TW202012945A - An automatic measurement system for antenna radiation pattern - Google Patents

An automatic measurement system for antenna radiation pattern Download PDF

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TW202012945A
TW202012945A TW107133554A TW107133554A TW202012945A TW 202012945 A TW202012945 A TW 202012945A TW 107133554 A TW107133554 A TW 107133554A TW 107133554 A TW107133554 A TW 107133554A TW 202012945 A TW202012945 A TW 202012945A
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antenna
arm
radio frequency
joint
signal
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TW107133554A
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TWI676035B (en
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邱宗文
吳有文
宋芳燕
吳昇翰
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川升股份有限公司
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Abstract

An automatic measurement system for antenna radiation pattern comprises an anechoic chamber, a high directional antenna, a robotic arm unit and a control and measuring unit. The robot arm unit is disposed in the anechoic chamber and moves the high directivity antenna to move between a plurality of measurement points, and the measurement points are all located on a hemispherical surface of a predetermined radius. The control and measurement unit uses the high directivity antenna to measure a radiation gain of an AUT (antenna under test), and constructs a half spherical radiation pattern of the AUT by using a plurality of radiation gains.

Description

天線輻射場型自動量測系統 Antenna radiation field type automatic measuring system

本發明是關於一種量測系統,特別是一種可以自動化量測天線的半球面輻射場型的系統。 The invention relates to a measurement system, in particular to a system capable of automatically measuring the hemispherical radiation pattern of an antenna.

參閱圖1,先前技術的天線量測系統是在一電波暗室11中安裝一個高指向性天線12及一個旋轉基座13,再將一待測天線14放在該旋轉基座13上,該旋轉基座13具有繞著Z軸360度旋轉的功能,該高指向性天線12具有人工手動調整繞著X軸±90度旋轉的功能。該高指向性天線12與該待測天線14分別用來接收和發射一電磁波,並藉由該旋轉基座13連動該待測天線14繞著Z軸360度旋轉一圈而量得XY平面的二維輻射場型。 Referring to FIG. 1, the prior art antenna measurement system is to install a highly directional antenna 12 and a rotating base 13 in an anechoic chamber 11, and then place an antenna under test 14 on the rotating base 13, the rotation The base 13 has a function of rotating 360 degrees around the Z axis, and the highly directional antenna 12 has a function of manually adjusting the rotation about ±90 degrees around the X axis. The highly directional antenna 12 and the antenna under test 14 are respectively used to receive and transmit an electromagnetic wave, and the antenna under test 14 is rotated 360 degrees around the Z axis through the rotating base 13 to measure the XY plane. Two-dimensional radiation pattern.

這種先前技術的缺點在於:需人工手動調整該高指向性天線12及該待測天線14的擺放位置,每次(該旋轉基座13繞著Z軸360度旋轉一圈稱為一次)只能量得一個二維平面的輻射場型,若要用N個二維平面的輻射場型去建構一個三維的輻射場型就必須人工手動N次去調整該待測天線14的 傾斜角度,如此一來不但不精準且非常耗時。 The disadvantage of this prior art is that the position of the high directivity antenna 12 and the antenna under test 14 needs to be manually adjusted each time (the rotating base 13 rotates 360 degrees around the Z axis once is called once) Only one energy can get the radiation pattern of a two-dimensional plane. If you want to use N two-dimensional radiation patterns to construct a three-dimensional radiation pattern, you must manually adjust the tilt angle of the antenna 14 under test manually N times. This is not only inaccurate but also very time-consuming.

由於已知的天線開發系統有前述的問題,因此需要發展一種能自動化量測天線的半球面輻射場型的系統,以增進天線研發的效率。 Since the known antenna development system has the aforementioned problems, it is necessary to develop a system that can automatically measure the hemispherical radiation field type of the antenna to improve the efficiency of antenna research and development.

本發明天線輻射場型自動量測系統適用於量測一待測天線的半球面輻射場型,該待測天線包括一主輻射面,該第一較佳實施例包含一電波暗室、一高指向性天線、一機器手臂單元,及一控制及量測單元。 The antenna radiation field type automatic measurement system of the present invention is suitable for measuring the hemispherical radiation field type of an antenna to be tested. The antenna to be tested includes a main radiation surface. The first preferred embodiment includes an electric wave dark room and a high pointing Antenna, a robot arm unit, and a control and measurement unit.

該電波暗室包括一頂板,及相對於該頂板的一底板,該待測天線貼近該頂板設置,且該待測天線的主輻射面朝向該底板設置。 The anechoic chamber includes a top plate and a bottom plate relative to the top plate, the antenna to be tested is disposed close to the top plate, and the main radiation surface of the antenna to be tested is disposed toward the bottom plate.

該機器手臂單元設置在該電波暗室中,並包括一固定座及一活動臂,該固定座設置在該電波暗室的底板,該活動臂從該固定座延伸而出且具有一夾物臂部,該高指向性天線設置在該夾物臂部上並被該活動臂連動。 The robot arm unit is disposed in the radio wave dark room, and includes a fixed seat and a movable arm, the fixed seat is provided on the bottom plate of the radio wave dark room, the movable arm extends from the fixed seat and has a clip arm portion, The high directivity antenna is arranged on the arm part of the object and is interlocked by the movable arm.

該控制及量測單元電連接該待測天線、該高指向性天線及該機器手臂單元,並控制該機器手臂單元連動該高指向性天線在多個預設的量測點之間移動,且該等預設的量測點皆位於一預設半徑的半球面上,當該高指向性天線移動到每一個預設的量測點時,該控制及量測單元是透過該待測天線及該高指向性天線分別收發一電磁波去量測該待測天 線的一輻射增益,該控制及量測單元還利用該多數個分別對應該等量測點的輻射增益建構出該待測天線的一半球面輻射場型,並且,該半球面所界定出的一圓形開口是朝向該電波暗室的頂板及該待測天線,且該待測天線、該半球面的球心及該固定座於該底板的一法線方向上的投影相重疊。 The control and measurement unit is electrically connected to the antenna to be tested, the highly directional antenna and the robot arm unit, and controls the robot arm unit to move the highly directional antenna to move between a plurality of preset measurement points, and The preset measurement points are all located on a hemispherical surface of a preset radius. When the highly directional antenna moves to each preset measurement point, the control and measurement unit passes through the antenna to be measured and The highly directional antenna respectively transmits and receives an electromagnetic wave to measure a radiation gain of the antenna to be measured. The control and measurement unit also uses the plurality of radiation gains corresponding to the measurement points to construct half of the antenna to be tested. A spherical radiation field pattern, and a circular opening defined by the hemispherical surface is directed to the top plate of the anechoic chamber and the antenna to be tested, and the antenna to be tested, the spherical center of the hemispherical surface and the fixing seat are on the bottom plate The projections in a normal direction overlap.

較佳地,該電波暗室的頂板具有一開口,該電波暗室還包括一窗戶,該窗戶內面用以貼附該待測天線,當該窗戶打開時,該電波暗室的內外空間透過該開口連通,而當該窗戶關上時,該頂板的開口被該窗戶蓋住,該待測天線的主輻射面是朝向該電波暗室的底板。 Preferably, the top plate of the anechoic chamber has an opening, the anechoic chamber further includes a window, the inner surface of the window is used to attach the antenna under test, and when the window is opened, the inner and outer spaces of the anechoic chamber communicate through the opening , And when the window is closed, the opening of the top plate is covered by the window, and the main radiation surface of the antenna to be tested is toward the bottom plate of the anechoic chamber.

較佳地,該活動臂還包括一旋轉件、一第一臂部及一第二臂部。該旋轉件具有一旋轉端部及一關節,該旋轉端部套接於該固定座,該旋轉件具有相對於該固定座旋轉0度到360度的功能,且該旋轉件的軸心線及該半球面的球心共同位於該底板的法線方向上。該第一臂部具有一第一關節、一第二關節,及一連接該第一關節及該第二關節的臂桿,且該第一臂部的第一關節與該旋轉件的關節相連接,使得該第一臂部可以相對該旋轉件轉動。該第二臂部具有一第一關節、一第二關節,及一連接該第一關節及該第二關節的臂桿,且該第二臂部的第一關節與該第一臂部的第二關節相連接,使得該第二臂部可以相對該第一臂部轉動,該夾物臂部與該第二臂部的第二關節相連接,使得該夾物臂部可以相 對該第二臂部轉動。 Preferably, the movable arm further includes a rotating member, a first arm portion and a second arm portion. The rotating member has a rotating end and a joint, the rotating end is sleeved on the fixing base, the rotating member has a function of rotating from 0 to 360 degrees relative to the fixing base, and the axis of the rotating member and The spherical centers of the hemispherical surfaces are co-located in the normal direction of the bottom plate. The first arm has a first joint, a second joint, and an arm connecting the first joint and the second joint, and the first joint of the first arm is connected to the joint of the rotating member So that the first arm can rotate relative to the rotating member. The second arm has a first joint, a second joint, and an arm connecting the first joint and the second joint, and the first joint of the second arm and the first arm The two joints are connected so that the second arm can rotate relative to the first arm, and the clip arm is connected to the second joint of the second arm so that the clip arm can be opposed to the second arm部转。 Rotate.

較佳地,該控制及量測單元包括一射頻訊號產生器、一訊號饋入夾具、一頻譜分析儀及一電腦。該射頻訊號產生器輸出一預設大小的射頻輸出訊號。該訊號饋入夾具電連接該射頻訊號產生器以接收該射頻輸出訊號,且具有一探針及一攝像鏡頭,該攝像鏡頭朝向該探針設置以輔助觀測該探針的影像,該探針用以碰觸該待測天線以將該射頻輸出訊號傳遞到該待測天線,該待測天線接收該射頻輸出訊號並轉換成該電磁波,該高指向性天線接收該電磁波並轉換成一射頻接收訊號。該頻譜分析儀電連接該高指向性天線以接收該射頻接收訊號,並量測該射頻接收訊號的振幅。該電腦電連接該頻譜分析儀以得到該射頻接收訊號的振幅,並根據該射頻接收訊號的振幅、該高指向性天線的輻射增益、該半球面的半徑及該訊號饋入夾具的路徑損耗共同計算該高指向性天線位於該量測點時該待測天線的輻射增益,並建構該待測天線的半球面輻射場型。 Preferably, the control and measurement unit includes a radio frequency signal generator, a signal feeding fixture, a spectrum analyzer and a computer. The radio frequency signal generator outputs a radio frequency output signal of a preset size. The signal feeding fixture is electrically connected to the RF signal generator to receive the RF output signal, and has a probe and a camera lens, the camera lens is disposed toward the probe to assist in observing the image of the probe. Touching the antenna under test to transmit the RF output signal to the antenna under test, the antenna under test receives the RF output signal and converts it into the electromagnetic wave, and the highly directional antenna receives the electromagnetic wave and converts it into a RF receiving signal. The spectrum analyzer is electrically connected to the high directivity antenna to receive the radio frequency reception signal, and measures the amplitude of the radio frequency reception signal. The computer is electrically connected to the spectrum analyzer to obtain the amplitude of the RF received signal, and according to the amplitude of the RF received signal, the radiation gain of the highly directional antenna, the radius of the hemispherical surface and the path loss of the signal feeding fixture together Calculate the radiation gain of the antenna under test when the highly directional antenna is located at the measurement point, and construct the hemispherical radiation pattern of the antenna under test.

較佳地,該控制及量測單元包括一射頻訊號產生器、一訊號饋入夾具、一頻譜分析儀及一電腦。該射頻訊號產生器輸出一預設大小的射頻輸出訊號,該高指向性天線電連接該射頻訊號產生器以接收該射頻輸出訊號並轉換成該電磁波,該待測天線接收該電磁波並轉換成一射頻接收訊號。該訊號饋入夾具具有一探針及一攝像鏡頭,該攝像鏡頭 朝向該探針設置以輔助觀測該探針影像,該探針用以碰觸該待測天線以接收該射頻接收訊號。該頻譜分析儀電連接該訊號饋入夾具以接收該射頻接收訊號,並量測該射頻接收訊號的振幅。該電腦電連接該頻譜分析儀以得到該射頻接收訊號的振幅,並根據該射頻接收訊號的振幅、該高指向性天線的輻射增益、該半球面的半徑及該訊號饋入夾具的路徑損耗共同計算該高指向性天線位於該量測點時該待測天線的輻射增益,並建構該待測天線的半球面輻射場型。 Preferably, the control and measurement unit includes a radio frequency signal generator, a signal feeding fixture, a spectrum analyzer and a computer. The radio frequency signal generator outputs a radio frequency output signal of a predetermined size, the highly directional antenna is electrically connected to the radio frequency signal generator to receive the radio frequency output signal and convert it into the electromagnetic wave, and the antenna under test receives the electromagnetic wave and converts it into a radio frequency Receive the signal. The signal feeding fixture has a probe and a camera lens. The camera lens is disposed toward the probe to assist in observing the probe image. The probe is used to touch the antenna to be tested to receive the RF reception signal. The spectrum analyzer is electrically connected to the signal feeding fixture to receive the radio frequency reception signal, and measures the amplitude of the radio frequency reception signal. The computer is electrically connected to the spectrum analyzer to obtain the amplitude of the RF received signal, and according to the amplitude of the RF received signal, the radiation gain of the highly directional antenna, the radius of the hemispherical surface and the path loss of the signal feeding fixture together Calculate the radiation gain of the antenna under test when the highly directional antenna is located at the measurement point, and construct the hemispherical radiation pattern of the antenna under test.

本發明天線輻射場型自動量測系統適用於量測一待測天線的半球面輻射場型,該待測天線包括一主輻射面,該第二較佳實施例包含一電波暗室、一反射鏡、一高指向性天線、一機器手臂單元,及一控制及量測單元。 The antenna radiation field type automatic measuring system of the present invention is suitable for measuring the hemispherical radiation field type of an antenna to be tested. The antenna to be tested includes a main radiation surface. The second preferred embodiment includes an electric wave anechoic chamber and a reflector , A highly directional antenna, a robot arm unit, and a control and measurement unit.

該電波暗室包括一頂板,及相對於該頂板的一底板,該待測天線貼近該頂板設置,且該待測天線的主輻射面朝向該底板設置。 The anechoic chamber includes a top plate and a bottom plate relative to the top plate, the antenna to be tested is disposed close to the top plate, and the main radiation surface of the antenna to be tested is disposed toward the bottom plate.

該高指向性天線包括一主輻射面,該高指向性天線的輻射場型的一主波束是指向該反射鏡,該高指向性天線與該待測天線之間收發的一電磁波是入射該反射鏡並被反射。 The highly directional antenna includes a main radiating surface, a main beam of the radiation pattern of the highly directional antenna is directed to the reflector, and an electromagnetic wave transmitted and received between the highly directional antenna and the antenna under test is incident on the reflection Mirror and is reflected.

該機器手臂單元設置在該電波暗室中,並包括一固定座及一活動臂,該固定座設置在該電波暗室的底板,該活動臂從該固定座延伸而出且具有一夾物臂部,該夾物臂 部具有一第一端及一第二端,該反射鏡設置在該夾物臂部的第一端,該高指向性天線設置在該夾物臂部的第二端。 The robot arm unit is disposed in the radio wave dark room, and includes a fixed seat and a movable arm, the fixed seat is provided on the bottom plate of the radio wave dark room, the movable arm extends from the fixed seat and has a clip arm portion, The object-holding arm has a first end and a second end, the reflector is disposed at the first end of the object-holding arm, and the high directivity antenna is disposed at the second end of the object-holding arm.

該控制及量測單元電連接該待測天線、該高指向性天線及該機器手臂單元,並控制該機器手臂單元連動該反射鏡在多個預設的量測點之間移動,且該等量測點皆位於一預設半徑的半球面上,當該反射鏡移動到每一個預設的量測點時,該控制及量測單元是透過該待測天線及該高指向性天線分別收發該電磁波去量測該待測天線的一輻射增益,該控制及量測單元還利用該多數個分別對應該等量測點的輻射增益建構出該待測天線的一半球面輻射場型,並且,該半球面所界定出的一圓形開口是朝向該電波暗室的頂板及該待測天線,且該待測天線、該半球面的球心及該固定座於該底板的一法線方向上的投影相重疊。 The control and measurement unit is electrically connected to the antenna to be tested, the high directivity antenna and the robot arm unit, and controls the robot arm unit to move the mirror between a plurality of preset measurement points, and these The measurement points are located on a hemispherical surface with a preset radius. When the mirror moves to each preset measurement point, the control and measurement unit transmits and receives through the antenna to be tested and the highly directional antenna respectively The electromagnetic wave is used to measure a radiation gain of the antenna under test. The control and measurement unit also uses the plurality of radiation gains corresponding to the measurement points to construct a half-spherical radiation pattern of the antenna under test, and, A circular opening defined by the hemispherical surface is directed toward the top plate of the anechoic chamber and the antenna to be tested, and the antenna to be tested, the spherical center of the hemispherical surface and the fixing base are in a normal direction of the bottom plate The projections overlap.

較佳地,該反射鏡是一平面鏡。 Preferably, the mirror is a plane mirror.

較佳地,該活動臂還包括一旋轉件、一第一臂部及一第二臂部。該旋轉件具有一旋轉端部及一關節,該旋轉端部套接於該固定座,該旋轉件具有相對於該固定座旋轉0度到360度的功能,且該旋轉件的軸心線及該半球面的球心共同位於該底板的法線方向上。該第一臂部具有一第一關節、一第二關節,及一連接該第一關節及該第二關節的臂桿,且該第一臂部的第一關節與該旋轉件的關節相連接,使得該第一臂部可以相對該旋轉件轉動。該第二臂部具有一第 一關節、一第二關節,及一連接該第一關節及該第二關節的臂桿,且該第二臂部的第一關節與該第一臂部的第二關節相連接,使得該第二臂部可以相對該第一臂部轉動,該夾物臂部與該第二臂部的第二關節相連接,使得該夾物臂部可以相對該第二臂部轉動。 Preferably, the movable arm further includes a rotating member, a first arm portion and a second arm portion. The rotating member has a rotating end and a joint, the rotating end is sleeved on the fixing base, the rotating member has a function of rotating from 0 to 360 degrees relative to the fixing base, and the axis of the rotating member and The spherical centers of the hemispherical surfaces are co-located in the normal direction of the bottom plate. The first arm has a first joint, a second joint, and an arm connecting the first joint and the second joint, and the first joint of the first arm is connected to the joint of the rotating member So that the first arm can rotate relative to the rotating member. The second arm has a first joint, a second joint, and an arm connecting the first joint and the second joint, and the first joint of the second arm and the first arm The two joints are connected so that the second arm can rotate relative to the first arm, and the clip arm is connected to the second joint of the second arm so that the clip arm can be opposed to the second arm部转。 Rotate.

較佳地,該控制及量測單元包括一射頻訊號產生器、一訊號饋入夾具、一頻譜分析儀及一電腦。該射頻訊號產生器輸出一預設大小的射頻輸出訊號。該訊號饋入夾具電連接該射頻訊號產生器以接收該射頻輸出訊號,且具有一探針及一攝像鏡頭,該攝像鏡頭朝向該探針設置以輔助觀測該探針的影像,該探針用以碰觸該待測天線以將該射頻輸出訊號傳遞到該待測天線,該待測天線接收該射頻輸出訊號並轉換成該電磁波發射,該反射鏡反射部分的該電磁波到該高指向性天線,該高指向性天線接收部分的該電磁波並轉換成一射頻接收訊號。該頻譜分析儀電連接該高指向性天線以接收該射頻接收訊號,並量測該射頻接收訊號的振幅。該電腦電連接該頻譜分析儀以得到該射頻接收訊號的振幅,並根據該射頻接收訊號的振幅、該高指向性天線的輻射增益、該半球面的半徑、該高指向性天線到該反射鏡之間的直線距離,及該訊號饋入夾具的路徑損耗,共同計算該反射鏡位於該量測點時該待測天線的輻射增益,且利用該等量測點所在位置的空間資訊及該等輻射增益建構該待測天線的半球面輻射場 型。 Preferably, the control and measurement unit includes a radio frequency signal generator, a signal feeding fixture, a spectrum analyzer and a computer. The radio frequency signal generator outputs a radio frequency output signal of a preset size. The signal feeding fixture is electrically connected to the RF signal generator to receive the RF output signal, and has a probe and a camera lens, the camera lens is disposed toward the probe to assist in observing the image of the probe. Touch the antenna under test to transmit the RF output signal to the antenna under test, the antenna under test receives the RF output signal and converts it to the electromagnetic wave emission, and the electromagnetic wave reflected by the reflector reflects to the highly directional antenna , The electromagnetic wave received by the highly directional antenna is converted into a radio frequency reception signal. The spectrum analyzer is electrically connected to the high directivity antenna to receive the radio frequency reception signal, and measures the amplitude of the radio frequency reception signal. The computer is electrically connected to the spectrum analyzer to obtain the amplitude of the RF received signal, and according to the amplitude of the RF received signal, the radiation gain of the highly directional antenna, the radius of the hemispherical surface, the highly directional antenna to the reflector The linear distance between them, and the path loss of the signal fed into the fixture, together calculate the radiation gain of the antenna under test when the mirror is at the measurement point, and use the spatial information of the location of the measurement point and the The radiation gain constructs the hemispherical radiation pattern of the antenna to be tested.

較佳地,該控制及量測單元包括一射頻訊號產生器、一訊號饋入夾具、一頻譜分析儀及一電腦。該射頻訊號產生器輸出一預設大小的射頻輸出訊號,該高指向性天線電連接該射頻訊號產生器以接收該射頻輸出訊號並轉換成該電磁波朝該反射鏡發射,該反射鏡反射該電磁波到該待測天線,該待測天線接收該電磁波並轉換成一射頻接收訊號。該訊號饋入夾具具有一探針及一攝像鏡頭,該攝像鏡頭朝向該探針設置以輔助觀測該探針影像,該探針用以碰觸該待測天線以接收該射頻接收訊號。該頻譜分析儀電連接該訊號饋入夾具以接收該射頻接收訊號,並量測該射頻接收訊號的振幅。該電腦電連接該頻譜分析儀以得到該射頻接收訊號的振幅,並根據該射頻接收訊號的振幅、該高指向性天線的輻射增益、該半球面的半徑、該高指向性天線到該反射鏡之間的直線距離,及該訊號饋入夾具的路徑損耗,共同計算該反射鏡位於該量測點時該待測天線的輻射增益,且利用該等量測點所在位置的空間資訊及該等輻射增益建構該待測天線的半球面輻射場型。 Preferably, the control and measurement unit includes a radio frequency signal generator, a signal feeding fixture, a spectrum analyzer and a computer. The radio frequency signal generator outputs a radio frequency output signal of a predetermined size, the highly directional antenna is electrically connected to the radio frequency signal generator to receive the radio frequency output signal and converts the electromagnetic wave to the mirror, and the mirror reflects the electromagnetic wave To the antenna under test, the antenna under test receives the electromagnetic wave and converts it into a radio frequency reception signal. The signal feeding fixture has a probe and a camera lens. The camera lens is disposed toward the probe to assist in observing the probe image. The probe is used to touch the antenna to be tested to receive the radio frequency reception signal. The spectrum analyzer is electrically connected to the signal feeding fixture to receive the radio frequency reception signal, and measures the amplitude of the radio frequency reception signal. The computer is electrically connected to the spectrum analyzer to obtain the amplitude of the RF received signal, and according to the amplitude of the RF received signal, the radiation gain of the highly directional antenna, the radius of the hemispherical surface, the highly directional antenna to the reflector The linear distance between them, and the path loss of the signal fed into the fixture, together calculate the radiation gain of the antenna under test when the mirror is at the measurement point, and use the spatial information of the location of the measurement point and the The radiation gain constructs the hemispherical radiation pattern of the antenna to be tested.

本發明之效果在於利用該機器手臂單元進行自動化的輻射增益量測,並利用該電腦建構出半球面輻射場型,所以可以解決先前技術所述的缺點。 The effect of the present invention is to use the robot arm unit for automatic radiation gain measurement, and use the computer to construct a hemispherical radiation field pattern, so the shortcomings described in the prior art can be solved.

11‧‧‧電波暗室 11‧‧‧Electronic darkroom

12‧‧‧高指向性天線 12‧‧‧High directional antenna

13‧‧‧旋轉基座 13‧‧‧rotating base

14‧‧‧待測天線 14‧‧‧ antenna under test

2‧‧‧待測天線 2‧‧‧ antenna under test

21‧‧‧主輻射面 21‧‧‧Main radiating surface

3‧‧‧電波暗室 3‧‧‧Electronic wave darkroom

4‧‧‧高指向性天線 4‧‧‧High directional antenna

5‧‧‧機器手臂單元 5‧‧‧Robot arm unit

6‧‧‧控制及量測單元 6‧‧‧Control and measurement unit

31‧‧‧頂板 31‧‧‧Top board

311‧‧‧開口 311‧‧‧ opening

32‧‧‧底板 32‧‧‧Bottom plate

33‧‧‧側板 33‧‧‧Side board

34‧‧‧窗戶 34‧‧‧window

35‧‧‧電磁波吸收體 35‧‧‧Electromagnetic wave absorber

4‧‧‧高指向性天線 4‧‧‧High directional antenna

5‧‧‧機器手臂單元 5‧‧‧Robot arm unit

50‧‧‧固定座 50‧‧‧Fixed seat

51‧‧‧活動臂 51‧‧‧movable arm

52‧‧‧旋轉件 52‧‧‧rotating parts

521‧‧‧旋轉端部 521‧‧‧rotating end

522‧‧‧關節 522‧‧‧joint

53‧‧‧第一臂部 53‧‧‧ First arm

531‧‧‧第一關節 531‧‧‧The first joint

532‧‧‧第二關節 532‧‧‧Second Joint

533‧‧‧臂桿 533‧‧‧arm

54‧‧‧第二臂部 54‧‧‧Second arm

541‧‧‧第一關節 541‧‧‧The first joint

542‧‧‧第二關節 542‧‧‧Second Joint

543‧‧‧臂桿 543‧‧‧arm

55‧‧‧夾物臂部 55‧‧‧Clamp arm

551‧‧‧第一端 551‧‧‧The first end

552‧‧‧第二端 552‧‧‧Second end

6‧‧‧控制及量測單元 6‧‧‧Control and measurement unit

61‧‧‧射頻訊號產生器 61‧‧‧RF signal generator

62‧‧‧訊號饋入夾具 62‧‧‧Signal feeding fixture

621‧‧‧探針 621‧‧‧probe

622‧‧‧攝像鏡頭 622‧‧‧Camera lens

63‧‧‧頻譜分析儀 63‧‧‧ Spectrum Analyzer

64‧‧‧電腦 64‧‧‧Computer

7‧‧‧反射鏡 7‧‧‧Reflecting mirror

R‧‧‧半球面的半徑 R‧‧‧ Hemisphere radius

第1圖是一示意圖,說明先前技術的天線量測系統。 Figure 1 is a schematic diagram illustrating a prior art antenna measurement system.

第2圖是一示意圖,說明本發明天線輻射場型自動量測系統的第一較佳實施例。 FIG. 2 is a schematic diagram illustrating the first preferred embodiment of the automatic measurement system of the antenna radiation field type of the present invention.

第3圖是第一較佳實施例更詳細的一示意圖,說明控制及量測單元的一種實施方式。 Figure 3 is a more detailed schematic diagram of the first preferred embodiment, illustrating an implementation of the control and measurement unit.

第4圖是第一較佳實施例更詳細的另一示意圖,說明控制及量測單元的另一種實施方式。 Figure 4 is another more detailed schematic diagram of the first preferred embodiment, illustrating another implementation of the control and measurement unit.

第5圖是第二較佳實施例的一示意圖。 Fig. 5 is a schematic diagram of the second preferred embodiment.

第6圖是第二較佳實施例的另一示意圖。 Fig. 6 is another schematic diagram of the second preferred embodiment.

參閱圖2,本發明一天線輻射場型自動量測系統適用於量測一待測天線2的半球面輻射場型,該待測天線2包括一主輻射面21,該第一較佳實施例包含一電波暗室3、一高指向性天線4、一機器手臂單元5及一控制及量測單元6。 Referring to FIG. 2, an antenna radiation field type automatic measurement system of the present invention is suitable for measuring a hemispherical radiation field pattern of an antenna 2 to be tested. The antenna 2 to be tested includes a main radiation surface 21, the first preferred embodiment It includes an anechoic chamber 3, a highly directional antenna 4, a robot arm unit 5 and a control and measurement unit 6.

該電波暗室3的外型大致上呈一中空的長方體,其包括一頂板31、一相對於該頂板31的底板32、四片連接該頂板31及該底板32的側板33,及一窗戶34。 The appearance of the anechoic chamber 3 is generally a hollow rectangular parallelepiped, which includes a top plate 31, a bottom plate 32 opposite to the top plate 31, four side plates 33 connecting the top plate 31 and the bottom plate 32, and a window 34.

該頂板31、該等側板33及該底板32貼有多個用電磁波吸收體35,且該頂板31具有一開口311,該開口311大約位於該頂板31的幾何中心。 A plurality of electromagnetic wave absorbers 35 are attached to the top plate 31, the side plates 33 and the bottom plate 32, and the top plate 31 has an opening 311 which is approximately located at the geometric center of the top plate 31.

該窗戶34內面用以貼附該待測天線2,當該窗戶34打開 時,該電波暗室3的內外空間透過該開口311連通,而當該窗戶34關上時,該頂板31的開口311被該窗戶34蓋住,此時該待測天線2貼近該頂板31設置,且主輻射面21是面向該電波暗室3的底板32。 The inner surface of the window 34 is used to attach the antenna 2 to be tested. When the window 34 is opened, the inner and outer spaces of the radio wave darkroom 3 communicate through the opening 311, and when the window 34 is closed, the opening 311 of the top plate 31 is The window 34 is covered. At this time, the antenna 2 to be tested is disposed close to the top plate 31, and the main radiation surface 21 is the bottom plate 32 facing the anechoic chamber 3.

該高指向性天線4的輻射場型具有一主波束,該高指向性天線4可以是導波管天線(waveguide antenna)、洩漏波天線(leaky wave antenna)、喇叭天線(horn antenna)、陣列天線(array antenna),或其它具有高指向性特徵的天線類型。 The radiation pattern of the highly directional antenna 4 has a main beam. The highly directional antenna 4 may be a waveguide antenna, a leaky wave antenna, a horn antenna, and an array antenna (array antenna), or other antenna types with high directivity characteristics.

該機器手臂單元5設置在該電波暗室3中,並包括一固定座50及一活動臂51。 The robot arm unit 5 is disposed in the anechoic chamber 3 and includes a fixed base 50 and a movable arm 51.

該固定座50設置在該電波暗室3的底板32的幾何中心。 The fixing seat 50 is disposed at the geometric center of the bottom plate 32 of the radio wave anechoic chamber 3.

該活動臂51從該固定座50延伸而出,且具有一旋轉件52、一第一臂部53、一第二臂部54及一夾物臂部55。 The movable arm 51 extends from the fixing base 50 and has a rotating member 52, a first arm portion 53, a second arm portion 54 and an object-holding arm portion 55.

該旋轉件52具有一旋轉端部521及一關節522,該旋轉端部521套接於該固定座50,該旋轉件52具有相對於該固定座50旋轉0度到360度的功能。 The rotating member 52 has a rotating end 521 and a joint 522. The rotating end 521 is sleeved on the fixing base 50. The rotating member 52 has a function of rotating from 0 to 360 degrees relative to the fixing base 50.

該第一臂部53具有一第一關節531、一第二關節532,及一連接該第一關節531及該第二關節532的臂桿533,且該第一臂部53的第一關節531與該旋轉件52的關節522相連接,使得該第一臂部53可以相對該旋轉件52轉動。 The first arm 53 has a first joint 531, a second joint 532, and an arm 533 connecting the first joint 531 and the second joint 532, and the first joint 531 of the first arm 53 The joint 522 of the rotating member 52 is connected so that the first arm portion 53 can rotate relative to the rotating member 52.

該第二臂部54具有一第一關節541、一第二關節542,及一連接該第一關節541及該第二關節532的臂桿543,且該第二臂部54的第一關節541與該第一臂部53的第二關節532相連接,使得該第二臂部54 可以相對該第一臂部53轉動。 The second arm 54 has a first joint 541, a second joint 542, and an arm 543 connecting the first joint 541 and the second joint 532, and the first joint 541 of the second arm 54 The second joint 532 of the first arm 53 is connected so that the second arm 54 can rotate relative to the first arm 53.

該夾物臂部55與該第二臂部54的第二關節542相連接,使得該夾物臂部55可以相對該第二臂部54轉動。該高指向性天線4設置在該夾物臂部55上並被該活動臂51連動。 The clip arm portion 55 is connected to the second joint 542 of the second arm portion 54 so that the clip arm portion 55 can rotate relative to the second arm portion 54. The highly directional antenna 4 is provided on the gripping arm portion 55 and is interlocked by the movable arm 51.

該控制及量測單元6電連接該待測天線2、該高指向性天線4及該機器手臂單元5,並控制該機器手臂單元5連動該高指向性天線4在多個預設的量測點之間移動。 The control and measurement unit 6 is electrically connected to the antenna 2 to be tested, the highly directional antenna 4 and the robot arm unit 5, and controls the robot arm unit 5 to link the highly directional antenna 4 in a plurality of preset measurements Move between points.

該等預設的量測點皆位於一預設半徑的半球面上,當該高指向性天線4移動到每一個預設的量測點時,該控制及量測單元6是透過該待測天線2及該高指向性天線4分別收發一電磁波去量測該待測天線2的一輻射增益,該控制及量測單元6還利用該多數個分別對應該等量測點的輻射增益建構出該待測天線2的一半球面輻射場型,其中,當該高指向性天線4停留在該量測點時,該機器手臂單元5還會轉動高指向性天線4的角度,使該高指向性天線4的主波束朝向該半球面的球心(該半球面的球心也就是該輻射面21的一幾何中心),並且,該半球面所界定出的一圓形開口是朝向該電波暗室3的頂板31及該待測天線2,且該待測天線2、該半球面的球心、該旋轉件52的軸心線及該固定座50於該底板32的一法線方向(Z方向)上的投影相重疊。 The preset measurement points are all located on a hemispherical surface of a preset radius. When the high directional antenna 4 moves to each preset measurement point, the control and measurement unit 6 passes through the to-be-measured The antenna 2 and the highly directional antenna 4 respectively send and receive an electromagnetic wave to measure a radiation gain of the antenna 2 to be tested. The control and measurement unit 6 is also constructed using the radiation gains of the plurality of measurement points corresponding to the measurement points The half-spherical radiation pattern of the antenna 2 to be tested, wherein, when the high directivity antenna 4 stays at the measurement point, the robot arm unit 5 will also rotate the angle of the high directivity antenna 4 to make the high directivity The main beam of the antenna 4 is directed to the spherical center of the hemispherical surface (the spherical center of the hemispherical surface is also a geometric center of the radiating surface 21), and a circular opening defined by the hemispherical surface is directed to the radio wave anechoic chamber 3 The top plate 31 and the antenna 2 to be tested, and the antenna 2 to be tested, the spherical center of the hemispherical surface, the axis of the rotating member 52 and a normal direction (Z direction) of the fixing base 50 to the bottom plate 32 The projections on the overlap.

參閱圖3,圖3是為了說明當該待測天線2作為發射天線而該高指向性天線4作為接收天線時,該控制及量測單元6的一種實施方式。 Referring to FIG. 3, FIG. 3 is for explaining an embodiment of the control and measurement unit 6 when the antenna 2 to be tested is used as a transmitting antenna and the highly directional antenna 4 is used as a receiving antenna.

該控制及量測單元6包括一射頻訊號產生器61、一訊號饋 入夾具62、一頻譜分析儀63及一電腦64。 The control and measurement unit 6 includes a radio frequency signal generator 61, a signal feed fixture 62, a spectrum analyzer 63 and a computer 64.

該射頻訊號產生器61輸出一預設大小的射頻輸出訊號。 The radio frequency signal generator 61 outputs a radio frequency output signal of a preset size.

該訊號饋入夾具62電連接該射頻訊號產生器61以接收該射頻輸出訊號,且具有一探針621及一攝像鏡頭622,該攝像鏡頭622朝向該探針621設置以輔助觀測該探針621的影像,該探針621用以碰觸該待測天線2以將該射頻輸出訊號傳遞到該待測天線2,該待測天線2接收該射頻輸出訊號並轉換成該電磁波,該高指向性天線4接收該電磁波並轉換成一射頻接收訊號。 The signal feeding fixture 62 is electrically connected to the RF signal generator 61 to receive the RF output signal, and has a probe 621 and a camera lens 622, and the camera lens 622 is disposed toward the probe 621 to assist in observing the probe 621 Image, the probe 621 is used to touch the antenna under test 2 to transmit the RF output signal to the antenna under test 2, the antenna under test 2 receives the RF output signal and converts it into the electromagnetic wave, the high directivity The antenna 4 receives the electromagnetic wave and converts it into a radio frequency reception signal.

該頻譜分析儀63電連接該高指向性天線4以接收該射頻接收訊號,並量測該射頻接收訊號的振幅。在實際應用上,該頻譜分析儀63也可以用網路分析儀取代。 The spectrum analyzer 63 is electrically connected to the high directivity antenna 4 to receive the radio frequency reception signal, and measures the amplitude of the radio frequency reception signal. In practical applications, the spectrum analyzer 63 can also be replaced with a network analyzer.

該電腦64電連接該頻譜分析儀63以接收該射頻接收訊號的振幅,並根據該射頻接收訊號的振幅、該高指向性天線4的輻射增益、該半球面的半徑R及該訊號饋入夾具62的路徑損耗(insertion loss)共同計算該高指向性天線4位於該量測點時,該待測天線2的輻射增益,且利用該等量測點所在位置的空間資訊及該等輻射增益建構該待測天線2的半球面輻射場型。 The computer 64 is electrically connected to the spectrum analyzer 63 to receive the amplitude of the RF received signal, and feeds into the fixture according to the amplitude of the RF received signal, the radiation gain of the highly directional antenna 4, the radius R of the hemisphere, and the signal The path loss of 62 (insertion loss) jointly calculates the radiation gain of the antenna under test 2 when the highly directional antenna 4 is located at the measurement point, and is constructed using the spatial information of the location of the measurement point and the radiation gain The hemispherical radiation pattern of the antenna 2 to be tested.

參閱圖4,圖4是為了說明當該高指向性天線4作為發射天線而該待測天線2作為接收天線時,該控制及量測單元6的另一種實施方式。 Referring to FIG. 4, FIG. 4 is for explaining another embodiment of the control and measurement unit 6 when the highly directional antenna 4 is used as a transmitting antenna and the antenna under test 2 is used as a receiving antenna.

該射頻訊號產生器61輸出一預設大小的射頻輸出訊號。 The radio frequency signal generator 61 outputs a radio frequency output signal of a preset size.

該高指向性天線4電連接該射頻訊號產生器61以接收該射 頻輸出訊號並轉換成該電磁波,該待測天線2接收該電磁波並轉換成一射頻接收訊號。 The highly directional antenna 4 is electrically connected to the radio frequency signal generator 61 to receive the radio frequency output signal and convert it into the electromagnetic wave, and the antenna under test 2 receives the electromagnetic wave and converts it into a radio frequency reception signal.

該訊號饋入夾具62包括一探針621及一攝像鏡頭622。該攝像鏡頭622朝向該探針621設置以輔助觀測該探針621影像,該探針621用以碰觸該待測天線2以接收該射頻接收訊號。 The signal feeding fixture 62 includes a probe 621 and a camera lens 622. The camera lens 622 is disposed toward the probe 621 to assist in observing the image of the probe 621. The probe 621 is used to touch the antenna 2 to be tested to receive the RF reception signal.

該頻譜分析儀63電連接該訊號饋入夾具62以接收該射頻接收訊號,並量測該射頻接收訊號的振幅。 The spectrum analyzer 63 is electrically connected to the signal feeding fixture 62 to receive the RF reception signal, and measures the amplitude of the RF reception signal.

該電腦64電連接該頻譜分析儀63以得到該射頻接收訊號的振幅,並根據該射頻接收訊號的振幅、該高指向性天線4的輻射增益、該半球面的半徑R及該訊號饋入夾具62的路徑損耗共同計算該高指向性天線4位於該量測點時該待測天線2的輻射增益,且利用該等量測點所在位置的空間資訊及該等輻射增益建構該待測天線2的半球面輻射場型。 The computer 64 is electrically connected to the spectrum analyzer 63 to obtain the amplitude of the RF received signal, and according to the amplitude of the RF received signal, the radiation gain of the highly directional antenna 4, the radius R of the hemisphere and the signal feeding fixture The path loss of 62 jointly calculates the radiation gain of the antenna under test 2 when the highly directional antenna 4 is located at the measurement point, and constructs the antenna under test 2 using the spatial information of the location of the measurement point and the radiation gain Radiation pattern of the hemisphere.

參閱圖5,是本發明的第二較佳實施例,其與第一較佳實施例近似(見圖2),差異在於第一較佳實施例支援遠場或近場的量測方式,第二較佳實施例更支援縮距場的量測方式,因此第二較佳實施例更包含一反射鏡7。本較佳實施例與該第一較佳實施例近似的部分不再贅述,差異的部分說明如下。 5 is a second preferred embodiment of the present invention, which is similar to the first preferred embodiment (see FIG. 2), the difference is that the first preferred embodiment supports far-field or near-field measurement methods, the first The second preferred embodiment further supports the measurement method of the reduced-distance field, so the second preferred embodiment further includes a reflecting mirror 7. The parts of this preferred embodiment that are similar to the first preferred embodiment will not be repeated, and the differences will be described as follows.

該夾物臂部55具有一第一端551及一第二端552,該反射鏡7設置在該夾物臂部55的第一端551,該高指向性天線4設置在該夾物臂部55的第二端552。 The clamp arm 55 has a first end 551 and a second end 552, the reflector 7 is disposed at the first end 551 of the clamp arm 55, and the highly directional antenna 4 is disposed at the clamp arm The second end 552 of 55.

於本較佳實施例,該反射鏡7是平面鏡,該高指向性天線4其輻射場型的主波束是指向該反射鏡7,當該待測天線2作為發射天線而該 高指向性天線4作為接收天線時,該待測天線2發射出的該電磁波傳播至該反射鏡7,再被該反射鏡7反射到該高指向性天線4;反之,當該高指向性天線4作為發射天線而該待測天線2作為接收天線時,該高指向性天線4發射出的該電磁波傳播至該反射鏡7,再被該反射鏡7反射到該待測天線2接收。相較於第一較佳實施例,第二較佳實施例的該電波暗室3的空間要求較小(縮距場量測),原因在於第一較佳實施例中的該待測天線2與該高指向性天線4之間是以直視(line-of-sight)的方式收發該電磁波,但第二較佳實施例是利用該反射鏡7反射的方式收發電磁波,如此等同延長了傳播距離。 In the preferred embodiment, the reflecting mirror 7 is a plane mirror, the main beam of the radiation pattern of the highly directional antenna 4 is directed to the reflecting mirror 7, when the antenna under test 2 is used as a transmitting antenna and the highly directional antenna 4 As a receiving antenna, the electromagnetic wave emitted by the antenna under test 2 propagates to the mirror 7 and is reflected by the mirror 7 to the highly directional antenna 4; conversely, when the highly directional antenna 4 is used as a transmitting antenna When the antenna 2 under test is used as a receiving antenna, the electromagnetic wave emitted by the high directivity antenna 4 propagates to the mirror 7 and then is reflected by the mirror 7 to the antenna 2 under test for reception. Compared with the first preferred embodiment, the space requirement of the anechoic chamber 3 of the second preferred embodiment is smaller (shrinkage field measurement), because the antenna 2 to be tested in the first preferred embodiment is The highly directional antenna 4 transmits and receives the electromagnetic wave in a line-of-sight manner, but the second preferred embodiment uses the reflection mode of the reflecting mirror 7 to transmit and receive the electromagnetic wave, which is equivalent to extending the propagation distance.

該控制及量測單元6控制該機器手臂單元5連動該反射鏡7在多個預設的量測點之間移動,且該等量測點皆位於一預設半徑的半球面上,當該反射鏡7移動到每一個預設的量測點時,該控制及量測單元6是透過該待測天線2及該高指向性天線4分別收發一電磁波(電磁波途中經過該反射鏡7)去量測該待測天線2的一輻射增益,該控制及量測單元6還利用該多數個分別對應該等量測點的輻射增益建構出該待測天線2的一半球面輻射場型。 The control and measurement unit 6 controls the robot arm unit 5 to move the mirror 7 to move between a plurality of predetermined measurement points, and the measurement points are located on a hemispherical surface of a predetermined radius. When the reflecting mirror 7 moves to each preset measuring point, the control and measuring unit 6 sends and receives an electromagnetic wave (the electromagnetic wave passes through the reflecting mirror 7 on the way) through the antenna 2 to be tested and the highly directional antenna 4 respectively To measure a radiation gain of the antenna 2 to be tested, the control and measurement unit 6 also uses the plurality of radiation gains corresponding to the measurement points to construct a half-spherical radiation pattern of the antenna 2 to be tested.

當該待測天線2作為發射天線且該高指向性天線4作為接收天線時,該待測天線2接收該射頻輸出訊號並轉換成該電磁波發射,該反射鏡7反射部分的該電磁波到該高指向性天線4,該高指向性天線4接收部分的該電磁波並轉換成一射頻接收訊號,該頻譜分析儀63電連接該高指向性天線4以接收該射頻接收訊號,並量測該射頻接收訊號的振幅。該電腦64電連接該頻譜分析儀63以接收該射頻接收訊號的振幅,並根據該射 頻接收訊號的振幅、該高指向性天線4的輻射增益、該半球面的半徑R、該高指向性天線4到該反射鏡7之間的直線距離L,及該訊號饋入夾具62的路徑損耗共同計算該反射鏡7位於該量測點時,該待測天線2的輻射增益,且利用該等量測點所在位置的空間資訊及該等輻射增益建構該待測天線2的半球面輻射場型。 When the antenna under test 2 is used as a transmitting antenna and the highly directional antenna 4 is used as a receiving antenna, the antenna under test 2 receives the radio frequency output signal and converts it into an electromagnetic wave emission, and the reflecting mirror 7 reflects part of the electromagnetic wave to the high A directional antenna 4, the high directional antenna 4 receives part of the electromagnetic wave and converts it into a radio frequency reception signal, the spectrum analyzer 63 is electrically connected to the high directional antenna 4 to receive the radio frequency reception signal, and measure the radio frequency reception signal The amplitude. The computer 64 is electrically connected to the spectrum analyzer 63 to receive the amplitude of the radio frequency received signal, and according to the amplitude of the radio frequency received signal, the radiation gain of the highly directional antenna 4, the radius R of the hemisphere, the highly directional antenna The linear distance L between the reflector 7 and the reflector 7 and the path loss of the signal feeding fixture 62 jointly calculate the radiation gain of the antenna 2 to be tested when the reflector 7 is located at the measurement point, and use the same amount The spatial information of the location of the measuring point and the radiation gains constitute the hemispherical radiation pattern of the antenna 2 to be measured.

參閱圖6,當該高指向性天線4作為發射天線且該待測天線2作為接收天線時,該高指向性天線4電連接該射頻訊號產生器61以接收一射頻輸出訊號並轉換成該電磁波朝該反射鏡7發射,該反射鏡7反射該電磁波到該待測天線2,該待測天線2接收該電磁波並轉換成一射頻接收訊號。該探針621用以碰觸該待測天線2以接收該射頻接收訊號。該頻譜分析儀63電連接該訊號饋入夾具62以接收該射頻接收訊號,並量測該射頻接收訊號的振幅。該電腦64電連接該頻譜分析儀63以得到該射頻接收訊號的振幅,並根據該射頻接收訊號的振幅、該高指向性天線4的輻射增益、該半球面的半徑、該高指向性天線4到該反射鏡7之間的直線距離,及該訊號饋入夾具62的路徑損耗共同計算該反射鏡7位於該量測點時,該待測天線2的輻射增益,且利用該等量測點所在位置的空間資訊及該等輻射增益建構該待測天線2的半球面輻射場型。 Referring to FIG. 6, when the highly directional antenna 4 is used as a transmitting antenna and the antenna under test 2 is used as a receiving antenna, the highly directional antenna 4 is electrically connected to the RF signal generator 61 to receive an RF output signal and convert it into the electromagnetic wave It is emitted toward the reflecting mirror 7, the reflecting mirror 7 reflects the electromagnetic wave to the antenna under test 2, and the antenna under test 2 receives the electromagnetic wave and converts it into a radio frequency receiving signal. The probe 621 is used to touch the antenna 2 to be tested to receive the RF reception signal. The spectrum analyzer 63 is electrically connected to the signal feeding fixture 62 to receive the RF reception signal, and measures the amplitude of the RF reception signal. The computer 64 is electrically connected to the spectrum analyzer 63 to obtain the amplitude of the RF received signal, and according to the amplitude of the RF received signal, the radiation gain of the highly directional antenna 4, the radius of the hemispherical surface, the highly directional antenna 4 The straight-line distance to the reflector 7 and the path loss of the signal feeding fixture 62 jointly calculate the radiation gain of the antenna 2 to be tested when the reflector 7 is located at the measurement point, and use the measurement points The spatial information of the location and the radiation gains constitute the hemispherical radiation pattern of the antenna 2 to be tested.

該待測天線2的輻射增益的計算方式補充說明如下。 The calculation method of the radiation gain of the antenna 2 to be tested is supplemented as follows.

因為該射頻訊號產生器61輸出的射頻輸出訊號的功率P1是已知,該高指向性天線4也是已知的天線(增益已知),所以可以計算出該高指向性天線4接收該射頻輸出訊號後輻射出的該電磁波的功率P2,該電磁波行經的路徑距離是L+R,且環境是空氣,因此可以計算該電磁波到達 該待測天線2時的功率P3,另外該頻譜分析儀63接可以量得該射頻接收訊號的功率P4,其中功率P4和功率P3的差異就是該待測天線2的增益和該訊號饋入夾具62的路徑損耗(insertion loss)兩者造成的,而該路徑損耗又是已知(可用網路分析儀等工具量得),因此可以將該路徑損耗補償掉,故最終算得到該待測天線2的輻射增益G。R:該半球面的半徑,L:該高指向性天線4到該反射鏡7之間的直線距離。 Because the power P1 of the RF output signal output by the RF signal generator 61 is known, and the highly directional antenna 4 is also a known antenna (gain is known), it can be calculated that the highly directional antenna 4 receives the RF output The power P2 of the electromagnetic wave radiated after the signal, the path distance traveled by the electromagnetic wave is L+R, and the environment is air, so the power P3 when the electromagnetic wave reaches the antenna under test 2 can be calculated, and the spectrum analyzer 63 is connected to The power P4 of the RF received signal can be measured, where the difference between the power P4 and the power P3 is caused by both the gain of the antenna under test 2 and the insertion loss of the signal feeding fixture 62, and the path loss It is also known (can be measured by tools such as a network analyzer), so the path loss can be compensated, so the radiation gain G of the antenna 2 to be tested is finally calculated. R: the radius of the hemisphere, L: the linear distance between the highly directional antenna 4 and the mirror 7.

此外,由於該旋轉件52具有旋轉0度到360度(ψ=00~3600)的功能,且該第一臂部53、該第二臂部54及該夾物臂部55彼此間可以相對轉動(θ=-900~+900),所以每一個量測點的空間位置可以用(ψθ)表示出來,若再加入該待測天線2的輻射增益G,則電腦64根據數據(ψθG)就可以建構該待測天線2的半球面輻射場型。 In addition, since the rotating member 52 has a function of rotating from 0 degrees to 360 degrees ( ψ =0 0 to 360 0 ), and the first arm portion 53, the second arm portion 54 and the clip arm portion 55 can be mutually Relative rotation ( θ =-90 0 ~+90 0 ), so the spatial position of each measurement point can be expressed by ( ψ , θ ). If the radiation gain G of the antenna 2 to be measured is added, the computer 64 The data ( ψ , θ , G ) can construct the hemispherical radiation pattern of the antenna 2 to be tested.

綜上所述,上述較佳實施例具有以下優點:利用該機器手臂單元5對該待測天線2進行自動化的輻射增益量測,並利用該電腦64建構出該待測天線2的半球面輻射場型,進而解決先前技術的缺點。 In summary, the above-mentioned preferred embodiment has the following advantages: the robot arm unit 5 is used to perform automatic radiation gain measurement on the antenna 2 to be tested, and the computer 64 is used to construct the hemispherical radiation of the antenna 2 to be tested Field pattern, and then solve the shortcomings of the prior art.

惟以上所述者,僅為本發明之實施例而已,當不能以此限定本發明實施之範圍,凡是依本發明申請專利範圍及專利說明書內容所作之簡單地等效變化與修飾,皆仍屬本發明專利涵蓋之範圍內。 However, the above are only examples of the present invention, and should not be used to limit the scope of implementation of the present invention, any simple equivalent changes and modifications made in accordance with the scope of the patent application of the present invention and the content of the patent specification still belong to This invention covers the patent.

2‧‧‧待測天線 2‧‧‧ antenna under test

21‧‧‧主輻射面 21‧‧‧Main radiating surface

3‧‧‧電波暗室 3‧‧‧Electronic wave darkroom

31‧‧‧頂板 31‧‧‧Top board

311‧‧‧開口 311‧‧‧ opening

32‧‧‧底板 32‧‧‧Bottom plate

33‧‧‧側板 33‧‧‧Side board

34‧‧‧窗戶 34‧‧‧window

35‧‧‧電磁波吸收體 35‧‧‧Electromagnetic wave absorber

4‧‧‧高指向性天線 4‧‧‧High directional antenna

5‧‧‧機器手臂單元 5‧‧‧Robot arm unit

50‧‧‧固定座 50‧‧‧Fixed seat

51‧‧‧活動臂 51‧‧‧movable arm

52‧‧‧旋轉件 52‧‧‧rotating parts

521‧‧‧旋轉端部 521‧‧‧rotating end

522‧‧‧關節 522‧‧‧joint

53‧‧‧第一臂部 53‧‧‧ First arm

531‧‧‧第一關節 531‧‧‧The first joint

532‧‧‧第二關節 532‧‧‧Second Joint

533‧‧‧臂桿 533‧‧‧arm

54‧‧‧第二臂部 54‧‧‧Second arm

541‧‧‧第一關節 541‧‧‧The first joint

542‧‧‧第二關節 542‧‧‧Second Joint

543‧‧‧臂桿 543‧‧‧arm

55‧‧‧夾物臂部 55‧‧‧Clamp arm

6‧‧‧控制及量測單元 6‧‧‧Control and measurement unit

Claims (10)

一種天線輻射場型自動量測系統,適用於量測一待測天線的半球面輻射場型,該待測天線包括一主輻射面,該系統包含:一電波暗室,包括一頂板,及相對於該頂板的一底板,該待測天線貼近該頂板設置,且該待測天線的主輻射面朝向該底板設置;一高指向性天線;一機器手臂單元,設置在該電波暗室中,並包括一固定座及一活動臂,該固定座設置在該電波暗室的底板,該活動臂從該固定座延伸而出且具有一夾物臂部,該高指向性天線設置在該夾物臂部上並被該活動臂連動;及一控制及量測單元,電連接該待測天線、該高指向性天線及該機器手臂單元,並控制該機器手臂單元連動該高指向性天線在多個預設的量測點之間移動,且該等預設的量測點皆位於一預設半徑的半球面上,當該高指向性天線移動到每一個預設的量測點時,該控制及量測單元是透過該待測天線及該高指向性天線分別收發一電磁波去量測該待測天線的一輻射增益,該控制及量測單元還利用該多數個分別對應該等量測點的輻射增益建構出該待測天線的一半球面輻射場型,並且,該半球面所界定出的一圓形開口是朝向該電波暗室的頂板及該待測天線,且該待測天 線、該半球面的球心及該固定座於該底板的一法線方向上的投影相重疊。 An antenna radiation field type automatic measurement system is suitable for measuring the hemispherical radiation field type of an antenna to be tested. The antenna to be tested includes a main radiation surface. The system includes: an electric wave anechoic chamber, including a top plate, and A bottom plate of the top plate, the antenna under test is arranged close to the top plate, and the main radiating surface of the antenna under test is set toward the bottom plate; a highly directional antenna; a robot arm unit, which is set in the radio wave dark room, and includes a A fixed base and a movable arm are provided on the bottom plate of the radio wave anechoic chamber. The movable arm extends from the fixed base and has a clamping arm part, and the highly directional antenna is arranged on the clamping arm part and Linked by the movable arm; and a control and measurement unit electrically connecting the antenna to be tested, the high directivity antenna and the robot arm unit, and controlling the robot arm unit to link the high directivity antenna in multiple preset Move between measurement points, and the preset measurement points are all located on a hemispherical surface with a preset radius. When the highly directional antenna moves to each preset measurement point, the control and measurement The unit transmits and receives an electromagnetic wave through the antenna under test and the highly directional antenna to measure a radiation gain of the antenna under test. The control and measurement unit also utilizes the plurality of radiation gains corresponding to the measurement points respectively A semi-spherical radiation pattern of the antenna to be tested is constructed, and a circular opening defined by the hemisphere is toward the top plate of the anechoic chamber and the antenna to be tested, and the antenna to be tested and the hemispherical sphere The projections of the center and the fixing base in a normal direction of the base plate overlap. 根據申請專利範圍第1項之天線輻射場型自動量測系統,其中該電波暗室的頂板具有一開口,該電波暗室還包括一窗戶,該窗戶內面用以貼附該待測天線,當該窗戶打開時,該電波暗室的內外空間透過該開口連通,而當該窗戶關上時,該頂板的開口被該窗戶蓋住,該待測天線的主輻射面是朝向該電波暗室的底板。 According to the automatic measurement system of antenna radiation field type 1 in the patent application scope, wherein the top plate of the anechoic chamber has an opening, the anechoic chamber also includes a window, the inner surface of the window is used to attach the antenna to be tested, when the When the window is opened, the inner and outer spaces of the anechoic chamber communicate with each other through the opening, and when the window is closed, the opening of the top plate is covered by the window, and the main radiation surface of the antenna to be tested is toward the bottom plate of the anechoic chamber. 根據申請專利範圍第1項之天線輻射場型自動量測系統,其中該活動臂還包括:一旋轉件,具有一旋轉端部及一關節,該旋轉端部套接於該固定座,該旋轉件具有相對於該固定座旋轉0度到360度的功能,且該旋轉件的軸心線及該半球面的球心共同位於該底板的法線方向上;一第一臂部,具有一第一關節、一第二關節,及一連接該第一關節及該第二關節的臂桿,且該第一臂部的第一關節與該旋轉件的關節相連接,使得該第一臂部可以相對該旋轉件轉動;及一第二臂部,具有一第一關節、一第二關節,及一連接該第一關節及該第二關節的臂桿,且該第二臂部的第一關節與該第一臂部的第二關節相連接,使得該第二臂部可 以相對該第一臂部轉動,該夾物臂部與該第二臂部的第二關節相連接,使得該夾物臂部可以相對該第二臂部轉動。 According to the automatic measurement system of antenna radiation field type 1 in the patent application scope, wherein the movable arm further includes: a rotating member having a rotating end and a joint, the rotating end is sleeved on the fixing base, and the rotating The member has a function of rotating from 0 to 360 degrees relative to the fixed base, and the axis of the rotating member and the center of the hemispherical surface are located in the normal direction of the bottom plate; a first arm portion has a first A joint, a second joint, and an arm connecting the first joint and the second joint, and the first joint of the first arm is connected to the joint of the rotating member, so that the first arm can Rotate relative to the rotating member; and a second arm having a first joint, a second joint, and an arm connecting the first joint and the second joint, and the first joint of the second arm Connected to the second joint of the first arm, so that the second arm can rotate relative to the first arm, the arm of the clip is connected to the second joint of the second arm, so that the clip The arm can rotate relative to the second arm. 根據申請專利範圍第1項之天線輻射場型自動量測系統,其中該控制及量測單元包括:一射頻訊號產生器,輸出一預設大小的射頻輸出訊號;一訊號饋入夾具,電連接該射頻訊號產生器以接收該射頻輸出訊號,且具有一探針及一攝像鏡頭,該攝像鏡頭朝向該探針設置以輔助觀測該探針的影像,該探針用以碰觸該待測天線以將該射頻輸出訊號傳遞到該待測天線,該待測天線接收該射頻輸出訊號並轉換成該電磁波,該高指向性天線接收該電磁波並轉換成一射頻接收訊號;一頻譜分析儀,電連接該高指向性天線以接收該射頻接收訊號,並量測該射頻接收訊號的振幅;及一電腦,電連接該頻譜分析儀以得到該射頻接收訊號的振幅,並根據該射頻接收訊號的振幅、該高指向性天線的輻射增益、該半球面的半徑及該訊號饋入夾具的路徑損耗共同計算該高指向性天線位於該量測點時該待測天線的輻射增益,並建構該待測天線的半球面輻射場型。 The automatic measurement system of the antenna radiation field type according to item 1 of the patent application scope, wherein the control and measurement unit includes: a radio frequency signal generator, which outputs a radio frequency output signal of a preset size; a signal feeding fixture, and electrical connection The radio frequency signal generator receives the radio frequency output signal, and has a probe and a camera lens, the camera lens is disposed toward the probe to assist in observing the image of the probe, and the probe is used to touch the antenna under test To transmit the radio frequency output signal to the antenna under test, the antenna under test receives the radio frequency output signal and converts it into the electromagnetic wave, the highly directional antenna receives the electromagnetic wave and converts it into a radio frequency received signal; a spectrum analyzer, electrically connected The highly directional antenna receives the radio frequency received signal and measures the amplitude of the radio frequency received signal; and a computer is electrically connected to the spectrum analyzer to obtain the amplitude of the radio frequency received signal, and according to the amplitude of the radio frequency received signal, The radiation gain of the highly directional antenna, the radius of the hemisphere and the path loss of the signal feeding fixture together calculate the radiation gain of the antenna to be tested when the highly directional antenna is located at the measurement point, and construct the antenna to be tested Radiation pattern of the hemisphere. 根據申請專利範圍第1項之天線輻射場型自動量測系統,其中該控制及量測單元包括: 一射頻訊號產生器,輸出一預設大小的射頻輸出訊號,該高指向性天線電連接該射頻訊號產生器以接收該射頻輸出訊號並轉換成該電磁波,該待測天線接收該電磁波並轉換成一射頻接收訊號;一訊號饋入夾具,具有一探針及一攝像鏡頭,該攝像鏡頭朝向該探針設置以輔助觀測該探針影像,該探針用以碰觸該待測天線以接收該射頻接收訊號;一頻譜分析儀,電連接該訊號饋入夾具以接收該射頻接收訊號,並量測該射頻接收訊號的振幅;及一電腦,電連接該頻譜分析儀以得到該射頻接收訊號的振幅,並根據該射頻接收訊號的振幅、該高指向性天線的輻射增益、該半球面的半徑及該訊號饋入夾具的路徑損耗共同計算該高指向性天線位於該量測點時該待測天線的輻射增益,並建構該待測天線的半球面輻射場型。 The automatic measurement system of the antenna radiation field type according to item 1 of the patent application scope, wherein the control and measurement unit includes: a radio frequency signal generator that outputs a radio frequency output signal of a predetermined size, and the highly directional antenna is electrically connected to the The radio frequency signal generator receives the radio frequency output signal and converts it into the electromagnetic wave, and the antenna under test receives the electromagnetic wave and converts it into a radio frequency receiving signal; a signal feeding fixture has a probe and a camera lens, and the camera lens faces the The probe is set to assist in observing the image of the probe. The probe is used to touch the antenna to be tested to receive the RF receiving signal; a spectrum analyzer is electrically connected to the signal feeding fixture to receive the RF receiving signal and measure Measuring the amplitude of the RF received signal; and a computer, electrically connected to the spectrum analyzer to obtain the amplitude of the RF received signal, and according to the amplitude of the RF received signal, the radiation gain of the highly directional antenna, the radius of the hemisphere Together with the path loss of the signal feeding fixture, the radiation gain of the antenna under test when the highly directional antenna is located at the measurement point is calculated, and the hemispherical radiation pattern of the antenna under test is constructed. 一種天線輻射場型自動量測系統,適用於量測一待測天線的半球面輻射場型,該待測天線包括一主輻射面,該系統包含:一電波暗室,包括一頂板,及相對於該頂板的一底板,該待測天線貼近該頂板設置,且該待測天線的主輻射面朝向該底板設置;一反射鏡; 一高指向性天線,包括一主輻射面,該高指向性天線的輻射場型的一主波束是指向該反射鏡,該高指向性天線與該待測天線之間收發的一電磁波是入射該反射鏡並被反射;一機器手臂單元,設置在該電波暗室中,並包括一固定座及一活動臂,該固定座設置在該電波暗室的底板,該活動臂從該固定座延伸而出且具有一夾物臂部,該夾物臂部具有一第一端及一第二端,該反射鏡設置在該夾物臂部的第一端,該高指向性天線設置在該夾物臂部的第二端;及一控制及量測單元,電連接該待測天線、該高指向性天線及該機器手臂單元,並控制該機器手臂單元連動該反射鏡在多個預設的量測點之間移動,且該等量測點皆位於一預設半徑的半球面上,當該反射鏡移動到每一個預設的量測點時,該控制及量測單元是透過該待測天線及該高指向性天線分別收發該電磁波去量測該待測天線的一輻射增益,該控制及量測單元還利用該多數個分別對應該等量測點的輻射增益建構出該待測天線的一半球面輻射場型,並且,該半球面所界定出的一圓形開口是朝向該電波暗室的頂板及該待測天線,且該待測天線、該半球面的球心及該固定座於該底板的一法線方向上的投影相重疊。 An antenna radiation field type automatic measurement system is suitable for measuring the hemispherical radiation field type of an antenna to be tested. The antenna to be tested includes a main radiation surface. The system includes: an electric wave anechoic chamber, including a top plate, and A bottom plate of the top plate, the antenna under test is disposed close to the top plate, and the main radiating surface of the antenna under test is set toward the bottom plate; a reflector; a highly directional antenna, including a main radiating surface, the highly directional antenna A main beam of the radiation field type is directed to the mirror, and an electromagnetic wave transmitted and received between the highly directional antenna and the antenna under test is incident on the mirror and is reflected; a robot arm unit is provided in the radio wave dark room And includes a fixed seat and a movable arm, the fixed seat is disposed on the bottom plate of the anechoic chamber, the movable arm extends from the fixed seat and has a clamp arm portion, the clamp arm portion has a first end And a second end, the reflecting mirror is arranged at the first end of the clamp arm, the high directivity antenna is arranged at the second end of the clamp arm; and a control and measurement unit is electrically connected to the A measuring antenna, the highly directional antenna and the robot arm unit, and control the robot arm unit to move the mirror to move between a plurality of preset measurement points, and the measurement points are all located at a preset radius On the hemispherical surface, when the mirror moves to each preset measurement point, the control and measurement unit transmits and receives the electromagnetic wave to measure the antenna under test through the antenna under test and the highly directional antenna respectively A radiation gain, the control and measurement unit also uses the plurality of radiation gains corresponding to the measurement points to construct a semi-spherical radiation pattern of the antenna under test, and a circle defined by the hemisphere The opening is toward the top plate of the anechoic chamber and the antenna to be tested, and the projections of the antenna to be tested, the spherical center of the hemispherical surface and the fixing base in a normal direction of the bottom plate overlap. 根據申請專利範圍第6項之天線輻射場型自動量測系統,其中該反射鏡是一平面鏡。 According to item 6 of the patent application scope of the antenna radiation field type automatic measurement system, the reflector is a plane mirror. 根據申請專利範圍第6項之天線輻射場型自動量測系統,其中該活動臂還包括:一旋轉件,具有一旋轉端部及一關節,該旋轉端部套接於該固定座,該旋轉件具有相對於該固定座旋轉0度到360度的功能,且該旋轉件的軸心線及該半球面的球心共同位於該底板的法線方向上;一第一臂部,具有一第一關節、一第二關節,及一連接該第一關節及該第二關節的臂桿,且該第一臂部的第一關節與該旋轉件的關節相連接,使得該第一臂部可以相對該旋轉件轉動;及一第二臂部,具有一第一關節、一第二關節,及一連接該第一關節及該第二關節的臂桿,且該第二臂部的第一關節與該第一臂部的第二關節相連接,使得該第二臂部可以相對該第一臂部轉動,該夾物臂部與該第二臂部的第二關節相連接,使得該夾物臂部可以相對該第二臂部轉動。 According to the antenna radiation field type automatic measurement system of claim 6 of the patent application scope, wherein the movable arm further includes: a rotating member having a rotating end and a joint, the rotating end is sleeved on the fixing base, the rotating The member has a function of rotating from 0 to 360 degrees relative to the fixed base, and the axis of the rotating member and the center of the hemispherical surface are located in the normal direction of the bottom plate; a first arm portion has a first A joint, a second joint, and an arm connecting the first joint and the second joint, and the first joint of the first arm is connected to the joint of the rotating member, so that the first arm can Rotate relative to the rotating member; and a second arm having a first joint, a second joint, and an arm connecting the first joint and the second joint, and the first joint of the second arm Connected to the second joint of the first arm, so that the second arm can rotate relative to the first arm, the arm of the clip is connected to the second joint of the second arm, so that the clip The arm can rotate relative to the second arm. 根據申請專利範圍第6項之天線輻射場型自動量測系統,其中該控制及量測單元包括:一射頻訊號產生器,輸出一預設大小的射頻輸出訊號; 一訊號饋入夾具,電連接該射頻訊號產生器以接收該射頻輸出訊號,且具有一探針及一攝像鏡頭,該攝像鏡頭朝向該探針設置以輔助觀測該探針的影像,該探針用以碰觸該待測天線以將該射頻輸出訊號傳遞到該待測天線,該待測天線接收該射頻輸出訊號並轉換成該電磁波發射,該反射鏡反射部分的該電磁波到該高指向性天線,該高指向性天線接收部分的該電磁波並轉換成一射頻接收訊號;一頻譜分析儀,電連接該高指向性天線以接收該射頻接收訊號,並量測該射頻接收訊號的振幅;及一電腦,電連接該頻譜分析儀以得到該射頻接收訊號的振幅,並根據該射頻接收訊號的振幅、該高指向性天線的輻射增益、該半球面的半徑、該高指向性天線到該反射鏡之間的直線距離,及該訊號饋入夾具的路徑損耗,共同計算該反射鏡位於該量測點時該待測天線的輻射增益,且利用該等量測點所在位置的空間資訊及該等輻射增益建構該待測天線的半球面輻射場型。 The automatic measurement system of antenna radiation field type according to item 6 of the patent application scope, wherein the control and measurement unit includes: a radio frequency signal generator that outputs a radio frequency output signal of a preset size; a signal feeding fixture, electrically connected The radio frequency signal generator receives the radio frequency output signal, and has a probe and a camera lens, the camera lens is disposed toward the probe to assist in observing the image of the probe, and the probe is used to touch the antenna under test To transmit the RF output signal to the antenna under test, the antenna under test receives the RF output signal and converts it to the electromagnetic wave emission, the electromagnetic wave reflected by the mirror part to the highly directional antenna, the highly directional antenna receives Part of the electromagnetic wave is converted into a radio frequency reception signal; a spectrum analyzer, which is electrically connected to the high directivity antenna to receive the radio frequency reception signal, and measures the amplitude of the radio frequency reception signal; and a computer, which is electrically connected to the spectrum analyzer To obtain the amplitude of the RF received signal, and according to the amplitude of the RF received signal, the radiation gain of the highly directional antenna, the radius of the hemisphere, the linear distance between the highly directional antenna and the reflector, and the The path loss of the signal feeding into the fixture, together calculate the radiation gain of the antenna under test when the mirror is at the measurement point, and use the spatial information of the location of the measurement point and the radiation gain to construct the antenna of the antenna under test Hemispherical radiation pattern. 根據申請專利範圍第6項之天線輻射場型自動量測系統,其中該控制及量測單元包括:一射頻訊號產生器,輸出一預設大小的射頻輸出訊號,該高指向性天線電連接該射頻訊號產生器以接收該射頻輸出訊號並轉換成該電磁波朝該反射鏡發射,該反射鏡 反射該電磁波到該待測天線,該待測天線接收該電磁波並轉換成一射頻接收訊號;一訊號饋入夾具,具有一探針及一攝像鏡頭,該攝像鏡頭朝向該探針設置以輔助觀測該探針影像,該探針用以碰觸該待測天線以接收該射頻接收訊號;一頻譜分析儀,電連接該訊號饋入夾具以接收該射頻接收訊號,並量測該射頻接收訊號的振幅;及一電腦,電連接該頻譜分析儀以得到該射頻接收訊號的振幅,並根據該射頻接收訊號的振幅、該高指向性天線的輻射增益、該半球面的半徑、該高指向性天線到該反射鏡之間的直線距離,及該訊號饋入夾具的路徑損耗,共同計算該反射鏡位於該量測點時該待測天線的輻射增益,且利用該等量測點所在位置的空間資訊及該等輻射增益建構該待測天線的半球面輻射場型。 According to the antenna measurement field type 6 automatic measurement system of the patent application scope, wherein the control and measurement unit includes: a radio frequency signal generator, which outputs a radio frequency output signal of a preset size, and the highly directional antenna is electrically connected to the The radio frequency signal generator receives the radio frequency output signal and converts the electromagnetic wave to the mirror, and the mirror reflects the electromagnetic wave to the antenna under test. The antenna under test receives the electromagnetic wave and converts it into a radio frequency receiving signal; a signal feed Into the fixture, there is a probe and a camera lens, the camera lens is arranged towards the probe to assist in observing the probe image, the probe is used to touch the antenna to be tested to receive the RF receiving signal; a spectrum analyzer , Electrically connecting the signal feeding fixture to receive the radio frequency receiving signal and measuring the amplitude of the radio frequency receiving signal; and a computer, electrically connecting the spectrum analyzer to obtain the amplitude of the radio frequency receiving signal, and receiving the signal according to the radio frequency Amplitude, the radiation gain of the highly directional antenna, the radius of the hemispherical surface, the linear distance between the highly directional antenna and the reflector, and the path loss of the signal fed into the fixture, together calculating the reflector is located in the When measuring points, the radiation gain of the antenna to be measured is used, and the spatial information of the locations of the measurement points and the radiation gains are used to construct the hemispherical radiation pattern of the antenna to be measured.
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