TW202111341A - Testing apparatus - Google Patents

Abstract

This disclosure provides a testing apparatus and a tested circuit board is configured to be placed on the testing apparatus. The testing apparatus includes a base, a first plate, a second plate, a support component and a check assembly. The base includes a support surface and the tested circuit board is configured to be placed on the support surface. The first plate is disposed on the base. The second plate is pivotally connected to the first plate and is stacked on a side of the first plate that is located away from the base. The support component is fixed on the second plate. The check assembly is slidably disposed on the support component so as to be moved close to or away from the support surface. When the second plate is pivoted relative to the first plate, the second plate moves the check assembly close to or away from the support surface via the support component.

Description

Test Equipment

The present invention relates to a test equipment, especially a test equipment used to test circuit boards.

Generally speaking, the test equipment used for in-circuit test (ICT) includes a base and an upper mold. The circuit board to be tested is carried on the carrying surface of the base. The upper mold is provided with a test probe, and the test probe protrudes from the test surface of the upper mold facing the bearing surface. In addition, the upper mold is slidably disposed on the base to be away from or close to the base, so that the test probe is electrically connected to or separated from the circuit board to be tested.

However, since the upper mold slides to the position farthest from the base relative to the base, the space between the bearing surface of the base and the test surface of the upper mold is still insufficient for maintenance personnel to replace or repair the test probe. Therefore, maintenance personnel need to remove the cover of the upper mold and take out the circuit board with test probes in the upper mold to replace or repair the test probes, which prevents the maintenance personnel from replacing them in a convenient and efficient manner. Or repair the test probe.

The present invention is to provide a testing device, so that the electrical connectors in the testing module can be replaced or repaired in a convenient and efficient manner.

The test equipment disclosed in an embodiment of the present invention is used to carry a circuit board to be tested. The test equipment includes a base, a first board, a second board, a bracket, and a detection module. The base includes a bearing surface. The carrying surface is used for carrying a circuit board to be tested. The first board is disposed on the base. The second board is pivotally connected to the first board and stacked on the side of the first board away from the base. The bracket is fixed to the second board. The detection module is slidably arranged on the bracket to be close to or away from the bearing surface. When the second board pivots relative to the first board, the second board drives the detection module to move closer to or away from the bearing surface through the bracket.

According to the test equipment disclosed in the above embodiment, the detection module is slidably disposed on the bracket fixed on the second board, and the second board is pivotally connected to the first board fixed on the base, so the second board When pivoting relative to the first board, the detection module will be moved away from the bearing surface of the base. When the second board pivots relative to the first board to drive the detection module away from the bearing surface, there is enough space between the detection module and the bearing surface to allow maintenance personnel to replace or repair the detection module in a convenient and efficient manner. Electrical connections in the group.

The above description of the content of the present invention and the description of the following embodiments are used to demonstrate and explain the principle of the present invention and provide a further explanation of the scope of the patent application of the present invention.

The detailed features and advantages of the present invention will be described in detail in the following embodiments. The content is sufficient to enable anyone familiar with the relevant art to understand the technical content of the present invention and implement it accordingly, and in accordance with the content disclosed in this specification, the scope of patent application and the drawings. Anyone who is familiar with relevant skills can easily understand the purpose and advantages of the present invention. The following examples further illustrate the viewpoints of the present invention in detail, but do not limit the scope of the present invention by any viewpoint.

Please refer to Figure 1. Fig. 1 is a side view of a circuit board to be tested and a test device according to an embodiment of the present invention.

This embodiment provides a testing device 10 for carrying a circuit board 20 to be tested. The test equipment 10 includes a base 100, a sliding rail 120, a sliding member 150, a first plate body 200, a protruding member 250, a first positioning structure 260, a second positioning structure 270, and a second plate body 300, a fastener 350, two pivotal members 400, a bracket 450, a detection module 500, a slider 520, a sliding rod 550, and a handle 600.

The base 100 includes a bearing surface 101. The carrying surface 101 is used to carry a circuit board 20 to be tested. The sliding rail 120 is disposed on the bearing surface 101. The sliding member 150 is slidably disposed on the sliding rail 120, and the first plate 200 is disposed on the side of the sliding member 150 facing away from the base 100. In other words, the first board 200 is slidably disposed on the bearing surface 101 of the base 100 through the sliding member 150 and the sliding rail 120.

Of course, the first plate 200 is not limited to be disposed on the bearing surface 101 of the base 100. In other embodiments, the first plate body can also be arranged on the side surface adjacent to the bearing surface of the base. Further, in the embodiment where the first plate body is arranged on the side surface adjacent to the bearing surface of the base , The slide rail is changed to this side.

Of course, the test device 10 is not limited to include the slide rail 120 and the slide member 150. In other embodiments, the test device does not include the slide rail and the slide member. Instead, the test device 10 is provided on the first plate through a rack provided on the bearing surface. The gear to make the first plate slidably set on the base.

Please refer to Figure 1, Figure 2 and Figure 3. Fig. 2 is a perspective view of the first plate, the protruding member, the second plate, the locking member, and the pivotal member of the testing device in Fig. 1. Fig. 3 is an exploded view of the first plate, the protruding member, the second plate, the locking member and the pivotal member in Fig. 2.

The protruding member 250 protrudes from one side of the first plate body 200 and is formed integrally with the first plate body 200, for example. The first positioning structure 260 and the second positioning structure 270 respectively protrude from opposite sides of the protrusion 250 and are, for example, positioning protrusions.

The second board 300 is stacked on the side of the first board 200 away from the base 100. The locking member 350 is fixed to the first board 200 and the second board 300.

The test device 10 is not limited to include one lock piece 350. In other embodiments, the test device includes two or more lock pieces. In addition, in still another embodiment, the test device does not include the lock firmware.

Each of the two pivoting members 400 includes a first fixing portion 401, a second fixing portion 402 and a pivoting shaft portion 403. In each pivoting member 400, the first fixing portion 401 is fixed to the first plate 200, the second fixing portion 402 is fixed to the second plate 300, and opposite sides of the pivoting shaft portion 403 are respectively pivoted to the first plate. The fixed portion 401 and the second fixed portion 402. In other words, the first board 200 is pivotally connected to the second board 300 through the two pivotal members 400.

Of course, the testing device 10 is not limited to include two pivotal members 400. In other embodiments, the test device only includes a pivotal member, or, in still other embodiments, the test device does not include a pivotal member, and instead uses any other suitable means to pivot the first board to the second Board body.

Please refer to Figure 1 again. The bracket 450 is fixed to the second board 300. In addition, when the second board 300 is stacked on the first board 200, the bracket 450 is located on the side of the second board 300 away from the first board 200, but the present invention is not limited to this. In other embodiments When the second board is stacked on the first board, the bracket and the pivotal member are located on the same side of the second board.

In this embodiment, the detection module 500 includes a housing 501, a circuit board 502, and a plurality of electrical connections 503. The housing 501 is slidably disposed on the bracket 450 through the slider 520 and the sliding rod 550 to be close to or away from the bearing surface 101. The circuit board 502 is disposed on the housing 501. The electrical connector 503 is disposed on a side surface 504 of the circuit board 502 facing the carrying surface 101, and is, for example, a test probe.

The handle 600 is disposed on the housing 501 of the detection module 500 for the user to hold. The present invention is not limited to the structure of the handle 600. In other embodiments, the handle includes a holding member and a positioning rod, wherein different sides of the positioning rod are respectively arranged on the housing and the slider of the detection module for The housing is positioned, and the holding member is arranged on the positioning rod.

Please refer to Figure 1, Figure 4 and Figure 5. Fig. 4 is a partial enlarged view of the top view of the testing device in Fig. 1. FIG. 5 is a partial enlarged view of the schematic side sectional view drawn along the cutting plane line 5-5 in FIG. 4. FIG.

In this embodiment, the testing device 10 further includes a third positioning structure 650 and a fourth positioning structure 700. The third positioning structure 650 and the fourth positioning structure 700 are located on the bearing surface 101 of the base 100. In this embodiment, the third positioning structure 650 and the fourth positioning structure 700 are, for example, positioning grooves, and the first positioning structure 260 and the second positioning structure 270 are matched with the third positioning structure 650 and the fourth positioning structure 700, respectively.

In addition, in this embodiment, the testing device 10 further includes a positioning column 800. The positioning column 800 includes a wide-diameter section 801 and a narrow-diameter section 802 connected to each other. The diameter D1 of the wide-diameter section 801 is greater than the diameter D2 of the narrow-diameter section 802, and the narrow-diameter section 802 movably penetrates a through hole 251 of the protrusion 250, so that the wide-diameter section 801 bears on the protrusion 250 away from the base 100 On the side. The base 100 further includes a first positioning hole 102 and a second positioning hole 103.

As shown in FIGS. 4 and 5, when the sliding member 150 drives the first plate 200 to slide to a first position, the first positioning structure 260 is engaged with the third positioning structure 650, and the narrow section 802 is located at the first position. The positioning hole 102 allows the first plate 200 to be positioned on the base 100.

It should be noted that, since the first plate 200 is positioned on the base 100 at the second position in a manner similar to the way the first plate 200 is positioned on the base 100 at the first position, it is only shown as an example in the drawings. The state where the first board 200 is located at the first position.

When the sliding member 150 drives the first plate 200 to slide to a second position, the second positioning structure 270 is engaged with the fourth positioning structure 700, and the narrow section 802 is located in the second positioning hole 103, so that the first plate The body 200 is positioned on the base 100.

However, the present invention is not limited to the structures of the first positioning structure 260, the second positioning structure 270, the third positioning structure 650, and the fourth positioning structure 700. In other embodiments, the first positioning structure and the second positioning structure are positioning grooves, and the third positioning structure and the fourth positioning structure are positioning protrusions.

In addition, the testing device 10 is not limited to include a protrusion 250. In other embodiments, the test equipment includes two protrusions. In this case, the first positioning structure, the second positioning structure, the third positioning structure, the fourth positioning structure, the positioning pillar, the first positioning hole, and the second positioning hole The number of is adjusted to two accordingly, so that the opposite sides of the first plate body are positioned on the base through the two convex parts respectively. In addition, in still another embodiment, the test device does not include the protruding member. In this case, the test device does not need to include the first positioning structure, the second positioning structure, the third positioning structure, the fourth positioning structure, and the positioning pillar. And the base does not need to include the first positioning hole and the second positioning hole.

Refer to Figure 6. Fig. 6 is a side view of the second plate of the testing device in Fig. 1 when pivoting relative to the first plate in the opening direction. In order to pivot the second board 300 relative to the first board 200, the locking member 350 must first be removed. Then, the second plate 300 is pivoted relative to the first plate 200 along the opening direction A. As shown in FIG. 6, when the second board 300 pivots relative to the first board 200 in the opening direction A, the second board 300 drives the detection module 500 away from the bearing surface 101 through the bracket 450, thereby increasing the detection module The space between 500 and the bearing surface 101.

According to the test equipment disclosed in the above embodiment, the detection module is slidably disposed on the bracket fixed on the second board, and the second board is pivotally connected to the first board fixed on the base, so the second board When pivoting relative to the first board, the detection module will be moved away from the bearing surface of the base. When the second board pivots relative to the first board to drive the detection module away from the bearing surface, there is enough space between the detection module and the bearing surface to allow maintenance personnel to replace or repair the detection module in a convenient and efficient manner. Electrical connections in the group.

Although the present invention is disclosed in the foregoing embodiments as above, it is not intended to limit the present invention. Anyone familiar with similar art can make some changes and modifications without departing from the spirit and scope of the present invention. Therefore, the present invention The scope of patent protection for inventions shall be determined by the scope of patent applications attached to this specification.

10: Test equipment 100: Pedestal 101: bearing surface 102: The first positioning hole 103: second positioning hole 120: Slide rail 150: sliding parts 200: The first board 250: convex 251: Perforation 260: The first positioning structure 270: The second positioning structure 300: second board 350: lock firmware 400: pivot 401: The first fixed part 402: second fixed part 403: Pivot shaft 450: bracket 500: detection module 501: Shell 502: Circuit Board 503: Electrical connector 504: side 520: Slider 550: Slider 600: handle 650: third positioning structure 700: Fourth positioning structure 800: positioning column 801: wide section 802: Narrow section 20: Circuit board to be tested D1, D2: diameter A: Opening direction

Fig. 1 is a side view of a circuit board to be tested and a test device according to an embodiment of the present invention. Fig. 2 is a perspective view of the first plate, the protruding member, the second plate, the locking member, and the pivotal member of the testing device in Fig. 1. Fig. 3 is an exploded view of the first plate, the protruding member, the second plate, the locking member and the pivotal member in Fig. 2. Fig. 4 is a partial enlarged view of the top view of the testing device in Fig. 1. FIG. 5 is a partial enlarged view of the schematic side sectional view drawn along the cutting plane line 5-5 in FIG. 4. FIG. Fig. 6 is a side view of the second plate of the testing device in Fig. 1 when pivoting relative to the first plate in the opening direction.

10: Test equipment

100: Pedestal

101: bearing surface

120: Slide rail

150: sliding parts

200: The first board

250: convex

300: second board

400: pivot

450: bracket

500: detection module

501: Shell

502: Circuit Board

503: Electrical connector

504: side

520: Slider

550: Slider

600: handle

800: positioning column

20: Circuit board to be tested

A: Opening direction

Claims (10)

A test equipment for carrying a circuit board to be tested, the test equipment comprising: A base includes a bearing surface for bearing a circuit board to be tested; a first board body disposed on the base; a second board body pivotally connected to the first board body and stacked On the side of the first plate away from the base; a bracket fixed to the second plate; and a detection module slidably disposed on the bracket close to or away from the bearing surface; wherein, when the first plate When the two boards pivot relative to the first board, the second board drives the detection module to approach or move away from the bearing surface through the bracket. For example, the test device described in item 1 of the scope of patent application further includes a locking member that is locked to the first plate body and the second plate body. According to the test equipment described in item 1 of the scope of patent application, the first board is disposed on the bearing surface of the base. According to the test device described in item 1 of the scope of patent application, when the second board is stacked on the first board, the bracket is located on the side of the second board away from the first board. For example, the test equipment described in item 1 of the scope of patent application further includes two pivotal members, each of which includes a first fixing portion, a second fixing portion, and a pivot shaft portion. In the article, the first fixing portion is fixed to the first plate body, the second fixing portion is fixed to the second plate body, and opposite sides of the pivot shaft portion are respectively pivotally connected to the first fixing portion and the first fixing portion. Two fixed part. As for the test equipment described in the first item of the patent application, the detection module includes a housing, a circuit board and a plurality of electrical connections, the housing is slidably arranged on the bracket, and the circuit board is arranged on the housing Body, the electrical connectors are arranged on a side surface of the circuit board facing the carrying surface. The test equipment described in item 1 of the scope of patent application further includes a sliding rail and a sliding member, the sliding rail is arranged on the bearing surface, and the sliding member is arranged on the side of the first plate facing the base And slidably arranged on the slide rail. For example, the test equipment described in item 7 of the scope of patent application further includes a protrusion, a first positioning structure, a second positioning structure, a third positioning structure, and a fourth positioning structure. The protrusion protrudes from the The first plate body, the first positioning structure and the second positioning structure are respectively located on opposite sides of the protruding member, the third positioning structure and the fourth positioning structure are located on the base, when the sliding member drives the second positioning structure When a plate body slides to a first position, the first positioning structure is engaged with the third positioning structure, and when the sliding member drives the first plate body to slide to a second position, the second positioning structure and The fourth positioning structure is engaged with each other. For example, the test device described in item 8 of the scope of the patent application further includes a positioning column that includes a wide-diameter section and a narrow-diameter section connected to each other. The diameter of the wide-diameter section is greater than the diameter of the narrow-diameter section. The narrow-diameter section is movably penetrated through a through hole of the protruding piece, so that the wide-diameter section bears on the side of the protruding piece away from the base. The base further includes a first positioning hole and a second positioning When the first plate is at the first position, the narrow section is located at the first positioning hole, and when the first plate is at the second position, the narrow section is located at the second positioning hole. For example, the test equipment described in item 1 of the scope of the patent application further includes a handle, and the handle is arranged on the detection module.

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