TW201732061A - Material supply apparatus and deposition apparatus - Google Patents

Material supply apparatus and deposition apparatus Download PDF

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Publication number
TW201732061A
TW201732061A TW105132322A TW105132322A TW201732061A TW 201732061 A TW201732061 A TW 201732061A TW 105132322 A TW105132322 A TW 105132322A TW 105132322 A TW105132322 A TW 105132322A TW 201732061 A TW201732061 A TW 201732061A
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container
vapor deposition
melting furnace
evaporation
chamber
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TW105132322A
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TWI711711B (en
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關根元氣
三上瞬
小泉和彥
山田新悅
柳澤伸二
小清水孝治
樋口淳
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愛發科股份有限公司
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    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/24Vacuum evaporation
    • C23C14/28Vacuum evaporation by wave energy or particle radiation
    • C23C14/30Vacuum evaporation by wave energy or particle radiation by electron bombardment
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/24Vacuum evaporation
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/24Vacuum evaporation
    • C23C14/243Crucibles for source material
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/24Vacuum evaporation
    • C23C14/246Replenishment of source material
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/56Apparatus specially adapted for continuous coating; Arrangements for maintaining the vacuum, e.g. vacuum locks

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  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Engineering & Computer Science (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Toxicology (AREA)
  • Physical Vapour Deposition (AREA)

Abstract

An aspect of a material supply apparatus of the instant invention is provided, wherein the material supply apparatus includes a material supply chamber, a melting furnace, at least one container, a supply unit and a transporting unit. The material supply chamber is disposed outside a vapor deposition chamber and feasible to be maintained in a depressurized atmosphere. The melting furnace is disposed on the material supply chamber and used to melt evaporation material. The container is configured to contain the molten liquid of the evaporation material which has melted in the melting furnace. The supply unit is mounted on the melting furnace for supplying the molten liquid from the melting furnace to the container. The transporting unit is used to transport the ingot of the evaporation material which is supplied by the supply unit and has solidified in the container along with the container to the vapor deposition chamber.

Description

材料供給裝置及蒸鍍裝置 Material supply device and vapor deposition device

本發明係有關於一種用以將蒸發材料供給至蒸發源之材料供給裝置以及具備有材料供給裝置之蒸鍍裝置。 The present invention relates to a material supply device for supplying an evaporation material to an evaporation source, and a vapor deposition device including a material supply device.

已知有一種真空蒸鍍裝置,係使蒸發材料(亦稱為蒸鍍材料)的蒸氣堆積於基板上,並於基板上形成例如金屬膜。真空蒸鍍裝置的蒸發源已知有阻抗加熱式、誘導加熱式、電子束加熱式等各種方式,藉由加熱或電子束照射收容於坩堝內的蒸發材料而使蒸發材料熔融並蒸發,藉此生成蒸發材料的蒸氣。 There is known a vacuum vapor deposition apparatus in which vapor of an evaporation material (also referred to as a vapor deposition material) is deposited on a substrate, and a metal film is formed on the substrate, for example. The evaporation source of the vacuum vapor deposition apparatus is known in various forms such as an impedance heating type, an induction heating type, and an electron beam heating type, and the evaporation material is melted and evaporated by heating or electron beam irradiation of the evaporation material contained in the crucible. A vapor of the evaporation material is generated.

在蒸鍍裝置中,從產生性的觀點來看,已知有一種蒸鍍裝置,係構成為可在將蒸鍍室內維持於預定的減壓氛圍的狀態下,間歇性或連續性地將蒸發材料供給至坩堝。例如在專利文獻1中揭示有一種技術,係將成形為粒(pellet)狀的蒸發材料間歇性地(每隔固定時間)供給至坩堝;於專利文獻2中揭示有一種技術,係將形成為線(wire)狀的蒸發 材料連續性地供給至坩堝。 In the vapor deposition device, from the viewpoint of productivity, a vapor deposition device is known which is configured to intermittently or continuously evaporate while maintaining the vapor deposition chamber in a predetermined reduced pressure atmosphere. The material is supplied to the crucible. For example, Patent Document 1 discloses a technique in which an evaporation material formed into a pellet shape is intermittently supplied (at a fixed time) to a crucible; and Patent Document 2 discloses a technique which is formed as Wire-like evaporation The material is continuously supplied to the crucible.

[先前技術文獻] [Previous Technical Literature]

[專利文獻] [Patent Literature]

專利文獻1:日本特開平5-128518號公報。 Patent Document 1: Japanese Laid-Open Patent Publication No. H5-128518.

專利文獻2:日本特開平7-286266號公報。 Patent Document 2: Japanese Laid-Open Patent Publication No. Hei 7-286266.

然而,在將粒狀的蒸發材料供給至坩堝的方法中,由於基本上為間歇供給,因此會有蒸發率容易變動從而難以形成均勻膜厚的金屬膜之問題。此外,在將線狀的蒸發材料供給至坩堝的方法中,由於可連續供給,因此能抑制蒸發率的變動,然而在為難以加工成線狀之材料的情形中,有成本變高之問題。 However, in the method of supplying the particulate evaporation material to the crucible, since it is basically intermittently supplied, there is a problem that the evaporation rate is easily changed and it is difficult to form a metal film having a uniform film thickness. Further, in the method of supplying the linear evaporating material to the crucible, since the supply can be continuously supplied, fluctuations in the evaporation rate can be suppressed. However, in the case where it is difficult to process the material into a linear shape, there is a problem that the cost becomes high.

有鑑於上述情事,本發明的目的在於提供一種材料供給裝置以及具備有材料供給裝置之蒸鍍裝置,無須蒸發材料的形狀加工,且可使蒸發率不變動地將蒸發材料供給至蒸鍍室。 In view of the above circumstances, an object of the present invention is to provide a material supply device and a vapor deposition device including the material supply device, which can supply the evaporation material to the vapor deposition chamber without changing the evaporation rate without changing the shape of the evaporation material.

為了達成上述目的,本發明實施形態之一的材料供給裝置係具備有材料供給室、熔解爐、至少一個容器、供給單 元以及搬運單元。 In order to achieve the above object, a material supply device according to an embodiment of the present invention includes a material supply chamber, a melting furnace, at least one container, and a supply sheet. Yuan and handling unit.

上述材料供給室係設置於蒸鍍室的外部,並構成為可維持於減壓氛圍。 The material supply chamber is provided outside the vapor deposition chamber and is configured to be maintained in a reduced pressure atmosphere.

上述熔解爐係設置於上述材料供給室,用以熔解蒸發材料。 The melting furnace is disposed in the material supply chamber to melt the evaporation material.

上述容器係收容已在上述熔解爐熔解的上述蒸發材料的熔融液。 The container accommodates a melt of the evaporation material that has been melted in the melting furnace.

上述供給單元係安裝於上述熔解爐,用以將上述熔融液從上述熔解爐供給至上述容器。 The supply unit is attached to the melting furnace for supplying the melt from the melting furnace to the vessel.

上述搬運單元係構成為可將從上述供給單元供給並已在上述容器內凝固的上述蒸發材料的鑄錠(ingot)連同上述容器一起搬運至上述蒸鍍室。 The transport unit is configured such that an ingot of the evaporating material that is supplied from the supply unit and solidified in the container is transported to the vapor deposition chamber together with the container.

由於材料供給室係構成為可維持於減壓氛圍,因此上述材料供給裝置係無須將蒸鍍室開放至大氣,而能將蒸發材料搬運至蒸鍍室。 Since the material supply chamber is configured to be maintained in a reduced pressure atmosphere, the material supply device can transport the evaporation material to the vapor deposition chamber without opening the vapor deposition chamber to the atmosphere.

此外,搬運至蒸鍍室之蒸發材料為從熔解爐以熔融液狀態供給至容器並已於容器內凝固之鑄錠,並連同容器一起被搬運至蒸鍍室,且在此狀態下於蒸鍍室進行再加熱而蒸發。因此,無須蒸發材料的形狀加工,即使是比較軟的金屬材料亦可作為蒸發材料穩定地供給。 Further, the evaporation material transferred to the evaporation chamber is an ingot which is supplied from the melting furnace to the container in a molten state and solidified in the container, and is carried together with the container to the evaporation chamber, and is vapor-deposited in this state. The chamber is reheated to evaporate. Therefore, even if the shape of the evaporating material is processed, even a relatively soft metal material can be stably supplied as an evaporating material.

再者,由於蒸發材料係以容器為單位被搬運,因此可不使蒸發率變動地將蒸發材料供給至蒸鍍室。 Further, since the evaporation material is transported in units of containers, the evaporation material can be supplied to the vapor deposition chamber without changing the evaporation rate.

再者,在真空下一連串地進行蒸發材料的熔解、朝容 器內的供給、以及朝蒸鍍室的搬運。因此,可防止蒸發材料的氧化或水分的附著導致劣化等,而能將高品質的蒸發材料穩定地供給至蒸鍍室。 Furthermore, the evaporation of the evaporation material is carried out in series under vacuum. Supply in the device and transportation to the vapor deposition chamber. Therefore, it is possible to prevent the evaporation of the evaporation material or the adhesion of the moisture to cause deterioration or the like, and it is possible to stably supply the high-quality evaporation material to the vapor deposition chamber.

上述容器亦可包含有可分別收容上述蒸發材料之複數個容器。在此情形中,上述材料供給裝置亦可進一步具備有:支撐台,係包含有分度台(index table),該分度台係可將上述複數個容器依序地移動至上述供給單元所為之上述蒸發材料的供給位置。 The container may also include a plurality of containers that can respectively accommodate the evaporating material. In this case, the material supply device may further include: a support table including an index table, wherein the indexing table may sequentially move the plurality of containers to the supply unit. The supply position of the above evaporation material.

藉此,由於能效率佳地準備供給至蒸鍍室的蒸發材料,因此能謀求縮短朝蒸鍍室補給蒸鍍材料所需的時間。 Thereby, since the evaporation material supplied to the vapor deposition chamber can be prepared efficiently, it is possible to shorten the time required to supply the vapor deposition material to the vapor deposition chamber.

上述供給單元亦可具備有熔融液排放機構以及導引構件。 The supply unit may be provided with a melt discharge mechanism and a guide member.

上述熔融液排放機構係具備有:軸構件,係液密性地貫通上述熔解爐的底部,並於外周面具有少一個凹部;以及驅動源,係使上述軸構件沿著上述軸構件的軸方向往復移動。上述熔融液排放機構係構成為可藉由沿著上述軸構件的軸方向的往復移動而將預定量的熔融液朝上述熔解爐的外部排出。 The melt discharge mechanism includes a shaft member that penetrates the bottom of the melting furnace in a liquid-tight manner and has a small recess on the outer peripheral surface, and a drive source that causes the shaft member to follow an axial direction of the shaft member Reciprocating. The melt discharge mechanism is configured to discharge a predetermined amount of molten liquid toward the outside of the melting furnace by reciprocating movement in the axial direction of the shaft member.

上述導引構件係設置於上述熔解爐的底部,用以將已排出至上述熔解爐的外部的上述預定量的熔融液誘導至上述容器。 The guiding member is provided at a bottom portion of the melting furnace for inducing the predetermined amount of molten liquid discharged to the outside of the melting furnace to the container.

藉此,能抑制每個容器的蒸發材料的量的偏差。 Thereby, the deviation of the amount of the evaporation material per container can be suppressed.

上述熔融液排放機構亦可進一步具備有設置於上述熔解爐的底部之儲留部。上述儲留部係構成為可儲留上述預定量的熔融液;上述軸構件係液密性地貫通上述儲留部。再者,上述驅動源係構成為可將上述軸構件在第一位置與第二位置之間移動,該第一位置係經由上述凹部將上述熔融液從上述熔解爐供給至上述儲留部之位置,該第二位置係經由上述凹部將上述熔融液從上述儲留部供給至上述導引構件之位置。 The melt discharge mechanism may further include a storage portion provided at a bottom portion of the melting furnace. The storage unit is configured to store the predetermined amount of the molten liquid, and the shaft member penetrates the storage portion in a liquid-tight manner. Further, the driving source is configured to move the shaft member between a first position and a second position, and the first position is to supply the molten liquid from the melting furnace to the storage portion via the recess The second position is a position at which the melt is supplied from the storage portion to the guide member via the recess.

上述材料供給裝置亦可進一步具備有:搬運室,係可收容上述搬運單元,並可維持於減壓氛圍。 The material supply device may further include a transfer chamber that can accommodate the transfer unit and can be maintained in a reduced pressure atmosphere.

由於可將材料供給室與搬運室氛圍性地阻斷,因此能防止蒸鍍室內的氛圍污染或者混染(contamination)。 Since the material supply chamber and the transfer chamber can be atmosphere-blocked, it is possible to prevent atmosphere contamination or contamination in the vapor deposition chamber.

本發明實施形態之一的蒸鍍裝置係具備有蒸鍍部、材料供給室、熔解爐、第一支撐部、供給單元以及搬運單元。 A vapor deposition device according to an embodiment of the present invention includes a vapor deposition unit, a material supply chamber, a melting furnace, a first support portion, a supply unit, and a transfer unit.

上述蒸鍍部係具有蒸鍍室。 The vapor deposition unit has a vapor deposition chamber.

上述材料供給室係設置於上述蒸鍍室的外部,並構成為可維持於減壓氛圍。 The material supply chamber is provided outside the vapor deposition chamber and is configured to be maintained in a reduced pressure atmosphere.

上述熔解爐係設置於上述材料供給室,用以熔解蒸發材料。 The melting furnace is disposed in the material supply chamber to melt the evaporation material.

上述第一支撐部係包含有:至少一個容器,係可收容已在上述熔解爐熔解的上述蒸發材料的熔融液。 The first support portion includes at least one container that can accommodate the molten material of the evaporation material that has been melted in the melting furnace.

上述供給單元係將上述熔融液從上述熔解爐供給至上述容器。 The supply unit supplies the melt from the melting furnace to the container.

上述搬運單元係構成為可將從上述供給單元供給且已於上述容器內凝固的上述蒸發材料的鑄錠連同上述容器一起從上述第一支撐部搬運至上述蒸鍍室。 The transport unit is configured such that an ingot of the evaporating material that is supplied from the supply unit and solidified in the container is transported from the first support unit to the vapor deposition chamber together with the container.

上述蒸鍍部亦可進一步具備有:支撐台,係設置於上述蒸鍍室,用以支撐上述容器;以及電子槍,係構成為可對已收容於上述支撐台上的上述容器之上述鑄錠照射電子束。 The vapor deposition unit may further include: a support base provided in the vapor deposition chamber to support the container; and an electron gun configured to illuminate the ingot of the container accommodated in the support table Electron beam.

上述容器亦可包含有可分別收容上述蒸發材料之複數個容器。在此情形中,上述支撐台亦可進一步包含有:分度台,係可將上述複數個容器依序地移動至上述電子槍的上述電子束的照射位置。 The container may also include a plurality of containers that can respectively accommodate the evaporating material. In this case, the support table may further include an indexing table for sequentially moving the plurality of containers to the irradiation position of the electron beam of the electron gun.

如上所述,依據本發明,無須蒸發材料的形狀加工,且能不使蒸發率變動地將蒸發材料供給至蒸鍍室。 As described above, according to the present invention, it is possible to supply the evaporation material to the vapor deposition chamber without changing the evaporation rate without the shape processing of the evaporation material.

10‧‧‧蒸鍍部 10‧‧‧Decanting Department

11‧‧‧蒸鍍室 11‧‧‧vaporation chamber

12‧‧‧基板保持部 12‧‧‧Substrate retention department

13‧‧‧支撐台 13‧‧‧Support table

14‧‧‧電子槍 14‧‧‧Electronic gun

20‧‧‧材料供給機構 20‧‧‧Material supply agency

30‧‧‧材料供給部 30‧‧‧Material Supply Department

31‧‧‧材料供給室 31‧‧‧Material supply room

32‧‧‧熔解爐 32‧‧‧melting furnace

33‧‧‧支撐台 33‧‧‧Support table

34‧‧‧供給單元 34‧‧‧Supply unit

35、65‧‧‧熔融液排放機構 35, 65‧‧‧ melt discharge mechanism

35g、65g‧‧‧凹部 35g, 65g‧‧‧ recess

36、66‧‧‧導引構件 36, 66‧‧‧ Guide members

37‧‧‧感測器 37‧‧‧ Sensors

38‧‧‧控制器 38‧‧‧ Controller

40‧‧‧搬運部 40‧‧‧Transportation Department

41‧‧‧搬運室 41‧‧・Transport room

42‧‧‧搬運單元 42‧‧‧Transportation unit

51‧‧‧第一真空排氣系統 51‧‧‧First vacuum exhaust system

52‧‧‧第二真空排氣系統 52‧‧‧Second vacuum exhaust system

53‧‧‧第三真空排氣系統 53‧‧‧ Third vacuum exhaust system

64‧‧‧供給單元 64‧‧‧Supply unit

100‧‧‧蒸鍍裝置 100‧‧‧Vapor deposition unit

321‧‧‧加熱器 321‧‧‧heater

322‧‧‧爐壁 322‧‧‧ furnace wall

323‧‧‧冷媒循環通路 323‧‧‧Refrigerant circulation path

324‧‧‧護套部 324‧‧‧ sheathing

325‧‧‧襯裡構材 325‧‧‧ lining members

326‧‧‧底孔 326‧‧‧ bottom hole

351、651‧‧‧軸部 351, 651‧‧‧ shaft

352、653‧‧‧驅動源 352, 653‧‧‧ drive source

421‧‧‧手部 421‧‧‧Hands

422‧‧‧多關節手臂部 422‧‧‧Multi-joint arm

652‧‧‧儲留部 652‧‧‧Reservation Department

652a、652b‧‧‧貫通孔 652a, 652b‧‧‧through holes

661‧‧‧加熱源 661‧‧‧heat source

662‧‧‧熔融液排放口 662‧‧‧ melt discharge

A1、A2、A3‧‧‧旋轉軸 A1, A2, A3‧‧‧ rotating shaft

E‧‧‧電子束 E‧‧‧electron beam

Fh‧‧‧凸緣部 Fh‧‧‧Flange

H‧‧‧容器 H‧‧‧ Container

M‧‧‧蒸發材料 M‧‧‧ evaporation material

M1、M2‧‧‧熔融液 M1, M2‧‧‧ melt

M3‧‧‧蒸氣 M3‧‧‧Vapor

P1、P3‧‧‧待機位置 P1, P3‧‧‧ standby position

P2‧‧‧蒸發位置 P2‧‧‧Evaporation position

P4‧‧‧供給位置 P4‧‧‧ supply location

S‧‧‧基板 S‧‧‧Substrate

V1、V2‧‧‧閘閥 V1, V2‧‧‧ gate valve

z1‧‧‧寬度 Width of z1‧‧‧

z2‧‧‧高度尺寸 Z2‧‧‧ height dimension

圖1係顯示具備有本發明的實施形態之一的材料供給裝置之蒸鍍裝置的構成之概略側視圖。 Fig. 1 is a schematic side view showing a configuration of a vapor deposition device including a material supply device according to an embodiment of the present invention.

圖2中的A、B係概略性地顯示蒸氣材料供給裝置中 的熔解爐及熔融液排放機構的構成之主要部分的側剖視圖。 A and B in Fig. 2 schematically show the vapor material supply device A side cross-sectional view of a main part of the composition of the melting furnace and the melt discharge mechanism.

圖3係概略性地顯示本發明的另一實施形態的材料供給機構中的蒸發材料的熔融液的供給單元的構成之側剖視圖。 FIG. 3 is a side cross-sectional view schematically showing a configuration of a supply unit of a molten material of an evaporation material in a material supply mechanism according to another embodiment of the present invention.

以下參照圖式說明本發明的實施形態。 Embodiments of the present invention will be described below with reference to the drawings.

<第一實施形態> <First Embodiment>

圖1係顯示具備有本發明的實施形態之一的材料供給裝置之蒸鍍裝置的構成之概略側視圖。此外,圖中X軸、Y軸及Z軸為彼此相互正交之三軸方向,X軸及Y軸係分別表示水平方向,Z軸係表示高度方向。 Fig. 1 is a schematic side view showing a configuration of a vapor deposition device including a material supply device according to an embodiment of the present invention. Further, in the drawing, the X-axis, the Y-axis, and the Z-axis are three-axis directions orthogonal to each other, the X-axis and the Y-axis indicate the horizontal direction, and the Z-axis indicates the height direction.

[蒸鍍裝置的整體構成] [Overall structure of vapor deposition device]

如圖1所示,蒸鍍裝置100係具備有蒸鍍部10以及用以將蒸發材料供給至蒸鍍部10之材料供給機構20(材料供給裝置)。 As shown in FIG. 1 , the vapor deposition device 100 includes a vapor deposition unit 10 and a material supply mechanism 20 (material supply device) for supplying an evaporation material to the vapor deposition unit 10 .

(蒸鍍部) (vapor deposition)

蒸鍍部10係具備有:蒸鍍室11;基板保持部12,係保持基板S;支撐台13,係支撐蒸發材料M;以及電子槍14,係對蒸發材料M照射電子束E。 The vapor deposition unit 10 includes a vapor deposition chamber 11 , a substrate holding portion 12 that holds the substrate S, a support table 13 that supports the evaporation material M, and an electron gun 14 that irradiates the evaporation material M with the electron beam E.

蒸鍍室11係連接至第一真空排氣系統51,並由真空腔室(vacuum chamber)所構成,該真空腔室係可將內部排氣或維持至預定的減壓氛圍。 The vapor deposition chamber 11 is connected to the first vacuum exhaust system 51 and is constituted by a vacuum chamber which can exhaust or maintain the inside to a predetermined decompression atmosphere.

基板保持部12係設置於蒸鍍室11的內部的上方,並構成為可將基板S的成膜面朝向下方並予以支撐。在本實施形態中,基板保持部12係構成為可在保持基板S的狀態下在XY平面內繞著旋轉軸A1旋轉。 The substrate holding portion 12 is provided above the inside of the vapor deposition chamber 11, and is configured to support the film formation surface of the substrate S downward. In the present embodiment, the substrate holding portion 12 is configured to be rotatable about the rotation axis A1 in the XY plane while holding the substrate S.

作為基板S,典型而言能使用玻璃基板、半導體基板等矩形或圓形的板狀基板,但並未限定於此,亦可使用塑膠膜等可撓性基板。 As the substrate S, a rectangular or circular plate-shaped substrate such as a glass substrate or a semiconductor substrate can be used. However, the present invention is not limited thereto, and a flexible substrate such as a plastic film may be used.

支撐台13係設置於蒸鍍室11的底部附近,並構成為可支撐應被蒸鍍至基板S的成膜面之蒸發材料M與收容該蒸發材料M之容器H。在本實施形態中,支撐台13係包含有圓盤狀的分度台,該分度台係可在支撐複數個容器H之狀態下在XY平面內繞著旋轉軸A2。支撐台13係內建可循環冷卻水等冷媒之冷卻機構;複數個容器H係在支撐台13的上表面中於同一圓周上隔著預定間隔配置。可配置於支撐台13上之容器H的數量並無特別限定,可為一個,但典型而言為複數個。 The support table 13 is provided near the bottom of the vapor deposition chamber 11, and is configured to support the evaporation material M to be vapor-deposited to the film formation surface of the substrate S and the container H accommodating the evaporation material M. In the present embodiment, the support table 13 includes a disk-shaped indexing table that can surround the rotation axis A2 in the XY plane while supporting the plurality of containers H. The support table 13 is internally provided with a cooling mechanism for circulating a cooling medium such as cooling water, and a plurality of containers H are disposed on the same circumference of the support table 13 at predetermined intervals on the same circumference. The number of the containers H that can be disposed on the support table 13 is not particularly limited and may be one, but is typically plural.

支撐台13係將任意一個容器H(蒸發材料M)從待機位置P1依序供給至蒸發位置P2。待機位置P1係包含有使收容使用完或使用前的蒸發材料之容器H暫時性地待機之一個或兩個以上的位置,且該位置係用以在與材料供給機構20之間授受蒸發材料M與容器H之位置。蒸發位置P2係電子槍14的電子束E照射至蒸發材料M之位置,在本實施形態中,如圖1所示,設定於在Z軸方向中與基板保持部12上的基板S的中心相對向的位置。 The support table 13 sequentially supplies any one of the containers H (evaporation material M) from the standby position P1 to the evaporation position P2. The standby position P1 includes one or two or more positions for temporarily waiting for the container H for storing the used evaporating material before use, and the position is for imparting the evaporation material M to and from the material supply mechanism 20 . With the location of the container H. In the evaporation position P2, the electron beam E of the electron gun 14 is irradiated to the position of the evaporation material M. In the present embodiment, as shown in FIG. 1, the electron beam E is set to face the center of the substrate S on the substrate holding portion 12 in the Z-axis direction. s position.

電子槍14係設置於支撐台13的附近,並構成為可將電子束E照射至已設置於蒸發位置P2的蒸發材料M。電子槍14係以磁場偏向型(橫向(tranverse))的電子槍所構成,但並未限定於此,例如亦可採用皮爾斯式電子槍(Pierce type electron gun)等其他形式的電子槍。 The electron gun 14 is disposed in the vicinity of the support table 13 and configured to irradiate the electron beam E to the evaporation material M that has been disposed at the evaporation position P2. The electron gun 14 is configured by a magnetic field bias type (tranverse) electron gun. However, the electron gun 14 is not limited thereto. For example, another type of electron gun such as a Pierce type electron gun may be used.

此外,雖未圖示,然而蒸鍍部10係具備有下述構件等:磁鐵,係使電子束E朝蒸發位置P2上的蒸發材料M偏向;基板搬運室,用以將基板S相對於蒸鍍室11搬出或搬入;以及氣體導入管線,係將製程氣體導入至蒸鍍室11。此外,支撐台13並未限定於一個,亦可設置兩個以上。在此情形中,電子槍14亦可對應支撐台13的數量設置複數台。 Further, although not shown, the vapor deposition unit 10 includes a magnet such that the electron beam E is deflected toward the evaporation material M at the evaporation position P2, and a substrate transfer chamber for vaporizing the substrate S. The plating chamber 11 is carried out or carried in; and the gas introduction line introduces the process gas into the vapor deposition chamber 11. Further, the support table 13 is not limited to one, and two or more may be provided. In this case, the electron gun 14 can also be provided with a plurality of stages corresponding to the number of the support tables 13.

材料供給機構20係具備有:材料供給部30,係供給 蒸發材料M;以及搬運部40,係將蒸發材料M從材料供給部30搬運至蒸鍍部10。 The material supply mechanism 20 is provided with a material supply unit 30 and is supplied The evaporation material M and the conveyance unit 40 convey the evaporation material M from the material supply unit 30 to the vapor deposition unit 10.

(材料供給部) (Material supply department)

材料供給部30係具備有:材料供給室31;熔解爐32,係熔解蒸發材料;支撐台33,係支撐可收容蒸發材料的熔融液M1之容器H;以及供給單元34,係將熔融液M1從熔解爐32供給至容器H。 The material supply unit 30 includes a material supply chamber 31, a melting furnace 32 that melts the evaporation material, a support table 33 that supports the container M that can store the molten material M1, and a supply unit 34 that melts the liquid M1. It is supplied from the melting furnace 32 to the container H.

材料供給室31係設置於蒸鍍室11的外部,並與蒸鍍室11獨立地以真空腔室所構成。亦即,材料供給室31係連接至第二真空排氣系統52,並構成為內部可排氣或維持於預定的減壓氛圍。 The material supply chamber 31 is provided outside the vapor deposition chamber 11, and is constituted by a vacuum chamber independently of the vapor deposition chamber 11. That is, the material supply chamber 31 is connected to the second vacuum exhaust system 52 and is configured to be internally vented or maintained at a predetermined reduced pressure atmosphere.

熔解爐32係設置於材料供給室31的內部,並如後述般具有用以將收容塊(bulk)狀的蒸發材料之內部空間以及用以將上述蒸發材料加熱至預定溫度並予以熔解之加熱器等。熔解爐32的內部係可與材料供給室31一起排氣達至預定的減壓氛圍,藉此熔解爐32係作為真空熔解爐發揮作用。 The melting furnace 32 is disposed inside the material supply chamber 31, and has an internal space for accommodating a bulk-shaped evaporation material and a heater for heating the evaporation material to a predetermined temperature and melting as will be described later. Wait. The inside of the melting furnace 32 can be exhausted together with the material supply chamber 31 to a predetermined reduced pressure atmosphere, whereby the melting furnace 32 functions as a vacuum melting furnace.

材料供給室31及熔解爐32皆具有可開閉的頂蓋(未圖示),並構成為可經由這些頂蓋將塊狀的蒸發材料投入至熔解爐32的內部空間。 Each of the material supply chamber 31 and the melting furnace 32 has an openable and closable top cover (not shown), and is configured to allow the block-shaped evaporating material to be introduced into the internal space of the melting furnace 32 via the top covers.

容器H係可收容已於熔解爐32熔解的蒸發材料的熔融液M1,在本實施形態中,由與使用於電子束蒸發源之爐床(hearth)或爐床內襯(hearth liner)同樣的碳、陶瓷等隔熱性材料所構成。於容器H的上端開口部周緣一體形成有凸緣(flange)部Fh,並經由該凸緣部Fh使容器H把持於搬運部40的搬運單元42。容器H的容量並無特別限定,可因應蒸發材料M或蒸鍍部10的規格來選擇,在本實施形態中例如能使用具有約110cc的容量之容器。 The container H is a melt M1 capable of accommodating the evaporation material which has been melted in the melting furnace 32, and is the same as the hearth or the hearth liner used in the electron beam evaporation source in the present embodiment. It is made of heat-insulating materials such as carbon and ceramics. A flange portion Fh is integrally formed on the periphery of the upper end opening portion of the container H, and the container H is gripped by the conveyance unit 42 of the conveyance portion 40 via the flange portion Fh. The capacity of the container H is not particularly limited, and may be selected in accordance with the specifications of the evaporation material M or the vapor deposition unit 10. In the present embodiment, for example, a container having a capacity of about 110 cc can be used.

此外,作為蒸發材料所使用的金屬材料的種類亦無特別限定,能使用可進行電子束蒸鍍之各種金屬材料。在本實施形態中,例如能使用錫(Sn)、鉭(Ta)、鋁(Al)、鋰(Li)、銦(In)等塊狀且較柔軟的金屬材料。 Further, the type of the metal material used as the evaporation material is not particularly limited, and various metal materials capable of performing electron beam evaporation can be used. In the present embodiment, for example, a block-like and relatively soft metal material such as tin (Sn), tantalum (Ta), aluminum (Al), lithium (Li), or indium (In) can be used.

供給單元34係安裝於熔解爐32,並構成為將熔融液M1從熔解爐32供給至容器H。供給單元34係具備有熔融液排放機構35以及導引構件36。 The supply unit 34 is attached to the melting furnace 32 and configured to supply the melt M1 from the melting furnace 32 to the vessel H. The supply unit 34 is provided with a melt discharge mechanism 35 and a guide member 36.

熔融液排放機構35係構成為可從熔解爐32內的蒸發材料的熔融液M1將預定量的熔融液M2排出至熔解爐32的外部。導引構件36係設置於熔解爐32的底部,並構成為可將已排出至熔解爐32的外部之上述預定量的熔融液M2誘導至容器H。 The melt discharge mechanism 35 is configured to discharge a predetermined amount of the melt M2 from the melt M1 of the evaporated material in the melting furnace 32 to the outside of the melting furnace 32. The guiding member 36 is provided at the bottom of the melting furnace 32, and is configured to induce the predetermined amount of the molten liquid M2 discharged to the outside of the melting furnace 32 to the container H.

圖2中的A、B係概略性地顯示熔解爐32及熔融液排放機構35的構成之主要部分的側剖視圖。 A and B in Fig. 2 schematically show side cross-sectional views of essential parts of the configuration of the melting furnace 32 and the melt discharge mechanism 35.

如圖2中的A所示,熔解爐32係具備有:爐壁322,係內建加熱器(加熱線)321;護套(jacket)部324,係內建冷媒循環通路323;以及襯裡(lining)構材325。護套部324係用以阻止爐壁322的熱能傳遞至融解爐32的外部,並設置於爐壁322的外表面。襯裡構材325係用以使爐壁322的內表面與蒸發材料的熔融液M1之間的濕潤性(或者親和性)降低,並設置於爐壁322的內表面。襯裡325係例如由石墨等碳系材料所構成。 As shown by A in Fig. 2, the melting furnace 32 is provided with a furnace wall 322, a built-in heater (heating line) 321, a jacket portion 324, a built-in refrigerant circulation passage 323, and a lining ( Lining) member 325. The jacket portion 324 is for preventing heat energy transfer from the furnace wall 322 to the outside of the melting furnace 32 and to the outer surface of the furnace wall 322. The lining member 325 is for reducing the wettability (or affinity) between the inner surface of the furnace wall 322 and the molten material M1 of the evaporation material, and is provided on the inner surface of the furnace wall 322. The lining 325 is made of, for example, a carbon-based material such as graphite.

熔融液排放機構35係具備有軸部351以及驅動源352。 The melt discharge mechanism 35 includes a shaft portion 351 and a drive source 352.

軸部351係配置於導引構件36的內部,並以液密性地貫通熔解爐32的底部之圓柱形的高熔點金屬材料所構成。軸部351所貫通之熔解爐32的底孔326的內周面係被襯裡構材325被覆,且軸部351係可於軸方向(Z軸方向)滑動地插通至該襯裡構材325的表面。 The shaft portion 351 is disposed inside the guide member 36 and is formed of a cylindrical high-melting-point metal material that penetrates the bottom of the melting furnace 32 in a liquid-tight manner. The inner peripheral surface of the bottom hole 326 of the melting furnace 32 through which the shaft portion 351 passes is covered with the lining member 325, and the shaft portion 351 is slidably inserted into the lining member 325 in the axial direction (Z-axis direction). surface.

在本實施形態中,於軸部351的外周面設置有以軸部351的軸心作為中心之環狀的凹部35g。凹部35g係具有能收容預定量的熔融液M2之大小的容積。藉此,如圖2中 的B示意性所示般,在軸部351下降時,可將上述預定量的熔融液M2排出至熔解爐32的外側。上述預定量並無特別限定,典型而言為比容器H的容量還少的量,在本實施形態中為約10cc。如本實施形態般,當凹部35g設置成環狀時,由於在收容來自熔解爐的熔融液時熔融液容易遍及凹部35g整體,且在從凹部35g排出熔融液時熔融液亦容易從凹部35g整體排出,因此能確實地進行預定量的熔融液的收容及排出。此外,如圖所示,凹部35g的剖面形狀較佳為圓弧形狀(圓槽),藉此可進一步提高熔融液M2從凹部35g的排出性。 In the present embodiment, an annular recessed portion 35g having the axial center of the shaft portion 351 as a center is provided on the outer peripheral surface of the shaft portion 351. The recess 35g has a volume capable of accommodating a predetermined amount of the melt M2. Thereby, as shown in Figure 2 As schematically indicated by B, when the shaft portion 351 is lowered, the predetermined amount of the molten metal M2 can be discharged to the outside of the melting furnace 32. The predetermined amount is not particularly limited, and is typically smaller than the capacity of the container H, and is about 10 cc in the present embodiment. When the concave portion 35g is provided in a ring shape, the molten liquid is likely to spread over the entire concave portion 35g when the molten liquid from the melting furnace is accommodated, and the molten liquid is easily removed from the concave portion 35g as the molten liquid is discharged from the concave portion 35g. Since it is discharged, it is possible to reliably store and discharge a predetermined amount of the molten liquid. Further, as shown in the figure, the cross-sectional shape of the concave portion 35g is preferably an arc shape (circular groove), whereby the discharge property of the molten metal M2 from the concave portion 35g can be further improved.

此外,設置於軸部351的外周部之凹部35g不一定需要將軸部351的軸心作為中心並於外周面設置成環狀,只要能於軸部351的外周面形成有至少一個凹部並藉此劃定能收容預定量的熔融液之容積,則其形狀或形態並無特別限定。例如,凹部35g亦可由沿著軸部351的周方向間歇性地設置之複數個凹部所構成,亦可於軸部351的周方向由非連續的單一個部分環狀槽等所構成。 In addition, the recessed portion 35g provided in the outer peripheral portion of the shaft portion 351 does not necessarily have to have the axial center of the shaft portion 351 as a center, and is provided in an annular shape on the outer peripheral surface, so that at least one recessed portion can be formed on the outer peripheral surface of the shaft portion 351. The shape and shape of the melt can be accommodated in a predetermined amount, and the shape or form thereof is not particularly limited. For example, the concave portion 35g may be composed of a plurality of concave portions intermittently provided along the circumferential direction of the shaft portion 351, or may be constituted by a discontinuous single-part annular groove or the like in the circumferential direction of the shaft portion 351.

驅動源352係用以使軸部351沿著軸部351的軸方向往復移動,例如能以氣缸(cylinder)機構、滾珠螺桿機構等所構成。驅動源352係可使軸部351於如圖2中的A所示之凹部35g位於熔解爐32的內部之上升位置以及如圖2中的B所示之凹部35g位於熔解爐32的外部之下降位置之間 升降。 The drive source 352 is configured to reciprocate the shaft portion 351 in the axial direction of the shaft portion 351, and can be constituted, for example, by a cylinder mechanism, a ball screw mechanism, or the like. The driving source 352 is configured such that the concave portion 35g of the shaft portion 351 is located inside the melting furnace 32 as shown by A in FIG. 2 and the recess 35g as shown by B in FIG. 2 is lowered outside the melting furnace 32. Between positions Lifting.

此外,較佳為於導引構件36的內壁面亦被由與襯裡構材325同樣的材料所構成之襯裡構材被覆。藉此,由於能將熔融液排放機構35所排放之預定量的熔融液M2穩定地導引至容器H,因此能抑制到達容器H之熔融液的量的偏差。此外,為了防止與導引構件36的接觸導致蒸發材料M冷卻,亦可設置可將導引構件36維持至預定溫度以上之加熱源。 Further, it is preferable that the inner wall surface of the guide member 36 is also covered with a lining member made of the same material as the lining member 325. Thereby, since the predetermined amount of the molten metal M2 discharged from the melt discharge mechanism 35 can be stably guided to the container H, variations in the amount of the molten liquid reaching the container H can be suppressed. Further, in order to prevent the evaporation material M from being cooled by contact with the guiding member 36, a heating source capable of maintaining the guiding member 36 to a predetermined temperature or higher may be provided.

接著,如圖1所示,支撐台33係設置於材料供給室31的底部附近,並構成為可支撐複數個容器H。在本實施形態中,支撐台33係包含有圓盤狀的分度台,該圓盤狀的分度台係可在支撐複數個容器H的狀態下在XY平面內繞著旋轉軸A3旋轉。支撐台33係內建冷卻水等冷媒可循環的冷卻機構;複數個容器H係在支撐台33的上表面中於同一圓周上隔著預定間隔配置。可配置於支撐台33上之容器H的數量並無特別限定,亦可為一個,但典型而言為複數個。 Next, as shown in FIG. 1, the support table 33 is provided in the vicinity of the bottom of the material supply chamber 31, and is configured to support a plurality of containers H. In the present embodiment, the support table 33 includes a disk-shaped indexing table that is rotatable about the rotation axis A3 in the XY plane while supporting the plurality of containers H. The support table 33 is internally provided with a cooling mechanism in which a refrigerant such as cooling water can be circulated, and a plurality of containers H are disposed on the same circumference of the support table 33 at predetermined intervals on the same circumference. The number of the containers H that can be disposed on the support table 33 is not particularly limited, and may be one, but is usually plural.

支撐台33係將任意的一個容器H從待機位置P3依序供給至供給位置P4。待機位置P3係包含有用以使注入熔融液的蒸發材料M前或注入熔融液的蒸發材料M後的容器H暫時性地待機之一個或兩個以上的位置,且該位置為 在與蒸鍍部10之間授受蒸發材料M與容器H之位置。供給位置P4係被熔融液排放機構35供給(注入熔融液)預定量的熔融液M2之位置,在本實施形態中,如圖1所示,設定於在Z軸方向中與導引構件36的出口相對向的位置。 The support table 33 sequentially supplies an arbitrary one of the containers H from the standby position P3 to the supply position P4. The standby position P3 includes one or two or more positions for temporarily waiting for the container H after the evaporation material M in which the molten material is injected or the evaporation material M injected into the molten material, and the position is The position of the evaporation material M and the container H is transferred between the vapor deposition unit 10. The supply position P4 is supplied to the melt discharge mechanism 35 (injected into the melt) by a predetermined amount of the melt M2. In the present embodiment, as shown in FIG. 1, it is set in the Z-axis direction with the guide member 36. The position of the exit relative to the direction.

材料供給部30係進一步具備有感測器37以及控制器38。 The material supply unit 30 is further provided with a sensor 37 and a controller 38.

感測器37係配置於由設置於材料供給室31的上部之透明板所構成的窗的外側,用以檢測已從蒸鍍部10搬運至待機位置P3之使用完的容器H內的蒸發材料M的剩餘量,並將其檢測訊號輸出至控制器38。控制器38係依據感測器37的輸出來決定在供給位置P4中供給至該檢測對象的容器H之熔融液M1的供給量(在本實施形態中為軸部351的升降次數)。感測器37的種類並無特別限定,例如能使用照相機等影像感測器、雷射變位計等測距感測器。 The sensor 37 is disposed outside the window formed by the transparent plate provided on the upper portion of the material supply chamber 31, and detects the evaporation material in the used container H that has been transported from the vapor deposition unit 10 to the standby position P3. The remaining amount of M is output to the controller 38. The controller 38 determines the supply amount of the molten metal M1 supplied to the container H to be detected at the supply position P4 in accordance with the output of the sensor 37 (in the present embodiment, the number of movements of the shaft portion 351). The type of the sensor 37 is not particularly limited, and for example, a distance sensor such as an image sensor such as a camera or a laser displacement meter can be used.

典型而言,控制器38係由內建CPU(Central Processing Unit;中央處理器)和記憶體等之電腦所構成,用以控制材料供給部30及搬運部40的動作。此外,控制器38亦可作為用以控制包含有蒸鍍部10之蒸鍍裝置100整體的動作之主機控制器(host controller)而構成。 Typically, the controller 38 is constituted by a built-in CPU (Central Processing Unit) and a computer such as a memory to control the operations of the material supply unit 30 and the transport unit 40. Further, the controller 38 may be configured as a host controller for controlling the operation of the entire vapor deposition device 100 including the vapor deposition unit 10.

(搬運部) (transport department)

搬運部40係具備有搬運室41以及搬運單元42。 The transport unit 40 includes a transport chamber 41 and a transport unit 42.

搬運室41係配置於蒸鍍室11與材料供給室31之間,並經由閘閥(gate valve)V1、V2分別連接至蒸鍍室11以及材料供給室31。搬運室41係連接至第三真空排氣系統53,並構成為內部可排氣或維持於預定的減壓氛圍。 The transfer chamber 41 is disposed between the vapor deposition chamber 11 and the material supply chamber 31, and is connected to the vapor deposition chamber 11 and the material supply chamber 31 via gate valves V1 and V2, respectively. The transfer chamber 41 is connected to the third vacuum exhaust system 53 and is configured to be internally vented or maintained at a predetermined reduced pressure atmosphere.

搬運單元42係設置於搬運室41的底部。搬運單元42係具備有:手部421,係可將容器H的凸緣部Fh抬起;以及多關節手臂部422,係可將手部421朝X軸、Y軸及Z軸的三軸方向搬運並可繞著Z軸搬運。搬運單元42係例如由SCARA(Selective Compliant Assembly Robot Arm;水平關節型機器人)型、蛙腿(flog leg)型等搬運機器人所構成。 The transport unit 42 is provided at the bottom of the transport chamber 41. The transport unit 42 includes a hand 421 that lifts the flange portion Fh of the container H and a multi-joint arm portion 422 that can move the hand 421 in three directions of the X-axis, the Y-axis, and the Z-axis. Handling and handling around the Z axis. The transport unit 42 is constituted by, for example, a transport robot such as a SCARA (Selective Compliant Assembly Robot Arm) type or a flog leg type.

[蒸鍍裝置的動作] [Operation of vapor deposition device]

接著,說明由上述方式所構成之蒸鍍裝置100的典型的動作。 Next, a typical operation of the vapor deposition device 100 configured as described above will be described.

蒸鍍室11、材料供給室31以及搬運室41係經由第一真空排氣系統51、第二真空排氣系統52以及第三真空排氣系統53減壓、維持於預定的壓力。閘閥V1、V2係被關閉,各個室係被氛圍性地阻斷。此外,由於閘閥V1、V2係用以實現搬運室41的加載鎖定(load lock)功能,因此即使在以下的說明中未進行詳述,亦可知兩個閘閥V1、V2 係被控制成不會同時開放。 The vapor deposition chamber 11, the material supply chamber 31, and the transfer chamber 41 are decompressed and maintained at a predetermined pressure via the first vacuum exhaust system 51, the second vacuum exhaust system 52, and the third vacuum exhaust system 53. The gate valves V1, V2 are closed, and each chamber is atmosphere-blocked. In addition, since the gate valves V1 and V2 are used to realize the load lock function of the transfer chamber 41, even if not described in detail in the following description, two gate valves V1 and V2 are known. The system is controlled so that it is not open at the same time.

(材料供給步驟) (material supply step)

在材料供給部30中,熔解爐32係在內部已收容有塊狀的蒸發材料M的狀態下與材料供給室31一起被減壓,並在其減壓氛圍內熔解蒸發材料M。於支撐台33上,複數個空的容器H係分別設置於支撐台33上的待機位置P3以及供給位置P4。在蒸發材料M熔解後,經由供給單元34將蒸發材料M的熔融液M1從熔解爐32供給至供給位置P4上的容器H。 In the material supply unit 30, the melting furnace 32 is depressurized together with the material supply chamber 31 in a state in which the block-shaped evaporation material M is accommodated therein, and the evaporation material M is melted in the reduced pressure atmosphere. On the support table 33, a plurality of empty containers H are respectively disposed at the standby position P3 and the supply position P4 on the support table 33. After the evaporation material M is melted, the melt M1 of the evaporation material M is supplied from the melting furnace 32 to the vessel H at the supply position P4 via the supply unit 34.

具體而言,熔融液排放機構35的軸部351係從圖2中的A所示的上升位置移動至圖2中的B所示的下降位置,藉此經由導引構件36將已收容於凹部35g內的預定量(約10cc)的熔融液M2供給至容器H。軸部351的升降動作係反復動作直至供給至容器H的蒸發材料達至最大填充量。例如當將供給至容器H之蒸發材料的最大填充量設為100cc時,軸部351的升降動作係反復進行十次。 Specifically, the shaft portion 351 of the melt discharge mechanism 35 is moved from the raised position shown by A in FIG. 2 to the lowered position shown by B in FIG. 2, whereby it is accommodated in the recess via the guide member 36. A predetermined amount (about 10 cc) of the molten metal M2 in 35 g is supplied to the container H. The lifting operation of the shaft portion 351 is repeated until the evaporation material supplied to the container H reaches the maximum filling amount. For example, when the maximum filling amount of the evaporation material supplied to the container H is 100 cc, the lifting operation of the shaft portion 351 is repeated ten times.

將蒸發材料的熔融液M1供給至供給位置P4上的容器H後,支撐台33係旋轉預定角度,待機位置P3上的容器H係依序地移動至供給位置P4,並分別進行上述蒸發材料M1的熔融液排放動作。用以在供給位置P4接受熔融液M1的供給之容器H係移動至待機位置P3,且該容器H內的 熔融液M1係在支撐台33上被冷卻且凝固。因此,蒸發材料M的鑄錠(塊狀物)係被保持於該容器H。 After the molten material M1 of the evaporation material is supplied to the container H at the supply position P4, the support table 33 is rotated by a predetermined angle, and the container H at the standby position P3 is sequentially moved to the supply position P4, and the evaporation material M1 is separately performed. The melt discharge action. The container H for receiving the supply of the molten metal M1 at the supply position P4 is moved to the standby position P3, and the inside of the container H The melt M1 is cooled and solidified on the support table 33. Therefore, the ingot (bulk) of the evaporation material M is held in the container H.

搬運單元42的手部421係從搬運室41進入至材料供給室31內,並與在支撐台33上的待機位置P3待機且分別收容有蒸發材料M的容器H一起被搬運至蒸鍍室11。之後,收容該蒸發材料M之容器H係被搬運至蒸鍍室11的支撐台13的待機位置P1。 The hand 421 of the transport unit 42 enters the material supply chamber 31 from the transport chamber 41, and is transported to the vapor deposition chamber 11 together with the container H that is in standby at the standby position P3 on the support table 33 and in which the evaporation material M is accommodated. . Thereafter, the container H accommodating the evaporation material M is conveyed to the standby position P1 of the support table 13 of the vapor deposition chamber 11.

當容器H係搬運至支撐台13的待機位置P1時,該容器H係藉由支撐台13的旋轉而移動至蒸發位置P2。另一方面,搬運單元42係返回至材料供給室31內,並把持在支撐台33上的待機位置P3待機且已收容有蒸發材料M(鑄錠)之第二個容器H,再次進入至蒸鍍室11內,將該容器H載置於支撐台13上的待機位置P1。之後,反復進行該動作,直至達至支撐台13能支撐容器H的數量為止。 When the container H is conveyed to the standby position P1 of the support table 13, the container H is moved to the evaporation position P2 by the rotation of the support table 13. On the other hand, the transport unit 42 is returned to the material supply chamber 31, and is held by the standby position P3 on the support table 33, and has accommodated the second container H of the evaporation material M (ingot), and again enters the steaming. In the plating chamber 11, the container H is placed on the standby position P1 on the support table 13. Thereafter, this operation is repeated until the number of the containers H can be supported by the support table 13.

(蒸鍍步驟) (evaporation step)

在蒸鍍室11中,將基板S的成膜面朝下並保持於基板保持部12。已收容有蒸發材料M的容器H移動至蒸發位置P2後,從電子槍14對該容器H內的蒸發材料M照射電子束E。被電子束E照射的蒸發材料M係再次熔解,並產生蒸發材料M的蒸氣(蒸發粒子)M3。基板保持部12係以預定速度繞著旋轉軸A1旋轉,蒸氣M3係堆積至與基板保 持部12一起旋轉之基板S的成膜面。藉此,於基板S的成膜面形成有蒸發材料M的蒸鍍膜。 In the vapor deposition chamber 11, the film formation surface of the substrate S faces downward and is held by the substrate holding portion 12. After the container H containing the evaporation material M has moved to the evaporation position P2, the electron beam E is irradiated from the electron gun 14 to the evaporation material M in the container H. The evaporation material M irradiated with the electron beam E is melted again, and vapor (evaporation particles) M3 of the evaporation material M is generated. The substrate holding portion 12 rotates around the rotation axis A1 at a predetermined speed, and the vapor M3 is stacked to be bonded to the substrate. The film forming surface of the substrate S that the holding portion 12 rotates together. Thereby, a vapor deposition film of the evaporation material M is formed on the film formation surface of the substrate S.

因為持續蒸鍍處理而消耗蒸發位置P2上的容器H內的蒸發材料M。當蒸發材料M的剩餘量變成預定以下時,會導致蒸發率的變動而難以進行穩定的成膜處理。因此,當蒸發材料M的剩餘量變成預定以下時,藉由支撐台13的旋轉來交換蒸發位置P2上之使用完的蒸發材料M與待機位置P1上之未使用的蒸發材料M。之後,使用已移動至蒸發材料P2之新的蒸發材料M,再次開始基板S的成膜處理。此外,典型而言該蒸發材料M的交換作業係在基板S的替換時進行。 The evaporation material M in the container H at the evaporation position P2 is consumed because the vapor deposition process is continued. When the remaining amount of the evaporation material M becomes a predetermined value or less, a change in the evaporation rate is caused, and it is difficult to perform a stable film formation process. Therefore, when the remaining amount of the evaporation material M becomes a predetermined value or less, the used evaporation material M on the evaporation position P2 and the unused evaporation material M on the standby position P1 are exchanged by the rotation of the support table 13. Thereafter, the film formation process of the substrate S is started again using the new evaporation material M that has moved to the evaporation material P2. Further, the exchange operation of the evaporation material M is typically performed at the time of replacement of the substrate S.

(材料再供給步驟) (material resupply step)

當支撐台13上的蒸發材料M皆使用完時,或者當未使用的蒸發材料M的數量變成預定以下時,如後述般,各個容器H係從蒸鍍室11搬出至材料供給室31,另一方面,收容有未使用的新的蒸發材料M之容器係從材料供給室31被搬入至蒸鍍室11。 When the evaporation material M on the support table 13 is used up, or when the number of unused evaporation materials M becomes predetermined or less, as will be described later, each container H is carried out from the vapor deposition chamber 11 to the material supply chamber 31, and On the other hand, the container containing the unused new evaporation material M is carried into the vapor deposition chamber 11 from the material supply chamber 31.

搬運單元42係將在支撐台13上的待機位置P1待機中之使用完的蒸發材料M連同收容有該使用完的蒸發材料M之容器H一起搬運至材料供給室31。藉由搬運單元42搬運至材料供給室31內的支撐台33的待機位置之容器H係 藉由感測器37測量蒸發材料M的剩餘量後,藉由支撐台33的旋轉而移動至供給位置P4。另一方面,已預先供給有最大填充量的蒸發材料M之容器H係移動至待機位置P3,並經由搬運單元42將該容器H搬運至蒸鍍室11。 The transport unit 42 transports the used evaporating material M in the standby position P1 on the support table 13 to the material supply chamber 31 together with the container H in which the used evaporating material M is stored. The container H conveyed to the standby position of the support table 33 in the material supply chamber 31 by the transport unit 42 After the remaining amount of the evaporation material M is measured by the sensor 37, it is moved to the supply position P4 by the rotation of the support table 33. On the other hand, the container H that has previously supplied the evaporation material M having the maximum filling amount is moved to the standby position P3, and the container H is transported to the vapor deposition chamber 11 via the transport unit 42.

藉由熔融液排放機構35分別以預定量對已移動至供給位置P4的容器H供給蒸發材料M的熔融液M1,直至達至容器H的最大填充量為止。此時,依據感測器37所計測之該容器H中的蒸發材料的剩餘量資料,決定熔融液排放機構35的動作(軸部351的升降動作次數)。 The melt M1 of the evaporation material M is supplied to the container H that has moved to the supply position P4 by the melt discharge mechanism 35 by a predetermined amount until the maximum filling amount of the container H is reached. At this time, the operation of the melt discharge mechanism 35 (the number of lifting operations of the shaft portion 351) is determined based on the remaining amount data of the evaporated material in the container H measured by the sensor 37.

之後,反復上述動作,藉此對收容使用完的蒸發材料M之容器H再次填充新的蒸發材料M。再次填充有蒸發材料M的容器H係藉由搬運單元42在預定的時序(timing)(蒸鍍部10中的基板S的置換時)被搬運至蒸鍍室11。 Thereafter, the above operation is repeated, whereby the container E containing the used evaporation material M is again filled with the new evaporation material M. The container H filled with the evaporation material M again is conveyed to the vapor deposition chamber 11 by the conveyance unit 42 at a predetermined timing (when the substrate S in the vapor deposition unit 10 is replaced).

如上所述,在本實施形態中,能獲得例如下述的作用功效。 As described above, in the present embodiment, for example, the following effects can be obtained.

由於構成為材料供給室31可維持於減壓氛圍,因此無須將蒸鍍室11開放於大氣,而能將蒸發材料M搬運至蒸鍍室11。 Since the material supply chamber 31 can be maintained in a reduced pressure atmosphere, the evaporation material M can be transported to the vapor deposition chamber 11 without opening the vapor deposition chamber 11 to the atmosphere.

此外,搬運至蒸鍍室11之蒸發材料M為在熔融液狀態下從熔解爐32被供給至容器H且已在該容器H內凝固 之鑄錠,並連同容器H一起被搬運至蒸鍍室11,且在該狀態下在蒸鍍室11被再次加熱而蒸發。因此,無須蒸發材料M的形狀加工,即使是比較軟的金屬材料亦可作為蒸發材料M穩定地供給。 Further, the evaporation material M transported to the vapor deposition chamber 11 is supplied from the melting furnace 32 to the container H in the molten state and has been solidified in the container H. The ingot is conveyed to the vapor deposition chamber 11 together with the container H, and in this state, the vapor deposition chamber 11 is heated again to evaporate. Therefore, even if the shape of the evaporation material M is not processed, even a relatively soft metal material can be stably supplied as the evaporation material M.

再者,由於蒸發材料M係以容器H為單位被搬運,因此不會使蒸發率變動,而可將蒸發材料M供給至蒸鍍室11。 Further, since the evaporation material M is transported in units of the container H, the evaporation material M can be supplied to the vapor deposition chamber 11 without changing the evaporation rate.

此外,由於在真空下一連串地進行蒸發材料M的熔解、朝容器H內的供給、以及朝蒸鍍室11的搬運,因此可防止蒸發材料M的氧化或水分的附著導致劣化等,而能將高品質的蒸發材料M穩定地供給至蒸鍍室11。 In addition, since the evaporation of the evaporation material M, the supply into the container H, and the transportation to the vapor deposition chamber 11 are successively performed under the vacuum, it is possible to prevent the oxidation of the evaporation material M or the adhesion of moisture, thereby causing deterioration or the like. The high-quality evaporation material M is stably supplied to the vapor deposition chamber 11.

在上述實施形態中,材料供給室31內的支撐台33係包含有分度台,該分度台係可將複數個容器H依序地移動至供給位置P4。藉此,由於能效率佳地準備供給至蒸鍍室11的蒸發材料M,因此能謀求縮短朝蒸鍍室11補給蒸發材料M所需的時間。 In the above embodiment, the support table 33 in the material supply chamber 31 includes an indexing table that can sequentially move a plurality of containers H to the supply position P4. Thereby, since the evaporation material M supplied to the vapor deposition chamber 11 can be prepared efficiently, it is possible to shorten the time required to supply the evaporation material M to the vapor deposition chamber 11.

由於蒸鍍室11內的支撐台13亦同樣地包含有可使複數個容器H依序地移動至電子槍14的電子束E的照射位置之分度台,因此能確保蒸鍍處理所需的蒸發材料M,而可謀求生產性的提升。 Since the support table 13 in the vapor deposition chamber 11 similarly includes an indexing table that can sequentially move the plurality of containers H to the irradiation position of the electron beam E of the electron gun 14, the evaporation required for the vapor deposition process can be ensured. Material M, and can improve productivity.

在本實施形態中,由於熔融液排放機構35係構成為分 別以預定量將蒸發材料的熔融液供給至容器H,因此能抑制每個容器H的蒸發材料M的供給量的偏差。因此,亦可防止起因於蒸發材料M的量的偏差所導致之每個容器的蒸發率的偏差。 In the present embodiment, the melt discharge mechanism 35 is configured as a minute. Since the melt of the evaporation material is not supplied to the container H in a predetermined amount, variation in the supply amount of the evaporation material M per container H can be suppressed. Therefore, it is also possible to prevent the deviation of the evaporation rate of each container due to the deviation of the amount of the evaporation material M.

再者,在以上的實施形態中,搬運單元42係與蒸鍍室11及材料供給室31獨立地設置,並設置於可維持真空氛圍的搬運室41的內部。因此,可將材料供給室31與搬運室41氛圍性地阻斷,而能防止蒸鍍室11內的氛圍污染或者混染。 Further, in the above embodiment, the transport unit 42 is provided independently of the vapor deposition chamber 11 and the material supply chamber 31, and is provided inside the transport chamber 41 in which the vacuum atmosphere can be maintained. Therefore, the material supply chamber 31 and the transfer chamber 41 can be atmosphere-blocked, and the atmosphere in the vapor deposition chamber 11 can be prevented from being contaminated or contaminated.

<第二實施形態> <Second embodiment>

圖3係概略性地顯示本發明的另一實施形態的材料供給機構中的蒸發材料的熔融液的供給單元的構成之側剖視圖。 FIG. 3 is a side cross-sectional view schematically showing a configuration of a supply unit of a molten material of an evaporation material in a material supply mechanism according to another embodiment of the present invention.

以下主要說明與第一實施形態不同的構成,且對與上述實施形態同樣的構成附上同樣的符號並省略或簡化其說明。 The configuration that is different from the first embodiment will be mainly described below, and the same components as those of the above-described embodiment will be denoted by the same reference numerals, and their description will be omitted or simplified.

本實施形態的供給單元64係具備有熔融液排放機構65以及具有熔融液排放口662之導引構件66。熔融液排放機構65係具備有軸部651、儲留部652以及驅動源653。 The supply unit 64 of the present embodiment includes a melt discharge mechanism 65 and a guide member 66 having a melt discharge port 662. The melt discharge mechanism 65 includes a shaft portion 651, a storage portion 652, and a drive source 653.

儲留部652係設置於熔解爐32的底部,並構成為可將 蒸發材料M的熔融液M1儲留達至預定量。儲留部652係於上端部及下端部分別具有讓軸部651貫通之貫通孔652a、652b。 The storage portion 652 is disposed at the bottom of the melting furnace 32 and configured to be The melt M1 of the evaporation material M is retained to a predetermined amount. The storage portion 652 has through holes 652a and 652b through which the shaft portion 651 passes, in the upper end portion and the lower end portion, respectively.

軸部651係液密性地貫通熔解爐32的底部、導引構件66以及儲留部652,並構成為可相對於熔解爐32的底部、導引構件66以及儲留部652於軸方向滑動。與第一實施形態同樣地,軸部651係於其外周面具有將軸心作為中心之環狀的凹部65g。沿著凹部65g的Z軸方向之開口寬度z1係設定成比沿著儲留部652的Z軸方向之高度尺寸z2還小。因此,在經由凹部65g及貫通孔652a而於熔解爐32與儲留部652相互連通之間,貫通孔652b係被軸部651的外周面遮蔽。另一方面,在經由凹部65g及貫通孔652b而於儲留部652與導引構件66相互連通之間,貫通孔652a係被軸部651的外周面遮蔽。 The shaft portion 651 penetrates the bottom portion of the melting furnace 32, the guide member 66, and the storage portion 652 in a liquid-tight manner, and is configured to be slidable in the axial direction with respect to the bottom portion of the melting furnace 32, the guide member 66, and the reservoir portion 652. . Similarly to the first embodiment, the shaft portion 651 has an annular recessed portion 65g having an axial center as a center on the outer peripheral surface thereof. The opening width z1 along the Z-axis direction of the concave portion 65g is set to be smaller than the height dimension z2 along the Z-axis direction of the storage portion 652. Therefore, the through hole 652b is shielded by the outer peripheral surface of the shaft portion 651 between the melting furnace 32 and the storage portion 652 via the recess 65g and the through hole 652a. On the other hand, the through hole 652a is shielded by the outer peripheral surface of the shaft portion 651 between the storage portion 652 and the guide member 66 via the recess 65g and the through hole 652b.

與第一實施形態的構成同樣地,驅動源653係構成為可使熔解爐32的底部、導引構件66以及儲留部652升降移動。驅動源653係構成為可使軸部651在第一位置與第二位置之間移動,該第一位置係如圖中實線所示經由凹部65g將熔融液M1從熔解爐32供給至儲留部652之位置,該第二位置係如圖中二點練線所示經由凹部65g將熔融液M1從儲留部652供給至導引構件66的內部之位置。 Similarly to the configuration of the first embodiment, the drive source 653 is configured such that the bottom portion of the melting furnace 32, the guide member 66, and the storage portion 652 can be moved up and down. The driving source 653 is configured to move the shaft portion 651 between the first position and the second position, and the first position supplies the molten metal M1 from the melting furnace 32 to the storage via the recess 65g as indicated by the solid line in the figure. The position of the portion 652 is a position at which the molten metal M1 is supplied from the storage portion 652 to the inside of the guiding member 66 via the recess 65g as shown by the two-point line in the figure.

此外,與熔解爐32同樣地,儲留部652及導引構件66的內壁面係被用以降低與熔融液M1之間的親和性之襯裡構材所被覆。藉此,由於能將已在熔融液排放機構65所排放的預定量的熔融液M2穩定地導引至容器H,因此能抑制到達至容器H的熔融液的量的偏差。此外,為了防止與導引構件66的接觸導致蒸發材料M的冷卻,係設置有可將導引構件66維持於預定溫度以上之加熱源661。 Further, similarly to the melting furnace 32, the inner wall surfaces of the storage portion 652 and the guide member 66 are covered with a lining member for reducing the affinity with the melt M1. Thereby, since the predetermined amount of the molten metal M2 discharged from the melt discharge mechanism 65 can be stably guided to the container H, variations in the amount of the molten liquid reaching the container H can be suppressed. Further, in order to prevent cooling of the evaporation material M by contact with the guiding member 66, a heating source 661 capable of maintaining the guiding member 66 at a predetermined temperature or higher is provided.

與上述第一實施形態同樣地,在如上所構成的本實施形態的供給單元64中,亦可藉由軸部651的一次的升降動作將預定量的熔融液高精度且穩定地從熔解爐32內供給至容器H。由於上述預定量係能因應儲留部652的內部容積任意地設計,因此即使對於欲將比較大容量的熔融液一次性地供給至容器H之要求亦能充分地對應。 Similarly to the above-described first embodiment, in the supply unit 64 of the present embodiment configured as described above, a predetermined amount of the molten liquid can be accurately and stably removed from the melting furnace 32 by the vertical lifting operation of the shaft portion 651. The inside is supplied to the container H. Since the predetermined amount can be arbitrarily designed in accordance with the internal volume of the storage portion 652, it is possible to sufficiently cope with the requirement that the relatively large-capacity molten liquid is to be supplied to the container H at one time.

以上已說明本發明的實施形態,但本發明並未限定於上述實施形態,而可施加各種變化。 Although the embodiments of the present invention have been described above, the present invention is not limited to the above embodiments, and various modifications can be applied.

例如,在以上的實施形態中,雖然已例舉蒸鍍部10中的蒸發源係由電子束蒸發源所構成之情形予以說明,但並未限定於此,亦可由阻抗加熱式或誘導加熱式蒸發源所構成。在此情形中,本發明亦可作為被供給至這些蒸發源之蒸發材料的供給裝置而應用。 For example, in the above embodiment, the case where the evaporation source in the vapor deposition unit 10 is constituted by the electron beam evaporation source has been described. However, the present invention is not limited thereto, and may be an impedance heating type or an induction heating type. The evaporation source is composed of. In this case, the present invention can also be applied as a supply means for the evaporation material supplied to these evaporation sources.

10‧‧‧蒸鍍部 10‧‧‧Decanting Department

11‧‧‧蒸鍍室 11‧‧‧vaporation chamber

12‧‧‧基板保持部 12‧‧‧Substrate retention department

13‧‧‧支撐台 13‧‧‧Support table

14‧‧‧電子槍 14‧‧‧Electronic gun

20‧‧‧材料供給機構 20‧‧‧Material supply agency

30‧‧‧材料供給部 30‧‧‧Material Supply Department

31‧‧‧材料供給室 31‧‧‧Material supply room

32‧‧‧熔解爐 32‧‧‧melting furnace

33‧‧‧支撐台 33‧‧‧Support table

34‧‧‧供給單元 34‧‧‧Supply unit

35‧‧‧熔融液排放機構 35‧‧‧ melt discharge mechanism

36‧‧‧導引構件 36‧‧‧Guide members

37‧‧‧感測器 37‧‧‧ Sensors

38‧‧‧控制器 38‧‧‧ Controller

40‧‧‧搬運部 40‧‧‧Transportation Department

41‧‧‧搬運室 41‧‧・Transport room

42‧‧‧搬運單元 42‧‧‧Transportation unit

51‧‧‧第一真空排氣系統 51‧‧‧First vacuum exhaust system

52‧‧‧第二真空排氣系統 52‧‧‧Second vacuum exhaust system

53‧‧‧第三真空排氣系統 53‧‧‧ Third vacuum exhaust system

100‧‧‧蒸鍍裝置 100‧‧‧Vapor deposition unit

421‧‧‧手部 421‧‧‧Hands

422‧‧‧多關節手臂部 422‧‧‧Multi-joint arm

A1、A2、A3‧‧‧旋轉軸 A1, A2, A3‧‧‧ rotating shaft

E‧‧‧電子束 E‧‧‧electron beam

Fh‧‧‧凸緣部 Fh‧‧‧Flange

H‧‧‧容器 H‧‧‧ Container

M‧‧‧蒸發材料 M‧‧‧ evaporation material

M1、M2‧‧‧熔融液 M1, M2‧‧‧ melt

M3‧‧‧蒸氣 M3‧‧‧Vapor

P1、P3‧‧‧待機位置 P1, P3‧‧‧ standby position

P2‧‧‧蒸發位置 P2‧‧‧Evaporation position

P4‧‧‧供給位置 P4‧‧‧ supply location

S‧‧‧基板 S‧‧‧Substrate

V1、V2‧‧‧閘閥 V1, V2‧‧‧ gate valve

Claims (8)

一種材料供給裝置,係具備有:材料供給室,係設置於蒸鍍室的外部,並可維持於減壓氛圍;熔解爐,係設置於前述材料供給室,用以熔解蒸發材料;至少一個容器,係可收容已在前述熔解爐熔解的前述蒸發材料的熔融液;供給單元,係安裝於前述熔解爐,用以將前述熔融液從前述熔解爐供給至前述容器;以及搬運單元,係可將從前述供給單元供給且已在前述容器內凝固之前述蒸發材料的鑄錠連同前述容器一起搬運至前述蒸鍍室。 A material supply device comprising: a material supply chamber disposed outside the vapor deposition chamber and maintained in a reduced pressure atmosphere; and a melting furnace disposed in the material supply chamber for melting the evaporation material; at least one container a supply of the molten material that has been melted in the melting furnace; a supply unit installed in the melting furnace for supplying the molten liquid from the melting furnace to the container; and a transport unit The ingot of the evaporating material supplied from the supply unit and solidified in the container is transported to the vapor deposition chamber together with the container. 如請求項1所記載之材料供給裝置,其中前述容器係包含有可分別收容前述蒸發材料之複數個容器;前述材料供給裝置係進一步具備有支撐台,該支撐台係包含有分度台,該分度台係可將前述複數個容器依序地移動至前述供給單元所為之前述蒸發材料的供給位置。 The material supply device according to claim 1, wherein the container includes a plurality of containers that can respectively accommodate the evaporation materials, and the material supply device further includes a support table, wherein the support table includes an indexing table. The indexing station can sequentially move the plurality of containers to the supply position of the evaporation material provided by the supply unit. 如請求項1或2所記載之材料供給裝置,其中前述供給單元係具備有:熔融液排放機構,係具備有:軸構件,係液密性地貫通前述熔解爐的底部,並於外周面具有至少一個 凹部;以及驅動源,係使前述軸構件沿著前述軸構件的軸方向往復移動;並構成為前述熔融液排放機構係可藉由沿著前述軸構件的軸方向的往復移動而將預定量的熔融液排出至前述熔解爐的外部;以及導引構件,係設置於前述熔解爐的底部,用以將已排出至前述熔解爐的外部之前述預定量的熔融液誘導至前述容器。 The material supply device according to claim 1 or 2, wherein the supply unit includes a melt discharge mechanism including a shaft member that penetrates the bottom of the melting furnace in a liquid-tight manner and has an outer peripheral surface at least one a recessed portion; and a drive source for reciprocating the shaft member along an axial direction of the shaft member; and configured to cause the melt discharge mechanism to be a predetermined amount by reciprocating movement along an axial direction of the shaft member The molten metal is discharged to the outside of the melting furnace; and a guiding member is provided at a bottom portion of the melting furnace for inducing the predetermined amount of the molten metal discharged to the outside of the melting furnace to the container. 如請求項3所記載之材料供給裝置,其中前述熔融液排放機構係進一步具備有:儲留部,係設置於前述熔解爐的底部,並可儲留前述預定量的熔融液;前述軸構件係液密性地貫通前述儲留部;前述驅動源係構成為可將前述軸構件於第一位置與第二位置之間移動,前述第一位置係經由前述凹部將前述熔融液從前述熔解爐供給至前述儲留部之位置,前述第二位置係經由前述凹部將前述熔融液從前述儲留部供給至前述導引構件之位置。 The material supply device according to claim 3, wherein the melt discharge mechanism further includes a storage portion provided at a bottom portion of the melting furnace and capable of storing the predetermined amount of the molten liquid; Liquid-tightly penetrating the storage portion; the driving source is configured to move the shaft member between a first position and a second position, and the first position is to supply the molten liquid from the melting furnace via the recess The second position is a position at which the molten material is supplied from the storage portion to the guiding member via the recessed portion at the position of the storage portion. 如請求項1至4中任一項所記載之材料供給裝置,其中進一步具備有:搬運室,係用以收容前述搬運單元,並可維持於減壓氛圍。 The material supply device according to any one of claims 1 to 4, further comprising: a transfer chamber for accommodating the transport unit and maintained in a reduced pressure atmosphere. 一種蒸鍍裝置,係具備有:蒸鍍部,係具有蒸鍍室;材料供給室,係設置於前述蒸鍍室的外部,並可維持於減壓氛圍; 熔解爐,係設置於前述材料供給室,用以熔解蒸發材料;第一支撐部,係包含有至少一個容器,前述容器係可收容已在前述熔解爐熔解的前述蒸發材料的熔融液;供給單元,係將前述熔融液從前述熔解爐供給至前述容器;以及搬運單元,係可將從前述供給單元供給且已在前述容器內凝固的前述蒸發材料的鑄錠連同前述容器一起從前述第一支撐部搬運至前述蒸鍍室。 A vapor deposition device comprising: a vapor deposition unit having a vapor deposition chamber; and a material supply chamber disposed outside the vapor deposition chamber and maintained in a reduced pressure atmosphere; a melting furnace is disposed in the material supply chamber for melting the evaporation material; the first support portion includes at least one container, and the container is configured to receive the molten material of the evaporation material that has been melted in the melting furnace; And supplying the molten liquid from the melting furnace to the container; and a conveying unit that is an ingot of the evaporating material that is supplied from the supply unit and solidified in the container together with the container from the first support The part is transported to the vapor deposition chamber. 如請求項6所記載之蒸鍍裝置,其中前述蒸鍍部係進一步具備有:支撐台,係設置於前述蒸鍍室,用以支撐前述容器;以及電子槍,係可對已收容於前述支撐台上的前述容器的前述鑄錠照射電子束。 The vapor deposition device according to claim 6, wherein the vapor deposition unit further includes: a support base provided in the vapor deposition chamber to support the container; and an electron gun that is accommodated in the support table The aforementioned ingot of the aforementioned container is irradiated with an electron beam. 如請求項7所記載之蒸鍍裝置,其中前述容器係包含有可分別收容前述蒸發材料之複數個容器;前述支撐台係包含有分度台,前述分度台係可將前述複數個容器依序地移動至前述電子槍的前述電子束的照射位置。 The vapor deposition device according to claim 7, wherein the container comprises a plurality of containers respectively accommodating the evaporation materials; the support table includes an indexing table, and the indexing table can be configured according to the plurality of containers The position of the irradiation of the aforementioned electron beam of the aforementioned electron gun is sequentially moved.
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Publication number Priority date Publication date Assignee Title
CN110218977B (en) * 2019-07-03 2021-04-27 Tcl华星光电技术有限公司 Evaporation plating device
CN113564534B (en) * 2020-04-28 2023-05-09 宝山钢铁股份有限公司 Continuous plating solution supply device and method for vacuum plating unit
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Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03173767A (en) * 1989-11-30 1991-07-29 Mitsubishi Electric Corp Apparatus for forming thin film
JPH05128518A (en) 1991-10-31 1993-05-25 Sony Corp Manufacture of magnetic recording medium
JPH07286266A (en) 1994-04-18 1995-10-31 Fuji Photo Film Co Ltd Vapor deposition device and vapor deposition method
JP4312289B2 (en) * 1999-01-28 2009-08-12 キヤノンアネルバ株式会社 Organic thin film forming equipment
JP4701486B2 (en) * 2000-09-18 2011-06-15 エプソントヨコム株式会社 Electron gun for electron beam vapor deposition, vapor deposition material holding device, and vapor deposition device
CN1210435C (en) * 2003-06-04 2005-07-13 深圳市创欧科技有限公司 Evaporating and coating apparatus for making organic electroluminescent display
WO2007135870A1 (en) * 2006-05-19 2007-11-29 Ulvac, Inc. Vapor deposition apparatus for organic vapor deposition material and process for producing organic thin film
JP5081899B2 (en) * 2007-03-26 2012-11-28 株式会社アルバック Vapor deposition source, vapor deposition apparatus, film formation method
JP5282038B2 (en) * 2007-09-10 2013-09-04 株式会社アルバック Vapor deposition equipment
KR101182907B1 (en) * 2007-10-09 2012-09-13 파나소닉 주식회사 Film forming method and film forming apparatus
KR101205752B1 (en) * 2008-02-26 2012-11-28 가부시키가이샤 알박 Film forming source, deposition apparatus and apparatus for manufacturing organic el element
JP2010106357A (en) * 2008-09-30 2010-05-13 Canon Inc Method for depositing film and film deposition apparatus
JP2010265508A (en) * 2009-05-14 2010-11-25 Panasonic Corp Apparatus and method for manufacturing thin film
JP2013127086A (en) * 2011-12-16 2013-06-27 Ulvac Japan Ltd Vapor deposition apparatus and vapor deposition method
JP2014136827A (en) * 2013-01-18 2014-07-28 Hitachi High-Technologies Corp Vapor deposition apparatus and evaporation source used therefor

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