TW201803266A - Processes for surface mount quartz crystal resonator whole up panel apparatus and method - Google Patents
Processes for surface mount quartz crystal resonator whole up panel apparatus and method Download PDFInfo
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- 239000010453 quartz Substances 0.000 title claims abstract description 33
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 title claims abstract description 33
- 238000000034 method Methods 0.000 title claims abstract description 31
- 239000013078 crystal Substances 0.000 title claims abstract description 27
- 235000012431 wafers Nutrition 0.000 claims abstract description 149
- 238000000576 coating method Methods 0.000 claims abstract description 79
- 239000011248 coating agent Substances 0.000 claims abstract description 76
- 238000004519 manufacturing process Methods 0.000 claims abstract description 24
- 238000001179 sorption measurement Methods 0.000 claims abstract description 20
- NJPPVKZQTLUDBO-UHFFFAOYSA-N novaluron Chemical compound C1=C(Cl)C(OC(F)(F)C(OC(F)(F)F)F)=CC=C1NC(=O)NC(=O)C1=C(F)C=CC=C1F NJPPVKZQTLUDBO-UHFFFAOYSA-N 0.000 claims description 19
- 229910052751 metal Inorganic materials 0.000 claims description 18
- 239000002184 metal Substances 0.000 claims description 18
- 239000000758 substrate Substances 0.000 claims description 7
- 230000000149 penetrating effect Effects 0.000 claims description 2
- 238000003825 pressing Methods 0.000 claims 1
- 239000002987 primer (paints) Substances 0.000 description 18
- 239000011159 matrix material Substances 0.000 description 14
- 238000010586 diagram Methods 0.000 description 4
- 239000000853 adhesive Substances 0.000 description 3
- 230000001070 adhesive effect Effects 0.000 description 3
- 239000000178 monomer Substances 0.000 description 3
- 239000000919 ceramic Substances 0.000 description 2
- 239000003292 glue Substances 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 238000005507 spraying Methods 0.000 description 2
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 1
- 230000003321 amplification Effects 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000004744 fabric Substances 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 238000003199 nucleic acid amplification method Methods 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 238000005070 sampling Methods 0.000 description 1
- 229910052709 silver Inorganic materials 0.000 description 1
- 239000004332 silver Substances 0.000 description 1
- 239000013589 supplement Substances 0.000 description 1
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H3/00—Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators
- H03H3/007—Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators for the manufacture of electromechanical resonators or networks
- H03H3/02—Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators for the manufacture of electromechanical resonators or networks for the manufacture of piezoelectric or electrostrictive resonators or networks
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
- H03H9/15—Constructional features of resonators consisting of piezoelectric or electrostrictive material
- H03H9/17—Constructional features of resonators consisting of piezoelectric or electrostrictive material having a single resonator
- H03H9/19—Constructional features of resonators consisting of piezoelectric or electrostrictive material having a single resonator consisting of quartz
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Abstract
Description
本發明屬於電子元器件領域,尤其涉及表面貼石英晶體諧振器生產中整板上片裝置及方法。The invention belongs to the field of electronic components, and in particular relates to a device and method for a whole plate in the production of surface-mounted quartz crystal resonators.
石英晶體諧振器又稱為石英晶體,俗稱晶振,是利用石英晶體的壓電效應而製成的諧振元,與半導體器件和阻容元件一起使用,便可構成石英晶體振盪器。Quartz crystal resonators are also called quartz crystals, commonly known as crystal oscillators. They are resonators made using the piezoelectric effect of quartz crystals. They can be used together with semiconductor devices and RC elements to form quartz crystal oscillators.
石英晶片,以下簡稱為晶片,它可以是正方形、矩形或圓形等,在它的兩個對應面上塗敷銀層作為電極,表面貼石英晶體諧振器是通過導電膠將石英晶片上的電極和基座進行電連接,在基座上塗底膠,形成石英晶片下方導電膠,將石英晶片方在底膠上方,並且石英晶片上的副電極塗上膠,形成石英晶片上方導電膠。Quartz wafer, hereinafter referred to as wafer, it can be square, rectangular or circular, etc., silver electrodes are coated on its two corresponding faces, and the quartz crystal resonator on the surface is the electrode on the quartz wafer and The base is electrically connected, and a primer is coated on the base to form a conductive adhesive below the quartz wafer. The quartz wafer is above the primer, and the secondary electrode on the quartz wafer is coated to form a conductive adhesive above the quartz wafer.
CCD作為圖像傳感器,也叫圖像控制器,是一種半導體器件,能夠把光學影像轉化為數字信號。一塊CCD上包含的像素數越多,其提供的畫面分辨率也就越高。CCD的作用就像膠片一樣,但它是把光信號轉換成電荷信號。CCD上有許多排列整齊的光電二極管,能感應光線,並將光信號轉變成電信號,經外部採樣放大及模數轉換電路轉換成數字圖像信號。CCD as an image sensor, also called an image controller, is a semiconductor device that can convert optical images into digital signals. The more pixels a CCD contains, the higher the resolution it provides. CCD works like film, but it converts light signals into charge signals. There are many neatly arranged photodiodes on the CCD, which can sense light and convert the light signal into an electrical signal, which is converted into a digital image signal by external sampling amplification and analog-to-digital conversion circuits.
對於將石英晶片固定在基座上,目前一直採用從鍍膜夾具中逐一吸取晶片再放置在基座內的生產方法。主要工藝為:直接從鍍膜夾具中逐一吸取晶片,移至CCD檢測並旋轉角度,當CCD識別晶片合格後,逐一搭載在點好底膠的基座內。For the fixing of the quartz wafer on the base, the production method of sucking the wafers from the coating fixture one by one and then placing them in the base has been adopted. The main process is: directly pick up the wafers one by one from the coating fixture, move them to the CCD for detection and rotate the angle. After the CCD recognizes the wafers as qualified, mount them one by one in the base of the primed adhesive.
但是,目前這種逐一吸取晶片工藝存在以下問題:However, the current process of sucking wafers one by one has the following problems:
1、單只晶片逐一吸取、放置時間約0.6s,移載整板夾具(以400pcs為例)晶片時間為240s,生產效率低。1. Individual wafers are sucked one by one, and the time is about 0.6s. The wafer time for transferring the whole board fixture (taking 400pcs as an example) is 240s, and the production efficiency is low.
2、由於生產效率低流轉緩慢,鍍膜夾具需要量大。2. Due to the low production efficiency and slow flow, the coating fixture needs a large amount.
針對現有技術的不足,本發明提供表面貼石英晶體諧振器生產中的整板上片裝置及方法,用於表面貼石英晶體諧振器的基座整板加工,實現鍍膜後晶片直接從鍍膜夾具內整板移置到基座整板內。In view of the shortcomings of the prior art, the present invention provides a whole-plate device and method for the production of surface-mounted quartz crystal resonators, which are used for the entire processing of the base of the surface-mounted quartz crystal resonators, so that the coated wafers can be directly from the coating fixture The whole plate is moved into the whole plate of the base.
為解決上述技術問題,本發明提供的表面貼石英晶體諧振器生產中整板上片裝置,其特殊之處在於:包括固定裝置、位於固定裝置內部的吸附裝置、與固定裝置可拆卸連接的移動裝置,在移動裝置上設置有用於貼裝在基座整板1上的整板晶片,所述整板晶片由多個晶片4形成,所述吸附裝置與移動裝置上的整板晶片相接觸。In order to solve the above technical problems, the entire on-board device in the production of the surface-mounted quartz crystal resonator provided by the present invention is special in that it includes a fixing device, an adsorption device located inside the fixing device, and a movement detachably connected to the fixing device. The device is provided on the mobile device with a whole plate wafer for mounting on the base plate 1. The whole plate wafer is formed of a plurality of wafers 4, and the adsorption device is in contact with the whole plate wafer on the mobile device.
進一步地,所述固定裝置為吸盒12,所述吸附裝置包括位於貫穿吸盒12上表面的金屬棒7、位於金屬棒7頂端的吸嘴13、套設在金屬棒7上的彈簧9,金屬棒7底端與真空系統連接,吸嘴13頂端與移動裝置內的整板晶片一一對應。Further, the fixing device is a suction box 12, which includes a metal rod 7 penetrating the upper surface of the suction box 12, a suction nozzle 13 located at the top of the metal rod 7, and a spring 9 sleeved on the metal rod 7, The bottom end of the metal rod 7 is connected to the vacuum system, and the top end of the suction nozzle 13 corresponds to the entire plate wafer in the mobile device one-to-one.
進一步地,所述移動裝置為鍍膜夾具10,鍍膜夾具10上每個晶片4的行列間距是基座整板1中單體基座1-1的行列間距整數倍。Further, the moving device is a coating jig 10, and a row-to-column spacing of each wafer 4 on the coating jig 10 is an integer multiple of a row-to-column spacing of a single base 1-1 in the entire pedestal 1.
進一步地,吸盒12上還設置有定位裝置,所述定位裝置為設置在吸盒上的多個定位針8,定位針8分別與基座整板上相應的載盤定位孔1-2對應。Further, the suction box 12 is further provided with a positioning device. The positioning device is a plurality of positioning pins 8 provided on the suction box, and the positioning pins 8 correspond to the corresponding tray positioning holes 1-2 on the base plate. .
進一步地,所述鍍膜夾具10上設置有與基座整板1上的基座整板定位孔1-3一致的鍍膜夾具定位孔11。Further, the coating fixture 10 is provided with a coating fixture positioning hole 11 that is consistent with the base whole plate positioning holes 1-3 on the base whole plate 1.
本發明提供表面貼石英晶體諧振器生產中整板上片方法,其特殊之處在於:多個晶片形成整板晶片,整體移動整板晶片使得整板晶片中每個晶片正下方都有一個單體基座與之對應。The present invention provides a method for manufacturing a whole plate on a surface-mounted quartz crystal resonator, which is special in that a plurality of wafers form a whole plate wafer and the whole plate wafer is moved as a whole so that there is a single sheet directly below each wafer in the whole plate wafer The body base corresponds to it.
進一步地,整體移動整板晶片至基座整板上,包括以下步驟:Further, moving the entire plate wafer to the entire substrate plate includes the following steps:
步驟1、將整板晶片整體移動在帶有吸附裝置的固定裝置內,通過吸附裝置吸住整板晶片;Step 1. Move the entire wafer as a whole in a fixing device with an adsorption device, and suck the entire wafer through the adsorption device;
步驟2、下壓吸附裝置,使每個晶片接觸其對應的單體基座左右平臺上的底膠;Step 2. Press down the adsorption device so that each wafer contacts the primer on the left and right platforms of the corresponding single base;
步驟3、分離吸附裝置與整板晶片,整板晶片移載在基座整板內的每個單體基座上。Step 3: The adsorption device is separated from the entire plate wafer, and the entire plate wafer is transferred on each unit base in the entire plate of the base.
進一步地,在步驟1中整板晶片是通過移動裝置整體移動在固定裝置內的吸附裝置上方。Further, in step 1, the entire wafer is moved over the adsorption device in the fixed device by the mobile device as a whole.
進一步地,在步驟1中通過電氣裝置或人工操作將移動裝置安裝在固定裝置內。Further, in step 1, the mobile device is installed in the fixed device by an electric device or a manual operation.
進一步地,所述移動裝置為鍍膜夾具,其製作滿足以下條件:Further, the moving device is a coating fixture, and the manufacturing meets the following conditions:
鍍膜夾具與基座整板尺寸一致;The size of the coating fixture is the same as that of the base plate;
鍍膜夾具上每個晶片的行列間距是基座整板中單體基座的行列間距整數倍;The row and column spacing of each wafer on the coating fixture is an integer multiple of the row and column spacing of the individual pedestals in the entire pedestal;
鍍膜夾具上的定位孔與基座整板上的定位孔一致。The positioning holes on the coating fixture are consistent with the positioning holes on the entire base plate.
進一步地,在步驟2中,下壓吸附裝置前,將固定裝置中的吸附裝置位於整板晶片的上方,整板晶片中每個晶片的下方對應基座整板中相應單體基座的位置。Further, in step 2, before the adsorption device is pressed down, the adsorption device in the fixing device is positioned above the entire wafer, and the lower part of each wafer in the entire wafer corresponds to the position of the corresponding single substrate in the entire substrate. .
進一步地,在步驟1中製作的固定裝置為吸盒,吸附裝置為位於吸盒內的吸嘴,吸盒下端與真空系統連接,吸盒內部的吸嘴與移動裝置內的整板晶片一一對應,吸盒上的定位裝置與基座整板載盤的定位孔一致。Further, the fixing device manufactured in step 1 is a suction box, the suction device is a suction nozzle located in the suction box, the lower end of the suction box is connected to a vacuum system, and the suction nozzle inside the suction box is connected to the entire board wafer in the moving device one by one. Correspondingly, the positioning device on the suction box is consistent with the positioning hole of the whole plate on the base plate.
進一步地,在步驟2中通過電氣裝置或人工操作移動吸盒,使得整板晶片位於基座整板上方。Further, in step 2, the suction box is moved by an electric device or a manual operation, so that the entire plate wafer is located above the entire plate of the base.
本發明與現有技術相比,其有益之處在於:本發明採用整板移載多個晶片工藝,將多個晶片在鍍膜夾具上形成整板晶片,通過鍍膜夾具將整板晶片放置在吸盒內固定,每個吸嘴對應有一個晶片,通過翻轉,將整板晶片放置在帶有底膠的基座整板上,這樣可以縮短放置大量晶片的時間,提高貼片速度,生產效率提高幾十至上百倍,同時擴大貼片生產量。Compared with the prior art, the present invention is beneficial in that the present invention adopts a process of transferring a plurality of wafers on a whole plate, forming a plurality of wafers on a coating fixture, and placing the entire plate on a suction box through the coating fixture. Internally fixed, each nozzle corresponds to a wafer, and by turning, the entire wafer is placed on the base plate with the primer. This can shorten the time for placing a large number of wafers, increase the placement speed, and increase production efficiency. Ten to hundreds of times, while expanding the production of SMD.
以下參照附圖1至附圖6,給出本發明的具體實施方式,用來對本發明做進一步說明。The following describes specific embodiments of the present invention with reference to FIGS. 1 to 6 to further explain the present invention.
本發明中的晶片就是石英晶體諧振器,關於用於表面貼石英晶體諧振器的基座整板,在本發明中基座整板的具體形式為:在陶瓷大板上通過加工成按矩陣排布連接的結構單元,每個結構單元作為一個獨立的單體基座,由此形成的陶瓷大板作為本發明的基座整板。The wafer in the present invention is a quartz crystal resonator. Regarding the entire base plate for a surface-mounted quartz crystal resonator, the specific form of the base plate in the present invention is: processed on a large ceramic plate into a matrix array. The structural units connected by cloth, each structural unit serves as an independent single base, and the ceramic large plate formed thereby serves as the entire base plate of the present invention.
在本發明的整板晶片的具體形式為:在鍍膜夾具上按照矩陣排布的多個晶片形成整板晶片,每個結構單元作為一個獨立的每個晶片,由此形成本發明的整板晶片。The specific form of the whole board wafer of the present invention is: forming a whole board wafer from a plurality of wafers arranged in a matrix on a coating fixture, and each structural unit is regarded as an independent each wafer, thereby forming the whole board wafer of the present invention. .
在本實施例中提供表面貼石英晶體諧振器生產中整板上片工藝方法,是對表面貼石英晶體諧振器生產中上片階段的改進,對於生產中的其他步驟,如塗布底膠的工藝,不再詳細展開描述,僅用來對本發明的工藝進行輔助說明。The present embodiment provides a method for manufacturing the entire plate on the surface-mounted quartz crystal resonator, which is an improvement on the loading stage in the production of surface-mounted quartz crystal resonators. For other steps in production, such as the process of applying primer It will not be described in detail any more, and is only used to supplement the description of the process of the present invention.
在本發明中基座整板上是按M*N矩陣排布連接的單體基座,M、N的初始值均為1,M、N均為非零自然數,M為行數且M的最大值為矩陣的行數,N為列數且N的最大值為矩陣的列數,即1≤M≤行數,1≤N≤列數,對於基座整板上的每個單體基座採用 表達, 是位於基座整板第M行第N列的單體基座。In the present invention, the entire pedestal is a single pedestal connected in an M * N matrix arrangement. The initial values of M and N are both 1, M and N are non-zero natural numbers, M is the number of rows, and M The maximum value is the number of rows in the matrix, N is the number of columns, and the maximum value of N is the number of columns in the matrix, that is, 1 ≤ M ≤ number of rows, 1 ≤ N ≤ number of columns. The pedestal is expressed as a single pedestal located in the Mth row and Nth column of the entire pedestal.
在本發明中移動裝置採用的鍍膜夾具,固定裝置採用帶有吸嘴的吸盒,為便於移動整板晶片至固定裝置內,也可採用其它類型的裝置,或者手動移動。固定裝置不局限於吸盒,只要在固定裝置內部只要配有多個吸嘴就可以,真空系統在圖中未示出,位於吸盒內部,具體安裝位置不受限制,只要能控制吸嘴與晶片之間的吸附即可。真空系統既可以作為吸盒的一部分位於吸盒內部,也可以作為獨立的結構位於吸盒外部。In the present invention, the coating fixture used by the mobile device and the suction device with a suction nozzle are used for the fixing device. In order to facilitate the movement of the entire wafer into the fixing device, other types of devices can also be used, or they can be moved manually. The fixing device is not limited to the suction box, as long as multiple suction nozzles are provided inside the fixing device. The vacuum system is not shown in the figure and is located inside the suction box. The specific installation position is not limited, as long as the nozzle and the Adsorption between wafers is sufficient. The vacuum system can be located inside the suction box as part of the suction box or outside the suction box as a separate structure.
鍍膜夾具上的整板晶片為P*Q矩陣,P為行數且P的最大值為矩陣的行數,Q為列數且Q的最大值為矩陣的列數,即1≤P≤行數,1≤Q≤列數,對於整板晶片上的每個晶片採用 表達, 是位於鍍膜夾具第P行第Q列的每個晶片。The entire wafer on the coating fixture is a P * Q matrix, P is the number of rows and the maximum value of P is the number of rows in the matrix, Q is the number of columns and the maximum value of Q is the number of columns in the matrix, that is, 1≤P≤number of rows , 1 ≤ Q ≤ the number of columns. For each wafer on the entire wafer, the expression is used. Each wafer is located in the P-th row and Q-th column of the coating fixture.
本發明中的鍍膜夾具要滿足以下條件:The coating fixture in the present invention must meet the following conditions:
1、要求鍍膜夾具與基座整板尺寸一致;1. It is required that the size of the coating fixture and the base plate are the same;
2、鍍膜夾具的行列間距是基座整板的行列間距整數倍,即P為M的整數倍,Q為N的整數倍。鍍膜夾具為多層結構,在鍍膜夾具晶片層上方的一層,每兩行之間設置有一行磁片,磁片的數目與該行每個晶片的數目一致,每個磁片對應有每個晶片,可以將每個晶片固定在鍍膜夾具上形成整板晶片;2. The row and column spacing of the coating fixture is an integer multiple of the row and column spacing of the entire base plate, that is, P is an integer multiple of M and Q is an integer multiple of N. The coating fixture is a multilayer structure. One layer above the wafer layer of the coating fixture is provided with a row of magnetic sheets between each two rows. The number of magnetic sheets is the same as the number of each wafer in the row. Each magnetic sheet corresponds to each wafer. Each wafer can be fixed on a coating jig to form a whole board wafer;
3、鍍膜夾具定位孔與基座整板定位孔一致。3. The positioning hole of the coating fixture is the same as the positioning hole of the base plate.
本發明中固定夾具的吸盒要滿足以下條件The suction box of the fixed fixture in the present invention must meet the following conditions
1、吸盒下端與真空系統連接,通過電氣裝置可做180°翻轉;1. The lower end of the suction box is connected to the vacuum system, and can be turned 180 ° through electrical devices;
2、吸盒內部有彈性下壓的吸嘴與鍍膜夾具內晶片一一對應;2. The suction nozzle with elastic down inside the suction box corresponds to the wafer in the coating fixture one-to-one;
3、吸盒上的定位裝置與基座整板載盤的定位孔一致。3. The positioning device on the suction box is consistent with the positioning hole of the whole plate on the base.
在本發明中吸盒上表面的四個角部均設置有定位裝置,在定位裝置之間的區域均勻排布有金屬棒,金屬棒貫穿吸盒上表面,在吸盒上表面的上方,每個金屬棒的頂部設置有吸嘴,在吸盒上表面的下方,每個金屬棒上套接有彈簧並固定在吸盒內,金屬棒底端設置有真空系統。在本發明中定位裝置為設置在吸盒上的多個定位針,定位針分別與基座整板相應的載盤定位孔對應,這樣在吸盒的吸嘴位於晶片上方時,定位針與載盤定位孔扣合,可以將吸盒固定在基座整板上。In the present invention, four corners of the upper surface of the suction box are provided with positioning devices, and metal rods are evenly arranged in the area between the positioning devices. The metal rods penetrate the upper surface of the suction box, and above the upper surface of the suction box, each A suction nozzle is provided on the top of each metal rod. Below the upper surface of the suction box, a spring is sleeved on each metal rod and fixed in the suction box. A vacuum system is provided at the bottom end of the metal rod. In the present invention, the positioning device is a plurality of positioning pins provided on the suction box, and the positioning pins respectively correspond to the corresponding tray positioning holes of the entire plate of the base, so that when the suction nozzle of the suction box is located above the wafer, the positioning pins and the carrier The disk positioning holes are fastened, and the suction box can be fixed on the whole plate of the base.
在本發明中基座整板的載盤兩側邊共有4個載盤定位孔,具體為載盤定位孔P1、載盤定位孔P2、載盤定位孔P3、載盤定位孔P4,對稱分佈在載盤兩側邊,用來與吸盒的四個定位針相扣合。In the present invention, there are 4 tray positioning holes on both sides of the tray of the base plate, specifically, tray positioning holes P1, tray positioning holes P2, tray positioning holes P3, and tray positioning holes P4, which are symmetrically distributed. On both sides of the carrier, it is used to engage with the four positioning pins of the suction box.
鍍膜夾具上設置有與基座整板上的基座整板定位孔一致的鍍膜夾具定位孔,當吸盒固定在基座整板上時,基座整板定位孔與鍍膜夾具定位孔的扣合,可以確保鍍膜夾具的穩定,有利於每個晶片與其對應的單體基座對應。The coating fixture is provided with a positioning hole for the coating fixture which is consistent with the positioning hole of the base plate on the base plate. When the suction box is fixed on the base plate, the positioning hole of the base plate and the positioning hole of the coating plate Together, it can ensure the stability of the coating fixture, which is conducive to each wafer corresponding to its corresponding single base.
按照以上基座整板、鍍膜夾具、吸盒的規格對本發明中的實施方式進行說明。The embodiments of the present invention will be described according to the specifications of the entire base plate, the coating jig, and the suction box.
在利用鍍膜夾具移動整板晶片之前,按照以下步驟對基座整板塗布底膠:Before using the coating fixture to move the entire plate of wafer, follow the steps below to apply primer to the entire plate of the pedestal:
步驟1、將準備好的基座整板放置到基座提籠內等待塗布底膠;Step 1. Place the prepared whole base plate into the base cage and wait for the primer to be applied;
步驟2、根據膠點大小位置調整噴膠時間和噴膠位置;Step 2. Adjust the glue spraying time and position according to the size of the glue dot;
步驟3、基座整板內每個單體基座的左右平臺上塗布底膠。Step 3. Apply primer to the left and right platforms of each single base in the whole base plate.
實施例1Example 1
在本實施例中鍍膜夾具上的整板晶片行列與基座整板的行列間距相同,即完成基座整板上的全部單體基座的塗布底膠工藝後,對全部的單體基座同時進行上片工藝,在本實施例中鍍膜夾具上的整板晶片為P*Q矩陣,基座整板上是M*N矩陣,P=M,Q=N,當基座整板上的每個單體基座的左右平臺均塗布底膠後,按照以下步驟進行整板晶片的移動與放置,具體上片過程如下:In this embodiment, the rows and columns of the entire wafer on the coating fixture are the same as the rows and columns of the entire pedestal. That is, after the primer coating process is completed for all the individual pedestals on the entire pedestal of the pedestal, all the individual pedestals are coated. At the same time, the wafer loading process is performed. In this embodiment, the entire wafer on the coating fixture is a P * Q matrix, and the entire base plate is an M * N matrix, P = M, Q = N. After the primer is coated on the left and right platforms of each monomer base, the entire wafer is moved and placed according to the following steps. The specific loading process is as follows:
步驟1、將放置在鍍膜夾具內的整板晶片放置到晶片提籠內,整板晶片上每個晶片的個數、吸盒內吸嘴的數目以及整板基座上單體基座的數目保持一致;Step 1. Place the entire plate of wafers placed in the coating fixture into the wafer cage, the number of each wafer on the whole plate of wafers, the number of nozzles in the suction box, and the number of individual pedestals on the whole plate base be consistent;
步驟2、通過機械手將帶有整板晶片的鍍膜夾具安裝在吸盒內,開啟真空系統,通過吸盒內的吸嘴吸住晶片,吸盒內每一個金屬棒頂端的吸嘴對應鍍膜夾具上的每個晶片,揭去上鍍膜夾具的上電極蓋板;Step 2: Install the coating fixture with the entire plate of wafer in the suction box by a robotic hand, turn on the vacuum system, and suck the wafer through the suction nozzle in the suction box. The suction nozzle at the top of each metal rod in the suction box corresponds to the coating fixture. On each wafer, remove the upper electrode cover of the upper coating fixture;
步驟3、通過機械手翻轉吸盒,通過定位針使吸盒與基座整板載盤重合,鍍膜夾具與基座整板重合;從而每個晶片與基座整板內的單體基座一一對應;Step 3: The suction box is turned over by a robotic arm, and the suction box is overlapped with the whole plate carrier plate by the positioning pin, and the coating fixture is overlapped with the whole plate of the base plate; One correspondence
步驟4、下壓吸嘴,使每個晶片接觸對應的單體基座左右平臺的底膠;Step 4. Press down the suction nozzle so that each wafer contacts the primer on the left and right platforms of the corresponding single base;
步驟5、對吸盒破真空後,每個吸嘴對每個晶片失去吸力,吸盒與鍍膜夾具離開基座整板的載盤,整板晶片移載在基座整板內的每個單體基座上。Step 5. After breaking the vacuum of the suction box, each suction nozzle loses suction to each wafer, the suction box and the coating fixture leave the carrier plate of the entire plate of the base, and the entire wafer is transferred to each unit of the whole plate of the base. Body base.
在本實施例中將鍍膜夾具安裝在吸盒內,以及翻轉吸盒均通過電氣裝置實現,具體使用機械手來操作。In this embodiment, the coating fixture is installed in the suction box, and the suction box is turned over by an electrical device, which is specifically operated using a robot hand.
實施例2Example 2
在本實施例,鍍膜夾具上的整板晶片移動至基座整板上的過程類似於實施例1,不同之處在於,本實施例中鍍膜夾具上的整板晶片行列為基座整板的行列間距兩倍,對於鍍膜夾具上的整板晶片為P*Q矩陣,基座整板上是M*N矩陣,P=2M,Q=2N,即完成基座整板上的全部單體基座的塗布底膠工藝後,對位於基座整板上奇數行奇數列或偶數行偶數列的單體基座同時進行上片工藝。在本實施例中選擇先對基座整板上奇數行奇數列的單體基座上片,之後再對基座整板上偶數行偶數列的單體基座上片In this embodiment, the process of moving the entire plate wafer on the coating fixture to the entire base plate is similar to that in Embodiment 1, except that in this embodiment, the entire plate wafer on the coating fixture is the same as the entire plate on the base plate. The distance between rows and columns is twice. For the whole plate wafer on the coating fixture, it is a P * Q matrix, and the whole pedestal plate is a M * N matrix, P = 2M, Q = 2N. After the primer coating process of the base, the monolithic base on the odd-numbered rows and even-numbered columns or even-numbered rows and even-numbered columns on the whole board of the base is simultaneously subjected to the loading process. In this embodiment, the monolithic base with odd rows and odd columns on the entire base plate is selected to be loaded, and then the monolithic base with even rows and even columns is placed on the entire base plate.
當基座整板上的每個單體基座的左右平臺均塗布底膠後,按照以下步驟進行整板晶片的移動與放置,具體上片過程如下:After the primer is coated on the left and right platforms of each single base on the whole pedestal of the pedestal, the whole plate is moved and placed according to the following steps. The specific loading process is as follows:
步驟1、將放置在鍍膜夾具內的整板晶片放置到晶片提籠內,整板晶片上每個晶片的個數、吸盒內吸嘴的數目一致,並且每個晶片與整板基座上奇數行奇數列單體基座的數目保持一致;Step 1. Place the entire wafer placed in the coating fixture into the wafer cage. The number of each wafer on the entire wafer and the number of suction nozzles in the suction box are the same, and each wafer is on the whole board base. The number of single-element bases in odd rows and odd columns remains the same;
步驟2、通過機械手將帶有整板晶片的鍍膜夾具安裝在吸盒內,通過吸盒內的吸嘴吸住晶片,吸盒內每一個金屬棒頂端的吸嘴對應鍍膜夾具上的每個晶片,揭去上鍍膜夾具的上電極;Step 2: Install the coating fixture with the entire plate of wafer in the suction box by the robot, and suck the wafer through the suction nozzle in the suction box. The suction nozzle on the top of each metal rod in the suction box corresponds to each of the coating fixtures. Wafer, peel off the upper electrode of the upper coating fixture;
步驟3、通過機械手翻轉吸盒,通過定位針使吸盒與基座整板載盤重合,鍍膜夾具與基座整板重合;從而每個晶片與基座整板內的單體基座一一對應;Step 3: The suction box is turned over by a robotic arm, and the suction box is overlapped with the whole plate carrier plate by the positioning pin, and the coating fixture is overlapped with the whole plate of the base plate; One correspondence
步驟4、下壓吸嘴,使每個晶片接觸對應的單體基座左右平臺的底膠;Step 4. Press down the suction nozzle so that each wafer contacts the primer on the left and right platforms of the corresponding single base;
步驟5、對吸盒破真空後,每個吸嘴對每個晶片失去吸力,吸盒與鍍膜夾具離開基座整板的載盤,整板晶片移載在基座整板內位於奇數行奇數列的每個單體基座上;Step 5. After breaking the vacuum of the suction box, each suction nozzle loses the suction power for each wafer, the suction box and the coating fixture leave the carrier plate of the entire plate of the base, and the entire wafer is transferred in the whole plate of the base in odd rows and odd rows. A series of individual cell bases;
步驟6、返回步驟1,再次在鍍膜夾具上放置整板晶片,重複動作步驟1至步驟5,在此步驟中,吸盒翻轉後,位於鍍膜夾具上的每個晶片與整板基座上偶數行偶數列的單體基座對應。Step 6. Return to step 1 and place the entire plate of wafers on the coating fixture again. Repeat steps 1 to 5. In this step, after the suction box is turned over, each wafer on the coating fixture is even-numbered on the whole plate base. Corresponds to the unit base of even-numbered columns.
根據以上步驟完成基座整板上全部單體基座的上片工作。Follow the above steps to complete the work of loading all the single bases on the entire base plate.
實施例3Example 3
在本實施例,鍍膜夾具上的整板晶片移動至基座整板上的過程類似於實施例1,不同之處在於,在本實施例中將鍍膜夾具安裝在吸盒內,以及翻轉吸盒均通過手動實現。In this embodiment, the process of moving the entire plate wafer on the coating fixture to the entire plate of the base is similar to that in Embodiment 1, except that in this embodiment, the coating fixture is installed in the suction box, and the suction box is turned over. This is done manually.
此外,本實施例中鍍膜夾具上的整板晶片行列為基座整板的行列間距3倍,對於鍍膜夾具上的整板晶片為P*Q矩陣,基座整板上是M*N矩陣,P=3M,Q=3N,即完成基座整板上的全部單體基座的塗布底膠工藝後,對位於基座整板上相隔兩行相隔兩列的單體基座同時進行上片工藝。以12*12的基座整板為例,在本實施例中選擇先對基座整板第1、4、7、10行,第1、4、7、10列上的單體基座整體上片,之後再對基座整板第2、5、8、11行,第2、5、8、11列上的單體基座整體上片,最後對基座整板第3、6、9、12行,第3、6、9、12列上的單體基座整體上片。In addition, in this embodiment, the rows and columns of the entire wafer on the coating fixture are 3 times the row and column spacing of the entire plate of the pedestal. For the entire wafer on the coating fixture, it is a P * Q matrix, and the entire substrate on the base is an M * N matrix. P = 3M, Q = 3N, that is, after completing the primer coating process for all the monomer bases on the entire base plate, the single bases located on the base plate are separated by two rows and two columns at the same time. Craft. Taking the base plate of 12 * 12 as an example, in this embodiment, the entire base of the base plate on the first, fourth, seventh, and tenth rows, and on the first, fourth, seventh, and tenth columns of the whole base is selected. Load the film, and then load the entire base plate on rows 2, 5, 8, 11 and 2, 5, 8, and 11 as a whole. Finally, load the base plate on rows 3, 6, and Rows 9, 12 and 3, 6, 9, 12 are monolithic bases on the whole.
當基座整板上的每個單體基座的左右平臺均塗布底膠後,按照以下步驟進行整板晶片的移動與放置,具體上片過程如下:After the primer is coated on the left and right platforms of each single base on the whole pedestal of the pedestal, the whole plate is moved and placed according to the following steps. The specific loading process is as follows:
步驟1、將放置在鍍膜夾具內的整板晶片放置到晶片提籠內,整板晶片上每個晶片的個數、吸盒內吸嘴的數目一致,並且每個晶片與整板基座上第1、4、7、10行,第1、4、7、10列單體基座的數目保持一致;Step 1. Place the entire wafer placed in the coating fixture into the wafer cage. The number of each wafer on the entire wafer and the number of suction nozzles in the suction box are the same, and each wafer is on the whole board base. The first, fourth, seventh, and tenth rows, the first, fourth, seventh, and tenth columns of the single base remain the same;
步驟2、人工將帶有整板晶片的鍍膜夾具安裝在吸盒內,通過吸盒內的吸嘴吸住晶片,吸盒內每一個金屬棒頂端的吸嘴對應鍍膜夾具上的每個晶片,揭去上鍍膜夾具的上電極;Step 2. Manually install the coating fixture with the whole plate of wafer in the suction box, and suck the wafer through the suction nozzle in the suction box. The suction nozzle at the top of each metal rod in the suction box corresponds to each wafer on the coating fixture. Remove the upper electrode of the upper coating fixture;
步驟3、人工翻轉吸盒,通過定位針使吸盒與基座整板載盤重合,鍍膜夾具與基座整板重合;從而每個晶片與基座整板內第1、4、7、10行,第1、4、7、10列的單體基座一一對應;Step 3: Manually flip the suction box, make the suction box coincide with the entire plate carrier plate by the positioning pin, and the coating fixture coincide with the entire plate of the base plate; therefore, each wafer is in the first, fourth, seventh, and tenth of the entire plate of the base plate. Rows, one-to-one correspondence with the individual bases of columns 1, 4, 7, 10;
步驟4、下壓吸嘴,使每個晶片接觸對應的單體基座左右平臺的底膠;Step 4. Press down the suction nozzle so that each wafer contacts the primer on the left and right platforms of the corresponding single base;
步驟5、對吸盒破真空後,每個吸嘴對每個晶片失去吸力,吸盒與鍍膜夾具離開基座整板的載盤,整板晶片移載在基座整板內第1、4、7、10行,第1、4、7、10列的每個單體基座上;Step 5. After breaking the vacuum of the suction box, each suction nozzle loses the suction force for each wafer, the suction box and the coating fixture leave the carrier plate of the whole plate, and the whole wafer is transferred to the first plate of the base plate. , 7, 10 rows, on each base of columns 1, 4, 7, 10;
步驟6、返回步驟1,再次在鍍膜夾具上放置整板晶片,重複動作步驟1至步驟5,在此步驟中,吸盒翻轉後,位於鍍膜夾具上的每個晶片與整板基座上第2、5、8、11行,第2、5、8、11列的單體基座對應。Step 6. Return to step 1 and place the entire plate wafer on the coating fixture again. Repeat steps 1 to 5. In this step, after the suction box is turned over, each wafer on the coating fixture and the whole plate base Rows 2, 5, 8, and 11 correspond to the individual bases in columns 2, 5, 8, and 11.
步驟7、返回步驟1,再次在鍍膜夾具上放置整板晶片,重複動作步驟1至步驟5,在此步驟中,吸盒翻轉後,位於鍍膜夾具上的每個晶片與整板基座上第3、6、9、12行,第3、6、9、12列的單體基座對應。Step 7. Return to step 1 and place the entire wafer on the coating fixture again. Repeat steps 1 to 5. In this step, after the suction box is turned over, each wafer on the coating fixture and the whole plate base Rows 3, 6, 9, and 12 correspond to the individual bases in rows 3, 6, 9, and 12.
根據以上步驟完成基座整板上全部單體基座的上片工作。Follow the above steps to complete the work of loading all the single bases on the entire base plate.
以上實施例僅列出了本發明的幾種整體上片的順序,本發明主要實現對整板基座的上片採用整板移動工藝,至於鍍膜夾具的行列間距是基座整板的行列間距整數倍,是不同的上片順序,根據行列間距可以變換出更多的上片順序。The above embodiments only list several orders of the overall film loading of the present invention. The present invention mainly implements the whole plate moving process for the upper film of the whole plate base. As for the row and column spacing of the coating fixture, it is the row and column spacing of the whole board of the base. Integer multiples are different loading sequences, and more loading sequences can be transformed according to the row and column spacing.
對於本領域技術人員而言,顯然本發明不限於上述示範性實施例的細節,而且在不背離本發明的精神或基本特徵的情況下,能夠以其他的具體形式實現本發明。因此,無論從哪一點來看,均應將實施例看作是示範性的,而且是非限制性的,本發明的範圍由所附權利要求而不是上述說明限定,因此旨在將落在權利要求的等同要件的含義和範圍內的所有變化囊括在本發明內。It is obvious to a person skilled in the art that the present invention is not limited to the details of the above-mentioned exemplary embodiments, and the present invention can be implemented in other specific forms without departing from the spirit or basic features of the present invention. Therefore, the embodiments are to be regarded as exemplary and non-limiting in every respect, and the scope of the present invention is defined by the appended claims rather than the above description, and therefore is intended to fall within the claims. All changes that are within the meaning and scope of equivalent elements are encompassed by the invention.
此外,應當理解,雖然本說明書按照實施方式加以描述,但並非每個實施方式包含一個獨立的技術方案,說明書的這種敘述方式僅僅是為清楚起見,本領域技術人員應當將說明書作為一個整體,各實施例中的技術方案也可以經適當組合,形成本領域技術人員可以理解的其他實施方式。In addition, it should be understood that although this description is described in terms of embodiments, not every embodiment includes an independent technical solution. This description of the description is for clarity only, and those skilled in the art should take the description as a whole. The technical solutions in the embodiments can also be appropriately combined to form other implementations that can be understood by those skilled in the art.
1‧‧‧基座整板
1-1‧‧‧單體基座
1-2‧‧‧載盤定位孔
1-3‧‧‧基座整板定位孔
2‧‧‧左平臺
3‧‧‧右平臺
4‧‧‧晶片
5‧‧‧副電極
6‧‧‧底膠
7‧‧‧金屬棒
8‧‧‧定位針
9‧‧‧彈簧
10‧‧‧鍍膜夾具
11‧‧‧鍍膜夾具定位孔
12‧‧‧吸盒
13‧‧‧吸嘴1‧‧‧ base plate
1-1‧‧‧Single base
1-2‧‧‧Carrier plate positioning hole
1-3‧‧‧ base plate positioning holes
2‧‧‧left platform
3‧‧‧right platform
4‧‧‧Chip
5‧‧‧ secondary electrode
6‧‧‧ primer
7‧‧‧ metal rod
8‧‧‧ positioning pin
9‧‧‧ spring
10‧‧‧Coated Fixture
11‧‧‧ Coated fixture positioning holes
12‧‧‧ Suction Box
13‧‧‧Nozzle
圖1是本發明基座整板示意圖;FIG. 1 is a schematic diagram of a whole plate of a base of the present invention;
圖2是本發明單體基座示意圖;2 is a schematic diagram of a single base of the present invention;
圖3是本發明單體基座噴膠後狀態示意圖;FIG. 3 is a schematic view of a state after spraying the monomer base of the present invention; FIG.
圖4是本發明吸取晶片的吸盒結構示意圖;4 is a schematic structural diagram of a suction box for sucking a wafer according to the present invention;
圖5是本發明吸盒部分結構示意圖;5 is a schematic structural view of a part of a suction box according to the present invention;
圖6是本發明鍍膜夾具結構示意圖。FIG. 6 is a schematic structural diagram of a coating fixture of the present invention.
7‧‧‧金屬棒 7‧‧‧ metal rod
8‧‧‧定位針 8‧‧‧ positioning pin
12‧‧‧吸盒 12‧‧‧ Suction Box
13‧‧‧吸嘴 13‧‧‧Nozzle
Claims (10)
Applications Claiming Priority (2)
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??201610528937.5 | 2016-07-06 | ||
CN201610528937.5A CN106067775B (en) | 2016-07-06 | 2016-07-06 | Paste in quartz-crystal resonator production sheet devices and method in whole plate in surface |
Publications (2)
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TW201803266A true TW201803266A (en) | 2018-01-16 |
TWI674750B TWI674750B (en) | 2019-10-11 |
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TW106122609A TWI674750B (en) | 2016-07-06 | 2017-07-05 | Processes for surface mount quartz crystal resonator whole up panel apparatus and method |
Country Status (3)
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CN (1) | CN106067775B (en) |
TW (1) | TWI674750B (en) |
WO (1) | WO2018006755A1 (en) |
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CN106067775B (en) * | 2016-07-06 | 2019-04-26 | 四川明德亨电子科技有限公司 | Paste in quartz-crystal resonator production sheet devices and method in whole plate in surface |
CN107517044B (en) * | 2017-08-10 | 2024-04-09 | 四川明德亨电子科技有限公司 | Substrate structure of whole-board SMD quartz crystal resonator and processing method thereof |
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CN100416782C (en) * | 2004-08-20 | 2008-09-03 | 威宇科技测试封装有限公司 | Chip radiator fin-fitting method |
CN101594120B (en) * | 2008-05-28 | 2012-07-25 | 上海晶赛电子有限公司 | Manufacturing method of ceramic packaged sheet type quartz crystal frequency device |
CN101515553B (en) * | 2009-04-08 | 2011-07-13 | 扬州扬杰电子科技股份有限公司 | Method for processing chip diode |
CN101867005A (en) * | 2010-06-13 | 2010-10-20 | 天津市卓辉电子有限公司 | Method for bonding a plurality of LED chips on thermal conducting substrate |
CN102163658B (en) * | 2011-02-01 | 2012-07-04 | 哈尔滨工业大学 | LED (light-emitting diode) device with multiple chip suction nozzles |
CN105305995B (en) * | 2015-11-05 | 2016-11-30 | 烟台明德亨电子科技有限公司 | A kind of SMD quartz crystal resonator and imposite encapsulation process technique thereof |
CN205754235U (en) * | 2016-07-06 | 2016-11-30 | 烟台明德亨电子科技有限公司 | Sheet devices on imposite in the patch quartz-crystal resonator production of surface |
CN106067775B (en) * | 2016-07-06 | 2019-04-26 | 四川明德亨电子科技有限公司 | Paste in quartz-crystal resonator production sheet devices and method in whole plate in surface |
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2016
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2017
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WO2018006755A1 (en) | 2018-01-11 |
CN106067775B (en) | 2019-04-26 |
CN106067775A (en) | 2016-11-02 |
TWI674750B (en) | 2019-10-11 |
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