TW202007972A - Horizontal double-sided probe device including a machine, at least one upper detection unit and at least one lower detection unit - Google Patents

Abstract

The present invention is a horizontal double-sided probe device, which includes a machine, at least one upper detection unit and at least one lower detection unit, wherein the machine includes a base, two lower slide rails and two upper slide rails, and the lower slide rail and the upper slide rail are located on the top surface of the base; each lower detection unit includes a lower seat rail and at least one lower probe member, the lower seat rail is slidably located on the lower slide rail, and the lower probe member is slidably disposed on the lower seat rail; and each upper detection unit includes an upper seat rail and at least one upper probe member, the upper seat rail is slidably located on the upper slide rail, and the upper probe member is slidably disposed on the upper seat rail. The horizontal double-sided probe device of the present invention simultaneously detects the top surface and the bottom surface of a carrier board by using the upper detection unit and the lower detection unit, and performs signal correction by using a high-frequency signal correction method and a horizontal top surface-through-bottom surface correction device to reduce errors and to improve detection accuracy.

Description

Horizontal double-sided probe equipment

This creation is a horizontal double-sided probe device, especially a horizontal double-sided probe device that can increase the detection efficiency and improve the detection accuracy by double-sided probe detection.

For printed circuit board (Printed circuit board, PCB for short) or carrier board carrying many integrated circuit (integrated circuit, IC for short) components, a single-sided probe testing equipment is usually used for testing. The surface probe detection device includes a carrier board and a plurality of probes, the plurality of probes are arranged on the carrier board at intervals, the one end of the plurality of probes has a needle, and the user first performs high-frequency signal on the plurality of probes After the calibration, the plurality of needles of the single-sided probe testing device are brought into contact with the carrier board to be tested for electrical connection, that is, the purpose of testing the carrier boards of the plurality of integrated circuit components is achieved.

However, the detection of the single-sided probe detection device contacts the side of the carrier board through the plurality of probes, and can only be used for the detection of the carrier board on which a plurality of integrated circuit elements are provided on one side. Faster, the operating bandwidth and working speed are getting faster and faster. In order to meet this demand, the transmission path of the integrated circuit needs to be shortened as much as possible. Therefore, most integrated circuit components are placed on a loading board and the corresponding circuit layout is performed. The top surface of the package carrier board is equipped with a plurality of solder pads with integrated circuit components, and the bottom surface of the package carrier board is used to reposition the signal output terminal of the circuit layout, so that the signal transmission path can be located on the top surface of the package carrier board The soldering pad is transmitted to the signal output end of the bottom surface of the package carrier. However, the single-sided probe inspection device cannot perform double-sided inspection. Therefore, there is no way to perform double-sided inspection on the top and bottom surfaces of the package carrier.

In order to solve the above problems, a vertical double-sided inspection device capable of detecting both sides of the package carrier is developed. The vertical double-sided inspection device includes a carrier, two rotators, two probe holders and two probes. Two rotators are located on both sides of the stage, the two probe holders are respectively arranged on the two rotators, the two probes are respectively arranged on the two probe holders, and the two rotators can control the rotation of the two probe holders , So that the two probe bases can be rotatably converted into a vertical state or a horizontal state. After the user first performs high-frequency signal correction on the plural probes in a horizontal state, the user passes the two probe bases through the two The rotator rotates into a vertical state, and installs the package carrier board with a plurality of soldering pads on the stage, so that the package carrier board assumes a vertical state, and the two probe holders control the two probes in the package The two sides of the carrier board are inspected to achieve the purpose of simultaneously inspecting both sides of the package carrier board.

However, when the vertical double-sided detection device performs high-frequency signal correction, the user needs to perform high-frequency signal correction on the two probe bases in a horizontal state. After the signal correction of the two probe bases is completed, the The two probe bases are rotated into a vertical state, and the package carrier board is mounted on the stage in a vertical state, so that the detection of the vertical double-sided detection equipment can be performed. During the rotation of the two probe bases, As a result, the original signal correction value loses its accuracy, which in turn affects the accuracy of detection, resulting in a problem of low accuracy.

The main purpose of this creation is to provide a horizontal double-sided probe device, so as to improve the problem that the existing single-sided probe detection device cannot perform double-sided detection, and to improve the problem that the vertical double-sided detection device has low detection accuracy.

In order to achieve the purpose of pre-disclosure, the original horizontal double-sided probe equipment includes: a machine, which includes a base, four pillars, two lower rails, two crossbars, two rails and two upper rails, the Four pillars are arranged on the top surface of the base, and the two lower rails are arranged on the top surface of the base along an X axis. The two lower rails are parallel to each other. The two cross bars are respectively spanned on the two pillars along the Y axis, the two rails are provided on the two cross bars along the X axis, and the two ends of the two upper slide rails are connected to the X axis along the X axis On the four pillars, the two upper slide rails are parallel to each other; at least the lower test unit, the lower test unit is slidably straddled on the two lower slide rails, each lower test unit includes two lowering devices, a lower seat rail and at least one lower A probe piece, the two down-regulators are respectively slidably arranged on the two down rails, and the two ends of the lower seat rail are respectively arranged on the two down-regulators along the Y axis and are received by the two down-regulators Controlling lifting, the lower probe member is slidably arranged on the lower seat rail, the lower probe member comprises a lower probe seat and a lower probe head, the lower probe seat is slidably arranged on the lower seat On the rail, the lower probe head is arranged on the lower probe base; and at least one upper test unit, the upper test unit is slidably straddled on the two upper slide rails, each upper test unit includes two adjustments Lifter, an upper seat rail and at least one upper probe piece, the two lifters are respectively slidably arranged on the two upper slide rails, and the two ends of the upper seat rail are respectively arranged on the two adjusters along the Y axis The upper probe is slidably arranged on the upper seat rail. The upper probe piece includes an upper probe base and an upper probe head. The upper The probe seat is slidably arranged on the upper seat rail, and the upper probe head is arranged on the upper probe seat.

In the original horizontal double-sided probe device, the lower test unit and the upper test unit allow a user to slide a carrier board onto the two rack rails to make the carrier board detect horizontally. The top surface and bottom surface of the board can be detected by the lower probe member and the upper probe member at the same time, to achieve the effect of double-sided detection, and the user corrects the method by high-frequency signals, and the horizontal top and bottom surface through correction The signal correction of the lower test unit and the upper test unit is performed, and the lower test unit and the upper test unit are corrected by the horizontal signal. The carrier board slides into the two rails to perform horizontal detection, reducing The errors caused by the rotation of the lower probe base and the upper probe base maintain accurate signal correction, and the lower probe part and the upper probe part can be adjusted and displaced along the X axis or the Y axis, It can effectively improve the accuracy and practicality of detection.

As shown in FIGS. 1 to 3, it discloses a preferred embodiment of the creative horizontal double-sided probe device. As can be seen from the drawings, the creative horizontal double-sided probe device includes a machine 10, at least the following test Unit 20 and at least one upper test unit 30.

As shown in FIGS. 2, 5 and 7, the machine 10 includes a base 11, four pillars 12, two lower rails 13, two cross bars 14, two rails 15 and two upper rails 16, the four pillars 12 is provided on the top surface of the base 11, the two lower rails 13 are provided on the top surface of the base 11 along an X axis, the two lower rails 13 are parallel to each other, and the two ends of the two lower rails 13 are respectively connected A strut 12, the two cross bars 14 span the two struts 12 along the Y axis, the two rails 15 are placed on the two cross bars 14 along the X axis, and the two upper slide rails 16 Both ends are connected to the four pillars 12 along the X axis, and the two upper slide rails 16 are parallel to each other.

As shown in FIG. 3, FIG. 5 and FIG. 8, the lower testing unit 20 is slidably straddled on the two lower sliding rails 13, and each lower testing unit 20 includes two down regulators 21, a lower seat rail 22 and at least one lower The probe member 23, the two down-regulators 21 are respectively slidably disposed on the two down rails 13, and the two ends of the lower seat rail 22 are respectively disposed on the two down-regulators 21 along the Y axis and are received The two lowering controllers 21 control the ascent and descent, the lower probe member 23 is slidably disposed on the lower seat rail 22, the lower probe member 23 includes a lower probe seat 24 and a lower probe head 25, the lower The probe base 24 is slidably disposed on the lower base rail 22, and the lower probe head 25 is disposed on the lower probe base 24, wherein the lower testing unit 20 includes a lower camera 26, which 26 is slidably disposed on the lower seat rail 22, the lower camera 26 includes a lower camera seat 27 and a lower camera 28, the lower camera seat 27 is slidably disposed on the lower seat rail 22, the lower camera 28 is set on the lower camera base 27, each lower probe base 24 has a lower fine-tuning wheel 29, the lower fine-tuning wheel 29 can adjust the lower probe head 25 to move up and down, and the second down regulator 21 is a pneumatic lifter. In the embodiment, the number of the lower test unit 20 is two, and the lower test unit 20 includes a lower camera 26.

As shown in FIG. 2, FIG. 4 and FIG. 6, the upper test unit 30 is slidably straddled on the two upper slide rails 16, and each upper test unit 30 includes two lifters 31, an upper seat rail 32 and at least one upper The probe member 33, the two regulators 31 are respectively slidably disposed on the two upper slide rails 16, and both ends of the upper seat rail 32 are respectively disposed on the two regulators 31 along the Y axis and are received The two lifters 31 are controlled to move up and down. The upper probe member 33 is slidably disposed on the upper seat rail 32. The upper probe member 33 includes an upper probe seat 34 and an upper probe head 35. The upper probe base 34 is slidably disposed on the upper seat rail 32, and the upper probe head 35 is disposed on the upper probe base 34, wherein the upper measurement unit 30 includes an upper camera 36, which The member 36 is slidably disposed on the upper seat rail 32. The upper camera member 36 includes an upper camera seat 37 and an upper camera 38. The upper camera seat 37 is slidably disposed on the upper seat rail 32. The upper camera The device 38 is disposed on the upper camera base 37. Each upper probe base 34 has an upper fine-tuning wheel 39. The upper fine-tuning wheel 39 can adjust the upper probe head 35 to move up and down. The second lifter 31 is a pneumatic lifter In this embodiment, the number of the upper testing unit 30 is two, the number of the upper probes 33 of each upper testing unit 30 is two, and the upper camera 36 of each upper testing unit 30 The number is one each.

As shown in FIG. 9, FIG. 10 and FIG. 12, the operation mode of a preferred embodiment of the horizontal double-sided probe device of the present invention is disclosed. The second lifter 31 of the upper test unit 30 adjusts to lower the lower seat rail 22 of the lower test unit 20, and the upper seat rail 32 of the upper test unit 30 rises, so that the two rack rails 15 There is space for installation on both sides for PCB placement. The user installs a number of integrated circuit (IC) components 41 on the top and bottom surfaces of a carrier board 40, and then uses high-frequency signal correction techniques , The user corrects the signals of the lower test unit 20 and the upper test unit 30 with a horizontal top and bottom pass-through corrector (not shown), so that the lower test unit 20 and the upper test unit 30 The measurement unit 30 can perform signal correction in a horizontal state. After the signals of the lower measurement unit 20 and the upper measurement unit 30 are corrected, the carrier board 40 is slid onto the two rack rails 15 and the two adjustments are adjusted. The lowerer 21 and the two lifters 31 bring the lower seat rail 22 and the upper seat rail 32 close to the carrier board 40, and the lower probe member 23 of the lower seat rail 22 and the upper probe on the upper seat rail 32 The piece 33 can be close to the carrier board 40, and the user can start the measurement operation.

As shown in FIG. 9, FIG. 11 and FIG. 12, the operation mode of one preferred embodiment of the present horizontal double-sided probe device is disclosed. The user uses the lower probe member 23 of the lower seat rail 22 and the The upper probe piece 33 on the upper seat rail 32 can approach the carrier board 40 to start the measurement operation, and the lower seat rail 22 of the lower test unit 20 can be adjusted along the X axis on the slide rail 13 according to the user's needs Slip, and adjust the lower probe base 24 of the lower probe member 23 to slide along the Y axis on the lower seat rail 22, and slide to the position of the bottom surface of the carrier board 40 to be detected, then the downward probe The needle 25 detects the integrated circuit element 41 on the bottom surface of the carrier board 40. Similarly, it can be seen that the upper seat rail 32 can be adjusted to slide along the X axis according to the user's needs, and the upper probe seat of the upper probe member 33 34 slides along the Y axis on the upper seat rail 32 to the position of the top surface detected by the carrier board 40, then the upper probe head 35 can detect the integrated circuit element 41 of the top surface of the carrier board 40 , The top surface and the bottom surface of the carrier board 40 can be simultaneously detected to improve the efficiency of the detection operation, and after the horizontal signal correction of the lower probe base 24 and the upper probe base 34, the accuracy of the signal correction can be maintained and improved Detection accuracy.

In the above, when the user detects that the carrier board 40 is completed, the user can adjust through the second down-regulator 21 and the second up-regulator 31, so that the lower seat rail 22 descends and the upper seat rail 32 rises. Both the down-regulator 21 and the two up-regulators 31 are pneumatic lifters, which can speed up the movement speed of the lower seat rail 22 and the upper seat rail 32, and can quickly replace the carrier board 40 from the two rack rails 15 To improve the convenience of replacing the carrier board 40, and the number of the lower test unit 20 and the upper test unit 30 can be increased or decreased according to the user's needs, which can meet the user's inspection of the carrier board 40 Demand, to enhance the practicality of the original horizontal double-sided probe equipment.

In addition, the lower test unit 20 includes a lower camera 26 that can slide on the lower seat rail 22 through the lower camera seat 27 and view the lower probe member 23 through the lower camera 28 Whether the bottom surface of the carrier board 40 is accurately detected, for the same reason, the upper test unit 30 can view the upper probe member 33 through the upper camera 38 of the upper camera member 36 to detect the top surface of the carrier board 40, the lower The camera 26 and the upper camera 36 can check the accuracy of the detection, and in order to make the detection accuracy more accurate, the user can use the lower fine adjustment wheel 29 to adjust the lower probe head 25 to raise and lower, and use the upper fine adjustment The wheel 39 adjusts the up and down of the upper probe head 35 to achieve a more subtle and accurate detection result.

To sum up, in the original horizontal double-sided probe device, through the lower test unit 20 and the upper test unit 30, the top surface and the bottom surface of the carrier board 40 can be simultaneously received by the lower probe member 23 and the The detection of the upper probe member 33 achieves the effect of double-sided detection, and the signal correction of the lower test unit 20 and the upper test unit 30 is in a horizontal state, and the carrier board 40 is slid into the two rack rails 15 to perform Horizontal detection reduces the errors caused by the rotation of the lower probe base 24 and the upper probe base 34. Maintaining the accuracy of the signal correction can improve the accuracy of detection. In addition, by adjusting the two down-converters 21 Lowering the raising of the second lifter 31, the lower seat rail 22 and the upper seat rail 32 are quickly away from the two rack rails 15, so that the carrier board 40 can be quickly replaced from the two rack rails 15 and lifted Convenience of replacing the carrier board 40.

10 ‧ ‧ ‧ machine 11 ‧ ‧ ‧ base 12 ‧ ‧ ‧ pillar 13 ‧ ‧ ‧ slide rail 14 ‧ ‧ ‧ cross bar 15 ‧ ‧ ‧ rail 16 ‧ ‧ ‧ upper slide rail 20 ‧ ‧ ‧ lower test unit 21 ‧‧‧Lower adjuster 22‧‧‧Lower rail 23‧‧‧Lower probe piece 24‧‧‧Lower probe holder 25‧‧‧Lower probe head 26‧‧‧Lower camera 27‧‧‧Lower camera Base 28 ‧ ‧ ‧ lower camera 29 ‧ ‧ ‧ lower fine adjustment wheel 30 ‧ ‧ ‧ upper test unit 31 ‧ ‧ ‧ lifter 32 ‧ ‧ ‧ upper seat rail 33 ‧ ‧ ‧ upper probe 34 ‧ ‧ ‧ upper probe Base 35‧‧‧ Upper probe head 36‧‧‧ Upper camera 37‧‧‧ Upper camera base 38‧‧‧ Upper camera 39‧‧‧ Upper trim wheel 40‧‧‧ Carrier board 41‧‧‧ Integrated circuit element

Figure 1: A three-dimensional schematic diagram of a preferred embodiment of the original horizontal double-sided probe device. Figure 2: A perspective schematic view of the probe holder exploded on one of the preferred embodiments of the original horizontal double-sided probe device. Figure 3: A perspective schematic view of a probe holder under one preferred embodiment of the original horizontal double-sided probe device. Figure 4: A schematic top view of a preferred embodiment of the original horizontal double-sided probe device. Figure 5: A schematic side view of a preferred embodiment of the horizontal double-sided probe device of the present invention. Fig. 6: A schematic front view of a preferred embodiment of the original horizontal double-sided probe device. Fig. 7: A schematic top view of a carrier of a preferred embodiment of the horizontal double-sided probe device of the present invention. Figure 8: A schematic top view of a probe holder under one of the preferred embodiments of the original horizontal double-sided probe device. Fig. 9: A three-dimensional schematic view of the installation of one of the preferred embodiments of the horizontal double-sided probe device. Fig. 10: a schematic top view of a mounting frame of a preferred embodiment of a horizontal double-sided probe device of the present invention. Fig. 11: A schematic top view of the installation of one preferred embodiment of the horizontal double-sided probe device of the present invention. Fig. 12: A schematic cross-sectional side view of the installation of a preferred embodiment of the horizontal double-sided probe device of the present invention.

10‧‧‧machine

11‧‧‧Dock

12‧‧‧ Pillar

13‧‧‧sliding track

14‧‧‧crossbar

15‧‧‧Rack

16‧‧‧upper rail

21‧‧‧Lower

22‧‧‧Lower seat rail

23‧‧‧ Lower probe

30‧‧‧Test unit

31‧‧‧Lift regulator

32‧‧‧Top rail

33‧‧‧Upper probe

34‧‧‧Upper probe holder

36‧‧‧Upper video

37‧‧‧up camera

38‧‧‧Up camera

39‧‧‧up fine adjustment wheel

Claims (5)

A horizontal double-sided probe device includes: a machine including a base, four pillars, two lower rails, two cross bars, two rails and two upper rails, and the four pillars are arranged on the On the top surface of the base, the two slide rails are arranged on the top surface of the base along an X axis. The two slide rails are parallel to each other. Two ends of the two slide rails are respectively connected to a pillar, and the two cross bars are respectively along A Y axially spans the two pillars, the two rails are axially disposed on the two crossbars along the X axis, and two ends of the two upper rails are axially connected to the four pillars along the X axis, the The two upper slide rails are parallel to each other; at least the lower test unit, the lower test unit is slidably straddled on the two lower slide rails, each lower test unit includes two lowerers, a lower seat rail and at least one probe member, the The two down regulators are respectively slidably arranged on the two down rails, and the two ends of the lower seat rail are respectively arranged on the two down regulators along the Y axis and are controlled by the two down regulators to move up and down. The lower probe member is slidably arranged on the lower seat rail. The lower probe member comprises a lower probe seat and a lower probe head. The lower probe seat is slidably arranged on the lower seat rail. The probe head is arranged on the lower probe base; and at least one upper measuring unit, the upper measuring unit is slidably straddled on the two upper slide rails, each upper measuring unit includes two lifters and an upper base Rail and at least one upper probe, the two regulators are respectively slidably arranged on the two upper slide rails, and the two ends of the upper seat rail are respectively arranged on the two regulators along the Y axis and are received The two lifters control lifting, and the upper probe piece is slidably arranged on the upper seat rail, the upper probe piece includes an upper probe seat and an upper probe head, and the upper probe seat is slidable The upper probe head is arranged on the upper probe base. The horizontal double-sided probe device according to claim 1, wherein the lower testing unit includes a lower camera, the lower camera is slidably disposed on the lower seat rail, and the lower camera includes a lower camera seat And a camera, the lower camera seat is slidably provided on the lower seat rail, the lower camera is provided on the lower camera seat, the upper test unit includes an upper camera, the upper camera is slidably The upper camera is provided on the upper seat rail. The upper camera includes an upper camera seat and an upper camera. The upper camera seat is slidably provided on the upper seat rail. The upper camera is provided on the upper camera seat. The horizontal double-sided probe device according to claim 1, wherein each lower probe base has a lower fine adjustment wheel, the lower fine adjustment wheel can adjust the lifting of the lower probe head, and each upper probe base has an upper fine adjustment Wheel, the upper fine adjustment wheel can adjust the up and down of the upper probe head. The horizontal double-sided probe device according to claim 2, wherein each lower probe base has a lower fine adjustment wheel, the lower fine adjustment wheel can adjust the lower probe head to move up and down, and each upper probe base has an upper fine adjustment Wheel, the upper fine adjustment wheel can adjust the up and down of the upper probe head. The horizontal double-sided probe device according to any one of claims 1 to 4, wherein both the second down-converter and the second up-regulator are pneumatic lifters.

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