,069,055 Ammonium salts described in Japanese Patent Application Laid-Open No. 4-365049, etc., phosphonium salts described in each specification of U.S. Patent No. 4,069,055 and U.S. Patent No. 4,069,056, European Patent No. 104,143, and U.S. Patent No. 339,049 No., each description of U.S. Patent No. 410,201, Japanese Patent Application Laid-Open No. 2-150848, Japanese Patent Application Publication No. 2-296514, and European Patent No. 370,693, European Patent No. 390,214, and European Patent No. 233,567 No., European Patent No. 297,443, European Patent No. 297,442, U.S. Patent No. 4,933,377, U.S. Patent No. 161,811, U.S. Patent No. 410,201, U.S. Patent No. 339,049, U.S. Patent No. 4,760,013, U.S. Patent No. 4,734,444, U.S. Patent No. 2,833,827, German Patent No. 2,904,626, German Patent No. 3,604,580, German Patent No. 3,604,581, J.V. Crivello et al., Macromolecules, 10 (6), 1307 (1977), Selenium salts described in J.V.Crivello et al., J.Polymer Sci., Polymer Chem.Ed., 17, 1047 (1979), C.S.Wen et al., Teh, Proc.Conf.Rad.Curing ASIA, p478 Tokyo, Oct. (1988), arsenic salts, pyridinium salts and other onium salts, etc., are incorporated in this specification.

作為鎓鹽，可以舉出下述通式（RI-I）～（RI-III）所表示之鎓鹽。 [化學式44]

Figure 02_image087
式（RI-I）中，Ar 11表示可以具有1～6個取代基之碳數20以下的芳基，作為較佳的取代基，可以舉出碳數1～12的烷基、碳數2～12的烯基、碳數2～12的炔基、碳數6～12的芳基、碳數1～12的烷氧基、碳數1～12的芳氧基、鹵素原子、碳數1～12的烷基胺基、碳數2～12的二烷基胺基、烷基的碳數為1～12的烷基醯胺基或芳基的碳數為6～20的芳基醯胺基、羰基、羧基、氰基、磺醯基、碳數1～12的硫代烷基、碳數1～12的硫代芳基。Z 11 -表示1價的陰離子，係鹵素離子、過氯酸離子、六氟磷酸鹽離子、四氟硼酸鹽離子、磺酸離子、亞磺酸離子、硫代磺酸離子、硫酸離子，從穩定性的方面而言，過氯酸離子、六氟磷酸鹽離子、四氟硼酸鹽離子、磺酸離子、亞磺酸離子為較佳。式（RI-II）中，Ar 21、Ar 22各自獨立地表示可以具有1～6個取代基之碳數1～20的芳基，作為較佳的取代基，可以舉出碳數1～12的烷基、碳數2～12的烯基、碳數2～12的炔基、碳數1～12的芳基、碳數1～12的烷氧基、碳數1～12的芳氧基、鹵素原子、碳數1～12的單烷基胺基、烷基的碳數分別獨立地係1～12的二烷基胺基、烷基的碳數為1～12的烷基醯胺基或芳基醯胺基、羰基、羧基、氰基、磺醯基、碳數1～12的硫代烷基、碳數1～12的硫代芳基。Z 21 -表示1價的陰離子，係鹵素離子、過氯酸離子、六氟磷酸鹽離子、四氟硼酸鹽離子、磺酸離子、亞磺酸離子、硫代磺酸離子、硫酸離子，從穩定性、反應性的方面而言，過氯酸離子、六氟磷酸鹽離子、四氟硼酸鹽離子、磺酸離子、亞磺酸離子、羧酸離子為較佳。式（RI-III）中，R 31、R 32、R 33各自獨立地表示可以具有1～6個取代基之碳數6～20以下的芳基或烷基、烯基、炔基，較佳地，從反應性、穩定性的方面考慮，芳基為較佳。作為較佳的取代基，可以舉出碳數1～12的烷基、碳數2～12的烯基、碳數2～12的炔基、碳數1～12的芳基、碳數1～12的烷氧基、碳數1～12的芳氧基、鹵素原子、碳數1～12的單烷基胺基、烷基的碳數分別獨立地係1～12的二烷基胺基、烷基的碳數係1～12的烷基醯胺基或芳基醯胺基、羰基、羧基、氰基、磺醯基、碳數1～12的硫代烷基、碳數1～12的硫代芳基。Z 31 -表示1價的陰離子，係鹵素離子、過氯酸離子、六氟磷酸鹽離子、四氟硼酸鹽離子、磺酸離子、亞磺酸離子、硫代磺酸離子、硫酸離子，從穩定性、反應性的方面而言，過氯酸離子、六氟磷酸鹽離子、四氟硼酸鹽離子、磺酸離子、亞磺酸離子、羧酸離子為較佳。 Examples of the onium salt include onium salts represented by the following general formulas (RI-I) to (RI-III). [chemical formula 44]
Figure 02_image087
In the formula (RI-I), Ar 11 represents an aryl group having 1 to 6 substituents with carbon number of 20 or less. Preferred substituents include alkyl groups with 1 to 12 carbon atoms, and alkyl groups with 2 carbon atoms. Alkenyl with 1 to 12 carbons, alkynyl with 2 to 12 carbons, aryl with 6 to 12 carbons, alkoxy with 1 to 12 carbons, aryloxy with 1 to 12 carbons, halogen atom, 1 carbon Alkylamino group with ~12 carbons, dialkylamino group with 2 to 12 carbons, alkylamide group with 1 to 12 carbons in the alkyl group or arylamide with 6 to 20 carbons in the aryl group group, carbonyl, carboxyl, cyano, sulfonyl, thioalkyl with 1 to 12 carbons, and thioaryl with 1 to 12 carbons. Z 11 - represents monovalent anions, which are halogen ions, perchlorate ions, hexafluorophosphate ions, tetrafluoroborate ions, sulfonic acid ions, sulfinic acid ions, thiosulfonic acid ions, and sulfate ions. In terms of properties, perchlorate ions, hexafluorophosphate ions, tetrafluoroborate ions, sulfonate ions, and sulfinate ions are preferable. In the formula (RI-II), Ar 21 and Ar 22 each independently represent an aryl group having 1 to 20 carbon atoms which may have 1 to 6 substituents. Preferred substituents include 1 to 12 carbon atoms. Alkyl, alkenyl with 2 to 12 carbons, alkynyl with 2 to 12 carbons, aryl with 1 to 12 carbons, alkoxy with 1 to 12 carbons, aryloxy with 1 to 12 carbons , a halogen atom, a monoalkylamino group with a carbon number of 1 to 12, a dialkylamino group with an alkyl group with a carbon number of 1 to 12, and an alkylamide group with an alkyl group with a carbon number of 1 to 12 Or an arylamido group, a carbonyl group, a carboxyl group, a cyano group, a sulfonyl group, a thioalkyl group having 1 to 12 carbons, or a thioaryl group having 1 to 12 carbons. Z 21 -represents monovalent anions, which are halogen ions, perchlorate ions, hexafluorophosphate ions, tetrafluoroborate ions, sulfonic acid ions, sulfinic acid ions, thiosulfonic acid ions, and sulfate ions. In terms of properties and reactivity, perchlorate ions, hexafluorophosphate ions, tetrafluoroborate ions, sulfonate ions, sulfinate ions, and carboxylate ions are preferable. In formula (RI-III), R 31 , R 32 , and R 33 each independently represent an aryl group or an alkyl group, an alkenyl group, or an alkynyl group having 1 to 6 substituents with carbon numbers of 6 to 20 or less, preferably In view of reactivity and stability, an aryl group is preferable. Preferred substituents include alkyl groups having 1 to 12 carbons, alkenyl groups having 2 to 12 carbons, alkynyl groups having 2 to 12 carbons, aryl groups having 1 to 12 carbons, and aryl groups having 1 to 12 carbons. An alkoxy group with 12 carbons, an aryloxy group with 1 to 12 carbons, a halogen atom, a monoalkylamino group with 1 to 12 carbons, and a dialkylamino group with an alkyl group with 1 to 12 carbons independently, Alkyl amido or arylamido, carbonyl, carboxyl, cyano, sulfonyl, thioalkyl with 1 to 12 carbons, 1 to 12 carbons Thioaryl. Z 31 -represents monovalent anions, which are halogen ions, perchlorate ions, hexafluorophosphate ions, tetrafluoroborate ions, sulfonic acid ions, sulfinic acid ions, thiosulfonic acid ions, and sulfate ions. In terms of properties and reactivity, perchlorate ions, hexafluorophosphate ions, tetrafluoroborate ions, sulfonate ions, sulfinate ions, and carboxylate ions are preferable.

作為較佳的光酸產生劑的具體例，可以舉出以下者。 [化學式45]

Figure 02_image089
[化學式46]
Figure 02_image091
[化學式47]
Figure 02_image093
[化學式48]
Figure 02_image095
Specific examples of a preferable photoacid generator include the following. [chemical formula 45]
Figure 02_image089
[chemical formula 46]
Figure 02_image091
[chemical formula 47]
Figure 02_image093
[chemical formula 48]
Figure 02_image095

相對於從樹脂組成物的總固體成分中去除了填充劑之總質量，光酸產生劑使用0.1～20質量%為較佳，使用0.5～18質量%為更佳，使用0.5～10質量%為進一步較佳，使用0.5～3質量%為更進一步較佳，使用0.5～1.2質量%為進而更進一步較佳。 光酸產生劑可以單獨使用一種，亦可以以複數種的組合使用。複數種的組合之情況下，該等的合計量在上述範圍內為較佳。 又，為了賦予對所期望的光源之感光性，與敏化劑併用亦較佳。 The photoacid generator is preferably used in an amount of 0.1 to 20% by mass, more preferably 0.5 to 18% by mass, and 0.5 to 10% by mass relative to the total mass of the total solid content of the resin composition after the filler has been removed. More preferably, it is still more preferable to use 0.5-3 mass %, and it is still more preferable to use 0.5-1.2 mass %. A photoacid generator may be used individually by 1 type, and may use it in combination of several types. In the case of a combination of plural types, it is preferable that the total amount thereof is within the above-mentioned range. Moreover, in order to provide photosensitivity to a desired light source, it is also preferable to use together with a sensitizer.

＜鹼產生劑＞ 本發明的樹脂組成物可以包含鹼產生劑。在此，鹼產生劑係能夠藉由物理或化學作用而產生鹼之化合物。作為對本發明的樹脂組成物而言較佳的鹼產生劑，可以舉出熱鹼產生劑及光鹼產生劑。 尤其，樹脂組成物包含環化樹脂的前驅物之情況下，樹脂組成物包含鹼產生劑為較佳。藉由樹脂組成物含有熱鹼產生劑，例如能夠藉由加熱來促進前驅物的環化反應，從而成為硬化物的機械特性或耐藥品性良好者，例如作為半導體封裝中所包含之重新配線層用層間絕緣膜的性能變得良好。 作為鹼產生劑，可以係離子型鹼產生劑，亦可以係非離子型鹼產生劑。作為由鹼產生劑產生之鹼，例如可以舉出二級胺、三級胺。 關於本發明之鹼產生劑並沒有特別限制，能夠使用公知的鹼產生劑。作為公知的鹼產生劑，例如能夠使用胺甲醯基肟化合物、胺甲醯基羥胺化合物、胺甲酸化合物、甲醯胺化合物、乙醯胺化合物、胺甲酸酯化合物、苄基胺甲酸酯化合物、硝基苄基胺甲酸酯化合物、磺醯胺化合物、咪唑衍生物化合物、胺醯亞胺化合物、吡啶衍生物化合物、α-胺基苯乙酮衍生物化合物、四級銨鹽衍生物化合物、吡啶鎓鹽、α-內酯環衍生物化合物、胺醯亞胺化合物、鄰苯二甲醯亞胺衍生物化合物、醯氧基亞胺基化合物等。 作為非離子型鹼產生劑的具體化合物，可以舉出式（B1）、式（B2）或式（B3）所表示之化合物。 [化學式49]

Figure 02_image097
<Base Generator> The resin composition of the present invention may contain a base generator. Here, the base generator is a compound capable of generating a base through physical or chemical action. As a preferable base generator for the resin composition of this invention, a thermal base generator and a photobase generator are mentioned. In particular, when the resin composition contains a precursor of a cyclized resin, it is preferable that the resin composition contains a base generator. When the resin composition contains a thermal base generator, for example, the cyclization reaction of the precursor can be promoted by heating, so that the mechanical properties and chemical resistance of the cured product are good, for example, it can be used as a rewiring layer included in a semiconductor package. The performance with the interlayer insulating film becomes good. The base generator may be an ionic base generator or a nonionic base generator. Examples of the base generated by the base generator include secondary amines and tertiary amines. The base generator of the present invention is not particularly limited, and known base generators can be used. As known base generators, for example, carbamoyl oxime compounds, carbamoyl hydroxylamine compounds, carbamate compounds, formamide compounds, acetamide compounds, carbamate compounds, benzyl carbamate compounds, etc. Compounds, nitrobenzyl carbamate compounds, sulfonamide compounds, imidazole derivative compounds, amidoimide compounds, pyridine derivative compounds, α-aminoacetophenone derivative compounds, quaternary ammonium salt derivatives compounds, pyridinium salts, α-lactone ring derivative compounds, amidoimide compounds, phthalimide derivative compounds, acyloxyimino compounds, and the like. Specific examples of the nonionic base generating agent include compounds represented by formula (B1), formula (B2) or formula (B3). [chemical formula 49]
Figure 02_image097

式（B1）及式（B2）中，Rb 1、Rb 2及Rb 3分別獨立地係不具有三級胺結構之有機基團、鹵素原子或氫原子。其中，Rb 1及Rb 2不會同時成為氫原子。又，Rb 1、Rb 2及Rb 3不會均具有羧基。另外，在本說明書中，三級胺結構係指3價的氮原子的3個鍵結鍵均與烴系的碳原子共價鍵結之結構。故，鍵結之碳原子係構成羰基之碳原子之情況下，亦即，與氮原子一同形成醯胺基時，則不限於此。 In formula (B1) and formula (B2), Rb 1 , Rb 2 and Rb 3 are each independently an organic group not having a tertiary amine structure, a halogen atom or a hydrogen atom. However, Rb 1 and Rb 2 do not become hydrogen atoms at the same time. In addition, Rb 1 , Rb 2 and Rb 3 do not all have a carboxyl group. In addition, in this specification, a tertiary amine structure means the structure in which all three bonds of a trivalent nitrogen atom are covalently bonded to the carbon atom of a hydrocarbon system. Therefore, when the bonded carbon atom is a carbon atom constituting a carbonyl group, that is, when forming an amide group together with a nitrogen atom, it is not limited thereto.

式（B1）、（B2）中，關於Rb 1、Rb 2及Rb 3，該等中至少1個包含環狀結構為較佳，至少2個包含環狀結構為更佳。作為環狀結構，可以係單環及縮合環中的任一種，單環或由2個單環縮合而成之縮合環為較佳。單環係5員環或6員環為較佳，6員環為更佳。單環係環己烷環及苯環為較佳，環己烷環為更佳。 In formulas (B1) and (B2), regarding Rb 1 , Rb 2 , and Rb 3 , at least one of them preferably has a cyclic structure, and at least two of them have a cyclic structure. The cyclic structure may be either a monocyclic ring or a condensed ring, and a monocyclic or condensed ring formed by condensing two monocyclic rings is preferable. A single ring is preferably a 5-membered ring or a 6-membered ring, more preferably a 6-membered ring. Monocyclic cyclohexane ring and benzene ring are preferred, and cyclohexane ring is more preferred.

更具體而言，Rb 1及Rb 2係氫原子、烷基（碳數1～24為較佳，2～18為更佳，3～12為進一步較佳）、烯基（碳數2～24為較佳，2～18為更佳，3～12為進一步較佳）、芳基（碳數6～22為較佳，6～18為更佳，6～10為進一步較佳）或芳基烷基（碳數7～25為較佳，7～19為更佳，7～12為進一步較佳）為較佳。該等基團在發揮本發明的效果之範圍內可以具有取代基。Rb 1與Rb 2可以相互鍵結而形成環。作為所形成之環，4～7員的含氮雜環為較佳。Rb 1及Rb 2尤其係可以具有取代基之直鏈、支鏈或環狀的烷基（碳數1～24為較佳，2～18為更佳，3～12為進一步較佳）為較佳，可以具有取代基之環烷基（碳數3～24為較佳，3～18為更佳，3～12為進一步較佳）為更佳，可以具有取代基之環己基為進一步較佳。 More specifically, Rb 1 and Rb 2 are hydrogen atoms, alkyl groups (preferably 1 to 24 carbons, more preferably 2 to 18, more preferably 3 to 12), alkenyl (2 to 24 carbons is preferred, 2-18 is more preferred, 3-12 is further preferred), aryl (6-22 carbons is preferred, 6-18 is more preferred, 6-10 is further preferred) or aryl An alkyl group (preferably having 7 to 25 carbon atoms, more preferably having 7 to 19 carbon atoms, and still more preferably having 7 to 12 carbon atoms) is more preferred. These groups may have substituents within the range in which the effects of the present invention are exhibited. Rb 1 and Rb 2 may be bonded to each other to form a ring. As the formed ring, a nitrogen-containing heterocyclic ring with 4 to 7 members is preferable. In particular, Rb 1 and Rb 2 are linear, branched or cyclic alkyl groups (preferably 1 to 24 carbons, more preferably 2 to 18, and further preferably 3 to 12) which may have substituents. Preferably, a cycloalkyl group that may have a substituent (preferably 3 to 24 carbons, more preferably 3 to 18, and even more preferably 3 to 12) is more preferred, and a cyclohexyl group that may have a substituent is even more preferred .

作為Rb 3，可以舉出烷基（碳數1～24為較佳，2～18為更佳，3～12為進一步較佳）、芳基（碳數6～22為較佳，6～18為更佳，6～10為進一步較佳）、烯基（碳數2～24為較佳，2～12為更佳，2～6為進一步較佳）、芳基烷基（碳數7～23為較佳，7～19為更佳，7～12為進一步較佳）、芳基烯基（碳數8～24為較佳，8～20為更佳，8～16為進一步較佳）、烷氧基（碳數1～24為較佳，2～18為更佳，3～12為進一步較佳）、芳氧基（碳數6～22為較佳，6～18為更佳，6～12為進一步較佳）或芳基烷氧基（碳數7～23為較佳，7～19為更佳，7～12為進一步較佳）。其中，環烷基（碳數3～24為較佳，3～18為更佳，3～12為進一步較佳）、芳基烯基、芳基烷氧基為較佳。Rb 3在發揮本發明的效果之範圍內可以進一步具有取代基。 Examples of Rb 3 include alkyl (preferably 1-24 carbons, more preferably 2-18, still more preferably 3-12), aryl (preferably 6-22 carbons, 6-18 is more preferred, 6-10 is further preferred), alkenyl (carbon number 2-24 is preferred, 2-12 is more preferred, 2-6 is further preferred), arylalkyl (carbon number 7- 23 is preferred, 7-19 is more preferred, 7-12 is further preferred), aryl alkenyl (8-24 carbons is preferred, 8-20 is more preferred, 8-16 is further preferred) , Alkoxy (preferably 1-24 carbons, more preferably 2-18, further preferably 3-12), aryloxy (preferably 6-22 carbons, more preferably 6-18, 6-12 is more preferable) or arylalkoxy group (the carbon number is 7-23 is preferable, 7-19 is more preferable, 7-12 is still more preferable). Among them, cycloalkyl groups (preferably having 3 to 24 carbon atoms, more preferably having 3 to 18 carbon atoms, and still more preferably having 3 to 12 carbon atoms), arylalkenyl groups and arylalkoxy groups are preferred. Rb 3 may further have a substituent within the range of exhibiting the effect of the present invention.

式（B1）所表示之化合物係下述式（B1-1）或下述式（B1-2）所表示之化合物為較佳。 [化學式50]

Figure 02_image099
The compound represented by the formula (B1) is preferably a compound represented by the following formula (B1-1) or the following formula (B1-2). [chemical formula 50]
Figure 02_image099

式中，Rb 11及Rb 12以及Rb 31及Rb 32分別與式（B1）中的Rb 1及Rb 2相同。 Rb 13為烷基（碳數1～24為較佳，2～18為更佳，3～12為進一步較佳）、烯基（碳數2～24為較佳，2～18為更佳，3～12為進一步較佳）、芳基（碳數6～22為較佳，6～18為更佳，6～12為進一步較佳）、芳基烷基（碳數7～23為較佳，7～19為更佳，7～12為進一步較佳），在發揮本發明的效果之範圍內可以具有取代基。其中，Rb 13係芳基烷基為較佳。 In the formula, Rb 11 and Rb 12 and Rb 31 and Rb 32 are the same as Rb 1 and Rb 2 in the formula (B1), respectively. Rb 13 is alkyl (preferably 1-24 carbons, more preferably 2-18, further preferably 3-12), alkenyl (preferably 2-24 carbons, more preferably 2-18, 3-12 is more preferred), aryl (6-22 carbons is preferred, 6-18 is more preferred, 6-12 is further preferred), arylalkyl (7-23 carbons is preferred , 7-19 is more preferable, 7-12 is still more preferable), and may have a substituent within the range which exhibits the effect of this invention. Among them, Rb 13 is arylalkyl is preferred.

Rb 33及Rb 34分別獨立地係氫原子、烷基（碳數1～12為較佳，1～8為更佳，1～3為進一步較佳）、烯基（碳數2～12為較佳，2～8為更佳，2～3為進一步較佳）、芳基（碳數6～22為較佳，6～18為更佳，6～10為進一步較佳）、芳基烷基（碳數7～23為較佳，7～19為更佳，7～11為進一步較佳），氫原子為較佳。 Rb 33 and Rb 34 are independently a hydrogen atom, an alkyl group (preferably 1-12 carbons, more preferably 1-8, more preferably 1-3), alkenyl (2-12 carbons are relatively preferably, 2-8 is more preferred, 2-3 is further preferred), aryl (6-22 carbons is preferred, 6-18 is preferred, 6-10 is further preferred), arylalkyl (The carbon number is preferably 7-23, more preferably 7-19, and still more preferably 7-11), and a hydrogen atom is more preferable.

Rb 35係烷基（碳數1～24為較佳，1～12為更佳，3～8為進一步較佳）、烯基（碳數2～12為較佳，2～10為更佳，3～8為進一步較佳）、芳基（碳數6～22為較佳，6～18為更佳，6～12為進一步較佳）、芳基烷基（碳數7～23為較佳，7～19為更佳，7～12為進一步較佳），芳基為較佳。 Rb 35 is alkyl (preferably 1-24 carbons, more preferably 1-12, further preferably 3-8), alkenyl (preferably 2-12 carbons, more preferably 2-10, 3-8 is more preferred), aryl (6-22 carbons is more preferred, 6-18 is more preferred, 6-12 is further preferred), arylalkyl (7-23 carbons is preferred , 7-19 is more preferred, 7-12 is further preferred), aryl is preferred.

式（B1-1）所表示之化合物係式（B1-1a）所表示之化合物亦較佳。 [化學式51]

Figure 02_image101
It is also preferable that the compound represented by the formula (B1-1) is a compound represented by the formula (B1-1a). [chemical formula 51]
Figure 02_image101

Rb 11及Rb 12與式（B1-1）中的Rb 11及Rb 12同義。 Rb 15及Rb 16係氫原子、烷基（碳數1～12為較佳，1～6為更佳，1～3為進一步較佳）、烯基（碳數2～12為較佳，2～6為更佳，2～3為進一步較佳）、芳基（碳數6～22為較佳，6～18為更佳，6～10為進一步較佳）、芳基烷基（碳數7～23為較佳，7～19為更佳，7～11為進一步較佳），氫原子或甲基為較佳。 Rb 17係烷基（碳數1～24為較佳，1～12為更佳，3～8為進一步較佳）、烯基（碳數2～12為較佳，2～10為更佳，3～8為進一步較佳）、芳基（碳數6～22為較佳，6～18為更佳，6～12為進一步較佳）、芳基烷基（碳數7～23為較佳，7～19為更佳，7～12為進一步較佳），其中芳基為較佳。 Rb 11 and Rb 12 are synonymous with Rb 11 and Rb 12 in formula (B1-1). Rb 15 and Rb 16 are hydrogen atoms, alkyl (preferably 1-12 carbons, more preferably 1-6, further preferably 1-3), alkenyl (preferably 2-12 carbons, 2 ～6 is more preferred, 2～3 is further preferred), aryl group (carbon number 6～22 is preferred, 6～18 is more preferred, 6～10 is further preferred), arylalkyl group (carbon number 7-23 is preferable, 7-19 is more preferable, 7-11 is still more preferable), a hydrogen atom or a methyl group is preferable. Rb 17 is alkyl (preferably 1-24 carbons, more preferably 1-12, further preferably 3-8), alkenyl (preferably 2-12 carbons, more preferably 2-10, 3-8 is more preferred), aryl (6-22 carbons is more preferred, 6-18 is more preferred, 6-12 is further preferred), arylalkyl (7-23 carbons is preferred , 7-19 is more preferred, 7-12 is further preferred), among which aryl is preferred.

[化學式52]

Figure 02_image103
[chemical formula 52]
Figure 02_image103

式（B3）中，L表示在連接相鄰之氧原子和碳原子之連接鏈的路徑上具有飽和烴基的2價的烴基且連接鏈的路徑上的原子數為3以上的烴基。又，R N1及R N2分別獨立地表示1價的有機基團。 In the formula (B3), L represents a divalent hydrocarbon group having a saturated hydrocarbon group on the path of the connecting chain connecting adjacent oxygen atoms and carbon atoms, and the number of atoms on the connecting chain path is 3 or more. Also, R N1 and R N2 each independently represent a monovalent organic group.

在本說明書中，“連接鏈”係指連結連接對象的2個原子或原子組之間之路徑上的原子鏈中以最短（最小原子數）路徑連接該等連接對象者。例如，下述式所表示之化合物中，L由伸苯基伸乙基構成，且具有伸乙基作為飽和烴基，連接鏈由4個碳原子構成，連接鏈的路徑上的原子數（亦即，構成連接鏈之原子的數量，以下亦稱為“連接鏈長”或“連接鏈的長度”。）為4。 [化學式53]

Figure 02_image105
In this specification, "connecting chain" refers to the atom chain on the path between two atoms or atom groups connecting the connecting objects, which connects the connecting objects by the shortest (minimum number of atoms) path. For example, in the compound represented by the following formula, L is composed of phenylene ethylenyl, and has ethylenyl as a saturated hydrocarbon group, the connecting chain is composed of 4 carbon atoms, and the number of atoms on the path of the connecting chain (that is, the number of atoms constituting The number of atoms connecting the chain, hereinafter also referred to as "the length of the connecting chain" or "the length of the connecting chain".) is 4. [chemical formula 53]
Figure 02_image105

式（B3）中的L中的碳數（亦包括連接鏈中的碳原子以外的碳原子）係3～24為較佳。上限係12以下為更佳，10以下為進一步較佳，8以下為特佳。下限係4以上為更佳。從迅速進行上述分子內環化反應之觀點考慮，L的連接鏈長的上限係12以下為較佳，8以下為更佳，6以下為進一步較佳，5以下為特佳。尤其，L的連接鏈長係4或5為較佳，4為最佳。作為鹼產生劑的具體的較佳化合物，例如亦可以舉出國際公開第2020/066416號的段落號0102～0168中所記載之化合物、國際公開第2018/038002號的段落號0143～0177中所記載之化合物。It is preferable that the number of carbons in L in formula (B3) (including carbon atoms other than the carbon atoms in the connecting chain) is 3-24. The upper limit is more preferably 12 or less, further preferably 10 or less, and particularly preferably 8 or less. The lower limit is more preferably 4 or more. From the viewpoint of rapidly advancing the intramolecular cyclization reaction, the upper limit of the linking chain length of L is preferably 12 or less, more preferably 8 or less, further preferably 6 or less, and particularly preferably 5 or less. In particular, the connecting chain length of L is 4 or 5, and 4 is the best. Specific preferred compounds of the base generator include, for example, the compounds described in paragraphs 0102 to 0168 of International Publication No. 2020/066416, and the compounds described in paragraphs 0143 to 0177 of International Publication No. 2018/038002. listed compounds.

又，鹼產生劑包含下述式（N1）所表示之化合物亦較佳。 [化學式54]

Figure 02_image107
Moreover, it is also preferable that a base generator contains the compound represented by following formula (N1). [chemical formula 54]
Figure 02_image107

式（N1）中，R N1及R N2分別獨立地表示1價的有機基團，R C1表示氫原子或保護基，L表示2價的連接基。 In formula (N1), R N1 and R N2 each independently represent a monovalent organic group, R C1 represents a hydrogen atom or a protecting group, and L represents a divalent linking group.

L係2價的連接基，2價的有機基團為較佳。連接基的連接鏈長係1以上為較佳，2以上為更佳。作為上限，12以下為較佳，8以下為更佳，5以下為進一步較佳。連接鏈長係在式中的2個羰基之間成為最短路程之原子排列上存在之原子的數量。L is a divalent linking group, preferably a divalent organic group. The linking chain length of the linking group is preferably 1 or more, more preferably 2 or more. As an upper limit, 12 or less is preferable, 8 or less is more preferable, and 5 or less is still more preferable. The linking chain length is the number of atoms present on the arrangement of atoms that becomes the shortest distance between two carbonyl groups in the formula.

式（N1）中，R N1及R N2分別獨立地表示1價的有機基團（碳數1～24為較佳，2～18為更佳，3～12為進一步較佳），烴基（碳數1～24為較佳，1～12為更佳，1～10為進一步較佳）為較佳，具體而言，能夠舉出脂肪族烴基（碳數1～24為較佳，1～12為更佳，1～10為進一步較佳）或芳香族烴基（碳數6～22為較佳，6～18為更佳，6～10為進一步較佳），脂肪族烴基為較佳。若使用脂肪族烴基作為R N1及R N2，則所產生之鹼的鹼性高，因此為較佳。另外，脂肪族烴基及芳香族烴基可以具有取代基，又，脂肪族烴基及芳香族烴基可以在脂肪族烴鏈中或芳香環中、取代基中具有氧原子。尤其，可以例示出脂肪族烴基在烴鏈中具有氧原子之態樣。 In formula (N1), R N1 and R N2 independently represent a monovalent organic group (preferably 1-24 carbons, more preferably 2-18, more preferably 3-12), hydrocarbon group (carbon 1 to 24 is preferred, 1 to 12 is more preferred, and 1 to 10 is further preferred), and specifically, aliphatic hydrocarbon groups can be mentioned (preferably 1 to 24 carbons, 1 to 12 more preferably, 1 to 10 are further preferred) or aromatic hydrocarbon groups (6 to 22 carbons are preferred, 6 to 18 are more preferred, 6 to 10 are further preferred), and aliphatic hydrocarbon groups are preferred. When an aliphatic hydrocarbon group is used as R N1 and R N2 , the resulting base has a high basicity, which is preferable. In addition, the aliphatic hydrocarbon group and the aromatic hydrocarbon group may have a substituent, and the aliphatic hydrocarbon group and the aromatic hydrocarbon group may have an oxygen atom in the aliphatic hydrocarbon chain, in the aromatic ring, or in the substituent. In particular, an aspect in which the aliphatic hydrocarbon group has an oxygen atom in the hydrocarbon chain can be exemplified.

作為構成R N1及R N2之脂肪族烴基，可以舉出直鏈或支鏈的鏈狀烷基、環狀烷基、鏈狀烷基與環狀烷基的組合相關之基團、在鏈中具有氧原子之烷基。直鏈或支鏈的鏈狀烷基係碳數1～24者為較佳，2～18為更佳，3～12為進一步較佳。直鏈或支鏈的鏈狀烷基例如可以舉出甲基、乙基、丙基、丁基、戊基、己基、庚基、辛基、壬基、癸基、十一基、十二基、異丙基、異丁基、二級丁基、三級丁基、異戊基、新戊基、三級戊基、異己基等。 環狀烷基係碳數3～12者為較佳，3～6為更佳。環狀烷基例如可以舉出環丙基、環丁基、環戊基、環己基、環辛基等。 鏈狀烷基與環狀烷基的組合相關之基團係碳數4～24者為較佳，4～18為更佳，4～12為進一步較佳。鏈狀烷基與環狀烷基的組合相關之基團例如可以舉出環己基甲基、環己基乙基、環己基丙基、甲基環己基甲基、乙基環己基乙基等。 在鏈中具有氧原子之烷基係碳數2～12者為較佳，2～6為更佳，2～4為進一步較佳。在鏈中具有氧原子之烷基可以為鏈狀，亦可以為環狀，且可以為直鏈，亦可以為支鏈。 其中，在提高後述的分解生成鹼的沸點之觀點上，R N1及R N2係碳數5～12的烷基為較佳。其中，在重視與金屬（例如銅）的層積層時的密接性之配方中，具有環狀的烷基之基團或碳數1～8的烷基為較佳。 Examples of the aliphatic hydrocarbon groups constituting R N1 and R N2 include linear or branched chain alkyl groups, cyclic alkyl groups, groups related to combinations of chain alkyl groups and cyclic alkyl groups, groups in the chain An alkyl group having an oxygen atom. The linear or branched chain alkyl group preferably has 1 to 24 carbon atoms, more preferably 2 to 18 carbon atoms, and even more preferably 3 to 12 carbon atoms. Examples of linear or branched chain alkyl include methyl, ethyl, propyl, butyl, pentyl, hexyl, heptyl, octyl, nonyl, decyl, undecyl, dodecyl , isopropyl, isobutyl, secondary butyl, tertiary butyl, isopentyl, neopentyl, tertiary pentyl, isohexyl, etc. The cyclic alkyl group is preferably one with 3-12 carbon atoms, and more preferably 3-6 carbon atoms. As a cyclic alkyl group, a cyclopropyl group, a cyclobutyl group, a cyclopentyl group, a cyclohexyl group, a cyclooctyl group etc. are mentioned, for example. The group related to the combination of a chain alkyl group and a cyclic alkyl group is preferably one with 4-24 carbon atoms, more preferably 4-18 carbon atoms, and even more preferably 4-12 carbon atoms. Examples of groups related to the combination of a chain alkyl group and a cyclic alkyl group include cyclohexylmethyl group, cyclohexylethyl group, cyclohexylpropyl group, methylcyclohexylmethyl group, ethylcyclohexylethyl group and the like. The alkyl group having an oxygen atom in the chain has preferably 2-12 carbon atoms, more preferably 2-6 carbon atoms, and still more preferably 2-4 carbon atoms. The alkyl group having an oxygen atom in the chain may be chain or cyclic, and may be linear or branched. Among them, R N1 and R N2 are preferably alkyl groups having 5 to 12 carbon atoms from the viewpoint of increasing the boiling point of the bases to be decomposed and produced as described later. Among them, a group having a cyclic alkyl group or an alkyl group having 1 to 8 carbon atoms is preferable in formulations that place emphasis on the adhesiveness of the laminated layer with a metal (for example, copper).

R N1及R N2可以相互連接而形成環狀結構。形成環狀結構之情況下，可以在鏈中具有氧原子等。又，R N1及R N2所形成之環狀結構可以係單環，亦可以係縮合環，但單環為較佳。作為所形成之環狀結構，式（N1）中的含有氮原子之5員環或6員環為較佳，例如可以舉出吡咯環、咪唑環、吡唑環、吡咯啉環、吡咯啶環、咪唑啶環、吡唑環、哌啶環、哌𠯤環、嗎啉環等，可以較佳地舉出吡咯啉環、吡咯啶環、哌啶環、哌𠯤環、嗎啉環。 R N1 and R N2 may be connected to each other to form a ring structure. When forming a ring structure, an oxygen atom etc. may be contained in a chain. Also, the ring structure formed by R N1 and R N2 may be a single ring or a condensed ring, but a single ring is preferred. As the formed ring structure, a 5-membered ring or a 6-membered ring containing a nitrogen atom in formula (N1) is preferable, for example, pyrrole ring, imidazole ring, pyrazole ring, pyrroline ring, pyrrolidine ring , imidazolidine ring, pyrazole ring, piperidine ring, piperidine ring, morpholine ring, etc., preferably pyrroline ring, pyrrolidine ring, piperidine ring, piperridine ring, and morpholine ring.

R C1表示氫原子或保護基，氫原子為較佳。 R C1 represents a hydrogen atom or a protecting group, preferably a hydrogen atom.

作為保護基，藉由酸或鹼的作用而分解之保護基為較佳，可以較佳地舉出藉由酸而分解之保護基。As the protecting group, a protecting group decomposed by the action of an acid or a base is preferable, and a protecting group decomposed by an acid is preferably used.

作為保護基的具體例，可以舉出鏈狀或環狀的烷基或在鏈中具有氧原子之鏈狀或環狀的烷基。作為鏈狀或環狀的烷基，可以舉出甲基、乙基、異丙基、第三丁基、環己基等。作為在鏈中具有氧原子之鏈狀的烷基，具體而言，可以舉出烷氧基烷基，進一步具體而言，可以舉出甲氧基甲基（MOM）基團、乙氧基乙基（EE）基團等。作為在鏈中具有氧原子之環狀的烷基，可以舉出環氧基、縮水甘油基、氧雜環丁基、四氫呋喃基、四氫吡喃（THP）基等。Specific examples of the protecting group include chain or cyclic alkyl groups or chain or cyclic alkyl groups having an oxygen atom in the chain. A methyl group, an ethyl group, an isopropyl group, a tert-butyl group, a cyclohexyl group, etc. are mentioned as a chain-like or cyclic alkyl group. As the chain-like alkyl group having an oxygen atom in the chain, specifically, an alkoxyalkyl group, more specifically, a methoxymethyl (MOM) group, an ethoxyethyl group, base (EE) group, etc. Examples of the cyclic alkyl group having an oxygen atom in the chain include epoxy group, glycidyl group, oxetanyl group, tetrahydrofuryl group, tetrahydropyranyl (THP) group, and the like.

作為構成L之2價的連接基並沒有特別規定，但烴基為較佳，脂肪族烴基為更佳。烴基可以具有取代基，又，可以在烴鏈中具有碳原子以外的種類的原子。更具體而言，可以在鏈中具有氧原子之2價的烴連接基為較佳，可以在鏈中具有氧原子之2價的脂肪族烴基、2價的芳香族烴基或可以在鏈中具有氧原子之2價的脂肪族烴基與2價的芳香族烴基的組合相關之基團為更佳，可以在鏈中具有氧原子之2價的脂肪族烴基為進一步較佳。該等基不具有氧原子為較佳。 2價的烴連接基係碳數1～24者為較佳，2～12為更佳，2～6為進一步較佳。2價的脂肪族烴基係碳數1～12者為較佳，2～6為更佳，2～4為進一步較佳。2價的芳香族烴基係碳數6～22者為較佳，6～18為更佳，6～10為進一步較佳。2價的脂肪族烴基與2價的芳香族烴基的組合相關之基團（例如，伸芳基烷基）係碳數7～22者為較佳，7～18為更佳，7～10為進一步較佳。 The divalent linking group constituting L is not particularly defined, but a hydrocarbon group is preferred, and an aliphatic hydrocarbon group is more preferred. The hydrocarbon group may have a substituent, and may have atoms other than carbon atoms in the hydrocarbon chain. More specifically, a divalent hydrocarbon linking group that may have an oxygen atom in the chain is preferable, a divalent aliphatic hydrocarbon group that may have an oxygen atom in the chain, a divalent aromatic hydrocarbon group, or a divalent aromatic hydrocarbon group that may have an oxygen atom in the chain. A group related to a combination of a divalent aliphatic hydrocarbon group of an oxygen atom and a divalent aromatic hydrocarbon group is more preferable, and a divalent aliphatic hydrocarbon group which may have an oxygen atom in the chain is still more preferable. Such groups preferably do not have an oxygen atom. The divalent hydrocarbon linking group is preferably one having 1 to 24 carbon atoms, more preferably 2 to 12 carbon atoms, and still more preferably 2 to 6 carbon atoms. The divalent aliphatic hydrocarbon group has preferably 1-12 carbon atoms, more preferably 2-6 carbon atoms, and still more preferably 2-4 carbon atoms. The divalent aromatic hydrocarbon group has preferably 6-22 carbon atoms, more preferably 6-18 carbon atoms, and still more preferably 6-10 carbon atoms. The group related to the combination of divalent aliphatic hydrocarbon group and divalent aromatic hydrocarbon group (for example, arylalkyl group) is preferably one with 7 to 22 carbon atoms, more preferably 7 to 18, and 7 to 10 is Further better.

作為連接基L，具體而言，直鏈或支鏈的鏈狀伸烷基、環狀伸烷基、鏈狀伸烷基與環狀伸烷基的組合相關之基團、在鏈中具有氧原子之伸烷基、直鏈或支鏈的鏈狀的伸烯基、環狀的伸烯基、伸芳基、伸芳基伸烷基為較佳。 直鏈或支鏈的鏈狀伸烷基係碳數1～12者為較佳，2～6為更佳，2～4為進一步較佳。 環狀伸烷基係碳數3～12者為較佳，3～6為更佳。 鏈狀伸烷基與環狀伸烷基的組合相關之基團係碳數4～24者為較佳，4～12為更佳，4～6為進一步較佳。 在鏈中具有氧原子之伸烷基可以係鏈狀，亦可以係環狀，且可以係直鏈，亦可以係支鏈。在鏈中具有氧原子之伸烷基係碳數1～12者為較佳，1～6為更佳，1～3為進一步較佳。 As the linking group L, specifically, a linear or branched chain alkylene group, a cyclic alkylene group, a group related to a combination of a chain alkylene group and a cyclic alkylene group, and an oxygen group in the chain. Atomic alkylene groups, linear or branched chain alkenylene groups, cyclic alkenylene groups, arylylene groups, and arylylenealkylene groups are preferred. The linear or branched chain alkylene group has preferably 1-12 carbon atoms, more preferably 2-6 carbon atoms, and still more preferably 2-4 carbon atoms. The carbon number of the cyclic alkylene system is 3-12, more preferably 3-6. The group related to the combination of chain alkylene and cyclic alkylene is preferably one with 4-24 carbon atoms, more preferably 4-12 carbon atoms, and even more preferably 4-6 carbon atoms. The alkylene group having an oxygen atom in the chain may be a chain or a ring, and may be a straight chain or a branched chain. The alkylene group having an oxygen atom in the chain has preferably 1-12 carbon atoms, more preferably 1-6 carbon atoms, and still more preferably 1-3 carbon atoms.

直鏈或支鏈的鏈狀的伸烯基係碳數2～12者為較佳，2～6為更佳，2～3為進一步較佳。直鏈或支鏈的鏈狀的伸烯基的C=C鍵的數量係1～10為較佳，1～6為更佳，1～3為進一步較佳。 環狀的伸烯基係碳數3～12者為較佳，3～6為更佳。環狀的伸烯基的C=C鍵的數量係1～6為較佳，1～4為更佳，1～2為進一步較佳。 伸芳基係碳數6～22者為較佳，6～18為更佳，6～10為進一步較佳。 伸芳基伸烷基係碳數7～23者為較佳，7～19為更佳，7～11為進一步較佳。 其中，鏈狀伸烷基、環狀伸烷基、在鏈中具有氧原子之伸烷基、鏈狀的伸烯基、伸芳基、伸芳基伸烷基為較佳，1,2-伸乙基、丙二基（尤其是1,3-丙二基）、環己二基（尤其是1,2- 環己二基）、伸乙烯基（尤其是順式伸乙烯基）、伸苯基（1,2-伸苯基）、伸苯基亞甲基（尤其是1,2-伸苯基亞甲基）、伸乙氧基伸乙基（尤其是1,2-伸乙氧基-1,2-伸乙基）為更佳。 The linear or branched chain alkenylene group has preferably 2-12 carbon atoms, more preferably 2-6 carbon atoms, and still more preferably 2-3 carbon atoms. The number of C=C bonds in the linear or branched alkenylene group is preferably 1-10, more preferably 1-6, and even more preferably 1-3. The cyclic alkenylene group has preferably 3-12 carbon atoms, more preferably 3-6 carbon atoms. The number of C=C bonds in the cyclic alkenylene group is preferably 1-6, more preferably 1-4, and even more preferably 1-2. The carbon number of the aryl group is preferably 6-22, more preferably 6-18, and still more preferably 6-10. The arylalkylene group has preferably 7-23 carbon atoms, more preferably 7-19, and still more preferably 7-11. Among them, chain alkylene, cyclic alkylene, alkylene having an oxygen atom in the chain, chain alkenylene, arylylene, arylylene alkylene are preferred, and 1,2-alkylene Ethyl, propanediyl (especially 1,3-propanediyl), cyclohexanediyl (especially 1,2-cyclohexanediyl), vinylene (especially cis-vinylene), phenylene (1,2-phenylene), phenylene methylene (especially 1,2-phenylene methylene), ethoxyethylene (especially 1,2-ethoxy- 1,2-ethylene) is more preferred.

作為鹼產生劑，可以舉出下述例子，但本發明不應解釋為受其限定。As the base generating agent, the following examples can be mentioned, but the present invention should not be construed as being limited thereto.

[化學式55]

Figure 02_image109
[chemical formula 55]
Figure 02_image109

非離子型鹼產生劑的分子量係800以下為較佳，600以下為更佳，500以下為進一步較佳。作為下限，100以上為較佳，200以上為更佳，300以上為進一步較佳。The molecular weight of the nonionic base generator is preferably 800 or less, more preferably 600 or less, and still more preferably 500 or less. The lower limit is preferably 100 or more, more preferably 200 or more, and still more preferably 300 or more.

作為離子型鹼產生劑的具體的較佳化合物，例如亦可以舉出國際公開第2018/038002號的段落號0148～0163中所記載之化合物。Specific preferred compounds of the ionic base generator include, for example, compounds described in paragraph numbers 0148 to 0163 of International Publication No. 2018/038002.

作為銨鹽的具體例，能夠舉出以下化合物，但本發明並不限定於該等。 [化學式56]

Figure 02_image111
Specific examples of the ammonium salt include the following compounds, but the present invention is not limited thereto. [chemical formula 56]
Figure 02_image111

作為亞胺鎓（Iminium）鹽的具體例，能夠舉出以下化合物，但本發明並不限定於該等。 [化學式57]

Figure 02_image113
Specific examples of iminium (Iminium) salts include the following compounds, but the present invention is not limited thereto. [chemical formula 57]
Figure 02_image113

本發明的樹脂組成物包含鹼產生劑之情況下，相對於本發明的樹脂組成物中的樹脂100質量份，鹼產生劑的含量，係0.1～50質量份為較佳。下限係0.3質量份以上為更佳，0.5質量份以上為進一步較佳。上限係30質量份以下為更佳，20質量份以下為進一步較佳，10質量份以下為進一步較佳，亦可以為5質量份以下，亦可以為4質量份以下。 鹼產生劑能夠使用1種或2種以上。當使用2種以上時，合計量在上述範圍內為較佳。 When the resin composition of the present invention contains a base generator, the content of the base generator is preferably 0.1 to 50 parts by mass relative to 100 parts by mass of the resin in the resin composition of the present invention. The lower limit is more preferably 0.3 parts by mass or more, and more preferably 0.5 parts by mass or more. The upper limit is more preferably 30 parts by mass or less, more preferably 20 parts by mass or less, still more preferably 10 parts by mass or less, may be 5 parts by mass or less, or may be 4 parts by mass or less. The base generator can be used 1 type or 2 or more types. When using 2 or more types, it is preferable that a total amount exists in the said range.

＜溶劑＞ 本發明的樹脂組成物包含溶劑為較佳。 溶劑能夠任意使用公知的溶劑。溶劑較佳為有機溶劑。作為有機溶劑，可以舉出酯類、醚類、酮類、環狀烴類、亞碸類、醯胺類、脲類、醇類等化合物。 <Solvent> It is preferable that the resin composition of the present invention contains a solvent. As the solvent, known solvents can be used arbitrarily. The solvent is preferably an organic solvent. Examples of organic solvents include compounds such as esters, ethers, ketones, cyclic hydrocarbons, sulfides, amides, ureas, and alcohols.

作為酯類，作為較佳者例如可以舉出乙酸乙酯、乙酸正丁酯、乙酸異丁酯、乙酸己酯、甲酸戊酯、乙酸異戊酯、丙酸丁酯、丁酸異丙酯、丁酸乙酯、丁酸丁酯、乳酸甲酯、乳酸乙酯、γ-丁內酯、ε-己內酯、δ-戊內酯、烷氧基乙酸烷基酯（例如，烷氧基乙酸甲酯、烷氧基乙酸乙酯、烷氧基乙酸丁酯（例如，甲氧基乙酸甲酯、甲氧基乙酸乙酯、甲氧基乙酸丁酯、乙氧基乙酸甲酯、乙氧基乙酸乙酯等））、3-烷氧基丙酸烷基酯類（例如，3-烷氧基丙酸甲酯、3-烷氧基丙酸乙酯等（例如，3-甲氧基丙酸甲酯、3-甲氧基丙酸乙酯、3-乙氧基丙酸甲酯、3-乙氧基丙酸乙酯等））、2-烷氧基丙酸烷基酯類（例如，2-烷氧基丙酸甲酯、2-烷氧基丙酸乙酯、2-烷氧基丙酸丙酯等（例如，2-甲氧基丙酸甲酯、2-甲氧基丙酸乙酯、2-甲氧基丙酸丙酯、2-乙氧基丙酸甲酯、2-乙氧基丙酸乙酯））、2-烷氧基-2-甲基丙酸甲酯及2-烷氧基-2-甲基丙酸乙酯（例如，2-甲氧基-2-甲基丙酸甲酯、2-乙氧基-2-甲基丙酸乙酯等）、丙酮酸甲酯、丙酮酸乙酯、丙酮酸丙酯、乙醯乙酸甲酯、乙醯乙酸乙酯、2-氧代丁酸甲酯、2-氧代丁酸乙酯、己酸乙酯、庚酸乙酯、丙二酸二甲酯、丙二酸二乙酯等。As esters, for example, ethyl acetate, n-butyl acetate, isobutyl acetate, hexyl acetate, amyl formate, isoamyl acetate, butyl propionate, isopropyl butyrate, Ethyl butyrate, butyl butyrate, methyl lactate, ethyl lactate, γ-butyrolactone, ε-caprolactone, δ-valerolactone, alkyl alkoxyacetates (e.g., alkoxyacetic acid Methyl ester, ethyl alkoxyacetate, butyl alkoxyacetate (for example, methyl methoxyacetate, ethyl methoxyacetate, butyl methoxyacetate, methyl ethoxyacetate, ethoxy ethyl acetate, etc.)), alkyl 3-alkoxypropionates (e.g., methyl 3-alkoxypropionate, ethyl 3-alkoxypropionate, etc. (e.g., 3-methoxypropionate methyl 3-methoxypropionate, ethyl 3-methoxypropionate, methyl 3-ethoxypropionate, ethyl 3-ethoxypropionate, etc.), alkyl 2-alkoxypropionate (e.g. , methyl 2-alkoxypropionate, ethyl 2-alkoxypropionate, propyl 2-alkoxypropionate, etc. (for example, methyl 2-methoxypropionate, 2-methoxypropionate ethyl 2-methoxypropionate, methyl 2-ethoxypropionate, ethyl 2-ethoxypropionate)), methyl 2-alkoxy-2-methylpropionate and ethyl 2-alkoxy-2-methylpropionate (for example, methyl 2-methoxy-2-methylpropionate, ethyl 2-ethoxy-2-methylpropionate, etc.), Methyl pyruvate, ethyl pyruvate, propyl pyruvate, methyl acetoacetate, ethyl acetoacetate, methyl 2-oxobutyrate, ethyl 2-oxobutyrate, ethyl hexanoate, Ethyl heptanoate, dimethyl malonate, diethyl malonate, etc.

作為醚類，作為較佳者例如可以舉出乙二醇二甲醚、二乙二醇二甲醚、二乙二醇二乙醚、二乙二醇乙基甲醚、二乙二醇丁基甲醚、三乙二醇二甲醚、四乙二醇二甲醚、四氫呋喃、乙二醇單甲醚、乙二醇單乙醚、甲基賽路蘇乙酸酯、乙基賽路蘇乙酸酯、二乙二醇單甲醚、二乙二醇單乙醚、二乙二醇單丁醚、丙二醇單甲醚、丙二醇二甲醚、丙二醇單甲醚乙酸酯、丙二醇單乙醚乙酸酯、乙二醇單丁醚、乙二醇單丁醚乙酸酯、二乙二醇乙基甲醚、丙二醇單丙醚乙酸酯、二丙二醇二甲醚等。As ethers, for example, ethylene glycol dimethyl ether, diethylene glycol dimethyl ether, diethylene glycol diethyl ether, diethylene glycol ethyl methyl ether, diethylene glycol butyl methyl ether, Triethylene glycol dimethyl ether, tetraethylene glycol dimethyl ether, tetrahydrofuran, ethylene glycol monomethyl ether, ethylene glycol monoethyl ether, methyl celuxoacetate, ethyl celuxoacetate, di Ethylene glycol monomethyl ether, diethylene glycol monoethyl ether, diethylene glycol monobutyl ether, propylene glycol monomethyl ether, propylene glycol dimethyl ether, propylene glycol monomethyl ether acetate, propylene glycol monoethyl ether acetate, ethylene glycol Monobutyl ether, ethylene glycol monobutyl ether acetate, diethylene glycol ethyl methyl ether, propylene glycol monopropyl ether acetate, dipropylene glycol dimethyl ether, etc.

作為酮類，作為較佳者例如可以舉出甲基乙基酮、環己酮、環戊酮、2-庚酮、3-庚酮、3-甲基環己酮、左旋葡萄糖酮、二氫左旋葡萄糖酮等。As ketones, for example, methyl ethyl ketone, cyclohexanone, cyclopentanone, 2-heptanone, 3-heptanone, 3-methylcyclohexanone, levoglucosone, dihydro Levoglucosone, etc.

作為環狀烴類，作為較佳者例如可以舉出甲苯、二甲苯、苯甲醚等芳香族烴類、檸檬烯等環式萜烯類。As the cyclic hydrocarbons, aromatic hydrocarbons such as toluene, xylene, and anisole, and cyclic terpenes such as limonene are preferable examples.

作為亞碸類，例如，可以舉出二甲基亞碸作為較佳者。As the arsonites, for example, dimethyl arsonite is preferable.

作為醯胺類，作為較佳者可以舉出N-甲基-2-吡咯啶酮、N-乙基-2-吡咯啶酮、N-環己基-2-吡咯啶酮、N,N-二甲基乙醯胺、N,N-二甲基甲醯胺、N,N-二甲基異丁醯胺、3-甲氧基-N,N-二甲基丙醯胺、3-丁氧基-N,N-二甲基丙醯胺、N-甲醯基嗎啉、N-乙醯基嗎啉等。As amides, N-methyl-2-pyrrolidone, N-ethyl-2-pyrrolidone, N-cyclohexyl-2-pyrrolidone, N,N-di Methylacetamide, N,N-dimethylformamide, N,N-dimethylisobutyramide, 3-methoxy-N,N-dimethylpropionamide, 3-butoxy Base-N,N-dimethylacrylamide, N-formylmorpholine, N-acetylmorpholine, etc.

作為脲類，作為較佳者可以舉出N,N,N’,N’-四甲基脲、1,3-二甲基-2-咪唑啶酮等。As ureas, N,N,N',N'-tetramethylurea, 1,3-dimethyl-2-imidazolidinone, etc. are mentioned preferably.

作為醇類，可以舉出甲醇、乙醇、1-丙醇、2-丙醇、1-丁醇、1-戊醇、1-己醇、苯甲醇、乙二醇單甲醚、1-甲氧基-2-丙醇、2-乙氧基乙醇、二乙二醇單乙醚、二乙二醇單己醚、三乙二醇單甲醚、丙二醇單乙醚、丙二醇單甲醚、聚乙二醇單甲醚、聚丙二醇、四乙二醇、乙二醇單丁醚、乙二醇單苄基醚、乙二醇單苯基醚、甲基苯基甲醇、正戊醇、甲基戊醇及二丙酮醇等。Examples of alcohols include methanol, ethanol, 1-propanol, 2-propanol, 1-butanol, 1-pentanol, 1-hexanol, benzyl alcohol, ethylene glycol monomethyl ether, 1-methoxy 2-propanol, 2-ethoxyethanol, diethylene glycol monoethyl ether, diethylene glycol monohexyl ether, triethylene glycol monomethyl ether, propylene glycol monoethyl ether, propylene glycol monomethyl ether, polyethylene glycol Monomethyl ether, polypropylene glycol, tetraethylene glycol, ethylene glycol monobutyl ether, ethylene glycol monobenzyl ether, ethylene glycol monophenyl ether, methyl phenyl carbinol, n-pentanol, methyl pentanol and diacetone alcohol etc.

從塗佈面性狀的改進等觀點考慮，溶劑係混合2種以上之形態亦較佳。From the viewpoint of improvement of properties of the coated surface, etc., a solvent-based mixture of two or more types is also preferable.

在本發明中，選自3-乙氧基丙酸甲酯、3-乙氧基丙酸乙酯、乙基賽路蘇乙酸酯、乳酸乙酯、二乙二醇二甲醚、乙酸丁酯、3-甲氧基丙酸甲酯、2-庚酮、環己酮、環戊酮、γ-丁內酯、二甲基亞碸、乙基卡必醇乙酸酯、丁基卡必醇乙酸酯、N-甲基-2-吡咯啶酮、丙二醇甲醚及丙二醇甲醚乙酸酯、左旋葡萄糖酮、二氫左旋葡萄糖酮中之一種溶劑或由2種以上構成之混合溶劑為較佳。併用二甲基亞碸和γ-丁內酯或併用N-甲基-2-吡咯啶酮和乳酸乙酯為特佳。In the present invention, selected from the group consisting of methyl 3-ethoxypropionate, ethyl 3-ethoxypropionate, ethyl celuxoacetate, ethyl lactate, diethylene glycol dimethyl ether, butyl acetate Esters, Methyl 3-Methoxypropionate, 2-Heptanone, Cyclohexanone, Cyclopentanone, γ-Butyrolactone, Dimethylsulfene, Ethyl Carbitol Acetate, Butyl Carbitol Alcohol acetate, N-methyl-2-pyrrolidone, propylene glycol methyl ether and propylene glycol methyl ether acetate, levoglucosone, dihydrolevuroglucosone, or a mixed solvent consisting of two or more of them is better. The combined use of dimethylsulfene and γ-butyrolactone or the combined use of N-methyl-2-pyrrolidone and ethyl lactate is particularly preferred.

從塗佈性的觀點考慮，溶劑的含量設為本發明的樹脂組成物的總固體成分濃度成為5～80質量%之量為較佳，設為本發明的樹脂組成物的總固體成分濃度成為5～75質量%之量為更佳，設為本發明的樹脂組成物的總固體成分濃度成為10～70質量%之量為進一步較佳，使本發明的樹脂組成物的總固體成分濃度成為20～70質量%為進一步較佳。溶劑含量依據塗膜的所需厚度和塗佈方法調整即可。From the viewpoint of coatability, the content of the solvent is preferably such that the total solid concentration of the resin composition of the present invention becomes 5 to 80% by mass, and the total solid concentration of the resin composition of the present invention becomes The amount of 5 to 75% by mass is more preferable, and the total solid concentration of the resin composition of the present invention is further preferably 10 to 70% by mass, so that the total solid concentration of the resin composition of the present invention becomes 20-70 mass % is still more preferable. The solvent content can be adjusted according to the desired thickness of the coating film and the coating method.

本發明的樹脂組成物可以僅含有一種溶劑，亦可以含有2種以上。含有2種以上溶劑時，其合計在上述範圍為較佳。The resin composition of this invention may contain only 1 type of solvent, and may contain 2 or more types. When two or more kinds of solvents are contained, it is preferable that the total thereof is within the above-mentioned range.

＜金屬接著性改進劑＞ 本發明的樹脂組成物包含用於提高與用於電極或配線等中之金屬材料的接著性之金屬接著性改進劑為較佳。作為金屬接著性改進劑，可以舉出具有烷氧基甲矽烷基之矽烷偶合劑、鋁系接著助劑、鈦系接著助劑、具有磺醯胺結構之化合物及具有硫基脲結構之化合物、磷酸衍生物化合物、β酮酸酯（keto ester）化合物、胺基化合物等。 ＜Metal adhesion improver＞ It is preferable that the resin composition of the present invention contains a metal adhesion improver for improving adhesion with metal materials used for electrodes, wiring, and the like. Examples of metal adhesion improvers include silane coupling agents having an alkoxysilyl group, aluminum-based adhesive additives, titanium-based adhesive additives, compounds having a sulfonamide structure, and compounds having a thiourea structure, Phosphoric acid derivative compounds, β keto ester compounds, amine compounds, etc.

〔矽烷偶合劑〕 作為矽烷偶合劑，例如可以舉出國際公開第2015/199219號的0167段中所記載之化合物、日本特開2014-191002號公報的0062～0073段中所記載之化合物、國際公開第2011/080992號的0063～0071段中所記載之化合物、日本特開2014-191252號公報的0060～0061段中所記載之化合物、日本特開2014-041264號公報的0045～0052段中所記載之化合物、國際公開第2014/097594號的0055段中所記載之化合物、日本特開2018-173573的0067～0078段中所記載之化合物，該等內容被編入本說明書中。又，如日本特開2011-128358號公報的0050～0058段中所記載，使用2種以上不同之矽烷偶合劑亦較佳。又，矽烷偶合劑使用下述化合物亦較佳。以下式中，Me表示甲基，Et表示乙基。 〔Silane coupling agent〕 Examples of the silane coupling agent include compounds described in paragraph 0167 of International Publication No. 2015/199219, compounds described in paragraphs 0062 to 0073 of Japanese Patent Application Laid-Open No. 2014-191002, and compounds described in paragraphs 0073 and 2011/080992 of International Publication No. 2011/080992. Compounds described in paragraphs 0063 to 0071 of Japanese Patent Application Laid-Open No. 2014-191252, compounds described in paragraphs 0060 to 0061 of Japanese Patent Application Laid-Open No. 2014-191252, compounds described in paragraphs 0045 to 0052 of Japanese Patent Application Laid-Open No. 2014-041264, The compounds described in paragraph 0055 of International Publication No. 2014/097594, and the compounds described in paragraphs 0067 to 0078 of Japanese Patent Application Laid-Open No. 2018-173573 are incorporated in this specification. Also, as described in paragraphs 0050 to 0058 of JP-A-2011-128358, it is also preferable to use two or more different silane coupling agents. Moreover, it is also preferable to use the following compound as a silane coupling agent. In the following formulae, Me represents a methyl group, and Et represents an ethyl group.

[化學式58]

Figure 02_image115
[chemical formula 58]
Figure 02_image115

作為其他矽烷偶合劑，例如可以舉出乙烯基三甲氧基矽烷、乙烯基三乙氧基矽烷、2-（3,4-環氧環己基）乙基三甲氧基矽烷、3-環氧丙氧基丙基甲基二甲氧基矽烷、3-環氧丙氧基丙基三甲氧基矽烷、3-環氧丙氧基丙基甲基二乙氧基矽烷、3-環氧丙氧基丙基三乙氧基矽烷、對苯乙烯基三甲氧基矽烷、3-甲基丙烯醯氧基丙基甲基二甲氧基矽烷、3-甲基丙烯醯氧基丙基三甲氧基矽烷、3-甲基丙烯醯氧基丙基甲基二乙氧基矽烷、3-甲基丙烯醯氧基丙基三乙氧基矽烷、3-丙烯醯氧基丙基三甲氧基矽烷、N-2-（胺基乙基）-3-胺基丙基甲基二甲氧基矽烷、N-2-（胺基乙基）-3-胺基丙基三甲氧基矽烷、3-胺基丙基三甲氧基矽烷、3-胺基丙基三乙氧基矽烷、3-三乙氧基甲矽烷基-N-（1,3-二甲基-亞丁基）丙胺、N-苯基-3-胺基丙基三甲氧基矽烷、三-（三甲氧基甲矽烷基丙基）異氰脲酸酯、3-脲基丙基三烷氧基矽烷、3-巰基丙基甲基二甲氧基矽烷、3-巰基丙基三甲氧基矽烷、3-異氰酸酯丙基三乙氧基矽烷、3-三甲氧基甲矽烷基丙基琥珀酸酐。該等能夠單獨使用1種或者組合使用2種以上。Examples of other silane coupling agents include vinyltrimethoxysilane, vinyltriethoxysilane, 2-(3,4-epoxycyclohexyl)ethyltrimethoxysilane, 3-glycidoxy 3-Glycidoxypropylmethyldimethoxysilane, 3-Glycidoxypropyltrimethoxysilane, 3-Glycidoxypropylmethyldiethoxysilane, 3-Glycidoxypropyl Triethoxysilane, p-Styryltrimethoxysilane, 3-Methacryloxypropylmethyldimethoxysilane, 3-Methacryloxypropyltrimethoxysilane, 3 -Methacryloxypropylmethyldiethoxysilane, 3-methacryloxypropyltriethoxysilane, 3-acryloxypropyltrimethoxysilane, N-2- (Aminoethyl)-3-aminopropylmethyldimethoxysilane, N-2-(aminoethyl)-3-aminopropyltrimethoxysilane, 3-aminopropyltrimethoxysilane Oxysilane, 3-aminopropyltriethoxysilane, 3-triethoxysilyl-N-(1,3-dimethyl-butylene)propylamine, N-phenyl-3-amine propyltrimethoxysilane, tris-(trimethoxysilylpropyl)isocyanurate, 3-ureidopropyltrialkoxysilane, 3-mercaptopropylmethyldimethoxysilane , 3-mercaptopropyltrimethoxysilane, 3-isocyanatepropyltriethoxysilane, 3-trimethoxysilylpropylsuccinic anhydride. These can be used individually by 1 type or in combination of 2 or more types.

〔鋁系接著助劑〕 作為鋁系接著助劑，例如能夠舉出三（乙醯乙酸乙酯）鋁、三（乙醯丙酮）鋁、乙醯乙酸乙酯鋁二異丙酯等。 〔Aluminum-based adhesive agent〕 Examples of the aluminum-based adhesive agent include tris(acetylacetate)aluminum, tris(acetylacetonate)aluminum, and ethylacetate aluminum diisopropylate.

又，作為其他金屬接著性改進劑，亦能夠使用日本特開2014-186186號公報的0046～0049段中所記載之化合物、日本特開2013-072935號公報的0032～0043段中所記載之硫化物系化合物，該等內容被編入本說明書中。Also, as other metal adhesion improvers, compounds described in paragraphs 0046 to 0049 of JP-A-2014-186186 and vulcanized compounds described in paragraphs 0032-0043 of JP-A-2013-072935 can also be used. system compounds, and these contents are incorporated into this specification.

相對於樹脂100質量份，金屬接著性改進劑的含量較佳為0.01～30質量份，更佳為在0.1～10質量份的範圍內，進一步較佳為在0.5～5質量份的範圍內。藉由設為上述下限值以上，圖案與金屬層的接著性變得良好，藉由設為上述上限值以下，圖案的耐熱性、機械特性變得良好。金屬接著性改進劑可以僅為1種，亦可以為2種以上。使用2種以上之情況下，其合計在上述範圍內為較佳。The content of the metal adhesion improver is preferably in the range of 0.01 to 30 parts by mass, more preferably in the range of 0.1 to 10 parts by mass, and still more preferably in the range of 0.5 to 5 parts by mass with respect to 100 parts by mass of the resin. By setting it as more than the said lower limit, the adhesiveness of a pattern and a metal layer becomes favorable, and by setting it as below the said upper limit, the heat resistance of a pattern, and a mechanical characteristic become favorable. The metal adhesiveness improver may be only 1 type, and may be 2 or more types. When using 2 or more types, it is preferable that the total is within the said range.

＜遷移抑制劑＞ 本發明的樹脂組成物進一步包含遷移抑制劑為較佳。藉由包含遷移抑制劑，能夠有效地抑制源自金屬層（金屬配線）之金屬離子向膜內移動。 ＜Migration Inhibitor＞ It is preferable that the resin composition of this invention further contains a migration inhibitor. By including a migration inhibitor, the migration of metal ions originating in the metal layer (metal wiring) into the film can be effectively suppressed.

作為遷移抑制劑，並沒有特別限制，可以舉出具有雜環（吡咯環、呋喃環、噻吩環、咪唑環、㗁唑環、噻唑環、吡唑環、異㗁唑環、異噻唑環、四唑環、吡啶環、嗒𠯤環、嘧啶環、吡𠯤環、哌啶環、哌𠯤環、嗎啉環、2H-吡喃環及6H-吡喃環、三𠯤環）之化合物、硫脲類及具有氫硫基之化合物、受阻酚系化合物、水楊酸衍生物系化合物、醯肼衍生物系化合物。尤其，能夠較佳地使用1,2,4-三唑、苯并三唑、3-胺基-1,2,4-三唑、3,5-二胺基-1,2,4-三唑等三唑系化合物、1H-四唑、5-苯基四唑、5-胺基-1H-四唑等四唑系化合物。The migration inhibitor is not particularly limited, and examples include heterocyclic rings (pyrrole ring, furan ring, thiophene ring, imidazole ring, azole ring, thiazole ring, pyrazole ring, isoxazole ring, isothiazole ring, Azole ring, pyridine ring, pyranium ring, pyrimidine ring, pyrimidine ring, piperidine ring, piperium ring, morpholine ring, 2H-pyran ring and 6H-pyran ring, tri-pyran ring), thiourea Classes and compounds with mercapto groups, hindered phenolic compounds, salicylic acid derivatives, and hydrazine derivatives. In particular, 1,2,4-triazole, benzotriazole, 3-amino-1,2,4-triazole, 3,5-diamino-1,2,4-triazole can be preferably used Triazole-based compounds such as azoles, tetrazole-based compounds such as 1H-tetrazole, 5-phenyltetrazole, and 5-amino-1H-tetrazole.

或者，亦能夠使用捕捉鹵素離子等陰離子之離子捕捉劑。Alternatively, an ion trapping agent that traps anions such as halogen ions can also be used.

作為其他遷移抑制劑，能夠使用日本特開2013-015701號公報的0094段中所記載之防銹劑、日本特開2009-283711號公報的0073～0076段中所記載之化合物、日本特開2011-059656號公報的0052段中所記載之化合物、日本特開2012-194520號公報的0114、0116及0118段中所記載之化合物、國際公開第2015/199219號的0166段中所記載之化合物等，該等內容被編入本說明書中。As other migration inhibitors, rust inhibitors described in paragraph 0094 of JP 2013-015701 A, compounds described in paragraphs 0073 to 0076 of JP 2009-283711 A, JP 2011 - Compounds described in Paragraph 0052 of Publication No. 059656, compounds described in Paragraphs 0114, 0116 and 0118 of Japanese Patent Application Laid-Open No. 2012-194520, compounds described in Paragraph 0166 of International Publication No. 2015/199219, etc. , which are incorporated into this manual.

作為遷移抑制劑的具體例，可以舉出下述化合物。Specific examples of migration inhibitors include the following compounds.

[化學式59]

Figure 02_image117
[chemical formula 59]
Figure 02_image117

本發明的樹脂組成物具有遷移抑制劑之情況下，遷移抑制劑的含量相對於從本發明的樹脂組成物的總固體成分中去除了填充劑之總質量，係0.01～5.0質量%為較佳，0.05～2.0質量%為更佳，0.1～1.0質量%為進一步較佳。When the resin composition of the present invention has a migration inhibitor, the content of the migration inhibitor is preferably 0.01 to 5.0% by mass relative to the total mass of the resin composition of the present invention excluding fillers from the total solid content. , 0.05-2.0 mass % is more preferable, and 0.1-1.0 mass % is still more preferable.

遷移抑制劑可以係僅1種，亦可以係2種以上。遷移抑制劑係2種以上時，其合計在上述範圍為較佳。The migration inhibitor may be of only one type, or may be of two or more types. When there are two or more types of migration inhibitors, it is preferable that the total thereof is within the above-mentioned range.

＜聚合抑制劑＞ 本發明的樹脂組成物包含聚合抑制劑為較佳。作為聚合抑制劑，可以舉出酚系化合物、醌系化合物、胺基系化合物、N-氧基自由基化合物系化合物、硝基系化合物、亞硝基系化合物、雜芳香環系化合物、金屬化合物等。 ＜Polymerization inhibitor＞ It is preferable that the resin composition of this invention contains a polymerization inhibitor. Examples of polymerization inhibitors include phenolic compounds, quinone-based compounds, amino-based compounds, N-oxyl radical compound-based compounds, nitro-based compounds, nitroso-based compounds, heteroaromatic ring-based compounds, and metal compounds. wait.

作為聚合抑制劑的具體化合物，可以較佳地使用對氫醌、鄰氫醌、鄰甲氧基苯酚、對甲氧基苯酚、二-第三丁基-對甲酚、五倍子酚、對第三丁基鄰苯二酚、1,4-苯醌、二苯基-對苯醌、4,4’-硫代雙（3-甲基-6-第三丁基苯酚）、2,2’-亞甲基雙（4-甲基-6-第三丁基苯酚）、N-亞硝基苯基羥基胺第一鈰鹽、N-亞硝基-N-苯基羥基胺鋁鹽、N-亞硝基二苯胺、N-苯基萘胺、乙二胺四乙酸、1,2-環己烷二胺四乙酸、乙二醇醚二胺四乙酸、2,6-二-第三丁基-4-甲基苯酚、5-亞硝基-8-羥基喹啉、1-亞硝基-2-萘酚、2-亞硝基-1-萘酚、2-亞硝基-5-（N-乙基-N-磺基丙基胺基）苯酚、N-亞硝基-N-（1-萘基）羥胺銨鹽、雙（4-羥基-3,5-第三丁基）苯基甲烷、1,3,5-三（4-第三丁基-3-羥基-2,6-二甲基苄基）-1,3,5-三𠯤-2,4,6-（1H,3H,5H）-三酮、4‐羥基-2,2,6,6-四甲基哌啶1-氧基自由基、2,2,6,6-四甲基哌啶1-氧基自由基、啡噻𠯤、啡㗁𠯤、1,1-二苯基-2-苦基肼、二丁基二硫代胺基甲酸銅（II）、硝基苯、N-亞硝基-N-苯基羥基胺鋁鹽、N-亞硝基-N-苯基羥基胺銨鹽等。又，亦能夠使用日本特開2015-127817號公報的0060段中所記載之聚合抑制劑及國際公開第2015/125469號的0031～0046段中所記載之化合物，該內容被編入本說明書中。As specific compounds of the polymerization inhibitor, p-hydroquinone, o-hydroquinone, o-methoxyphenol, p-methoxyphenol, di-tert-butyl-p-cresol, gallicol, p-tertiary Butylcatechol, 1,4-benzoquinone, diphenyl-p-benzoquinone, 4,4'-thiobis(3-methyl-6-tert-butylphenol), 2,2'- Methylenebis(4-methyl-6-tert-butylphenol), N-nitrosophenylhydroxylamine first cerium salt, N-nitroso-N-phenylhydroxylamine aluminum salt, N- Nitrosodiphenylamine, N-phenylnaphthylamine, ethylenediaminetetraacetic acid, 1,2-cyclohexanediaminetetraacetic acid, glycol ether diaminetetraacetic acid, 2,6-di-tert-butyl -4-methylphenol, 5-nitroso-8-hydroxyquinoline, 1-nitroso-2-naphthol, 2-nitroso-1-naphthol, 2-nitroso-5-( N-ethyl-N-sulfopropylamino)phenol, N-nitroso-N-(1-naphthyl)hydroxylamine ammonium salt, bis(4-hydroxy-3,5-tert-butyl)benzene Methane, 1,3,5-tris(4-tert-butyl-3-hydroxy-2,6-dimethylbenzyl)-1,3,5-tris-2,4,6-(1H ,3H,5H)-trione, 4‐hydroxy-2,2,6,6-tetramethylpiperidine 1-oxyl radical, 2,2,6,6-tetramethylpiperidine 1-oxyl Free radicals, phenanthrene, phenanthrene, 1,1-diphenyl-2-picrylhydrazine, copper (II) dibutyldithiocarbamate, nitrobenzene, N-nitroso-N - phenylhydroxylamine aluminum salt, N-nitroso-N-phenylhydroxylamine ammonium salt, etc. In addition, the polymerization inhibitors described in paragraph 0060 of JP-A-2015-127817 and the compounds described in paragraphs 0031 to 0046 of International Publication No. 2015/125469 can also be used, and these contents are incorporated in this specification.

本發明的樹脂組成物具有聚合抑制劑之情況下，聚合抑制劑的含量相對於從本發明的樹脂組成物的總固體成分中去除了填充劑之總質量，係0.01～20質量%為較佳，0.02～15質量%為更佳，0.05～10質量%為進一步較佳。When the resin composition of the present invention has a polymerization inhibitor, the content of the polymerization inhibitor is preferably 0.01 to 20% by mass relative to the total mass of the resin composition of the present invention excluding fillers from the total solid content. , 0.02-15 mass % is more preferable, and 0.05-10 mass % is still more preferable.

聚合抑制劑可以係僅1種，亦可以係2種以上。聚合抑制劑係2種以上時，其合計在上述範圍為較佳。The polymerization inhibitor may be only one type, or may be two or more types. When there are two or more types of polymerization inhibitors, it is preferable that the total thereof is within the above-mentioned range.

＜酸捕捉劑＞ 為了減少從曝光至加熱為止經時所引起之性能變化，本發明的樹脂組成物含有酸捕捉劑為較佳。在此，酸捕捉劑係指藉由存在於體系中而能夠捕捉產生酸之化合物，酸性度低且pKa高的化合物為較佳。作為酸捕捉劑，具有胺基之化合物為較佳，一級胺、二級胺、三級胺、銨鹽、三級醯胺等為較佳，一級胺、二級胺、三級胺、銨鹽為更佳，二級胺、三級胺、銨鹽為進一步較佳。 作為酸捕捉劑，能夠較佳地舉出具有咪唑結構、二氮雜雙環結構、鎓結構、三烷基胺結構、苯胺結構或吡啶結構之化合物、具有羥基及/或醚鍵之烷基胺衍生物、具有羥基及/或醚鍵之苯胺衍生物等。具有鎓結構之情況下，酸捕捉劑係具有選自銨、重氮、錪、鋶、鏻、吡啶鎓等中之陽離子和酸性度比酸產生劑所產生之酸低的酸的陰離子之鹽為較佳。 ＜Acid Scavenger＞ It is preferable that the resin composition of the present invention contains an acid scavenger in order to reduce performance changes caused by time from exposure to heating. Here, the acid scavenger refers to a compound capable of capturing acid generation by being present in the system, and a compound with low acidity and high pKa is preferable. As an acid scavenger, compounds with amine groups are preferred, primary amines, secondary amines, tertiary amines, ammonium salts, tertiary amide, etc. are preferred, primary amines, secondary amines, tertiary amines, ammonium salts More preferably, secondary amines, tertiary amines, and ammonium salts are further preferred. As the acid scavenger, compounds having an imidazole structure, a diazabicyclic structure, an onium structure, a trialkylamine structure, aniline structure or a pyridine structure, and alkylamine derivatives having a hydroxyl group and/or an ether bond can be preferably mentioned. substances, aniline derivatives with hydroxyl and/or ether linkages, etc. In the case of having an onium structure, the acid scavenger is a salt having a cation selected from ammonium, diazo, iodonium, permeum, phosphonium, pyridinium, etc., and an anion of an acid lower in acidity than the acid generated by the acid generator. better.

作為具有咪唑結構之酸捕捉劑，可以舉出咪唑、2,4,5-三苯基咪唑、苯并咪唑、2-苯基苯并咪唑等。作為具有二氮雜雙環結構之酸捕捉劑，可以舉出1,4-二氮雜雙環[2,2,2]辛烷、1,5-二氮雜雙環[4,3,0]壬-5-烯、1,8-二氮雜雙環[5,4,0]十一-7-烯等。作為具有鎓結構之酸捕捉劑，可以舉出氫氧化四丁基銨、氫氧化三芳基鋶、氫氧化苯甲醯甲基鋶、具有2-氧代烷基之氫氧化鋶，具體而言，可以舉出氫氧化三苯基鋶、氫氧化三（三級丁基苯基）鋶、氫氧化雙（三級丁基苯基）錪、氫氧化苯甲醯甲基噻吩鎓、氫氧化2-氧代丙基噻吩鎓等。作為具有三烷基胺結構之酸捕捉劑，能夠舉出三（正丁基）胺、三（正辛基）胺等。作為具有苯胺結構之酸捕捉劑，能夠舉出2,6-二異丙基苯胺、N,N-二甲基苯胺、N,N-二丁基苯胺、N,N-二己基苯胺等。作為具有吡啶結構之酸捕捉劑，能夠舉出吡啶、4-甲基吡啶等。作為具有羥基及/或醚鍵之烷基胺衍生物，能夠舉出乙醇胺、二乙醇胺、三乙醇胺、N-苯基二乙醇胺、三（甲氧基乙氧基乙基）胺等。作為具有羥基及/或醚鍵之苯胺衍生物，能夠舉出N,N-雙（羥基乙基）苯胺等。Examples of the acid scavenger having an imidazole structure include imidazole, 2,4,5-triphenylimidazole, benzimidazole, 2-phenylbenzimidazole, and the like. Examples of acid-scavenging agents having a diazabicyclic structure include 1,4-diazabicyclo[2,2,2]octane, 1,5-diazabicyclo[4,3,0]nonane- 5-ene, 1,8-diazabicyclo[5,4,0]undec-7-ene, etc. Examples of the acid scavenger having an onium structure include tetrabutylammonium hydroxide, triaryl percolium hydroxide, benzoylmethyl percolium hydroxide, and percolium hydroxide having a 2-oxoalkyl group. Specifically, Triphenylmalladium hydroxide, tris(tertiary butylphenyl)conium hydroxide, bis(tertiary butylphenyl)iodium hydroxide, benzoylmethylthiophenium hydroxide, 2- Oxypropylthiophenium, etc. Tri(n-butyl)amine, tri(n-octyl)amine, etc. are mentioned as an acid scavenger which has a trialkylamine structure. Examples of the acid scavenger having an aniline structure include 2,6-diisopropylaniline, N,N-dimethylaniline, N,N-dibutylaniline, N,N-dihexylaniline, and the like. Pyridine, 4-picoline, etc. are mentioned as an acid scavenger which has a pyridine structure. Examples of the alkylamine derivatives having a hydroxyl group and/or an ether bond include ethanolamine, diethanolamine, triethanolamine, N-phenyldiethanolamine, tris(methoxyethoxyethyl)amine, and the like. Examples of the aniline derivative having a hydroxyl group and/or an ether bond include N,N-bis(hydroxyethyl)aniline and the like.

作為較佳的酸捕捉劑的具體例，可以舉出乙醇胺、二乙醇胺、三乙醇胺、乙胺、二乙胺、三乙胺、己胺、十二胺、環己基胺、環己基甲基胺、環己基二甲基胺、苯胺、N-甲基苯胺、N,N-二甲基苯胺、二苯胺、吡啶、丁胺、異丁胺、二丁胺、三丁胺、二環己基胺、DBU（二氮雜雙環十一烯）、DABCO（1,4-二氮雜雙環[2.2.2]辛烷）、N,N-二異丙基乙胺、氫氧化四甲基銨、乙二胺、1,5-二胺基戊烷、N-甲基己基胺、N-甲基二環己基胺、三辛胺、N-乙基乙二胺、N,N-二乙基乙二胺、N,N,N’,N’-四丁基-1,6-己烷二胺、精三胺、二胺基環己烷、雙（2-甲氧基乙基）胺、哌啶、甲基哌啶、哌𠯤、莨菪烷、N-苯基苄胺、1,2-二苯胺基乙烷、2-胺基乙醇、甲苯胺、胺基苯酚、己基苯胺、伸苯基二胺、苯基乙胺、二苄胺、吡咯、N-甲基吡咯、胍、胺基吡咯啶、吡唑、吡唑啉、胺基嗎啉、胺基烷基嗎啉等。Specific examples of preferred acid scavenger include ethanolamine, diethanolamine, triethanolamine, ethylamine, diethylamine, triethylamine, hexylamine, dodecylamine, cyclohexylamine, cyclohexylmethylamine, Cyclohexyldimethylamine, aniline, N-methylaniline, N,N-dimethylaniline, diphenylamine, pyridine, butylamine, isobutylamine, dibutylamine, tributylamine, dicyclohexylamine, DBU (diazabicycloundecene), DABCO (1,4-diazabicyclo[2.2.2]octane), N,N-diisopropylethylamine, tetramethylammonium hydroxide, ethylenediamine , 1,5-diaminopentane, N-methylhexylamine, N-methyldicyclohexylamine, trioctylamine, N-ethylethylenediamine, N,N-diethylethylenediamine, N,N,N',N'-tetrabutyl-1,6-hexanediamine, refined triamine, diaminocyclohexane, bis(2-methoxyethyl)amine, piperidine, methyl Piperidine, piperone, tropane, N-phenylbenzylamine, 1,2-diphenylaminoethane, 2-aminoethanol, toluidine, aminophenol, hexylaniline, phenylenediamine, benzene Ethylamine, dibenzylamine, pyrrole, N-methylpyrrole, guanidine, aminopyrrolidine, pyrazole, pyrazoline, aminomorpholine, aminoalkylmorpholine, etc.

該等酸捕捉劑可以單獨使用1種，亦可以組合使用2種以上。 本發明之組成物可以含有或不含有酸捕捉劑，含有之情況下，以從組成物的總固體成分中去除了填充劑之總質量為標準，酸捕捉劑的含量通常為0.001～10質量%，較佳為0.01～5質量%。 These acid scavenger may be used individually by 1 type, and may use it in combination of 2 or more types. The composition of the present invention may or may not contain an acid scavenger. When it is contained, the content of the acid scavenger is usually 0.001 to 10% by mass based on the total mass of the total solid content of the composition excluding the filler. , preferably 0.01 to 5% by mass.

酸產生劑與酸捕捉劑的使用比例係酸產生劑/酸捕捉劑（莫耳比）=2.5～300為較佳。亦即，從靈敏度、解析度的觀點考慮，莫耳比係2.5以上為較佳，從抑制曝光後加熱處理為止浮雕圖案的經時變粗所引起之解析度的下降之觀點考慮，300以下為較佳。酸產生劑/酸捕捉劑（莫耳比）更佳為5.0～200，進一步較佳為7.0～150。The use ratio of acid generator and acid scavenger is preferably acid generator/acid scavenger (molar ratio) = 2.5-300. That is, from the viewpoint of sensitivity and resolution, the molar ratio is preferably 2.5 or more, and from the viewpoint of suppressing the decrease in resolution caused by the time-dependent thickening of the relief pattern until heat treatment after exposure, 300 or less is preferable. better. The acid generator/acid scavenger (molar ratio) is more preferably from 5.0 to 200, further preferably from 7.0 to 150.

＜其他添加劑＞ 本發明的樹脂組成物能夠在可獲得本發明的效果之範圍內依據需要配合各種添加物，例如界面活性劑、高級脂肪酸衍生物、紫外線吸收劑、有機鈦化合物、抗氧化劑、抗凝聚劑、酚系化合物、其他高分子化合物、塑化劑及其他助劑類（例如，消泡劑、阻燃劑等）等。藉由適當含有該等成分，能夠調整膜物理性質等性質。關於該等成分，例如，能夠參閱日本特開2012-003225號公報的0183段以後（所對應之美國專利申請公開第2013/0034812號說明書的0237段）的記載、日本特開2008-250074號公報的0101～0104、0107～0109段等的記載，該等內容被編入本說明書中。配合該等添加劑之情況下，其合計配合量設為本發明的樹脂組成物的固體成分的3質量%以下為較佳。 ＜Other additives＞ The resin composition of the present invention can contain various additives such as surfactants, higher fatty acid derivatives, ultraviolet absorbers, organic titanium compounds, antioxidants, anti-coagulation agents, phenols, etc. series compounds, other polymer compounds, plasticizers and other additives (such as defoamers, flame retardants, etc.), etc. Properties such as film physical properties can be adjusted by appropriately containing these components. Regarding these components, for example, the descriptions in JP-A-2012-003225 and after paragraph 0183 (paragraph 0237 of the corresponding U.S. Patent Application Publication No. 2013/0034812 specification), JP-A-2008-250074 0101 to 0104, 0107 to 0109, etc., and these contents are incorporated into this manual. When compounding these additives, the total compounding amount is preferably 3% by mass or less of the solid content of the resin composition of the present invention.

〔界面活性劑〕 作為界面活性劑，能夠使用氟系界面活性劑、矽酮系界面活性劑、烴系界面活性劑等各種界面活性劑。界面活性劑可以為非離子型界面活性劑，亦可以為陽離子型界面活性劑，亦可以為陰離子型界面活性劑。 〔Surfactant〕 As the surfactant, various surfactants such as fluorine-based surfactants, silicone-based surfactants, and hydrocarbon-based surfactants can be used. The surfactant can be a nonionic surfactant, a cationic surfactant, or an anionic surfactant.

藉由在本發明的樹脂組成物中含有界面活性劑，製備成塗佈液時的溶液特性（尤其是流動性）進一步獲得提高，從而能夠進一步改善塗佈厚度的均勻性或省液性。亦即，當使用適用含有界面活性劑之組成物之塗佈液來形成膜時，被塗佈面與塗佈液的界面張力下降而對被塗佈面之潤濕性獲得改善，從而對被塗佈面之塗佈性獲得提高。因此，能夠更佳地形成厚度不均小的厚度均勻的膜。By including a surfactant in the resin composition of the present invention, the solution properties (especially fluidity) when prepared as a coating liquid are further improved, thereby further improving the uniformity of coating thickness or liquid saving. That is, when a coating solution containing a surfactant-containing composition is used to form a film, the interfacial tension between the coated surface and the coating solution decreases and the wettability of the coated surface is improved, thereby improving the coating surface. The coatability of the coated surface is improved. Therefore, it is possible to more preferably form a film having a uniform thickness with less unevenness in thickness.

作為氟系界面活性劑，例如可以舉出MEGAFACE F171、MEGAFACE F172、MEGAFACE F173、MEGAFACE F176、MEGAFACE F177、MEGAFACE F141、MEGAFACE F142、MEGAFACE F143、MEGAFACE F144、MEGAFACE R30、MEGAFACE F437、MEGAFACE F475、MEGAFACE F479、MEGAFACE F482、MEGAFACE F554、MEGAFACE F780、RS-72-K（以上為DIC Corporation製造）、Fluorad FC430、Fluorad FC431、Fluorad FC171、Novec FC4430、Novec FC4432（以上為3M Japan Limited製造）、Surflon S-382、Surflon SC-101、Surflon SC-103、Surflon SC-104、Surflon SC-105、Surflon SC1068、Surflon SC-381、Surflon SC-383、Surflon S393、Surflon KH-40（以上為ASAHI GLASS CO.,LTD.製造）、PF636、PF656、PF6320、PF6520、PF7002（OMNOVA Solutions Inc.製造）等。氟系界面活性劑亦能夠使用日本特開2015-117327號公報的0015～0158段中所記載之化合物、日本特開2011-132503號公報的0117～0132段中所記載之化合物，該等內容被編入本說明書中。作為氟系界面活性劑，亦能夠使用嵌段聚合物，作為具體例，例如可以舉出日本特開2011-89090號公報中所記載之化合物，該等內容被編入本說明書中。 氟系界面活性劑亦能夠較佳地使用包含源自具有氟原子之（甲基）丙烯酸酯化合物之重複單元和源自具有2個以上（較佳為5個以上）伸烷氧基（較佳為伸乙氧基、伸丙氧基）之（甲基）丙烯酸酯化合物之重複單元之含氟高分子化合物，下述化合物亦可以作為本發明中使用之氟系界面活性劑而例示。 [化學式60]

Figure 02_image119
Examples of fluorine-based surfactants include MEGAFACE F171, MEGAFACE F172, MEGAFACE F173, MEGAFACE F176, MEGAFACE F177, MEGAFACE F141, MEGAFACE F142, MEGAFACE F143, MEGAFACE F144, MEGAFACE R30, MEGAFACE F437, MEGAFACE F475, MEGAFACE F479, MEGAFACE F482, MEGAFACE F554, MEGAFACE F780, RS-72-K (the above are manufactured by DIC Corporation), Fluorad FC430, Fluorad FC431, Fluorad FC171, Novec FC4430, Novec FC4432 (the above are manufactured by 3M Japan Limited), Surflon S-382, Surflon SC-101, Surflon SC-103, Surflon SC-104, Surflon SC-105, Surflon SC1068, Surflon SC-381, Surflon SC-383, Surflon S393, Surflon KH-40 (the above are ASAHI GLASS CO.,LTD. manufactured), PF636, PF656, PF6320, PF6520, PF7002 (manufactured by OMNOVA Solutions Inc.), etc. As the fluorine-based surfactant, compounds described in paragraphs 0015 to 0158 of JP-A-2015-117327 and compounds described in paragraphs 0117-0132 of JP-A-2011-132503 can be used. incorporated into this manual. A block polymer can also be used as a fluorine-type surfactant, and as a specific example, the compound described in Unexamined-Japanese-Patent No. 2011-89090 is mentioned, and these contents are incorporated in this specification. Fluorine-based surfactants can also preferably be used to include repeating units derived from (meth)acrylate compounds with fluorine atoms and derived from 2 or more (preferably 5 or more) alkoxyl groups (preferably Fluorine-containing polymer compounds that are repeating units of (meth)acrylate compounds of ethoxyl, propoxyl) and the following compounds can also be exemplified as fluorine-based surfactants used in the present invention. [chemical formula 60]
Figure 02_image119

上述化合物的重量平均分子量較佳為3,000～50,000，5,000～30,000為更佳。 關於氟系界面活性劑，亦能夠將在側鏈中具有乙烯性不飽和基之含氟聚合物用作氟系界面活性劑。作為具體例，可以舉出日本特開2010-164965號公報的0050～0090段及0289～0295段中所記載之化合物，該內容被編入本說明書中。又，作為市售品，例如可以舉出DIC Corporation製造之MEGAFACE RS-101、RS-102、RS-718K等。 The weight average molecular weight of the above compound is preferably from 3,000 to 50,000, more preferably from 5,000 to 30,000. Regarding the fluorine-based surfactant, a fluorine-containing polymer having an ethylenically unsaturated group in a side chain can also be used as the fluorine-based surfactant. Specific examples include compounds described in paragraphs 0050 to 0090 and paragraphs 0289 to 0295 of JP-A-2010-164965, and the contents thereof are incorporated in the present specification. Moreover, as a commercial item, Megaface RS-101, RS-102, RS-718K etc. manufactured by DIC Corporation are mentioned, for example.

氟系界面活性劑中的氟含有率係3～40質量%為較佳，更佳為5～30質量%，特佳為7～25質量%。氟含有率在該範圍內之氟系界面活性劑在塗佈膜的厚度均勻性和省液性的觀點上有效果，在組成物中的溶解性亦良好。The fluorine content in the fluorine-based surfactant is preferably from 3 to 40% by mass, more preferably from 5 to 30% by mass, and particularly preferably from 7 to 25% by mass. A fluorine-based surfactant having a fluorine content within this range is effective in terms of thickness uniformity of the coating film and liquid-saving property, and has good solubility in the composition.

作為矽酮系界面活性劑，例如可以舉出Toray Silicone DC3PA、Toray Silicone SH7PA、Toray Silicone DC11PA、Toray Silicone SH21PA、Toray Silicone SH28PA、Toray Silicone SH29PA、Toray Silicone SH30PA、Toray Silicone SH8400（以上為Dow Corning Toray Co.,Ltd.製造）、TSF-4440、TSF-4300、TSF-4445、TSF-4460、TSF-4452（以上為Momentive Performance Materials Inc.製造）、KP341、KF6001、KF6002（以上為Shin-Etsu Chemical Co.,Ltd.製造）、BYK307、BYK323、BYK330（以上為BYK Chemie GmbH製造）等。Examples of silicone-based surfactants include Toray Silicone DC3PA, Toray Silicone SH7PA, Toray Silicone DC11PA, Toray Silicone SH21PA, Toray Silicone SH28PA, Toray Silicone SH29PA, Toray Silicone SH30PA, Toray Silicone SH8400 (the above are Dow Corning Toray Co. ., Ltd.), TSF-4440, TSF-4300, TSF-4445, TSF-4460, TSF-4452 (manufactured by Momentive Performance Materials Inc. above), KP341, KF6001, KF6002 (manufactured by Shin-Etsu Chemical Co. ., Ltd.), BYK307, BYK323, BYK330 (the above are manufactured by BYK Chemie GmbH), etc.

作為烴系界面活性劑，例如可以舉出PIONIN A-76、New Kalgen FS-3PG、PIONIN B-709、PIONIN B-811-N、PIONIN D-1004、PIONIN D-3104、PIONIN D-3605、PIONIN D-6112、PIONIN D-2104-D、PIONIN D-212、PIONIN D-931、PIONIN D-941、PIONIN D-951、PIONIN E-5310、PIONIN P-1050-B、PIONIN P-1028-P、PIONIN P-4050-T等（以上為Takemoto Oil & Fat Co.,Ltd.製造）等。Examples of hydrocarbon-based surfactants include PIONIN A-76, New Kalgen FS-3PG, PIONIN B-709, PIONIN B-811-N, PIONIN D-1004, PIONIN D-3104, PIONIN D-3605, PIONIN D-6112, PIONIN D-2104-D, PIONIN D-212, PIONIN D-931, PIONIN D-941, PIONIN D-951, PIONIN E-5310, PIONIN P-1050-B, PIONIN P-1028-P, PIONIN P-4050-T and the like (the above are manufactured by Takemoto Oil & Fat Co., Ltd.) and the like.

作為非離子型界面活性劑，可以例示出甘油、三羥甲基丙烷、三羥甲基乙烷以及該等的乙氧基化物及丙氧基化物（例如，甘油丙氧基化物、甘油乙氧基化物等）、聚氧乙烯月桂基醚、聚氧乙烯硬脂基醚、聚氧乙烯油烯基醚、聚氧乙烯辛基苯基醚、聚氧乙烯壬基苯基醚、聚乙二醇二月桂酸酯、聚乙二醇二硬脂酸酯、脫水山梨糖醇脂肪酸酯等。作為市售品，可以舉出Pluronic（註冊商標）L10、L31、L61、L62、10R5、17R2、25R2（BASF公司製造）、Tetronic 304、701、704、901、904、150R1（BASF公司製造）、Solsperse 20000（Lubrizol Japan Ltd.製造）、NCW-101、NCW-1001、NCW-1002（Wako Pure Chemical Industries, Ltd.製造）、PIONIN D-6112、D-6112-W、D-6315（Takemoto Oil & Fat Co.,Ltd.製造）、OLFIN E1010、Surfynol 104、400、440（Nissan Chemical Industries, Ltd.製造）等。Examples of nonionic surfactants include glycerin, trimethylolpropane, trimethylolethane, and their ethoxylates and propoxylates (for example, glycerin propoxylate, glycerin ethoxylate base compounds, etc.), polyoxyethylene lauryl ether, polyoxyethylene stearyl ether, polyoxyethylene oleyl ether, polyoxyethylene octylphenyl ether, polyoxyethylene nonylphenyl ether, polyethylene glycol Dilaurate, polyethylene glycol distearate, sorbitan fatty acid ester, etc. Commercially available products include Pluronic (registered trademark) L10, L31, L61, L62, 10R5, 17R2, 25R2 (manufactured by BASF Corporation), Tetronic 304, 701, 704, 901, 904, 150R1 (manufactured by BASF Corporation), Solsperse 20000 (manufactured by Lubrizol Japan Ltd.), NCW-101, NCW-1001, NCW-1002 (manufactured by Wako Pure Chemical Industries, Ltd.), PIONIN D-6112, D-6112-W, D-6315 (Takemoto Oil & Fat Co., Ltd.), OLFIN E1010, Surfynol 104, 400, 440 (manufactured by Nissan Chemical Industries, Ltd.), etc.

作為陽離子型界面活性劑，具體而言，可以舉出有機矽氧烷聚合物KP341（Shin-Etsu Chemical Co.,Ltd.製造）、（甲基）丙烯酸系（共）聚合物Polyflow No.75、No.77、No.90、No.95（Kyoeisha chemical Co.,Ltd.製造）、W001（Yusho Co.,Ltd.製造）等。Specific examples of cationic surfactants include organosiloxane polymer KP341 (manufactured by Shin-Etsu Chemical Co., Ltd.), (meth)acrylic (co)polymer Polyflow No. 75, No.77, No.90, No.95 (manufactured by Kyoeisha Chemical Co., Ltd.), W001 (manufactured by Yusho Co., Ltd.) and the like.

作為陰離子型界面活性劑，具體而言，可以舉出W004、W005、W017（Yusho Co.,Ltd.製造）、SANDET BL（SANYO KASEI CO.,LTD.製造）等。Specific examples of the anionic surfactant include W004, W005, W017 (manufactured by Yusho Co., Ltd.), Sandet BL (manufactured by Sanyo Kasei Co., Ltd.), and the like.

界面活性劑可以僅使用1種，亦可以組合2種以上。 界面活性劑的含量相對於從組成物的總固體成分中去除了填充劑之總質量，係0.001～2.0質量%為較佳，0.005～1.0質量%為更佳。 Surfactants may be used alone or in combination of two or more. The content of the surfactant is preferably 0.001 to 2.0% by mass, more preferably 0.005 to 1.0% by mass, based on the total mass of the total solid content of the composition excluding the filler.

〔高級脂肪酸衍生物〕 為了防止由氧引起之聚合阻礙，本發明的樹脂組成物可以添加如二十二酸或二十二酸醯胺那樣的高級脂肪酸衍生物而在塗佈後的乾燥過程中偏在於本發明的樹脂組成物的表面。 〔Higher fatty acid derivatives〕 In order to prevent the polymerization inhibition caused by oxygen, the resin composition of the present invention can add higher fatty acid derivatives such as behenic acid or behenic acid amide to favor the resin composition of the present invention during the drying process after coating. the surface of the composition.

又，高級脂肪酸衍生物亦能夠使用國際公開第2015/199219號的0155段中所記載之化合物，該內容被編入本說明書中。Moreover, the compound described in paragraph 0155 of International Publication No. 2015/199219 can also be used as a higher fatty acid derivative, and the content is incorporated in this specification.

本發明的樹脂組成物具有高級脂肪酸衍生物之情況下，高級脂肪酸衍生物的含量相對於從本發明的樹脂組成物的總固體成分中去除了填充劑之總質量，係0.1～10質量%為較佳。高級脂肪酸衍生物可以係僅1種，亦可以係2種以上。高級脂肪酸衍生物係2種以上時，其合計在上述範圍為較佳。When the resin composition of the present invention has a higher fatty acid derivative, the content of the higher fatty acid derivative is 0.1 to 10% by mass relative to the total mass of the resin composition of the present invention excluding the filler from the total solid content. better. The higher fatty acid derivatives may be one kind, or two or more kinds. When there are two or more higher fatty acid derivatives, it is preferable that the total thereof is within the above-mentioned range.

〔紫外線吸收劑〕 本發明的組成物可以包含紫外線吸收劑。作為紫外線吸收劑，能夠使用水楊酸酯系、二苯甲酮系、苯并三唑系、取代丙烯腈系、三𠯤系等紫外線吸收劑。 作為水楊酸酯系紫外線吸收劑的例子，可以舉出水楊酸苯酯、水楊酸對辛基苯酯、水楊酸對三級丁基苯酯等，作為二苯甲酮系紫外線吸收劑的例子，可以舉出2,2’-二羥基-4-甲氧基二苯甲酮、2,2’-二羥基-4,4’-二甲氧基二苯甲酮、2,2’,4,4’-四羥基二苯甲酮、2-羥基-4-甲氧基二苯甲酮、2,4-二羥基二苯甲酮、2-羥基-4-辛氧基二苯甲酮等。又，作為苯并三唑系紫外線吸收劑的例子，可以舉出2-（2’-羥基-3’,5’-二-第三丁基苯基）-5-氯苯并三唑、2-（2’-羥基-3’-第三丁基-5’-甲基苯基）-5-氯苯并三唑、2-（2’-羥基-3’-第三戊基-5’-異丁基苯基）-5-氯苯并三唑、2-（2’-羥基-3’-異丁基-5’-甲基苯基）-5-氯苯并三唑、2-（2’-羥基-3’-異丁基-5’-丙基苯基）-5-氯苯并三唑、2-（2’-羥基-3’,5’-二-第三丁基苯基）苯并三唑、2-（2’-羥基-5’-甲基苯基）苯并三唑、2-[2’-羥基-5’-（1,1,3,3-四甲基）苯基]苯并三唑等。 〔UV absorber〕 The composition of the present invention may contain an ultraviolet absorber. As the ultraviolet absorber, salicylate-based, benzophenone-based, benzotriazole-based, substituted acrylonitrile-based, and trisulfone-based ultraviolet absorbers can be used. Examples of salicylate-based ultraviolet absorbers include phenyl salicylate, p-octylphenyl salicylate, p-tertiary butylphenyl salicylate, etc., as benzophenone-based ultraviolet absorbers. Examples of agents include 2,2'-dihydroxy-4-methoxybenzophenone, 2,2'-dihydroxy-4,4'-dimethoxybenzophenone, 2,2 ',4,4'-tetrahydroxybenzophenone, 2-hydroxy-4-methoxybenzophenone, 2,4-dihydroxybenzophenone, 2-hydroxy-4-octyloxydiphenyl Methanone etc. Also, examples of benzotriazole-based ultraviolet absorbers include 2-(2'-hydroxy-3',5'-di-tert-butylphenyl)-5-chlorobenzotriazole, 2 -(2'-Hydroxy-3'-tert-butyl-5'-methylphenyl)-5-chlorobenzotriazole, 2-(2'-Hydroxy-3'-tert-amyl-5' -isobutylphenyl)-5-chlorobenzotriazole, 2-(2'-hydroxy-3'-isobutyl-5'-methylphenyl)-5-chlorobenzotriazole, 2- (2'-Hydroxy-3'-isobutyl-5'-propylphenyl)-5-chlorobenzotriazole, 2-(2'-Hydroxy-3',5'-di-tert-butyl Phenyl)benzotriazole, 2-(2'-hydroxy-5'-methylphenyl)benzotriazole, 2-[2'-hydroxy-5'-(1,1,3,3-tetra Methyl) phenyl] benzotriazole, etc.

作為取代丙烯腈系紫外線吸收劑的例子，可以舉出2-氰基-3,3-二苯基丙烯酸乙酯、2-氰基-3,3-二苯基丙烯酸2-乙基己酯等。另外，作為三𠯤系紫外線吸收劑的例子，可以舉出2-[4-[（2-羥基-3-十二烷氧基丙基）氧基]-2-羥基苯基]-4,6-雙（2,4-二甲基苯基）-1,3,5-三𠯤、2-[4-[（2-羥基-3-十三烷氧基丙基）氧基]-2-羥基苯基]-4,6-雙（2,4-二甲基苯基）-1,3,5-三𠯤、2-（2,4-二羥基苯基）-4,6-雙（2,4-二甲基苯基）-1,3,5-三𠯤等單（羥基苯基）三𠯤化合物；2,4-雙（2-羥基-4-丙氧基苯基）-6-（2,4-二甲基苯基）-1,3,5-三𠯤、2,4-雙（2-羥基-3-甲基-4-丙氧基苯基）-6-（4-甲基苯基）-1,3,5-三𠯤、2,4-雙（2-羥基-3-甲基-4-己氧基苯基）-6-（2,4-二甲基苯基）-1,3,5-三𠯤等雙（羥基苯基）三𠯤化合物；2,4-雙（2-羥基-4-丁氧基苯基）-6-（2,4-二丁氧基苯基）-1,3,5-三𠯤、2,4,6-三（2-羥基-4-辛氧基苯基）-1,3,5-三𠯤、2,4,6-三[2-羥基-4-（3-丁氧基-2-羥基丙氧基）苯基]-1,3,5-𠯤等三（羥基苯基）三𠯤化合物等。Examples of substituted acrylonitrile UV absorbers include ethyl 2-cyano-3,3-diphenylacrylate, 2-ethylhexyl 2-cyano-3,3-diphenylacrylate, etc. . In addition, as an example of a trioxane-based ultraviolet absorber, 2-[4-[(2-hydroxy-3-dodecyloxypropyl)oxy]-2-hydroxyphenyl]-4,6 -Bis(2,4-dimethylphenyl)-1,3,5-trimethalone, 2-[4-[(2-hydroxy-3-tridecyloxypropyl)oxy]-2- Hydroxyphenyl]-4,6-bis(2,4-dimethylphenyl)-1,3,5-trimethanone, 2-(2,4-dihydroxyphenyl)-4,6-bis( 2,4-Dimethylphenyl)-1,3,5-trimethanone and other mono(hydroxyphenyl)trimethanone compounds; 2,4-bis(2-hydroxy-4-propoxyphenyl)-6 -(2,4-Dimethylphenyl)-1,3,5-trimethylphenyl, 2,4-bis(2-hydroxy-3-methyl-4-propoxyphenyl)-6-(4 -Methylphenyl)-1,3,5-trimethanone, 2,4-bis(2-hydroxy-3-methyl-4-hexyloxyphenyl)-6-(2,4-dimethyl Phenyl)-1,3,5-tris(hydroxyphenyl)tris(2,4-bis(2-hydroxy-4-butoxyphenyl)-6-(2,4-di Butoxyphenyl)-1,3,5-trimethanone, 2,4,6-tris(2-hydroxy-4-octyloxyphenyl)-1,3,5-trimethanium, 2,4, 6-tris[2-hydroxy-4-(3-butoxy-2-hydroxypropoxy)phenyl]-1,3,5-sulfone and other tri(hydroxyphenyl)trisulfone compounds, etc.

在本發明中，上述各種紫外線吸收劑可以單獨使用1種，亦可以組合使用2種以上。 本發明的組成物可以包含或不包含紫外線吸收劑，包含之情況下，紫外線吸收劑的含量相對於從本發明的組成物的總固體成分質量中去除了填充劑之總質量，係0.001質量%以上且1質量%以下為較佳，0.01質量%以上且0.1質量%以下為更佳。 In the present invention, the above-mentioned various ultraviolet absorbers may be used alone or in combination of two or more. The composition of the present invention may or may not contain an ultraviolet absorber, and when it is included, the content of the ultraviolet absorber is 0.001% by mass relative to the total mass of the composition of the present invention excluding fillers. More than 1 mass % is preferable, and 0.01 mass % or more and 0.1 mass % or less are more preferable.

〔有機鈦化合物〕 本實施形態的樹脂組成物可以含有有機鈦化合物。藉由樹脂組成物含有有機鈦化合物，即使在低溫下硬化之情況下，亦能夠形成耐藥品性優異之樹脂層。 〔Organotitanium compound〕 The resin composition of this embodiment may contain an organic titanium compound. By containing the organotitanium compound in the resin composition, a resin layer excellent in chemical resistance can be formed even when cured at a low temperature.

作為能夠使用之有機鈦化合物，可以舉出在鈦原子上經由共價鍵或離子鍵鍵結有有機基團者。 將有機鈦化合物的具體例示於以下的I）～VII）： I）鈦螯合化合物：其中，從樹脂組成物的保存穩定性良好、可獲得良好的硬化圖案之角度考慮，具有2個以上烷氧基之鈦螯合化合物為更佳。具體例為雙（三乙醇胺）二異丙氧基鈦、雙（2,4-戊二酸酯）二（正丁氧基）鈦、雙（2,4-戊二酸酯）二異丙氧基鈦、雙（四甲基庚二酸酯）二異丙氧基鈦、雙（乙醯乙酸乙酯）二異丙氧基鈦等。 II）四烷氧基鈦化合物：例如為四（正丁氧基）鈦、四乙氧基鈦、四（2-乙基己氧基）鈦、四異丁氧基鈦、四異丙氧基鈦、四甲氧基鈦、四甲氧基丙氧基鈦、四甲基苯氧基鈦、四（正壬氧基）鈦、四（正丙氧基）鈦、四硬脂醯氧基鈦、四[雙｛2,2-（烯丙氧基甲基）丁氧基｝]鈦等。 III）二茂鈦化合物：例如為五甲基環戊二烯基三甲醇鈦、雙（η5-2,4-環戊二烯-1-基）雙（2,6-二氟苯基）鈦、雙（η5-2,4-環戊二烯-1-基）雙（2,6-二氟-3-（1H-吡咯-1-基）苯基）鈦等。 IV）單烷氧基鈦化合物：例如為三（二辛基磷酸酯）異丙氧基鈦、三（十二基苯磺酸酯）異丙氧基鈦等。 V）氧化鈦化合物：例如為雙（戊二酸酯）氧化鈦、雙（四甲基庚二酸酯）氧化鈦、酞菁氧化鈦等。 VI）四乙醯丙酮鈦化合物：例如為四乙醯丙酮鈦等。 VII）鈦酸酯偶合劑：例如為異丙基三（十二烷基）苯磺醯基鈦酸酯等。 Examples of organic titanium compounds that can be used include those in which an organic group is bonded to a titanium atom via a covalent bond or an ionic bond. Specific examples of organic titanium compounds are shown in the following I) to VII): I) Titanium chelate compounds: Among them, titanium chelate compounds having two or more alkoxy groups are more preferable from the standpoint of good storage stability of the resin composition and good hardening patterns. Specific examples are bis(triethanolamine)diisopropoxytitanium, bis(2,4-glutarate)bis(n-butoxy)titanium, bis(2,4-glutarate)diisopropoxy Base titanium, bis(tetramethylpimelate) diisopropoxytitanium, bis(acetoacetate ethyl)diisopropoxytitanium, etc. II) Tetraalkoxytitanium compounds: such as tetra(n-butoxy)titanium, tetraethoxytitanium, tetrakis(2-ethylhexyloxy)titanium, tetraisobutoxytitanium, tetraisopropoxytitanium Titanium, tetramethoxytitanium, tetramethoxypropoxytitanium, tetramethylphenoxytitanium, tetra(n-nonyloxy)titanium, tetra(n-propoxy)titanium, tetrastearyloxytitanium , Tetra[bis{2,2-(allyloxymethyl)butoxy}]titanium, etc. III) Titanocene compounds: e.g. pentamethylcyclopentadienyl trimethoxide titanium, bis(η5-2,4-cyclopentadien-1-yl)bis(2,6-difluorophenyl)titanium , bis(η5-2,4-cyclopentadien-1-yl)bis(2,6-difluoro-3-(1H-pyrrol-1-yl)phenyl)titanium, etc. IV) Monoalkoxytitanium compounds: for example, tris(dioctylphosphate)isopropoxytitanium, tris(dodecylbenzenesulfonate)isopropoxytitanium, and the like. V) Titanium oxide compound: For example, bis(glutarate)titanium oxide, bis(tetramethylpimelate)titanium oxide, titanium phthalocyanine oxide, and the like. VI) Titanium tetraacetylacetonate compound: For example, titanium tetraacetylacetonate and the like. VII) Titanate coupling agent: for example, isopropyl tris(dodecyl)benzenesulfonyl titanate and the like.

其中，作為有機鈦化合物，從發揮更良好的耐藥品性之觀點考慮，選自包括上述I）鈦螯合化合物、II）四烷氧基鈦化合物及III）二茂鈦化合物之群組中的至少一種化合物為較佳。尤其，雙（乙基乙醯乙酸酯）二異丙氧基鈦、四（正丁氧基）鈦及雙（η5-2,4-環戊二烯-1-基）雙（2,6-二氟-3-（1H-吡咯-1-基）苯基）鈦為較佳。Among them, the organotitanium compound is selected from the group consisting of the above-mentioned I) titanium chelate compounds, II) tetraalkoxytitanium compounds and III) titanocene compounds from the viewpoint of exhibiting better chemical resistance. At least one compound is preferred. In particular, bis(ethyl acetyl acetate)diisopropoxytitanium, tetra(n-butoxy)titanium and bis(η5-2,4-cyclopentadien-1-yl)bis(2,6 -Difluoro-3-(1H-pyrrol-1-yl)phenyl)titanium is preferred.

配合有機鈦化合物之情況下，其配合量相對於樹脂100質量份係0.05～10質量份為較佳，更佳為0.1～2質量份。配合量係0.05質量份以上之情況下，所獲得之硬化圖案更有效地顯現良好的耐熱性及耐藥品性，另一方面，係10質量份以下之情況下，組成物的保存穩定性更優異。When compounding an organic titanium compound, the compounding quantity is 0.05-10 mass parts with respect to 100 mass parts of resins, More preferably, it is 0.1-2 mass parts. When the compounding amount is 0.05 parts by mass or more, the obtained hardened pattern more effectively exhibits good heat resistance and chemical resistance. On the other hand, when it is 10 parts by mass or less, the storage stability of the composition is more excellent .

〔抗氧化劑〕 本發明的組成物可以包含抗氧化劑。藉由含有抗氧化劑作為添加劑，能夠提高硬化後的膜的伸長率特性或與金屬材料的密接性。作為抗氧化劑，可以舉出酚化合物、亞磷酸酯化合物、硫醚化合物等。作為酚化合物，能夠使用作為酚系抗氧化劑而已知之任意的酚化合物。作為較佳的酚化合物，可以舉出受阻酚化合物。在與酚性羥基相鄰之部位（鄰位）具有取代基之化合物為較佳。作為上述取代基，碳數1～22的經取代或未經取代之烷基為較佳。又，抗氧化劑係在同一分子內具有酚基和亞磷酸酯基之化合物亦較佳。又，抗氧化劑亦能夠較佳地使用磷系抗氧化劑。作為磷系抗氧化劑，可以舉出三[2-[[2,4,8,10-四（1,1-二甲基乙基）二苯并[d,f][1,3,2]二氧雜膦雜環庚二烯-6-基]氧基]乙基]胺、三[2-[（4,6,9,11-四-第三丁基二苯并[d,f][1,3,2]二氧雜膦雜環庚二烯-2-基）氧基]乙基]胺、亞磷酸乙基雙（2,4-二-第三丁基-6-甲基苯基）等。作為抗氧化劑的市售品，例如，可以舉出Adekastab AO-20、Adekastab AO-30、Adekastab AO-40、Adekastab AO-50、Adekastab AO-50F、Adekastab AO-60、Adekastab AO-60G、Adekastab AO-80、Adekastab AO-330（以上為ADEKA CORPORATION製造）等。又，抗氧化劑亦能夠使用日本專利第6268967號公報的段落號0023～0048中所記載之化合物，該內容被編入本說明書中。又，本發明的組成物視需要可以含有潛在抗氧化劑。作為潛在抗氧化劑，可以舉出作為抗氧化劑發揮功能之部位被保護基保護之化合物，且保護基藉由在100～250℃下進行加熱或在酸/鹼觸媒存在下在80～200℃下進行加熱而脫離並作為抗氧化劑發揮功能之化合物。作為潛在抗氧化劑，可以舉出國際公開第2014/021023號、國際公開第2017/030005號、日本特開2017-008219號公報中所記載之化合物，該內容被編入本說明書中。作為潛在抗氧化劑的市售品，可以舉出ADEKA ARKLS GPA-5001（ADEKA CORPORATION製造）等。 作為較佳的抗氧化劑的例子，可以舉出2,2-硫代雙（4-甲基-6-三級丁基苯酚）、2,6-二-三級丁基苯酚及式（3）所表示之化合物。 〔Antioxidants〕 The compositions of the present invention may contain antioxidants. By containing an antioxidant as an additive, the elongation characteristic of the cured film and the adhesiveness with a metal material can be improved. As an antioxidant, a phenolic compound, a phosphite compound, a thioether compound, etc. are mentioned. As the phenolic compound, any phenolic compound known as a phenolic antioxidant can be used. A hindered phenol compound is mentioned as a preferable phenol compound. A compound having a substituent at a position adjacent to the phenolic hydroxyl group (ortho position) is preferred. As the above-mentioned substituent, a substituted or unsubstituted alkyl group having 1 to 22 carbon atoms is preferable. Furthermore, it is also preferable that the antioxidant is a compound having a phenolic group and a phosphite group in the same molecule. Moreover, phosphorus antioxidant can also be used preferably as an antioxidant. Examples of phosphorus-based antioxidants include tris[2-[[2,4,8,10-tetrakis(1,1-dimethylethyl)dibenzo[d,f][1,3,2] Dioxaphosphine-6-yl]oxy]ethyl]amine, tris[2-[(4,6,9,11-tetra-tert-butyldibenzo[d,f] [1,3,2]dioxaphosphine-2-yl)oxy]ethyl]amine, ethylphosphite bis(2,4-di-tert-butyl-6-methyl phenyl) etc. Examples of commercially available antioxidants include Adekastab AO-20, Adekastab AO-30, Adekastab AO-40, Adekastab AO-50, Adekastab AO-50F, Adekastab AO-60, Adekastab AO-60G, Adekastab AO -80, Adekastab AO-330 (the above are manufactured by ADEKA CORPORATION), etc. In addition, as an antioxidant, compounds described in paragraph numbers 0023 to 0048 of Japanese Patent No. 6268967 can also be used, and the content is incorporated in this specification. Moreover, the composition of this invention may contain a latent antioxidant as needed. As potential antioxidants, there can be mentioned compounds in which the part that functions as an antioxidant is protected by a protecting group, and the protecting group is heated at 100 to 250°C or heated at 80 to 200°C in the presence of an acid/base catalyst. A compound that decomposes upon heating and functions as an antioxidant. Examples of potential antioxidants include compounds described in International Publication No. 2014/021023, International Publication No. 2017/030005, and Japanese Patent Application Laid-Open No. 2017-008219, the contents of which are incorporated herein. As a commercial item of a latent antioxidant, ADEKA ARKLS GPA-5001 (manufactured by ADEKA CORPORATION) etc. are mentioned. Examples of preferred antioxidants include 2,2-thiobis(4-methyl-6-tertiary butylphenol), 2,6-two-tertiary butylphenol and formula (3) The indicated compound.

[化學式61]

Figure 02_image121
[chemical formula 61]
Figure 02_image121

通式（3）中，R 5表示氫原子或碳數2以上（較佳為碳數2～10）的烷基，R 6表示碳數2以上（較佳為碳數2～10）的伸烷基。R 7表示碳數2以上（較佳為碳數2～10）的伸烷基、包含氧原子及氮原子中的至少任一者之1～4價的有機基團。k表示1～4的整數。 In the general formula (3), R 5 represents a hydrogen atom or an alkyl group with 2 or more carbons (preferably 2 to 10 carbons), and R 6 represents an alkyl group with 2 or more carbons (preferably 2 to 10 carbons). alkyl. R 7 represents an alkylene group having 2 or more carbon atoms (preferably 2 to 10 carbon atoms), and a 1 to 4 valent organic group including at least any one of an oxygen atom and a nitrogen atom. k represents an integer of 1-4.

式（3）所表示之化合物抑制樹脂所具有之脂肪族基或酚性羥基的氧化劣化。又，藉由對金屬材料的防銹作用，能夠抑制金屬氧化。The compound represented by formula (3) suppresses oxidation degradation of the aliphatic group or phenolic hydroxyl group which resin has. In addition, metal oxidation can be suppressed by the antirust effect on metal materials.

由於能夠同時作用於樹脂和金屬材料，因此k係2～4的整數為更佳。作為R 7，可以舉出烷基、環烷基、烷氧基、烷基醚基、烷基甲矽烷基、烷氧基甲矽烷基、芳基、芳基醚基、羧基、羰基、烯丙基、乙烯基、雜環基、-O-、-NH-、-NHNH-、將該等組合而成者等，並且可以進一步具有取代基。其中，從在顯影液中的溶解性或金屬密接性的觀點考慮，具有烷基醚基、-NH-為較佳，從與樹脂的相互作用和基於金屬錯合形成之金屬密接性的觀點考慮，-NH-為更佳。 Since it can act on resin and metal materials simultaneously, the integer of k is 2-4 is more preferable. Examples of R 7 include alkyl, cycloalkyl, alkoxy, alkyl ether, alkylsilyl, alkoxysilyl, aryl, aryl ether, carboxyl, carbonyl, allyl group, vinyl group, heterocyclic group, -O-, -NH-, -NHNH-, a combination of these, etc., and may further have a substituent. Among them, it is preferable to have an alkyl ether group or -NH- from the viewpoint of solubility in a developer or metal adhesion, and from the viewpoint of interaction with resin and metal adhesion by metal complex formation , -NH- is more preferred.

作為通式（3）所表示之化合物的例子，可以舉出以下者，但並不限於下述結構。Examples of the compound represented by the general formula (3) include the following, but are not limited to the following structures.

[化學式62]

Figure 02_image123
[chemical formula 62]
Figure 02_image123

[化學式63]

Figure 02_image125
[chemical formula 63]
Figure 02_image125

[化學式64]

Figure 02_image127
[chemical formula 64]
Figure 02_image127

[化學式65]

Figure 02_image129
[chemical formula 65]
Figure 02_image129

抗氧化劑的添加量相對於特定樹脂100質量份，係0.1～10質量份為較佳，0.5～5質量份為更佳。藉由將添加量設為0.1質量份以上，在高溫高濕環境下亦可容易獲得伸長率特性或提高對金屬材料之密接性之效果，又，藉由設為10質量份以下，例如在與感光劑之相互作用下樹脂組成物的靈敏度獲得提高。抗氧化劑可以僅使用1種，亦可以使用2種以上。在使用2種以上之情況下，該等的合計量成為上述範圍為較佳。The addition amount of an antioxidant is preferably 0.1-10 mass parts with respect to 100 mass parts of specific resins, More preferably, it is 0.5-5 mass parts. By setting the amount of addition to 0.1 parts by mass or more, it is possible to easily obtain elongation characteristics or the effect of improving the adhesion to metal materials even in a high-temperature and high-humidity environment. Also, by setting it to 10 parts by mass or less, for example, with The sensitivity of the resin composition is improved under the interaction of the photosensitizer. Antioxidant may use only 1 type, and may use 2 or more types. When using 2 or more types, it is preferable that these total amounts are in the said range.

〔抗凝聚劑〕 本實施形態的樹脂組成物依據需要可以含有抗凝聚劑。作為抗凝聚劑，可以舉出聚丙烯酸鈉等。 〔Anti-coagulation agent〕 The resin composition of this embodiment may contain an anti-agglomeration agent as needed. Sodium polyacrylate etc. are mentioned as an anti-agglomeration agent.

在本發明中，抗凝聚劑可以單獨使用1種，亦可以組合使用2種以上。 本發明的組成物可以包含或不包含凝聚抑制劑，包含之情況下，凝聚抑制劑的含量相對於從本發明的組成物的總固體成分質量中去除了填充劑之總質量，係0.01質量%以上且10質量%以下為較佳，0.02質量%以上且5質量%以下為更佳。 In the present invention, the anti-aggregating agent may be used alone or in combination of two or more. The composition of the present invention may or may not contain an aggregation inhibitor, and when it is included, the content of the aggregation inhibitor is 0.01% by mass relative to the total mass of the composition of the present invention excluding fillers from the total solid content mass. More than 10 mass % is more preferable, and 0.02 mass % or more and 5 mass % or less are more preferable.

〔酚系化合物〕 本實施形態的樹脂組成物依據需要可以含有酚系化合物。作為酚系化合物，可以舉出Bis-Z、BisP-EZ、TekP-4HBPA、TrisP-HAP、TrisP-PA、BisOCHP-Z、BisP-MZ、BisP-PZ、BisP-IPZ、BisOCP-IPZ、BisP-CP、BisRS-2P、BisRS-3P、BisP-OCHP、亞甲基三-FR-CR、BisRS-26X（以上為產品名稱，Honshu Chemical Industry Co.,Ltd.製造）、BIP-PC、BIR-PC、BIR-PTBP、BIR-BIPC-F（以上為產品名稱，ASAHI YUKIZAI CORPORATION製造）等。 〔Phenolic compounds〕 The resin composition of this embodiment may contain a phenolic compound as needed. Examples of phenolic compounds include Bis-Z, BisP-EZ, TekP-4HBPA, TrisP-HAP, TrisP-PA, BisOCHP-Z, BisP-MZ, BisP-PZ, BisP-IPZ, BisOCP-IPZ, BisP- CP, BisRS-2P, BisRS-3P, BisP-OCHP, Methylenetri-FR-CR, BisRS-26X (the above are product names, manufactured by Honshu Chemical Industry Co., Ltd.), BIP-PC, BIR-PC , BIR-PTBP, BIR-BIPC-F (the above are product names, manufactured by ASAHI YUKIZAI CORPORATION), etc.

在本發明中，酚系化合物可以單獨使用1種，亦可以組合使用2種以上。 本發明的組成物可以包含或不包含酚系化合物，包含之情況下，酚系化合物的含量相對於從本發明的組成物的總固體成分質量中去除了填充劑之總質量，係0.01質量%以上且30質量%以下為較佳，0.02質量%以上且20質量%以下為更佳。 In the present invention, the phenolic compound may be used alone or in combination of two or more. The composition of the present invention may or may not contain a phenolic compound, and when it is included, the content of the phenolic compound is 0.01% by mass relative to the total mass of the composition of the present invention excluding fillers. More than 30 mass % is more preferable, and 0.02 mass % or more and 20 mass % or less are more preferable.

〔其他高分子化合物〕 作為其他高分子化合物，可以舉出矽氧烷樹脂、使（甲基）丙烯酸共聚而成之（甲基）丙烯酸聚合物、酚醛清漆樹脂、可溶酚醛樹脂、多羥基苯乙烯樹脂及該等的共聚物等。其他高分子化合物亦可以為導入有羥甲基、烷氧基甲基、環氧基等交聯基之改質體。 〔Other polymer compounds〕 Examples of other polymer compounds include silicone resins, (meth)acrylic acid polymers obtained by copolymerizing (meth)acrylic acid, novolak resins, resol resins, polyhydroxystyrene resins, and the like. Copolymer etc. Other high molecular compounds can also be modified bodies introduced with cross-linking groups such as methylol, alkoxymethyl, and epoxy groups.

在本發明中，其他高分子化合物可以單獨使用1種，亦可以組合使用2種以上。 本發明的組成物可以包含或不包含其他高分子化合物，包含之情況下，其他高分子化合物的含量相對於從本發明的組成物的總固體成分質量中去除了填充劑之總質量，係0.01質量%以上且30質量%以下為較佳，0.02質量%以上且20質量%以下為更佳。 In the present invention, other polymer compounds may be used alone or in combination of two or more. The composition of the present invention may or may not contain other polymer compounds. In the case of inclusion, the content of other polymer compounds is 0.01 relative to the total mass of the total solid content of the composition of the present invention excluding fillers. It is preferably at least 30 mass %, more preferably at least 0.02 mass % and at most 20 mass %.

＜樹脂組成物的特性＞ 本發明的樹脂組成物的黏度能夠利用樹脂組成物的固體成分濃度來調整。從塗佈膜厚的觀點考慮，1,000mm 2/s～12,000mm 2/s為較佳，2,000mm 2/s～10,000mm 2/s為更佳，2,500mm 2/s～8,000mm 2/s為進一步較佳。若在上述範圍內，則容易獲得均勻性高的塗佈膜。若為1,000mm 2/s以上，則例如容易以作為再配線用絕緣膜而需要之膜厚進行塗佈，若為12,000mm 2/s以下，則可獲得塗佈表面形態優異之塗膜。 <Characteristics of the resin composition> The viscosity of the resin composition of the present invention can be adjusted by the solid content concentration of the resin composition. From the viewpoint of coating film thickness, 1,000mm 2 /s to 12,000mm 2 /s is preferable, 2,000mm 2 /s to 10,000mm 2 /s is more preferable, and 2,500mm 2 /s to 8,000mm 2 /s is more preferable for further improvement. If it is in the said range, it will become easy to obtain the coating film with high uniformity. If it is 1,000 mm 2 /s or more, it is easy to coat with a film thickness required as an insulating film for rewiring, for example, and if it is 12,000 mm 2 /s or less, a coating film with excellent coating surface morphology can be obtained.

＜關於樹脂組成物的含有物質之限制＞ 本發明的樹脂組成物的含水率小於2.0質量%為較佳，小於1.5質量%為更佳，小於1.0質量%為進一步較佳。若小於2.0%，則樹脂組成物的保存穩定性得到提高。 作為維持水分的含量之方法，可以舉出調整保管條件中的濕度、降低保管時的收容容器的孔隙率等。 <Restrictions on substances contained in resin compositions> The moisture content of the resin composition of the present invention is preferably less than 2.0% by mass, more preferably less than 1.5% by mass, and still more preferably less than 1.0% by mass. If it is less than 2.0%, the storage stability of the resin composition will be improved. As a method of maintaining the water content, adjustment of the humidity in the storage conditions, reduction of the porosity of the storage container during storage, and the like can be mentioned.

從絕緣性的觀點而言，本發明的樹脂組成物的金屬含量（其中，填充劑設為在該金屬含量中不包含者）小於5質量ppm（parts per million：百萬分率）為較佳，小於1質量ppm為更佳，小於0.5質量ppm為進一步較佳。作為金屬，可以舉出鈉、鉀、鎂、鈣、鐵、銅、鉻、鎳等，但以有機化合物與金屬的錯合物的形式包含之金屬除外。包含複數種金屬時，該等金屬的合計在上述範圍為較佳。From the standpoint of insulation, it is preferable that the metal content of the resin composition of the present invention (where the filler is not included in the metal content) is less than 5 mass ppm (parts per million: parts per million) , is more preferably less than 1 mass ppm, and is still more preferably less than 0.5 mass ppm. Examples of metals include sodium, potassium, magnesium, calcium, iron, copper, chromium, nickel and the like, but metals contained in the form of complexes of organic compounds and metals are excluded. When a plurality of metals are contained, the total of these metals is preferably within the above range.

又，作為減少無意包含於本發明的樹脂組成物中之金屬雜質之方法，能夠舉出如下等方法：選擇金屬含量少的原料作為構成本發明的樹脂組成物之原料；對構成本發明的樹脂組成物之原料進行過濾器過濾；在裝置內用聚四氟乙烯等進行加襯（lining）而在盡可能抑制污染之條件下進行蒸餾。Also, as a method for reducing the metal impurities unintentionally included in the resin composition of the present invention, the following methods can be mentioned: selecting a raw material with a small metal content as the raw material constituting the resin composition of the present invention; The raw materials of the composition are filtered through a filter; the inside of the device is lined with polytetrafluoroethylene, etc., and the distillation is carried out under the condition of suppressing pollution as much as possible.

在本發明的樹脂組成物中，若考慮作為半導體材料的用途，則從配線腐蝕性的觀點考慮，鹵素原子的含量小於500質量ppm為較佳，小於300質量ppm為更佳，小於200質量ppm為進一步較佳。其中，以鹵素離子的狀態存在者小於5質量ppm為較佳，小於1質量ppm為更佳，小於0.5質量ppm為進一步較佳。作為鹵素原子，可以舉出氯原子及溴原子。氯原子及溴原子或氯離子及溴離子的合計分別在上述範圍為較佳。 作為調節鹵素原子的含量之方法，可較佳地舉出離子交換處理等。 In the resin composition of the present invention, considering the use as a semiconductor material, the content of halogen atoms is preferably less than 500 mass ppm, more preferably less than 300 mass ppm, and less than 200 mass ppm from the viewpoint of wiring corrosion. for further improvement. Among them, those present in the state of halogen ions are preferably less than 5 mass ppm, more preferably less than 1 mass ppm, and still more preferably less than 0.5 mass ppm. Examples of the halogen atom include a chlorine atom and a bromine atom. The total of chlorine atoms and bromine atoms or chlorine ions and bromine ions is preferably within the above-mentioned ranges. As a method of adjusting the content of a halogen atom, ion exchange treatment etc. are mentioned preferably.

作為本發明的樹脂組成物的收容容器，能夠使用以往公知的收容容器。又，作為收容容器，以抑制雜質混入原材料或本發明的樹脂組成物中為目的，使用將容器內壁由6種6層的樹脂構成之多層瓶或用6種樹脂製成7層結構之瓶亦較佳。作為這種容器，例如，可以舉出日本特開2015-123351號公報中所記載之容器。 [實施例] As a container for the resin composition of the present invention, a conventionally known container can be used. Also, as a storage container, for the purpose of suppressing impurities from being mixed into the raw material or the resin composition of the present invention, a multi-layer bottle made of 6 kinds of 6-layer resins or a bottle of 7-layer structure made of 6 kinds of resins is used. Also better. As such a container, the container described in Unexamined-Japanese-Patent No. 2015-123351 is mentioned, for example. [Example]

以下，舉出實施例對本發明進行進一步具體的說明。以下的實施例中所示出之材料、使用量、比例、處理內容、處理步驟等只要不脫離本發明的宗旨，則能夠適當進行變更。故，本發明的範圍並不限定於以下示出之具體例。Hereinafter, an Example is given and this invention is demonstrated further concretely. Materials, usage amounts, ratios, processing contents, processing procedures, etc. shown in the following examples can be appropriately changed unless departing from the gist of the present invention. Therefore, the scope of the present invention is not limited to the specific examples shown below.

＜合成例2；聚合物P-2的合成＞ 將4,4’-氧代二鄰苯二甲酸二酐（ODPA）7.76g（25毫莫耳）及3,3’,4,4’-聯苯四羧酸二酐6.23g（25毫莫耳）放入到反應容器中，並且加入甲基丙烯酸-2-羥基乙酯（HEMA）13.4g及γ-丁內酯100ml。藉由一邊在室溫下攪拌，一邊加入吡啶7.91g而獲得了反應混合物。在基於反應之發熱結束之後，自然冷卻至室溫，進一步靜置了16小時。 接著，在冰冷卻下，在反應混合物中，一邊攪拌將二環己基碳二亞胺（DCC）20.6g（99.9毫莫耳）溶解於γ-丁內酯30ml之溶液，一邊經40分鐘加入。繼續一邊攪拌4,4’-二胺基二苯醚（DADPE）9.3g（46毫莫耳）懸浮於γ-丁內酯350ml之懸浮液，一邊經60分鐘加入。 在室溫下攪拌了2小時之後，進一步加入乙醇3ml並攪拌了1小時。然後，加入γ-丁內酯100ml。藉由過濾而去除在反應混合物中產生之沉澱物而獲得了反應液。 將所獲得之反應液加入到3升的乙醇中，生成了由粗聚合物構成之沉澱物。濾取所生成之粗聚合物，並且溶解於四氫呋喃200ml而獲得了粗聚合物溶液。將所獲得之粗聚合物溶液滴加到3升的水中，使聚合物沉澱，濾取所獲得之沉澱物之後，進行真空乾燥而獲得了粉末狀的聚合物P-2。 測量了該聚合物的重量平均分子量（Mw），結果為23,000。 聚合物P-2係下述結構的樹脂。括號的下標表示各重複單元的莫耳比。 [化學式66]

Figure 02_image131
<Synthesis Example 2; Synthesis of Polymer P-2> 7.76 g (25 millimoles) of 4,4'-oxodiphthalic dianhydride (ODPA) and 3,3',4,4'- 6.23 g (25 mmol) of biphenyltetracarboxylic dianhydrides were put into the reaction container, and 13.4 g of 2-hydroxyethyl methacrylate (HEMA) and 100 ml of γ-butyrolactone were added. A reaction mixture was obtained by adding 7.91 g of pyridine while stirring at room temperature. After the heat generation by the reaction ended, it was naturally cooled to room temperature, and then left still for 16 hours. Next, a solution of 20.6 g (99.9 mmol) of dicyclohexylcarbodiimide (DCC) dissolved in 30 ml of γ-butyrolactone was added to the reaction mixture over 40 minutes while stirring under ice cooling. A suspension of 9.3 g (46 mmol) of 4,4'-diaminodiphenyl ether (DADPE) suspended in 350 ml of γ-butyrolactone was added over 60 minutes while stirring. After stirring at room temperature for 2 hours, 3 ml of ethanol was further added and stirred for 1 hour. Then, 100 ml of γ-butyrolactone was added. The precipitate generated in the reaction mixture was removed by filtration to obtain a reaction liquid. The obtained reaction solution was added to 3 liters of ethanol to form a precipitate consisting of a crude polymer. The generated crude polymer was collected by filtration, and dissolved in 200 ml of tetrahydrofuran to obtain a crude polymer solution. The obtained crude polymer solution was added dropwise to 3 liters of water to precipitate the polymer, and the obtained precipitate was collected by filtration and vacuum-dried to obtain powdery polymer P-2. The weight average molecular weight (Mw) of this polymer was measured and found to be 23,000. Polymer P-2 is a resin having the following structure. The subscripts in parentheses indicate the molar ratio of each repeating unit. [chemical formula 66]
Figure 02_image131

＜合成例3；聚合物P-3的合成＞ 將20.0g（64.5毫莫耳）的4,4’-氧二鄰苯二甲酸酐（在140℃下乾燥了12小時）、16.8g（129毫莫耳）的甲基丙烯酸-2-羥基乙酯、0.05g的氫醌、20.4g（258毫莫耳）的吡啶、100g的二甘二甲醚進行混合，在60℃的溫度下攪拌18小時而製造了4,4’-氧代二鄰苯二甲酸和甲基丙烯酸-2-羥基乙酯的二酯。接著，冷卻反應混合物，經2小時加入了16.12g（135.5毫莫耳）的SOCl 2。接著，將在100mL的N-甲基吡咯啶酮中溶解了12.74g（60.0毫莫耳）的2,2’-二甲基聯苯‐4,4’-二胺之溶液調整到-5～0℃的溫度範圍內，並且經2小時滴加到反應混合物中。在0℃下，使反應混合物反應1小時之後，加入乙醇70g，在室溫下攪拌了1小時。接著，在5升的水中使聚醯亞胺前驅物沉澱，並將水-聚醯亞胺前驅物混合物以5,000rpm的速度攪拌了15分鐘。過濾聚醯亞胺前驅物並去除，在4升的水中再次攪拌30分鐘並在此過濾。接著，在減壓下，將所獲得之聚醯亞胺前驅物乾燥2天。該聚醯亞胺前驅物（聚合物P-3）的重量平均分子量為29,000。 聚合物P-3係下述結構的樹脂。 [化學式67]

Figure 02_image133
<Synthesis Example 3; Synthesis of Polymer P-3> 20.0 g (64.5 mmol) of 4,4'-oxydiphthalic anhydride (dried at 140° C. for 12 hours), 16.8 g (129 millimoles) of 2-hydroxyethyl methacrylate, 0.05 g of hydroquinone, 20.4 g (258 millimoles) of pyridine, and 100 g of diglyme, and stirred at a temperature of 60 ° C for 18 The diester of 4,4'-oxodiphthalic acid and 2-hydroxyethyl methacrylate was produced in hours. Next, the reaction mixture was cooled and 16.12 g (135.5 mmol) of SOCl2 were added over 2 hours. Next, a solution in which 12.74 g (60.0 mmol) of 2,2'-dimethylbiphenyl-4,4'-diamine was dissolved in 100 mL of N-methylpyrrolidone was adjusted to -5~ temperature range of 0°C and was added dropwise to the reaction mixture over 2 hours. After allowing the reaction mixture to react at 0° C. for 1 hour, 70 g of ethanol was added thereto, followed by stirring at room temperature for 1 hour. Next, the polyimide precursor was precipitated in 5 liters of water, and the water-polyimide precursor mixture was stirred at a speed of 5,000 rpm for 15 minutes. The polyimide precursor was filtered and removed, stirred again in 4 liters of water for 30 minutes and filtered there. Next, the obtained polyimide precursor was dried under reduced pressure for 2 days. The weight average molecular weight of this polyimide precursor (polymer P-3) was 29,000. Polymer P-3 is a resin having the following structure. [chemical formula 67]
Figure 02_image133

＜合成例4；聚合物P-4的合成＞ 將20.0g（64.5毫莫耳）的4,4’-氧二鄰苯二甲酸酐（在140℃下乾燥了12小時）、16.8g（129毫莫耳）的甲基丙烯酸-2-羥基乙酯、0.05g的氫醌、20.4g（258毫莫耳）的吡啶、100g的二甘二甲醚進行混合，在60℃的溫度下攪拌18小時而製造了4,4’-氧代二鄰苯二甲酸和甲基丙烯酸-2-羥基乙酯的二酯。接著，藉由SOCl 2將所獲得之二酯進行氯化之後，以與合成例3相同的方式，將在N-甲基吡咯啶酮中溶解了4,4’-二胺基二苯醚之溶液滴加到反應混合物中，將之後獲得之反應混合物進行提純和乾燥。該聚醯亞胺前驅物（聚合物P-4）的重量平均分子量為18,000。 聚合物P-4係下述結構的樹脂。 [化學式68]

Figure 02_image135
<Synthesis Example 4; Synthesis of Polymer P-4> 20.0 g (64.5 mmol) of 4,4'-oxydiphthalic anhydride (dried at 140° C. for 12 hours), 16.8 g (129 millimoles) of 2-hydroxyethyl methacrylate, 0.05 g of hydroquinone, 20.4 g (258 millimoles) of pyridine, and 100 g of diglyme, and stirred at a temperature of 60 ° C for 18 The diester of 4,4'-oxodiphthalic acid and 2-hydroxyethyl methacrylate was produced in hours. Next, after chlorinating the obtained diester with SOCl 2 , in the same manner as in Synthesis Example 3, 4,4'-diaminodiphenyl ether was dissolved in N-methylpyrrolidone The solution was added dropwise to the reaction mixture, and the reaction mixture obtained thereafter was purified and dried. The weight average molecular weight of this polyimide precursor (polymer P-4) was 18,000. Polymer P-4 is a resin having the following structure. [chemical formula 68]
Figure 02_image135

＜合成例5；聚合物P-5的合成＞ 在乾燥氮氣流下，在25℃下使由4,4’-二羧基二苯醚和1-羥基苯并三唑構成之二羧酸二酯88.64g（180毫莫耳）、2,2-雙（3-胺基-4-羥基苯基）六氟丙烷65.93g（180毫莫耳）、ED-600（產品名稱，Huntsman Corporation製造）12.00g（20毫莫耳）、NMP（N-甲基吡咯啶酮）800g反應30分鐘，接著在油浴中加熱，在80℃下反應了8小時。接著，作為封端劑加入5-降莰烯-2,3-二羧酸酐12.31g（75毫莫耳），在80℃下進一步攪拌3小時，結束反應。反應結束後，將溶液冷卻至室溫之後，過濾反應混合物，將反應混合物投入到水/異丙醇=3/1（體積比）的混合液2L中，獲得了沉澱物。過濾並收集該沉澱物，用水清洗3次之後，在80℃的真空乾燥機乾燥20小時，獲得了聚合物P-5（聚苯并㗁唑前驅物）。重量平均分子量為28,000。 <Synthesis Example 5; Synthesis of Polymer P-5> Under dry nitrogen flow, 88.64 g (180 millimoles) of dicarboxylic acid diester composed of 4,4'-dicarboxydiphenyl ether and 1-hydroxybenzotriazole, 2,2-bis (3-amino-4-hydroxyphenyl)hexafluoropropane 65.93 g (180 mmol), ED-600 (product name, manufactured by Huntsman Corporation) 12.00 g (20 mmol), NMP (N-methyl pyrrolidone) 800 g was reacted for 30 minutes, then heated in an oil bath, and reacted at 80° C. for 8 hours. Next, 12.31 g (75 millimoles) of 5-norbornene-2,3-dicarboxylic anhydride was added as a terminal blocking agent, and the mixture was further stirred at 80° C. for 3 hours to complete the reaction. After the reaction was completed, the solution was cooled to room temperature, the reaction mixture was filtered, and the reaction mixture was poured into 2 L of a mixed liquid of water/isopropanol=3/1 (volume ratio), and a precipitate was obtained. The precipitate was collected by filtration, washed with water three times, and then dried in a vacuum dryer at 80° C. for 20 hours to obtain polymer P-5 (polybenzoxazole precursor). The weight average molecular weight was 28,000.

混合下述表中記載之成分，獲得了各組成物。 具體而言，表中記載之成分的含量設為表中記載之量（質量份）。又，在表中，“-”的記載表示組成物不含有對應之成分。 The components described in the following tables were mixed to obtain respective compositions. Concretely, the content of the components described in the table was the amount (parts by mass) described in the table. In addition, in the table, the description of "-" shows that a composition does not contain a corresponding component.

[表1] 成分 組成物1 組成物2 組成物3 組成物4 組成物5 組成物6 組成物7 組成物8 組成物9 組成物10 組成物11 組成物12 組成物13 組成物14 F-1 28.62 28.8 - - - - 28.8 - - - - - - - F-2 9.54 9.6 - - - - 9.6 - 32 - - - - - F-3 - - - - - 48 - - - - - - - - F-4 - - - - 32 - - 32 - - 21.4 21.4 21.4 21.4 F-5 - - 45.7 45.7 - - - - - - - - - - F-6 - - - - - - - - - - 7.1    - - F-7 - - - - - - - - - - - 7.1 - - F-8 - - - - - - - - - - - - 7.1 7.1 P-1 31.8 - - - - - - - - 69.96 - - - - P-2 - 9.6 - - - - - - - - - - - - P-3 - - 8 - - - - - - - - - - - P-4 - - - 8 8 9.2 - 8 8 - 16.4 16.4 16.4 16.4 P-5 - - - - - - 9.6 - - - - - - - B-1 - 8.82 7.35 - - - 9 - - - 4.8 4.8 4.8 2.4 B-2 11.76 - - - - - - - - 11.76 - - - - B-3 - - - 7.35 7.35 6.9 - 7.35 7.35 - - - - - B-4 - - - - - - - - - - - - - 2.4 C-1 - - - - 1.5 1 - 1.5 1.5 - - - - - C-2 - 1.8 1.5 1.5 - - 1.8 - - - 1.1 1.1 1.1 1.1 D-1 - 0.54 0.45 0.45 0.45 0.32 - 0.45 0.45 - 0.45 0.45 0.45 0.45 E-1 0.3 0.6 0.5 0.5 0.5 0.35 0.5 0.5 0.5 0.3 0.6 0.6 0.6 0.6 A-1 0.06 0.06 0.05 0.05 0.05 0.035 0.05 0.05 0.05 0.06 0.02 0.02 0.02 0.02 G-1 0.24 0.18 0.15 0.15 0.15 0.14 - 0.15 0.15 0.24 - - - - G-2 - - - - - - - - - - 0.3 0.3 0.3 0.3 H-1 - 40 15 15 50 20 40.65 50 50 - 47.83 47.83 47.83 47.83 H-2 - - 21.3 21.3 - 14.055 - - - - - - - - H-3 17.68 - - - - - - - - 17.68 - - - - [Table 1] Element Composition 1 Composition 2 Composition 3 Composition 4 Composition 5 Composition 6 Composition 7 Composition 8 Composition 9 Composition 10 Composition 11 Composition 12 Composition 13 Composition 14 F-1 28.62 28.8 - - - - 28.8 - - - - - - - F-2 9.54 9.6 - - - - 9.6 - 32 - - - - - F-3 - - - - - 48 - - - - - - - - F-4 - - - - 32 - - 32 - - 21.4 21.4 21.4 21.4 F-5 - - 45.7 45.7 - - - - - - - - - - F-6 - - - - - - - - - - 7.1 - - F-7 - - - - - - - - - - - 7.1 - - F-8 - - - - - - - - - - - - 7.1 7.1 P-1 31.8 - - - - - - - - 69.96 - - - - P-2 - 9.6 - - - - - - - - - - - - P-3 - - 8 - - - - - - - - - - - P-4 - - - 8 8 9.2 - 8 8 - 16.4 16.4 16.4 16.4 P-5 - - - - - - 9.6 - - - - - - - B-1 - 8.82 7.35 - - - 9 - - - 4.8 4.8 4.8 2.4 B-2 11.76 - - - - - - - - 11.76 - - - - B-3 - - - 7.35 7.35 6.9 - 7.35 7.35 - - - - - B-4 - - - - - - - - - - - - - 2.4 C-1 - - - - 1.5 1 - 1.5 1.5 - - - - - C-2 - 1.8 1.5 1.5 - - 1.8 - - - 1.1 1.1 1.1 1.1 D-1 - 0.54 0.45 0.45 0.45 0.32 - 0.45 0.45 - 0.45 0.45 0.45 0.45 E-1 0.3 0.6 0.5 0.5 0.5 0.35 0.5 0.5 0.5 0.3 0.6 0.6 0.6 0.6 A-1 0.06 0.06 0.05 0.05 0.05 0.035 0.05 0.05 0.05 0.06 0.02 0.02 0.02 0.02 G-1 0.24 0.18 0.15 0.15 0.15 0.14 - 0.15 0.15 0.24 - - - - G-2 - - - - - - - - - - 0.3 0.3 0.3 0.3 H-1 - 40 15 15 50 20 40.65 50 50 - 47.83 47.83 47.83 47.83 H-2 - - 21.3 21.3 - 14.055 - - - - - - - - H-3 17.68 - - - - - - - - 17.68 - - - -

表中記載之縮寫的詳細內容為如下所述。The details of the abbreviations listed in the table are as follows.

〔樹脂〕 ·P-1：Upia（註冊商標）-LB 1001（Ube Industries, Ltd製造） ·P-2～P-5：在上述合成之P-2～P-5 [resin] · P-1: Upia (registered trademark) - LB 1001 (manufactured by Ube Industries, Ltd) P-2～P-5: P-2～P-5 synthesized above

〔填充劑〕 ·F-1：氧化鋁/Sumitomo Chemical Co.,Ltd.製造，Sumiko Random AA-3 ·F-2：氧化鋁/Sumitomo Chemical Co.,Ltd.製造，Sumiko Random AA-04 ·F-3：二氧化矽奈米粒子分散液（平均粒徑：0.02μm） ·F-4：氮化硼/3M公司製造，Platelets001 ESK Ceramics公司製造，SPC1 ·F-5：氧化鋁/Admatechs Co., Ltd.製造，微細氧化鋁分散液，AO-502 ·F-6：碳纖維（Mitsubishi Chemical Corporation製造之Dialead K223） ·F-7：氮化硼奈米管（BNNano Inc製造之BN Nanobarbs） ·F-8：纖維狀氮化鋁（U-MAP Co., Ltd.製造之熱敏粉末型） 〔filler〕 ・F-1: Aluminum oxide/manufactured by Sumitomo Chemical Co., Ltd., Sumiko Random AA-3 ・F-2: Aluminum oxide/manufactured by Sumitomo Chemical Co., Ltd., Sumiko Random AA-04 ・F-3: Silica nanoparticle dispersion (average particle size: 0.02μm) F-4: Boron Nitride/Manufactured by 3M Company, Platelets001 Manufactured by ESK Ceramics, SPC1 ・F-5: Alumina/Admatechs Co., Ltd., fine alumina dispersion, AO-502 ・F-6: Carbon fiber (Dialead K223 manufactured by Mitsubishi Chemical Corporation) F-7: Boron Nitride Nanotubes (BN Nanobarbs manufactured by BNNano Inc) ・F-8: Fibrous aluminum nitride (heat-sensitive powder type manufactured by U-MAP Co., Ltd.)

〔聚合性化合物〕 ·B-1：四乙二醇二甲基丙烯酸酯（Arkema公司製造） ·B-2：二新戊四醇六丙烯酸酯（KYOEISHA CHEMICAL Co.,LTD製造） ·B-3：OGSOL EA-0300 丙烯酸酯（Osaka Gas Chemicals Co.,Ltd.製造） ·B-4：OGSOL EA-0200（Osaka Gas Chemicals Co.,Ltd.製造） 〔polymeric compound〕 ・B-1: Tetraethylene glycol dimethacrylate (manufactured by Arkema) · B-2: Dineopentylthritol hexaacrylate (manufactured by KYOEISHA CHEMICAL Co.,LTD) ・B-3: OGSOL EA-0300 acrylate (manufactured by Osaka Gas Chemicals Co., Ltd.) · B-4: OGSOL EA-0200 (manufactured by Osaka Gas Chemicals Co., Ltd.)

〔起始劑〕 ·C-1：Irgacure OXE-01（BASF公司製造） ·C-2：PERCUMYL D（NOF CORPORATION製造） 〔Initiator〕 ・C-1: Irgacure OXE-01 (manufactured by BASF Corporation) ・C-2: PERCUMYL D (manufactured by NOF CORPORATION)

〔金屬接著性改進劑〕 ·D-1：N-[3-（三乙氧基甲矽烷基）丙基]順丁烯醯胺酸 〔Metal adhesion improver〕 D-1: N-[3-(triethoxysilyl)propyl]maleic acid

〔遷移抑制劑〕 ·E-1：5-胺基四唑 〔Migration inhibitor〕 · E-1: 5-aminotetrazole

〔聚合抑制劑〕 ·A-1：4MeHQ（4-甲氧基苯酚） 〔polymerization inhibitor〕 A-1: 4MeHQ (4-methoxyphenol)

〔鹼產生劑〕 ·G-1：1-[4-（2-羥乙基）-1-哌啶基]-3-（2-羥基苯基）-1- 丙酮 ·G-2：下述化合物 [化學式69]

Figure 02_image137
[Base generator] G-1: 1-[4-(2-hydroxyethyl)-1-piperidinyl]-3-(2-hydroxyphenyl)-1-propanone G-2: the following Compound [Chemical Formula 69]
Figure 02_image137

〔溶劑〕 ·H-1：GBL（γ-丁內酯） ·H-2：CN（環戊酮） ·H-3：NMP（N-甲基吡咯啶酮） 〔Solvent〕 · H-1: GBL (γ-butyrolactone) H-2: CN (cyclopentanone) H-3: NMP (N-Methylpyrrolidone)

又，填充劑的物性的詳細內容如下述表所示。 [表2] 填充劑 平均粒徑 （μm） 比表面積 （m 2/g） F-1 3.5 5 F-2 0.47 4 F-3 0.02 230 F-4 0.5 20 F-5 0.25 8 In addition, the details of the physical properties of the filler are shown in the following table. [Table 2] filler Average particle size (μm) Specific surface area (m 2 /g) F-1 3.5 5 F-2 0.47 4 F-3 0.02 230 F-4 0.5 20 F-5 0.25 8

＜平均粒徑的評價＞ 填充劑的平均粒徑在基板上塗佈組成物之後，觀察進行了軟性烘烤、預硬化之膜的剖面SEM（掃描式電子顯微鏡）並進行測量。作為SEM，使用Hitachi High-Technologies Corporation.製造之掃描式電子顯微鏡S-4800，算出相對於各粒子的表觀輪廓的最小包含圓的直徑的平均值，作為平均粒徑。 ＜Evaluation of Average Particle Size＞ Average Particle Size of Filler After coating the composition on the substrate, the cross-section SEM (scanning electron microscope) of the soft-baked and pre-cured film was observed and measured. As SEM, the scanning electron microscope S-4800 manufactured by Hitachi High-Technologies Corporation was used, and the average value of the diameters of the smallest enclosing circle with respect to the apparent contour of each particle was calculated as the average particle diameter.

＜組成物的製備＞ 如表1所示，混合各成分，製備了均勻的溶液。將所獲得之溶液通過細孔寬度為20μm的過濾器，並且在壓力0.4Mpa下進行加壓過濾，獲得了樹脂組成物。 ＜Preparation of composition＞ As shown in Table 1, the components were mixed to prepare a homogeneous solution. The obtained solution was passed through a filter having a pore width of 20 μm, and pressure-filtered at a pressure of 0.4 MPa to obtain a resin composition.

＜基板的製作＞ 藉由電鍍在8英吋矽晶圓上製作了具有以下尺寸、金屬種類之柱狀基板。任意基板的柱均為正方陣列。 a）間距；25μm、銅柱直徑;10μm、銅柱高度;10μm b）間距；45μm、依序形成銅/錫柱直徑;20μm、銅/錫柱高度;2/8μm、矽晶圓、銅、錫。 c）間距；45μm、銅柱直徑;20μm、銅柱高度;10μm d）在8英吋矽晶圓上，藉由CVD（化學氣相沉積（chemical vapor deposition））形成厚度5μm的SiO 2膜，藉由光微影及乾式蝕刻，以正方陣列形成了間距45μm、直徑20μm的孔圖案。對形成孔圖案之面上，藉由CVD依序形成鈦及銅的薄層之後，藉由電鍍向孔圖案內填充了銅。然後，將在圖案內填充了銅之SiO 2膜與內部的銅一起藉由CMP研磨至厚度3μm。 <Manufacturing of the substrate> A columnar substrate with the following dimensions and metal types was fabricated on an 8-inch silicon wafer by electroplating. The columns of any substrate are square arrays. a) spacing; 25μm, diameter of copper pillar; 10μm, height of copper pillar; 10μm b) spacing; 45μm, diameter of copper/tin pillar formed sequentially; 20μm, height of copper/tin pillar; 2/8μm, silicon wafer, copper, tin. c) pitch; 45 μm, diameter of copper pillars; 20 μm, height of copper pillars; 10 μm d) SiO 2 film with a thickness of 5 μm formed on an 8-inch silicon wafer by CVD (chemical vapor deposition), Through photolithography and dry etching, hole patterns with a pitch of 45 μm and a diameter of 20 μm were formed in a square array. On the surface on which the hole pattern was formed, thin layers of titanium and copper were sequentially formed by CVD, and copper was filled into the hole pattern by electroplating. Then, the SiO 2 film filled with copper in the pattern was polished to a thickness of 3 μm by CMP together with the inner copper.

以下對所製作之柱狀基板的詳細內容進行詳細說明。 圖6的（a）係上述a）及c）的概略剖面圖。 在圖6的（a）中，分別地10表示基板，12表示藉由銅而形成之凸部（柱）。 圖6的（a）中，各柱中的柱直徑d的算術平均值係柱直徑，在a）中係10μm、在c）中係20μm。 圖6的（a）中，各柱中的柱間隔p的算術平均值係間距，在a）中係10μm、在c）中係20μm。 圖6的（a）中，各柱中的柱高度h的算術平均值係柱高度，在a）中係10μm、在c）中係10μm。 圖6的（b）係上述b）的概略剖面圖。 圖6的（b）中，10表示基板、12表示凸部，凸部12係由藉由錫而形成之柱（導通路）14和藉由銅而形成之柱（電極）16形成。 圖6的（b）中，各柱中的柱直徑d的算術平均值係柱直徑，在b）中係20μm。 圖6的（b）中，各柱中的柱間隔p的算術平均值係間距，在b）中係45μm。 圖6的（b）中，各柱中的導通路高度h1的算術平均值係錫柱高度，在b）中係8μm。 圖6的（b）中，各柱中的電極高度h2的算術平均值係銅柱高，在b）中係2μm。 The details of the manufactured columnar substrate will be described in detail below. (a) of FIG. 6 is a schematic sectional view of said a) and c). In (a) of FIG. 6 , 10 denotes a substrate, and 12 denotes a protrusion (column) formed of copper. In (a) of FIG. 6 , the arithmetic mean value of the column diameter d in each column is 10 μm in a) and 20 μm in c). In (a) of FIG. 6 , the arithmetic mean of the column spacing p in each column is a pitch, and it is 10 μm in a) and 20 μm in c). In (a) of FIG. 6 , the arithmetic mean bollard height of the column height h in each column is 10 μm in a) and 10 μm in c). (b) of FIG. 6 is a schematic cross-sectional view of the above b). In (b) of FIG. 6 , 10 denotes a substrate, 12 denotes a protrusion, and the protrusion 12 is formed of a post (conduction path) 14 formed of tin and a post (electrode) 16 formed of copper. In (b) of FIG. 6 , the arithmetic mean value of the column diameter d in each column is the column diameter, and in b), it is 20 μm. In (b) of FIG. 6 , the arithmetic mean of the column spacing p in each column is the pitch, and in b), it is 45 μm. In (b) of FIG. 6 , the arithmetic mean value of the conduction path height h1 in each pillar is the tin pillar height, and in b), it is 8 μm. In (b) of FIG. 6 , the arithmetic mean value of the electrode height h2 in each pillar is the copper pillar height, and in b), it is 2 μm.

＜基板積層體（接合體）的製作＞ 在a）、b）、c）、d）的各基板上，將後述之表中所記載之各組成物塗佈成15μm膜厚，在100℃下，烘烤了5分鐘。進一步以表中記載之條件進行追加烘烤，獲得了含填充劑層。然後，藉由使用DISCO公司製造之Surface planer DAS8920，將表面切割成殘膜5μm而進行了含填充劑層的表面的平坦化。製作各2片（表中的基板1及基板2）進行了平坦化之基板，並且以表中記載之組合，並且用EVG公司製造之Bonder540實施了基板彼此的接合。以接合溫度250℃或300℃（表中的“接合溫度”的欄中記載之溫度）、按壓力14kN、加熱時間：10min、環境壓力：1×10 -3mbar的條件實施接合，獲得了基板積層體（接合體）。對於各接合體，確認到基板彼此被電連接。1mbar係100Pa。 <Preparation of substrate laminate (bonded body)> On each of the substrates a), b), c), and d), each composition described in the table below was applied to a film thickness of 15 μm, and the temperature was 100°C. , and bake for 5 minutes. Further, additional baking was performed under the conditions described in the table to obtain a filler-containing layer. Then, using Surface planer DAS8920 manufactured by DISCO Corporation, the surface was cut to have a residual film of 5 μm, and the surface of the filler layer was planarized. Two planarized substrates (substrate 1 and substrate 2 in the table) were produced, and the substrates were bonded together using Bonder 540 manufactured by EVG in combinations described in the table. Bonding was carried out at a bonding temperature of 250°C or 300°C (the temperature described in the "Joining temperature" column in the table), pressing force of 14kN, heating time: 10min, and ambient pressure: 1×10 -3 mbar to obtain a substrate Laminates (Joints). In each bonded body, it was confirmed that the substrates were electrically connected to each other. 1mbar is 100Pa.

＜最大剝離阻力的評價＞ 使用切割機將所獲得之各基板積層體切割成7mm×7mm的尺寸，使用XYZTEC公司製造之condor Sigma模具測試儀，使用共享工具測量了尺寸係7mm×7mm的最大剝離阻力（kg/cm 2）。每一級等級製作5個試驗片，進行各5次測量，採用了其算術平均值。最大剝離阻力以下述3個階段進行了評價。評價結果記載於表的“最大剝離阻力”欄中。最大剝離阻力越大，表示接合體的接著性越優異。 -評價標準- A：最大剝離阻力係50kg/cm 2以上。 B：最大剝離阻力小於50kg/cm 2且40kg/cm 2以上。 C：最大剝離阻力小於40kg/cm 2。 <Evaluation of maximum peel resistance> Each of the obtained substrate laminates was cut into a size of 7 mm x 7 mm using a cutting machine, and the maximum peel of the size system of 7 mm x 7 mm was measured using a condor Sigma mold tester manufactured by XYZTEC Co., Ltd. using a shared tool. Resistance (kg/cm 2 ). Five test pieces were prepared for each grade, and the measurement was performed five times each, and the arithmetic mean thereof was adopted. The maximum peel resistance was evaluated in the following three steps. The evaluation results are described in the "maximum peel resistance" column of the table. The larger the maximum peel resistance, the better the adhesiveness of the bonded body. -Evaluation Criteria- A: The maximum peel resistance is 50 kg/cm 2 or more. B: The maximum peel resistance is less than 50 kg/cm 2 and not less than 40 kg/cm 2 . C: The maximum peel resistance is less than 40 kg/cm 2 .

＜耐環境性的評價＞ 以與上述最大剝離阻力的評價相同的條件製作了接合體（基板積層體）。使用HIRAYAMA Manufacturing Corporation製造之HAST裝置PC-422R8，在120℃/100%RH（相對濕度）/0.1Mpa的環境下，將接合體保持了168小時。對保持後的接合體進行上述最大剝離阻力的評價，將表示上述最大剝離阻力的50%以上的值者設為（A）、將表示25%以上且小於50%的值者設為（B）、將小於25%的值者設為（C）。評價結果記載於表中的“耐環境性”的欄中。 ＜Evaluation of Environmental Resistance＞ A bonded body (substrate laminate) was produced under the same conditions as the evaluation of the above-mentioned maximum peel resistance. The bonded body was held for 168 hours in an environment of 120° C./100% RH (relative humidity)/0.1 MPa using a HAST apparatus PC-422R8 manufactured by HIRAYAMA Manufacturing Corporation. The above-mentioned maximum peel resistance was evaluated for the bonded body after holding, and the value indicating 50% or more of the above-mentioned maximum peel resistance was set as (A), and the value showing 25% or more and less than 50% was set as (B) , Set the value less than 25% as (C). The evaluation results are described in the column of "environmental resistance" in the table.

＜導熱性＞ 基於熱擴散率評價了導熱性。基於週期加熱法（塑膠的國際標準 依據ISO 22007-3），並且用熱擴散率測量裝置FTC-RT（ADVANCE RIKO Inc.製造）測量了熱擴散率。藉由獲取相同厚度的矽晶圓的參考數據，並算出其差分而進行了測量。藉由使裝置與塗膜面接觸而測量熱擴散率，並且以下述4個階段進行了評價。評價結果記載於表中的“導熱性”的欄中。熱擴散率越大，表示含填充劑層的導熱性越優異。 -評價標準- A：熱擴散率係5.0×10 -7m 2s -1以上。 B：熱擴散率係3.0×10 -7m 2s -1以上且小於5.0×10 -7m 2s -1。 C：熱擴散率係2.0×10 -7m 2s -1以上且小於3.0×10 -7m 2s -1。 D：熱擴散率小於2.0×10 -7m 2s -1。 <Thermal conductivity> The thermal conductivity was evaluated based on the thermal diffusivity. The thermal diffusivity was measured based on a cycle heating method (international standard for plastics according to ISO 22007-3), and thermal diffusivity was measured with a thermal diffusivity measuring device FTC-RT (manufactured by ADVANCE RIKO Inc.). Measurements were performed by acquiring reference data from silicon wafers of the same thickness and calculating the difference. The thermal diffusivity was measured by bringing the device into contact with the coating film surface, and evaluated in the following four steps. The evaluation results are described in the column of "thermal conductivity" in the table. The larger the thermal diffusivity, the better the thermal conductivity of the filler-containing layer. -Evaluation Criteria- A: The thermal diffusivity is 5.0×10 -7 m 2 s -1 or more. B: The thermal diffusivity is not less than 3.0×10 -7 m 2 s -1 and less than 5.0×10 -7 m 2 s -1 . C: The thermal diffusivity is not less than 2.0×10 -7 m 2 s -1 and less than 3.0×10 -7 m 2 s -1 . D: Thermal diffusivity is less than 2.0×10 -7 m 2 s -1 .

＜熱膨脹係數（CTE）的評價＞ 在基板上，將各實施例中使用之組成物塗佈成所獲得之硬化膜的膜厚成為1μm之厚度，並且以表中的“追加烘烤”的欄中記載之厚度進行了加熱。關於加熱後所獲得之硬化膜（含填充劑層的模型），在50～200℃的範圍內，使用J.A.Woollam公司製造之變溫光譜橢偏儀，測量了膜厚方向的線膨脹係數（CTE值）。同樣地，測量了以上述厚度塗佈組成物9，並且藉由加熱200℃/30分鐘而獲得之硬化膜在50～200℃的範圍內的線膨脹係數（CTE-C）。藉由下述式，算出各組成物的相對CTE值（%），以下述3個階段進行評價。 相對CTE值（%）=各組成物的CTE值/CTE-C × 100 -評價標準- A：相對CTE值小於50%。 B：相對CTE值係50%以上且小於70%。 C：相對CTE值係70%以上。 ＜Evaluation of Coefficient of Thermal Expansion (CTE)＞ On the board|substrate, the composition used in each Example was applied so that the film thickness of the obtained cured film might become 1 micrometer, and it heated at the thickness described in the column of "additional baking" in a table|surface. With regard to the cured film obtained after heating (the model containing the filler layer), the coefficient of linear expansion (CTE value) in the film thickness direction was measured in the range of 50 to 200°C using a variable temperature spectroscopic ellipsometer manufactured by J.A. Woollam Co., Ltd. ). Similarly, the coefficient of linear expansion (CTE-C) in the range of 50 to 200° C. was measured for the cured film obtained by applying the composition 9 to the above thickness and heating at 200° C./30 minutes. The relative CTE value (%) of each composition was calculated from the following formula, and the evaluation was performed in the following three stages. Relative CTE value (%) = CTE value of each composition/CTE-C × 100 -evaluation standard- A: The relative CTE value is less than 50%. B: The relative CTE value is more than 50% and less than 70%. C: The relative CTE value is above 70%.

[表3]    組成物 追加烘烤 基板1 基板2 接合溫度 最大剝離阻力 耐環境性的評價 導熱性 CTE 實施例1 組成物1 200℃/30分鐘 a） a） 300℃ B A A B 實施例2 組成物1 200℃/30分鐘 b） c） 250℃ B A A B 實施例3 組成物2 200℃/60分鐘 b） c） 250℃ A A A B 實施例4 組成物3 200℃/60分鐘 b） c） 250℃ A A B A 實施例5 組成物4 200℃/60分鐘 b） c） 250℃ A A B A 實施例6 組成物5 2000C/60分鐘 b） c） 250℃ A A A B 實施例7 組成物6 200℃/60分鐘 b） c） 250℃ A A C A 實施例8 組成物7 200℃/60分鐘 b） c） 250℃ B A A B 實施例9 組成物4 200℃/60分鐘 a） a） 250℃ A A B B 實施例10 組成物5 200℃/60分鐘 a） a） 300℃ A A A B 實施例11 組成物5 200℃/60分鐘 b） d） 250℃ A A B B 實施例12 組成物8 200℃/60分鐘 b） d） 250℃ A A B B 實施例13 組成物9 200℃/60分鐘 b） d） 250℃ A A B B 比較例1 組成物10 200℃/30分鐘 b） c） 300℃ B B D C 比較例2 組成物10 350℃/60分鐘 b） c） 300℃ C C D C 實施例14 組成物11 200℃/10分鐘 a） d） 250℃ A B A B 實施例15 組成物12 200℃/10分鐘 a） d） 250℃ A A A B 實施例16 組成物13 200℃/10分鐘 a） d） 250℃ A A A B 實施例17 組成物14 200℃/10分鐘 a） d） 250℃ A A A B [table 3] Composition Bake Substrate 1 Substrate 2 junction temperature Maximum Peel Resistance Evaluation of Environmental Resistance thermal conductivity CTE Example 1 Composition 1 200℃/30 minutes a) a) 300℃ B A A B Example 2 Composition 1 200℃/30 minutes b) c) 250°C B A A B Example 3 Composition 2 200℃/60min b) c) 250°C A A A B Example 4 Composition 3 200℃/60min b) c) 250°C A A B A Example 5 Composition 4 200℃/60min b) c) 250°C A A B A Example 6 Composition 5 2000C/60 minutes b) c) 250°C A A A B Example 7 Composition 6 200℃/60min b) c) 250°C A A C A Example 8 Composition 7 200℃/60min b) c) 250°C B A A B Example 9 Composition 4 200℃/60min a) a) 250°C A A B B Example 10 Composition 5 200℃/60min a) a) 300℃ A A A B Example 11 Composition 5 200℃/60min b) d) 250°C A A B B Example 12 Composition 8 200℃/60min b) d) 250°C A A B B Example 13 Composition 9 200℃/60min b) d) 250°C A A B B Comparative example 1 Composition 10 200℃/30 minutes b) c) 300℃ B B D. C Comparative example 2 Composition 10 350℃/60min b) c) 300℃ C C D. C Example 14 Composition 11 200℃/10 minutes a) d) 250°C A B A B Example 15 Composition 12 200℃/10 minutes a) d) 250°C A A A B Example 16 Composition 13 200℃/10 minutes a) d) 250°C A A A B Example 17 Composition 14 200℃/10 minutes a) d) 250°C A A A B

從上述表的結果明確可知，藉由本發明的接合體之製造方法而獲得之接合體，獲得了具備導熱性優異之填充劑層之接合體。 在使用不含有填充劑之組成物而形成接著層之比較例1及比較例2中，可知所獲得之接著層的導熱性差。 As is clear from the results in the above table, the bonded body obtained by the method for producing a bonded body of the present invention is a bonded body having a filler layer having excellent thermal conductivity. In Comparative Example 1 and Comparative Example 2 in which an adhesive layer was formed using a composition not containing a filler, it was found that the thermal conductivity of the obtained adhesive layer was poor.

1:基板A（基底基板、子芯片） 1x:矽晶圓 1y:含填充劑層配設基板 1z:積層體 2:基板B（母芯片） 2a:基板B的表面 2x:矽晶圓 2y:通孔電極 3:電極 30:凸部 31:導通路 31a:導通路的前端 32:電極（焊盤）（金屬部） 4:樹脂組成物層 4a:含填充劑層的表面（平坦化前） 4b:含填充劑層的表面（平坦化後） 41:含填充劑層 8:電子電路區域 10:基板 12:凸部 14:導通路 16:電極 81:電子電路 90:半導體器件 91:黏合膜 93:焊錫電極（凸塊） 94:底部填充劑 95:密封樹脂 96:銲線 97a:基板電極 97b:銲線盤 98:底板 99:焊球 100:接合體 101a～101d:半導體元件 101:接合體 102b～102d:貫通電極 103a～103e:金屬凸塊 105:重新配線層 110,110a,110b:樹脂層（含填充劑層） 115:絕緣層 120:配線基板 120a:表面電極 200:半導體器件 d:柱直徑 p:柱間隔 h:柱高度 h1:導通路高度 h2:電極高度 1: Substrate A (base substrate, daughter chip) 1x: silicon wafer 1y: substrate with filler layer 1z: layered body 2: Substrate B (mother chip) 2a: Surface of Substrate B 2x: silicon wafer 2y: Through-hole electrode 3: electrode 30: convex part 31: Leading path 31a: the front end of the conduction path 32: Electrode (pad) (metal part) 4: Resin composition layer 4a: Surface with filler layer (before planarization) 4b: Surface with filler layer (after planarization) 41: Filler layer 8: Electronic circuit area 10: Substrate 12: convex part 14: Leading path 16: electrode 81: Electronic circuit 90: Semiconductor devices 91: Adhesive film 93: Solder electrode (bump) 94: Underfill 95: sealing resin 96: Welding wire 97a: Substrate electrode 97b: Welding pad 98: Bottom plate 99: solder ball 100:Joint body 101a～101d: semiconductor elements 101: Joint body 102b to 102d: penetrating electrodes 103a～103e: metal bumps 105: Rewiring layer 110, 110a, 110b: resin layer (containing filler layer) 115: insulation layer 120: wiring substrate 120a: surface electrode 200: Semiconductor devices d: column diameter p: column interval h: column height h1: Height of the conduction path h2: electrode height

圖1係示意性地表示COC半導體器件的結構之剖面圖。 圖2係由示意性剖面圖表示本發明的一實施形態之接合體之製造方法中接合基板時之步驟之步驟說明圖。 圖3係由示意性剖面圖表示本發明的一實施形態之接合體之製造方法中接合基板時之步驟之步驟說明圖（圖2的繼續）。 圖4係由示意性剖面圖表示本發明的一實施形態之接合體之製造方法中接合基板時之步驟之步驟說明圖（圖3的繼續）。 圖5係示意性地表示使用TSV之三維安裝半導體器件的一例之剖面圖。 圖6係表示實施例中使用之基板的詳細情況之概略剖面圖。 FIG. 1 is a cross-sectional view schematically showing the structure of a COC semiconductor device. FIG. 2 is a schematic cross-sectional view showing steps in bonding substrates in a method for manufacturing a bonded body according to an embodiment of the present invention. 3 is a schematic cross-sectional view showing a step in bonding substrates in a method of manufacturing a bonded body according to an embodiment of the present invention (continued from FIG. 2 ). FIG. 4 is a schematic sectional view showing a step in bonding substrates in a method of manufacturing a bonded body according to an embodiment of the present invention (continuation of FIG. 3 ). FIG. 5 is a cross-sectional view schematically showing an example of a three-dimensionally mounted semiconductor device using TSVs. Fig. 6 is a schematic cross-sectional view showing details of a substrate used in an example.

1x:矽晶圓 1x: silicon wafer

1z:積層體 1z: layered body

3:電極 3: electrode

4b:含填充劑層的表面(平坦化後) 4b: Surface with filler layer (after planarization)

8:電子電路區域 8: Electronic circuit area

31:導通路 31: Leading path

31a:導通路的前端 31a: the front end of the conduction path

41:含填充劑層 41: Filler layer

81:電子電路 81: Electronic circuit

Claims (18)

一種接合體之製造方法，其係包括： 準備具備具有凸部之面之基板A，及具有配線端子之基板B之步驟； 在前述基板A的具有前述凸部之面上，形成包含黏合劑及填充劑之含填充劑層之步驟； 將前述含填充劑層與前述凸部一起進行平坦化來使前述凸部中的至少一部分從前述含填充劑層露出而獲得積層體之步驟；及 前述積層體的具有含填充劑層之面與前述基板B所具有之前述配線端子的至少一部分接合之步驟。 A method of manufacturing a joint body, which includes: A step of preparing a substrate A having a surface having a convex portion, and a substrate B having a wiring terminal; A step of forming a filler-containing layer including an adhesive and a filler on the surface of the aforementioned substrate A having the aforementioned protrusions; A step of flattening the filler-containing layer together with the protrusions to expose at least a part of the protrusions from the filler-containing layer to obtain a laminate; and A step of bonding the surface of the laminate having the filler-containing layer to at least a part of the wiring terminals of the substrate B. 如請求項1所述之接合體之製造方法，其中 形成前述含填充劑層之步驟係包括如下步驟：將包含選自包括黏合劑及黏合劑的前驅物之群組中的至少一種樹脂和填充劑之樹脂組成物適用於前述基板A的具有前述凸部之面上。 The manufacturing method of the junction body as described in claim 1, wherein The step of forming the aforementioned filler-containing layer includes the steps of: applying a resin composition comprising at least one resin and a filler selected from the group consisting of adhesives and adhesive precursors to the substrate A having the aforementioned protrusions. on the face of the Ministry. 如請求項2所述之接合體之製造方法，其中 形成前述含填充劑層之步驟包括在前述適用後以150～300℃的溫度加熱組成物。 The manufacturing method of the junction body as described in claim 2, wherein The step of forming the aforementioned filler-containing layer includes heating the composition at a temperature of 150-300° C. after the aforementioned application. 如請求項2或請求項3所述之接合體之製造方法，其中 前述樹脂組成物包含選自包括環化樹脂及其前驅物之群組中的至少一種樹脂作為前述樹脂。 The method of manufacturing the junction body according to claim 2 or claim 3, wherein The aforementioned resin composition contains at least one resin selected from the group including cyclized resins and their precursors as the aforementioned resin. 如請求項1至請求項3之任一項所述之接合體之製造方法，其中 前述積層體中的含填充劑層的TTV係10μm以下，前述TTV係指，從含填充劑層的邊緣部向1mm以上的內側的區域分割為2mm見方的分區，測量每個分區中的一個表面與另一個表面之間的最大厚度（T1）和一個表面與另一個表面之間的最小厚度（T2），按每個分區算出膜厚差（T1-T2），在各分區按膜厚差（T1-T2）從大到小的順序設置排序，將從最上位分區按膜厚差從大到小的順序的相當於總分區數的10%的個數的分區組及將從最低位分區按膜厚差從小到大的順序的相當於總分區數的10%的個數的分區組除外，剩餘的分區組的各膜厚差（T1-T2）的算術平均值。 The method of manufacturing the junction body according to any one of claim 1 to claim 3, wherein The TTV of the filler-containing layer in the above-mentioned laminate is 10 μm or less. The above-mentioned TTV means that the area from the edge of the filler-containing layer to the inside of 1 mm or more is divided into 2 mm square partitions, and one surface of each partition is measured. The maximum thickness (T1) between the other surface and the minimum thickness (T2) between one surface and the other surface, calculate the film thickness difference (T1-T2) for each partition, and calculate the film thickness difference (T1-T2) in each partition ( T1-T2) Set the sorting order from large to small, and arrange the partition groups corresponding to 10% of the total number of partitions from the highest partition in the order of film thickness difference from large to small, and sort from the lowest partition by The film thickness difference is the arithmetic mean value (T1-T2) of each film thickness difference (T1-T2) of the remaining partition groups, except for the partition groups corresponding to 10% of the total partitions in the order of small to large. 如請求項1至請求項3之任一項所述之接合體之製造方法，其中 前述凸部包含金屬。 The method of manufacturing the junction body according to any one of claim 1 to claim 3, wherein The aforementioned protrusions contain metal. 如請求項6所述之接合體之製造方法，其中 前述金屬包含選自包括銅、錫及鎳之群組中的至少一種金屬。 The manufacturing method of the junction body as described in claim 6, wherein The foregoing metal includes at least one metal selected from the group consisting of copper, tin and nickel. 如請求項1至請求項3之任一項所述之接合體之製造方法，其中 前述凸部係藉由至少含有包含銅之層及包含錫之層而成之凸部。 The method of manufacturing the junction body according to any one of claim 1 to claim 3, wherein The aforementioned convex portion is a convex portion formed by including at least a layer containing copper and a layer containing tin. 如請求項1至請求項3之任一項所述之接合體之製造方法，其中 前述含填充劑層中所包含之前述黏合劑係絕緣性黏合劑。 The method of manufacturing the junction body according to any one of claim 1 to claim 3, wherein The aforementioned adhesive contained in the aforementioned filler-containing layer is an insulating adhesive. 如請求項1至請求項3之任一項所述之接合體之製造方法，其中 前述含填充劑層中所包含之前述黏合劑包含選自包括乙烯基、丙烯酸基及甲基丙烯酸基之群組中的至少一種基團。 The method of manufacturing the junction body according to any one of claim 1 to claim 3, wherein The aforementioned binder included in the aforementioned filler-containing layer includes at least one group selected from the group consisting of vinyl groups, acrylic groups, and methacrylic groups. 如請求項1至請求項3之任一項所述之接合體之製造方法，其中 前述填充劑包含選自包括氮化硼、氮化鋁、氮化矽、氧化鋁、氧化鎂、氧化鋅及氧化鈹之群組中的至少一種。 The method of manufacturing the junction body according to any one of claim 1 to claim 3, wherein The aforementioned filler includes at least one selected from the group consisting of boron nitride, aluminum nitride, silicon nitride, aluminum oxide, magnesium oxide, zinc oxide and beryllium oxide. 如請求項1至請求項3之任一項所述之接合體之製造方法，其中 前述填充劑的體積電阻率係1.0X10 11Ω·cm以上。 The method of manufacturing a joined body according to any one of claim 1 to claim 3, wherein the volume resistivity of the filler is above 1.0×10 11 Ω·cm. 如請求項1至請求項3之任一項所述之接合體之製造方法，其中 前述填充劑的平均粒徑係10μm以下，上述平均粒徑係相對各粒子的表觀輪廓的最小包含圓的直徑的平均值。 The method of manufacturing the junction body according to any one of claim 1 to claim 3, wherein The average particle diameter of the aforementioned filler is 10 μm or less, and the above-mentioned average particle diameter is an average value of the diameter of the smallest circle included in the apparent profile of each particle. 如請求項1至請求項3之任一項所述之接合體之製造方法，其中 獲得前述積層體之步驟中的前述平坦化藉由切割來進行。 The method of manufacturing the junction body according to any one of claim 1 to claim 3, wherein The aforementioned planarization in the step of obtaining the aforementioned laminate is performed by dicing. 如請求項1至請求項3之任一項所述之接合體之製造方法，其中 前述接合步驟中的接合溫度係300℃以下。 The method of manufacturing the junction body according to any one of claim 1 to claim 3, wherein The joining temperature in the aforementioned joining step is 300° C. or lower. 如請求項1至請求項3之任一項所述之接合體之製造方法，其中 所獲得之接合體中的含填充劑層的熱擴散率係2.0×10 -7m 2s -1以上。 The method for manufacturing a joined body according to any one of claims 1 to 3, wherein the thermal diffusivity of the filler-containing layer in the obtained joined body is 2.0×10 -7 m 2 s -1 or more. 一種半導體器件之製造方法，其具備藉由請求項1至請求項16之任一項所述之接合體之製造方法而獲得之接合體。A method of manufacturing a semiconductor device, comprising a bonded body obtained by the method for manufacturing a bonded body according to any one of claims 1 to 16. 一種樹脂組成物，其使用於請求項1至請求項16之任一項所述之接合體之製造方法中的前述含填充劑層的形成。A resin composition used in the formation of the filler-containing layer in the method of manufacturing the bonded body according to any one of claims 1 to 16.
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