TW201816391A - Detecting equipment - Google Patents
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- TW201816391A TW201816391A TW105134349A TW105134349A TW201816391A TW 201816391 A TW201816391 A TW 201816391A TW 105134349 A TW105134349 A TW 105134349A TW 105134349 A TW105134349 A TW 105134349A TW 201816391 A TW201816391 A TW 201816391A
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Description
本發明係關於一種檢測設備,特別是一種雙檢測鏡頭的檢測設備。The present invention relates to a detecting device, and more particularly to a detecting device for a dual detecting lens.
在一般的半導體製程中,當晶圓表面形成多個晶粒後,通常會繼續對晶粒進行點測、檢測與分類等製程。其中,檢測製程主要是利用檢測鏡頭來掃描晶粒,並依據擷取到的影像來判斷晶粒本身是否存在有缺陷。In a general semiconductor process, when a plurality of crystal grains are formed on the surface of the wafer, processes such as spot measurement, detection, and classification of the crystal grains are generally continued. Among them, the detection process mainly uses the detection lens to scan the die, and judges whether the die itself is defective according to the captured image.
晶圓檢測依需求分為單向檢測及雙向檢測。單向檢測的部分是將晶圓平放於承載平台上,且透過位於晶圓上方的檢測鏡頭來擷取晶圓上表面的影像。由於晶圓整面皆受到承載平台的支撐,故晶圓呈平坦而不會影響到檢測品質。雙向檢測的部分為透過治具夾住晶圓之外緣,且透過位於晶圓上下兩側的檢測鏡頭來分別擷取晶圓上、下表面的影像。由於晶圓僅外緣受到支撐,中央處並未受到支撐,故晶圓之中央處會略為下凹,使得晶圓不再呈平坦而會影響檢測品質。因此,如何避免晶圓不平坦而影響檢測品質的狀況發生,則為研發人員應解決的問題之一。Wafer inspection is divided into one-way detection and two-way detection according to requirements. The part of the unidirectional detection is to flatten the wafer on the carrying platform and capture the image of the upper surface of the wafer through the detecting lens located above the wafer. Since the entire surface of the wafer is supported by the carrying platform, the wafer is flat without affecting the quality of the inspection. The part of the two-way detection is to sandwich the outer edge of the wafer through the fixture, and to capture images of the upper and lower surfaces of the wafer through the detection lenses located on the upper and lower sides of the wafer. Since the outer edge of the wafer is only supported, the center is not supported, so the center of the wafer will be slightly concave, so that the wafer is no longer flat and will affect the quality of inspection. Therefore, how to avoid the unevenness of the wafer and affect the quality of the detection is one of the problems that the developer should solve.
本發明在於提供一種檢測設備,藉以解決習知雙向檢測時,晶圓不再呈平坦而會影響檢測品質的問題。The present invention provides a detecting device for solving the problem that the wafer is no longer flat and affects the quality of detection in the conventional two-way detection.
本發明之一實施例所揭露之檢測設備包含一基座、一環形治具、一水平調整組件、一支撐環體、一第一影像擷取裝置及一第二影像擷取裝置。環形治具可活動地設置於基座。環形治具用以固定一待測物。水平調整組件包含一固定座、一活動座及至少三個水平調整件。固定座固定於基座並位於環形治具下方。活動座透過至少三個水平調整件鎖附於固定座。支撐環體固定於活動座。支撐環體遠離活動座之一側用以支撐待測物,並具有一透光口。第一影像擷取裝置固定於環形治具上方。第二影像擷取裝置固定於環形治具下方。第二影像擷取裝置透過支撐環體之透光口朝向第一影像擷取裝置。其中,至少三個水平調整件之至少一可相對固定座轉動,以調整活動座之水平。The detecting device disclosed in one embodiment of the present invention comprises a base, an annular fixture, a horizontal adjustment component, a support ring body, a first image capturing device and a second image capturing device. The ring fixture is movably disposed on the base. The ring fixture is used to fix a sample to be tested. The level adjusting component comprises a fixing seat, a movable seat and at least three horizontal adjusting members. The mount is fixed to the base and under the ring fixture. The movable seat is attached to the fixed seat through at least three horizontal adjustment members. The support ring is fixed to the movable seat. The support ring body is away from one side of the movable seat for supporting the object to be tested, and has a light transmission port. The first image capturing device is fixed above the annular fixture. The second image capturing device is fixed under the annular fixture. The second image capturing device faces the first image capturing device through the light transmitting port of the support ring body. Wherein at least one of the at least three horizontal adjustment members is rotatable relative to the fixed seat to adjust the level of the movable seat.
根據上述實施例之檢測設備,透過三個水平調整件來調整活動座與支撐環體的水平,而至少有一個水平調整件係透過鎖合的方式來調整活動座與固定座的位置關係,以在使用最少元件與佔據最小空間的情況下調整活動座與支撐環體的水平。According to the detecting device of the above embodiment, the level of the movable seat and the supporting ring body are adjusted through the three horizontal adjusting members, and at least one horizontal adjusting member adjusts the positional relationship between the movable seat and the fixed seat through the locking manner, Adjust the level of the movable seat and the support ring with minimal components and minimal space.
以上關於本發明內容的說明及以下實施方式的說明係用以示範與解釋本發明的原理,並且提供本發明的專利申請範圍更進一步的解釋。The above description of the present invention and the following description of the embodiments are intended to illustrate and explain the principles of the invention, and to provide a further explanation of the scope of the invention.
請參閱圖1至圖5。圖1為根據本發明第一實施例所述之檢測設備的前視示意圖。圖2為圖1之水平調整組件與支撐環體的立體示意圖。圖3為圖2之分解示意圖。圖4為圖2之上視示意圖。圖5為沿圖4之5-5割面線所繪示的剖面示意圖。Please refer to Figure 1 to Figure 5. 1 is a front elevational view of a detecting apparatus according to a first embodiment of the present invention. 2 is a perspective view of the horizontal adjustment assembly and the support ring of FIG. 1. Figure 3 is an exploded perspective view of Figure 2. Figure 4 is a top plan view of Figure 2. Figure 5 is a cross-sectional view taken along line 5-5 of Figure 4;
本實施例之檢測設備10包含一基座100、一旋轉台200、一環形治具300、一水平調整組件400、一支撐環體500、一第一影像擷取裝置600、一第二影像擷取裝置700、一組裝環體800、一光源850、二限位板件910及多個結合件920。The detecting device 10 of the embodiment includes a base 100, a rotating table 200, an annular fixture 300, a horizontal adjusting component 400, a supporting ring body 500, a first image capturing device 600, and a second image. The device 700, an assembly ring body 800, a light source 850, two limiting plate members 910, and a plurality of coupling members 920 are taken.
旋轉台200可旋轉地設於基座100。此外,旋轉台200可透過直線驅動設備相對基座100單維度或雙維度的滑移。The rotary table 200 is rotatably provided to the base 100. In addition, the rotary table 200 can be slidable by a linear drive device with respect to the base 100 in one or two dimensions.
環形治具300固定於旋轉台200,使得環形治具300可活動地設置於基座100。環形治具300用以固定一待測物,待測物例如為晶圓。此外,在本實施例中,環形治具300例如是透過夾具(未繪式)固定於旋轉台200,使得環形治具300便於固定於旋轉台200或自旋轉台200取下。The ring fixture 300 is fixed to the rotary table 200 such that the ring fixture 300 is movably disposed on the base 100. The ring fixture 300 is used to fix a sample to be tested, and the object to be tested is, for example, a wafer. Further, in the present embodiment, the annular jig 300 is fixed to the rotary table 200 by, for example, a jig (not shown), so that the annular jig 300 is easily fixed to the rotary table 200 or removed from the rotary table 200.
水平調整組件400包含一固定座410、一活動座420及三個水平調整件430a、430b。固定座410固定於基座100並位於環形治具300下方,活動座420透過至少三個水平調整件430a、430b鎖附於固定座410。The level adjusting assembly 400 includes a fixing base 410, a movable seat 420 and three horizontal adjusting members 430a and 430b. The fixing base 410 is fixed to the base 100 and located under the annular fixture 300. The movable seat 420 is locked to the fixing base 410 through at least three horizontal adjusting members 430a and 430b.
在本實施例中,三個水平調整件430a、430b包含二個第一水平調整件430a與一個第二水平調整件430b。每一第一水平調整件430a包含一第一固定螺栓430a1及一彈性件430a2。第一固定螺栓430a1穿設活動座420並鎖合於固定座410。彈性件430a2例如為壓縮彈簧,並夾設於固定座410與活動座420之間。第二水平調整件430b包含一第二固定螺栓430b1、一第一萬向接頭430b2及一第二萬向接頭430b3。第二固定螺栓430b1穿設活動座420並鎖合於固定座410。第一萬向接頭430b2固定於第二固定螺栓430b1。第二萬向接頭430b3固定於活動座420並可轉動地連接於第一萬向接頭430b2。In the present embodiment, the three horizontal adjustment members 430a, 430b include two first horizontal adjustment members 430a and one second horizontal adjustment member 430b. Each of the first horizontal adjustment members 430a includes a first fixing bolt 430a1 and an elastic member 430a2. The first fixing bolt 430 a1 passes through the movable seat 420 and is locked to the fixing base 410 . The elastic member 430a2 is, for example, a compression spring, and is interposed between the fixing base 410 and the movable seat 420. The second level adjusting member 430b includes a second fixing bolt 430b1, a first universal joint 430b2 and a second universal joint 430b3. The second fixing bolt 430b1 is disposed through the movable seat 420 and is locked to the fixing base 410. The first universal joint 430b2 is fixed to the second fixing bolt 430b1. The second universal joint 430b3 is fixed to the movable seat 420 and rotatably connected to the first universal joint 430b2.
在本實施例中,二個第一水平調整件430a位於活動座420之同一側,第二水平調整件430b位於活動座420之相對一側。二第一水平調整件430a之第一固定螺栓430a1可相對固定座410轉動而轉緊或轉鬆。當二第一水平調整件430a之第一固定螺栓430a1相對變鬆時,活動座420之一側會以第二水平調整件430b之第一萬向接頭430b2為支點,活動座420之另一側會受到彈性件430a2之支撐而提高水平高度。反之,當二第一水平調整件430a之第一固定螺栓430a1相對變緊時,活動座420之一側會以第二水平調整件430b之第一萬向接頭430b2為支點,活動座420之另一側會受到第一固定螺栓430a1之抵壓而降低水平高度。如此一來,可透過二第一水平調整件430a之第一固定螺栓430a1之鬆緊度來調整活動座420之水平傾斜程度。In this embodiment, the two first level adjusting members 430a are located on the same side of the movable seat 420, and the second horizontal adjusting member 430b is located on the opposite side of the movable seat 420. The first fixing bolts 430a1 of the two first level adjusting members 430a are rotatable relative to the fixing base 410 to be turned or loosened. When the first fixing bolt 430a1 of the two first level adjusting members 430a is relatively loose, one side of the movable seat 420 is supported by the first universal joint 430b2 of the second horizontal adjusting member 430b, and the other side of the movable seat 420 It is supported by the elastic member 430a2 to raise the level. On the other hand, when the first fixing bolt 430a1 of the second horizontal adjusting member 430a is relatively tight, one side of the movable seat 420 is supported by the first universal joint 430b2 of the second horizontal adjusting member 430b, and the movable seat 420 is another. One side is pressed by the first fixing bolt 430a1 to lower the level. In this way, the horizontal inclination of the movable seat 420 can be adjusted through the tightness of the first fixing bolts 430a1 of the two first level adjusting members 430a.
值得注意的是,本實施例所揭露第一水平調整件430a、430b並非用以限制本發明,在其他實施例中,亦可透過其他形式的水平調整件來調整活動座420之水平傾斜程度。其他形式的水平調整件例如為相螺合的螺栓與螺帽,螺栓穿設活動座並鎖附於固定座,螺帽樞設於活動座並螺合於螺栓。如此一來,當使用者轉動螺帽時,即可調整活動座420之水平高度。It should be noted that the first level adjusting members 430a and 430b are not used to limit the present invention. In other embodiments, the horizontal tilting degree of the movable seat 420 can also be adjusted through other forms of horizontal adjusting members. Other forms of horizontal adjustment members are, for example, bolts and nuts that are screwed together. The bolts are passed through the movable seat and are locked to the fixed seat. The nut is pivoted to the movable seat and screwed to the bolt. In this way, when the user turns the nut, the level of the movable seat 420 can be adjusted.
此外,在本實施例中,水平調整件的數量為三個,但並不以此為限,在其他實施例中,亦可以為四個以上。In addition, in the present embodiment, the number of the horizontal adjustment members is three, but not limited thereto, and in other embodiments, it may be four or more.
支撐環體500透過組裝環體800固定於活動座420。詳細來說,支撐環體500包含一集光段510及一支撐段520。集光段510具有相對的一第一側511及一第二側512。集光段510之第一側511透過組裝環體800固定於活動座420。集光段510之第二側512連接於支撐段520,且第一側511之內徑大於第二側512之內徑。舉例來說,本實施例之集光段510的外形為中空錐體。支撐段520遠離集光段510之一側圍繞出一透光口521,且支撐段520遠離集光段510之一側用以支撐待測物。此外,本實施例之固定座410亦可搭配升降調整機構,以令支撐環體500可相對基座100升降,以調整支撐環體500對待測物的支撐力。The support ring 500 is fixed to the movable seat 420 through the assembly ring 800. In detail, the support ring body 500 includes a light collecting section 510 and a support section 520. The light collecting section 510 has a first side 511 and a second side 512 opposite to each other. The first side 511 of the light collecting section 510 is fixed to the movable seat 420 through the assembly ring body 800. The second side 512 of the light collecting section 510 is coupled to the support section 520, and the inner diameter of the first side 511 is larger than the inner diameter of the second side 512. For example, the light collecting section 510 of the embodiment has a hollow cone shape. A side of the support section 520 away from the light collecting section 510 surrounds a light transmitting opening 521, and the supporting section 520 is away from one side of the light collecting section 510 for supporting the object to be tested. In addition, the fixing base 410 of the embodiment can also be combined with the lifting adjustment mechanism to enable the supporting ring body 500 to be lifted and lowered relative to the base 100 to adjust the supporting force of the supporting ring body 500 to be tested.
此外,組裝環體800於靠近集光段510之一側具有一裝設斜面810。集光段510罩覆組裝環體800之裝設斜面810,且光源850疊設於裝設斜面810。光源850用以發出之一光線,且光線朝透光口521射出。In addition, the assembly ring body 800 has a mounting slope 810 on one side of the light collecting section 510. The light collecting section 510 covers the mounting slope 810 of the assembly ring body 800, and the light source 850 is stacked on the mounting slope 810. The light source 850 is used to emit a light, and the light is emitted toward the light transmission port 521.
限位板件910具有一第一開孔911及一第二開孔912。第二開孔912之孔徑大於第一開孔911之孔徑。二結合件920之一穿設第一開孔911並鎖合於固定座410。二結合件920之另一可滑移地位於第二開孔912並鎖合於活動座420。The limiting plate member 910 has a first opening 911 and a second opening 912. The aperture of the second opening 912 is larger than the aperture of the first opening 911. One of the two coupling members 920 is disposed through the first opening 911 and is locked to the fixing base 410. The other of the two coupling members 920 is slidably located in the second opening 912 and is locked to the movable seat 420.
第一影像擷取裝置600固定於環形治具300上方。第二影像擷取裝置700固定於環形治具300下方,並透過支撐環體之透光口對準第一影像擷取裝置600。The first image capturing device 600 is fixed above the annular fixture 300. The second image capturing device 700 is fixed under the annular fixture 300 and aligned with the first image capturing device 600 through the light transmission port of the support ring.
在本實施例中,其中第一影像擷取裝置600與第二影像擷取裝置700同軸心。此外,第一影像擷取裝置600例如可另搭配驅動構件,以透過驅動構件來調整第一影像擷取裝置600的位置,並確保第一影像擷取裝置600與第二影像擷取裝置700同軸心。如此一來,將可提升檢測設備10的檢測品質。In this embodiment, the first image capturing device 600 is concentric with the second image capturing device 700. In addition, the first image capturing device 600 can be further configured with a driving member to adjust the position of the first image capturing device 600 through the driving member, and ensure that the first image capturing device 600 is coaxial with the second image capturing device 700. heart. As a result, the detection quality of the detecting device 10 can be improved.
請參閱圖3與圖6。圖6為圖1之檢測設備的使用示意圖。Please refer to Figure 3 and Figure 6. Figure 6 is a schematic view showing the use of the detecting device of Figure 1.
實際在檢測時,支撐環體500之支撐段520會隔著薄膜30支撐晶圓20,以避免支撐段520直接接觸晶圓20而導致晶圓20之損壞。當支撐環體500之支撐段520支撐出之晶圓20相對於第一影像擷取裝置600與第二影像擷取裝置700非呈水平時,則可透過第一水平調整件430a之第一固定螺栓430a1的調整來調整支撐環體500之支撐段520的水平。舉例來說,若支撐環體500之支撐段520靠近第一水平調整件430a的一側水平高度較另一側低時,則可沿箭頭a所指示的方向旋轉第一水平調整件430a之第一固定螺栓430a1。並且,透過彈性件430a2之推抵讓活動座420以第二水平調整件430b之第一萬向接頭430b2為支點,並沿箭頭b所指示的方向旋轉,進而透過活動座420調整支撐環體500之支撐段520的水平。Actually, during the detection, the support section 520 of the support ring 500 supports the wafer 20 via the film 30 to prevent the support section 520 from directly contacting the wafer 20 and causing damage to the wafer 20. When the wafer 20 supported by the support section 520 of the support ring body 500 is not horizontal with respect to the first image capturing device 600 and the second image capturing device 700, the first fixing of the first horizontal adjusting member 430a can be transmitted. Adjustment of the bolt 430a1 adjusts the level of the support section 520 of the support ring 500. For example, if the horizontal height of the support section 520 of the support ring body 500 near the first horizontal adjustment member 430a is lower than the other side, the first horizontal adjustment member 430a can be rotated in the direction indicated by the arrow a. A fixing bolt 430a1. And the movable seat 420 is pushed by the elastic member 430a2 with the first universal joint 430b2 of the second horizontal adjusting member 430b as a fulcrum and rotated in the direction indicated by the arrow b, thereby adjusting the supporting ring body 500 through the movable seat 420. The level of the support section 520.
反之,若支撐環體500之支撐段520靠近第一水平調整件430a的一側水平高度較另一側高時,則可沿箭頭c所指示的方向旋轉第一水平調整件430a之第一固定螺栓430a1。並且,透過第一固定螺栓430a1之推壓讓活動座420以第二水平調整件430b之第一萬向接頭430b2為支點,並沿箭頭d所指示的方向旋轉,進而透過活動座420調整支撐環體500之支撐段520的水平。On the contrary, if the horizontal height of the support section 520 of the support ring body 500 near the first horizontal adjustment member 430a is higher than the other side, the first fixing of the first horizontal adjustment member 430a can be rotated in the direction indicated by the arrow c. Bolt 430a1. And the movable seat 420 is circulated by the first universal joint 430b2 of the second horizontal adjusting member 430b as a fulcrum by the pressing of the first fixing bolt 430a1, and is rotated in the direction indicated by the arrow d, thereby adjusting the support ring through the movable seat 420. The level of the support section 520 of the body 500.
在本實施例中,水平調校是否完成可透過實際拍攝來檢視。並且,待支撐環體500之支撐段520的水平調校完成後,可將各結合件920分別鎖緊於固定座410與活動座420,以固定固定座410與活動座420的位置關係。In this embodiment, whether the horizontal adjustment is completed or not can be viewed through actual shooting. Moreover, after the horizontal adjustment of the support section 520 of the support ring body 500 is completed, each of the joint members 920 can be respectively locked to the fixed seat 410 and the movable seat 420 to fix the positional relationship between the fixed seat 410 and the movable seat 420.
上述實施例中,集光段510之外形為中空錐體,但並不以此為限。請參閱圖7。圖7為根據本發明第二實施例所述之支撐環體的剖面示意圖。本實施例之集光段510’的外形為中空球體。也就是說,集光段510’的集光效果與積分球的集光效果相似。In the above embodiment, the light collecting section 510 is formed as a hollow cone, but is not limited thereto. Please refer to Figure 7. Figure 7 is a schematic cross-sectional view of a support ring body in accordance with a second embodiment of the present invention. The shape of the light collecting section 510' of this embodiment is a hollow sphere. That is to say, the light collecting effect of the collecting section 510' is similar to that of the integrating sphere.
根據上述實施例之檢測設備,透過三個水平調整件來調整活動座與支撐環體的水平,而至少有一個水平調整件係透過鎖合的方式來調整活動座與固定座的位置關係,以在使用最少元件與佔據最小空間的情況下調整活動座與支撐環體的水平。According to the detecting device of the above embodiment, the level of the movable seat and the supporting ring body are adjusted through the three horizontal adjusting members, and at least one horizontal adjusting member adjusts the positional relationship between the movable seat and the fixed seat through the locking manner, Adjust the level of the movable seat and the support ring with minimal components and minimal space.
雖然本發明以前述之較佳實施例揭露如上,然其並非用以限定本發明,任何熟習相像技藝者,在不脫離本發明之精神和範圍內,當可作些許之更動與潤飾,因此本發明之專利保護範圍須視本說明書所附之申請專利範圍所界定者為準。While the present invention has been described above in terms of the preferred embodiments thereof, it is not intended to limit the invention, and the invention may be modified and modified without departing from the spirit and scope of the invention. The patent protection scope of the invention is subject to the definition of the scope of the patent application attached to the specification.
10‧‧‧檢測設備10‧‧‧Testing equipment
100‧‧‧基座100‧‧‧Base
200‧‧‧旋轉台200‧‧‧Rotating table
300‧‧‧環形治具300‧‧‧Round fixture
400‧‧‧水平調整組件400‧‧‧Horizontal adjustment components
410‧‧‧固定座410‧‧‧ fixed seat
420‧‧‧活動座420‧‧‧ activity seat
430a‧‧‧第一水平調整件430a‧‧‧First level adjustment
430a1‧‧‧第一固定螺栓430a1‧‧‧First fixing bolt
430a2‧‧‧彈性件430a2‧‧‧Flexible parts
430b‧‧‧第二水平調整件430b‧‧‧Second level adjustment
430b1‧‧‧第二固定螺栓430b1‧‧‧Second fixing bolt
430b2‧‧‧第一萬向接頭430b2‧‧‧1st universal joint
430b3‧‧‧第二萬向接頭430b3‧‧‧2nd universal joint
500‧‧‧支撐環體500‧‧‧Support ring
510‧‧‧集光段510‧‧‧Lighting section
511‧‧‧第一側511‧‧‧ first side
512‧‧‧第二側512‧‧‧ second side
520‧‧‧支撐段520‧‧‧Support section
521‧‧‧透光口521‧‧‧Lighting mouth
600‧‧‧第一影像擷取裝置600‧‧‧First image capture device
700‧‧‧第二影像擷取裝置700‧‧‧Second image capture device
800‧‧‧組裝環體800‧‧‧Assembly ring
810‧‧‧裝設斜面810‧‧‧Installed bevel
850‧‧‧光源850‧‧‧Light source
910‧‧‧限位板件910‧‧‧Limited plate
911‧‧‧第一開孔911‧‧‧ first opening
912‧‧‧第二開孔912‧‧‧Second opening
920‧‧‧結合件920‧‧‧Connected parts
圖1為根據本發明第一實施例所述之檢測設備的前視示意圖。 圖2為圖1之水平調整組件與支撐環體的立體示意圖。 圖3為圖2之分解示意圖。 圖4為圖2之上視示意圖。 圖5為沿圖4之5-5割面線所繪示的剖面示意圖。 圖6為圖1之檢測設備的使用示意圖。 圖7為根據本發明第二實施例所述之支撐環體的剖面示意圖。1 is a front elevational view of a detecting apparatus according to a first embodiment of the present invention. 2 is a perspective view of the horizontal adjustment assembly and the support ring of FIG. 1. Figure 3 is an exploded perspective view of Figure 2. Figure 4 is a top plan view of Figure 2. Figure 5 is a cross-sectional view taken along line 5-5 of Figure 4; Figure 6 is a schematic view showing the use of the detecting device of Figure 1. Figure 7 is a schematic cross-sectional view of a support ring body in accordance with a second embodiment of the present invention.
Claims (10)
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TW105134349A TWI611177B (en) | 2016-10-24 | 2016-10-24 | Detecting equipment |
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TW105134349A TWI611177B (en) | 2016-10-24 | 2016-10-24 | Detecting equipment |
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TWI611177B TWI611177B (en) | 2018-01-11 |
TW201816391A true TW201816391A (en) | 2018-05-01 |
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CN110823055A (en) * | 2018-08-13 | 2020-02-21 | 奇景光电股份有限公司 | Measuring jig |
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US6809809B2 (en) * | 2000-11-15 | 2004-10-26 | Real Time Metrology, Inc. | Optical method and apparatus for inspecting large area planar objects |
TWM323343U (en) * | 2007-03-12 | 2007-12-11 | Wu Jiun Nan | Improvement for imaging apparatus of device examination |
CN201355404Y (en) * | 2009-02-24 | 2009-12-02 | 南京东利来光电实业有限责任公司 | Dark field lighting object lens device |
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