TW201932394A - Wafer-transport vehicle and wafer-carrier detection method - Google Patents

Wafer-transport vehicle and wafer-carrier detection method Download PDF

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TW201932394A
TW201932394A TW107102029A TW107102029A TW201932394A TW 201932394 A TW201932394 A TW 201932394A TW 107102029 A TW107102029 A TW 107102029A TW 107102029 A TW107102029 A TW 107102029A TW 201932394 A TW201932394 A TW 201932394A
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wafer
detecting
door panel
wafer cassette
warning signal
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TW107102029A
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TWI638760B (en
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詹翔安
李忠憲
蕭鳳儒
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台灣積體電路製造股份有限公司
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Abstract

A wafer-transport vehicle includes a carrying device including a receiving space and a detection area connected to the receiving space; a hoist device disposed in the receiving space configured to moving a wafer carrier into the receiving space; and a detection device disposed on the carrying device, and configured to detect the position of the door of the wafer carrier, and configured to generates a warning signal when the door of the wafer carrier is located at the detection area.

Description

晶圓運輸載具以及晶圓盒偵測方法 Wafer transport carrier and wafer cassette detection method

本揭露主要關於一種晶圓運輸載具以及晶圓盒偵測方法,尤指一種具有偵測裝置之晶圓運輸載具以及利用偵測裝置偵測晶圓盒之偵測方法。 The disclosure relates to a wafer transport vehicle and a wafer cassette detecting method, and more particularly to a wafer transport vehicle with a detecting device and a detecting method for detecting a wafer cassette by using the detecting device.

半導體設備已使用於多種電子上的應用,例如個人電腦、手機、數位相機、以及其他電子設備。半導體設備基本上依序經由沈積絕緣層或介電層、導電層、以及半導體層之材料至一晶圓、以及使用微影技術圖案化多種材料層來形成電路組件以及元件於其上而被製造。許多積體電路一般製造於一單一晶圓,且晶圓上個別的晶粒於積體電路之間沿著一切割線被切割分離。舉例而言,個別的晶粒基本上被分別的封裝於一多晶片模組或是其他類型的封裝。 Semiconductor devices have been used in a variety of electronic applications, such as personal computers, cell phones, digital cameras, and other electronic devices. The semiconductor device is manufactured substantially by sequentially depositing a material of a dielectric layer or a dielectric layer, a conductive layer, and a semiconductor layer to a wafer, and patterning a plurality of material layers using lithography techniques to form circuit components and components thereon. . Many integrated circuits are typically fabricated on a single wafer, and individual dies on the wafer are cut and separated along a cutting line between the integrated circuits. For example, individual dies are substantially packaged separately in a multi-wafer module or other type of package.

為了能使晶圓於不同之半導體設備中移動,發展了一種懸吊式搬運系統。雖然目前之懸吊式搬運系統符合了其使用之目的,但尚未滿足許多其他方面的要求。因此,需要提供懸吊式搬運系統的改進方案。 In order to enable wafers to move in different semiconductor devices, a suspended handling system has been developed. Although the current suspension handling system meets its purpose for use, it has not yet met many other requirements. Therefore, there is a need to provide an improved solution for a suspended handling system.

本揭露之一些實施例提供一種晶圓運輸載具,包括:一乘載裝置,具有一容置空間以及與容置空間連接之一偵 測區域;一懸吊裝置,設置於容置空間內,且被配置用以將一晶圓盒移動至容置空間內;以及一偵測裝置,設置於乘載裝置上,被配置用於偵測晶圓盒之門板的位置,以當門板位於偵測區域內時,發出一警告訊號。 Some embodiments of the present disclosure provide a wafer transport carrier, including: a carrying device having a receiving space and a connection with the receiving space a measuring device; a suspension device disposed in the accommodating space and configured to move a wafer cassette into the accommodating space; and a detecting device disposed on the loading device and configured to detect The position of the door panel of the wafer cassette is measured to emit a warning signal when the door panel is located in the detection area.

本揭露之一些實施例提供了一種晶圓盒偵測方法,包括:經由一懸吊裝置將一晶圓盒晶圓運輸載具從一半導體設備吊起,並朝向一乘載裝置之一容置空間內移動;以及於懸吊裝置移動晶圓盒的過程中,當晶圓盒之一門板位於連接於容置空間之一偵測區域內時,一偵測裝置發出一第一警告訊號。 Some embodiments of the present disclosure provide a method for detecting a wafer cassette, comprising: lifting a wafer cassette wafer transport carrier from a semiconductor device via a suspension device and accommodating one of the carrier devices Moving in the space; and in the process of moving the wafer cassette by the suspension device, when a door panel of the wafer cassette is located in a detection area connected to the receiving space, a detecting device sends a first warning signal.

1‧‧‧晶圓運輸載具 1‧‧‧ wafer transport vehicle

10‧‧‧乘載裝置 10‧‧‧Carriage device

11‧‧‧下開口 11‧‧‧ opening

12‧‧‧側開口 12‧‧‧ side opening

13‧‧‧滑槽 13‧‧‧Chute

14‧‧‧側壁 14‧‧‧ side wall

20‧‧‧懸吊裝置 20‧‧‧suspension device

30‧‧‧偵測裝置 30‧‧‧Detection device

31‧‧‧止擋元件 31‧‧‧stop element

311‧‧‧滑塊 311‧‧‧ Slider

312‧‧‧止擋片 312‧‧‧stop film

313‧‧‧接觸面 313‧‧‧Contact surface

314、315‧‧‧導電片 314, 315‧‧‧ conductive sheet

32‧‧‧偵測元件 32‧‧‧Detection components

34‧‧‧訊號發射器 34‧‧‧Signal transmitter

35‧‧‧訊號接受器 35‧‧‧Signal Receiver

33‧‧‧防護元件 33‧‧‧ protective elements

A1‧‧‧晶圓運輸系統 A1‧‧‧ wafer transport system

A10‧‧‧半導體設備 A10‧‧‧Semiconductor equipment

A11‧‧‧裝載埠 A11‧‧‧Loading equipment

A20‧‧‧晶圓儲存設備 A20‧‧‧ wafer storage equipment

A21‧‧‧承載座 A21‧‧‧ bearing seat

A22‧‧‧第二裝載埠 A22‧‧‧Second loader

A30‧‧‧懸吊式搬運系統 A30‧‧‧suspension handling system

A31‧‧‧軌道 A31‧‧ Track

B1‧‧‧晶圓盒 B1‧‧‧ wafer cassette

B11‧‧‧外殼 B11‧‧‧ Shell

B12‧‧‧門板 B12‧‧‧ door panel

B13‧‧‧扣合元件 B13‧‧‧ fastening components

C1‧‧‧角度 C1‧‧‧ angle

D1‧‧‧懸吊方向 D1‧‧‧ hanging direction

S1‧‧‧容置空間 S1‧‧‧ accommodating space

S2‧‧‧偵測區域 S2‧‧‧Detection area

W1‧‧‧晶圓 W1‧‧‧ wafer

第1圖為根據本揭露之一些實施例中晶圓運輸系統的示意圖。 1 is a schematic diagram of a wafer transport system in accordance with some embodiments of the present disclosure.

第2圖為根據本揭露之一些實施例中晶圓運輸載具的立體圖。 2 is a perspective view of a wafer transport carrier in accordance with some embodiments of the present disclosure.

第3圖為根據本揭露之一些實施例中止擋元件的立體圖。 Figure 3 is a perspective view of a stop element in accordance with some embodiments of the present disclosure.

第4圖為根據本揭露之一些實施例中晶圓運輸載具的示意圖,其中晶圓盒之門板位於一蓋合位置。 4 is a schematic illustration of a wafer transport carrier in accordance with some embodiments of the present disclosure, wherein the door panel of the wafer cassette is in a closed position.

第5圖為根據本揭露之一些實施例中晶圓運輸載具的示意圖,其中晶圓盒之門板位於一鬆脫位置。 Figure 5 is a schematic illustration of a wafer transport carrier in accordance with some embodiments of the present disclosure, wherein the door panel of the wafer cassette is in a releasable position.

第6圖為根據本揭露之一些實施例中晶圓運輸載具的示意圖。 Figure 6 is a schematic illustration of a wafer transport carrier in accordance with some embodiments of the present disclosure.

第7圖為根據本揭露之一些實施例中晶圓運輸載具的示意 圖。 Figure 7 is a schematic illustration of a wafer transport carrier in accordance with some embodiments of the present disclosure. Figure.

第8圖為根據本揭露之一些實施例中晶圓運輸載具的立體圖。 Figure 8 is a perspective view of a wafer transport carrier in accordance with some embodiments of the present disclosure.

第9圖為根據本揭露之一些實施例中晶圓運輸載具的示意圖。 Figure 9 is a schematic illustration of a wafer transport carrier in accordance with some embodiments of the present disclosure.

第10圖為根據本揭露之一些實施例中晶圓運輸載具的示意圖。 Figure 10 is a schematic illustration of a wafer transport carrier in accordance with some embodiments of the present disclosure.

第11圖為根據本揭露之一些實施例中晶圓盒偵測方法的流程圖。 11 is a flow chart of a method for detecting a wafer cassette in accordance with some embodiments of the present disclosure.

以下之說明提供了許多不同的實施例、或是例子,用來實施本揭露之不同特徵。以下特定例子所描述的元件和排列方式,僅用來精簡的表達本揭露實施例,其僅作為例子,而並非用以限制本揭露實施例。例如,第一特徵在一第二特徵上或上方的結構之描述包括了第一和第二特徵之間直接接觸,或是以另一特徵設置於第一和第二特徵之間,以致於第一和第二特徵並不是直接接觸。 The following description provides many different embodiments, or examples, for implementing the various features of the disclosure. The components and arrangements described in the following specific examples are only used to simplify the disclosure of the disclosed embodiments, which are merely by way of example, and are not intended to limit the disclosed embodiments. For example, the description of the structure of the first feature on or above a second feature includes direct contact between the first and second features, or another feature disposed between the first and second features such that The first and second features are not in direct contact.

此外,本說明書於不同的例子中沿用了相同的元件標號及/或文字。前述之沿用僅為了簡化以及明確,並不表示於不同的實施例以及設定之間必定有關聯。 In addition, the same reference numerals and/or characters are used in the present description in the different examples. The foregoing is merely for purposes of simplicity and clarity and is not intended to be

本說明書之第一以及第二等詞彙,僅作為清楚解釋之目的,並非用以對應於以及限制專利範圍。此外,第一特徵以及第二特徵等詞彙,並非限定是相同或是不同之特徵。 The vocabulary of the first and second words of this specification are for the purpose of clarity of explanation and are not intended to be construed as limiting. In addition, the first feature and the second feature are not limited to the same or different features.

於此使用之空間上相關的詞彙,例如上方或下方 等,僅用以簡易描述圖式上之一元件或一特徵相對於另一元件或特徵之關係。除了圖式上描述的方位外,包括於不同之方位使用或是操作之裝置。圖式中之形狀、尺寸、以及厚度可能為了清楚說明之目的而未依照比例繪製或是被簡化,僅提供說明之用。 Spatially related vocabulary used here, such as above or below The use of one element or the relationship of one feature to another element or feature is simply described. In addition to the orientations described in the drawings, the devices are used or operated in different orientations. The shapes, dimensions, and thicknesses of the drawings may not be drawn to scale or simplified for the purpose of clarity of description, and are merely illustrative.

本揭露實施例提供一種晶圓運輸載具,能於吊起一晶圓盒之過程中偵測晶圓盒之門板是否關好。此外,晶圓運輸載具可於運送晶圓盒的過程中,偵測門板是否打開或止擋門板脫落。 The disclosed embodiment provides a wafer transport carrier capable of detecting whether the door panel of the wafer cassette is closed during lifting of a wafer cassette. In addition, the wafer transport carrier can detect whether the door panel is open or the door panel is detached during the process of transporting the wafer cassette.

第1圖為根據本揭露之一些實施例中晶圓運輸系統A1的示意圖。晶圓運輸系統A1可包括一半導體設備A10、一晶圓儲存設備A20、以及一懸吊式搬運系統A30(Over Hoist Transport,OHT)。半導體設備A10用以對晶圓W1實施半導體製程。 1 is a schematic diagram of a wafer transport system A1 in accordance with some embodiments of the present disclosure. The wafer transport system A1 may include a semiconductor device A10, a wafer storage device A20, and a Over Hoist Transport (OHT). The semiconductor device A10 is used to perform a semiconductor process on the wafer W1.

於一些實施例中,半導體設備A10可為一化學機械研磨(chemical mechanical polishing,CMP)設備、一物理氣相沉積(physical vapor deposition,PVD)設備、一化學氣相沉積(chemical vapor deposition,CVD)設備、一離子佈植(ion implant)設備、一蝕刻(etching)設備、一微影(photolithography)設備、或是其他合適之設備。 In some embodiments, the semiconductor device A10 can be a chemical mechanical polishing (CMP) device, a physical vapor deposition (PVD) device, and a chemical vapor deposition (CVD). A device, an ion implant device, an etching device, a photolithography device, or other suitable device.

於一些實施例中,上述半導體製程可為一化學機械研磨製程、一物理氣相沉積製程、一化學氣相沉積製程、一摻雜製程、一蝕刻製程、一微影製程、或是其他適合之製程。 In some embodiments, the semiconductor process may be a chemical mechanical polishing process, a physical vapor deposition process, a chemical vapor deposition process, a doping process, an etching process, a lithography process, or other suitable Process.

半導體設備A10可包括多個裝載埠A11(load port),用以承載晶圓盒B1。於一些實施例中,半導體設備A10可包括一個裝載埠A11。 The semiconductor device A10 may include a plurality of load ports A11 (load Port), used to carry the wafer cassette B1. In some embodiments, semiconductor device A10 can include a load port A11.

晶圓盒B1可用以容納一或多片晶圓W1。於一些實施例中,晶圓盒B1可為一前開式晶圓傳送盒(front opening unified pod,FOUP)或是一晶舟(wafer boat)。 The wafer cassette B1 can be used to accommodate one or more wafers W1. In some embodiments, the wafer cassette B1 can be a front opening unified pod (FOUP) or a wafer boat.

晶圓盒B1可包括一外殼(亦可稱為殼體)B11、一門板B12以及一扣合元件B13。外殼B11內可用以容納多片晶圓W1。門板B12可拆卸地設置於外殼B11上。於本實施例中,門板B12可拆卸地設置於外殼B11之一側壁。扣合元件B13設置於外殼B11上。於本實施例中,扣合元件B13設置於外殼B11之頂部。 The wafer cassette B1 may include a casing (also referred to as a casing) B11, a door panel B12, and a fastening component B13. The outer casing B11 can be used to accommodate a plurality of wafers W1. The door panel B12 is detachably disposed on the outer casing B11. In the embodiment, the door panel B12 is detachably disposed on one side wall of the outer casing B11. The fastening element B13 is disposed on the outer casing B11. In this embodiment, the fastening component B13 is disposed on the top of the outer casing B11.

當晶圓盒B1承載於裝載埠A11時,半導體設備A10將門板B12由外殼B11上拆卸。半導體設備A10將晶圓W1由晶圓盒B1內取出後,運送至半導體設備A10內部進行半導體製程。當半導體設備A10處理完晶圓W1後,會將晶圓W1送回晶圓盒B1內,並將門板B12蓋合於外殼B11。 When the wafer cassette B1 is carried on the loading cassette A11, the semiconductor device A10 detaches the door panel B12 from the housing B11. The semiconductor device A10 takes out the wafer W1 from the inside of the wafer cassette B1, and then transports it to the inside of the semiconductor device A10 to perform a semiconductor process. After the semiconductor device A10 has processed the wafer W1, the wafer W1 is returned to the wafer cassette B1, and the door panel B12 is covered to the outer casing B11.

晶圓儲存設備A20用以儲存多個晶圓盒B1。晶圓儲存設備A20包括了多個承載座A21以及多個裝載埠A22。承載座A21設置於晶圓儲存設備A20內,且裝載埠A22位於晶圓儲存設備A20之外側。 The wafer storage device A20 is used to store a plurality of wafer cassettes B1. The wafer storage device A20 includes a plurality of carriers A21 and a plurality of loading cassettes A22. The carrier A21 is disposed in the wafer storage device A20, and the loading port A22 is located on the outer side of the wafer storage device A20.

當晶圓盒B1要儲存於晶圓儲存設備A20內時,晶圓盒B1先放置於裝載埠A22上,之後晶圓儲存設備A20將放置於裝載埠A22上之晶圓盒B1傳輸至晶圓儲存設備A20內之承載座A21上。 When the wafer cassette B1 is to be stored in the wafer storage device A20, the wafer cassette B1 is first placed on the loading cassette A22, and then the wafer storage device A20 transfers the wafer cassette B1 placed on the loading cassette A22 to the wafer. Store on the carrier A21 in the device A20.

當晶圓盒B1從儲晶圓儲存設備A20內取出時,晶圓儲存設備A20將放置於承載座A21上之晶圓盒B1傳輸至裝載埠A22。之後,懸吊式搬運系統A30可將晶圓盒B1由裝載埠A22傳輸至半導體設備A10之裝載埠A11上。 When the wafer cassette B1 is taken out from the storage wafer storage device A20, the wafer storage device A20 transfers the wafer cassette B1 placed on the carrier A21 to the loading cassette A22. Thereafter, the suspended transport system A30 can transport the wafer cassette B1 from the loading cassette A22 to the loading cassette A11 of the semiconductor device A10.

懸吊式搬運系統A30包括一軌道A31以及多個晶圓運輸載具1。在一些實施例中,軌道A31係設置於晶圓廠之天花板,並可經過裝載埠A11以及裝載埠A22之上方。晶圓運輸載具1可移動地設置於軌道A31上。換句話說,晶圓運輸載具1可沿軌道A31移動,並且晶圓運輸載具1用以運輸晶圓盒B1。 The suspended handling system A30 includes a track A31 and a plurality of wafer transport carriers 1. In some embodiments, the track A31 is placed on the ceiling of the fab and can pass over the load magazine A11 and the load magazine A22. The wafer transport carrier 1 is movably disposed on the track A31. In other words, the wafer transport carrier 1 can be moved along the track A31, and the wafer transport carrier 1 is used to transport the wafer cassette B1.

於一些實施例中,晶圓運輸載具1將晶圓盒B1由晶圓儲存設備A20運輸至半導體設備A10,或是將晶圓盒B1由半導體設備A10運輸至晶圓儲存設備A20。於一些實施例中,晶圓運輸載具1將晶圓盒B1由晶圓儲存設備A20運輸至另一晶圓儲存設備,或是將晶圓盒B1由半導體設備A10運輸至另一半導體設備。 In some embodiments, the wafer transport carrier 1 transports the wafer cassette B1 from the wafer storage device A20 to the semiconductor device A10, or transports the wafer cassette B1 from the semiconductor device A10 to the wafer storage device A20. In some embodiments, the wafer transport carrier 1 transports the wafer cassette B1 from the wafer storage device A20 to another wafer storage device, or transports the wafer cassette B1 from the semiconductor device A10 to another semiconductor device.

如第1圖所示,晶圓運輸載具1包括一乘載裝置10以及一懸吊裝置20。乘載裝置10可移動地設置於軌道A31上,且用以運送晶圓盒B1。乘載裝置10可包括一容置空間S1以及一下開口11。下開口11與容置空間S1連接且位於乘載裝置10之底部(意即面朝軌道A31的相反側)。 As shown in FIG. 1, the wafer transporting carrier 1 includes a loading device 10 and a suspension device 20. The carrying device 10 is movably disposed on the track A31 and is used to transport the wafer cassette B1. The carrying device 10 can include an accommodating space S1 and a lower opening 11. The lower opening 11 is connected to the accommodating space S1 and is located at the bottom of the carrying device 10 (that is, facing the opposite side of the track A31).

懸吊裝置20設置於乘載裝置10內,且可位於容置空間S1內。懸吊裝置20用以將晶圓盒B1沿一懸吊方向D1移動。上述之懸吊方向D1可為一垂直方向。軌道A31可垂直或大致垂直於懸吊方向D1延伸。 The suspension device 20 is disposed in the carrying device 10 and can be located in the accommodating space S1. The suspension device 20 is used to move the wafer cassette B1 in a hanging direction D1. The above hanging direction D1 may be a vertical direction. The track A31 may extend vertically or substantially perpendicular to the hanging direction D1.

如第1圖所示,於一些實施例中,當半導體設備A10之裝載埠A11上未承載晶圓盒B1時,半導體設備A10可發出一發出請求訊號。晶圓儲存設備A20可依據上述請求訊號將承載座A21上之晶圓盒B1搬出並放置於裝載埠A22上。 As shown in FIG. 1, in some embodiments, when the wafer cassette B1 is not carried on the loading cassette A11 of the semiconductor device A10, the semiconductor device A10 can issue a request signal. The wafer storage device A20 can carry out the wafer cassette B1 on the carrier A21 and place it on the loading cassette A22 according to the above request signal.

於一實施例中,半導體設備A10發出之請求訊號傳送至晶圓運輸系統A1之一控制系統(未圖示)中,且藉由上述控制系統將請求訊號轉送至晶圓儲存設備A20或根據請求訊號傳送一對應控制訊號至晶圓儲存設備A20。 In one embodiment, the request signal sent by the semiconductor device A10 is transmitted to a control system (not shown) of the wafer transport system A1, and the request signal is forwarded to the wafer storage device A20 by the control system or according to the request. The signal transmits a corresponding control signal to the wafer storage device A20.

此時,晶圓儲存設備A20可發出一搬運訊號。懸吊式搬運系統A30可依據搬運訊號將一晶圓運輸載具1移動至晶圓盒B1之上方。於一實施例中,晶圓儲存設備A20發出之搬運訊號傳送至上述控制系統中,且上述控制系統將請求訊號轉送至懸吊式搬運系統A30或根據請求訊號傳送一對應控制訊號至晶圓儲存設備A20。 At this time, the wafer storage device A20 can issue a transfer signal. The suspended transport system A30 can move a wafer transport carrier 1 above the wafer cassette B1 according to the transport signal. In one embodiment, the transport signal sent by the wafer storage device A20 is transmitted to the control system, and the control system transfers the request signal to the suspended transport system A30 or transmits a corresponding control signal to the wafer storage according to the request signal. Device A20.

之後,晶圓運輸載具1將懸吊裝置20下降至晶圓盒B1上,並將懸吊裝置20扣合於晶圓盒B1之扣合元件B13。於懸吊裝置20扣合好晶圓盒B1之扣合元件B13之後,懸吊裝置20將晶圓盒B1沿懸吊方向D1吊起,並經由下開口11進入乘載裝置10之容置空間S1內。 Thereafter, the wafer transport carrier 1 lowers the suspension device 20 onto the wafer cassette B1, and snaps the suspension device 20 to the fastening member B13 of the wafer cassette B1. After the suspension device 20 fastens the fastening component B13 of the wafer cassette B1, the suspension device 20 lifts the wafer cassette B1 in the hanging direction D1 and enters the housing space of the carrying device 10 via the lower opening 11. Within S1.

晶圓運輸載具1帶著晶圓盒B1沿軌道A31移動至半導體設備A10之一裝載埠A11上方。晶圓運輸載具1控制懸吊裝置20下降以將晶圓盒B1放置於裝載埠A11上。之後,懸吊裝置20脫離晶圓盒B1之扣合元件B13並上升至晶圓運輸載具1之內。 The wafer transport carrier 1 is carried along the track A31 with the wafer cassette B1 to the top of one of the semiconductor devices A10. The wafer transport carrier 1 controls the suspension device 20 to descend to place the wafer cassette B1 on the loading cassette A11. Thereafter, the suspension device 20 is disengaged from the snap element B13 of the wafer cassette B1 and raised into the wafer transport carrier 1.

當半導體設備A10處理完晶圓盒B1內之晶圓W1 後,半導體設備A10發出一搬運訊號。於一些實施例中,懸吊式搬運系統A30依據上述搬運訊號移動一晶圓運輸載具1至裝載埠A11上之晶圓盒B1上方。 When the semiconductor device A10 processes the wafer W1 in the wafer cassette B1 Thereafter, the semiconductor device A10 sends a carry signal. In some embodiments, the suspended handling system A30 moves a wafer transport carrier 1 to the top of the wafer cassette B1 on the loading cassette A11 in accordance with the transport signal.

晶圓運輸載具1沿懸吊方向D1將懸吊裝置20下降至晶圓盒B1上,並扣合於扣合元件B13。於懸吊裝置20結合扣合元件B13後,懸吊裝置20抬升晶圓盒B1並經由下開口11進入乘載裝置10之容置空間S1內。之後,晶圓運輸載具1沿軌道A31移動以將晶圓盒B1運送至晶圓儲存設備A20或另一半導體設備。 The wafer transport carrier 1 lowers the suspension device 20 to the wafer cassette B1 in the hanging direction D1 and is fastened to the fastening member B13. After the suspension device 20 is coupled to the fastening component B13, the suspension device 20 lifts the wafer cassette B1 and enters the accommodating space S1 of the carrying device 10 via the lower opening 11. Thereafter, the wafer transport carrier 1 is moved along the track A31 to transport the wafer cassette B1 to the wafer storage device A20 or another semiconductor device.

第2圖為根據本揭露之一些實施例中晶圓運輸載具1的立體圖。第3圖為根據本揭露之一些實施例中止擋元件31的立體圖。第4圖為根據本揭露之一些實施例中晶圓運輸載具1的示意圖。 2 is a perspective view of a wafer transport carrier 1 in accordance with some embodiments of the present disclosure. Figure 3 is a perspective view of the stop element 31 in accordance with some embodiments of the present disclosure. FIG. 4 is a schematic illustration of a wafer transport carrier 1 in accordance with some embodiments of the present disclosure.

乘載裝置10可包括一側開口12以及一滑槽13。側開口12以及滑槽13形成於乘載裝置10之一側壁14。側開口12與容置空間S1連接,且垂直或大致垂直於下開口11。晶圓運輸載具1可更包括一偵測裝置30,設置於乘載裝置10之側壁14上,且鄰近於側開口12以及容置空間S1。於本實施例中,偵測裝置30可位於一偵測區域S2。偵測區域S2經由側開口12與容置空間S1連接。 The ride 10 can include a side opening 12 and a chute 13. The side opening 12 and the chute 13 are formed on one of the side walls 14 of the carrying device 10. The side opening 12 is connected to the accommodating space S1 and is perpendicular or substantially perpendicular to the lower opening 11. The wafer transport carrier 1 further includes a detecting device 30 disposed on the side wall 14 of the carrying device 10 and adjacent to the side opening 12 and the receiving space S1. In this embodiment, the detecting device 30 can be located in a detecting area S2. The detection area S2 is connected to the accommodation space S1 via the side opening 12.

偵測裝置30可包括一止擋元件31以及一偵測元件32(如第4圖所示)。止擋元件31可沿懸吊方向D1可移動地設置於乘載裝置10之滑槽13內,且可位於偵測區域S2內。於一些實施例中,止擋元件31可大致為一L型結構,但並不於以限制。 The detecting device 30 can include a stop element 31 and a detecting element 32 (as shown in FIG. 4). The stop element 31 can be movably disposed in the sliding slot 13 of the carrying device 10 in the hanging direction D1 and can be located in the detecting area S2. In some embodiments, the stop element 31 can be generally an L-shaped structure, but is not limited.

如第2圖及第3圖所示,止擋元件31可包括一滑塊311以及一止擋片312。滑塊311可移動地設置於乘載裝置10之滑槽13內。換句話說,滑槽13可限制滑塊311於懸吊方向D1移動。於一些實施例中,滑塊311可為一T型結構。滑槽13於垂直於懸吊方向D1之截面可為T型。藉由滑塊311之結構可防止止擋元件31脫落於滑槽13。 As shown in FIGS. 2 and 3, the stop member 31 can include a slider 311 and a stop tab 312. The slider 311 is movably disposed in the chute 13 of the carrying device 10. In other words, the chute 13 can restrict the slider 311 from moving in the hanging direction D1. In some embodiments, the slider 311 can be a T-shaped structure. The cross section of the chute 13 perpendicular to the suspension direction D1 may be T-shaped. The stop member 31 can be prevented from falling off the chute 13 by the structure of the slider 311.

止擋片312連接於滑塊311,且位於偵測區域S2內。於一些實施例中,止擋片312可大致沿懸吊方向D1延伸,且對應於側開口12以及容置空間S1。於一些實施例中,止擋片312固定於滑塊311。於一些實施例中,止擋片312與滑塊311一體成形。 The stop piece 312 is connected to the slider 311 and located in the detection area S2. In some embodiments, the stop tab 312 can extend generally in the suspending direction D1 and corresponds to the side opening 12 and the receiving space S1. In some embodiments, the stop tab 312 is secured to the slider 311. In some embodiments, the stop tab 312 is integrally formed with the slider 311.

偵測元件32設置於乘載裝置10內,且可對應於滑槽13。於一些實施例中,偵測元件32設置於滑槽13中遠離下開口11之一側,滑塊311未被移動時位於滑槽13中鄰近於下開口11之一側。於一些實施例中,偵測元件32可為一接觸式開關或是一非接觸式開關。舉例而言,接觸式開關可為一按鈕式開關,且非接觸式開關可為一磁簧式開關或一距離感測器,但並不以此為限。 The detecting component 32 is disposed in the carrying device 10 and may correspond to the chute 13 . In some embodiments, the detecting element 32 is disposed on one side of the chute 13 away from the lower opening 11 and is located in the chute 13 adjacent to one side of the lower opening 11 when the slider 311 is not moved. In some embodiments, the detecting component 32 can be a contact switch or a contactless switch. For example, the contact switch can be a push button switch, and the non-contact switch can be a reed switch or a distance sensor, but is not limited thereto.

偵測元件32用以產生一警告訊號。於一實施例中,偵測元件32發出之警告訊號傳送至晶圓運輸系統A1之一控制系統(未圖示)中。因此,當偵測元件32產生警告訊號後,晶圓運輸系統A1之控制系統可依據警告訊號停止乘載裝置10及/或懸吊裝置20移動。 The detecting component 32 is configured to generate a warning signal. In one embodiment, the warning signal from the detecting component 32 is transmitted to a control system (not shown) of the wafer transport system A1. Therefore, after the detecting component 32 generates the warning signal, the control system of the wafer transportation system A1 can stop the movement of the loading device 10 and/or the suspension device 20 according to the warning signal.

於一些實施例中,晶圓運輸系統A1之控制系統更 可以經由無線傳輸的方式將警告訊號傳輸於相關工程師之行動裝置。於一些實施例中,偵測元件32發出之警告訊號更傳送至乘載裝置10,且乘載裝置10可依據警告訊號經由一光源發出警告光線。 In some embodiments, the control system of the wafer transport system A1 is more The warning signal can be transmitted to the relevant engineer's mobile device via wireless transmission. In some embodiments, the warning signal sent by the detecting component 32 is further transmitted to the loading device 10, and the charging device 10 can emit warning light via a light source according to the warning signal.

於第4圖中,晶圓盒B1之門板B12位於一蓋合位置,且止擋元件31位於一初始位置。此時,門板B12並不位於偵測區域S2內,且門板B12與止擋元件31之止擋片312分離。於本揭露實施例中,當門板B12位於蓋合位置時表示門板B12良好地與外殼B11結合。因此,於懸吊裝置20抬升晶圓盒B1的過程中或是於乘載裝置10運送晶圓盒B1的過程中,當晶圓盒B1之門板B12不位於偵測區域S2內,或是觸碰到止擋元件31時,偵測裝置30並不會發出警告訊號。 In Fig. 4, the door panel B12 of the wafer cassette B1 is in a closed position, and the stopper member 31 is located at an initial position. At this time, the door panel B12 is not located in the detection area S2, and the door panel B12 is separated from the stopper piece 312 of the stopper member 31. In the disclosed embodiment, when the door panel B12 is in the closed position, the door panel B12 is well coupled with the outer casing B11. Therefore, during the process of lifting the wafer cassette B1 by the suspension device 20 or during the process of transporting the wafer cassette B1 by the loading device 10, when the door panel B12 of the wafer cassette B1 is not located in the detection area S2, or touches When the stop element 31 is encountered, the detecting device 30 does not emit a warning signal.

第5圖為根據本揭露之一些實施例中晶圓運輸載具1的示意圖。於第5圖中,晶圓盒B1之門板B12位於一鬆脫位置,且止擋元件31位於一觸發位置。因此,於懸吊裝置20抬升晶圓盒B1的過程中,門板B12會於偵測區域S2內移動。此外,當晶圓盒B1移動至容置空間S1內時,門板B12會於懸吊方向D1上推動止擋片312之底部,以使此止擋元件31之滑塊311朝向偵測元件32移動。當止擋元件31靠近或接觸偵測元件32時,偵測裝置30發出一警告訊號。於一些實施例中,乘載裝置10及/或懸吊裝置20移動依據警告訊號停止移動。 FIG. 5 is a schematic illustration of a wafer transport carrier 1 in accordance with some embodiments of the present disclosure. In Fig. 5, the door panel B12 of the wafer cassette B1 is in a loose position, and the stop member 31 is in a trigger position. Therefore, in the process in which the suspension device 20 lifts the wafer cassette B1, the door panel B12 moves in the detection area S2. In addition, when the wafer cassette B1 is moved into the accommodating space S1, the door panel B12 pushes the bottom of the stopping piece 312 in the hanging direction D1 to move the slider 311 of the stopping member 31 toward the detecting element 32. . When the stop element 31 approaches or contacts the detecting element 32, the detecting device 30 issues a warning signal. In some embodiments, the movement of the carrier device 10 and/or the suspension device 20 stops moving in accordance with the warning signal.

由於當偵測裝置30發出警告訊號後,晶圓運輸載具1依據警告訊號停止懸吊裝置20移動晶圓盒B1,且停止晶圓運輸載具1本身於軌道A31上移動。因此,能即時的防止門板 B12於懸吊裝置20移動晶圓盒B1的過程中進一步的晃動而導致門板B12脫落於外殼B11。此外,藉由停止晶圓運輸載具1本身於軌道A31上移動,可等待工程師能即時地將門板B12妥善的安裝於外殼B11,以避免門板B12於晶圓運輸載具1的移動過程中掉落。 After the detecting device 30 issues a warning signal, the wafer transporting vehicle 1 stops the hanging device 20 from moving the wafer cassette B1 according to the warning signal, and stops the wafer transporting vehicle 1 from moving on the track A31. Therefore, the door panel can be prevented instantly B12 further sways during the movement of the hanging device 20 to move the wafer cassette B1, causing the door panel B12 to fall off the outer casing B11. In addition, by stopping the wafer transporting vehicle 1 itself to move on the track A31, the engineer can wait for the door panel B12 to be properly mounted on the outer casing B11 in time to prevent the door panel B12 from falling during the movement of the wafer transporting vehicle 1. drop.

由於門板B12於懸吊裝置20或晶圓運輸載具1移動晶圓盒B1的過程中掉落時可能會導致晶圓盒B1的重心改變導致晶圓盒B1晃動或傾斜。而當晶圓盒B1晃動或傾斜時若缺少門板B12止擋可能或使得晶圓盒B1內之晶圓W1掉出於晶圓盒B1外,導致嚴重的損失。因此,藉由本揭露之偵測裝置30即時地防止門板B12脫落,進而能防止晶圓W1掉出於晶圓盒B1外。 Since the door panel B12 is dropped during the movement of the suspension device 20 or the wafer transporting vehicle 1 to move the wafer cassette B1, the center of gravity of the wafer cassette B1 may be changed to cause the wafer cassette B1 to shake or tilt. However, if the door panel B1 is shaken or tilted, the lack of the door panel B12 stopper may cause the wafer W1 in the wafer cassette B1 to fall out of the wafer cassette B1, resulting in serious loss. Therefore, the detecting device 30 of the present disclosure prevents the door panel B12 from coming off immediately, thereby preventing the wafer W1 from falling out of the wafer cassette B1.

於本實施例中,感測元件32可為一非接觸式開關。因此,止擋元件31可不需接觸偵測元件32即可使偵測裝置30發出警告訊號,藉以避免止擋元件31碰撞於感測元件32時移動門板B12與外殼B11之相對位置而導致門板B12脫落。 In this embodiment, the sensing component 32 can be a contactless switch. Therefore, the stop element 31 can cause the detecting device 30 to issue a warning signal without contacting the detecting component 32, so as to prevent the relative position of the door panel B12 and the outer casing B11 from moving when the stopping component 31 collides with the sensing component 32, thereby causing the door panel B12. Fall off.

於一些實施例中,感測元件32可為一磁簧式開關。滑塊311包括一永久磁鐵。換句話說,滑塊311可產生一磁力。當滑塊311接近磁簧式開關時,滑塊311之磁力觸發磁簧式開關,並產生上述之警告訊號。 In some embodiments, the sensing element 32 can be a reed switch. The slider 311 includes a permanent magnet. In other words, the slider 311 can generate a magnetic force. When the slider 311 approaches the reed switch, the magnetic force of the slider 311 triggers the reed switch and generates the above warning signal.

於一些實施例中,感測元件32可為一距離感測器。當感測元件32感測到其與滑塊311間之距離小於一預定距離,例如1公分,即表示門板B12位於鬆脫位置,故感測元件32發出警告訊號。 In some embodiments, sensing element 32 can be a distance sensor. When the sensing element 32 senses that the distance between the slider 311 and the slider 311 is less than a predetermined distance, for example, 1 cm, that is, the door panel B12 is in the released position, the sensing component 32 issues a warning signal.

如第4圖所示,若門板B12於懸吊裝置20移動或懸 吊晶圓盒B1的過程中位於蓋合位置,則止擋元件31不會被門板B12移動。隨後,若門板B12鬆脫於外殼B11,此時,門板B12可抵靠於止擋元件31上。因此,止擋元件31可止擋門板B12脫落於外殼B11之外。此外,當門板B12接觸止擋片312之朝向容置空間S1之一接觸面313時,晶圓運輸載具1可發出一警告訊號。於一些實施例中,乘載裝置10及/或懸吊裝置20移動依據警告訊號停止移動。 As shown in Figure 4, if the door panel B12 is moved or suspended in the suspension device 20 When the wafer cassette B1 is in the closed position, the stopper member 31 is not moved by the door panel B12. Subsequently, if the door panel B12 is loosened from the outer casing B11, the door panel B12 can be abutted against the stop member 31 at this time. Therefore, the stopper member 31 can stop the door panel B12 from falling out of the outer casing B11. In addition, when the door panel B12 contacts the contact surface 313 of the stopper piece 312 facing the accommodating space S1, the wafer transporting vehicle 1 can issue a warning signal. In some embodiments, the movement of the carrier device 10 and/or the suspension device 20 stops moving in accordance with the warning signal.

第6圖為根據本揭露之一些實施例中晶圓運輸載具1的示意圖。止擋片312之一端可樞接於滑塊311之一端。滑塊311具有一導電片314。止擋片312具有一導電片315。導電片315與導電片314可與感測單元32電性連接。當止擋片312並未被門板B12經由接觸面313推動時,導電片315與導電片314分離。 Figure 6 is a schematic illustration of a wafer transport carrier 1 in accordance with some embodiments of the present disclosure. One end of the stop piece 312 is pivotally connected to one end of the slider 311. The slider 311 has a conductive sheet 314. The stop piece 312 has a conductive piece 315. The conductive sheet 315 and the conductive sheet 314 can be electrically connected to the sensing unit 32. When the stopper piece 312 is not pushed by the door panel B12 via the contact surface 313, the conductive sheet 315 is separated from the conductive sheet 314.

第7圖為根據本揭露之一些實施例中晶圓運輸載具1的示意圖。當門板B12傾倒至止擋片312以使止擋片312相對於滑塊311旋轉。此時,導電片315與導電片314接觸或電性連接,並使偵測裝置30之感測單元32產生警告訊號。 FIG. 7 is a schematic illustration of a wafer transport carrier 1 in accordance with some embodiments of the present disclosure. When the door panel B12 is poured to the stopper piece 312 to rotate the stopper piece 312 with respect to the slider 311. At this time, the conductive sheet 315 is in contact with or electrically connected to the conductive sheet 314, and the sensing unit 32 of the detecting device 30 generates a warning signal.

如第6圖以及第7圖所示,止擋片312與滑塊311之間的角度C1限制於一預定範圍之間。於一些實施例中,上述預定範圍約為90度至95度之間。因此,止擋片312亦可防止門板B12脫落。 As shown in Figs. 6 and 7, the angle C1 between the stop piece 312 and the slider 311 is limited to a predetermined range. In some embodiments, the predetermined range is between about 90 degrees and 95 degrees. Therefore, the stopper piece 312 can also prevent the door panel B12 from coming off.

第8圖為根據本揭露之一些實施例中晶圓運輸載具1的立體圖。第9圖為根據本揭露之一些實施例中晶圓運輸載具1的示意圖。偵測裝置30設置於偵測區域S2內,且可設置於 乘載裝置10之側壁14上。偵測裝置30包括偵測元件32以及多個防護元件33。偵測元件32可包括多個訊號發射器34以及多個訊號接受器35。 Figure 8 is a perspective view of a wafer transport carrier 1 in accordance with some embodiments of the present disclosure. FIG. 9 is a schematic illustration of a wafer transport carrier 1 in accordance with some embodiments of the present disclosure. The detecting device 30 is disposed in the detecting area S2 and can be disposed on On the side wall 14 of the carrier device 10. The detecting device 30 includes a detecting element 32 and a plurality of shielding elements 33. The detecting component 32 can include a plurality of signal emitters 34 and a plurality of signal receptors 35.

防護元件33可設置於乘載裝置10之側壁14上。於一些實施例中,防護元件33可為L型結構,但並不以此為限。防護元件33可鄰近於偵測區域S2。於本實施例中,偵測區域S2位於容置空間S1與兩防護元件33之間。 The protective element 33 can be disposed on the side wall 14 of the ride 10. In some embodiments, the guard element 33 can be an L-shaped structure, but is not limited thereto. The guard element 33 can be adjacent to the detection area S2. In this embodiment, the detection area S2 is located between the accommodating space S1 and the two shielding elements 33.

訊號發射器34設置於防護元件33上,且可用以發射一偵測光束。訊號接受器35設置於另一個防護元件33上,且可用以接收偵測光束。於一些實施例中,訊號發射器34以及訊號接受器35可整合為一個元件。於一些實施例中,訊號發射器34以及訊號接受器35可設置於同一個防護元件33上。 The signal emitter 34 is disposed on the guard element 33 and can be used to emit a detection beam. The signal receiver 35 is disposed on the other guard element 33 and is operable to receive the detection beam. In some embodiments, the signal transmitter 34 and the signal receiver 35 can be integrated into one component. In some embodiments, the signal transmitter 34 and the signal receiver 35 can be disposed on the same guard element 33.

於一些實施例中,部分之訊號發射器34以及訊號接受器35位於同一防護元件33,且部分之訊號發射器34以及訊號接受器35位於另一防護元件33。於一些實施例中,位於同一防護元件33上之訊號發射器34以及訊號接受器35以交錯方式排列。 In some embodiments, a portion of the signal transmitter 34 and the signal receiver 35 are located in the same guard element 33, and a portion of the signal transmitter 34 and the signal receiver 35 are located in the other guard element 33. In some embodiments, the signal transmitters 34 and the signal receivers 35 on the same guard element 33 are arranged in a staggered manner.

如第9圖所示,於懸吊裝置20移動晶圓盒B1的過程中,當晶圓盒B1之門板B12位於偵測區域S2並遮蔽偵測光束時,偵測裝置30發出警告訊號。 As shown in FIG. 9, during the process of moving the wafer cassette B1 by the suspension device 20, when the door panel B12 of the wafer cassette B1 is located in the detection area S2 and shields the detection beam, the detecting device 30 issues a warning signal.

第10圖為根據本揭露之一些實施例中晶圓運輸載具1的示意圖。如第10圖所示,當晶圓運輸載具1運送晶圓盒B1的過程中,若門板B12鬆脫於外殼B11,則門板B12可被防護元件33所止擋,因此防護元件33可防止門板B12脫落於外殼B11。 此外,門板B12位於鬆脫位置時,門板B12會遮擋偵測光束進而使偵測裝置30可發出警告訊號。 FIG. 10 is a schematic illustration of a wafer transport carrier 1 in accordance with some embodiments of the present disclosure. As shown in FIG. 10, when the wafer transporting vehicle 1 transports the wafer cassette B1, if the door panel B12 is loosened from the outer casing B11, the door panel B12 can be stopped by the protective member 33, so that the protective member 33 can be prevented. The door panel B12 falls off the outer casing B11. In addition, when the door panel B12 is in the loose position, the door panel B12 blocks the detection beam and the detection device 30 can issue a warning signal.

於第8圖至第9圖之實施例中之防護元件33、訊號發射器34以及訊號接受器35可運用於第1圖至第7圖所示之實施例中。 The shield member 33, the signal transmitter 34, and the signal receiver 35 in the embodiments of Figs. 8 to 9 can be applied to the embodiments shown in Figs. 1 to 7.

第11圖為根據本揭露之一些實施例中晶圓盒B1偵測方法的流程圖。於步驟S101中,如第1圖所示,晶圓盒B1放置於半導體設備A10之一裝載埠A11上。晶圓運輸系統A1控制一晶圓運輸載具1移動至晶圓盒B1之上方。晶圓運輸載具1利用懸吊裝置20將晶圓盒B1從半導體設備A10吊起,並朝向乘載裝置10之容置空間S1內移動。 FIG. 11 is a flow chart of a method for detecting a wafer cassette B1 according to some embodiments of the present disclosure. In step S101, as shown in FIG. 1, the wafer cassette B1 is placed on one of the semiconductor devices A10 on the loading cassette A11. The wafer transport system A1 controls a wafer transport carrier 1 to move above the wafer cassette B1. The wafer transport carrier 1 lifts the wafer cassette B1 from the semiconductor device A10 by the suspension device 20, and moves toward the accommodation space S1 of the carrier device 10.

於步驟S103中,於懸吊裝置20移動晶圓盒B1的過程中,當晶圓盒B1之一門板B12位於連接於容置空間S1之一偵測區域S2內時,偵測裝置30發出警告訊號,並執行步驟S105。 In step S103, during the process of moving the wafer cassette B1 by the suspension device 20, when one of the door panels B12 of the wafer cassette B1 is located in the detection area S2 of the receiving space S1, the detecting device 30 issues a warning. Signal, and step S105 is performed.

步驟S105中,若懸吊裝置20正在移動晶圓盒B1,則停止懸吊裝置20移動。若晶圓運輸載具1正在運送晶圓盒B1,則停止乘載裝置10運輸載移動。 In step S105, if the suspension device 20 is moving the wafer cassette B1, the suspension device 20 is stopped. If the wafer transporting vehicle 1 is transporting the wafer cassette B1, the transporting movement of the carrying device 10 is stopped.

若晶圓盒B1之門板B12並未位於偵測區域S2內,則懸吊裝置20將晶圓盒B1移動至一運輸位置(如第4圖所示)後執行步驟S107。於步驟S107中,晶圓運輸載具1沿軌道A31運送晶圓盒B1。 If the door panel B12 of the wafer cassette B1 is not located in the detection area S2, the suspension device 20 moves the wafer cassette B1 to a transport position (as shown in FIG. 4) and then performs step S107. In step S107, the wafer transport carrier 1 transports the wafer cassette B1 along the track A31.

於步驟S109中,於晶圓運輸載具1移動中,當門板B12移動至偵測區域S2中時,偵測裝置30發出警告訊號,並執行步驟S105。 In step S109, when the wafer transporting vehicle 1 moves, when the door panel B12 moves into the detecting area S2, the detecting device 30 issues a warning signal, and executes step S105.

若晶圓盒B1之門板B12並未位於連接於偵測區域S2內,則晶圓運輸載具1繼續沿軌道A31運送晶圓盒B1。於步驟S111中,當晶圓W1運輸載到達一預定位置,載卸晶圓盒B1於一晶圓儲存設備A20或另一半導體設備。 If the door panel B12 of the wafer cassette B1 is not located in the detection area S2, the wafer transport carrier 1 continues to transport the wafer cassette B1 along the track A31. In step S111, when the wafer W1 transports a predetermined position, the wafer cassette B1 is loaded and unloaded on a wafer storage device A20 or another semiconductor device.

綜上所述,利用本揭露之偵測裝置可於懸吊裝置移動晶圓盒的過程中,或是晶圓運輸載具運輸晶圓盒的過程中即時地偵測晶圓盒之門板是否鬆脫於外殼,並可於偵測到門板鬆脫於外殼時發出警告訊號,進而可防止門板脫落於外殼與降低晶圓報廢的風險。 In summary, the detecting device of the present disclosure can instantly detect whether the door panel of the wafer cassette is loose during the process of moving the wafer cassette by the hanging device or during the process of transporting the wafer cassette by the wafer transporting vehicle. It is detached from the outer casing and can issue a warning signal when it detects that the door panel is loose from the outer casing, thereby preventing the door panel from falling off the outer casing and reducing the risk of wafer scrapping.

本揭露提供一種晶圓運輸載具,包括:一乘載裝置,具有一容置空間以及與容置空間連接之一偵測區域;一懸吊裝置,設置於容置空間內,且被配置用以將一晶圓盒移動至容置空間內;以及一偵測裝置,設置於乘載裝置上,被配置用於偵測晶圓盒之門板的位置,以於門板位於偵測區域內時,發出一警告訊號。 The present disclosure provides a wafer transporting vehicle comprising: a carrying device having a receiving space and a detecting area connected to the receiving space; a suspension device disposed in the receiving space and configured To move a wafer cassette into the accommodating space; and a detecting device disposed on the loading device configured to detect the position of the door panel of the wafer cassette, so that when the door panel is located in the detecting area, Send a warning signal.

於一些實施例中,偵測裝置包括:一止擋元件,可移動地設置於乘載裝置上,且位於偵測區域內;以及一偵測元件,設置於乘載裝置內。偵測元件被配置當止擋元件被門板推移並接近偵測元件時,發出警告訊號。 In some embodiments, the detecting device includes: a stop element movably disposed on the carrying device and located in the detecting area; and a detecting component disposed in the carrying device. The detecting component is configured to issue a warning signal when the stopper element is moved by the door panel and approaches the detecting component.

於一些實施例中,偵測元件可為一接觸式開關或一非接觸式開關。 In some embodiments, the detecting component can be a contact switch or a contactless switch.

於一些實施例中,止擋元件包括:一滑塊,可移動地設置於乘載裝置之一滑槽內;以及一止擋片,連接於滑塊,且位於偵測區域內。 In some embodiments, the stop element includes: a slider movably disposed in one of the chutes of the carrier device; and a stop tab coupled to the slider and located within the detection area.

於一些實施例中,偵測裝置被配置當門板接觸止擋片之朝向容置空間之一接觸面時,發出警告訊號。 In some embodiments, the detecting device is configured to issue a warning signal when the door panel contacts one of the contact faces of the stop sheet facing the accommodating space.

於一些實施例中,止擋片樞接於滑塊,止擋片包括一第一導電片,且滑塊包括與第一導電片分離之一第二導電片。偵測裝置被配置當門板抵靠止擋片並使止擋片相對於滑塊旋轉後,第一導電片電性連接第二導電片,發出警告訊號。 In some embodiments, the stop piece is pivotally connected to the slider, the stop piece includes a first conductive piece, and the slider includes a second conductive piece separated from the first conductive piece. The detecting device is configured to electrically connect the second conductive piece to the second conductive piece to issue a warning signal when the door plate abuts the stop piece and rotates the stop piece relative to the slider.

於一些實施例中,偵測裝置包括:一訊號發射器,配置用以發射一偵測光束;以及一訊號接受器,配置用以接收偵測光束。偵測裝置被配置當晶圓盒之門板位於偵測區域並遮蔽偵測光束時,發出警告訊號。 In some embodiments, the detecting device includes: a signal transmitter configured to emit a detection beam; and a signal receiver configured to receive the detection beam. The detecting device is configured to issue a warning signal when the door panel of the wafer cassette is located in the detection area and shields the detection beam.

於一些實施例中,偵測裝置更包括一防護元件,設置於乘載裝置上,並鄰近於偵測區域,其中訊號發射器設置於防護元件上,且門板位於一鬆脫位置時,門板抵靠於防護元件。 In some embodiments, the detecting device further includes a protective component disposed on the carrying device adjacent to the detecting area, wherein the signal emitter is disposed on the protective component, and the door panel is located in a loose position Relying on protective components.

本揭露提供了一種晶圓盒偵測方法,包括:經由一懸吊裝置將一晶圓盒從一半導體設備吊起,並朝向一乘載裝置之一容置空間內移動;以及於懸吊裝置移動晶圓盒的過程中,當晶圓盒之一門板位於連接於容置空間之一偵測區域內時,一偵測裝置發出警告訊號。 The present disclosure provides a method for detecting a wafer cassette, comprising: lifting a wafer cassette from a semiconductor device via a suspension device and moving it in an accommodation space of one of the carrier devices; and the suspension device During the process of moving the wafer cassette, a detecting device sends a warning signal when one of the door panels of the wafer cassette is located in a detecting area connected to the receiving space.

於一些實施例中,於乘載裝置運送晶圓盒的過程中,當門板推動偵測裝置之一擋片時,偵測裝置發出警告訊號。 In some embodiments, during the process of transporting the wafer cassette by the carrying device, the detecting device issues a warning signal when the door panel pushes one of the detecting devices.

上述已揭露之特徵能以任何適當方式與一或多個已揭露之實施例相互組合、修飾、置換或轉用,並不限定於特定之實施例。 The above-disclosed features can be combined, modified, substituted or diverted with one or more of the disclosed embodiments in any suitable manner and are not limited to the specific embodiments.

本揭露雖以各種實施例揭露如上,然而其僅為範例參考而非用以限定本揭露的範圍,任何熟習此項技藝者,在不脫離本揭露之精神和範圍內,當可做些許的更動與潤飾。因此上述實施例並非用以限定本揭露之範圍,本揭露之保護範圍當視後附之申請專利範圍所界定者為準。 The present disclosure is disclosed in the above embodiments, but is not intended to limit the scope of the disclosure. Any one skilled in the art can make some changes without departing from the spirit and scope of the disclosure. With retouching. Therefore, the above embodiments are not intended to limit the scope of the disclosure, and the scope of the disclosure is defined by the scope of the appended claims.

Claims (10)

一種晶圓運輸載具,包括:一乘載裝置,具有一容置空間以及與該容置空間連接之一偵測區域;一懸吊裝置,設置於該容置空間內,且被配置用以將一晶圓盒移動至該容置空間內;以及一偵測裝置,設置於該乘載裝置上,且被配置以偵測該晶圓盒之一門板的位置,以於該門板位於該偵測區域內時,發出一警告訊號。 A wafer transporting vehicle includes: a carrying device having a receiving space and a detecting area connected to the receiving space; a suspension device disposed in the receiving space and configured to be used Moving a wafer cassette into the accommodating space; and a detecting device disposed on the carrying device and configured to detect a position of a door panel of the wafer cassette, wherein the door panel is located in the Detecting A warning signal is issued when measuring the area. 如申請專利範圍第1項所述之晶圓運輸載具,其中該偵測裝置包括:一止擋元件,可移動地設置於該乘載裝置上,且位於該偵測區域內;以及一偵測元件,設置於該乘載裝置內;其中該偵測元件被配置以當該止擋元件被該門板推移並接近該偵測元件時,發出該警告訊號。 The wafer transport vehicle of claim 1, wherein the detecting device comprises: a stop element movably disposed on the carrying device and located in the detecting area; and a detecting The detecting component is disposed in the carrying device; wherein the detecting component is configured to issue the warning signal when the stopping component is moved by the door panel and approaches the detecting component. 如申請專利範圍第2項所述之晶圓運輸載具,其中該偵測元件可為一接觸式開關或一非接觸式開關。 The wafer transport vehicle of claim 2, wherein the detecting component can be a contact switch or a non-contact switch. 如申請專利範圍第2項所述之晶圓運輸載具,其中該止擋元件包括:一滑塊,可移動地設置於該乘載裝置之一滑槽內;以及一止擋片,連接於該滑塊,且位於該偵測區域內。 The wafer transport carrier of claim 2, wherein the stop element comprises: a slider movably disposed in one of the chutes of the carrier device; and a stop piece connected to the The slider is located in the detection area. 如申請專利範圍第4項所述之晶圓運輸載具,其中當該門板接觸該止擋片之朝向該容置空間之一接觸面時,該偵測 裝置發出該警告訊號。 The wafer transporting vehicle of claim 4, wherein the detecting is when the door panel contacts a contact surface of the stopping piece facing the accommodating space The device sends the warning signal. 如申請專利範圍第4項所述之晶圓運輸載具,其中該止擋片樞接於該滑塊,該止擋片包括一第一導電片,且該滑塊包括與該第一導電片分離之一第二導電片,其中該偵測裝置被配置以當該門板抵靠該止擋片並使該止擋片相對於該滑塊旋轉後,該第一導電片電性連接該第二導電片時,發出該警告訊號。 The wafer transporting vehicle of claim 4, wherein the stopping piece is pivotally connected to the slider, the stopping piece comprises a first conductive piece, and the sliding block comprises the first conductive piece Separating a second conductive sheet, wherein the detecting device is configured to electrically connect the second conductive sheet to the second after the door panel abuts the stop sheet and rotates the stop sheet relative to the slider This warning signal is issued when the conductive sheet is used. 如申請專利範圍第1項所述之晶圓運輸載具,其中該偵測裝置包括:一訊號發射器,被配置用以發射一偵測光束;以及一訊號接受器,被配置用以接收該偵測光束;其中該偵測裝置被置以當該晶圓盒之該門板位於該偵測區域並遮蔽該偵測光束時,發出該警告訊號。 The wafer transport vehicle of claim 1, wherein the detecting device comprises: a signal transmitter configured to emit a detection beam; and a signal receiver configured to receive the Detecting a light beam; wherein the detecting device is configured to issue the warning signal when the door panel of the wafer cassette is located in the detecting area and shields the detecting beam. 如申請專利範圍第7項所述之晶圓運輸載具,其中該偵測裝置更包括一防護元件,設置於該乘載裝置上,並鄰近於該偵測區域,其中該訊號發射器設置於該防護元件上,且該門板位於一鬆脫位置時,該門板抵靠於該防護元件。 The wafer transport vehicle of claim 7, wherein the detecting device further comprises a protective component disposed on the carrier device and adjacent to the detecting region, wherein the signal transmitter is disposed on the The door panel abuts the guard element when the guard element is in a loose position. 一種晶圓盒偵測方法,包括:經由一懸吊裝置將一晶圓盒從一半導體設備吊起,並朝向一乘載裝置之一容置空間內移動;以及於該懸吊裝置移動該晶圓盒的過程中,當該晶圓盒之一門板位於連接於該容置空間之一偵測區域內時,一偵測裝置發出一警告訊號。 A method for detecting a wafer cassette, comprising: lifting a wafer cassette from a semiconductor device via a suspension device and moving it toward an accommodation space of a carrier device; and moving the crystal to the suspension device In the process of the round box, when one of the door panels of the wafer cassette is located in a detection area of the receiving space, a detecting device sends a warning signal. 如申請專利範圍第9項所述之晶圓盒偵測方法,更包括於 該乘載裝置運送該晶圓盒的過程中,當該門板位於該偵測區域內時,該偵測裝置發出該警告訊號。 The method for detecting a wafer cassette as described in claim 9 of the patent application is further included in During the process of transporting the wafer cassette, the detecting device sends the warning signal when the door panel is located in the detecting area.
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