TW202108277A - Machine-learning system for laser processing device and machine-learning method - Google Patents

Machine-learning system for laser processing device and machine-learning method Download PDF

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TW202108277A
TW202108277A TW109110961A TW109110961A TW202108277A TW 202108277 A TW202108277 A TW 202108277A TW 109110961 A TW109110961 A TW 109110961A TW 109110961 A TW109110961 A TW 109110961A TW 202108277 A TW202108277 A TW 202108277A
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laser processing
processing device
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豆野和延
鈴木正美
西尾修
徳岡哲
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日商片岡製作所股份有限公司
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    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23KSOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K26/00Working by laser beam, e.g. welding, cutting or boring
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23KSOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K26/00Working by laser beam, e.g. welding, cutting or boring
    • B23K26/02Positioning or observing the workpiece, e.g. with respect to the point of impact; Aligning, aiming or focusing the laser beam
    • B23K26/04Automatically aligning, aiming or focusing the laser beam, e.g. using the back-scattered light
    • GPHYSICS
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Abstract

In order to promote automation of a portion or the entirety of the operations of a plurality of laser processing devices, this machine-learning system for a laser processing device is configured which includes: a learning data storage unit 101 which stores acquired learning data that is a set of images captured by a camera sensor for capturing images of objects to be processed respectively provided in the plurality of laser processing devices that irradiate target positions with laser light in order to correct defects generated in the objects to be processed, and additional information that suggests, at least in a corresponding image, a defect position of the object to be processed or a target position to be irradiated with the laser light; and a learning unit 102 which generates, by using a learning data group stored in the learning data storage unit 101, a learnt model in which the image of the object to be processed, which is captured with the camera sensor provided in the laser processing device, is taken as an input and the defect position or the target position at least in the image is taken as an output.

Description

雷射處理裝置用的機械學習系統及機械學習方法Machine learning system and machine learning method for laser processing device

本發明有關實施朝向被處理物上的目標位置照射雷射光來進行處理之雷射處理裝置的控制。The present invention relates to the control of a laser processing device that performs processing by irradiating laser light toward a target position on an object to be processed.

作為雷射處理裝置的一種,可以舉例有修正在液晶顯示器模組、電漿顯示器模組、有機電激發光(Electro-Luminescence)顯示器模組、無機EL顯示器模組、微型LED(Light-Emitting Diode)顯示器模組、透明導電膜基板或是濾色片等產生的缺陷(或是不良)之雷射修理裝置(例如,參閱下述專利文獻)。 [先前技術文獻] [專利文獻]As a kind of laser processing device, there can be exemplified corrections in liquid crystal display modules, plasma display modules, electro-luminescence display modules, inorganic EL display modules, and micro LEDs (Light-Emitting Diode). ) Laser repair device for defects (or defects) caused by display modules, transparent conductive film substrates, or color filters (for example, refer to the following patent documents). [Prior Technical Literature] [Patent Literature]

[專利文獻1] 日本特開2005-274709號專利公報[Patent Document 1] Japanese Patent Application Publication No. 2005-274709

[發明欲解決之課題][The problem to be solved by the invention]

在這種的雷射處理裝置中,為了精確檢測被處理物上的缺陷所存在的位置並修正其缺陷,被要求精確照射雷射光到必要的目標位置。In this kind of laser processing device, in order to accurately detect the position of the defect on the processed object and correct the defect, it is required to accurately irradiate the laser light to the necessary target position.

現狀下,被處理物上的缺陷位置或照射雷射光的目標位置係肉身的人類也就是操作人員目視並分析拍攝了被處理物的影像而發現。再加上,操作人員經由透過搖桿(操縱桿)或其他的操作輸入裝置之手動操作,選定照射雷射光的目標位置、雷射光的波長、輸出強度、線束徑或者是尺寸、雷射光的投影形狀、焦點距離、照射時間的長度等的配方(recipe),進行對被處理物之雷射處理。Under the current situation, the defect position on the processed object or the target location of the laser light is found by the human body, that is, the operator visually and analyzing the image of the processed object. In addition, the operator selects the target position of the irradiated laser light, the wavelength of the laser light, the output intensity, the beam diameter or the size, and the projection of the laser light through manual operation through a joystick (joystick) or other operation input device Recipe for shape, focal distance, length of irradiation time, etc., perform laser processing on the processed object.

在工廠等的現場中,為了在一定時間內處理多數個被處理物,併設複數座雷射處理裝置。僅就這部分,操作人員的負擔增加,不得不配置多幾人的操作人員。In factories and other sites, in order to process a large number of processed objects within a certain period of time, multiple laser processing devices are installed. Only in this part, the burden on the operators has increased, and a few more operators have to be deployed.

本發明期望的目的在於促進複數座雷射處理裝置的作業(operation)的一部分或是全部的自動化。 [解決課題之手段]The desired purpose of the present invention is to promote the automation of part or all of the operations of a plurality of laser processing devices. [Means to solve the problem]

為了解決上述的課題,在本發明構成了一種雷射處理裝置用的機械學習系統,該雷射處理裝置具備:學習資料記憶部,其係取得並記憶實施在應修正在被處理物產生的缺陷的目標位置照射雷射光的處理之複數座雷射處理裝置之各個所具備之用於拍攝被處理物的視覺感測器所拍攝到的影像、以及暗示至少該影像上的被處理物的缺陷位置或者是應照射雷射光的目標位置之附加資訊的組也就是學習資料;以及學習部,其係使用前述學習資料記憶部所記憶的學習資料群,把雷射處理裝置所具備的視覺感測器拍攝被處理物而得的影像作為輸入,產生至少把影像上中的缺陷位置或者是目標位置作為輸出之學習完畢模型。In order to solve the above-mentioned problems, the present invention constitutes a mechanical learning system for a laser processing device. The laser processing device includes: a learning data storage unit that acquires and memorizes defects that should be corrected in the processed object. The target position is irradiated with laser light. Each of the multiple laser processing devices is equipped with the image captured by the visual sensor for shooting the processed object, and at least the defect location of the processed object on the image is suggested Or it is the group of additional information of the target position that should be irradiated with the laser light, that is, the learning data; and the learning unit, which uses the learning data group memorized by the aforementioned learning data storage unit to integrate the visual sensor provided in the laser processing device The image obtained by shooting the object to be processed is used as input, and a learned model is generated that takes at least the defect position or the target position in the image as the output.

在前述學習資料記憶部記憶的學習資料的附加資訊,包含有:識別雷射處理裝置應對對象的被處理物實施的雷射處理的內容之識別子或是暗示處理的內容之資訊。接著,在前述學習部產生的學習完畢模型的輸出,包含有:指定雷射處理裝置應對對象的被處理物實施的雷射處理的內容之識別子或是暗示處理的內容之資訊。The additional information of the learning data memorized in the learning data storage unit includes: an identifier for identifying the content of the laser processing performed by the laser processing device on the object to be processed, or information suggesting the content of the processing. Next, the output of the learned model generated by the aforementioned learning unit includes information specifying the identifier of the content of the laser processing performed by the laser processing device on the object to be processed or the content of the hint processing.

作為具體的其中一樣態,舉例有:隨附在雷射處理裝置的控制用控制器與透過電信線路連接成可以通訊之伺服電腦,具備前述學習資料記憶部及前述學習部;前述伺服電腦從複數座雷射處理裝置透過前述控制用控制器接收並收集前述學習資料,產生前述學習完畢模型,並且,在控制各雷射處理裝置時,把前述伺服電腦產生出的前述學習完畢模型發送到隨附在各雷射處理裝置之前述控制用控制器。As a specific one of the states, for example: the control controller attached to the laser processing device and the servo computer connected through a telecommunication line to be able to communicate, equipped with the aforementioned learning data storage unit and the aforementioned learning unit; the aforementioned servo computer from the plural The laser processing device receives and collects the aforementioned learning data through the aforementioned control controller, generates the aforementioned learned model, and when controlling each laser processing device, sends the aforementioned learned model generated by the aforementioned servo computer to the attached The aforementioned control controller in each laser processing device.

作為另一個樣態,舉例有:隨附在雷射處理裝置的控制用控制器與透過電信線路連接成可以通訊之伺服電腦,具備前述學習資料記憶部及前述學習部;前述伺服電腦從複數座雷射處理裝置透過前述控制用控制器接收並收集前述學習資料,產生前述學習完畢模型,並且,在控制各雷射處理裝置時,前述伺服電腦透過前述控制用控制器接收各雷射處理裝置的視覺感測器拍攝到的影像,把根據把該影像作為輸入給予到了前述學習完畢模型的結果的輸出之用於雷射處理的控制訊號,回應到產生了該影像之隨附在雷射處理裝置的控制用控制器。As another aspect, for example, there is a control controller attached to the laser processing device and a servo computer connected through a telecommunication line to be able to communicate, with the aforementioned learning data storage unit and the aforementioned learning unit; the aforementioned servo computer from a plurality of seats The laser processing device receives and collects the learning data through the control controller to generate the learned model, and when controlling each laser processing device, the servo computer receives the information of each laser processing device through the control controller The image captured by the visual sensor responds to the laser processing device attached to the laser processing device based on the output of the result of giving the image as an input to the aforementioned learning model, and responds to the generated image The controller is used for control.

作為更進一步其他的樣態,舉例有:隨附在雷射處理裝置的控制用控制器,具備前述學習資料記憶部及前述學習部;隨附在雷射處理裝置的控制用控制器與透過電信線路連接成可以通訊的伺服電腦,係從複數座雷射處理裝置透過前述控制用控制器接收並收集前述學習資料,而且把該學習資料發送到隨附在各雷射處理裝置的控制用控制器做配發。As further other aspects, for example, there are: a control controller attached to the laser processing device, including the aforementioned learning data storage unit and the aforementioned learning unit; a control controller attached to the laser processing device, and a telecom The line is connected to a servo computer that can communicate. It receives and collects the aforementioned learning data from a plurality of laser processing devices through the aforementioned control controller, and sends the learning data to the control controller attached to each laser processing device Do allotment.

有關本發明的雷射處理裝置用的機械學習方法,具備以下步驟:取得並記憶實施在應修正在被處理物產生的缺陷的目標位置照射雷射光的處理之複數座雷射處理裝置之各個所具備之用於拍攝被處理物的視覺感測器所拍攝到的影像、以及暗示至少該影像上的被處理物的缺陷位置或者是應照射雷射光的目標位置之附加資訊的組也就是學習資料之步驟;以及使用前述學習資料群,把雷射處理裝置所具備的視覺感測器拍攝被處理物而得的影像作為輸入,產生至少把影像上中的缺陷位置或者是目標位置作為輸出之學習完畢模型之步驟。 [發明效果]The mechanical learning method for the laser processing device of the present invention has the following steps: acquiring and memorizing each of the multiple laser processing devices that perform the processing of irradiating laser light at the target position where the defect generated in the processed object should be corrected A group of additional information that is provided with the image taken by the visual sensor used to photograph the object to be processed, and the additional information that suggests at least the defect position of the object to be processed on the image or the target position that should be irradiated with laser light, that is, the learning material The steps; and using the aforementioned learning data group, the image obtained by the visual sensor of the laser processing device taken by the processed object is used as input, and at least the defect position or the target position in the image is generated as the output learning Complete the steps of the model. [Effects of the invention]

根據本發明,可以促進複數座雷射處理裝置的作業的一部分或是全部的自動化。According to the present invention, it is possible to promote the automation of part or all of the operations of a plurality of laser processing devices.

參閱圖面說明本發明之一實施方式。一開始,敘述有關本實施方式的系統欲控制的雷射處理裝置1。本實施方式中的雷射處理裝置1,乃是在液晶顯示器模組、電漿顯示器模組、有機電激發光顯示器模組、無機EL顯示器模組、微型LED顯示器模組、透明導電膜基板或是濾色片等0產生的不良處照射雷射光L,來修正該被處理物W的缺陷之雷射修理裝置。An embodiment of the present invention will be described with reference to the drawings. At the beginning, the laser processing device 1 to be controlled by the system of this embodiment will be described. The laser processing device 1 in this embodiment is used in a liquid crystal display module, a plasma display module, an organic electroluminescent display module, an inorganic EL display module, a micro LED display module, a transparent conductive film substrate or It is a laser repairing device that irradiates the defect of the color filter and other 0 with laser light L to correct the defect of the workpiece W.

於圖1及圖2,表示一座的雷射處理裝置1的構成。雷射處理裝置1係主要元件如下:朝向被處理物W上的目標位置亦即液晶顯示器模組等的不良處照射雷射光L之照射單元2、使照射單元2移動在與雷射光L的光軸正交或是略正交的X軸及Y軸的二維方向之XY平臺3、7、使照射單元2移動在與雷射光L的光軸平行或是略平行的Z軸方向之Z軸調節機構3、6、以及計測從照射單元2到被處理物W為止的距離之位移計4。Fig. 1 and Fig. 2 show the configuration of a single laser processing device 1. The main components of the laser processing device 1 are as follows: an irradiation unit 2 that irradiates the laser light L toward the target position on the processed object W, that is, a defect of the liquid crystal display module, etc., moves the irradiation unit 2 to the light of the laser light L The XY stage 3, 7 of the two-dimensional directions of the X-axis and Y-axis, which are orthogonal or slightly orthogonal, move the irradiation unit 2 on the Z-axis parallel to the optical axis of the laser light L or slightly parallel to the Z-axis direction The adjustment mechanisms 3 and 6 and the displacement meter 4 which measures the distance from the irradiation unit 2 to the object W to be processed.

支架9支撐照射單元2、XY平臺3、7、Z軸調節機構3、6及位移計4、以及被處理物W。支架9透過防震構件91,接地到地板。防震構件91例如是防震(制振)橡膠或空氣彈簧等的被動懸架,其作用在於抑制頻率比特定值(例如,5Hz)還高的振動從地板傳到支架9。The holder 9 supports the irradiation unit 2, the XY stages 3, 7, the Z-axis adjustment mechanisms 3, 6 and the displacement meter 4, and the object W to be processed. The bracket 9 is grounded to the floor through the anti-vibration member 91. The anti-vibration member 91 is, for example, a passive suspension such as anti-vibration (vibration-damping) rubber or an air spring, and its role is to suppress transmission of vibration with a frequency higher than a specific value (for example, 5 Hz) from the floor to the bracket 9.

被處理物W經由夾持、吸附等其他適宜的手段被支架9固定。對被處理物W照射雷射光L之處理的當中,被處理物W是固定物。The to-be-processed object W is fixed by the holder 9 by other suitable means, such as clamping and suction. In the process of irradiating the treatment object W with laser light L, the treatment object W is a fixed object.

雷射處理裝置1中的XY平臺3、7是由第一XY平臺3及第二XY平臺7這兩個組合出來的。第二XY平臺7係設立在支架9上,支撐照射單元2、第一XY平臺3、Z軸調節機構3、6及位移計4,可以使這些移動在X軸方向及Y軸方向之二維方向。第二XY平臺7係例如元件如下:架設在支架9的兩側部並延伸在Y軸方向之一對的Y軸軌條71、沿各Y軸軌條71行走之一對的Y軸線型馬達臺車72、兩側部分別被Y軸線型馬達臺車72支撐並沿X軸方向延伸之X軸軌條73、以及沿X軸軌條73行走之X軸線型馬達臺車74。接著,X軸線型馬達臺車74支撐照射單元2、Z軸調節機構3、6及位移計4。照射單元2及位移計4係從被處理物W的正上沿Z軸方向面向被處理物W。概括地說,第二XY平臺7係使照射單元2、Z軸調節機構3、6及位移計4相對於支架9及被處理物W移動在X軸方向及Y軸方向。The XY stages 3 and 7 in the laser processing device 1 are a combination of the first XY stage 3 and the second XY stage 7. The second XY platform 7 is set up on the bracket 9 to support the irradiation unit 2, the first XY platform 3, the Z-axis adjustment mechanism 3, 6 and the displacement meter 4, which can move these two dimensions in the X-axis direction and the Y-axis direction. direction. For example, the second XY stage 7 has the following components: a pair of Y-axis rails 71 erected on both sides of the bracket 9 and extending in the Y-axis direction, and a pair of Y-axis type motors that run along each Y-axis rail 71 The trolley 72 and the X-axis rail 73 extending along the X-axis direction supported by the Y-axis motor trolley 72 on both sides, and the X-axis motor trolley 74 running along the X-axis rail 73 respectively. Next, the X-axis type motor trolley 74 supports the irradiation unit 2, the Z-axis adjustment mechanisms 3 and 6, and the displacement meter 4. The irradiation unit 2 and the displacement meter 4 face the object W from directly above the object W in the Z-axis direction. In summary, the second XY stage 7 moves the irradiation unit 2, the Z-axis adjustment mechanisms 3, 6 and the displacement meter 4 in the X-axis direction and the Y-axis direction relative to the holder 9 and the workpiece W.

在Y軸軌條71與Y軸線型馬達臺車72這一組附設線型編碼器,經由該線型編碼器檢測Y軸線型馬達臺車72的Y軸方向的位置座標。也在X軸軌條73與X軸線型馬達臺車74這一組附設線型編碼器,經由該線型編碼器檢測X軸線型馬達臺車74之現在的X軸方向的位置座標。結果,透過兩線型編碼器,檢測支撐照射單元2之X軸線型馬達臺車74之現在的XY位置座標。A linear encoder is attached to the set of the Y-axis rail 71 and the Y-axis motor cart 72, and the position coordinate of the Y-axis motor cart 72 in the Y-axis direction is detected via the linear encoder. A linear encoder is also attached to the set of the X-axis rail 73 and the X-axis motor carriage 74, and the current position coordinate of the X-axis motor carriage 74 in the X-axis direction is detected through the linear encoder. As a result, through the two-line encoder, the current XY position coordinates of the X-axis motor trolley 74 supporting the irradiation unit 2 are detected.

雷射處理裝置1中的Z軸調節機構3、6是由第一Z軸調節機構3及第二Z軸調節機構6這兩個組合出來的。第二Z軸調節機構6係介於把照射單元2、第一XY平臺3及位移計4予以一體化之框體5、以及上述X軸線型馬達臺車74之間,可以使框體5相對於X軸線型馬達臺車74移動在Z軸方向。沿X軸線型馬達臺車74的Z軸方向之高度位置為不變。第二Z軸調節機構6例如是包含滾珠螺桿之已知的螺旋進給機構,在X軸線型馬達臺車74與框體5中的其中一方軸承螺旋軸,並且在另一方固定螺合到該螺旋軸的螺帽,經由伺服馬達或步進馬達等旋轉驅動螺旋軸,藉此,使螺帽沿螺旋軸前進後退,引起框體5的Z軸方向的上下動作。第二Z軸調節機構6係使照射單元2及位移計4,相對於支架9及被處理物W移動在Z軸方向。The Z-axis adjustment mechanisms 3 and 6 in the laser processing device 1 are a combination of the first Z-axis adjustment mechanism 3 and the second Z-axis adjustment mechanism 6. The second Z-axis adjustment mechanism 6 is interposed between the frame 5 that integrates the irradiation unit 2, the first XY stage 3, and the displacement gauge 4, and the above-mentioned X-axis type motor trolley 74, so that the frame 5 can be opposed to each other. The X-axis type motor trolley 74 moves in the Z-axis direction. The height position along the Z-axis direction of the X-axis type motor trolley 74 is unchanged. The second Z-axis adjustment mechanism 6 is, for example, a known screw feeding mechanism including a ball screw. One of the X-axis motor trolley 74 and the frame 5 bears the screw shaft, and is fixed and screwed to the other side of the X-axis motor trolley 74 The screw cap of the screw shaft rotates and drives the screw shaft via a servo motor, a stepping motor, etc., thereby causing the nut to advance and retreat along the screw shaft, causing the frame body 5 to move up and down in the Z-axis direction. The second Z-axis adjustment mechanism 6 moves the irradiation unit 2 and the displacement meter 4 in the Z-axis direction relative to the holder 9 and the workpiece W.

在X軸線型馬達臺車74與框體5這一組附設線型編碼器,經由該線型編碼器檢測框體5之現在的Z軸方向的位置座標。A linear encoder is attached to the set of the X-axis motor cart 74 and the frame body 5, and the current position coordinate of the frame body 5 in the Z-axis direction is detected through the linear encoder.

如圖2表示,收容在框體5內的照射單元2包含:用於觀測被處理物W上的目標位置及其周邊範圍之光學系統、以及用於對被處理物W上的目標位置照射雷射光L之光學系統。前者的光學系統至少包含:落射照明光源21、分束器(或是半透鏡)22、二向分光鏡23、對物透鏡24、成像透鏡251及視覺感測器25。從落射照明光源21所供給的落射光係經由分束器22被反射,朝向與被處理物W相對之對物透鏡24的光軸的方向。其落射光透過二向分光鏡23後,通過對物透鏡24而照射被處理物W上的目標位置及其周邊範圍。碰到被加工物反射回去的光通量係射入到對物透鏡24,透過二向分光鏡23及分束器22射入到成像透鏡251,成像在視覺感測器25也就是CCD(Charge-Coupled Device)或CMOS(Complementary Metal-Oxide- Semiconductor)等的固態攝像元件。如此,經由視覺感測器25,可以拍攝被處理物W上的目標位置及其周邊範圍並得到影像。As shown in Figure 2, the irradiation unit 2 housed in the housing 5 includes: an optical system for observing the target position on the processed object W and its surrounding area, and an optical system for irradiating the target position on the processed object W with thunder The optical system of the light L. The former optical system at least includes: an epi-illumination light source 21, a beam splitter (or a half lens) 22, a bidirectional beam splitter 23, an objective lens 24, an imaging lens 251, and a vision sensor 25. The epi-light system supplied from the epi-illumination light source 21 is reflected via the beam splitter 22 and faces the direction of the optical axis of the objective lens 24 facing the object W to be processed. After the falling light passes through the dichroic mirror 23, it irradiates the target position on the processed object W and its peripheral range through the objective lens 24. The luminous flux reflected by the object to be processed is incident on the objective lens 24, and incident on the imaging lens 251 through the dichroic beam splitter 23 and the beam splitter 22, and the image is imaged on the visual sensor 25, which is CCD (Charge-Coupled Device) or CMOS (Complementary Metal-Oxide- Semiconductor) and other solid-state imaging elements. In this way, through the visual sensor 25, the target position on the processed object W and its surrounding area can be photographed and an image can be obtained.

對物透鏡24係存在倍率互為相異之複數個。這些對物透鏡24係安裝在電動換鏡旋座241,可以經由旋轉換鏡旋座241來選擇任一個對物透鏡24配置到光軸上。亦即,可以變更適用的對物透鏡24的倍率。The objective lens 24 has a plurality of different magnifications. These pairs of objective lenses 24 are mounted on a motorized lens exchange rotating base 241, and any one of the objective lenses 24 can be selected and arranged on the optical axis through the rotating lens exchange rotating base 241. That is, the applied magnification of the objective lens 24 can be changed.

後者的光學系統至少包含:雷射光L的光源也就是振盪器26、衰減器27、偏光板28、光通量擴展器29、可變狹縫20、二向分光鏡23及對物透鏡24。二向分光鏡23及對物透鏡24係與前者的光學系統的透鏡共通。從雷射振盪器26所供給的雷射光L,係經由衰減器27而衰減,經由偏光板28而偏光,經由光通量擴展器29及可變狹縫20而整形。可變狹縫20係可以使通過這些的雷射光通量的形狀變化。更進一步,雷射光L係經由二向分光鏡23被反射,朝向與被處理物W相對之對物透鏡24的光軸的方向。該雷射光L係通過對物透鏡24而被聚光在被處理物W上的目標位置。如此,可以把雷射光L照射到被處理物W上的目標位置。The latter optical system includes at least: the light source of the laser light L, that is, an oscillator 26, an attenuator 27, a polarizing plate 28, a light flux expander 29, a variable slit 20, a dichroic mirror 23, and an objective lens 24. The dichroic mirror 23 and the objective lens 24 are common to the lenses of the former optical system. The laser light L supplied from the laser oscillator 26 is attenuated by the attenuator 27, polarized by the polarizing plate 28, and shaped by the luminous flux expander 29 and the variable slit 20. The variable slit 20 can change the shape of the laser light flux passing through these. Furthermore, the laser light L is reflected by the dichroic mirror 23 and faces the direction of the optical axis of the objective lens 24 opposite to the object W to be processed. The laser light L is focused on the target position on the object W by the objective lens 24. In this way, the laser light L can be irradiated to the target position on the object W to be processed.

但是,前者的光學系統、後者的光學系統都可以包含圖2未表示之其他的光學元件,例如光纖或鏡片、稜鏡、透鏡、開關器等。However, both the optical system of the former and the optical system of the latter may include other optical elements not shown in FIG. 2, such as optical fibers or lenses, lenses, lenses, switches, etc.

位移計4是用於計測從照射單元2的對物透鏡24到被處理物W上的目標位置為止之沿Z軸方向的相離距離者。位移計4例如是朝向被處理物W照射雷射光R,接收碰到被處理物W而反射的雷射光R,據此,精密計測從該位移計4到被處理物W為止的距離之已知的雷射位移計。位移計4係收容在框體5內或是附設在框體5外。經由已述之第二Z軸調節機構6的功能,位移計4係與框體5、照射單元2及第一XY平臺3成為一體,上下動作在Z軸方向。The displacement meter 4 is used to measure the distance in the Z-axis direction from the objective lens 24 of the irradiation unit 2 to the target position on the object W to be processed. For example, the displacement meter 4 irradiates the laser light R toward the processed object W and receives the laser light R reflected by the processed object W. Based on this, the distance from the displacement meter 4 to the processed object W is accurately measured. The laser displacement meter. The displacement meter 4 is housed in the frame 5 or attached outside the frame 5. Through the function of the second Z-axis adjustment mechanism 6 described above, the displacement meter 4 is integrated with the housing 5, the irradiation unit 2, and the first XY stage 3, and moves up and down in the Z-axis direction.

第一XY平臺3係收容到框體5內,至少支撐照射單元2中的對物透鏡24及換鏡旋座241,可以使其移動在X軸方向及Y軸方向之二維方向。第一XY平臺3例如是經由壓電馬達(超音波馬達)使支撐對物透鏡24及換鏡旋座241的平臺精密移動在X軸方向及Y軸方向之已知的壓電平臺。第一XY平臺3係使照射單元2的對物透鏡24,相對於框體5,更進一步相對於支架9及被處理物W,位移在X軸方向及Y軸方向。The first XY stage 3 is housed in the frame body 5, and supports at least the objective lens 24 and the lens-changing rotating seat 241 in the irradiation unit 2 so that it can move in the two-dimensional direction of the X-axis direction and the Y-axis direction. The first XY stage 3 is, for example, a known piezoelectric stage that precisely moves the stage supporting the objective lens 24 and the lens exchange base 241 in the X-axis direction and the Y-axis direction via a piezoelectric motor (ultrasonic motor). The first XY stage 3 displaces the objective lens 24 of the irradiation unit 2 in the X-axis direction and the Y-axis direction with respect to the frame 5 and further with respect to the holder 9 and the object W to be processed.

第一Z軸調節機構3也是收容在框體5內,至少支撐照射單元2中的對物透鏡24及換鏡旋座241,可以使其移動在Z軸方向。第一Z軸調節機構3例如是經由壓電馬達使支撐對物透鏡24及換鏡旋座241的平臺精密移動在Z軸方向之已知的壓電平臺。第一Z軸調節機構3係使照射單元2的對物透鏡24,相對於框體5,更進一步相對於支架9及被處理物W,位移在Z軸方向。The first Z-axis adjustment mechanism 3 is also housed in the frame 5, and supports at least the objective lens 24 and the lens-changing rotating seat 241 in the irradiation unit 2 so that it can move in the Z-axis direction. The first Z-axis adjustment mechanism 3 is, for example, a known piezoelectric stage that precisely moves the stage supporting the objective lens 24 and the lens exchange rotating seat 241 in the Z-axis direction via a piezoelectric motor. The first Z-axis adjustment mechanism 3 displaces the objective lens 24 of the irradiation unit 2 in the Z-axis direction relative to the frame 5 and further relative to the holder 9 and the object W to be processed.

尚且,在本實施方式中,經由單一的壓電馬達XYZ平臺,來實現第一XY平臺3及第一Z軸調節機構3之兩功能。該壓電XYZ平臺3係可以使支撐對物透鏡24及換鏡旋座241的平臺,移動在X軸方向、Y軸方向及Z軸方向之三維方向。Furthermore, in this embodiment, the two functions of the first XY stage 3 and the first Z-axis adjustment mechanism 3 are realized through a single piezoelectric motor XYZ stage. The piezoelectric XYZ stage 3 is capable of moving the stage supporting the objective lens 24 and the lens-changing rotation base 241 in the three-dimensional directions of the X-axis direction, the Y-axis direction and the Z-axis direction.

照射單元2之對物透鏡24以外的元件或位移計4也不一定要搭載在壓電XYZ平臺3。是可以圖求削減壓電XYZ平臺3的積載量,盡可能提高壓電XYZ平臺3所致之對物透鏡24的位置控制的精度及響應性。不過,並沒有排除把照射單元2的對物透鏡24以外的元件的至少一部分搭載在壓電XYZ平臺3並一起與對物透鏡24移動的情況,也沒有排除位把移計4搭載在壓電XYZ平臺3並一起與對物透鏡24移動的情況。Elements other than the objective lens 24 of the irradiation unit 2 or the displacement meter 4 do not necessarily need to be mounted on the piezoelectric XYZ stage 3. It is possible to reduce the stowage of the piezoelectric XYZ stage 3, and to improve the accuracy and responsiveness of the position control of the objective lens 24 by the piezoelectric XYZ stage 3 as much as possible. However, it does not exclude that at least a part of the elements other than the objective lens 24 of the irradiation unit 2 is mounted on the piezoelectric XYZ stage 3 and moved together with the objective lens 24, nor is it excluded that the position shift meter 4 is mounted on the piezoelectric When the XYZ stage 3 moves together with the objective lens 24.

於作為第一XY平臺及第一Z軸調節機構之壓電XYZ平臺3附設光學線型編碼器,經由該線型編碼器檢測平臺的X軸方向、Y軸方向及Z軸方向的位置座標。An optical linear encoder is attached to the piezoelectric XYZ stage 3 as the first XY stage and the first Z-axis adjustment mechanism, and the position coordinates of the stage in the X-axis direction, Y-axis direction and Z-axis direction are detected through the linear encoder.

在本實施方式中假定之沿被處理物W的X軸方向及Y軸方向之寬度尺寸超過1m。為了可以對這樣大型的被處理物W的大致全部區域照射雷射光L之處理,第二XY平臺7的行程亦即朝二維方向的可動範圍為1m以上。亦即,Y軸線型馬達臺車72的Y軸方向的可動範圍為1m以上,而且X軸線型馬達臺車74的X軸方向的可動範圍也還是1m以上。In this embodiment, the width dimension along the X-axis direction and the Y-axis direction of the object W to be processed is assumed to exceed 1 m. In order to be able to irradiate the laser light L to substantially the entire area of the object W of such a large size, the stroke of the second XY stage 7, that is, the movable range in the two-dimensional direction is 1 m or more. That is, the movable range of the Y-axis direction of the Y-axis type motor bogie 72 is 1 m or more, and the movable range of the X-axis direction of the X-axis type motor bogie 74 is also 1 m or more.

相反地,第一XY平臺3的行程亦即朝X軸方向及Y軸方向的可動範圍遠比第二XY平臺7的還小,支撐對物透鏡24的平臺的X軸方向及Y軸方向的可動範圍分別為100μm以下,頂多40μm至50μm左右。雖然如此,第一XY平臺3比起第二XY平臺7,最小位移量還是很細小的。第一XY平臺3比起第二XY平臺7,可以更細微且精密地調節對物透鏡24的X軸方向及Y軸方向的位置。再加上,隨附在第一XY平臺3的光學線型編碼器所致之位置座標的檢測的解析度,比起隨附在第二XY平臺7的線型編碼器所致之位置座標的檢測的解析度還要高。Conversely, the stroke of the first XY stage 3, that is, the movable range in the X-axis direction and the Y-axis direction is much smaller than that of the second XY stage 7, and supports the X-axis and Y-axis directions of the stage of the objective lens 24. The movable range is below 100μm, at most about 40μm to 50μm. Even so, the minimum displacement of the first XY stage 3 is still very small compared to the second XY stage 7. Compared with the second XY stage 7, the first XY stage 3 can finely and precisely adjust the position of the objective lens 24 in the X-axis direction and the Y-axis direction. In addition, the resolution of the position coordinate detection caused by the optical linear encoder attached to the first XY stage 3 is higher than that of the position coordinate detection caused by the linear encoder attached to the second XY stage 7 The resolution is even higher.

而且,第一Z軸調節機構3的行程亦即朝Z軸方向的可動範圍遠比第二Z軸調節機構6的還小,支撐對物透鏡24的平臺的Z軸方向的可動範圍為10μm至30μm左右。雖然如此,第一Z軸調節機構3比起第二Z軸調節機構6,最小位移量還是很細小的。第一Z軸調節機構3比起第二Z軸調節機構6,可以更細微且精密地調節對物透鏡24的X軸方向及Y軸方向的位置。再加上,隨附在第一Z軸調節機構3的光學線型編碼器所致之位置座標的檢測的解析度,比起隨附在第二Z軸調節機構6的線型編碼器所致之位置座標的檢測的解析度還要高。Moreover, the stroke of the first Z-axis adjustment mechanism 3, that is, the movable range in the Z-axis direction is much smaller than that of the second Z-axis adjustment mechanism 6, and the movable range in the Z-axis direction of the stage supporting the objective lens 24 is 10 μm to About 30μm. Even so, the minimum displacement of the first Z-axis adjustment mechanism 3 is still very small compared to the second Z-axis adjustment mechanism 6. The first Z-axis adjustment mechanism 3 can finely and precisely adjust the position of the objective lens 24 in the X-axis direction and the Y-axis direction than the second Z-axis adjustment mechanism 6. In addition, the resolution of the position coordinate detection caused by the optical linear encoder attached to the first Z-axis adjustment mechanism 3 is higher than that of the linear encoder attached to the second Z-axis adjustment mechanism 6 The resolution of the coordinate detection is even higher.

隨附在雷射處理裝置1,並掌管控制該雷射處理裝置1的控制之控制用控制器8,係例如構成通用的個人電腦或工件工作站等作為主體。如圖3表示,控制用控制器8為具備CPU(Central Processing Unit)81、主記憶體82、輔助記憶裝置83、視訊編解碼器84、顯示器85、通訊介面86、操作輸入裝置87等的硬體資源,並聯合動作這些硬體者。The control controller 8 that is attached to the laser processing device 1 and controls the control of the laser processing device 1 is, for example, a general-purpose personal computer or a work station as the main body. As shown in FIG. 3, the control controller 8 is a hardware including a CPU (Central Processing Unit) 81, a main memory 82, an auxiliary memory device 83, a video codec 84, a display 85, a communication interface 86, an operation input device 87, etc. Physical resources, and act in conjunction with these hardware players.

輔助記憶裝置83乃是快閃記憶體、硬碟裝置、光學碟片裝置等。視訊編解碼器84係主要元件如下:根據從CPU83所接受到的描繪指示,產生應顯示的畫面,把其畫面訊號向顯示器85送出之GPU(Graphics Processing Unit);以及暫時性儲存畫面或影像的資料之視訊記憶體等。視訊編解碼器84也可以不是硬體,而是作為軟體來安裝。通訊介面86乃是該控制用控制器8用於與外部的裝置0、1進行資訊通訊的裝置,包含有線連接介面或是無線收發器。操作輸入裝置87乃是操作人員用手指操作的鍵盤、壓下按鈕、搖桿、滑鼠或觸控面板(也是有與顯示器85重合的)之指向裝置,或是其他裝置。The auxiliary memory device 83 is a flash memory, a hard disk device, an optical disk device, etc. The main components of the video codec 84 are as follows: according to the drawing instructions received from the CPU 83, the GPU (Graphics Processing Unit) that generates the picture to be displayed, and sends the picture signal to the display 85; and temporarily stores the picture or image Video memory for data, etc. The video codec 84 may not be hardware, but may be installed as software. The communication interface 86 is a device used by the control controller 8 for information communication with external devices 0 and 1, including a wired connection interface or a wireless transceiver. The operation input device 87 is a keyboard, a pointing device for pressing a button, a joystick, a mouse, or a touch panel (which is also overlapped with the display 85) operated by the operator with a finger, or other devices.

控制用控制器8中,經由CPU81所應執行的程式被儲存在輔助記憶裝置83,在執行程式之際從輔助記憶裝置83讀入到主記憶體82,被CPU81解讀。控制用控制器8根據程式使硬體資源作動,進行雷射處理裝置1的控制。In the control controller 8, the program to be executed via the CPU 81 is stored in the auxiliary memory device 83, and when the program is executed, the program is read from the auxiliary memory device 83 to the main memory 82 and read by the CPU 81. The control controller 8 activates the hardware resources in accordance with the program to control the laser processing device 1.

於圖4,表示控制用控制器8在雷射處理裝置1所致之雷射處理中所進行的處理的順序例。首先,控制用控制器8係準備從雷射處理裝置1的照射單元2朝向被處理物W上的目標位置照射雷射光L,對第二XY平臺7給予控制訊號,通過對物透鏡24的光軸亦即對物透鏡24照射到被處理物W的雷射光L的照射位置與被處理物W上的目標位置一致或是在其附近,為此,驅動第二XY平臺7,使包含照射單元2框體5朝X軸方向及/或是Y軸方向移動(步驟S1)。FIG. 4 shows an example of the processing sequence performed by the control controller 8 in the laser processing by the laser processing device 1. First, the controller 8 for control prepares to irradiate the laser light L from the irradiation unit 2 of the laser processing device 1 toward the target position on the object W to be processed, and to give a control signal to the second XY stage 7 to pass the light on the objective lens 24. The axis, that is, the irradiation position of the laser light L that irradiates the object lens 24 to the processed object W coincides with or is close to the target position on the processed object W. To this end, the second XY stage 7 is driven to include the irradiation unit 2 The frame body 5 moves in the X-axis direction and/or the Y-axis direction (step S1).

接著,控制用控制器8係對第一XY平臺3給予控制訊號,通過對物透鏡24照射到被處理物W的雷射光L的照射位置與被處理物W上的目標位置精密重合,為此,驅動第一XY平臺3,微調照射單元2的對物透鏡24的X軸方向及/或是Y軸方向的位置(步驟S2)。此時,透過照射單元2所具有的視覺感測器25,拍攝與被處理物W中的對物透鏡24的光軸相交的位置及其周邊範圍,解析得到的影像並檢測被處理物W上的目標位置,把光軸正確對位到其目標位置,可以細微修正第一XY平臺3所致之位移量。但是,視覺感測器25所致之被處理物W的拍攝,係在把對物透鏡24的焦點合焦到被處理物W之後進行者為佳。Next, the control controller 8 gives a control signal to the first XY stage 3, and the irradiation position of the laser light L irradiated to the object W by the objective lens 24 precisely coincides with the target position on the object W. , The first XY stage 3 is driven, and the position of the objective lens 24 of the irradiation unit 2 in the X-axis direction and/or the Y-axis direction is fine-tuned (step S2). At this time, through the visual sensor 25 of the irradiation unit 2, the position that intersects the optical axis of the objective lens 24 in the object W and the surrounding area are captured, the obtained image is analyzed, and the surface of the object W is detected. Correctly align the optical axis to its target position, and the displacement caused by the first XY stage 3 can be slightly corrected. However, the imaging of the processed object W by the visual sensor 25 is preferably performed after the focus of the objective lens 24 is focused on the processed object W.

與上述步驟S2幾乎同時,控制用控制器8係對Z軸調節機構3、6給予控制訊號,對物透鏡24的焦點、接著通過該對物透鏡24而被照射到被處理物W的雷射光L的焦點被精密合焦在被處理物W上的目標位置,為此,驅動Z軸調節機構3、6來微調節包含照射單元2之框體5及/或是對物透鏡24的Z軸方向的位置(步驟S3)。在該步驟S3中,不使用位移計4的功能。在步驟S3中,例如,透過照射單元2所具有的視覺感測器25,反覆拍攝與被處理物W中的對物透鏡24的光軸相交的位置及其周邊範圍,解析得到的影像並逐次求出其對比(明暗差),並且,使框體5及/或是對物透鏡24上下動作,一直到攝影畫像的對比為最大或是接近最大的高度位置為止。Almost at the same time as the above step S2, the control controller 8 gives control signals to the Z-axis adjustment mechanisms 3 and 6, to focus on the objective lens 24 and then irradiate the laser light to the object W through the pair of objective lenses 24 The focal point of L is precisely focused on the target position on the object W. For this reason, the Z-axis adjustment mechanisms 3 and 6 are driven to fine-adjust the frame 5 including the irradiation unit 2 and/or the Z-axis of the objective lens 24 The position of the direction (step S3). In this step S3, the function of the displacement meter 4 is not used. In step S3, for example, through the visual sensor 25 of the irradiation unit 2, the position that intersects the optical axis of the objective lens 24 in the object W and the surrounding area are repeatedly captured, and the obtained images are analyzed and successively The contrast (difference between light and dark) is determined, and the frame 5 and/or the objective lens 24 are moved up and down until the contrast of the photographed image becomes the maximum or close to the maximum height position.

在步驟S3不使用位移計4的理由,係如圖2所示,為了在被處理物W施以雷射處理,通過對物透鏡24照射的雷射光L的照射位置、以及為了計測從位移計4一直到被處理物W為止的相離距離而進行照射的雷射光R的照射位置,是不會相互一致而是有所偏差。對物透鏡24係其倍率越大,對物透鏡24本身的尺寸也越大。為了避免與對物透鏡24的干涉,不得不遠離對物透鏡24配置位移計4,總之,使位移計4的光軸吻合到對物透鏡24的光軸是很困難的。大型的被處理物W是有整體性或是部分性撓曲變形的情況。也一併考慮到其撓曲變形的程度不是恆常一定的話,是無法把經由位移計4所計測出的相離距離,直接視為從對物透鏡24一直到被處理物W上的目標位置為止的距離。亦即,位移計4所計測出相離距離的位置,是與從對物透鏡24射出的雷射光L碰到的位置相異,是有因為被照射物的撓曲而沿兩位置的Z軸方向的高度為不相同的可能性,而且兩位置的高度的差無法事先知道。所以,在步驟S3中,無法使用位移計4,而是利用對比AF(Auto Forcus)法等,把雷射光L的焦點合焦到被處理物W上的照射位置。The reason why the displacement meter 4 is not used in step S3 is that, as shown in FIG. 2, in order to perform laser processing on the processed object W, the irradiation position of the laser light L irradiated by the objective lens 24 and the displacement meter 4 The irradiated positions of the laser light R irradiated at a distance up to the workpiece W are not coincident with each other but deviate. The larger the magnification of the objective lens 24, the larger the size of the objective lens 24 itself. In order to avoid interference with the objective lens 24, the displacement meter 4 has to be arranged far away from the objective lens 24. In short, it is difficult to match the optical axis of the displacement meter 4 to the optical axis of the objective lens 24. The large workpiece W may be deformed integrally or partially. Considering that the degree of flexural deformation is not constant, it is impossible to directly regard the distance measured by the displacement meter 4 as the target position on the object W from the objective lens 24. Distance. That is, the position of the distance measured by the displacement meter 4 is different from the position where the laser light L emitted from the objective lens 24 hits, and it is caused by the deflection of the irradiated object along the Z axis of the two positions. The height of the direction is not the same possibility, and the height difference between the two positions cannot be known in advance. Therefore, in step S3, the displacement meter 4 cannot be used, but the contrast AF (Auto Forcus) method or the like is used to focus the focus of the laser light L to the irradiation position on the object W to be processed.

經過上述步驟S1至S3,照射單元2的對物透鏡24到達把雷射光L照射到被處理物W上的目標位置之處理所必要的基本位置。以後,控制用控制器8係開始把對物透鏡24維持在該基本位置之回饋控制(步驟S4及S5)。執行位置回饋控制是為了防止因為干擾而雷射光L的光軸或是焦點從被處理物W上的目標位置偏離的狀態下導致把雷射光L照射到被處理物W之憾事。典型的干擾是從設置雷射處理裝置1的工廠等的地板傳遞到支架9、被加工物0、XY平臺7、Z軸調節機構6及照射單元2之振動。某種程度以上之頻率高的(超過5Hz)振動係因為介於地板與支架9之間的防震構件91而被遮斷或是充分衰減。但是,頻率低的(未達5Hz,為2Hz至3Hz左右的)振動,未必會被防震構件91遮斷,而得以從地板傳遞到支架9、被加工物0、XY平臺7、Z軸調節機構6及照射單元2。After the above steps S1 to S3, the objective lens 24 of the irradiating unit 2 reaches the basic position necessary for the processing of irradiating the laser light L to the target position on the object W to be processed. Thereafter, the control controller 8 starts feedback control for maintaining the objective lens 24 at the basic position (steps S4 and S5). The position feedback control is performed to prevent the laser light L from being irradiated to the processed object W when the optical axis or focus of the laser light L deviates from the target position on the processed object W due to interference. A typical disturbance is the vibration transmitted from the floor of the factory etc. where the laser processing device 1 is installed to the bracket 9, the workpiece 0, the XY stage 7, the Z-axis adjustment mechanism 6, and the irradiation unit 2. The vibration with a high frequency (over 5 Hz) to a certain extent is blocked or sufficiently attenuated by the anti-vibration member 91 between the floor and the bracket 9. However, the low frequency (less than 5 Hz, about 2 Hz to 3 Hz) vibration is not necessarily blocked by the anti-vibration member 91, but can be transmitted from the floor to the bracket 9, the workpiece 0, the XY stage 7, and the Z-axis adjustment mechanism 6 and irradiation unit 2.

在X軸方向及Y軸方向的位置回饋控制步驟S4中,控制用控制器8係在把照射單元2位置到基本位置以後,透過照射單元2所具有的視覺感測器25,反覆拍攝與被處理物W中的對物透鏡24的光軸相交的位置及其周邊範圍,解析所得到的影像,逐次求出現在的照射單元2的位置從基本位置亦即從雷射光L的照射位置吻合到目標位置時的位置到底偏離在X軸方向及Y軸方向有多少之偏差。接著,把控制訊號給與到第一XY平臺3,驅動第一XY平臺3往縮小其偏差的方向,朝基本位置修正對物透鏡24的位置。經此,可以把對物透鏡24的光軸,換言之雷射光L的照射位置,持續保持在被處理物W上的目標位置或是其附近。In the position feedback control step S4 in the X-axis direction and the Y-axis direction, the control controller 8 sets the position of the irradiation unit 2 to the basic position, and then repeatedly shoots and is photographed through the visual sensor 25 of the irradiation unit 2 The position where the optical axis of the objective lens 24 intersects and its peripheral range in the processed object W are analyzed, and the obtained image is analyzed, and the position of the irradiation unit 2 appears successively from the basic position, that is, from the irradiation position of the laser light L. How much deviation does the position at the target position deviate from in the X-axis direction and the Y-axis direction. Then, the control signal is given to the first XY stage 3, and the first XY stage 3 is driven to reduce the deviation, and the position of the objective lens 24 is corrected toward the basic position. With this, the optical axis of the objective lens 24, in other words, the irradiation position of the laser light L, can be continuously maintained at or near the target position on the object W to be processed.

在Z軸方向的位置回饋控制步驟S5中,控制用控制器8把照射單元2位置到了基本位置時,透過位移計4計測一直到被處理物W為止的相離距離,把該距離設定為回饋控制的目標距離。再加上,以後,透過位移計4反覆計測一直到被處理物W為止的相離距離,逐次求出已計測出的現在的相離距離與目標距離之偏差。該偏差係暗示現在的照射單元2的位置從基本位置亦即從雷射光L的焦點吻合到目標位置時的位置到底偏離在Z軸方向有多少。接著,把控制訊號給與到第一Z軸調節機構3,驅動第一Z軸調節機構3朝縮小其偏差的方向,朝向基本位置修正對物透鏡24的位置。經此,可以把雷射光L的焦點,持續保持在被處理物W上的目標位置或是其附近。In step S5 of the position feedback control in the Z-axis direction, when the control controller 8 positions the irradiation unit 2 to the basic position, the displacement meter 4 measures the distance to the object W to be processed, and sets the distance as feedback The target distance of the control. In addition, thereafter, the displacement meter 4 repeatedly measures the separation distance to the object W to be processed, and successively obtains the deviation between the measured current separation distance and the target distance. This deviation indicates how much the current position of the irradiation unit 2 deviates in the Z-axis direction from the basic position, that is, the position when the focal point of the laser light L coincides with the target position. Next, the control signal is given to the first Z-axis adjustment mechanism 3, and the first Z-axis adjustment mechanism 3 is driven to correct the position of the objective lens 24 toward the basic position in the direction of reducing the deviation. Through this, the focus of the laser light L can be continuously maintained at or near the target position on the object W to be processed.

經由位置回饋控制,可以快速修正起因於從地板傳遞到支架9、被加工物0、XY平臺7、Z軸調節機構6及照射單元2的低周波的振動所產生的偏差。作為第一XY平臺及第一Z軸調節機構之壓電馬達平臺3,係為了修正起因於低周波振動所產生的偏差而具有充分的響應速度。Through the position feedback control, it is possible to quickly correct the deviation caused by the low-frequency vibration transmitted from the floor to the bracket 9, the workpiece 0, the XY stage 7, the Z-axis adjustment mechanism 6, and the irradiation unit 2. The piezoelectric motor stage 3, which is the first XY stage and the first Z-axis adjustment mechanism, has a sufficient response speed in order to correct the deviation caused by the low-frequency vibration.

而且,支撐對物透鏡24的壓電馬達平臺3的可動範圍為100μm以下,是為微小。而且,供給自雷射振盪器26並射入到對物透鏡24的雷射光L,乃是準直的平行光。從而,不把照射單元2的對物透鏡24以外的元件搭載在壓電馬達平臺3,透過壓電馬達平臺3使對物透鏡24位移在X軸方向或Y軸方向時,僅位移被照射物0上的視覺感測器25進行拍攝的位置、及照射雷射光L的位置為相同的量。即便透過壓電馬達平臺3使對物透鏡24位移在Z軸方向也是沒有問題的。In addition, the movable range of the piezoelectric motor stage 3 supporting the objective lens 24 is 100 μm or less, which is very small. In addition, the laser light L supplied from the laser oscillator 26 and incident on the objective lens 24 is collimated parallel light. Therefore, when components other than the objective lens 24 of the irradiation unit 2 are not mounted on the piezoelectric motor stage 3, when the objective lens 24 is displaced in the X-axis direction or the Y-axis direction through the piezoelectric motor stage 3, only the irradiated object is displaced The position where the visual sensor 25 takes the image on 0 and the position where the laser light L is irradiated are the same amount. Even if the objective lens 24 is displaced in the Z-axis direction through the piezoelectric motor stage 3, there is no problem.

如此,控制用控制器8,係一方面執行置回饋控制,一方面把雷射光L照射到被處理物W上的目標位置(步驟S6)。In this way, the control controller 8 performs the placement feedback control on the one hand, and irradiates the laser light L to the target position on the object W on the other hand (step S6).

在對被處理物W的雷射處理之際,有必要決定照射雷射光L的目標位置之所使用的雷射光L的波長、輸出強度、線束徑或者是尺寸、雷射光L的投影形狀、焦點距離、照射時間的長度等的配方。在本實施方式中,使用經由機械學習所產生出的學習完畢模型,解析拍攝了作為被處理物W之液晶顯示器面板等之影像,來決定存在於該被處理物W之缺陷位置,進而決定應照射雷射光L的目標位置的XY座標。更進一步,也設定雷射處理中的雷射光L的波長、輸出強度、線束徑或者是尺寸、雷射光L的投影形狀、焦點距離等。焦點距離相當於目標位置的Z座標。When laser processing the object W, it is necessary to determine the wavelength, output intensity, beam diameter or size of the laser light L used to irradiate the target position of the laser light L, and the projection shape and focus of the laser light L The formula of distance, length of irradiation time, etc. In this embodiment, the learned model generated by machine learning is used to analyze and photograph the image of the liquid crystal display panel or the like of the processed object W to determine the position of the defect in the processed object W, and then determine the application The XY coordinates of the target position where the laser light L is irradiated. Furthermore, the wavelength, output intensity, beam diameter or size of the laser light L in the laser processing, the projection shape of the laser light L, the focal length, etc. are also set. The focal distance is equivalent to the Z coordinate of the target position.

如圖5表示,本實施方式的機械學習系統,係經由把設置在工廠等之附帶在複數座雷射處理裝置1之控制用控制器8,透過有線LAN(Local Area Network)或無線LAN、WAN(Wide Area Network)、MAN(Mertopolitan Area Network)、攜帶式電話網路、網際網路等的電信線路連接到伺服電腦0可以相互通訊而構築出。尚且,複數座雷射處理裝置1的每一個附帶一個控制用控制器8,各控制用控制器8不限於掌管所對應之一座雷射處理裝置1的控制。一個控制用控制器8也可以掌管二座以上的雷射處理裝置1的控制。而且,特定的控制用控制器8也可以兼任伺服電腦0的任務。As shown in FIG. 5, the machine learning system of this embodiment is connected to a control controller 8 attached to a plurality of laser processing devices 1 installed in a factory, etc., through wired LAN (Local Area Network) or wireless LAN, WAN (Wide Area Network), MAN (Mertopolitan Area Network), portable telephone network, Internet and other telecommunication lines are connected to the servo computer and can be constructed to communicate with each other. Moreover, each of the plurality of laser processing devices 1 is attached with a control controller 8, and each control controller 8 is not limited to be in charge of the control of the corresponding laser processing device 1. One control controller 8 can also control the laser processing apparatus 1 of two or more. Furthermore, the specific control controller 8 may also serve as the task of the servo computer 0.

伺服電腦0例如把通用的個人電腦或工件工作站等構成作為主體。如圖6表示,伺服電腦0具備CPU01、主記憶體02、輔助記憶裝置03、視訊編解碼器04、顯示器05、通訊介面06、操作輸入裝置07等的硬體資源,這些是聯合動作。The servo computer 0 is composed of, for example, a general-purpose personal computer or a work station as its main body. As shown in Figure 6, the server computer 0 has hardware resources such as CPU01, main memory 02, auxiliary memory device 03, video codec 04, display 05, communication interface 06, operation input device 07, etc. These are joint actions.

輔助記憶裝置03乃是快閃記憶體、硬碟裝置、光學碟片裝置等。視訊編解碼器04係主要元件如下:根據從CPU03所接受到的描繪指示,產生應顯示的畫面,把其畫面訊號向顯示器05送出之GPU;以及暫時性儲存畫面或影像的資料之視訊記憶體等。視訊編解碼器04也可以不是硬體,而是作為軟體來安裝。通訊介面06乃是該伺服電腦0用於與外部的裝置8進行資訊通訊的裝置,包含有線連接介面或是無線收發器。操作輸入裝置07乃是操作人員用手指操作的鍵盤、壓下按鈕、搖桿、滑鼠或觸控面板(也是有與顯示器05重合的)之指向裝置,或是其他裝置。The auxiliary memory device 03 is a flash memory, a hard disk device, an optical disk device, etc. The main components of the video codec 04 are as follows: according to the drawing instructions received from the CPU03, the GPU that generates the screen that should be displayed, and sends the screen signal to the display 05; and the video memory that temporarily stores the screen or image data Wait. The video codec 04 can also be installed as software instead of hardware. The communication interface 06 is a device used by the server computer 0 for information communication with an external device 8, including a wired connection interface or a wireless transceiver. The operation input device 07 is a pointing device operated by an operator with a finger, a keyboard, pressing a button, a joystick, a mouse or a touch panel (also overlapped with the display 05), or other devices.

於伺服電腦0,經由CPU01所應執行的程式被儲存在輔助記憶裝置03,在執行程式之際從輔助記憶裝置03讀入到主記憶體02,被CPU01解讀。In the servo computer 0, the program to be executed via the CPU01 is stored in the auxiliary memory device 03, and when the program is executed, it is read from the auxiliary memory device 03 to the main memory 02 and interpreted by the CPU01.

在圖7表示具體的其中一樣態下,伺服電腦0根據程式使硬體資源作動,發揮作為下述的學習資料記憶部101及學習部102的功能。In one of the specific states shown in FIG. 7, the servo computer 0 operates the hardware resources according to the program, and functions as the learning data storage unit 101 and the learning unit 102 described below.

學習資料記憶部101,係從複數座雷射處理裝置1之各個,把透過掌管該雷射處理裝置1的控制之控制用控制器8所產生的學習資料,利用主記憶體02或者是輔助記憶裝置03的所需的記憶區域來記憶。學習資料乃是組合了:各雷射處理裝置1具備的視覺感測器25拍攝被處理物W所得到的影像;以及定義要對同被處理物W進行的雷射處理的內容的配方之附加資訊。The learning data storage unit 101 uses the main memory 02 or the auxiliary memory of the learning data generated by the control controller 8 in charge of the control of the laser processing device 1 from each of the plurality of laser processing devices 1 The required memory area of the device 03 to be memorized. The learning material is a combination of: the visual sensor 25 of each laser processing device 1 captures the image obtained by the processed object W; and the addition of a recipe that defines the content of the laser processing to be performed on the same processed object W News.

如圖8表示,欲產生的學習完畢模型,乃是在雷射處理的對象的被處理物W的影像被輸入到輸入層時,其輸入經過中間層(隱藏層)到達輸出層,成為定義對同被處理物W的雷射處理的內容的配方之資訊而輸出的類神經網路(或是,深度學習型人工智慧)。學習資料中的被處理物W的攝影畫像對應到該類神經網路的輸入。接著,學習資料中的附加資訊係對應到同類神經網路的輸出,符合附帶教師的學習中的訓練資料。As shown in Figure 8, the learned model to be generated is when the image of the processed object W that is the target of laser processing is input to the input layer, the input passes through the intermediate layer (hidden layer) to the output layer, and becomes a definition pair. A neural network (or, deep learning artificial intelligence) output with the formula information of the content of the laser processing of the processed object W. The photographic image of the processed object W in the learning material corresponds to the input of this type of neural network. Then, the additional information in the learning materials corresponds to the output of the same kind of neural network, which conforms to the training materials in the learning of the accompanying teacher.

所以,附加資訊至少包含:表示在被處理物W的攝影畫像內之該被處理物W的缺陷位置的座標(或者是,座標的範圍)、及/或是為了修正該被處理物W的缺陷而應對同被處理物W照射雷射光L之目標位置的座標(或者是,座標的範圍)。Therefore, the additional information includes at least: the coordinates (or the range of coordinates) indicating the defect position of the processed object W in the photographic image of the processed object W, and/or for correcting the defect of the processed object W Instead, the coordinates (or the range of the coordinates) of the target position where the laser light L is irradiated with the object W to be processed.

在此,被處理物W的缺陷位置與英照射雷射光L的目標位置,並非總是為一致,是有兩者不同的情況。即便缺陷位置相同,因為缺陷的種類或程度,目標位置也會變化。例如,在液晶顯示器面板W等的某個畫素產生任何的缺陷時,在連接到該畫素的配線的短路處照射雷射光L來切斷該短路處,或是在斷線處照射雷射光L來熔接該短路處,或是對製造過程中混入的異物照射雷射光L來去除該異物,藉此,可以消解缺陷,也可以施以在具有缺陷的畫素之本身照射雷射光L而不讓該畫素點亮使其變得不醒目之處置。在被處理物W上缺陷位置與目標位置為相同,或是從缺陷位置可以無歧異特定目標位置的話,沒有必要在附加資訊(以及,學習完畢模型的輸出)包含目標位置。但是,並非一定要如此的話,是有必要在附加資訊包含目標位置,或是在附加資訊包含用於特定目標位置之任何其他的資訊。Here, the defect position of the workpiece W and the target position of the laser beam L are not always the same, but they may be different. Even if the defect location is the same, the target location will change because of the type or degree of the defect. For example, when any defect occurs in a certain pixel of the liquid crystal display panel W, laser light L is irradiated to the short circuit of the wiring connected to the pixel to cut off the short circuit, or laser light is irradiated to the broken wire. L is used to weld the short-circuit, or the foreign matter mixed in the manufacturing process is irradiated with laser light L to remove the foreign matter, thereby eliminating the defect, or applying laser light L to the defective pixel itself. Let the pixel light up so that it becomes inconspicuous. If the defect position and the target position on the processed object W are the same, or if the target position can be specified without distinction from the defect position, there is no need to include the target position in the additional information (and the output of the learned model). However, this is not necessarily the case, it is necessary to include the target location in the additional information, or to include any other information for the specific target location in the additional information.

更進一步,附加資訊包含以下項目等的其中一部分或是全部: ・除了表示缺陷的種類及/或是程度的資訊之其他暗示缺陷位置與目標位置的相對位置關係之資訊 ・所使用的雷射光L的波長 ・所使用的雷射光L的輸出 ・所使用的雷射光L的線束徑或者是尺寸 ・所使用的雷射光L的線束的形狀 ・所使用的雷射光L的焦點距離 ・把雷射光L照射到被處理物W的時間的長度。Furthermore, the additional information includes some or all of the following items, etc.: ・In addition to the information indicating the type and/or degree of the defect, other information that implies the relative positional relationship between the defect location and the target location ・Wavelength of the laser light L used ・The output of the laser light L used ・The harness diameter or size of the laser light L used ・The shape of the harness of the laser light L used ・The focal length of the laser light L used ・The length of time the laser light L is irradiated to the object W to be processed.

或者是,附加資訊為各個上揭項目的組,也就是包含指定複數的配方的候補中任意個識別子。在配方α與配方β中,缺陷位置與目標位置的相對位置關係、雷射光L的波長、輸出、線束徑或者是尺寸、線束的投影形狀、焦點距離、照射時間等中的至少一部分為相異。識別子係表示指示對映在成為學習資料的一部分的影像之對象的被處理物W上的目標位置,是否施以配方α所致之雷射處理,還是施以配方β所致之雷射處理。Or, the additional information is a group of each uplifted item, that is, any identifier among the candidates including a specified plural number of recipes. In formula α and formula β, at least a part of the relative positional relationship between the defect position and the target position, the wavelength, output, beam diameter or size of the laser light L, the projection shape of the beam, the focal length, the irradiation time, etc. are different . The identification sub-system indicates whether the target position on the processed object W mapped on the image that becomes a part of the learning material is to be subjected to the laser treatment caused by the formula α or the laser treatment caused by the formula β.

學習資料所包含的附加資訊,係透過顯示器85目視了相同的學習資料所包含的被處理物W的攝影畫像之操作人員,通過操作操作輸入裝置87的方式,輸入到控制用控制器8。例如,操作人員指定出表現在影像內的缺陷位置(的範圍)及/或是目標位置(的範圍),或是為了修正該被處理物W的缺陷從複數個候補的中選擇出必要的雷射處理的配方,或是指定所使用的雷射光L的波長、輸出其他的參數。The additional information contained in the learning material is input to the control controller 8 by an operator who has visually viewed the photographic image of the processed object W contained in the same learning material through the display 85 by operating the operation input device 87. For example, the operator designates the defect position (range) and/or the target position (range) shown in the image, or selects the necessary mine from a plurality of candidates in order to correct the defect of the processed object W. The formula of the laser treatment, or specify the wavelength of the laser light L used, and output other parameters.

受理了與被處理物W有關的附加資訊的輸入之控制用控制器8,係把其附加資訊及與其成對的被處理物W的攝影畫像作為學習資料,向伺服電腦0發送。伺服電腦0經由接收從複數座雷射處理裝置1的控制用控制器8所產生的學習資料,收集與多數個被處理物W有關的學習資料,積蓄到學習資料記憶部101。The control controller 8 that has received the input of the additional information related to the processed object W sends the additional information and the photographic image of the processed object W paired with the additional information to the servo computer 0 as learning data. The servo computer 0 receives learning data generated from the control controller 8 of the plurality of laser processing devices 1, collects learning data related to a plurality of objects W to be processed, and accumulates the learning data storage unit 101.

學習部102係使用學習資料記憶部101所記憶的學習資料群,產生學習完畢模型。亦即,依序讀出積蓄在學習資料記憶部101的學習資料,把某個學習資料所包含的被處理物W的攝影畫像作為輸入,把映在該影像的被處理物W上的缺陷位置(的範圍)及/或是目標位置(的範圍)或其他的附加資訊作為輸出,為了對這樣的輸入做成那樣的輸出,執行使類神經網路變化的深度學習。類神經網路所輸出的附加資訊的內容,係與在機械學習所用的學習資料所包含的內容為同等。順便說明,機械學習中,伺服電腦0有援用GPU的演算能力的情況。The learning part 102 uses the learning material group memorized by the learning material memory part 101 to generate a learning completion model. That is, the learning materials stored in the learning material storage unit 101 are sequentially read out, a photographic image of the processed object W contained in a certain learning material is input as input, and the defect position on the processed object W reflected in the image is taken as input (The range) and/or the target position (the range) or other additional information is used as output. In order to make such output for such input, deep learning that makes neural network-like changes is performed. The content of the additional information output by the similar neural network is the same as the content contained in the learning materials used in machine learning. By the way, in the machine learning, the servo computer 0 may use the calculation ability of the GPU.

經過上述的機械學習產生出的學習完畢模型之伺服電腦0,係把其學習完畢模型的資料,向複數座雷射處理裝置1之各個所附帶的控制用控制器8發送做配發。各控制用控制器8接收從伺服電腦0所產生的學習完畢模型的資料,記憶到主記憶體82或者是輔助記憶裝置83的所需的記憶區域。The servo computer 0 of the learned model generated through the above-mentioned mechanical learning sends the data of the learned model to the control controller 8 attached to each of the plurality of laser processing devices 1 for distribution. Each control controller 8 receives the data of the learned model generated from the servo computer 0, and stores it in the main memory 82 or the required memory area of the auxiliary memory device 83.

該學習完畢模型係今後,可以用於經由雷射處理裝置1執行對被處理物W的雷射處理。亦即,控制用控制器8取得透過視覺感測器25拍攝了搬入到所對應的雷射處理裝置1之被處理物W之影像,把該影像作為輸入給予到學習完畢模型的類神經網路,藉此,可以把存在於該被處理物W上的缺陷的位置(或者是其範圍)及/或是應照射雷射光L的目標的位置(或者是其範圍)作為輸出。更進一步,可以把與在機械學習所用的學習資料所包含的內容為相同種類的附加資訊,亦即把表示缺陷的種類及/或是程度的資訊,或是所使用的雷射光L的波長、輸出強度、射束形狀、焦點距離等,或者是識別應執行對該被處理物W的雷射處理的配方的候補之識別子之資訊,作為輸出。然後,控制用控制器8係根據利用學習完畢模型決定出的配方,對該被處理物W照射雷射光L。The learned model system can be used in the future to perform laser processing on the object W via the laser processing device 1. In other words, the control controller 8 acquires an image of the object W that has been moved into the corresponding laser processing device 1 taken through the visual sensor 25, and provides the image as an input to the neural network of the learned model By this, the position (or the range) of the defect existing on the processed object W and/or the position (or the range) of the target to be irradiated with the laser light L can be output as the output. Furthermore, the content contained in the learning materials used in machine learning can be the same type of additional information, that is, the information indicating the type and/or degree of the defect, or the wavelength of the laser light L used, The output intensity, beam shape, focal distance, etc., or the information of the identifier that identifies the candidate for the recipe for which the laser processing of the object W should be executed is output as output. Then, the control controller 8 irradiates the object W with laser light L based on the recipe determined using the learned model.

在本實施方式中,構成了雷射處理裝置1用的機械學習系統,該雷射處理裝置具備:學習資料記憶部101,其係取得並記憶實施在應修正在被處理物W產生的缺陷的目標位置照射雷射光L的處理之複數座雷射處理裝置1之各個所具備之用於拍攝被處理物W的視覺感測器25所拍攝到的影像、以及暗示至少該影像上的被處理物W的缺陷位置或者是應照射雷射光的目標位置之附加資訊的組也就是學習資料;以及學習部102,其係使用前述學習資料記憶部101所記憶的學習資料群,把雷射處理裝置1所具備的視覺感測器25拍攝被處理物W而得的影像作為輸入,產生至少把影像上中的缺陷位置或者是目標位置作為輸出之學習完畢模型。根據本實施方式,在複數座雷射處理裝置1的各個對被處理物W執行雷射處理之際,利用學習完畢模型,可以不靠人力自動地檢測在對象的被處理物W產生的缺陷位置、或是應照射雷射光L到對象的被處理物W之目標位置。In the present embodiment, a mechanical learning system for the laser processing device 1 is constituted. The laser processing device includes: a learning data storage unit 101 that acquires and stores the defects that should be corrected in the processed object W. The image captured by the visual sensor 25 for photographing the processed object W provided in each of the plurality of laser processing devices 1 for processing the laser light L irradiated at the target position, and hints at least the processed object on the image The defect position of W or the set of additional information of the target position to be irradiated with laser light, that is, the learning data; and the learning unit 102, which uses the learning data group memorized by the aforementioned learning data storage unit 101 to integrate the laser processing device 1 The included visual sensor 25 takes an image of the processed object W as an input, and generates a learned model whose output is at least a defect position or a target position in the image. According to this embodiment, when each of the plurality of laser processing devices 1 performs laser processing on the processed object W, using the learned model, it is possible to automatically detect the position of a defect in the target processed object W without relying on manpower. , Or the laser light L should be irradiated to the target position of the object to be processed W.

於前述學習資料記憶部101所記憶的學習資料的附加資訊,包含有:識別雷射處理裝置1對對象的被處理物W應實施的雷射處理的內容(除了表示缺陷的種類及/或是程度的資訊之其他暗示缺陷位置與目標位置的相對位置關係之資訊、或是所使用的雷射光L的波長、輸出、線束徑或者是尺寸、線束的投影形狀、焦點距離等)之識別子(指定配方的識別子)或是暗示處理的內容本身之資訊;於前述學習部102所產生的學習完畢模型的輸出,包含有:指定雷射處理裝置1對對象的被處理物W應實施的雷射處理的內容之識別子或是暗示處理的內容的資訊。經此,在複數座雷射處理裝置1之各個對被處理物W執行雷射處理之際,可以不靠人力自動地決定利用學習完畢模型,把對對象的被處理物W施以雷射處理的內容的一部分或是全部。The additional information of the learning data stored in the aforementioned learning data storage unit 101 includes: identifying the content of the laser processing that the laser processing device 1 should perform on the object to be processed W (except for indicating the type of defect and/or Other information indicating the relative positional relationship between the defect position and the target position, or the identifier (specified) of the wavelength, output, wire diameter or size of the laser light L used, the projection shape of the wire harness, the focal length, etc.) Recipe identifier) or information that implies the content of the processing itself; the output of the learned model generated by the aforementioned learning unit 102 includes: the laser processing that the designated laser processing device 1 should perform on the object to be processed W The identifier of the content or the information that implies the content of the processing. As a result, when each of the plurality of laser processing devices 1 performs laser processing on the processed object W, it is possible to automatically determine the use of the learned model without relying on manpower to perform laser processing on the target processed object W Part or all of the content.

本實施方式的機械學習系統係可以達成複數座雷射處理裝置1的作業的一部分或是全部的自動化。The machine learning system of this embodiment can automate part or all of the operations of a plurality of laser processing devices 1.

而且,在本實施方式的系統中,隨附在雷射處理裝置1的控制用控制器8與透過電信線路連接成可以通訊之伺服電腦0,具備前述學習資料記憶部101及前述學習部102;前述伺服電腦0從複數座雷射處理裝置1透過前述控制用控制器8接收並收集前述學習資料,產生前述學習完畢模型,並且,在控制各雷射處理裝置1時,把前述伺服電腦0產生出的前述學習完畢模型發送到隨附在各雷射處理裝置1之前述控制用控制器8。經此,可以把機械學習的成果分配到複數座雷射處理裝置1的控制用控制器8,可以把該成果活用在複數座雷射處理裝置1的控制。此對於運作複數基雷射處理裝置1的工廠等中的效率化大有貢獻。Furthermore, in the system of this embodiment, the control controller 8 attached to the laser processing device 1 and the servo computer 0 that can communicate via a telecommunication line are provided with the aforementioned learning data storage unit 101 and the aforementioned learning unit 102; The servo computer 0 receives and collects the learning data from the plurality of laser processing devices 1 through the control controller 8 to generate the learned model, and when controlling each laser processing device 1, the servo computer 0 is generated The learned model is sent to the control controller 8 attached to each laser processing device 1. With this, the results of the mechanical learning can be distributed to the control controller 8 of the plurality of laser processing devices 1, and the results can be utilized for the control of the plurality of laser processing devices 1. This greatly contributes to efficiency improvement in factories and the like that operate the plural-based laser processing device 1.

尚且,本發明並不限於以上詳述的實施方式。在上述實施方式中,把伺服電腦0產生出的學習完畢模型發送到隨附在複數座雷射處理裝置1之複數座控制用控制器8,各控制用控制器8使用該模型控制雷射處理裝置1所致之雷射處理,特別是執行被處理物W上的缺陷位置的檢測或是照射雷射光L的目標位置之其他的配方的決定處理。Furthermore, the present invention is not limited to the embodiments detailed above. In the above embodiment, the learned model generated by the servo computer 0 is sent to the plurality of control controllers 8 attached to the plurality of laser processing devices 1, and each control controller 8 uses the model to control the laser processing The laser processing by the device 1 is, in particular, the detection of the defect position on the processed object W or the determination processing of other recipes for irradiating the target position of the laser light L.

但是,執行使用學習完畢模型的配方的決定處理之主體,不限定在控制用控制器8。伺服電腦0把產生出的學習完畢模型的資料記憶保持在主記憶體02或者是輔助記憶裝置03的所需的記憶區域,不妨礙決定執行配方的決定處理的主體之樣態。However, the main body of the decision process that executes the recipe using the learned model is not limited to the control controller 8. The servo computer 0 keeps the generated data of the learned model in the main memory 02 or the required memory area of the auxiliary memory device 03, which does not hinder the determination of the main body of the formula decision process.

更具體方面,進行複數座雷射處理裝置1之各個所致之對被處理物W的雷射處理,在控制各雷射處理裝置1時,把各雷射處理裝置1的視覺感測器25拍攝了對象的被處理物W的影像從控制用控制器8向伺服電腦0發送,伺服電腦0接收該影像。More specifically, the laser processing of the object W caused by each of the plurality of laser processing devices 1 is performed. When each laser processing device 1 is controlled, the visual sensor 25 of each laser processing device 1 The image of the object to be processed W that captured the subject is sent from the control controller 8 to the servo computer 0, and the servo computer 0 receives the image.

接著,於伺服電腦0,把該影像作為輸入給予到學習完畢模型的類神經網路,藉此,把存在於該被處理物W上的缺陷的位置及/或是應照射雷射光L的目標的位置,作為輸出。更進一步,可以把與在機械學習所用的學習資料所包含的內容為相同種類的附加資訊,亦即把表示缺陷的種類及/或是程度的資訊,或是所使用的雷射光L的波長、輸出強度、射束形狀、焦點距離等,或者是識別應執行對該被處理物W的雷射處理的配方的候補之識別子之資訊,作為輸出。伺服電腦0把這些輸出資訊,回應到產生被處理物W的攝影畫像之控制用控制器8。控制用控制器8係接收從伺服電腦0所產生的輸出資訊,根據基於該資訊決定出的配方,對該被處理物W照射雷射光L。Then, in the servo computer 0, the image is given as an input to the neural network of the learned model, thereby, the position of the defect existing on the processed object W and/or the target that should be irradiated with the laser light L As output. Furthermore, the content contained in the learning materials used in machine learning can be the same type of additional information, that is, the information indicating the type and/or degree of the defect, or the wavelength of the laser light L used, The output intensity, beam shape, focal distance, etc., or the information of the identifier that identifies the candidate for the recipe for which the laser processing of the object W should be executed is output as output. The servo computer 0 responds to the output information to the control controller 8 for generating a photographic image of the processed object W. The control controller 8 receives the output information generated from the servo computer 0, and irradiates the processed object W with laser light L based on the recipe determined based on the information.

而且,在上述實施方式中,伺服電腦0具備學習資料記憶部101及學習部102,把從隨附在各雷射處理裝置1的控制用控制器8所產生的學習資料匯集到伺服電腦0,於伺服電腦0執行產生學習完畢模型的機械學習。Furthermore, in the above-mentioned embodiment, the servo computer 0 includes the learning data storage unit 101 and the learning unit 102, and collects the learning data generated from the control controller 8 attached to each laser processing device 1 to the servo computer 0. The machine learning that generates the learned model is executed on the servo computer 0.

相對於此,如圖9表示,也考慮到各控制用控制器8具備學習資料記憶部101及學習部102的樣態,亦即不是伺服電腦0而是各控制用控制器8執行產生學習完畢模型的機械學習之樣態。On the other hand, as shown in FIG. 9, it is also considered that each control controller 8 has a learning data storage unit 101 and a learning unit 102, that is, it is not the servo computer 0 but each control controller 8 executes the generation and learning. The mechanical learning state of the model.

該情況下,伺服電腦0從複數座雷射處理裝置1透過控制用控制器8接收並收集學習資料,而且,把該學習資料發送到隨附在各雷射處理裝置1之各控制用控制器8做配發。各控制用控制器8把從其他的控制用控制器8透過伺服電腦0接收到的學習資料,記憶到作為學習資料記憶部101的主記憶體82或者是輔助記憶裝置83的所需的記憶區域。重點是,在控制複數座雷射處理裝置1的各個之複數個控制用控制器8之間,共有學習資料群。伺服電腦0係把各控制用控制器8所產生的學習資料中繼到其他的控制用控制器8。在此,特定的控制用控制器8兼具該伺服電腦0的任務。In this case, the servo computer 0 receives and collects learning data from the plurality of laser processing devices 1 through the control controller 8, and sends the learning data to each control controller attached to each laser processing device 1 8 Do allotment. Each control controller 8 stores the learning data received from other control controllers 8 through the servo computer 0 in the main memory 82 as the learning data storage unit 101 or the required memory area of the auxiliary memory device 83 . The important point is that a group of learning materials is shared among the plurality of control controllers 8 that control each of the plurality of laser processing devices 1. The servo computer 0 relays the learning data generated by each control controller 8 to other control controllers 8. Here, the specific control controller 8 also has the task of the servo computer 0.

如此,各控制用控制器8的學習部102使用學習資料記憶部101記憶的學習資料群,產生學習完畢模型。該機械學習中,各控制用控制器8援用GPU的演算能力。各控制用控制器8把產生出的學習完畢模型的資料記憶保持到主記憶體82或者是輔助記憶裝置83的所需的記憶區域。In this way, the learning unit 102 of each control controller 8 uses the learning material group memorized by the learning material storage unit 101 to generate a learned model. In this machine learning, each control controller 8 utilizes the calculation capability of the GPU. Each control controller 8 stores the generated data of the learned model in a required memory area of the main memory 82 or the auxiliary memory device 83.

在應進行各雷射處理裝置1所致之對被處理物W的雷射處理,控制該雷射處理裝置1之時,控制用控制器8取得該雷射處理裝置1的視覺感測器25拍攝了對象的被處理物W之影像。接著,於控制用控制器8,把該影像作為輸入給予到學習完畢模型的類神經網路,藉此,把存在於該被處理物W上的缺陷的位置及/或是應照射雷射光L的目標的位置,作為輸出。更進一步,可以把與在機械學習所用的學習資料所包含的內容為相同種類的附加資訊,亦即把表示缺陷的種類及/或是程度的資訊,或是所使用的雷射光L的波長、輸出強度、射束形狀、焦點距離等,或者是識別應執行對該被處理物W的雷射處理的配方的候補之識別子之資訊,作為輸出。控制用控制器8係根據基於該輸出資訊決定出的配方,對該被處理物W照射雷射光L。When the laser processing of the object W by each laser processing device 1 is to be performed and the laser processing device 1 is to be controlled, the control controller 8 acquires the visual sensor 25 of the laser processing device 1 The image of the processed object W is taken. Next, in the control controller 8, the image is given as an input to the quasi-neural network of the learned model, whereby the position of the defect existing on the processed object W and/or the laser light L should be irradiated The location of the target, as output. Furthermore, the content contained in the learning materials used in machine learning can be the same type of additional information, that is, the information indicating the type and/or degree of the defect, or the wavelength of the laser light L used, The output intensity, beam shape, focal distance, etc., or the information of the identifier that identifies the candidate for the recipe for which the laser processing of the object W should be executed is output as output. The control controller 8 irradiates the object W with laser light L based on the recipe determined based on the output information.

其他,各部之具體的構成或處理的順序等在不逸脫本發明的主旨的範圍下,可以做種種變形。 [產業上的可利用性]In addition, the specific configuration of each part, the order of processing, etc., can be variously modified without departing from the scope of the present invention. [Industrial availability]

本發明可以適用在對被處理物照射雷射光,施以期望的處理之雷射處理裝置的控制。The present invention can be applied to the control of a laser processing device that irradiates a processed object with laser light and performs desired processing.

W:被處理物 1:雷射處理裝置 8:控制用控制器 0:伺服電腦 101:學習資料記憶部 102:學習部W: Object to be processed 1: Laser processing device 8: Controller for control 0: Servo computer 101: Learning Materials and Memory Department 102: Learning Department

[圖1] 表示本發明的一實施方式中的雷射處理裝置的整體概要之圖。 [圖2] 示意性表示雷射處理裝置的照射單元的光學系統、第一XY平臺及位移計之圖。 [圖3] 表示雷射處理裝置的控制用控制器所具備的硬體資源之圖。 [圖4] 表示雷射處理裝置的控制用控制器根據程式所實施的處理的順序例之流程圖。 [圖5] 表示同實施方式中的機械學習系統的構成之圖。 [圖6] 表示伺服電腦所具備的硬體資源之圖。 [圖7] 同實施方式的機械學習系統的功能方塊圖。 [圖8] 表示同實施方式的機械學習系統所產生的學習完畢模型的概念之圖。 [圖9] 有關本發明的變形例之一的機械學習系統的功能方塊圖。[Fig. 1] A diagram showing the overall outline of a laser processing device in an embodiment of the present invention. [Fig. 2] A diagram schematically showing the optical system, the first XY stage, and the displacement meter of the irradiation unit of the laser processing device. [Fig. 3] A diagram showing the hardware resources of the control controller of the laser processing device. [Fig. 4] A flowchart showing an example of the procedure of processing executed by the control controller of the laser processing device according to the program. [Fig. 5] A diagram showing the configuration of the machine learning system in the same embodiment. [Figure 6] A diagram showing the hardware resources of the server computer. [Fig. 7] A functional block diagram of the machine learning system in the same embodiment. [Fig. 8] A diagram showing the concept of a learned model generated by the machine learning system of the same embodiment. [Fig. 9] A functional block diagram of a machine learning system related to a modification of the present invention.

0:伺服電腦 0: Servo computer

8:控制用控制器 8: Controller for control

101:學習資料記憶部 101: Learning Materials and Memory Department

102:學習部 102: Learning Department

Claims (6)

一種雷射處理裝置用的機械學習系統,該雷射處理裝置具備: 學習資料記憶部,其係取得並記憶實施在應修正在被處理物產生的缺陷的目標位置照射雷射光的處理之複數座雷射處理裝置之各個所具備之用於拍攝被處理物的視覺感測器所拍攝到的影像、以及暗示至少該影像上的被處理物的缺陷位置或者是應照射雷射光的目標位置之附加資訊的組也就是學習資料;以及 學習部,其係使用前述學習資料記憶部所記憶的學習資料群,把雷射處理裝置所具備的視覺感測器拍攝被處理物而得的影像作為輸入,產生至少把影像上中的缺陷位置或者是目標位置作為輸出之學習完畢模型。A mechanical learning system for a laser processing device, the laser processing device having: The learning data memory unit, which acquires and memorizes the visual perception of the multiple laser processing devices that perform the processing of irradiating the laser light at the target position where the defect generated in the processed object should be corrected. It is used to photograph the processed object. The image captured by the detector and the group of additional information suggesting at least the defect position of the processed object on the image or the target position that should be irradiated with laser light, that is, the learning material; and The learning unit uses the learning data group memorized by the aforementioned learning data storage unit, and takes the image of the processed object captured by the visual sensor of the laser processing device as input, and generates at least the defect position in the image Or the target position is used as the output of the learned model. 如請求項1的機械學習系統,其中, 在前述學習資料記憶部記憶的學習資料的附加資訊,包含有:識別雷射處理裝置應對對象的被處理物實施的雷射處理的內容之識別子或是暗示處理的內容之資訊; 在前述學習部產生的學習完畢模型的輸出,包含有:指定雷射處理裝置應對對象的被處理物實施的雷射處理的內容之識別子或是暗示處理的內容之資訊。Such as the mechanical learning system of claim 1, in which, The additional information of the learning data memorized in the aforementioned learning data storage unit includes: an identifier that identifies the content of the laser processing performed by the laser processing device on the object to be processed or information that implies the content of the processing; The output of the learned model generated by the aforementioned learning unit includes: an identifier specifying the content of the laser processing performed by the laser processing device on the object to be processed, or information suggesting the content of the processing. 如請求項1的機械學習系統,其中, 隨附在雷射處理裝置的控制用控制器與透過電信線路連接成可以通訊之伺服電腦,具備前述學習資料記憶部及前述學習部; 前述伺服電腦從複數座雷射處理裝置透過前述控制用控制器接收並收集前述學習資料,產生前述學習完畢模型,並且, 在控制各雷射處理裝置時,把前述伺服電腦產生出的前述學習完畢模型發送到隨附在各雷射處理裝置之前述控制用控制器。Such as the mechanical learning system of claim 1, in which, The control controller attached to the laser processing device and the servo computer that can communicate through the telecommunication line are equipped with the aforementioned learning data storage unit and the aforementioned learning unit; The aforementioned servo computer receives and collects the aforementioned learning data from a plurality of laser processing devices through the aforementioned control controller, and generates the aforementioned learned model, and, When controlling each laser processing device, the learned model generated by the servo computer is sent to the control controller attached to each laser processing device. 如請求項1的機械學習系統,其中, 隨附在雷射處理裝置的控制用控制器與透過電信線路連接成可以通訊之伺服電腦,具備前述學習資料記憶部及前述學習部; 前述伺服電腦從複數座雷射處理裝置透過前述控制用控制器接收並收集前述學習資料,產生前述學習完畢模型,並且, 在控制各雷射處理裝置時,前述伺服電腦透過前述控制用控制器接收各雷射處理裝置的視覺感測器拍攝到的影像,把根據把該影像作為輸入給予到了前述學習完畢模型的結果的輸出之用於雷射處理的控制訊號,回應到產生了該影像之隨附在雷射處理裝置的控制用控制器。Such as the mechanical learning system of claim 1, in which, The control controller attached to the laser processing device and the servo computer that can communicate through the telecommunication line are equipped with the aforementioned learning data storage unit and the aforementioned learning unit; The aforementioned servo computer receives and collects the aforementioned learning data from a plurality of laser processing devices through the aforementioned control controller, and generates the aforementioned learned model, and, When controlling each laser processing device, the servo computer receives the image captured by the visual sensor of each laser processing device through the controller for control, and gives the result of the learned model based on the image as input. The output control signal for laser processing responds to the control controller attached to the laser processing device that generated the image. 如請求項1的機械學習系統,其中, 隨附在雷射處理裝置的控制用控制器,具備前述學習資料記憶部及前述學習部; 隨附在雷射處理裝置的控制用控制器與透過電信線路連接成可以通訊的伺服電腦,係從複數座雷射處理裝置透過前述控制用控制器接收並收集前述學習資料,而且把該學習資料發送到隨附在各雷射處理裝置的控制用控制器做配發。Such as the mechanical learning system of claim 1, in which, The control controller attached to the laser processing device is provided with the aforementioned learning material storage unit and the aforementioned learning unit; The control controller attached to the laser processing device and the servo computer that can communicate through telecommunication lines receive and collect the aforementioned learning data from the plurality of laser processing devices through the aforementioned control controller, and transfer the learning data It is sent to the control controller attached to each laser processing device for distribution. 一種雷射處理裝置用的機械學習方法,具備以下步驟: 取得並記憶實施在應修正在被處理物產生的缺陷的目標位置照射雷射光的處理之複數座雷射處理裝置之各個所具備之用於拍攝被處理物的視覺感測器所拍攝到的影像、以及暗示至少該影像上的被處理物的缺陷位置或者是應照射雷射光的目標位置之附加資訊的組也就是學習資料之步驟;以及 使用前述學習資料群,把雷射處理裝置所具備的視覺感測器拍攝被處理物而得的影像作為輸入,產生至少把影像上中的缺陷位置或者是目標位置作為輸出之學習完畢模型之步驟。A mechanical learning method for a laser processing device has the following steps: Acquire and memorize the images captured by the visual sensor used to photograph the processed object in each of the multiple laser processing devices that implement the processing of irradiating the laser light at the target position where the defect generated in the processed object should be corrected , And a group of additional information that implies at least the defect position of the processed object on the image or the target position of the laser light that should be irradiated, that is, the step of learning materials; and Using the aforementioned learning data group, take the image of the processed object taken by the visual sensor of the laser processing device as input, and generate a learned model with at least the defect position or the target position in the image as the output .
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