TW202132784A - 筒狀體、接觸端子、檢查治具以及檢查裝置 - Google Patents

筒狀體、接觸端子、檢查治具以及檢查裝置 Download PDF

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Publication number
TW202132784A
TW202132784A TW110106595A TW110106595A TW202132784A TW 202132784 A TW202132784 A TW 202132784A TW 110106595 A TW110106595 A TW 110106595A TW 110106595 A TW110106595 A TW 110106595A TW 202132784 A TW202132784 A TW 202132784A
Authority
TW
Taiwan
Prior art keywords
spring portion
coil spring
cylindrical body
turns
inspection
Prior art date
Application number
TW110106595A
Other languages
English (en)
Chinese (zh)
Inventor
太田憲宏
Original Assignee
日商日本電產理德股份有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 日商日本電產理德股份有限公司 filed Critical 日商日本電產理德股份有限公司
Publication of TW202132784A publication Critical patent/TW202132784A/zh

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716—Elastic
    • G01R1/06722—Spring-loaded
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0491—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets for testing integrated circuits on wafers, e.g. wafer-level test cartridge
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06733—Geometry aspects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
    • G01R31/2831—Testing of materials or semi-finished products, e.g. semiconductor wafers or substrates
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
    • G01R31/2863—Contacting devices, e.g. sockets, burn-in boards or mounting fixtures

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Geometry (AREA)
  • Environmental & Geological Engineering (AREA)
  • Measuring Leads Or Probes (AREA)
TW110106595A 2020-02-26 2021-02-25 筒狀體、接觸端子、檢查治具以及檢查裝置 TW202132784A (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2020031050 2020-02-26
JP2020-031050 2020-02-26

Publications (1)

Publication Number Publication Date
TW202132784A true TW202132784A (zh) 2021-09-01

Family

ID=77491485

Family Applications (1)

Application Number Title Priority Date Filing Date
TW110106595A TW202132784A (zh) 2020-02-26 2021-02-25 筒狀體、接觸端子、檢查治具以及檢查裝置

Country Status (7)

Country Link
US (1) US20230349946A1 (https=)
EP (1) EP4113127A4 (https=)
JP (1) JPWO2021172061A1 (https=)
KR (1) KR20220149908A (https=)
CN (1) CN115210581A (https=)
TW (1) TW202132784A (https=)
WO (1) WO2021172061A1 (https=)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
IT202300008088A1 (it) * 2023-04-26 2024-10-26 Technoprobe Spa Testa di misura con sonde di contatto perfezionate

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100745104B1 (ko) * 2000-06-16 2007-08-01 니혼 하츠쵸 가부시키가이샤 컨택터 프로브, 전기 프로브 유닛, 컨택터 프로브를 위한 프로브 어셈블리와 절연체의 조합체 및 컨택터 프로브를 위한 탄성의 도전성 프로브 어셈블리
JP2003185677A (ja) * 2001-12-20 2003-07-03 Mitsui Mining & Smelting Co Ltd 電気検査用プローブカード
US7598757B2 (en) * 2005-12-06 2009-10-06 Unitechno Inc. Double ended contact probe
JP2010060527A (ja) * 2008-09-05 2010-03-18 Yokowo Co Ltd グランド用コンタクトプローブを有する検査ユニット
WO2010140184A1 (ja) * 2009-06-01 2010-12-09 有限会社電材マート プローブ及びプローブ装置
CN203148988U (zh) * 2013-01-29 2013-08-21 中国探针股份有限公司 电子元件测试装置的偏心弹簧
JP6411169B2 (ja) * 2014-10-22 2018-10-24 株式会社日本マイクロニクス 電気的接触子及び電気的接続装置
JP2017054773A (ja) * 2015-09-11 2017-03-16 日本電産リード株式会社 接続治具、基板検査装置、及び接続治具の製造方法
JP6890921B2 (ja) * 2015-10-21 2021-06-18 株式会社日本マイクロニクス プローブカード及び接触検査装置
JP2017142080A (ja) * 2016-02-08 2017-08-17 日本電産リード株式会社 接触端子、検査治具、及び検査装置
JP2017162600A (ja) * 2016-03-08 2017-09-14 アルプス電気株式会社 スプリングコンタクト
JP2018009789A (ja) * 2016-07-11 2018-01-18 アルプス電気株式会社 スプリングコンタクトと、スプリングコンタクトを使用したソケット、およびスプリングコンタクトの製造方法
JP6892277B2 (ja) * 2017-02-10 2021-06-23 株式会社日本マイクロニクス プローブ及び電気的接続装置
KR101860923B1 (ko) * 2017-05-30 2018-05-24 황동원 반도체 디바이스 테스트용 콘택트 및 테스트 소켓장치
JP7098886B2 (ja) 2017-07-04 2022-07-12 日本電産リード株式会社 接触端子、検査治具、及び検査装置
JP2019039754A (ja) * 2017-08-24 2019-03-14 株式会社日本マイクロニクス プローブ
JP2021056158A (ja) * 2019-10-01 2021-04-08 株式会社日本マイクロニクス 電気的接触子、電気的接続構造及び電気的接続装置

Also Published As

Publication number Publication date
JPWO2021172061A1 (https=) 2021-09-02
KR20220149908A (ko) 2022-11-09
US20230349946A1 (en) 2023-11-02
EP4113127A1 (en) 2023-01-04
EP4113127A4 (en) 2024-03-27
CN115210581A (zh) 2022-10-18
WO2021172061A1 (ja) 2021-09-02

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