TW202303818A - Wafer loading and unloading system and loading and unloading method - Google Patents
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本發明實施例屬於半導體技術領域,尤其關於一種晶圓上下料系統及上下料方法。The embodiments of the present invention belong to the technical field of semiconductors, and in particular relate to a wafer loading and unloading system and a loading and unloading method.
目前,在晶圓雙面拋光設備自動上下料系統中,下料緩存區為固定方式,需要增加單獨的機械手臂將下料緩存區中已拋光的晶圓轉移至晶圓匣中,機械手臂的增加相應地會提高設備製造成本,且後期維護成本也會提高。At present, in the automatic loading and unloading system of wafer double-sided polishing equipment, the unloading buffer area is fixed, and a separate mechanical arm needs to be added to transfer the polished wafers in the unloading buffer area to the wafer cassette. The increase will correspondingly increase the equipment manufacturing cost, and the later maintenance cost will also increase.
另一方面,在相關技術中的晶圓雙面拋光設備自動上下料系統中,上料機器人和下料機器人均只能單片傳輸完成上料和下料過程,因此晶圓的上下料時間較長,嚴重影響了晶圓的生產效率。On the other hand, in the automatic loading and unloading system of wafer double-sided polishing equipment in the related art, both the loading robot and the unloading robot can only complete the loading and unloading process by single-chip transmission, so the loading and unloading time of the wafer is relatively long. long, seriously affecting the production efficiency of the wafer.
有鑑於此,本發明實施例期望提供一種晶圓上下料系統及上下料方法;能夠縮短晶圓的上下料時間,提高生產效率的同時,降低設備製造成本和後期維護成本。In view of this, the embodiments of the present invention expect to provide a wafer loading and unloading system and a loading and unloading method, which can shorten the wafer loading and unloading time, improve production efficiency, and reduce equipment manufacturing costs and later maintenance costs.
本發明實施例的技術方案是這樣實現的: 第一方面,本發明實施例提供了一種晶圓上下料系統,該晶圓上下料系統包括: 能夠暫存多片待拋光的晶圓的上料緩存區; 能夠暫存多片已拋光的晶圓的下料緩存區; 擺動機械臂,該擺動機械臂用於將暫存於該上料緩存區的多片待拋光的晶圓同時轉移至對應的載具中;以及,將每個該載具中的多片已拋光的晶圓同時轉移至該下料緩存區中。 The technical scheme of the embodiment of the present invention is realized like this: In the first aspect, an embodiment of the present invention provides a wafer loading and unloading system, the wafer loading and unloading system includes: A loading buffer area capable of temporarily storing multiple wafers to be polished; Unloading buffer area capable of temporarily storing multiple polished wafers; Swing the mechanical arm, the swinging mechanical arm is used to transfer the multiple wafers to be polished temporarily stored in the loading buffer area to the corresponding carrier at the same time; and, the multiple polished wafers in each carrier The wafers are transferred to the unloading buffer area at the same time.
第二方面,本發明實施例提供了一種晶圓上下料方法,該晶圓上下料方法包括: 利用擺動機械臂吸附上料緩存區的多片待拋光的晶圓後,將該多片待拋光的晶圓同時轉移至對應的載具中; 待該多片待拋光的晶圓完成雙面拋光後,利用該擺動機械臂依次吸附每個該載具中的已拋光的晶圓,將該已拋光的晶圓轉移至下料緩存區中。 In the second aspect, an embodiment of the present invention provides a wafer loading and unloading method, the wafer loading and unloading method includes: After using the swinging robot arm to absorb multiple wafers to be polished in the loading buffer area, transfer the multiple wafers to be polished to the corresponding carrier at the same time; After the multiple wafers to be polished are polished on both sides, the swinging mechanical arm is used to sequentially absorb each polished wafer in the carrier, and the polished wafers are transferred to the unloading buffer area.
本發明實施例提供了一種晶圓上下料系統及上下料方法;能夠通過擺動機械臂將上料緩存區中暫存的多片待拋光的晶圓轉移至對應的任一載具中;以及,通過擺動機械臂也能夠將每個載具中的多片已拋光的晶圓同時轉移至下料緩存區中,縮短了晶圓上下料時間,提高了生產效率;同時在本發明實施例提供的晶圓上下料系統中,利用擺動機械臂完成晶圓的上下料過程,減少了機器人設備數量,降低了機器人設備的製造成本和後期維護成本。The embodiment of the present invention provides a wafer loading and unloading system and a loading and unloading method; the plurality of wafers to be polished temporarily stored in the loading buffer area can be transferred to any corresponding carrier by swinging the mechanical arm; and, By swinging the mechanical arm, multiple polished wafers in each carrier can also be transferred to the unloading buffer area at the same time, which shortens the loading and unloading time of wafers and improves production efficiency; at the same time, in the embodiment of the present invention In the wafer loading and unloading system, the swing robot arm is used to complete the wafer loading and unloading process, which reduces the number of robot equipment, reduces the manufacturing cost and later maintenance cost of robot equipment.
為利 貴審查委員了解本發明之技術特徵、內容與優點及其所能達到之功效,茲將本發明配合附圖及附件,並以實施例之表達形式詳細說明如下,而其中所使用之圖式,其主旨僅為示意及輔助說明書之用,未必為本發明實施後之真實比例與精準配置,故不應就所附之圖式的比例與配置關係解讀、侷限本發明於實際實施上的申請範圍,合先敘明。In order for Ligui examiners to understand the technical characteristics, content and advantages of the present invention and the effects it can achieve, the present invention is hereby combined with the accompanying drawings and appendices, and is described in detail in the form of embodiments as follows, and the drawings used therein , the purpose of which is only for illustration and auxiliary instructions, and not necessarily the true proportion and precise configuration of the present invention after implementation, so it should not be interpreted based on the proportion and configuration relationship of the attached drawings, and limit the application of the present invention in actual implementation The scope is described first.
在本發明實施例的描述中,需要理解的是,術語“長度”、“寬度”、“上”、“下”、“前”、“後”、“左”、“右”、“垂直”、“水平”、“頂”、“底”“內”、“外”等指示的方位或位置關係為基於附圖所示的方位或位置關係,僅是為了便於描述本發明實施例和簡化描述,而不是指示或暗示所指的裝置或元件必須具有特定的方位、以特定的方位構造和操作,因此不能理解為對本發明的限制。In the description of the embodiments of the present invention, it should be understood that the terms "length", "width", "upper", "lower", "front", "rear", "left", "right", "vertical" , "horizontal", "top", "bottom", "inner", "outer" and other indicated orientations or positional relationships are based on the orientations or positional relationships shown in the drawings, and are only for the convenience of describing the embodiments of the present invention and simplifying the description , rather than indicating or implying that the device or element referred to must have a particular orientation, be constructed and operate in a particular orientation, and thus should not be construed as limiting the invention.
此外,術語“第一”、“第二”僅用於描述目的,而不能理解為指示或暗示相對重要性或者隱含指明所指示的技術特徵的數量。由此,限定有“第一”、“第二”的特徵可以明示或者隱含地包括一個或者更多個所述特徵。在本發明實施例的描述中,“多個”的含義是兩個或兩個以上,除非另有明確具體的限定。In addition, the terms "first" and "second" are used for descriptive purposes only, and cannot be interpreted as indicating or implying relative importance or implicitly specifying the quantity of indicated technical features. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of said features. In the description of the embodiments of the present invention, "plurality" means two or more, unless otherwise specifically defined.
在本發明實施例中,除非另有明確的規定和限定,術語“安裝”、“相連”、“連接”、“固定”等術語應做廣義理解,例如,可以是固定連接,也可以是可拆卸連接,或成一體;可以是機械連接,也可以是電連接;可以是直接相連,也可以通過中間媒介間接相連,可以是兩個元件內部的連通或兩個元件的相互作用關係。對於本領域的具通常知識者而言,可以根據具體情況理解上述術語在本發明實施例中的具體含義。In the embodiments of the present invention, terms such as "installation", "connection", "connection" and "fixation" should be interpreted in a broad sense unless otherwise clearly specified and limited. Disassembled connection, or integration; it can be mechanical connection or electrical connection; it can be direct connection or indirect connection through an intermediary, and it can be the internal communication of two components or the interaction relationship between two components. Those with ordinary knowledge in the art can understand the specific meanings of the above terms in the embodiments of the present invention according to specific situations.
下面將結合本發明實施例中的附圖,對本發明實施例中的技術方案進行清楚、完整地描述。The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the drawings in the embodiments of the present invention.
參見圖1,其示出了常規技術方案中晶圓W雙面拋光時所採用的晶圓上下料系統1A,如圖1所示,晶圓上下料系統1A中具體包括:承載裝置10,上料區20以及下料區30;其中,
承載裝置10包括研磨盤101,設置在研磨盤101上的多個載具102和內銷環103;其中,研磨盤101用於研磨晶圓W(圖中黑色填充的圓形區域),載具102用於固定晶圓W,內銷環103用於驅動載具102自轉,從而通過研磨盤101和載具102的轉動對晶圓W進行拋光;其中,每個載具102上均設置有載具識別孔1021;
上料區20包括第一晶圓匣201,上料機器人202和上料緩存區203A;其中,上料機器人202端部設置的上料機械手臂2021將待拋光的晶圓W從第一晶圓匣201中取出並放置於上料緩存區203A中後,再通過上料機器人202端部設置的真空吸盤2022將上料緩存區203A中待拋光的晶圓W轉送至載具102中;需要說明的是,如圖1所示,在晶圓上下料系統1A中,上料緩存區203A中只能依次暫存單片待拋光的晶圓W;且為了能夠穩定地吸附晶圓W,上料機器人202端部可設置多個真空吸盤2022,例如圖1中所示,在上料機器人202下端設置有3個真空吸盤2022,用於同時吸附待拋光的晶圓W;可以理解的,第一晶圓匣201設置有開口,以便於取放待拋光的晶圓W;
下料區30包括第二晶圓匣301,下料機器人302,下料緩存區303A和下料水槽304;其中,下料機器人302端部設置的下料機械手臂3021將已拋光的晶圓W從載具102中取出並放置於下料緩存區303A中後,再通過下料機械手臂3021將下料緩存區303中的晶圓W轉送至第二晶圓匣301中;同樣地,第一晶圓匣301頁設置有開口,以便於取放已拋光的晶圓W;需要說明的是,在晶圓上下料系統1A中還設置有搬送機械手臂(圖中未示出),用於將第二晶圓匣301搬送至下料水槽304中,以避免外界環境中的汙染物對已拋光的晶圓W表面產生汙染。
Referring to FIG. 1 , it shows a wafer loading and unloading
可以理解地,採用晶圓上下料系統1A進行晶圓W的上下料時,只能進行單片晶圓W的傳輸,傳片效率低,且需要上料機器人202和下料機器人302同時工作的同時,還需要單獨再增加搬送機械手臂,導致設備的製造成本和後期維護成本高。因此,本發明實施例期望提供一種晶圓上下料系統,縮短晶圓上下料時間,提高生產效率的同時,降低設備製造成本和後期維護成本。It can be understood that when the wafer W is loaded and unloaded by using the wafer loading and
參見圖2,其示出了本發明實施例提供的一種晶圓上下料系統1,如圖2所示,該晶圓上下料系統1包括:
能夠暫存多片待拋光的晶圓W的上料緩存區203;
能夠暫存多片已拋光的晶圓W的下料緩存區303;
擺動機械臂40,該擺動機械臂40用於將暫存於該上料緩存區203的多片待拋光的晶圓W同時轉移至對應的載具102中;以及,將每個該載具102中的多片已拋光的晶圓W同時轉移至該下料緩存區303中。
Referring to FIG. 2, it shows a wafer loading and unloading
需要說明的是,在本發明實施例中以圖2中所示同時轉移3片晶圓W作為示例對本發明的實施例進行說明,但是本發明實施例提供的晶圓上下料系統1並不局限於只能同時轉移3片晶圓W。It should be noted that, in the embodiment of the present invention, the embodiment of the present invention is described by taking the simultaneous transfer of three wafers W shown in FIG. It is limited to only transfer 3 wafers W at the same time.
對於圖2所示的晶圓上下料系統1,在利用上料機器人202將多片待拋光的晶圓W從第一晶圓匣201轉移至上料緩存區203中之後,通過擺動機械臂40將上料緩存區203中暫存的多片晶圓W轉移至對應的任一載具102中;以及,通過擺動機械臂40也能夠將每個載具102中的多片已拋光的晶圓W同時轉移至下料緩存區303中,縮短了晶圓W上下料時間,提高了生產效率;同時在本發明實施例提供的晶圓上下料系統1中,利用擺動機械臂40完成晶圓W的上下料過程,減少了機器人設備數量,降低了機器人設備的製造成本和後期維護成本。For the wafer loading and
如圖3所示,其示出了利用擺動機械臂40完成晶圓W的上下料操作完成後,擺動機械臂40則恢復至原始狀態,準備下一輪的上下料操作。As shown in FIG. 3 , it shows that after the loading and unloading operation of the wafer W is completed by using the
對於圖2所示的晶圓上下料系統1,作為一些可能的實施方式,結合圖2和圖3所示,該擺動機械臂40的端部設置有多個真空吸盤2022,該多個真空吸盤用於在上料過程中分別吸附該上料緩存區203的多片待拋光的晶圓W;以及,在下料過程中分別吸附每個該載具102的已拋光的晶圓W,也就是說,在本發明實施例中,在上下料過程中,擺動機械臂40端部設置的每個真空吸盤2022用於吸附單片晶圓W,為了保證吸附效果,在實際實施過程中,可增加真空吸盤2022的吸附力,具體方法本發明實施例不作具體闡述。For the wafer loading and
對於圖2所示的晶圓上下料系統1,可選地,作為一些可能的實施方式,結合圖2和圖3所示,該擺動機械臂40的端部設置有定位裝置401,具體地,定位裝置401可以為定位相機,在具體實施過程中,該定位裝置401,經配置為:
根據採集到的載具識別孔1021的圖像,確定該多片待拋光的晶圓W在每個該載具中的放置位置,以使得多個真空吸盤2022吸附的多片待拋光的晶圓W能夠精確地放置於載具102中;
以及,根據該採集到的該載具識別孔1021的圖像,確定該多片已拋光的晶圓W在該載具102中的位置,以使得多個真空吸盤2022能夠精確地吸附載具102中已拋光的晶圓W。
For the wafer loading and
需要說明的是,在具體實施過程中,若定位相機採集到任一個載具識別孔1021的完整圖像,即確定真空吸盤2022吸附的多片待拋光的晶圓W能夠精確地放置於載具102中;以及,多個真空吸盤2022能夠精確地吸附載具102中已拋光的晶圓W。當然,在一些示例中,若定位相機的十字形對焦點與載具識別孔1021的圖像中心位置之間的距離差值滿足設定閾值範圍時,也能夠確定真空吸盤2022吸附的多片待拋光的晶圓W能夠精確地放置於載具102中;以及,多個真空吸盤2022能夠精確地吸附載具102中已拋光的晶圓W。It should be noted that, in the specific implementation process, if the positioning camera collects a complete image of any one of the
對於圖2所示的晶圓上下料系統1,作為一些可能的實施方式,該下料緩存區303中設置有多個水滑盤402,用於分別承載從該載具102轉移至該下料緩存區303的多片已拋光的晶圓W。For the wafer loading and
對於上述可能的實施方式中,在一些示例中,如圖2所示,每個該水滑盤402上設置有出水孔4021,該出水孔4021與供水裝置(圖中未示出),用於向對應的該水滑盤402噴射去離子水。For the above possible implementation manners, in some examples, as shown in FIG. 2 , each
對於上述可能的實施方式中,在一些示例中,如圖4所示,每個該水滑盤402連接有第一傾斜裝置403,該第一傾斜裝置403用於驅動對應的該水滑盤402呈傾斜狀態。For the above-mentioned possible implementation manners, in some examples, as shown in FIG. in a tilted state.
對於圖2所示的晶圓上下料系統1,在一些可能的實施方式中,如圖4所示,該晶圓上下料系統1還包括有晶圓匣驅動機構50,該晶圓匣驅動機構50包括晶圓匣支撐裝置501、第二傾斜裝置502和晶圓匣升降裝置503;其中,For the wafer loading and
該晶圓匣支撐裝置501與第二晶圓匣301連接,用於固定該第二晶圓匣301;
該第二傾斜裝置502與該晶圓匣支撐裝置501連接,用於驅動該晶圓匣支撐裝置501傾斜放置以使得該第二晶圓匣301呈傾斜狀態,進而使得該第二晶圓匣301的開口與呈傾斜狀態的該水滑盤402對準,從而使得該水滑盤402中已拋光的晶圓W滑移至該第二晶圓匣301中,且該晶圓匣升降裝置503伸展至與呈傾斜狀態的該晶圓匣支撐裝置501相抵接以支撐該第二晶圓匣301;
以及,如圖5所示,待該第二晶圓匣301裝滿已拋光的晶圓W後,該第二傾斜裝置502驅動該晶圓匣支撐裝置501水平放置以使得該第二晶圓匣301呈水平狀態,且該晶圓匣升降裝置503回縮至原始高度位置。
The
可以理解地,在下料過程中,當已拋光的晶圓W放置於下料緩存區303之後,即可通過第一傾斜裝置403驅動任一水滑盤402呈傾斜狀態,與此同時,第二傾斜裝置502沿軸線方向伸展以驅動第二晶圓匣301也呈與水滑盤402相匹配的傾斜狀態,並通過晶圓匣支撐裝置501支撐和固定該第二晶圓匣301保持上述的傾斜狀態,以使得水滑盤402上的晶圓W能夠滑移至第二晶圓匣301中。可以理解地,在晶圓W滑移至第二晶圓匣301的過程中,出水孔4021持續地向對應的水滑盤402中噴射去離子水,以保證晶圓W在去離子水以及自身重力的共同作用下滑移至第二晶圓匣301中。可以理解地,當上述水滑盤402中的晶圓W滑移至第二晶圓匣301中後,沿著下料緩存區303的軸線方向轉動下料緩存區303,以使得下一個暫存有已拋光晶圓W的水滑盤402轉動至與第二晶圓匣301開口相對應的位置,按照上述同樣的方法對已拋光的晶圓W進行轉移。應注意的是,為了保證每個水滑盤402中的晶圓W均精確地滑移至第二晶圓匣301中對應的位置,在具體實施過程中,可通過晶圓匣驅動機構50適當地調整第二晶圓匣301的高度位置和傾斜角度,以保證第二晶圓匣301的開口與水滑盤402對準。It can be understood that during the unloading process, when the polished wafer W is placed in the
需要說明的是,水滑盤402的傾斜角度為預先設定的角度,以使得每個水滑盤402中的晶圓W均能夠精確地滑移至第二晶圓匣301中的對應位置。It should be noted that the inclination angle of the
可以理解地,待第二晶圓匣301裝滿晶圓W後,第二傾斜裝置502沿軸線方向回縮以使得第二晶圓匣301恢復至原始的水平狀態,且晶圓匣支撐裝置501也回縮至原始的高度位置。It can be understood that after the
對於上述可能的實施方式中,在一些示例中,如圖2所示,該晶圓匣搬送裝置305用於將水平狀態的該第二晶圓匣301搬送至下料水槽304中。For the above possible implementation manners, in some examples, as shown in FIG. 2 , the
參見圖6,其示出了本發明實施例提供的一種晶圓上下料方法,該晶圓上下料方法能夠應用於圖2所示的晶圓上下料系統1中,該晶圓上下料方法包括:
S601、利用擺動機械臂吸附上料緩存區中的多片待拋光的晶圓後,將該多片待拋光的晶圓同時轉移至對應的載具中;
S602、待該多片待拋光的晶圓完成雙面拋光後,利用該擺動機械臂依次吸附每個該載具中的已拋光的晶圓,將該已拋光的晶圓轉移至下料緩存區中。
Referring to FIG. 6, it shows a wafer loading and unloading method provided by an embodiment of the present invention. The wafer loading and unloading method can be applied to the wafer loading and
可以理解地,由於圖6所示的晶圓上下料方法能夠應用於前述技術方案所述的晶圓上下料系統1中,因此對於晶圓上下料方法的具體細節可參見前述技術方案中對於晶圓上下料系統1中各個元件的詳細描述,在此不再贅述。Understandably, since the wafer loading and unloading method shown in FIG. 6 can be applied to the wafer loading and unloading
示例性地,對於圖6所示的晶圓上下料方法,在一些可能的實施方式中,該晶圓上下料方法還包括: 通過出水孔對水滑盤供給去離子水,並依次驅動該下料緩存區中的每個水滑盤呈傾斜狀態,以使得該水滑盤中已拋光的晶圓滑移至呈傾斜狀態的第二晶圓匣中; 待該第二晶圓匣中裝滿該已拋光的晶圓後,調整該第二晶圓匣呈水平狀態,以通過晶圓匣搬送裝置將該第二晶圓匣轉移至下料水槽中。 Exemplarily, for the wafer loading and unloading method shown in FIG. 6 , in some possible implementations, the wafer loading and unloading method further includes: Supply deionized water to the water slide plate through the water outlet hole, and sequentially drive each water slide plate in the unloading buffer area to be inclined, so that the polished wafer in the water slide plate slides to the inclined state. In the second wafer cassette; After the second wafer cassette is filled with the polished wafers, adjust the second wafer cassette to be in a horizontal state, so as to transfer the second wafer cassette to the unloading water tank by the wafer cassette transfer device.
需要說明的是:本發明實施例所記載的技術方案之間,在不衝突的情況下,可以任意組合。It should be noted that: the technical solutions described in the embodiments of the present invention can be combined arbitrarily if there is no conflict.
需要說明的是:本發明實施例所記載的技術方案之間,在不衝突的情況下,可以任意組合。以上僅為本發明之較佳實施例,並非用來限定本發明之實施範圍,如果不脫離本發明之精神和範圍,對本發明進行修改或者等同替換,均應涵蓋在本發明申請專利範圍的保護範圍當中。It should be noted that: the technical solutions described in the embodiments of the present invention can be combined arbitrarily if there is no conflict. The above are only preferred embodiments of the present invention, and are not used to limit the implementation scope of the present invention. If the present invention is modified or equivalently replaced without departing from the spirit and scope of the present invention, it shall be covered by the protection of the patent scope of the present invention. in the range.
1A:晶圓上下料系統
1:晶圓上下料系統
10:承載裝置
101:研磨盤
102:載具
103:內銷環
1021:載具識別孔
20:上料區
201:第一晶圓匣
202:上料機器人
2021:上料機械手臂
2022:真空吸盤
203:上料緩存區
203A:上料緩存區
30:下料區
301:第二晶圓匣
302:下料機器人
3021:下料機械手臂
303:下料緩存區
303A:下料緩存區
304:下料水槽
305:晶圓匣搬送裝置
40:擺動機械臂
401:定位裝置
402:水滑盤
4021:出水孔
403:第一傾斜裝置
50:晶圓匣驅動機構
501:晶圓匣支撐裝置
502:第二傾斜裝置
503:晶圓匣升降裝置
W:晶圓
S601-S602:步驟
1A: Wafer loading and unloading system
1: Wafer loading and unloading system
10: Carrying device
101: grinding disc
102: Vehicle
103: Domestic sales ring
1021: Carrier identification hole
20: Feeding area
201: The first wafer cassette
202: Loading robot
2021: Loading robotic arm
2022: Vacuum suction cups
203:
圖1為本發明實施例提供的常規技術方案中採用的晶圓上下料系統示意圖; 圖2為本發明實施例提供的一種晶圓上下料系統示意圖; 圖3為本發明實施例提供的晶圓上下料過程完成後,擺動機械臂的狀態示意圖; 圖4為本發明實施例提供的一種晶圓下料過程示意圖; 圖5為本發明實施例提供的另一種晶圓下料過程示意圖; 圖6為本發明實施例提供的一種晶圓上下料方法流程示意圖。 FIG. 1 is a schematic diagram of a wafer loading and unloading system adopted in a conventional technical solution provided by an embodiment of the present invention; 2 is a schematic diagram of a wafer loading and unloading system provided by an embodiment of the present invention; 3 is a schematic diagram of the state of the swinging robot arm after the wafer loading and unloading process provided by the embodiment of the present invention is completed; FIG. 4 is a schematic diagram of a wafer unloading process provided by an embodiment of the present invention; FIG. 5 is a schematic diagram of another wafer unloading process provided by an embodiment of the present invention; FIG. 6 is a schematic flowchart of a wafer loading and unloading method provided by an embodiment of the present invention.
1:晶圓上下料系統 1: Wafer loading and unloading system
10:承載裝置 10: Carrying device
20:上料區 20: Feeding area
30:下料區 30:Unloading area
40:擺動機械臂 40: Swing the robotic arm
101:研磨盤 101: grinding disc
102:載具 102: Vehicle
103:內銷環 103: Domestic sales ring
201:第一晶圓匣 201: The first wafer cassette
202:上料機器人 202: Loading robot
203:上料緩存區 203: Loading buffer area
301:第二晶圓匣 301: Second wafer cassette
303:下料緩存區 303: Unloading buffer area
304:下料水槽 304: Feed sink
305:晶圓匣搬送裝置 305: Wafer Cassette Transfer Device
401:定位裝置 401: Positioning device
402:水滑盤 402: water slide disc
1021:載具識別孔 1021: Carrier identification hole
2021:上料機械手臂 2021: Loading robotic arm
2022:真空吸盤 2022: Vacuum suction cups
4021:出水孔 4021: outlet hole
W:晶圓 W: Wafer
Claims (10)
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CN202111627519.9 | 2021-12-28 | ||
CN202111627519.9A CN114261751A (en) | 2021-12-28 | 2021-12-28 | Wafer feeding system and feeding and discharging method |
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Publication Number | Publication Date |
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TW202303818A true TW202303818A (en) | 2023-01-16 |
TWI834252B TWI834252B (en) | 2024-03-01 |
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