TW201935017A - Probe detection device and detection module thereof - Google Patents

Probe detection device and detection module thereof Download PDF

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TW201935017A
TW201935017A TW107103451A TW107103451A TW201935017A TW 201935017 A TW201935017 A TW 201935017A TW 107103451 A TW107103451 A TW 107103451A TW 107103451 A TW107103451 A TW 107103451A TW 201935017 A TW201935017 A TW 201935017A
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probe
electrode
bearing surface
detection device
pressure sensor
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TW107103451A
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Chinese (zh)
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TWI630396B (en
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張軒誠
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中華精測科技股份有限公司
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Abstract

A probe detection device includes a detection module and a probe holder. The detection module includes a carrying platform, a pressing member arranged at intervals on the carrying platform, a pressure sensor mounted on a side of the pressing member facing the carrying platform, a first electrode mounted on the pressing member and located on a side of the pressure sensor facing the carrying platform, and a second electrode mounted on the carrying platform and spaced apart from the first electrode. The probe holder is disposed between the first electrode and the second electrode. The probe detection device can perform a detection operation and can allow the probe to pass through the probe holder so that the opposite ends of the probe can respectively pierce through the probe holder. The pressing member can move toward the carrying platform so that the first electrode and the second electrode can respectively press against the opposite ends of the probe. In addition, the present disclosure also provides a detection module of a probe detection device.

Description

探針檢測裝置及其檢測模組 Probe detection device and detection module

本發明涉及一種檢測裝置,尤其涉及一種探針檢測裝置及其檢測模組。 The invention relates to a detection device, in particular to a probe detection device and a detection module thereof.

現有的探針裝置(探針卡)所使用的各種探針,例如:微機電(MEMS)矩形探針、頂針式(pogo)探針、及圓形線針等,在使用上因其功能性的不同,需要具有耐電流特性或者機械力回復特性等規格。然而,現有的探針檢測裝置在探針製造完畢後,並未能夠對探針進行有效地檢測。 Various probes used in existing probe devices (probe cards), such as micro-electromechanical (MEMS) rectangular probes, pogo probes, and round wire needles, etc. are used due to their functionality Different specifications require specifications such as current resistance characteristics or mechanical force recovery characteristics. However, the existing probe detection device cannot effectively detect the probe after the probe is manufactured.

於是,本發明人認為上述缺陷可改善,乃特潛心研究並配合科學原理的運用,終於提出一種設計合理且有效改善上述缺陷的本發明。 Therefore, the present inventor believes that the above-mentioned defects can be improved, and with special research and cooperation with the application of scientific principles, he finally proposes an invention with a reasonable design and effective improvement of the above-mentioned defects.

本發明實施例在於提供一種探針檢測裝置及其檢測模組,能有效地改善現有探針檢測裝置所可能產生的缺陷。 An embodiment of the present invention is to provide a probe detection device and a detection module thereof, which can effectively improve defects that may occur in the existing probe detection device.

本發明實施例公開一種探針檢測裝置,包括:一檢測模組,包含:一承載台,具有一承載面;一下壓元件,間隔地設置於所述承載面的上方;一壓力感測器,安裝於所述下壓元件的面向所述承載面的一側;一第一電極,安裝於所述下壓元件並位於所述壓力感測器的面向所述承載面的一側、且與所述壓力感測器彼此電性絕緣;及一第二電極,安裝於所述承載面上、且與所述第一 電極呈間隔設置;以及一探針固定座,設置於所述第一電極及所述第二電極之間、且可拆卸地裝設於所述承載台的所述承載面;其中,所述探針檢測裝置能執行一檢測作業,並用以提供一探針穿設於所述探針固定座,以使得所述探針的位於相反兩端的一第一端部及一第二端部分別穿出所述探針固定座;其中,當所述探針檢測裝置執行所述檢測作業時,所述下壓元件能朝所述承載面的方向移動,以使得所述第一電極壓觸所述探針的所述第一端部,並且使得所述第二電極壓觸所述探針的所述第二端部;其中,所述第一電極及所述第二電極能用來提供所述探針一電流,並且所述壓力感測器能用來感測所述下壓元件對所述探針所造成的一壓力值。 An embodiment of the present invention discloses a probe detection device, including: a detection module including: a bearing platform having a bearing surface; a pressing element arranged at intervals above the bearing surface; a pressure sensor, Mounted on a side of the pressing member facing the bearing surface; a first electrode mounted on the pressing member and located on a side of the pressure sensor facing the bearing surface, and connected to The pressure sensors are electrically insulated from each other; and a second electrode is mounted on the bearing surface and is separated from the first The electrodes are arranged at intervals; and a probe fixing base is provided between the first electrode and the second electrode and is detachably mounted on the bearing surface of the bearing platform; wherein the probe The needle detection device can perform a detection operation and is used to provide a probe penetrating the probe fixing base, so that a first end portion and a second end portion of the probe at opposite ends are respectively penetrated. The probe fixing base; wherein when the probe detection device performs the detection operation, the pressing element can move toward the bearing surface, so that the first electrode is pressed against the probe The first end portion of the needle, and the second electrode being pressed against the second end portion of the probe; wherein the first electrode and the second electrode can be used to provide the probe A needle is a current, and the pressure sensor can be used to sense a pressure value caused by the depression element to the probe.

本發明實施例另公開一種探針檢測裝置的檢測模組,用以容置一探針固定座及定位於所述探針固定座的一探針,包括:一承載台,具有一承載面;一下壓元件,間隔地設置於所述承載面的上方;一壓力感測器,安裝於所述下壓元件的面向所述承載面的一側;一第一電極,安裝於所述下壓元件並位於所述壓力感測器的面向所述承載面的一側、且與所述壓力感測器彼此電性絕緣;以及一第二電極,安裝於所述承載面上、且與所述第一電極呈間隔設置;其中,所述下壓元件能朝所述承載面的方向移動,用以使所述第一電極壓觸於所述探針的一端,並使所述第二電極壓觸於所述探針的另一端;其中,所述第一電極及所述第二電極能用來提供所述探針一電流,並且所述壓力感測器能用來感測所述下壓元件對所述探針所造成的一壓力值。 The embodiment of the invention further discloses a detection module of a probe detection device, which is used for accommodating a probe fixing base and a probe positioned on the probe fixing base, comprising: a bearing platform with a bearing surface; The pressing element is disposed above the bearing surface at intervals; a pressure sensor is installed on the side of the pressing element facing the bearing surface; a first electrode is installed on the pressing element And is located on a side of the pressure sensor facing the bearing surface, and is electrically insulated from the pressure sensor; and a second electrode is installed on the bearing surface and is separated from the first electrode. One electrode is arranged at intervals; wherein the pressing element can be moved in the direction of the bearing surface, so that the first electrode is pressed against one end of the probe, and the second electrode is pressed against At the other end of the probe; wherein the first electrode and the second electrode can be used to provide a current to the probe, and the pressure sensor can be used to sense the depression element A pressure value applied to the probe.

綜上所述,本發明實施例的探針檢測裝置及其檢測模組,能通過所述第一電極及第二電極提供探針電流、且通過所述壓力感測器感測下壓元件對探針所造成的壓力值,而能檢測所述探針的性能,並且能提升所述探針的檢測效率。 In summary, the probe detection device and its detection module according to the embodiments of the present invention can provide a probe current through the first electrode and the second electrode, and sense a pair of depression elements through the pressure sensor. The pressure value caused by the probe can detect the performance of the probe, and can improve the detection efficiency of the probe.

為能更進一步瞭解本發明的特徵及技術內容,請參閱以下有 關本發明的詳細說明與附圖,但是此等說明與附圖僅用來說明本發明,而非對本發明的保護範圍作任何的限制。 In order to further understand the features and technical contents of the present invention, please refer to the following The detailed description and drawings of the present invention are used to explain the present invention, but not to limit the scope of the present invention.

100‧‧‧探針檢測裝置 100‧‧‧ Probe detection device

1‧‧‧檢測模組 1‧‧‧Detection Module

11‧‧‧承載台 11‧‧‧bearing platform

111‧‧‧承載面 111‧‧‧bearing surface

112‧‧‧凹槽 112‧‧‧Groove

12‧‧‧下壓元件 12‧‧‧Press-down element

13‧‧‧壓力感測器 13‧‧‧Pressure sensor

14‧‧‧第一電極 14‧‧‧first electrode

15‧‧‧絕緣層 15‧‧‧ Insulation

16‧‧‧第二電極 16‧‧‧Second electrode

17‧‧‧影像擷取單元 17‧‧‧Image Acquisition Unit

2‧‧‧探針固定座 2‧‧‧ Probe Holder

21‧‧‧第一導板 21‧‧‧The first guide plate

211‧‧‧第一通孔 211‧‧‧First through hole

22‧‧‧第二導板 22‧‧‧Second Guide

221‧‧‧第二通孔 221‧‧‧Second through hole

23‧‧‧支撐體 23‧‧‧ support

24‧‧‧容置空間 24‧‧‧ accommodation space

P‧‧‧探針 P‧‧‧Probe

P1‧‧‧第一端部 P1‧‧‧first end

P2‧‧‧第二端部 P2‧‧‧Second end

P3‧‧‧中間段 P3‧‧‧ middle section

圖1為本發明實施例探針檢測裝置的側視示意圖。 FIG. 1 is a schematic side view of a probe detection device according to an embodiment of the present invention.

圖2為圖1的探針檢測裝置的局部放大示意圖。 FIG. 2 is a partially enlarged schematic diagram of the probe detection device of FIG. 1.

圖3為本發明實施例的第一電極及第二電極分別壓觸探針的第一端部及第二端部的示意圖。 FIG. 3 is a schematic diagram of the first electrode and the second electrode respectively pressing the first end portion and the second end portion of the probe according to the embodiment of the present invention.

圖4為本發明實施例的探針檢測裝置執行極限電流值檢測作業的模擬分析圖。 FIG. 4 is a simulation analysis diagram of the limit current value detection operation performed by the probe detection device according to the embodiment of the present invention.

圖5為本發明實施例的探針檢測裝置執行極限壓力值檢測作業的模擬分析圖。 FIG. 5 is a simulation analysis diagram of a probe detection device performing an extreme pressure value detection operation according to an embodiment of the present invention.

請參閱圖1至圖5,為本發明的實施例,需先說明的是,本實施例對應附圖所提及的相關數量與外型,僅用來具體地說明本發明的實施方式,以便於了解本發明的內容,而非用來侷限本發明的保護範圍。 Please refer to FIG. 1 to FIG. 5, which are embodiments of the present invention. It should be noted that this embodiment corresponds to the related quantities and appearances mentioned in the drawings, and is only used to specifically describe the embodiments of the present invention, In order to understand the content of the present invention, it is not intended to limit the protection scope of the present invention.

[探針檢測裝置] [Probe detection device]

如圖1及圖2,本發明的實施例公開一種探針檢測裝置100,包括一檢測模組1及可拆卸地裝設於所述檢測模組1的一探針固定座2。其中,所述探針檢測裝置100能執行一檢測作業,並用以提供一探針P穿設於探針固定座2,以使得所述探針P的位於相反兩端的一第一端部P1及一第二端部P2分別穿出探針固定座2(如圖2),並且使得所述檢測模組1能測得所述探針P的一極限電流值(耐電流特性規格)或一極限壓力值(機械力回復特性規格)。以下將分別說明本實施例探針檢測裝置100的各個元件具體 構造,而後再適時說明探針檢測裝置100的各個元件間的連接關係。 As shown in FIG. 1 and FIG. 2, an embodiment of the present invention discloses a probe detection device 100 including a detection module 1 and a probe fixing base 2 detachably mounted on the detection module 1. Wherein, the probe detection device 100 can perform a detection operation and is used to provide a probe P passing through the probe fixing base 2 so that a first end portion P1 and a first end portion of the probe P at opposite ends and A second end portion P2 penetrates the probe fixing base 2 (as shown in FIG. 2), and enables the detection module 1 to measure a limit current value (current resistance characteristic specification) or a limit of the probe P. Pressure value (mechanical force recovery characteristic specification). Hereinafter, each element of the probe detection device 100 of this embodiment will be specifically described. The structure, and then the connection relationship between the various elements of the probe detection device 100 will be described in due course.

所述檢測模組1包含一承載台11、一下壓元件12、一壓力感測器13、一第一電極14、一絕緣層15、一第二電極16、一電流供應單元(圖未繪示)、及一下壓元件控制單元(圖未繪示)。 The detection module 1 includes a supporting platform 11, a pressing element 12, a pressure sensor 13, a first electrode 14, an insulating layer 15, a second electrode 16, and a current supply unit (not shown in the figure). ), And a pressing element control unit (not shown).

請繼續參閱圖2,所述承載台11具有一承載面111,並且所述承載面111凹設形成有一凹槽112。其中,所述承載面111能用以承載探針固定座2,而所述凹槽112能用以容置所述探針P的第二端部P2。所述下壓元件12是間隔地設置於承載面111的上方,也就是說,所述下壓元件12是位於承載面111的上方、且與承載面111間隔一段距離。在本實施例中,所述下壓元件12可以例如是一機械力下壓螺桿,但本發明不受限於此。 Please continue to refer to FIG. 2, the supporting platform 11 has a supporting surface 111, and the supporting surface 111 is concavely formed with a groove 112. The supporting surface 111 can be used to carry the probe fixing base 2, and the groove 112 can be used to receive the second end portion P2 of the probe P. The pressing elements 12 are disposed above the bearing surface 111 at intervals, that is, the pressing elements 12 are located above the bearing surface 111 and spaced apart from the bearing surface 111. In this embodiment, the pressing-down element 12 may be, for example, a mechanical pressing-down screw, but the present invention is not limited thereto.

再者,所述壓力感測器13(如:受力讀值元件)是安裝於下壓元件12的面向承載面111的一側(如圖2中安裝於下壓元件12的下側)。所述第一電極14是安裝於下壓元件12並位於壓力感測器13的面向承載面111的一側(如圖2中位於壓力感測器13的下側)、且與所述壓力感測器13彼此電性絕緣。較佳地,所述壓力感測器13與第一電極14之間是通過設置有絕緣層15而彼此電性絕緣,但本發明不受限於此。所述第二電極16是安裝於承載面111上、且與所述第一電極14呈間隔設置。更詳細地說,所述第二電極16是安裝於承載台11的凹槽112中,並且所述凹槽112能用來提供探針P的第二端部P2穿設並壓觸第二電極16。藉此,所述凹槽112能用來限制所述探針P的第二端部P2突伸出所述探針固定座2的長度,以提升檢測作業的準確度。 Furthermore, the pressure sensor 13 (such as a force reading element) is installed on the side of the pressing member 12 facing the bearing surface 111 (as shown in FIG. 2, it is installed on the lower side of the pressing member 12). The first electrode 14 is mounted on the pressing element 12 and is located on a side of the pressure sensor 13 facing the bearing surface 111 (as shown on the lower side of the pressure sensor 13 in FIG. 2), and is connected to the pressure sensor. The measuring devices 13 are electrically insulated from each other. Preferably, the pressure sensor 13 and the first electrode 14 are electrically insulated from each other by providing an insulating layer 15, but the present invention is not limited thereto. The second electrode 16 is mounted on the bearing surface 111 and is disposed at a distance from the first electrode 14. In more detail, the second electrode 16 is installed in the groove 112 of the supporting platform 11, and the groove 112 can be used to provide a second end portion P2 of the probe P to penetrate and press the second electrode. 16. Therefore, the groove 112 can be used to limit the length of the second end portion P2 of the probe P protruding from the probe fixing base 2 to improve the accuracy of the detection operation.

另,所述電流供應單元(圖未繪示)是電性連接於第一電極14及第二電極16、且能用來經由第一電極14及第二電極16而提供一電流給所述探針P(如圖3,當第一電極14及第二電極16分 別地壓觸探針P的第一端部P1及第二端部P2),以使得所述探針檢測裝置100能測得探針P的極限電流值(耐電流特性)。所述下壓元件控制單元(圖未繪示)能控制下壓元件12朝承載面111的方向移動的位移量,以使得所述探針檢測裝置100能測得探針P的極限壓力值(機械力回復特性),其中,所述位移量的解析度是介於0.01微米至0.1微米之間。 In addition, the current supply unit (not shown) is electrically connected to the first electrode 14 and the second electrode 16 and can be used to provide a current to the probe via the first electrode 14 and the second electrode 16. Pin P (as shown in Figure 3, when the first electrode 14 and the second electrode 16 minutes The first end portion P1 and the second end portion P2) of the probe P are pressed separately, so that the probe detection device 100 can measure the limit current value (current resistance characteristic) of the probe P. The pressing element control unit (not shown) can control the displacement of the pressing element 12 moving in the direction of the bearing surface 111 so that the probe detection device 100 can measure the limit pressure value of the probe P ( Mechanical force recovery characteristic), wherein the resolution of the displacement amount is between 0.01 micrometer and 0.1 micrometer.

值得一提的是,由於探針裝置在實際針測時,所述探針裝置的探針需受到一下壓機械力來接觸且刺穿待測點的表面氧化物(如:晶圓的待測點的表面氧化物);因此,所述探針檢測裝置100需配置有精密可控的下壓元件12(位移量的解析度介於0.01微米至0.1微米之間),以使得所述探針檢測裝置100能夠模擬探針裝置的實際檢測環境,並且使得所述探針檢測裝置100能夠獲得準確的檢測結果。再者,由於所述下壓元件12在下壓的同時需同步測得探針P的反作用力,以獲得探針P的機械力回復特性,因此下壓元件12與探針P的接觸端需配置有壓力感測器13。 It is worth mentioning that when the probe device is in the actual needle test, the probe of the probe device needs to be pressed by mechanical force to contact and pierce the surface oxide of the point to be measured (such as the wafer to be tested). Point surface oxide); therefore, the probe detection device 100 needs to be equipped with a precisely controllable down-pressing element 12 (the resolution of the displacement amount is between 0.01 micrometer and 0.1 micrometer) so that the probe The detection device 100 can simulate an actual detection environment of the probe device, and enables the probe detection device 100 to obtain an accurate detection result. Furthermore, since the pressing force of the pressing element 12 needs to be measured simultaneously with the reaction force of the probe P to obtain the mechanical force recovery characteristics of the probe P, the contact ends of the pressing element 12 and the probe P need to be configured.有 压力 ensor13。 There is a pressure sensor 13.

請繼續參閱圖2,所述探針固定座2是設置於檢測模組1的第一電極14及第二電極16之間,並且所述探針固定座2是可拆卸地裝設於所述承載台11的承載面111。 Please continue to refer to FIG. 2, the probe fixing base 2 is disposed between the first electrode 14 and the second electrode 16 of the detection module 1, and the probe fixing base 2 is detachably installed on the detection module 1. The bearing surface 111 of the bearing platform 11.

更具體地說,所述探針固定座2包含一第一導板21、與所述第一導板21呈間隔設置的一第二導板22、及設置於所述第一導板21及第二導板22之間且呈透明狀的一支撐體23。所述第一導板21形成有一第一通孔211,所述第二導板22形成有位置對應於第一通孔211的一第二通孔221,並且所述第一導板21、第二導板22、及支撐體23共同形成有一容置空間24。其中,所述探針固定座2能用來提供所述探針P依序地穿設第一導板21的第一通孔211及第二導板22的第二通孔221,以使得所述探針P的第一端部P1穿出第一導板21、使得所述探針P的第二端部P2穿出第二 導板22、並使得所述探針P的中間段P3位於第一導板21及第二導板22之間且容置於所述容置空間24中。在本發明的一實施例中,所述第一導板21較佳地是可相對於第二導板22移動,以調整第一導板21與第二導板22之間的距離,但本發明不受限於此。 More specifically, the probe fixing base 2 includes a first guide plate 21, a second guide plate 22 spaced from the first guide plate 21, and the first guide plate 21 and A supporting body 23 is transparent between the second guide plates 22. The first guide plate 21 is formed with a first through hole 211, the second guide plate 22 is formed with a second through hole 221 corresponding to the first through hole 211, and the first guide plate 21, the first The two guide plates 22 and the supporting body 23 together form an accommodating space 24. Wherein, the probe fixing base 2 can be used to provide the probe P to sequentially pass through the first through hole 211 of the first guide plate 21 and the second through hole 221 of the second guide plate 22, so that The first end portion P1 of the probe P penetrates the first guide plate 21 so that the second end portion P2 of the probe P penetrates a second The guide plate 22 is such that the middle section P3 of the probe P is located between the first guide plate 21 and the second guide plate 22 and is accommodated in the accommodation space 24. In an embodiment of the present invention, the first guide plate 21 is preferably movable relative to the second guide plate 22 to adjust the distance between the first guide plate 21 and the second guide plate 22, but this The invention is not limited to this.

再者,所述探針檢測裝置100的檢測模組1進一步包含有一影像顯示單元(圖未繪示)及一影像擷取單元17。其中,所述影像擷取單元17的位置是對應於支撐體23(如圖1的支撐體23的右側);所述影像擷取單元17能通過呈透明狀的支撐體23來擷取探針P的形變影像;而所述影像顯示單元能用來顯示所述探針P的形變影像,以方便檢測人員觀察。其中,所述影像顯示單元可以例如是液晶顯示器(Liquid Crystal Display,LCD),而所述影像擷取單元17可以例如是感光耦合元件(Charge-coupled Device,CCD)或互補式金屬氧化物半導體(Complementary Metal-Oxide-Semiconductor,CMOS),但本發明不受限於此。 Furthermore, the detection module 1 of the probe detection device 100 further includes an image display unit (not shown) and an image capture unit 17. Wherein, the position of the image capturing unit 17 corresponds to the supporting body 23 (as shown on the right side of the supporting body 23); the image capturing unit 17 can capture the probe through the transparent supporting body 23 Deformation image of P; and the image display unit can be used to display the deformation image of the probe P to facilitate inspection personnel to observe. The image display unit may be, for example, a liquid crystal display (LCD), and the image capture unit 17 may be, for example, a Charge-coupled Device (CCD) or a complementary metal oxide semiconductor (CCD). Complementary Metal-Oxide-Semiconductor (CMOS), but the present invention is not limited to this.

藉此,本發明實施例的探針檢測裝置100的探針固定座2,能通過第一導板21可相對於第二導板22移動,而使得檢測人員能根據待檢測的探針P的規格(如:長度規格),而調整第一導板21與第二導板22之間的距離,從而使得所述探針檢測裝置100能適用於檢測各種不同規格的探針P。 Thereby, the probe fixing base 2 of the probe detection device 100 of the embodiment of the present invention can be moved relative to the second guide plate 22 through the first guide plate 21, so that the inspector can detect the position of the probe P according to the Specifications (such as length specifications), and the distance between the first guide plate 21 and the second guide plate 22 is adjusted, so that the probe detection device 100 can be adapted to detect probes P of various specifications.

再者,本發明實施例的探針檢測裝置100的探針固定座2,能通過所述支撐體23呈透明狀、及所述影像擷取單元17的位置對應於支撐體23,而使得檢測人員能通過影像顯示單元、影像擷取單元17及支撐體23來觀察探針P的形變影像,從而提升檢測作業的方便性。 Furthermore, the probe fixing base 2 of the probe detection device 100 according to the embodiment of the present invention can make the detection through the support 23 being transparent and the position of the image capturing unit 17 corresponding to the support 23. The personnel can observe the deformation image of the probe P through the image display unit, the image capturing unit 17 and the support body 23, thereby improving the convenience of the detection operation.

另,由於本發明實施例的探針檢測裝置100的探針固定座2是可拆卸地裝設於承載台11的承載面111,因此檢測人員可根據待檢測的探針P的形貌或數量,而更換不同設計的探針固定座2,以使得所述探針檢測裝置100能適用於檢測各種不同形貌的探針 P(如:微機電矩形探針、頂針式探針、或圓形線針)、或能適用於檢測各種不同數量的探針P(如:由單一探針P的檢測延伸至多個探針P的檢測)。 In addition, since the probe fixing base 2 of the probe detection device 100 according to the embodiment of the present invention is detachably installed on the bearing surface 111 of the bearing platform 11, the inspector can determine the shape or number of the probes P to be detected. The probe fixing base 2 with a different design is replaced, so that the probe detection device 100 can be adapted to detect probes with various shapes. P (such as micro-electromechanical rectangular probes, thimble probes, or round wire needles), or can be suitable for detecting various different numbers of probes P (such as: from the detection of a single probe P to multiple probes P Detection).

值得一提的是,當所述探針檢測裝置100需同時檢測多個探針P時(大批量檢測),所述探針固定座2的第一導板21及第二導板22能分別形成有多個第一通孔211及多個第二通孔221(圖未繪示),以使得每個所述探針P能依序地穿設於第一導板21的相對應的第一通孔211及第二導板22的相對應的第二通孔221。 It is worth mentioning that when the probe detection device 100 needs to detect a plurality of probes P at the same time (high-volume detection), the first guide plate 21 and the second guide plate 22 of the probe holder 2 can be respectively A plurality of first through holes 211 and a plurality of second through holes 221 (not shown) are formed, so that each of the probes P can be sequentially passed through the corresponding first through holes of the first guide plate 21. A through hole 211 and a corresponding second through hole 221 of the second guide plate 22.

如圖2及圖3,當所述探針檢測裝置100執行檢測作業時,所述下壓元件12能通過下壓元件控制單元的控制而朝承載台11的承載面111的方向移動(如圖2),以使得所述第一電極14壓觸探針P的第一端部P1,並且使得所述第二電極16壓觸探針P的第二端部P2(如圖3)。其中,所述第一電極14及第二電極16能通過電流供應單元提供探針P電流,並且所述壓力感測器13能用來感測下壓元件12對探針P所造成的一壓力值(也就是探針P對下壓元件12所造成的反作用力)。 As shown in FIG. 2 and FIG. 3, when the probe detection device 100 performs a detection operation, the pressing element 12 can be moved toward the bearing surface 111 of the bearing platform 11 by the control of the pressing element control unit (as shown in FIG. 2). 2), so that the first electrode 14 is pressed against the first end portion P1 of the probe P, and the second electrode 16 is pressed against the second end portion P2 of the probe P (see FIG. 3). The first electrode 14 and the second electrode 16 can provide a probe P current through a current supply unit, and the pressure sensor 13 can be used to sense a pressure caused by the depression element 12 on the probe P. Value (that is, the reaction force of the probe P to the pressing member 12).

藉此,本發明實施例的探針檢測裝置100,能通過所述第一電極14及第二電極16提供探針P電流、且通過所述壓力感測器13感測下壓元件12對探針P所造成的壓力值,而使得所述探針檢測裝置100能模擬探針裝置在實際進行半導體晶圓測試時的環境(同時對探針P施加電流訊號及下壓力)、能檢測所述探針P的性能、且能提升所述探針P的檢測效率。 Thereby, the probe detection device 100 according to the embodiment of the present invention can provide a probe P current through the first electrode 14 and the second electrode 16, and sense the pair of probes of the depression element 12 through the pressure sensor 13. The pressure value caused by the needle P, so that the probe detection device 100 can simulate the environment of the probe device when the semiconductor wafer is actually tested (simultaneously applying a current signal and a down force to the probe P), and can detect the The performance of the probe P can improve the detection efficiency of the probe P.

更詳細地說,本發明實施例的檢測作業能進一步區分為一極限電流值檢測作業(檢測探針P的耐電流特性規格)、及一極限壓力值檢測作業(檢測探針P的機械力回復特性規格)。 In more detail, the detection operation of the embodiment of the present invention can be further divided into a limit current detection operation (the current resistance characteristic specification of the detection probe P) and a limit pressure detection operation (the mechanical force recovery of the detection probe P). Feature Specifications).

如圖4,當所述探針檢測裝置100執行極限電流值檢測作業且壓力感測器13感測的壓力值提升至一預定值(8kgf/cm2至12 kgf/cm2)時,所述探針檢測裝置100能停止下壓元件12的移動、且逐漸提升所述電流的電流值直至探針P斷裂(如圖4的壓力值會因探針P斷裂而有下降的趨勢),而所述探針P斷裂時的電流的電流值定義為探針P的極限電流值,藉此,所述探針檢測裝置100可精準地量測出待測試的探針P的耐電流特性規格。 As shown in FIG. 4, when the probe detection device 100 performs a limit current value detection operation and the pressure value sensed by the pressure sensor 13 is raised to a predetermined value (8 kgf / cm 2 to 12 kgf / cm 2 ), the The probe detection device 100 can stop the movement of the pressing element 12 and gradually increase the current value of the current until the probe P is broken (as shown in FIG. 4, the pressure value tends to decrease due to the breakage of the probe P). The current value of the current when the probe P is broken is defined as the limit current value of the probe P, whereby the probe detection device 100 can accurately measure the current-resistant characteristic specification of the probe P to be tested.

如圖5,當所述探針檢測裝置100執行極限壓力值檢測作業且第一電極14及第二電極16提供給探針P的電流的電流值為一預定值時,所述探針檢測裝置100能使下壓元件12繼續朝承載面111的方向移動(以使得壓力值逐漸地提升)直至探針斷裂(如圖5的電流值會因探針P斷裂而有下降的趨勢),而所述探針斷裂時的壓力感測器13感測的壓力值定義為探針P的極限壓力值,藉此,所述探針檢測裝置100可精準地量測出待測試的探針P的機械力回復特性規格。 As shown in FIG. 5, when the probe detection device 100 performs a limit pressure value detection operation and the current value of the current provided by the first electrode 14 and the second electrode 16 to the probe P is a predetermined value, the probe detection device 100 can make the pressing element 12 continue to move in the direction of the bearing surface 111 (so that the pressure value gradually increases) until the probe is broken (as shown in Figure 5, the current value will tend to decrease due to the break of the probe P), and The pressure value sensed by the pressure sensor 13 when the probe is broken is defined as the limit pressure value of the probe P, whereby the probe detection device 100 can accurately measure the mechanism of the probe P to be tested. Force recovery characteristic specifications.

[探針檢測裝置的檢測模組] [Detection module of probe detection device]

如圖2,本發明的實施例另公開一種探針檢測裝置100的檢測模組1,用以容置一探針固定座2及定位於所述探針固定座2的一探針P。所述探針檢測裝置100的檢測模組1包括一承載台11、一下壓元件12、一壓力感測器13、一第一電極、及一第二電極16。所述承載台11具有一承載面111。所述下壓元件12間隔地設置於承載面111的上方。所述壓力感測器13安裝於下壓元件12的面向承載面111的一側。所述第一電極14安裝於下壓元件12並位於壓力感測器13的面向承載面111的一側、且與所述壓力感測器13彼此電性絕緣。所述第二電極16安裝於承載面111上、且與所述第一電極14呈間隔設置。 As shown in FIG. 2, an embodiment of the present invention further discloses a detection module 1 of a probe detection device 100 for accommodating a probe fixing base 2 and a probe P positioned on the probe fixing base 2. The detection module 1 of the probe detection device 100 includes a carrier 11, a pressing element 12, a pressure sensor 13, a first electrode, and a second electrode 16. The supporting platform 11 has a supporting surface 111. The down-pressing elements 12 are disposed above the supporting surface 111 at intervals. The pressure sensor 13 is mounted on a side of the pressing member 12 facing the bearing surface 111. The first electrode 14 is mounted on the pressing element 12 and is located on a side of the pressure sensor 13 facing the bearing surface 111, and is electrically insulated from the pressure sensor 13. The second electrode 16 is mounted on the bearing surface 111 and is disposed at a distance from the first electrode 14.

其中,所述下壓元件12能朝承載面111的方向移動,用以使所述第一電極14壓觸於探針P的一端,並使所述第二電極16壓觸於探針P的另一端。其中,所述第一電極14及第二電極16能 用來提供探針P一電流,並且所述壓力感測器13能用來感測下壓元件12對探針P所造成的一壓力值(也就是探針P對下壓元件12所造成的反作用力)。 Wherein, the pressing element 12 can be moved in the direction of the bearing surface 111, so that the first electrode 14 is pressed against one end of the probe P, and the second electrode 16 is pressed against the probe P. another side. The first electrode 14 and the second electrode 16 can The probe P is used to provide a current, and the pressure sensor 13 can be used to sense a pressure value caused by the pressing element 12 on the probe P (that is, the pressure caused by the probe P on the pressing element 12). Reaction force).

[本發明實施例的技術效果] [Technical effect of the embodiment of the present invention]

綜上所述,本發明實施例的探針檢測裝置100,能通過所述第一電極14及第二電極16提供探針電流、且通過所述壓力感測器13感測下壓元件12對探針P所造成的壓力值,而能檢測所述探針P的性能、並且能提升所述探針P的檢測效率。 In summary, the probe detection device 100 according to the embodiment of the present invention can provide a probe current through the first electrode 14 and the second electrode 16 and sense the pair of depression elements 12 through the pressure sensor 13. The pressure value caused by the probe P can detect the performance of the probe P, and can improve the detection efficiency of the probe P.

再者,所述探針檢測裝置100能通過對探針P選擇性地執行極限電流值檢測作業或極限壓力值檢測作業,以精準地量測出待測試的探針P的耐電流特性規格或機械力回復特性規格。 In addition, the probe detection device 100 can selectively perform a limit current value detection operation or a limit pressure value detection operation on the probe P to accurately measure the current-resistant characteristic specification or Mechanical force recovery characteristic specifications.

以上所述僅為本發明的優選可行實施例,並非用來侷限本發明的保護範圍,凡依本發明申請專利範圍所做的均等變化與修飾,皆應屬本發明的權利要求書的保護範圍。 The above are only the preferred and feasible embodiments of the present invention, and are not intended to limit the scope of protection of the present invention. Any equal changes and modifications made in accordance with the scope of patent application of the present invention shall fall within the protection scope of the claims of the present invention .

Claims (10)

一種探針檢測裝置,包括:一檢測模組,包含:一承載台,具有一承載面;一下壓元件,間隔地設置於所述承載面的上方;一壓力感測器,安裝於所述下壓元件的面向所述承載面的一側;一第一電極,安裝於所述下壓元件並位於所述壓力感測器的面向所述承載面的一側、且與所述壓力感測器彼此電性絕緣;及一第二電極,安裝於所述承載面上、且與所述第一電極呈間隔設置;以及一探針固定座,設置於所述第一電極及所述第二電極之間、且可拆卸地裝設於所述承載台的所述承載面;其中,所述探針檢測裝置能執行一檢測作業,並用以提供一探針穿設於所述探針固定座,以使得所述探針的位於相反兩端的一第一端部及一第二端部分別穿出所述探針固定座;其中,當所述探針檢測裝置執行所述檢測作業時,所述下壓元件能朝所述承載面的方向移動,以使得所述第一電極壓觸所述探針的所述第一端部,並且使得所述第二電極壓觸所述探針的所述第二端部;其中,所述第一電極及所述第二電極能用來提供所述探針一電流,並且所述壓力感測器能用來感測所述下壓元件對所述探針所造成的一壓力值。 A probe detection device includes: a detection module including: a bearing platform having a bearing surface; a pressing element arranged at intervals above the bearing surface; and a pressure sensor mounted on the lower portion A side of the pressure element facing the bearing surface; a first electrode installed on the lower pressure element and located on a side of the pressure sensor facing the bearing surface and connected to the pressure sensor Are electrically insulated from each other; and a second electrode is installed on the bearing surface and is disposed at a distance from the first electrode; and a probe fixing seat is provided on the first electrode and the second electrode And is detachably installed on the bearing surface of the bearing platform; wherein the probe detecting device can perform a detecting operation and is used to provide a probe passing through the probe fixing base, So that a first end portion and a second end portion of the probe at opposite ends respectively penetrate the probe fixing base; wherein, when the probe detection device performs the detection operation, the The pressing element can move in the direction of the bearing surface to The first electrode is pressed against the first end portion of the probe, and the second electrode is pressed against the second end portion of the probe; wherein the first electrode and all The second electrode can be used to provide a current to the probe, and the pressure sensor can be used to sense a pressure value caused by the pressing element to the probe. 如請求項1所述的探針檢測裝置,其中,當所述探針檢測裝置執行所述檢測作業且所述壓力感測器感測的所述壓力值提升至一預定值時,所述探針檢測裝置能停止所述下壓元件的移動、且逐漸提升所述電流的電流值直至所述探針斷裂,而所述探針斷裂時的所述電流的所述電流值定義為所述探針的一極 限電流值。 The probe detection device according to claim 1, wherein when the probe detection device performs the detection operation and the pressure value sensed by the pressure sensor is raised to a predetermined value, the probe The needle detection device can stop the movement of the pressing element and gradually increase the current value of the current until the probe is broken, and the current value of the current when the probe is broken is defined as the probe. One pole of the needle Limit current value. 如請求項1所述的探針檢測裝置,其中,當所述探針檢測裝置執行所述檢測作業且所述第一電極及所述第二電極提供給所述探針的所述電流的電流值為一預定值時,所述探針檢測裝置能使所述下壓元件繼續朝所述承載面的方向移動直至所述探針斷裂,而所述探針斷裂時的所述壓力感測器感測的所述壓力值定義為所述探針的一極限壓力值。 The probe detection device according to claim 1, wherein when the probe detection device performs the detection operation and the first electrode and the second electrode provide the current of the current to the probe When the value is a predetermined value, the probe detecting device can make the pressing member continue to move toward the bearing surface until the probe is broken, and the pressure sensor when the probe is broken The sensed pressure value is defined as a limit pressure value of the probe. 如請求項1所述的探針檢測裝置,其中,所述探針固定座包含一第一導板及與所述第一導板呈間隔設置的一第二導板,所述探針固定座能用來提供所述探針依序地穿設所述第一導板及所述第二導板,以使得所述探針的所述第一端部穿出所述所述第一導板,且使得所述探針的所述第二端部穿出所述第二導板;其中,所述第一導板可相對於所述第二導板移動。 The probe detection device according to claim 1, wherein the probe fixing base comprises a first guide plate and a second guide plate spaced from the first guide plate, and the probe fixing base It can be used to provide the probe to pass through the first guide plate and the second guide plate in order, so that the first end portion of the probe penetrates the first guide plate. And the second end portion of the probe is allowed to pass out of the second guide plate; wherein the first guide plate is movable relative to the second guide plate. 如請求項4所述的探針檢測裝置,其中,所述探針固定座進一步包含設置於所述第一導板及所述第二導板之間且呈透明狀的一支撐體;其中,所述檢測模組進一步包含有位置對應於所述支撐體的一影像擷取單元,並且所述影像擷取單元能通過所述支撐體來擷取所述探針的形變影像。 The probe detection device according to claim 4, wherein the probe fixing base further includes a transparent body disposed between the first guide plate and the second guide plate and having a transparent shape; wherein, The detection module further includes an image capturing unit corresponding to the support, and the image capturing unit can capture the deformation image of the probe through the support. 如請求項1所述的探針檢測裝置,其中,所述承載台的所述承載面凹設形成有一凹槽,所述第二電極安裝於所述凹槽中,並且所述凹槽用來提供所述探針的所述第二端部穿設並壓觸所述第二電極。 The probe detection device according to claim 1, wherein the bearing surface of the bearing platform is concavely formed with a groove, the second electrode is installed in the groove, and the groove is used for The second end portion of the probe is provided to penetrate and press the second electrode. 如請求項1所述的探針檢測裝置,其中,所述檢測模組進一步包含有一電流供應單元及一下壓元件控制單元;其中,所述電流供應單元電性連接於所述第一電極及所述第二電極、且能用來提供所述電流給所述探針;其中,所述下壓元件控制單元能控制所述下壓元件朝所述承載面的方向移動的位移量,並且所述位移量的解析度是介於0.01微米至0.1微米之間。 The probe detection device according to claim 1, wherein the detection module further includes a current supply unit and a pressing element control unit; wherein the current supply unit is electrically connected to the first electrode and the The second electrode can be used to provide the current to the probe; wherein the depression element control unit can control a displacement amount of the depression element moving toward the bearing surface, and the The resolution of the displacement is between 0.01 microns and 0.1 microns. 一種探針檢測裝置的檢測模組,用以容置一探針固定座及定位於所述探針固定座的一探針,包括:一承載台,具有一承載面;一下壓元件,間隔地設置於所述承載面的上方;一壓力感測器,安裝於所述下壓元件的面向所述承載面的一側;一第一電極,安裝於所述下壓元件並位於所述壓力感測器的面向所述承載面的一側、且與所述壓力感測器彼此電性絕緣;以及一第二電極,安裝於所述承載面上、且與所述第一電極呈間隔設置;其中,所述下壓元件能朝所述承載面的方向移動,用以使所述第一電極壓觸於所述探針的一端,並使所述第二電極壓觸於所述探針的另一端;其中,所述第一電極及所述第二電極能用來提供所述探針一電流,並且所述壓力感測器能用來感測所述下壓元件對所述探針所造成的一壓力值。 A detection module of a probe detection device is used for accommodating a probe fixing base and a probe positioned on the probe fixing base, comprising: a bearing platform with a bearing surface; a pressing element, spaced apart The pressure sensor is disposed above the bearing surface; a pressure sensor is installed on a side of the pressing member facing the bearing surface; a first electrode is installed on the pressing member and located on the pressure sensor; A side of the sensor facing the bearing surface and electrically insulated from the pressure sensor; and a second electrode mounted on the bearing surface and disposed at a distance from the first electrode; Wherein, the pressing element can be moved in the direction of the bearing surface, so that the first electrode is pressed against one end of the probe, and the second electrode is pressed against the probe. The other end; wherein the first electrode and the second electrode can be used to provide a current to the probe, and the pressure sensor can be used to sense the pressure of the probe on the probe. A pressure value caused. 如請求項8所述的探針檢測裝置的檢測模組,其中,所述承載台的所述承載面凹設形成有一凹槽,所述第二電極安裝於所述凹槽中,並且所述凹槽用來提供所述探針的所述第二端部穿設並壓觸所述第二電極。 The detection module of the probe detection device according to claim 8, wherein the bearing surface of the bearing platform is concavely formed with a groove, the second electrode is installed in the groove, and the The groove is used for providing the second end portion of the probe to pass through and press against the second electrode. 如請求項8所述的探針檢測裝置的檢測模組,其進一步包括有一電流供應單元及一下壓元件控制單元;其中,所述電流供應單元電性連接於所述第一電極及所述第二電極、且能用來提供所述電流給所述探針;其中,所述下壓元件控制單元能控制所述下壓元件朝所述承載面方向移動的位移量,並且所述位移量的解析度是介於0.01微米至0.1微米之間。 The detection module of the probe detection device according to claim 8, further comprising a current supply unit and a pressing element control unit; wherein the current supply unit is electrically connected to the first electrode and the first electrode. Two electrodes and can be used to provide the current to the probe; wherein the pressing element control unit can control a displacement amount of the pressing element moving toward the bearing surface, and the displacement amount is The resolution is between 0.01 microns and 0.1 microns.
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