TWI728863B - Antenna radiation pattern measurement system - Google Patents
Antenna radiation pattern measurement system Download PDFInfo
- Publication number
- TWI728863B TWI728863B TW109123985A TW109123985A TWI728863B TW I728863 B TWI728863 B TW I728863B TW 109123985 A TW109123985 A TW 109123985A TW 109123985 A TW109123985 A TW 109123985A TW I728863 B TWI728863 B TW I728863B
- Authority
- TW
- Taiwan
- Prior art keywords
- probe
- arm
- central axis
- antenna
- box
- Prior art date
Links
Images
Abstract
Description
本發明是關於一種量測系統,特別是用以量測通訊晶片的天線輻射場型量測系統。 The invention relates to a measurement system, especially an antenna radiation field measurement system used for measuring communication chips.
圖1是申請案號106123414的一個實施例,在該實施例中旋臂11主要是在支架12的上方來回擺盪,並配合原地自轉的支架12對一待測天線(圖未示出,需放在支架上)進行上半球面天線輻射場型的量測。
Figure 1 is an embodiment of the application number 106123414. In this embodiment, the
參閱圖2,這種傳統設計的缺點就是:旋臂11主要是在遠離地面的上半平面來回擺盪,當旋臂如圖1中從θ=0度擺盪到θ=90度的位置時,因為地球引力g的關係會讓旋臂11承受一個往下的重力f=m×g,但隨後卻需要用馬達產生的扭力對抗重力及慣性力的兩個力量,逆勢轉動旋臂11向上轉換運動方向,因此會產生馬達瞬間功耗上升及震動的問題。
Refer to Figure 2. The disadvantage of this traditional design is that the
另外,這個先前技術也不適用於直接量測內含天線的晶片。 In addition, this prior art is not suitable for direct measurement of a chip containing an antenna.
為了解決先前技術的問題,本發明提出了一種天線輻射場型量測系統。 In order to solve the problems of the prior art, the present invention proposes an antenna radiation field pattern measurement system.
本發明天線輻射場型量測系統包括一測試箱、一治具單元 及一縮距場量測裝置。 The antenna radiation field measurement system of the present invention includes a test box and a fixture unit And a distance measuring device.
該測試箱包括一位於箱頂的開窗,及間隔面對該開窗的箱底。 The test box includes an opening on the top of the box, and a bottom of the box facing the opening at intervals.
該治具單元設置於該開窗的位置,用以設置一待測的通訊裝置,例如是至少包括一天線的晶片,並包括一第一承載部、一第二承載部、一連接部、一探針、一針座及一電子顯微鏡。 The jig unit is set at the position of the window to set a communication device to be tested, such as a chip that includes at least an antenna, and includes a first bearing portion, a second bearing portion, a connecting portion, and a Probe, a needle holder and an electron microscope.
該第一承載部固定在該測試箱的箱頂的開窗,且外觀呈一圓盤狀並具有一通孔。該第二承載部的外觀也呈一圓盤狀並具有一通孔,該第二承載部用以承載該待測的通訊裝置,且該第二承載部承載該待測的通訊裝置時,該第二承載部的通孔是位於該通訊裝置的下方。該第二承載部的通孔其孔徑是由窄漸寬,且鄰近該通訊裝置處的孔徑最小,遠離該通訊裝置處的孔徑最大。例如該第二承載部的通孔是呈一圓錐體截去尖角後的形狀。 The first supporting part is fixed on the opening window of the top of the test box, and the appearance is a disc shape and has a through hole. The second bearing part also has a disc-shaped appearance and has a through hole. The second bearing part is used to bear the communication device to be tested. When the second bearing part bears the communication device to be tested, the second bearing part bears the communication device to be tested. The through hole of the two supporting parts is located under the communication device. The aperture of the through hole of the second supporting portion is gradually wider from narrower, and the aperture adjacent to the communication device is the smallest, and the aperture far away from the communication device is the largest. For example, the through hole of the second bearing portion is in the shape of a cone truncated with sharp corners.
該連接部用以連接該第一承載部及該第二承載部。該探針的尖端用以碰觸該通訊裝置的一天線訊號饋入點,該探針的鈍端電連接一同軸電纜。 The connecting portion is used for connecting the first bearing portion and the second bearing portion. The tip of the probe is used to touch an antenna signal feed point of the communication device, and the blunt end of the probe is electrically connected with a coaxial cable.
該針座包括一個三向位移器、一探針夾及一延伸桿。 The needle base includes a three-way displacer, a probe clamp and an extension rod.
該三向位移器設置於該第一承載部上,該三向位移器用以連動整個該治具單元進行三維空間位移的微調,以使該探針的尖端對準該天線訊號饋入點。該探針夾設置於鄰近該第二承載部的通孔的位置,用以夾住該探針。該延伸桿的兩端分別連接該探針夾及該三向位移器,用以延伸該探針夾與該三向位移器的距離。該電子顯微鏡透過該第一承載部的通 孔對準該探針。 The three-way displacer is arranged on the first bearing part, and the three-way displacer is used for linking the entire jig unit to fine-tune the three-dimensional displacement, so that the tip of the probe is aligned with the antenna signal feed point. The probe clamp is arranged at a position adjacent to the through hole of the second carrying part to clamp the probe. Two ends of the extension rod are respectively connected with the probe clamp and the three-way displacer, so as to extend the distance between the probe clamp and the three-way displacer. The electron microscope passes through the communication of the first carrying part The hole is aligned with the probe.
該縮距場量測裝置用以量測該通訊裝置面對箱底的半球面天線輻射場型,並包括一固定基座、一內L型臂、一饋源天線、一反射器、一外L型臂、一第一旋轉器及一第二旋轉器。 The narrowing field measuring device is used to measure the radiation field pattern of the hemispherical antenna of the communication device facing the bottom of the box, and includes a fixed base, an inner L-shaped arm, a feed antenna, a reflector, and an outer L The shaped arm, a first rotator and a second rotator.
該固定基座設置於該箱底。 The fixed base is arranged at the bottom of the box.
該內L型臂包括相連接的一第一直臂及一第二直臂。 The inner L-shaped arm includes a first straight arm and a second straight arm that are connected.
該饋源天線設置於該第一直臂,該反射器設置於該第二直臂,該反射器將源自該饋源天線的電磁波反射至該治具單元的一量測區。 The feed antenna is arranged on the first straight arm, the reflector is arranged on the second straight arm, and the reflector reflects electromagnetic waves originating from the feed antenna to a measurement area of the fixture unit.
該外L型臂包括相連接的一第三直臂及一第四直臂。 The outer L-shaped arm includes a third straight arm and a fourth straight arm that are connected.
該第一旋轉器連接於該第一直臂與該第三直臂之間,該第一旋轉器驅動該內L型臂繞著一第一中心軸線在該治具單元的下方來回擺盪。 The first rotator is connected between the first straight arm and the third straight arm, and the first rotator drives the inner L-shaped arm to oscillate around a first central axis under the fixture unit.
該第二旋轉器連接於該固定基座與該第四直臂之間,該第二旋轉器驅動該外L型臂繞著一第二中心軸線自轉,該第二中心軸線與該第一中心軸線互相垂直。 The second rotator is connected between the fixed base and the fourth straight arm, and the second rotator drives the outer L-shaped arm to rotate around a second central axis, the second central axis and the first center The axes are perpendicular to each other.
本發明之效果在於:因為重力因素,將該內L型臂設計成繞著一第一中心軸線在該治具單元的下方來回擺盪會相較在該治具單元的上方來回旋轉節省功耗,特別是在該內L型臂擺盪到相對地面的最高點要反向擺盪時重力和該內L型臂擺盪的方向是一致的,而不是如先前技術是相反的,因此本發明的該第一旋轉器能以較低的功耗改變該內L型臂擺盪的方向,也同時降低馬達扭力對抗地球重力時產生的振動,另外,本發明的治具單元更適合5G封裝天線(AiP)的量測。 The effect of the present invention is that due to gravity, the inner L-shaped arm is designed to swing around a first central axis below the fixture unit to save power compared with rotating back and forth above the fixture unit. Especially when the inner L-shaped arm swings to the highest point relative to the ground to swing in the opposite direction, the gravity and the swing direction of the inner L-shaped arm are consistent, rather than the opposite as in the prior art. Therefore, the first aspect of the present invention is The rotator can change the swing direction of the inner L-shaped arm with lower power consumption, and at the same time reduce the vibration generated when the motor torque is opposed to the earth's gravity. In addition, the fixture unit of the present invention is more suitable for the amount of 5G package antenna (AiP) Measurement.
11:旋臂 11: Spiral arm
12:支架 12: Bracket
2:測試箱 2: test box
21:箱頂 21: Box top
211:開窗 211: open window
22:箱底 22: bottom of the box
3:治具單元 3: Fixture unit
31:第一承載部 31: The first bearing part
311:通孔 311: Through Hole
32:第二承載部 32: The second bearing part
321:通孔 321: Through hole
33:連接部 33: Connection part
34:探針 34: Probe
35:針座 35: Needle seat
351:三向位移器 351: Three-way Displacer
352:探針夾 352: Probe Clip
353:延伸桿 353: Extension Rod
36:電子顯微鏡 36: Electron microscope
4:縮距場量測裝置 4: Distance measurement device
41:固定基座 41: fixed base
42:內L型臂 42: inner L-arm
421:第一直臂 421: first straight arm
422:第二直臂 422: second straight arm
43:饋源天線 43: feed antenna
44:反射器 44: reflector
45:外L型臂 45: Outer L-arm
451:第三直臂 451: Third Straight Arm
452:第四直臂 452: Fourth Straight Arm
46:第一旋轉器 46: The first spinner
47:第二旋轉器 47: second spinner
5:通訊裝置 5: Communication device
θ:第一中心軸線 θ : first central axis
ψ:第二中心軸線 ψ: second central axis
第1圖是傳統天線輻射場型量測系統的示意圖。 Figure 1 is a schematic diagram of a traditional antenna radiation field measurement system.
第2圖是說明傳統天線輻射場型量測系統的缺點的示意圖。 Figure 2 is a schematic diagram illustrating the shortcomings of the traditional antenna radiation field measurement system.
第3圖是本發明較佳實施例的示意圖。 Figure 3 is a schematic diagram of a preferred embodiment of the present invention.
第4圖是本發明較佳實施例不包括測試箱的示意圖。 Figure 4 is a schematic diagram of the preferred embodiment of the present invention excluding the test box.
第5圖是本較佳實施例的治具單元的剖面示意圖。 Figure 5 is a schematic cross-sectional view of the fixture unit of the preferred embodiment.
第6圖是本發明較佳實施例不包括測試箱的另一示意圖。 Figure 6 is another schematic diagram of the preferred embodiment of the present invention excluding the test box.
第7圖是治具單元及通訊裝置的局部示意圖。 Figure 7 is a partial schematic diagram of the fixture unit and the communication device.
第8圖是說明本發明較佳實施例的優點的示意圖。 Figure 8 is a schematic diagram illustrating the advantages of the preferred embodiment of the present invention.
參閱圖3至圖4,本發明天線輻射場型量測系統的較佳實施例包括一測試箱2、一治具單元3及一縮距場量測裝置4。
3 to 4, the preferred embodiment of the antenna radiation field measurement system of the present invention includes a
該測試箱2包括一位於箱頂21的開窗211,及間隔面對該開窗211的箱底22。
The
該治具單元3設置於該開窗211的位置,用以設置一待測的通訊裝置5,例如是至少包括一天線的晶片,並包括一第一承載部31、一第二承載部32、一連接部33、一探針34(圖7)、一針座35及一電子顯微鏡36。
The
該第一承載部31固定在該測試箱2的箱頂21的開窗211,且外觀呈一圓盤狀並具有一通孔311。該第二承載部32的外觀也呈一圓盤狀並具有一通孔321,該第二承載部32用以承載該待測的通訊裝置5,且該第二
承載部32承載該待測的通訊裝置5時,該第二承載部32的通孔321該通訊裝置5的下方。該第二承載部32的通孔321其孔徑如圖7所示是由窄漸寬,且鄰近該通訊裝置5處的孔徑最小,遠離該通訊裝置5處的孔徑最大。例如該第二承載部32的通孔321是呈一圓錐體截去尖角後的形狀。
The first supporting
該連接部33用以連接該第一承載部31及該第二承載部32。該探針34的尖端用以碰觸該通訊裝置5的一天線訊號饋入點,該探針34的鈍端用以電連接同軸電纜(圖未示出)。
The connecting
見圖4及圖5,該針座35括一個三向位移器351、一探針夾352及一延伸桿353。
4 and 5, the
該三向位移器351設置於該第一承載部31上,該三向位移器351用以連動整個該治具單元3進行三維空間位移的微調,以使該探針34的尖端對準該通訊裝置5的天線訊號饋入點。該探針夾352設置於鄰近該第二承載部32的通孔321的位置,用以夾住該探針34。該延伸桿353的兩端分別連接該探針夾352及該三向位移器351,用以延伸該探針夾352與該三向位移器351的距離。該電子顯微鏡36透過該第一承載部31的通孔311對準該探針34。
The three-
該縮距場量測裝置4用以量測該通訊裝置5面對箱底22的半球面天線輻射場型,該半球面天線輻射場型的開口朝向該箱頂21,該縮距場量測裝置4包括一固定基座41、一內L型臂42、一饋源天線43、一反射器44、一外L型臂45、一第一旋轉器46及一第二旋轉器47。
The retraction
該固定基座41設置於該箱底22。
The fixed
該內L型臂42包括相連接的一第一直臂421及一第二直臂
422。
The inner L-shaped
該饋源天線43設置於垂直該箱底22的該第一直臂421上,該反射器44設置於平行該箱底22的該第二直臂422上,該反射器44將源自該饋源天線43的電磁波反射至該治具單元3的一量測區,該通訊裝置5被測試時是放置在該量測區。
The
該外L型臂45包括相連接的一第三直臂451及一第四直臂452,該第三直臂451垂直該箱底22,該第四直臂452平行該箱底22。
The outer L-shaped
該第一旋轉器46連接於該第一直臂421與該第三直臂451之間,且該第一旋轉器46受馬達驅動,進而驅動該內L型臂42繞著一第一中心軸線θ在該治具單元3的下方來回擺盪,θ的最大角度範圍是180度。
The
該第二旋轉器47連接於該固定基座41與該第四直臂452之間,該第二旋轉器47驅動該外L型臂45繞著一第二中心軸線ψ自轉,該第二中心軸線ψ與該第一中心軸線θ互相垂直,ψ的最大角度範圍是360度。
The
圖6是將該治具單元3及該縮距場量測裝置4旋轉一個角度,便於理解其構造。
FIG. 6 shows that the
本發明有益的功效在於如圖8所示,本發明將該內L型臂42設計成繞著第一中心軸線θ在該治具單元3的下方來回擺盪會相較在該治具單元3的上方來回旋轉節省功耗,特別是在該內L型臂42擺盪到相對地面的最高點要反向擺盪時重力f和該內L型臂42擺盪的方向是一致的,而不是如先前技術是相反的,因此本發明的該第一旋轉器46能以較低的功耗改變該內L型臂42擺盪的方向,也同時降低馬達扭力對抗地球重力時產生的振動,另外,本發明的治具單元3更適合5G封裝天線(AiP)的量測。
The beneficial effect of the present invention is that as shown in FIG. 8, the inner L-shaped
惟以上所述者,僅為本發明之實施例而已,當不能以此限定本發明實施之範圍,凡是依本發明申請專利範圍及專利說明書內容所作之簡單地等效變化與修飾,皆仍屬本發明專利涵蓋之範圍內。 However, the above are only examples of the present invention. When the scope of implementation of the present invention cannot be limited by this, all simple equivalent changes and modifications made according to the scope of the patent application of the present invention and the content of the patent specification still belong to This invention patent covers the scope.
3:治具單元 3: Fixture unit
31:第一承載部 31: The first bearing part
32:第二承載部 32: The second bearing part
33:連接部 33: Connection part
35:針座 35: Needle seat
351:三向位移器 351: Three-way Displacer
352:探針夾 352: Probe Clip
353:延伸桿 353: Extension Rod
36:電子顯微鏡 36: Electron microscope
4:縮距場量測裝置 4: Distance measurement device
41:固定基座 41: fixed base
42:內L型臂 42: inner L-arm
421:第一直臂 421: first straight arm
422:第二直臂 422: second straight arm
43:饋源天線 43: feed antenna
44:反射器 44: reflector
45:外L型臂 45: Outer L-arm
451:第三直臂 451: Third Straight Arm
452:第四直臂 452: Fourth Straight Arm
46:第一旋轉器 46: The first spinner
47:第二旋轉器 47: second spinner
θ:第一中心軸線 θ : first central axis
ψ:第二中心軸線 ψ: second central axis
Claims (6)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW109123985A TWI728863B (en) | 2020-07-14 | 2020-07-14 | Antenna radiation pattern measurement system |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW109123985A TWI728863B (en) | 2020-07-14 | 2020-07-14 | Antenna radiation pattern measurement system |
Publications (2)
Publication Number | Publication Date |
---|---|
TWI728863B true TWI728863B (en) | 2021-05-21 |
TW202202855A TW202202855A (en) | 2022-01-16 |
Family
ID=77036298
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW109123985A TWI728863B (en) | 2020-07-14 | 2020-07-14 | Antenna radiation pattern measurement system |
Country Status (1)
Country | Link |
---|---|
TW (1) | TWI728863B (en) |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWM580686U (en) * | 2017-11-28 | 2019-07-11 | 台灣福雷電子股份有限公司 | Testing device and testing system |
TWI676035B (en) * | 2018-09-20 | 2019-11-01 | 川升股份有限公司 | An automatic measurement system for antenna radiation pattern |
-
2020
- 2020-07-14 TW TW109123985A patent/TWI728863B/en active
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWM580686U (en) * | 2017-11-28 | 2019-07-11 | 台灣福雷電子股份有限公司 | Testing device and testing system |
TWI676035B (en) * | 2018-09-20 | 2019-11-01 | 川升股份有限公司 | An automatic measurement system for antenna radiation pattern |
Also Published As
Publication number | Publication date |
---|---|
TW202202855A (en) | 2022-01-16 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
TWI728863B (en) | Antenna radiation pattern measurement system | |
US20040150574A1 (en) | Gimballed reflector mounting platform | |
CN106885513A (en) | A kind of robot three-dimensional repetitive positioning accuracy test system | |
CN201795785U (en) | Measuring device of space moving point three-dimensional coordinate | |
CN210347782U (en) | Compact range antenna measuring system with reflecting surface positioned above quiet zone | |
CN201266180Y (en) | Measuring apparatus for reflection index of wave suction material | |
CN111735829B (en) | Automatic intelligent detection equipment | |
CN104166233A (en) | Multi-reflecting-surface rotating optical delay line device based on involute principle | |
CN104596639B (en) | Far-field three-dimensional strength representation device for semiconductor light source | |
US8474328B2 (en) | Device measuring the wind speed and the wind direction | |
CN209439591U (en) | Bonding joint device and supersonic bonding machine | |
CN204422485U (en) | The pipe ultrasonic Guided waves angle probe that absorption affinity is adjustable | |
CN215218343U (en) | Lead bonding tensile test machine | |
CN113960373A (en) | Antenna radiation pattern measuring system | |
CN110120578A (en) | A kind of 5G signal receiving antenna | |
CN109001830B (en) | A kind of device reducing absolute gravimeter falling bodies rotation error based on Inertia Based on Torsion Pendulum Method | |
CN204439208U (en) | A kind of characterization apparatus of the far field dimensional strength for semiconductor light sources | |
CN212342800U (en) | High-performance radar antenna pedestal with three-mode insect radar detection function | |
CN207824928U (en) | It is a kind of to rotate and lift duplex mechanical arm | |
CN107607062A (en) | Crank-shaft link neck phase angle full-shape measurement indexing means and method | |
CN207563785U (en) | A kind of wind-driven generator control cabinet pedestal assembles drilling equipment | |
CN209513912U (en) | Insulativity detection device is used in a kind of processing of energy-storage battery packet | |
CN208156027U (en) | A kind of low temperature two dimension vacuum sample platform | |
CN216288918U (en) | Manual cross pitching adjusting device | |
CN208026681U (en) | A kind of tube body is oblique to hinder probe bracket and failure detector |