TW202111857A - Wafer transmission manipulator and wafer overturning method thereof - Google Patents

Wafer transmission manipulator and wafer overturning method thereof Download PDF

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TW202111857A
TW202111857A TW108142780A TW108142780A TW202111857A TW 202111857 A TW202111857 A TW 202111857A TW 108142780 A TW108142780 A TW 108142780A TW 108142780 A TW108142780 A TW 108142780A TW 202111857 A TW202111857 A TW 202111857A
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wafer
drying unit
clamping arm
jaw
drives
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TWI773943B (en
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沈凌寒
楊思遠
臧志城
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大陸商杭州眾硅電子科技有限公司
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/677Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
    • H01L21/67763Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading
    • H01L21/67766Mechanical parts of transfer devices
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/677Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
    • H01L21/67703Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations between different workstations
    • H01L21/67718Changing orientation of the substrate, e.g. from a horizontal position to a vertical position
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/683Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L21/687Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
    • H01L21/68714Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
    • H01L21/68721Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by edge clamping, e.g. clamping ring

Abstract

The invention discloses a wafer transmission manipulator and a wafer overturning method thereof. The wafer transmission manipulator comprises a transverse transmission shaft which is only located at one side of a cleaning unit; a transverse transmission carriage which is arranged on the transverse transmission shaft and can make transverse movement along the transverse transmission shaft; a firstvertical lifting shaft which is arranged on the transverse transmission carriage and can perform vertical movement on the transverse transmission carriage; a rotating table which is arranged on the first vertical lifting shaft; and a first claw clamping arm which is connected with the rotating table and is driven by the rotating table to perform rotating movement. Free conversion of the wafer in horizontal and vertical states can be met; and the transverse transmission carriage does not run directly above the drying unit so as to eliminate the possibility of scattering impurity particles on the moving parts of the wafer transmission manipulator onto the wafer during the drying process.

Description

晶圓傳輸機械手及其晶圓翻轉方法Wafer transfer manipulator and its wafer turning method

本發明涉及半導體積體電路晶片製造的設備領域,具體涉及一種晶圓傳輸機械手及其晶圓翻轉方法。The invention relates to the field of equipment for manufacturing semiconductor integrated circuit wafers, in particular to a wafer transfer manipulator and a wafer turning method thereof.

隨著半導體產業的迅速發展,積體電路特徵尺寸不斷趨於微細化,半導體晶片不斷地朝小體積、高電路密集度、快速、低耗電方向發展,積體電路現已進入超大型積體電路(Ultra-Large-scale integration,ULSI)亞微米級的技術階段。伴隨著矽晶片直徑的逐漸增大,元件內刻線寬度逐步縮小,金屬層數的增多,因此半導體薄膜表面的高平坦化對器件的高性能、低成本、高成品率有著重要的影響,這導致對矽晶片表面的平整度要求將日趨嚴格。With the rapid development of the semiconductor industry, the feature size of integrated circuits continues to be miniaturized, and semiconductor chips continue to develop in the direction of small size, high circuit density, fast speed, and low power consumption. Integrated circuits have now entered the ultra-large integrated circuit. Circuit (Ultra-Large-scale integration, ULSI) sub-micron technology stage. With the gradual increase in the diameter of silicon wafers, the width of the scribed lines in the device has gradually decreased, and the number of metal layers has increased. Therefore, the high planarization of the semiconductor film surface has an important impact on the high performance, low cost, and high yield of the device. As a result, the flatness requirements on the surface of silicon wafers will become increasingly strict.

目前,作為唯一能獲得全域平面化效果的平整化技術化學機械拋光技術,化學機械平坦化(Chemical Mechanical Planarization,CMP)已經發展成集線上量測、線上終點檢測、清洗等技術於一體的化學機械拋光技術,是積體電路向微細化、多層化、薄型化、平坦化製程發展的產物。在晶圓進行CMP加工後,會在晶圓表面殘留加工的移除物和拋光液,為了及時去除晶圓表面的污染物,CMP設備需要搭配清洗設備使用。在乾燥晶圓的製程中,一個基本要求就是使晶圓乾燥,並且杜絕原來附著在溶液中的任何顆粒重新附著至晶圓的可能。At present, as the only planarization technology chemical mechanical polishing technology that can obtain a global planarization effect, chemical mechanical planarization (Chemical Mechanical Planarization, CMP) has been developed into a chemical mechanical integration of online measurement, online endpoint detection, cleaning and other technologies. Polishing technology is the product of the development of integrated circuits to miniaturization, multilayer, thinning, and flattening processes. After the wafer is processed by CMP, the processed removal and polishing liquid will remain on the surface of the wafer. In order to remove the contaminants on the wafer surface in time, the CMP equipment needs to be used with cleaning equipment. In the process of drying the wafer, a basic requirement is to dry the wafer and prevent any particles originally attached to the solution from reattaching to the wafer.

為了使整個清洗模組達到較好的清洗效果,可以採用乾燥單元是水平放置而其他幾個清洗單元均是垂直放置的配置。在此種配置下,為了使晶圓從垂直狀態轉換成水平狀態,晶圓傳輸機械手需提供翻轉功能以配合完成這一工作。習知的清洗機械手中,一些是卡爪夾持臂未有旋轉功能,只能有Z軸上下運動的單個自由度,通過晶圓卡爪端實現晶圓的翻轉。但是此種實現方法需將機械手整體移動到乾燥設備上方,卡爪夾持臂才能將已經晶圓卡爪翻轉的晶圓置入乾燥設備中,這種晶圓傳輸機械手整體位於乾燥設備上方的置入過程,較易給最後道乾燥製程引入雜質顆粒,降低晶圓的潔淨度。且晶圓傳輸機械手的橫向行程貫穿整個清洗模組,長行程傳輸對傳輸效率也有一定的影響。In order to achieve a better cleaning effect for the entire cleaning module, a configuration in which the drying unit is placed horizontally and the other cleaning units are placed vertically can be used. In this configuration, in order to convert the wafer from a vertical state to a horizontal state, the wafer transfer manipulator needs to provide a flip function to cooperate to complete this work. In the conventional cleaning robots, some of the claw gripping arms do not have a rotation function, and can only have a single degree of freedom for the up and down movement of the Z axis, and the flip of the wafer is realized through the wafer claw end. However, this implementation method requires the robot to be moved to the top of the drying equipment so that the claw gripper arm can put the wafers that have been turned over by the wafer claws into the drying equipment. In the placement process, it is easier to introduce impurity particles into the final drying process, reducing the cleanliness of the wafer. Moreover, the lateral stroke of the wafer transfer manipulator runs through the entire cleaning module, and the long-stroke transfer also has a certain impact on the transfer efficiency.

本發明的目的是提供一種晶圓傳輸機械手及其晶圓翻轉方法,以通過實現晶圓在水平和垂直兩種狀態的轉換來滿足化學機械平坦化的製程要求,並排除在乾燥製程中將晶圓傳輸機械手運動部件上的雜質顆粒散落到晶圓上的可能性。The purpose of the present invention is to provide a wafer transfer manipulator and a wafer turning method thereof to meet the process requirements of chemical mechanical planarization by realizing the conversion of the wafer in the horizontal and vertical states, and eliminate the need for the chemical mechanical planarization process during the drying process. Possibility of impurity particles on the moving parts of the wafer transfer robot scattered on the wafer.

為達到上述目的,本發明提供了一種晶圓傳輸機械手,用於化學機械平坦化設備的清洗模組中的晶圓傳輸,以將晶圓以垂直狀態在清洗模組的清洗單元中完成清洗後取出,再通過翻轉後以水平狀態置入清洗模組的乾燥單元,其包括: 橫向傳輸軸,僅位於所述清洗單元的一側; 橫向傳輸拖板,設置在所述橫向傳輸軸上,並能夠沿所述橫向傳輸軸做橫向運動; 第一垂直升降軸,設置在所述橫向傳輸拖板上,並能夠在所述橫向傳輸拖板上做垂直運動; 旋轉台,設置在所述第一垂直升降軸上; 第一卡爪夾持臂,與所述旋轉台相連,並由所述旋轉台驅動做旋轉運動,用於對晶圓進行取放。In order to achieve the above objective, the present invention provides a wafer transfer manipulator, which is used for wafer transfer in the cleaning module of a chemical mechanical planarization device to complete the cleaning of the wafer in the cleaning unit of the cleaning module in a vertical state. It is then taken out, and then placed in the drying unit of the cleaning module in a horizontal state after being turned over, which includes: The transverse transmission shaft is located only on one side of the cleaning unit; The horizontal transmission carriage is arranged on the horizontal transmission shaft and can move laterally along the horizontal transmission shaft; The first vertical lifting shaft is arranged on the lateral transmission pallet, and can perform vertical movement on the lateral transmission pallet; The rotating table is arranged on the first vertical lifting shaft; The first jaw clamping arm is connected with the rotating table and is driven by the rotating table to make a rotation movement for picking and placing wafers.

上述的晶圓傳輸機械手,其中,所述清洗單元和所述乾燥單元安裝有可開關的門,用於所述晶圓傳輸機械手對晶圓進行取放時的自動打開或關閉。In the above-mentioned wafer transfer robot, a switchable door is installed on the cleaning unit and the drying unit for automatic opening or closing when the wafer transfer robot picks and places wafers.

上述的晶圓傳輸機械手,其中,所述清洗單元包括:乾燥前單元和清洗模組其他單元;所述乾燥單元和清洗模組其他單元位於所述乾燥前單元的兩側;所述乾燥前單元採用垂直方向作業;所述乾燥前單元內的晶圓由所述第一卡爪夾持臂傳輸至所述乾燥單元;所述清洗模組其他單元為晶圓過渡單元、兆聲清洗單元、刷洗單元中的一個或多個。In the above wafer transfer robot, the cleaning unit includes: a pre-drying unit and other units of the cleaning module; the drying unit and other units of the cleaning module are located on both sides of the pre-drying unit; The unit operates in a vertical direction; the wafers in the pre-drying unit are transferred to the drying unit by the first jaw clamping arm; and the other units of the cleaning module are wafer transition units, megasonic cleaning units, One or more of the scrubbing units.

上述的晶圓傳輸機械手,其中,所述晶圓傳輸機械手還包括:至少一個第二垂直升降軸,設置在所述橫向傳輸拖板上,並能夠在所述橫向傳輸拖板上做垂直運動;所述第一垂直升降軸位於所述第二垂直升降軸和所述乾燥單元之間;每個所述第二垂直升降軸上還設置有第二卡爪夾持臂,用於與第一卡爪夾持臂配合進行清洗模組其他單元到乾燥前單元之間的晶圓傳送。In the above-mentioned wafer transfer manipulator, the wafer transfer manipulator further includes: at least one second vertical lifting shaft, which is arranged on the lateral transfer carriage and can be used for vertical movement on the lateral transfer carriage. Movement; the first vertical lifting shaft is located between the second vertical lifting shaft and the drying unit; each of the second vertical lifting shaft is also provided with a second jaw gripping arm, used to and the first A jaw clamping arm cooperates with the wafer transfer from other units of the cleaning module to the pre-drying unit.

本發明還提供了一種上述晶圓傳輸機械手的晶圓翻轉方法,該方法包括晶圓置入步驟和機械手返回步驟; 所述晶圓置入步驟包括:所述第一卡爪夾持臂從所述清洗單元的乾燥前單元中取出晶圓後,通過橫向、垂直、旋轉三個運動方向的聯動或非聯動動作實現晶圓從垂直狀態翻轉為水平狀態,並將晶圓置入乾燥單元; 所述機械手返回步驟包括:第一卡爪夾持臂將晶圓放置於所述乾燥單元後,通過橫向、垂直、旋轉三個運動方向的聯動或非聯動動作由水平狀態恢復為垂直狀態,並返回原位置。The present invention also provides a wafer turning method of the above-mentioned wafer transfer manipulator, which includes a wafer placement step and a manipulator returning step; The wafer placement step includes: after the first jaw clamping arm takes out the wafer from the pre-drying unit of the cleaning unit, it is realized by linkage or non-linkage action in the three movement directions of horizontal, vertical, and rotation The wafer is turned from the vertical state to the horizontal state, and the wafer is placed in the drying unit; The manipulator returning step includes: after the first jaw clamping arm places the wafer in the drying unit, the horizontal state is restored to the vertical state through linkage or non-linkage actions in the three movement directions of horizontal, vertical, and rotation, And return to the original position.

上述的晶圓傳輸機械手的晶圓翻轉方法,其中,所述晶圓置入步驟具體包括: 所述第一卡爪夾持臂從所述乾燥前單元中取出晶圓後,同時進行以下三個方向上的運動:橫向傳輸拖板帶動第一卡爪夾持臂向遠離所述乾燥單元的方向做橫向運動,旋轉台帶動第一卡爪夾持臂向靠近所述乾燥單元一側旋轉至晶圓達到水平狀態,第一垂直升降軸帶動第一卡爪夾持臂垂直運動至一定位置; 隨後橫向傳輸拖板帶動第一卡爪夾持臂向靠近所述乾燥單元的方向橫向運動至晶圓位於乾燥單元的上方;第一垂直升降軸帶動第一卡爪夾持臂垂直向下運動至晶圓位於乾燥單元內部指定機構;第一卡爪夾持臂鬆開晶圓,使晶圓位於乾燥單元內部指定機構上。In the above-mentioned wafer turning method of a wafer transfer robot, the wafer placing step specifically includes: After the first jaw clamping arm takes out the wafer from the pre-drying unit, it moves in the following three directions at the same time: the lateral transport carriage drives the first jaw clamping arm to the direction away from the drying unit The rotating table drives the first jaw holding arm to rotate to the side close to the drying unit until the wafer reaches a horizontal state, and the first vertical lifting shaft drives the first jaw holding arm to move vertically to a certain position; Subsequently, the horizontal transfer carriage drives the first jaw clamping arm to move laterally in the direction close to the drying unit until the wafer is located above the drying unit; the first vertical lifting shaft drives the first jaw clamping arm to move vertically downward to The wafer is located on the designated mechanism inside the drying unit; the first jaw clamping arm releases the wafer so that the wafer is located on the designated mechanism inside the drying unit.

上述的晶圓傳輸機械手的晶圓翻轉方法,其中,所述晶圓置入步驟具體包括:所述第一卡爪夾持臂從所述乾燥前單元中取出晶圓後,橫向傳輸拖板帶動第一卡爪夾持臂向遠離所述乾燥單元的方向做橫向運動;然後旋轉台帶動第一卡爪夾持臂向靠近所述乾燥單元一側旋轉至晶圓達到水平狀態;接著第一垂直升降軸帶動第一卡爪夾持臂垂直運動至一定位置;隨後橫向傳輸拖板帶動第一卡爪夾持臂向靠近所述乾燥單元的方向橫向運動至晶圓位於乾燥單元的上方;第一垂直升降軸帶動第一卡爪夾持臂垂直向下運動至晶圓位於乾燥單元內部指定機構;第一卡爪夾持臂鬆開晶圓,使晶圓位於乾燥單元內部指定機構上。In the above-mentioned wafer inversion method of a wafer transfer robot, the wafer placement step specifically includes: after the first jaw clamping arm takes out the wafer from the pre-drying unit, laterally transfer the carriage Drive the first jaw holding arm to move laterally away from the drying unit; then the rotating table drives the first jaw holding arm to rotate to the side close to the drying unit until the wafer reaches a horizontal state; then the first The vertical lifting shaft drives the first jaw holding arm to move vertically to a certain position; then the lateral transport carriage drives the first jaw holding arm to move laterally towards the drying unit until the wafer is above the drying unit; A vertical lifting shaft drives the first jaw clamping arm to move vertically downward until the wafer is located in the designated mechanism inside the drying unit; the first jaw clamping arm releases the wafer so that the wafer is located on the designated mechanism inside the drying unit.

上述的晶圓傳輸機械手的晶圓翻轉方法,其中,所述晶圓置入步驟具體包括:所述第一卡爪夾持臂從所述乾燥前單元中取出晶圓後,橫向傳輸拖板帶動第一卡爪夾持臂向遠離所述乾燥單元的方向做橫向運動;然後旋轉台帶動第一卡爪夾持臂向靠近所述乾燥單元一側旋轉至晶圓達到水平狀態;隨後橫向傳輸拖板帶動第一卡爪夾持臂向靠近所述乾燥單元的方向橫向運動至晶圓位於乾燥單元的上方;第一垂直升降軸帶動第一卡爪夾持臂垂直向下運動至晶圓位於乾燥單元內部指定機構;第一卡爪夾持臂鬆開晶圓,使晶圓位於乾燥單元內部指定機構上。In the above-mentioned wafer inversion method of a wafer transfer robot, the wafer placement step specifically includes: after the first jaw clamping arm takes out the wafer from the pre-drying unit, laterally transfer the carriage Drive the first jaw holding arm to move laterally away from the drying unit; then the rotating table drives the first jaw holding arm to rotate to the side close to the drying unit until the wafer reaches a horizontal state; then lateral transfer The carriage drives the first jaw clamping arm to move laterally in the direction close to the drying unit until the wafer is located above the drying unit; the first vertical lifting shaft drives the first jaw clamping arm to move vertically downward until the wafer is located The internal designated mechanism of the drying unit; the first jaw clamping arm releases the wafer so that the wafer is located on the internal designated mechanism of the drying unit.

上述的晶圓傳輸機械手的晶圓翻轉方法,其中,所述晶圓置入步驟具體包括:所述第一卡爪夾持臂從所述乾燥前單元中取出晶圓後,旋轉台帶動第一卡爪夾持臂向靠近所述乾燥單元一側旋轉至晶圓達到水平狀態;隨後橫向傳輸拖板帶動第一卡爪夾持臂橫向運動至晶圓位於乾燥單元的上方;第一垂直升降軸帶動第一卡爪夾持臂垂直向下運動至晶圓位於乾燥單元內部指定機構;第一卡爪夾持臂鬆開晶圓,使晶圓位於乾燥單元內部指定機構上。In the above-mentioned wafer turning method of a wafer transfer robot, the wafer placing step specifically includes: after the first jaw clamping arm takes out the wafer from the pre-drying unit, the rotating table drives the first A jaw clamping arm rotates to the side close to the drying unit until the wafer reaches a horizontal state; then the lateral transport carriage drives the first jaw clamping arm to move laterally until the wafer is above the drying unit; the first vertical lift The shaft drives the first jaw clamping arm to move vertically downward until the wafer is located in the designated mechanism inside the drying unit; the first jaw clamping arm releases the wafer, so that the wafer is located on the internal designated mechanism in the drying unit.

上述的晶圓傳輸機械手的晶圓翻轉方法,其中,所述機械手返回步驟具體包括:當晶圓被放置於乾燥單元後,同時進行以下三個方向上的運動:橫向傳輸拖板帶動第一卡爪夾持臂向遠離所述乾燥單元的方向做橫向運動;旋轉台帶動第一卡爪夾持臂向下旋轉至第一卡爪夾持臂呈垂直狀態;第一垂直升降軸帶動第一卡爪夾持臂垂直向上運動至一定位置。In the above-mentioned wafer turning method of the wafer transfer robot, the returning step of the robot specifically includes: when the wafer is placed in the drying unit, it simultaneously moves in the following three directions: the lateral transfer carriage drives the second A claw clamping arm moves laterally away from the drying unit; the rotating table drives the first claw clamping arm to rotate downward until the first claw clamping arm is in a vertical state; the first vertical lifting shaft drives the first claw clamping arm to be vertical. A jaw clamping arm moves vertically upward to a certain position.

上述的晶圓傳輸機械手的晶圓翻轉方法,其中,所述機械手返回步驟具體包括:當晶圓被放置於乾燥單元後,第一垂直升降軸帶動第一卡爪夾持臂垂直向上運動至一定位置;然後橫向傳輸拖板帶動第一卡爪夾持臂向遠離所述乾燥單元的方向橫向運動至一定位置;接著旋轉台帶動第一卡爪夾持臂向下旋轉至第一卡爪夾持臂呈垂直狀態。In the above-mentioned wafer turning method of a wafer transfer robot, the robot returning step specifically includes: when the wafer is placed in the drying unit, the first vertical lifting shaft drives the first jaw clamping arm to move vertically upwards To a certain position; then the horizontal transmission carriage drives the first jaw clamping arm to move laterally away from the drying unit to a certain position; then the rotating table drives the first jaw clamping arm to rotate down to the first jaw The clamping arm is in a vertical state.

上述的晶圓傳輸機械手的晶圓翻轉方法,其中,所述機械手返回步驟具體包括:當晶圓被放置於乾燥單元後,橫向傳輸拖板帶動第一卡爪夾持臂向遠離所述乾燥單元的方向橫向運動至一定位置;然後第一垂直升降軸帶動第一卡爪夾持臂垂直向上運動至一定位置;接著旋轉台帶動第一卡爪夾持臂向下旋轉至第一卡爪夾持臂呈垂直狀態。In the above-mentioned wafer turning method of a wafer transfer robot, the robot returning step specifically includes: when the wafer is placed in the drying unit, the lateral transfer carriage drives the first jaw clamping arm to move away from the The direction of the drying unit moves laterally to a certain position; then the first vertical lifting shaft drives the first jaw holding arm to move vertically upward to a certain position; then the rotating table drives the first jaw holding arm to rotate down to the first jaw The clamping arm is in a vertical state.

相對於習知技術,本發明具有以下有益效果: 1. 本發明所提供的晶圓傳輸機械手設置於化學機械平坦化設備的清洗模組中,可以切實有效滿足晶圓在水平和垂直兩種狀態的轉換,符合實際生產需求,機械手翻轉過程無需增加空間以供翻轉,也不會對其他機構產生干擾,空間利用率高。 2. 本發明中晶圓傳輸機械手使乾燥單元能夠以作用效果最佳為目標來選擇晶圓放置模式(垂直或水平放置),無需為了便於晶圓傳輸而使乾燥單元的晶圓放置模式與清洗模組其餘各單元一致。 3. 由於晶圓傳輸機械手的橫向傳輸軸行程只到乾燥前單元為止,行程緊湊,機械手翻轉後向乾燥單元置入晶圓過程中,橫向傳輸拖板不會運行到乾燥單元一側,從而排除在乾燥製程中將晶圓傳輸機械手運動部件上的雜質顆粒散落到晶圓上的可能性。Compared with the conventional technology, the present invention has the following beneficial effects: 1. The wafer transfer manipulator provided by the present invention is set in the cleaning module of the chemical mechanical planarization equipment, which can effectively meet the conversion of the wafer in the horizontal and vertical states, and meet the actual production requirements. The manipulator flipping process There is no need to increase the space for turning, nor will it interfere with other institutions, and the space utilization is high. 2. The wafer transfer manipulator of the present invention enables the drying unit to select the wafer placement mode (vertical or horizontal placement) with the best effect as the goal, and there is no need to change the wafer placement mode of the drying unit to facilitate wafer transfer. The remaining units of the cleaning module are the same. 3. Since the stroke of the transverse transfer axis of the wafer transfer robot only reaches the unit before drying, the stroke is compact. After the robot is turned over, the transverse transfer carriage will not run to the side of the drying unit during the process of placing the wafer into the drying unit. This eliminates the possibility of scattering the impurity particles on the moving parts of the wafer transfer manipulator on the wafer during the drying process.

以下結合附圖通過具體實施例對本發明作進一步的描述,這些實施例僅用於說明本發明,並不是對本發明保護範圍的限制。The present invention will be further described below through specific embodiments with reference to the accompanying drawings. These embodiments are only used to illustrate the present invention and are not intended to limit the scope of protection of the present invention.

在如圖1所示的較佳實施例中,本發明所提供的晶圓傳輸機械手,用於化學機械平坦化設備的清洗模組中的晶圓8傳輸,以將晶圓8以垂直狀態在清洗模組的清洗單元中完成清洗後取出,再通過翻轉後以水平狀態置入清洗模組的乾燥單元10。在一些較佳的實施例中,所述清洗單元和所述乾燥單元10安裝有可開關的氣動門,用於所述晶圓傳輸機械手對晶圓8進行取放時的自動打開或關閉。In the preferred embodiment shown in FIG. 1, the wafer transfer robot provided by the present invention is used to transfer the wafer 8 in the cleaning module of the chemical mechanical planarization equipment to transfer the wafer 8 in a vertical state. After the cleaning is completed in the cleaning unit of the cleaning module, it is taken out, and then placed in the drying unit 10 of the cleaning module in a horizontal state after being turned over. In some preferred embodiments, the cleaning unit and the drying unit 10 are equipped with a switchable pneumatic door for automatically opening or closing the wafer 8 when the wafer transfer robot picks and places the wafer 8.

清洗模組的清洗單元包括:乾燥前單元9和清洗模組其他單元;乾燥單元10和清洗模組其他單元位於乾燥前單元9的兩側;在一些較佳的實施例中,所述乾燥前單元9可以選擇刷洗單元,在該單元中晶圓8採用垂直方向作業;所述清洗模組其他單元可以為晶圓過渡單元、兆聲清洗單元、刷洗單元中的一個或複數個。清洗單元的具體設置可以根據實際生產的需要進行自由組合,以靈活適用各種情況。The cleaning unit of the cleaning module includes: a pre-drying unit 9 and other units of the cleaning module; the drying unit 10 and other units of the cleaning module are located on both sides of the pre-drying unit 9; in some preferred embodiments, the pre-drying unit The unit 9 can select a scrubbing unit in which the wafer 8 is operated in a vertical direction; the other units of the cleaning module can be one or more of a wafer transition unit, a megasonic cleaning unit, and a scrubbing unit. The specific settings of the cleaning unit can be freely combined according to actual production needs to flexibly apply to various situations.

在該實施例中,本發明所提供的晶圓傳輸機械手包括:橫向傳輸軸1、橫向傳輸拖板2、第一垂直升降軸3、第二垂直升降軸5、第一卡爪夾持臂7及第二卡爪夾持臂6。In this embodiment, the wafer transfer robot provided by the present invention includes: a transverse transfer shaft 1, a transverse transfer carriage 2, a first vertical lift shaft 3, a second vertical lift shaft 5, and a first jaw clamping arm 7 and the second jaw clamping arm 6.

其中,橫向傳輸拖板2設置在所述橫向傳輸軸1上,並能夠沿所述橫向傳輸軸1做橫向運動;橫向傳輸軸1僅位於所述清洗單元一側,以使得橫向傳輸拖板2不會運行到乾燥單元10一側,從而排除在乾燥製程中晶圓傳輸機械手運動部件上的雜質顆粒散落到晶圓8上的可能性。需要說明的是:橫向傳輸軸1的位置僅需要滿足橫向傳輸拖板2不會運行到乾燥單元一側即可,至於橫向傳輸軸1與清洗單元的空間相對位置並不做特別限定。橫向傳輸軸1可以低於清洗單元,只需要滿足晶圓傳輸機械手能夠完成取放晶圓8即可。更佳地,橫向傳輸軸1佈置於清洗單元的上方,以實現更佳的佈置方式。Wherein, the lateral transmission carriage 2 is arranged on the lateral transmission shaft 1 and can move laterally along the lateral transmission shaft 1; the lateral transmission shaft 1 is only located on one side of the cleaning unit, so that the lateral transmission carriage 2 It will not run to the side of the drying unit 10, thereby eliminating the possibility that the impurity particles on the moving parts of the wafer transport robot will be scattered on the wafer 8 during the drying process. It should be noted that the position of the horizontal transmission shaft 1 only needs to satisfy that the horizontal transmission carriage 2 does not run to the side of the drying unit, and the spatial relative position of the horizontal transmission shaft 1 and the cleaning unit is not particularly limited. The lateral transfer shaft 1 can be lower than the cleaning unit, and only needs to satisfy that the wafer transfer robot can complete the picking and placing of the wafer 8. More preferably, the transverse transmission shaft 1 is arranged above the cleaning unit to achieve a better arrangement.

橫向傳輸拖板2上並排設置有第一垂直升降軸3和第二垂直升降軸5,能夠在所述橫向傳輸拖板2上各自單獨做垂直上下運動。其中所述第一垂直升降軸3上還設置有旋轉台4,用於驅動與其相連的第一卡爪夾持臂7做旋轉運動。所述旋轉台4的驅動形式為氣動或電動。而所述第二垂直升降軸5直接與第二卡爪夾持臂6相連。所述第一卡爪夾持臂7與所述第二卡爪夾持臂6相比更靠近於所述乾燥單元10,用於將晶圓8從所述乾燥前單元9傳輸至所述乾燥單元10。A first vertical lifting shaft 3 and a second vertical lifting shaft 5 are arranged side by side on the lateral transmission carriage 2, which can independently move vertically and upwardly on the lateral transmission carriage 2 respectively. Wherein, the first vertical lifting shaft 3 is also provided with a rotating table 4 for driving the first claw clamping arm 7 connected to it to rotate. The driving form of the rotary table 4 is pneumatic or electric. The second vertical lifting shaft 5 is directly connected with the second jaw clamping arm 6. The first jaw gripping arm 7 is closer to the drying unit 10 than the second jaw gripping arm 6, and is used to transfer the wafer 8 from the pre-drying unit 9 to the drying unit. Unit 10.

而所述第二卡爪夾持臂6則用於將晶圓8從所述清洗模組其他單元傳輸至所述乾燥前單元9。該實施例設置第二卡爪夾持臂6是為了在第一卡爪夾持臂7從乾燥前單元9中取出晶圓8之後,立即可以有待加工的晶圓8進入乾燥前單元9內進行作業,以實現更高的生產效率。但在一些實施例中沒有該第二卡爪夾持臂6的設置,並不影響本發明所解決的技術問題以及所實現的技術效果,故本發明對第二卡爪夾持臂6的數量並沒有限制,可以根據實際生產情況進行配製。The second jaw clamping arm 6 is used to transfer the wafer 8 from other units of the cleaning module to the pre-drying unit 9. In this embodiment, the second jaw holding arm 6 is provided for the purpose of immediately after the first jaw holding arm 7 removes the wafer 8 from the pre-drying unit 9, the wafer 8 to be processed can enter the pre-drying unit 9 for processing. Work to achieve higher production efficiency. However, in some embodiments, the absence of the second jaw clamping arm 6 does not affect the technical problems solved by the present invention and the technical effect achieved. Therefore, the present invention has a limited number of second jaw clamping arms 6 There is no restriction, and it can be prepared according to the actual production situation.

橫向傳輸軸1佈置在乾燥前單元9的一側,清洗模組其他單元按圖1所示順序放置在橫向傳輸軸1下方。第二卡爪夾持臂6可以通過第二垂直升降軸5進行Z軸方向的升降,第一卡爪夾持臂7可以通過旋轉台4進行順時針或者逆時針旋轉,旋轉台4通過第一垂直升降軸3進行Z軸方向的升降,橫向傳輸拖板2通過橫向傳輸軸1進行X軸方向的移動。乾燥前單元9以及清洗模組其他單元都是乾燥晶圓8的前道製程單元,乾燥單元10的作用是將清洗好的晶圓8進行表面乾燥和潔淨。晶圓傳輸機械手的作用是通過夾持晶圓8後的橫向運動、垂直運動以及旋轉運動來運送晶圓8到清洗模組各個單元中。The horizontal transmission shaft 1 is arranged on one side of the pre-drying unit 9, and the other units of the cleaning module are placed under the horizontal transmission shaft 1 in the order shown in FIG. 1. The second jaw clamping arm 6 can be raised and lowered in the Z-axis direction through the second vertical lifting shaft 5, the first jaw clamping arm 7 can be rotated clockwise or counterclockwise by the rotating table 4, and the rotating table 4 can pass through the first The vertical lifting shaft 3 moves in the Z-axis direction, and the horizontal transmission carriage 2 moves in the X-axis direction through the horizontal transmission shaft 1. The pre-drying unit 9 and the other units of the cleaning module are all pre-process units for drying the wafer 8. The function of the drying unit 10 is to dry and clean the surface of the cleaned wafer 8. The function of the wafer transfer manipulator is to transport the wafer 8 to each unit of the cleaning module through the lateral movement, the vertical movement and the rotational movement after the wafer 8 is clamped.

本發明還提供了一種上述晶圓傳輸機械手的晶圓8翻轉方法,該方法包括晶圓8置入步驟和機械手返回步驟。The present invention also provides a wafer 8 turning method of the above-mentioned wafer transfer robot. The method includes a wafer 8 placing step and a robot returning step.

所述晶圓8置入步驟包括:所述第一卡爪夾持臂7從所述清洗單元中取出晶圓8後,通過橫向、垂直、旋轉三個運動方向的聯動或非聯動動作實現晶圓8從垂直狀態翻轉為水平狀態,並將晶圓8置入乾燥單元10。The step of placing the wafer 8 includes: after the first jaw clamping arm 7 takes out the wafer 8 from the cleaning unit, the wafer 8 is realized by linkage or non-linkage actions in the three movement directions of horizontal, vertical, and rotation. The circle 8 is turned from the vertical state to the horizontal state, and the wafer 8 is placed in the drying unit 10.

所述機械手返回步驟包括:第一卡爪夾持臂7將晶圓8放置於所述乾燥單元10後,通過橫向、垂直、旋轉三個運動方向的聯動或非聯動動作由水平狀態恢復為垂直狀態,並返回原位置。The manipulator returning step includes: after the first jaw clamping arm 7 places the wafer 8 in the drying unit 10, it is restored from the horizontal state to the horizontal state through linkage or non-linkage actions in the three movement directions of horizontal, vertical, and rotation. Vertical state, and return to the original position.

關於本發明所提供的基於上述晶圓傳輸機械手的晶圓8翻轉方法,將從以下7個實施例進行具體說明。當然地,能夠實現本發明上述晶圓8翻轉方法的具體實施方案並不局限於下述的7個實施例。With regard to the wafer 8 turning method based on the above-mentioned wafer transfer robot provided by the present invention, the following seven embodiments will be specifically described. Of course, the specific implementations that can implement the above-mentioned wafer 8 inversion method of the present invention are not limited to the following seven embodiments.

實施例1:Example 1:

在第一卡爪夾持臂7沿Z軸方向運動從乾燥前單元9中取出晶圓8後(如圖2的①部分所示),如圖2的②部分所示,橫向傳輸拖板2向X+方向運動,同時旋轉台4帶動晶圓8沿A+順時針旋轉,以及第一垂直升降軸3攜第一卡爪夾持臂7向Z-方向向下運動,第一卡爪夾持臂7攜晶圓8在X+、A+、Z-三個方向上共同運動,共同協調完成晶圓8從垂直到水平的狀態轉換過程,如圖2的③部分所示,晶圓8已達到水平狀態。在晶圓8翻轉期間,乾燥單元10內部指定機構已做好晶圓8放入的準備。隨後橫向傳輸拖板2帶動第一卡爪夾持臂7向X-方向移動至晶圓8位於乾燥單元10的上方(如圖2的④部分所示)。第一卡爪夾持臂7在Z-方向向下運動至晶圓8位於乾燥單元10內部指定機構(如圖2的⑤部分所示),第一卡爪夾持臂7鬆開晶圓8,晶圓8位於乾燥單元10內部指定機構上。After the first jaw gripping arm 7 moves along the Z-axis direction and takes out the wafer 8 from the pre-drying unit 9 (as shown in part ① in Fig. 2), as shown in part ② in Fig. 2, the carriage 2 is transferred laterally Move in the X+ direction, while the turntable 4 drives the wafer 8 to rotate clockwise along A+, and the first vertical lifting shaft 3 carries the first claw clamping arm 7 to move downward in the Z- direction, the first claw clamping arm 7 The wafer 8 moves together in the three directions of X+, A+, and Z- to coordinate and complete the state transition process of the wafer 8 from vertical to horizontal. As shown in part ③ of Figure 2, the wafer 8 has reached the horizontal state. . During the inversion of the wafer 8, the designated mechanism inside the drying unit 10 is ready to put the wafer 8 in. Subsequently, the lateral transport carriage 2 drives the first jaw clamping arm 7 to move in the X-direction until the wafer 8 is located above the drying unit 10 (as shown in part ④ in FIG. 2). The first jaw clamping arm 7 moves down in the Z-direction until the wafer 8 is located in the designated mechanism inside the drying unit 10 (as shown in part ⑤ in Figure 2), and the first jaw clamping arm 7 releases the wafer 8 , The wafer 8 is located on the designated mechanism inside the drying unit 10.

實施例2:Example 2:

在第一卡爪夾持臂7沿Z軸方向運動從乾燥前單元9中取出晶圓8後(如圖3的①部分所示),如圖3的②部分所示,橫向傳輸拖板2向X+方向移動一段距離,然後旋轉台4帶動第一卡爪夾持臂7沿A+順時針旋轉至一定角度使晶圓8達到水平狀態(如圖3的③和④部分所示)。接著第一垂直升降軸3攜第一卡爪夾持臂7向Z-方向向下運動一定的位置。在晶圓8翻轉期間,乾燥單元10內部指定機構已做好晶圓8放入的準備。隨後橫向傳輸拖板2帶動第一卡爪夾持臂7向X-方向移動至晶圓8位於乾燥單元10的上方(如圖3的⑤部分所示)。第一卡爪夾持臂7在Z-方向向下運動至晶圓8位於乾燥單元10內部指定機構(如圖3的⑥部分所示),第一卡爪夾持臂7鬆開晶圓8,晶圓8位於乾燥單元10內部指定機構上。以上步驟是各方向單獨運動組合的結果。After the first jaw gripping arm 7 moves along the Z-axis direction and takes out the wafer 8 from the pre-drying unit 9 (as shown in part ① in Fig. 3), as shown in part ② in Fig. 3, the carriage 2 is transported laterally Move a certain distance in the X+ direction, and then the rotating table 4 drives the first jaw clamping arm 7 to rotate clockwise along A+ to a certain angle to make the wafer 8 reach a horizontal state (as shown in parts ③ and ④ in Fig. 3). Then, the first vertical lifting shaft 3 carries the first jaw clamping arm 7 and moves downward to a certain position in the Z-direction. During the inversion of the wafer 8, the designated mechanism inside the drying unit 10 is ready to put the wafer 8 in. Subsequently, the lateral transport carriage 2 drives the first jaw clamping arm 7 to move in the X-direction until the wafer 8 is located above the drying unit 10 (as shown in part ⑤ of FIG. 3). The first jaw holding arm 7 moves downward in the Z-direction until the wafer 8 is located in the designated mechanism inside the drying unit 10 (as shown in part ⑥ in Figure 3), and the first jaw holding arm 7 releases the wafer 8 , The wafer 8 is located on the designated mechanism inside the drying unit 10. The above steps are the result of a combination of individual movements in each direction.

實施例3:Example 3:

在第一卡爪夾持臂7沿Z軸方向運動從乾燥前單元9中取出晶圓8後(如圖4的①部分所示),如圖4的②部分所示,橫向傳輸拖板2向X+方向移動一段距離,然後旋轉台4帶動第一卡爪夾持臂7沿A+順時針旋轉至一定角度使晶圓8達到水平狀態(如圖4的③和④部分所示)。接著橫向傳輸拖板2帶動第一卡爪夾持臂7向X-方向運動(如圖4的⑤部分所示),隨後第一垂直升降軸3攜第一卡爪夾持臂7向Z-方向向下運動至晶圓8位於乾燥單元10內部指定機構(如圖4的⑥部分所示)。最後第一卡爪夾持臂7鬆開晶圓8,晶圓8位於乾燥單元10內部指定機構上。After the first jaw gripping arm 7 moves along the Z-axis direction and takes out the wafer 8 from the pre-drying unit 9 (as shown in part ① in Fig. 4), as shown in part ② in Fig. 4, the carriage 2 is transported laterally Move a certain distance in the X+ direction, and then the rotating table 4 drives the first jaw clamping arm 7 to rotate clockwise along A+ to a certain angle to make the wafer 8 reach a horizontal state (as shown in parts ③ and ④ in Fig. 4). Then the transverse transmission carriage 2 drives the first jaw clamping arm 7 to move in the X-direction (as shown in part ⑤ in Fig. 4), and then the first vertical lifting shaft 3 carries the first jaw clamping arm 7 to the Z-direction. The direction moves downward until the wafer 8 is located in the designated mechanism inside the drying unit 10 (as shown in part ⑥ in Fig. 4). Finally, the first jaw clamping arm 7 releases the wafer 8, and the wafer 8 is located on a designated mechanism inside the drying unit 10.

實施例4:Example 4:

在第一卡爪夾持臂7沿Z軸方向運動從乾燥前單元9中取出晶圓8後(如圖5的①部分所示),緊接著第一卡爪夾持臂7直接沿A+順時針旋轉至一定角度使晶圓8達到水平狀態(如圖5的②部分所示),然後再根據不同卡爪夾持臂的實際長短,將橫向傳輸拖板2進行X+或X-方向移動(微調),使晶圓8處於乾燥單元10的正上方,隨後第一垂直升降軸3攜第一卡爪夾持臂7向Z-方向向下運動至晶圓8位於乾燥單元10內部指定機構。最後第一卡爪夾持臂7鬆開晶圓8,晶圓8位於乾燥單元10內部指定機構上。After the first jaw holding arm 7 moves along the Z-axis direction to take out the wafer 8 from the pre-drying unit 9 (as shown in part ① in Fig. 5), the first jaw holding arm 7 directly moves along the A+ direction. Rotate the hour hand to a certain angle to make the wafer 8 reach a horizontal state (as shown in part ② in Figure 5), and then move the horizontal transport carriage 2 in the X+ or X- direction according to the actual length of the gripping arms of different jaws ( Fine adjustment) to make the wafer 8 directly above the drying unit 10, and then the first vertical lifting shaft 3 carries the first jaw clamping arm 7 and moves downward in the Z-direction until the wafer 8 is located in the designated mechanism inside the drying unit 10. Finally, the first jaw clamping arm 7 releases the wafer 8, and the wafer 8 is located on a designated mechanism inside the drying unit 10.

當晶圓8被放置於乾燥單元10內部指定機構後,機械手接著將返回原狀態,可以採用以下實施例5-7的方案,以完成整個迴圈。After the wafer 8 is placed in the designated mechanism inside the drying unit 10, the manipulator will then return to the original state, and the following embodiments 5-7 can be used to complete the entire loop.

實施例5:Example 5:

放置晶圓8的動作可以選擇應用實施例1-4中的任一方案,當晶圓8被放置於乾燥單元10內部指定機構後,機械手接著將返回原狀態,橫向傳輸拖板2向X+方向運動,旋轉台4帶動晶圓8沿A-順時針旋轉,第一垂直升降軸3攜第一卡爪夾持臂7向Z+方向上升,第一卡爪夾持臂7在X+、A-、Z+三個方向上共同運動,共同協調完成從水平到垂直狀態的過程。The action of placing the wafer 8 can choose to apply any of the schemes in the embodiments 1-4. After the wafer 8 is placed in the designated mechanism inside the drying unit 10, the robot will then return to the original state and transfer the carriage 2 laterally to X+ Moving in the direction, the rotating table 4 drives the wafer 8 to rotate clockwise along A-, the first vertical lifting shaft 3 carries the first claw clamping arm 7 upwards in the Z+ direction, and the first claw clamping arm 7 is at X+, A- , Z+ move together in three directions, and coordinate to complete the process from horizontal to vertical.

實施例6:Example 6:

放置晶圓8的動作可以選擇應用實施例1-4中的任一方案,當晶圓8被放置於乾燥單元10內部指定機構後,機械手接著將返回原狀態,被橫置的第一卡爪夾持臂7先往Z+方向上升到一定高位,然後往X+方向移動一定距離後,第一卡爪夾持臂7向A-方向旋轉直至恢復成垂直狀態,完成整個迴圈。The action of placing the wafer 8 can choose to apply any of the schemes in the embodiments 1-4. After the wafer 8 is placed in the designated mechanism inside the drying unit 10, the robot will then return to the original state, the first card being horizontally placed. The claw clamping arm 7 first rises to a certain high position in the Z+ direction, and then moves a certain distance in the X+ direction, the first claw clamping arm 7 rotates in the A- direction until it returns to a vertical state, completing the entire loop.

實施例7:Example 7:

放置晶圓8的動作可以選擇應用實施例1-4中的任一方案,當晶圓8被放置於乾燥單元10內部指定機構後,機械手接著將返回原狀態,被橫置的第一卡爪夾持臂7先往X+方向移動一定距離後,再往Z+方向上升到一定高位,然後第一卡爪夾持臂7向A-方向旋轉直至恢復成垂直狀態,完成整個迴圈。The action of placing the wafer 8 can choose to apply any of the schemes in the embodiments 1-4. After the wafer 8 is placed in the designated mechanism inside the drying unit 10, the robot will then return to the original state, the first card being horizontally placed. The jaw clamping arm 7 first moves in the X+ direction for a certain distance, and then rises to a certain high position in the Z+ direction, and then the first jaw clamping arm 7 rotates in the A- direction until it returns to a vertical state, completing the entire loop.

總之,晶圓8置入可以是聯動或非聯動,機械手返回可以是聯動或非聯動,關於晶圓8置入的實施例1-4和關於機械手返回的實施例5-7可根據實際需要自由組合使用,以適應各種實際生產環境。In short, wafer 8 placement can be linked or non-linked, and robot return can be linked or non-linked. Examples 1-4 regarding wafer 8 insertion and Examples 5-7 regarding robot return can be based on actual conditions. It needs to be combined freely to adapt to various actual production environments.

綜上所述,本發明所提供的晶圓傳輸機械手設置於化學機械平坦化設備的清洗模組中,可以切實有效滿足晶圓在水平和垂直兩種狀態的轉換,符合實際生產需求,機械手翻轉過程無需增加空間以供翻轉,也不會對其他機構產生干擾,空間利用率高。本發明中晶圓傳輸機械手使乾燥單元能夠以作用效果最佳為目標來選擇晶圓放置模式(垂直或水平放置),無需為了便於晶圓傳輸而使乾燥單元的晶圓放置模式與清洗模組其餘各單元一致。由於晶圓傳輸機械手的橫向傳輸軸行程只到乾燥前單元為止,行程緊湊,機械手翻轉後向乾燥單元置入晶圓過程中,橫向傳輸拖板不會運行到乾燥單元一側,從而排除在乾燥製程中晶圓傳輸機械手運動部件上的雜質顆粒散落到晶圓上的可能性。To sum up, the wafer transfer robot provided by the present invention is set in the cleaning module of the chemical mechanical planarization equipment, which can effectively meet the conversion of the wafer in the horizontal and vertical states, and meet the actual production requirements. The hand-turning process does not need to increase the space for turning, nor will it interfere with other mechanisms, and the space utilization rate is high. The wafer transfer manipulator of the present invention enables the drying unit to select the wafer placement mode (vertical or horizontal placement) with the best effect as the goal, without requiring the wafer placement mode and cleaning mode of the drying unit to facilitate wafer transfer. The remaining units of the group are the same. Since the stroke of the horizontal transfer axis of the wafer transfer robot only reaches the unit before drying, the stroke is compact. After the robot is turned over, the wafer is placed into the drying unit, and the horizontal transfer carriage will not run to the drying unit side, thus eliminating The possibility of impurity particles on the moving parts of the wafer transfer robot being scattered on the wafer during the drying process.

儘管本發明的內容已經通過上述較佳實施例作了詳細介紹,但應當認識到上述的描述不應被認為是對本發明的限制。在所屬技術領域中具有通常知識者閱讀了上述內容後,對於本發明的多種修改和替代都將是顯而易見的。因此,本發明的保護範圍應由所附的申請專利範圍來限定。Although the content of the present invention has been described in detail through the above preferred embodiments, it should be recognized that the above description should not be considered as limiting the present invention. Various modifications and alternatives to the present invention will be obvious after reading the above content by those with ordinary knowledge in the technical field. Therefore, the scope of protection of the present invention should be limited by the scope of the attached patent application.

1:橫向傳輸軸 2:橫向傳輸拖板 3:第一垂直升降軸 4:旋轉台 5:第二垂直升降軸 6:第二卡爪夾持臂 7:第一卡爪夾持臂 8:晶圓 9:乾燥前單元 10:乾燥單元1: Horizontal transmission shaft 2: Horizontal transmission carriage 3: The first vertical lifting shaft 4: Rotating table 5: The second vertical lifting axis 6: The second jaw gripping arm 7: The first jaw gripping arm 8: Wafer 9: Unit before drying 10: Drying unit

圖1為本發明晶圓傳輸機械手一較佳實施例的結構示意圖; 圖2為本發明晶圓翻轉方法中晶圓置入步驟實施例1的流程示意圖; 圖3為本發明晶圓翻轉方法中晶圓置入步驟實施例2的流程示意圖; 圖4為本發明晶圓翻轉方法中晶圓置入步驟實施例3的流程示意圖; 圖5為本發明晶圓翻轉方法中晶圓置入步驟實施例4的流程示意圖。FIG. 1 is a schematic structural diagram of a preferred embodiment of a wafer transfer robot according to the present invention; 2 is a schematic flow chart of Embodiment 1 of the wafer placement step in the wafer turning method of the present invention; 3 is a schematic flow chart of Embodiment 2 of the wafer placement step in the wafer turning method of the present invention; 4 is a schematic flowchart of Embodiment 3 of the wafer placement step in the wafer turning method of the present invention; FIG. 5 is a schematic flowchart of Embodiment 4 of the wafer placement step in the wafer turning method of the present invention.

1:橫向傳輸軸1: Horizontal transmission axis

2:橫向傳輸拖板2: Horizontal transmission carriage

3:第一垂直升降軸3: The first vertical lifting shaft

4:旋轉台4: Rotating table

5:第二垂直升降軸5: The second vertical lifting axis

6:第二卡爪夾持臂6: The second jaw gripping arm

7:第一卡爪夾持臂7: The first jaw gripping arm

8:晶圓8: Wafer

9:乾燥前單元9: Unit before drying

10:乾燥單元10: Drying unit

Claims (12)

一種晶圓傳輸機械手,用於化學機械平坦化設備的一清洗模組中的晶圓傳輸,以將晶圓以垂直狀態在該清洗模組的一清洗單元中完成清洗後取出,再通過翻轉後以水平狀態置入該清洗模組的一乾燥單元,其中,包括: 一橫向傳輸軸,僅位於該清洗單元的一側; 一橫向傳輸拖板,設置在該橫向傳輸軸上,並能夠沿該橫向傳輸軸做橫向運動; 一第一垂直升降軸,設置在該橫向傳輸拖板上,並能夠在該橫向傳輸拖板上做垂直運動; 一旋轉台,設置在該第一垂直升降軸上; 一第一卡爪夾持臂,與該旋轉台相連,並由該旋轉台驅動做旋轉運動,用於對晶圓進行取放。A wafer transfer manipulator is used for wafer transfer in a cleaning module of a chemical mechanical planarization device, so that the wafer is removed in a cleaning unit of the cleaning module in a vertical state after being cleaned, and then turned over Then it is placed in a horizontal state into a drying unit of the cleaning module, which includes: A transverse transmission shaft, located only on one side of the cleaning unit; A horizontal transmission carriage, which is arranged on the horizontal transmission shaft and can move laterally along the horizontal transmission shaft; A first vertical lifting shaft, which is arranged on the horizontal transmission pallet, and can perform vertical movement on the horizontal transmission pallet; A rotating table arranged on the first vertical lifting shaft; A first jaw clamping arm is connected to the rotating table and driven by the rotating table to make a rotating movement for picking and placing wafers. 如申請專利範圍第1項所述的晶圓傳輸機械手,其中,該清洗單元和該乾燥單元安裝有可開關的門,用於該晶圓傳輸機械手對晶圓進行取放時的自動打開或關閉。The wafer transfer manipulator described in item 1 of the scope of patent application, wherein the cleaning unit and the drying unit are equipped with switchable doors for automatic opening when the wafer transfer manipulator picks up and places wafers Or close. 如申請專利範圍第1項所述的晶圓傳輸機械手,其中,該清洗單元包括:一乾燥前單元和一清洗模組其他單元;該乾燥單元和該清洗模組其他單元位於該乾燥前單元的兩側;該乾燥前單元採用垂直方向作業;該乾燥前單元內的晶圓由該第一卡爪夾持臂傳輸至該乾燥單元;該清洗模組其他單元為晶圓過渡單元、兆聲清洗單元、刷洗單元中的一個或複數個。As described in the first item of the scope of patent application, the cleaning unit includes: a pre-drying unit and other units of the cleaning module; the drying unit and other units of the cleaning module are located in the pre-drying unit The pre-drying unit is operated in a vertical direction; the wafers in the pre-drying unit are transferred to the drying unit by the first gripper arm; the other units of the cleaning module are wafer transition units, megasonics One or more of the cleaning unit and the scrubbing unit. 如申請專利範圍第3項所述的晶圓傳輸機械手,其中,該晶圓傳輸機械手還包括:至少一個第二垂直升降軸,設置在該橫向傳輸拖板上,並能夠在該橫向傳輸拖板上做垂直運動;該第一垂直升降軸位於該第二垂直升降軸和該乾燥單元之間;該第二垂直升降軸上還設置有一第二卡爪夾持臂,用於與該第一卡爪夾持臂配合進行該清洗模組其他單元到該乾燥前單元之間的晶圓傳送。For the wafer transfer robot described in item 3 of the scope of patent application, the wafer transfer robot further includes: at least one second vertical lifting shaft, which is arranged on the lateral transfer carriage and can transfer in the lateral direction. The carriage moves vertically; the first vertical lifting shaft is located between the second vertical lifting shaft and the drying unit; the second vertical lifting shaft is also provided with a second jaw clamping arm for contacting the second vertical lifting shaft. A jaw clamping arm cooperates with the wafer transfer from other units of the cleaning module to the pre-drying unit. 一種如申請專利範圍第3或4項所述的晶圓傳輸機械手的晶圓翻轉方法,其中,該晶圓翻轉方法包括一晶圓置入步驟和一機械手返回步驟; 該晶圓置入步驟包括:該第一卡爪夾持臂從該清洗單元的該乾燥前單元中取出晶圓後,通過橫向、垂直、旋轉三個運動方向的聯動或非聯動動作實現晶圓從垂直狀態翻轉為水平狀態,並將晶圓置入該乾燥單元; 該機械手返回步驟包括:該第一卡爪夾持臂將晶圓放置於該乾燥單元後,通過橫向、垂直、旋轉三個運動方向的聯動或非聯動動作由水平狀態恢復為垂直狀態,並返回原位置。A wafer turning method for a wafer transfer robot according to item 3 or 4 of the scope of patent application, wherein the wafer turning method includes a wafer placing step and a robot returning step; The wafer placement step includes: after the first jaw clamping arm takes out the wafer from the pre-drying unit of the cleaning unit, the wafer is realized by linkage or non-linkage of the three movement directions of horizontal, vertical, and rotation. Turn over from the vertical state to the horizontal state, and place the wafer in the drying unit; The returning step of the manipulator includes: after the first jaw clamping arm places the wafer in the drying unit, the horizontal state is restored to the vertical state through linkage or non-linkage actions in the three movement directions of horizontal, vertical, and rotation, and Return to the original position. 如申請專利範圍第5項所述的晶圓傳輸機械手的晶圓翻轉方法,其中,該晶圓置入步驟具體包括: 該第一卡爪夾持臂從該乾燥前單元中取出晶圓後,同時進行以下三個方向上的運動: 該橫向傳輸拖板帶動該第一卡爪夾持臂向遠離該乾燥單元的方向做橫向運動,該旋轉台帶動該第一卡爪夾持臂向靠近該乾燥單元一側旋轉至晶圓達到水平狀態,該第一垂直升降軸帶動該第一卡爪夾持臂垂直運動至一定位置; 隨後該橫向傳輸拖板帶動該第一卡爪夾持臂向靠近該乾燥單元的方向橫向運動至晶圓位於該乾燥單元的上方; 該第一垂直升降軸帶動該第一卡爪夾持臂垂直向下運動至晶圓位於該乾燥單元內部指定機構;該第一卡爪夾持臂鬆開晶圓,使晶圓位於該乾燥單元內部指定機構上。As described in the fifth item of the scope of patent application, the wafer turning method of the wafer transfer robot, wherein the wafer placement step specifically includes: After the first jaw clamping arm takes out the wafer from the pre-drying unit, it moves in the following three directions at the same time: The lateral transport carriage drives the first jaw holding arm to move laterally away from the drying unit, and the rotating table drives the first jaw holding arm to rotate to the side close to the drying unit until the wafer reaches the level State, the first vertical lifting shaft drives the first jaw clamping arm to move vertically to a certain position; Then the lateral transport carriage drives the first jaw clamping arm to move laterally in a direction close to the drying unit until the wafer is located above the drying unit; The first vertical lifting shaft drives the first claw clamping arm to move vertically downward until the wafer is located in the designated mechanism inside the drying unit; the first claw clamping arm releases the wafer so that the wafer is located in the drying unit On the internal designated agency. 如申請專利範圍第5項所述的晶圓傳輸機械手的晶圓翻轉方法,其中,該晶圓置入步驟具體包括:該第一卡爪夾持臂從該乾燥前單元中取出晶圓後,該橫向傳輸拖板帶動該第一卡爪夾持臂向遠離該乾燥單元的方向做橫向運動;然後該旋轉台帶動該第一卡爪夾持臂向靠近該乾燥單元一側旋轉至晶圓達到水平狀態;接著該第一垂直升降軸帶動該第一卡爪夾持臂垂直運動至一定位置;隨後該橫向傳輸拖板帶動該第一卡爪夾持臂向靠近該乾燥單元的方向橫向運動至晶圓位於該乾燥單元的上方;該第一垂直升降軸帶動該第一卡爪夾持臂垂直向下運動至晶圓位於該乾燥單元內部指定機構;該第一卡爪夾持臂鬆開晶圓,使晶圓位於該乾燥單元內部指定機構上。As described in the fifth item of the scope of patent application, the wafer inverting method of the wafer transfer robot, wherein the wafer placement step specifically includes: after the first jaw clamping arm takes out the wafer from the pre-drying unit , The lateral transfer carriage drives the first claw clamping arm to move laterally away from the drying unit; then the rotating table drives the first claw clamping arm to rotate to the side close to the drying unit to the wafer Reach the horizontal state; then the first vertical lifting shaft drives the first jaw clamping arm to move vertically to a certain position; then the horizontal transmission carriage drives the first jaw clamping arm to move laterally towards the direction of the drying unit Until the wafer is located above the drying unit; the first vertical lifting shaft drives the first jaw holding arm to move vertically downward until the wafer is located in the designated mechanism inside the drying unit; the first jaw holding arm is released The wafer is placed on the designated mechanism inside the drying unit. 如申請專利範圍第5項所述的晶圓傳輸機械手的晶圓翻轉方法,其中,該晶圓置入步驟具體包括:該第一卡爪夾持臂從該乾燥前單元中取出晶圓後,該橫向傳輸拖板帶動該第一卡爪夾持臂向遠離該乾燥單元的方向做橫向運動;然後該旋轉台帶動該第一卡爪夾持臂向靠近該乾燥單元一側旋轉至晶圓達到水平狀態;隨後該橫向傳輸拖板帶動該第一卡爪夾持臂向靠近該乾燥單元的方向橫向運動至晶圓位於該乾燥單元的上方;該第一垂直升降軸帶動該第一卡爪夾持臂垂直向下運動至晶圓位於該乾燥單元內部指定機構;該第一卡爪夾持臂鬆開晶圓,使晶圓位於該乾燥單元內部指定機構上。As described in the fifth item of the scope of patent application, the wafer inverting method of the wafer transfer robot, wherein the wafer placement step specifically includes: after the first jaw clamping arm takes out the wafer from the pre-drying unit , The lateral transfer carriage drives the first claw clamping arm to move laterally away from the drying unit; then the rotating table drives the first claw clamping arm to rotate to the side close to the drying unit to the wafer Reach a horizontal state; then the lateral transport carriage drives the first jaw clamping arm to move laterally towards the direction of the drying unit until the wafer is above the drying unit; the first vertical lifting shaft drives the first jaw The clamping arm moves vertically downwards until the wafer is located in the designated mechanism inside the drying unit; the first jaw clamping arm loosens the wafer so that the wafer is located on the designated mechanism inside the drying unit. 如申請專利範圍第5項所述的晶圓傳輸機械手的晶圓翻轉方法,其中,該晶圓置入步驟具體包括:該第一卡爪夾持臂從該乾燥前單元中取出晶圓後,該旋轉台帶動該第一卡爪夾持臂向靠近該乾燥單元一側旋轉至晶圓達到水平狀態;隨後該橫向傳輸拖板帶動該第一卡爪夾持臂橫向運動至晶圓位於該乾燥單元的上方;該第一垂直升降軸帶動該第一卡爪夾持臂垂直向下運動至晶圓位於該乾燥單元內部指定機構;該第一卡爪夾持臂鬆開晶圓,使晶圓位於該乾燥單元內部指定機構上。As described in the fifth item of the scope of patent application, the wafer inverting method of the wafer transfer robot, wherein the wafer placement step specifically includes: after the first jaw clamping arm takes out the wafer from the pre-drying unit , The rotating table drives the first jaw holding arm to rotate to the side close to the drying unit until the wafer reaches a horizontal state; then the lateral transfer carriage drives the first jaw holding arm to move laterally until the wafer is located at the Above the drying unit; the first vertical lifting shaft drives the first jaw holding arm to move vertically downward until the wafer is located in the designated mechanism inside the drying unit; the first jaw holding arm loosens the wafer to make the wafer The circle is located on the designated mechanism inside the drying unit. 如申請專利範圍第5項所述的晶圓傳輸機械手的晶圓翻轉方法,其中,該機械手返回步驟具體包括:當晶圓被放置於該乾燥單元後,同時進行以下三個方向上的運動:該橫向傳輸拖板帶動該第一卡爪夾持臂向遠離該乾燥單元的方向做橫向運動;該旋轉台帶動該第一卡爪夾持臂向下旋轉至該第一卡爪夾持臂呈垂直狀態;該第一垂直升降軸帶動該第一卡爪夾持臂垂直向上運動至一定位置。As described in item 5 of the scope of patent application, the wafer turning method of the wafer transfer robot, wherein the robot returning step specifically includes: when the wafer is placed in the drying unit, simultaneously performing the following three directions Movement: The horizontal transmission carriage drives the first jaw clamping arm to move laterally away from the drying unit; the rotating table drives the first jaw clamping arm to rotate downward until the first jaw is clamped The arm is in a vertical state; the first vertical lifting shaft drives the first jaw clamping arm to move vertically upward to a certain position. 如申請專利範圍第5項所述的晶圓傳輸機械手的晶圓翻轉方法,其中,該機械手返回步驟具體包括:當晶圓被放置於該乾燥單元後,該第一垂直升降軸帶動該第一卡爪夾持臂垂直向上運動至一定位置;然後該橫向傳輸拖板帶動該第一卡爪夾持臂向遠離該乾燥單元的方向橫向運動至一定位置;接著該旋轉台帶動該第一卡爪夾持臂向下旋轉至該第一卡爪夾持臂呈垂直狀態。As described in the fifth item of the scope of patent application, the wafer turning method of the wafer transfer robot, wherein the robot returning step specifically includes: when the wafer is placed in the drying unit, the first vertical lifting shaft drives the The first jaw clamping arm moves vertically upwards to a certain position; then the horizontal transmission carriage drives the first jaw clamping arm to move laterally away from the drying unit to a certain position; then the rotating table drives the first The claw clamping arm rotates downwards until the first claw clamping arm is in a vertical state. 如申請專利範圍第5項所述的晶圓傳輸機械手的晶圓翻轉方法,其中,該機械手返回步驟具體包括:當晶圓被放置於該乾燥單元後,該橫向傳輸拖板帶動該第一卡爪夾持臂向遠離該乾燥單元的方向橫向運動至一定位置;然後該第一垂直升降軸帶動該第一卡爪夾持臂垂直向上運動至一定位置;接著該旋轉台帶動該第一卡爪夾持臂向下旋轉至該第一卡爪夾持臂呈垂直狀態。As described in the fifth item of the scope of patent application, the wafer turning method of the wafer transfer robot, wherein the returning step of the robot specifically includes: when the wafer is placed in the drying unit, the lateral transfer carriage drives the second A jaw clamping arm moves laterally away from the drying unit to a certain position; then the first vertical lifting shaft drives the first jaw clamping arm to move vertically upward to a certain position; then the rotating table drives the first The claw clamping arm rotates downwards until the first claw clamping arm is in a vertical state.
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