TW201826897A - Method of manufacturing circuit board - Google Patents

Method of manufacturing circuit board Download PDF

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Publication number
TW201826897A
TW201826897A TW106130440A TW106130440A TW201826897A TW 201826897 A TW201826897 A TW 201826897A TW 106130440 A TW106130440 A TW 106130440A TW 106130440 A TW106130440 A TW 106130440A TW 201826897 A TW201826897 A TW 201826897A
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Taiwan
Prior art keywords
insulating layer
base insulating
circuit pattern
metal
layer
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TW106130440A
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Chinese (zh)
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TWI732039B (en
Inventor
陳曄
法蘭克 魏
內保貴
川瀨雅之
李勸商
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日商迪思科股份有限公司
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    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/0011Working of insulating substrates or insulating layers
    • H05K3/0044Mechanical working of the substrate, e.g. drilling or punching
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/02Apparatus or processes for manufacturing printed circuits in which the conductive material is applied to the surface of the insulating support and is thereafter removed from such areas of the surface which are not intended for current conducting or shielding
    • H05K3/04Apparatus or processes for manufacturing printed circuits in which the conductive material is applied to the surface of the insulating support and is thereafter removed from such areas of the surface which are not intended for current conducting or shielding the conductive material being removed mechanically, e.g. by punching
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/22Secondary treatment of printed circuits
    • H05K3/24Reinforcing the conductive pattern
    • H05K3/241Reinforcing the conductive pattern characterised by the electroplating method; means therefor, e.g. baths or apparatus
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/22Secondary treatment of printed circuits
    • H05K3/26Cleaning or polishing of the conductive pattern

Abstract

The present invention is to provide a wiring board with a higher flatness, capable of more satisfactorily performing connection with an electrode of a mounted component. A method for manufacturing a wiring board comprises: a base insulating layer forming step of forming a base insulating layer on a rear surface of a core board; a rear surface smoothing step of smoothing a surface of the base insulating layer of the rear surface by shaving the same with a bite tool or a grindstone; a groove forming step of forming a groove to serve as a circuit pattern on the base insulating layer by a laser beam or photo-etching; a metal thin film forming step of forming a metal thin film on the base insulating layer by means of sputtering or the like; a metal coating step of coating a surface of the base insulating layer with metal by a plating process, using the metal thin film as an electrode; and a circuit pattern layer forming step of forming a flat circuit pattern layer having an exposed metal circuit pattern by shaving the metal and the base insulating layer with the bite tool until the base insulating layer reaches a predetermined finish thickness.

Description

配線基板的製造方法Manufacturing method of wiring board

發明領域 本發明是有關於一種配線基板的製造方法。FIELD OF THE INVENTION The present invention relates to a method for manufacturing a wiring board.

發明背景 以往,已知有一種關於配線基板的技術,其具有組裝並搭載半導體晶片或各種電子零件,並確保這些電極和其他零件之導通的中介層(interposer)或印刷配線基板這樣的再配線層。例如,於專利文獻1中已揭示有一種在芯材基板的正面、背面將導體層和有機絕緣層交互地堆疊上去之堆積(build up)方式的印刷配線板。BACKGROUND OF THE INVENTION Conventionally, a technology related to a wiring board is known, which has an interposer or a redistribution layer such as a printed wiring board that assembles and mounts a semiconductor wafer or various electronic parts and ensures the conduction of these electrodes and other parts. . For example, Patent Document 1 discloses a build-up printed wiring board in which a conductive layer and an organic insulating layer are alternately stacked on a front surface and a back surface of a core substrate.

又,專利文獻2中已揭示有一種印刷配線板,其是在設置使樹脂含浸於補強材而成之第1絕緣層,並且以第1絕緣層補強芯材基板之後,積層未含有補強材之複數層第2絕緣層。該印刷配線板,是藉由在芯材基板及第1絕緣層中包含補強材、將第1絕緣層的厚度作成比各第2絕緣層的厚度更厚,以抑制在對印刷配線板施加熱歷程的情形下產生翹曲的狀況。 先前技術文獻 專利文獻In addition, Patent Document 2 discloses a printed wiring board in which a first insulating layer formed by impregnating a resin with a reinforcing material is provided, and a core material substrate is reinforced with the first insulating layer, and a layer containing no reinforcing material is laminated. A plurality of second insulating layers. In this printed wiring board, a reinforcing material is included in the core substrate and the first insulating layer, and the thickness of the first insulating layer is made thicker than the thickness of each of the second insulating layers to prevent heat from being applied to the printed wiring board. In the case of history, warping occurs. Prior Art Literature Patent Literature

專利文獻1:日本專利特開2001-196743號公報 專利文獻2:日本專利特開2013-80823號公報Patent Document 1: Japanese Patent Laid-Open No. 2001-196743 Patent Document 2: Japanese Patent Laid-Open No. 2013-80823

發明概要 發明欲解決之課題 在上述專利文獻1、2所記載之搭載於配線基板上的半導體晶片或各種電子零件,正持續進行輕薄短小化,與配線板之電極連接的電極墊也會變小。因此,當配線基板翹曲或不平坦時,會無法將搭載的半導體晶片或各種電子零件的電極與配線基板的電極良好地連接,而成為動作不良之要因。如上述,專利文獻2所記載的印刷配線板,雖然能夠抑制在施加熱歷程時產生翹曲的狀況,但是只抑制由熱歷程形成的變形,恐有在芯材基板原本就翹曲或並非平坦的情況下,無法將配線基板平坦地形成之疑慮。SUMMARY OF THE INVENTION The problem to be solved by the invention is that the semiconductor wafer or various electronic components mounted on a wiring board described in the above-mentioned Patent Documents 1 and 2 are continuously thinned and shortened, and the electrode pads connected to the electrodes of the wiring board are also reduced. . Therefore, when the wiring substrate is warped or uneven, the electrodes of the mounted semiconductor wafer or various electronic components cannot be well connected to the electrodes of the wiring substrate, and this causes a malfunction. As described above, although the printed wiring board described in Patent Document 2 can suppress the occurrence of warpage when a thermal history is applied, only the deformation caused by the thermal history can be suppressed, and the core substrate may be warped or not flat originally. In the case of this, there is a concern that the wiring substrate cannot be formed flat.

本發明是有鑒於上述而作成的發明,其目的在於提供一種配線基板,其為可做到更良好地進行與搭載之零件的電極的連接之平坦度更高的配線基板。 用以解決課題之手段The present invention has been made in view of the above, and an object of the present invention is to provide a wiring board which is a wiring board with a higher flatness that enables better connection with electrodes of mounted components. Means to solve the problem

為了解決上述之課題,並達成目的,本發明是在正面、背面具備再配線層之配線基板的製造方法,其特徵在於具備: 基底絕緣層形成步驟,在成為芯材之基板的正面、背面形成樹脂的基底絕緣層; 正面背面平坦化步驟,以刀具工具或磨削磨石對正面、背面之該基底絕緣層的表面進行削取平坦化; 溝形成步驟,藉由雷射光線或光蝕刻而在該基底絕緣層上形成成為電路圖案之溝; 金屬被覆步驟,在該溝形成步驟之後,於該基底絕緣層的表面被覆金屬;及 電路圖案層形成步驟,以刀具工具削取該金屬及該基底絕緣層直到該基底絕緣層達到規定之成品厚度為止,以形成該金屬的該電路圖案露出之平坦的電路圖案層, 藉由該正面背面平坦化步驟及該電路圖案層形成步驟以形成平坦的配線基板。In order to solve the above-mentioned problems and achieve the object, the present invention is a method for manufacturing a wiring board having a redistribution layer on the front and back sides, and is characterized by comprising: a step of forming a base insulating layer, Resin base insulating layer; front and back flattening step, cutting and planarizing the front and back surface of the base insulating layer with a tool or a grinding stone; groove forming step, by laser light or photo etching Forming a groove that becomes a circuit pattern on the base insulating layer; a metal coating step; after the groove forming step, covering the surface of the base insulating layer with a metal; and a circuit pattern layer forming step that uses a cutter tool to cut the metal and the The base insulating layer is formed until the base insulating layer reaches a predetermined finished thickness to form a flat circuit pattern layer on which the circuit pattern of the metal is exposed. The front and back planarization steps and the circuit pattern layer forming step are used to form a flat layer. Wiring board.

又,較理想的是,在該溝形成步驟之後且於該金屬被覆步驟之前,在該基底絕緣層的表面被覆金屬薄膜,並且將該金屬薄膜作為以鍍敷處理來將該金屬被覆在該基底絕緣層之表面時的電極。Further, it is preferable that a metal thin film is coated on the surface of the base insulating layer after the trench forming step and before the metal coating step, and the metal thin film is coated with the metal on the substrate as a plating treatment. An electrode on the surface of an insulating layer.

又,較理想的是,在該電路圖案層之上更進一步積層並形成該電路圖案層。 發明效果It is also preferable that the circuit pattern layer is further laminated and formed on the circuit pattern layer. Invention effect

在本發明的配線基板的製造方法中,是將形成在成為芯材之基板的正面側及背面側之雙方上的基底絕緣層進行平坦化。其結果為,即使假定芯材基板本身翹曲、或者基板的表面上具有凹凸,仍然能夠在之後將成為電路圖案層之基底絕緣層的表面平坦地形成。又,由於是藉由將被覆在基底絕緣層上之金屬和基底絕緣層一起削取,來形成電路圖案露出之電路圖案層,所以能夠將電路圖案層的表面更平坦地形成。從而,依據本實施形態的配線基板的製造方法,變得可得到可更良好地進行與搭載之零件的電極的連接之平坦度更高的配線基板。In the method of manufacturing a wiring substrate of the present invention, the base insulating layer formed on both the front side and the back side of the substrate serving as the core material is planarized. As a result, even if the core material substrate itself is warped or the surface of the substrate has unevenness, it is possible to form the surface of the underlying insulating layer that will become the circuit pattern layer flat later. In addition, since the metal covered on the base insulating layer and the base insulating layer are cut together to form a circuit pattern layer with the exposed circuit pattern, the surface of the circuit pattern layer can be formed more flatly. Therefore, according to the method for manufacturing a wiring board according to this embodiment, it is possible to obtain a wiring board with a higher flatness, which can better connect with the electrodes of the mounted components.

用以實施發明之形態 針對用於實施本發明之形態(實施形態),參照圖式作更詳細之說明。本發明並不因以下的實施形態所記載之內容而受到限定。又,在以下所記載之構成要素中,包含所屬技術領域中具有通常知識者可輕易設想得到之事物或實質上相同之事物。此外,以下所記載之構成是可以適當組合的。又,在不脫離本發明之要旨的範圍內,可進行各種構成之省略、置換或變更。Embodiments for Implementing the Invention Embodiments (embodiments) for implementing the invention will be described in more detail with reference to the drawings. The present invention is not limited by the contents described in the following embodiments. In addition, the constituent elements described below include things that can be easily conceived by a person having ordinary knowledge in the technical field or substantially the same. In addition, the structures described below can be appropriately combined. Moreover, various structures can be omitted, replaced, or changed without departing from the gist of the present invention.

根據圖式來說明本發明之實施形態的配線基板的製造方法。圖1是顯示藉由實施形態之配線基板的製造方法所製造的配線基板的截面圖。圖1所示之配線基板1,是具有組裝並搭載半導體晶片或各種電機零件,並確保這些電極和其他零件之導通的中介層或印刷配線基板這樣的再配線層的配線基板。在本實施形態中,配線基板1是搭載半導體晶片並連接於印刷配線基板,且按照已預先設定之圖案來連接半導體晶片之電極與印刷配線基板的配線圖案的中介層。如圖1所示,配線基板1具備成為芯材之芯材基板10、及形成於芯材基板10的正面10a及背面10b之雙方的再配線層即電路圖案層20。A method for manufacturing a wiring board according to an embodiment of the present invention will be described with reference to the drawings. FIG. 1 is a cross-sectional view showing a wiring substrate manufactured by a wiring substrate manufacturing method according to an embodiment. The wiring board 1 shown in FIG. 1 is a wiring board having an interposer or a rewiring layer such as a printed wiring board that assembles and mounts a semiconductor wafer or various motor parts and ensures conduction between these electrodes and other parts. In the present embodiment, the wiring substrate 1 is an interposer that mounts a semiconductor wafer and is connected to a printed wiring substrate, and connects an electrode of the semiconductor wafer and a wiring pattern of the printed wiring substrate according to a preset pattern. As shown in FIG. 1, the wiring substrate 1 includes a core material substrate 10 serving as a core material, and a circuit pattern layer 20 as a rewiring layer formed on both the front surface 10 a and the back surface 10 b of the core material substrate 10.

芯材基板10是例如以玻璃環氧(glass epoxy)樹脂或陶瓷、玻璃等所形成之絕緣性(非導電性)的基板。芯材基板10的厚度為例如50μm左右。在本實施形態中,芯材基板10是如圖1所示,於背面10b側(圖中下側)彎曲成描繪凸型的形狀。再者,包含圖1在內,以下說明的圖式中,為了說明芯材基板10為彎曲的情形,因此記載得比實際於芯材基板10產生的彎曲程度更大。The core substrate 10 is an insulating (non-conductive) substrate formed of, for example, glass epoxy resin, ceramic, glass, or the like. The thickness of the core substrate 10 is, for example, about 50 μm. In this embodiment, as shown in FIG. 1, the core material substrate 10 is bent on the back surface 10 b side (lower side in the figure) to form a convex shape. In addition, in the drawings described below including FIG. 1, in order to explain the case where the core material substrate 10 is bent, it is described that the degree of bending caused by the core material substrate 10 is greater.

電路圖案層20具有形成在芯材基板10的正面10a上及背面10b上的第1電路圖案層21、形成在第1電路圖案層21上的第2電路圖案層22、及形成在第2電路圖案層22上的第3電路圖案層23。再者,電路圖案層20,只要在芯材基板10上至少形成有1層即可,形成4層以上亦可。The circuit pattern layer 20 includes a first circuit pattern layer 21 formed on the front surface 10 a and a back surface 10 b of the core substrate 10, a second circuit pattern layer 22 formed on the first circuit pattern layer 21, and a second circuit. The third circuit pattern layer 23 on the pattern layer 22. The circuit pattern layer 20 may be formed on the core substrate 10 at least one layer, and may be formed in four or more layers.

第1電路圖案層21具有絕緣性的基底絕緣層21a、及埋入基底絕緣層21a內之作為電極電路的複數個電路圖案21b。第2電路圖案層22具有絕緣性的基底絕緣層22a、及埋入基底絕緣層22a內之作為電極電路的複數個電路圖案22b。第3電路圖案層23具有絕緣性的基底絕緣層23a、及埋入基底絕緣層23a內之作為電極電路的複數個電路圖案23b。The first circuit pattern layer 21 has an insulating base insulating layer 21a and a plurality of circuit patterns 21b as electrode circuits embedded in the base insulating layer 21a. The second circuit pattern layer 22 includes an insulating base insulating layer 22 a and a plurality of circuit patterns 22 b as electrode circuits embedded in the base insulating layer 22 a. The third circuit pattern layer 23 has an insulating base insulating layer 23a and a plurality of circuit patterns 23b as electrode circuits embedded in the base insulating layer 23a.

基底絕緣層21a、22a、23a是包含樹脂材的乾膜(dry film)式的層間絕緣材料,並且使用味之素Fine-Techo株式會社製的味之素堆積膜(build up film,以下稱為「ABF」)而形成。在本實施形態中,基底絕緣層21a、22a、23a雖然是以ABF所構成,但是構成基底絕緣層21a、22a、23a之材料並不限定於ABF。基底絕緣層21a、22a、23a是在各電路圖案層20內將相鄰的電路圖案21b、22b、23b彼此絕緣,並且將各電路圖案層20間的電路圖案21b、22b、23b彼此絕緣。基底絕緣層21a、22a、23a的厚度是例如40μm左右。The base insulating layers 21a, 22a, and 23a are dry film-type interlayer insulating materials including a resin material, and an Ajinomoto Fine-Techo Co., Ltd. build-up film (hereinafter referred to as a build-up film) is used. "ABF"). In this embodiment, although the base insulating layers 21a, 22a, and 23a are made of ABF, the materials constituting the base insulating layers 21a, 22a, and 23a are not limited to ABF. The base insulating layers 21a, 22a, and 23a insulate adjacent circuit patterns 21b, 22b, and 23b from each other in each circuit pattern layer 20, and insulate circuit patterns 21b, 22b, and 23b between each circuit pattern layer 20. The thickness of the base insulating layers 21a, 22a, and 23a is, for example, about 40 μm.

各電路圖案21b、22b、23b是以例如銅等的金屬所形成。各電路圖案21b、22b、23b的高度(電路圖案層的積層方向之高度)是例如15μm~20μm左右。如圖1所示,各電路圖案21b、22b、23b是在規定位置進行電連接。位於最外層的第3電路圖案層23的電路圖案23b是露出於配線基板1的外側。露出於配線基板1的外側的電路圖案23b,是連接於半導體晶片的電極或印刷配線基板的配線圖案之電路圖案。又,配線基板1具有將芯材基板10從正面10a貫通至背面10b,並且連接於電路圖案層20的貫通電極。配線基板1是將露出於配線基板1的外側的電路圖案23b連接於半導體晶片的電極或印刷配線基板的配線圖案,且藉由將各電路圖案層20的電路圖案21b、22b、23b彼此在規定位置進行電連接,以將半導體晶片的電極與印刷配線基板的配線圖案依照預先設定的圖案進行電連接。Each of the circuit patterns 21b, 22b, and 23b is formed of a metal such as copper. The height of each of the circuit patterns 21b, 22b, and 23b (the height in the lamination direction of the circuit pattern layer) is, for example, about 15 μm to 20 μm. As shown in FIG. 1, each of the circuit patterns 21b, 22b, and 23b is electrically connected at a predetermined position. The circuit pattern 23 b of the third circuit pattern layer 23 located at the outermost layer is exposed outside the wiring substrate 1. The circuit pattern 23b exposed on the outside of the wiring substrate 1 is a circuit pattern of an electrode connected to a semiconductor wafer or a wiring pattern of a printed wiring substrate. The wiring substrate 1 includes a through electrode that penetrates the core substrate 10 from the front surface 10 a to the back surface 10 b and is connected to the circuit pattern layer 20. The wiring substrate 1 is a wiring pattern in which a circuit pattern 23b exposed on the outside of the wiring substrate 1 is connected to an electrode of a semiconductor wafer or a printed wiring substrate, and the circuit patterns 21b, 22b, and 23b of each circuit pattern layer 20 are defined with each other. The electrodes are electrically connected at positions to electrically connect the electrodes of the semiconductor wafer and the wiring pattern of the printed wiring board according to a preset pattern.

接著,說明實施形態之配線基板的製造方法。圖2是顯示作為實施形態之配線基板的製造方法之流程的一部分,而形成各電路圖案層的處理順序的流程圖。如圖2所示,實施形態之配線基板的製造方法具備:基底絕緣層形成步驟ST1、正面背面平坦化步驟ST2、溝形成步驟ST3、金屬薄膜形成步驟ST4、金屬被覆步驟ST5、及電路圖案層形成步驟ST6。配線基板1是藉由重覆實施圖2所示之處理,而積層並形成第1電路圖案層21、第2電路圖案層22、及第3電路圖案層23。以下,與形成於芯材基板10上之第1電路圖案層21的情形為例,根據圖式來說明各電路圖案層的形成順序。Next, a method for manufacturing a wiring board according to an embodiment will be described. FIG. 2 is a flowchart showing a processing procedure for forming each circuit pattern layer as part of a flow of a method for manufacturing a wiring substrate according to an embodiment. As shown in FIG. 2, the method for manufacturing a wiring substrate according to the embodiment includes a base insulating layer forming step ST1, a front and back planarization step ST2, a groove forming step ST3, a metal thin film forming step ST4, a metal coating step ST5, and a circuit pattern layer. Forming step ST6. The wiring substrate 1 is formed by laminating and forming the first circuit pattern layer 21, the second circuit pattern layer 22, and the third circuit pattern layer 23 by repeatedly performing the processing shown in FIG. 2. Hereinafter, with reference to the case where the first circuit pattern layer 21 is formed on the core substrate 10 as an example, the formation order of each circuit pattern layer will be described with reference to the drawings.

圖3是顯示藉由基底絕緣層形成步驟ST1而形成有基底絕緣層21a的芯材基板10的說明圖;圖4是顯示在正面背面平坦化步驟ST2中對基底絕緣層21a之表面進行平坦化之情形的說明圖;圖5是顯示在正面背面平坦化步驟ST2中對基底絕緣層21a之表面進行平坦化之情形的其他例子的說明圖;圖6是顯示已將基底絕緣層21a平坦化之芯材基板10的說明圖;圖7是顯示在溝形成步驟ST3中於基底絕緣層21a的表面形成複數條溝R之情形的說明圖;圖8是顯示藉由金屬薄膜形成步驟ST4而在基底絕緣層21a的表面形成有金屬薄膜21c之芯材基板10的說明圖;圖9是顯示藉由金屬被覆步驟ST5而在基底絕緣層21a上被覆有金屬M之芯材基板10的說明圖;圖10是顯示在電路圖案層形成步驟ST6中切削金屬M及基底絕緣層21a的一部分之情形的說明圖;圖11是顯示已形成有第1電路圖案層21之芯材基板10的說明圖。FIG. 3 is an explanatory diagram showing the core substrate 10 on which the base insulating layer 21a is formed in the base insulating layer forming step ST1; FIG. 4 is a view showing flattening the surface of the base insulating layer 21a in the front and back planarization step ST2. FIG. 5 is an explanatory diagram showing another example of a case where the surface of the base insulating layer 21a is flattened in the front-back planarization step ST2; FIG. 6 is a view showing the base insulating layer 21a has been flattened An explanatory diagram of the core substrate 10; FIG. 7 is an explanatory diagram showing a case where a plurality of grooves R are formed on the surface of the base insulating layer 21a in the groove forming step ST3; FIG. 9 is an explanatory view showing a core material substrate 10 coated with a metal M on a base insulating layer 21a by a metal coating step ST5; FIG. 9 is an explanatory view showing a core material substrate 10 with a metal thin film 21c formed on a surface of the insulating layer 21a; 10 is an explanatory diagram showing a situation where the metal M and a part of the base insulating layer 21a are cut in the circuit pattern layer forming step ST6. FIG. 11 is an explanatory diagram showing the core material substrate 10 on which the first circuit pattern layer 21 has been formed.

基底絕緣層形成步驟ST1是在芯材基板10的正面10a及背面10b形成基底絕緣層21a的步驟。在基底絕緣層形成步驟ST1中,如圖3所示,是藉由加熱壓接等將味之素Fine-Techo株式會社製的ABF固定在芯材基板10的正面10a及背面10b之雙方。此時,本實施形態的芯材基板10,會由於在背面10b側(圖中下側)彎曲成描繪凸形狀,而如圖3所示,使固定在芯材基板10的正面10a及背面10b的基底絕緣層21a之與芯材基板10為相反側的表面211a也配合芯材基板10的形狀而彎曲。The base insulating layer forming step ST1 is a step of forming a base insulating layer 21 a on the front surface 10 a and the back surface 10 b of the core substrate 10. In the base insulating layer forming step ST1, as shown in FIG. 3, ABF manufactured by Ajinomoto Fine-Techo Co., Ltd. is fixed to both the front surface 10a and the back surface 10b of the core substrate 10 by thermal compression bonding or the like. At this time, the core material substrate 10 of this embodiment is bent to a convex shape on the back surface 10b side (lower side in the figure), and as shown in FIG. 3, the front material 10a and the back surface 10b of the core material substrate 10 are fixed. The surface 211 a of the base insulating layer 21 a opposite to the core material substrate 10 is also bent in accordance with the shape of the core material substrate 10.

正面背面平坦化步驟ST2,是以刀具工具31對形成於芯材基板10的正面10a及背面10b之基底絕緣層21a的表面211a進行削取平坦化的步驟。在正面背面平坦化步驟ST2中,如圖4所示,是將芯材基板10的正面10a及背面10b的其中一側的基底絕緣層21a吸引保持在刀具切削裝置30之具有由金屬製的銷吸盤(pin chuck)等所形成之保持面32a的工作夾台32上。然後,使刀具切削裝置30的刀具輪33旋轉,藉由圖未示之移動機構使刀具輪33朝圖中下方向移動,並且使刀具工具31和工作夾台32在與保持面32a平行方向上相對移動,以藉由刀具工具31切削基底絕緣層21a的表面211a來進行平坦化。接著,將芯材基板10的正面10a及背面10b的另一側的基底絕緣層21a吸引保持在工作夾台32上,並藉由刀具工具31同樣地切削一側的基底絕緣層21a的表面211a來進行平坦化。藉此,如圖6所示,可以將芯材基板10的正面10a側及背面10b側之雙方的基底絕緣層21a的表面平坦地形成。再者,在正面背面平坦化步驟ST2中,也可以將黏著膠帶等的保護構件貼附在被吸引保持在工作夾台31之側的基底絕緣層21a的表面上。The front and back planarization step ST2 is a step of cutting and planarizing the surface 211 a of the base insulating layer 21 a formed on the front surface 10 a and the back surface 10 b of the core substrate 10 with the tool 31. In the front and back planarization step ST2, as shown in FIG. 4, the base insulating layer 21a on one of the front surface 10a and the back surface 10b of the core substrate 10 is attracted and held on the tool cutting device 30 and has a pin made of metal. On the work clamp 32 of the holding surface 32a formed by a pin chuck or the like. Then, the cutter wheel 33 of the cutter cutting device 30 is rotated, the cutter wheel 33 is moved in the lower direction in the figure by a moving mechanism (not shown), and the cutter tool 31 and the work clamp 32 are aligned in a direction parallel to the holding surface 32a. The relative movement is performed to planarize the surface 211a of the base insulating layer 21a by the cutting tool 31. Next, the base insulating layer 21a on the other side of the front surface 10a and the back surface 10b of the core substrate 10 is sucked and held on the work clamp 32, and the surface 211a of the base insulating layer 21a on one side is similarly cut by the tool 31. For flattening. Thereby, as shown in FIG. 6, the surface of the base insulating layer 21a on both the front surface 10a side and the back surface 10b side of the core substrate 10 can be formed flat. In the front-back planarization step ST2, a protective member such as an adhesive tape may be attached to the surface of the base insulating layer 21a that is attracted and held on the side of the work table 31.

在圖4所示之例中,雖然是以刀具切削裝置30的刀具工具31對基底絕緣層21a的表面211a進行削取平坦化,但是正面背面平坦化步驟ST2,如圖5所示,也能以磨削裝置50的磨削磨石51來對基底絕緣層21a的表面211a進行削取平坦化。在以磨削裝置50的磨削磨石51對基底絕緣層21a的表面211a進行削取平坦化的情形下,是將基底絕緣層21a吸引保持在磨削裝置50之具有保持面52a的工作夾台52上,而一邊以使磨削裝置50的磨削磨石51接觸於基底絕緣層21a的狀態來使工作夾台52旋轉,一邊使磨削輪53旋轉,並且藉由磨削磨石51切削基底絕緣層21a的表面211a來進行平坦化。再者,即使是在正面背面平坦化步驟ST2中使用研磨裝置50的情形下,也可以將黏著膠帶等的保護構件貼附在被吸引保持在工作夾台52之側的基底絕緣層21a的表面上。In the example shown in FIG. 4, although the surface 211 a of the base insulating layer 21 a is cut and flattened by the tool tool 31 of the tool cutting device 30, the front and back planarization step ST2 can also be performed as shown in FIG. 5. The surface 211 a of the base insulating layer 21 a is ground and flattened by the grinding stone 51 of the grinding device 50. In the case where the surface 211a of the base insulating layer 21a is cut and flattened by the grinding stone 51 of the grinding device 50, the base insulating layer 21a is attracted and held on a work clamp having a holding surface 52a of the grinding device 50 While rotating the work clamp table 52 while the grinding stone 51 of the grinding device 50 is in contact with the base insulating layer 21a on the table 52, the grinding wheel 53 is rotated while the grinding wheel 51 is being rotated. The surface 211a of the base insulating layer 21a is cut to be planarized. Furthermore, even in the case where the polishing device 50 is used in the front-back planarization step ST2, a protective member such as an adhesive tape can be attached to the surface of the base insulating layer 21a attracted and held on the side of the work clamp table 52. on.

又,實施形成第1電路圖案層21時的正面背面平坦化步驟ST2之後,為了在配線基板1上形成圖未示之貫通電極,所以對芯材基板10及基底絕緣層21a施行使用了雷射光之燒蝕加工,以形成貫通芯材基板10本身及芯材基板10的正面10a側及背面10b側之雙方的基底絕緣層21a之未圖示的貫通孔(through hole)。再者,此燒蝕加工,亦可在後述之溝形成步驟ST3中進行。In addition, after the front-back planarization step ST2 when forming the first circuit pattern layer 21 is performed, in order to form a through-electrode (not shown) on the wiring substrate 1, laser light is used for the core substrate 10 and the base insulating layer 21a. The ablation process is performed to form through holes (not shown) through the base insulating layer 21a of the core material substrate 10 itself and both the front surface 10a side and the back surface 10b side of the core material substrate 10. The ablation process may be performed in a groove formation step ST3 described later.

溝形成步驟ST3,是藉由雷射光線在基底絕緣層21a形成成為電路圖案21b之溝R的步驟。在溝形成步驟ST3中,是將芯材基板10的正面10a側及背面10b側之其中一側的基底絕緣層21a吸引保持在雷射加工裝置40之具有由多孔陶瓷(porous ceramics)等所形成之保持面41a的工作夾台41上。然後,如圖7所示,從雷射光線照射部42使例如準分子雷射光等的雷射光線L依照預先設定的圖案朝基底絕緣層21a的規定範圍照射,以在基底絕緣層21a的表面211a形成複數條溝R。像這樣,藉由將雷射光線L照射在基底絕緣層21a的規定範圍,就能更效率良好地形成複數條溝R。又,藉由使用雷射加工,相較於例如以可進行光蝕刻(photoetching)的樹脂材料形成基底絕緣層21a,並藉由光蝕刻形成溝R的情形,能夠以低價的方式形成複數條溝R。接著,將芯材基板10的正面10a及背面10b之另一側的基底絕緣層21a吸引保持在工作夾台41上,並且同樣地將雷射光線L照射在一側之基底絕緣層21a的表面211a以形成複數條溝R。再者,即使在溝形成步驟ST3中,也可以將黏著膠帶等的保護構件貼附在被吸引保持在工作夾台41之側的基底絕緣層21a的表面上。The trench forming step ST3 is a step of forming a trench R that becomes a circuit pattern 21b in the base insulating layer 21a by laser light. In the groove forming step ST3, the base insulating layer 21a on one of the front surface 10a side and the back surface 10b side of the core substrate 10 is sucked and held in the laser processing device 40 and is formed of porous ceramics or the like. It is on the work clamp 41 of the holding surface 41a. Then, as shown in FIG. 7, the laser light irradiating section 42 irradiates laser light L such as excimer laser light toward a predetermined range of the base insulating layer 21 a in accordance with a preset pattern so that the surface of the base insulating layer 21 a is irradiated. 211a forms a plurality of grooves R. As described above, by irradiating the laser light L to a predetermined range of the base insulating layer 21a, the plurality of grooves R can be formed more efficiently. In addition, by using laser processing, a plurality of strips can be formed at a low cost compared with the case where the base insulating layer 21a is formed of a resin material that can be photoetched and the grooves R are formed by photoetching, for example. Ditch R. Next, the base insulating layer 21a on the other side of the front surface 10a and the back surface 10b of the core substrate 10 is attracted and held on the work clamp 41, and the laser light L is similarly irradiated on the surface of the base insulating layer 21a on one side. 211a to form a plurality of grooves R. Furthermore, even in the groove formation step ST3, a protective member such as an adhesive tape may be attached to the surface of the base insulating layer 21a that is attracted and held on the side of the work table 41.

金屬薄膜形成步驟ST4,是在基底絕緣層21a的表面形成金屬薄膜21c的步驟。在金屬薄膜形成步驟ST4中,是在芯材基板10的正面10a側及背面10b側之雙方的基底絕緣層21a上, 藉由濺鍍(sputtering)將由導電性之金屬所構成的金屬薄膜21c依序形成被覆膜。藉此,如圖8所示,可包含複數條溝R的內部而在芯材基板10的正面10a側及背面10b側之雙方的基底絕緣層21a的表面211a整體皆形成金屬薄膜21c。此時,在圖未示之貫通電極用的貫通孔的內面上也形成有金屬薄膜21c。再者,金屬薄膜21c也可以設成是將由金屬材料所形成的焊料等藉由網版印刷或噴墨方式的印刷而形成在基底絕緣層21c上之構成。The metal thin film forming step ST4 is a step of forming a metal thin film 21c on the surface of the base insulating layer 21a. In the metal thin film forming step ST4, the metal thin film 21c made of a conductive metal is sputtered on the base insulating layer 21a on both the front surface 10a side and the back surface 10b side of the core substrate 10 by sputtering. In order to form a coating film. Thereby, as shown in FIG. 8, the metal thin film 21 c may be formed on the entire surface 211 a of the base insulating layer 21 a on both the front surface 10 a side and the back surface 10 b side of the core substrate 10 including the plurality of grooves R. At this time, a metal thin film 21c is also formed on the inner surface of a through-hole for a through-electrode (not shown). In addition, the metal thin film 21c may be configured such that solder or the like formed of a metal material is formed on the base insulating layer 21c by screen printing or inkjet printing.

金屬被覆步驟ST5是將金屬薄膜21c作為電極,藉由鍍敷處理將金屬M被覆在基底絕緣層21a之表面211a的步驟。在金屬被覆步驟ST5中,是在溶液內將金屬薄膜21c作為電極,使導電性的金屬M電沉積在基底絕緣層21a的表面211a上的金屬薄膜21c及圖未示之貫通孔的內面之金屬薄膜21c上,而如圖9所示,在溝R內充填金屬M。此時,圖未示之貫通電極用的貫通孔內也充填有金屬M。在金屬被覆步驟ST5中,是對芯材基板10的正面10a側及背面10b側之雙方的基底絕緣層21a依序、或同時地施行鍍敷處理。藉此,如圖9所示,於芯材基板10的正面10a側及背面10b側之雙方,可包含複數條溝R的內部而在基底絕緣層21a的表面211a上被覆金屬M。The metal coating step ST5 is a step in which the metal thin film 21c is used as an electrode, and the metal M is coated on the surface 211a of the base insulating layer 21a by a plating process. In the metal coating step ST5, the metal thin film 21c is used as an electrode in the solution, and the conductive metal M is electrodeposited on the surface 211a of the base insulating layer 21a. The metal thin film 21c and the inner surface of a through hole (not shown) On the metal thin film 21c, as shown in FIG. 9, a metal M is filled in the groove R. At this time, the through holes for through electrodes (not shown) are also filled with metal M. In the metal coating step ST5, the base insulating layer 21a on both the front surface 10a side and the back surface 10b side of the core substrate 10 is sequentially or simultaneously subjected to plating treatment. As a result, as shown in FIG. 9, on both the front surface 10 a side and the back surface 10 b side of the core substrate 10, the inside of the plurality of grooves R may be covered with the metal M on the surface 211 a of the base insulating layer 21 a.

電路圖案層形成步驟ST6,是以刀具工具31切削金屬M及基底絕緣層21a直到基底絕緣層21a達到規定之成品厚度為止,以形成金屬的電路圖案21b露出之平坦的第1電路圖案層21的步驟。在電路圖案層形成步驟ST6中,如圖10所示,是將被覆在芯材基板10的正面10a及背面10b的其中一側之基底絕緣層21a上之金屬M的表面,吸引保持在刀具切削裝置30之具有由金屬製的銷吸盤等所形成之保持面32a的工作夾台32上。然後,藉由使刀具切削裝置30的刀具輪33旋轉,一邊使刀具輪33和工作夾台32相對於保持面32a在平行方向上相對移動,一邊藉由刀具工具31切削金屬M。此時,是包含基底絕緣層21a的表層部分而切削金屬M。接著,將被覆在芯材基板10的正面10a及背面10b之另一側的基底絕緣層21a上之金屬M的表面吸引保持在工作夾台32上。然後,同樣地藉由刀具工具31來切削被覆於一側之基底絕緣層21a上的金屬M。再者,即使在電路圖案層形成步驟ST6中,也可以將黏著膠帶等的保護構件貼附在被吸引保持在工作夾台32之側的被覆於基底絕緣層21a上之金屬M的表面。The circuit pattern layer forming step ST6 is performed by cutting the metal M and the base insulating layer 21a with the tool 31 until the base insulating layer 21a reaches a predetermined finished thickness to form a flat first circuit pattern layer 21 exposed by the metal circuit pattern 21b. step. In the circuit pattern layer forming step ST6, as shown in FIG. 10, the surface of the metal M coated on the base insulating layer 21a on one of the front surface 10a and the back surface 10b of the core substrate 10 is attracted and held by the cutting tool. The device 30 has a work chuck 32 having a holding surface 32a formed by a metal pin chuck or the like. Then, the cutter wheel 33 of the cutter cutting device 30 is rotated, while the cutter wheel 33 and the work table 32 are relatively moved in a parallel direction with respect to the holding surface 32a, the metal M is cut by the cutter tool 31. At this time, the metal M is cut by including the surface layer portion of the base insulating layer 21a. Next, the surface of the metal M coated on the base insulating layer 21 a on the other side of the front surface 10 a and the back surface 10 b of the core material substrate 10 is sucked and held on the work clamp 32. Then, the metal M coated on one side of the base insulating layer 21a is cut by the tool 31 in the same manner. In addition, even in the circuit pattern layer forming step ST6, a protective member such as an adhesive tape may be attached to the surface of the metal M covered with the base insulating layer 21a that is attracted and held on the work clamp 32 side.

藉此,如圖11所示,於芯材基板10的正面10a側及背面10b側之雙方,從除了複數條溝R之內部以外的基底絕緣層21a的表面上將金屬M及金屬薄膜21c去除。殘留於複數條溝R內的金屬M及金屬薄膜21c,會成為埋入基底絕緣層21a的電路圖案21b,並且在基底絕緣層21a的表面211a露出。又,殘留於圖未示之貫通電極用的貫通孔內的金屬M及金屬薄膜21c成為貫通電極用的電路圖案,並且在基底絕緣層21a的表面211a露出。又,可將基底絕緣層21a的表面211a與電路圖案21b的露出面211b平坦(齊平面)地形成。亦即,能夠將第1電路圖案層21平坦地形成。再者,基底絕緣層21a的表層部分的切削量,只要能夠從除了複數條溝R之內部以外的基底絕緣層21a的表面211a將金屬M及金屬薄膜21c去除,並且將第1電路圖案層21平坦地形成即可,較理想的是,儘可能愈少愈好。藉此,變得可抑制因包含於ABF的二氧化矽填料(silica filler),而在刀具切削裝置30的刀具工具31上發生摩耗或破裂(chipping)、或在電路圖案21b的露出面211b上產生龜裂(污跡(smear))的情形。又,電路圖案層形成步驟ST6,亦可與正面背面平坦化步驟ST2同樣,為使用圖5所示之磨削裝置50,並以磨削磨石51削取金屬M及基底絕緣層21a直到基底絕緣層21a達到規定之成品厚度為止,而形成金屬的電路圖案21b露出之平坦的第1電路圖案層21之步驟。Thereby, as shown in FIG. 11, the metal M and the metal thin film 21 c are removed from the surface of the base insulating layer 21 a except for the inside of the plurality of grooves R on both the front surface 10 a side and the back surface 10 b side of the core substrate 10. . The metal M and the metal thin film 21c remaining in the plurality of grooves R become a circuit pattern 21b embedded in the base insulating layer 21a, and are exposed on the surface 211a of the base insulating layer 21a. The metal M and the metal thin film 21c remaining in the through-hole for a through-electrode (not shown) serve as a circuit pattern for the through-electrode, and are exposed on the surface 211a of the base insulating layer 21a. Moreover, the surface 211a of the base insulating layer 21a and the exposed surface 211b of the circuit pattern 21b can be formed flat (flush). That is, the first circuit pattern layer 21 can be formed flat. In addition, the cutting amount of the surface layer portion of the base insulating layer 21a can be obtained by removing the metal M and the metal thin film 21c from the surface 211a of the base insulating layer 21a except the inside of the plurality of grooves R, and removing the first circuit pattern layer 21 It is sufficient to form it flat, and it is ideal that as little as possible is better. This makes it possible to suppress the occurrence of abrasion or chipping on the tool 31 of the tool cutting device 30 due to the silica filler contained in the ABF, or on the exposed surface 211b of the circuit pattern 21b. A crack (smear) is generated. In addition, in the circuit pattern layer forming step ST6, similarly to the front and back planarization step ST2, the metal M and the base insulating layer 21a are cut to the base by using the grinding device 50 shown in FIG. 5 and the grinding stone 51. A step of forming a flat first circuit pattern layer 21 with the metal circuit pattern 21b exposed until the insulating layer 21a reaches a predetermined finished thickness.

以上述之順序形成第1電路圖案層21之後,再次重覆實施從基底絕緣層步驟ST1至電路圖案層形成步驟ST6的處理。亦即,將ABF固定在第1電路圖案層21上以形成基底絕緣層22a(基底絕緣層形成步驟ST1),並且使用刀具切削裝置30將基底絕緣層22a平坦化(正面背面平坦化步驟ST2)。其次,使用雷射加工裝置40在基底絕緣層22a上形成複數條溝R(溝形成步驟ST3)。然後,藉由濺鍍等在基底絕緣層22a上形成金屬薄膜(金屬薄膜形成步驟ST4)、並藉由鍍敷處理以金屬薄膜作為電極來將金屬M被覆在基底絕緣層22a之表面(金屬被覆步驟ST5)。此外,使用刀具切削裝置30,以刀具工具(或磨削磨石51)31將金屬M和基底絕緣層22a的表層部分一起削取,而形成第2電路圖案22b露出之平坦的第2電路圖案層22(電路圖案層形成步驟ST6)。藉此,能夠在平坦的第1電路圖案層21上形成平坦的第2電路圖案層22。又,可以藉由同樣的順序,在平坦的第2電路圖案層22上形成平坦的第3電路圖案層23。其結果,能夠形成具有圖1所示之平坦的電路圖案層20的配線基板1。After the first circuit pattern layer 21 is formed in the above-mentioned order, the processes from the base insulating layer step ST1 to the circuit pattern layer forming step ST6 are repeatedly performed again. That is, the ABF is fixed on the first circuit pattern layer 21 to form a base insulating layer 22a (base insulating layer forming step ST1), and the base insulating layer 22a is flattened using the cutter cutting device 30 (front and back flattening step ST2) . Next, a plurality of trenches R are formed in the base insulating layer 22a using the laser processing apparatus 40 (trench formation step ST3). Then, a metal thin film is formed on the base insulating layer 22a by sputtering or the like (metal thin film forming step ST4), and the metal M is coated on the surface of the base insulating layer 22a by using a metal thin film as an electrode by a plating process (metal coating). Step ST5). In addition, using the cutter cutting device 30, the metal M and the surface layer portion of the base insulating layer 22a are cut together with a cutter tool (or grinding stone 51) 31 to form a flat second circuit pattern with the second circuit pattern 22b exposed. Layer 22 (circuit pattern layer forming step ST6). Thereby, a flat second circuit pattern layer 22 can be formed on the flat first circuit pattern layer 21. In addition, a flat third circuit pattern layer 23 can be formed on the flat second circuit pattern layer 22 by the same procedure. As a result, the wiring substrate 1 having the flat circuit pattern layer 20 shown in FIG. 1 can be formed.

又,包含將圖未示之貫通電極用之電路圖案彼此連接的情形,而在各電路圖案層20之間將電路圖案彼此電連接之時,會在圖2所示之處理順序中,於溝形成步驟ST3中形成到達下層側之電路圖案露出於基底絕緣層之位置的溝R。藉此,可在金屬薄膜形成步驟ST4中於下層側的電路圖案的露出面上形成金屬薄膜,並且在金屬被覆步驟ST5中於該溝R內充填金屬M。並且,可以藉由電路圖案層形成步驟ST6,形成與下層側之電路圖案連接的電路圖案。又,在配線基板1的最外層,在電路圖案之中,也是只有所謂的電極墊部於表面露出。電極墊部,是用於將配線基板1、及搭載於配線基板1之半導體晶片或連接於配線基板1的其他的配線基板電連接的部分。In addition, it includes a case where circuit patterns for through electrodes (not shown) are connected to each other, and when the circuit patterns are electrically connected to each other between the circuit pattern layers 20, in the processing sequence shown in FIG. In the forming step ST3, a trench R is formed where the circuit pattern reaching the lower layer side is exposed at the base insulating layer. Thereby, a metal thin film can be formed on the exposed surface of the circuit pattern on the lower layer side in the metal thin film forming step ST4, and the metal M can be filled in the groove R in the metal coating step ST5. In addition, a circuit pattern connected to the circuit pattern on the lower layer side can be formed in the circuit pattern layer forming step ST6. In the outermost layer of the wiring board 1, only the so-called electrode pad portion is exposed on the surface among the circuit patterns. The electrode pad portion is a portion for electrically connecting the wiring substrate 1 and a semiconductor wafer mounted on the wiring substrate 1 or another wiring substrate connected to the wiring substrate 1.

如以上所說明,在本實施形態的配線基板的製造方法中,是對形成於芯材基板10的正面10a及背面10b的基底絕緣層21a進行平坦化(正面背面平坦化步驟ST2)。其結果,即使是如本實施形態的芯材基板10地芯材基板10本身翹曲(彎曲)、或者芯材基板10的正面10a或背面10b具有凹凸,仍然能夠在之後將成為電路圖案層21之基底絕緣層21a的表面平坦地形成。又,由於是藉由將被覆於基底絕緣層21a上的金屬M與基底絕緣層21a一起削取,以形成電路圖案21b露出之第1電路圖案層21,所以能夠將第1電路圖案層21的表面更平坦地形成。從而,依據本實施形態的配線基板的製造方法,變得可得到可更良好地進行與搭載之零件的電極的連接之平坦度更高的配線基板1。As described above, in the method of manufacturing a wiring substrate according to this embodiment, the base insulating layer 21a formed on the front surface 10a and the back surface 10b of the core substrate 10 is planarized (front surface back surface planarization step ST2). As a result, even if the core material substrate 10 itself is warped (bent) like the core material substrate 10 of the present embodiment, or the front surface 10a or the back surface 10b of the core material substrate 10 has unevenness, it can be a circuit pattern layer 21 later. The surface of the base insulating layer 21a is formed flat. In addition, since the metal M coated on the base insulating layer 21a is cut out together with the base insulating layer 21a to form the first circuit pattern layer 21 exposed by the circuit pattern 21b, the first circuit pattern layer 21 can be The surface is formed more flatly. Therefore, according to the method for manufacturing a wiring board according to this embodiment, it is possible to obtain a wiring board 1 having a higher flatness, which enables better connection with the electrodes of the mounted components.

又,在溝形成步驟ST3之後且於金屬被覆步驟ST5之前,在基底絕緣層21a的表面被覆金屬薄膜21c(金屬薄膜形成步驟ST4),並將金屬薄膜21c作為以鍍敷處理來將該金屬M被覆在基底絕緣層21a的表面時的電極。藉此,能夠容易地將成為電路圖案21b之金屬M被覆在基底絕緣層21a上。Further, after the trench forming step ST3 and before the metal coating step ST5, the surface of the base insulating layer 21a is coated with a metal thin film 21c (metal thin film forming step ST4), and the metal thin film 21c is subjected to a plating treatment to the metal M An electrode when covering the surface of the base insulating layer 21a. Thereby, the metal M which becomes the circuit pattern 21b can be easily covered on the base insulating layer 21a.

又,在電路圖案層之上更進一步積層並形成電路圖案層。亦即,藉由重覆實施圖2所示之處理順序,以在平坦的第1電路圖案層21上積層並形成平坦的第2電路圖案層22,且在平坦的第2電路圖案層22上積層並形成平坦的第3電路圖案層23。藉此,可以良好地抑制每當積層各層時平坦度降低之情形。從而,變得可更良好地確保位於最外層的第3電路圖案層23的平坦度,且更良好地進行配線基板1之電極和搭載於配線基板1之零件的電極的連接。亦即,本發明在如配線基板1的多層配線型的配線基板的製造上是很適合的。又,藉由將各電路圖案21b、22b、23b的表面平坦化,就能夠將各電路圖案21b、22b、23b的層間距離(電極高度)設為固定。其結果,變得可將各電路圖案21b、22b、23b中的電阻或通訊速度之值設為固定。Furthermore, the circuit pattern layer is further laminated on the circuit pattern layer to form a circuit pattern layer. That is, the processing sequence shown in FIG. 2 is repeatedly implemented to laminate and form a flat second circuit pattern layer 22 on the flat first circuit pattern layer 21, and on the flat second circuit pattern layer 22 A flat third circuit pattern layer 23 is laminated and formed. This makes it possible to satisfactorily suppress a decrease in flatness each time each layer is laminated. Accordingly, it is possible to more securely ensure the flatness of the third circuit pattern layer 23 located at the outermost layer, and to better connect the electrodes of the wiring substrate 1 and the electrodes of the components mounted on the wiring substrate 1. That is, the present invention is very suitable for manufacturing a multilayer wiring type wiring substrate such as the wiring substrate 1. In addition, by planarizing the surfaces of the circuit patterns 21b, 22b, and 23b, the interlayer distance (electrode height) of the circuit patterns 21b, 22b, and 23b can be fixed. As a result, it becomes possible to set the value of the resistance or the communication speed in each of the circuit patterns 21b, 22b, and 23b to be fixed.

在本實施形態中,雖然是設成在基底絕緣層形成步驟ST1中使用味之素Fine-Techo公司製之ABF來形成基底絕緣層21a、22a、23a,並在溝形成步驟ST3中藉由對基底絕緣層21a、22a、23a照射雷射光線以形成複數條溝R之構成,但是基底絕緣層21a、22a、23a及複數條溝R的形成手法,並不受限於此。圖12是顯示實施變形例的溝形成步驟ST3之情形的說明圖。In this embodiment, although the ABF made by Ajinomoto Fine-Techo is used to form the base insulating layers 21a, 22a, and 23a in the base insulating layer forming step ST1, and in the trench forming step ST3, The base insulating layers 21a, 22a, and 23a are irradiated with laser light to form a plurality of grooves R, but the formation method of the base insulating layers 21a, 22a, 23a and the plurality of grooves R is not limited to this. FIG. 12 is an explanatory diagram showing a state in which a groove formation step ST3 according to a modification is implemented.

圖12所示之形成於芯材基板10的基底絕緣層21a,包含可藉由光蝕刻(光刻法(photolithography))進行圖案去除的感光性的樹脂材料。例如,作為基底絕緣層21a,使用包含感光性的樹脂材料之乾膜,並在基底絕緣層形成步驟ST1中,將乾膜藉由加熱壓接來固定在芯材基板10的正面10a及背面10b。又,作為基底絕緣層21a,而使用例如具有感光性的液狀樹脂,並在基底絕緣層形成步驟ST1中,藉由旋轉塗佈(spin coat)將液狀樹脂滴下到芯材基板10的正面10a及背面10b,且藉由加熱來固定亦可。在形成第2電路圖案層22的基底絕緣層22a、第3電路圖案層23的基底絕緣層23a時也是同樣。The base insulating layer 21a formed on the core substrate 10 shown in FIG. 12 includes a photosensitive resin material that can be pattern-removed by photolithography (photolithography). For example, as the base insulating layer 21a, a dry film containing a photosensitive resin material is used, and in the base insulating layer forming step ST1, the dry film is fixed to the front surface 10a and the back surface 10b of the core substrate 10 by thermal compression bonding. . In addition, as the base insulating layer 21a, for example, a liquid resin having photosensitivity is used, and in the base insulating layer forming step ST1, the liquid resin is dropped onto the front surface of the core substrate 10 by a spin coat. 10a and the back surface 10b may be fixed by heating. The same applies when the base insulating layer 22 a of the second circuit pattern layer 22 and the base insulating layer 23 a of the third circuit pattern layer 23 are formed.

並且,在圖12所示之變形例的溝形成步驟ST3中,如圖中實線箭頭所示,是透過預先形成有沿著複數條溝R之圖案P的遮罩60,並在規定時間中將光照射於基底絕緣層21a。藉此,可沿著遮罩60之圖案P對基底絕緣層21a的曝光的位置之表面側的一部分進行圖案去除,而在基底絕緣層21a上形成複數條溝R。再者,在進行光蝕刻(光刻法),以對基底絕緣層21a之已曝光之位置進行圖案去除的情形下,也可以先將遮罩60的圖案P,形成為沿著複數條溝R以外的部分之形狀。在第2電路圖案層22的基底絕緣層22a、第3電路圖案層23的基底絕緣層23a上形成複數條溝R時也是同樣。In the groove forming step ST3 of the modification shown in FIG. 12, as shown by the solid line arrows in the figure, the mask 60 having a pattern P along the plurality of grooves R formed in advance is transmitted for a predetermined period of time. The base insulating layer 21a is irradiated with light. Thereby, a part of the surface side of the exposed position of the base insulating layer 21a can be pattern-removed along the pattern P of the mask 60, and a plurality of grooves R can be formed in the base insulating layer 21a. In addition, in the case of performing photo-etching (lithography) to remove the pattern of the exposed position of the base insulating layer 21a, the pattern P of the mask 60 may be formed along a plurality of grooves R first. The shape of the other parts. The same applies when a plurality of grooves R are formed in the base insulating layer 22 a of the second circuit pattern layer 22 and the base insulating layer 23 a of the third circuit pattern layer 23.

像這樣,藉由不使用ABF,而以可藉由光蝕刻(光刻法)進行圖案去除的感光性之樹脂材料來形成基底絕緣層21a(22a、23a),變得可抑制在電路圖案層形成步驟ST6中,因切削包含二氧化矽填料之ABF而在刀具工具31上產生摩耗或破裂、或使電路圖案21b的表面龜裂的情形。In this manner, the base insulating layer 21a (22a, 23a) is formed by using a photosensitive resin material that can be pattern-removed by photoetching (lithography) without using ABF, and it becomes possible to suppress the circuit pattern layer. In the forming step ST6, abrasion or cracking of the cutting tool 31 or cracking of the surface of the circuit pattern 21b may be caused by cutting the ABF containing silicon dioxide filler.

再者,在本實施形態中,雖然是設成在芯材基板10的正面10a及背面10b的雙方形成電路圖案層20之構成,但是本發明也可以適用於只在芯材基板10之任一面上形成電路圖案層20之構成上。Furthermore, in this embodiment, although the circuit pattern layer 20 is formed on both the front surface 10a and the back surface 10b of the core substrate 10, the present invention can also be applied to only one surface of the core substrate 10 The circuit pattern layer 20 is formed thereon.

1‧‧‧配線基板1‧‧‧wiring board

10‧‧‧芯材基板10‧‧‧ core substrate

10a‧‧‧正面10a‧‧‧front

10b‧‧‧背面10b‧‧‧ back

20‧‧‧電路圖案層20‧‧‧Circuit pattern layer

21‧‧‧第1電路圖案層21‧‧‧The first circuit pattern layer

21a、22a、23a‧‧‧基底絕緣層21a, 22a, 23a ‧‧‧ base insulating layer

211a‧‧‧表面211a‧‧‧ surface

211b‧‧‧露出面211b‧‧‧ exposed

21b、22b、23b‧‧‧電路圖案21b, 22b, 23b‧‧‧Circuit patterns

21c‧‧‧金屬薄膜21c‧‧‧Metal film

22‧‧‧第2電路圖案層22‧‧‧ 2nd circuit pattern layer

23‧‧‧第3電路圖案層23‧‧‧3rd circuit pattern layer

30‧‧‧刀具切削裝置30‧‧‧ Tool cutting device

31‧‧‧刀具工具31‧‧‧Tools

32、41、52‧‧‧工作夾台32, 41, 52‧‧‧ work clamps

32a、41a、52a‧‧‧保持面32a, 41a, 52a‧‧‧

33‧‧‧刀具輪33‧‧‧Cutter wheel

40‧‧‧雷射加工裝置40‧‧‧laser processing device

42‧‧‧雷射光線照射部42‧‧‧Laser light irradiation section

50‧‧‧磨削裝置50‧‧‧Grinding device

51‧‧‧磨削磨石51‧‧‧grinding stone

53‧‧‧磨削輪53‧‧‧Grinding wheel

60‧‧‧遮罩60‧‧‧Mask

L‧‧‧雷射光線L‧‧‧ laser light

M‧‧‧金屬M‧‧‧ Metal

P‧‧‧圖案P‧‧‧Pattern

R‧‧‧溝R‧‧‧ trench

ST1~ST6‧‧‧步驟ST1 ~ ST6‧‧‧‧steps

圖1是顯示藉由實施形態之配線基板的製造方法所製造的配線基板的截面圖。 圖2是顯示作為實施形態之配線基板的製造方法之流程的一部分,而形成各電路圖案層的處理順序的流程圖。 圖3是顯示藉由基底絕緣層形成步驟而形成有基底絕緣層的芯材基板的說明圖。 圖4是顯示在正面背面平坦化步驟中將基底絕緣層之表面平坦化之情形的說明圖。 圖5是顯示在正面背面平坦化步驟中將基底絕緣層之表面平坦化之情形的其他例子的說明圖。 圖6是顯示已將基底絕緣層平坦化之芯材基板的說明圖。 圖7是顯示在溝形成步驟中於基底絕緣層的表面形成複數條溝之情形的說明圖。 圖8是顯示藉由金屬薄膜形成步驟而在基底絕緣層的表面形成有金屬薄膜之芯材基板的說明圖。 圖9是顯示藉由金屬被覆步驟而在基底絕緣層上被覆有金屬之芯材基板的說明圖。 圖10是顯示在電路圖案層形成步驟中切削金屬及基底絕緣層的一部分之情形的說明圖。 圖11是顯示已形成有第1電路圖案層之芯材基板的說明圖。 圖12是顯示實施變形例的溝形成步驟之情形的說明圖。FIG. 1 is a cross-sectional view showing a wiring substrate manufactured by a wiring substrate manufacturing method according to an embodiment. FIG. 2 is a flowchart showing a processing procedure for forming each circuit pattern layer as part of a flow of a method for manufacturing a wiring substrate according to an embodiment. FIG. 3 is an explanatory view showing a core substrate having a base insulating layer formed in a base insulating layer forming step. FIG. 4 is an explanatory view showing a state where the surface of the base insulating layer is flattened in the front-back planarization step. FIG. 5 is an explanatory diagram showing another example of a case where the surface of the base insulating layer is planarized in the front-back planarization step. FIG. 6 is an explanatory view showing a core material substrate having a planarized base insulating layer. FIG. 7 is an explanatory view showing a state where a plurality of grooves are formed on the surface of the base insulating layer in the groove forming step. FIG. 8 is an explanatory diagram showing a core material substrate having a metal thin film formed on a surface of a base insulating layer by a metal thin film forming step. FIG. 9 is an explanatory diagram showing a core material substrate coated with a metal on a base insulating layer by a metal coating step. FIG. 10 is an explanatory diagram showing a state where a part of a metal and a base insulating layer is cut in a circuit pattern layer forming step. FIG. 11 is an explanatory view showing a core material substrate on which a first circuit pattern layer has been formed. FIG. 12 is an explanatory diagram showing a state in which a groove formation step according to a modification is performed.

Claims (3)

一種配線基板的製造方法,是在正面、背面具備再配線層之配線基板的製造方法,其特徵在於具備: 基底絕緣層形成步驟,在成為芯材之基板的正面、背面形成樹脂的基底絕緣層; 正面背面平坦化步驟,以刀具工具或磨削磨石對正面、背面之該基底絕緣層的表面進行削取平坦化; 溝形成步驟,藉由雷射光線或光蝕刻而在該基底絕緣層上形成成為電路圖案之溝; 金屬被覆步驟,在該溝形成步驟之後,於該基底絕緣層的表面被覆金屬;及 電路圖案層形成步驟,以刀具工具削取該金屬及該基底絕緣層直到該基底絕緣層達到規定之成品厚度為止,以形成該金屬的該電路圖案露出之平坦的電路圖案層, 藉由該正面背面平坦化步驟及該電路圖案層形成步驟以形成平坦的配線基板。A method for manufacturing a wiring board is a method for manufacturing a wiring board having a redistribution layer on the front and back sides, comprising: a base insulating layer forming step of forming a resin base insulating layer on the front and back sides of a substrate that becomes a core material ; Front and back flattening step, cutting and flattening the surface of the base insulating layer on the front and back with a cutter tool or a grinding stone; groove forming step, forming the base insulating layer by laser light or photoetching A groove forming a circuit pattern is formed thereon; a metal coating step, after the groove forming step, covering the surface of the base insulating layer with metal; and a circuit pattern layer forming step, cutting the metal and the base insulating layer with a cutter tool until the Until the base insulating layer reaches a predetermined finished thickness, a flat circuit pattern layer exposed by the circuit pattern of the metal is formed, and a flat wiring substrate is formed by the front and back planarization step and the circuit pattern layer forming step. 如請求項1之配線基板的製造方法,其中,在該溝形成步驟之後且於該金屬被覆步驟之前,在該基底絕緣層的表面被覆金屬薄膜,並且將該金屬薄膜作為以鍍敷處理來將該金屬被覆在該基底絕緣層之表面時的電極。The method of manufacturing a wiring substrate according to claim 1, wherein the surface of the base insulating layer is coated with a metal thin film after the groove forming step and before the metal coating step, and the metal thin film is treated by plating. An electrode when the metal covers the surface of the base insulating layer. 如請求項1或2之配線基板的製造方法,其中,在該電路圖案層之上更進一步積層並形成該電路圖案層。The method for manufacturing a wiring substrate according to claim 1 or 2, wherein the circuit pattern layer is further laminated and formed on the circuit pattern layer.
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