JP4490247B2 - Circuit board testing equipment - Google Patents

Description

  The present invention relates to a circuit board test apparatus that uses a probe to test a circuit board developed at a development site.

  Conventionally, many test apparatuses for circuit boards for mass-produced products on which electronic parts such as ICs, resistors, capacitors, etc. are mounted have been proposed as shown in Patent Document 1, for example. A circuit board to be tested with such a circuit board testing apparatus has a design and shape that takes into account the positions of the points to be measured and the shape of the circuit board so that they can be easily measured with the testing apparatus.

On the other hand, a circuit board developed at a development site has the following characteristics, and has a problem that it cannot be tested by a circuit board testing apparatus for mass-produced products.
(1) Circuit boards vary in size, and the number and position of points to be measured vary.

(2) Electronic components are mounted up to the edge of the circuit board, and it may be difficult to hold the circuit board.
(3) The measurement may be performed while the circuit board is operated, but the power supply or the signal input / output connector may interfere with the board holder of the mass-produced circuit board testing apparatus and may interfere with the connection.

Therefore, at the development site, an operator directly holds the probe or uses a flexible arm provided at the tip of the probe to contact the probe with a predetermined measurement point on the circuit board for measurement. Is the current situation.
JP 2002-296315 A

When measuring by bringing the probe into contact with the point to be measured, in order to perform stable measurement, it is necessary to make contact with an appropriate pressure from the viewpoint of preventing contact failure and noise mixing.
However, the performance of a semiconductor such as an IC mounted on a circuit board is improved, the terminals are downsized, the number of terminals is increased, and the pitch between the terminals is narrowed.

  For this reason, it is difficult for the operator to hold the probe directly or to use a flexible arm provided at the tip of the probe to bring the tip of the probe into contact with the measurement point of the circuit board with an appropriate pressure. There is a problem that the load becomes large and a difference due to work ability occurs.

  The present invention has been made in view of the above problems, and an object of the present invention is to provide a circuit board testing apparatus capable of easily bringing a probe into contact with a measurement point of a circuit board with an appropriate pressure.

The invention according to claim 1, which solves the above problem, includes a circuit board holder that holds a circuit board, and a probe holder that holds a probe that contacts the measurement point of the circuit board and measures the measurement point. The probe holder is disposed along the guide, and is supported so as to be rotatable about a central axis and movable in the direction of the central axis. A threaded rod, a slider movably engaged with the guide, provided with the probe, and formed with a female threaded hole into which the threaded rod is screwed, and a hole through which the threaded rod is inserted , the screw A stopper that prohibits movement in one of the movements of the rod in the central axis direction, an elastic member that abuts against the stopper and the slider, and pushes the slider in a direction that the screw rod abuts against the stopper; Kara A circuit board testing apparatus characterized by having a probe pressing mechanism.

  Due to the elastic member of the probe pressing mechanism, the screw rod comes into contact with the stopper, and movement in one direction is prohibited. Further, since the slider is movably engaged with the guide, rotation is prohibited.

  In this state, when the screw rod is rotated in one direction, only the slider is guided by the guide and moved in one direction of the guide, and the probe provided on the slider contacts the point to be measured on the circuit board.

  Further, when the screw rod is rotated in one direction, the slider and the screw rod are moved in the other direction of the guide. At this time, the elastic member is elastically deformed, and the probe is pressed against the measurement point by the elastic repulsive force.

The invention according to claim 2 is the circuit board testing apparatus according to claim 1, further comprising a rotation mechanism that allows the probe to rotate about an axis parallel to the axis of the probe.
The invention according to claim 3
The circuit board is substantially rectangular and is arranged substantially perpendicular to the floor;
The circuit board holder is
A first frame facing a lower side of the circuit board;
A second frame attached to the first frame and facing one side of the circuit board;
A third frame attached to the first frame and facing the other side of the circuit board;
A slide block provided at least one for each of the first frame, the second frame, and the third frame, and movably provided along the first frame, the second frame, and the third frame;
A stopper mechanism that prohibits movement of the slide block;
A holding claw provided on the slide block and formed with a groove into which an edge of the circuit board is fitted;
3. The circuit board testing apparatus according to claim 1, wherein at least one of the second frame and the third frame is movable along the first frame.

  The invention according to claim 4 is the circuit board testing apparatus according to claim 3, characterized in that there is no member other than the holding claws on the plane on which the circuit board is arranged.

  According to the first aspect of the present invention, since the slider provided with the probe is pushed by the elastic member in the direction in which the screw rod comes into contact with the stopper, the backlash caused by screwing between the screw rod and the female screw hole is small. Become.

Therefore, the probe can be accurately moved to a desired position.
Further, after the probe contacts the point to be measured on the circuit board, the probe can be brought into contact with the point to be measured on the circuit board with an appropriate pressure by further rotating the screw rod.

  According to the second aspect of the invention, for example, in the case of a probe in which the tip side is bifurcated, one of which is a signal detector and the other is a ground, the probe is centered on an axis parallel to the probe axis. By rotating the, the signal detection unit and the ground can be brought into contact with an optimum place, and accurate measurement can be performed.

  According to the invention of claim 3, the first frame facing the lower side of the circuit board, the second frame attached to the first frame and facing one side of the circuit board, and the first frame A third frame that is attached to the frame and faces the other side of the circuit board; and at least one of the second frame and the third frame extends along the first frame. By making the circuit board movable, circuit boards of various sizes can be held if the circuit board is substantially rectangular.

  Since the slide block is provided so as to be movable along the first frame, the second frame, and the third frame, if the circuit board is rectangular, each slide block is moved when the slide block is moved. The holding claws provided on the block always move while contacting the lower edge of the circuit board and the edges of the two side edges. Therefore, even when the slide block is moved in order to avoid the electronic components mounted on the edge of the circuit board, the work is facilitated because the posture of the circuit board does not change.

  According to the fourth aspect of the present invention, there is no member other than the holding claws on the plane on which the circuit board is arranged. The output connector can be easily connected to the circuit board.

  Next, exemplary embodiments of the present invention will be described with reference to the drawings. First, the overall configuration of the circuit board testing apparatus according to this embodiment will be described with reference to FIG. The circuit board testing apparatus according to this embodiment includes a circuit board holder 3 that holds a rectangular circuit board 1 in a vertical direction with respect to a base 11 that is parallel to the floor, and a measurement point in contact with a measurement point of the circuit board 1. It comprises a probe holder 7 that holds a probe 5 for measuring points. In the present specification, the direction perpendicular to the base 11 is the z axis, the direction perpendicular to the circuit board 1 on the plane parallel to the base 11 is the x axis, and the circuit board is on the plane parallel to the base 11. A direction parallel to 1 is taken as a y-axis.

  Here, the probe holder will be described with reference to FIGS. 3 is a top view of the probe holder shown in FIG. 2, FIG. 4 is a front view of the probe holder shown in FIG. 2, and FIG. 5 is a right side view of FIG.

  The lower part of the probe holder 7 is a magnet stand 13 that is attracted to the base 11 (see FIG. 2) by magnetic attraction. A shaft 15 extending in a direction perpendicular to the base 11 (z-axis direction) is fixed to the magnet stand 13.

  A lifting stage 17 is movably provided along the shaft 15. The elevating stage 17 includes an elevating stage main body 19 and an elevating block 23 provided in the elevating stage main body 19 and having a hole 21 through which the shaft 15 is inserted. A slit 25 extending from the outer wall surface of the lifting block 23 to the hole 21 is formed in the lifting block 23. The slit 25 forms a first arm portion 27 and a second arm portion 29 in the elevating block 23. The first arm portion 27 is formed with a hole 27a extending in the horizontal direction, and the second arm portion 29 is formed with a female screw hole 29a facing the hole 27a and extending in the horizontal direction. A large-diameter portion 31 a having a larger diameter than the hole 27 a of the first arm portion 27 and a large-diameter portion 31 a are provided so as to pass through the hole 27 a of the first arm portion 27, and the female screw of the second arm portion 29 A clamping screw 31 having an external thread portion 31b that is screwed into the hole 29a is provided. By rotating the fastening screw 31, the interval between the slits 25 of the elevating block 23 is widened or narrowed. That is, the diameter of the hole 21 of the elevating block 23 is reduced or enlarged. By changing the diameter of the hole 21 of the lifting block 23, the lifting stage 17 can be held at a desired height.

  A biaxial moving stage 30 is provided in the lifting stage main body 19 of the lifting stage 17. The biaxial moving stage 30 moves in a direction parallel to the circuit board 1 (y-axis direction) on a plane parallel to the base 11 with respect to the fixed base 33 provided on the lifting stage main body 19 and the fixed base 33. The y stage 35 is provided, and the z stage 37 is movable on the y stage 35 in a direction (z-axis direction) perpendicular to the base 11.

  The mechanism that enables the y stage 35 to move with respect to the fixed base 33 and the mechanism that enables the z stage 37 to move with respect to the y stage 35 are well known, but examples include the following mechanisms.

  The y stage 35 will be described as an example. A guide provided on the fixed base 33 and extending in the y-axis direction so that the y stage 35 is movably engaged, and either the y stage 35 or the fixed base 33 The screw rod provided so as to be rotatable along the guide in a state in which axial movement is prohibited, and provided on one of the y stage 35 and the fixed base 33, and screwed into the screw rod. There is a feed screw mechanism in which the y stage 35 moves along a guide (in the y-axis direction) by rotating a screw rod. A guide provided on the fixed base 33 and extending in the y-axis direction so that the y stage 35 is movably engaged, and provided on either the y stage 35 or the fixed base 33 along the guide. And the y stage 35 and the fixed base 33. The y stage 35 is guided in the y-axis direction by rotating the pinion. There is a rack and pinion mechanism that moves along.

  In the figure, 39 is a y-stage drive knob, and 41 is a z-stage drive knob. By rotating these knobs, z is moved to a desired position on a plane parallel to the circuit board 1 (xz plane). The stage 37 can be moved.

  A probe pressing mechanism 51 is provided on the z stage 37. The probe pressing mechanism 51 will be described with reference to FIG. A support plate 53 extending upward is provided on the surface of the z stage 37 facing the circuit board 1. A base 55 is attached to the upper surface of the support plate 53. On the base 55, a linear guide 57 extending in a direction perpendicular to the circuit board 1 (x-axis direction) is provided.

The base 55 is formed with a bent portion 55a bent upward in a direction parallel to the circuit board 1, and a hole 55b is formed in the bent portion 55a.
The screw rod 59 is disposed along the guide 57, and one end side is inserted into the hole 55b of the base 55, and is supported so as to be rotatable about the central axis and movable in the central axis direction. Further, one end side of the screw rod 59 is provided so that the operation knob 61 is integrated with the screw rod 59 through the hole 55 b of the base 55. The connection portion 61 a of the operation knob 61 with the screw rod 59 is set larger than the diameter of the hole 55 b of the bent portion 55 a of the base 55.

  Therefore, the bent portion 55a of the base 55 moves in one direction (direction toward the circuit board 1) of the movement of the screw rod 59 in the central axis direction when the connecting portion 61a of the operation knob 61 abuts. It is a prohibited stopper.

A slider 63 is movably engaged with the guide 57. The slider 63 is formed with a female screw hole 63a into which the other end side of the screw rod 59 is screwed.
Then, the screw rod 59 is wound, and the slider 63 is urged by a biasing force of a spring (elastic member) 65 whose one end is in contact with the bent portion 55a (stopper) of the base 55 and whose other end is in contact with the slider 63. The connecting portion 61a (screw rod 59) of the operation knob 61 contacts the bent portion 55a (stopper) of the base 55, and the screw rod 59 is prohibited from moving in one direction (direction approaching the circuit board 1). . Further, since the slider 63 is movably engaged with the guide 57, the rotation is prohibited.

For this reason, when the operation knob 61 is rotated, the slider 63 moves along the guide 57.
A probe 73 is provided on the slider 63. The probe 73 of this embodiment is disposed in the probe storage pipe 75. A female screw hole is formed in the cylindrical surface of the probe storage pipe 75, and a fixing screw 77 is screwed from the outside of the probe storage pipe 75. The fixing screw 77 contacts the outer surface of the probe 73 and presses the probe 73 against the inner wall surface of the probe storage pipe 75, whereby the probe 73 is fixed to the probe storage pipe 75. In this embodiment, the external thread portion of the fixing screw 77 protruding from the outer peripheral surface of the probe storage pipe 75 is wound, with one end on the head of the fixing screw 77 and the other end on the probe storage pipe 75. The fixing screw 77 is prevented from loosening by a spring 79 that abuts the outer peripheral surface of the fixing screw 77. Furthermore, a signal detection unit 73a that contacts the measurement point is formed at the tip of the probe 73 of this embodiment.

  The probe storage pipe 75 is held by a pipe holding member 81 having a C-shaped cross section that covers the peripheral surface of the probe storage pipe 75. The pipe holding member 81 is attached to the slider 63 via a bracket 83.

  As shown in FIGS. 3 and 5, the pipe holding member 81 is formed with a female screw hole from the outer surface toward the inner surface, and is provided with a fixing screw 83 that is screwed into the female screw hole. The fixing screw 83 contacts the outer surface of the probe storage pipe 75 and presses the probe storage pipe 75 against the inner wall surface of the pipe holding member 81, whereby the probe storage pipe 75 is fixed to the pipe holding member 81. Furthermore, by loosening the fixing screw 83, the probe storage pipe 75 (probe 73) can rotate around an axis parallel to the axis of the probe 73. That is, the pipe holding member 81 and the fixing screw 83 constitute a rotation mechanism that allows the probe 73 to rotate about an axis parallel to the axis of the probe 73.

  Next, the circuit board holder 3 will be described with reference to FIGS. 2 and 6 to 7. 6 is a top view of the circuit board holder shown in FIG. 2, and FIG. 7 is a left side view of the circuit board holder shown in FIG. Moreover, the circuit board holder 3 of FIG. 2 has shown the cross section in the cutting line AA of FIG.

  As shown in FIG. 7, the circuit board holder 3 includes a first frame 121 that faces the lower side of the circuit board 1, a second frame 123 that faces one side of the circuit board 1, and the other side of the circuit board 1. And a third frame 125 facing the side.

  The lower part of the circuit board holder 3 is a magnet stand 101 that is attracted to the base 11 by magnetic attraction. A shaft 103 extending in a direction perpendicular to the base 11 (z-axis direction) is fixed to the magnet stand 101.

  As shown in FIG. 6, an elevating block 105 is provided at a substantially central portion of the first frame 121. The lifting block 105 is formed with a hole 107 through which the shaft 103 is inserted. A slit 109 extending from the outer wall surface of the lifting block 105 to the hole 107 is formed in the lifting block 105. A first arm portion 111 and a second arm portion 113 are formed in the elevating block 105 by the slit 109. The first arm portion 111 is formed with a hole 111a extending in the horizontal direction, and the second arm portion 113 is formed with a female screw hole 113a facing the hole 111a and extending in the horizontal direction. A large-diameter portion 115a having a diameter larger than the hole 111a of the first arm portion 111 and a large-diameter portion 115a are inserted into the hole 111a of the first arm portion 111, and the female screw of the second arm portion 113 is inserted. A tightening screw 115 having a male screw portion 115b screwed into the hole 113a is provided. By rotating the fastening screw 115, the interval between the slits 109 of the elevating block 105 is widened or narrowed. That is, the diameter of the hole 107 of the elevating block 105 is reduced or enlarged. By changing the diameter of the hole 107 of the lift block 105, the lift block 105 (first frame 121) can be held at a desired height.

  The first frame 121, the second frame 123, and the third frame 125 all have the same cross-sectional shape, and are bent at approximately 90 degrees from the base B and one side of the base B as shown in FIG. The first side portion C and the second side portion D bent from the other side portion of the base portion B in the same direction as the first side portion D by the same angle. A guide hole E extending in the longitudinal direction of each frame is formed in the base portion B of the first frame 121, the second frame 123, and the third frame 125.

  Further, the slide block F is movably engaged in a space surrounded by the base B, the first side C, and the second side D of each frame. A female screw hole G is formed on the surface of the slide block F facing the base B of each frame. On the other hand, a fastening screw H is disposed outside each frame. The tightening screw H is connected to the operating portion I and the operating portion I having a diameter larger than the narrower width of the guide hole E, is inserted through the guide hole E of each frame, and the female screw hole G of the slide block F And an external thread portion J that is screwed onto the.

  By loosening the tightening screw H, the slide block F can move along the guide hole E of each guide. By tightening the tightening screw H, the movement of the slide block F is prohibited.

  Next, the attachment structure of the first frame 121, the second frame 123, and the third frame 125 will be described. As shown in FIG. 7, slide blocks F ′ having fastening screws H ′ are disposed on both sides of the first frame 121. The slide block F ′ protrudes from a space surrounded by the base portion B, the first side portion C, and the second side portion D of the first frame 121. The protruding portions are the second frame 123 and the third frame. The projecting portion is fitted into a space surrounded by the base portion B of 125, the first side portion C, and the second side portion D, and the second frame 123, It is attached to three frames 125. Therefore, the second frame 123 and the third frame 125 can move along the first frame 121 by loosening the tightening screw H ′, and the second frame 123 and the third frame can be moved by tightening the tightening screw H ′. The movement of 125 is prohibited.

  Next, a mechanism for holding the circuit board 1 on the first frame 121, the second frame 123, and the third frame 125 will be described. As shown in FIGS. 2, 6, and 7, two slide blocks F each having a fastening screw H are disposed at the center of the first frame 121. One slide block F having a fastening screw H is disposed on each of the second frame 123 and the third frame 125.

  Each slide block F protrudes from a space surrounded by the base B, the first side C, and the second side D of each frame, and the holding claw 201 has two screws 203 on the protruding portion. It is attached using. Here, the holding claw 201 will be described with reference to FIG. FIGS. 9A and 9B are diagrams illustrating the holding claws. FIG. 9A is a front view, FIG. 9B is a top view, FIG. 9C is a right side view of FIG. 9A, and FIG. ) Is a cross-sectional view taken along a cutting line KK in FIG. In these drawings, the holding claws 201 have a prismatic shape, and FIG. (A) which is a front view shows an upper surface or a lower surface of the prism. Two holes 205 through which the screws 203 are inserted are formed from the upper surface to the lower surface of the holding claw 201. As shown in FIG. 8, the holding claw 201 is attached to the slide block F so that the ridge line 201 c between the first side surface 201 a and the second side surface 201 b of the holding claw 201 faces the circuit board 1.

  A groove 207 is formed from the first side surface 201a to the second side surface 201b so as to intersect the ridgeline 201c and into which the edge of the circuit board 1 is fitted. The cross-sectional shape of the groove 207 is V-shaped so that circuit boards of various thicknesses can be fitted.

As shown in FIGS. 2, 6, and 8, there is no member other than the holding claws 201 on the plane on which the circuit board 1 is arranged.
Next, the operation of the circuit board testing apparatus having such a configuration will be described.

(1) Setting the Circuit Board 1 to the Circuit Board Holder 3 First, the circuit board holder 3 is fixed on the base 11 with the magnetic attraction force of the magnet stand 101. After the tightening screw 115 is loosened and the first frame 121, the second frame 123, and the third frame 125 are moved up and down to a desired height (Z-axis direction), the tightening screw 115 is tightened to hold its position.

  Next, the space | interval of the 2nd flame | frame 123 of the circuit board holder 3 and the 3rd flame | frame 125 is opened so that the circuit board 1 cannot be hold | maintained. With the lower edge portion of the circuit board 1 fitted in the grooves 207 of the two holding claws 201 of the first frame 121, one side edge portion of the circuit board 1 is set to the groove 207 of the holding claws 201 of the second frame 123. To fit. Next, both or one of the second frame 123 and the third frame 125 is moved along the first frame 121, and the other side edge portion of the circuit board 1 is inserted into the groove 207 of the holding claw 201 of the third frame 125. Mate.

(2) Setting the probe holder 7 The probe holder 7 is fixed on the base 11 by the magnetic attraction force of the magnet stand 113, and rough positioning is performed on the X-axis-Y-axis plane. Next, the tightening screw 31 is loosened and the biaxial moving stage 30 is moved up and down to a desired height (Z-axis direction), and then the tightening screw 31 is tightened to hold its position.

Next, the operation knob 61 of the probe pressing mechanism 51 is turned to bring the probe 73 closer to the circuit board 1 and move the tip of the probe 73 to the vicinity of the point to be measured on the circuit board 1.
Next, the y stage driving knob 39 and the z stage driving knob 41 of the biaxial moving stage 30 are operated to position the probe 73 in the plane (yz plane) of the circuit board 1.

Next, as shown in FIG. 10A, the operation knob 61 of the probe pressing mechanism 51 is turned to bring the signal detection unit 73 a at the tip of the probe 73 into contact with the measurement point P of the circuit board 1.
Further, when the operation knob 61 is turned in the same direction, the signal detection unit 73a of the probe 73 is in contact with the measurement point P of the circuit board 1, so that as shown in FIG. The members, that is, the slider 63, the pipe holding member 81, the probe storage pipe 75, the probe 73, and the screw rod 59 are retracted, and the elastic repulsion force of the spring 65 is increased. It contacts the measurement point P of the substrate 1.

According to the probe holder 7 having such a configuration, the following effects can be obtained.
(1) In the probe pressing mechanism 51, the slider 63 provided with the probe 73 is pressed by the spring 65 in the direction in which the screw rod 59 comes into contact with the bent portion 55 a (stopper) of the base 55. 59 and the backlash of screwing with the female screw hole 63a are reduced. Therefore, the probe 73 can be accurately moved to a desired position.

 (2) After the probe 73 comes into contact with the measurement point P of the circuit board 1, the operation knob 61 is further rotated, so that the signal detection unit 73 a of the probe 73 is made to measure the measurement point P of the circuit board 1 with an appropriate pressure. Can be contacted.

 (3) By loosening the fixing screw 83, the probe storage pipe 75 (probe 73) can rotate about an axis parallel to the axis of the probe 73. Therefore, for example, as shown in FIG. 11, when the tip of the probe 73 has a bifurcated shape, one of which is a signal detection unit 73a and the other is a ground 73b, the axis is parallel to the axis of the probe 73. By rotating the probe 73, the signal detection unit 73a and the ground 73b can be brought into contact with an optimum place, and accurate measurement can be performed.

Moreover, according to the circuit board holder 3 having such a configuration, the following effects can be obtained.
(1) A first frame 121 facing the lower side of the circuit board 1, a second frame 123 attached to the first frame 121, facing one side of the circuit board 1, and a first frame 121, The circuit board 1 has a third frame 125 facing the other side of the circuit board 1, and the second frame 123 and the third frame 125 are movable along the first frame 121. If it is substantially rectangular, circuit boards of various sizes can be held.

 (2) Since the slide block F is provided to be movable along the first frame 121, the second frame 123, and the third frame 125, if the circuit board 1 is rectangular, the slide blocks F are moved. In this case, the holding claws 201 provided in each slide block F always move while contacting the lower side of the circuit board 1 and the edges of the two side sides. Therefore, even when moving the slide block F in order to avoid the electronic components mounted on the edge of the circuit board 1, the posture of the circuit board 1 does not change, so that the operation is facilitated.

 (3) Since there is no member other than the holding claws 201 on the plane on which the circuit board 1 is arranged, when measuring while operating the circuit board 1, it is easy to connect the power supply and signal input / output connector. It can be connected to the circuit board 1.

  The present invention is not limited to the above embodiment. In the above embodiment, the second frame 123 and the third frame 125 are movable along the first frame 121, but it is sufficient that at least one of the frames is movable with respect to the first frame 121.

It is a block diagram of a probe pressing mechanism. It is a figure explaining the whole structure of a circuit board testing apparatus. It is a top view of the probe holder shown in FIG. It is a front view of the probe holder shown in FIG. FIG. 5 is a right side view of FIG. 4. It is a top view of the circuit board holder shown in FIG. It is a left view of the circuit board holder shown in FIG. It is a perspective view of a frame, a slide block, and a holding claw. FIG. 10 is a diagram for explaining the holding claw of FIG. 9, where (a) is a front view, (b) is a top view, (c) is a right side view of (a), and (d) is (a). It is sectional drawing in the cutting | disconnection line KK of a figure. It is a figure explaining the action | operation of a probe pressing mechanism. It is a figure explaining the other example of a form of the front-end | tip part of a probe.

Explanation of symbols

55a Bent part (stopper)
57 Guide 59 Threaded rod 63 Slider 63a Female thread hole 65 Spring (elastic member)

Claims (4)

A circuit board holder for holding the circuit board;
A probe holder for holding a probe that contacts the measurement point of the circuit board and measures the measurement point;
A circuit board testing apparatus having
The probe holder is
A linear guide,
A screw rod disposed along the guide and supported so as to be rotatable about a central axis and movable in the direction of the central axis;
A slider movably engaged with the guide, provided with the probe, and formed with a female screw hole into which the screw rod is screwed;
A stopper having a hole through which the screw rod is inserted, and prohibiting movement in one of the movements of the screw rod in the central axis direction;
An elastic member that contacts the stopper and the slider and pushes the slider in a direction in which the screw rod contacts the stopper;
A circuit board testing apparatus comprising a probe pressing mechanism comprising:   The circuit board testing apparatus according to claim 1, further comprising a rotation mechanism that allows the probe to rotate about an axis parallel to the axis of the probe. The circuit board is substantially rectangular and is arranged substantially perpendicular to the floor;
The circuit board holder is
A first frame facing a lower side of the circuit board;
A second frame attached to the first frame and facing one side of the circuit board;
A third frame attached to the first frame and facing the other side of the circuit board;
A slide block provided at least one for each of the first frame, the second frame, and the third frame, and movably provided along the first frame, the second frame, and the third frame;
A stopper mechanism that prohibits movement of the slide block;
A holding claw provided on the slide block and formed with a groove into which an edge of the circuit board is fitted;
3. The circuit board testing apparatus according to claim 1, wherein at least one of the second frame and the third frame is movable along the first frame.   4. The circuit board testing apparatus according to claim 3, wherein there is no member other than the holding claws on a plane on which the circuit board is disposed.

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