TW202045587A - Composition for forming release layer for slit die coating, and release layer - Google Patents

Composition for forming release layer for slit die coating, and release layer Download PDF

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TW202045587A
TW202045587A TW109102486A TW109102486A TW202045587A TW 202045587 A TW202045587 A TW 202045587A TW 109102486 A TW109102486 A TW 109102486A TW 109102486 A TW109102486 A TW 109102486A TW 202045587 A TW202045587 A TW 202045587A
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composition
formula
forming
release layer
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進藤和也
江原和也
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日商日產化學股份有限公司
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    • BPERFORMING OPERATIONS; TRANSPORTING
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    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
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    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
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Abstract

The present invention provides a composition for forming a release layer for slit die coating, which contains (A) a polyurea that contains a repeating unit represented by formula (1), (B) an acid compound or a salt thereof, (C) a crosslinking agent that is selected from among compounds having nitrogen atoms which are substituted by a hydroxyalkyl group and/or an alkoxymethyl group, (D) a polymer additive which contains a repeating unit represented by formula (a1), a repeating unit represented by formula (b) and a repeating unit represented by formula (c), and (E) a solvent that contains at least one solvent which has a vapor pressure of 800 Pa or less at 20 DEG C; and this composition is configured such that 3-100 parts by mass of the polymer additive (D) is contained per 100 parts by mass of the polyurea (A).

Description

狹縫式塗佈用剝離層形成用組成物及剝離層Composition for forming release layer for slit coating and release layer

本發明有關狹縫式塗佈用剝離層形成用組成物及剝離層。The present invention relates to a composition for forming a release layer for slit coating and a release layer.

近幾年來,電子裝置除了要求薄型化及輕量化之特性以外,亦要求賦予可彎曲之功能。由此,謀求使用輕量之可撓性塑膠基板而替代以往之重且脆弱而無法彎曲之玻璃基板。In recent years, in addition to the characteristics of thinner and lighter weight, electronic devices are also required to be flexible. Therefore, it is sought to use a lightweight flexible plastic substrate to replace the heavy and fragile glass substrate that cannot be bent in the past.

尤其,於新世代顯示器中,謀求開發使用輕量可撓性塑膠基板(以下亦稱為樹脂基板)之主動矩陣型全彩TFT顯示器面板。又,觸控式顯示器則已開發組合於顯示器面板而使用之觸控面板之透明電極或樹脂基板等之對應於可撓化之材料。作為透明電極,則自過去使用之ITO,提案出PEDOT等可彎曲加工之透明導電性聚合物、金屬奈米線及其混合系等之另外的透明電極材料(專利文獻1~4)。In particular, in the new generation of displays, it is sought to develop active matrix full-color TFT display panels using a lightweight flexible plastic substrate (hereinafter also referred to as a resin substrate). In addition, touch-sensitive displays have developed materials that correspond to flexible materials such as transparent electrodes or resin substrates of touch panels used in combination with display panels. As transparent electrodes, ITO has been used since the past, and other transparent electrode materials such as PEDOT and other bendable transparent conductive polymers, metal nanowires and their hybrid systems have been proposed (Patent Documents 1 to 4).

另一方面,觸控面板膜之基材亦自玻璃開發至由聚對苯二甲酸乙二酯(PET)、聚醯亞胺、環烯烴、丙烯酸等之塑膠所成之薄片等,而具有可撓性之透明可撓性觸控螢幕面板(專利文獻5~7)。On the other hand, the base material of the touch panel film has also been developed from glass to a sheet made of plastics such as polyethylene terephthalate (PET), polyimide, cycloolefin, and acrylic. Flexible transparent flexible touch screen panel (Patent Documents 5~7).

一般,可撓性觸控螢幕面板,為了穩定進行生產與剝離,而於玻璃基板等之支撐基板上製作剝離層(黏著層),於其上製作裝置後予以剝離而生產(專利文獻8)。該剝離層需要於行程中不自支撐基板剝離但另一方面於剝離之際為低剝離力。Generally, a flexible touch screen panel is produced by making a peeling layer (adhesive layer) on a supporting substrate such as a glass substrate for stable production and peeling, and then peeling off after manufacturing a device on it (Patent Document 8). The peeling layer needs to not peel from the supporting substrate during the stroke, but on the other hand, it has a low peeling force during peeling.

又,近幾年來,基於抑制塗佈液之使用與伴隨步驟簡略化之生產性之觀點,於生產線上使用狹縫式塗佈法(專利文獻9、10)。該方法與旋轉塗佈法不同,由於製膜後含有大量溶劑,故需要減壓乾燥製程。該製程係於塗佈處理與加熱處理之間實施,係用以使剛塗佈後之不穩定膜穩定化所必須。但,因減壓所致之殘存溶劑之影響,會發生塗佈不均,故有必要改善該塗佈不均。 [先前技術文獻] [專利文獻]In addition, in recent years, the slit coating method has been used on the production line from the viewpoint of suppressing the use of the coating liquid and simplifying the accompanying steps of productivity (Patent Documents 9, 10). This method is different from the spin coating method. Since the film contains a large amount of solvents after film formation, a vacuum drying process is required. This process is implemented between coating treatment and heating treatment, and is necessary to stabilize the unstable film just after coating. However, coating unevenness may occur due to the influence of residual solvents caused by reduced pressure, so it is necessary to improve the unevenness of coating. [Prior Technical Literature] [Patent Literature]

[專利文獻1] 國際公開第2012/147235號 [專利文獻2] 日本特開2009-283410號公報 [專利文獻3] 日本特表2010-507199號公報 [專利文獻4] 日本特開2009-205924號公報 [專利文獻5] 國際公開第2017/002664號 [專利文獻6] 國際公開第2016/160338號 [專利文獻7] 日本特開2015-166145號公報 [專利文獻8] 日本特開2016-531358號公報 [專利文獻9] 日本特開2014-102490號公報 [專利文獻10] 日本特開2014-106956號公報[Patent Document 1] International Publication No. 2012/147235 [Patent Document 2] JP 2009-283410 A [Patent Document 3] JP 2010-507199 Publication [Patent Document 4] JP 2009-205924 A [Patent Document 5] International Publication No. 2017/002664 [Patent Document 6] International Publication No. 2016/160338 [Patent Document 7] JP 2015-166145 A [Patent Document 8] JP 2016-531358 A [Patent Document 9] JP 2014-102490 A [Patent Document 10] JP 2014-106956 A

[發明欲解決之課題][The problem to be solved by the invention]

本發明係鑒於前述情況而完成者,目的在於提供即使藉由狹縫式塗佈法塗佈時,亦不產生塗佈不均、可賦與具有與基體之優異密著性、與樹脂基板之適度密著性及適度剝離性之剝離層之狹縫式塗佈用剝離層形成用組成物。 [用以解決課題之手段]The present invention was completed in view of the foregoing circumstances, and its purpose is to provide a resin substrate with excellent adhesion to the substrate without causing uneven coating even when it is coated by a slit coating method. A composition for forming a release layer for slit coating of a release layer with moderate adhesion and moderate release. [Means to solve the problem]

本發明人等為達成上述目的而重複積極檢討之結果,發現包含(A)含有特定重複單位之聚脲,(B)酸化合物或其鹽,(C)選自具有羥基烷基及/或以烷氧基甲基取代之氮原子之化合物的交聯劑,(D)含有特定重複單位之高分子添加劑、及(E)由在20℃之蒸氣壓為800Pa以下之溶劑所成之溶劑之剝離層形成用組成物,其作為狹縫式塗佈用之組成物優異,可再現性良好地賦與具有與基體之優異密著性、與樹脂基板之適度密著性及適度剝離性之剝離層,因而完成本發明。The inventors of the present invention repeated the results of active reviews in order to achieve the above objectives, and found that they contain (A) polyurea containing specific repeating units, (B) acid compounds or salts thereof, (C) selected from hydroxyalkyl groups and/or A crosslinking agent for compounds with alkoxymethyl substituted nitrogen atoms, (D) polymer additives containing specific repeating units, and (E) stripping of solvents made of solvents whose vapor pressure is below 800 Pa at 20°C A composition for layer formation, which is excellent as a composition for slit coating, and reproducibly imparts a release layer with excellent adhesion to the substrate, moderate adhesion to the resin substrate, and moderate releasability , Thus completing the present invention.

亦即,本發明提供下述之狹縫式塗佈用剝離層形成用組成物及剝離層。 1. 一種狹縫式塗佈用剝離層形成用組成物,其包含 (A)含有以下述式(1)表示之重複單位之聚脲, (B)酸化合物或其鹽, (C)選自具有羥基烷基及/或以烷氧基甲基取代之氮原子之化合物的交聯劑, (D)含有以下述式(a1)表示之重複單位、以下述式(b)表示之重複單位及以下述式(c)表示之重複單位之高分子添加劑,以及 (E)包含至少1種於20℃之蒸氣壓為800Pa以下之溶劑的溶劑, (D)高分子添加劑相對於(A)聚脲100質量份,含有3~100質量份,

Figure 02_image001
[式中,A1 、A2 、A3 、A4 、A5 及A6 分別獨立為氫原子、甲基或乙基, X1 為下述式(1-1)、(1-2)、(1-3)或(1-4)表示之基
Figure 02_image003
(式中,R1 及R2 分別獨立為氫原子、碳數1~6之烷基、碳數3~6之烯基、苄基或苯基,前述苯基可經選自碳數1~6之烷基、鹵原子、碳數1~6之烷氧基、硝基、氰基、羥基及碳數1~6之烷硫基所成之群中之至少1種基取代,且R1 及R2 亦可相互鍵結與該等所鍵結之碳原子一起形成碳數3~6之環,R3 為碳數1~6之烷基、碳數3~6之烯基、苄基或苯基,前述苯基可經選自碳數1~6之烷基、鹵原子、碳數1~6之烷氧基、硝基、氰基、羥基及碳數1~6之烷硫基所成之群中之至少1種基取代), Q1 為下述式(1-5)或(1-6)表示之基,
Figure 02_image005
(式中,X2 為式(1-1)、式(1-2)或式(1-4)表示之基,Q2 為碳數1~10之伸烷基、伸苯基、伸萘基或伸蒽基,前述伸苯基、伸萘基及伸蒽基可經選自碳數1~6之烷基、鹵原子、碳數1~6之烷氧基、硝基、氰基、羥基及碳數1~6之烷硫基所成之群中之至少1種基取代,n1 及n2 分別獨立為0或1)]
Figure 02_image007
(式中,RA 分別獨立為氫原子或甲基,RB1 係至少1個氫原子經氟原子取代之碳數3或4之分支狀烷基,RC 係碳數1~10之羥基烷基,RD 為碳數6~20之多環式烷基或碳數6~12之芳基)。 2. 如1之狹縫式塗佈用剝離層形成用組成物,其中(D)高分子添加物之式(b)表示之重複單位中,RC 為碳數2~10之羥基烷基,羥基所鍵結之碳原子為2級碳原子,且式(a1)表示之重複單位之含有比例於(D)高分子添加物之全部重複單位中為30莫耳%以上。 3. 如1或2之狹縫式塗佈用剝離層形成用組成物,其中X1 為式(1-3)表示之基。 4. 如3之狹縫式塗佈用剝離層形成用組成物,其中R3 為2-丙烯基。 5. 如1至4中任一項之狹縫式塗佈用剝離層形成用組成物,其中Q1 為式(1-5)表示之基。 6. 如1至5中任一項之狹縫式塗佈用剝離層形成用組成物,其中(B)成分係磺酸化合物或其鹽。 7. 如1至6中任一項之狹縫式塗佈用剝離層形成用組成物,其中(C)交聯劑為下述式(C-1)~(C-7)之任一者表示之化合物,
Figure 02_image009
(式中,R11 ~R38 分別獨立為氫原子或碳數1~6之烷基,R39 為氫原子或甲基)。 8. 如1至7中任一項之狹縫式塗佈用剝離層形成用組成物,其中(C)交聯劑之含量,相對於(A)聚脲100質量份,為10~100質量份。 9. 一種剝離層,其係由如1至8中任一項之狹縫式塗佈用剝離層形成用組成物所得。 10. 一種層合體,其係於如9之剝離層上層合波長400nm之光透過率為80%以上之樹脂層而成。 11. 一種樹脂基板之製造方法,其包含 將如1至8中任一項之狹縫式塗佈用剝離層形成用組成物塗佈於基體上,形成剝離層之步驟, 於前述剝離層上,形成波長400nm之光透過率為80%以上之樹脂基板之步驟,及 以0.15N/25mm以下之剝離力剝離前述樹脂基板之步驟。 [發明效果]That is, the present invention provides the following composition for forming a release layer for slit coating and a release layer. 1. A composition for forming a release layer for slit coating, comprising (A) a polyurea containing a repeating unit represented by the following formula (1), (B) an acid compound or its salt, and (C) selected from A crosslinking agent of a compound having a hydroxyalkyl group and/or a nitrogen atom substituted with an alkoxymethyl group, (D) containing a repeating unit represented by the following formula (a1), a repeating unit represented by the following formula (b), and The polymer additive in the repeating unit represented by the following formula (c), and (E) a solvent containing at least one solvent with a vapor pressure of 800 Pa or less at 20°C, (D) the polymer additive is relative to (A) polyurea 100 parts by mass, containing 3~100 parts by mass,
Figure 02_image001
[In the formula, A 1 , A 2 , A 3 , A 4 , A 5 and A 6 are each independently a hydrogen atom, a methyl group or an ethyl group, and X 1 is the following formula (1-1), (1-2) , (1-3) or (1-4)
Figure 02_image003
(In the formula, R 1 and R 2 are each independently a hydrogen atom, an alkyl group with a carbon number of 1 to 6, an alkenyl group with a carbon number of 3 to 6, a benzyl group or a phenyl group. At least one of the group consisting of 6 alkyl groups, halogen atoms, C1-C6 alkoxy groups, nitro groups, cyano groups, hydroxyl groups and C1-C6 alkylthio groups, and R 1 And R 2 can also be bonded to each other together with the bonded carbon atoms to form a carbon 3-6 ring, R 3 is an alkyl with 1 to 6 carbons, an alkenyl with 3 to 6 carbons, and a benzyl group Or phenyl group, the aforementioned phenyl group can be selected from alkyl groups having 1 to 6 carbon atoms, halogen atoms, alkoxy groups having 1 to 6 carbon atoms, nitro groups, cyano groups, hydroxyl groups and alkylthio groups having 1 to 6 carbon atoms At least one group in the group is substituted), Q 1 is a group represented by the following formula (1-5) or (1-6),
Figure 02_image005
(In the formula, X 2 is a group represented by formula (1-1), formula (1-2) or formula (1-4), and Q 2 is an alkylene, phenylene, or naphthalene with 1 to 10 carbon atoms The aforementioned phenylene, naphthylene and anthracene groups can be selected from alkyl groups with 1 to 6 carbons, halogen atoms, alkoxy groups with 1 to 6 carbons, nitro, cyano, Substitution of at least one group of hydroxyl group and alkylthio group with carbon number 1~6, n 1 and n 2 are independently 0 or 1)]
Figure 02_image007
(In the formula, R A is independently a hydrogen atom or a methyl group, R B1 is a branched alkyl group with 3 or 4 carbons in which at least one hydrogen atom is replaced by a fluorine atom, and R C is a hydroxyalkane with 1 to 10 carbons. R D is a polycyclic alkyl group with 6 to 20 carbons or an aryl group with 6 to 12 carbons). 2. The composition for forming a release layer for slit coating as in 1, wherein in the repeating unit represented by formula (b) of (D) polymer additives, R C is a hydroxyalkyl group with 2 to 10 carbon atoms, The carbon atom to which the hydroxyl group is bonded is a secondary carbon atom, and the content of the repeating unit represented by the formula (a1) is 30 mol% or more in all the repeating units of the polymer additive (D). 3. The composition for forming a release layer for slit coating according to 1 or 2, wherein X 1 is a base represented by formula (1-3). 4. The composition for forming a release layer for slit coating according to 3 , wherein R 3 is a 2-propenyl group. 5. The composition for forming a release layer for slit coating according to any one of 1 to 4, wherein Q 1 is a base represented by formula (1-5). 6. The composition for forming a release layer for slit coating according to any one of 1 to 5, wherein the component (B) is a sulfonic acid compound or a salt thereof. 7. The composition for forming a release layer for slit coating according to any one of 1 to 6, wherein the (C) crosslinking agent is any of the following formulas (C-1) to (C-7) Represents the compound,
Figure 02_image009
(In the formula, R 11 to R 38 are each independently a hydrogen atom or an alkyl group with 1 to 6 carbon atoms, and R 39 is a hydrogen atom or a methyl group). 8. The composition for forming a release layer for slit coating according to any one of 1 to 7, wherein the content of (C) crosslinking agent is 10-100 mass parts relative to 100 mass parts of (A) polyurea Copies. 9. A peeling layer obtained from the composition for forming a peeling layer for slit coating according to any one of 1 to 8. 10. A laminated body, which is formed by laminating a resin layer with a light transmittance of 80% or more at a wavelength of 400 nm on a release layer such as 9. 11. A method of manufacturing a resin substrate, comprising the step of applying the composition for forming a peeling layer for slit coating as in any one of 1 to 8 on a substrate to form a peeling layer, on the peeling layer , A step of forming a resin substrate with a light transmittance of 80% or more at a wavelength of 400nm, and a step of peeling the aforementioned resin substrate with a peeling force of 0.15N/25mm or less. [Invention Effect]

藉由使用本發明之狹縫式塗佈用剝離層形成用組成物,不產生塗佈不均、可再現性良好地賦與具有與基體之優異密著性、與樹脂基板之適度密著性及適度剝離性之剝離層。且於可撓性電子裝置之製造製程中,不對形成於基體上之樹脂基板或進而於其上設置之電路等造成損傷,可將該電路等與該樹脂基板一起自該基體分離。因此,本發明之狹縫式塗佈用剝離層形成用組成物,可有助於具備樹脂基板之可撓性電子裝置之製造製程之高速化或其良率提高。By using the composition for forming a release layer for slit coating of the present invention, coating unevenness is not generated, and it has excellent adhesion to the substrate and moderate adhesion to the resin substrate with good reproducibility. And moderately peelable peeling layer. In the manufacturing process of the flexible electronic device, the resin substrate formed on the substrate or the circuit provided on the substrate is not damaged, and the circuit and the like can be separated from the substrate together with the resin substrate. Therefore, the composition for forming a release layer for slit coating of the present invention can contribute to the speeding up of the manufacturing process of flexible electronic devices provided with the resin substrate or the improvement of yield.

[狹縫式塗佈用剝離層形成用組成物][Composition for forming release layer for slit coating]

本發明之狹縫式塗佈用剝離層形成用組成物包含(A)含有特定重複單位之聚脲,(B)酸化合物或其鹽,(C)選自具有羥基烷基及/或以烷氧基甲基取代之氮原子之化合物的交聯劑,(D)含有特定重複單位之高分子添加劑、及(E)溶劑者。The composition for forming a release layer for slit coating of the present invention comprises (A) a polyurea containing a specific repeating unit, (B) an acid compound or a salt thereof, and (C) is selected from the group having a hydroxyalkyl group and/or an alkyl group. The crosslinking agent of the compound of the nitrogen atom substituted by oxymethyl group, (D) the polymer additive containing the specific repeating unit, and (E) the solvent.

[(A)聚脲] (A)成分之聚脲係含有以下述式(1)表示之重複單位者。

Figure 02_image011
[(A) Polyurea] The polyurea of the component (A) contains a repeating unit represented by the following formula (1).
Figure 02_image011

式(1)中,A1 、A2 、A3 、A4 、A5 及A6 分別獨立為氫原子、甲基或乙基,但基於剝離性與生產性之觀點,較佳A1 ~A6 全部為氫原子。In formula (1), A 1 , A 2 , A 3 , A 4 , A 5 and A 6 are each independently a hydrogen atom, a methyl group or an ethyl group, but from the viewpoint of releasability and productivity, A 1 to All A 6 are hydrogen atoms.

式(1)中,X1 為下述式(1-1)、(1-2)、(1-3)或(1-4)表示之基:

Figure 02_image013
In formula (1), X 1 is a group represented by the following formula (1-1), (1-2), (1-3) or (1-4):
Figure 02_image013

式(1-1)及(1-2)中,R1 及R2 分別獨立為氫原子、碳數1~6之烷基、碳數3~6之烯基、苄基或苯基,前述苯基可經選自碳數1~6之烷基、鹵原子、碳數1~6之烷氧基、硝基、氰基、羥基及碳數1~6之烷硫基所成之群中之至少1種基取代,且R1 及R2 亦可相互鍵結而與該等所鍵結之碳原子一起形成碳數3~6之環。In formulas (1-1) and (1-2), R 1 and R 2 are each independently a hydrogen atom, an alkyl group with 1 to 6 carbons, an alkenyl group with 3 to 6 carbons, a benzyl group or a phenyl group. The phenyl group can be selected from the group consisting of alkyl groups with 1 to 6 carbons, halogen atoms, alkoxy groups with 1 to 6 carbons, nitro, cyano, hydroxyl, and alkylthio groups with 1 to 6 carbons. At least one of the groups is substituted, and R 1 and R 2 may also be bonded to each other to form a carbon 3-6 ring together with the bonded carbon atoms.

式(1-3)中,R3 為碳數1~6之烷基、碳數3~6之烯基、苄基或苯基,前述苯基可經選自碳數1~6之烷基、鹵原子、碳數1~6之烷氧基、硝基、氰基、羥基及碳數1~6之烷硫基所成之群中之至少1種基取代。In formula (1-3), R 3 is an alkyl group with 1 to 6 carbons, an alkenyl group with 3 to 6 carbons, a benzyl group or a phenyl group. The aforementioned phenyl group can be selected from alkyls with 1 to 6 carbons. , Halogen atom, C1-C6 alkoxy group, nitro group, cyano group, hydroxyl group and C1-C6 alkylthio group are substituted with at least one group.

式(1)中,Q1 為下述式(1-5)或(1-6)表示之基,

Figure 02_image015
In formula (1), Q 1 is a group represented by the following formula (1-5) or (1-6),
Figure 02_image015

式(1-5)中,X2 為式(1-1)、式(1-2)或式(1-4)表示之基。式(1-5)中,例如X2 為以式(1-2)表示之基時,其構造成為以下述式(1-5-1)表示者。

Figure 02_image017
(式中,R1 及R2 與前述相同)。In formula (1-5), X 2 is a group represented by formula (1-1), formula (1-2) or formula (1-4). In formula (1-5), for example, when X 2 is a group represented by formula (1-2), its structure is represented by the following formula (1-5-1).
Figure 02_image017
(In the formula, R 1 and R 2 are the same as described above).

式(1-6)中,Q2 為碳數1~10之伸烷基、伸苯基、伸萘基或伸蒽基。前述伸苯基、伸萘基及伸蒽基可經選自碳數1~6之烷基、鹵原子、碳數1~6之烷氧基、硝基、氰基、羥基及碳數1~6之烷硫基所成之群中之至少1種基取代。又,Q2 為伸苯基、伸萘基或伸蒽基之情況,該等之鍵結位置並未特別限定。亦即,會有例如伸苯基以1位與2位鍵結之情況、以1位與3位鍵結之情況或以1位與4位鍵結之情況,伸萘基以1位與2位鍵結之情況、以1位與4位鍵結之情況、以1位與5位鍵結之情況或以2位與3位鍵結之情況,伸蒽基以1位與2位鍵結之情況、以1位與4位鍵結之情況或以9位與10位鍵結之情況等,任一情況均可。In formula (1-6), Q 2 is an alkylene group, phenylene group, naphthylene group or anthrylene group having 1 to 10 carbon atoms. The aforementioned phenylene, naphthylene and anthracene groups can be selected from alkyl groups having 1 to 6 carbon atoms, halogen atoms, alkoxy groups having 1 to 6 carbon atoms, nitro groups, cyano groups, hydroxyl groups and carbon numbers 1~6. At least one of the group consisting of 6 alkylthio groups is substituted. In addition, when Q 2 is a phenylene group, a naphthylene group or an anthracene group, the bonding position of these groups is not particularly limited. That is, there may be cases where the phenylene group is bonded at the 1-position and the 2-position, the 1-position and the 3-position are bonded, or the 1-position and the 4-position are bonded, and the naphthylene group is bonded at the 1-position and the 2-position. In the case of position bonding, the case of bonding with the 1-position and the 4-position, the case of the bonding with the 1-position and the 5-position, or the case of the 2-position and the 3-position bonding, the anthracene group is bonded with the 1-position and the 2-position It can be either the case, the case of bonding with 1 position and 4 positions, or the case of bonding with 9 positions and 10 positions.

作為前述碳數1~6之烷基可為直鏈狀、分支狀、環狀之任一者,舉例為例如甲基、乙基、異丙基、正丁基、環己基等。作為前述碳數3~6之烯基可為直鏈狀、分支狀、環狀之任一者,舉例為例如2-丙烯基、3-丁烯基等。The alkyl group having 1 to 6 carbon atoms may be any of linear, branched, and cyclic, and examples thereof include methyl, ethyl, isopropyl, n-butyl, cyclohexyl, and the like. The alkenyl group having 3 to 6 carbon atoms may be any of linear, branched, and cyclic, and examples thereof include 2-propenyl and 3-butenyl.

作為前述碳數1~6之烷氧基可為直鏈狀、分支狀、環狀之任一者,舉例為例如甲氧基、乙氧基、異丙氧基、正戊氧基及環己氧基等。作為碳數1~6之烷硫基可為直鏈狀、分支狀、環狀之任一者,舉例為例如甲硫基、乙硫基、異丙硫基、正戊硫基、環己硫基等。作為前述鹵原子舉例為氟原子、氯原子、溴原子、碘原子等。又,作為R1 與R2 鍵結而形成之碳數3~6之環,舉例為環丁烷環、環戊烷環、環己烷環等。The alkoxy group having 1 to 6 carbon atoms may be any of linear, branched, and cyclic, and examples include methoxy, ethoxy, isopropoxy, n-pentoxy and cyclohexyl. Oxy etc. The alkylthio group having 1 to 6 carbon atoms may be linear, branched, or cyclic, and examples include methylthio, ethylthio, isopropylthio, n-pentylthio, and cyclohexylthio. Base etc. Examples of the aforementioned halogen atom include a fluorine atom, a chlorine atom, a bromine atom, an iodine atom, and the like. In addition, examples of the ring having 3 to 6 carbon atoms formed by bonding R 1 and R 2 include a cyclobutane ring, a cyclopentane ring, and a cyclohexane ring.

作為前述碳數1~10之伸烷基,可為直鏈狀、分支狀、環狀之任一者,舉例為例如亞甲基、伸乙基、伸丙基、五亞甲基、伸環己基、2-甲基伸丙基等。The aforementioned alkylene group having 1 to 10 carbon atoms may be linear, branched, or cyclic, and examples include methylene, ethylene, propylene, pentamethylene, and ring extension. Hexyl, 2-methylpropylene, etc.

又,式(1)中,X1 為以式(1-2)表示之基時,其構造成為下述式(2)表示者,X1 為以式(1-3)表示之基時,其構造成為下述式(3)表示者。又,式(3)中,R3 較佳為2-丙烯基。

Figure 02_image019
(式中,A1 ~A6 、R1 ~R3 及Q1 與前述相同)。Moreover, in formula (1), when X 1 is a base represented by formula (1-2), its structure is represented by the following formula (2), and when X 1 is a base represented by formula (1-3), The structure is represented by the following formula (3). In addition, in formula (3), R 3 is preferably a 2-propenyl group.
Figure 02_image019
(In the formula, A 1 to A 6 , R 1 to R 3 and Q 1 are the same as above).

式(1)中,基於(A)成份之聚脲之耐熱性之觀點,Q1 較佳包含環狀構造。亦即,較佳Q1 為以式(1-5)表示之基或以式(1-6)表示之基,Q2 為環狀伸烷基、伸苯基、伸萘基或伸蒽基,更佳為以式(1-5)表示之基。In the formula (1), based on the heat resistance of the polyurea of the component (A), Q 1 preferably includes a cyclic structure. That is, it is preferable that Q 1 is a group represented by formula (1-5) or a group represented by formula (1-6), and Q 2 is a cyclic alkylene group, phenylene group, naphthylene group or anthrylene group , More preferably a base represented by formula (1-5).

作為式(1)表示之重複單位,較佳為以下述式(4)~式(22)表示者。又,下述式中,Me為甲基,Et為乙基。

Figure 02_image021
The repeating unit represented by formula (1) is preferably represented by the following formula (4) to formula (22). In the following formula, Me is a methyl group and Et is an ethyl group.
Figure 02_image021

Figure 02_image023
Figure 02_image023

Figure 02_image025
Figure 02_image025

Figure 02_image027
Figure 02_image027

Figure 02_image029
Figure 02_image029

(A)成分之聚脲可參考例如國際公開第 2005/098542號而合成。(A) The polyurea of component can refer to, for example, International Publication No. Synthesized under No. 2005/098542.

(A)聚脲之重量平均分子量(Mw)較佳為1,000 ~200,000,更佳為3,000~100,000,又更佳為4,000~ 30,000,再更佳為5,000~20,000。又,其分散度(Mw/Mn)較佳為1.3~4.0,更佳為1.4~2.5。又Mn係數平均分子量,Mw及Mn係藉由凝膠滲透層析儀(GPC)之聚苯乙烯換算測定值。(A) The weight average molecular weight (Mw) of the polyurea is preferably 1,000 to 200,000, more preferably 3,000 to 100,000, still more preferably 4,000 to 30,000, and still more preferably 5,000 to 20,000. In addition, the degree of dispersion (Mw/Mn) is preferably 1.3 to 4.0, more preferably 1.4 to 2.5. In addition, the Mn coefficient is the average molecular weight, Mw and Mn are measured by gel permeation chromatography (GPC) converted from polystyrene.

[(B)酸化合物或其鹽] 本發明之剝離層形成用組成物包含作為(B)成分之酸化合物或其鹽。作為前述酸化合物舉例為對-甲苯磺酸、三氟甲烷磺酸、吡啶鎓-對-甲苯磺酸鹽、水楊酸、樟腦磺酸、磺基水楊酸、4-氯苯磺酸、4-羥基苯磺酸、苯二磺酸、1-萘磺酸等之磺酸化合物,或水楊酸、磺基水楊酸、檸檬酸、苯甲酸、羥基苯甲酸等之羧酸化合物。且,作為前述酸化合物之鹽舉例為前述酸之吡啶鎓鹽、異丙醇胺鹽、N-甲基嗎啉鹽等,具體舉例為對-甲苯磺酸吡啶鎓鹽、1-萘磺酸吡啶鎓鹽、異丙醇胺對-甲苯磺酸鹽、N-甲基嗎啉對-甲苯磺酸鹽等。[(B) Acid compound or its salt] The composition for forming a release layer of the present invention contains an acid compound or a salt thereof as the component (B). Examples of the aforementioned acid compounds are p-toluenesulfonic acid, trifluoromethanesulfonic acid, pyridinium-p-toluenesulfonate, salicylic acid, camphorsulfonic acid, sulfosalicylic acid, 4-chlorobenzenesulfonic acid, 4 -Sulfonic acid compounds such as hydroxybenzenesulfonic acid, benzenedisulfonic acid, 1-naphthalenesulfonic acid, or carboxylic acid compounds such as salicylic acid, sulfosalicylic acid, citric acid, benzoic acid, and hydroxybenzoic acid. In addition, as the salt of the aforementioned acid compound, pyridinium salt, isopropanolamine salt, N-methylmorpholine salt, etc. of the aforementioned acid are exemplified, and specific examples are p-toluenesulfonic acid pyridinium salt, 1-naphthalenesulfonic acid pyridinium Onium salt, isopropanolamine p-toluenesulfonate, N-methylmorpholine p-toluenesulfonate, etc.

(B)成分之含量,相對於(A)成分之聚脲100質量份,較佳為0.01~30質量份,更佳為0.1~20質量份。(B)成分之含量若為上述範圍,則可獲得能賦與具有耐熱性與適度剝離性、製膜後之安定性優異之剝離層的組成物。(B)酸化合物或其鹽可單獨使用1種,亦可組合2種以上使用。The content of the component (B) is preferably 0.01 to 30 parts by mass, and more preferably 0.1 to 20 parts by mass relative to 100 parts by mass of the polyurea of the component (A). When the content of the component (B) is in the above range, a composition capable of imparting a peeling layer having heat resistance, moderate peelability, and excellent stability after film formation can be obtained. (B) An acid compound or its salt may be used individually by 1 type, and may be used in combination of 2 or more types.

[(C)交聯劑] 本發明之剝離層形成用組成物包含作為(C)成分之交聯劑。前述交聯劑係選自具有羥基烷基及/或以烷氧基甲基取代之氮原子之化合物者。[(C) Crosslinking agent] The composition for forming a release layer of the present invention contains a crosslinking agent as the component (C). The aforementioned crosslinking agent is selected from compounds having a hydroxyalkyl group and/or a nitrogen atom substituted with an alkoxymethyl group.

作為前述交聯劑,較佳為以下述式(C-1)~(C-7)之任一者表示之化合物。

Figure 02_image031
The crosslinking agent is preferably a compound represented by any of the following formulas (C-1) to (C-7).
Figure 02_image031

式中,R11 ~R38 分別獨立為氫原子或碳數1~6之烷基,但較佳為碳數1~6之烷基。R39 為氫原子或甲基。In the formula, R 11 to R 38 are each independently a hydrogen atom or an alkyl group having 1 to 6 carbon atoms, but preferably an alkyl group having 1 to 6 carbon atoms. R 39 is a hydrogen atom or a methyl group.

作為前述交聯劑,具體舉例為六羥甲基三聚氰胺、四羥甲基苯胍胺、1,3,4,6-四羥甲基甘脲、六甲氧基甲基三聚氰胺、四甲氧基甲基苯胍胺、1,3,4,6-四(甲氧基甲基)甘脲、1,3,4,6-四(丁氧基甲基)甘脲、1,3,4,6-四(羥基甲基)甘脲等之含氮化合物。As the aforementioned crosslinking agent, specific examples are hexamethylol melamine, tetramethylol benzoguanamine, 1,3,4,6-tetramethylol glycoluril, hexamethoxymethyl melamine, tetramethoxymethyl Benzoguanamine, 1,3,4,6-tetra(methoxymethyl) glycoluril, 1,3,4,6-tetra(butoxymethyl) glycoluril, 1,3,4,6 -Tetra (hydroxymethyl) glycoluril and other nitrogen-containing compounds.

又,作為交聯劑舉例為ALLNEX公司製之甲氧基甲基型三聚氰胺化合物(商品名CYMEL(註冊商標)300、CYMEL 301、CYMEL 303、CYMEL 350)、丁氧基甲基型三聚氰胺(商品名MYCOTE(註冊商標)506、MYCOTE 508)、甘脲化合物(商品名CYMEL 1170、POWDERLINK 1174)、甲基化脲樹脂(商品名UFR65)、丁基化脲樹脂(商品名UFR300、U-VAN10S60、U-VAN10R、U-VAN11HV)、DIC(股)製脲/甲醛系樹脂(商品名BECKAMINE(註冊商標)J-300S、BECKAMINE P-955、BECKAMINE N)等之市售的含氮化合物。In addition, examples of the crosslinking agent are methoxymethyl melamine compounds (trade names CYMEL (registered trademark) 300, CYMEL 301, CYMEL 303, CYMEL 350) manufactured by ALLNEX, butoxymethyl melamine (trade name MYCOTE (registered trademark) 506, MYCOTE 508), glycoluril compound (trade name CYMEL 1170, POWDERLINK 1174), methylated urea resin (trade name UFR65), butylated urea resin (trade name UFR300, U-VAN10S60, U -VAN10R, U-VAN11HV), DIC (Stock) urea/formaldehyde resin (trade name BECKAMINE (registered trademark) J-300S, BECKAMINE P-955, BECKAMINE N) and other commercially available nitrogen-containing compounds.

又,作為交聯劑舉例為3,3’-5,5’-四(甲氧基甲基)-[1,1’-聯苯]-4,4’-二醇、5,5’-(1-甲基亞乙基)雙[2-羥基-1,3-苯二甲醇]等之含芳香環化合物。In addition, as the crosslinking agent, 3,3'-5,5'-tetra(methoxymethyl)-[1,1'-biphenyl]-4,4'-diol, 5,5'- (1-Methylethylene)bis[2-hydroxy-1,3-benzenedimethanol] and other aromatic ring-containing compounds.

進而,作為交聯劑可利用使用N-羥甲基(甲基)丙烯醯胺、N-甲氧基甲基(甲基)丙烯醯胺、N-乙氧基甲基(甲基)丙烯醯胺、N-丁氧基甲基(甲基)丙烯醯胺等之經羥甲基或烷氧基甲基取代之(甲基)丙烯醯胺化合物而製造之聚合物。作為此等聚合物舉例為例如聚(N-丁氧基甲基(甲基)丙烯醯胺)、N-丁氧基甲基(甲基)丙烯醯胺與苯乙烯之共聚物、N-羥基甲基(甲基)丙烯醯胺與(甲基)丙烯酸甲酯之共聚物、N-乙氧基甲基甲基丙烯醯胺與甲基丙烯酸苄酯之共聚物、N-丁氧基甲基(甲基)丙烯醯胺與(甲基)丙烯酸苄酯與(甲基)丙烯酸2-羥基丙酯之共聚物等。Furthermore, N-methylol (meth)acrylamide, N-methoxymethyl (meth)acrylamide, N-ethoxymethyl (meth)acrylamide, and N-ethoxymethyl (meth)acrylamide can be used as a crosslinking agent. Amine, N-butoxymethyl(meth)acrylamide, etc., are polymers produced by (meth)acrylamide compounds substituted with methylol or alkoxymethyl. Examples of such polymers include poly(N-butoxymethyl(meth)acrylamide), copolymer of N-butoxymethyl(meth)acrylamide and styrene, N-hydroxyl Copolymer of methyl(meth)acrylamide and methyl(meth)acrylate, copolymer of N-ethoxymethylmethacrylamide and benzyl methacrylate, N-butoxymethyl Copolymer of (meth)acrylamide, benzyl (meth)acrylate and 2-hydroxypropyl (meth)acrylate, etc.

作為前述交聯劑,更佳舉例為六甲氧基甲基三聚氰胺、四甲氧基甲基苯胍胺、1,3,4,6-四(甲氧基甲基)甘脲(POWDERLINK 1174)、1,3,4,6-四(丁氧基甲基)甘脲、1,3,4,6-四(羥基甲基)甘脲。As the aforementioned crosslinking agent, more preferable examples are hexamethoxymethyl melamine, tetramethoxymethyl benzoguanamine, 1,3,4,6-tetra (methoxymethyl) glycoluril (POWDERLINK 1174), 1,3,4,6-Tetra (butoxymethyl) glycoluril, 1,3,4,6-tetra(hydroxymethyl) glycoluril.

該等交聯劑可藉由自我縮合而引起交聯反應。且,可與(A)成分之聚脲中之羥基引起交聯反應。因此,藉由此等交聯反應,所形成之剝離層變強固,成為對有機溶劑之溶解性較低之剝離層。These cross-linking agents can cause cross-linking reactions by self-condensation. In addition, it can cause a crosslinking reaction with the hydroxyl group in the polyurea of component (A). Therefore, due to this crosslinking reaction, the formed release layer becomes strong and becomes a release layer with low solubility in organic solvents.

(C)成分之含量,相對於(A)成分之聚脲100質量份,較佳為10~100質量份,更佳為20~50質量份。(C)成分之含量若為前述範圍,則獲得可賦與具有高耐熱性與適度剝離性、製膜後之安定性優異之剝離層的組成物。(C)交聯劑可單獨使用1種,亦可組合2種以上使用。The content of the component (C) is preferably 10-100 parts by mass, and more preferably 20-50 parts by mass relative to 100 parts by mass of the polyurea of the component (A). (C) If the content of the component is in the aforementioned range, a composition capable of imparting a release layer having high heat resistance and moderate releasability and excellent stability after film formation is obtained. (C) A crosslinking agent may be used individually by 1 type, and may be used in combination of 2 or more types.

[(D)高分子添加劑] 本發明之剝離層形成用組成物包含作為(D)成分之含有以下述式(a1)表示之重複單位、以下述式(b)表示之重複單位及以下述式(c)表示之重複單位之高分子添加劑。

Figure 02_image033
[(D) Polymer Additive] The composition for forming a release layer of the present invention contains as component (D) a repeating unit represented by the following formula (a1), a repeating unit represented by the following formula (b), and the following formula (c) The polymer additive of the repeating unit.
Figure 02_image033

式中,RA 分別獨立為氫原子或甲基。RB1 係至少1個氫原子經氟原子取代之碳數3或4之分支狀烷基。RC 係碳數1~10之羥基烷基。RD 為碳數6~20之多環式烷基或碳數6~12之芳基。In the formula, R A is each independently a hydrogen atom or a methyl group. R B1 is a branched alkyl group with 3 or 4 carbon atoms in which at least one hydrogen atom is replaced by a fluorine atom. R C is a hydroxyalkyl group with 1 to 10 carbon atoms. R D is a polycyclic alkyl group with 6 to 20 carbons or an aryl group with 6 to 12 carbons.

作為前述碳數3或4之分支狀烷基舉例為異丙基、異丁基、第二丁基及第三丁基。作為RB1 ,較佳為該等分支狀烷基之至少1個氫原子經氟原子取代者,作為具體例舉例為1,1,1-三氟異丙基、1,1,1,3,3,3-六氟異丙基、九氟第三丁基等。The branched alkyl group having 3 or 4 carbon atoms is exemplified by isopropyl group, isobutyl group, second butyl group, and tertiary butyl group. R B1 is preferably one in which at least one hydrogen atom of the branched alkyl group is substituted with a fluorine atom. Specific examples include 1,1,1-trifluoroisopropyl, 1,1,1,3, 3,3-hexafluoroisopropyl, nonafluoro tertiary butyl, etc.

作為前述碳數1~10之羥基烷基舉例為羥基甲基、2-羥基乙基、3-羥基丙基、4-羥基丁基、5-羥基戊基、6-羥基己基、7-羥基庚基、8-羥基辛基、9-羥基壬基、10-羥基癸基、2-羥基-1-甲基乙基、2-羥基-1,1-二甲基乙基、3-羥基-1-甲基丙基、3-羥基-1,2-二甲基丙基、3-羥基-2,2-二甲基丙基、4-羥基-1-甲基丁基、4-羥基-2-甲基丁基、4-羥基-3-甲基丁基等之碳數1~10之羥基烷基,且羥基所鍵結之碳原子為1級碳原子者;1-羥基乙基、1-羥基丙基、2-羥基丙基、1-羥基丁基、2-羥基丁基、1-羥基己基、2-羥基己基、1-羥基辛基、2-羥基辛基、1-羥基癸基、2-羥基癸基、1-羥基-1-甲基乙基、2-羥基-2-甲基丙基等之碳數2~10之羥基烷基,且羥基所鍵結之碳原子為2級或3級碳原子者。作為RC 尤其較佳為碳數2~10之羥基烷基且羥基所鍵結之碳原子為2級碳原子者。Examples of the aforementioned hydroxyalkyl group having 1 to 10 carbon atoms include hydroxymethyl, 2-hydroxyethyl, 3-hydroxypropyl, 4-hydroxybutyl, 5-hydroxypentyl, 6-hydroxyhexyl, and 7-hydroxyheptyl. Base, 8-hydroxyoctyl, 9-hydroxynonyl, 10-hydroxydecyl, 2-hydroxy-1-methylethyl, 2-hydroxy-1,1-dimethylethyl, 3-hydroxy-1 -Methylpropyl, 3-hydroxy-1,2-dimethylpropyl, 3-hydroxy-2,2-dimethylpropyl, 4-hydroxy-1-methylbutyl, 4-hydroxy-2 -Methylbutyl, 4-hydroxy-3-methylbutyl, and other hydroxyalkyl groups with 1 to 10 carbon atoms, and the carbon atom to which the hydroxyl group is bonded is a first-order carbon atom; 1-hydroxyethyl, 1 -Hydroxypropyl, 2-hydroxypropyl, 1-hydroxybutyl, 2-hydroxybutyl, 1-hydroxyhexyl, 2-hydroxyhexyl, 1-hydroxyoctyl, 2-hydroxyoctyl, 1-hydroxydecyl , 2-hydroxydecyl, 1-hydroxy-1-methylethyl, 2-hydroxy-2-methylpropyl and other hydroxyalkyl groups with 2-10 carbons, and the carbon atom to which the hydroxyl group is bonded is 2 Grade or grade 3 carbon atoms. R C is particularly preferably a hydroxyalkyl group having 2 to 10 carbon atoms and the carbon atom to which the hydroxyl group is bonded is a secondary carbon atom.

作為前述碳數6~20之多環式烷基舉例為1-金剛烷基、2-金剛烷基、異冰片基、冰片基等。作為前述碳數6~12之芳基舉例為苯基、1-萘基、2-萘基、1-聯苯基、2-聯苯基等。Examples of the aforementioned polycyclic alkyl group having 6 to 20 carbon atoms include 1-adamantyl, 2-adamantyl, isobornyl, and borneol. Examples of the aryl group having 6 to 12 carbon atoms include phenyl, 1-naphthyl, 2-naphthyl, 1-biphenyl, 2-biphenyl, and the like.

且,(D)高分子添加劑可為含有以下述式(a2)表示之重複單位、以下述式(b)表示之重複單位、以下述式(c)表示之重複單位及以下述式(d)表示之重複單位者。

Figure 02_image035
In addition, the (D) polymer additive may contain a repeating unit represented by the following formula (a2), a repeating unit represented by the following formula (b), a repeating unit represented by the following formula (c), and a repeating unit represented by the following formula (d) Represents the repeated unit.
Figure 02_image035

式中,RA 、RC 及RD 與前述相同。RB2 係至少1個氫原子經氟原子取代之碳數3或4之分支狀烷基(但2-甲基-1,1,1,3,3,3-六氟異丙基除外)。作為前述碳數3或4之分支狀烷基舉例為與前述者相同。RE 為單鍵、碳數6~20之多環式伸烷基或碳數6~12之伸芳基。RF 為單鍵或碳數1~10之伸烷基。RG 為甲基、乙基或羥基。In the formula, R A , R C and R D are the same as above. R B2 is a branched alkyl group with 3 or 4 carbon atoms in which at least one hydrogen atom is replaced by a fluorine atom (except 2-methyl-1,1,1,3,3,3-hexafluoroisopropyl). Examples of the branched alkyl group having 3 or 4 carbon atoms are the same as those described above. R E is a single bond, a polycyclic alkylene group with 6 to 20 carbons or an aryl alkylene group with 6 to 12 carbons. R F is a single bond or an alkylene group with 1-10 carbon atoms. R G is methyl, ethyl or hydroxyl.

作為前述碳數6~20之多環式伸烷基舉例為自前述之碳數6~20之多環式烷基之具體例去除1個氫原子之基,舉例為例如伸金剛烷基、伸異冰片基、伸冰片基等。Examples of the aforementioned polycyclic alkylene group having 6 to 20 carbon atoms include a group in which one hydrogen atom is removed from the specific example of the aforementioned polycyclic alkyl group having 6 to 20 carbon atoms. Examples are, for example, adamantyl group and alkylene group. Different borneol base, stretched borneol base, etc.

作為前述碳數6~12之伸芳基舉例為自前述碳數6~12之芳基之具體例去除1個氫原子之基,舉例為例如伸苯基、伸萘基、伸聯苯基等。Examples of the aforementioned aryl group having 6 to 12 carbon atoms include a group having one hydrogen atom removed from the specific examples of the aforementioned aryl group having 6 to 12 carbon atoms, such as phenylene group, naphthylene group, and biphenylene group. .

作為前述碳數1~10之伸烷基,可舉例為與前述Q2 之說明中例示者同樣者。本發明中,較佳為碳數1~5之伸烷基,更佳為亞甲基及伸乙基,又更佳為亞甲基。As the alkylene having 1 to 10 carbon atoms, the same as those exemplified in the description of Q 2 can be exemplified. In the present invention, the alkylene group having 1 to 5 carbon atoms is preferable, the methylene group and the ethylene group are more preferable, and the methylene group is still more preferable.

作為式(a1)或(a2)表示之重複單位舉例為下述式(a-1)~(a-3)表示者,但不限定於該等。又下述式中,RA 與前述相同。

Figure 02_image037
Examples of the repeating unit represented by the formula (a1) or (a2) are those represented by the following formulas (a-1) to (a-3), but are not limited to these. In the following formula, R A is the same as described above.
Figure 02_image037

作為式(b)表示之重複單位,舉例為下述式(b-1)~(b-16)表示者,但不限定於該等。又,下述式中,RA 與前述相同。

Figure 02_image039
As the repeating unit represented by the formula (b), those represented by the following formulas (b-1) to (b-16) are exemplified, but are not limited to these. In addition, in the following formula, R A is the same as described above.
Figure 02_image039

作為式(c)表示之重複單位,舉例為下述式(c-1)~(c-13)表示者,但不限定於該等。又,下述式中,RA 與前述相同。

Figure 02_image041
As the repeating unit represented by the formula (c), those represented by the following formulas (c-1) to (c-13) are exemplified, but are not limited to these. In addition, in the following formula, R A is the same as described above.
Figure 02_image041

作為式(d)表示之重複單位,舉例為下述式(d-1)~(d-8)表示者,但不限定於該等。又,下述式中,RA 與前述相同。

Figure 02_image043
As the repeating unit represented by the formula (d), those represented by the following formulas (d-1) to (d-8) are exemplified, but are not limited to these. In addition, in the following formula, R A is the same as described above.
Figure 02_image043

(D)高分子添加劑為含有以式(a1)表示之重複單位、以式(b)表示之重複單位及以式(c)表示之重複單位者,且式(b)表示之重複單位中之羥基烷基之羥基所鍵結之碳原子為2級或3級碳原子之情況,式(a1)表示之重複單位之含有率,於全部重複單位中,較佳為30~60莫耳%,更佳為35~50莫耳%。式(b)表示之重複單位之含有率,於全部重複單位中,較佳為10~35莫耳%,更佳為15~30莫耳%。式(c)表示之重複單位之含有率,於全部重複單位中,較佳為5~60莫耳%,更佳為20~50莫耳%。(D) The polymer additive contains the repeating unit represented by formula (a1), the repeating unit represented by formula (b) and the repeating unit represented by formula (c), and among the repeating units represented by formula (b) When the carbon atom to which the hydroxyl group of the hydroxyalkyl group is bonded is a secondary or tertiary carbon atom, the content of the repeating unit represented by formula (a1) is preferably 30-60 mol% in all repeating units, More preferably, it is 35-50 mol%. The content rate of the repeating unit represented by the formula (b) is preferably 10 to 35 mol%, more preferably 15 to 30 mol% in all repeating units. The content rate of the repeating unit represented by formula (c) is preferably 5-60 mol%, more preferably 20-50 mol% in all repeating units.

(D)高分子添加劑為含有以式(a1)表示之重複單位、以式(b)表示之重複單位及以式(c)表示之重複單位者,且式(b)表示之重複單位中之羥基烷基之羥基所鍵結之碳原子為1級碳原子之情況,式(a1)表示之重複單位之含有率,於全部重複單位中,較佳為15~60莫耳%,更佳為25~60莫耳%,又更佳為30~60莫耳%,再更佳為35~50莫耳%。式(b)表示之重複單位之含有率,於全部重複單位中,較佳為8~38莫耳%,更佳為10~38莫耳%,又更佳為10~35莫耳%,再更佳為15~30莫耳%。式(c)表示之重複單位之含有率,於全部重複單位中,較佳為2~77莫耳%,更佳為2~65莫耳%,又更佳為5~60莫耳%,再更佳為20~50莫耳%。(D) The polymer additive contains the repeating unit represented by formula (a1), the repeating unit represented by formula (b) and the repeating unit represented by formula (c), and among the repeating units represented by formula (b) When the carbon atom to which the hydroxyl group of the hydroxyalkyl group is bonded is a first-order carbon atom, the content of the repeating unit represented by formula (a1), in all repeating units, is preferably 15-60 mol%, more preferably 25-60 mol%, more preferably 30-60 mol%, still more preferably 35-50 mol%. The content rate of the repeating unit represented by formula (b) is preferably 8~38 mol%, more preferably 10~38 mol%, and still more preferably 10~35 mol% in all repeating units. More preferably, it is 15-30 mole%. The content rate of the repeating unit represented by formula (c) is preferably 2~77 mol%, more preferably 2~65 mol%, and more preferably 5~60 mol% in all repeating units. More preferably, it is 20-50 mole%.

(D)高分子添加劑為含有以式(a2)表示之重複單位、以式(b)表示之重複單位、以式(c)表示之重複單位及以式(d)表示之重複單位者之情況,式(a2)表示之重複單位之含有率,於全部重複單位中,較佳為2~45莫耳%,更佳為5~35莫耳%。式(b)表示之重複單位之含有率,於全部重複單位中,較佳為20~35莫耳%,更佳為25~35莫耳%。式(c)表示之重複單位之含有率,於全部重複單位中,較佳為30~45莫耳%,更佳為35~45莫耳%。式(d)表示之重複單位之含有率,於全部重複單位中,較佳為5~18莫耳%,更佳為5~15莫耳%。(D) When the polymer additive contains the repeating unit represented by formula (a2), the repeating unit represented by formula (b), the repeating unit represented by formula (c), and the repeating unit represented by formula (d) , The content rate of the repeating unit represented by the formula (a2), in all repeating units, is preferably 2~45 mol%, more preferably 5~35 mol%. The content rate of the repeating unit represented by formula (b) is preferably 20 to 35 mol%, more preferably 25 to 35 mol% in all repeating units. The content rate of the repeating unit represented by formula (c) is preferably 30-45 mol%, more preferably 35-45 mol% in all repeating units. The content rate of the repeating unit represented by formula (d) is preferably 5-18 mol%, more preferably 5-15 mol% in all repeating units.

(D)高分子添加劑之Mw較佳為2,000~10,000,更佳為3,000~8,000。又其Mw/Mn較佳為1.0~2.1,更佳為1.0~1.9。(D) The Mw of the polymer additive is preferably 2,000 to 10,000, more preferably 3,000 to 8,000. The Mw/Mn is preferably 1.0 to 2.1, more preferably 1.0 to 1.9.

(D)高分子添加劑之含量,相對於(A)成分之聚脲100質量份,為3~100質量份,更佳為3~80質量份,又更佳為3~50質量份。高分子添加劑之含量未達3質量份時,有剝離力變大之情況,超過100質量份時,於製膜時有排斥之情況。(D)高分子添加劑可單獨使用1種,亦可組合2種以上使用。(D) The content of the polymer additive is 3 to 100 parts by mass, more preferably 3 to 80 parts by mass, and still more preferably 3 to 50 parts by mass relative to 100 parts by mass of polyurea of component (A). When the content of the polymer additive is less than 3 parts by mass, the peeling force may increase, and when it exceeds 100 parts by mass, it may be rejected during film formation. (D) The polymer additive may be used alone or in combination of two or more kinds.

[(E)溶劑] 本發明之剝離層形成用組成物包含作為(E)成分之溶劑。作為前述溶劑較佳為碳數3~20之二醇醚系溶劑、碳數3~20之酯系溶劑、碳數3~20之酮系溶劑或碳數3~20之環狀化合物系溶劑。[(E) Solvent] The composition for forming a release layer of the present invention contains a solvent as the component (E). The aforementioned solvent is preferably a glycol ether solvent with 3 to 20 carbons, an ester solvent with 3 to 20 carbons, a ketone solvent with 3 to 20 carbons, or a cyclic compound solvent with 3 to 20 carbons.

作為前述二醇醚系溶劑舉例為丙二醇單甲醚(PGME)、丙二醇單甲醚乙酸酯(PGMEA)、丙二醇單乙醚、丙二醇單乙醚乙酸酯、丙二醇單丙醚、丙二醇單丁醚、乙二醇單甲醚、乙二醇二甲醚、乙二醇二乙醚、乙二醇單甲醚乙酸酯、二乙二醇單甲醚、二乙二醇單乙醚、二乙二醇二甲醚(Diglyme)、二乙二醇二乙醚、二乙二醇單己醚、二乙二醇丁基甲醚、三乙二醇單甲醚、三乙二醇二甲醚(Triglyme)、二乙二醇單丁醚、二乙二醇乙基甲醚、二乙二醇異丙基甲醚、二乙二醇二丁醚、二甲氧基四乙二醇、二丙二醇甲醚、二丙二醇二甲醚、二丙二醇單甲醚、二丙二醇單乙醚乙酸酯(DEGEEA)、甲氧基甲基丁醇、三丙二醇二甲醚、三乙二醇丁基甲醚等。Examples of the aforementioned glycol ether solvent include propylene glycol monomethyl ether (PGME), propylene glycol monomethyl ether acetate (PGMEA), propylene glycol monoethyl ether, propylene glycol monoethyl ether acetate, propylene glycol monopropyl ether, propylene glycol monobutyl ether, ethyl acetate Glycol monomethyl ether, ethylene glycol dimethyl ether, ethylene glycol diethyl ether, ethylene glycol monomethyl ether acetate, diethylene glycol monomethyl ether, diethylene glycol monoethyl ether, diethylene glycol dimethyl ether Ether (Diglyme), diethylene glycol diethyl ether, diethylene glycol monohexyl ether, diethylene glycol butyl methyl ether, triethylene glycol monomethyl ether, triethylene glycol dimethyl ether (Triglyme), diethylene glycol Monobutyl ether, diethylene glycol ethyl methyl ether, diethylene glycol isopropyl methyl ether, diethylene glycol dibutyl ether, dimethoxytetraethylene glycol, dipropylene glycol methyl ether, dipropylene glycol dimethyl ether , Dipropylene glycol monomethyl ether, dipropylene glycol monoethyl ether acetate (DEGEEA), methoxymethyl butanol, tripropylene glycol dimethyl ether, triethylene glycol butyl methyl ether, etc.

作為前述酯系溶劑舉例為乙酸乙酯、乙酸丁酯、乙酸甲氧基丁酯、乙酸戊酯、乙酸異丙酯、乳酸甲酯、乳酸乙酯(EL)、乳酸丁酯、2-羥基異丁酸甲酯、2-羥基異丁酸乙酯、3-甲氧基丙酸乙酯等。Examples of the aforementioned ester solvent include ethyl acetate, butyl acetate, methoxybutyl acetate, amyl acetate, isopropyl acetate, methyl lactate, ethyl lactate (EL), butyl lactate, 2-hydroxy iso Methyl butyrate, ethyl 2-hydroxyisobutyrate, ethyl 3-methoxypropionate, etc.

作為前述酮系溶劑舉例為甲基乙基酮、甲基丙基酮、甲基異丁基酮、二異丁基酮、二丙酮醇、環己酮、環戊酮等。Examples of the ketone solvent include methyl ethyl ketone, methyl propyl ketone, methyl isobutyl ketone, diisobutyl ketone, diacetone alcohol, cyclohexanone, and cyclopentanone.

作為前述環狀化合物溶劑舉例為四氫呋喃、1,4-二噁烷、1,3-二氧雜環戊烷、2-吡咯啶酮、N-甲基吡咯啶酮(NMP)、N-乙基吡咯啶酮(NEP)、1,3-二甲基-2-咪唑啶酮(DMI)、γ-丁內酯(GBL)等。Examples of the aforementioned cyclic compound solvent include tetrahydrofuran, 1,4-dioxane, 1,3-dioxolane, 2-pyrrolidone, N-methylpyrrolidone (NMP), N-ethyl Pyrolidone (NEP), 1,3-dimethyl-2-imidazolidinone (DMI), γ-butyrolactone (GBL), etc.

(E)成分之溶劑包含至少1種於20℃之蒸氣壓為800Pa以下之溶劑的溶劑。前述溶劑之蒸氣壓,基於減壓乾燥時之揮發性之觀點,較佳為700Pa以下者,更佳為600Pa以下者。蒸氣壓下限並未特別限定,通常為0.1Pa以上,較佳為0.5Pa以上。作為蒸氣壓800Pa以下之溶劑,較佳為前述溶劑中蒸氣壓為800Pa以下者。作為此等溶劑較佳為PGMEA、丙二醇單乙醚乙酸酯、丙二醇單丁醚、乙二醇二乙醚、乙二醇單甲醚乙酸酯、二乙二醇單甲醚、Diglyme、二乙二醇二乙醚、乙二醇丁基甲醚、Triglyme、二乙二醇乙基甲醚、二乙二醇異丙基甲醚、二甲氧基四乙二醇、二丙二醇甲醚、二丙二醇二甲醚、DEGEEA、甲氧基甲基丁醇、三乙二醇丁基甲醚、EL、乳酸丁酯、2-羥基異丁酸甲酯、2-羥基異丁酸乙酯、3-乙氧基丙酸乙酯、二丙酮醇、環己酮、2-吡咯啶酮、NMP、NEP、DMI、GBL等。The solvent of component (E) contains at least one solvent with a vapor pressure of 800 Pa or less at 20°C. The vapor pressure of the aforementioned solvent is preferably 700 Pa or less, more preferably 600 Pa or less from the viewpoint of volatility during drying under reduced pressure. The lower limit of the vapor pressure is not particularly limited, but it is usually 0.1 Pa or more, and preferably 0.5 Pa or more. As a solvent having a vapor pressure of 800 Pa or less, one having a vapor pressure of 800 Pa or less among the aforementioned solvents is preferable. As these solvents, PGMEA, propylene glycol monoethyl ether acetate, propylene glycol monobutyl ether, ethylene glycol diethyl ether, ethylene glycol monomethyl ether acetate, diethylene glycol monomethyl ether, Diglyme, diethylene two Alcohol diethyl ether, ethylene glycol butyl methyl ether, Triglyme, diethylene glycol ethyl methyl ether, diethylene glycol isopropyl methyl ether, dimethoxytetraethylene glycol, dipropylene glycol methyl ether, dipropylene glycol dimethyl ether , DEGEEA, methoxymethyl butanol, triethylene glycol butyl methyl ether, EL, butyl lactate, methyl 2-hydroxyisobutyrate, ethyl 2-hydroxyisobutyrate, ethyl 3-ethoxypropionate Esters, diacetone alcohol, cyclohexanone, 2-pyrrolidone, NMP, NEP, DMI, GBL, etc.

於20℃之蒸氣壓為800Pa以下之溶劑之含量,基於減壓乾燥時之不揮發性之觀點,本發明之組成物中,較佳為1~99.9質量%,更佳為1~90質量%,又更佳為5~80質量%。The content of the solvent with a vapor pressure of 800 Pa or less at 20°C, based on the viewpoint of non-volatility during drying under reduced pressure, the composition of the present invention is preferably 1 to 99.9 mass%, more preferably 1 to 90 mass% , And more preferably 5~80% by mass.

(E)溶劑之含量,較佳為使本發明之剝離層形成用組成物中之固形分濃度成為0.1~40質量%之量,更佳為成為0.5~20質量%之量,又更佳為成為0.5~10質量%之量。又,所謂固形分係剝離層形成用組成物之全部成分中,溶劑以外者之總稱。溶劑可單獨使用1種,亦可組合2種以上使用。(E) The content of the solvent is preferably such that the solid content concentration in the composition for forming a release layer of the present invention becomes an amount of 0.1-40% by mass, more preferably an amount of 0.5-20% by mass, and still more preferably It becomes the amount of 0.5-10% by mass. In addition, the so-called solid part is a general term for all the components of the composition for forming a release layer except for the solvent. A solvent may be used individually by 1 type, and may be used in combination of 2 or more types.

[其他添加物] 本發明之剝離層形成用組成物亦可根據需要包含界面活性劑。藉由添加界面活性劑,可提高前述剝離層形成用組成物對基板之塗佈性。作為前述界面活性劑可使用非離子系界面活性劑、氟系界面活性劑、矽氧系界面活性劑等之習知界面活性劑。[Other additives] The composition for forming a release layer of the present invention may contain a surfactant as needed. By adding a surfactant, the coating property of the composition for forming a release layer to a substrate can be improved. As the aforementioned surfactant, conventional surfactants such as nonionic surfactants, fluorine-based surfactants, and silicone-based surfactants can be used.

作為前述非離子系界面活性劑之具體例舉例為例如聚氧乙烯月桂醚、聚氧乙烯硬脂醚、聚氧乙烯鯨蠟醚、聚氧乙烯油醚等之聚氧乙烯烷基醚類;聚氧乙烯辛基苯基醚、聚氧乙烯壬基苯基醚等之聚氧乙烯烷基芳基醚類;聚氧乙烯・聚氧丙烯嵌段共聚物類;山梨糖醇酐單月桂酸酯、山梨糖醇酐單棕櫚酸酯、山梨糖醇酐單硬脂酸酯、山梨糖醇酐單油酸酯、山梨糖醇酐三油酸酯、山梨糖醇酐三硬脂酸酯等之山梨糖醇酐脂肪酸酯類;聚氧乙烯山梨糖醇酐單月桂酸酯、聚氧乙烯山梨糖醇酐單棕櫚酸酯、聚氧乙烯山梨糖醇酐單硬脂酸酯、聚氧乙烯山梨糖醇酐三油酸酯、聚氧乙烯山梨糖醇酐三硬脂酸酯等之聚氧乙烯山梨糖醇酐脂肪酸酯類等。Specific examples of the aforementioned nonionic surfactant include polyoxyethylene alkyl ethers such as polyoxyethylene lauryl ether, polyoxyethylene stearyl ether, polyoxyethylene cetyl ether, and polyoxyethylene oleyl ether; Polyoxyethylene alkyl aryl ethers such as oxyethylene octyl phenyl ether and polyoxyethylene nonyl phenyl ether; polyoxyethylene and polyoxypropylene block copolymers; sorbitan monolaurate, Sorbitan monopalmitate, sorbitan monostearate, sorbitan monooleate, sorbitan trioleate, sorbitan tristearate, etc. Alkyd fatty acid esters; polyoxyethylene sorbitan monolaurate, polyoxyethylene sorbitan monopalmitate, polyoxyethylene sorbitan monostearate, polyoxyethylene sorbitan Polyoxyethylene sorbitan fatty acid esters such as trioleate and polyoxyethylene sorbitan tristearate.

作為前述氟系界面活性劑舉例為EF TOP(註冊商標)EF301、EF303、EF352(三菱材料電子化成(股)製)、MEGAFAC(註冊商標)F171、F173、F554、F559、F563、R-30、R-40、R-40-LM、DS-21 (DIC(股)製)、FLUORAD(註冊商標)FC430、FC431(3M公司製)、ASAHIGUARD(註冊商標)AG710、SURFLON(註冊商標)S-382、SC101、SC102、SC103、SC104、SC105、SC106(旭玻璃(股)製)等。Examples of the aforementioned fluorine-based surfactants are EF TOP (registered trademark) EF301, EF303, EF352 (manufactured by Mitsubishi Materials Electronics Co., Ltd.), MEGAFAC (registered trademark) F171, F173, F554, F559, F563, R-30, R-40, R-40-LM, DS-21 (DIC (stock) system), FLUORAD (registered trademark) FC430, FC431 (3M company system), ASAHIGUARD (registered trademark) AG710, SURFLON (registered trademark) S-382 , SC101, SC102, SC103, SC104, SC105, SC106 (made by Asahi Glass Co., Ltd.), etc.

又,作為矽氧系界面活性劑舉例為有機矽氧烷聚合物KP341(信越化學工業(股)製)等。In addition, the silicone-based surfactant is exemplified by organosiloxane polymer KP341 (manufactured by Shin-Etsu Chemical Co., Ltd.).

前述剝離層形成用組成物包含界面活性劑時,其含量相對於(A)聚脲100質量份,較佳為0.0001~1質量份,更佳為0.001~0.5質量份。前述界面活性劑可單獨使用1種,亦可組合2種以上使用。When the composition for forming a peeling layer contains a surfactant, its content is preferably 0.0001 to 1 part by mass, and more preferably 0.001 to 0.5 part by mass relative to 100 parts by mass of (A) polyurea. The aforementioned surfactants may be used singly or in combination of two or more kinds.

[狹縫式塗佈用剝離層形成用組成物之調製] 本發明之狹縫式塗佈用剝離層形成用組成物之調製方法並未特別限定。作為調製方法舉例為於溶解於溶劑之(A)成分之溶液中以特定比例混合(B)成分、(C)成分、(D)成分及(E)成分等,作成均一溶液之方法,或於前述調製方法之適當階段,根據需要進而添加其他添加劑並混合之方法。[Preparation of a composition for forming a release layer for slit coating] The preparation method of the composition for forming a release layer for slit coating of the present invention is not particularly limited. An example of the preparation method is a method of mixing (B), (C), (D), and (E) in a solution of (A) component dissolved in a solvent in a specific ratio to make a uniform solution, or In the appropriate stage of the aforementioned preparation method, other additives are added and mixed as needed.

本發明之剝離層形成用組成物之調製中,藉由溶劑中之聚合反應所得之特定共聚物(聚合物)之溶液可直接使用。該情況下,例如於(A)成分之溶液中,與前述同樣饋入(B)成分,進而(C)成分、(D)成分、(E)成分等作成均一溶液。此時,可基於濃度調整為目的進而追加投入溶劑。此時,於(A)成分之生成過程所用之溶劑與剝離層形成用組成物之濃度調整所用之溶劑可相同亦可不同。In the preparation of the composition for forming a release layer of the present invention, a solution of a specific copolymer (polymer) obtained by a polymerization reaction in a solvent can be used as it is. In this case, for example, the (B) component is fed into the solution of the (A) component in the same manner as described above, and the (C) component, (D) component, (E) component, and the like are made into a uniform solution. In this case, the solvent can be added for the purpose of concentration adjustment. At this time, the solvent used in the production process of the component (A) and the solvent used in the concentration adjustment of the release layer forming composition may be the same or different.

又,所調製之剝離層形成用組成物之溶液較佳使用孔徑為0.2μm左右之過濾器等過濾後使用。In addition, the prepared solution of the composition for forming a peeling layer is preferably used after being filtered with a filter having a pore size of about 0.2 μm.

本發明之剝離層形成用組成物之黏度,可考慮所製作之剝離層厚度等而適當設定,但以再現性良好地獲得尤其是0.01~5μm左右之厚度的膜為目的時,通常於25℃為1~5,000mPa・s左右,較佳為1~2,000mPa・s左右。The viscosity of the composition for forming a release layer of the present invention can be appropriately set in consideration of the thickness of the release layer to be produced, but for the purpose of obtaining a film with a thickness of about 0.01 to 5 μm with good reproducibility, it is usually at 25°C It is about 1~5,000mPa・s, preferably about 1~2,000mPa・s.

此處,黏度可使用市售之液體黏度測定用黏度計,參考例如JIS K7117-2中記載之順序,以剝離層形成用組成物之溫度25℃之條件進行測定。較佳,作為黏度計係使用圓錐平板型(cone plate型)旋轉黏度計,較佳以同型黏度計使用1°34’×R24作為標準圓錐轉子,以剝離層形成用組成物之溫度25℃之條件進行測定。作為此等旋轉黏度計舉例為例如東機產業(股)製TVE-25L。Here, the viscosity can be measured using a commercially available viscometer for measuring liquid viscosity, referring to, for example, the procedure described in JIS K7117-2, and measuring the temperature of the composition for forming a release layer at 25°C. Preferably, a cone plate rotary viscometer is used as the viscometer, and 1°34'×R24 is preferably used as a standard cone rotor with the same type viscometer. The temperature of the composition for forming the peeling layer is 25°C. The conditions are determined. An example of such a rotational viscometer is TVE-25L manufactured by Toki Sangyo Co., Ltd.

[剝離層] 以包含將本發明之狹縫式塗佈用剝離層形成用組成物使用狹縫式塗佈器於基體上藉由狹縫式塗佈法塗佈後,於180~250℃燒成之步驟之燒成法,可獲得具有與基體之優異密著性及與樹脂基板之適度密著性與適度剝離性之剝離層。[Peeling layer] It includes a step of applying the composition for forming a release layer for slit coating of the present invention on a substrate by a slit coating method using a slit coater, and then firing at 180~250°C The firing method can obtain a peeling layer with excellent adhesion to the substrate and moderate adhesion and moderate releasability to the resin substrate.

加熱時間係隨加熱溫度而異無法一概規定,但通常為1分鐘~5小時。又,前述燒成時之溫度只要最高溫度為前述範圍,則亦可包含在其以下之溫度燒成之步驟。The heating time varies with the heating temperature and cannot be specified, but it is usually 1 minute to 5 hours. In addition, as long as the temperature at the time of the firing is the highest temperature in the above range, the firing step may be included at a temperature lower than that.

作為本發明之加熱態樣之較佳一例,舉例為於50~150℃加熱1分鐘~1小時後,直接上升加熱溫度,於180~250℃加熱5分鐘~4小時之態樣。尤其作為加熱態樣之更佳一例,舉例為於50~150℃加熱1分鐘~1小時,於200~250℃加熱5分鐘~2小時之態樣。進而,作為加熱態樣之更佳一例,舉例為於50~150℃加熱1~30分鐘後,於200~250℃加熱5分鐘~1小時之態樣。As a preferable example of the heating aspect of the present invention, for example, after heating at 50-150°C for 1 minute to 1 hour, the heating temperature is directly increased, and heating at 180-250°C for 5 minutes to 4 hours. In particular, as a better example of the heating state, for example, heating at 50~150°C for 1 minute to 1 hour, and 200~250°C for 5 minutes to 2 hours. Furthermore, as a more preferable example of the heating state, after heating at 50 to 150°C for 1 to 30 minutes, heating at 200 to 250°C for 5 minutes to 1 hour, for example.

又,於基體上形成本發明之剝離層時,可於基體之一部分表面形成剝離層,亦可於整面形成。作為於基體之一部分表面形成剝離層之態樣,舉例為基體表面中僅於特定範圍形成剝離層之態樣、於基體表面整面以點圖型、線與間隔圖型等之圖型狀形成剝離層之態樣等。又,本發明中,所謂基體係其表面塗佈本發明之剝離層形成用組成物者,意指可撓性電子裝置等之製造所用者。In addition, when the release layer of the present invention is formed on a substrate, the release layer may be formed on a part of the surface of the substrate, or it may be formed on the entire surface. As an aspect of forming a peeling layer on a part of the surface of the substrate, for example, the aspect of forming a peeling layer only in a specific area on the surface of the substrate, and forming the entire surface of the substrate with patterns such as dot pattern, line and space pattern, etc. The state of the peeling layer, etc. In the present invention, the term "base system" where the composition for forming the release layer of the present invention is applied to the surface of the base system refers to those used in the manufacture of flexible electronic devices and the like.

作為基體(基材)舉例為例如玻璃、金屬(矽晶圓等)、水泥板等,尤其基於由本發明之剝離層形成用組成物所得之剝離層對其具有充分密著性,較佳為玻璃。又,基體表面可以單一材料構成,亦可以2種以上之材料構成。作為以2種以上材料構成基體表面之態樣,有基體表面中某範圍以某材料構成,其餘表面以其他材料構成之態樣、於基體表面整面某材料以點圖型、線與間隔圖型等之圖型狀存在於其他材料中之態樣等。Examples of the substrate (substrate) are, for example, glass, metal (silicon wafer, etc.), cement board, etc. In particular, the peeling layer obtained from the composition for forming a peeling layer of the present invention has sufficient adhesion to it, preferably glass . In addition, the surface of the substrate may be composed of a single material, or may be composed of two or more materials. As the surface of the substrate composed of two or more materials, a certain area of the surface of the substrate is composed of a certain material, and the rest of the surface is composed of other materials, and a certain material on the entire surface of the substrate has a pattern of dots, lines and intervals. Patterns and other patterns exist in other materials.

作為加熱所用之器具舉例為例如加熱板、烘箱等。加熱環境可為空氣下亦可為惰性氣體下,且可為常壓下亦可為減壓下。Examples of appliances used for heating include hot plates, ovens, and the like. The heating environment can be under air or under inert gas, and can be under normal pressure or under reduced pressure.

剝離層厚度通常為0.01~50μm左右,基於生產性之觀點,較佳為0.01~20μm左右,更佳為0.01~5μm左右,調整加熱前之塗膜厚度而實現期望厚度。The thickness of the peeling layer is usually about 0.01-50μm. From the viewpoint of productivity, it is preferably about 0.01-20μm, more preferably about 0.01-5μm. The thickness of the coating film before heating is adjusted to achieve the desired thickness.

本發明之剝離層具有與基體尤其是與玻璃基體之優異密著性、並且具有與樹脂基板之適度密著性及適度剝離性。因此,本發明之剝離層於可撓性電子裝置之製造製程中,對於該裝置之樹脂基板不會造成損傷,由於該樹脂基板可與形成於該樹脂基板上之電路等一起自基體剝離故而可較適當地使用。The peeling layer of the present invention has excellent adhesion to the substrate, especially to the glass substrate, and has moderate adhesion and moderate peelability to the resin substrate. Therefore, the peeling layer of the present invention does not cause damage to the resin substrate of the device during the manufacturing process of the flexible electronic device, because the resin substrate can be peeled from the substrate together with the circuit formed on the resin substrate. Use it more appropriately.

[樹脂基板之製造方法] 針對使用本發明之剝離層之可撓性電子裝置之製造方法之一例加以說明。首先,使用本發明之狹縫式塗佈用剝離層形成用組成物,藉由前述方法,於玻璃基體上形成剝離層。於該剝離層上塗佈用以形成樹脂基板之樹脂基板形成用溶液,燒成所得塗膜,形成經由本發明之剝離層固定於玻璃基體之樹脂基板。[Method of manufacturing resin substrate] An example of a manufacturing method of a flexible electronic device using the peeling layer of the present invention will be described. First, using the composition for forming a release layer for slit coating of the present invention, a release layer is formed on a glass substrate by the aforementioned method. The resin substrate forming solution for forming a resin substrate is coated on the release layer, and the resulting coating film is fired to form a resin substrate fixed to the glass substrate via the release layer of the present invention.

前述塗膜之燒成溫度係根據樹脂種類等適當設定,但本發明中,該燒成時之最高溫度較佳設為200~ 250℃,更佳設為210~250℃,又更佳設為220~240℃。藉由將樹脂基板製作時之燒成時的最高溫度設為該範圍,可更提高基底的剝離層與基體之密著性或剝離層與樹脂基板之適度密著性及剝離性。該情況下,只要將最高溫度設於前述範圍,則亦可包含於其以下之溫度燒成之步驟。The firing temperature of the aforementioned coating film is appropriately set according to the type of resin, etc. However, in the present invention, the maximum temperature during firing is preferably set to 200~250°C, more preferably set to 210~250°C, and more preferably set to 220~240℃. By setting the maximum temperature at the time of firing during the production of the resin substrate to this range, the adhesion between the release layer of the base and the substrate or the appropriate adhesion and releasability between the release layer and the resin substrate can be further improved. In this case, as long as the maximum temperature is set within the aforementioned range, the step of firing at a temperature below it may also be included.

以樹脂基板全面覆蓋剝離層之方式,以與剝離層之面積比較為較大之面積形成樹脂基板。作為樹脂基板舉例為由丙烯酸聚合物所成之樹脂基板或由環烯烴聚合物所成之樹脂基板。該樹脂基板之形成方法只要依據常用方法即可。且作為前述樹脂基板,較佳為波長400nm之光透過率為80%以上者。The resin substrate is formed so that the entire surface of the release layer is covered by the resin substrate with a larger area than the area of the release layer. Examples of the resin substrate include a resin substrate made of acrylic polymer or a resin substrate made of cycloolefin polymer. The method of forming the resin substrate only needs to follow a common method. Furthermore, as the aforementioned resin substrate, a light transmittance with a wavelength of 400 nm of 80% or more is preferable.

其次,將經由本發明之剝離層固定於基體之該樹脂基板上,根據需要形成期望電路,隨後例如沿著剝離層切割樹脂基板,將樹脂基板與該電路一起自剝離層剝離,而將樹脂基板與基體分離。此時,亦可將基體之一部分與剝離層一起切割。若使用本發明之剝離層,可藉0.15N/25mm以下,尤其是0.1N/25mm以下之剝離力將樹脂基板自剝離層剝離。 [實施例]Secondly, the peeling layer of the present invention is fixed to the resin substrate of the base body, and the desired circuit is formed as required. Then, for example, the resin substrate is cut along the peeling layer, and the resin substrate and the circuit are peeled from the peeling layer to remove the resin substrate. Separated from the substrate. At this time, a part of the base body can also be cut together with the release layer. If the peeling layer of the present invention is used, the resin substrate can be peeled from the peeling layer with a peeling force of 0.15N/25mm or less, especially 0.1N/25mm or less. [Example]

以下列舉合成例、調製例、實施例及比較例更詳細說明本發明,但本發明不限定於下述實施例。Hereinafter, synthesis examples, preparation examples, examples, and comparative examples are given to explain the present invention in more detail, but the present invention is not limited to the following examples.

下述例中使用之化合物如以下。又,蒸氣壓係20℃下之值。 PGME:丙二醇單甲醚(蒸氣壓1200Pa) PGMEA:丙二醇單甲醚乙酸酯(蒸氣壓500Pa) EL:乳酸乙酯(蒸氣壓279Pa) GBL:γ-丁內酯(蒸氣壓150Pa) DEGEEA:二乙二醇單乙醚乙酸酯(蒸氣壓6Pa) Triglyme:三乙二醇二甲醚(蒸氣壓120Pa) Diglyme:二乙二醇二甲醚(蒸氣壓330Pa) PL-LI:1,3,4,6-四(甲氧基乙基)甘脲(ALLNEX公司製,商品名:POWDERLINK 1174) PPTS:對-甲苯磺酸吡啶鎓鹽 IBXA:甲基丙烯酸異冰片酯 HPMA:甲基丙烯酸2-羥基丙酯 ADMA:甲基丙烯酸2-金剛烷酯 HFiPMA:甲基丙烯酸1,1,1,3,3,3-六氟丙酯 AIBN:偶氮雙異丁腈The compounds used in the following examples are as follows. In addition, the vapor pressure is a value at 20°C. PGME: Propylene glycol monomethyl ether (vapor pressure 1200Pa) PGMEA: Propylene glycol monomethyl ether acetate (vapor pressure 500Pa) EL: ethyl lactate (vapor pressure 279Pa) GBL: γ-butyrolactone (vapor pressure 150Pa) DEGEEA: Diethylene glycol monoethyl ether acetate (vapor pressure 6Pa) Triglyme: Triethylene glycol dimethyl ether (vapor pressure 120Pa) Diglyme: Diethylene glycol dimethyl ether (vapor pressure 330Pa) PL-LI: 1,3,4,6-Tetra (methoxyethyl) glycoluril (manufactured by ALLNEX, trade name: POWDERLINK 1174) PPTS: pyridinium p-toluenesulfonate IBXA: Isobornyl methacrylate HPMA: 2-hydroxypropyl methacrylate ADMA: 2-adamantyl methacrylate HFiPMA: 1,1,1,3,3,3-hexafluoropropyl methacrylate AIBN: Azobisisobutyronitrile

又,聚合物之重量平均分子量(Mw)之測定係使用日本分光(股)製GPC裝置(管柱:Shodex(註冊商標)KD801及KD805(昭和電工(股)製);溶離液:二甲基甲醯胺/LiBr・H2 O(29.6mM)/H3 PO4 (29.6mM)/THF(0.1質量%);流量:1.0mL/min;管柱溫度:40℃;Mw:標準聚苯乙烯換算值)進行。In addition, the weight average molecular weight (Mw) of the polymer was measured using a GPC device manufactured by JASCO Corporation (columns: Shodex (registered trademark) KD801 and KD805 (manufactured by Showa Denko Corporation)); eluent: dimethyl Formamide/LiBr・H 2 O(29.6mM)/H 3 PO 4 (29.6mM)/THF(0.1% by mass); flow rate: 1.0mL/min; column temperature: 40°C; Mw: standard polystyrene Converted value).

[1]聚合物之合成 [合成例1]聚脲(L1)之合成 將單烯丙基二縮水甘油基異氰脲酸(四國化成工業(股)製)100g、5,5-二乙基巴比妥酸66.4g及氯化苄基三乙銨4.1g溶解於PGME 682g之後,於130℃反應24小時,獲得包含聚脲(L1)之溶液(固形分濃度20質量%)。GPC分析之結果,所得聚脲(L1)之Mw為8,000,Mw/Mn為1.5。[1] Synthesis of polymers [Synthesis example 1] Synthesis of polyurea (L1) Dissolve 100 g of monoallyl diglycidyl isocyanuric acid (manufactured by Shikoku Chemical Industry Co., Ltd.), 66.4 g of 5,5-diethylbarbituric acid and 4.1 g of benzyltriethylammonium chloride in After 682 g of PGME, it was reacted at 130° C. for 24 hours to obtain a solution containing polyurea (L1) (solid content concentration 20% by mass). As a result of GPC analysis, the obtained polyurea (L1) had an Mw of 8,000 and a Mw/Mn of 1.5.

[合成例2]丙烯酸聚合物(S1)之合成 將HFiPMA4.02g、HPMA2.22g、ADMA5.00g及AIBN 0.47g溶解於PGME49.1g中,於70℃反應20小時,獲得丙烯酸聚合物(S1)溶液(固形分濃度20質量%)。各單位之組成比為HFiPMA:HPMA:ADMA=30:30:40。GPC分析之結果,所得丙烯酸聚合物(S1)之Mw為5,040,Mw/Mn為1.7。[Synthesis example 2] Synthesis of acrylic polymer (S1) 4.02 g of HFiPMA, 2.22 g of HPMA, 5.00 g of ADMA, and 0.47 g of AIBN were dissolved in 49.1 g of PGME and reacted at 70° C. for 20 hours to obtain an acrylic polymer (S1) solution (solid content concentration 20% by mass). The composition ratio of each unit is HFiPMA:HPMA:ADMA=30:30:40. As a result of GPC analysis, the obtained acrylic polymer (S1) had Mw of 5,040 and Mw/Mn of 1.7.

[合成例3]丙烯酸聚合物(S2)之合成 將HFiPMA3.98g、HPMA2.43g、IBXA5.00g及AIBN 0.46g溶解於PGME49.8g中,於70℃反應20小時,獲得丙烯酸聚合物(S2)溶液(固形分濃度20質量%)。各單位之組成比為HFiPMA:HPMA:IBXA=30:30:40。GPC分析之結果,所得丙烯酸聚合物(S2)之Mw為4,720,Mw/Mn為1.7。[Synthesis example 3] Synthesis of acrylic polymer (S2) HFiPMA3.98g, HPMA2.43g, IBXA5.00g, and AIBN 0.46g were dissolved in PGME49.8g and reacted at 70°C for 20 hours to obtain an acrylic polymer (S2) solution (solid content concentration 20% by mass). The composition ratio of each unit is HFiPMA:HPMA:IBXA=30:30:40. As a result of GPC analysis, the obtained acrylic polymer (S2) had Mw of 4,720 and Mw/Mn of 1.7.

[2]樹脂基板形成用組成物之調製 [調製例1]樹脂基板形成用組成物F1之調製 於饋入有四氯化碳100g之梨形燒瓶中,添加ZEONOR (註冊商標)1020R(日本ZEON(股)製環烯烴聚合物)10g及EPOLEAD(註冊商標)GT401(DAICEL(股)製)3g。該溶液於氮氣環境下攪拌24小時溶解,調製樹脂基板形成用組成物F1。[2] Preparation of composition for resin substrate formation [Preparation example 1] Preparation of composition F1 for forming a resin substrate Into a pear-shaped flask filled with 100 g of carbon tetrachloride, add 10 g of ZEONOR (registered trademark) 1020R (cycloolefin polymer made by ZEON (Stock) in Japan) and 3 g of EPOLEAD (registered trademark) GT401 (made by DAICEL (Stock)) . This solution was stirred in a nitrogen atmosphere for 24 hours to dissolve, and a composition F1 for forming a resin substrate was prepared.

[3]狹縫式塗佈用剝離層形成用組成物之調製 [實施例1-1]剝離層形成用組成物1之調製 於合成例1所得之反應液20g中,添加PL-LI 1.00g、PPTS 0.12g、丙烯酸聚合物(S1)溶液1.50g及PGMEA,以PGME稀釋至固形分濃度為5質量%,PGMEA濃度為30質量%,調製剝離層形成用組成物1。[3] Preparation of composition for forming release layer for slit coating [Example 1-1] Preparation of composition 1 for forming peeling layer To 20 g of the reaction solution obtained in Synthesis Example 1, 1.00 g of PL-LI, 0.12 g of PPTS, 1.50 g of acrylic polymer (S1) solution and PGMEA were added, and diluted with PGME to a solid content concentration of 5 mass%, and a PGMEA concentration of 30 Mass %, the composition 1 for peeling layer formation was prepared.

[實施例1-2]剝離層形成用組成物2之調製 除了使固形分濃度成為5質量%,PGMEA濃度成為70質量%以外,以與實施例1-1同樣方法調製剝離層形成用組成物2。[Example 1-2] Preparation of composition 2 for forming peeling layer The composition 2 for forming a peeling layer was prepared in the same manner as in Example 1-1 except that the solid content concentration was 5 mass% and the PGMEA concentration was 70 mass%.

[實施例1-3]剝離層形成用組成物3之調製 除了替代PGMEA而使用EL,使固形分濃度成為5質量%,EL濃度成為30質量%以外,以與實施例1-1同樣方法調製剝離層形成用組成物3。[Example 1-3] Preparation of composition 3 for forming peeling layer Except that EL was used instead of PGMEA, and the solid content concentration was set to 5 mass% and the EL concentration was set to 30 mass %, the release layer forming composition 3 was prepared in the same manner as in Example 1-1.

[實施例1-4]剝離層形成用組成物4之調製 除了替代PGMEA而使用EL,使固形分濃度成為5質量%,EL濃度成為70質量%以外,以與實施例1-1同樣方法調製剝離層形成用組成物4。[Example 1-4] Preparation of composition 4 for forming peeling layer Except that EL was used instead of PGMEA, the solid content concentration was 5 mass %, and the EL concentration was 70 mass %, the composition 4 for peeling layer formation was prepared in the same manner as in Example 1-1.

[實施例1-5]剝離層形成用組成物5之調製 除了替代PGMEA而使用GBL,使固形分濃度成為5質量%,GBL濃度成為30質量%以外,以與實施例1-1同樣方法調製剝離層形成用組成物5。[Example 1-5] Preparation of composition 5 for forming peeling layer Except that GBL was used instead of PGMEA, the solid content concentration was 5 mass %, and the GBL concentration was 30 mass %, the composition 5 for peeling layer formation was prepared by the same method as Example 1-1.

[實施例1-6]剝離層形成用組成物6之調製 除了替代PGMEA而使用GBL,使固形分濃度成為5質量%,GBL濃度成為10質量%以外,以與實施例1-1同樣方法調製剝離層形成用組成物6。[Example 1-6] Preparation of composition 6 for forming peeling layer Except that GBL was used instead of PGMEA, the solid content concentration was set to 5 mass%, and the GBL concentration was set to 10 mass%, a peeling layer forming composition 6 was prepared in the same manner as in Example 1-1.

[實施例1-7]剝離層形成用組成物7之調製 除了替代PGMEA而使用Triglyme,使固形分濃度成為5質量%,Triglyme濃度成為30質量%以外,以與實施例1-1同樣方法調製剝離層形成用組成物5。[Example 1-7] Preparation of composition 7 for forming peeling layer Except that Triglyme was used instead of PGMEA, and the solid content concentration was set to 5% by mass and the Triglyme concentration was set to 30% by mass, the release layer forming composition 5 was prepared in the same manner as in Example 1-1.

[實施例1-8]剝離層形成用組成物8之調製 除了替代PGMEA而使用Triglyme,使固形分濃度成為5質量%,Triglyme濃度成為10質量%以外,以與實施例1-1同樣方法調製剝離層形成用組成物8。[Example 1-8] Preparation of composition 8 for forming peeling layer Except that Triglyme was used instead of PGMEA, and the solid content concentration was 5 mass %, and the Triglyme concentration was 10 mass %, the composition 8 for peeling layer formation was prepared in the same manner as in Example 1-1.

[實施例1-9]剝離層形成用組成物9之調製 除了替代PGMEA而使用Diglyme,使固形分濃度成為5質量%,Diglyme濃度成為10質量%以外,以與實施例1-1同樣方法調製剝離層形成用組成物9。[Example 1-9] Preparation of composition 9 for forming peeling layer Except that Diglyme was used instead of PGMEA, and the solid content concentration was set to 5 mass%, and the Diglyme concentration was set to 10 mass%, a release layer forming composition 9 was prepared in the same manner as in Example 1-1.

[實施例1-10]剝離層形成用組成物10之調製 除了替代PGMEA而使用DEGEEA,使固形分濃度成為5質量%,DEGEEA濃度成為30質量%以外,以與實施例1-1同樣方法調製剝離層形成用組成物10。[Example 1-10] Preparation of composition 10 for forming peeling layer Except that DEGEEA was used instead of PGMEA, and the solid content concentration was set to 5% by mass and the DEGEEA concentration was set to 30% by mass, the release layer forming composition 10 was prepared in the same manner as in Example 1-1.

[實施例1-11]剝離層形成用組成物11之調製 於合成例1所得之反應液20g中,添加PL-LI 1.28g、PPTS 0.12g、丙烯酸聚合物(S1)溶液6.00g及PGMEA,以PGME稀釋至固形分濃度為5質量%,PGMEA濃度為30質量%,調製剝離層形成用組成物11。[Example 1-11] Preparation of composition 11 for forming peeling layer To 20 g of the reaction solution obtained in Synthesis Example 1, add 1.28 g of PL-LI, 0.12 g of PPTS, 6.00 g of acrylic polymer (S1) solution and PGMEA, and dilute with PGME to a solid content concentration of 5 mass% and a PGMEA concentration of 30 Mass %, the composition 11 for peeling layer formation was prepared.

[實施例1-12]剝離層形成用組成物12之調製 於合成例1所得之反應液20g中,添加PL-LI 1.00g、PPTS 0.12g、丙烯酸聚合物(S2)溶液1.50g及PGMEA,以PGME稀釋至固形分濃度為5質量%,PGMEA濃度為30質量%,調製剝離層形成用組成物12。[Example 1-12] Preparation of composition 12 for forming peeling layer To 20 g of the reaction solution obtained in Synthesis Example 1, 1.00 g of PL-LI, 0.12 g of PPTS, 1.50 g of acrylic polymer (S2) solution and PGMEA were added, and diluted with PGME to a solid content concentration of 5 mass%, and a PGMEA concentration of 30 Mass %, the composition 12 for peeling layer formation was prepared.

[實施例1-13]剝離層形成用組成物13之調製 於合成例1所得之反應液20g中,添加PL-LI 1.00g、PPTS 0.60g、丙烯酸聚合物(S2)溶液1.50g及GBL,以PGME稀釋至固形分濃度為5質量%,GBL濃度為30質量%,調製剝離層形成用組成物13。[Example 1-13] Preparation of composition 13 for forming peeling layer To 20 g of the reaction solution obtained in Synthesis Example 1, 1.00 g of PL-LI, 0.60 g of PPTS, 1.50 g of acrylic polymer (S2) solution and GBL were added, and diluted with PGME to a solid content concentration of 5 mass% and a GBL concentration of 30 Mass %, the composition 13 for peeling layer formation was prepared.

[實施例1-14]剝離層形成用組成物14之調製 於合成例1所得之反應液20g中,添加PL-LI 1.00g、PPTS 0.60g、丙烯酸聚合物(S1)溶液1.50g及PGMEA,以PGME稀釋至固形分濃度為5質量%,PGMEA濃度為30質量%,調製剝離層形成用組成物14。[Example 1-14] Preparation of composition 14 for forming peeling layer To 20 g of the reaction solution obtained in Synthesis Example 1, 1.00 g of PL-LI, 0.60 g of PPTS, 1.50 g of acrylic polymer (S1) solution and PGMEA were added, and diluted with PGME to a solid content concentration of 5 mass%, and a PGMEA concentration of 30 Mass %, the composition 14 for peeling layer formation was prepared.

[實施例1-15]剝離層形成用組成物15之調製 於合成例1所得之反應液1g中,添加3,3’-5,5’-四(甲氧基甲基)-[1,1’-聯苯]-4,4’-二醇0.06g、PPTS 0.01g、丙烯酸聚合物(S1)溶液0.08g及PGMEA,以PGME稀釋至固形分濃度為5質量%,PGMEA濃度為30質量%,調製剝離層形成用組成物15。[Example 1-15] Preparation of composition 15 for forming peeling layer To 1 g of the reaction solution obtained in Synthesis Example 1, add 0.06 g of 3,3'-5,5'-tetra(methoxymethyl)-[1,1'-biphenyl]-4,4'-diol , PPTS 0.01 g, acrylic polymer (S1) solution 0.08 g, and PGMEA were diluted with PGME to a solid content concentration of 5% by mass and a PGMEA concentration of 30% by mass to prepare composition 15 for forming a peeling layer.

[比較例1]剝離層形成用組成物16之調製 除了替代PGMEA而使用PGME,使固形分濃度成為5質量%,PGME濃度成為95質量%以外,以與實施例1-1同樣方法調製剝離層形成用組成物16。[Comparative example 1] Preparation of composition 16 for forming peeling layer Except that PGME was used instead of PGMEA, and the solid content concentration was set to 5 mass %, and the PGME concentration was set to 95 mass %, the peeling layer forming composition 16 was prepared in the same manner as in Example 1-1.

[4]剝離層之製作及其評價 [實施例2-1] 將剝離層形成用組成物1使用狹縫式塗佈器(TECHNO MACHINE (股)製,製品名:桌上型,條件:液量7μL,間隙25μm,塗佈速度20mm/sec)塗佈於玻璃基板(100mm×100mm,以下同)上。隨後,所得塗膜以真空乾燥器(減壓度60Pa)以5秒到達減壓度,進行真空乾燥。其次,使用加熱板於100℃加熱2分鐘,進而使用加熱板於230℃加熱10分鐘,於玻璃基板上形成厚度約0.1μm之剝離層,獲得附剝離層之玻璃基板1。[4] Production and evaluation of peeling layer [Example 2-1] The composition 1 for forming a peeling layer was coated on the glass using a slit coater (manufactured by Techno Machine (stock), product name: desktop type, conditions: liquid volume 7μL, gap 25μm, coating speed 20mm/sec) On the substrate (100mm×100mm, the same below). Subsequently, the obtained coating film reached a pressure reduction degree in 5 seconds with a vacuum dryer (degree of pressure reduction 60 Pa), and was vacuum dried. Next, use a hot plate to heat at 100°C for 2 minutes, and then use a hot plate to heat at 230°C for 10 minutes to form a peeling layer with a thickness of about 0.1 μm on the glass substrate to obtain a glass substrate 1 with a peeling layer.

[實施例2-2] 除了替代剝離層形成用組成物1而使用剝離層形成用組成物2以外,以與實施例2-1同樣方法,獲得附剝離層之玻璃基板2。[Example 2-2] Except having used the composition 2 for peeling layer formation instead of the composition 1 for peeling layer formation, it carried out similarly to Example 2-1, and obtained the glass substrate 2 with a peeling layer.

[實施例2-3] 除了替代剝離層形成用組成物1而使用剝離層形成用組成物3以外,以與實施例2-1同樣方法,獲得附剝離層之玻璃基板3。[Example 2-3] Except having used the composition 3 for peeling layer formation instead of the composition 1 for peeling layer formation, it carried out similarly to Example 2-1, and obtained the glass substrate 3 with a peeling layer.

[實施例2-4] 除了替代剝離層形成用組成物1而使用剝離層形成用組成物4以外,以與實施例2-1同樣方法,獲得附剝離層之玻璃基板4。[Example 2-4] Except having used the composition 4 for peeling layer formation instead of the composition 1 for peeling layer formation, it carried out similarly to Example 2-1, and obtained the glass substrate 4 with a peeling layer.

[實施例2-5] 除了替代剝離層形成用組成物1而使用剝離層形成用組成物5以外,以與實施例2-1同樣方法,獲得附剝離層之玻璃基板5。[Example 2-5] Except having used the composition 5 for peeling layer formation instead of the composition 1 for peeling layer formation, it carried out similarly to Example 2-1, and obtained the glass substrate 5 with a peeling layer.

[實施例2-6] 除了替代剝離層形成用組成物1而使用剝離層形成用組成物6以外,以與實施例2-1同樣方法,獲得附剝離層之玻璃基板6。[Example 2-6] Except having used the composition 6 for peeling layer formation instead of the composition 1 for peeling layer formation, it carried out similarly to Example 2-1, and obtained the glass substrate 6 with a peeling layer.

[實施例2-7] 除了替代剝離層形成用組成物1而使用剝離層形成用組成物7以外,以與實施例2-1同樣方法,獲得附剝離層之玻璃基板7。[Example 2-7] The glass substrate 7 with a peeling layer was obtained by the same method as Example 2-1 except having used the composition 7 for peeling layer formation instead of the composition 1 for peeling layer formation.

[實施例2-8] 除了替代剝離層形成用組成物1而使用剝離層形成用組成物8以外,以與實施例2-1同樣方法,獲得附剝離層之玻璃基板8。[Example 2-8] Except having used the composition 8 for peeling layer formation instead of the composition 1 for peeling layer formation, it carried out similarly to Example 2-1, and obtained the glass substrate 8 with a peeling layer.

[實施例2-9] 除了替代剝離層形成用組成物1而使用剝離層形成用組成物9以外,以與實施例2-1同樣方法,獲得附剝離層之玻璃基板9。[Example 2-9] The glass substrate 9 with a peeling layer was obtained by the same method as Example 2-1 except having used the composition 9 for peeling layer formation instead of the composition 1 for peeling layer formation.

[實施例2-10] 除了替代剝離層形成用組成物1而使用剝離層形成用組成物10以外,以與實施例2-1同樣方法,獲得附剝離層之玻璃基板10。[Example 2-10] Except having used the composition 10 for peeling layer formation instead of the composition 1 for peeling layer formation, the glass substrate 10 with a peeling layer was obtained by the same method as Example 2-1.

[實施例2-11] 除了替代剝離層形成用組成物1而使用剝離層形成用組成物11以外,以與實施例2-1同樣方法,獲得附剝離層之玻璃基板11。[Example 2-11] The glass substrate 11 with a peeling layer was obtained by the same method as Example 2-1 except using the composition 11 for peeling layer formation instead of the composition 1 for peeling layer formation.

[實施例2-12] 除了替代剝離層形成用組成物1而使用剝離層形成用組成物12以外,以與實施例2-1同樣方法,獲得附剝離層之玻璃基板12。[Example 2-12] The glass substrate 12 with a peeling layer was obtained by the same method as Example 2-1 except having used the composition 12 for peeling layer formation instead of the composition 1 for peeling layer formation.

[實施例2-13] 除了替代剝離層形成用組成物1而使用剝離層形成用組成物13以外,以與實施例2-1同樣方法,獲得附剝離層之玻璃基板13。[Example 2-13] Except having used the composition 13 for peeling layer formation instead of the composition 1 for peeling layer formation, it carried out similarly to Example 2-1, and obtained the glass substrate 13 with a peeling layer.

[實施例2-14] 除了替代剝離層形成用組成物1而使用剝離層形成用組成物14以外,以與實施例2-1同樣方法,獲得附剝離層之玻璃基板14。[Example 2-14] The glass substrate 14 with a peeling layer was obtained by the same method as Example 2-1 except using the composition 14 for peeling layer formation instead of the composition 1 for peeling layer formation.

[實施例2-15] 除了替代剝離層形成用組成物1而使用剝離層形成用組成物15以外,以與實施例2-1同樣方法,獲得附剝離層之玻璃基板15。[Example 2-15] The glass substrate 15 with a peeling layer was obtained by the same method as Example 2-1 except having used the composition 15 for peeling layer formation instead of the composition 1 for peeling layer formation.

[比較例2-1] 除了替代剝離層形成用組成物1而使用剝離層形成用組成物16以外,以與實施例2-1同樣方法,獲得附剝離層之玻璃基板16。以Na燈確認剝離層之不均之結果,剝離層白濁,確認有多數不均。[Comparative Example 2-1] The glass substrate 16 with a peeling layer was obtained by the same method as Example 2-1 except having used the composition 16 for peeling layer formation instead of the composition 1 for peeling layer formation. As a result of confirming the unevenness of the peeling layer with Na lamp, the peeling layer was cloudy, and it was confirmed that there were many unevenness.

[5]樹脂基板之製作 [實施例3-1] 於附剝離層之玻璃基板1上,使用旋轉塗佈器(條件:以旋轉數200rpm約15秒),於前述玻璃基板上之剝離層(樹脂薄膜)上塗佈樹脂基板形成用組成物F1。所得塗膜使用加熱板於80℃加熱2分鐘,隨後使用加熱板於230℃加熱30分鐘,於剝離層上形成厚度約3μm之樹脂基板,獲得附樹脂基板/剝離層之玻璃基板1。隨後,使用紫外光可見光分光光度計(島津製作所(股)製UV-2600)測定光透過率之結果,樹脂基板於400nm顯示90%以上之透過率。[5] Production of resin substrate [Example 3-1] On the glass substrate 1 with a peeling layer, using a spin coater (condition: rotation speed 200 rpm for about 15 seconds), the resin substrate forming composition F1 was applied to the peeling layer (resin film) on the glass substrate. The resulting coating film was heated at 80°C for 2 minutes using a hot plate, and then heated at 230°C for 30 minutes using a hot plate to form a resin substrate with a thickness of about 3 μm on the peeling layer to obtain a glass substrate 1 with resin substrate/peeling layer. Subsequently, using an ultraviolet-visible spectrophotometer (Shimadzu Corporation UV-2600) to measure the light transmittance, the resin substrate showed a transmittance of more than 90% at 400nm.

[實施例3-2] 除了替代附剝離層之玻璃基板1而使用附剝離層之玻璃基板2以外,以與實施例3-1同樣方法獲得附樹脂基板/剝離層之玻璃基板2。樹脂基板於400nm顯示90%以上之透過率。[Example 3-2] Except having used the glass substrate 2 with a peeling layer instead of the glass substrate 1 with a peeling layer, the glass substrate 2 with a resin substrate/peeling layer was obtained by the same method as Example 3-1. The resin substrate shows a transmittance of over 90% at 400nm.

[實施例3-3] 除了替代附剝離層之玻璃基板1而使用附剝離層之玻璃基板3以外,以與實施例3-1同樣方法獲得附樹脂基板/剝離層之玻璃基板3。樹脂基板於400nm顯示90%以上之透過率。[Example 3-3] Except having used the glass substrate 3 with a peeling layer instead of the glass substrate 1 with a peeling layer, the glass substrate 3 with a resin substrate/peeling layer was obtained by the same method as Example 3-1. The resin substrate shows a transmittance of over 90% at 400nm.

[實施例3-4] 除了替代附剝離層之玻璃基板1而使用附剝離層之玻璃基板4以外,以與實施例3-1同樣方法獲得附樹脂基板/剝離層之玻璃基板4。樹脂基板於400nm顯示90%以上之透過率。[Example 3-4] Except having used the glass substrate 4 with a peeling layer instead of the glass substrate 1 with a peeling layer, the glass substrate 4 with a resin substrate/peeling layer was obtained by the same method as Example 3-1. The resin substrate shows a transmittance of over 90% at 400nm.

[實施例3-5] 除了替代附剝離層之玻璃基板1而使用附剝離層之玻璃基板5以外,以與實施例3-1同樣方法獲得附樹脂基板/剝離層之玻璃基板5。樹脂基板於400nm顯示90%以上之透過率。[Example 3-5] Except having used the glass substrate 5 with a peeling layer instead of the glass substrate 1 with a peeling layer, the glass substrate 5 with a resin substrate/peeling layer was obtained by the same method as Example 3-1. The resin substrate shows a transmittance of over 90% at 400nm.

[實施例3-6] 除了替代附剝離層之玻璃基板1而使用附剝離層之玻璃基板6以外,以與實施例3-1同樣方法獲得附樹脂基板/剝離層之玻璃基板6。樹脂基板於400nm顯示90%以上之透過率。[Example 3-6] Except having used the glass substrate 6 with a peeling layer instead of the glass substrate 1 with a peeling layer, the glass substrate 6 with a resin substrate/peeling layer was obtained by the same method as Example 3-1. The resin substrate shows a transmittance of over 90% at 400nm.

[實施例3-7] 除了替代附剝離層之玻璃基板1而使用附剝離層之玻璃基板7以外,以與實施例3-1同樣方法獲得附樹脂基板/剝離層之玻璃基板7。樹脂基板於400nm顯示90%以上之透過率。[Example 3-7] Except having used the glass substrate 7 with a peeling layer instead of the glass substrate 1 with a peeling layer, the glass substrate 7 with a resin substrate/peeling layer was obtained by the same method as Example 3-1. The resin substrate shows a transmittance of over 90% at 400nm.

[實施例3-8] 除了替代附剝離層之玻璃基板1而使用附剝離層之玻璃基板8以外,以與實施例3-1同樣方法獲得附樹脂基板/剝離層之玻璃基板8。樹脂基板於400nm顯示90%以上之透過率。[Example 3-8] Except having used the glass substrate 8 with a peeling layer instead of the glass substrate 1 with a peeling layer, the glass substrate 8 with a resin substrate/peeling layer was obtained by the same method as Example 3-1. The resin substrate shows a transmittance of over 90% at 400nm.

[實施例3-9] 除了替代附剝離層之玻璃基板1而使用附剝離層之玻璃基板9以外,以與實施例3-1同樣方法獲得附樹脂基板/剝離層之玻璃基板9。樹脂基板於400nm顯示90%以上之透過率。[Example 3-9] Except having used the glass substrate 9 with a peeling layer instead of the glass substrate 1 with a peeling layer, the glass substrate 9 with a resin substrate/peeling layer was obtained by the same method as Example 3-1. The resin substrate shows a transmittance of over 90% at 400nm.

[實施例3-10] 除了替代附剝離層之玻璃基板1而使用附剝離層之玻璃基板10以外,以與實施例3-1同樣方法獲得附樹脂基板/剝離層之玻璃基板10。樹脂基板於400nm顯示90%以上之透過率。[Example 3-10] Except having used the glass substrate 10 with a peeling layer instead of the glass substrate 1 with a peeling layer, the glass substrate 10 with a resin substrate/peeling layer was obtained by the same method as Example 3-1. The resin substrate shows a transmittance of over 90% at 400nm.

[實施例3-11] 除了替代附剝離層之玻璃基板1而使用附剝離層之玻璃基板11以外,以與實施例3-1同樣方法獲得附樹脂基板/剝離層之玻璃基板11。樹脂基板於400nm顯示90%以上之透過率。[Example 3-11] Except having used the glass substrate 11 with a peeling layer instead of the glass substrate 1 with a peeling layer, the glass substrate 11 with a resin substrate/peeling layer was obtained by the same method as Example 3-1. The resin substrate shows a transmittance of over 90% at 400nm.

[實施例3-12] 除了替代附剝離層之玻璃基板1而使用附剝離層之玻璃基板12以外,以與實施例3-1同樣方法獲得附樹脂基板/剝離層之玻璃基板12。樹脂基板於400nm顯示90%以上之透過率。[Example 3-12] Except having used the glass substrate 12 with a peeling layer instead of the glass substrate 1 with a peeling layer, the glass substrate 12 with a resin substrate/peeling layer was obtained by the same method as Example 3-1. The resin substrate shows a transmittance of over 90% at 400nm.

[實施例3-13] 除了替代附剝離層之玻璃基板1而使用附剝離層之玻璃基板13以外,以與實施例3-1同樣方法獲得附樹脂基板/剝離層之玻璃基板13。樹脂基板於400nm顯示90%以上之透過率。[Example 3-13] Except having used the glass substrate 13 with a peeling layer instead of the glass substrate 1 with a peeling layer, the glass substrate 13 with a resin substrate/peeling layer was obtained by the same method as Example 3-1. The resin substrate shows a transmittance of over 90% at 400nm.

[實施例3-14] 除了替代附剝離層之玻璃基板1而使用附剝離層之玻璃基板14以外,以與實施例3-1同樣方法獲得附樹脂基板/剝離層之玻璃基板14。樹脂基板於400nm顯示90%以上之透過率。[Example 3-14] Except for using the glass substrate 14 with a peeling layer instead of the glass substrate 1 with a peeling layer, the glass substrate 14 with a resin substrate/peeling layer was obtained by the same method as Example 3-1. The resin substrate shows a transmittance of over 90% at 400nm.

[實施例3-15] 除了替代附剝離層之玻璃基板1而使用附剝離層之玻璃基板15以外,以與實施例3-1同樣方法獲得附樹脂基板/剝離層之玻璃基板15。樹脂基板於400nm顯示90%以上之透過率。[Example 3-15] Except having used the glass substrate 15 with a peeling layer instead of the glass substrate 1 with a peeling layer, the glass substrate 15 with a resin substrate/peeling layer was obtained by the same method as Example 3-1. The resin substrate shows a transmittance of over 90% at 400nm.

[6]剝離性之評價 針對附剝離層之玻璃基板1~16,藉下述方法確認剝離層與玻璃基板之密著性,針對未產生剝離層不均之附樹脂基板/剝離層之玻璃基板1~15確認剝離層與樹脂皮膜之剝離性。又,下述試驗係以同一玻璃基板進行。[6] Evaluation of peelability For glass substrates 1 to 16 with a peeling layer, confirm the adhesion between the peeling layer and the glass substrate by the following method. For glass substrates 1 to 15 with a resin substrate/peeling layer without uneven peeling layer, confirm the peeling layer and The peelability of the resin film. In addition, the following tests were performed on the same glass substrate.

(1)剝離層與玻璃基板之密著性評價 將附剝離層之玻璃基板1~16上之剝離層進行十字切割(縱橫2mm間隔,以下同),進行25格切割。亦即,藉由該十字切割,形成25個2mm見方之塊格。以黏著膠帶貼附於該25格切割部分,剝下該膠帶,基於以下基準,評價密著性。結果示於表1。 <判定基準> 5B:0%剝離(未剝離) 4B:未達5%剝離 3B:5%~未達15%剝離 2B:15%~未達35%剝離 1B:35%~未達65%剝離 0B:65%~未達80%剝離 B:80%~未達95%剝離 A:95%~未達100%剝離 AA:100%剝離(全部剝離)(1) Evaluation of adhesion between peeling layer and glass substrate The peeling layer on the glass substrates 1-16 with peeling layer is cross-cut (2mm in vertical and horizontal, the same below), and 25 grids are cut. That is, by the cross cutting, 25 blocks of 2mm square are formed. The adhesive tape was attached to the 25 cut part, the tape was peeled off, and the adhesion was evaluated based on the following criteria. The results are shown in Table 1. <Judgment criteria> 5B: 0% peeling (not peeling) 4B: Less than 5% peel 3B: 5% to less than 15% peeling 2B: 15% ~ less than 35% peeling 1B: 35% ~ less than 65% peeling 0B: 65% ~ less than 80% peeling B: 80% to less than 95% peeling A: 95% to less than 100% peeling AA: 100% peeling (all peeling)

(2)剝離層與樹脂基板之剝離力評價 對附樹脂基板/剝離層之玻璃基板1~15製作25mm×50mm之短條物。進而,貼附CELLOTAPE(註冊商標) (NICHIBON(股)製CT-24)後,使用Autograph AGS-500N(島津製作所(股)製),以剝離角度90°、剝離速度300mm/min剝離,測定剝離力。又,無法剝離者記為無法剝離。結果示於表1。(2) Evaluation of peeling force between peeling layer and resin substrate Make short strips of 25mm×50mm on glass substrates 1-15 with resin substrate/peeling layer. Furthermore, after attaching CELLOTAPE (registered trademark) (CT-24 manufactured by NICHIBON Co., Ltd.), using Autograph AGS-500N (manufactured by Shimadzu Corporation), peeled at a peeling angle of 90° and a peeling speed of 300 mm/min, and the peeling was measured. force. Also, those that could not be peeled off were recorded as not peelable. The results are shown in Table 1.

Figure 02_image045
Figure 02_image045

由表1所示之結果,實施例之剝離層與玻璃基板之密著性優異,且與樹脂基板之剝離性優異。另一方面,比較例之剝離層表面見到多數不均,而白濁。From the results shown in Table 1, the peeling layer of the example has excellent adhesion to the glass substrate and excellent peelability with the resin substrate. On the other hand, the surface of the peeling layer of the comparative example was mostly uneven and became cloudy.

由以上結果,顯示若使用本發明之狹縫式塗佈用剝離層形成用組成物,即使藉狹縫式塗佈法塗佈之情況,亦不發生塗佈不均,可獲得具有與基體之優異密著性、與樹脂基板之適度密著性及適度剝離性之剝離層。From the above results, it is shown that if the composition for forming a release layer for slit coating of the present invention is used, even if it is coated by the slit coating method, coating unevenness does not occur, and it is possible to obtain A release layer with excellent adhesion, moderate adhesion to the resin substrate, and moderate releasability.

Claims (11)

一種狹縫式塗佈用剝離層形成用組成物,其包含 (A)含有以下述式(1)表示之重複單位之聚脲, (B)酸化合物或其鹽, (C)選自具有羥基烷基及/或以烷氧基甲基取代之氮原子之化合物的交聯劑, (D)含有以下述式(a1)表示之重複單位、以下述式(b)表示之重複單位及以下述式(c)表示之重複單位之高分子添加劑,以及 (E)包含至少1種於20℃之蒸氣壓為800Pa以下之溶劑的溶劑, (D)高分子添加劑相對於(A)聚脲100質量份,含有3~100質量份,
Figure 03_image001
[式中,A1 、A2 、A3 、A4 、A5 及A6 分別獨立為氫原子、甲基或乙基, X1 為下述式(1-1)、(1-2)、(1-3)或(1-4)表示之基
Figure 03_image003
(式中,R1 及R2 分別獨立為氫原子、碳數1~6之烷基、碳數3~6之烯基、苄基或苯基,前述苯基可經選自碳數1~6之烷基、鹵原子、碳數1~6之烷氧基、硝基、氰基、羥基及碳數1~6之烷硫基所成之群中之至少1種基取代,且R1 及R2 亦可相互鍵結與該等所鍵結之碳原子一起形成碳數3~6之環,R3 為碳數1~6之烷基、碳數3~6之烯基、苄基或苯基,前述苯基可經選自碳數1~6之烷基、鹵原子、碳數1~6之烷氧基、硝基、氰基、羥基及碳數1~6之烷硫基所成之群中之至少1種基取代), Q1 為下述式(1-5)或(1-6)表示之基,
Figure 03_image005
(式中,X2 為式(1-1)、式(1-2)或式(1-4)表示之基,Q2 為碳數1~10之伸烷基、伸苯基、伸萘基或伸蒽基,前述伸苯基、伸萘基及伸蒽基可經選自碳數1~6之烷基、鹵原子、碳數1~6之烷氧基、硝基、氰基、羥基及碳數1~6之烷硫基所成之群中之至少1種基取代,n1 及n2 分別獨立為0或1)]
Figure 03_image007
(式中,RA 分別獨立為氫原子或甲基,RB1 係至少1個氫原子經氟原子取代之碳數3或4之分支狀烷基,RC 係碳數1~10之羥基烷基,RD 為碳數6~20之多環式烷基或碳數6~12之芳基)。
A composition for forming a release layer for slit coating, comprising (A) a polyurea containing a repeating unit represented by the following formula (1), (B) an acid compound or a salt thereof, and (C) selected from those having a hydroxyl group The crosslinking agent of an alkyl group and/or a nitrogen atom substituted by an alkoxymethyl group, (D) contains a repeating unit represented by the following formula (a1), a repeating unit represented by the following formula (b), and the following The polymer additive of the repeating unit represented by formula (c), and (E) a solvent containing at least one solvent with a vapor pressure of 800 Pa or less at 20°C, (D) the polymer additive relative to (A) 100 mass of polyurea Parts, containing 3~100 parts by mass,
Figure 03_image001
[In the formula, A 1 , A 2 , A 3 , A 4 , A 5 and A 6 are each independently a hydrogen atom, a methyl group or an ethyl group, and X 1 is the following formula (1-1), (1-2) , (1-3) or (1-4)
Figure 03_image003
(In the formula, R 1 and R 2 are each independently a hydrogen atom, an alkyl group with a carbon number of 1 to 6, an alkenyl group with a carbon number of 3 to 6, a benzyl group or a phenyl group. At least one of the group consisting of 6 alkyl groups, halogen atoms, C1-C6 alkoxy groups, nitro groups, cyano groups, hydroxyl groups and C1-C6 alkylthio groups, and R 1 And R 2 can also be bonded to each other together with the bonded carbon atoms to form a carbon 3-6 ring, R 3 is an alkyl with 1 to 6 carbons, an alkenyl with 3 to 6 carbons, and a benzyl group Or phenyl group, the aforementioned phenyl group can be selected from alkyl groups having 1 to 6 carbon atoms, halogen atoms, alkoxy groups having 1 to 6 carbon atoms, nitro groups, cyano groups, hydroxyl groups and alkylthio groups having 1 to 6 carbon atoms At least one group in the group is substituted), Q 1 is a group represented by the following formula (1-5) or (1-6),
Figure 03_image005
(In the formula, X 2 is a group represented by formula (1-1), formula (1-2) or formula (1-4), and Q 2 is an alkylene, phenylene, or naphthalene with 1 to 10 carbon atoms The aforementioned phenylene, naphthylene and anthracene groups can be selected from alkyl groups with 1 to 6 carbons, halogen atoms, alkoxy groups with 1 to 6 carbons, nitro, cyano, Substitution of at least one group of hydroxyl group and alkylthio group with carbon number 1~6, n 1 and n 2 are independently 0 or 1)]
Figure 03_image007
(In the formula, R A is independently a hydrogen atom or a methyl group, R B1 is a branched alkyl group with 3 or 4 carbons in which at least one hydrogen atom is replaced by a fluorine atom, and R C is a hydroxyalkane with 1 to 10 carbons. R D is a polycyclic alkyl group with 6 to 20 carbons or an aryl group with 6 to 12 carbons).
如請求項1之狹縫式塗佈用剝離層形成用組成物,其中(D)高分子添加物之式(b)表示之重複單位中,RC 為碳數2~10之羥基烷基,羥基所鍵結之碳原子為2級碳原子,且式(a1)表示之重複單位之含有比例於(D)高分子添加物之全部重複單位中為30莫耳%以上。For example, the composition for forming a release layer for slit coating according to claim 1, wherein in the repeating unit represented by formula (b) of (D) polymer additive, R C is a hydroxyalkyl group with 2 to 10 carbon atoms, The carbon atom to which the hydroxyl group is bonded is a secondary carbon atom, and the content of the repeating unit represented by the formula (a1) is 30 mol% or more in all the repeating units of the polymer additive (D). 如請求項1或2之狹縫式塗佈用剝離層形成用組成物,其中X1 為式(1-3)表示之基。The composition for forming a release layer for slit coating according to claim 1 or 2, wherein X 1 is a base represented by formula (1-3). 如請求項3之狹縫式塗佈用剝離層形成用組成物,其中R3 為2-丙烯基。The composition for forming a release layer for slit coating according to claim 3, wherein R 3 is a 2-propenyl group. 如請求項1至4中任一項之狹縫式塗佈用剝離層形成用組成物,其中Q1 為式(1-5)表示之基。The composition for forming a release layer for slit coating according to any one of claims 1 to 4, wherein Q 1 is a base represented by formula (1-5). 如請求項1至5中任一項之狹縫式塗佈用剝離層形成用組成物,其中(B)成分係磺酸化合物或其鹽。The composition for forming a release layer for slit coating according to any one of claims 1 to 5, wherein the component (B) is a sulfonic acid compound or a salt thereof. 如請求項1至6中任一項之狹縫式塗佈用剝離層形成用組成物,其中(C)交聯劑為下述式(C-1)~(C-7)之任一者表示之化合物,
Figure 03_image009
(式中,R11 ~R38 分別獨立為氫原子或碳數1~6之烷基,R39 為氫原子或甲基)。
The composition for forming a release layer for slit coating according to any one of claims 1 to 6, wherein (C) the crosslinking agent is any one of the following formulas (C-1) to (C-7) Represents the compound,
Figure 03_image009
(In the formula, R 11 to R 38 are each independently a hydrogen atom or an alkyl group with 1 to 6 carbon atoms, and R 39 is a hydrogen atom or a methyl group).
如請求項1至7中任一項之狹縫式塗佈用剝離層形成用組成物,其中(C)交聯劑之含量,相對於(A)聚脲100質量份,為10~100質量份。The composition for forming a release layer for slit coating according to any one of claims 1 to 7, wherein the content of (C) crosslinking agent is 10-100 mass parts relative to 100 mass parts of (A) polyurea Copies. 一種剝離層,其係由如請求項1至8中任一項之狹縫式塗佈用剝離層形成用組成物所得。A peeling layer obtained from the composition for forming a peeling layer for slit coating according to any one of claims 1 to 8. 一種層合體,其係於如請求項9之剝離層上層合波長400nm之光透過率為80%以上之樹脂層而成。A laminate formed by laminating a resin layer with a light transmittance of 80% or more at a wavelength of 400 nm on a release layer as in claim 9. 一種樹脂基板之製造方法,其包含 將如請求項1至8中任一項之狹縫式塗佈用剝離層形成用組成物塗佈於基體上,形成剝離層之步驟, 於前述剝離層上,形成波長400nm之光透過率為80%以上之樹脂基板之步驟,及 以0.15N/25mm以下之剝離力剝離前述樹脂基板之步驟。A method for manufacturing a resin substrate, which comprises The step of applying the composition for forming a release layer for slit coating according to any one of claims 1 to 8 on a substrate to form a release layer, The step of forming a resin substrate with a light transmittance of 80% or more at a wavelength of 400 nm on the aforementioned release layer, and The step of peeling the aforementioned resin substrate with a peeling force of 0.15N/25mm or less.
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