TW202205397A - Appratus for detaching die and method for detaching die using the same - Google Patents

Appratus for detaching die and method for detaching die using the same Download PDF

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TW202205397A
TW202205397A TW109146515A TW109146515A TW202205397A TW 202205397 A TW202205397 A TW 202205397A TW 109146515 A TW109146515 A TW 109146515A TW 109146515 A TW109146515 A TW 109146515A TW 202205397 A TW202205397 A TW 202205397A
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pressing
contact
members
die
unit
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TW109146515A
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車明起
姜泰宇
朴賢碩
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韓華精密機械股份有限公司
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67132Apparatus for placing on an insulating substrate, e.g. tape
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/683Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L21/6835Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
    • H01L21/6836Wafer tapes, e.g. grinding or dicing support tapes
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2221/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof covered by H01L21/00
    • H01L2221/67Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere
    • H01L2221/683Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L2221/68304Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
    • H01L2221/68327Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support used during dicing or grinding
    • H01L2221/68336Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support used during dicing or grinding involving stretching of the auxiliary support post dicing
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2221/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof covered by H01L21/00
    • H01L2221/67Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere
    • H01L2221/683Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L2221/68304Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
    • H01L2221/68381Details of chemical or physical process used for separating the auxiliary support from a device or wafer
    • H01L2221/68386Separation by peeling
    • H01L2221/6839Separation by peeling using peeling wedge or knife or bar

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)

Abstract

The present invention relates to a die detaching apparatus capable of precisely detaching a die by minimizing errors occurring in the die detaching process, and a die detaching method using the same. A die detaching apparatus according to an embodiment of the present invention is an apparatus for detaching a die disposed on a adhesive sheet from the adhesive sheet by pressing the adhesive sheet from below, comprising a plurality of contact members contacting the adhesive sheet. It includes a head unit, a pressing unit including a plurality of pressing members for moving the plurality of contact members in the vertical direction and a driving unit for moving the plurality of pressing members in the vertical direction wherein the driving unit has a stage for integrally moving the pressing members in a vertical direction, a driving unit integrally moving with the stage, and a driving unit for independently moving at least one of the plurality of pressing members in the vertical direction; and a driving control unit for controlling the stage and the driving unit.

Description

晶粒分離裝置及使用該裝置的晶粒分離方法 Grain separation device and grain separation method using the same

本發明是有關一種在半導體製造中使用的設備和方法,並且,更具體地說,是有關一種應用具有多數接觸構件和驅動單元的晶粒分離設備以及使用其分離晶粒的方法。 The present invention relates to an apparatus and method for use in semiconductor manufacturing, and, more particularly, to a die separation apparatus employing a plurality of contact members and drive units and a method of separating dies using the same.

晶粒再加工,即是半導體晶片,並且藉由沿著劃線以預定間隔切割晶圓來製造。切下的晶粒在藉由晶粒結合機分離並從貼合片上拾取的同時,附著到貼合片,然後被安裝在用以封裝的導線架或電路板上。 Die reprocessing, that is, semiconductor wafers, is fabricated by dicing the wafer at predetermined intervals along scribe lines. The cut dies are attached to the die while being separated by a die bonder and picked up from the die, and then mounted on a lead frame or circuit board for packaging.

以下方法乃用以分離和拾取附著在常規貼合片上的晶粒的方法。首先,使用晶粒結合機從下方按壓貼合片的下表面,並且將要分離的晶粒的周邊部分和貼合片分離。此時,晶粒結合機僅按壓與晶粒外圍部分相對應的貼合片表面。其次,按壓與靶晶粒的中央部分相對應的貼合片的表面,以從貼合片分離靶晶粒。然後,分離的晶粒被拾取並傳送到下一步。 The following methods are used to separate and pick up dies attached to conventional bonding sheets. First, the lower surface of the bonding sheet is pressed from below using a die bonder, and the peripheral portion of the die to be separated is separated from the bonding sheet. At this time, the die bonder presses only the surface of the bonding sheet corresponding to the peripheral portion of the die. Next, the surface of the bonding sheet corresponding to the central portion of the target die is pressed to separate the target die from the bonding sheet. Then, the separated die are picked up and conveyed to the next step.

其後,在傳統的晶粒結合機中,被分成數片的塊體分別上下移動,並形成一具有高度與貼合片不同的貼合表面。 Then, in the conventional die bonding machine, the blocks divided into several pieces move up and down respectively, and form a bonding surface with a height different from that of the bonding sheet.

然而,在該過程中,可能發生的是,塊體與貼合片接觸的表面位於不同的高度。此為用於升高和降低每個接觸構件的單獨驅動單元,並且根據每個控制信號,諸如電動機的驅動單元的運動而上下運動。因此,難以建立使塊體與貼合片接觸的公共基準面。這是因為由於在分離和拾取過程中不可避免地發生錯誤(例如在多數個接觸構件和驅動單元工作時所發生的機械錯誤,或在控制過程中發生的錯誤)而導致難以從貼合片上精確地分離晶粒,並且,缺陷率還有可能增加。 During this process, however, it can happen that the surfaces of the block in contact with the lamination sheet are located at different heights. This is a separate drive unit for raising and lowering each contact member, and moves up and down according to each control signal, such as the movement of the drive unit of the motor. Therefore, it is difficult to establish a common reference plane for contacting the block and the bonding sheet. This is because it is difficult to precisely remove the lamination sheet due to errors that inevitably occur during separation and pickup (such as mechanical errors that occur when many contact members and drive units work, or errors that occur during control) Grains are separated, and the defect rate may increase.

為了使用各種分離方法,有著藉由將單獨的驅動單元應用於多數個接觸構件來進行控制的情況,但是仍然存在上述問題。另外,為了控制整個接觸構件,例如凸輪,物理上,可以根據凸輪的形狀來集中控制整個接觸構件。 In order to use various separation methods, there are cases where control is performed by applying a single drive unit to a plurality of contact members, but the above-mentioned problems still exist. In addition, in order to control the entire contact member, such as the cam, physically, the entire contact member can be collectively controlled according to the shape of the cam.

上述背景技術是發明人為實現本發明而擁有的技術資訊,或者是在本發明的衍生過程中獲取的技術資訊,並不一定是在提交本發明之前向公眾公開的已知技術。 The above-mentioned background art is the technical information possessed by the inventor to realize the present invention, or the technical information obtained during the derivation process of the present invention, and is not necessarily a known technology disclosed to the public before the present invention is submitted.

背景技術文獻 Background Art Documents

專利文獻:專利文獻1為日本專利公開第1994-295930號 Patent document: Patent document 1 is Japanese Patent Laid-Open No. 1994-295930

本發明提供了一種晶粒分離裝置和使用該晶粒分離裝置的晶粒分離方法,其可以藉由將多數個接觸構件精確地壓在其上佈置有晶粒的貼合片上來提高晶粒的分離和拾取質量。 The present invention provides a crystal grain separating device and a crystal grain separating method using the same, which can improve the separation rate of crystal grains by precisely pressing a plurality of contact members on a bonding sheet on which crystal grains are arranged. Separation and pickup quality.

根據本發明的實施例的晶粒分離裝置,該晶粒分離裝置是藉由從下方按壓貼合片以從該貼合片上分離設置在該貼合片上的晶粒,並且包括多數個與接觸該貼合片的接觸構件;其包括頭部單元,該頭部單元包括:按壓單元,該按壓單元包括用於在直立方向上移動多數個接觸部件的多數個按壓部件、以及驅動單元,其用以在直立方向上移動多數個按壓部件。該驅動單元為多數個,包括用以在直立方向上一體地移動按壓構件的平台,用以在直立方向上佈置多數個按壓構件中的至少一個的驅動單元,以及用以控制平台和驅動單元的驅動控制單元。 According to the die separation device of the embodiment of the present invention, the die separation device separates the die arranged on the lamination sheet from the lamination sheet by pressing the lamination sheet from below, and includes a plurality of A contact member of a sticking sheet; it includes a head unit including a pressing unit including a plurality of pressing members for moving a plurality of contact members in an upright direction, and a driving unit for Move the plurality of pressing members in the upright direction. The driving unit is a plurality of, including a platform for integrally moving the pressing member in the upright direction, a driving unit for arranging at least one of the plurality of pressing members in the upright direction, and a driving unit for controlling the platform and the driving unit drive control unit.

在根據本發明的實施方式的晶粒分離裝置中,按壓構件被連接為分別對應於接觸構件,使得接觸構件可以在直立方向上移動。 In the grain separation apparatus according to the embodiment of the present invention, the pressing members are connected to correspond to the contact members, respectively, so that the contact members can move in the upright direction.

在根據本發明的實施方式的晶粒分離裝置中,驅動單元包括具有傾斜部的構件,該傾斜部設置在平 台上以在直立於直立方向的方向上移動;多數個按壓部件中的至少一個按壓部件。可根據具有傾斜部分之構件的運動,在直立方向上獨立地運動。 In the grain separation apparatus according to an embodiment of the present invention, the driving unit includes a member having an inclined portion provided on a flat surface The table is moved in a direction upright to the upright direction; at least one pressing member of the plurality of pressing members. It can move independently in the upright direction according to the movement of the member having the inclined portion.

在根據本發明的實施方式的晶粒分離裝置中,多數個按壓構件為三個以上,並且,驅動單元可以設置為少於按壓構件的數量。 In the grain separation apparatus according to the embodiment of the present invention, the plurality of pressing members is three or more, and the driving unit may be provided less than the number of pressing members.

在根據本發明之實施方式的晶粒分離裝置中,驅動單元設置在具有傾斜部的構件的一側,並且,相對於具有傾斜部的部件可以具有至少一個引導件。 In the die separation apparatus according to the embodiment of the present invention, the driving unit is provided on one side of the member having the inclined portion, and may have at least one guide relative to the member having the inclined portion.

在根據本發明實施例的晶粒分離裝置中,平台直接連接到多數個按壓構件中的最裡面的按壓構件,驅動單元設置在平台上,並且,除了最裡面的按壓構件之外的其餘按壓構件均可以獨立上下移動。平台、多數個按壓構件和驅動單元之間的設置關係不受特別限制,並且各種配置關係是可能的。例如,平台可以直接連接到多數個按壓構件中的最外側按壓構件。 In the die separation apparatus according to the embodiment of the present invention, the stage is directly connected to the innermost pressing member among the plurality of pressing members, the driving unit is provided on the stage, and the remaining pressing members except the innermost pressing member Can move up and down independently. The arrangement relationship among the platform, the plurality of pressing members, and the driving unit is not particularly limited, and various configuration relationships are possible. For example, the platform may be directly connected to the outermost pressing member of the plurality of pressing members.

在根據本發明的實施方式的晶粒分離裝置中,驅動單元可以使頭部單元和按壓單元在直立方向上一體地移動。 In the die separating apparatus according to the embodiment of the present invention, the driving unit may integrally move the head unit and the pressing unit in the upright direction.

在根據本發明另一實施例的晶粒分離裝置,是一種晶粒分離裝置,該晶粒分離裝置從下方按壓貼合片以從該貼合片分離設置在該貼合片上的晶粒;並且,包括多 數個接觸該貼合片的接觸構件。其乃包括頭部單元,該頭部單元包括:按壓單元,該按壓單元包括用於在直立方向上移動多數個接觸部件的多數個按壓部件;以及驅動單元,其在直立方向上移動多數個按壓部件,其中,驅動單元是多數個接觸部件和多數個按壓部件一體地升高以使貼合片和整個多數個接觸構件彼此接觸,並且多數個按壓構件中的一些升高或降低以升高或降低貼合片和多數個接觸部件。藉由改變其接觸狀態,將晶粒從貼合片上分離。 In another embodiment of the present invention, a die separating device is a die separating device that presses a bonding sheet from below to separate the dies provided on the bonding sheet from the bonding sheet; and , including many Several contact members are in contact with the adhesive sheet. It includes a head unit that includes: a pressing unit that includes a plurality of pressing members for moving a plurality of contact members in an upright direction; and a drive unit that moves a plurality of pressing members in the upright direction components, wherein the driving unit is that a plurality of contact members and a plurality of pressing members are integrally raised to make the fitting sheet and the entire plurality of contact members contact each other, and some of the plurality of pressing members are raised or lowered to raise or lower Lower the lamination and multiple contact parts. The die is separated from the laminate by changing its contact state.

根據本發明的另一個實施例的晶粒分離方法,是藉由包括多數個接觸構件的晶粒分離裝置對貼合片進行加壓,以從貼合片分離設置在貼合片上的晶粒之晶粒分離方法。乃將多數個接觸構件對準至相同的高度,將多數個對準的接觸構件一體地升高,與貼合片接觸,並且,升高或降低多數個接觸構件中的一部,以使得貼合片升高或降低,並且改變多數個接觸構件的接觸狀態。 According to another embodiment of the present invention, the die separation method includes pressurizing the lamination sheet by a die separation device including a plurality of contact members, so as to separate the die arranged on the lamination sheet from the lamination sheet. Grain separation method. It is to align the plurality of contact members to the same height, raise the plurality of aligned contact members integrally, and contact the fitting sheet, and raise or lower a part of the plurality of contact members, so that the The laminate is raised or lowered, and the contact state of the plurality of contact members is changed.

在根據本發明的另一實施方式的晶粒分離方法中,改變接觸狀態的步驟可以選擇性地升高或降低是同心排列的多數個接觸構件中的至少一個接觸構件。 In the grain separation method according to another embodiment of the present invention, the step of changing the contact state may selectively raise or lower at least one contact member among a plurality of contact members that are concentrically arranged.

在根據本發明另一實施例的晶粒分離方法中,晶粒分離裝置使頭部單元沿著直立方向移動,所述頭部單元包括從下方按壓貼合片的多數個接觸構件和多數個在直立方向的接觸構件。其包括:一按壓單元,其包括: 多數個按壓構件,用於按壓貼合片;以及驅動單元,其用以在直立方向上移動多數個按壓構件;以及該驅動單元,其在直立方向上整體地移動多數個按壓構件。平台和驅動單元一體地移動,並且使多數個按壓構件中的至少一個在直立方向獨立地移動,以及藉由使平台升高而接觸貼合片的步驟,多數個接觸構件在使貼合片的整個上表面與貼合片接觸並且改變接觸狀態的步驟中,可以通過升高或降低驅動單元來使多數個接觸構件中的至少一個與貼合片隔開。 In the die separation method according to another embodiment of the present invention, the die separation device moves a head unit in an upright direction, the head unit including a plurality of contact members pressing the bonding sheet from below and a plurality of Contact member in upright orientation. It includes: a pressing unit, which includes: A plurality of pressing members for pressing the fitting sheet; and a driving unit for moving the plurality of pressing members in the upright direction; and the driving unit for integrally moving the plurality of pressing members in the upright direction. The platform and the driving unit are integrally moved, and at least one of the plurality of pressing members is independently moved in the upright direction, and the steps of contacting the fitting sheet by raising the platform, the plurality of contacting members are in contact with the fitting sheet. In the step of contacting the entire upper surface with the bonding sheet and changing the contact state, at least one of the plurality of contact members may be separated from the bonding sheet by raising or lowering the driving unit.

藉由以下用於實施本發明的詳細描述,申請專利範圍和附圖,除上述那些以外的其他方面,特徵和優點將變得顯而易見。 Aspects, features and advantages in addition to those described above will become apparent from the following detailed description for carrying out the invention, the scope of the claims and the accompanying drawings.

根據本發明之實施方式的晶粒分離裝置和使用該晶粒分離裝置的晶粒分離方法,可以在多數個接觸構件相對於其上設置有晶粒的貼合片,以相同高度接觸的狀態下改變接觸構件和貼合片的貼合狀態。藉此,可以在多數個接觸構件更精確地對準的狀態下,執行分離和結合製程,從而提高晶粒分離的品質與數量。 According to the crystal grain separation device and the crystal grain separation method using the same according to the embodiment of the present invention, a plurality of contact members can be in a state of contacting at the same height with respect to the bonded sheet on which the crystal grains are provided. Change the bonding state of the contact member and the bonding sheet. Thereby, the separation and bonding process can be performed in a state where the plurality of contact members are more accurately aligned, thereby improving the quality and quantity of die separation.

特別地,根據本發明實施例的晶粒分離裝置和使用該晶粒分離裝置的晶粒分離方法,係在直立方向上一體地移動多數個按壓構件,並且,其中的一部份及/或全部 均在直立方向獨立地運動,從而可以精確地從貼合片上將晶粒壓下並分離。 In particular, according to the crystal grain separating apparatus and the crystal grain separating method using the same, the plurality of pressing members are integrally moved in the vertical direction, and a part and/or all of them Both move independently in the upright direction, so that the die can be precisely pressed and separated from the laminate.

另外,根據本發明之實施例的晶粒分離裝置和使用該晶粒分離裝置的晶粒分離方法,可以控制按壓構件單獨地上下移動,從而減少驅動構件的數量,並且減少整個系統的部件和成本。 In addition, according to the grain separation apparatus and the grain separation method using the same, according to the embodiment of the present invention, the pressing member can be controlled to move up and down individually, thereby reducing the number of driving members, and reducing the parts and cost of the entire system .

1:晶粒結合系統 1: Die bonding system

10:晶粒分離裝置 10: Die separation device

100:頭部單元 100: Head unit

110:主體 110: Subject

120:頂蓋 120: top cover

121:吸附孔 121: adsorption hole

122:引導槽 122: Guide slot

130:支撐架 130: Support frame

140:接觸構件 140: Contact components

140A:突出部 140A: Protrusion

140B:接觸構件主體 140B: Contact member body

141:第一接觸塊 141: First contact block

142:第二接觸塊 142: Second contact block

143:第三接觸塊 143: Third contact block

150:第一銷體 150: The first pin body

20:支持裝置 20: Support device

21:第一晶圓支撐構件 21: First wafer support member

22:第二晶圓支撐構件 22: Second wafer support member

23:第三晶圓支撐構件 23: Third wafer support member

200:按壓單元 200: Press unit

210:按壓構件 210: Press the member

210A:上按壓構件 210A: Upper pressing member

210B:下按壓構件 210B: Lower pressing member

211:第一按壓塊 211: The first pressing block

212:第二按壓塊 212: Second pressing block

213:第三按壓塊 213: The third pressing block

220:第二銷體 220: Second pin body

221:第一按壓塊的2a銷體 221: 2a pin body of the first pressing block

222:第二按壓塊的2b銷體 222: 2b pin body of the second pressing block

223:第三按壓塊的2c引腳 223: 2c pin of the third pressing block

300:驅動單元 300: Drive unit

310:平台 310: Platform

320:驅動機構 320: Drive Mechanism

321:引導件 321: Guide

322:滑塊 322: Slider

323:推動構件 323: Push Component

324:滾輪 324: Roller

D:晶粒 D: grain

G:凹槽 G: Groove

M1:第一驅動構件 M1: first drive member

M2:第二驅動構件 M2: Second drive member

P:突起 P: Protrusion

P1:第一銷體 P1: The first pin body

S:貼合片 S: Lamination sheet

W:晶圓 W: Wafer

第1圖係顯示根據本發明實施例的包括晶粒分離裝置的晶粒結合系統。 FIG. 1 shows a die bonding system including a die separation device according to an embodiment of the present invention.

第2圖係顯示放置在貼合片上的晶粒。 Figure 2 shows the die placed on the laminate.

第3圖係顯示第1圖所示晶粒分離裝置。 FIG. 3 shows the die separation apparatus shown in FIG. 1 .

第4圖係顯示沿第3圖所示IV-IV線截取的截面圖。 FIG. 4 shows a cross-sectional view taken along the line IV-IV shown in FIG. 3 .

第5圖係顯示第4圖所示頭部單元的截面圖。 FIG. 5 is a cross-sectional view showing the head unit shown in FIG. 4 .

第6圖係顯示從頂部所視之第5圖的接觸構件配置圖。 Fig. 6 is a diagram showing the arrangement of the contact members of Fig. 5 as viewed from the top.

第7圖係顯示第5圖所示接觸構件的突出部。 FIG. 7 shows the protrusion of the contact member shown in FIG. 5 .

第8圖係顯示沿第5圖之VIII-VIII線所截取的截面圖。 FIG. 8 is a cross-sectional view taken along line VIII-VIII of FIG. 5. FIG.

第9圖係顯示第4圖所示按壓單元的正面示意圖。 FIG. 9 is a schematic front view of the pressing unit shown in FIG. 4 .

第10圖係顯示沿第9圖所示之X-X線所視的截面圖。 FIG. 10 shows a cross-sectional view taken along line X-X shown in FIG. 9 .

第11圖係顯示沿第9圖所示之XI-XI線所視的截面 圖。 Fig. 11 shows a section along the line XI-XI shown in Fig. 9 picture.

第12圖係顯示第4圖所示按壓單元及驅動單元部份的立體示意圖。 FIG. 12 is a perspective view of the pressing unit and the driving unit shown in FIG. 4 .

第13圖係顯示第4圖所示驅動單元說明圖。 FIG. 13 is an explanatory diagram showing the drive unit shown in FIG. 4 .

第14圖係顯示根據本發明實施例所示晶粒分離方法流程圖。 FIG. 14 is a flowchart of a method for separating die according to an embodiment of the present invention.

第15a至15d圖係顯示根據本發明實施例的晶粒分離進行狀態。 Figures 15a to 15d show the progress of the grain separation according to the embodiment of the present invention.

第16a至16d圖係顯示根據本發明另一實施例的晶粒分離進行狀態。 Figures 16a to 16d show the state of progress of die separation according to another embodiment of the present invention.

本發明可以應用於各種狀態,並且可以具有各種實施例。特定的實施例將在附圖中顯示並且在下列對本發明實施方式所作的說明中被詳細描述。然而,這並不是在將本發明限制為特定的實施例,應當理解為包括本發明的精神和範圍內包括的所有變更,等同形式和替代形式。在描述本發明時,即使在其他實施例中進行了說明,相同的附圖標記也用於相同的組件。 The present invention can be applied to various states and can have various embodiments. Specific embodiments are shown in the accompanying drawings and are described in detail in the following description of embodiments of the invention. However, this is not intended to limit the present invention to the specific embodiments, but should be understood to include all modifications, equivalents and alternatives included within the spirit and scope of the present invention. In describing the present invention, the same reference numerals are used for the same components even if described in other embodiments.

諸如第一和第二的術語可以用於描述各種組件,但是這些組件不應受到這些術語的限制。這些術語僅用於區分一個組件和其他組件。 Terms such as first and second may be used to describe various components, but these components should not be limited by these terms. These terms are only used to distinguish one component from another.

在本申請案中使用的術語僅用於描述特定實 施例,而無意於限制本發明。在本申請案中,術語包括具有意在指示本文所述的特徵,數字,步驟,動作,部件或其組合,一個或多數個其他特徵的存在。應當理解,其並不預先排除字段或數字,步驟,操作,組件,部件或其組合的存在或增加的可能性。 The terms used in this application are used to describe specific embodiments only, and are not intended to limit the invention. In this application, the terms " comprising " or " having " are intended to indicate the presence of a feature, number, step, act, component or combination thereof, one or more of the other features described herein. It should be understood that it does not preclude the presence or addition of fields or numbers, steps, operations, components, parts or combinations thereof.

在下文中,將參考在附圖中所顯示的與本發明有關的實施例來詳細描述本發明。 Hereinafter, the present invention will be described in detail with reference to embodiments related to the present invention shown in the accompanying drawings.

第1圖係顯示包括根據本發明實施例的晶粒分離裝置10的晶粒結合系統1,第2圖係顯示佈置在貼合片S上的晶粒D。 FIG. 1 shows a die bonding system 1 including a die separation apparatus 10 according to an embodiment of the present invention, and FIG. 2 shows a die D arranged on a lamination sheet S. As shown in FIG.

參照第1圖和第2圖,根據本晶粒分離裝置10可以被包括在晶粒結合系統1中。 Referring to FIGS. 1 and 2 , the die separation apparatus 10 according to the present invention may be included in the die bonding system 1 .

藉由分離和拾取佈置在貼合片S上的晶圓W,並且更具體地,可以將晶圓W分為多數個的晶粒D,進行分離和拾取,來將晶粒結合系統1安裝在基板上。 The die bonding system 1 is mounted on the wafer W by separating and picking up the wafer W arranged on the bonding sheet S, and more specifically, the wafer W can be divided into a plurality of dies D for separation and pickup. on the substrate.

晶粒結合系統1可以包括晶粒分離裝置10,晶粒支持裝置20與晶粒拾取裝置30。 The die bonding system 1 may include a die separating device 10 , a die supporting device 20 and a die picking device 30 .

支持裝置20包括:第一晶圓支撐構件21,其具有用以支撐設置有晶粒D的貼合片S之端部;以及第二晶圓支撐構件22,用以插入第一晶圓支撐構件21(貼合片S的下表面位於其上的第二晶圓支撐構件22和第三晶圓支撐構件23)。 The supporting device 20 includes: a first wafer supporting member 21 having an end portion for supporting the bonding sheet S provided with the die D; and a second wafer supporting member 22 for inserting the first wafer supporting member 21 (the second wafer support member 22 and the third wafer support member 23 on which the lower surface of the bonding sheet S is located).

當藉由傳送裝置(未示出)將貼合片S放置在第三晶圓支撐構件23上時,根據本發明實施方式的晶粒分離裝置10被設置在貼合片S下方。然後,在貼合片S被支持裝置支撐的狀態下,可以按壓貼合片S的下表面,以從貼合片S上分離晶粒D。另外,晶粒拾取裝置30可以從貼合片S拾取晶粒D並將其安裝在基板等的上面。 When the bonding sheet S is placed on the third wafer support member 23 by a conveying device (not shown), the die separating apparatus 10 according to the embodiment of the present invention is disposed below the bonding sheet S. Then, in a state where the bonding sheet S is supported by the support device, the lower surface of the bonding sheet S may be pressed to separate the die D from the bonding sheet S. In addition, the die pick-up device 30 can pick up the die D from the bonding sheet S and mount it on the upper surface of a substrate or the like.

第3圖顯示了第1圖的晶粒分離裝置10,第4圖示顯示了沿第3圖的IV-IV截取的截面,第5圖放大了第4圖的頭部單元100,並且,第6圖顯示了從第5圖頂部觀察的接觸構件140,第7圖顯示了第5圖的接觸構件140的突出部140A,第8圖顯示了沿第5圖的切線VII-VII所截取的截面構成。 Fig. 3 shows the die separation apparatus 10 of Fig. 1, Fig. 4 shows a section taken along IV-IV of Fig. 3, Fig. 5 enlarges the head unit 100 of Fig. 4, and Fig. 4 Fig. 6 shows the contact member 140 viewed from the top of Fig. 5, Fig. 7 shows the protrusion 140A of the contact member 140 of Fig. 5, and Fig. 8 shows a section taken along the tangent line VII-VII of Fig. 5 constitute.

參照第3圖和第4圖,根據本發明實施例的晶粒分離裝置10包括:頭部單元100,按壓單元200,和驅動單元300。其可包括用來控制的驅動控制單元(未示出)。 Referring to FIGS. 3 and 4 , the die separation apparatus 10 according to the embodiment of the present invention includes: a head unit 100 , a pressing unit 200 , and a driving unit 300 . It may include a drive control unit (not shown) for controlling.

頭部單元100設置在晶粒分離裝置10的頂部,並且可以直接按壓貼合片S的表面。 The head unit 100 is disposed on the top of the die separation device 10, and can directly press the surface of the bonding sheet S.

參照第5圖至第8圖,頭部單元100可包括主體110,頂蓋120,支撐架130和接觸構件140。 5 to 8 , the head unit 100 may include a main body 110 , a top cover 120 , a support frame 130 and a contact member 140 .

主體110是頭部單元100的主體部分,並且可具有其中佈置接觸構件140的空間。主體110的形狀不受特別限制,並且在一個實施例中可以是圓柱形的。 The main body 110 is a main body portion of the head unit 100, and may have a space in which the contact member 140 is disposed. The shape of the main body 110 is not particularly limited, and may be cylindrical in one embodiment.

頂蓋120被設置以覆蓋主體110的頂部。可在頂蓋120的上表面上設置多數個開口,以允許接觸構件140在直立方向上移動的吸附孔121和引導槽122。 The top cover 120 is provided to cover the top of the main body 110 . A plurality of openings may be provided on the upper surface of the top cover 120 to allow the suction holes 121 and the guide grooves 122 of the contact member 140 to move in the upright direction.

多數個吸附孔121形成在頂蓋120的上表面上,並且數量沒有特別限制。吸附孔121可以連接到設置在剝離裝置10中或與之分離設置的吸附裝置(未示出)。當接觸構件140推動貼合片S時,吸附裝置經由吸附孔121吸附貼合片S,可以使晶粒D更穩定地分離。 A plurality of adsorption holes 121 are formed on the upper surface of the top cover 120, and the number is not particularly limited. The adsorption hole 121 may be connected to an adsorption device (not shown) provided in the peeling device 10 or provided separately therefrom. When the contact member 140 pushes the bonding sheet S, the suction device sucks the bonding sheet S through the suction holes 121 , so that the crystal grains D can be separated more stably.

引導槽122可以形成在頂蓋120的上表面的中心。引導槽122的尺寸和形狀不受特別限制,但是,較佳的是,可以對應於稍後描述的接觸構件140之突出部140A的尺寸和形狀。 The guide groove 122 may be formed at the center of the upper surface of the top cover 120 . The size and shape of the guide groove 122 are not particularly limited, but may preferably correspond to the size and shape of the protrusion 140A of the contact member 140 described later.

支撐架130設置在主體110的底部,並且可以將頭部單元100連接至按壓單元200。 The support bracket 130 is disposed at the bottom of the main body 110 and may connect the head unit 100 to the pressing unit 200 .

接觸構件140設置在主體110內部,並且可以設置成多數個,以擠壓貼合片S的表面。 The contact member 140 is provided inside the main body 110, and may be provided in plural to press the surface of the fitting sheet S. As shown in FIG.

在一實施例中,接觸構件140可以是多數個同心佈置的塊體。更具體地,可如同第5圖和第8圖所示,每個均為環形的第一接觸塊141,第二接觸塊142和第三接觸塊143在接觸構件140中是同心的。 In an embodiment, the contact member 140 may be a plurality of concentrically arranged blocks. More specifically, as shown in FIGS. 5 and 8 , the first contact blocks 141 , the second contact blocks 142 and the third contact blocks 143 , each of which are annular, are concentric in the contact member 140 .

第一接觸塊141為設置在接觸構件140的最內側的接觸塊。另外,第二接觸塊142可以被佈置為在徑向方 向上與第一接觸塊141間隔以圍繞第一接觸塊141者。另外,第三接觸塊143可以被佈置成在徑向方向上與第二接觸塊142間隔以圍繞第二接觸塊142者。 The first contact block 141 is a contact block disposed on the innermost side of the contact member 140 . In addition, the second contact blocks 142 may be arranged in a radial direction It is spaced upward from the first contact block 141 to surround the first contact block 141 . In addition, the third contact block 143 may be arranged to be spaced apart from the second contact block 142 in the radial direction to surround the second contact block 142 .

接觸構件140的數量沒有特別限制。在本發明的一個實施例中,顯示了三個接觸構件140,但是晶粒分離裝置10考慮了晶粒D和貼合片S的具體規格,因此各種接觸構件140均可能包括。這也適用於稍後描述的按壓構件210。然而,在下文中,為了便於理解,主要描述設置三個接觸構件140的狀態。 The number of the contact members 140 is not particularly limited. In one embodiment of the present invention, three contact members 140 are shown, but the die separation device 10 considers the specific specifications of the die D and the bonding sheet S, so various contact members 140 may be included. This also applies to the pressing member 210 described later. However, in the following, for ease of understanding, the state in which the three contact members 140 are provided is mainly described.

在一實施例中,多數個接觸構件140可獨立移動。更具體而言,第一接觸塊141,第二接觸塊142和第三接觸塊143不受彼此的移動的約束,並且在垂直方向或直立方向上移動時獨立地接觸貼合片S。因此,可以改變貼合片S和接觸構件140之間的接觸狀態。 In one embodiment, the plurality of contact members 140 are independently movable. More specifically, the first contact block 141, the second contact block 142, and the third contact block 143 are not constrained by each other's movement, and independently contact the bonding sheet S when moving in the vertical direction or the upright direction. Therefore, the contact state between the bonding sheet S and the contact member 140 can be changed.

在一實施例中,接觸構件140可包括突出部140A和主體部分140B。 In an embodiment, the contact member 140 may include a protrusion 140A and a body portion 140B.

突出部140A可以設置在接觸構件140的頂部上。更具體而言,如第5圖和第7圖所示,突出部140A藉由向上突出多數個接觸構件140而形成。突出部140A的上端可以直接接觸貼合片S的下表面。 The protrusion 140A may be provided on the top of the contact member 140 . More specifically, as shown in FIGS. 5 and 7 , the protruding portion 140A is formed by protruding a plurality of contact members 140 upward. The upper end of the protrusion 140A may directly contact the lower surface of the bonding sheet S.

突出部140A的形狀沒有特別限制。在一個實施例中,如第7圖所示,突出部140A可以為其中具有多數個 正方形狀的接觸構件140分層佈置的形狀。 The shape of the protrusion 140A is not particularly limited. In one embodiment, as shown in FIG. 7, the protrusion 140A may have a plurality of A shape in which the square-shaped contact members 140 are arranged in layers.

主體部分140B可以從突出部140A的下端沿徑向和高度方向延伸,並且可以為具有圓柱的形狀。 The main body portion 140B may extend in the radial and height directions from the lower end of the protruding portion 140A, and may have a cylindrical shape.

在一個實施例中,根據本發明的實施例的接觸構件140可以具有向上變窄的形狀。 In one embodiment, the contact member 140 according to an embodiment of the present invention may have an upwardly narrowed shape.

在一實施例中,突出部140A可以包括多數個突起P和凹槽G。 In one embodiment, the protrusion 140A may include a plurality of protrusions P and grooves G.

更具體而言,如第7圖所示,可以在第一接觸塊141的頂表面上形成多數個突起P。當第一接觸塊141向上移動時,這些突起P中的每一個可以直接接觸貼合片S的下表面。另外,可以在第一接觸塊141的突起P之間形成凹槽G。 More specifically, as shown in FIG. 7 , a plurality of protrusions P may be formed on the top surface of the first contact block 141 . Each of these protrusions P may directly contact the lower surface of the fitting sheet S when the first contact block 141 moves upward. In addition, grooves G may be formed between the protrusions P of the first contact blocks 141 .

類似地,可以在第二接觸塊142和第三接觸塊143的上表面上交替地重複形成多數個突起P和凹槽G。 Similarly, a plurality of protrusions P and grooves G may be alternately and repeatedly formed on the upper surfaces of the second contact block 142 and the third contact block 143 .

因此,貼合片S並不被整個支撐在每個接觸塊的上表面上,而是可以被形成在接觸塊中的突起P和凹槽G支撐而呈局部彎曲的狀態。 Therefore, the bonding sheet S is not entirely supported on the upper surface of each contact block, but may be supported in a partially bent state by the protrusions P and grooves G formed in the contact blocks.

即,根據本發明實施例的晶粒分離裝置10,除了改變多數個接觸構件140與貼合片S之間的接觸狀態之外,藉由設置接觸構件140上的突起P的設置和凹槽G的形成,可以更容易地將晶粒D從貼合片S上分離。 That is, according to the die separation device 10 of the embodiment of the present invention, in addition to changing the contact state between the plurality of contact members 140 and the lamination sheet S, by setting the arrangement of the protrusions P and the grooves G on the contact members 140 , the die D can be more easily separated from the bonding sheet S.

在一實施例中,凹槽G在縱向和寬度方向上的 尺寸可以小於突起P的尺寸。因此,可以防止貼合片S被過度地拉入而形成在凹槽G的空間內。 In one embodiment, the groove G in the longitudinal and width directions The size may be smaller than that of the protrusion P. Therefore, the bonding sheet S can be prevented from being formed in the space of the groove G from being pulled in excessively.

在另一實施例中,形成在任何一個接觸塊中的凹槽G,在長度方向和寬度方向上的尺寸,可以小於形成在相鄰的接觸塊中之突起P的尺寸。例如,如第7圖所示,形成在第二接觸塊142中的凹槽G是,與形成在與相鄰的接觸塊相鄰的第一接觸塊141和第三接觸塊143中的突起P作比較,在長度和寬度方向上的尺寸均可能較小。如此,可以防止貼合片S過度彎曲。 In another embodiment, the size of the groove G formed in any one of the contact blocks in the length direction and the width direction may be smaller than the size of the protrusion P formed in the adjacent contact block. For example, as shown in FIG. 7, the groove G formed in the second contact block 142 is the projection P formed in the first contact block 141 and the third contact block 143 adjacent to the adjacent contact blocks For comparison, the dimensions in both the length and width directions may be smaller. In this way, the bonding sheet S can be prevented from being bent excessively.

如第5圖所示,頭部單元100可以進一步包括多數個第一銷體150。第一銷體150設置在頭部單元100的下端,以將稍後將描述的按壓單元200的按壓構件210的運動傳遞到接觸構件140。儘管在第5圖中僅示出了連接到第一接觸塊141的第一銷體150,但是可進一步增加連接到第二接觸塊142和第三接觸塊143的第一接觸銷體150。 As shown in FIG. 5 , the head unit 100 may further include a plurality of first pin bodies 150 . The first pin body 150 is provided at the lower end of the head unit 100 to transmit the movement of the pressing member 210 of the pressing unit 200 to be described later to the contact member 140 . Although only the first pin body 150 connected to the first contact block 141 is shown in FIG. 5 , the first contact pin body 150 connected to the second contact block 142 and the third contact block 143 may be further increased.

然而,不一定必須設置第一銷體P1,並且,按壓構件210可以在沒有第一銷體P1的情況下直接按壓和移動接觸構件140。 However, the first pin body P1 does not necessarily have to be provided, and the pressing member 210 may directly press and move the contact member 140 without the first pin body P1.

第9圖顯示了第4圖的按壓單元200;第10圖顯示了沿第9圖的裁切線X-X截取的截面圖,第11圖顯示了沿第9圖的XI-XI線截取的截面圖;第12圖則將第4圖中的按壓單元200和驅動單元300被放大並顯示出來。 Fig. 9 shows the pressing unit 200 of Fig. 4; Fig. 10 shows a cross-sectional view taken along the cutting line XX of Fig. 9, and Fig. 11 shows a cross-sectional view taken along the line XI-XI of Fig. 9; In Fig. 12, the pressing unit 200 and the driving unit 300 in Fig. 4 are enlarged and displayed.

參照第9圖至第12圖,按壓單元200可在直立方向上移動頭部單元100的多數個接觸構件140以按壓貼合片S的下表面。 Referring to FIGS. 9 to 12 , the pressing unit 200 may move the plurality of contact members 140 of the head unit 100 in the upright direction to press the lower surface of the fitting sheet S. FIG.

按壓單元200可以包括多數個按壓構件210。 The pressing unit 200 may include a plurality of pressing members 210 .

按壓構件210被連接為分別對應於接觸構件140,並且在直立方向上移動接觸構件140。這些按壓構件210可以在直立方向上彼此獨立地移動。 The pressing members 210 are connected to correspond to the contact members 140, respectively, and move the contact members 140 in the upright direction. These pressing members 210 can move independently of each other in the upright direction.

在一個實施例中,按壓構件210可包括第一按壓塊211,第二按壓塊212和第三按壓塊213。第一按壓塊211,第二按壓塊212和第三按壓塊213分別獨立於第一接觸塊141,第二接觸塊142和第三接觸塊143而可以上下移動。按壓塊的數量沒有特別限制,並且可以對應於接觸塊的數量。 In one embodiment, the pressing member 210 may include a first pressing block 211 , a second pressing block 212 and a third pressing block 213 . The first pressing block 211 , the second pressing block 212 and the third pressing block 213 can move up and down independently of the first contact block 141 , the second contact block 142 and the third contact block 143 respectively. The number of pressing blocks is not particularly limited, and may correspond to the number of contact blocks.

在一個實施例中,如第9圖所示,按壓構件210可以分為上按壓構件210A和下按壓構件210B。 In one embodiment, as shown in FIG. 9 , the pressing member 210 may be divided into an upper pressing member 210A and a lower pressing member 210B.

另外,按壓單元200還可包括一第二銷體220,第二銷體220連接上按壓構件210A和下按壓構件210B。第二銷體220可以連接包括在上按壓構件210A和下按壓構件210B中的每個按壓塊。更具體地說,第二銷體220包括連接第一按壓塊211的2a銷體221,連接第二按壓塊212的2b銷體222,以及,連接第三按壓塊213的第2c銷體223。 In addition, the pressing unit 200 may further include a second pin body 220, and the second pin body 220 is connected to the upper pressing member 210A and the lower pressing member 210B. The second pin body 220 may connect each pressing block included in the upper pressing member 210A and the lower pressing member 210B. More specifically, the second pin body 220 includes a 2a pin body 221 connected to the first pressing block 211 , a 2b pin body 222 connected to the second pressing block 212 , and a 2c pin body 223 connected to the third pressing block 213 .

因此,如後所述,當下按壓構件210B的按壓塊藉由驅動單元300在直立方向上移動時,該運動藉由第二銷 體220傳遞到上按壓構件210A。另外,上按壓構件210A可以在直立方向上獨立地移動頭部單元100的接觸構件140。 Therefore, as described later, when the pressing block of the lower pressing member 210B is moved in the upright direction by the driving unit 300, the movement is The body 220 is transmitted to the upper pressing member 210A. In addition, the upper pressing member 210A can independently move the contact member 140 of the head unit 100 in the upright direction.

在另一個實施例中,按壓單元200不包括第二銷體220,並且上按壓構件210A和下按壓構件210B可以一體地形成。在這種情況下,上部和下部可以是,用於在概念上係分離按壓構件210的含義。 In another embodiment, the pressing unit 200 does not include the second pin body 220, and the upper pressing member 210A and the lower pressing member 210B may be integrally formed. In this case, the upper part and the lower part may be used to conceptually separate the meanings of the pressing member 210 .

在一個實施例中,如第10圖所示,上按壓構件210A的上端可以由多數個多邊形塊狀體構成。更具體地說,在上按壓構件210A的上端,第一按壓塊211佈置在中央,第二按壓塊212佈置在其兩側,並且,最外面可以設置為第三按壓塊213。亦即第二按壓塊212和第三按壓塊213可以包括多數個物理上分離的塊體。 In one embodiment, as shown in FIG. 10, the upper end of the upper pressing member 210A may be composed of a plurality of polygonal blocks. More specifically, at the upper end of the upper pressing member 210A, the first pressing piece 211 is arranged in the center, the second pressing piece 212 is arranged on both sides thereof, and the outermost may be provided as the third pressing piece 213 . That is, the second pressing block 212 and the third pressing block 213 may include a plurality of physically separated blocks.

在一個實施例中,上按壓構件210A的下端可以由多數個同心佈置的塊體構成。更具體地說,上按壓構件210A的下端,第一按壓塊211設置在中心,第二按壓塊212設置成圍繞第一按壓塊211,並且第三按壓塊213可以被再次佈置為圍繞第二按壓塊212。 In one embodiment, the lower end of the upper pressing member 210A may be composed of a plurality of blocks arranged concentrically. More specifically, at the lower end of the upper pressing member 210A, the first pressing block 211 is disposed at the center, the second pressing block 212 is disposed to surround the first pressing block 211, and the third pressing block 213 may be arranged to surround the second pressing block again Block 212.

又,按壓構件210,更具體而已言,上按壓構件210A可以具有向上變窄的形狀。 Also, the pressing member 210, more specifically, the upper pressing member 210A may have a shape narrowed upward.

在第10圖和第11圖中,每個按壓塊被顯示出來為具有多邊形形狀,但是不限於此。例如,按壓塊可具有各種形狀,諸如環形和橢圓形。 In FIGS. 10 and 11, each pressing block is shown to have a polygonal shape, but is not limited thereto. For example, the pressing block may have various shapes, such as annular and oval.

儘管未在圖中示出,但是下按壓構件210B的上端可以具有與上按壓構件210A的下端相同的形狀。更具體地說,第9圖中由XI’-XI’指示的截面可以具有與由XI-XI指示的截面相同的形狀。 Although not shown in the drawings, the upper end of the lower pressing member 210B may have the same shape as the lower end of the upper pressing member 210A. More specifically, the section indicated by XI'-XI' in Fig. 9 may have the same shape as the section indicated by XI-XI.

在一個實施例中,下按壓構件210B可以分別連接至第二銷體220。更具體地說,如第9圖和第12圖所示,下按壓構件210B具有佈置在中央的第一按壓塊211和圍繞第一按壓塊211的第二按壓塊212之設置,並且可以將第三按壓塊213設置為再次圍繞第二按壓塊212。另外,第一按壓塊211連接到2a引腳221,第二按壓塊212連接到2b引腳222,第三按壓塊213則是連接到2c引腳223。因此,當第二銷體220中的每一個根據稍後描述之驅動單元300的操作上下移動時,按壓構件210也分別上下移動。在第12圖中,兩個第二銷體220連接到每個按壓構件210,但是要連接的數目或位置沒有特別限制。 In one embodiment, the lower pressing members 210B may be connected to the second pin bodies 220, respectively. More specifically, as shown in FIGS. 9 and 12, the lower pressing member 210B has a first pressing block 211 arranged in the center and a second pressing block 212 surrounding the first pressing block 211, and can The three pressing blocks 213 are arranged to surround the second pressing block 212 again. In addition, the first pressing block 211 is connected to the 2a pin 221 , the second pressing block 212 is connected to the 2b pin 222 , and the third pressing block 213 is connected to the 2c pin 223 . Therefore, when each of the second pin bodies 220 moves up and down according to the operation of the driving unit 300 to be described later, the pressing members 210 also move up and down, respectively. In FIG. 12, two second pin bodies 220 are connected to each pressing member 210, but the number or positions to be connected are not particularly limited.

另外,下按壓構件210B的下端可以被佈置為連接到驅動單元300,稍後將對此進行描述。 In addition, the lower end of the lower pressing member 210B may be arranged to be connected to the driving unit 300, which will be described later.

第13圖顯示出第4圖的驅動單元300。更具體地說,第12圖顯示出從側面所視之驅動單元300的視圖。 FIG. 13 shows the drive unit 300 of FIG. 4 . More specifically, FIG. 12 shows a side view of the drive unit 300 .

如第4圖和第13圖所示,驅動單元300設置在晶粒分離裝置10的下方,並且能夠使按壓構件210沿上下方向移動。 As shown in FIGS. 4 and 13 , the driving unit 300 is provided below the die separation device 10 and can move the pressing member 210 in the up-down direction.

驅動單元300可以包括平台310和驅動機構320。 The drive unit 300 may include a platform 310 and a drive mechanism 320 .

平台310設置在驅動單元300下方,並且多數個按壓構件210可以在直立方向上作一體性的移動。更具體地說,平台310是單板,其連接到第一驅動構件M1並且可以在直立方向移動。另外,第一按壓塊211,第二按壓塊212和第三按壓塊213可以設置在平台310的上表面上。因此,當平台310沿直立方向移動時,第一按壓塊211,第二按壓塊212和第三按壓塊213也可以沿直立方向作一體性的移動。 The platform 310 is disposed under the driving unit 300, and the plurality of pressing members 210 can move integrally in the upright direction. More specifically, the platform 310 is a single plate, which is connected to the first drive member M1 and can move in an upright direction. In addition, the first pressing block 211 , the second pressing block 212 and the third pressing block 213 may be disposed on the upper surface of the platform 310 . Therefore, when the platform 310 moves in the upright direction, the first pressing block 211 , the second pressing block 212 and the third pressing block 213 can also move integrally in the upright direction.

驅動機構320與平台310係作一體性的移動,並且在直立方向上獨立地移動多數個按壓構件210中的至少一個。例如,驅動機構320可以具有用於在直立方向上移動按壓構件210的滾輪結構。 The driving mechanism 320 moves integrally with the platform 310, and independently moves at least one of the plurality of pressing members 210 in the upright direction. For example, the driving mechanism 320 may have a roller structure for moving the pressing member 210 in the upright direction.

驅動機構320可以包括引導件321,滑塊322,具有傾斜部分的推動構件323和滾輪324。 The driving mechanism 320 may include a guide 321 , a slider 322 , a pushing member 323 having an inclined portion, and a roller 324 .

引導件321可以垂直於直立方向設置在平台310上。例如,引導件321可以沿垂直於作為直立方向的Z軸之X軸方向或Y軸方向佈置。 The guide 321 may be disposed on the platform 310 perpendicular to the upright direction. For example, the guides 321 may be arranged in the X-axis direction or the Y-axis direction which is perpendicular to the Z-axis as the upright direction.

滑塊322設置在引導件321上,並且可以沿著引導件321在一個方向上往復運動。例如,滑塊322可在被插入到形成在引導件321的側表面上的凹槽中的同時,在一個 方向上往復運動。 The slider 322 is provided on the guide 321 and can reciprocate in one direction along the guide 321 . For example, the slider 322 may be inserted into a groove formed on the side surface of the guide 321 at a reciprocating movement in the direction.

具有傾斜部分的推動構件323具有預定角度的傾斜表面,且連接到滑塊322,而可以在一個方向上移動。例如,當滑動件322藉由第二驅動構件M2的操作沿一個方向移動時,具有與滑動件322連接的傾斜部分的推動構件323也沿相同方向移動。 The pushing member 323 having an inclined portion has an inclined surface of a predetermined angle, and is connected to the slider 322 so as to be movable in one direction. For example, when the slider 322 is moved in one direction by the operation of the second driving member M2, the pushing member 323 having the inclined portion connected with the slider 322 is also moved in the same direction.

如此,驅動機構320乃用以相對於按壓構件210,提供直立的上下運動,並且在一個實施例中,驅動機構320具有引導件321,滑動件322和具有傾斜表面的推動構件323,以及滾輪324。但是,具有傾斜部分的推動構件323係為具有傾斜表面者,然並不限於此。例如,驅動機構320可以在側面上設置有凹槽以引起按壓構件210的直立上下運動。可替代地,驅動機構320可以被構造為使得在具有圓柱環形形狀的上表面或側表面上形成凸輪,並且當各個凸輪旋轉時,可以與上表面或側表面的運動相關聯地引起直立運動。 As such, the drive mechanism 320 is used to provide upright up-and-down movement relative to the pressing member 210 , and in one embodiment, the drive mechanism 320 has a guide 321 , a slider 322 and a push member 323 with an inclined surface, and a roller 324 . However, the pushing member 323 having the inclined portion is one having the inclined surface, but is not limited thereto. For example, the driving mechanism 320 may be provided with grooves on the sides to cause the upright up-and-down movement of the pressing member 210 . Alternatively, the drive mechanism 320 may be configured such that cams are formed on an upper or side surface having a cylindrical annular shape, and when each cam is rotated, an upright motion may be induced in association with movement of the upper or side surface.

在一個實施例中,第一驅動構件M1和第二驅動構件M2是分別用以移動平台310和滑塊322(或具有傾斜部分的推動構件323)之各種驅動裝置中的任何一個。更具體地說,第一驅動構件M1和第二驅動構件M2可以是步進電動機,線性電動機或作為驅動機構的伺服電動機。 In one embodiment, the first driving member M1 and the second driving member M2 are any one of various driving means for moving the platform 310 and the slider 322 (or the pushing member 323 having the inclined portion), respectively. More specifically, the first driving member M1 and the second driving member M2 may be a stepping motor, a linear motor, or a servo motor as a driving mechanism.

第二驅動構件M2設置在具有傾斜部分的推動 構件323之移動方向的前方,並且並排設置在具有傾斜部分的推動構件323的側面上,或者設置在底部,以提供驅動力。當第二驅動構件M2設置在下方時,第二驅動構件M2可以包括驅動機構320之滑塊322的功能。 The second drive member M2 is provided in a pusher having an inclined portion The members 323 are arranged in front of the moving direction of the members 323, and are arranged side by side on the sides of the pushing members 323 having inclined portions, or at the bottom, to provide a driving force. When the second driving member M2 is disposed below, the second driving member M2 may include the function of the slider 322 of the driving mechanism 320 .

滾輪324設置在按壓構件210的一側,並且可以保持與具有傾斜部分的推動構件323之傾斜表面的接觸狀態。更具體而言,如第12圖所示,滾輪324可設置在第二按壓塊212的下端,使得具有傾斜部分的推動構件323隨之沿一個方向移動,而與傾斜表面接觸的同時滾動移動。同樣地,滾輪324也可設置在第三按壓塊213的下端,使得具有傾斜部分的推動構件323沿一個方向移動,並且在與傾斜表面接觸的同時滾動移動。因此,具有傾斜部分的推動構件323在一個方向上的運動可以產生使按壓構件210在直立方向的運動。 The roller 324 is provided on one side of the pressing member 210, and can maintain a contact state with the inclined surface of the pushing member 323 having the inclined portion. More specifically, as shown in FIG. 12, the roller 324 may be provided at the lower end of the second pressing block 212, so that the pushing member 323 having the inclined portion moves in one direction therewith, and rolls while being in contact with the inclined surface. Likewise, the roller 324 may also be provided at the lower end of the third pressing block 213 so that the pushing member 323 having the inclined portion moves in one direction and rolls while being in contact with the inclined surface. Therefore, the movement of the pushing member 323 having the inclined portion in one direction can cause the movement of the pressing member 210 in the upright direction.

在一個具體實施例中,第一按壓塊211可以直接連接到平台310。亦即,與第二按壓塊212和第三按壓塊213不同,第一按壓塊211的運動可以獨立於具有傾斜部分的推動構件323。 In a specific embodiment, the first pressing block 211 may be directly connected to the platform 310 . That is, unlike the second pressing block 212 and the third pressing block 213, the movement of the first pressing block 211 may be independent of the pushing member 323 having the inclined portion.

在一個具體實施例中,按壓構件210的數量可為三個或更多,並且驅動機構320可以設置成比按壓構件210的數量少。例如,如上所述,可以設置三個按壓構件210作為第一按壓塊211,第二按壓塊212和第三按壓塊213,並 且可以設置驅動機構320。而第二按壓塊212和第三按壓塊213可連接到每個驅動機構320,並且第一按壓塊211亦可以直接連接到平台310,而不連接到驅動機構320。 In a specific embodiment, the number of the pressing members 210 may be three or more, and the driving mechanism 320 may be provided less than the number of the pressing members 210 . For example, as described above, three pressing members 210 may be provided as the first pressing block 211, the second pressing block 212 and the third pressing block 213, and And a drive mechanism 320 may be provided. The second pressing block 212 and the third pressing block 213 may be connected to each driving mechanism 320 , and the first pressing block 211 may also be directly connected to the platform 310 without being connected to the driving mechanism 320 .

因此,隨著平台310沿直立方向移動,第一按壓塊211也沿直立方向移動,同時,作為各個驅動機構320的第二按壓塊212也沿直立方向移動。並且第三按壓塊213也沿直立方向移動。亦即,多數個按壓構件210可以藉由平台310的移動,而整體地移動。另外,隨著多數個按壓構件210一體地移動,頭部單元100和按壓單元200可以在直立方向作一體性的移動。即,平台310可以使頭部單元100和按壓單元200在直立方向上整體地移動。 Therefore, as the platform 310 moves in the upright direction, the first pressing blocks 211 also move in the upright direction, and at the same time, the second pressing blocks 212 serving as the respective driving mechanisms 320 also move in the upright direction. And the third pressing block 213 also moves in the upright direction. That is, the plurality of pressing members 210 can be moved as a whole by the movement of the platform 310 . In addition, as the plurality of pressing members 210 move integrally, the head unit 100 and the pressing unit 200 may integrally move in the upright direction. That is, the platform 310 may integrally move the head unit 100 and the pressing unit 200 in the upright direction.

另外,第二按壓塊212和第三按壓塊213可以藉由與其連接的每個驅動機構320的移動,而沿著直立方向獨立地移動。 In addition, the second pressing block 212 and the third pressing block 213 can be independently moved in the upright direction by the movement of each driving mechanism 320 connected thereto.

在一個具體實施例中,多數個按壓構件210係呈同心配置,並且是具有向上變窄之形狀的多數個塊狀體,並且,平台310是多數個按壓構件210中的最裡面的按壓構件(例如,其可以直接連接到第一按壓塊211)。 In a specific embodiment, the plurality of pressing members 210 are concentrically arranged and are a plurality of blocks having a shape that narrows upward, and the platform 310 is the innermost pressing member ( For example, it can be directly connected to the first pressing block 211).

此外,驅動機構320可在直立方向上獨立移動最裡面的按壓構件以外的其餘按壓構件(例如,第二按壓塊212與第三按壓塊213)。 In addition, the driving mechanism 320 can independently move the remaining pressing members (eg, the second pressing block 212 and the third pressing block 213 ) except the innermost pressing member in the upright direction.

然而,平台310、多數個按壓構件210和驅動機 構320之間的佈置關係不限於此。例如,平台310可以直接連接到多數個按壓構件210中之最外側按壓構件。另外,驅動機構320可獨立於最外按壓構件,而在直立方向移動其餘的按壓構件(例如,第一按壓塊211和第二按壓塊212)。 However, the platform 310, the plurality of pressing members 210 and the driving machine The arrangement relationship between the structures 320 is not limited to this. For example, the platform 310 may be directly connected to the outermost pressing member of the plurality of pressing members 210 . In addition, the driving mechanism 320 may move the remaining pressing members (eg, the first pressing block 211 and the second pressing block 212 ) in the upright direction independently of the outermost pressing member.

因此,根據本發明實施例的晶粒分離裝置10,可使得多數個接觸構件140和多數個按壓構件210作整體性的升高,以形成貼合片S和多數個接觸構件140。藉由接觸多數個按壓構件210的整體,並使其一部分升高或降低,以改變貼合片S和多數個接觸構件140的接觸狀態,從而將晶粒D從貼合片S上移除,而可以將其分離。 Therefore, according to the die separation device 10 of the embodiment of the present invention, the plurality of contact members 140 and the plurality of pressing members 210 can be raised integrally to form the bonding sheet S and the plurality of contact members 140 . By contacting the whole of the plurality of pressing members 210 and raising or lowering a part thereof, the contact state between the bonding sheet S and the plurality of contact members 140 is changed, thereby removing the die D from the bonding sheet S, instead it can be separated.

儘管未在圖中示出,但是晶粒分離裝置10可以包括一驅動控制單元(未示出)。驅動控制單元可以根據預設程序或用戶的操作來控制驅動單元300,更具體地說,控制平台310和驅動機構320。 Although not shown in the drawings, the die separation apparatus 10 may include a drive control unit (not shown). The driving control unit may control the driving unit 300, more specifically, the platform 310 and the driving mechanism 320, according to a preset program or a user's operation.

第14圖示出了根據本發明另一實施例的晶粒分離方法。 FIG. 14 shows a method for separating grains according to another embodiment of the present invention.

參照第14圖,根據本發明另一實施例的晶粒分離方法,藉由具有包括多數個接觸構件140的晶粒分離裝置10,按壓貼合片S,從而形成一貼合片S作為一用以分離設置在貼合片S上的晶粒D,如此,可能首先將多數個接觸部件140對準相同的高度。 Referring to FIG. 14, according to another embodiment of the die separation method of the present invention, a die separation device 10 including a plurality of contact members 140 is used to press the bonding sheet S, thereby forming a bonding sheet S for a purpose In order to separate the dies D disposed on the bonding sheet S, it is possible to first align a plurality of contact members 140 to the same height.

更具體地說,如第15a圖所示,第一接觸塊 141,第二接觸塊142和第三接觸塊143均位於相同的高度L1處。在這種狀態下,接觸構件140不與貼合片S接觸。 More specifically, as shown in Figure 15a, the first contact block 141, the second contact block 142 and the third contact block 143 are all located at the same height L1. In this state, the contact member 140 is not in contact with the bonding sheet S.

接下來,將對齊的多數個接觸構件140一體地升高,以與貼合片S接觸。 Next, the aligned plurality of contact members 140 are raised integrally to come into contact with the fitting sheet S. As shown in FIG.

更具體地說,如第15b圖所示,在相同高度L1上對準的第一接觸塊141,第二接觸塊142和第三接觸塊143整體地升高,它位於相同的高度L2。因此,所有接觸構件140保持與貼合片S接觸。 More specifically, as shown in FIG. 15b, the first contact block 141, the second contact block 142 and the third contact block 143, which are aligned at the same height L1, are raised integrally, which are located at the same height L2. Therefore, all the contact members 140 are kept in contact with the bonding sheet S.

接下來,升高或降低多數個接觸構件140的一部分以改變貼合片S與多數個接觸構件140之間的接觸狀態。在一實施例中,多數個同心配置和對準的接觸構件140中的至少一個接觸構件140,可以被選擇性地升高或降低,以改變接觸構件140的接觸狀態。 Next, a part of the plurality of contact members 140 is raised or lowered to change the contact state between the fitting sheet S and the plurality of contact members 140 . In one embodiment, at least one contact member 140 of the plurality of concentrically configured and aligned contact members 140 can be selectively raised or lowered to change the contact state of the contact member 140 .

更具體地說,如第15c圖所示,可以藉由使用驅動機構320來降低第三接觸塊143,進而來降低第三按壓塊213。因此,如第15c圖所示,由接觸構件140支撐的貼合片S的面積可獲得減小。 More specifically, as shown in FIG. 15c, the third contact block 143 can be lowered by using the driving mechanism 320, and then the third pressing block 213 can be lowered. Therefore, as shown in Fig. 15c, the area of the bonding sheet S supported by the contact member 140 can be reduced.

接下來,如第15d圖所示,可以藉由使用驅動機構320來降低第二接觸塊142,進而降低第二按壓塊212。因此,如第15d圖所示,由接觸構件140所支撐的貼合片S的面積進一步可獲得減小。因此,隨著貼合片S和接觸構件140的接觸狀態改變(接觸面積減小),可以將晶粒D從貼 合片S上分離。 Next, as shown in FIG. 15d , the second contact block 142 can be lowered by using the driving mechanism 320 , thereby lowering the second pressing block 212 . Therefore, as shown in Fig. 15d, the area of the bonding sheet S supported by the contact member 140 can be further reduced. Therefore, as the contact state of the bonding sheet S and the contact member 140 changes (the contact area decreases), the die D can be removed from the bonding Separation on the sheet S.

第15a圖至第15d圖顯示了降低接觸構件140的情況,但並不限於此種情形。 FIGS. 15a to 15d show the case where the contact member 140 is lowered, but it is not limited to this case.

例如,第一接觸塊141,第二接觸塊142和第三接觸塊143均位於與第15a圖(第16a圖)相同的高度L1處。 For example, the first contact block 141, the second contact block 142 and the third contact block 143 are all located at the same height L1 as in Fig. 15a (Fig. 16a).

接著,如第15b圖所示,將第一接觸塊141、第二接觸塊142和第三接觸塊143整體地升高,並且都定位在相同的高度L2處(同第16b圖)。 Next, as shown in Fig. 15b, the first contact block 141, the second contact block 142 and the third contact block 143 are raised integrally and all positioned at the same height L2 (same as Fig. 16b).

接著,可以使用驅動機構320來升高第二按壓塊212,進而升高第二接觸塊142。因此,如第16c圖所示,減小了由接觸構件140支撐的貼合片S的面積。並且,由於貼合片S僅由第二接觸塊142支撐,因此剩餘部分向下彎曲,從而可以從貼合片S上分離晶粒D。 Next, the driving mechanism 320 may be used to raise the second pressing block 212 , thereby raising the second contact block 142 . Therefore, as shown in Fig. 16c, the area of the bonding sheet S supported by the contact member 140 is reduced. Also, since the bonding sheet S is only supported by the second contact block 142, the remaining portion is bent downward, so that the die D can be separated from the bonding sheet S.

繼續,可以藉由使用驅動機構320來升高第三按壓塊213,進而升高第三接觸塊143。結果,如第16d圖所示,改變了接觸構件140與貼合片S之間的接觸狀態。另外,由於貼合片S僅由第三接觸塊143支撐,因此剩餘部分向下彎曲,從而可以更容易地從貼合片S上分離晶粒D。 Continuing, the third pressing block 213 may be raised by using the driving mechanism 320 , thereby raising the third contact block 143 . As a result, as shown in Fig. 16d, the contact state between the contact member 140 and the bonding sheet S is changed. In addition, since the bonding sheet S is only supported by the third contact block 143, the remaining portion is bent downward, so that the die D can be separated from the bonding sheet S more easily.

如上所述,本發明藉由一體地升高多數個接觸構件140以接觸貼合片S來升高或降低與貼合片S接觸的多數個接觸構件140中的一部份。藉由改變構件140的接觸 狀態,可以容易地將晶粒D從貼合片S上分離。 As described above, the present invention raises or lowers a part of the plurality of contact members 140 in contact with the adhesive sheet S by integrally raising the plurality of contact members 140 to contact the adhesive sheet S. By changing the contact of member 140 state, the die D can be easily separated from the bonding sheet S.

特別地,根據本發明,多數個接觸構件140係一體地升高,以接觸貼合片S,使得每個接觸構件140可以相對於貼合片S定位在相同的高度處。因此,可以藉由最小化在裝置的操作期間產生的接觸構件140之間的高度差,來從貼合片S精確地分離晶粒D。 In particular, according to the present invention, the plurality of contact members 140 are integrally elevated to contact the fitting sheet S, so that each contact member 140 can be positioned at the same height relative to the fitting sheet S. FIG. Therefore, the die D can be accurately separated from the bonding sheet S by minimizing the height difference between the contact members 140 generated during the operation of the device.

另外,根據本發明,接觸構件140和按壓構件210具有向上變窄的形狀,從而平穩地傳遞動力,並且使裝置的空間效率最大化。 In addition, according to the present invention, the contact member 140 and the pressing member 210 have upwardly narrowed shapes, thereby smoothly transmitting power and maximizing the space efficiency of the device.

在本說明書中,主要以有限的實施方式描述本發明,但是在本發明的範圍內各種實施方式是可能的。另外,儘管在本說明書中沒有明確描述,但是示例和等效裝置也被併入本發明中。因此,本發明的真正保護範圍應該由所附權利要求書限定。 In this specification, the present invention is mainly described in a limited embodiment, but various embodiments are possible within the scope of the present invention. Additionally, although not explicitly described in this specification, example and equivalent arrangements are also incorporated into the present invention. Accordingly, the true scope of the present invention should be defined by the appended claims.

100:頭部單元 100: Head unit

200:按壓單元 200: Press unit

300:驅動單元 300: Drive unit

Claims (11)

一種從下方按壓貼合片以從貼合片分離設置在貼合片上的晶粒之晶粒分離裝置,其具有一晶粒分離設施,包括: A die separation device for pressing a lamination sheet from below to separate the die set on the lamination sheet from the lamination sheet, which has a die separation facility, comprising: 一頭部單元,包括多數個與貼合片接觸的接觸構件; a head unit, including a plurality of contact members in contact with the lamination sheet; 一按壓單元,包括多數個按壓構件,其用以使多數個抵接部件沿直立方向移動; a pressing unit, including a plurality of pressing members, which are used to move a plurality of abutting parts in a vertical direction; 一驅動單元,用於在直立方向上移動該多數個按壓構件; a drive unit for moving the plurality of pressing members in the upright direction; 一驅動控制單元,用於控制一平台和驅動單元; a drive control unit for controlling a platform and the drive unit; 一驅動單元載物平台,其在直立方向上一體性地移動多數個按壓部件;以及 a drive unit stage that integrally moves the plurality of pressing members in an upright direction; and 又一驅動單元,其設置在平台上,並且使多數個按壓構件中的至少一個在直立方向上獨立地移動。 Yet another driving unit, which is provided on the platform and independently moves at least one of the plurality of pressing members in the upright direction. 如申請專利範圍第1項之晶粒分離裝置,其中按壓構件與對應於接觸構件的每個構件連接,用以使接觸構件能夠在直立方向上移動。 The die separating device of claim 1, wherein the pressing member is connected to each member corresponding to the contact member, so that the contact member can move in the upright direction. 如申請專利範圍第1項之晶粒分離裝置,其中所含驅動單元包括具有傾斜部的構件,該傾斜部設置在平台上,以在垂直於直立方向的方向上移動,多數個按壓構件中 的至少一個,可根據具有傾斜部之構件的移動,而獨立地在上下方向移動。 The die separation device of claim 1, wherein the drive unit includes a member having an inclined portion, the inclined portion is arranged on the platform to move in a direction perpendicular to the upright direction, and among the plurality of pressing members At least one of them can be independently moved in the up-down direction according to the movement of the member having the inclined portion. 如申請專利範圍第1項之晶粒分離裝置,其中所含多數個按壓構件為三個以上,驅動機構的數量少於按壓構件、脫模裝置的數量。 According to the die separation device of claim 1 of the scope of application, the plurality of pressing members is three or more, and the number of driving mechanisms is less than the number of pressing members and demolding devices. 如申請專利範圍第3項之晶粒分離裝置,其中所含驅動單元設置在具有傾斜部的構件之一側,並且,相對於具有傾斜部的構件具有至少一個引導件。 The die separation device according to claim 3, wherein the drive unit is disposed on one side of the member having the inclined portion, and has at least one guide relative to the member having the inclined portion. 如申請專利範圍第4項之晶粒分離裝置,其中所述平台直接連接到多數個按壓構件中的最裡面的按壓構件,驅動單元脫模裝置設置在平台上,並且,除了最裡面的按壓構件之外的按壓構件在直立方向上獨立地移動。 The die separating device of claim 4, wherein the platform is directly connected to the innermost pressing member among the plurality of pressing members, the driving unit demolding device is provided on the platform, and, except for the innermost pressing member The other pressing members move independently in the upright direction. 如申請專利範圍第1項之晶粒分離裝置,其中所述驅動單元中所含模頭分離裝置為一種使頭部單元和按壓單元在直立方向整體移動者。 According to the die separation device of claim 1 of the claimed scope, wherein the die separation device included in the driving unit is a device that makes the head unit and the pressing unit move integrally in the vertical direction. 一種晶粒分離裝置,其藉由改變多數個接觸部件的接觸狀態而從貼合片分離晶粒,作為用以從下方按壓貼合片以從貼合片分離設置在貼合片上之晶粒的晶粒分離裝置,其包括: A die separation device that separates dies from a lamination sheet by changing the contact state of a plurality of contact members, as a means for pressing the lamination sheet from below to separate the die arranged on the lamination sheet from the lamination sheet A grain separation device, which includes: 一頭部單元,其包括與貼合片接觸的多數個接觸構件; a head unit, which includes a plurality of contact members in contact with the lamination sheet; 一按壓單元,其包括多數個按壓構件,該按壓構件用以在直立方向上移動多數個接觸構件,並且在直立方向上移動多數個按壓構件;以及 a pressing unit including a plurality of pressing members for moving the plurality of contact members in the upright direction and moving the plurality of pressing members in the upright direction; and 驅動單元,其整體地升高多數個接觸構件和多數個按壓構件以整體地使貼合片和多數個接觸構件接觸,並且升高或降低多數個按壓構件中的至少一個以形成貼合片。 A driving unit that integrally raises the plurality of contact members and the plurality of pressing members to integrally bring the fitting sheet into contact with the plurality of contact members, and raises or lowers at least one of the plurality of pressing members to form the fitting sheet. 一種使用晶粒分離裝置之晶粒分離方法,其係將多數個接觸構件對準到相同的高度;整體地升高多數個對準的接觸構件,以接觸貼合片;並且藉由升高或降低多數個接觸構件的一部分,來改變貼合片與多數個接觸構件之間的接觸狀態,以利用具有多數個接觸構件對貼合片進行按壓,而從貼合片分離設置在貼合片上的晶粒者。 A die separation method using a die separation device, which is to align a plurality of contact members to the same height; raise a plurality of aligned contact members as a whole to contact a bonding sheet; and by raising or A part of the plurality of contact members is lowered to change the contact state between the lamination sheet and the plurality of contact members, so that the lamination sheet is pressed by the plurality of contact members, and the sheet provided on the lamination sheet is separated from the lamination sheet. Grainer. 如申請專利範圍第9項之晶粒分離方法,其為藉由更改接觸狀態的步驟之一種晶粒分離的方法,其中,多數個同心佈置和對準的接觸構件中的至少一個,乃被選擇性地升高或降低。 The die separation method of claim 9, which is a method of die separation by the step of changing the contact state, wherein at least one of a plurality of concentrically arranged and aligned contact members is selected increase or decrease sexually. 如申請專利範圍第9項之晶粒分離方法,其中所述分離裝置包含: The method for separating crystal grains as claimed in item 9 of the patent application scope, wherein the separating device comprises: 一頭部單元,包括多數個接觸構件,其從下方按壓貼合片; a head unit, including a plurality of contact members, which press the fitting sheet from below; 一按壓單元,包括多數個按壓構件,所述按壓構件用以在直立方向上移動所述多數個接觸構件,以按壓所述貼合片,並包含用以在直立方向上移動多數個按壓構件的驅動單元; a pressing unit including a plurality of pressing members for moving the plurality of contact members in the upright direction to press the fitting sheet, and comprising a plurality of pressing members for moving the plurality of pressing members in the upright direction Drive unit; 一驅動單元平台,其在直立方向一體地移動多數個按壓構件; a drive unit platform that integrally moves the plurality of pressing members in the upright direction; 一驅動單元,該驅動單元與平台一體地移動,並且使多數個按壓構件中的至少一個在直立方向獨立地移動;而其並包括 a drive unit that moves integrally with the platform and moves at least one of the plurality of pressing members independently in the upright direction; and includes 接觸貼合片之步驟,藉由抬高平台,使多數個接觸構件的所有上表面與貼合片接觸; In the step of contacting the lamination sheet, by raising the platform, all the upper surfaces of the plurality of contact members are brought into contact with the lamination sheet; 更改接觸狀態的步驟,其中藉由升高或降低驅動單元,使多數個接觸構件中的至少一個與貼合片隔開。 The step of changing the contact state, wherein at least one of the plurality of contact members is separated from the lamination sheet by raising or lowering the drive unit.
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