TW201840014A - Apparatus for screen printing of a material on a substrate used in the manufacture of a solar cell, solar cell production apparatus, and method for screen printing of a material on a substrate used in the manufacture of a solar cell - Google Patents

Apparatus for screen printing of a material on a substrate used in the manufacture of a solar cell, solar cell production apparatus, and method for screen printing of a material on a substrate used in the manufacture of a solar cell Download PDF

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TW201840014A
TW201840014A TW107114215A TW107114215A TW201840014A TW 201840014 A TW201840014 A TW 201840014A TW 107114215 A TW107114215 A TW 107114215A TW 107114215 A TW107114215 A TW 107114215A TW 201840014 A TW201840014 A TW 201840014A
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deposition
material processing
process head
devices
head assembly
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TW107114215A
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Chinese (zh)
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大衛 可拉
路易吉 迪桑堤
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義大利商應用材料意大利有限公司
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Priority claimed from CN201720465495.4U external-priority patent/CN207587749U/en
Priority claimed from PCT/EP2017/060236 external-priority patent/WO2018197005A1/en
Application filed by 義大利商應用材料意大利有限公司 filed Critical 義大利商應用材料意大利有限公司
Publication of TW201840014A publication Critical patent/TW201840014A/en

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    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02EREDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00Energy generation through renewable energy sources
    • Y02E10/50Photovoltaic [PV] energy
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02PCLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P70/00Climate change mitigation technologies in the production process for final industrial or consumer products
    • Y02P70/50Manufacturing or production processes characterised by the final manufactured product

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Abstract

An apparatus (100) for screen printing of a material on a substrate (10) used in the manufacture of a solar cell is provided. The apparatus (100) includes a process head assembly (110) including one or more deposition devices (120) configured for transferring the material from a screen (154) to the substrate (10) and one or more material processing devices (130) for processing of the material on the screen (154), and a drive device (140) configured for moving the process head assembly (110) in a first direction (1) along a substrate support (20) for transferring and processing of the material during a deposition process.

Description

用於將材料網印於用於太陽能電池製造中的基板上的設備、太陽能電池生產設備、以及將材料網印於用於太陽能電池製造中的基板上的方法Apparatus for screen-printing material on a substrate used in solar cell manufacturing, solar cell production equipment, and method for screen-printing material on a substrate used in solar cell manufacturing

本揭示案的實施方式涉及用於將材料網印於用於太陽能電池製造中的基板上的設備、太陽能電池生產設備、以及將材料網印於用於太陽能電池製造中的基板上的方法。Embodiments of the present disclosure relate to an apparatus for screen printing materials on a substrate used in solar cell manufacturing, a solar cell production apparatus, and a method for screen printing materials on a substrate used in solar cell manufacturing.

太陽能電池是將陽光直接轉換成電力的光電裝置。在這個領域內,已知使用沉積技術、具體地是印刷技術在晶體矽基底上生產太陽能電池,從而在太陽能電池的前表面上實現選擇性發射器結構。處理循環可包括至少一個印刷操作和任選的另一材料處理操作,在所述印刷操作過程中,通過沉積裝置將材料沉積在基板上。設備的生產率和/或生產量可能受到該處理循環的循環時間的限制。Solar cells are photovoltaic devices that directly convert sunlight into electricity. In this field, it is known to use deposition techniques, in particular printing techniques, to produce solar cells on crystalline silicon substrates, thereby implementing selective emitter structures on the front surface of the solar cells. The processing cycle may include at least one printing operation and optionally another material processing operation during which the material is deposited on the substrate by the deposition device. The productivity and / or throughput of the equipment may be limited by the cycle time of the treatment cycle.

鑒於以上內容,克服了本領域中的至少一些問題的用於將材料網印於用於太陽能電池製造中的基板上的新設備、太陽能電池生產設備、以及將材料網印於用於太陽能電池製造中的基板上的方法是有益的。本揭示案的目標尤其在於提供能夠減少處理循環的循環時間以增加生產率和生產量中的至少一個的設備。In view of the above, new equipment for screen printing materials on substrates used in solar cell manufacturing, solar cell production equipment, and screen printing materials for solar cell manufacturing that overcome at least some problems in the art The method on the substrate is beneficial. The objective of the present disclosure is, inter alia, to provide equipment capable of reducing the cycle time of the processing cycle to increase at least one of productivity and throughput.

鑒於以上內容,提供用於將材料網印於用於太陽能電池製造中的基板上的設備、太陽能電池生產設備、以及將材料網印於用於太陽能電池製造中的基板上的方法。本揭示案的另外的態樣、益處以及特徵從權利要求書、說明書以及附圖中顯而易見。In view of the above, an apparatus for screen printing a material on a substrate used in solar cell manufacturing, a solar cell production apparatus, and a method for screen printing a material on a substrate used in solar cell manufacturing are provided. Additional aspects, benefits, and features of the present disclosure are apparent from the claims, specification, and drawings.

根據本揭示案的一個態樣,提供用於將材料網印於用於太陽能電池製造中的基板上的設備。所述設備包括製程頭部組件和驅動裝置。所述製程頭部組件包括:一個或更多個沉積裝置,所述一個或更多個沉積裝置被配置為用於將所述材料從絲網傳送到所述基板;和一個或更多個材料處理裝置,所述一個或更多個材料處理裝置用於處理所述絲網上的所述材料。所述驅動裝置被配置為用於沿著基板支撐件在第一方向上移動所述製程頭部組件,以便在沉積製程過程中傳送和處理所述材料。刮板刮板薄膜According to one aspect of the present disclosure, an apparatus for screen printing materials on a substrate used in solar cell manufacturing is provided. The equipment includes a process head assembly and a driving device. The process head assembly includes: one or more deposition devices configured to transfer the material from the screen to the substrate; and one or more materials A processing device, the one or more material processing devices are used to process the material on the screen. The drive device is configured to move the process head assembly along the substrate support in the first direction to transfer and process the material during the deposition process. Scraper film

根據本揭示案的另一態樣,提供一種太陽能電池生產設備。所述太陽能電池生產設備包括一個或更多個沉積站,以及根據本文所述實施方式用於將材料網印於用於太陽能電池製造中的基板上的設備。According to another aspect of the present disclosure, a solar cell production facility is provided. The solar cell production equipment includes one or more deposition stations, and equipment for screen printing materials on substrates used in solar cell manufacturing according to embodiments described herein.

根據本揭示案的另一態樣,提供一種用於將材料網印於用於太陽能電池製造中的基板上的方法。所述方法包括沿著基板支撐件在第一方向上將具有一個或更多個沉積裝置和一個或更多個材料處理裝置的製程頭部組件至少從第一位置移動到第二位置,以便使用所述一個或更多個沉積裝置中的至少一個沉積裝置將所述材料從所述絲網傳送到所述基板並且使用所述一個或更多個材料處理裝置中的至少一個材料處理裝置執行對所述絲網上的所述材料的處理,其中材料的傳送和處理在所述製程頭部組件從所述第一位置移動到所述第二位置過程中執行。According to another aspect of the present disclosure, a method for screen printing a material on a substrate used in solar cell manufacturing is provided. The method includes moving a process head assembly having one or more deposition devices and one or more material processing devices along a substrate support in a first direction from at least a first position to a second position for use At least one deposition device of the one or more deposition devices transfers the material from the screen to the substrate and performs the alignment using at least one material processing device of the one or more material processing devices The processing of the material on the screen, wherein the transfer and processing of the material are performed during the movement of the process head assembly from the first position to the second position.

實施例亦針對用於實行所揭示方法的設備並包括用於執行每個所述方法態樣的設備部件。此等方法態樣可藉由硬體元件、適當軟體程式化的電腦,兩個或以任何其他方式的任何組合執行。此外,根據本揭示案的實施例亦針對操作所述設備的方法。用於操作所述設備的方法包括用於實行設備的每個功能的方法態樣。The embodiments are also directed to an apparatus for performing the disclosed method and include apparatus components for performing each of the described method aspects. These methods can be implemented by hardware components, computers programmed with appropriate software, two or any combination in any other way. Furthermore, embodiments according to the present disclosure are also directed to methods of operating the device. The method for operating the device includes a method aspect for performing each function of the device.

現將詳細參照本揭示案的各種實施方式,所述實施方式的一個或更多個示例在附圖中示出。在以下對附圖的描述內,相同的附圖標記是指相同的部件。一般來說,僅描述了各個實施方式之間的差異處。每個示例以解釋揭示案內容的方式提供,而不意在作為本揭示案的限制。另外,例示或描述為一個實施方式的部分的特徵可以用於其它實施方式或與其它實施方式結合來產生另一實施方式。預期的是,說明書包括此類修改和變化。Reference will now be made in detail to various embodiments of the present disclosure, one or more examples of which are shown in the drawings. In the following description of the drawings, the same reference numerals refer to the same components. Generally, only the differences between the various embodiments are described. Each example is provided by way of explanation of the contents of the disclosure, and is not intended as a limitation of the disclosure. In addition, features illustrated or described as part of one embodiment may be used in or combined with other embodiments to produce another embodiment. It is expected that the description includes such modifications and changes.

用於在基板上形成導電線路圖案的處理循環可包括使用沉積裝置來將材料沉積在基板上的至少一個沉積製程和使用材料處理裝置的至少另一製程。至少一個沉積製程和至少另一製程可以順序地執行,即,通過使用具有沉積裝置和附接到其上的材料處理裝置的製程頭部執行兩個行程進行。沉積製程和另一製程的雙重行程增加了處理循環的循環時間。設備的生產率和/或生產量減少。The processing cycle for forming the conductive wiring pattern on the substrate may include at least one deposition process using a deposition device to deposit material on the substrate and at least another process using a material processing device. At least one deposition process and at least another process may be performed sequentially, that is, by using a process head having a deposition device and a material processing device attached thereto to perform two strokes. The double stroke of the deposition process and another process increases the cycle time of the processing cycle. The productivity and / or throughput of the equipment is reduced.

根據本揭示案的用於將材料網印於基板上的設備使用可移動的製程頭部組件,所述可移動的製程頭部組件被配置為使用沉積裝置在基板上執行材料沉積,並且同時使用材料處理裝置執行材料處理。作為一個示例,可以在製程頭部組件的同一行程或移動過程中進行沉積和材料處理。可以減少處理循環的循環時間,並且可以增加設備的生產率和/或生產量。具體地講,可以在絲網上提供一層材料。可使用沉積裝置(可為刮板(squeegee))將材料從絲網傳送到基板。材料處理裝置可以跟隨沉積裝置,並且在絲網上提供另一層的材料,以供沉積在例如後續基板上。The apparatus for screen-printing materials on a substrate according to the present disclosure uses a movable process head assembly configured to perform material deposition on the substrate using a deposition apparatus and use it simultaneously The material processing device performs material processing. As an example, deposition and material processing can be performed during the same stroke or movement of the process head assembly. The cycle time of the processing cycle can be reduced, and the productivity and / or throughput of the equipment can be increased. Specifically, a layer of material can be provided on the silk screen. A deposition device (which may be a squeegee) can be used to transfer the material from the screen to the substrate. The material processing device may follow the deposition device and provide another layer of material on the screen for deposition on, for example, a subsequent substrate.

圖1示出了根據本文所述實施方式的用於將材料網印於用於太陽能電池製造中的基板10上的設備100的示意圖。材料可以是適於在基板10的表面12上形成導電線路圖案(諸如指狀物和/或匯流條(busbar))的材料。作為一個示例,材料可為膏劑,諸如銀膏。FIG. 1 shows a schematic diagram of an apparatus 100 for screen printing materials on a substrate 10 used in solar cell manufacturing according to embodiments described herein. The material may be a material suitable for forming conductive line patterns (such as fingers and / or busbars) on the surface 12 of the substrate 10. As an example, the material may be a paste, such as a silver paste.

設備100包括製程頭部組件110和驅動裝置。製程頭部組件110包括:一個或更多個沉積裝置120,所述一個或更多個沉積裝置120被配置為用於將材料從絲網154傳送到基板10;和一個或更多個材料處理裝置130,所述一個或更多個材料處理裝置130用於處理絲網154上的材料。驅動裝置被配置為用於沿著基板支撐件20在第一方向1上移動製程頭部組件110或製程頭部組件110的部分(諸如所述製程頭部組件的製程頭部)來將材料從絲網154傳送到基板10並且在沉積製程過程中處理絲網154上的材料。在一些實現方式中,一個或更多個沉積裝置120可為一個或更多個印刷裝置,諸如刮板。材料處理也可稱為「覆墨階段(flood phase)」,其可在絲網上提供基本上均勻的材料層,所述基本上均勻的材料層被傳送到例如跟隨於經處理的基板的後續基板。The apparatus 100 includes a process head assembly 110 and a driving device. The process head assembly 110 includes: one or more deposition devices 120 configured to transfer material from the wire mesh 154 to the substrate 10; and one or more material processing Device 130, the one or more material processing devices 130 are used to process the material on the wire mesh 154. The driving device is configured to move the process head assembly 110 or a portion of the process head assembly 110 (such as the process head of the process head assembly) along the substrate support 20 in the first direction 1 to remove material from The screen 154 is transferred to the substrate 10 and the material on the screen 154 is processed during the deposition process. In some implementations, the one or more deposition devices 120 can be one or more printing devices, such as a squeegee. Material processing may also be referred to as a "flood phase", which may provide a substantially uniform layer of material on the screen, the substantially uniform layer of material being transferred to, for example, a follow-up that follows the processed substrate Substrate.

沉積(諸如印刷)和材料處理在一個行程或週期中執行。換句話說,可以同時執行沉積和材料處理。在沉積製程期間的組合覆墨移動可以減少製程時間,諸如關鍵路徑時間。作為一個示例,關鍵路徑時間可減少約三分之一。Deposition (such as printing) and material processing are performed in one pass or cycle. In other words, deposition and material processing can be performed simultaneously. The combined ink coating movement during the deposition process can reduce process time, such as critical path time. As an example, the critical path time can be reduced by about one third.

在圖1的示例中,製程頭部組件110包括製程頭部140,例如一個單一製程頭部,其中一個或更多個沉積裝置120中的至少一個沉積裝置和一個或更多個材料處理裝置130中的至少一個材料處理裝置附接到製程頭部140。然而,本揭示案並不限於此,並且製程頭部組件可包括兩個或更多個製程頭部,所述兩個或更多個製程頭部具有附接到其上的相應沉積裝置和/或材料處理裝置。具有兩個製程頭部的製程頭部組件的示例在圖4A和圖4B中示出。In the example of FIG. 1, the process head assembly 110 includes a process head 140, such as a single process head, wherein at least one of the one or more deposition devices 120 and one or more material processing devices 130 At least one of the material processing devices is attached to the process head 140. However, the present disclosure is not limited to this, and the process head assembly may include two or more process heads having respective deposition devices attached thereto and / or Or material handling device. An example of a process head assembly with two process heads is shown in FIGS. 4A and 4B.

在一些實現方式中,在使用一個或更多個沉積裝置而執行的沉積製程的持續時間的至少一部分期間同時執行沉積和材料處理。作為一個示例,可在沉積製程的持續時間的50%或更多,具體地70%或更多,以及更具體地90%或更多期間執行材料處理。根據一些實施方式,沉積和材料處理在沉積製程的基本整個持續時間(諸如沉積製程的持續時間的100%)期間同時執行。沉積製程可對應於由製程頭部執行的一個行程或移動,例如在第一位置A與第二位置B之間。第一位置A與第二位置B之間的距離可等於或大於基板10或導電線路圖形的延伸度(extension),使得導電線路圖案或其一層可以在一個行程過程中沉積在基板10上。In some implementations, the deposition and material processing are performed simultaneously during at least a portion of the duration of the deposition process performed using one or more deposition devices. As an example, the material processing may be performed during 50% or more of the duration of the deposition process, specifically 70% or more, and more specifically 90% or more. According to some embodiments, the deposition and material processing are performed simultaneously during substantially the entire duration of the deposition process (such as 100% of the duration of the deposition process). The deposition process may correspond to a stroke or movement performed by the process head, for example, between the first position A and the second position B. The distance between the first position A and the second position B may be equal to or greater than the extension of the substrate 10 or the conductive wiring pattern, so that the conductive wiring pattern or a layer thereof may be deposited on the substrate 10 in one stroke.

設備100可包括絲網裝置150,所述絲網裝置150設置在基板支撐件20與製程頭部組件110之間。絲網裝置150可包括框架152和絲網154,絲網154附接到框架152。根據可以與本文所述的其它實施方式組合的一些實施方式,一個或更多個沉積裝置120可為一個或更多個印刷裝置。一個或更多個印刷裝置可各自包括刮板。刮板可以被配置為接觸絲網154以便進行印刷。在一些實施方式中,所述刮板的尖端接觸絲網154並且推動材料穿過絲網154印刷到基板10上。刮板可為金剛石刮板或成角度的刮板。The apparatus 100 may include a wire mesh device 150 disposed between the substrate support 20 and the process head assembly 110. The wire mesh device 150 may include a frame 152 and a wire mesh 154 to which the wire mesh 154 is attached. According to some embodiments, which may be combined with other embodiments described herein, one or more deposition devices 120 may be one or more printing devices. One or more printing devices may each include a squeegee. The squeegee may be configured to contact the screen 154 for printing. In some embodiments, the tip of the squeegee contacts the screen 154 and pushes the material through the screen 154 to print onto the substrate 10. The scraper may be a diamond scraper or an angled scraper.

絲網154可包括網、印刷遮罩、薄片、金屬薄片、塑膠薄片、板材、金屬板材和塑膠板材中的至少一個。在一些實施方式中,絲網154限定對應於待印刷在基板上的結構的圖案,其中圖案可包括孔洞、狹槽、切口或其它孔隙中的至少一個。圖案可對應於待印刷在基板10上的導電線路圖案,諸如太陽能電池的指狀物和/或匯流條。作為一個示例,絲網154可具有限定導電線路圖案的開口和設置在開口內的金屬絲網(wire mesh)。通過使用一個或更多個材料處理裝置130,可將待沉積在基板10上的材料作為基本上均勻的層提供在絲網154上。由於存在金屬絲網,材料不會流過開口。在沉積製程過程中,沉積裝置,例如刮板,會對材料施加力或壓力並且推動材料穿過開口,使得材料被傳送到基板10(即,沉積在基板10上)。The screen 154 may include at least one of a mesh, a printing mask, a sheet, a metal sheet, a plastic sheet, a plate, a metal plate, and a plastic plate. In some embodiments, the screen 154 defines a pattern corresponding to the structure to be printed on the substrate, where the pattern may include at least one of holes, slots, cutouts, or other apertures. The pattern may correspond to a conductive line pattern to be printed on the substrate 10, such as fingers and / or bus bars of a solar cell. As an example, the wire mesh 154 may have an opening that defines a conductive line pattern and a wire mesh disposed in the opening. By using one or more material processing devices 130, the material to be deposited on the substrate 10 can be provided on the wire mesh 154 as a substantially uniform layer. Due to the presence of wire mesh, the material does not flow through the opening. During the deposition process, a deposition device, such as a squeegee, exerts force or pressure on the material and pushes the material through the opening so that the material is transferred to the substrate 10 (ie, deposited on the substrate 10).

根據可以與本文所述的其它實施方式組合的一些實施方式,一個或更多個材料處理裝置130被配置為用於在絲網154上提供基本上均勻的材料薄膜。在一些實現方式中,材料處理可使材料以最佳的方式傳送到基板10上。任選地或替代地,一個或更多個材料處理裝置130被配置為用於回收基板10和/或絲網154上的多餘材料。在一些實現方式中,一個或更多個材料處理裝置130可為覆墨刀(flood bar)。材料處理可被稱為「覆墨(flooding)」。According to some embodiments that can be combined with other embodiments described herein, one or more material processing devices 130 are configured to provide a substantially uniform film of material on the wire mesh 154. In some implementations, material processing allows materials to be transferred onto the substrate 10 in an optimal manner. Optionally or alternatively, one or more material handling devices 130 are configured to recover excess material on the substrate 10 and / or the wire mesh 154. In some implementations, the one or more material processing devices 130 may be flood bars. Material processing may be referred to as "flooding".

根據可以與本文所述的其它實施方式組合的一些實施方式,驅動裝置被配置為用於在第一方向1上將製程頭部組件110至少從第一位置A移動到第二位置B,以便至少在從第一位置A移動到第二位置B的過程中執行材料在絲網154上的沉積/傳送和處理(例如,分佈)。從第一位置A到第二位置B或反之亦然的移動可分別對應於由製程頭部組件110或其製程頭部執行的一個行程(諸如第一行程和第二行程)。第一方向1可為垂直於垂直方向4的水準方向3。According to some embodiments, which can be combined with other embodiments described herein, the driving device is configured to move the process head assembly 110 in the first direction 1 from at least the first position A to the second position B, so as to at least The deposition / transportation and processing (eg, distribution) of the material on the screen 154 is performed during the movement from the first position A to the second position B. The movement from the first position A to the second position B or vice versa may correspond to one stroke (such as the first stroke and the second stroke) performed by the process head assembly 110 or its process head, respectively. The first direction 1 may be a horizontal direction 3 perpendicular to the vertical direction 4.

第一位置A和第二位置B可被限定為製程頭部組件110(例如,製程頭部140)相對於基板10、基板支撐件20和/或絲網154中的至少一個的相應位置。製程頭部組件110的位置可以繼而限定一個或更多個沉積裝置120和一個或更多個材料處理裝置130相對於基板10、基板支撐件20和/或絲網154中的至少一個的相應位置。The first position A and the second position B may be defined as corresponding positions of the process head assembly 110 (eg, the process head 140) relative to at least one of the substrate 10, the substrate support 20 and / or the wire mesh 154. The position of the process head assembly 110 may in turn define the respective positions of the one or more deposition devices 120 and the one or more material processing devices 130 relative to at least one of the substrate 10, substrate support 20, and / or screen 154 .

作為一個示例,當製程頭部組件110或製程頭部140處於第一位置A並且沿著第一方向1(「移動方向」)移動時,一個或更多個材料處理裝置130中的一個材料處理裝置可以在位置(a)處並且一個或更多個沉積裝置120中的一個沉積裝置可以在位置(b)處。同樣,當製程頭部組件110或製程頭部140處於第二位置B並且沿著第二方向2(「移動方向」)移動時,材料處理裝置可以在位置(c)處並且沉積裝置可以在位置(d)處。當製程頭部組件110從第一位置A到達第二位置B時,材料處理裝置從位置(a)移動到位置(c),並且沉積裝置從位置(b)移動到位置(d)。在一些實現方式中,如果沉積在兩個方向上同等地操作,那麼沉積裝置不會改變位置。作為一個示例,在非對稱的沉積裝置(諸如成角度的刮板)的情況下,一個沉積裝置升高,並且另一沉積裝置下降。As an example, when the process head assembly 110 or the process head 140 is in the first position A and moves in the first direction 1 ("moving direction"), one of the one or more material processing devices 130 processes The apparatus may be at position (a) and one of the one or more deposition apparatuses 120 may be at position (b). Similarly, when the process head assembly 110 or the process head 140 is in the second position B and moves along the second direction 2 ("moving direction"), the material processing device may be at position (c) and the deposition device may be at position (d). When the process head assembly 110 reaches the second position B from the first position A, the material processing apparatus moves from position (a) to position (c), and the deposition apparatus moves from position (b) to position (d). In some implementations, if the deposition operates equally in both directions, the deposition device does not change position. As an example, in the case of an asymmetric deposition device (such as an angled squeegee), one deposition device is raised and the other deposition device is lowered.

根據可以與本文所述的其它實施方式組合的一些實施方式,驅動裝置被配置為用於在與第一方向1相反的第二方向上移動製程頭部組件110,以便在沿第二方向的移動過程中執行沉積和材料處理。製程頭部組件110沿第二方向的移動可對應於製程頭部組件110從第二位置B到第一位置A的移動。第二方向可為垂直於垂直方向4的水準方向3。According to some embodiments that can be combined with other embodiments described herein, the drive device is configured to move the process head assembly 110 in a second direction opposite to the first direction 1 to facilitate movement in the second direction During the deposition and material processing. The movement of the process head assembly 110 in the second direction may correspond to the movement of the process head assembly 110 from the second position B to the first position A. The second direction may be the horizontal direction 3 perpendicular to the vertical direction 4.

在一些實現方式中,製程頭部組件110在第一位置A和第二位置B之間的移動,諸如第一行程和/或第二行程可對應於400 mm或更小,具體地300 mm或更小並且更具體地200 mm或更小的行程距離。作為一個示例,行程距離可以在150 mm至300 mm之間的範圍內,並且可以具體地為約220 mm。行程距離可等於或大於基板10或導電線路圖案的延伸度。第一位置A和第二位置B可相對於第一位置A與第二位置B之間的中心點(並且具體地是作為當製程頭部組件110處於第一位置A時沉積裝置的位置(b)與當製程頭部組件110處於第二位置B時沉積裝置的位置(d)之間的中心點)進行限定。作為一個示例,當第一位置A和第二位置B之間的行程距離為220 mm時,當製程頭部組件110處於第一位置A時,沉積裝置的位置(b)可以為-110 mm,並且當製程頭部組件110處於第二位置B時,沉積裝置的位置(d)可以為+110 mm。在一些實施方式中,提供一個或更多個參考位置。所述一個或更多個參考位置例如可為基板中心(零點位置)、在行程開始時的沉積裝置的位置(例如,-110 mm)以及在行程完成時的沉積裝置的最終位置(例如,+110 mm)。膏卷可以從-110 mm位置到+110 mm位置來回移動。由於處理裝置可與沉積裝置設有偏移(例如,30mm),因此製程頭部組件110可以執行額外運作以使膏卷返回準確位置。In some implementations, the movement of the process head assembly 110 between the first position A and the second position B, such as the first stroke and / or the second stroke may correspond to 400 mm or less, specifically 300 mm or Smaller and more specifically 200 mm or less travel distance. As an example, the travel distance may be in the range of 150 mm to 300 mm, and may specifically be about 220 mm. The travel distance may be equal to or greater than the extension of the substrate 10 or the conductive line pattern. The first position A and the second position B may be relative to the center point between the first position A and the second position B (and specifically the position of the deposition device when the process head assembly 110 is in the first position A ) And the center point between the position (d) of the deposition device when the process head assembly 110 is in the second position B). As an example, when the travel distance between the first position A and the second position B is 220 mm, when the process head assembly 110 is in the first position A, the position (b) of the deposition device may be -110 mm, And when the process head assembly 110 is in the second position B, the position (d) of the deposition device may be +110 mm. In some embodiments, one or more reference positions are provided. The one or more reference positions may be, for example, the center of the substrate (zero position), the position of the deposition device at the beginning of the stroke (eg, -110 mm), and the final position of the deposition device at the completion of the stroke (eg, 110 mm). The paste roll can be moved back and forth from the -110 mm position to the +110 mm position. Since the processing device can be offset from the deposition device (for example, 30 mm), the process head assembly 110 can perform additional operations to return the paste roll to an accurate position.

根據一些實施方式,在一個或更多個沉積裝置與一個或更多個材料處理裝置之間可以設有距離或間距。具體地講,在相鄰或鄰近的沉積裝置與材料處理裝置之間可以設有距離或間距。作為一個示例,在第一方向1上、在沉積裝置與相鄰的材料處理裝置之間的距離或間距可為50 mm或更小,具體地是40 mm或更小,並且可以更具體地為約30 mm。距離或間距可為材料積聚(「膏卷」)提供空間。According to some embodiments, a distance or spacing may be provided between one or more deposition devices and one or more material processing devices. In particular, a distance or spacing may be provided between adjacent or adjacent deposition devices and material processing devices. As an example, the distance or spacing between the deposition device and the adjacent material processing device in the first direction 1 may be 50 mm or less, specifically 40 mm or less, and may be more specifically About 30 mm. Distance or spacing can provide space for material accumulation ("paste roll").

在一些實施方式中,設備100被配置為至少進行雙重印刷。作為一個示例,導電線路圖案(諸如太陽能電池的指狀物和/或匯流條)可包括兩個或更多個材料層。第一材料層可以印刷在基板10上,並且第二材料層可至少部分地印刷在第一材料層的頂部上,以便形成導電線路圖案。在一些實現方式中,設備100可以在第一沉積製程過程中印刷第一材料層,第一沉積製程包括從第一位置A到第二位置B的移動或第一行程。在一些實施方式中,設備100可以在第二沉積製程過程中印刷第二材料層,第二沉積製程包括從第二位置B到第一位置A的移動或第二行程。然而,本揭示案並不限於此,並且可以利用沿相同方向(例如,第一方向1或第二方向)移動的製程頭部組件110執行沉積製程。在一些實施方式中,基板被交替地印刷,例如,一個基板使用第一方向1,另一基板使用第二方向2等等(例如,對於每個處理或印刷站)。In some embodiments, the device 100 is configured to perform at least double printing. As an example, the conductive line pattern (such as the fingers and / or bus bars of the solar cell) may include two or more material layers. The first material layer may be printed on the substrate 10, and the second material layer may be printed at least partially on top of the first material layer in order to form a conductive line pattern. In some implementations, the apparatus 100 may print the first material layer during the first deposition process, the first deposition process includes a movement or a first stroke from the first position A to the second position B. In some embodiments, the apparatus 100 may print the second material layer during the second deposition process, the second deposition process including a movement or a second stroke from the second position B to the first position A. However, the present disclosure is not limited to this, and the deposition process may be performed using the process head assembly 110 moving in the same direction (for example, the first direction 1 or the second direction). In some embodiments, the substrates are printed alternately, for example, one substrate uses the first direction 1, the other substrate uses the second direction 2, and so on (eg, for each processing or printing station).

在一些實現方式中,第一方向1和第二方向2可為實質上水準的方向。術語「水準方向」被理解為區別於「垂直方向」。也就是說,「水準方向」涉及例如製程頭部組件110的實質上水準的移動,其中與準確水準方向的幾度偏差(例如,達到5°或甚至達到10°)仍然被認為是「實質上水準的方向」。垂直方向4可以實質上平行於重力。In some implementations, the first direction 1 and the second direction 2 may be substantially horizontal directions. The term "horizontal direction" is understood to be different from "vertical direction". That is, the "leveling direction" refers to, for example, a substantially horizontal movement of the process head assembly 110, where a deviation of several degrees from the accurate leveling direction (eg, reaching 5 ° or even reaching 10 °) is still considered a "substantial level Direction. " The vertical direction 4 may be substantially parallel to gravity.

根據可以與本文所述的其它實施方式組合的一些實施方式,設備100,並且具體地是製程頭部組件110,還包括致動器組件,所述致動器組件被配置為用於移動一個或更多個沉積裝置120和/或一個或更多個材料處理裝置130。作為一個示例,致動器組件包括一個或更多個第一致動器,所述一個或更多個第一致動器被配置為調整一個或更多個材料處理裝置130中的至少一個材料處理裝置與絲網154和/或基板支撐件20之間的距離和至少一個材料處理裝置相對於絲網154和/或基板支撐件20的角度中的至少一個。另外地或替代地,所述致動器組件包括一個或更多個第二致動器,所述一個或更多個第二致動器被配置為調整一個或更多個沉積裝置120中的至少一個沉積裝置與絲網154和/或基板支撐件20之間的距離和至少一個沉積裝置相對於絲網154和/或基板支撐件20的角度中的至少一個。According to some embodiments that can be combined with other embodiments described herein, the apparatus 100, and specifically the process head assembly 110, further includes an actuator assembly configured to move one or More deposition devices 120 and / or one or more material processing devices 130. As an example, the actuator assembly includes one or more first actuators configured to adjust at least one material in one or more material processing devices 130 At least one of the distance between the processing device and the screen 154 and / or substrate support 20 and the angle of the at least one material processing device relative to the screen 154 and / or substrate support 20. Additionally or alternatively, the actuator assembly includes one or more second actuators that are configured to adjust one or more of the deposition devices 120 At least one of the distance between the at least one deposition device and the screen 154 and / or the substrate support 20 and the angle of the at least one deposition device relative to the screen 154 and / or the substrate support 20.

在一些實現方式中,在製程頭部組件110例如在第一位置A與第二位置B之間移動的過程中,可調整或控制一個或更多個材料處理裝置130中的至少一個材料處理裝置與絲網154和/或基板支撐件20之間的距離(例如,在垂直方向上)。作為一個示例,可以通過調整至少一個材料處理裝置的垂直位置來調整距離。即時調整垂直位置可以確保至少一個材料處理裝置不會幹擾絲網154,特別是在絲網154因絲網154與一個或更多個沉積裝置120接觸而變形時。根據一些實施方式,可以將一個或更多個材料處理裝置130中的至少一個材料處理裝置與絲網154和/或基板支撐件20之間的距離調整為遵循絲網輪廓(screen profile)。具體地,可將至少一個材料處理裝置的垂直位置控制或調整為遵循所述絲網輪廓。作為一個示例,在製程頭部組件110的移動過程中,可調整或控制至少一個材料處理裝置與絲網154和/或基板支撐件20之間的距離,以便使其將是基本上恆定的。In some implementations, during the movement of the process head assembly 110, for example, between the first position A and the second position B, at least one of the one or more material processing devices 130 may be adjusted or controlled The distance from the wire mesh 154 and / or the substrate support 20 (for example, in a vertical direction). As an example, the distance can be adjusted by adjusting the vertical position of at least one material processing device. Adjusting the vertical position in real time can ensure that at least one material processing device does not interfere with the wire mesh 154, especially when the wire mesh 154 is deformed by contact of the wire mesh 154 with one or more deposition devices 120. According to some embodiments, the distance between at least one of the one or more material processing devices 130 and the screen 154 and / or the substrate support 20 may be adjusted to follow a screen profile. In particular, the vertical position of at least one material processing device can be controlled or adjusted to follow the screen outline. As an example, during the movement of the process head assembly 110, the distance between the at least one material processing device and the screen 154 and / or the substrate support 20 may be adjusted or controlled so that it will be substantially constant.

圖2A和圖2B示出了根據本文所述實施方式的用於進行沉積(諸如印刷)和材料處理的製程頭部組件220的示意圖,所述製程頭部組件220在第一方向1上和在第二方向2上移動。2A and 2B show schematic views of a process head assembly 220 for deposition (such as printing) and material processing according to embodiments described herein, the process head assembly 220 in the first direction 1 and in Move in the second direction 2.

根據可以與本文所述的其它實施方式組合的一些實施方式,一個或更多個材料處理裝置至少包括第一材料處理裝置230和第二材料處理裝置232。當製程頭部組件110(例如,製程頭部140)處於第一位置A時,第一材料處理裝置230處於位置(a),沉積裝置處於位置(b),並且第二材料處理裝置232處於位置(a')。當製程頭部組件110處於第二位置B時,第一材料處理裝置230處於位置(c),沉積裝置處於位置(d),並且第二材料處理裝置232處於位置(c')。According to some embodiments, which can be combined with other embodiments described herein, the one or more material processing devices include at least a first material processing device 230 and a second material processing device 232. When the process head assembly 110 (eg, the process head 140) is in the first position A, the first material processing device 230 is in position (a), the deposition device is in position (b), and the second material processing device 232 is in position (a '). When the process head assembly 110 is in the second position B, the first material processing device 230 is in position (c), the deposition device is in position (d), and the second material processing device 232 is in position (c ').

在一些實現方式中,一個或更多個沉積裝置120中的至少一個沉積裝置定位在第一材料處理裝置230與第二材料處理裝置232之間。雖然圖2A和圖2B示例性地示出第一材料處理裝置230與第二材料處理裝置232之間的一個沉積裝置,但是本揭示案不限於此。具體地,在第一材料處理裝置230與第二材料處理裝置232之間可以設有多於一個沉積裝置,諸如兩個沉積裝置。In some implementations, at least one of the one or more deposition devices 120 is positioned between the first material processing device 230 and the second material processing device 232. Although FIGS. 2A and 2B exemplarily show one deposition device between the first material processing device 230 and the second material processing device 232, the present disclosure is not limited thereto. Specifically, there may be more than one deposition device, such as two deposition devices, between the first material processing device 230 and the second material processing device 232.

在另外實施方式中,一個或更多個沉積裝置120至少包括第一沉積裝置和第二沉積裝置。一個或更多個材料處理裝置中的至少一個材料處理裝置可以定位在第一沉積裝置與第二沉積裝置之間。作為一個示例,兩個材料處理裝置可以定位在第一沉積裝置與第二沉積裝置之間。In another embodiment, the one or more deposition devices 120 include at least a first deposition device and a second deposition device. At least one material processing device of the one or more material processing devices may be positioned between the first deposition device and the second deposition device. As an example, two material processing devices may be positioned between the first deposition device and the second deposition device.

根據可以與本文所述的其它實施方式組合的一些實施方式,當製程頭部組件220在第一方向1上移動時,第一材料處理裝置230被定位在一個或更多個沉積裝置120後方。當製程頭部組件220在第二方向2上移動時,第二材料處理裝置232可以定位在一個或更多個沉積裝置120後方。換句話說,相應材料處理裝置在移動方向(諸如第一方向或第二方向)上跟隨一個或更多個沉積裝置120。According to some embodiments that can be combined with other embodiments described herein, when the process head assembly 220 is moved in the first direction 1, the first material processing device 230 is positioned behind one or more deposition devices 120. When the process head assembly 220 moves in the second direction 2, the second material processing device 232 may be positioned behind one or more deposition devices 120. In other words, the corresponding material processing device follows one or more deposition devices 120 in the moving direction, such as the first direction or the second direction.

如圖2A所示,在製程頭部組件110在第一方向1上移動的過程中,製程頭部組件110使用一個或更多個材料處理裝置中的第一材料處理裝置230進行材料處理。另外,如圖2B所示,在製程頭部組件110在第二方向2上移動的過程中,製程頭部組件110使用第二材料處理裝置232進行材料處理。在製程頭部組件110移動過程中用於材料處理的材料處理裝置可以被定位成足夠靠近絲網154,以便允許材料處理,諸如在絲網154上提供基本上均勻的材料層。作為一個示例,用於進行材料處理的材料處理裝置與絲網154之間的距離(例如,以下段落中描述的第一距離d1或第二距離d2)可以根據沉積在絲網154上的材料的層厚度、材料(例如,膏劑)的流變性以及材料的組成中的至少一個進行選擇。As shown in FIG. 2A, during the movement of the process head assembly 110 in the first direction 1, the process head assembly 110 uses the first material processing device 230 of one or more material processing devices to perform material processing. In addition, as shown in FIG. 2B, during the movement of the process head assembly 110 in the second direction 2, the process head assembly 110 uses the second material processing device 232 to perform material processing. The material handling device for material handling during the movement of the process head assembly 110 may be positioned close enough to the wire mesh 154 to allow material handling, such as providing a substantially uniform layer of material on the wire mesh 154. As an example, the distance between the material processing apparatus for performing material processing and the wire mesh 154 (for example, the first distance d1 or the second distance d2 described in the following paragraph) may be based on the At least one of layer thickness, rheology of the material (eg, paste), and composition of the material is selected.

根據一些實施方式,在製程頭部組件220在第一方向1上移動的過程中,絲網154與第一材料處理裝置230之間的第一距離d1小於絲網154與第二材料處理裝置232之間的第二距離d2。在製程頭部組件220在第二方向2上移動的過程中,絲網154與第二材料處理裝置232之間的第二距離d2可以小於絲網154與第一材料處理裝置230之間的第一距離d1。第一距離d1和第二距離d2可以限定在垂直方向上。According to some embodiments, during the movement of the process head assembly 220 in the first direction 1, the first distance d1 between the wire mesh 154 and the first material processing device 230 is smaller than the wire mesh 154 and the second material processing device 232 The second distance d2. During the movement of the process head assembly 220 in the second direction 2, the second distance d2 between the wire mesh 154 and the second material processing device 232 may be smaller than the second distance between the wire mesh 154 and the first material processing device 230 One distance d1. The first distance d1 and the second distance d2 may be defined in the vertical direction.

在一些實現方式中,第一距離d1和第二距離d2中的較大距離(即,圖2A中的第二距離d2和圖2B中的第一距離d1)可以在5 mm與25 mm之間的範圍內,具體地是在10 mm與20 mm之間的範圍內,並且更具體地可以為約15 mm。第一距離d1和第二距離d2中的較小距離(即,圖2A中的第一距離d1和圖2B中的第二距離d2)可以在0.01 mm與2 mm之間的範圍內,具體地是在0.05 mm與1.5 mm之間的範圍內,並且更具體地可為在0.1 mm與1 mm之間的範圍內。In some implementations, the larger of the first distance d1 and the second distance d2 (ie, the second distance d2 in FIG. 2A and the first distance d1 in FIG. 2B) may be between 5 mm and 25 mm Within a range of 10 mm and 20 mm, and more specifically about 15 mm. The smaller of the first distance d1 and the second distance d2 (ie, the first distance d1 in FIG. 2A and the second distance d2 in FIG. 2B) may be in the range between 0.01 mm and 2 mm, specifically Is in the range between 0.05 mm and 1.5 mm, and more specifically may be in the range between 0.1 mm and 1 mm.

在一些實現方式中,在第一位置A和第二位置B之間移動過程中,可調整或控制第一距離d1和/或第二距離d2。即時調整第一距離d1和/或第二距離d2可以確保至少一個材料處理裝置不會幹擾絲網154。根據一些實施方式,可將第一距離d1和/或第二距離d2調整為遵循絲網輪廓。根據一些實施方式,僅調整正使用的材料處理裝置的距離。可以使未使用的材料處理裝置的距離保持恆定。作為一個示例,可以對正使用中的材料處理裝置的距離做出調整,以便將所述材料處理裝置與絲網154之間的距離(諸如第一距離d1或第二距離d2)保持為基本上恆定的。In some implementations, during the movement between the first position A and the second position B, the first distance d1 and / or the second distance d2 may be adjusted or controlled. The immediate adjustment of the first distance d1 and / or the second distance d2 can ensure that at least one material processing device does not interfere with the wire mesh 154. According to some embodiments, the first distance d1 and / or the second distance d2 may be adjusted to follow the screen outline. According to some embodiments, only the distance of the material handling device being used is adjusted. The distance of the unused material processing device can be kept constant. As an example, the distance of the material processing device in use may be adjusted so as to maintain the distance between the material processing device and the wire mesh 154 (such as the first distance d1 or the second distance d2) to be substantially stable.

根據可以與本文所述的其它實施方式組合的一些實施方式,設備100,並且具體地是製程頭部組件220(例如,製程頭部140)還包括致動器組件,所述致動器組件被配置為用於移動一個或更多個沉積裝置120和/或一個或更多個材料處理裝置。作為一個示例,致動器組件包括一個或更多個第一致動器,所述一個或更多個第一致動器被配置為調整一個或更多個材料處理裝置中的至少一個材料處理裝置與絲網154和/或基板支撐件20之間的距離(例如,第一距離d1和/或第二距離d2)和至少一個材料處理裝置相對於絲網154和/或基板支撐件20的角度中的至少一個。作為一個示例,一個或更多個第一致動器可包括第一致動器單元和第二致動器單元,第一致動器單元被配置為調整第一材料處理裝置230與絲網154和/或基板支撐件20之間的第一距離d1,第二致動器單元被配置為調整第二材料處理裝置232與絲網154和/或基板支撐件20之間的第二距離d2。According to some embodiments that can be combined with other embodiments described herein, the device 100, and specifically the process head assembly 220 (eg, the process head 140) also includes an actuator assembly that is It is configured to move one or more deposition devices 120 and / or one or more material processing devices. As an example, the actuator assembly includes one or more first actuators configured to adjust at least one material processing of one or more material processing devices The distance between the device and the screen 154 and / or the substrate support 20 (eg, the first distance d1 and / or the second distance d2) and the at least one material processing device relative to the screen 154 and / or the substrate support 20 At least one of the angles. As an example, one or more first actuators may include a first actuator unit and a second actuator unit, the first actuator unit configured to adjust the first material processing device 230 and the wire mesh 154 And / or the first distance d1 between the substrate support 20, the second actuator unit is configured to adjust the second distance d2 between the second material processing device 232 and the screen 154 and / or the substrate support 20.

致動器組件中的致動器,諸如一個或更多個第一致動器和/或一個或更多個第二致動器,可從由以下項組成的組選擇:步進電機(stepper motor)、線性電機、氣動電機以及它們的任何組合。The actuators in the actuator assembly, such as one or more first actuators and / or one or more second actuators, can be selected from the group consisting of: stepper motor (stepper motor), linear motor, pneumatic motor and any combination of them.

圖3示出了根據本文所述的另外實施方式的用於將材料沉積於用於太陽能電池製造中的基板上的設備的示意圖。Figure 3 shows a schematic view of an apparatus for depositing materials on a substrate used in solar cell manufacturing according to further embodiments described herein.

根據可以與本文所述的其它實施方式組合的一些實施方式,一個或更多個沉積裝置120被配置為用於在沉積製程過程中接觸絲網154。用於在沉積製程過程中進行材料處理的一個或更多個材料處理裝置130可以被配置為在所述沉積製程過程中不與絲網154接觸。具體地,一個或更多個材料處理裝置130可以與絲網154間隔開例如關於圖2A和圖2B說明的第一距離和/或第二距離。According to some embodiments, which may be combined with other embodiments described herein, one or more deposition devices 120 are configured to contact the wire mesh 154 during the deposition process. One or more material processing devices 130 for performing material processing during the deposition process may be configured not to contact the wire mesh 154 during the deposition process. Specifically, one or more material processing devices 130 may be spaced apart from the wire mesh 154 by, for example, the first distance and / or the second distance described with respect to FIGS. 2A and 2B.

在一些實現方式中,一個或更多個沉積裝置120與基板支撐件20之間的距離可以小於一個或更多個材料處理裝置130與基板支撐件20之間的距離。在圖3的示例中,一個或更多個沉積裝置120與基板支撐件20之間的距離可以基本上對應於絲網154和基板10的組合厚度。沉積裝置可對絲網施加力。絲網發生變形,並且由沉積裝置施加的小於絲網阻力的力被傳遞到基板。In some implementations, the distance between the one or more deposition devices 120 and the substrate support 20 may be less than the distance between the one or more material processing devices 130 and the substrate support 20. In the example of FIG. 3, the distance between the one or more deposition devices 120 and the substrate support 20 may substantially correspond to the combined thickness of the wire mesh 154 and the substrate 10. The deposition device can apply force to the wire mesh. The screen is deformed, and the force applied by the deposition device that is less than the resistance of the screen is transmitted to the substrate.

在圖3中,示出一個或更多個沉積裝置120與基板10之間的距離和一個或更多個材料處理裝置130與基板10之間的距離之間的差值d。差值d可相對於基板10或替代地可相對於基板支撐件20(諸如基板支撐件的支撐表面,所述支撐表面被配置成用於在沉積製程過程中支撐基板)和/或水準平面限定。水準平面可由支撐表面限定。在一些實現方式中,差值d可對應於一個或更多個沉積裝置120的尖端與一個或更多個材料處理裝置130的尖端之間的高度差值(例如,在垂直方向上)。差值d可以在5 mm與25 mm之間的範圍內,具體地在10 mm與20 mm之間的範圍內,並且更具體地可為約15 mm。可通過線性移動一個或更多個材料處理裝置130來改變距離d,如用箭頭5指示。In FIG. 3, the difference d between the distance between the one or more deposition devices 120 and the substrate 10 and the distance between the one or more material processing devices 130 and the substrate 10 is shown. The difference d may be defined relative to the substrate 10 or alternatively to the substrate support 20 (such as the support surface of the substrate support configured to support the substrate during the deposition process) and / or the level . The leveling plane may be defined by the support surface. In some implementations, the difference d may correspond to the height difference between the tips of the one or more deposition devices 120 and the one or more material processing devices 130 (eg, in the vertical direction). The difference d may be in the range between 5 mm and 25 mm, specifically in the range between 10 mm and 20 mm, and more specifically may be about 15 mm. The distance d can be changed by linearly moving one or more material handling devices 130, as indicated by arrow 5.

圖4A和圖4B示出了根據本文所述的另外實施方式的用於將材料沉積於用於太陽能電池製造中的基板上的設備的製程頭部組件的示意圖。4A and 4B show schematic diagrams of a process head assembly of an apparatus for depositing material on a substrate used in solar cell manufacturing according to further embodiments described herein.

根據可以與本文所述的實施方式組合的其它實施方式,設備並且具體地是製程頭部組件,包括兩個或更多個製程頭部。所述兩個或更多個製程頭部可彼此獨立地控制和/或移動。作為一個示例,製程頭部組件包括第一製程頭部和第二製程頭部。第一驅動裝置可以被配置為用於例如在第一方向和/或第二方向上移動第一製程頭部,並且第二驅動裝置可以被提供來例如在第一方向和/或第二方向上移動第二製程頭部。一個或更多個沉積裝置中的至少一個沉積裝置可附接到第一製程頭部,並且一個或更多個材料處理裝置中的至少一個材料處理裝置附接到第二製程頭部。According to other embodiments that can be combined with the embodiments described herein, the device and specifically the process head assembly includes two or more process heads. The two or more process heads can be controlled and / or moved independently of each other. As an example, the process head assembly includes a first process head and a second process head. The first driving device may be configured to move the first process head in, for example, the first direction and / or the second direction, and the second driving device may be provided, for example, in the first direction and / or the second direction Move the second process head. At least one of the one or more deposition devices may be attached to the first process head, and at least one of the one or more material processing devices is attached to the second process head.

在圖4A的示例中,製程頭部組件410包括第一製程頭部412和第二製程頭部414。一個或更多個沉積裝置中的至少一個沉積裝置附接到第一製程頭部412。一個或更多個材料處理裝置中的至少一個材料處理裝置附接到第二製程頭部414。在當前示例中,沉積裝置或材料處理裝置附接到相應的製程頭部。換句話說,每個製程頭部具有附接到其上的沉積裝置或材料處理裝置。雖然示出一個沉積裝置和一個材料處理裝置,但是應當理解,本揭示案不限於此,並且兩個或更多個沉積裝置可附接到第一製程頭部412。同樣,兩個或更多個材料處理裝置可附接到第二製程頭部414。In the example of FIG. 4A, the process head assembly 410 includes a first process head 412 and a second process head 414. At least one of the one or more deposition devices is attached to the first process head 412. At least one material processing device of the one or more material processing devices is attached to the second process head 414. In the current example, a deposition device or material processing device is attached to the corresponding process head. In other words, each process head has a deposition device or material processing device attached thereto. Although one deposition apparatus and one material processing apparatus are shown, it should be understood that the present disclosure is not limited thereto, and two or more deposition apparatuses may be attached to the first process head 412. Likewise, two or more material handling devices may be attached to the second process head 414.

關於圖4B,製程頭部組件420包括第一製程頭部422和第二製程頭部424。一個或更多個沉積裝置中的至少一個沉積裝置和一個或更多個材料處理裝置中的至少一個材料處理裝置附接到第一製程頭部422。一個或更多個沉積裝置中的至少另一沉積裝置和一個或更多個材料處理裝置中的至少另一材料處理裝置附接到第二製程頭部424。在當前示例中,沉積裝置和材料處理裝置兩者都附接到相應的製程頭部。4B, the process head assembly 420 includes a first process head 422 and a second process head 424. At least one of the one or more deposition devices and at least one of the one or more material processing devices are attached to the first process head 422. At least another deposition device of the one or more deposition devices and at least another material processing device of the one or more material processing devices are attached to the second process head 424. In the current example, both the deposition device and the material processing device are attached to the corresponding process head.

雖然在每個製程頭部處示出一個沉積裝置和一個材料處理裝置,但是應當理解,本揭示案不限於此,並且兩個或更多個沉積裝置和/或兩個或更多個材料處理裝置可附接到第一製程頭部422。同樣,兩個或更多個沉積裝置和/或兩個或更多個材料處理裝置可附接到第二製程頭部424。Although one deposition device and one material processing device are shown at the head of each process, it should be understood that the present disclosure is not limited thereto, and two or more deposition devices and / or two or more material processing The device may be attached to the first process head 422. Likewise, two or more deposition devices and / or two or more material processing devices may be attached to the second process head 424.

圖5示出了根據本文所述的另外實施方式的用於將材料沉積於用於太陽能電池製造中的基板上的設備的製程頭部組件510的示意圖。製程頭部組件510可包括或可以是製程頭部540。5 shows a schematic diagram of a process head assembly 510 of an apparatus for depositing material on a substrate used in solar cell manufacturing according to further embodiments described herein. The process head assembly 510 may include or may be the process head 540.

根據可以與本文所述的其它實施方式組合的一些實施方式,設備並且具體地是製程頭部組件510包括致動器組件,所述致動器組件被配置為用於移動一個或更多個沉積裝置520和/或一個或更多個材料處理裝置(諸如第一材料處理裝置530和第二材料處理裝置532)。一個或更多個沉積裝置520可為刮板,諸如矩形刮板。刮板可以具有尖端522,諸如矩形狀的尖端。根據可以與本文所述的其它實施方式組合的一些實施方式,一個或更多個沉積裝置可為基本上對稱的。作為一個示例,一個或更多個沉積裝置可以具有基本上對稱的尖端,使得相同的(例如,單個)沉積裝置可以用於在第一方向和第二方向上進行印刷。According to some embodiments, which may be combined with other embodiments described herein, the apparatus and specifically the process head assembly 510 includes an actuator assembly configured to move one or more deposits The device 520 and / or one or more material processing devices (such as the first material processing device 530 and the second material processing device 532). The one or more deposition devices 520 may be scrapers, such as rectangular scrapers. The squeegee may have a tip 522, such as a rectangular tip. According to some embodiments, which may be combined with other embodiments described herein, one or more deposition devices may be substantially symmetrical. As one example, one or more deposition devices may have substantially symmetrical tips, so that the same (eg, single) deposition device may be used for printing in the first direction and the second direction.

在一些實施方式中,致動器組件包括一個或更多個第一致動器562,所述一個或更多個第一致動器562被配置成調整一個或更多個材料處理裝置與絲網和/或基板支撐件之間的距離,並任選地調整一個或更多個處理裝置相對於絲網和/或基板支撐件的角度。作為一個示例,一個或更多個第一致動器562可包括第一致動器單元,所述第一致動器單元被配置為調整第一材料處理裝置530與絲網之間的距離(例如第一距離)和第一材料處理裝置530相對於絲網和/或基板支撐件的角度(諸如第一角度)中的至少一個。一個或更多個第一致動器562可包括第二致動器單元,所述第二致動器單元被配置為調整第二材料處理裝置532與絲網之間的距離(諸如第二距離)和第二材料處理裝置532相對於絲網和/或基板支撐件的角度(諸如第三角度)中的至少一個。在一些實現方式中,一個或更多個第一致動器562可僅線性移動處理裝置。可以提供另一致動器,所述另一致動器被配置為改變整個製程頭部組件的角度。In some embodiments, the actuator assembly includes one or more first actuators 562 configured to adjust one or more material handling devices and wires The distance between the mesh and / or substrate support, and optionally adjusting the angle of one or more processing devices relative to the wire mesh and / or substrate support. As one example, the one or more first actuators 562 may include a first actuator unit configured to adjust the distance between the first material processing device 530 and the wire mesh ( For example, at least one of the first distance) and the angle (such as the first angle) of the first material processing device 530 relative to the wire mesh and / or the substrate support. The one or more first actuators 562 may include a second actuator unit configured to adjust the distance (such as the second distance) between the second material processing device 532 and the wire mesh ) And at least one of the angles (such as a third angle) of the second material processing device 532 with respect to the wire mesh and / or the substrate support. In some implementations, one or more first actuators 562 may only move the processing device linearly. Another actuator may be provided that is configured to change the angle of the head assembly throughout the process.

在一些實現方式中,一個或更多個第一致動器562被配置為調整一個或更多個材料處理裝置與絲網之間的距離。作為一個示例,一個或更多個第一致動器562使得一個或更多個材料處理裝置(諸如第一材料處理裝置530和第二材料處理裝置532)可相對於彼此基本上平行地移動。一個或更多個第一致動器562可為線性致動器,諸如線性電機。In some implementations, the one or more first actuators 562 are configured to adjust the distance between the one or more material processing devices and the wire mesh. As one example, the one or more first actuators 562 enable one or more material processing devices (such as the first material processing device 530 and the second material processing device 532) to move substantially parallel to each other. The one or more first actuators 562 may be linear actuators, such as linear motors.

另外地或替代地,致動器組件包括一個或更多個第二致動器564,所述一個或更多個第二致動器564被配置為調整一個或更多個沉積裝置520與絲網和/或基板支撐件之間的距離,並任選地調整一個或更多個沉積裝置520相對於絲網和/或基板支撐件的角度(諸如第二角度)。作為一個示例,一個或更多個第二致動器564可以被配置為將一個或更多個沉積裝置520朝絲網移動,以便接觸絲網。一個或更多個第二致動器564可進一步被配置為調整一個或更多個沉積裝置520對絲網施加的壓力。一個或更多個第二致動器564可以被配置為在基本上平行於由一個或更多個第一致動器562提供的移動方向的方向上移動一個或更多個沉積裝置520。可通過插置一個或更多個第一致動器562和一個或更多個第二致動器564來控制處理裝置的尖端與絲網之間的距離(例如,圖2B中的「d1」)。Additionally or alternatively, the actuator assembly includes one or more second actuators 564 configured to adjust one or more deposition devices 520 and wires The distance between the mesh and / or substrate support, and optionally adjusting the angle (such as a second angle) of the one or more deposition devices 520 relative to the wire mesh and / or substrate support. As one example, one or more second actuators 564 may be configured to move one or more deposition devices 520 toward the screen to contact the screen. The one or more second actuators 564 may be further configured to adjust the pressure applied by the one or more deposition devices 520 to the wire mesh. The one or more second actuators 564 may be configured to move the one or more deposition devices 520 in a direction substantially parallel to the moving direction provided by the one or more first actuators 562. The distance between the tip of the processing device and the wire mesh can be controlled by inserting one or more first actuators 562 and one or more second actuators 564 (for example, "d1" in FIG. 2B ).

一個或更多個材料處理裝置和一個或更多個沉積裝置520相對於絲網和/或基板支撐件之間的距離可以在垂直平面中限定。同樣,可相對於垂直平面限定相應的材料處理裝置和沉積裝置相對於絲網和/或基板支撐件的角度,諸如第一角度至第三角度。The distance between the one or more material processing devices and the one or more deposition devices 520 relative to the wire mesh and / or substrate support may be defined in a vertical plane. Also, the angles of the respective material processing devices and deposition devices relative to the wire mesh and / or substrate support, such as the first angle to the third angle, may be defined relative to the vertical plane.

在一些實現方式中,設備包括一個或更多個旋轉致動器,所述一個或更多個旋轉致動器被配置為旋轉製程頭部組件510,具體地將是其製程頭部。一個或更多個旋轉致動器可以被配置為調整製程頭部組件或製程頭部相對於絲網和/或基板支撐件的角度。在圖5中,可相對於垂直平面限定絲網和/或基板支撐件與製程頭部之間的角度α。當在第一方向上移動時,製程頭部組件510可以具有角度+α,這個角度可對應於製程頭部組件510沿順時針方向的傾斜。In some implementations, the device includes one or more rotary actuators that are configured to rotate the process head assembly 510, which will specifically be its process head. The one or more rotary actuators may be configured to adjust the angle of the process head assembly or process head relative to the screen and / or substrate support. In FIG. 5, the angle α between the wire mesh and / or the substrate support and the process head may be defined relative to the vertical plane. When moving in the first direction, the process head assembly 510 may have an angle + α, which may correspond to the tilt of the process head assembly 510 in the clockwise direction.

當在第二方向上移動時,製程頭部組件510可以具有角度-α,這個角度可對應於製程頭部組件510沿逆時針方向的傾斜。角度+α和-α可相對於垂直平面或方向成70°或更小,具體地是60°或更小,更具體地40°或更小,並且甚至更具體地20°或更小。作為一個示例,角度+α和-α可以在20°與70°之間的範圍內,並且更具體地在40°與70°之間的範圍內。When moving in the second direction, the process head assembly 510 may have an angle -α, and this angle may correspond to the inclination of the process head assembly 510 in the counterclockwise direction. The angles + α and -α may be 70 ° or less relative to the vertical plane or direction, specifically 60 ° or less, more specifically 40 ° or less, and even more specifically 20 ° or less. As an example, the angles + α and -α may be in the range between 20 ° and 70 °, and more specifically in the range between 40 ° and 70 °.

在一些實施方式中,製程頭部組件510的一種配置可包括一個或更多個第一致動器562和一個或更多個第二致動器564,以便線性地且基本上平行於彼此地驅動一個或更多個處理裝置和一個或更多個沉積裝置,並且可進一步包括一個或更多個旋轉致動器,所述一個或更多個旋轉致動器被配置為旋轉製程頭部組件510。製程頭部組件510的另一配置可包括一個或更多個第一致動器562和一個或更多個第二致動器564,所述一個或更多個第一致動器562用於線性地且基本上平行於彼此地驅動一個或更多個處理裝置,所述一個或更多個第二致動器564用於線性地(例如,垂直地)驅動一個或更多個沉積裝置,並且旋轉一個或更多個沉積裝置。In some embodiments, one configuration of the process head assembly 510 may include one or more first actuators 562 and one or more second actuators 564 so as to be linear and substantially parallel to each other One or more processing devices and one or more deposition devices are driven, and may further include one or more rotary actuators configured to rotate the process head assembly 510. Another configuration of the process head assembly 510 may include one or more first actuators 562 and one or more second actuators 564, the one or more first actuators 562 for One or more processing devices are driven linearly and substantially parallel to each other, the one or more second actuators 564 are used to drive one or more deposition devices linearly (eg, vertically), And rotate one or more deposition devices.

根據可以與本文所述的其它實施方式組合的一些實施方式,設備被配置為例如在沉積製程之前、期間和/或之後調整一個或更多個材料處理裝置中的至少一個材料處理裝置的一個或更多個處理參數。一個或更多個處理參數選自由以下項組成的組:至少一個材料處理裝置與絲網和/或基板支撐件之間的距離(諸如第一距離和/或第二距離)、和至少一個材料處理裝置相對於絲網和/或基板支撐件的角度。According to some embodiments, which can be combined with other embodiments described herein, the apparatus is configured to adjust, for example, one of at least one of the one or more material processing devices before, during, and / or after the deposition process or More processing parameters. The one or more processing parameters are selected from the group consisting of: a distance (such as a first distance and / or a second distance) between at least one material processing device and the wire mesh and / or substrate support, and at least one material The angle of the processing device relative to the wire mesh and / or substrate support.

根據可以與本文所述的其它實施方式組合的一些實施方式,設備被配置為例如在沉積製程之前、期間和/或之後調整一個或更多個沉積裝置520的一個或更多個沉積參數。一個或更多個沉積參數可以選自由以下項組成的組:一個或更多個沉積裝置520中的至少一個沉積裝置與絲網和/或基板支撐件之間的距離、一個或更多個沉積裝置520中的至少一個沉積裝置相對於絲網和/或基板支撐件的的角度、製程頭部組件(例如,製程頭部)相對於絲網和/或基板支撐件的移動速度,以及一個或更多個沉積裝置中的至少一個沉積裝置例如作用於沉積製程中使用的絲網上的壓力。According to some embodiments, which may be combined with other embodiments described herein, the apparatus is configured to adjust one or more deposition parameters of one or more deposition devices 520, for example, before, during, and / or after the deposition process. The one or more deposition parameters may be selected from the group consisting of: the distance between at least one of the one or more deposition devices 520 and the screen and / or substrate support, one or more depositions The angle of at least one deposition device in device 520 relative to the wire mesh and / or substrate support, the movement speed of the process head assembly (eg, the process head) relative to the wire mesh and / or substrate support, and one or At least one of the more deposition devices acts on the pressure on the screen used in the deposition process, for example.

在一些實現方式中,在沉積製程過程中,尤其在材料處理過程中,調整一個或更多個處理參數中的至少一個處理參數。另外地或替代地,在沉積製程過程中,調整一個或更多個沉積參數中的至少一個沉積參數。對處理參數和/或沉積參數的即時調整可以提高導電線路圖案的品質。根據一些實施方式,可基於或根據一個或更多個沉積參數調整一個或更多個處理參數中的至少一個處理參數。In some implementations, at least one of the one or more processing parameters is adjusted during the deposition process, especially during the material processing. Additionally or alternatively, during the deposition process, at least one of the one or more deposition parameters is adjusted. The instant adjustment of the processing parameters and / or deposition parameters can improve the quality of the conductive line pattern. According to some embodiments, at least one of the one or more processing parameters may be adjusted based on or based on the one or more deposition parameters.

圖6示出了根據本文所述的另外實施方式的用於將材料網印於用於太陽能電池製造中的基板上的設備600的示意圖。6 shows a schematic diagram of an apparatus 600 for screen printing materials on a substrate used in solar cell manufacturing according to further embodiments described herein.

根據可以與本文所述的實施方式組合的一些實施方式,設備並且具體地是製程頭部組件包括兩個或更多個製程頭部(也被稱為「分組」或「製程分組」)。所述兩個或更多個製程頭部可彼此獨立地控制和/或移動。作為一個示例,製程頭部組件包括第一製程頭部610和第二製程頭部620。一個或更多個沉積裝置中的第一沉積裝置612附接到第一製程頭部610,並且一個或更多個沉積裝置中的第二沉積裝置622附接到第二製程頭部620。同樣,一個或更多個材料處理裝置中的第一材料處理裝置614附接到第一製程頭部610,並且一個或更多個材料處理裝置中的第二材料處理裝置624附接到第二製程頭部620。According to some embodiments that can be combined with the embodiments described herein, the device and specifically the process head assembly includes two or more process heads (also referred to as "grouping" or "process grouping"). The two or more process heads can be controlled and / or moved independently of each other. As an example, the process head assembly includes a first process head 610 and a second process head 620. The first deposition device 612 of the one or more deposition devices is attached to the first process head 610, and the second deposition device 622 of the one or more deposition devices is attached to the second process head 620. Likewise, the first material processing device 614 of the one or more material processing devices is attached to the first process head 610, and the second material processing device 624 of the one or more material processing devices is attached to the second Process head 620.

一個或更多個沉積裝置可為成角度的沉積裝置,諸如成角度的刮板或精密刮板。每個成角度的沉積裝置可以被配置為用於僅在一個方向上進行印刷(這不同於先前所描述的金剛石刮板,金剛石刮板是實質上對稱的,並且被配置為用於沿向前和向後兩個方向進行印刷)。為了能夠在兩個方向上執行印刷,製程頭部組件包括在材料處理裝置(例如,第一材料處理裝置614和第二材料處理裝置624)之間的兩個角度沉積裝置(例如,第一沉積裝置612和第二沉積裝置622)。The one or more deposition devices may be angled deposition devices, such as angled scrapers or precision scrapers. Each angled deposition device can be configured for printing in only one direction (this is different from the previously described diamond squeegee, which is substantially symmetrical and is configured for forward And printing in both directions). To be able to perform printing in two directions, the process head assembly includes two angle deposition devices (eg, first deposition) between the material processing device (eg, first material processing device 614 and second material processing device 624) Device 612 and second deposition device 622).

在沿第一方向1執行的沉積製程過程中,可以提升具有第二沉積裝置622和第二材料處理裝置624的第二製程頭部620。換句話說,在沿第一方向1執行的沉積製程過程中,並不使用第二製程頭部620。第一製程頭部610下降,使得第一沉積裝置612接觸絲網154以將材料30傳送到基板(未示出)上。在第一材料處理裝置614與絲網154之間設有一定距離,使得跟隨於第一沉積裝置612的第一材料處理裝置614在絲網154上提供基本上均勻的材料30的薄膜或層。During the deposition process performed in the first direction 1, the second process head 620 having the second deposition device 622 and the second material processing device 624 may be lifted. In other words, during the deposition process performed in the first direction 1, the second process head 620 is not used. The first process head 610 is lowered so that the first deposition device 612 contacts the screen 154 to transfer the material 30 onto a substrate (not shown). A distance is provided between the first material processing device 614 and the wire mesh 154 such that the first material processing device 614 following the first deposition device 612 provides a substantially uniform film or layer of material 30 on the wire mesh 154.

在沿與第一方向1相反的第二方向執行的後續沉積製程過程中,第一製程頭部610升高,並且第二製程頭部620下降。第二沉積裝置622接觸絲網154以將絲網上的材料(即,先前由第一材料處理裝置614提供到基板的薄膜或層)傳送到基板上,所述基板可與先前基板為同一基板(例如,如果執行雙重印刷)或另一/後續基板。During the subsequent deposition process performed in the second direction opposite to the first direction 1, the first process head 610 is raised and the second process head 620 is lowered. The second deposition device 622 contacts the wire mesh 154 to transfer the material on the wire mesh (ie, the film or layer previously provided to the substrate by the first material processing device 614) onto the substrate, which may be the same substrate as the previous substrate (For example, if double printing is performed) or another / subsequent substrate.

雖然在每個製程頭部處示出一個沉積裝置和一個材料處理裝置,但是應當理解,本揭示案不限於此,並且兩個或更多個沉積裝置和/或兩個或更多個材料處理裝置可附接到第一製程頭部610。同樣,兩個或更多個沉積裝置和/或兩個或更多個材料處理裝置可附接到第二製程頭部620。Although one deposition device and one material processing device are shown at the head of each process, it should be understood that the present disclosure is not limited thereto, and two or more deposition devices and / or two or more material processing The device may be attached to the first process head 610. Likewise, two or more deposition devices and / or two or more material processing devices may be attached to the second process head 620.

根據一些實施方式,兩個或更多個製程頭部(例如第一製程頭部610和第二製程頭部620)可以在垂直方向上移動或升降。另外地或替代地,兩個或更多個製程頭部可被配置為移動一個或更多個沉積裝置和/或一個或更多個材料處理裝置,如本文中先前所述的。According to some embodiments, two or more process heads (eg, the first process head 610 and the second process head 620) may move or lift in the vertical direction. Additionally or alternatively, two or more process heads may be configured to move one or more deposition devices and / or one or more material processing devices, as previously described herein.

圖7示出了根據本文所述實施方式的太陽能電池生產設備700的示意圖。FIG. 7 shows a schematic diagram of a solar cell production apparatus 700 according to embodiments described herein.

太陽能電池生產設備700包括一個或更多個沉積站720,以及根據本文所述實施方式的用於將材料網印於用於太陽能電池製造中的基板上的設備725。可將設備725設置在一個或更多個沉積站720中的至少一個沉積站中。The solar cell production apparatus 700 includes one or more deposition stations 720, and an apparatus 725 for screen printing materials on a substrate used in solar cell manufacturing according to embodiments described herein. The apparatus 725 may be provided in at least one of the one or more deposition stations 720.

太陽能電池生產設備700可包括在一個或更多個沉積站720上游和/或下游的一個或更多個其它站。作為一個示例,太陽能電池生產設備700可包括第一檢查站(first inspection station)710,第一檢查站710用於檢查要輸入到一個或更多個沉積站720中的基板。太陽能電池生產設備700可包括乾燥站730,乾燥站730用於乾燥在一個或更多個沉積站720中沉積於基板上的材料。在一些實施方式中,太陽能電池生產設備700可包括第二檢查站740,第二檢查站740用於檢查在一個或更多個沉積站720中沉積於基板上的導電線路圖案。The solar cell production apparatus 700 may include one or more other stations upstream and / or downstream of the one or more deposition stations 720. As one example, the solar cell production apparatus 700 may include a first inspection station 710 for inspecting substrates to be input into one or more deposition stations 720. The solar cell production apparatus 700 may include a drying station 730 for drying materials deposited on the substrate in one or more deposition stations 720. In some embodiments, the solar cell production apparatus 700 may include a second inspection station 740 for inspecting conductive wiring patterns deposited on the substrate in one or more deposition stations 720.

太陽能電池生產設備700,具體地是具有根據本揭示案的設備的一個或更多個沉積站720,可以是用於生產太陽能電池的較大生產系統(諸如串聯(in-line)生產系統)的部分。The solar cell production equipment 700, in particular one or more deposition stations 720 with equipment according to the present disclosure, may be of a larger production system (such as an in-line production system) for producing solar cells section.

圖8示出了根據本文所述實施方式將材料網印於用於太陽能電池製造中的基板上的方法800的流程圖。可根據本文所述實施方式使用用於將材料網印於用於太陽能電池製造中的基板上的設備來實施方法800。8 shows a flowchart of a method 800 of screen printing materials on a substrate used in solar cell manufacturing according to embodiments described herein. Method 800 may be implemented using equipment for screen printing materials on substrates used in solar cell manufacturing according to embodiments described herein.

方法800包括在方塊810中,沿著基板支撐件在第一方向上將具有一個或更多個沉積裝置和一個或更多個材料處理裝置的製程頭部組件至少從第一位置移動到第二位置,以便使用一個或更多個沉積裝置中的至少一個沉積裝置將材料從絲網傳送到基板,並且使用一個或更多個材料處理裝置中的至少一個材料處理裝置執行對絲網上的材料的處理,其中至少在製程頭部組件從第一位置移動到第二位置的過程中執行材料的傳送和處理。在一些實現方式中,方法800包括在方塊820中,在與第一方向相反的第二方向上移動製程頭部組件,以便在沿第二方向的移動過程中執行材料的傳送(諸如印刷)和處理。Method 800 includes, at block 810, moving a process head assembly having one or more deposition devices and one or more material processing devices in a first direction along a substrate support at least from a first position to a second Position so that the material is transferred from the screen to the substrate using at least one of the one or more deposition devices, and the material on the screen is performed using at least one of the one or more material processing devices Processing, wherein at least during the process of moving the head assembly from the first position to the second position, the material transfer and processing are performed. In some implementations, the method 800 includes, at block 820, moving the process head assembly in a second direction opposite to the first direction to perform material transfer (such as printing) during movement in the second direction and deal with.

材料的傳送和處理可在沉積製程的持續時間的至少一部分期間,並且具體地是在沉積製程的基本整個持續時間期間同時執行。一個或更多個材料處理裝置可以例如在絲網上提供基本上均勻的材料薄膜或層。任選地,一個或更多個材料處理裝置可從絲網回收過量的材料。The transfer and processing of the material may be performed simultaneously during at least a portion of the duration of the deposition process, and specifically during substantially the entire duration of the deposition process. One or more material processing devices may provide, for example, a substantially uniform film or layer of material on the wire mesh. Optionally, one or more material handling devices may recover excess material from the wire mesh.

根據本文所述的實施方式,將材料網印於用於太陽能電池製造中的基板上的方法可使用電腦程式、軟體、電腦軟體產品以及相關控制器執行,所述控制器可具有CPU、記憶體、使用者介面,以及與用於將材料沉積於用於太陽能電池製造中的基板上的設備的相應元件通訊的輸入和輸出設備。According to the embodiments described herein, the method of screen printing materials on substrates used in solar cell manufacturing can be performed using computer programs, software, computer software products, and related controllers, which can have a CPU, memory , User interface, and input and output devices that communicate with the corresponding elements of equipment used to deposit materials on substrates used in solar cell manufacturing.

本揭示案使用可移動的製程頭部組件,所述可移動的製程頭部組件被配置為同時執行以下操作:使用沉積裝置在基板上沉積材料和使用材料處理裝置進行材料處理。作為一個示例,可以在製程頭部組件的同一行程期間進行沉積和材料處理。可以減少處理循環的循環時間,並且可以增加設備的生產率和/或生產量。具體地講,可以在絲網上提供一層材料。可使用沉積裝置(可為刮板)將材料從絲網傳送到基板。材料處理裝置可以跟隨沉積裝置,並且在絲網上提供另一層的材料,以便在後續基板上進行沉積。The present disclosure uses a movable process head assembly that is configured to perform the following operations simultaneously: depositing material on a substrate using a deposition device and material processing using a material processing device. As an example, deposition and material processing can be performed during the same stroke of the process head assembly. The cycle time of the processing cycle can be reduced, and the productivity and / or throughput of the equipment can be increased. Specifically, a layer of material can be provided on the silk screen. A deposition device (which can be a squeegee) can be used to transfer the material from the screen to the substrate. The material processing device may follow the deposition device and provide another layer of material on the screen to facilitate deposition on subsequent substrates.

儘管上述內容針對本揭示案的實施方式,但是也可在不脫離本揭示案的基本範圍的情況下設計出本揭示內容的其他和進一步的實施方式,並且本揭示案的範圍由隨附的權利要求書確定。Although the above is directed to the embodiments of the present disclosure, other and further embodiments of the present disclosure can be designed without departing from the basic scope of the present disclosure, and the scope of the present disclosure is determined by the accompanying rights The request is confirmed.

1‧‧‧第一方向1‧‧‧ First direction

2‧‧‧第二方向2‧‧‧Second direction

3‧‧‧水準方向3‧‧‧horizontal direction

4‧‧‧垂直方向4‧‧‧Vertical

5‧‧‧箭頭5‧‧‧arrow

10‧‧‧基板10‧‧‧ substrate

12‧‧‧表面12‧‧‧Surface

20‧‧‧基板支撐件20‧‧‧ substrate support

30‧‧‧材料30‧‧‧Material

100‧‧‧設備100‧‧‧ Equipment

110‧‧‧製程頭部組件110‧‧‧ Process head assembly

120‧‧‧沉積裝置120‧‧‧Deposition device

130‧‧‧材料處理裝置130‧‧‧Material processing device

140‧‧‧製程頭部140‧‧‧ Process head

150‧‧‧絲網裝置150‧‧‧ Wire mesh device

152‧‧‧框架152‧‧‧Frame

154‧‧‧絲網154‧‧‧ Wire mesh

220‧‧‧製程頭部組件220‧‧‧Process head assembly

230‧‧‧第一材料處理裝置230‧‧‧First material processing device

232‧‧‧第二材料處理裝置232‧‧‧Second material processing device

410‧‧‧製程頭部組件410‧‧‧Process head assembly

412‧‧‧第一製程頭部412‧‧‧ First process head

414‧‧‧第二製程頭部414‧‧‧second process head

420‧‧‧製程頭部組件420‧‧‧Process head assembly

422‧‧‧第一製程頭部422‧‧‧ First process head

424‧‧‧第二製程頭部424‧‧‧second process head

510‧‧‧製程頭部組件510‧‧‧Process head assembly

520‧‧‧沉積裝置520‧‧‧Deposition device

522‧‧‧尖端522‧‧‧tip

530‧‧‧第一材料處理裝置530‧‧‧First material processing device

540‧‧‧製程頭部540‧‧‧ Process head

562‧‧‧第一致動器562‧‧‧ First actuator

564‧‧‧第二致動器564‧‧‧Second actuator

610‧‧‧第一製程頭部610‧‧‧ First process head

612‧‧‧第一沉積裝置612‧‧‧First deposition device

614‧‧‧第一材料處理裝置614‧‧‧First material processing device

620‧‧‧第二製程頭部620‧‧‧second process head

622‧‧‧第二沉積裝置622‧‧‧Second deposition device

624‧‧‧第二材料處理裝置624‧‧‧Second material processing device

700‧‧‧太陽能電池生產設備700‧‧‧Solar cell production equipment

710‧‧‧第一檢查站710‧‧‧ First Checkpoint

720‧‧‧沉積站720‧‧‧Deposition Station

725‧‧‧設備725‧‧‧Equipment

730‧‧‧乾燥站730‧‧‧Drying station

740‧‧‧第二檢查站740‧‧‧ Second Checkpoint

800‧‧‧方法800‧‧‧Method

810‧‧‧方塊810‧‧‧box

820‧‧‧方塊820‧‧‧block

A‧‧‧第一位置A‧‧‧ first position

B‧‧‧第二位置B‧‧‧ second position

d‧‧‧差值d‧‧‧Difference

d1‧‧‧第一距離d1‧‧‧first distance

d2‧‧‧第二距離d2‧‧‧second distance

α‧‧‧角度α‧‧‧ angle

因此,為了能夠詳細理解本揭示案的上述特徵,上文所簡要概述的本揭示案的更具體的描述可以參照實施方式進行。附圖涉及本揭示案的各個實施方式,並且描述如下:Therefore, in order to be able to understand the above-mentioned features of the present disclosure in detail, a more specific description of the present disclosure briefly summarized above can be made with reference to the embodiments. The drawings relate to various embodiments of the present disclosure and are described as follows:

圖1示出了根據本文所述實施方式的用於將材料網印於用於太陽能電池製造中的基板上的設備的示意圖;1 shows a schematic diagram of an apparatus for screen printing materials on a substrate used in solar cell manufacturing according to embodiments described herein;

圖2A和圖2B示出了根據本文所述實施方式的用於進行印刷和材料處理的製程頭部組件的示意圖,所述製程頭部組件分別在第一方向上和在第二方向上移動;2A and 2B show schematic diagrams of a process head assembly for printing and material processing according to embodiments described herein, the process head assembly moving in a first direction and in a second direction, respectively;

圖3示出了根據本文所述的另外實施方式的用於將材料網印於用於太陽能電池製造中的基板上的設備的示意圖;3 shows a schematic diagram of an apparatus for screen printing materials on a substrate used in solar cell manufacturing according to further embodiments described herein;

圖4A和圖4B示出了根據本文所述的另外實施方式的用於將材料網印於用於太陽能電池製造中的基板上的設備的製程頭部組件的示意圖;4A and 4B show schematic views of a process head assembly of an apparatus for screen printing a material on a substrate used in solar cell manufacturing according to further embodiments described herein;

圖5示出了根據本文所述的另外實施方式的用於將材料網印於用於太陽能電池製造中的基板上的設備的製程頭部組件的示意圖;5 shows a schematic view of a process head assembly of an apparatus for screen printing materials on a substrate used in solar cell manufacturing according to further embodiments described herein;

圖6示出了根據本文所述的另外實施方式的用於將材料網印於用於太陽能電池製造中的基板上的設備的示意圖;6 shows a schematic diagram of an apparatus for screen printing a material on a substrate used in solar cell manufacturing according to further embodiments described herein;

圖7示出了根據本文所述實施方式的太陽能電池生產設備的示意圖;以及7 shows a schematic diagram of a solar cell production facility according to embodiments described herein; and

圖8示出了根據本文所述的另外實施方式的用於將材料網印於用於太陽能電池製造中的基板上的方法的流程圖。8 shows a flowchart of a method for screen printing a material on a substrate used in solar cell manufacturing according to further embodiments described herein.

國內寄存資訊 (請依寄存機構、日期、號碼順序註記) 無Domestic hosting information (please note in order of hosting institution, date, and number) None

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Claims (20)

一種用於將一材料網印於用於一太陽能電池製造中的一基板上的設備,該設備包括: 一製程頭部組件,該製程頭部組件包括:一個或更多個沉積裝置,該一個或更多個沉積裝置被配置為用於將該材料從一絲網傳送到該基板;和一個或更多個材料處理裝置,該一個或更多個材料處理裝置被配置為用於處理該絲網上的該材料;一驅動裝置,該驅動裝置被配置為用於沿著一基板支撐件在一第一方向上移動該製程頭部組件,以便在一沉積製程過程中傳送和處理該材料。An apparatus for screen printing a material on a substrate used in the manufacture of a solar cell, the apparatus includes: a process head assembly, the process head assembly includes: one or more deposition devices, the one Or more deposition devices configured to transfer the material from a screen to the substrate; and one or more material processing devices configured to process the screen The material on the top; a driving device configured to move the process head assembly in a first direction along a substrate support to transport and process the material during a deposition process. 如請求項1所述的設備,其中該絲網設置在該基板支撐件與該製程頭部組件之間,其中該一個或更多個沉積裝置包括一刮板,並且其中該刮板被配置為與該絲網接觸以進行印刷。The apparatus of claim 1, wherein the screen is disposed between the substrate support and the process head assembly, wherein the one or more deposition devices include a scraper, and wherein the scraper is configured as Contact with this screen for printing. 如請求項1或2所述的設備,其中該一個或更多個材料處理裝置至少包括一第一材料處理裝置和一第二材料處理裝置,其中該一個或更多個沉積裝置中的至少一個沉積裝置定位在該第一材料處理裝置與該第二材料處理裝置之間。The apparatus according to claim 1 or 2, wherein the one or more material processing devices include at least a first material processing device and a second material processing device, wherein at least one of the one or more deposition devices The deposition device is positioned between the first material processing device and the second material processing device. 如請求項1或2所述的設備,進一步包括一個或更多個第一致動器,該一個或更多個第一致動器被配置為調整該一個或更多個材料處理裝置中的至少一個材料處理裝置與該絲網之間的距離。The apparatus according to claim 1 or 2, further comprising one or more first actuators, the one or more first actuators configured to adjust the The distance between at least one material handling device and the wire mesh. 如請求項4所述的設備,其中該一個或更多個第一致動器包括一第一致動器單元和一第二致動器單元,該第一致動器單元被配置為調整該第一材料處理裝置與該絲網之間的一第一距離,該第二致動器單元被配置為調整該第二材料處理裝置與該絲網之間的一第二距離。The apparatus of claim 4, wherein the one or more first actuators include a first actuator unit and a second actuator unit, the first actuator unit is configured to adjust the A first distance between the first material processing device and the wire mesh, the second actuator unit is configured to adjust a second distance between the second material processing device and the wire mesh. 如請求項1或2所述的設備,其中該材料處理可被稱為覆墨。The apparatus according to claim 1 or 2, wherein the material processing may be referred to as ink coating. 如請求項1或2所述的設備, 其中該製程頭部組件包括一第一製程頭部和一第二製程頭部,其中該一個或更多個沉積裝置中的至少一個沉積裝置附接到該第一製程頭部,並且該一個或更多個材料處理裝置中的至少一個材料處理裝置附接到該第二製程頭部,或者其中該製程頭部組件包括一製程頭部,其中該一個或更多個沉積裝置中的至少一個沉積裝置和該一個或更多個材料處理裝置中的至少一個材料處理裝置附接到該製程頭部。The apparatus of claim 1 or 2, wherein the process head assembly includes a first process head and a second process head, wherein at least one of the one or more deposition devices is attached to The first process head, and at least one of the one or more material processing devices is attached to the second process head, or wherein the process head assembly includes a process head, wherein the one At least one of the one or more deposition devices and at least one of the one or more material processing devices are attached to the process head. 一種太陽能電池生產設備,該太陽能電池生產設備包括: 一個或更多個沉積站, 如請求項1至2中之一項所述的設備,該設備在該一個或更多個沉積站中的至少一個沉積站中。A solar cell production facility, the solar cell production facility comprising: one or more deposition stations, the device as described in one of claims 1 to 2, the device being in at least one of the one or more deposition stations In a deposition station. 一種用於將一材料網印於用於一太陽能電池製造中的一基板上的方法,該方法包括以下步驟: 沿著一基板支撐件在一第一方向上將具有一個或更多個沉積裝置和一個或更多個材料處理裝置的一製程頭部組件至少從一第一位置移動到一第二位置,以便使用該等一個或更多個沉積裝置中的至少一個沉積裝置將該材料從一絲網傳送到該基板並且使用該等一個或更多個材料處理裝置中的至少一個材料處理裝置執行對該絲網上的該材料的處理,其中該傳送和該處理在該製程頭部組件從該第一位置移動到該第二位置過程中執行。A method for screen printing a material on a substrate used in the manufacture of a solar cell, the method comprising the following steps: There will be one or more deposition devices in a first direction along a substrate support And a process head assembly of one or more material processing devices moves from at least a first position to a second position to use at least one of the one or more deposition devices to remove the material from a thread The web is transferred to the substrate and at least one of the one or more material processing devices is used to perform processing of the material on the screen, wherein the transfer and the processing are performed at the process head assembly from the It is executed during the movement of the first position to the second position. 如請求項9所述的方法,其中在一沉積製程的持續時間的至少一部分期間同時執行該材料的傳送和處理。The method of claim 9, wherein the transfer and processing of the material are performed simultaneously during at least a portion of the duration of a deposition process. 如請求項9或10所述的方法,其中該等一個或更多個材料處理裝置被配置為用於在該絲網上提供該材料的基本上均勻薄膜。The method of claim 9 or 10, wherein the one or more material processing devices are configured to provide a substantially uniform film of the material on the screen. 如請求項9或10所述的方法,進一步包括以下步驟: 在與該第一方向相反的一第二方向上移動該製程頭部組件,以便在沿該第二方向的移動過程中執行所述材料的傳送和處理。The method according to claim 9 or 10, further comprising the steps of: moving the process head assembly in a second direction opposite to the first direction, so as to perform the process during the movement in the second direction Material transfer and handling. 如請求項9所述的方法,其中沿著該第一方向移動該製程頭部組件使用該等一個或更多個材料處理裝置中的一第一材料處理裝置。The method of claim 9, wherein moving the process head assembly along the first direction uses a first material processing device of the one or more material processing devices. 如請求項13所述的方法,其中沿著該第二方向移動該製程頭部組件使用該等一個或更多個材料處理裝置中的一第二材料處理裝置。The method of claim 13, wherein moving the process head assembly along the second direction uses a second material processing device of the one or more material processing devices. 如請求項13所述的方法,其中當該製程頭部組件在該第一方向上移動時,該第一材料處理裝置被定位在該一個或更多個沉積裝置後方。The method of claim 13, wherein when the process head assembly is moved in the first direction, the first material processing device is positioned behind the one or more deposition devices. 如請求項14所述的方法,其中當該製程頭部組件在該第二方向上移動時,該第二材料處理裝置被定位在該一個或更多個沉積裝置後方。The method of claim 14, wherein when the process head assembly is moved in the second direction, the second material processing device is positioned behind the one or more deposition devices. 如請求項13或16中任一項所述的方法,其中在該製程頭部組件在該第一方向上的移動過程中,該絲網與該第一材料處理裝置之間的一距離小於該絲網與該第二材料處理裝置之間的一距離,並且其中在該製程頭部組件在該第二方向上的移動過程中,該絲網與該第二材料處理裝置之間的一距離小於該絲網與該第一材料處理裝置之間的一距離。The method according to any one of claims 13 or 16, wherein during the movement of the process head assembly in the first direction, a distance between the screen and the first material processing device is less than the A distance between the wire mesh and the second material processing device, and wherein during the movement of the process head assembly in the second direction, a distance between the wire mesh and the second material processing device is less than A distance between the screen and the first material processing device. 如請求項9或10所述的方法,進一步包括以下步驟: 調整該等一個或更多個材料處理裝置中的至少一個材料處理裝置的一個或更多個處理參數,其中該等一個或更多個處理參數選自由以下項組成的組: 該至少一個材料處理裝置與該絲網和該基板支撐件中的至少一個之間的一距離;以及 該至少一個材料處理裝置相對於該絲網和該基板支撐件中的至少一個的一角度。The method according to claim 9 or 10, further comprising the steps of: adjusting one or more processing parameters of at least one material processing device of the one or more material processing devices, wherein the one or more The processing parameters are selected from the group consisting of: a distance between the at least one material processing device and at least one of the screen and the substrate support; and the at least one material processing device relative to the screen and the An angle of at least one of the substrate supports. 如請求項9或10中任一項所述的方法,進一步包括以下步驟: 調整該等一個或更多個沉積裝置中的至少一個沉積裝置的一個或更多個沉積參數,其中該等一個或更多個沉積參數選自由以下項組成的組: 該至少一個沉積裝置與該基板支撐件之間的一距離; 該至少一個沉積裝置相對於該基板支撐件的一角度; 該製程頭部組件相對於該基板支撐件的一移動速度;以及該至少一個沉積裝置作用於該絲網上的一壓力。The method according to any one of claims 9 or 10, further comprising the steps of: adjusting one or more deposition parameters of at least one of the one or more deposition devices, wherein the one or More deposition parameters are selected from the group consisting of: a distance between the at least one deposition device and the substrate support; an angle of the at least one deposition device relative to the substrate support; the process head assembly A moving speed of the substrate support; and a pressure acting on the screen by the at least one deposition device. 如請求項18所述的方法,其中應用以下至少一個: 該等一個或更多個處理參數中的至少一個處理參數在該材料處理過程中進行調整,以及該等一個或更多個沉積參數中的至少一個沉積參數在該傳送過程中進行調整。The method of claim 18, wherein at least one of the following is applied: at least one of the one or more processing parameters is adjusted during the material processing, and the one or more deposition parameters At least one of the deposition parameters is adjusted during the transfer process.
TW107114215A 2017-04-28 2018-04-26 Apparatus for screen printing of a material on a substrate used in the manufacture of a solar cell, solar cell production apparatus, and method for screen printing of a material on a substrate used in the manufacture of a solar cell TW201840014A (en)

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PCT/EP2017/060236 WO2018197005A1 (en) 2017-04-28 2017-04-28 Apparatus for screen printing of a material on a substrate used in the manufacture of a solar cell, solar cell production apparatus, and method for screen printing of a material on a substrate used in the manufacture of a solar cell
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