TW201930220A - Glass, glass powder, conductive paste and solar cell sufficiently in contact with the insulating film and the semiconductor substrate so as to make sure of the above being secured by the glass - Google Patents

Glass, glass powder, conductive paste and solar cell sufficiently in contact with the insulating film and the semiconductor substrate so as to make sure of the above being secured by the glass Download PDF

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TW201930220A
TW201930220A TW108100949A TW108100949A TW201930220A TW 201930220 A TW201930220 A TW 201930220A TW 108100949 A TW108100949 A TW 108100949A TW 108100949 A TW108100949 A TW 108100949A TW 201930220 A TW201930220 A TW 201930220A
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glass
electrode
conductive paste
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insulating film
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TWI778207B (en
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中北要佑
柏田陽平
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日商Agc股份有限公司
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    • CCHEMISTRY; METALLURGY
    • C03GLASS; MINERAL OR SLAG WOOL
    • C03CCHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
    • C03C12/00Powdered glass; Bead compositions
    • CCHEMISTRY; METALLURGY
    • C03GLASS; MINERAL OR SLAG WOOL
    • C03CCHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
    • C03C3/00Glass compositions
    • C03C3/04Glass compositions containing silica
    • C03C3/062Glass compositions containing silica with less than 40% silica by weight
    • C03C3/064Glass compositions containing silica with less than 40% silica by weight containing boron
    • C03C3/066Glass compositions containing silica with less than 40% silica by weight containing boron containing zinc
    • CCHEMISTRY; METALLURGY
    • C03GLASS; MINERAL OR SLAG WOOL
    • C03CCHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
    • C03C3/00Glass compositions
    • C03C3/12Silica-free oxide glass compositions
    • C03C3/14Silica-free oxide glass compositions containing boron
    • C03C3/145Silica-free oxide glass compositions containing boron containing aluminium or beryllium
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01BCABLES; CONDUCTORS; INSULATORS; SELECTION OF MATERIALS FOR THEIR CONDUCTIVE, INSULATING OR DIELECTRIC PROPERTIES
    • H01B1/00Conductors or conductive bodies characterised by the conductive materials; Selection of materials as conductors
    • H01B1/14Conductive material dispersed in non-conductive inorganic material
    • H01B1/16Conductive material dispersed in non-conductive inorganic material the conductive material comprising metals or alloys
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01BCABLES; CONDUCTORS; INSULATORS; SELECTION OF MATERIALS FOR THEIR CONDUCTIVE, INSULATING OR DIELECTRIC PROPERTIES
    • H01B1/00Conductors or conductive bodies characterised by the conductive materials; Selection of materials as conductors
    • H01B1/20Conductive material dispersed in non-conductive organic material
    • H01B1/22Conductive material dispersed in non-conductive organic material the conductive material comprising metals or alloys
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/02Details
    • H01L31/0224Electrodes
    • H01L31/022408Electrodes for devices characterised by at least one potential jump barrier or surface barrier
    • H01L31/022425Electrodes for devices characterised by at least one potential jump barrier or surface barrier for solar cells
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/04Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02EREDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00Energy generation through renewable energy sources
    • Y02E10/50Photovoltaic [PV] energy
    • Y02E10/547Monocrystalline silicon PV cells

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  • Spectroscopy & Molecular Physics (AREA)
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  • Photovoltaic Devices (AREA)
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Abstract

This invention provides a glass, a glass powder containing the glass, a conductive paste containing the glass powder, and solar cells with improved conversion efficiency by using the conductive paste. When an electrode is formed on a semiconductor substrate such as a solar cell via an insulating film, the glass is sufficiently in contact with the insulating film and the semiconductor substrate, and sufficient reliability can be maintained in the same time, and the conversion efficiency of the solar cell can be increased. The glass is characterized by comprising, in terms of mol% relative to oxide, 6% to 30% of V2O5, 15% to 50% of B2O3, 10% to 40% of BaO, 5% to 30% of ZnO, and 0 to 15% of Al2O3. The glass powder comprises the glass and has a D50 of 0.8 to 6.0 [mu]m when a volume-based 50% particle size in the cumulative particle size distribution is set as D50.

Description

玻璃、玻璃粉末、導電糊料及太陽能電池Glass, glass powder, conductive paste and solar cells

本發明係關於一種玻璃、玻璃粉末、導電糊料及太陽能電池,尤其是關於一種適於太陽能電池之電極形成用之玻璃、玻璃粉末、使用該玻璃粉末之導電糊料、及具有利用該導電糊料形成之電極之太陽能電池。The invention relates to a glass, a glass powder, a conductive paste, and a solar cell, and more particularly, to a glass, a glass powder, a conductive paste using the glass powder, and a conductive paste using the glass powder. Solar cells with formed electrodes.

先前以來,於矽(Si)等半導體基板上形成作為電極之導電層之電子裝置用於多種用途。此種作為電極之導電層係以如下方式形成,即:將使鋁(Al)或銀(Ag)、銅(Cu)等導電性金屬粉末及玻璃粉末分散於有機媒劑中而成之導電糊料塗覆於半導體基板上,並以電極形成所需之溫度進行煅燒。Previously, electronic devices in which a conductive layer as an electrode was formed on a semiconductor substrate such as silicon (Si) were used for various purposes. Such a conductive layer as an electrode is formed by dispersing a conductive metal powder such as aluminum (Al), silver (Ag), copper (Cu), and glass powder in an organic vehicle. The material is coated on a semiconductor substrate and calcined at a temperature required for electrode formation.

當以此方式於半導體基板上形成電極時,會有如下情形,即:於形成有半導體基板之電極之表面整面形成絕緣膜,且圖案狀之電極以部分地貫通絕緣膜而與半導體基板接觸之方式形成。例如,於太陽能電池中,於成為受光面之半導體基板上設置抗反射膜,且電極圖案狀地設置於其上。抗反射膜係用以一面保持充分之可視光透射率一面降低正面反射率而提高受光效率者,一般由氮化矽、二氧化鈦、二氧化矽、氧化鋁等絕緣材料構成。又,於PERC(Passivated Emitter and Rear Contact,鈍化發射極及背接觸)等太陽能電池中,於背面整面亦設置有包含與抗反射膜相同之絕緣材料之鈍化膜,並且電極以與半導體基板部分接觸之姿態形成於該鈍化膜上。When an electrode is formed on a semiconductor substrate in this manner, there is a case where an insulating film is formed on the entire surface of the electrode on which the semiconductor substrate is formed, and the patterned electrode partially penetrates the insulating film to contact the semiconductor substrate Way of forming. For example, in a solar cell, an antireflection film is provided on a semiconductor substrate that becomes a light-receiving surface, and electrodes are provided thereon in a pattern. The anti-reflection film is used to reduce the frontal reflectivity and improve the light receiving efficiency while maintaining sufficient visible light transmittance, and is generally composed of insulating materials such as silicon nitride, titanium dioxide, silicon dioxide, and aluminum oxide. Moreover, in solar cells such as PERC (Passivated Emitter and Rear Contact), a passivation film containing the same insulating material as the anti-reflection film is also provided on the entire rear surface, and the electrode A contact gesture is formed on the passivation film.

此處,上述電極之形成中必須以與半導體基板接觸之方式形成電極,並且於受光面上除去絕緣膜與電極之圖案對應之部分,於除去絕緣膜之部分形成電極。又,於PERC太陽能電池等之背面上可進行電性接觸之範圍內部分地除去絕緣膜,於背面整面形成電極。Here, in the formation of the above-mentioned electrode, it is necessary to form the electrode so as to be in contact with the semiconductor substrate, and remove the portion of the insulating film corresponding to the pattern of the electrode on the light-receiving surface, and form the electrode on the portion of removing the insulating film. In addition, the insulating film is partially removed within a range where electrical contact can be made on the back surface of a PERC solar cell or the like, and an electrode is formed on the entire back surface.

作為部分地除去絕緣層之方法,係利用雷射等進行物理除去,於除去了絕緣層之部分形成電極,藉此該電極與半導體接觸而作為太陽能電池進行動作。於先前之太陽能電池構造中,若背面電極與Si等之半導體基板全面地直接接觸並形成電極,則藉由背面全面之接觸而作為太陽能電池進行動作。另一方面,若為PERC太陽能電池等之構造,則除去了絕緣膜之部分之面積為背面整面之大致1~3%,背面側電極之大部分形成於絕緣膜上。As a method of partially removing the insulating layer, a laser or the like is used to physically remove the electrode, and an electrode is formed on the portion from which the insulating layer has been removed, whereby the electrode is in contact with the semiconductor to operate as a solar cell. In the previous solar cell structure, if the back electrode was directly in contact with a semiconductor substrate such as Si as a whole and an electrode was formed, it would operate as a solar cell through the entire back contact. On the other hand, in the case of a structure such as a PERC solar cell, the area excluding the insulating film is approximately 1 to 3% of the entire back surface, and most of the back electrode is formed on the insulating film.

於半導體基板上形成電極之上述技術亦應用於太陽能電池中之pn接合型半導體基板上之電極形成。作為此種含有玻璃粉末之導電糊料,例如,於專利文獻1中記載有電子裝置電極用糊料。於專利文獻1中,揭示有一種無鉛玻璃,其係將可形成對於腐蝕性氣體等之耐久性優異之電極之氧化釩作為主成分,並且作為具體之玻璃組成,以氧化物換算含有V2 O5 :26.7莫耳%、ZnO:22.2莫耳%、BaO:17.8莫耳%、Sb2 O3 :11.0莫耳%、及P2 O5 :22.3莫耳%。然而,由於專利文獻1中所記載之玻璃中未充分地含有B2 O3 ,尤其是當p型半導體基板中之太陽能電池之背面電極形成時,作為多數載子之硼無法充分地擴散至Si基板中,故而有電氣特性劣化之問題。The above-mentioned technique of forming an electrode on a semiconductor substrate is also applied to electrode formation on a pn-junction semiconductor substrate in a solar cell. As such a conductive paste containing glass powder, for example, Patent Document 1 describes a paste for an electrode of an electronic device. Patent Document 1 discloses a lead-free glass containing vanadium oxide as a main component capable of forming an electrode having excellent durability against corrosive gases and the like, and containing V 2 O in terms of oxide as a specific glass composition. 5: 26.7 mole%, ZnO: 22.2 mole%, BaO: 17.8 mole%, Sb 2 O 3: 11.0 mole%, and P 2 O 5: 22.3 mole%. However, since the glass described in Patent Document 1 does not sufficiently contain B 2 O 3 , especially when a back electrode of a solar cell in a p-type semiconductor substrate is formed, boron as a majority carrier cannot be sufficiently diffused into Si. In the substrate, there is a problem that the electrical characteristics are deteriorated.

於專利文獻2中,作為被覆用玻璃,揭示有一種玻璃,其以氧化物換算含有V2 O5 :4.4莫耳%、B2 O3 :9.2莫耳%、ZnO:26.5莫耳%、BaO:5.2莫耳%、Al2 O3 :10.2莫耳%、SiO2 :30.6莫耳%、MgO:6.0莫耳%、CaO:7.1莫耳%、及SrO:0.8莫耳%。然而,專利文獻2中所記載之玻璃若用於電極形成,則由於V2 O5 含量低,SiO2 含量高,從而玻璃軟化點上升,有於電極形成所需之煅燒時無足夠之玻璃進行流動之問題。Patent Document 2 discloses glass as a coating glass which contains V 2 O 5 : 4.4 mole%, B 2 O 3 : 9.2 mole%, ZnO: 26.5 mole%, and BaO in terms of oxide. : 5.2 mole%, Al 2 O 3 : 10.2 mole%, SiO 2 : 30.6 mole%, MgO: 6.0 mole%, CaO: 7.1 mole%, and SrO: 0.8 mole%. However, if the glass described in Patent Document 2 is used for electrode formation, since the content of V 2 O 5 is low and the content of SiO 2 is high, the softening point of the glass is increased, and there is not enough glass for the firing required for electrode formation. The problem of mobility.

於專利文獻3中,作為電漿顯示面板間隔壁用無鉛玻璃,揭示有一種玻璃,其以氧化物換算含有V2 O5 :17.5莫耳%、B2 O3 :15.2莫耳%、ZnO:26.0莫耳%、BaO:6.9莫耳%、Al2 O3 :5.2莫耳%、K2 O:5.6莫耳%、CaO:9.4莫耳%、TiO2 :6.6莫耳%、及P2 O5 :7.5莫耳%。然而,專利文獻3中所記載之玻璃若用於介隔絕緣膜之PERC太陽能電池等之背面側之電極形成,則由於BaO含量低,從而電極與半導體基板之接觸電阻成分增加,有電池特性下降之問題。In Patent Document 3, as a lead-free glass for a plasma display panel partition wall, there is disclosed a glass containing V 2 O 5 : 17.5 mole%, B 2 O 3 : 15.2 mole%, and ZnO: 26.0 mole%, BaO: 6.9 mole%, Al 2 O 3: 5.2 mole%, K 2 O: 5.6 mole%, CaO: 9.4 mole%, TiO 2: 6.6 mole%, and P 2 O 5 : 7.5 mole%. However, if the glass described in Patent Document 3 is used to form an electrode on the back side of a PERC solar cell that cuts off the edge film, the contact resistance component between the electrode and the semiconductor substrate increases due to the low BaO content, and the battery characteristics decrease Problem.

於專利文獻4中,作為無鉛系低熔點玻璃,揭示有一種玻璃,其以氧化物換算含有V2 O5 :16.3莫耳%、B2 O3 :18.0莫耳%、ZnO:34.1莫耳%、BaO:13.8莫耳%、Al2 O3 :3.6莫耳%、TeO2 :4.0莫耳%、TiO2 :6.0莫耳%、及MoO3 :4.1莫耳%。然而,專利文獻4中所記載之玻璃若用於介隔絕緣膜之PERC太陽能電池等之背面側之電極形成,則由於ZnO含量高、玻璃轉移點低,從而於電極形成時玻璃與絕緣膜過度反應,有電極外觀變差之問題。
[先前技術文獻]
[專利文獻]
In Patent Document 4, as a lead-free low-melting glass, there is disclosed a glass containing V 2 O 5 : 16.3 mol%, B 2 O 3 : 18.0 mol%, and ZnO: 34.1 mol% in terms of oxide. , BaO: 13.8 mole%, Al 2 O 3: 3.6 mole%, TeO 2: 4.0 mole%, TiO 2: 6.0 mole%, and MoO 3: 4.1 mole%. However, if the glass described in Patent Document 4 is used to form an electrode on the back side of a PERC solar cell or the like that cuts off the edge film, the glass and the insulating film are excessive when the electrode is formed because of the high ZnO content and low glass transition point The reaction has a problem that the appearance of the electrode is deteriorated.
[Prior technical literature]
[Patent Literature]

[專利文獻1]日本專利第5754090號
[專利文獻2]日本專利特開平3-126639公報
[專利文獻3]日本專利特開2006-8496公報
[專利文獻4]日本專利特開平6-263478公報
[Patent Document 1] Japanese Patent No. 5754090
[Patent Document 2] Japanese Patent Laid-Open No. 3-126639
[Patent Document 3] Japanese Patent Laid-Open No. 2006-8496
[Patent Document 4] Japanese Patent Laid-Open No. 6-263478

[發明所欲解決之問題][Problems to be solved by the invention]

關於太陽能電池之電極形成中所使用之釩系玻璃,開發了許多如專利文獻1般提高電極之形成性之技術。然而,如下技術正在開發中,尤其是於PERC等之太陽能電池中,即便調整了用於電極形成之玻璃粉末之玻璃組成或粉末之粒度分佈,於現狀下,隨著電極形成亦能充分地保持可靠性,並且降低電極與半導體基板之電阻,從而提高太陽能電池之轉換效率。Regarding vanadium-based glass used for electrode formation of a solar cell, many techniques have been developed as described in Patent Document 1 to improve the electrode formability. However, the following technologies are under development, especially in solar cells such as PERC. Even if the glass composition or particle size distribution of the glass powder used for electrode formation is adjusted, under current conditions, it can be fully maintained with electrode formation. Reliability, and reduce the resistance between the electrode and the semiconductor substrate, thereby improving the conversion efficiency of the solar cell.

本發明之目的在於提供一種玻璃,其係用於電極形成者,當於太陽能電池等之半導體基板上介隔絕緣膜形成電極時,可形成如下電極,其外觀良好且能夠充分地確保與絕緣膜及半導體基板之接觸,同時由於具有耐水性等而保持充分之可靠性,並且該玻璃能夠提高太陽能電池之轉換效率。本發明之目的在於進而提供一種包含該玻璃之玻璃粉末、含有該玻璃粉末之導電糊料、及藉由使用該導電糊料而提高了轉換效率之太陽能電池。
[解決問題之技術手段]
An object of the present invention is to provide a glass which is used for electrode formation. When forming an electrode through an insulating film on a semiconductor substrate such as a solar cell, the following electrode can be formed, which has a good appearance and can sufficiently secure the insulating film. It is in contact with semiconductor substrates, while maintaining sufficient reliability due to water resistance, etc., and the glass can improve the conversion efficiency of solar cells. An object of the present invention is to further provide a glass powder containing the glass, a conductive paste containing the glass powder, and a solar cell having improved conversion efficiency by using the conductive paste.
[Technical means to solve the problem]

本發明提供以下構成之玻璃、玻璃粉末、導電糊料及太陽能電池。
[1]一種玻璃,其特徵在於:以氧化物換算之莫耳%表示,含有V2 O5 :6~30%、B2 O3 :15~50%、BaO:10~40%、ZnO:5~30%、及Al2 O3 :0~15%。
[2]如[1]之玻璃,以氧化物換算之莫耳%表記,其進而含有合計0~10%之選自SiO2 、SrO、MoO3 及WO3 中之至少1種。
[3]如[1]或[2]之玻璃,其中,玻璃轉移溫度為380~550℃。
[4]一種玻璃粉末,其包含如[1]至[3]中任一項之玻璃,當將累積粒度分佈中之體積基準之50%粒徑設為D50 時,D50 為0.8~6.0 μm。
[5]一種導電糊料,其含有如[4]之玻璃粉末、導電性金屬粉末、及有機媒劑。
[6]一種太陽能電池,其具備使用如[5]之導電糊料而形成之電極。
[7]一種導電糊料,其特徵在於:其係含有金屬、玻璃、及有機媒劑者,上述金屬相對於上述導電糊料之總質量含有63.0~97.9質量%,且包含選自由Al、Ag、Cu、Au、Pd及Pt所組成之群中之至少1種;上述玻璃相對於上述金屬100質量份含有0.1~9.8質量份,以氧化物換算之莫耳%表示,含有V2 O5 :6~30%、B2 O3 :15~50%、BaO:10~40%、ZnO:5~30%、及Al2 O3 0~15%;且上述有機媒劑相對於上述導電糊料之總質量含有2~30質量%。
[8]如[7]之導電糊料,其中,以氧化物換算之莫耳%表記,上述玻璃進而含有合計0~10%之選自SiO2 、SrO、MoO3 及WO3 中之至少1種。
[9]如[7]或[8]之導電糊料,其中,上述玻璃之玻璃轉移溫度為380~550℃。
[10]如[7]至[9]中任一項之導電糊料,其中,上述玻璃係當將累積粒度分佈中之體積基準之50%粒徑設為D50 時D50 為0.8~6.0 μm之玻璃粒子。
[11]如[7]至[10]中任一項之導電糊料,其中,上述金屬含有Al。
[12]如[7]之[11]中之任一項之導電糊料,其中,上述有機媒劑係使有機樹脂黏合劑溶解於溶劑而成之有機樹脂黏合劑溶液,上述有機樹脂黏合劑包含:選自由丙烯酸系樹脂、甲基纖維素、乙基纖維素、羧甲基纖維素、乙氧基纖維素、苄基纖維素、丙基纖維素、及硝化纖維素所組成之群中之至少1種,上述丙烯酸系樹脂係將選自由甲基丙烯酸甲酯、甲基丙烯酸乙酯、甲基丙烯酸丁酯、甲基丙烯酸2-羥基乙酯、丙烯酸丁酯、及丙烯酸2-羥基乙酯所組成之群中之至少1種以上聚合而獲得者;且上述溶劑包含選自由松油醇、二乙二醇單丁醚乙酸酯、二乙二醇單乙醚乙酸酯、丙二醇二乙酸酯、及甲基乙基酮所組成之群中之至少1種。
[13]一種太陽能電池,其特徵在於具備:矽基板,其具有太陽光受光面;第1絕緣膜,其設置於上述矽基板之上述太陽光受光面側;第2絕緣膜,其設置於上述矽基板之上述太陽光受光面之相反側之表面,且具有至少一個開口部;第2電極,其經由上述第2絕緣膜之上述開口部與上述矽基板部分接觸;及第1電極,其貫通上述第1絕緣膜之一部分而與上述矽基板接觸;且上述第2電極包含:含有選自由Al、Ag、Cu、Au、Pd及Pt所組成之群中之至少1種之金屬、及以氧化物換算之莫耳%表示含有V2 O5 :6~30%、B2 O3 :15~50%、BaO:10~40%、ZnO:5~30%、及Al2 O3 0~15%之玻璃。
[14]如[13]之太陽能電池,其中,上述第2電極包含:上述金屬90~99.9質量%、及上述玻璃0.1~10質量%。
[15]如[13]或[14]之太陽能電池,其中,上述第2電極中所包含之金屬至少含有Al。
[16]如[13]至[15]中之任一項之太陽能電池,其中,上述第1電極包含至少含有Ag之金屬。
[17]如[13]至[16]中之任一項之太陽能電池,其中,上述第1絕緣膜含有氮化矽。
[18]如[13]至[17]中之任一項之太陽能電池,其中,上述第2絕緣膜具備與上述矽基板之上述太陽光受光面之相反側之表面相接之含有氧化鋁或氧化矽之氧化金屬膜,且於上述氧化金屬膜上進而具備氮化矽膜。
[發明之效果]
The present invention provides glass, glass powder, conductive paste, and solar cells having the following constitutions.
[1] A glass characterized in that it is expressed in mole% in terms of oxides and contains V 2 O 5 : 6 to 30%, B 2 O 3 : 15 to 50%, BaO: 10 to 40%, and ZnO: 5 to 30% and Al 2 O 3 : 0 to 15%.
[2] The glass according to [1], which is expressed in mole% in terms of oxide, and further contains at least one selected from SiO 2 , SrO, MoO 3 and WO 3 in a total of 0 to 10%.
[3] The glass according to [1] or [2], wherein the glass transition temperature is 380 to 550 ° C.
[4] A glass powder comprising the glass according to any one of [1] to [3], and when the 50% particle diameter based on the volume basis in the cumulative particle size distribution is set to D 50 , D 50 is 0.8 to 6.0 μm.
[5] A conductive paste containing the glass powder as described in [4], a conductive metal powder, and an organic vehicle.
[6] A solar cell comprising an electrode formed using a conductive paste as described in [5].
[7] A conductive paste, characterized in that it contains a metal, glass, and an organic vehicle, and the metal contains 63.0 to 97.9% by mass relative to the total mass of the conductive paste, and is selected from Al, Ag At least one of the group consisting of Cu, Au, Pd, and Pt; the glass contains 0.1 to 9.8 parts by mass relative to 100 parts by mass of the metal, expressed in mole% in terms of oxides, and contains V 2 O 5 : 6-30%, B 2 O 3 : 15-50%, BaO: 10-40%, ZnO: 5-30%, and Al 2 O 3 0-15%; and the organic vehicle is relative to the conductive paste. The total mass contains 2 to 30% by mass.
[8] The conductive paste as described in [7], in which Mohr% expressed in terms of oxides, said glass further contains a total of 0 to 10% of at least 1 selected from SiO 2 , SrO, MoO 3 and WO 3 Species.
[9] The conductive paste according to [7] or [8], wherein the glass transition temperature of the glass is 380 to 550 ° C.
[10] The conductive paste according to any one of [7] to [9], wherein the glass is a D 50 of 0.8 to 6.0 when the 50% particle diameter of the volume basis in the cumulative particle size distribution is set to D 50 μm glass particles.
[11] The conductive paste according to any one of [7] to [10], wherein the metal contains Al.
[12] The conductive paste according to any one of [11] in [7], wherein the organic vehicle is an organic resin adhesive solution obtained by dissolving an organic resin adhesive in a solvent, and the organic resin adhesive Contains: selected from the group consisting of acrylic resin, methyl cellulose, ethyl cellulose, carboxymethyl cellulose, ethoxy cellulose, benzyl cellulose, propyl cellulose, and nitrocellulose At least one type of the acrylic resin is selected from the group consisting of methyl methacrylate, ethyl methacrylate, butyl methacrylate, 2-hydroxyethyl methacrylate, butyl acrylate, and 2-hydroxyethyl acrylate The obtained group is obtained by polymerizing at least one or more species; and the solvent includes a solvent selected from the group consisting of terpineol, diethylene glycol monobutyl ether acetate, diethylene glycol monoethyl ether acetate, and propylene glycol diacetic acid. At least one of the group consisting of an ester and methyl ethyl ketone.
[13] A solar cell comprising: a silicon substrate having a solar light receiving surface; a first insulating film provided on the solar light receiving surface side of the silicon substrate; and a second insulating film provided on the silicon substrate A surface of the silicon substrate opposite to the above-mentioned sunlight-receiving surface and having at least one opening; a second electrode that is in contact with the silicon substrate through the opening of the second insulating film; and a first electrode that passes through A part of the first insulating film is in contact with the silicon substrate; and the second electrode includes: a metal containing at least one selected from the group consisting of Al, Ag, Cu, Au, Pd, and Pt; and an oxide Molar% in terms of material means that it contains V 2 O 5 : 6-30%, B 2 O 3 : 15-50%, BaO: 10-40%, ZnO: 5-30%, and Al 2 O 3 0-15. % Of glass.
[14] The solar cell according to [13], wherein the second electrode includes 90 to 99.9% by mass of the metal and 0.1 to 10% by mass of the glass.
[15] The solar cell according to [13] or [14], wherein the metal contained in the second electrode contains at least Al.
[16] The solar cell according to any one of [13] to [15], wherein the first electrode includes a metal containing at least Ag.
[17] The solar cell according to any one of [13] to [16], wherein the first insulating film contains silicon nitride.
[18] The solar cell according to any one of [13] to [17], wherein the second insulating film includes an alumina-containing or abutting surface on the opposite side of the solar light-receiving surface of the silicon substrate. An oxide metal film of silicon oxide, and further comprising a silicon nitride film on the oxide metal film.
[Effect of the invention]

本發明之玻璃及包含該玻璃之玻璃粉末與導電性成分一併用於導電糊料中,藉此,當於太陽能電池等之半導體基板上介隔絕緣膜形成電極時,可充分地確保與絕緣膜及半導體基板之接觸。又,該粉末係含有硼之玻璃之粉末,可於電極形成時使玻璃含有之硼擴散至半導體基板之例如p型層中,從而形成良好之p+ 層,藉此可提高太陽能電池之轉換效率。The glass of the present invention and the glass powder containing the glass are used in a conductive paste together with a conductive component, whereby when an edge film is formed on a semiconductor substrate such as a solar cell to form an electrode, it can sufficiently ensure the insulation film. And semiconductor substrate. In addition, the powder is a powder of glass containing boron, which can diffuse the boron contained in the glass into the p-type layer of the semiconductor substrate during the formation of the electrode, thereby forming a good p + layer, thereby improving the conversion efficiency of the solar cell. .

進而,藉由將本發明之玻璃用於太陽能電池等之半導體基板上介隔絕緣膜之電極形成中,可抑制電極形成時之電極剝離或變色等外觀不良之產生。此外,由於形成之電極具有耐水性等,故而亦可具備高可靠性,即便於需使太陽能電池等之半導體於任何環境下動作之情形時,亦可充分地應對。Furthermore, by using the glass of the present invention for electrode formation with an insulating film on a semiconductor substrate such as a solar cell, it is possible to suppress appearance defects such as electrode peeling or discoloration during electrode formation. In addition, since the formed electrode has water resistance and the like, it can also have high reliability, and can sufficiently cope with a case where a semiconductor such as a solar cell needs to be operated in any environment.

於本發明中,可提供一種含有該玻璃粉末、能夠用於電極形成、可提高太陽能電池之轉換效率之導電糊料、及藉由使用該導電糊料而提高了轉換效率之太陽能電池。In the present invention, a conductive paste containing the glass powder, which can be used for electrode formation, can improve the conversion efficiency of a solar cell, and a solar cell whose conversion efficiency is improved by using the conductive paste can be provided.

以下,對本發明之實施形態進行說明。
<玻璃>
本發明之玻璃以氧化物換算之莫耳%表示含有V2 O5 :6~30%、B2 O3 :15~50%、BaO:10~40%、ZnO:5~30%、及Al2 O3 :0~15%。於以下說明中,若無特別說明,則玻璃之各成分之含量中之「%」之表示係氧化物換算之莫耳%表示。於本說明書中,表示數值範圍之「~」包括其上下限。
Hereinafter, embodiments of the present invention will be described.
< Glass >
The glass of the present invention in terms of Moire% indicates that it contains V 2 O 5 : 6-30%, B 2 O 3 : 15-50%, BaO: 10-40%, ZnO: 5-30%, and Al. 2 O 3 : 0 to 15%. In the following description, unless otherwise specified, the expression of "%" in the content of each component of the glass is expressed in mole% in terms of oxide conversion. In this specification, "~" indicating a numerical range includes the upper and lower limits.

本發明之玻璃中之各成分之含量係根據獲得之玻璃之感應耦合電漿(ICP-AES:Inductively Coupled Plasma-Atomic Emission Spectroscopy)分析或電子束顯微分析儀(EPMA:Electron Probe Micro Analyzer)分析之結果求出。The content of each component in the glass of the present invention is analyzed based on the obtained ICP-AES (Inductively Coupled Plasma-Atomic Emission Spectroscopy) analysis or the electron beam microanalyzer (EPMA: Electron Probe Micro Analyzer) analysis The result is obtained.

於本發明之玻璃中,V2 O5 係提高玻璃之軟化流動性、且能夠於使用含有該玻璃之導電糊料而獲得之電極中獲得與絕緣膜及半導體基板之接觸性之必需成分。以下,於玻璃成分之說明中,「導電糊料」係「含有本發明之玻璃之導電糊料」,「電極」係指「使用含有本發明之玻璃之導電糊料而獲得之電極」。又,藉由玻璃中之V2 O5 降低了玻璃轉移點,可容易地調整電極與絕緣膜及半導體基板之接觸性。其結果,可促進後續之電極與半導體基板之反應,降低接觸電阻,並且可提高電極與絕緣膜之接著性。In the glass of the present invention, V 2 O 5 is an essential component that improves the softened fluidity of the glass and can obtain contact with an insulating film and a semiconductor substrate in an electrode obtained by using a conductive paste containing the glass. Hereinafter, in the description of the glass components, "conductive paste" means "conductive paste containing the glass of the present invention", and "electrode" means "electrode obtained using the conductive paste containing the glass of the present invention". In addition, the glass transition point is reduced by V 2 O 5 in the glass, and the contact between the electrode and the insulating film and the semiconductor substrate can be easily adjusted. As a result, the subsequent reaction between the electrode and the semiconductor substrate can be promoted, the contact resistance can be reduced, and the adhesion between the electrode and the insulating film can be improved.

V2 O5 進而可提高導電糊料中與導電性金屬之潤濕性,並且可藉由提高導電性金屬彼此之結合性而降低電極之電阻。又,於電極形成時調整導電性金屬表面之氧化膜生成,可調整耐候性。於導電性金屬為Al之情形時,其效果尤佳。V 2 O 5 can further improve the wettability of the conductive paste with the conductive metal, and can reduce the resistance of the electrode by improving the bonding between the conductive metals. In addition, the formation of an oxide film on the surface of the conductive metal at the time of electrode formation can adjust the weather resistance. The effect is particularly good when the conductive metal is Al.

本發明之玻璃含有6%以上且30%以下比率之V2 O5 。若V2 O5 之含量未達6%,則由於玻璃軟化點變高而流動性下降,從而導致電極與絕緣膜及半導體基板之接觸性、及電極中導電性金屬彼此之結合不充分。V2 O5 之含量較佳為7%以上,更佳為8%以上。另一方面,若V2 O5 之含量超過30%,則玻璃與絕緣膜過度反應,獲得之電極發生變色,並且導電性金屬過度氧化,電阻上升。V2 O5 之含量較佳為29%以下,更佳為28%以下。The glass of the present invention contains V 2 O 5 in a ratio of 6% to 30%. If the content of V 2 O 5 is less than 6%, the softening point of the glass will increase and the fluidity will decrease. As a result, the contact between the electrode and the insulating film and the semiconductor substrate, and the combination of conductive metals in the electrode will be insufficient. The content of V 2 O 5 is preferably 7% or more, and more preferably 8% or more. On the other hand, when the content of V 2 O 5 exceeds 30%, the glass and the insulating film react excessively, the obtained electrode is discolored, and the conductive metal is excessively oxidized to increase the resistance. The content of V 2 O 5 is preferably 29% or less, and more preferably 28% or less.

於本發明之玻璃中,B2 O3 係必需成分。B2 O3 具有提高玻璃之軟化流動性且提高電極與絕緣膜及半導體基板之接觸性之功能。又,B2 O3 係使玻璃穩定之成分。In the glass of the present invention, B 2 O 3 is an essential component. B 2 O 3 has the function of improving the softening fluidity of glass and improving the contact between the electrode and the insulating film and the semiconductor substrate. B 2 O 3 is a component that stabilizes glass.

進而,B2 O3 使玻璃流動,故而可促進半導體基板與導電糊料中之玻璃直接反應。藉此,例如,於半導體基板係pn接合型Si半導體基板之情形時,可良好地形成與電極接觸之p 層或n 層。例如,當形成與p 層接觸之電極時,可促進作為玻璃中所含成分之B2 O3 中之B擴散至p 層,從而可形成更良好之p 層。Furthermore, since B 2 O 3 causes glass to flow, direct reaction between the semiconductor substrate and the glass in the conductive paste can be promoted. Thereby, for example, when the semiconductor substrate is a pn junction Si semiconductor substrate, a p + layer or an n + layer in contact with the electrode can be formed satisfactorily. For example, when an electrode in contact with the p + layer is formed, it is possible to promote the diffusion of B in B 2 O 3 as a component contained in the glass to the p + layer, thereby forming a better p + layer.

本發明之玻璃含有15%以上50%以下比率之B2 O3 。若B2 O3 之含量未達15%,則當電極形成時無法使B充分地擴散至Si半導體基板中,故而例如有無法提高太陽能電池中之轉換效率之狀況。進而,B2 O3 係形成玻璃之網狀構造之成分,若其含量未達15%則導致無法進行玻璃化。B2 O3 之含量較佳為18%以上,更佳為20%以上。另一方面,若B2 O3 之含量超過50%,則耐候性劣化。B2 O3 之含量較佳為48%以下,更佳為45%以下。The glass of the present invention contains B 2 O 3 at a ratio of 15% to 50%. If the content of B 2 O 3 is less than 15%, B cannot be sufficiently diffused into the Si semiconductor substrate when the electrode is formed, and thus, for example, the conversion efficiency in a solar cell may not be improved. Furthermore, B 2 O 3 is a component that forms a network structure of glass, and if its content is less than 15%, vitrification cannot be performed. The content of B 2 O 3 is preferably 18% or more, and more preferably 20% or more. On the other hand, if the content of B 2 O 3 exceeds 50%, the weather resistance deteriorates. The content of B 2 O 3 is preferably 48% or less, and more preferably 45% or less.

於本發明之玻璃中,BaO係降低電極與半導體基板之接觸電阻之必需成分。BaO可作為玻璃成分亦可作為改質氧化物使玻璃穩定。本發明之玻璃中之BaO之含量為10%以上且40%以下。若BaO之含量未達10%,則當電極形成時電極與半導體基板之接觸電阻上升,故而例如有無法提高太陽能電池中之轉換效率之狀況。又,玻璃化變得困難。BaO之含量交較佳為13%以上,更佳為15%以上。若BaO之含量超過40%則由於發生結晶化而無法獲得玻璃。BaO之含量較佳為35%以下,更佳為30%以下。In the glass of the present invention, BaO is an essential component for reducing the contact resistance between an electrode and a semiconductor substrate. BaO can be used as a glass component or as a modified oxide to stabilize the glass. The content of BaO in the glass of the present invention is 10% or more and 40% or less. If the content of BaO is less than 10%, the contact resistance between the electrode and the semiconductor substrate increases when the electrode is formed, and therefore, for example, the conversion efficiency in a solar cell may not be improved. Moreover, vitrification becomes difficult. The content of BaO is preferably 13% or more, and more preferably 15% or more. When the content of BaO exceeds 40%, glass cannot be obtained due to crystallization. The content of BaO is preferably 35% or less, and more preferably 30% or less.

於本發明之玻璃中,ZnO係必需成分。ZnO係能夠抑制玻璃之結晶化、提高玻璃與Si基板等半導體基板上之絕緣膜或Si基板之反應性之成分。本發明之玻璃含有5%以上30%以下比率之ZnO。若ZnO之含量未達5%,則玻璃與Si基板等半導體基板上之絕緣膜或Si基板之反應性變差、接合強度減弱,且電極與半導體基板之電阻升高。ZnO之含量較佳為6%以上。若ZnO之含量超過30%,則當電極形成時玻璃與絕緣膜過度反應,電極外觀變差,且耐水性等耐候性下降。ZnO之含量較佳為27%以下。In the glass of the present invention, ZnO is an essential component. ZnO is a component that can suppress crystallization of glass and improve the reactivity of insulating films on Si substrates such as glass and Si substrates or Si substrates. The glass of the present invention contains ZnO in a ratio of 5% to 30%. If the content of ZnO is less than 5%, the reactivity between the glass and the insulating film on the semiconductor substrate such as the Si substrate or the Si substrate is deteriorated, the bonding strength is weakened, and the resistance between the electrode and the semiconductor substrate is increased. The content of ZnO is preferably 6% or more. When the content of ZnO exceeds 30%, the glass and the insulating film react excessively when the electrode is formed, the appearance of the electrode is deteriorated, and weather resistance such as water resistance is reduced. The content of ZnO is preferably 27% or less.

於本發明之玻璃中,Al2 O3 係用以提高耐候性之成分。又,藉由含有Al2 O3 ,可使玻璃穩定。本發明之玻璃中之Al2 O3 之含量為0%以上且15%以下。Al2 O3 之含量較佳為2%以上,更佳為5%以上。若Al2 O3 之含量超過15%,則玻璃轉移點上升,故而燒結時無法使玻璃流動。Al2 O3 之含量較佳為13%以下。In the glass of the present invention, Al 2 O 3 is a component for improving weather resistance. In addition, by containing Al 2 O 3 , the glass can be stabilized. The content of Al 2 O 3 in the glass of the present invention is 0% or more and 15% or less. The content of Al 2 O 3 is preferably 2% or more, and more preferably 5% or more. When the content of Al 2 O 3 exceeds 15%, the glass transition point increases, so that the glass cannot flow during sintering. The content of Al 2 O 3 is preferably 13% or less.

本發明之玻璃較佳為,進而含有合計0~10%之選自SiO2 、SrO、MoO3 及WO3 中之至少1種。若本發明之玻璃含有該等成分,則可使玻璃穩定且提高耐候性。SiO2 、SrO、MoO3 及WO3 之含量較佳為合計0.5%以上。若SiO2 、SrO、MoO3 及WO3 合計超過10%,則有無法進行玻璃化之虞。SiO2 、SrO、MoO3 及WO3 之含量較佳為合計8%以下。The glass of the present invention preferably further contains at least one selected from the group consisting of SiO 2 , SrO, MoO 3 and WO 3 in a total amount of 0 to 10%. When the glass of the present invention contains these components, the glass can be stabilized and the weather resistance can be improved. The content of SiO 2 , SrO, MoO 3 and WO 3 is preferably 0.5% or more in total. If the total of SiO 2 , SrO, MoO 3 and WO 3 exceeds 10%, vitrification may not be performed. The content of SiO 2 , SrO, MoO 3 and WO 3 is preferably 8% or less in total.

本發明之玻璃亦可含有除該等以外之其他任意成分。作為其他任意成分,具體而言,可列舉PbO、Bi2 O3 、P2 O3 、As2 O5 、Sb2 O5 、Li2 O、Na2 O、K2 O、ZrO2 、Fe2 O3 、CuO、Sb2 O3 、SnO2 、MnO、MnO2 、CeO2 、TiO2 等用於普通玻璃之各種氧化物成分。The glass of this invention may contain arbitrary components other than these. Specific examples of other optional components include PbO, Bi 2 O 3 , P 2 O 3 , As 2 O 5 , Sb 2 O 5 , Li 2 O, Na 2 O, K 2 O, ZrO 2 , and Fe 2 O 3 , CuO, Sb 2 O 3 , SnO 2 , MnO, MnO 2 , CeO 2 , TiO 2 and other oxide components used in ordinary glass.

該等其他任意成分根據目的可單獨使用1種或組合2種以上使用。其他任意成分之含量就各成分而言較佳為64%以下,更佳為60%以下,進而較佳為50%以下,最佳為40%以下。進而,其他任意成分之總含量較佳為50%以下,更佳為40%以下。These other arbitrary components can be used individually by 1 type or in combination of 2 or more types according to the objective. The content of other optional components is preferably 64% or less, more preferably 60% or less, still more preferably 50% or less, and most preferably 40% or less for each component. Furthermore, the total content of other optional components is preferably 50% or less, and more preferably 40% or less.

本發明之玻璃較佳為玻璃轉移溫度為380℃以上且550℃以下。若玻璃轉移溫度未達380℃,則燒結時玻璃之流動性高於所需。若玻璃之流動性過高,則會有如下情形:例如,於用於導電性糊料中之情形時,導電性成分與玻璃分離,於所得之電極中無法提供充分之導電性。又,由於玻璃轉移點較低,故而當電極形成時玻璃與絕緣膜過度反應,有電極外觀變差之情形。若玻璃轉移溫度超過550℃,則燒結時玻璃無法充分地流動,有特性變得不穩定之情形。玻璃轉移溫度更佳為390℃以上且520℃以下。The glass of the present invention preferably has a glass transition temperature of 380 ° C or higher and 550 ° C or lower. If the glass transition temperature does not reach 380 ° C, the fluidity of the glass during sintering is higher than required. If the fluidity of glass is too high, for example, when it is used in a conductive paste, the conductive component is separated from the glass, and sufficient conductivity cannot be provided in the obtained electrode. In addition, since the glass transition point is low, the glass and the insulating film react excessively when the electrode is formed, and the appearance of the electrode may be deteriorated. If the glass transition temperature exceeds 550 ° C, the glass may not flow sufficiently during sintering, and the characteristics may become unstable. The glass transition temperature is more preferably 390 ° C to 520 ° C.

於本發明中,玻璃轉移溫度係以如下方式獲得,即:利用由RIGAKU公司所製造之示差熱分析(DTA)裝置TG8110,以升溫速度10℃/分鐘進行測定而獲得DTA線圖,求出第1轉折點。In the present invention, the glass transition temperature is obtained by using a differential thermal analysis (DTA) device TG8110 manufactured by RIGAKU to measure at a temperature increase rate of 10 ° C./minute to obtain a DTA diagram, 1 turning point.

本發明之玻璃之製造方法並無特別限定。例如,可利用以下所示之方法進行製造。The manufacturing method of the glass of this invention is not specifically limited. For example, it can manufacture by the method shown below.

首先,準備原料混合物。原料只要為一般之氧化物系玻璃之製造中所使用之原料即可,並無特別限定,可使用氧化物或碳酸鹽等。於所得之玻璃中,以成為上述組成範圍之方式適當調整原料之種類及比率作為原料混合物。First, a raw material mixture is prepared. The raw material is not particularly limited as long as it is a raw material used in the production of general oxide-based glass, and oxides, carbonates, and the like can be used. In the obtained glass, the type and ratio of the raw materials were appropriately adjusted so as to become the above-mentioned composition range as a raw material mixture.

其次,利用周知之方法對原料混合物加熱而獲得熔融物。加熱熔融之溫度(熔融溫度)較佳為800~1400℃,更佳為900~1300℃。加熱熔融之時間較佳為30~300分鐘。Next, the raw material mixture is heated by a well-known method to obtain a melt. The temperature (melting temperature) for heating and melting is preferably 800 to 1400 ° C, and more preferably 900 to 1300 ° C. The time for heating and melting is preferably 30 to 300 minutes.

其後,藉由使熔融物冷卻固化,可獲得本發明之玻璃。冷卻方法並無特別限定。亦可採用藉由滾壓機、衝壓機、滴加冷卻液體等使其急冷之方法。所得之玻璃較佳為完全非晶質,即結晶化度為0%。但是,只要於不損害本發明之效果之範圍內,亦可包含結晶化之部分。Thereafter, the glass of the present invention can be obtained by cooling and solidifying the melt. The cooling method is not particularly limited. A rapid cooling method such as a roller press, a punch, and the addition of a cooling liquid can also be used. The obtained glass is preferably completely amorphous, that is, the degree of crystallinity is 0%. However, as long as the effect of the present invention is not impaired, a crystallized portion may be included.

如此獲得之本發明之玻璃可為任何形態。例如,可為塊狀、板狀、薄板狀(薄片狀)、粉末狀等。The glass of the present invention thus obtained may be in any form. For example, it may be a block shape, a plate shape, a thin plate shape (sheet shape), a powder shape, and the like.

本發明之玻璃具有作為結合劑之功能,且具有耐水性等耐候性,較佳用於導電性糊料中。含有本發明之玻璃之導電性糊料例如宜用於太陽能電池之電極形成。於使導電糊料含有本發明之玻璃之情形時,玻璃較佳為粉末。The glass of the present invention has a function as a binder and has weather resistance such as water resistance, and is preferably used in a conductive paste. The conductive paste containing the glass of the present invention is preferably used for electrode formation of a solar cell, for example. When the conductive paste contains the glass of the present invention, the glass is preferably a powder.

<玻璃粉末>
本發明之玻璃粉末包含本發明之玻璃,且D50 較佳為0.8 μm以上且6.0 μm以下。該D50 之範圍係用於導電糊料之尤佳範圍。藉由D50 為0.8 μm以上,作為導電糊料時之分散性進一步提高。又,藉由D50 為6.0 μm以下,於導電性金屬粉末之周圍不易產生不存在玻璃粉末之部位,故而電極與半導體基板等之接著性進一步上升。D50 更佳為1.0 μm以上。D50 更佳為5.0 μm以下。
< Glass powder >
The glass powder of the present invention contains the glass of the present invention, and D 50 is preferably 0.8 μm or more and 6.0 μm or less. The range of D 50 is a particularly preferable range for a conductive paste. When D 50 is 0.8 μm or more, the dispersibility when used as a conductive paste is further improved. In addition, since D 50 is 6.0 μm or less, a portion where glass powder does not exist is not easily generated around the conductive metal powder, and thus the adhesion between the electrode and the semiconductor substrate is further improved. D 50 is more preferably 1.0 μm or more. D 50 is more preferably 5.0 μm or less.

再者,於本說明書中,「D50 」表示累積粒度分佈中之體積基準之50%粒徑,具體而言,於使用雷射繞射、散射式粒度分佈測定裝置測定之粒徑分佈之累積粒度曲線中,表示其累計量按體積基準占50%時之粒徑。Further, in this specification, "D 50" indicates a cumulative 50% particle diameter on a volume basis particle size distribution of, specifically, to the use of a laser diffraction scattering type particle size distribution measuring apparatus for measuring the cumulative particle size distribution of The particle size curve indicates the particle size when the cumulative amount accounts for 50% on a volume basis.

本發明之玻璃粉末可藉由如下方式獲得,即:例如,利用乾式粉碎法或濕式粉碎法,將以上述方式製造而成之玻璃粉碎為具有上述特定之粒度分佈。The glass powder of the present invention can be obtained by, for example, using a dry pulverization method or a wet pulverization method to pulverize the glass manufactured in the above-mentioned manner to have the above-mentioned specific particle size distribution.

用以獲得本發明之玻璃粉末之玻璃之粉碎方法例如較佳為對適當形狀之玻璃進行乾式粉碎之後進行濕式粉碎之方法。乾式粉碎及濕式粉碎可使用例如輥磨機、球磨機、噴射磨機等粉碎機進行。粒度分佈之調整例如可藉由各粉碎中之粉碎時間或球磨機之球之大小等粉碎機之調整而進行。於濕式粉碎法之情形時,較佳為使用水作為溶劑。於濕式粉碎之後,藉由進行乾燥等除去水分,獲得玻璃粉末。為了調整玻璃粉末之粒徑,除了玻璃之粉碎以外,視需要亦可進行分級。The method for pulverizing the glass to obtain the glass powder of the present invention is preferably a method for dry-pulverizing glass of an appropriate shape and then wet-pulverizing. Dry pulverization and wet pulverization can be performed using a pulverizer such as a roll mill, a ball mill, or a jet mill. The particle size distribution can be adjusted, for example, by adjusting the pulverizer such as the pulverization time in each pulverization or the size of the ball of the ball mill. In the case of the wet pulverization method, it is preferable to use water as a solvent. After the wet pulverization, moisture is removed by drying or the like to obtain a glass powder. In order to adjust the particle diameter of the glass powder, in addition to the pulverization of the glass, classification may be performed as necessary.

<導電糊料>
本發明之玻璃例如可作為玻璃粉末應用於導電糊料。本發明之導電糊料含有本發明之上述玻璃粉末、導電性金屬粉末及有機媒劑。
< Conductive Paste >
The glass of the present invention can be applied to a conductive paste as a glass powder, for example. The conductive paste of the present invention contains the glass powder, the conductive metal powder, and the organic vehicle of the present invention.

本發明之導電糊料含有之導電性金屬粉末並無特別限制,可使用形成於半導體基板或絕緣性基板等電路基板(包含積層電子零件)上之電極中一般使用之金屬粉末。作為導電性金屬粉末,具體而言,可列舉Al、Ag、Cu、Au、Pd、Pt等之粉末,該等之中,自生產性之觀點而言較佳為Al粉末。自抑制凝聚且獲得均勻之分散性之觀點來看,導電性金屬粉末之粒徑D50 較佳為0.3 μm以上且10 μm以下。The conductive metal powder contained in the conductive paste of the present invention is not particularly limited, and metal powder generally used for electrodes formed on a circuit substrate (including a laminated electronic component) such as a semiconductor substrate or an insulating substrate can be used. Specific examples of the conductive metal powder include powders of Al, Ag, Cu, Au, Pd, and Pt. Among them, Al powder is preferred from the viewpoint of productivity. From the viewpoint of suppressing aggregation and obtaining uniform dispersibility, the particle diameter D 50 of the conductive metal powder is preferably 0.3 μm or more and 10 μm or less.

導電糊料中之導電性金屬粉末之含量相對於導電糊料之總質量較佳設為63.0質量%以上且97.9質量%以下。若導電性金屬粉末之含量未達63.0質量%,則導電性金屬粉末容易過度地燒結,產生玻璃浮起等。另一方面,若導電性金屬粉末之含量超過97.9質量%,則有玻璃析出物無法覆蓋導電性金屬粉末之周圍之虞。又,有電極與半導體基板或絕緣性基板等電路基板之接著性變差之虞。相對於導電糊料之總質量之導電性金屬粉末之含量更佳為75.0質量%以上且95.0質量%以下。The content of the conductive metal powder in the conductive paste is preferably 63.0% by mass or more and 97.9% by mass or less with respect to the total mass of the conductive paste. If the content of the conductive metal powder is less than 63.0% by mass, the conductive metal powder is likely to be excessively sintered, and glass floats or the like. On the other hand, when the content of the conductive metal powder exceeds 97.9% by mass, there is a possibility that glass precipitates cannot cover the surroundings of the conductive metal powder. In addition, there is a possibility that the adhesion between the electrode and a circuit substrate such as a semiconductor substrate or an insulating substrate may deteriorate. The content of the conductive metal powder with respect to the total mass of the conductive paste is more preferably 75.0% by mass or more and 95.0% by mass or less.

導電糊料中之玻璃粉末之含量例如相對於導電性金屬粉末100質量份較佳設為0.1質量份以上且10質量份以下。若玻璃粉末之含量未達0.1質量份,則有玻璃析出物無法覆蓋導電性金屬粉末之周圍之虞。又,有電極與半導體基板或絕緣性基板等電路基板之接著性變差之虞。另一方面,若玻璃粉末之含量超過10質量份,則導電性金屬粉末容易過度地燒結,產生玻璃浮起等。相對於導電性金屬粉末100質量份之玻璃粉末之含量更佳為0.5質量份以上且5質量份以下。The content of the glass powder in the conductive paste is, for example, preferably 0.1 to 10 parts by mass based on 100 parts by mass of the conductive metal powder. If the content of the glass powder is less than 0.1 parts by mass, there is a possibility that glass precipitates cannot cover the area around the conductive metal powder. In addition, there is a possibility that the adhesion between the electrode and a circuit substrate such as a semiconductor substrate or an insulating substrate may deteriorate. On the other hand, when the content of the glass powder exceeds 10 parts by mass, the conductive metal powder tends to be excessively sintered, and glass floats or the like. The content of the glass powder with respect to 100 parts by mass of the conductive metal powder is more preferably 0.5 parts by mass or more and 5 parts by mass or less.

作為導電糊料含有之有機媒劑,可使用將有機樹脂黏合劑溶解於溶劑而獲得之有機樹脂黏合劑溶液。As the organic vehicle contained in the conductive paste, an organic resin adhesive solution obtained by dissolving an organic resin adhesive in a solvent can be used.

作為用於有機媒劑中之有機樹脂黏合劑,可使用例如甲基纖維素、乙基纖維素、羧甲基纖維素、乙氧基纖維素、苄基纖維素、丙基纖維素、硝化纖維素等纖維素系樹脂、及將甲基丙烯酸甲酯、甲基丙烯乙酯、甲基丙烯酸丁酯、甲基丙烯酸2-羥基乙酯、丙烯酸丁酯、丙烯酸2-羥基乙酯等丙烯酸系單體之1種以上聚合而獲得之丙烯酸系樹脂等有機樹脂。As the organic resin binder used in the organic vehicle, for example, methyl cellulose, ethyl cellulose, carboxymethyl cellulose, ethoxy cellulose, benzyl cellulose, propyl cellulose, and nitrocellulose can be used. Cellulose resins such as cellulose, and acrylic monomers such as methyl methacrylate, ethyl methacrylate, butyl methacrylate, 2-hydroxyethyl methacrylate, butyl acrylate, and 2-hydroxyethyl acrylate Organic resins, such as acrylic resins, obtained by polymerizing one or more of the polymers.

作為用於有機媒劑中之溶劑,於纖維素系樹脂之情形時,較佳使用松油醇、二乙二醇單丁醚乙酸酯、二乙二醇單乙醚乙酸酯、丙二醇二乙酸酯等溶劑;於丙烯酸系樹脂之情形時,較佳使用甲基乙基酮、松油醇、二乙二醇單丁醚乙酸酯、二乙二醇單乙醚乙酸酯、丙二醇二乙酸酯等溶劑。As a solvent used in an organic vehicle, in the case of a cellulose resin, terpineol, diethylene glycol monobutyl ether acetate, diethylene glycol monoethyl ether acetate, and propylene glycol diethyl are preferably used. In the case of acrylic resins, methyl ethyl ketone, terpineol, diethylene glycol monobutyl ether acetate, diethylene glycol monoethyl ether acetate, and propylene glycol diethyl are preferably used. Solvents such as acid esters.

有機媒劑中之有機樹脂黏合劑與溶劑之比率並無特別限制,以所得之有機樹脂黏合劑溶液成為能夠調整導電糊料之黏度的黏度之方式進行選擇。具體而言,作為以有機樹脂黏合劑:溶劑表示之質量比,較佳為大致3:97~15:85。The ratio of the organic resin binder to the solvent in the organic vehicle is not particularly limited, and is selected in such a manner that the obtained organic resin binder solution becomes a viscosity capable of adjusting the viscosity of the conductive paste. Specifically, the mass ratio represented by the organic resin binder: solvent is preferably approximately 3:97 to 15:85.

導電糊料中之有機媒劑之含量相對於導電糊料總量較佳為2質量%以上且30質量%以下。若有機媒劑之含量未達2質量%,則由於導電糊料之黏度上升而導致導電糊料之印刷等塗覆性下降,不易形成良好之導電層(電極)。又,若有機媒劑之含量超過30質量%,則導電糊料之固形物成分之含有比率變低,不易獲得充分之塗覆膜厚。The content of the organic vehicle in the conductive paste is preferably 2% by mass or more and 30% by mass or less with respect to the total amount of the conductive paste. If the content of the organic vehicle is less than 2% by mass, coating properties such as printing of the conductive paste are reduced due to an increase in the viscosity of the conductive paste, and it is difficult to form a good conductive layer (electrode). In addition, if the content of the organic vehicle exceeds 30% by mass, the content ratio of the solid content of the conductive paste becomes low, and it is difficult to obtain a sufficient coating film thickness.

作為本發明之導電糊料之一態樣,可列舉如下導電糊料,其中,包含選自由Al、Ag、Cu、Au、Pd及Pt所組成之群中之至少1種之金屬相對於導電糊料之總質量含有63.0~97.9質量%;以氧化物換算之莫耳%表示含有V2 O5 :6~30%、B2 O3 :15~50%、BaO:10~40%、ZnO:5~30%、及Al2 O3 :0~15%之玻璃相對於上述金屬100質量份含有0.1~9.8質量份;且有機媒劑相對於導電糊料之總質量含有2~30質量%。本態樣中之玻璃係本發明之玻璃。關於本態樣之導電糊料含有之玻璃、金屬及有機媒劑,組成、種類、形態、含量等之較佳態樣可與上述相同。As one aspect of the conductive paste of the present invention, the following conductive pastes can be cited. Among them, at least one metal selected from the group consisting of Al, Ag, Cu, Au, Pd, and Pt is contained in the conductive paste. The total mass of the material contains 63.0-97.9% by mass; Moore% expressed in terms of oxide contains V 2 O 5 : 6-30%, B 2 O 3 : 15-50%, BaO: 10-40%, ZnO: 5 to 30% and Al 2 O 3 : 0 to 15% of the glass contains 0.1 to 9.8 parts by mass with respect to 100 parts by mass of the metal; and the organic vehicle contains 2 to 30% by mass with respect to the total mass of the conductive paste. The glass in this aspect is the glass of the present invention. With regard to the glass, metal, and organic vehicle contained in the conductive paste of this aspect, the preferred aspects of the composition, kind, form, content, etc. may be the same as described above.

於本發明之導電糊料中,除上述玻璃粉末、導電性金屬粉末、及有機媒劑之外,視需要可於不違背本發明之目的之限度內調配周知之添加劑。In the conductive paste of the present invention, in addition to the above-mentioned glass powder, conductive metal powder, and organic vehicle, if necessary, well-known additives can be blended within a limit that does not violate the purpose of the present invention.

作為此種添加劑,例如可列舉各種無機氧化物。作為無機氧化物,具體而言,可列舉B2 O3 、ZnO、SiO2 、Al2 O3 、TiO2 、MgO、ZrO2 、Sb2 O3 、及該等複合氧化物等。該等無機氧化物於導電糊料之煅燒時有緩和導電性金屬粉末之燒結之效果,藉此具有調整煅燒後之接合強度之作用。包括該等無機氧化物之添加劑之大小並無特別限定,例如,可合適地使用D50 為10 μm以下者。Examples of such additives include various inorganic oxides. Specific examples of the inorganic oxide include B 2 O 3 , ZnO, SiO 2 , Al 2 O 3 , TiO 2 , MgO, ZrO 2 , Sb 2 O 3 , and composite oxides thereof. These inorganic oxides have the effect of alleviating the sintering of the conductive metal powder during the calcination of the conductive paste, thereby having the effect of adjusting the joint strength after the calcination. The size of the additives including these inorganic oxides is not particularly limited, and for example, those having a D 50 of 10 μm or less can be suitably used.

導電糊料中之無機氧化物之含量根據目的進行適當設定,且相對於玻璃粉末較佳為10質量%以下,更佳為7質量%以下。若相對於玻璃粉末之無機氧化物之含量超過10質量%,則有電極形成時之導電糊料之流動性下降而導致電極與半導體基板或絕緣性基板等電路基板之接著強度下降之虞。又,為了獲得實用之調配效果(煅燒後之接合強度之調整),上述含量之下限值較佳為0.5質量%,更佳為1.0質量%。The content of the inorganic oxide in the conductive paste is appropriately set according to the purpose, and it is preferably 10% by mass or less, more preferably 7% by mass or less with respect to the glass powder. If the content of the inorganic oxide with respect to the glass powder exceeds 10% by mass, the fluidity of the conductive paste at the time of electrode formation may decrease, which may cause a decrease in bonding strength between the electrode and a circuit substrate such as a semiconductor substrate or an insulating substrate. In addition, in order to obtain a practical blending effect (adjustment of the bonding strength after firing), the lower limit of the content is preferably 0.5% by mass, and more preferably 1.0% by mass.

於導電糊料中,亦可如消泡劑或分散劑般向導電糊料中添加周知之添加物。再者,上述有機媒劑及該等添加物一般為電極形成之過程中消失之成分。於導電糊料之調製中,可應用使用具備攪拌翼之旋轉式混合機或磨碎機、輥磨機、球磨機等之周知之方法。In the conductive paste, well-known additives can also be added to the conductive paste like a defoamer or dispersant. In addition, the organic vehicle and the additives are generally components that disappear during the formation of the electrode. In the preparation of the conductive paste, a well-known method using a rotary mixer or a grinder, a roll mill, a ball mill, or the like having a stirring blade can be applied.

半導體基板或絕緣性基板等電路基板上之導電糊料之塗覆及煅燒可利用與先前之電極形成中之塗覆、煅燒相同之方法進行。作為塗覆方法,可列舉網版印刷、點膠法等。煅燒溫度係由所含有之導電性金屬粉末之種類、表面狀態等決定,可例示大致500~1000℃之溫度。煅燒時間係根據欲形成之電極之形狀、厚度等進行適當調整。又,於導電糊料之塗覆與煅燒之間,亦可設置於80~200℃左右之乾燥處理。The coating and firing of the conductive paste on a circuit substrate such as a semiconductor substrate or an insulating substrate can be performed by the same method as the coating and firing in the previous electrode formation. Examples of the coating method include screen printing and a dispensing method. The firing temperature is determined by the type and surface state of the conductive metal powder contained, and a temperature of approximately 500 to 1000 ° C can be exemplified. The firing time is appropriately adjusted according to the shape, thickness, etc. of the electrode to be formed. In addition, between the application and firing of the conductive paste, a drying treatment at 80 to 200 ° C. can also be set.

<太陽能電池>
本發明之太陽能電池具備使用本發明之此種導電糊料而形成之電極,具體而言,具備燒附於半導體基板上之電極。本發明之太陽能電池例如較佳為具備使用本發明之導電糊料而形成之電極作為PERC太陽能電池等單面受光型太陽能電池之背面電極。PERC太陽能電池一般於受光面具有含有絕緣材料之抗反射膜,亦於背面除一部分以外之整面含有與該抗反射膜相同之絕緣材料之絕緣膜。
< Solar cell >
The solar cell of the present invention includes an electrode formed using the conductive paste of the present invention, and specifically includes an electrode baked on a semiconductor substrate. The solar cell of the present invention preferably includes, for example, an electrode formed using the conductive paste of the present invention as a back electrode of a single-sided light-receiving solar cell such as a PERC solar cell. PERC solar cells generally have an anti-reflection film containing an insulating material on the light receiving surface, and an insulating film containing the same insulating material as the anti-reflection film on the entire surface except for a part of the back surface.

本發明之太陽能電池係於PERC太陽能電池等中,較佳為具備使用本發明之導電糊料而形成之電極,作為於設置於背面之絕緣膜上以與半導體基板部分接觸之姿態形成之電極。若使用本發明之導電糊料,則當於半導體基板上介隔絕緣膜形成電極時可獲得如下電極,其與除去了絕緣膜及絕緣層之部分之半導體基板之接觸得以充分地確保,且該電極因具有耐水性等而具有高可靠性。The solar cell of the present invention is a PERC solar cell or the like, and preferably includes an electrode formed using the conductive paste of the present invention as an electrode formed on an insulating film provided on the back surface so as to be in contact with a semiconductor substrate portion. If the conductive paste of the present invention is used, when an insulating film is formed on a semiconductor substrate via an insulating film, the following electrode can be obtained, and the contact with the semiconductor substrate from which the insulating film and the insulating layer are removed is sufficiently ensured, and the The electrode has high reliability due to water resistance and the like.

如上所述,本發明之導電糊料較佳含有Al粉末作為導電性金屬粉末。即,本發明之導電糊料較佳用於Al電極之形成。本發明之導電糊料更佳用於如下情形,即:於半導體基板上形成絕緣膜,例如利用雷射除去絕緣膜之一部分而成為具有開口部之絕緣膜,其後於該絕緣膜上經由開口部以與半導體基板部分接觸之姿態形成Al電極。As described above, the conductive paste of the present invention preferably contains Al powder as the conductive metal powder. That is, the conductive paste of the present invention is preferably used for forming an Al electrode. The conductive paste of the present invention is more preferably used in a case where an insulating film is formed on a semiconductor substrate, for example, a part of the insulating film is removed by a laser to become an insulating film having an opening, and then an opening is formed on the insulating film through the opening. The Al electrode is formed so as to be in contact with the semiconductor substrate portion.

於具有開口部之絕緣膜上,作為經由該開口部以與半導體基板接觸之姿態設置之Al電極,例如,可列舉:使用p型Si基板之PERC太陽能電池之背面電極、使用n型Si基板之PERT(Passivated Emitter, Rear Totally diffused,鈍化發射極,全背場擴散)太陽能電池之背面電極、使用n型Si基板或p型Si基板之雙面受光太陽能電池之設置於p層或p 層側之電極、背接觸型太陽能電池之一者之電極等。Examples of the Al electrode provided on the insulating film having an opening portion in contact with the semiconductor substrate through the opening portion include, for example, a back electrode of a PERC solar cell using a p-type Si substrate, and an electrode using an n-type Si substrate. PERT (Passivated Emitter, Rear Totally diffused), the back electrode of a solar cell, and a double-sided light-receiving solar cell using an n-type Si substrate or a p-type Si substrate are arranged on the p-layer or p + -layer side Electrode, one of the back-contact solar cells, etc.

作為本發明之太陽能電池之一實施形態,可列舉如下太陽能電池,其具備:矽基板,其具有太陽光受光面;第1絕緣膜,其設置於矽基板之太陽光受光面側;第2絕緣膜,其設置於矽基板之太陽光受光面之相反側之表面,且具有至少一個開口部;第2電極,其經由第2絕緣膜之開口部與矽基板部分接觸;及第1電極,其貫通第1絕緣膜之一部分而與矽基板接觸;第2電極包含:含有選自由Al、Ag、Cu、Au、Pd及Pt所組成之群中之至少1種之金屬、及以氧化物換算之莫耳%表示含有V2 O5 :6~30%、B2 O3 :15~50%、BaO:10~40%、ZnO:5~30%、及Al2 O3 :0~15%之玻璃。As one embodiment of the solar cell of the present invention, a solar cell including a silicon substrate having a solar light receiving surface; a first insulating film provided on the solar light receiving surface side of the silicon substrate; and a second insulation A film provided on a surface on the opposite side of the solar light receiving surface of the silicon substrate and having at least one opening; a second electrode in contact with the silicon substrate portion through the opening of the second insulating film; and a first electrode that Penetrates a part of the first insulating film and contacts the silicon substrate; the second electrode includes: a metal containing at least one selected from the group consisting of Al, Ag, Cu, Au, Pd, and Pt; and an oxide equivalent Molar% indicates that V 2 O 5 : 6-30%, B 2 O 3 : 15-50%, BaO: 10-40%, ZnO: 5-30%, and Al 2 O 3 : 0-15%. glass.

再者,第2絕緣膜之開口部係指設置為自第2絕緣膜之表面貫通至矽基板之太陽光受光面之相反側之表面的部分。於以下說明中,「開口部」之用語亦以與上述相同之含意使用。In addition, the opening portion of the second insulating film refers to a portion provided so as to penetrate from the surface of the second insulating film to the surface on the opposite side of the sunlight receiving surface of the silicon substrate. In the following description, the term "opening" is used with the same meaning as above.

開口部之形狀並無特別限定,可為線形或圓形。於形狀為線形之情形時,線寬較佳為30~100 μm;於圓形之情形時,其直徑較佳為30~100 μm。開口部之面積相對於矽基板之太陽光受光面之相反側之表面之總面積較佳為1~3%。The shape of the opening is not particularly limited, and may be linear or circular. In the case of a linear shape, the line width is preferably 30 to 100 μm; in the case of a circular shape, the diameter is preferably 30 to 100 μm. The area of the opening is preferably 1 to 3% of the total area of the surface on the opposite side of the solar light receiving surface of the silicon substrate.

第1電極較佳包含含有Al、Ag、Cu、Au、Pd及Pt所組成之群中之至少1種之金屬,該金屬較佳為至少含有Ag。又,第1絕緣膜例如含有氮化矽、二氧化鈦、氧化矽、氧化鋁等絕緣材料,較佳含有氮化矽。The first electrode preferably contains at least one metal from the group consisting of Al, Ag, Cu, Au, Pd, and Pt, and the metal preferably contains at least Ag. The first insulating film contains insulating materials such as silicon nitride, titanium dioxide, silicon oxide, and aluminum oxide, and preferably contains silicon nitride.

第2電極較佳含有上述金屬90~99.9質量%及上述玻璃0.1~10質量%。第2電極含有之玻璃係本發明之玻璃,且較佳組成係如上述所說明般。第2電極含有之金屬較佳為至少含有Al。The second electrode preferably contains 90 to 99.9% by mass of the metal and 0.1 to 10% by mass of the glass. The glass contained in the second electrode is the glass of the present invention, and the preferred composition is as described above. The metal contained in the second electrode preferably contains at least Al.

第2絕緣膜較佳為多層膜,且較佳為如下多層膜之構成,該多層膜具備與矽基板之太陽光受光面之相反側之表面相接之、含有氧化鋁或氧化矽之氧化金屬膜,並且於該氧化金屬膜上進而具備氮化矽膜。The second insulating film is preferably a multilayer film, and is preferably a multilayer film having an oxide metal containing alumina or silicon oxide in contact with a surface on the opposite side of the sunlight receiving surface of the silicon substrate. And a silicon nitride film is further provided on the metal oxide film.

以下,以利用本發明之導電糊料形成p型Si基板單面受光型太陽能電池之電極之情形為例進行說明。圖1係模式性地表示使用本發明之導電糊料形成電極之p型Si基板單面受光型太陽能電池之一例之剖面之圖。Hereinafter, a case where an electrode of a p-type Si substrate single-sided light-receiving solar cell is formed using the conductive paste of the present invention will be described as an example. FIG. 1 is a cross-sectional view schematically showing an example of a p-type Si substrate single-sided light-receiving solar cell in which an electrode is formed using the conductive paste of the present invention.

圖1所示之太陽能電池10包含p型Si基板1、設置於其上表面之絕緣膜2A、及設置於下表面之具有開口部7之絕緣膜2B,且包含形成於絕緣膜2B上之全面且經由開口部7與p型Si基板部分接觸之Al電極4、及貫通絕緣膜2A之一部分而與p型Si基板1接觸之Ag電極3。p型Si基板1之上表面例如具有使用濕式蝕刻法形成之、降低光反射率之凹凸構造。再者,圖式之上下未必表示使用時之上下。再者,視需要,p型Si基板之兩表面亦可具有凹凸構造。The solar cell 10 shown in FIG. 1 includes a p-type Si substrate 1, an insulating film 2A provided on an upper surface thereof, and an insulating film 2B provided with an opening portion 7 provided on a lower surface, and includes a comprehensive structure formed on the insulating film 2B. The Al electrode 4 which is in contact with the p-type Si substrate portion through the opening 7 and the Ag electrode 3 which is in contact with the p-type Si substrate 1 through a part of the insulating film 2A. The upper surface of the p-type Si substrate 1 has, for example, a concavo-convex structure formed using a wet etching method to reduce light reflectance. Moreover, the top and bottom of the drawings do not necessarily indicate top and bottom when used. Moreover, if necessary, both surfaces of the p-type Si substrate may have a concave-convex structure.

p型Si基板1自上而下依次由n 層1a、p層1b構成,Al電極4與p層1b接觸,且Ag電極3與n 層1a接觸。此處,n 層1a可藉由於形成有上述凹凸構造之表面例如摻雜P、Sb、As等而形成。The p-type Si substrate 1 is composed of an n + layer 1a and a p layer 1b in order from top to bottom, an Al electrode 4 is in contact with the p layer 1b, and an Ag electrode 3 is in contact with the n + layer 1a. Here, the n + layer 1a may be formed by doping the surface having the uneven structure described above, for example, doped with P, Sb, As, or the like.

Al電極4及Ag電極3係分別使用含有玻璃粉末及Al粉末之Al電極形成用導電糊料、及含有玻璃粉末及Ag粉末之Ag電極形成用導電糊料而以如下方式形成。The Al electrode 4 and the Ag electrode 3 are formed as follows using a conductive paste for forming an Al electrode containing a glass powder and an Al powder, and a conductive paste for forming an Ag electrode containing a glass powder and an Ag powder, respectively.

即,設置於p型Si基板1之上表面之絕緣膜2A於Ag電極3之形成前無間隙地存在於全面,且僅用以形成Ag電極3之塗覆有上述導電糊料之一部分於導電糊料之煅燒時熔融,藉此形成貫通絕緣膜2A並與p型Si基板1接觸之Ag電極3。That is, the insulating film 2A provided on the upper surface of the p-type Si substrate 1 exists in the entire surface without a gap before the formation of the Ag electrode 3, and only a part of the Ag electrode 3 coated with the above conductive paste is conductive The paste melts during firing, thereby forming an Ag electrode 3 that penetrates the insulating film 2A and contacts the p-type Si substrate 1.

另一方面,絕緣膜2B無間隙地設置於p型Si基板1之下表面全面,其後,為了形成Al電極4,利用雷射物理地除去其一部分,成為具有開口部7之構成。於具有開口部7之絕緣膜2B上之全面,塗覆上述Al電極形成用導電糊料並進行煅燒,藉此形成覆蓋絕緣膜2B之全面且經由開口部7與半導體部分接觸之Al電極4。On the other hand, the insulating film 2B is provided on the entire surface of the lower surface of the p-type Si substrate 1 without gaps. Thereafter, in order to form the Al electrode 4, a part of it is physically removed by a laser to have a configuration having an opening 7. The entire surface of the insulating film 2B having the opening 7 is coated with the above-mentioned conductive paste for forming Al electrodes and calcined, thereby forming the Al electrode 4 covering the entire surface of the insulating film 2B and in contact with the semiconductor portion through the opening 7.

再者,於Al電極4之形成時,Al電極形成用導電糊料經由開口部7與p型Si基板1之p層1b接觸,其後於煅燒時熔融,藉此Al自Al電極擴散至p層1b內,於Al電極正上方形成Al-Si合金層5。進而於Al-Si合金層5之正上方形成BSF(Back Surface Field,背表面場)層6作為p 層。When the Al electrode 4 is formed, the conductive paste for forming the Al electrode is in contact with the p layer 1b of the p-type Si substrate 1 through the opening 7 and then melts during firing, whereby Al diffuses from the Al electrode to p In the layer 1b, an Al-Si alloy layer 5 is formed directly above the Al electrode. Further, a BSF (Back Surface Field) layer 6 is formed directly above the Al-Si alloy layer 5 as a p + layer.

於上述中,本發明之導電糊料可用作Ag電極形成用導電糊料及Al電極形成用導電糊料,但尤佳為如上述般用作Al電極形成用導電糊料。Among the above, the conductive paste of the present invention can be used as a conductive paste for forming an Ag electrode and a conductive paste for forming an Al electrode, but is particularly preferably used as a conductive paste for forming an Al electrode as described above.

作為Al電極形成用導電糊料,使用本發明之玻璃之粉末及含有Al粉末之本發明之導電糊料,藉此,當介隔絕緣膜形成電極時,充分地確保電極與絕緣膜及半導體基板之接觸,獲得與p型Si基板1充分接觸之Al電極4。As the conductive paste for forming an Al electrode, the powder of glass of the present invention and the conductive paste of the present invention containing Al powder are used, thereby sufficiently securing the electrode, the insulating film, and the semiconductor substrate when forming an electrode through an insulating film. The Al electrode 4 is sufficiently contacted with the p-type Si substrate 1.

再者,太陽能電池包含之絕緣膜具有抗反射之功能,可抑制半導體載子之再結合,作為構成該膜之絕緣材料,可使用上述列舉之絕緣材料。絕緣膜可為單層膜,亦可為多層膜。本發明之導電糊料尤其於介隔具有含氮化矽及含氧化鋁或氧化矽之層的絕緣膜形成電極時,可充分地確保電極與絕緣膜及部分形成之半導體基板之接觸,具有較高之太陽能電池特性,並且使電極部具有較高之耐候性等可靠性。In addition, the insulating film included in the solar cell has an anti-reflection function and can suppress recombination of semiconductor carriers. As the insulating material constituting the film, the above-mentioned insulating materials can be used. The insulating film may be a single-layer film or a multilayer film. In particular, when the conductive paste of the present invention is used to form an electrode through an insulating film having a layer containing silicon nitride and a layer containing aluminum oxide or silicon oxide, the contact between the electrode and the insulating film and a partially formed semiconductor substrate can be sufficiently ensured. High solar cell characteristics, and high reliability such as weather resistance.

於本發明之太陽能電池中,尤其是於PERC太陽能電池中,背面於可進行電性接觸之範圍內被部分地除去絕緣膜,當形成含有本發明之玻璃之粉末之電極時,於整個絕緣膜上形成電極,同時除去了部分絕緣膜之部分可形成確保與半導體基板之接觸之電極構造。藉由使用該導電糊料,可形成外觀良好之該電極,所得之電極具有耐水性等耐候性,藉此能夠提供可實現高可靠性及高電池特性之太陽能電池。
[實施例]
In the solar cell of the present invention, especially in the PERC solar cell, the insulating film is partially removed on the back surface within a range where electrical contact can be made. When an electrode containing the glass powder of the present invention is formed, the entire insulating film is formed. An electrode structure is formed on the electrode and a part of the insulating film is removed at the same time, so that an electrode structure for ensuring contact with the semiconductor substrate can be formed. By using the conductive paste, the electrode having a good appearance can be formed, and the obtained electrode has weather resistance such as water resistance, thereby providing a solar cell capable of realizing high reliability and high battery characteristics.
[Example]

以下,參照實施例對本發明更詳細地進行說明,但本發明並不限定於實施例。例1~例17為實施例,例18、例19為比較例。Hereinafter, the present invention will be described in more detail with reference to examples, but the present invention is not limited to the examples. Examples 1 to 17 are examples, and examples 18 and 19 are comparative examples.

(例1~例19)
利用以下方法將玻璃製成薄板狀玻璃,且自薄板狀玻璃製造玻璃粉末。測定玻璃粉末之粒度分佈,並且使用玻璃粉末測定玻璃之玻璃轉移溫度。
(Examples 1 to 19)
The glass was made into a thin plate glass by the following method, and glass powder was produced from the thin plate glass. The particle size distribution of the glass powder was measured, and the glass transition temperature of the glass was measured using the glass powder.

<玻璃(薄板狀玻璃)之製造>
以成為表1所示之組成之方式對原料粉末進行調配、混合,於900~1200℃之電爐中使用坩鍋熔融30分鐘至1小時,從而成形為由表1所示之組成之玻璃構成之薄板狀玻璃。
< Manufacture of glass (thin plate glass) >
The raw material powder is prepared and mixed so as to have the composition shown in Table 1. It is melted in a crucible in an electric furnace at 900 to 1200 ° C for 30 minutes to 1 hour to form a glass composed of the composition shown in Table 1. Thin sheet glass.

<玻璃粉末之製造>
於各例中,組合乾式粉碎及濕式粉碎並以如下方式對所得之薄板狀玻璃進行粉碎,從而調整粒度分佈。測定所得之玻璃粉末之粒度分佈,並且使用玻璃粉末測定玻璃之玻璃轉移溫度。
< Manufacture of glass powder >
In each example, dry pulverization and wet pulverization were combined and the obtained thin plate glass was pulverized in the following manner to adjust the particle size distribution. The particle size distribution of the obtained glass powder was measured, and the glass transition temperature of the glass was measured using the glass powder.

利用球磨機對例1~例18之玻璃進行乾式粉碎,調整粉碎時間以獲得特定之D50 ,最後通過150網眼之篩網,從而製造玻璃粉末。The glass of Examples 1 to 18 was dry-pulverized with a ball mill, the crushing time was adjusted to obtain a specific D 50 , and finally passed through a 150-mesh sieve to produce glass powder.

對於例19之玻璃,為了於上述特定範圍內進一步減小D50 ,於上述乾式粉碎後,進而於球磨機中使用水對除去粗粒之玻璃粉末進行濕式粉碎,將所得之玻璃粉末用作玻璃粉末。為了於該濕式粉碎時獲得特定之D50 ,使用直徑5 mm之氧化鋁製球,藉由粉碎時間而對D50 進行調整。其後,對藉由濕式粉碎獲得之漿料進行過濾,於除去大部分水分後,利用乾燥機於130℃進行乾燥以調整水分量,從而製造玻璃粉末。For the glass of Example 19, in order to further reduce D 50 within the above specific range, after the above dry pulverization, the glass powder with coarse particles removed was further pulverized with water in a ball mill and the obtained glass powder was used as glass powder. In order to obtain a specific D 50 during the wet pulverization, a ball made of alumina having a diameter of 5 mm was used, and the D 50 was adjusted by the pulverization time. After that, the slurry obtained by the wet pulverization was filtered, and after removing most of the water, it was dried at 130 ° C. with a dryer to adjust the water content to produce a glass powder.

<評估>
對於各例之玻璃,利用以下方法對玻璃轉移溫度及玻璃粉末之D50 進行評估。將結果與組成一併示於表1。再者,於玻璃組成之各成分之欄中,空欄表示含量「0%」。
< Evaluation >
For each glass, the glass transition temperature and the D 50 of the glass powder were evaluated by the following methods. The results are shown in Table 1 together with the composition. In addition, in the column of each component of the glass composition, the empty column indicates the content "0%".

(玻璃轉移溫度)
將所得之玻璃粉末置於鋁製鍋中,利用由RIGAKU公司所製造之示差熱分析裝置TG8110以升溫速度10℃/分鐘進行測定。將藉由測定而獲得之DTA線圖之第1轉折點作為玻璃轉移溫度(表1中示為「DTA Tg」)。
(Glass transition temperature)
The obtained glass powder was placed in an aluminum pan, and measured using a differential thermal analysis device TG8110 manufactured by RIGAKU Corporation at a temperature increase rate of 10 ° C / min. The first turning point of the DTA line graph obtained by the measurement was taken as the glass transition temperature (shown as "DTA Tg" in Table 1).

(D50 )
對於例1~例18之玻璃,相對於異丙醇(IPA)60 cc混合玻璃粉末0.02 g,利用超音波分散使其分散1分鐘。向Microtrac測定機(雷射繞射、散射式粒度分佈測定裝置)中投入試樣,獲得D50 之值。對於例19之玻璃,相對於水60 cc混合玻璃粉末0.02 g,利用超音波分散使其分散1分鐘。向Microtrac測定機中投入試樣,獲得D50 之值。
(D 50 )
For the glass of Examples 1 to 18, 0.02 g of 60 cc of mixed glass powder of isopropyl alcohol (IPA) was dispersed by ultrasonic dispersion for 1 minute. A Microtrac measuring machine (laser diffraction, scattering type particle size distribution measuring device) was put into a sample to obtain a value of D 50 . Regarding the glass of Example 19, 0.02 g of a glass powder mixed with 60 cc of water was dispersed by ultrasonic dispersion for 1 minute. A sample was put into a Microtrac measuring machine, and a value of D 50 was obtained.

<導電糊料之製造>
利用以下方法製作分別含有上述中製作而成之例1~例19之玻璃粉末之Al電極形成用導電糊料。
< Manufacturing of conductive paste >
The conductive paste for forming Al electrodes containing the glass powders of Examples 1 to 19 prepared as described above was prepared by the following method.

首先,將二乙二醇單丁醚乙酸酯90質量份與乙基纖維素10質量份混合,於85℃攪拌2小時,從而調製有機媒劑。其次,於將以此方式獲得之有機媒劑21質量份與Al粉末(MINALCO公司製噴霧鋁粉:#800F)79質量份混合之後,利用磨碎機混練10分鐘。其後,以相對於Al粉末100質量份為3質量份之比率調配玻璃粉末,進而利用磨碎機混練60分鐘,製成Al電極形成用導電糊料。First, 90 parts by mass of diethylene glycol monobutyl ether acetate and 10 parts by mass of ethyl cellulose were mixed and stirred at 85 ° C. for 2 hours to prepare an organic vehicle. Next, 21 parts by mass of the organic vehicle obtained in this manner was mixed with 79 parts by mass of Al powder (spray aluminum powder manufactured by Minalco Corporation: # 800F), followed by kneading with a grinder for 10 minutes. Thereafter, a glass powder was prepared at a ratio of 3 parts by mass to 100 parts by mass of the Al powder, and further kneaded with a grinder for 60 minutes to prepare a conductive paste for forming an Al electrode.

<評估>
於使用上述Al電極形成用導電糊料形成電極後,對外觀及耐水性進行確認,作為煅燒膜評估。此時,絕緣膜係使用包含氮化矽層及氧化鋁層之2層者。將其結果示於表1。
< Evaluation >
After the electrode was formed using the conductive paste for forming an Al electrode, the appearance and water resistance were confirmed and evaluated as a fired film. In this case, the insulating film is composed of two layers including a silicon nitride layer and an aluminum oxide layer. The results are shown in Table 1.

(Al電極之製作、外觀及耐水性之評估)
分別使用上述中製作而成之Al電極形成用導電糊料,以如下方式於半導體基板上介隔絕緣膜(包含氮化矽層及氧化鋁層之2層膜)形成Al電極,且對該Al電極之外觀及耐水性進行評估。
(Production, appearance and evaluation of water resistance of Al electrode)
Using the conductive paste for forming Al electrodes prepared in the above, an Al electrode was formed on a semiconductor substrate through an insulating film (a two-layer film including a silicon nitride layer and an aluminum oxide layer) in the following manner, and an Al electrode was formed on the Al substrate. The appearance and water resistance of the electrodes were evaluated.

使用切割為160 μm之厚度之p型之結晶系Si半導體基板,首先,為了清洗基板之切割面,利用氫氟酸對表面進行大致極微量之蝕刻處理。其後,於光之受光面側之結晶系Si半導體基板表面,使用濕式蝕刻法形成降低光反射率之凹凸構造。其次,藉由擴散而於半導體基板之受光面形成n型層。使用P作為n型化之摻雜元素。其次,相對於半導體基板之n型層,於背面(p型Si基板之表面)形成絕緣膜。作為絕緣膜之材料,主要使用氮化矽及氧化鋁,於利用電漿CVD以10 nm之厚度形成氧化鋁層之後,於其上以120 nm之厚度形成氮化矽層。A p-type crystalline Si semiconductor substrate cut to a thickness of 160 μm is used. First, in order to clean the cut surface of the substrate, an approximately minute amount of etching treatment is performed on the surface with hydrofluoric acid. Thereafter, a concave-convex structure is formed on the surface of the crystalline Si semiconductor substrate on the light-receiving surface side of the light to reduce the light reflectance by a wet etching method. Next, an n-type layer is formed on the light receiving surface of the semiconductor substrate by diffusion. P is used as an n-type doping element. Next, an insulating film is formed on the back surface (the surface of the p-type Si substrate) with respect to the n-type layer of the semiconductor substrate. As a material of the insulating film, silicon nitride and aluminum oxide are mainly used. After forming an aluminum oxide layer with a thickness of 10 nm by plasma CVD, a silicon nitride layer is formed thereon with a thickness of 120 nm.

其次,用切片機將上述半導體基板切割為30 mm×30 mm之正方形之大小,於背面側之絕緣膜上,藉由200網眼之網版印刷將上述中所得之Al電極形成用導電糊料塗覆為20 mm×20 mm之正方形之圖案形狀。其後,使用紅外光加熱式帶式爐於峰值溫度760℃進行煅燒100秒,形成Al電極。Next, the above-mentioned semiconductor substrate was cut into a size of 30 mm × 30 mm square with a microtome, and the conductive paste for forming Al electrodes obtained above was printed on a 200-mesh screen printing on the insulating film on the back side. Coated as a 20 mm x 20 mm square pattern. Thereafter, an infrared light heating belt furnace was used for firing at a peak temperature of 760 ° C. for 100 seconds to form an Al electrode.

(1)外觀評估
對上述中所得之、介隔絕緣膜(包含氮化矽層及氧化鋁層之2層膜)形成於p型層(背面)側之Al電極之外觀進行評估。其後,對於能否形成Al電極,根據以下基準以肉眼進行評估。
(1) Appearance Evaluation The appearance of the Al electrode having a barrier film (a two-layer film including a silicon nitride layer and an aluminum oxide layer) formed on the p-type layer (back surface) side obtained in the above was evaluated. Thereafter, whether or not the Al electrode can be formed was evaluated with the naked eye based on the following criteria.

○:無剝離或變色,形成Al電極。
×:發生剝離或變色,作為Al電極不充分。
○: No peeling or discoloration, and an Al electrode was formed.
×: Peeling or discoloration occurred, and the Al electrode was insufficient.

將外觀評估之結果示於表1。於例1~例17之玻璃之全面,Al電極可與絕緣層接合,形成均勻之灰色。關於例18之玻璃,V2 O5 之含量高,就接著性而言為良好,但部分處變色為棕色,就作為太陽能電池之外觀而言存在問題。例19之玻璃係不含有V2 O5 之玻璃,就導電性而言為良好,但Al電極層發生剝離。The results of the appearance evaluation are shown in Table 1. In the whole of the glass of Examples 1 to 17, the Al electrode can be bonded to the insulating layer to form a uniform gray color. Regarding the glass of Example 18, the content of V 2 O 5 was high and the adhesiveness was good, but part of the glass was discolored to brown, which was a problem in terms of the appearance as a solar cell. The glass of Example 19 was a glass that did not contain V 2 O 5 and had good conductivity, but the Al electrode layer was peeled.

(2)耐水性評估
使上述中所得之、於p型層(背面)側介隔絕緣膜形成有Al電極之半導體基板於裝有離子交換水50 cc之燒杯中浸漬30分鐘,該燒杯係於恆溫水槽中加熱至85℃。根據以下基準對此時之Al電極之狀態進行評估。
(2) Evaluation of water resistance: The semiconductor substrate having the Al electrode formed on the p-type layer (back surface) side with an insulating film formed thereon was immersed in a beaker containing 50 cc of ion-exchanged water for 30 minutes. Heat to 85 ° C in a thermostatic bath. The state of the Al electrode at this time was evaluated based on the following criteria.

○:即便浸漬30分鐘,亦未於Al電極上發生發泡、變色。
△:於浸漬過程中,大量氣泡附著於Al電極表面。
×:於浸漬過程中,Al電極與離子交換水劇烈反應,從而發泡、變色。
○: Even if immersed for 30 minutes, no foaming or discoloration occurred on the Al electrode.
Δ: During the dipping process, a large number of bubbles adhered to the surface of the Al electrode.
×: During the immersion process, the Al electrode reacted violently with ion-exchanged water, thereby foaming and discoloring.

將耐水性評估之結果示於表1。例1~例17之玻璃即便有少量氣泡附著於Al電極表面,亦不會發生劇烈反應或變色。例18之玻璃於Al電極表面產生大量氣泡。例19之玻璃與離子交換水劇烈反應而發泡,最終變色為棕色。The results of the water resistance evaluation are shown in Table 1. Even if a small amount of air bubbles adhered to the surface of the Al electrode, the glass of Examples 1 to 17 did not undergo severe reaction or discoloration. The glass of Example 18 produced a large number of bubbles on the surface of the Al electrode. The glass of Example 19 reacted violently with ion-exchanged water to foam, and eventually became brown.

於太陽能電池中,一般利用乙烯乙酸乙烯酯(EVA)等樹脂對如上述般於半導體基板上形成電極而獲得之太陽能電池元件進行密封,從而進行使用,因此,就構造而言水分容易滲入內部。又,若考慮到太陽能電池之設置環境,則使用時水分多少會滲入內部為不可避免之現象。因此,為了維持太陽能電池之可靠性,電極之耐水性為不可缺少之要求。例如,於Al電極中,若耐水性低,則Al與水反應成為氫氧化鋁而不能作為電極發揮功能,作為太陽能電池之特性下降。於本發明中,由於電極具有如上述之耐水性,故而可以說太陽能電池之可靠性足夠高。In a solar cell, a resin such as ethylene vinyl acetate (EVA) is generally used to seal and obtain a solar cell element obtained by forming an electrode on a semiconductor substrate as described above. Therefore, moisture easily penetrates into the structure. In addition, if the installation environment of the solar cell is taken into consideration, it is inevitable that moisture will penetrate into the interior during use. Therefore, in order to maintain the reliability of the solar cell, the water resistance of the electrode is an indispensable requirement. For example, in an Al electrode, if the water resistance is low, Al reacts with water to become aluminum hydroxide and cannot function as an electrode, and the characteristics as a solar cell are reduced. In the present invention, since the electrode has water resistance as described above, it can be said that the reliability of the solar cell is sufficiently high.

[表1]
[Table 1]

<太陽能電池之製造>
使用上述例14、例17及例19之玻璃粉末而獲得之Al電極形成用導電糊料、及市售品之Ag電極形成用導電糊料,如下所述,於p型Si半導體基板1上之非受光面上形成Al電極4作為背面電極,於受光面上形成Ag電極3作為正面電極,從而製造圖1所示之構成之太陽能電池10。
< Manufacture of solar cells >
The conductive pastes for forming Al electrodes and the commercially available conductive pastes for forming Ag electrodes obtained by using the glass powders of Examples 14, 17, 17 and 19 described above were applied to the p-type Si semiconductor substrate 1 as described below. An Al electrode 4 is formed on the non-light-receiving surface as a back electrode, and an Ag electrode 3 is formed on the light-receiving surface as a front electrode, so that a solar cell 10 having the structure shown in FIG. 1 is manufactured.

首先,於Si半導體基板之受光面側及非受光面側,分別形成包含氮化矽層之絕緣膜2A、及自基板之非受光面側依次包含氧化鋁層及氮化矽層之2層膜之絕緣膜2B。進而,於絕緣膜2B上,於特定部位利用雷射形成開口部7。其次,於非受光面側之表面之全面,即絕緣膜2B之表面、及利用雷射除去部分絕緣膜2B之面對開口部7之半導體基板之表面,利用網版印刷塗覆使用上述例14、例17及例19之玻璃粉末而獲得之Al電極形成用導電糊料,並於120℃使其乾燥。First, an insulating film 2A including a silicon nitride layer and a two-layer film including an aluminum oxide layer and a silicon nitride layer in this order are formed on the light-receiving surface side and the non-light-receiving surface side of the Si semiconductor substrate, respectively. Its insulating film 2B. Furthermore, an opening 7 is formed on the insulating film 2B by a laser at a specific portion. Next, on the entire surface of the non-light-receiving surface side, that is, the surface of the insulating film 2B, and the surface of the semiconductor substrate facing the opening 7 by removing a portion of the insulating film 2B by laser, the above-mentioned Example 14 was applied by screen printing. The conductive paste for forming an Al electrode obtained from the glass powder of Examples 17 and 19 was dried at 120 ° C.

繼而,利用網版印刷,對Si半導體基板1之絕緣膜2A之表面整面線狀地塗覆Ag電極形成用導電糊料。其後,使用紅外光加熱式帶式爐於峰值溫度760℃進行煅燒100秒,形成正面Ag電極3及背面Al電極4,從而完成太陽能電池10。再者,表面Ag電極3係貫通絕緣膜2A而形成。Next, the entire surface of the insulating film 2A of the Si semiconductor substrate 1 was coated linearly with a conductive paste for forming an Ag electrode by screen printing. Thereafter, an infrared light heating belt furnace was used for firing at a peak temperature of 760 ° C. for 100 seconds to form a front Ag electrode 3 and a back Al electrode 4 to complete the solar cell 10. The surface Ag electrode 3 is formed through the insulating film 2A.

(太陽能電池之轉換效率之測定)
使用太陽模擬器,對使用分別含有上述各例之玻璃粉末之Al電極形成用導電糊料而製造之太陽能電池之轉換效率進行測定。具體而言,於太陽模擬器中設置太陽能電池,根據分光特性AM1.5G之基準太陽光線,依據JIS C8912 (1998年)測定電流電壓特性,從而導出各太陽能電池之轉換效率。將所得之轉換效率之結果示於表2。
(Measurement of conversion efficiency of solar cells)
Using a solar simulator, the conversion efficiency of a solar cell manufactured using the conductive paste for forming an Al electrode containing the glass powder of each of the above examples was measured. Specifically, a solar cell is installed in a solar simulator, and a current-voltage characteristic is measured in accordance with JIS C8912 (1998) based on a reference solar ray of a spectral characteristic of AM1.5G to derive a conversion efficiency of each solar cell. The results of the obtained conversion efficiency are shown in Table 2.

再者,表2中之符號表示以下含意。
Isc (A):短路狀態之短路電流
Voc (mV):開放狀態之開放電壓
FF (%):曲線因素
Eff (%):轉換效率
The symbols in Table 2 have the following meanings.
Isc (A): short-circuit current
Voc (mV): open voltage
FF (%): curve factor
Eff (%): Conversion efficiency

[表2]
[Table 2]

由表2可知,於使用例14及例17之玻璃粉末之情形時,FF為80%以上,且可獲得20%以上之轉換效率Eff。作為PERC太陽能電池,能夠充分地發揮性能。與此相對,根據表2,於使用例19之玻璃粉末之情形時,於電極形成後Al電極剝離,無法測定太陽能電池之轉換效率,故而記為「×」。As can be seen from Table 2, when the glass powders of Examples 14 and 17 were used, FF was 80% or more, and conversion efficiency Eff of 20% or more was obtained. As a PERC solar cell, it can fully exhibit its performance. On the other hand, according to Table 2, when the glass powder of Example 19 was used, the Al electrode was peeled after the electrode was formed, and the conversion efficiency of the solar cell could not be measured.

於使用例14及例17之玻璃粉末之情形時,於外觀保持良好之狀態之基礎上,可保持較高之FF,與於非受光面側不具有氧化鋁層及氮化矽層之絕緣膜之太陽能電池相比,作為PERC太陽能電池,可實現較高之Isc及Voc,且Eff超過20%。於使用作為比較例之例19之玻璃粉末之情形時,作為PERC太陽能電池,外觀較差,無法獲得長期可靠性;與此相對,於使用作為實施例之例14及例17之玻璃粉末之情形時,作為PERC太陽能電池,外觀良好且能夠同時保持與非受光面側中之絕緣膜及Si半導體基板之接觸,就可獲得長期可靠性而言為優異。In the case of using the glass powder of Examples 14 and 17, on the basis of maintaining a good appearance, it can maintain a high FF, and an insulating film without an aluminum oxide layer and a silicon nitride layer on the non-light-receiving surface side. Compared with solar cells, PERC solar cells can achieve higher Isc and Voc, and Eff exceeds 20%. In the case of using the glass powder of Example 19 as a comparative example, the PERC solar cell has a poor appearance and cannot obtain long-term reliability. In contrast, when the glass powder of Examples 14 and 17 is used as an example As a PERC solar cell, it has a good appearance and can simultaneously maintain contact with the insulating film and the Si semiconductor substrate in the non-light-receiving surface side, which is excellent in terms of obtaining long-term reliability.

根據表1、表2可明確,與作為比較例之例18、例19之玻璃及玻璃粉末相比,作為實施例之例1~例17之玻璃及玻璃粉末係適宜形成太陽能電池之電極者。From Tables 1 and 2, it is clear that compared with the glass and glass powders of Examples 18 and 19 as comparative examples, the glass and glass powder of Examples 1 to 17 as examples are suitable for forming electrodes for solar cells.

參照特定之實施態樣對本發明詳細地進行了說明,但顯而易見對於業者而言可不脫離本發明之精神及範圍地施加多種變更或修正。
本申請案係基於2018年1月11日申請之日本專利申請2018-002487者,其內容以參照之方式併入本文。
Although the present invention has been described in detail with reference to specific embodiments, it will be apparent to those skilled in the art that various changes or modifications can be made without departing from the spirit and scope of the present invention.
This application is based on Japanese Patent Application No. 2018-002487 filed on January 11, 2018, the contents of which are incorporated herein by reference.

1‧‧‧ p型Si半導體基板1‧‧‧ p-type Si semiconductor substrate

1a‧‧‧n1a‧‧‧n + floor

1b‧‧‧p層 1b‧‧‧p layer

2A‧‧‧絕緣膜 2A‧‧‧Insulation film

2B‧‧‧絕緣膜 2B‧‧‧Insulation film

3‧‧‧Ag電極 3‧‧‧Ag electrode

4‧‧‧Al電極 4‧‧‧Al electrode

5‧‧‧Al-Si合金層 5‧‧‧Al-Si alloy layer

6‧‧‧BSF層 6‧‧‧BSF floor

7‧‧‧開口部 7‧‧‧ opening

10‧‧‧太陽能電池 10‧‧‧ solar cell

圖1係模式性地表示使用本發明之導電糊料而形成電極之p型Si基板單面受光型太陽能電池之一例之剖面的圖。FIG. 1 is a diagram schematically showing a cross section of an example of a p-type Si substrate single-sided light-receiving solar cell in which an electrode is formed using the conductive paste of the present invention.

Claims (18)

一種玻璃,其特徵在於: 以氧化物換算之莫耳%表示,含有 V2 O5 :6~30%、 B2 O3 :15~50%、 BaO:10~40%、 ZnO:5~30%、及 Al2 O3 :0~15%。A glass characterized in that it is expressed in mole% in terms of oxides and contains V 2 O 5 : 6-30%, B 2 O 3 : 15-50%, BaO: 10-40%, and ZnO: 5-30 % And Al 2 O 3 : 0 to 15%. 如請求項1之玻璃,以氧化物換算之莫耳%表記,其進而含有合計0~10%之選自SiO2 、SrO、MoO3 及WO3 中之至少1種。For example, the glass of claim 1 is expressed in terms of mole% in terms of oxides, and further contains at least one selected from SiO 2 , SrO, MoO 3 and WO 3 in a total of 0 to 10%. 如請求項1或2之玻璃,其中,玻璃轉移溫度為380~550℃。The glass of claim 1 or 2, wherein the glass transition temperature is 380-550 ° C. 一種玻璃粉末,其包含如請求項1至3中任一項之玻璃,當將累積粒度分佈中之體積基準之50%粒徑設為D50 時,D50 為0.8~6.0 μm。A glass powder comprising the glass according to any one of claims 1 to 3, and when a 50% particle diameter based on a volume basis in a cumulative particle size distribution is set to D 50 , D 50 is 0.8 to 6.0 μm. 一種導電糊料,其含有如請求項4之玻璃粉末、導電性金屬粉末、及有機媒劑。A conductive paste containing the glass powder, the conductive metal powder, and the organic vehicle according to claim 4. 一種太陽能電池,其具備使用如請求項5之導電糊料而形成之電極。A solar cell includes an electrode formed using a conductive paste as claimed in claim 5. 一種導電糊料,其特徵在於:其係含有金屬、玻璃、及有機媒劑者,且 上述金屬相對於上述導電糊料之總質量含有63.0~97.9質量%,且包含選自由Al、Ag、Cu、Au、Pd及Pt所組成之群中之至少1種; 上述玻璃相對於上述金屬100質量份含有0.1~9.8質量份,以氧化物換算之莫耳%表示,含有V2 O5 :6~30%、B2 O3 :15~50%、BaO:10~40%、ZnO:5~30%、及Al2 O3 0~15%;且 上述有機媒劑相對於上述導電糊料之總質量含有2~30質量%。A conductive paste, characterized in that it contains a metal, glass, and an organic vehicle, and the metal contains 63.0 to 97.9% by mass relative to the total mass of the conductive paste, and is selected from the group consisting of Al, Ag, and Cu At least one of the group consisting of Au, Pd, and Pt; the glass contains 0.1 to 9.8 parts by mass relative to 100 parts by mass of the metal, expressed in mole% in terms of oxides, and contains V 2 O 5 : 6 to 30%, B 2 O 3 : 15-50%, BaO: 10-40%, ZnO: 5-30%, and Al 2 O 3 0-15%; and the total amount of the organic vehicle relative to the conductive paste Mass contains 2 to 30% by mass. 如請求項7之導電糊料,其中,以氧化物換算之莫耳%表記,上述玻璃進而含有合計0~10%之選自SiO2 、SrO、MoO3 及WO3 中之至少1種。For example, the conductive paste according to claim 7, wherein the mole is expressed in terms of oxides, and the glass further contains at least one selected from SiO 2 , SrO, MoO 3 and WO 3 in a total amount of 0 to 10%. 如請求項7或8之導電糊料,其中,上述玻璃之玻璃轉移溫度為380~550℃。The conductive paste of claim 7 or 8, wherein the glass transition temperature of the glass is 380 to 550 ° C. 如請求項7至9中任一項之導電糊料,其中,上述玻璃係當將累積粒度分佈中之體積基準之50%粒徑設為D50 時D50 為0.8~6.0 μm之玻璃粒子。The conductive paste according to any one of claims 7 to 9, wherein the glass is a glass particle having a D 50 of 0.8 to 6.0 μm when a 50% particle diameter on a volume basis in a cumulative particle size distribution is set to D 50 . 如請求項7至10中任一項之導電糊料,其中,上述金屬含有Al。The conductive paste according to any one of claims 7 to 10, wherein the metal contains Al. 如請求項7至11中任一項之導電糊料,其中,上述有機媒劑係使有機樹脂黏合劑溶解於溶劑而成之有機樹脂黏合劑溶液; 上述有機樹脂黏合劑包含:選自由丙烯酸系樹脂、甲基纖維素、乙基纖維素、羧甲基纖維素、乙氧基纖維素、苄基纖維素、丙基纖維素、及硝化纖維素所組成之群中之至少1種,上述丙烯酸系樹脂係將選自由甲基丙烯酸甲酯、甲基丙烯酸乙酯、甲基丙烯酸丁酯、甲基丙烯酸2-羥基乙酯、丙烯酸丁酯、及丙烯酸2-羥基乙酯所組成之群中之至少1種以上聚合而獲得者;且 上述溶劑包含選自由松油醇、二乙二醇單丁醚乙酸酯、二乙二醇單乙醚乙酸酯、丙二醇二乙酸酯、及甲基乙基酮所組成之群中之至少1種。The conductive paste according to any one of claims 7 to 11, wherein the organic vehicle is an organic resin adhesive solution obtained by dissolving an organic resin adhesive in a solvent; The organic resin binder is selected from the group consisting of acrylic resin, methyl cellulose, ethyl cellulose, carboxymethyl cellulose, ethoxy cellulose, benzyl cellulose, propyl cellulose, and nitrocellulose. At least one of the composition group, the acrylic resin is selected from the group consisting of methyl methacrylate, ethyl methacrylate, butyl methacrylate, 2-hydroxyethyl methacrylate, butyl acrylate, and acrylic acid. Obtained by polymerizing at least one species of a group consisting of 2-hydroxyethyl esters; and The solvent contains at least one selected from the group consisting of terpineol, diethylene glycol monobutyl ether acetate, diethylene glycol monoethyl ether acetate, propylene glycol diacetate, and methyl ethyl ketone. Species. 一種太陽能電池,其特徵在於具備: 矽基板,其具有太陽光受光面; 第1絕緣膜,其設置於上述矽基板之上述太陽光受光面側; 第2絕緣膜,其設置於上述矽基板之上述太陽光受光面之相反側之表面,且具有至少一個開口部; 第2電極,其經由上述第2絕緣膜之上述開口部與上述矽基板部分接觸;及 第1電極,其貫通上述第1絕緣膜之一部分而與上述矽基板接觸;且 上述第2電極包含:含有選自由Al、Ag、Cu、Au、Pd及Pt所組成之群中之至少1種之金屬、及以氧化物換算之莫耳%表示含有V2 O5 :6~30%、B2 O3 :15~50%、BaO:10~40%、ZnO:5~30%、及Al2 O3 :0~15%之玻璃。A solar cell includes: a silicon substrate having a solar light receiving surface; a first insulating film provided on the solar light receiving surface side of the silicon substrate; and a second insulating film provided on the silicon substrate. The surface on the opposite side of the sunlight receiving surface has at least one opening; a second electrode that is in contact with the silicon substrate portion through the opening of the second insulating film; and a first electrode that penetrates the first A part of the insulating film is in contact with the silicon substrate; and the second electrode includes: a metal containing at least one selected from the group consisting of Al, Ag, Cu, Au, Pd, and Pt; and an oxide equivalent Molar% indicates that V 2 O 5 : 6-30%, B 2 O 3 : 15-50%, BaO: 10-40%, ZnO: 5-30%, and Al 2 O 3 : 0-15%. glass. 如請求項13之太陽能電池,其中,上述第2電極包含:上述金屬90~99.9質量%、及上述玻璃0.1~10質量%。The solar cell according to claim 13, wherein the second electrode includes 90 to 99.9% by mass of the metal and 0.1 to 10% by mass of the glass. 如請求項13或14之太陽能電池,其中,上述第2電極中所包含之金屬至少含有Al。The solar cell according to claim 13 or 14, wherein the metal contained in the second electrode contains at least Al. 如請求項13至15中之任一項之太陽能電池,其中,上述第1電極包含至少含有Ag之金屬。The solar cell according to any one of claims 13 to 15, wherein the first electrode includes a metal containing at least Ag. 如請求項13至16中之任一項之太陽能電池,其中,上述第1絕緣膜含有氮化矽。The solar cell according to any one of claims 13 to 16, wherein the first insulating film contains silicon nitride. 如請求項13至17中之任一項之太陽能電池,其中,上述第2絕緣膜具備與上述矽基板之上述太陽光受光面之相反側之表面相接之含有氧化鋁或氧化矽之氧化金屬膜,且於上述氧化金屬膜上進而具備氮化矽膜。The solar cell according to any one of claims 13 to 17, wherein the second insulating film includes an oxide metal containing alumina or silicon oxide in contact with a surface on the opposite side of the sunlight receiving surface of the silicon substrate. And a silicon nitride film on the metal oxide film.
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