TW202014717A - Floating type capacitor detection device and detection method thereof for performing a high voltage test by directly using air as insulation to comprehensively detect the quality characteristics of the tested capacitor - Google Patents
Floating type capacitor detection device and detection method thereof for performing a high voltage test by directly using air as insulation to comprehensively detect the quality characteristics of the tested capacitor Download PDFInfo
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本發明係關於一種浮接式電容檢測設備及其檢測方法,尤指一種適用於對電容器施予高電壓測試之浮接式電容檢測設備及其檢測方法。 The invention relates to a floating capacitor detection device and a detection method thereof, in particular to a floating capacitor detection device and a detection method suitable for applying a high voltage test to a capacitor.
隨著電子裝置的技術不斷推陳出新,且尺寸不斷地愈趨輕薄短小,其中積層電容器的應用及需求亦不斷地攀升。 As the technology of electronic devices continues to evolve, and the size continues to become lighter, thinner and shorter, the application and demand of multilayer capacitors are also rising.
然而,目前一般習知檢測設備於進行高壓測試時大多係採轉盤式檢測,其不僅受限於1000伏特以下之工作電壓測試,且經一段時間測試後,受測積層電容器難免會殘留金屬餘屑於轉盤凹槽內,而當累積至一定的量時,有可能形成短路,而極可能影響檢測之準確度,甚至造成受測電容及檢測設備之損毀。此外,一般習知檢測設備無法即時切換檢測電容之各項參數,亦即無法以全面性地檢測積層電容器之各項特性參數。 However, at present, most of the conventional testing equipments adopt rotary disk testing when performing high-voltage testing, which is not only limited to the working voltage test below 1000 volts, and after a period of testing, the multilayer capacitor under test will inevitably leave metal residues In the groove of the turntable, when accumulated to a certain amount, a short circuit may be formed, which may affect the accuracy of the detection, and even cause damage to the tested capacitor and the detection equipment. In addition, the conventional detection equipment cannot switch the parameters of the detection capacitor in real time, that is, it cannot comprehensively detect the characteristic parameters of the multilayer capacitor.
因此,發明人發展出一種浮接式電容檢測設備及其檢測方法,能夠以浮接懸空的檢測機制來對積層電容器進行檢測,並提供檢測工作條件的切換機制,以有效地檢測積層電容器之各項特性參數。 Therefore, the inventor has developed a floating type capacitance detection device and a detection method thereof, which can detect the multilayer capacitor with a floating floating detection mechanism and provide a switching mechanism for detecting the working conditions to effectively detect each of the multilayer capacitors Item characteristic parameters.
本發明之主要目的係在提供一種浮接式電容檢測設備,俾能將受測電容予以懸空浮接的方式,即直接以空氣作為絕緣來進行高電壓測試,且提供可切換檢測工作條件之模組架構,以全面性且有效地檢測受測電容之品質特性。 The main purpose of the present invention is to provide a floating capacitor detection device, which can float the tested capacitor in a floating manner, that is, directly use air as an insulation to conduct high voltage testing, and provide a switchable detection working condition mode Group structure to comprehensively and effectively detect the quality characteristics of the capacitor under test.
為達成上述目的,本發明揭示一種浮接式電容檢測設備,用以檢測至少一受測電容,其中該設備包括一管理單元、一測試控制器、一第二量測模組、一端子模組及一切換模組,且測試控制器包括一處理單元及一第一量測模組。管理單元係用以儲存一預設檢測程式及至少一檢測參數值。測試控制器係電性連接管理單元並取得預設檢測程式及至少一檢測參數值,第一量測模組係用以量測至少一受測電容之第一特性參數。第二量測模組係電性連接至處理單元,並且用以量測至少一受測電容之第二特性參數。切換模組係電性連接測試控制器及第二量測模組。端子模組係電性連接切換模組,且端子模組包括一驅動部、一第一端子及一第二端子。其中,處理單元控制端子模組之驅動部以驅使第一端子與第二端子同時趨近並電性接觸至少一受測電容;處理單元係根據預設檢測程式控制切換模組,以切換第一端子及第二端子電性耦接至第一量測模組及第二量測模組中至少一者,進而檢測至少一受測電容之第一特性參數或第二特性參數中至少一者;處理單元控制端子模組之驅動部以驅使第一端子與第二端子同時遠離至少一受測電容並脫離電性接觸。 To achieve the above object, the present invention discloses a floating capacitor detection device for detecting at least one capacitor under test, wherein the device includes a management unit, a test controller, a second measurement module, and a terminal module And a switching module, and the test controller includes a processing unit and a first measurement module. The management unit is used to store a preset detection program and at least one detection parameter value. The test controller is electrically connected to the management unit and obtains a preset detection program and at least one detection parameter value. The first measurement module is used to measure the first characteristic parameter of at least one tested capacitor. The second measurement module is electrically connected to the processing unit and is used to measure the second characteristic parameter of at least one measured capacitance. The switching module is electrically connected to the test controller and the second measurement module. The terminal module is electrically connected to the switching module, and the terminal module includes a driving part, a first terminal and a second terminal. Wherein, the processing unit controls the driving part of the terminal module to drive the first terminal and the second terminal to simultaneously approach and electrically contact at least one tested capacitor; the processing unit controls the switching module according to a preset detection program to switch the first The terminal and the second terminal are electrically coupled to at least one of the first measurement module and the second measurement module, and then detect at least one of the first characteristic parameter or the second characteristic parameter of at least one measured capacitance; The processing unit controls the driving part of the terminal module to drive the first terminal and the second terminal to move away from the at least one tested capacitor at the same time and get out of electrical contact.
本發明之另一目的係在提供一種浮接式電容檢測方法,俾能將受測電容採懸空浮接的方式,即直接以空氣作為絕緣來進行高電壓測試步驟,且提供可切換檢測工作條件之測試模式,以全面性且有效地檢測受測電容之品質特性。 Another object of the present invention is to provide a floating capacitor detection method, so that the capacitor under test can be floated in a floating manner, that is, directly use air as an insulation to perform high voltage test steps, and provide switchable detection working conditions The test mode can comprehensively and effectively detect the quality characteristics of the capacitor under test.
為達成上述目的,本發明一種浮接式電容檢測方法,其主要適用於一電容檢測設備,設備包括一管理單元、一測試控制器、一第二量測模組、一端子模組及一切換模組,測試控制器包括一第一量測模組,端子模組包括複數端子;方法包括以下步驟:(A)藉由管理單元編寫一預設檢測程式;(B)測試控制器自管理單元取得預設檢測程式;(C)測試控制器控制端子模組之複數端子同時趨近並電性接觸一受測電容;(D)測試控制器根據預設檢測程式控制切換模組,以切換複數端子電性耦接至測試控制器之第一量測模組及第二量測模組中至少一者,進而檢測受測電容之一第一特性參數及一第二特性參數中至少一者;以及(E)測試控制器控制端子模組之複數端子同時遠離受測電容並脫離電性接觸。 In order to achieve the above object, the present invention provides a floating capacitance detection method, which is mainly applicable to a capacitance detection device, which includes a management unit, a test controller, a second measurement module, a terminal module and a switch Module, the test controller includes a first measurement module, and the terminal module includes a plurality of terminals; the method includes the following steps: (A) writing a preset detection program by the management unit; (B) testing the controller from the management unit Obtain the preset test program; (C) The multiple terminals of the control terminal module of the test controller simultaneously approach and electrically contact a tested capacitor; (D) The test controller controls the switching module according to the preset test program to switch the complex number The terminal is electrically coupled to at least one of the first measurement module and the second measurement module of the test controller, and further detects at least one of a first characteristic parameter and a second characteristic parameter of the capacitor under test; And (E) The plural terminals of the control terminal module of the test controller are at the same time far away from the tested capacitor and are out of electrical contact.
100‧‧‧浮接式電容檢測設備 100‧‧‧Floating type capacitance testing equipment
1‧‧‧管理單元 1‧‧‧ management unit
2‧‧‧測試控制器 2‧‧‧Test controller
20‧‧‧處理單元 20‧‧‧ processing unit
21‧‧‧第一量測模組 21‧‧‧ First measurement module
22‧‧‧第二量測模組 22‧‧‧Second measurement module
3‧‧‧端子模組 3‧‧‧terminal module
30‧‧‧驅動部 30‧‧‧Drive
31‧‧‧第一端子 31‧‧‧ First terminal
32‧‧‧第二端子 32‧‧‧Second terminal
33‧‧‧驅動馬達 33‧‧‧ drive motor
34‧‧‧傳動軸 34‧‧‧ drive shaft
251‧‧‧第一斜槽 251‧‧‧The first chute
352‧‧‧第二斜槽 352‧‧‧Second chute
361a‧‧‧第一導引臂 361a‧‧‧First guide arm
361b‧‧‧第一滑座 361b‧‧‧First Slide
362a‧‧‧第二導引臂 362a‧‧‧Second guide arm
362b‧‧‧第二滑座 362b‧‧‧Second Slide
37‧‧‧負壓吸嘴 37‧‧‧Negative pressure nozzle
38‧‧‧基台 38‧‧‧Abutment
S1a、S1b、S2a、S2b‧‧‧節點 S1a, S1b, S2a, S2b ‧‧‧ node
4‧‧‧切換模組 4‧‧‧Switch module
41‧‧‧第一切換單元 41‧‧‧ First switching unit
42‧‧‧第二切換單元 42‧‧‧Second switching unit
5‧‧‧分料模組 5‧‧‧ Feeding module
200‧‧‧方法 200‧‧‧Method
(A)-(F)‧‧‧步驟 (A)-(F)‧‧‧Step
Ps‧‧‧預設檢測程式 Ps‧‧‧default detection program
Pt‧‧‧檢測參數值 Pt‧‧‧Detection parameter value
C‧‧‧受測電容 C‧‧‧ capacitance under test
圖1係繪示本發明一較佳實施例之浮接式電容檢測設備的功能方塊圖。 FIG. 1 is a functional block diagram of a floating capacitor detection device according to a preferred embodiment of the present invention.
圖2A與圖2B係分別繪示本發明一較佳實施例之端子模組的上視圖與側視圖。 2A and 2B are respectively a top view and a side view of a terminal module according to a preferred embodiment of the present invention.
圖2C係繪示本發明一較佳實施例之端子模組中的驅動轉軸、第一斜槽與第二斜槽的示意圖。 FIG. 2C is a schematic diagram showing the driving shaft, the first chute and the second chute in the terminal module according to a preferred embodiment of the present invention.
圖3係繪示本發明一較佳實施例之切換模組、端子模組、第一量測模組與第二量測模組的功能示意圖。 FIG. 3 is a functional schematic diagram of a switching module, a terminal module, a first measurement module, and a second measurement module according to a preferred embodiment of the present invention.
圖4係繪示本發明一較佳實施例之浮接式電容檢測方法的步驟流程圖。 FIG. 4 is a flowchart showing the steps of a floating capacitor detection method according to a preferred embodiment of the present invention.
本發明浮接式電容檢測設備及其檢測方法在本實施例中被詳細描述之前,要特別注意的是,以下的說明中,類似的元件將以相同的元件符號來表示。再者,本發明之圖式僅作為示意說明,其未必按比例繪製,且所有細節也未必全部呈現於圖式中。 Before the floating capacitance detection device and detection method of the present invention are described in detail in this embodiment, it should be particularly noted that in the following description, similar elements will be denoted by the same element symbols. Furthermore, the drawings of the present invention are only for illustrative purposes, they are not necessarily drawn to scale, and all the details are not necessarily presented in the drawings.
請參照圖1,其繪示本發明一較佳實施例之浮接式電容檢測設備100的功能方塊圖。如圖所示,一種浮接式電容檢測設備100,用以檢測至少一受測電容C(未繪示於圖1中,請詳見圖2A及圖2B),其包括一管理單元1及一測試控制器2。然而,管理單元1可為個人桌上型電腦或筆記型電腦,用以提供使用者預先儲存一可具有檢測操作流程及檢測工作電壓與電流參數值之預設檢測程式Ps,以及亦可預先儲存至少一檢測參數值Pt,例如:可用以篩選分類受測電容C之品質特性優劣的比對參數表。
Please refer to FIG. 1, which illustrates a functional block diagram of a floating
其次,測試控制器2則是電性連接管理單元1,並且可自管理單元1取得預設檢測程式Ps及檢測參數值Pt。測試控制器2包括一處理單元20及一第一量測
模組21,其中處理單元20可依據預設檢測程式,進而在第一檢測條件下提供對應的第一工作電壓與電流,以量測受測電容C之第一特性參數,其中於本實施例中,第一特性參數係包括漏電流值(IL)與絕緣阻抗(IR),其中漏電流值(IL)的範圍從0.1nA~1mA,絕緣阻抗(IR)的範圍從10KΩ~200TΩ。
Secondly, the
請繼續參照圖1,浮接式電容檢測設備100亦包括第二量測模組22。第二量測模組22係電性連接至測試控制器2中之處理單元20,且透過處理單元20根據預設檢測程式從而在第二檢測條件下提供對應的第二工作電壓與電流,以量測受測電容C之第二特性參數,其中於本實施例中,第二特性參數係包括靜電容量值(C值)與介電材質衰減係數(D值)。其中,第一檢測條件與第二檢測條件下所分別提供的第一與第二工作電壓可從10伏特至10000伏特,然本實施例所採用的測試條件皆加載高電壓。
Please continue to refer to FIG. 1, the floating
然而,當完成檢測流程後,處理單元20即可將針對受測電容C檢測所獲得之第一特性參數及第二特性參數,予以傳送至管理單元1,接著再對另一個受測電容C進行檢測。此外,處理單元20除了可將檢測數據逐筆傳送至管理單元1之外,處理單元20亦可根據實際檢測需求而採取批量傳送至管理單元1。
However, after the detection process is completed, the
同時,測試控制器2中之處理單元20亦可將所檢測出之第一特性參數及第二特性參數等檢測數據,與預先儲存的檢測參數值Pt分析比較,從而可即時對受
測電容C進行特性品質的評比判定,並對應產生一品質參數。如此一來,與測試控制器2電性連接之分料模組5,即可根據品質參數將受測電容C予以進行分類集中。
At the same time, the
另外,浮接式電容檢測設備100更包括一端子模組3。端子模組3係電性連接至測試控制器2,且端子模組3包括一驅動部30、一第一端子31及一第二端子32。藉此,測試控制器2中之處理單元20將可依據預設檢測程式Ps,予以控制端子模組3之驅動部30以驅使第一端子31與第二端子32同時趨近或同時遠離受測電容C,以決定其與受測電容C電性接觸或脫離電性接觸。
In addition, the floating
更具體地,請同步參照圖2A至圖2C,其中圖2A與圖2B係繪示本發明一較佳實施例之端子模組的上視圖與側視圖,而圖2C係繪示本發明一較佳實施例之端子模組中的驅動轉軸、第一斜槽與第二斜槽的示意圖。如圖所述,端子模組3中之驅動部30係包括一驅動馬達33及一傳動軸34,而傳動軸34係連接至驅動馬達33。此外,傳動軸34之兩端係分別設置彼此反向一第一斜槽351與一第二斜槽352,其中第一斜槽351與一第二斜槽352之槽軌延伸方向係分別一特定角度(例如:30度至60度)而與傳動軸34之中心軸線而構成相互傾斜。
More specifically, please refer to FIGS. 2A to 2C synchronously, wherein FIGS. 2A and 2B are a top view and a side view of a terminal module according to a preferred embodiment of the present invention, and FIG. 2C is a comparison of the present invention. The schematic diagram of the driving shaft, the first chute and the second chute in the terminal module of the preferred embodiment. As shown in the figure, the driving
再者,本實施例之端子模組包括一基台38、一第一滑座361b及一第二滑座362b、一第一導引臂361a及一第二導引臂362a;第一滑座361b和第二滑座362b係利用導軌與導槽之方式滑設於基台38上,而第一端子
31及第二端子32分別組設於第一滑座361b和第二滑座362b,且彼此相向配置。另外,本實施例之驅動部30亦組設於基台38。
Furthermore, the terminal module of this embodiment includes a
此外,第一導引臂361a及第二導引臂362a之一端分別連接至第一滑座361b和第二滑座362b,另一端則分別滑設於第一斜槽351與第二斜槽352。據此,當驅動馬達33驅動傳動軸34沿一第一轉動方向轉動時,第一斜槽351與第二斜槽352分別藉由第一導引臂361a及第二導引臂362a帶動第一滑座361b和第二滑座362b朝彼此趨近,並同步電性接觸由一負壓吸嘴37所吸附之受測電容C,而得以開啟測試。另一方面,當驅動馬達33驅動傳動軸34沿一第二轉動方向轉動時,第一斜槽351與該第二斜槽352分別藉由第一導引臂361a及第二導引臂362a帶動第一滑座361b和第二滑座362b朝彼此遠離該受測電容C。
In addition, one ends of the
請繼續同步參照圖1及圖3,其中圖3係繪示本發明一較佳實施例之切換模組、端子模組、第一量測模組與第二量測模組的功能示意圖。如圖所示,浮接式電容檢測設備100包括一切換模組4,且切換模組4係電性連接測試控制器2、第二量測模組22及端子模組3。藉此,測試控制器2中之處理單元20將可根據預設檢測程式控制切換模組4,以切換第一端子31及第二端子32依序電性耦接至第一量測模組21及第二量測模組22,進而分別於第一測檢條件與第二檢測條件下檢測出受測電容C之第一特性參數或第二特性參數。
Please continue to refer to FIG. 1 and FIG. 3 synchronously, wherein FIG. 3 is a schematic diagram illustrating the switching module, the terminal module, the first measurement module, and the second measurement module of a preferred embodiment of the present invention. As shown in the figure, the floating
更進一步地說,於本實施例中,切換模組4包括第一切換單元41及第二切換單元42。其中,當處理單元20根據預設檢測程式來控制切換模組4切換檢測第一特性參數時,第一切換單元41將切換至節點S1a,且第二切換單元42亦切換至節點S1b,以建立數據傳輸連線通道於第一量測模組21與端子模組3之間,亦即使第一端子31及第二端子32可電性耦接第一量測模組21,並將所獲致之檢測數據(例如:漏電流值(IL)與絕緣阻抗(IR))傳輸至第一量測模組21。
Furthermore, in this embodiment, the
相對地,當處理單元20根據預設檢測程式來控制切換模組4切換檢測第二特性參數時,第一切換單元41將切換至節點S2a,且第二切換單元42亦切換至節點S2b,以建立數據傳輸連線通道於第二量測模組22與端子模組3之間,亦即第一端子31及第二端子32可電性耦接第二量測模組22,並將所獲致之檢測數據(例如:靜電容量值(C值)與介電材質衰減係數(D值))傳輸至第二量測模組22。
In contrast, when the
請參照圖4,其係繪示本發明一較佳實施例之浮接式電容檢測方法200的步驟流程圖。如圖所示,一種浮接式電容檢測方法200,其主要適用於上述實施例中之浮接式電容檢測設備100及其構成主要元件,包括管理單元1、測試控制器2、第二量測模組22、端子模組3及切換模組4,且測試控制器2包括第一量測模組21,而端子模組3包括第一端子31與第二端子32。
Please refer to FIG. 4, which is a flowchart illustrating the steps of the floating
首先,方法200於編寫設定步驟(A)中,係提供使用者藉由管理單元1編寫一預設檢測程式及設定一至少一檢測參數值。接著,方法200於擷取步驟(B)中,致使測試控制器2自管理單元1中擷取預設檢測程式及檢測參數值,以進行檢測前置作業。
First, the
再者,方法200於趨近接觸步驟(C)中,使測試控制器2控制端子模組3之第一端子31與第二端子32同時趨近至由負壓吸嘴37所吸附之受測電容C的兩側,進而使第一端子31與第二端子32產生電性接觸。其次,方法200於參數檢測步驟(D)中,首先進行凱文(Kelvin)測試或稱四線(4-wire)測試,亦即透過接觸測試來檢測第一端子31與第二端子32是否與受測電容C的電極端面完整接觸而構成導通,可充分避免因接觸不良所導致之測試失效。
Furthermore, in the approaching contacting step (C), the
再者,使測試控制器2根據預設檢測程式控制切換模組4,透過調節其第一切換單元41與第二切換單元42之檢測數據傳輸路徑,予以將第一端子31與第二端子32兩者同時依序切換電性耦接至測試控制器2之第一量測模組21及第二量測模組22,進而分別在第一檢測條件與第二檢測條件下,進行檢測受測電容C之一第一特性參數及一第二特性參數。
Furthermore, the
然而,當完成檢測受測電容C的第一特性參數及第二特性參數之後,方法200則進行脫離步驟(E),亦即使測試控制器2控制端子模組3,以驅使第一端子31與第二端子32同時自受測電容C兩側遠離,且負壓吸嘴27透過解除負壓而釋放受測電容C。
However, after the detection of the first characteristic parameter and the second characteristic parameter of the tested capacitor C is completed, the
另外,方法200可更包括品質判定步驟(F),其係依據將於前述參數檢測步驟(D)中所檢測出之第一特性參數及第二特性參數與前述編寫設定步驟(A)中所預先設定之檢測參數值,與以分析比較以對應產生一品質參數,進而據以分類集中。此外,方法200於品質判定步驟(F)中,同時亦可驅使測試控制器2將第一特性參數及第二特性參數,傳送至管理單元1。
In addition, the
上述實施例僅係為了方便說明而舉例而已,本發明所主張之權利範圍自應以申請專利範圍所述為準,而非僅限於上述實施例。 The above embodiments are only examples for the convenience of description, and the scope of rights claimed by the present invention should be subject to the scope of the patent application, and not limited to the above embodiments.
100‧‧‧浮接式電容檢測設備 100‧‧‧Floating type capacitance testing equipment
1‧‧‧管理單元 1‧‧‧ management unit
2‧‧‧測試控制器 2‧‧‧Test controller
20‧‧‧處理單元 20‧‧‧ processing unit
21‧‧‧第一量測模組 21‧‧‧ First measurement module
22‧‧‧第二量測模組 22‧‧‧Second measurement module
3‧‧‧端子模組 3‧‧‧terminal module
30‧‧‧驅動部 30‧‧‧Drive
31‧‧‧第一端子 31‧‧‧ First terminal
32‧‧‧第二端子 32‧‧‧Second terminal
4‧‧‧切換模組 4‧‧‧Switch module
5‧‧‧分料模組 5‧‧‧ Feeding module
Ps‧‧‧預設檢測程式 Ps‧‧‧default detection program
Pt‧‧‧檢測參數值 Pt‧‧‧Detection parameter value
Claims (10)
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