TW202022971A - Carrier receiving device having substrate and adapting component for receiving carriers to be mounted capable of enhancing precision for mounting non-packaged dies onto carrier in a simple and cost-effective manner - Google Patents

Carrier receiving device having substrate and adapting component for receiving carriers to be mounted capable of enhancing precision for mounting non-packaged dies onto carrier in a simple and cost-effective manner Download PDF

Info

Publication number
TW202022971A
TW202022971A TW108138510A TW108138510A TW202022971A TW 202022971 A TW202022971 A TW 202022971A TW 108138510 A TW108138510 A TW 108138510A TW 108138510 A TW108138510 A TW 108138510A TW 202022971 A TW202022971 A TW 202022971A
Authority
TW
Taiwan
Prior art keywords
carrier
adapter element
wafer
base body
placement
Prior art date
Application number
TW108138510A
Other languages
Chinese (zh)
Other versions
TWI734230B (en
Inventor
亞歷山大 尼克爾
Original Assignee
德商先進裝配系統有限責任兩合公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 德商先進裝配系統有限責任兩合公司 filed Critical 德商先進裝配系統有限責任兩合公司
Publication of TW202022971A publication Critical patent/TW202022971A/en
Application granted granted Critical
Publication of TWI734230B publication Critical patent/TWI734230B/en

Links

Images

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/50Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the subgroups H01L21/06 - H01L21/326, e.g. sealing of a cap to a base of a container
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/683Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L21/6835Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/50Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the subgroups H01L21/06 - H01L21/326, e.g. sealing of a cap to a base of a container
    • H01L21/56Encapsulations, e.g. encapsulation layers, coatings
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/68Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for positioning, orientation or alignment
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2221/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof covered by H01L21/00
    • H01L2221/67Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere
    • H01L2221/683Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L2221/68304Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
    • H01L2221/68313Auxiliary support including a cavity for storing a finished device, e.g. IC package, or a partly finished device, e.g. die, during manufacturing or mounting

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Die Bonding (AREA)
  • Supply And Installment Of Electrical Components (AREA)
  • Wire Bonding (AREA)

Abstract

The present invention relates to a carrier receiving device (130) for receiving a carrier (190) of non-packaged dies (282) to be mounted. The carrier receiving device (130) comprises: (a) a base body (140); (b) a pneumatic system (444) disposed in the base body (140); (c) an adapting component (150) having a first side (451) and a second side (452) opposite to the first side, wherein the first side (451) is attached to the surface (142) of the base body (140) in a releasable manner and the second side (452) is configured to attach the carrier (190) to be mounted onto the adapting component (150); and, (d) a pneumatic connecting structure (454), which is arranged in the adapting component (150), penetrates through the adapting component (150) and is extended from the first side (451) to the second side (452). The pneumatic system (444) and the pneumatic connecting structure (454) are configured to apply the negative pressure onto the surface of the carrier (190).

Description

使用具有基體和轉接元件的載體容納裝置容納待貼裝的載體 Use carrier accommodating device with base body and adapter element to accommodate carrier to be mounted

本發明總體上涉及電子元件製造的技術領域。本發明特別是涉及一種用於容納待貼裝無殼晶片的載體的載體容納裝置。本發明還涉及具有這種載體容納裝置的系統和貼裝機以及一種將無殼晶片貼裝到載體的方法,特別是在電子元件製造中,這些電子元件均具有至少一個封裝在封殼中的晶片以及適用的電連接觸點,借助這些電連接觸點可以電接觸封裝的晶片。 The present invention generally relates to the technical field of electronic component manufacturing. The present invention particularly relates to a carrier accommodating device for accommodating a carrier to be mounted with a shellless wafer. The present invention also relates to a system and a placement machine having such a carrier accommodating device, and a method for attaching a shellless chip to a carrier, especially in the manufacture of electronic components, which have at least one chip encapsulated in a package And suitable electrical connection contacts, with which the packaged chip can be electrically contacted.

在封裝電子元件的製造過程中,應將無殼的(半導體)晶片、即所謂的“裸晶片”貼裝到載體上。在所謂的“嵌入式晶片級封裝”(eWLP)技術的背景下,每個封裝(Package)的一個或多個晶片以有源側朝下的方式放置到位於載體的黏附膜上。隨後將放置的多個晶片灌封大量塑膠,這後來代表封殼。然後將整個灌封產品在高壓下烘烤,隨後從載體或黏附膜剝離。在隨後的技術步驟中,再接觸晶片,必要時進行電連接,並鍍覆用作電連接觸點的焊球。最後,將整個進一步處理後的灌封產品鋸開或以其他方式分割成單個器件。 In the manufacturing process of packaged electronic components, shellless (semiconductor) wafers, so-called "bare wafers", should be mounted on the carrier. In the context of the so-called "embedded wafer level packaging" (eWLP) technology, one or more chips of each package are placed on an adhesive film located on a carrier with the active side facing down. The placed multiple chips were subsequently potted with a large amount of plastic, which later represented the package. Then the entire potting product is baked under high pressure, and then peeled from the carrier or adhesive film. In the subsequent technical steps, the wafer is contacted again, electrical connections are made if necessary, and solder balls used as electrical connection contacts are plated. Finally, the entire potted product after further processing is sawed or otherwise divided into individual devices.

簡而言之,eWLP是一種用於積體電路的封殼構型,其中在由晶片和灌封料人造的晶片上產生電連接觸點。這樣就要執行在人造晶片上構成封殼的所有必要的處理步驟。這與使用所謂的“引線鍵合”的典型封殼技術相比,允許以極低的製造成本製造電熱性能絕佳的極小型扁平封殼。利用這種技術,可以將元 件制為例如球柵陣列(BGA)。 In short, eWLP is a package configuration for integrated circuits in which electrical connection contacts are created on a chip made of a chip and a potting compound. In this way, all the necessary processing steps to form the envelope on the artificial wafer are performed. Compared with the typical package technology that uses so-called "wire bonding", this allows the manufacture of extremely small flat packages with excellent electrothermal performance at very low manufacturing costs. Using this technique, you can The piece is made of, for example, a ball grid array (BGA).

在微電子學中,習知的另一種集成手段是製造所謂的系統級封裝(SiP)模組。在SIP技術中,由多個(半導體)晶片製造無源器件和有源器件以及其他元件,然後借助貼裝技術將這些晶片放置在載體上,其中載體可以例如是印刷電路板環氧材料、黏附膜或金屬箔。然後,借助公知的構建與連接技術將放置的晶片合併在封殼中,常稱為IC封裝。各個晶片之間所需的電連接可以例如通過鍵合引線來實現,其中也可能利用其他連接原理,例如晶片側邊上的導電薄層或層間連接。在eWLP技術背景下或SIP模組生產中,通常使用與公知表面貼裝技術相比的(改進型)貼裝機來處理尚無封殼的晶片。這種貼裝機具有貼裝頭,使用該貼裝頭將晶片放置在相應載體上的預定貼裝位置。這裡對貼裝的定位精度要求極高。目前,eWLP技術和SIP模組生產都要求15μm/3σ或更高的定位精度或貼裝精度,其中,σ(sigma)是貼裝位置的標準差。由於電子元件日益小型化,預計未來將對貼裝精度提出更高的要求。 In microelectronics, another well-known integration method is to manufacture so-called system-in-package (SiP) modules. In SIP technology, passive devices and active devices and other components are manufactured from multiple (semiconductor) wafers, and then these wafers are placed on a carrier by means of mounting technology, where the carrier can be, for example, printed circuit board epoxy material, adhesive Film or metal foil. Then, the placed chips are combined in a package with the help of well-known construction and connection techniques, often referred to as IC packaging. The required electrical connections between the various wafers can be achieved, for example, by bonding wires, where other connection principles may also be used, such as conductive thin layers on the sides of the wafers or interlayer connections. In the context of eWLP technology or in the production of SIP modules, a (improved) placement machine compared with the known surface mount technology is usually used to process wafers that have not yet been packaged. This type of placement machine has a placement head that is used to place the wafer at a predetermined placement position on the corresponding carrier. The positioning accuracy requirements for placement are extremely high here. At present, both eWLP technology and SIP module production require positioning accuracy or placement accuracy of 15μm/3σ or higher, where σ (sigma) is the standard deviation of the placement position. Due to the increasing miniaturization of electronic components, it is expected that higher requirements for placement accuracy will be put forward in the future.

這種高度精確的貼裝既需要參與貼裝的元件具高溫穩定性,又需要載體容納裝置具低熱膨脹性,借助真空或負壓將待貼裝的載體固定在該載體容納裝置上。因此,例如參閱DE102015101759B3,載體容納裝置(i)借助調溫裝置而保持在最恆定的溫度下並且(ii)由約64%的鐵和36%的鎳組成且熱膨脹係數極低的恆範鋼(invar steel)合金製成。此外,例如參閱DE102015101759B3以及DE102015112518B3,在載體容納裝置上附有標記。根據測量標記,可以確定因熱膨脹引起的龍門系統畸變,貼裝機的貼裝頭隨其發生運動。在確切獲知龍門畸變的情況下,通過對龍門的電動機進行適當的補償控制,可以至少大致 消除這種畸變。此外,可以修改所謂的貼裝機映射資料,以使貼裝位置匹配於載體的熱膨脹度。因此,特別是需要將貼裝精度進一步提高到10μm/3σ以上,載體使用與載體容納裝置相同的材料(具有相同的熱膨脹係數)。但使用恆範鋼因這種材料成本很高而十分昂貴。 This highly accurate placement requires not only high temperature stability of the components participating in the placement, but also low thermal expansion of the carrier containing device, and the carrier to be placed is fixed on the carrier containing device by means of vacuum or negative pressure. Therefore, for example, refer to DE102015101759B3, the carrier containing device (i) is maintained at the most constant temperature by means of a temperature regulating device and (ii) is composed of about 64% iron and 36% nickel and has a very low thermal expansion coefficient of Hengfan steel ( Made of invar steel) alloy. In addition, refer to DE102015101759B3 and DE102015112518B3, for example, a mark is attached to the carrier receiving device. According to the measurement marks, the distortion of the gantry system caused by thermal expansion can be determined, and the placement head of the placement machine moves with it. In the case of knowing the distortion of the gantry, the motor of the gantry can be at least roughly Eliminate this distortion. In addition, the so-called placement machine mapping data can be modified to match the placement position to the thermal expansion of the carrier. Therefore, it is particularly necessary to further improve the placement accuracy to 10 μm/3σ or more, and the carrier uses the same material (having the same thermal expansion coefficient) as the carrier accommodating device. However, the use of Hengfan steel is very expensive due to the high cost of this material.

儘管為載體容納裝置和載體採用不同的材料來解決上述成本問題,但這就無法實現期望的10μm/3σ以上的貼裝精度。 Although different materials are used for the carrier accommodating device and the carrier to solve the above-mentioned cost problem, this cannot achieve the desired placement accuracy of 10 μm/3σ or more.

本發明的目的是以裝備簡單又具成本效益的方式提高將無殼晶片貼裝到載體時的精度。 The purpose of the present invention is to improve the accuracy of mounting the shellless wafer to the carrier in a simple and cost-effective manner.

本發明用以達成上述目的的解決方案為獨立項的主題。本發明的有利實施方式參閱附屬項。 The solution of the present invention to achieve the above-mentioned object is the subject of a separate item. See the appendix for advantageous embodiments of the invention.

根據本發明的第一態樣,描述一種用於容納待貼裝無殼晶片的載體的載體容納裝置。所述載體容納裝置包括:(a)基體;(b)構造在基體中的氣動系統;(c)轉接元件,其具有第一側以及與該第一側相對的第二側,其中,第一側以能脫離的方式附接至基體的表面,並且第二側構造成使得待貼裝的載體能(平坦地)貼附至轉接元件;(d)氣動連接結構,其構造在轉接元件中並且從第一側貫穿轉接元件延伸到第二側,其中,氣動系統和氣動連接結構構造成能對載體的(下)表面施加負壓。 According to a first aspect of the present invention, a carrier accommodating device for accommodating a carrier to be mounted with a shellless wafer is described. The carrier containing device includes: (a) a base body; (b) a pneumatic system constructed in the base body; (c) an adapter element having a first side and a second side opposite to the first side, wherein the first side One side is detachably attached to the surface of the base, and the second side is configured so that the carrier to be mounted can be (flatly) attached to the adapter element; (d) a pneumatic connection structure, which is configured in the adapter The element extends through the adapter element from the first side to the second side, wherein the pneumatic system and the pneumatic connection structure are configured to apply negative pressure to the (lower) surface of the carrier.

所述載體容納裝置是基於以下認識:相對於常規的(單件式或單體式)載體容納裝置(不具有轉接板),所述載體容納裝置在“適用於”不同類型載體方面的功能性和/或靈活性可以通過具有基體和轉接元件的載體容納裝置的(至少)兩件式或兩分式實施方案來簡便而高效地擴展。即,可以針對不同類型的載 體提供不同的轉接元件,其中,全部轉接元件的第一側均構造成相同並與基體的表面相容。轉接元件的第二側則可以構造成與多種不同類型的載體中的至少一個載體相容,使其能夠可靠地容納一種類型的載體。 The carrier accommodating device is based on the following recognition: Compared with the conventional (one-piece or single-piece) carrier accommodating device (without adapter plate), the carrier accommodating device is "suitable for" different types of carriers. The performance and/or flexibility can be easily and efficiently expanded by the (at least) two-part or two-part embodiment of the carrier containing device with the base body and the adapter element. That is, for different types of loading The body provides different adapter elements, wherein the first sides of all the adapter elements are constructed to be the same and compatible with the surface of the base body. The second side of the adapter element can then be configured to be compatible with at least one of a plurality of different types of carriers, so that it can reliably accommodate one type of carrier.

簡而言之,通過可置換的轉接元件,也可以使用與基體不同的材料並進而具有不同的熱膨脹係數的載體。為了獲得高貼裝精度,僅需轉接元件和載體由熱膨脹係數至少大致相同的材料組成或具有這樣的材料。這樣就能使用比基體的材料更具成本效益的材料來製造載體。特別是可以使用熱膨脹係數更高的載體材料。 In short, with replaceable adapter elements, it is also possible to use a carrier that has a different material from the base body and thus has a different coefficient of thermal expansion. In order to obtain high placement accuracy, it is only necessary for the adapter element and the carrier to be composed of or have materials with at least approximately the same thermal expansion coefficient. In this way, a more cost-effective material than the base material can be used to manufacture the carrier. In particular, a carrier material with a higher coefficient of thermal expansion can be used.

例如,針對(視技術)需要十分特殊的載體材料的某些元件製造過程,可能要求載體材料與基體材料相比(顯著)不同並具有特別是更高的熱膨脹係數。與常規的載體容納裝置相比,通過所述的可更換轉接元件,可以擴展所述載體容納裝置在加工或製造不同的(封殼)元件(它們採用不同的製造技術製成)方面的靈活性。 For example, for certain component manufacturing processes that (depending on technology) require a very special carrier material, the carrier material may be required to be (significantly) different from the base material and have a particularly higher coefficient of thermal expansion. Compared with the conventional carrier accommodating device, through the replaceable adapter element, the flexibility of the carrier accommodating device in processing or manufacturing different (encapsulated) components (which are made by different manufacturing techniques) can be expanded Sex.

較佳地,轉接元件的材料使用一種材料,該材料具有與載體的材料至少大致相同的熱膨脹係數。特別較佳的是,轉接元件和載體使用相同的材料。 Preferably, a material is used for the material of the adapter element, and the material has a thermal expansion coefficient at least approximately the same as the material of the carrier. It is particularly preferred that the same material is used for the adapter element and the carrier.

在本發明中,術語“載體”原則上是指任何能夠貼裝的介質,該介質能夠(以其底側)放置在轉接元件上。根據相應的應用情況,載體可以是(單件式)襯底,例如也是印刷電路板,晶片放置於其上。載體也可以是多件式載體。例如,載體可以具有機械上相對較硬的框架結構,這種框架結構橫跨(黏性)載體膜,能夠以公知方式將晶片放置在該載體膜上,以便進行進一步處理。這種進一步處理尤其可以包括製造所謂的人造晶片,這種人造晶 片能夠以公知方式用於製造封殼的電子元件。在本發明中,術語“基體”是指任何這樣的空間實體結構:(i)其可以放置在貼裝機中,和/或其可以表示貼裝機的一部分;並且(ii)其具有這樣的(空間)配置表面,即轉接元件能夠以能脫離的方式貼附至該表面。 In the present invention, the term "carrier" refers in principle to any mountable medium that can be placed (with its bottom side) on the adapter element. According to the corresponding application, the carrier can be a (one-piece) substrate, for example also a printed circuit board, on which the wafer is placed. The carrier may also be a multi-piece carrier. For example, the carrier may have a mechanically relatively rigid frame structure that spans the (adhesive) carrier film on which the wafer can be placed in a known manner for further processing. This further processing may include, in particular, the production of so-called artificial wafers, which The sheet can be used in a known manner to manufacture electronic components of the package. In the present invention, the term "substrate" refers to any such spatial entity structure: (i) it can be placed in the placement machine, and/or it can represent a part of the placement machine; and (ii) it has such (space ) The configuration surface, that is, the adapter element can be attached to the surface in a detachable manner.

在本發明中,術語“轉接元件”是指任何這樣的空間實體結構:(i)其第一側可以(平坦地)貼附至基體的(上)表面;並且(ii)待貼裝的載體可以(平坦地)貼附至其第二側。轉接元件可以採用多件式或較佳單件式構造。 In the present invention, the term "adapting element" refers to any spatial entity structure: (i) its first side can be (flatly) attached to the (upper) surface of the base; and (ii) to be mounted The carrier can be attached (flatly) to its second side. The adapter element can be of multi-piece or preferably single-piece construction.

術語“氣動系統”是指附接或構造在基體中或基體上的任何通道系統。氣動系統可以在輸入側具有氣動介面,該氣動介面能對接有真空發生單元或抽吸泵。氣動系統在輸出側具有適用的出口,使得氣動系統中產生的真空也能“轉移”到氣動連接結構。 The term "pneumatic system" refers to any channel system attached or constructed in or on a base body. The pneumatic system can have a pneumatic interface on the input side, and the pneumatic interface can be connected with a vacuum generating unit or a suction pump. The pneumatic system has a suitable outlet on the output side, so that the vacuum generated in the pneumatic system can also be "transferred" to the pneumatic connection structure.

術語“氣動連接結構”同樣是指任何這樣的通道系統:其將在從氣動系統的輸入側接收的真空傳遞到貼附至轉接元件的第二側的載體的底側。在特別簡單的實施例中,氣動連接結構可以借助適用的貫通孔道、例如通孔來實現。 The term "pneumatic connection structure" also refers to any channel system that transfers the vacuum received from the input side of the pneumatic system to the bottom side of the carrier attached to the second side of the adapter element. In a particularly simple embodiment, the pneumatic connection structure can be realized by means of suitable through holes, for example through holes.

根據本發明的實施例,基體包括具有第一熱膨脹係數的第一材料,並且轉接元件包括具有第二熱膨脹係數的第二材料。在此情形下,第二熱膨脹係數大於第一熱膨脹係數。這樣的優點在於,為了進行高度精確地貼裝,所述載體容納裝置也能可靠地容納或保持載體,該載體具有載體材料或由載體材料製成,該載體材料與基體的第一材料具有不同的熱膨脹係數。如上所述,這樣就能提高所述載體容納裝置針對不同類型的載體的靈活性。 According to an embodiment of the present invention, the base includes a first material having a first thermal expansion coefficient, and the adapter element includes a second material having a second thermal expansion coefficient. In this case, the second coefficient of thermal expansion is greater than the first coefficient of thermal expansion. This has the advantage that, in order to carry out highly accurate placement, the carrier accommodating device can also reliably accommodate or hold a carrier that has a carrier material or is made of a carrier material, and the carrier material is different from the first material of the base. The coefficient of thermal expansion. As described above, this can improve the flexibility of the carrier accommodating device for different types of carriers.

根據本發明的另一實施例,第一材料是恆範鋼,特 別是超恆範鋼。 According to another embodiment of the present invention, the first material is Hengfan steel, special Don't be Super Hengfan Steel.

使用材料恆範鋼的優點在於,載體容納裝置的溫度變化僅對貼裝精度產生相對較小的影響。例如,這種溫度變化可能是因貼裝機中內置有所述載體容納裝置的元件的餘熱和/或環境溫度變化導致。 The advantage of using the material Hengfan steel is that the temperature change of the carrier containing device only has a relatively small impact on the placement accuracy. For example, this temperature change may be caused by the residual heat of the component in which the carrier accommodating device is built in the placement machine and/or the environmental temperature change.

如上所述,恆範鋼材料可以是由約64%的鐵和36%的鎳組成的合金。所謂的超恆範鋼可以是由31%的Ni、5%的Co和其餘的鐵組成的Ni-Co-Fe合金。 As mentioned above, the Hengfan steel material can be an alloy composed of approximately 64% iron and 36% nickel. The so-called ultra-constant steel can be a Ni-Co-Fe alloy composed of 31% Ni, 5% Co and the rest of iron.

根據本發明的另一實施例,轉接元件包括板或由板實現,該板中構造有氣動連接結構。這樣的優點在於,轉接元件易於製造。這特別適用於板是平面平行的板的實施方式。 According to another embodiment of the present invention, the adapter element includes a plate or is realized by a plate in which a pneumatic connection structure is constructed. This has the advantage that the adapter element is easy to manufacture. This applies particularly to embodiments where the plates are plane-parallel plates.

根據本發明的另一實施例,基體的表面具有矩形形狀。替代地或組合地,轉接元件的至少第二側具有圓形形狀,該圓形形狀匹配於載體的形狀。 According to another embodiment of the present invention, the surface of the base has a rectangular shape. Alternatively or in combination, at least the second side of the adapter element has a circular shape that matches the shape of the carrier.

轉接元件也可以(在幾何上)分兩件式由矩形板以及位於或佈置於其上的圓盤組成。在操作中,矩形板的底側貼附至基體。載體貼靠在圓盤的頂側上。可以調配圓盤的厚度,以便為載體給予圓形支承面的預期高度位置。這個高度位置可以較佳與特定標記的高度位置相符,該特定標記附接至矩形板的頂側並用於下述的校準過程。 The adapter element can also be (geometrically) composed of a rectangular plate and a circular disk located or arranged on it in two parts. In operation, the bottom side of the rectangular plate is attached to the base. The carrier rests on the top side of the disc. The thickness of the disc can be adjusted to give the carrier the desired height position of the circular support surface. This height position may preferably match the height position of a specific mark attached to the top side of the rectangular plate and used in the calibration process described below.

基體和/或轉接元件使用相對簡單的幾何形狀的優點在於,能夠通過簡便的方式並以高精度製造基體或轉接元件。 The advantage of using relatively simple geometric shapes for the base body and/or the adapter element is that the base body or the adapter element can be manufactured in a simple manner and with high precision.

根據本發明的另一實施例,所述載體容納裝置進一步包括多個緊固元件,特別是螺絲,用於使得轉接元件以能脫離的方式緊固至基體。 According to another embodiment of the present invention, the carrier accommodating device further includes a plurality of fastening elements, especially screws, for fastening the adapter element to the base in a detachable manner.

各個緊固元件能夠均勻或不均勻地分佈在基體的 表面上,因此有助於轉接元件固定地並可能超定地對接至基體。 Each fastening element can be evenly or unevenly distributed on the base body On the surface, it is therefore helpful for the adapter element to be fixedly and possibly over-determined to dock to the base.

在使用螺絲作為緊固元件的情況下,顯而易見的是,基體和轉接元件皆須在空間上相互關聯的位置具有適當的開口,其中至少一個開口相應設置有內螺紋。 In the case of using screws as the fastening element, it is obvious that both the base body and the adapter element must have appropriate openings at positions that are spatially related to each other, and at least one of the openings is correspondingly provided with an internal thread.

根據本發明的另一實施例,所述載體容納裝置進一步包括佈置或構造在基體與轉接元件之間的三個支承元件,其中,特別是這些支承元件均實現為支座式支承元件。這樣的優點在於,能夠通過簡便的方式(手動地)將轉接元件貼附至基體並從基體移開。通過免於平面固定的對接,可以防止因溫度變化(由於不同的熱膨脹係數)引起特別是轉接元件的應變和/或畸變。根據本發明的另一實施例,三個支承元件構造成使得轉接元件靜定地貼附至基體。 According to another embodiment of the present invention, the carrier accommodating device further comprises three supporting elements arranged or constructed between the base body and the adapter element, wherein, in particular, these supporting elements are realized as pedestal supporting elements. This has the advantage that the adapter element can be attached to and removed from the base body in a simple way (manually). By avoiding the flat fixed butt joint, it is possible to prevent the strain and/or distortion of the adapter element due to temperature changes (due to different thermal expansion coefficients). According to another embodiment of the present invention, the three supporting elements are configured such that the adapter element is statically attached to the base body.

靜定支承相對於超靜定支承的優點在於,溫度變化時,基體和轉接元件的熱膨脹增益不同,因此轉接元件不會發生任何空間畸變。這樣在貼裝機中就能確保(無殼)晶片特別精確地定位到待貼裝的載體元件,這是高貼裝精度的重要前提。 The advantage of statically indeterminate support over statically indeterminate support is that when the temperature changes, the thermal expansion gain of the base body and the adapter element are different, so the adapter element will not undergo any spatial distortion. In this way, in the placement machine, it can be ensured that the (shell-less) wafer is particularly accurately positioned to the carrier element to be placed, which is an important prerequisite for high placement accuracy.

靜定支承可以例如實現為三個滾珠支座,它們可以採用如下構造: The statically determinate support can be realized, for example, as three ball bearings, which can be constructed as follows:

(1)第一滾珠支座:轉接元件的第一(下)側存在(錐形)穿孔,例如90°的沉孔。基體的(上)表面存在第一滾珠的一部分,該第一滾珠卡入(錐形)穿孔並因此“沉入”其中。(單獨地)利用這個第一滾珠支座,轉接元件仍可以繞滾珠支座轉動和擺動。 (1) First ball bearing: There is a (tapered) perforation on the first (lower) side of the adapter element, such as a 90° counterbore. There is a part of the first ball on the (upper) surface of the base, which snaps into the (conical) perforation and therefore "sinks" into it. (Individually) With this first ball bearing, the adapter element can still rotate and swing around the ball bearing.

(2)第二滾珠支座:轉接元件的第一下側上或第一下側中存在(V形)凹槽,該凹槽的縱軸指向第一滾珠支座。基體上第二滾珠的一部分卡入(V形)凹槽中。通過第一滾珠支座與第 二滾珠支座組合,轉接元件只能繞軸線擺動,該軸線定義為第一滾珠支座的(第一)支點與第二滾珠支座(第二)支點之間的最短連線。 (2) The second ball bearing: there is a (V-shaped) groove on or in the first lower side of the adapter element, and the longitudinal axis of the groove points to the first ball bearing. A part of the second ball on the base is locked into the (V-shaped) groove. Pass the first ball bearing and the first With the combination of two ball bearings, the adapter element can only swing around an axis, which is defined as the shortest line between the (first) fulcrum of the first ball bearing and the (second) fulcrum of the second ball bearing.

(3)第三滾珠支座:構造在基體上的第三滾珠的一部分的頂點抵靠轉接元件的第一平面側。因此,轉接元件就能靜定地支承於基體上。 (3) The third ball bearing: the vertex of a part of the third ball constructed on the base abuts against the first plane side of the adapter element. Therefore, the adapter element can be statically supported on the base body.

應當指出,在靜定的支承狀態下,轉接元件仍然可能從三個(部分)支承滾珠抬升。避免這一點的具體方式是,例如轉接元件以磁性方式或者通過居中穿過第一滾珠支座的(部分)滾珠螺接而保持在基體上。 It should be pointed out that in a statically determinate support state, the adapter element may still be lifted from the three (partial) support balls. A specific way to avoid this is, for example, that the adapter element is held on the base body magnetically or by a (partial) ball screwing centered through the first ball support.

還應指出,上述每一個滾珠支座也可以這樣實現:將相應的(部分)滾珠附接或構造在轉接元件上,並且對應的對配件、即(錐形)穿孔、(V形)凹槽或平面附接或構造在基體上。 It should also be pointed out that each of the above-mentioned ball bearings can also be implemented as follows: the corresponding (part of) ball is attached or constructed on the adapter element, and the corresponding pair of accessories, namely (conical) perforation, (V-shaped) concave The groove or plane is attached or constructed on the base body.

根據本發明的另一實施例,轉接元件包括至少兩個第一標記,它們在光學上能識別並且特別是附接或構造在轉接元件上設置用於容納載體的空間區域之外。目前,較佳設置四個這樣的第一標記。 According to a further embodiment of the invention, the adapter element includes at least two first markings which are optically recognizable and are in particular attached or configured on the adapter element outside the space area provided for receiving the carrier. At present, it is preferable to provide four such first marks.

基於至少一個這樣的第一標記,通過適當的光學測量,能夠高精度地確定貼裝的晶片相對於該標記的位置。與此同時,在載體的坐標系中,十分精確地瞭解相應晶片的貼裝位置。於是,這種瞭解可以用於進一步處理至少部分地貼裝有晶片的載體。另外,當識別出晶片在載體坐標系中的貼裝位置出現非期望的偏差時,可以將該資訊轉發到使貼裝頭移動或定位的龍門系統的控制器。然後,該資訊可以用於在後續貼裝其他晶片時控制龍門系統,以便將來儘量避免貼裝位置的偏差。 Based on at least one such first mark, through appropriate optical measurement, the position of the mounted wafer relative to the mark can be determined with high accuracy. At the same time, in the coordinate system of the carrier, the placement position of the corresponding chip is understood very accurately. This knowledge can then be used to further process the at least partially wafer-mounted carrier. In addition, when an undesired deviation of the chip's placement position in the carrier coordinate system is recognized, the information can be forwarded to the controller of the gantry system that moves or positions the placement head. This information can then be used to control the gantry system during subsequent placement of other chips in order to avoid deviations in placement positions in the future.

根據本發明的另一實施例,基體包括至少兩個第二 標記,它們在光學上能識別並且特別是附接或構造在基體上設置用於容納轉接元件的空間區域之外。 According to another embodiment of the present invention, the base body includes at least two second Markings, which are optically recognizable and are in particular attached or constructed on the base body outside the space area provided for accommodating the adapter element.

基於至少一個這樣的第二標記,通過適當的光學測量,能夠高精度地確定貼裝的晶片相對於該標記的位置。與此同時,在基體的坐標系中,十分精確地瞭解相應晶片的貼裝位置。如上所述,如果基體由低熱膨脹係數的優質材料製成,則可以將基體的坐標系近似視為整個貼裝機的坐標系。 Based on at least one such second mark, through appropriate optical measurement, the position of the mounted wafer relative to the mark can be determined with high accuracy. At the same time, in the coordinate system of the substrate, the placement position of the corresponding chip can be understood very accurately. As mentioned above, if the base is made of a high-quality material with a low coefficient of thermal expansion, the coordinate system of the base can be approximately regarded as the coordinate system of the entire placement machine.

如果精確地瞭解所述貼裝機內相關的第二標記的位置,則可以精確地確定貼裝的晶片在貼裝機坐標系內的實際位置。此外,如果精確地瞭解待貼裝的載體在這個貼裝機坐標系內的位置(直接或間接地通過轉接元件的位置),則可以高精度地確定貼裝的晶片在載體坐標系內的實際位置。 If the position of the relevant second mark in the placement machine is accurately known, the actual position of the mounted chip in the placement machine coordinate system can be accurately determined. In addition, if the position of the carrier to be mounted in the coordinate system of the placement machine is accurately known (directly or indirectly through the position of the transfer component), the actual position of the mounted chip in the carrier coordinate system can be determined with high precision. position.

同樣,在這種情況下,如果在這種位置測量中確定實際貼裝位置與預定貼裝位置之間存在一定非期望的偏差,則在後續的貼裝過程中,通過適當地控制貼裝頭的運動至少大致補償這種偏差。 Similarly, in this case, if it is determined in this position measurement that there is a certain undesired deviation between the actual placement position and the predetermined placement position, in the subsequent placement process, the placement head should be properly controlled. The movement at least roughly compensates for this deviation.

在將基體內置到貼裝機中之前,可以使用高精度的光學測量儀來測量光學上能識別的第二標記的精確位置。通過這種方式,能夠以特別高的精度進行上述對貼裝位置的光學測量。 Before the substrate is built into the placement machine, a high-precision optical measuring instrument can be used to measure the precise position of the optically recognizable second mark. In this way, the above-mentioned optical measurement of the mounting position can be performed with particularly high accuracy.

兩個第二標記在空間上佈置於在貼裝機的操作期間設置用於容納轉接元件的區域之外的優點在於,假使載體在側面未超出轉接元件,也能在載體貼裝期間測量這些標記(的位置)。這樣,在貼裝過程中,根據待貼裝晶片的數目,可能需要幾個小時以光學方式精確地識別貼裝位置,從而長期持續地保證高貼裝精度。 The advantage of the two second marks being spatially arranged outside the area provided for accommodating the adapter element during the operation of the placement machine is that these can be measured during carrier placement even if the carrier does not extend beyond the adapter element on the side. Mark (location). In this way, during the mounting process, depending on the number of wafers to be mounted, it may take several hours to accurately identify the mounting position optically, so as to ensure high mounting accuracy for a long time.

根據本發明的另一態樣,描述一種用於容納待貼裝 無殼晶片的不同載體的系統。所述系統包括:(a)前述類型的載體容納裝置;(b)另外的轉接元件,其具有另外的第一側以及與該另外的第一側相對的另外的第二側,其中,另外的第一側以能脫離的方式附接至基體的表面,並且另外的第二側構造成使得另外的待貼裝的載體能(平坦地)貼附至另外的轉接元件;以及(c)另外的氣動連接結構,其構造在另外的轉接元件中並從另外的第一側貫穿另外的轉接元件延伸到另外的第二側。另外的氣動系統和氣動連接結構構造成能對另外的載體的(下)表面施加負壓。 According to another aspect of the present invention, a method for accommodating to be mounted System of different carriers without shell wafers. The system includes: (a) a carrier receiving device of the aforementioned type; (b) an additional adapter element having an additional first side and an additional second side opposite to the additional first side, wherein the additional The first side is detachably attached to the surface of the base, and the other second side is configured so that another carrier to be mounted can (flatly) be attached to another adapter element; and (c) Another pneumatic connection structure is constructed in another adapter element and extends from the other first side through the other adapter element to the other second side. The other pneumatic system and the pneumatic connection structure are configured to apply negative pressure to the (lower) surface of the other carrier.

所述系統是基於以下認識:針對基本元件可以提供不同的轉接板,這些轉接板分別與一種類型的載體相關聯。相互關聯的組件(即載體和轉接板)較佳由相同的材料製成,或者它們至少具有熱膨脹係數相同或相似的材料。一般而言,在系統中,可以保留(任意數目的)不同轉接元件,它們分別具有不同的熱膨脹係數,這樣就能穩妥又高精度地容納分別具有不同熱膨脹係數的多種不同類型的載體。 The system is based on the recognition that different adapter plates can be provided for the basic elements, and these adapter plates are respectively associated with one type of carrier. The interconnected components (ie, the carrier and the adapter plate) are preferably made of the same material, or they at least have materials with the same or similar thermal expansion coefficients. Generally speaking, in the system, it is possible to keep (any number) of different adapter elements, which have different thermal expansion coefficients, so that multiple different types of carriers with different thermal expansion coefficients can be safely and accurately accommodated.

簡而言之,使用具有(固定)內置基體的貼裝機,針對每種類型的載體使用匹配的轉接元件,從而可以給不同類型的載體貼裝晶片。這樣就不必針對每種類型的載體使用匹配的單件式載體容納裝置,否則當更換待貼裝載體的類型時,這種單件式載體容納裝置必須完全替換為另一種單件式載體容納裝置。使用根據本發明的多件式載體容納裝置時,就不必如此,因為僅需轉接元件保持匹配即可。與(單件式)載體容納裝置相比,轉接元件顯然成本更低,因此利用所述具有至少兩個轉接元件的系統,能夠相當可觀地節省成本。此外,與(單件式)載體容納裝置相比,轉接元件顯然可以更易於置換,因此利用所述系統,當更換待貼裝載體的類型時,可以顯著減少這種更換所需的時間。 In short, a placement machine with a (fixed) built-in substrate is used, and a matching adapter component is used for each type of carrier, so that different types of carriers can be placed on wafers. In this way, it is not necessary to use a matching single-piece carrier accommodating device for each type of carrier. Otherwise, when the type of loading body to be attached is changed, this single-piece carrier accommodating device must be completely replaced with another one-piece carrier accommodating device . When using the multi-piece carrier accommodating device according to the present invention, this need not be the case, because only the adapter element needs to be matched. Compared with the (single-piece) carrier accommodating device, the adaptor element is obviously lower in cost, so the use of the system with at least two adaptor elements can save considerable cost. In addition, compared with the (single-piece) carrier accommodating device, the adapter element can obviously be replaced more easily. Therefore, the system can significantly reduce the time required for such replacement when changing the type of loading body to be attached.

根據本發明的又一態樣,描述一種貼裝機,用於將無殼晶片貼裝到載體,特別是用於製造均具有至少一個封殼內晶片的電子元件,該封殼特別是具有完全硬化的灌封料。所述貼裝機包括:(a)供給裝置,用於提供具有多個晶片的晶片;(b)前述類型的載體容納裝置;以及(c)貼裝頭,用於從所提供的晶片中拾取晶片並將所拾取的晶片放置在載體上的預定貼裝位置。 According to another aspect of the present invention, a placement machine is described for attaching shellless wafers to a carrier, especially for manufacturing electronic components each having at least one chip in the package, the package particularly having a fully hardened Of potting materials. The placement machine includes: (a) a supply device for supplying wafers with a plurality of wafers; (b) a carrier housing device of the aforementioned type; and (c) a placement head for picking up wafers from the supplied wafers And place the picked up wafer on the predetermined mounting position on the carrier.

所述貼裝機是基於以下認識:具有基座和轉接板的兩分式載體容納裝置能夠具體匹配於待貼裝載體的類型,可以通過簡便的方式實現最佳地容納各類型的載體。這種最佳容納位置精確且盡可能沒有機械應力,特別是涉及到不易完全避免溫度波動,這是獲得極高貼裝精度的重要前提。 The placement machine is based on the recognition that a two-part carrier containing device with a base and an adapter plate can be specifically matched to the type of loading body to be placed, and can optimally contain various types of carriers in a simple manner. This kind of optimal holding position is accurate and without mechanical stress as much as possible, especially when temperature fluctuations are not easily avoided, which is an important prerequisite for obtaining extremely high placement accuracy.

根據本發明的還一方面,描述一種用於使用貼裝機、特別是前述類型的貼裝機將無殼晶片貼裝到載體的方法。所述方法包括:(a)借助供給裝置,提供具有多個晶片的晶片;(b)借助前述類型的載體容納裝置,容納待貼裝的載體;(c)借助負壓,將待貼裝的載體固定至載體容納裝置,該負壓經由基體中的氣動系統和轉接元件中的氣動連接結構施加於載體的(下)表面;(d)借助貼裝頭,從供給裝置拾取所提供的晶片;(e)將所拾取的晶片傳送到貼裝區域;以及(f)將所傳送的晶片放置在載體上的預定貼裝位置。所述方法也基於以下認識:通過使用前述載體容納裝置,其具有轉接板,該轉接板可以具體匹配於待裝載的載體的類型,可以通過簡便的方式實現針對各種載體類型的最佳容納。鑒於在將載體貼裝晶片的過程中不會出現無法完全避免的溫度波動,這一點特別適用。 According to another aspect of the present invention, a method for mounting a shellless wafer to a carrier using a placement machine, particularly the aforementioned type of placement machine, is described. The method includes: (a) using a supply device to provide wafers with multiple wafers; (b) using the aforementioned type of carrier accommodating device to accommodate the carrier to be mounted; (c) using negative pressure to load the wafer to be mounted The carrier is fixed to the carrier accommodating device, and the negative pressure is applied to the (lower) surface of the carrier via the pneumatic system in the base body and the pneumatic connection structure in the adapter element; (d) the chip is picked up from the supply device by means of the placement head (E) Transfer the picked wafer to the mounting area; and (f) Place the transferred wafer at a predetermined mounting position on the carrier. The method is also based on the following recognition: by using the aforementioned carrier accommodating device, it has an adapter plate, which can be specifically matched to the type of carrier to be loaded, and the optimal accommodation for various carrier types can be realized in a simple manner. . This is particularly applicable in view of the fact that there will be no unavoidable temperature fluctuations in the process of mounting the carrier on the wafer.

應當指出,上文已結合不同的發明主題說明本發明的實施方式。特別是,通過產品申請專利範圍描述本發明的某些 實施方式,而通過方法申請專利範圍描述本發明的另一些實施方式。但本領域技術人員閱讀本申請後可以清楚的是,除屬於一種類型發明主題的特徵組合之外,也可能存在屬於不同類型發明主題的任何特徵組合,除非另作明確說明。 It should be pointed out that the above has described the implementation of the present invention in combination with different subject matters. In particular, some aspects of the present invention are described through the scope of product patent application Embodiments, and other embodiments of the present invention are described through the method patent scope. However, it is clear to those skilled in the art after reading this application that, in addition to the feature combination belonging to one type of invention subject, there may also be any feature combination belonging to different types of invention subject, unless explicitly stated otherwise.

通過下文舉例說明本發明的較佳實施方式,本發明的更多優點和特徵將顯而易見。 By exemplifying the preferred embodiments of the present invention below, more advantages and features of the present invention will be apparent.

100:貼裝機 100: Placement machine

114:承載軌 114: load rail

116:承載臂 116: Carrier arm

118:承載板 118: Carrier plate

120:貼裝頭 120: Mounting head

130:載體容納裝置 130: carrier holding device

140:基體 140: matrix

142:表面 142: Surface

148:第二標記 148: Second Mark

150:轉接元件 150: Adapter element

158:第一標記 158: First Mark

160:供給裝置 160: supply device

161:晶片供給裝置 161: Wafer Supply Device

180:晶片 180: chip

190:載體 190: Carrier

222:晶片保持裝置 222: Wafer holding device

265:晶片記憶體 265: chip memory

270:相機 270: Camera

282:晶片 282: Chip

292:承載板 292: Carrier Board

294:黏附膜 294: Adhesive Film

296:光學結構 296: Optical Structure

372:調溫裝置 372: Thermostat

375:真空發生單元 375: Vacuum generating unit

376:真空管路 376: Vacuum line

444:氣動系統 444: Pneumatic system

451:第一側 451: first side

452:第二側 452: second side

454:氣動連接結構 454: Pneumatic connection structure

456:螺絲 456: screw

530:載體容納裝置 530: carrier holding device

557:半球形支承元件 557: Hemispherical support element

圖1示出根據本發明的實施例的貼裝機,包括:(i)具有基體和轉接元件的兩件式載體容納裝置;(ii)兩個晶片供給裝置;以及(iii)兩個貼裝頭。 Figure 1 shows a placement machine according to an embodiment of the present invention, including: (i) a two-piece carrier containing device with a base and an adapter element; (ii) two wafer supply devices; and (iii) two placements head.

圖2示出如圖1所示的貼裝機的一部分的放大圖。 Fig. 2 shows an enlarged view of a part of the placement machine shown in Fig. 1.

圖3示出兩件式載體容納裝置的俯視圖,該載體容納裝置具有氣動地耦合於其上的真空發生單元和調溫裝置。 Figure 3 shows a top view of a two-piece carrier containing device having a vacuum generating unit and a temperature regulating device pneumatically coupled to it.

圖4示出兩件式載體容納裝置的橫截面圖,其中,轉接元件與其氣動連接結構旋接至基體與其氣動系統。 Figure 4 shows a cross-sectional view of the two-piece carrier containment device, in which the adapter element and its pneumatic connection structure are screwed to the base body and its pneumatic system.

圖5示出兩件式載體容納裝置的另一種實施方式的橫截面圖,其中,轉接元件通過三個支承元件靜定地貼靠在基體上。 FIG. 5 shows a cross-sectional view of another embodiment of the two-part carrier receiving device, in which the adapter element rests statically on the base body by three support elements.

應當指出,在下文的具體描述中,不同的實施方式與另一種實施方式的對應特徵或元件相同或至少功能上相同的特徵或元件標有相同的附圖標記或其附圖標記的最後兩位元與對應相同或至少功能上相同的特徵或元件的附圖標記相同。為免贅述,下文不再具體闡述已基於前述實施方式說明的特徵或元件。 It should be pointed out that in the following detailed description, features or elements that are the same or at least functionally the same as the corresponding features or elements of a different embodiment and another embodiment are marked with the same reference signs or the last two digits of the reference signs. The elements are the same as the reference signs corresponding to the same or at least functionally identical features or elements. In order to avoid repetition, the features or elements that have been described based on the foregoing embodiments will not be described in detail below.

圖1示出根據本發明實施例的貼裝機100。貼裝機 100包括機架112,兩個表面定位系統附接至該機架112,以使各個貼裝頭120和121運動,以便它們可以在與附圖平面平行的平面內移動。這兩個表面定位系統包括相對於機架靜止的承載軌114作為共用的第一元件。兩個橫向承載臂116附接至承載軌114作為(非共用)的第二元件,它們可以沿y方向移動。承載臂116是定位系統,並且承載臂116與另一定位系統相關聯。兩個定位系統進一步分別包括可活動的承載板118,該可活動的承載板118附接到相應的承載臂116並且可以沿x方向移動。貼裝頭120和121借助固定的螺絲連接附接至兩個承載板118。 FIG. 1 shows a placement machine 100 according to an embodiment of the present invention. Placement machine 100 includes a frame 112 to which two surface positioning systems are attached to move each placement head 120 and 121 so that they can move in a plane parallel to the plane of the drawing. The two surface positioning systems include a carrier rail 114 that is stationary relative to the frame as a common first element. Two transverse load-bearing arms 116 are attached to the load-bearing rail 114 as a (non-common) second element, which can move in the y direction. The carrying arm 116 is a positioning system, and the carrying arm 116 is associated with another positioning system. The two positioning systems further respectively include a movable carrier plate 118, which is attached to the corresponding carrier arm 116 and can move in the x direction. The placement heads 120 and 121 are attached to the two carrier boards 118 by means of fixed screw connections.

貼裝機100進一步包括兩個晶片供給裝置,即一個晶片供給裝置160和另一個晶片供給裝置161。在其他未示出的實施方式中,代替至少一個晶片供給裝置,也可以使用另一種類型的供給裝置(例如,帶式或盒式供給裝置)。使用這兩個晶片供給裝置160、161的每一個,可以將晶片180從晶片記憶體(圖1中未示出)中帶入貼裝機100的提供區域,通過使用相應的貼裝頭120、121可以從中拾取各個晶片。貼裝頭120、121較佳是所謂的多重貼裝頭,它們均具有多個抽吸管(圖1中示為小圓圈)。抽吸管可以臨時拾取各一個晶片。根據本圖示出的實施例,抽吸管可以單獨沿z方向移動,該z方向的取向垂直於附圖平面,從而既垂直於y方向也垂直於x方向。替代地,也可使用具有其他拓撲結構的貼裝頭,例如所謂的“收集與放置轉塔頭”。 The placement machine 100 further includes two wafer supply devices, namely one wafer supply device 160 and the other wafer supply device 161. In other non-illustrated embodiments, instead of at least one wafer supply device, another type of supply device (for example, a tape or cassette type supply device) may be used. Using each of the two wafer supply devices 160, 161, the wafer 180 can be brought from the chip memory (not shown in FIG. 1) to the supply area of the placement machine 100 by using the corresponding placement heads 120, 121 Individual wafers can be picked from it. The placement heads 120 and 121 are preferably so-called multiple placement heads, both of which have multiple suction pipes (shown as small circles in FIG. 1). The suction tube can temporarily pick up one wafer each. According to the embodiment shown in this figure, the suction pipe can be moved independently in the z direction, which is oriented perpendicular to the plane of the drawing, and thus perpendicular to both the y direction and the x direction. Alternatively, placement heads with other topologies can also be used, such as the so-called "collect and place turret head".

於是,通過相關表面定位系統的適當控制,將由相應的貼裝頭120、121拾取的晶片傳送到貼裝區域中,在該貼裝區域中,將它們在預定的貼裝位置放置到待貼裝的載體190上。 Then, through appropriate control of the relevant surface positioning system, the wafers picked up by the corresponding placement heads 120 and 121 are transferred to the placement area, where they are placed at the predetermined placement position to be placed. On the carrier 190.

設置有兩個貼裝頭120、121和兩個供給裝置160、161的貼裝機100可以通過有利的方式在操作模式下操作,在該 操作模式下,兩個貼裝頭120、121分別交替地容納它們各自相關聯的供給裝置160、161的晶片並且將該晶片放置到待貼裝的載體190上。這樣就能顯著提高貼裝性能。就此而言,術語“貼裝性能”是指兩個貼裝頭120、121可以在預定的時間單位(例如1小時)內拾取並放置到載體190上的晶片的數目。 The placement machine 100 provided with two placement heads 120, 121 and two supply devices 160, 161 can be operated in an operating mode in an advantageous manner, where In the operation mode, the two placement heads 120 and 121 alternately accommodate the wafers of their respective associated supply devices 160 and 161 and place the wafers on the carrier 190 to be placed. This can significantly improve placement performance. In this regard, the term "mounting performance" refers to the number of wafers that can be picked up and placed on the carrier 190 by the two mounting heads 120 and 121 within a predetermined time unit (for example, 1 hour).

貼裝機100進一步包括載體容納裝置130。載體容納裝置130包括(至少)兩個元件或部件,即基體140和轉接元件150。根據本圖所示的實施例,基體140由恆範鋼(約64%的Fe,36%的Ni)或超恆範鋼(約31%的Ni,5%的Co,其餘為Fe)材料製成,因此它在貼裝機操作期間可能發生的溫度波動下只有極低的熱膨脹。基本上具有板外形的轉接元件由另一種材料製成。該材料與構成待貼裝的載體190的材料相同或具有至少大致相同的熱膨脹係數。根據本圖所示的實施例,載體190包括機械上相對較硬的框架結構,該框架結構完全由製造轉接元件150的材料製成。下面將參照圖2說明載體190的構型。 The placement machine 100 further includes a carrier containing device 130. The carrier accommodating device 130 includes (at least) two elements or components, namely a base 140 and an adapter element 150. According to the embodiment shown in this figure, the base 140 is made of Hengfan steel (about 64% Fe, 36% Ni) or super Hengfan steel (about 31% Ni, 5% Co, the rest is Fe) material Therefore, it has very low thermal expansion under temperature fluctuations that may occur during the operation of the placement machine. The adapter element, which basically has a board shape, is made of another material. The material is the same as or has at least substantially the same coefficient of thermal expansion as the material constituting the carrier 190 to be mounted. According to the embodiment shown in this figure, the carrier 190 includes a mechanically relatively rigid frame structure that is entirely made of the material from which the adapter element 150 is made. The configuration of the carrier 190 will be described below with reference to FIG. 2.

在貼裝過程中,將載體190保持或固定在貼裝機100在坐標系中的固定空間位置上。就此應當指出,與將封殼的電子元件貼裝到印刷電路板相比,將無殼的晶片貼裝到載體190通常會耗費更長的時間,因為載體190要貼裝的晶片數目一般遠多於要在印刷電路板上貼裝封殼的電子元件的數目。出於這種原因,對待貼裝的載體190定位並固定在載體容納裝置130上的精度提出極高的要求。為此,必須確保整個載體190的位置或載體190的各個分區的位置在例如兩小時的整個貼裝週期內都不改變。這同樣適用於相關表面定位系統的行程。 During the placement process, the carrier 190 is held or fixed at a fixed spatial position of the placement machine 100 in the coordinate system. In this regard, it should be pointed out that compared to mounting the packaged electronic components on the printed circuit board, it usually takes longer to mount the chip without a package to the carrier 190, because the number of chips to be mounted on the carrier 190 is generally much larger. For the number of electronic components to be mounted on the printed circuit board. For this reason, the accuracy of positioning and fixing the carrier 190 to be mounted on the carrier accommodating device 130 is extremely high. For this reason, it must be ensured that the position of the entire carrier 190 or the position of each partition of the carrier 190 does not change during the entire mounting cycle of, for example, two hours. The same applies to the stroke of the relevant surface positioning system.

為了獲得高的貼裝精度並確保更長的持續時間,在載體容納裝置上構造或附接多個標記。可以由相機採集這些標記, 並且可以通過對所採集的圖像進行對應的圖像分析來確定這些標記的精確位置。然後,可以根據所確定的標記的精確位置校準龍門系統,或者在較長的貼裝程式中反復重新校準。較佳地,如圖2所示,這種相機直接或間接地附接至其中一個貼裝頭。 In order to obtain high placement accuracy and ensure a longer duration, multiple marks are constructed or attached to the carrier receiving device. These markers can be captured by the camera, And the precise location of these markers can be determined by performing corresponding image analysis on the captured images. Then, the gantry system can be calibrated according to the precise position of the determined mark, or recalibrated repeatedly in a long placement program. Preferably, as shown in Fig. 2, such a camera is directly or indirectly attached to one of the placement heads.

根據本圖所示的實施例,轉接元件150上存在總共四個第一標記158,側向位於載體190旁。在基體140的(上)表面142上,在轉接元件150外面並從上方可以看出,存在總共四個第二標記148。 According to the embodiment shown in this figure, there are a total of four first marks 158 on the adapter element 150, which are laterally located beside the carrier 190. On the (upper) surface 142 of the base 140, outside of the adapter element 150 and seen from above, there are a total of four second marks 148.

圖2示出如圖1所示的貼裝機100的一部分的放大圖。晶片供給裝置160與晶片記憶體265相關聯,在該晶片記憶體265中,多個晶片均佈置有數個上下層疊的無殼晶片(圖中未示出)。借助晶片供給裝置160,可以從晶片儲存器265中拾取各個晶片180,並且在貼裝對應的晶片之後,再將至少部分地清空晶片的晶片180送回到晶片儲存器265中。 FIG. 2 shows an enlarged view of a part of the placement machine 100 shown in FIG. 1. The wafer supply device 160 is associated with a wafer memory 265 in which a plurality of wafers are arranged with a plurality of shellless wafers (not shown in the figure) stacked on top of each other. With the help of the wafer supply device 160, each wafer 180 can be picked up from the wafer storage 265, and after the corresponding wafer is mounted, the wafer 180 whose wafers are at least partially emptied is returned to the wafer storage 265.

為了借助載體容納裝置將載體190粗略地定位或定中在載體容納裝置130上或確切而言在轉接元件150上,在載體190的外部區域中構造兩個彼此相對的光學結構296。根據本圖所示的實施例,這兩個光學結構中的每一個都借助簡單的孔眼296來實現。 In order to roughly position or center the carrier 190 on the carrier accommodating device 130 or on the adapter element 150 by means of the carrier accommodating device, two mutually opposite optical structures 296 are formed in the outer region of the carrier 190. According to the embodiment shown in this figure, each of these two optical structures is realized by means of simple holes 296.

應當指出,所使用的載體190是一種常用的載體,通過公知方式,該載體較佳包括金屬的承載板292以及施加於該承載板292上的黏附膜294。在該黏附膜294上放置晶片,在圖2中用附圖標記282代表這些晶片。通過公知方式完成晶片282的貼裝,這是通過適當地定位貼裝頭120並使構造成抽吸管的晶片保持裝置222沿著垂直於(xy)平面的z方向下降。 It should be noted that the carrier 190 used is a commonly used carrier, and the carrier preferably includes a metal carrier plate 292 and an adhesive film 294 applied to the carrier plate 292 by a known method. Wafers are placed on the adhesive film 294, which are represented by the reference numeral 282 in FIG. 2. The placement of the wafer 282 is accomplished by a well-known method by appropriately positioning the placement head 120 and lowering the wafer holding device 222 configured as a suction tube in the z direction perpendicular to the (xy) plane.

上述載體190在轉接元件150上的定中是基於對結 構296的位置的光學測量。為此,根據本圖示出的實施例,使用相機270,該相機270通過有利的方式附接至可活動的貼裝頭120,從而通過適當地控制表面定位系統(圖2中未示出),通過適當方式將該相機270放置到待測量的結構296上方。如果在該測量中精確地瞭解相機270在貼裝機100或表面定位系統的坐標系內的位置,則可以通過對相機270採集的圖像進行適當的圖像分析來確定載體190在貼裝機100的坐標系中的座標。 The above-mentioned centering of the carrier 190 on the adapter element 150 is based on the alignment Optical measurement of the position of the structure 296. For this purpose, according to the embodiment shown in this figure, a camera 270 is used, which is attached to the movable placement head 120 in an advantageous manner, thereby by appropriately controlling the surface positioning system (not shown in FIG. 2) , Place the camera 270 above the structure 296 to be measured in an appropriate manner. If the position of the camera 270 in the coordinate system of the placement machine 100 or the surface positioning system is accurately known in this measurement, the image collected by the camera 270 can be analyzed to determine the position of the carrier 190 on the placement machine 100. The coordinates in the coordinate system.

替代地或組合地,如上所述的標記148和158也可以用於以光學方式確定載體190相對於這些標記148和158的相對位置。為此,僅需使用相機270檢測光學上能識別的結構296以及標記148、158中的至少兩個標記。應當指出,所使用的標記的數目絕不限於如圖2所示的總共八個標記148、158。通常:標記的數目越多,相應的光學測量越精確。標記148、158中的至少一個標記也可以連同已經貼裝的晶片282一起來測量。通過這種方式,如同公知的對貼裝內容的自動光學檢查(AOI),可以測量相關晶片282的精確實際位置。於是,將來要貼裝其他晶片時,可以考慮到與其目標位置可能存在的任何偏差,並通過表面定位系統的適當控制來補償這種偏差。 Alternatively or in combination, the marks 148 and 158 described above can also be used to optically determine the relative position of the carrier 190 with respect to these marks 148 and 158. For this, it is only necessary to use the camera 270 to detect the optically identifiable structure 296 and at least two of the marks 148 and 158. It should be noted that the number of marks used is by no means limited to a total of eight marks 148, 158 as shown in FIG. 2. Generally: the greater the number of marks, the more accurate the corresponding optical measurement. At least one of the marks 148 and 158 may also be measured together with the wafer 282 that has been mounted. In this way, as with the known automatic optical inspection (AOI) of the mounting content, the precise actual position of the relevant wafer 282 can be measured. Therefore, when other wafers are to be mounted in the future, any deviations that may exist from their target positions can be considered, and such deviations can be compensated by proper control of the surface positioning system.

應當指出,標記148、158具有高度精確的內部結構,可以極高精度地瞭解它們在基體140和轉接元件150上的位置。為此,較佳使用高精度的光學測量儀來測量基體140和/或轉接元件150連同相關的標記148和158,之後再內置到貼裝機100中。這樣就能精確地瞭解標記148、158的座標的位置資料,從而它們可以用於高精度地測量所貼裝的晶片282的位置。 It should be noted that the marks 148 and 158 have a highly accurate internal structure, and their positions on the base 140 and the adapter element 150 can be understood with extremely high accuracy. For this reason, it is preferable to use a high-precision optical measuring instrument to measure the base 140 and/or the adapter element 150 together with the related marks 148 and 158, and then build them into the placement machine 100. In this way, the position data of the coordinates of the marks 148 and 158 can be accurately understood, so that they can be used to measure the position of the mounted wafer 282 with high accuracy.

還應指出,轉接元件150可以保持多種不同的規格或尺寸。這樣貼裝機100就能以簡便的方式匹配於具有不同載體 規格的操作。另外,轉接元件150可以保有不同的熱膨脹係數,從而貼裝機100也能以簡便的方式匹配於不同載體的操作,其中,不同的載體包括具有不同熱膨脹係數的材料。 It should also be noted that the adapter element 150 can maintain a variety of different specifications or sizes. In this way, the placement machine 100 can be matched with different carriers in a simple manner Specification operation. In addition, the adapter element 150 can maintain different thermal expansion coefficients, so that the placement machine 100 can also be adapted to the operation of different carriers in a simple manner, wherein the different carriers include materials with different thermal expansion coefficients.

圖3示出兩件式載體容納裝置130的俯視圖。載體190借助負壓以能脫離的方式固定至轉接元件150。在圖3的俯視圖中未示出構造在轉接元件150和基體140中的對應氣動通道。圖3示意性示出真空發生單元375,其經由真空管路376氣動地連接到基體140的氣動系統444(圖中未示出)。 FIG. 3 shows a top view of the two-piece carrier receiving device 130. The carrier 190 is fixed to the adapter element 150 in a detachable manner by means of negative pressure. The corresponding pneumatic channels formed in the adapter element 150 and the base 140 are not shown in the top view of FIG. 3. FIG. 3 schematically shows a vacuum generating unit 375 which is pneumatically connected to the pneumatic system 444 of the base 140 via a vacuum line 376 (not shown in the figure).

另外,圖3同樣示出熱接到基體140的調溫裝置372的示意圖。在操作中,通過適當方式控制的調溫裝置372確保基體140保持在至少大致恆定的溫度。如果轉接元件150由導熱良好的材料製成,特別是由金屬製成,則轉接元件150與基體140之間的熱耦良好,並且轉接元件150和貼於其上的載體190可以保持在至少大致恆定的溫度。 In addition, FIG. 3 also shows a schematic diagram of the temperature control device 372 thermally connected to the base 140. In operation, the temperature adjustment device 372 controlled in a suitable manner ensures that the base 140 is maintained at an at least substantially constant temperature. If the adapter element 150 is made of a material with good heat conduction, especially metal, the thermal coupling between the adapter element 150 and the base 140 is good, and the adapter element 150 and the carrier 190 attached to it can be maintained At least approximately constant temperature.

圖4示出(至少)兩件式載體容納裝置130的橫截面圖。基體140中構造有氣動系統444,其由多個通道組成。氣動系統444在輸入側氣動地連接到真空管路376(如圖所示)。在真空發生單元375的運行中,氣動系統444中就產生負壓,該負壓傳遞到構造在轉接元件150中的氣動連接結構。氣動連接結構454也具有多個通道,當轉接元件150正確定位在基體140上時,這些通道對應於氣動系統444在基體140上表面上的出口的位置和大小。借助氣動連接結構454,將施加於轉接元件150的第二下側452的負壓傳遞到轉接元件150的第一上側451的開口。氣動連接結構454在轉接元件150的第一上側451的開口被待貼裝的載體190至少大致完全封閉,以使氣動系統444和氣動連接結構454中的負壓引起載體190以真空方式固定至轉接元件150的 第一側451。 FIG. 4 shows a cross-sectional view of the (at least) two-piece carrier receiving device 130. A pneumatic system 444 is constructed in the base 140, which is composed of a plurality of channels. The pneumatic system 444 is pneumatically connected to the vacuum line 376 on the input side (as shown). During the operation of the vacuum generating unit 375, a negative pressure is generated in the pneumatic system 444, and the negative pressure is transmitted to the pneumatic connection structure constructed in the adapter element 150. The pneumatic connection structure 454 also has a plurality of channels. When the adapter element 150 is correctly positioned on the base 140, these channels correspond to the position and size of the outlet of the pneumatic system 444 on the upper surface of the base 140. By means of the pneumatic connection structure 454, the negative pressure applied to the second lower side 452 of the adapter element 150 is transferred to the opening of the first upper side 451 of the adapter element 150. The opening of the pneumatic connection structure 454 on the first upper side 451 of the adapter element 150 is at least approximately completely closed by the carrier 190 to be mounted, so that the negative pressure in the pneumatic system 444 and the pneumatic connection structure 454 causes the carrier 190 to be fixed to it in a vacuum. Adapter element 150 First side 451.

應當指出,圖4僅示意性或示例性示出氣動系統444和/或氣動連接結構454的空間配置。根據具體應用情況,可以使用完全不同的幾何形狀。例如,可以在轉接元件150的第一上側構造環形凹槽,該環形凹槽可以承受負壓。 It should be noted that FIG. 4 only schematically or exemplarily shows the spatial configuration of the pneumatic system 444 and/or the pneumatic connection structure 454. Depending on the specific application, completely different geometries can be used. For example, an annular groove may be constructed on the first upper side of the adapter element 150, and the annular groove can withstand negative pressure.

根據圖4所示的實施例,轉接元件150借助多個示意性示出的螺絲456和對應的內螺紋以可脫離的方式螺接至基體140。螺絲456確保轉接元件150牢固地機械對接至基體140。當更換轉接元件150時,須鬆開全部螺絲456,並在安置另一個轉接元件之後,須再旋緊螺絲456。 According to the embodiment shown in FIG. 4, the adapter element 150 is screwed to the base 140 in a detachable manner by means of a plurality of schematically shown screws 456 and corresponding internal threads. The screws 456 ensure that the adapter element 150 is mechanically docked to the base 140 firmly. When replacing the adapter component 150, all the screws 456 must be loosened, and after another adapter component is installed, the screws 456 must be tightened.

圖5示出(至少)兩件式載體容納裝置530的另一種實施方式的橫截面圖。該載體容納裝置530與圖4所示的載體容納裝置130的區別僅在於,使用半球形支承元件557取代螺絲456,轉接元件150放置在該半球形支承元件557上。為清楚起見,圖5中放大示出轉接元件150的第二下側452與基體140的上側之間的間隙。實際上,該間隙小到只有少量外部空氣才能通過這個間隙滲透到氣動系統444中。真空發生單元375能夠“輕鬆泵走”這些少量空氣。 FIG. 5 shows a cross-sectional view of another embodiment of the (at least) two-piece carrier receiving device 530. The only difference between the carrier accommodating device 530 and the carrier accommodating device 130 shown in FIG. 4 is that a hemispherical support element 557 is used instead of the screw 456, and the adapter element 150 is placed on the hemispherical support element 557. For clarity, the gap between the second lower side 452 of the adapter element 150 and the upper side of the base 140 is enlarged and shown in FIG. 5. In fact, the gap is so small that only a small amount of outside air can penetrate into the pneumatic system 444 through the gap. The vacuum generating unit 375 can "easily pump away" these small amounts of air.

根據本圖示出的實施例,支承元件557或空間凹口(未示出)構造在轉接元件150的第二下側452上,以便實現轉接元件150靜定地支承於基體140上。在本發明中,已經詳細描述了借助三個滾珠支座實現這種靜定支承的可行方案,在此不再贅述。 According to the embodiment shown in this figure, a supporting element 557 or a space recess (not shown) is configured on the second underside 452 of the adaptor element 150 in order to achieve a statically stable support of the adaptor element 150 on the base 140. In the present invention, a feasible solution for realizing this statically determinate support by means of three ball bearings has been described in detail, and will not be repeated here.

應當指出,術語“包括”不排除其他元素,而“一個”不排除多個。而且,結合不同實施例描述的元素可以組合。還應指出,申請專利範圍中的附圖標記不應解釋為限制申請專利 範圍的範圍。 It should be noted that the term "comprising" does not exclude other elements, and "a" does not exclude a plurality. Moreover, elements described in combination with different embodiments may be combined. It should also be pointed out that the reference signs in the scope of patent applications should not be construed as limiting patent applications The scope of the scope.

130:載體容納裝置 130: carrier holding device

140:基體 140: matrix

148:第二標記 148: Second Mark

150:轉接元件 150: Adapter element

158:第一標記 158: First Mark

375:真空發生單元 375: Vacuum generating unit

376:真空管路 376: Vacuum line

444:氣動系統 444: Pneumatic system

451:第一側 451: first side

452:第二側 452: second side

454:氣動連接結構 454: Pneumatic connection structure

456:螺絲 456: screw

Claims (13)

一種用於容納待貼裝無殼晶片(282)的載體(190)的載體容納裝置(130),所述載體容納裝置(130)包括: A carrier accommodating device (130) for accommodating a carrier (190) for mounting a shellless wafer (282), the carrier accommodating device (130) includes: 基體(140); Base body (140); 構造在所述基體(140)中的氣動系統(444); A pneumatic system (444) constructed in the base body (140); 轉接元件(150),其具有第一側(451)以及與所述第一側(451)相對的第二側(452),其中, The adapter element (150) has a first side (451) and a second side (452) opposite to the first side (451), wherein, 所述第一側(451)以能脫離的方式附接至所述基體(140)的表面(142),並且 The first side (451) is detachably attached to the surface (142) of the base body (140), and 所述第二側(452)構造成使得待貼裝的載體(190)能貼附至所述轉接元件(150); The second side (452) is configured so that the carrier (190) to be mounted can be attached to the adapter element (150); 氣動連接結構(454),其構造在所述轉接元件(150)中並從所述第一側(451)貫穿所述轉接元件(150)延伸到所述第二側(452),其中, A pneumatic connection structure (454), which is constructed in the adapter element (150) and extends from the first side (451) through the adapter element (150) to the second side (452), wherein , 所述氣動系統(444)和所述氣動連接結構(454)構造成使得負壓能施加於所述載體(190)的表面。 The pneumatic system (444) and the pneumatic connection structure (454) are configured such that negative pressure can be applied to the surface of the carrier (190). 如申請專利範圍第1項所述之載體容納裝置(130), The carrier containing device (130) described in item 1 of the scope of patent application, 其中,所述基體(140)包括具有第一熱膨脹係數的第一材料,並且所述轉接元件(150)包括具有第二熱膨脹係數的第二材料, Wherein, the base body (140) includes a first material having a first thermal expansion coefficient, and the adapter element (150) includes a second material having a second thermal expansion coefficient, 其中,所述第二熱膨脹係數大於所述第一熱膨脹係數。 Wherein, the second thermal expansion coefficient is greater than the first thermal expansion coefficient. 如申請專利範圍第2項所述之載體容納裝置(130), The carrier containing device (130) described in item 2 of the scope of patent application, 其中,所述第一材料是恆範鋼,特別是超恆範鋼。 Wherein, the first material is Hengfan steel, especially super Hengfan steel. 如前述申請專利範圍中任一項所述之載體容納裝置(130), The carrier accommodating device (130) described in any one of the aforementioned patent applications, 其中,所述轉接元件是板(150),其中構造有所述氣動連接結構(454)。 Wherein, the adapter element is a plate (150) in which the pneumatic connection structure (454) is constructed. 如前述申請專利範圍中任一項所述之載體容納裝置(130), The carrier accommodating device (130) described in any one of the aforementioned patent applications, 其中,所述基體(140)的表面(142)具有矩形形狀,並且/或者 Wherein, the surface (142) of the base body (140) has a rectangular shape, and/or 其中,所述轉接元件(150)的至少第二側(452)具有圓形形狀。 Wherein, at least the second side (452) of the adapter element (150) has a circular shape. 如申請專利範圍第1至5項中任一項所述之載體容納裝置(130),進一步包括: The carrier accommodating device (130) according to any one of items 1 to 5 in the scope of the patent application further includes: 多個緊固元件(456),特別是螺絲(456),用於使得所述轉接元件(150)以能脫離的方式緊固至所述基體(140)。 A plurality of fastening elements (456), especially screws (456), are used to fasten the adapter element (150) to the base body (140) in a detachable manner. 如申請專利範圍第1至5項中任一項所述之載體容納裝置(530),進一步包括: The carrier accommodating device (530) described in any one of items 1 to 5 in the scope of the patent application further includes: 佈置或構造在所述基體(140)與所述轉接元件(150)之間的三個支承元件(557), Three supporting elements (557) arranged or constructed between the base body (140) and the adapter element (150), 其中,特別是所述支承元件(557)均實現為支座式支承元件。 Among them, in particular, the supporting elements (557) are all realized as pedestal supporting elements. 如申請專利範圍第7項所述之載體容納裝置(530), The carrier containing device (530) described in item 7 of the scope of patent application, 其中,所述三個支承元件(557)構造成使得所述轉接元件(150)靜定地貼附至所述基體(140)。 Wherein, the three supporting elements (557) are configured such that the adapter element (150) is statically attached to the base body (140). 如前述申請專利範圍中任一項所述之載體容納裝置(130), The carrier accommodating device (130) described in any one of the aforementioned patent applications, 其中,所述轉接元件(150)包括至少兩個第一標記(158),它們在光學上能識別並且特別是附接或構造在所述轉接元件(150)上設置用於容納所述載體(190)的空間區域之外。 Wherein, the adapter element (150) includes at least two first marks (158), which are optically recognizable and are especially attached or configured on the adapter element (150) to accommodate the The carrier (190) is outside the space area. 如前述申請專利範圍中任一項所述之載體容納裝置(130), The carrier accommodating device (130) described in any one of the aforementioned patent applications, 其中,所述基體(140)包括至少兩個第二標記(148),它們在光學上能識別並且特別是附接或構造在所述基體(140)上設置用於容納所述轉接元件(150)的空間區域之外。 Wherein, the base (140) includes at least two second marks (148), which are optically recognizable and are especially attached or configured on the base (140) to accommodate the adapter element ( 150) outside the space area. 一種用於容納待貼裝無殼晶片(282)的不同載體(190)之系統,所述系統包括: A system for accommodating different carriers (190) of a shellless chip (282) to be mounted, the system comprising: 如前述申請專利範圍中任一項所述之載體容納裝置(130); The carrier containing device (130) as described in any one of the aforementioned patent applications; 另外的轉接元件,其具有另外的第一側以及與所述另外的第一側相對的另外的第二側,其中,所述另外的第一側以能脫離的方式附接至所述基體的表面,並且所述另外的第二側構造成使得另外的待貼裝的載體能貼附至所述另外的轉接元件;以及 An additional adapter element having an additional first side and an additional second side opposite to the additional first side, wherein the additional first side is detachably attached to the base body And the other second side is configured so that another carrier to be mounted can be attached to the other adapter element; and 另外的氣動連接結構,其構造在所述另外的轉接元件中並從所述另外的第一側貫穿所述另外的轉接元件延伸到所述另外的第二側, Another pneumatic connection structure, which is constructed in the other adapter element and extends from the other first side through the other adapter element to the other second side, 其中,所述另外的氣動系統和所述氣動連接結構構造成能對所述另外的載體的表面或下表面施加負壓。 Wherein, the other pneumatic system and the pneumatic connection structure are configured to be able to apply negative pressure to the surface or the lower surface of the other carrier. 一種貼裝機(100),用於將無殼晶片(282)貼裝到載體(190),特別是用於製造均具有至少一個封殼內晶片的電子元件,所述封殼特別是具有完全硬化的灌封料,所述貼裝機包括: A placement machine (100) for attaching a shellless wafer (282) to a carrier (190), especially for manufacturing electronic components each having at least one chip in the package, the package in particular having a fully hardened The potting material, the placement machine includes: 供給裝置(160),用於提供具有多個晶片(282)的晶片(180); A supply device (160) for supplying a wafer (180) with a plurality of wafers (282); 如申請專利範圍第1至10項中任一項所述之載體容納裝置(130),用於容納待貼裝的載體(190);以及 The carrier accommodating device (130) described in any one of items 1 to 10 in the scope of the patent application is used for accommodating the carrier (190) to be mounted; and 貼裝頭(120),用於從所提供的晶片(180)中拾取晶片(282)並將所拾取的晶片(282)放置在所述載體(190)上的預定貼裝位置。 The placement head (120) is used to pick up the wafer (282) from the provided wafers (180) and place the picked up wafer (282) on the predetermined placement position on the carrier (190). 一種用於使用貼裝機(100)的方法,係為使用如申請專利範圍第12項所述之貼裝機(100)將無殼晶片(282)貼裝到載體(190)的方法,所述方法包括: A method for using the placement machine (100) is a method of using the placement machine (100) as described in item 12 of the scope of patent application to mount the shellless wafer (282) to the carrier (190), the method include: 借助供給裝置(160),提供具有多個晶片(282)的晶片(180); Provide a wafer (180) with a plurality of wafers (282) by means of the supply device (160); 借助如申請專利範圍第1至10項中任一項所述之載體容納裝置(130),容納待貼裝的載體; With the aid of the carrier accommodating device (130) described in any one of items 1 to 10 in the scope of the patent application, the carrier to be mounted is accommodated; 借助負壓,將所述待貼裝的載體(190)固定至所述載體容納裝置(130)上,所述負壓經由所述基體(140)中的氣動系統(444)和所述轉接元件(150)中的氣動連接結構(454)施加於所述載體(190)的表面; The carrier (190) to be mounted is fixed to the carrier accommodating device (130) by means of negative pressure, and the negative pressure passes through the pneumatic system (444) in the base body (140) and the adapter The pneumatic connection structure (454) in the element (150) is applied to the surface of the carrier (190); 借助貼裝頭(120),從所述供給裝置(160)拾取所提供的晶片(282); Pick up the provided wafer (282) from the supply device (160) by means of the placement head (120); 將所拾取的晶片(282)傳送到貼裝區域;以及 Transfer the picked wafer (282) to the placement area; and 將所傳送的晶片(282)放置在所述載體(190)上的預定貼裝位置。 The transferred wafer (282) is placed at a predetermined mounting position on the carrier (190).
TW108138510A 2018-11-26 2019-10-25 Carrier accommodating device, its system, placement machine and method of using placement machine TWI734230B (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE102018129805.6 2018-11-26
DE102018129805.6A DE102018129805B3 (en) 2018-11-26 2018-11-26 Receiving a carrier to be equipped with a carrier receiving device comprising a base body and an adapter element as well as a system and placement machine having these and method for equipping a carrier

Publications (2)

Publication Number Publication Date
TW202022971A true TW202022971A (en) 2020-06-16
TWI734230B TWI734230B (en) 2021-07-21

Family

ID=69320710

Family Applications (1)

Application Number Title Priority Date Filing Date
TW108138510A TWI734230B (en) 2018-11-26 2019-10-25 Carrier accommodating device, its system, placement machine and method of using placement machine

Country Status (4)

Country Link
JP (1) JP6916259B2 (en)
CN (1) CN111223783B (en)
DE (1) DE102018129805B3 (en)
TW (1) TWI734230B (en)

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0697215A (en) * 1992-09-11 1994-04-08 Hitachi Ltd Small article group attached adhesion sheet and method for picking up small article using thereof
KR960032667A (en) * 1995-02-28 1996-09-17 김광호 Lead frame transfer method
KR100245794B1 (en) * 1997-09-22 2000-03-02 윤종용 Lead frame transfer device and wire bonding apparatus comprising such a device
KR100629764B1 (en) * 2002-10-25 2006-09-28 마쯔시다덴기산교 가부시키가이샤 Semiconductor device and resin binder for assembling semiconductor device
JP3767548B2 (en) * 2002-12-09 2006-04-19 松下電器産業株式会社 Substrate holding jig for electronic component mounting equipment
KR100479650B1 (en) * 2003-04-10 2005-04-07 주식회사 다윈 A wafer with alternation design form and the semiconductor package manufacturing method therefor
US7300857B2 (en) * 2004-09-02 2007-11-27 Micron Technology, Inc. Through-wafer interconnects for photoimager and memory wafers
US8247269B1 (en) * 2011-06-29 2012-08-21 Fairchild Semiconductor Corporation Wafer level embedded and stacked die power system-in-package packages
DE102015100863B4 (en) * 2015-01-21 2022-03-03 Infineon Technologies Ag Method of handling a product substrate and a bonded substrate system
DE102015101759B3 (en) * 2015-02-06 2016-07-07 Asm Assembly Systems Gmbh & Co. Kg Picking machine and method for loading a carrier with unhoused chips
DE102015112518B3 (en) * 2015-07-30 2016-12-01 Asm Assembly Systems Gmbh & Co. Kg Picking machine and method for loading a carrier with unhoused chips
DE102016123362B3 (en) * 2016-12-02 2018-03-08 Asm Assembly Systems Gmbh & Co. Kg Picking machine with a displacement device for moving a receiving device for a carrier with Bestückmedium and a method for loading
CN107624037B (en) * 2017-09-01 2020-08-28 捷开通讯(深圳)有限公司 Fixing jig

Also Published As

Publication number Publication date
CN111223783A (en) 2020-06-02
JP2020088396A (en) 2020-06-04
JP6916259B2 (en) 2021-08-11
DE102018129805B3 (en) 2020-02-20
CN111223783B (en) 2024-02-02
TWI734230B (en) 2021-07-21

Similar Documents

Publication Publication Date Title
KR101868781B1 (en) Placement machine and method for equipping a substrate with unhoused chips
US4941255A (en) Method for precision multichip assembly
TWI673803B (en) Mounting device and mounting method for electronic parts, and manufacturing method of package parts
CN108198776B (en) Assembly machine for a mobile device with a mobile carrier receptacle
TWI771536B (en) Use of placeable marker components for a staged placement of components on a carrier
JP2019145742A (en) Contact accuracy assurance method, contact accuracy assurance mechanism, and inspection device
US20230148420A1 (en) Die attach systems, and methods for integrated accuracy verification and calibration using such systems
US20120126844A1 (en) Chip stack device testing method, chip stack device rearranging unit, and chip stack device testing apparatus
JP7102305B2 (en) Manufacturing method of die bonding equipment and semiconductor equipment
CN100546000C (en) Wireless substrate-like sensor
TW202137363A (en) Pressing module and device handler having the same
TWI734230B (en) Carrier accommodating device, its system, placement machine and method of using placement machine
CN105870038B (en) Assembly machine and method for assembling a shell-less chip to a carrier
JP7465197B2 (en) Element mounting equipment
JP2007333697A (en) Method of calibrating electronic component test apparatus
JP2019165059A (en) Die bonding apparatus and semiconductor device manufacturing method
JP2021027171A (en) Die bonding apparatus and manufacturing method for semiconductor device
JP2007111825A (en) Sticking device and method for manufacturing inkjet head by using the device
KR20230103832A (en) Die bonding equipment and driving deviation correcting method thereof
JP2022087927A (en) Component crimping device and component crimping method
JPH04307951A (en) Testing of semiconductor device
JPH04307949A (en) Testing