CN112444724A - Test equipment - Google Patents
Test equipment Download PDFInfo
- Publication number
- CN112444724A CN112444724A CN201910837169.5A CN201910837169A CN112444724A CN 112444724 A CN112444724 A CN 112444724A CN 201910837169 A CN201910837169 A CN 201910837169A CN 112444724 A CN112444724 A CN 112444724A
- Authority
- CN
- China
- Prior art keywords
- board
- positioning structure
- disposed
- base
- plate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
- G01R31/2808—Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0416—Connectors, terminals
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2818—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP] using test structures on, or modifications of, the card under test, made for the purpose of testing, e.g. additional components or connectors
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
The invention provides a test device which is used for bearing a circuit board to be tested. The test equipment comprises a base, a first plate body, a second plate body, a support and a detection module. The base comprises a bearing surface. The bearing surface is used for bearing the circuit board to be tested. The first plate body is arranged on the base. The second plate is pivoted to the first plate and is superposed on one side of the first plate, which is far away from the base. The bracket is fixed on the second plate body. The detection module is slidably arranged on the support and is close to or far away from the bearing surface. When the second plate body pivots relative to the first plate body, the second plate body drives the detection module to be close to or far away from the bearing surface through the support.
Description
Technical Field
The invention relates to a test device, in particular a test device for testing circuit boards.
Background
Generally, a test apparatus for performing an In-circuit test (ICT) includes a base and a top mold. The circuit board to be tested is supported on the supporting surface of the base. The upper die is provided with a test probe which protrudes out of the test surface of the upper die, which faces the bearing surface. In addition, the upper die is arranged on the base in a sliding mode and is far away from or close to the base, so that the test probe is electrically connected with or separated from the circuit board to be tested.
However, when the upper mold slides to the position farthest from the base, the space between the bearing surface of the base and the testing surface of the upper mold is still insufficient for the maintenance personnel to replace or maintain the testing probe. Therefore, the maintenance personnel need to remove the cover body of the upper die and take out the circuit board provided with the test probe in the upper die to replace or maintain the test probe, so that the maintenance personnel cannot replace or maintain the test probe in a convenient and efficient manner.
Disclosure of Invention
The present invention provides a testing apparatus, so that the electrical connector in the detection module can be replaced or maintained in a convenient and efficient manner.
The test equipment is used for bearing a circuit board to be tested. The test equipment comprises a base, a first plate body, a second plate body, a support and a detection module. The base comprises a bearing surface. The bearing surface is used for bearing the circuit board to be tested. The first plate body is arranged on the base. The second plate is pivoted to the first plate and is superposed on one side of the first plate, which is far away from the base. The bracket is fixed on the second plate body. The detection module is slidably arranged on the support and is close to or far away from the bearing surface. When the second plate body pivots relative to the first plate body, the second plate body drives the detection module to be close to or far away from the bearing surface through the support.
According to the testing device described in the above embodiment, since the detecting module is slidably disposed on the bracket fixed to the second plate, and the second plate is pivotally connected to the first plate fixed to the base, the second plate can drive the detecting module to move away from the carrying surface of the base when pivoting relative to the first plate. When the second plate body pivots relative to the first plate body to drive the detection module to be far away from the bearing surface, enough space is formed between the detection module and the bearing surface, so that a maintenance worker can replace or maintain the electric connection piece in the detection module in a convenient and efficient mode.
The foregoing description of the present disclosure and the following description of the embodiments are provided to illustrate and explain the principles of the present disclosure and to provide further explanation of the scope of the invention as claimed.
Drawings
Fig. 1 is a side view of a circuit board to be tested and a test apparatus according to an embodiment of the present invention.
Fig. 2 is a perspective view of the first board, the protruding member, the second board, the locking member and the pivot member of the testing apparatus shown in fig. 1.
Fig. 3 is an exploded view of the first plate, the protruding member, the second plate, the locking member and the pivot member shown in fig. 2.
Fig. 4 is a partially enlarged view of a top view of the test apparatus of fig. 1.
Fig. 5 is a partially enlarged side sectional view taken along section line 5-5 in fig. 4.
Fig. 6 is a side view of the second plate of the test apparatus of fig. 1 as it pivots relative to the first plate in an opening direction.
[ List of reference numerals ]
10 test device
100 base
101 carrying surface
102 first positioning hole
103 second positioning hole
120 sliding rail
150 sliding part
200 first plate body
250 convex part
251 through hole
260 first positioning structure
270 second positioning structure
300 second plate body
350 locking part
400 pivoting member
401 first fixed part
402 second fixed part
403 pivot shaft portion
450 rack
500 detection module
501 casing
502 circuit board
503 electrical connection
504 side surface
520 slide block
550 sliding rod
600 handle
650 third positioning structure
700 fourth positioning structure
800 positioning column
801 wide diameter section
802 narrow diameter section
20 circuit board to be tested
D1, D2 diameter
A direction of opening
Detailed Description
The detailed features and advantages of the present invention are described in detail in the following embodiments, which are sufficient for anyone skilled in the art to understand the technical contents of the present invention and to implement the present invention, and the related objects and advantages of the present invention can be easily understood by anyone skilled in the art from the contents described in the present specification, the claims and the drawings. The following examples further illustrate aspects of the present invention in detail, but are not intended to limit the scope of the invention in any way.
Please refer to fig. 1. Fig. 1 is a side view of a circuit board to be tested and a test apparatus according to an embodiment of the present invention.
The present embodiment provides a testing apparatus 10 for carrying a circuit board 20 to be tested. The testing apparatus 10 includes a base 100, a slide rail 120, a sliding member 150, a first board 200, a protrusion 250, a first positioning structure 260, a second positioning structure 270, a second board 300, a locking member 350, two pivoting members 400, a bracket 450, a detection module 500, a sliding block 520, a sliding rod 550, and a handle 600.
The susceptor 100 includes a carrying surface 101. The carrying surface 101 is used for carrying a circuit board 20 to be tested. The slide rail 120 is disposed on the supporting surface 101. The sliding member 150 is slidably disposed on the sliding rail 120, and the first board 200 is disposed on a side of the sliding member 150 opposite to the base 100. That is, the first plate 200 is slidably disposed on the supporting surface 101 of the base 100 through the sliding member 150 and the sliding rail 120.
However, the first plate 200 is not limited to be disposed on the carrying surface 101 of the base 100. In other embodiments, the first plate may also be disposed on the side surface of the base adjacent to the bearing surface, and further, in an embodiment where the first plate is disposed on the side surface of the base adjacent to the bearing surface, the slide rail is disposed on the side surface instead.
However, the testing apparatus 10 is not limited to include the slide rail 120 and the slider 150, and in other embodiments, the testing apparatus does not include the slide rail and the slider, but instead, the rack disposed on the carrying surface is matched with the gear disposed on the first board, so that the first board is slidably disposed on the base.
Please refer to fig. 1, fig. 2 and fig. 3. Fig. 2 is a perspective view of the first board, the protruding member, the second board, the locking member and the pivot member of the testing apparatus shown in fig. 1. Fig. 3 is an exploded view of the first plate, the protruding member, the second plate, the locking member and the pivot member shown in fig. 2.
The protrusion 250 protrudes from one side of the first plate 200, and is, for example, integrally formed with the first plate 200. The first positioning structure 260 and the second positioning structure 270 respectively protrude from two opposite sides of the protruding member 250, and are, for example, positioning pillars.
The second plate 300 is stacked on the first plate 200 at a side away from the base 100. The locking member 350 is locked to the first board 200 and the second board 300.
The test apparatus 10 is not limited to the inclusion of the locking member 350, and in other embodiments, the test apparatus includes two or more locking members. Furthermore, in another embodiment, the test equipment does not include a locking piece.
Each of the two pivoting members 400 includes a first fixing portion 401, a second fixing portion 402 and a pivoting shaft portion 403. In each pivoting member 400, the first fixing portion 401 is fixed to the first board 200, the second fixing portion 402 is fixed to the second board 300, and two opposite sides of the pivoting shaft 403 are respectively pivoted to the first fixing portion 401 and the second fixing portion 402. That is, the first board 200 is pivotally connected to the second board 300 by two pivotal connection members 400.
However, the test apparatus 10 is not limited to two pivots 400. In other embodiments, the testing apparatus includes only one pivot, or in still other embodiments, the testing apparatus does not include a pivot, but instead, the first board is pivoted to the second board by any other suitable means.
Please refer to fig. 1 again. The bracket 450 is fixed to the second plate 300. In addition, when the second board 300 is stacked on the first board 200, the bracket 450 is located on a side of the second board 300 away from the first board 200, but the invention is not limited thereto, and in other embodiments, when the second board is stacked on the first board, the bracket and the pivot joint are located on a same side of the second board.
In this embodiment, the detecting module 500 includes a housing 501, a circuit board 502 and a plurality of electrical connectors 503. The shell 501 is slidably disposed on the support 450 to be close to or far from the bearing surface 101 through the slider 520 and the slide bar 550. The circuit board 502 is disposed on the housing 501. The electrical connection members 503 are disposed on a side 504 of the circuit board 502 facing the carrying surface 101, and are, for example, test probes.
The handle 600 is disposed on the housing 501 of the detection module 500 for being held by a user. The present invention is not limited to the structure of the handle 600, and in other embodiments, the handle includes a holding member and a positioning rod, wherein different sides of the positioning rod are respectively disposed on the housing and the sliding block of the detection module for positioning the housing, and the holding member is disposed on the positioning rod.
Please refer to fig. 1, 4 and 5. Fig. 4 is a partially enlarged view of a top view of the test apparatus of fig. 1. Fig. 5 is a partially enlarged side sectional view taken along section line 5-5 in fig. 4.
In this embodiment, the testing apparatus 10 further includes a third positioning structure 650 and a fourth positioning structure 700. The third positioning structure 650 and the fourth positioning structure 700 are located on the supporting surface 101 of the base 100. In this embodiment, the third positioning structure 650 and the fourth positioning structure 700 are, for example, positioning grooves, and the first positioning structure 260 and the second positioning structure 270 are respectively matched with the third positioning structure 650 and the fourth positioning structure 700.
In addition, in the present embodiment, the testing apparatus 10 further includes a positioning pillar 800. Positioning post 800 includes a wide diameter section 801 and a narrow diameter section 802 connected together. The diameter D1 of the wide section 801 is larger than the diameter D2 of the narrow section 802, and the narrow section 802 is movably disposed through the through hole 251 of the protruding member 250, such that the wide section 801 bears against the side of the protruding member 250 away from the base 100. The base 100 further includes a first positioning hole 102 and a second positioning hole 103.
As shown in fig. 4 and 5, when the sliding member 150 drives the first plate 200 to slide to the first position, the first positioning structure 260 is engaged with the third positioning structure 650, and the narrow-diameter section 802 is located in the first positioning hole 102, so that the first plate 200 is positioned on the base 100.
It should be noted that, since the first board 200 is positioned on the base 100 at the second position in a similar manner to the first board 200 is positioned on the base 100 at the first position, the first board 200 is only exemplarily shown in the drawings.
When the sliding member 150 drives the first board body 200 to slide to the second position, the second positioning structure 270 is engaged with the fourth positioning structure 700, and the narrow-diameter section 802 is located in the second positioning hole 103, so that the first board body 200 is positioned on the base 100.
However, the present invention is not limited to the structures of the first positioning structure 260, the second positioning structure 270, the third positioning structure 650 and the fourth positioning structure 700. In other embodiments, the first positioning structure and the second positioning structure are positioning grooves, and the third positioning structure and the fourth positioning structure are positioning bumps.
Furthermore, the test apparatus 10 is not limited to the inclusion of the projections 250. In other embodiments, the testing apparatus includes two protruding members, in which case, the number of the first positioning structure, the second positioning structure, the third positioning structure, the fourth positioning structure, the positioning posts, the first positioning holes and the second positioning holes is correspondingly adjusted to two, so that two opposite sides of the first plate are positioned on the base through the two protruding members, respectively. In addition, in another embodiment, the testing apparatus does not include the protruding member, in which case, the testing apparatus does not need to include the first positioning structure, the second positioning structure, the third positioning structure, the fourth positioning structure and the positioning post, and the base does not need to include the first positioning hole and the second positioning hole.
Please refer to fig. 6. Fig. 6 is a side view of the second plate of the test apparatus of fig. 1 as it pivots relative to the first plate in an opening direction. In order to pivot the second plate 300 relative to the first plate 200, the locking member 350 is first removed. The second plate 300 is then pivoted relative to the first plate 200 in the opening direction a. As shown in fig. 6, when the second board 300 pivots relative to the first board 200 along the opening direction a, the second board 300 drives the detecting module 500 to be away from the carrying surface 101 through the bracket 450, so as to enlarge the space between the detecting module 500 and the carrying surface 101.
According to the testing device described in the above embodiment, since the detecting module is slidably disposed on the bracket fixed to the second plate, and the second plate is pivotally connected to the first plate fixed to the base, the second plate can drive the detecting module to move away from the carrying surface of the base when pivoting relative to the first plate. When the second plate body pivots relative to the first plate body to drive the detection module to be far away from the bearing surface, enough space is formed between the detection module and the bearing surface, so that a maintenance worker can replace or maintain the electric connection piece in the detection module in a convenient and efficient mode.
While the present invention has been described with reference to the above embodiments, it will be understood by those skilled in the art that various changes in form and details may be made therein without departing from the spirit and scope of the invention as defined by the appended claims.
Claims (10)
1. A kind of test equipment, in order to bear the weight of the circuit board to be measured, this test equipment includes:
the base comprises a bearing surface, and the bearing surface is used for bearing the circuit board to be tested;
the first plate body is arranged on the base;
the second plate body is pivoted to the first plate body and is superposed on one side of the first plate body, which is far away from the base;
the bracket is fixed on the second plate body; and
the detection module is slidably arranged on the support and is close to or far away from the bearing surface;
when the second plate body pivots relative to the first plate body, the second plate body drives the detection module to be close to or far away from the bearing surface through the support.
2. The test apparatus of claim 1, further comprising a locking member, wherein the locking member is locked to the first board and the second board.
3. The testing apparatus of claim 1, wherein the first plate is disposed on the carrying surface of the base.
4. The test apparatus of claim 1, wherein the bracket is disposed on a side of the second board body away from the first board body when the second board body is stacked on the first board body.
5. The testing apparatus of claim 1, further comprising two pivotal members, each of the two pivotal members comprising a first fixing portion, a second fixing portion and a pivotal shaft portion, wherein, in each of the two pivotal members, the first fixing portion is fixed to the first board body, the second fixing portion is fixed to the second board body, and opposite sides of the pivotal shaft portion are respectively pivoted to the first fixing portion and the second fixing portion.
6. The testing apparatus of claim 1, wherein the testing module comprises a housing slidably disposed on the frame, a circuit board disposed on the housing, and a plurality of electrical connectors disposed on a side of the circuit board facing the carrying surface.
7. The testing apparatus of claim 1, further comprising a slide rail disposed on the carrying surface and a sliding member disposed on a side of the first board facing the base and slidably disposed on the slide rail.
8. The testing apparatus of claim 7, further comprising a protrusion, a first positioning structure, a second positioning structure, a third positioning structure and a fourth positioning structure, wherein the protrusion protrudes from the first board, the first positioning structure and the second positioning structure are respectively located at two opposite sides of the protrusion, the third positioning structure and the fourth positioning structure are located on the base, when the slider drives the first board to slide to the first position, the first positioning structure is engaged with the third positioning structure, and when the slider drives the first board to slide to the second position, the second positioning structure is engaged with the fourth positioning structure.
9. The testing apparatus of claim 8, further comprising a positioning post, wherein the positioning post comprises a wide section and a narrow section connected to each other, the diameter of the wide section is larger than that of the narrow section, the narrow section is movably disposed through the through hole of the protruding member, such that the wide section is supported by the protruding member at a side thereof away from the base, the base further comprises a first positioning hole and a second positioning hole, the narrow section is disposed in the first positioning hole when the first plate is located at the first position, and the narrow section is disposed in the second positioning hole when the first plate is located at the second position.
10. The test apparatus of claim 1, further comprising a handle disposed on the detection module.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910837169.5A CN112444724A (en) | 2019-09-05 | 2019-09-05 | Test equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910837169.5A CN112444724A (en) | 2019-09-05 | 2019-09-05 | Test equipment |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN112444724A true CN112444724A (en) | 2021-03-05 |
Family
ID=74733574
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201910837169.5A Withdrawn CN112444724A (en) | 2019-09-05 | 2019-09-05 | Test equipment |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN112444724A (en) |
Citations (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6043667A (en) * | 1997-04-17 | 2000-03-28 | International Business Machines Corporation | Substrate tester location clamping, sensing, and contacting method and apparatus |
| US20030132767A1 (en) * | 2000-02-25 | 2003-07-17 | Tervo Paul A. | Membrane probing system |
| TWM291528U (en) * | 2005-12-27 | 2006-06-01 | Inventec Corp | Testing apparatus |
| CN2879195Y (en) * | 2006-01-10 | 2007-03-14 | 英业达股份有限公司 | Testing device |
| CN200979561Y (en) * | 2006-12-15 | 2007-11-21 | 英业达股份有限公司 | A circuit board fixing mechanism |
| CN101082632A (en) * | 2006-06-02 | 2007-12-05 | 金宝电子工业股份有限公司 | Testing tool for circuit board |
| TW200819764A (en) * | 2006-10-31 | 2008-05-01 | Chroma Ate Inc | Semiconductor testing system with precise positioning interface |
| TW200837353A (en) * | 2007-03-05 | 2008-09-16 | Chroma Ate Inc | Rotation-press cover inspection/test apparatus and the tester having the apparatus |
| CN206248693U (en) * | 2016-12-13 | 2017-06-13 | 深圳市利达泰克科技有限公司 | A kind of pair of depression bar circuit board function test fixture |
| TWI634333B (en) * | 2017-11-30 | 2018-09-01 | 京元電子股份有限公司 | Connecting interface for semiconductor testing device |
-
2019
- 2019-09-05 CN CN201910837169.5A patent/CN112444724A/en not_active Withdrawn
Patent Citations (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6043667A (en) * | 1997-04-17 | 2000-03-28 | International Business Machines Corporation | Substrate tester location clamping, sensing, and contacting method and apparatus |
| US20030132767A1 (en) * | 2000-02-25 | 2003-07-17 | Tervo Paul A. | Membrane probing system |
| TWM291528U (en) * | 2005-12-27 | 2006-06-01 | Inventec Corp | Testing apparatus |
| CN2879195Y (en) * | 2006-01-10 | 2007-03-14 | 英业达股份有限公司 | Testing device |
| CN101082632A (en) * | 2006-06-02 | 2007-12-05 | 金宝电子工业股份有限公司 | Testing tool for circuit board |
| TW200819764A (en) * | 2006-10-31 | 2008-05-01 | Chroma Ate Inc | Semiconductor testing system with precise positioning interface |
| CN200979561Y (en) * | 2006-12-15 | 2007-11-21 | 英业达股份有限公司 | A circuit board fixing mechanism |
| TW200837353A (en) * | 2007-03-05 | 2008-09-16 | Chroma Ate Inc | Rotation-press cover inspection/test apparatus and the tester having the apparatus |
| CN206248693U (en) * | 2016-12-13 | 2017-06-13 | 深圳市利达泰克科技有限公司 | A kind of pair of depression bar circuit board function test fixture |
| TWI634333B (en) * | 2017-11-30 | 2018-09-01 | 京元電子股份有限公司 | Connecting interface for semiconductor testing device |
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| WW01 | Invention patent application withdrawn after publication |
Application publication date: 20210305 |
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