TW202241644A - Chemical mechanical polishing apparatus and the wafer buffering device and method therein - Google Patents
Chemical mechanical polishing apparatus and the wafer buffering device and method therein Download PDFInfo
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- H01L21/673—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere using specially adapted carriers or holders; Fixing the workpieces on such carriers or holders
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- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
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- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67763—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading
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Abstract
Description
本發明有關半導體製造設備,尤其有關一種化學機械拋光設備及其晶圓緩存裝置和晶圓緩存方法。The invention relates to semiconductor manufacturing equipment, in particular to chemical mechanical polishing equipment, a wafer buffering device and a wafer buffering method thereof.
現有CMP(Chemical Mechanical Planarization),化學機械拋光設備通常包括前端模組EFEM、拋光單元和清洗單元。隨著半導體製造製程不斷的發展,對晶圓生產的精密度及潔淨度提出了更高的要求。在化學機械拋光平坦化製程過程中,當晶圓經過拋光單元作業後,晶圓表面附著有拋光液體,如轉運晶圓至清洗單元的時間過長,拋光液體乾燥附著於晶圓上,將影響晶圓的品質及成品率。如清洗單元或拋光單元在作業完成回收晶圓過程中出現故障或堵塞,則已經進入拋光單元作業的晶圓無法保持表面處於濕潤狀態,將影響晶圓的品質及成品率。Existing CMP (Chemical Mechanical Planarization), chemical mechanical polishing equipment usually includes a front-end module EFEM, a polishing unit and a cleaning unit. With the continuous development of semiconductor manufacturing process, higher requirements are put forward for the precision and cleanliness of wafer production. In the process of chemical mechanical polishing planarization, when the wafer passes through the polishing unit, the polishing liquid is attached to the surface of the wafer. If the time for transferring the wafer to the cleaning unit is too long, the polishing liquid will dry and adhere to the wafer, which will affect the Wafer quality and yield. If the cleaning unit or polishing unit breaks down or is blocked during the process of recycling wafers after the operation is completed, the wafers that have entered the polishing unit cannot keep the surface in a wet state, which will affect the quality and yield of the wafers.
本發明的目的在於提供一種化學機械拋光設備及其晶圓緩存裝置及晶圓緩存方法,減少了晶圓未經清洗而暴露空氣中的時間,提高了晶圓的品質和成品率。The object of the present invention is to provide a chemical mechanical polishing device, a wafer buffering device and a wafer buffering method, which reduce the time for the wafer to be exposed to the air without cleaning, and improve the quality and yield of the wafer.
為了達到上述目的,本發明提供一種晶圓緩存裝置,所述晶圓緩存裝置包含:緩存箱體,設置在所述緩存箱體上的驅動元件,以及連接所述驅動元件並設置在所述緩存箱體內的晶圓存儲元件;所述驅動元件驅動所述晶圓存儲元件在所述緩存箱體內做升降運動,以實現所述晶圓存儲元件上的晶圓離開或進入緩存箱體內的水環境。In order to achieve the above object, the present invention provides a wafer buffer device, which includes: a buffer box, a driving element arranged on the buffer box, and a The wafer storage element in the box; the drive element drives the wafer storage element to move up and down in the buffer box, so that the wafers on the wafer storage element leave or enter the water environment in the buffer box .
所述驅動元件設置在所述緩存箱體外部或內部。The driving element is arranged outside or inside the buffer box.
所述晶圓存儲元件包含:固定連接所述驅動元件的晶圓支架,以及固定連接所述晶圓支架的至少兩個晶圓座。The wafer storage element includes: a wafer holder fixedly connected to the drive element, and at least two wafer holders fixedly connected to the wafer holder.
所述晶圓座上下平行間隔排布。The wafer seats are arranged in parallel and spaced up and down.
所述晶圓緩存裝置更包含箱蓋,其固定連接所述驅動元件,並位於所述晶圓座的上方,所述箱蓋的尺寸與所述緩存箱體的開口尺寸匹配。The wafer buffer device further includes a case cover, which is fixedly connected to the driving element and located above the wafer seat, and the size of the case cover matches the opening size of the buffer case.
所述緩存箱體上設置給排水口和溢水口。A water supply and drainage port and an overflow port are arranged on the buffer box.
所述晶圓緩存裝置更包含機械手,以配合緩存裝置使用,所述機械手至少包含升降、水平移動2個自由度。The wafer buffering device further includes a manipulator to cooperate with the buffering device, and the manipulator includes at least two degrees of freedom of lifting and horizontal movement.
所述晶圓座包含缺口,所述缺口與機械手的方向一致。The wafer seat includes a notch, and the notch is in line with the direction of the manipulator.
本發明還提供一種化學機械拋光設備,包含: 拋光單元,其用於對晶圓進行拋光處理; 清洗單元,其用於對拋光後的晶圓進行清洗處理; 至少一個晶圓緩存裝置,其設置在所述拋光單元和所述清洗單元之間,用於緩存晶圓,使晶圓處於長時間的水環境保護。 The present invention also provides a chemical mechanical polishing equipment, comprising: a polishing unit, which is used to polish the wafer; A cleaning unit, which is used to clean the polished wafer; At least one wafer buffering device, which is arranged between the polishing unit and the cleaning unit, is used for buffering wafers, so that the wafers are protected by water environment for a long time.
所述晶圓緩存裝置更包含中轉機械手,用於實現對所述晶圓緩存裝置進行晶圓抓取及放置作業。The wafer buffer device further includes a transfer manipulator for performing wafer grabbing and placing operations on the wafer buffer device.
所述中轉機械手包含:旋轉軸、機械手臂、以及夾爪,所述夾爪通過所述機械手臂安裝於所述旋轉軸上,所述旋轉軸提供繞Z軸旋轉和Z向升降兩個自由度,所述機械手臂帶動所述夾爪在水平X向移動。The transfer manipulator includes: a rotating shaft, a mechanical arm, and a gripper. The gripper is mounted on the rotating shaft through the robotic arm. The rotating shaft provides two functions: rotation around the Z axis and Z-direction lifting. degree of freedom, the mechanical arm drives the gripper to move in the horizontal X direction.
本發明還提供一種晶圓緩存方法,驅動元件驅動晶圓存儲元件從緩存箱體內升起,晶圓座離開緩存箱體內的水環境;採用機械手將晶圓放置入晶圓座,或採用機械手從晶圓座抓取晶圓;驅動元件驅動晶圓存儲元件降入緩存箱體內,晶圓座進入緩存箱體內的水環境。The present invention also provides a wafer caching method. The driving element drives the wafer storage element to rise from the buffer box, and the wafer seat leaves the water environment in the buffer box; the wafer is placed into the wafer seat by a manipulator, or mechanical The hand grabs the wafer from the wafer seat; the driving element drives the wafer storage element to drop into the buffer box, and the wafer seat enters the water environment in the buffer box.
所述機械手為清洗區機械手,或拋光區機械手,或中轉機械手。The manipulator is a manipulator in the cleaning area, or a manipulator in the polishing area, or a transfer manipulator.
按照從上至下的順序從晶圓緩存裝置的晶圓座中抓取晶圓,率先抓取最上層的晶圓座中的晶圓,下層未被抓取晶圓的晶圓座仍然處於緩存箱體內的水環境中。Grab the wafers from the wafer holders of the wafer buffer device in order from top to bottom, first grab the wafers in the uppermost wafer holders, and the lower wafer holders that have not been grabbed wafers are still in the cache In the water environment in the box.
按照從下至上的順序將晶圓放置入晶圓緩存裝置的晶圓座中,率先將晶圓放置入最下層的晶圓座中,已經放置晶圓的晶圓座下降進入緩存箱體內的水環境。Place the wafers into the wafer holders of the wafer buffering device in the order from bottom to top, the wafers are first placed into the lowermost wafer holders, and the wafer holders that have already placed the wafers are lowered into the water in the buffer box. environment.
本發明具有以下有益效果: 1、晶圓緩存裝置佈置在拋光單元和清洗單元之間,機械手和晶圓緩存裝置的位置靈活佈置,可實現機械手分別從拋光單元和清洗單元搬運晶圓至晶圓緩存裝置,減少晶圓未經清洗而暴露空氣中的時間。 2、緩存箱體採用水箱設計,實現晶圓長時間處於水環境保護。 3、驅動組件設置在緩存箱體外部,隔離動力機構與水環境。 4、晶圓座上下平行間隔排布,實現了晶圓上下層疊存放,結省空間。 5、晶圓緩存裝置具備升降功能,可實現取放晶圓定位,緩存箱體開合等功能,減少了傳動晶圓機械手的行程需求,晶圓放入緩存箱體的晶圓支架上的順序為由下至上,晶圓支架上升配合機械手取放晶圓時,其他晶圓仍在水環境中,既可以充分利用空間,又增加了可儲存晶圓的數量,同時減少了晶圓因傳輸而暴露在空氣中的時間。 The present invention has the following beneficial effects: 1. The wafer buffer device is arranged between the polishing unit and the cleaning unit. The positions of the manipulator and the wafer buffer device are flexibly arranged, so that the manipulator can transfer the wafer from the polishing unit and the cleaning unit to the wafer buffer device respectively, reducing the number of wafers. The time the circle is exposed to air without cleaning. 2. The buffer box is designed with a water tank to protect the wafers in the water environment for a long time. 3. The driving components are arranged outside the buffer box to isolate the power mechanism from the water environment. 4. Wafer seats are arranged in parallel and spaced up and down, which realizes the stacking and storage of wafers up and down, saving space. 5. The wafer buffer device has a lifting function, which can realize the functions of picking and placing wafer positioning, opening and closing the buffer box, etc., reducing the stroke requirements of the transmission wafer manipulator, and placing the wafer on the wafer support of the buffer box. The order is from bottom to top. When the wafer holder rises and cooperates with the manipulator to pick and place the wafer, other wafers are still in the water environment, which can make full use of the space, increase the number of wafers that can be stored, and reduce the number of wafers due to transportation. and exposure time in air.
以下根據圖1~圖7,具體說明本發明的較佳實施例。A preferred embodiment of the present invention will be specifically described below with reference to FIGS. 1 to 7 .
圖1是晶圓緩存裝置100的佈置方法示意圖,中轉機械手501及晶圓緩存裝置100可被佈置於拋光單元400和清洗單元200之間,其中,中轉機械手501實現EFEM前端模組600、清洗單元200、拋光單元400之間的晶圓傳輸。當機台出現故障,導致晶圓無法完成全部拋光、清洗、乾燥製程回收至EFEM前端模組600時,清洗中的晶圓、已進入污染區待拋光的晶圓、拋光中的晶圓的均可由中轉機械手501轉運至晶圓緩存裝置100,使晶圓處於長時間的晶圓水環境保護,以便在機組維護過程中,可以安全儲存晶圓,使晶圓不受其上化學液結晶等污染,待機台恢復正常作業時,儲存在晶圓緩存裝置100中的晶圓可依次恢復至故障前的作業狀態。FIG. 1 is a schematic diagram of the arrangement method of the
如圖2所示,是本實施例中提供的一種晶圓緩存裝置100的結構圖。所述晶圓緩存裝置100包含:緩存箱體105,設置在所述緩存箱體105上的驅動元件,以及連接所述驅動元件並設置在所述緩存箱體105內的晶圓存儲元件,所述驅動元件可以驅動所述晶圓存儲元件實現在所述緩存箱體105內升降運動,以實現所述晶圓存儲元件上的晶圓離開或進入緩存箱體105內的水環境。As shown in FIG. 2 , it is a structural diagram of a
所述驅動組件包含:設置在所述緩存箱體105外部的直線驅動機構111,連接所述直線驅動機構111的導軌101,以及可沿所述導軌101移動的滑塊104。所述驅動元件設置在所述緩存箱體105外部,有利於提高直線驅動機構111的壽命及防腐性能。The drive assembly includes: a
所述晶圓存儲元件包含:固定連接所述滑塊104的晶圓支架102,固定連接所述晶圓支架102的多個晶圓座106,所述晶圓座106上下平行間隔排布。The wafer storage element includes: a
在本實施例中,所述晶圓緩存裝置100更包含箱蓋103,其固定設置在所述滑塊104上,並位於所述晶圓座106的上方,所述箱蓋103的尺寸與所述緩存箱體105的開口尺寸匹配,當直線驅動機構111驅動滑塊104帶動多個晶圓座106全部下降進入所述緩存箱體105內部時,所述箱蓋103可以完全封閉住所述緩存箱體105的開口。In this embodiment, the
所述緩存箱體105上設置給排水口110和溢水口112。The
如圖2所示,所述中轉機械手501包含:旋轉軸107、機械手臂108、夾爪109,所述夾爪109通過所述機械手臂108安裝於所述旋轉軸107上,所述旋轉軸107提供繞Z軸旋轉和Z向升降兩個自由度,所述機械手臂108可帶動所述夾爪109在水平X向和Y向移動。當所述滑塊104帶動所述晶圓座106離開所述緩存箱體105上邊沿時,所述夾爪109移動至所述晶圓座106處,實現晶圓抓取及放置作業。As shown in Figure 2, the
圖3A和圖3B是晶圓進入晶圓緩存裝置的過程示意圖。如圖3A所示,中轉機械手501上的夾爪109夾取需要被緩存的晶圓,旋轉軸107帶動晶圓對齊緩存箱體105內的晶圓座106;緩存箱體105底部給排水口110連接兩位三通的管路,可視需要控制進水或排水填充去離子水作業,直至去離子水覆蓋溢流口112,水深足夠覆蓋全部晶圓座106;直線驅動機構111推動滑塊104帶動晶圓支架102上升,直至最底層的空晶圓座106的高度超過緩存箱體105;中轉機械手501上的旋轉軸107下降,帶動晶圓移動至對齊最底層的空晶圓座106(1)與其上層晶圓座106(2)中間的高度;機械臂108水平移動帶動晶圓移動至最底層的空晶圓座106(1)正上方;旋轉軸107下降帶動晶圓移動至晶圓座106(1)上,夾爪109打開後晶圓落入晶圓座106(1);機械臂108和旋轉軸107再按反行程驅動夾爪109去取第二片待緩存的晶圓。晶圓座106(1)接收晶圓後,滑塊104帶動晶圓支架102下降,直到晶圓全部被緩存箱體105內的去離子水覆蓋,同時其上層的空晶圓座106(2)處於超出緩存箱體105頂邊高度,待夾爪109傳輸第二片晶圓到來。依次類推,如圖3B所示,當全部需緩存的晶圓處於緩存箱體105內的去離子水保護狀態時,滑塊104帶動箱蓋103下降至封閉緩存箱體105狀態。當需要恢復晶圓之前作業時,滑塊104帶動晶圓支架102上升,使最頂層晶圓到達超出緩存箱體105的高度,同時下層的晶圓仍處於水保護狀態;中轉機械手501按類似之前放晶圓的流程,抓取晶圓至緩存前的位置;滑塊104帶動晶圓支架102上移,以此類推,全部晶圓依次上升超出水面被夾爪109搬運至緩存前狀態。當緩存箱體105內全部晶圓被取走後,滑塊104下降帶動箱蓋103封閉緩存箱體105,使其內部不受外部顆粒等污染,有利於長期不使用的狀態下保持內部潔淨,同時緩存箱體105底部給排水口110打開排水閥,排盡緩存箱體105內全部去離子水。3A and 3B are schematic diagrams of the process of wafers entering the wafer buffering device. As shown in Figure 3A, the
如圖4~圖6所示,晶圓緩存裝置100被佈置於拋光單元400與清洗單元200之間,為節省空間,緩存箱體105被放置於拋光中轉檯302的下方。當拋光單元400中的晶圓需要被緩存時,拋光平臺401先將晶圓傳輸至載片台301,再由拋光區機械手502從載片台301傳輸晶圓601、602至中轉檯302;晶圓座106被升至超出緩存箱體105後,中轉機械手501依次將晶圓從中轉檯302傳輸至晶圓座106上。當清洗單元201、202、203、204中的晶圓需要被緩存時,由中轉機械手501從清洗單元200傳輸晶圓至晶圓座106上。晶圓緩存箱體105可佈置於拋光單元200和清洗單元之間的區域,位置靈活。中轉機械手501同時作為多個單元中轉機械手的應用時,緩存箱體105則需佈置於中轉機械手501能夾取晶圓的位置即可。同時,可實現單機械手配對個多緩存箱體105的配置。如圖6所示,緩存箱體105同時被佈置於拋光中轉檯302的下臺和中轉機械手501的另一側,增加了可緩存晶圓的數量。As shown in FIGS. 4-6 , the
在本發明的一個實施例中,所述驅動元件可用替代方案:滾珠絲杆、電推缸、氣動/液壓等直線運動機構,所述驅動元件可被設置在晶圓緩存箱體105內部,但需做好防腐措施。採用螺杆傳動,具備自鎖能力,即電機掉電時可保持晶圓座106高度定位穩定不變。In one embodiment of the present invention, the drive element can be replaced by: ball screw, electric cylinder, pneumatic/hydraulic and other linear motion mechanisms, the drive element can be arranged inside the
在本發明的另一個實施例中,直線驅動機構111升降驅動採用伺服電機驅動,精準控制定位每一片晶圓取放的高度為離開水面處,可儘量使已放置在晶圓支架102上的晶圓處於水環境保護狀態。可替換方案為氣缸等單一定位驅動,從而每次取放晶圓時需讓全部晶圓暴露在空氣中,增加晶圓乾燥結晶的風險。In another embodiment of the present invention, the lifting drive of the
在本發明的另一個實施例中,所述晶圓座106平行固定於晶圓支架102上,相互間隔優選10~60mm,能使爪夾109取放不干涉晶圓座106,同時下層的晶圓座106上的晶圓剛好能處於水保護狀態,即可以充分利用空間,增加可儲存晶圓的數量,同時減少晶圓因傳輸而暴露在空氣中的時間。In another embodiment of the present invention, the
在本發明的另一個實施例中,緩存箱體105上的溢水口112和給排水口110用於調節緩存箱體105內的水量,優選地,在緩存箱體105的底部設置給排水口110,頂部設置溢水口,底部給排水口110作為主入水口,同時可通過控制閥調節實現底部排水,便於水位高度感測器安裝及回饋,為防止水溢出箱體,控制最高水位,多餘水可從溢水口112排出。作為替代方案,入水口及排水口可根據實際控制需用新增、互換或變更位置。In another embodiment of the present invention, the
在本發明的另一個實施例中,緩存箱體105也可不與中轉機械手501對接,由清洗區機械手(圖中未顯示)或拋光區機械手502直接取放晶圓。In another embodiment of the present invention, the
在本發明的另一個實施例中,晶圓支架102上的晶圓座106具有方向性,即,所述晶圓座106具有缺口,以避讓機械手的夾爪,便於抓放晶圓。所述晶圓座106上的缺口應該與機械手的夾爪的方向一致,支撐晶圓的同時避讓取放晶圓的機械手。當採用中轉機械手501取放晶圓時,所述晶圓座106優先配對前後X方向動作的夾爪109,當採用清洗區機械手或拋光區機械手502直接取放晶圓時,所述晶圓座106則調整為配對Y方向動作的夾爪109。In another embodiment of the present invention, the
如圖7所示,在本發明的另一個實施例中,根據實際情況,所述晶圓緩存裝置可不具備箱蓋。As shown in FIG. 7 , in another embodiment of the present invention, according to actual conditions, the wafer buffer device may not have a box cover.
本發明具有以下有益效果: 1、晶圓緩存裝置佈置在拋光單元和清洗單元之間,機械手和晶圓緩存裝置的位置靈活佈置,可實現機械手分別從拋光單元和清洗單元搬運晶圓至晶圓緩存裝置,減少晶圓未經清洗而暴露空氣中的時間。 2、緩存箱體採用水箱設計,實現晶圓長時間處於水環境保護。 3、驅動組件設置在緩存箱體外部,隔離動力機構與水環境。 4、晶圓座上下平行間隔排布,實現了晶圓上下層疊存放,結省空間。 5、晶圓緩存裝置具備升降功能,可實現取放晶圓定位,緩存箱體開合等功能,減少了傳動晶圓機械手的行程需求,晶圓放入緩存箱體的晶圓支架上的順序為由下至上,晶圓支架上升配合機械手取放晶圓時,其他晶圓仍在水環境中,既可以充分利用空間,又增加了可儲存晶圓的數量,同時減少了晶圓因傳輸而暴露在空氣中的時間。 The present invention has the following beneficial effects: 1. The wafer buffer device is arranged between the polishing unit and the cleaning unit. The positions of the manipulator and the wafer buffer device are flexibly arranged, so that the manipulator can transfer the wafer from the polishing unit and the cleaning unit to the wafer buffer device respectively, reducing the number of wafers. The time the circle is exposed to air without cleaning. 2. The buffer box is designed with a water tank to protect the wafers in the water environment for a long time. 3. The driving components are arranged outside the buffer box to isolate the power mechanism from the water environment. 4. Wafer seats are arranged in parallel and spaced up and down, which realizes the stacking and storage of wafers up and down, saving space. 5. The wafer buffer device has a lifting function, which can realize the functions of picking and placing wafer positioning, opening and closing the buffer box, etc., reducing the stroke requirements of the transmission wafer manipulator, and placing the wafer on the wafer support of the buffer box. The order is from bottom to top. When the wafer holder rises and cooperates with the manipulator to pick and place the wafer, other wafers are still in the water environment, which can make full use of the space, increase the number of wafers that can be stored, and reduce the number of wafers due to transportation. and exposure time in air.
需要說明的是,在本發明的實施例中,術語“中心”、“縱向”、“橫向”、“長度”、“寬度”、“厚度”、“上”、“下”、“前”、“後”、“左”、“右”、“豎直”、“水平”、“頂”、“底”“內”、“外”、“順時針”、“逆時針”、“軸向”、“徑向”、“周向”等指示的方位或位置關係為基於附圖所示的方位或位置關係,僅是為了便於描述實施例,而不是指示或暗示所指的裝置或元件必須具有特定的方位、以特定的方位構造和操作,因此不能理解為對本發明的限制。此外,術語“第一”、“第二”、“第三”僅用於描述目的,而不能理解為指示或暗示相對重要性。It should be noted that, in the embodiments of the present invention, the terms "center", "longitudinal", "transverse", "length", "width", "thickness", "upper", "lower", "front", "Back", "Left", "Right", "Vertical", "Horizontal", "Top", "Bottom", "Inner", "Outer", "Clockwise", "Counterclockwise", "Axial" , "radial", "circumferential" and other indicated orientations or positional relationships are based on the orientations or positional relationships shown in the drawings, and are only for the convenience of describing the embodiments, rather than indicating or implying that the referred device or element must have Certain orientations, constructed and operative in certain orientations, therefore are not to be construed as limitations on the invention. In addition, the terms "first", "second", and "third" are used for descriptive purposes only, and should not be construed as indicating or implying relative importance.
在本發明中,除非另有明確的規定和限定,術語“安裝”、“相連”、“連接”、“固定”等術語應做廣義理解,例如,可以是固定連接,也可以是可拆卸連接,或成一體;可以是機械連接,也可以是電連接;可以是直接相連,也可以通過中間媒介間接相連,可以是兩個元件內部的連通或兩個元件的相互作用關係。對於本領域的普通技術人員而言,可以根據具體情況理解上述術語在本發明中的具體含義。In the present invention, unless otherwise clearly specified and limited, terms such as "installation", "connection", "connection" and "fixation" should be understood in a broad sense, for example, it can be a fixed connection or a detachable connection , or integrated; it can be mechanically connected or electrically connected; it can be directly connected or indirectly connected through an intermediary, and it can be the internal communication of two components or the interaction relationship between two components. Those of ordinary skill in the art can understand the specific meanings of the above terms in the present invention according to specific situations.
儘管本發明的內容已經通過上述優選實施例作了詳細介紹,但應當認識到上述的描述不應被認為是對本發明的限制。在本領域技術人員閱讀了上述內容後,對於本發明的多種修改和替代都將是顯而易見的。因此,本發明的保護範圍應由所附的申請專利範圍來限定。Although the content of the present invention has been described in detail through the above preferred embodiments, it should be understood that the above description should not be considered as limiting the present invention. Various modifications and alterations to the present invention will become apparent to those skilled in the art upon reading the above disclosure. Therefore, the protection scope of the present invention should be limited by the scope of the appended patent application.
100:晶圓緩存裝置
101:導軌
102:晶圓支架
103:箱蓋
104:滑塊
105:緩存箱體
106、106(1)、106(2)、106(3):晶圓座
107:旋轉軸
110:排水口
108:機械手臂
109:夾爪
110:排水口
111:直線驅動機構
112:溢水口
200、201、202、203、204:清洗單元
301:載片台
302:中轉檯
400:拋光單元
401:拋光平臺
501:中轉機械手
502:拋光區機械手
600:EFEM前端模組
601、602:晶圓
X、Y、Z:向/方向
100: Wafer cache device
101: guide rail
102: wafer support
103: box cover
104:Slider
105:
圖1是本發明實施例中提供的晶圓緩存裝置的佈置方法示意圖。 圖2是本發明實施例中提供的晶圓緩存裝置的結構示意圖。 圖3A和圖3B是晶圓進入晶圓緩存裝置的過程示意圖。 圖4是本發明實施例中晶圓緩存裝置被佈置於拋光單元與清洗單元之間的佈局圖。 圖5是圖4的側視圖。 圖6是圖4的俯視圖。 圖7是本發明實施例中提供的不含箱蓋的晶圓緩存裝置結構示意圖。 FIG. 1 is a schematic diagram of a method for arranging a wafer buffer device provided in an embodiment of the present invention. FIG. 2 is a schematic structural diagram of a wafer buffer device provided in an embodiment of the present invention. 3A and 3B are schematic diagrams of the process of wafers entering the wafer buffering device. FIG. 4 is a layout diagram of a wafer buffer device arranged between a polishing unit and a cleaning unit in an embodiment of the present invention. FIG. 5 is a side view of FIG. 4 . FIG. 6 is a top view of FIG. 4 . FIG. 7 is a schematic structural diagram of a wafer buffer device without a case cover provided in an embodiment of the present invention.
100:晶圓緩存裝置 100: Wafer cache device
101:導軌 101: guide rail
102:晶圓支架 102: wafer support
103:箱蓋 103: box cover
104:滑塊 104:Slider
105:緩存箱體 105: Cache box
106(1)、106(2)、106(3):晶圓座 106(1), 106(2), 106(3): wafer holder
107:旋轉軸 107:Rotary axis
108:機械手臂 108: Mechanical arm
109:夾爪 109: Gripper
110:排水口 110: drain
111:直線驅動機構 111: Linear drive mechanism
112:溢水口 112: overflow port
501:中轉機械手 501: Transit manipulator
601、602:晶圓 601, 602: Wafer
X、Y、Z:向/方向 X, Y, Z: direction/direction
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