TW201719686A - Method for fabricating high-conductivity thick aluminum paste - Google Patents

Method for fabricating high-conductivity thick aluminum paste Download PDF

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TW201719686A
TW201719686A TW104137774A TW104137774A TW201719686A TW 201719686 A TW201719686 A TW 201719686A TW 104137774 A TW104137774 A TW 104137774A TW 104137774 A TW104137774 A TW 104137774A TW 201719686 A TW201719686 A TW 201719686A
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aluminum
powder
paste
aluminum powder
conductivity
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TW104137774A
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Chinese (zh)
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TWI591653B (en
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李文熙
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國立成功大學
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Abstract

A method is provided to fabricate a thick aluminum paste. Distribution of particle size is wide. Solid content is increased. Thus, the problem of multiple pores is solved. A mechanism of alumina surface rupture is used. Sufficient glass powder is coordinated to inhibit exposed liquid of metal aluminum from air oxidation. Furthermore, adjacent exposed liquids of metal aluminum are contacted with each other to form conductive path. Hence, low electrical conductivity of aluminum paste is highly improved. The thick aluminum paste has low cost and high conductivity and can be sintered in air.

Description

高導電率厚膜鋁膏之製造方法Method for manufacturing high conductivity thick film aluminum paste

本發明係有關於一種高導電率厚膜鋁膏之製造方法,尤指涉及一種改善傳統鋁膏低導電率之問題,提供一低成本、高導電率,且可在空氣中燒結之厚膜導電鋁膏,特別係指可廣泛地取代現有高成本之導電銀膏與需在還原氣氛下燒結之導電銅膏之應用者。The invention relates to a method for manufacturing a high-conductivity thick-film aluminum paste, in particular to a problem of improving the low conductivity of a conventional aluminum paste, providing a low-cost, high-conductivity, and thick film conductive which can be sintered in air. Aluminum paste, in particular, refers to an application that can widely replace existing high cost conductive silver pastes with conductive copper pastes that need to be sintered in a reducing atmosphere.

厚膜電阻器之端電極可以分成三部份,正面端電極、側面端電極與背面端電極,其中側面端電極與背面端電極只是利用來供後製程電鍍鎳與錫晶種層使用,而正面端電極除了用來供後製程電鍍鎳與錫晶種層使用之外,同時也必需負責連接電阻層導通之路徑,因此正面端電極之導電率必須遠低於電阻層電阻率才可形成歐姆接觸。目前市面上端電極所用之導電漿料以銀膏為主,其亦為目前技術最成熟且應用最廣泛之厚膜導電漿料,具有高導電率,且可在空氣中燒結等優點,但成本過於昂貴,且隨著國際銀價持續上漲,銀粉價格仍高居不下,考量到成本問題,部分應用慢慢轉往以成本較低廉之銅做為金屬填充物,但因銅容易氧化,必須在還原氣氛下燒結,而還原氣氛燒結爐價格昂貴,故銅膏之應用還是有限。而鋁膏具有成本低且可在空氣中燒結之優勢,但目前市售鋁膏之電阻率往往偏高。造成傳統鋁膏呈現低導電率之主要原因為,金屬鋁在空氣中表面會自然生成一層薄薄之氧化鋁層阻止內部持續氧化,而這層氧化層阻擋了內部金屬鋁之接觸也抑制鋁在燒結過程中之收縮,造成燒結完後形成多孔洞與鋁空殼等缺陷結構,導致高電阻率,其微結構如第9圖所示。由此圖中可明顯看到傳統鋁膏多孔洞與鋁空殼之結構(或缺陷)。 再者,一般導電銀膏或銅膏在填充基板之孔洞與金屬化線路時都會面臨一個嚴重問題,一般導電銀膏或銅膏印刷後之尺寸會在燒結後因銀膏或銅膏之收縮而尺寸減少,這個問題對於填孔特別嚴重,因為會造成填孔導電膏無法填滿孔洞而留有空隙,可能影響導電或導熱行為,甚至在真空封裝時會有漏氣問題。 鑑於銀膏成本昂貴;銅膏雖然價格相對便宜但必須在還原氣氛下燒結 ,限制了銅膏之應用。而金屬鋁具有高導電率、低成本且可在空氣中燒結等優勢,但製作成鋁膏之後卻無法發揮其高導電率之特性。故,ㄧ般習用者係無法符合使用者於實際使用時之所需。The terminal electrode of the thick film resistor can be divided into three parts, a front end electrode, a side end electrode and a back end electrode, wherein the side end electrode and the back end electrode are only used for the post process electroplating nickel and tin seed layer, and the front side In addition to being used for the post-plating electroplating of nickel and tin seed layers, the terminal electrodes must also be responsible for connecting the path of the resistive layer conduction. Therefore, the conductivity of the front end electrode must be much lower than the resistivity of the resistive layer to form an ohmic contact. . At present, the conductive paste used in the terminal electrode on the market is mainly silver paste, which is also the most mature and widely used thick film conductive paste, which has the advantages of high electrical conductivity and sintering in air, but the cost is too high. Expensive, and as the international silver price continues to rise, the price of silver powder remains high, considering the cost issue, some applications are slowly transferred to low-cost copper as a metal filler, but because copper is easily oxidized, it must be in a reducing atmosphere. Under sintering, the reducing atmosphere sintering furnace is expensive, so the application of copper paste is limited. While aluminum paste has the advantage of low cost and can be sintered in air, the resistivity of commercially available aluminum pastes tends to be high. The main reason for the low electrical conductivity of the traditional aluminum paste is that the metal aluminum naturally forms a thin layer of aluminum oxide on the surface of the air to prevent continuous oxidation inside, and this layer of oxide blocks the contact of the internal metal aluminum and inhibits the aluminum. The shrinkage during the sintering process results in the formation of porous structures such as porous holes and aluminum voids after sintering, resulting in high electrical resistivity, and the microstructure thereof is as shown in Fig. 9. The structure (or defect) of the conventional aluminum paste porous hole and the aluminum empty shell can be clearly seen from the figure. In addition, generally conductive silver paste or copper paste will face a serious problem in filling the holes and metallization lines of the substrate. Generally, the size of the conductive silver paste or copper paste after printing will be caused by the shrinkage of silver paste or copper paste after sintering. The size is reduced. This problem is particularly serious for the hole filling, because the filling hole conductive paste cannot fill the hole and leave a void, which may affect the conductive or thermal conduction behavior, and may even have a gas leakage problem during vacuum packaging. In view of the high cost of silver paste; copper paste, although relatively inexpensive, must be sintered in a reducing atmosphere, limiting the application of copper paste. Metal aluminum has the advantages of high electrical conductivity, low cost, and sintering in air, but it cannot be utilized as an aluminum paste to exhibit its high electrical conductivity. Therefore, the user-like users cannot meet the needs of the user in actual use.

本發明之主要目的係在於,克服習知技藝所遭遇之上述問題並提供一種改善傳統鋁膏多孔洞與鋁空殼等缺陷造成低導電率之問題,能大幅提升導電率,實現一低成本、高導電率,且可在空氣中燒結之厚膜導電鋁膏,並可廣泛地取代現有高成本之導電銀膏與需在還原氣氛下燒結之導電銅膏之應用之高導電率厚膜鋁膏之製造方法。 本發明之次要目的係在於,提供一種可應用於厚膜電阻器端電極與LED陶瓷基板金屬化製程之高導電率厚膜鋁膏。 為達以上之目的,本發明係一種高導電率厚膜鋁膏之製造方法,其至少包含下列步驟:(A)提供一含不同粒徑之鋁粉,且該鋁粉之大小粒徑比例為4±50%:1±50%;(B)將該鋁粉與一玻璃粉混合,其中該玻璃粉之固體含量為7.5wt%±50%,且該鋁粉與該玻璃粉總固體含量比例為10:1;以及(C)將該鋁粉與該玻璃粉之混合物在至少500°C以上燒結溫度下進行液相燒結,此燒結溫度係可使該混合物中鋁粉利用表面氧化鋁破裂機制搭配液相玻璃粉包覆住所有鋁粉破裂的表面以抑制裸露之液態金屬鋁接觸空氣而氧化,並促使相鄰裸露之液態金屬鋁互相接觸而形成導電通路,得到一緻密且無收縮之厚膜導電漿料。 於本發明上述實施例中,該厚膜導電漿料之片電阻值小於5mΩ/sq。 於本發明上述實施例中,該鋁粉大粒徑控制在4~6μm,小粒徑控制在1~3μm。The main object of the present invention is to overcome the above problems encountered in the prior art and to provide a problem of improving the low electrical conductivity caused by defects such as the porous holes of the aluminum paste and the aluminum shell, which can greatly improve the electrical conductivity and achieve a low cost. High-conductivity, thick-film conductive aluminum paste that can be sintered in air, and can widely replace the high-conductivity silver paste with high-conductivity conductive silver paste and conductive copper paste that needs to be sintered in a reducing atmosphere. Manufacturing method. A secondary object of the present invention is to provide a high conductivity thick film aluminum paste which can be applied to a thick film resistor terminal electrode and an LED ceramic substrate metallization process. For the purpose of the above, the present invention is a method for producing a high-conductivity thick-film aluminum paste, which comprises at least the following steps: (A) providing an aluminum powder having different particle diameters, and the size ratio of the aluminum powder is 4±50%: 1±50%; (B) mixing the aluminum powder with a glass powder, wherein the glass powder has a solid content of 7.5 wt%±50%, and the ratio of the aluminum powder to the total solid content of the glass powder 10:1; and (C) the mixture of the aluminum powder and the glass powder is subjected to liquid phase sintering at a sintering temperature of at least 500 ° C. The sintering temperature is such that the aluminum powder in the mixture utilizes a surface alumina cracking mechanism. It is coated with liquid glass powder to cover the cracked surface of all aluminum powder to inhibit the exposure of exposed liquid metal aluminum to the air, and promote the contact of adjacent bare liquid metal aluminum to form a conductive path, which is uniform and non-shrinking. Membrane conductive paste. In the above embodiment of the invention, the thick film conductive paste has a sheet resistance of less than 5 mΩ/sq. In the above embodiment of the invention, the aluminum powder has a large particle size of 4 to 6 μm and a small particle size of 1 to 3 μm.

請參閱『第1A圖~第8圖』所示,係分別為本發明之製造流程示意圖、本發明之氧化鋁破裂機制示意圖、本發明之使用態樣示意圖、本發明大小鋁粉顆粒之熱重分析示意圖、本發明大小鋁粉顆粒之表面微結構示意圖、本發明使用不同比例之大小粒徑鋁粉之微結構示意圖、本發明添加不同玻璃量之熱重分析示意圖、本發明添加不同比例玻璃之微結構示意圖、本發明鋁粉與玻璃粉匹配與不匹配情況之微結構示意圖、本發明新型鋁膏與傳統鋁膏之微結構示意圖、本發明高導電率厚膜鋁膏應用厚膜電阻器端電極之可靠度硫化測試結果示意圖、以及本發明應用於LED陶瓷基板填孔與金屬化製程之結構示意圖。如圖所示:本發明係一種高導電率厚膜鋁膏之製造方法,其至少包含下列步驟: (A)如第1A圖所示,提供一含不同粒徑之鋁粉1,且該鋁粉1之大小粒徑比例為4±50%:1±50%,其中大粒徑鋁粉1控制在4~6μm,小粒徑鋁粉1控制在1~3μm; (B)將該鋁粉1與一玻璃粉2混合,其中該玻璃粉2之固體含量為7.5wt%±50%,且該鋁粉1與該玻璃粉2總固體含量比例為10:1;以及 (C)將該鋁粉1與該玻璃粉2之混合物在至少500°C以上燒結溫度下進行液相燒結,此燒結溫度係可使該混合物中鋁粉1從固態金屬鋁11轉變為液態金屬鋁12,利用表面氧化鋁13破裂機制(如第1B圖所示)搭配液相玻璃粉2包覆住所有鋁粉1破裂的表面以抑制裸露之液態金屬鋁12接觸空氣而氧化,並促使相鄰裸露之液態金屬鋁12互相接觸而形成導電通路14,得到一緻密且無收縮之厚膜導電鋁膏。如是,藉由上述揭露之流程構成一全新之高導電率厚膜鋁膏之製造方法。 傳統鋁膏多孔洞與鋁空殼之缺陷結構(如第9圖所示),其中多孔洞可藉由不同粒徑堆疊與提高固體含量來改善,而造成鋁空殼主要原因為在燒結溫度超過鋁之熔點(660°C)使內部金屬鋁熔化而膨脹,因膨脹係數之差異造成表面氧化鋁破裂使內部液態金屬鋁流出之後隨即氧化形成鋁空殼。對此,本發明充分利用上述所提創新技術,當運用時,如第1C圖所示,係將上述鋁粉1與玻璃粉2之混合物,與一黏著劑3混成漿料,將其印刷於基板後進行燒結,使黏著劑3燒除且玻璃粉2軟化為液相玻璃粉2,藉由表面氧化鋁13破裂機制並搭配足夠之玻璃粉2抑制裸露之液態金屬鋁12接觸空氣而氧化,進一步促使相鄰裸露之液態金屬鋁12互相接觸,形成導電通路。因此,本發明利用提高固體含量,即可實現高導電率、低成本且可在空氣中燒結之厚膜導電鋁膏。 針對上述鋁粉顆粒大小效應,本發明首先利用熱重分析觀察大粒徑與小粒徑鋁粉之氧化程度並且與掃描式電子顯微鏡(Scanning Electron Microscopy, SEM)圖互相對照,如第2A、2B圖所示,可以看出大粒徑鋁粉在600~700°C與持溫階段各有較大量之氧化,而小粒徑鋁粉則在500~600°C氧化後則無大量氧化發生。對照第2B圖SEM可以看出大粒徑鋁粉表面有隆起物,此隆起物即為在燒結超過鋁熔點之後表面氧化鋁破裂,內部液態金屬鋁流出隨即氧化所造成之現象,而小顆粒徑則無明顯隆起物產生;此結果代表大粒徑鋁粉較小粒徑鋁粉容易破裂。據此,本發明希望表面氧化鋁破裂如此才有機會使內部金屬鋁互相連接。故選擇以大粒徑鋁粉為主,小粒徑鋁粉為輔來達到形成通路與緻密化之目的。第3圖為本發明提高鋁膜堆疊密度,使用大小粒徑鋁粉比例1:0、1:1、4:1、及0:1之剖面微結構,明顯可以看到小粒徑鋁粉在燒結過後因表面氧化鋁層沒有破裂,無法形成導電通路,造成高電阻率。而大粒徑鋁粉因氧化層破裂促使鄰近裸露出之液態金屬鋁接觸形成導電通路,獲得較低電阻率。因此,根據電性及堆疊緻密程度得到一大粒徑與小粒徑鋁粉最佳比例為4:1。 而在氧化鋁破裂之後,必須要有足夠之液相玻璃粉包覆住破裂之表面抑制其氧化,並透過液相燒結之方式增加液態金屬鋁接觸之機會。對此,本發明嘗試添加不同之玻璃量分別為0%、3%、7.5%、及10%,且使用熱重分析儀觀察其玻璃粉添加量與氧化之關係如第4A圖所示,並搭配第4B圖之剖面圖觀察玻璃粉添加量對微結構之影響。由熱重分析儀可以觀察到隨玻璃粉之添加量增加氧化之程度就越小,而添加至7.5%玻璃粉後則幾乎沒有明顯之氧化。搭配剖面微結構可發現玻璃粉添加量太少無法有效包覆住所有鋁粉而造成液態金屬鋁流出產生鋁空殼;添加過量之玻璃粉則會阻擋液態金屬鋁之接觸面積,因電阻與接觸面積成正比,故造成高電阻率;由此可知,適當之玻璃粉添加量不但可以抑制氧化亦可增加液態金屬鋁接觸之機會,進而大幅降低電阻率。因此,本發明採用最佳玻璃粉添加量為7.5%,其鋁粉與玻璃粉比例為10:1。 本發明利用上述結果提升固體含量。配合表一顯示各個鋁膏之配方、電性、及燒結溫度總表,結果如第5圖所示,圖(a)發現鋁粉與玻璃粉比例不匹配(25:1)之狀況下提升固體含量片電阻值從13.59mΩ/sq下降至9.51mΩ/sq,僅降低約30%;而圖(b)鋁粉與玻璃粉比例匹配(10:1)之狀況下提升固含量片電阻值從10.87mΩ/sq大幅降低至4.53mΩ/sq,有效再降低約60%之片電阻值,此結果也說明了鋁粉與玻璃粉比例之重要性,而從第5圖剖面微結構也可以看出匹配之鋁粉與玻璃粉之比例可以有效增加導電通路並達到緻密之結構,進而實現一高導電率、低成本且可在空氣中燒結之厚膜導電鋁膏。 表一 第6圖中(a)為傳統鋁膏及(b)為本發明新型鋁膏之剖面微結構,由傳統鋁膏與本發明新型鋁膏微結構之差異,可以看出本發明新型鋁膏鋁粒子之間明顯形成導電通路,且堆疊緻密程度明顯改善許多。表二為本發明新型鋁膏與各種厚膜導體特性比較,由比較結果可知,本發明可改善傳統鋁膏低導電率之問題,提供一低成本、高導電率,且可在空氣中燒結之導電鋁膏,可廣泛取代高成本之導電銀膏與需在還原氣氛下燒結之導電銅膏。 表二 本發明提供一低成本、高導電且可在空氣中燒結之厚膜導電鋁膏,可大幅降低生產厚膜電阻器之生產成本。當使用於厚膜電阻器端電極一具體實施例中,其硫化測試條件為:溫度為105±2°C,時間為1000小時,於飽和硫蒸氣下(δR/R<1%)。由第7圖可靠度硫化測試1000小時結果顯示,傳統銀端電極與硫反應生成硫化銀導致1000小時測試後電阻值量測不到或是嚴重飄移;相反的,本發明以高導電率鋁膏應用厚膜電阻器鋁端電極1000小時硫化可靠度測試結果介面非常乾淨,代表硫與鋁不會發生反應,所以測試後阻值非常穩定。 第8圖(a)為本發明利用高導電率鋁膏4燒結不收縮應用於LED陶瓷基板5填孔與金屬化製程,由圖(b)結果顯示,本發明所提導電鋁膏4具有印刷後與燒結後尺寸完全不變之優點,顯見本發明對於填孔或是金屬化電極要求高精準度變化特別有幫助。因此, 由上述第6~8圖顯示,本發明利用創新之技術徹底改善多孔洞與鋁空殼等缺陷,能大幅提升導電率,實現一高導電率、低成本且可在空氣中燒結之厚膜導電鋁膏,並可應用於厚膜電阻器端電極、LED陶瓷基板填孔與金屬化製程、被動元件之內電極與端電極、太陽能電池之背面導體漿料、印刷電路板(PCB)上之電極晶片。 因此,本發明具有下述技術特性與優勢: 1. 本發明目的為改善傳統鋁膏低導電率之問題,提供一低成本、高導電率,且可在空氣中燒結之厚膜導電鋁膏,並可廣泛地取代現有高成本之導電銀膏與需在還原氣氛下燒結之導電銅膏之應用。 2. 本發明利用較廣之粒徑分佈與提高固體含量來解決多孔洞之問題,並充分利用氧化鋁破裂機制搭配上足夠之液相玻璃粉,促使內部液態金屬鋁互相接觸,形成導電通路,徹底改善鋁膏低導電率之問題。 3. 經前述實驗發現大粒徑鋁粉易破裂,形成導電通路,小粒徑鋁粉不易破裂,易填補孔洞,故以大粒徑為主,小粒徑為輔之概念得到一堆疊緻密且電性較佳之大小粒徑比例4:1。 4. 本發明在氧化鋁破裂之後,必須要有足夠之液相玻璃粉來潤濕所有之鋁粉,進而抑制裸露出之液態金屬鋁因流出而氧化與增加液態金屬鋁形成導電通路之機率,透過熱重分析選擇以7.5%之玻璃粉添加量抑制氧化效果為最佳,其鋁粉與玻璃粉比例為10:1。 5. 在取得最佳大小粒徑比、最佳鋁粉與玻璃粉之比例後,等比例提升固體含量,得到一緻密且電性接近銀膏及銅膏之片電阻值4.53 mΩ/sq。 綜上所述,本發明係一種高導電率厚膜鋁膏之製造方法,可有效改善習用鋁膏多孔洞與鋁空殼等缺陷造成低導電率之種種缺點,能大幅提升導電率,實現一低成本、高導電率,且可在空氣中燒結之厚膜導電鋁膏,並可廣泛地取代現有高成本之導電銀膏與需在還原氣氛下燒結之導電銅膏之應用,進而使本發明之産生能更進步、更實用、更符合使用者之所須,確已符合發明專利申請之要件,爰依法提出專利申請。 惟以上所述者,僅為本發明之較佳實施例而已,當不能以此限定本發明實施之範圍;故,凡依本發明申請專利範圍及發明說明書內容所作之簡單的等效變化與修飾,皆應仍屬本發明專利涵蓋之範圍內。Please refer to FIG. 1A to FIG. 8 , which are schematic diagrams of the manufacturing process of the present invention, a schematic diagram of the alumina cracking mechanism of the present invention, a schematic diagram of the use of the present invention, and a thermogravimetric weight of the aluminum powder particles of the present invention. The schematic diagram of the surface, the microstructure of the surface of the aluminum powder particles of the present invention, the microstructural diagram of the aluminum powder of different sizes and sizes of the present invention, the thermogravimetric analysis diagram of adding different amounts of glass of the present invention, and the addition of different proportions of glass according to the present invention Microstructure diagram, microstructure diagram of matching and mismatching of aluminum powder and glass powder of the invention, microstructure diagram of novel aluminum paste and traditional aluminum paste of the invention, and thick film resistor end of high conductivity thick film aluminum paste of the invention The schematic diagram of the reliability test results of the electrode and the structure of the invention applied to the hole filling and metallization process of the LED ceramic substrate. As shown in the figure: the present invention is a method for producing a high-conductivity thick-film aluminum paste, which comprises at least the following steps: (A) as shown in FIG. 1A, an aluminum powder 1 having different particle diameters is provided, and the aluminum is provided. The size ratio of powder 1 is 4±50%: 1±50%, wherein the large particle size aluminum powder 1 is controlled at 4-6 μm, and the small particle size aluminum powder 1 is controlled at 1-3 μm; (B) the aluminum powder 1 mixed with a glass frit 2, wherein the glass frit 2 has a solid content of 7.5 wt% ± 50%, and the ratio of the aluminum frit 1 to the glass frit 2 total solid content is 10:1; and (C) the aluminum The mixture of the powder 1 and the glass frit 2 is subjected to liquid phase sintering at a sintering temperature of at least 500 ° C. The sintering temperature is such that the aluminum powder 1 in the mixture is converted from the solid metal aluminum 11 to the liquid metal aluminum 12 by surface oxidation. The aluminum 13 rupture mechanism (as shown in Figure 1B) is coated with liquid glass frit 2 to cover all ruptured surfaces of aluminum powder 1 to inhibit exposure of exposed liquid metal aluminum 12 to air and promote adjacent bare liquid metal aluminum. 12 contact each other to form a conductive path 14 to obtain a uniform density And thick film conductive aluminum paste without shrinkage. If so, a new method of manufacturing a high conductivity thick film aluminum paste is constructed by the above disclosed process. The defect structure of the traditional aluminum paste porous hole and the aluminum empty shell (as shown in Fig. 9), wherein the porous hole can be improved by stacking different particle sizes and increasing the solid content, and the main reason for the aluminum empty shell is that the sintering temperature exceeds The melting point of aluminum (660 ° C) causes the internal metal aluminum to melt and expand. The surface alumina breaks due to the difference in expansion coefficient, and the internal liquid metal aluminum flows out and then oxidizes to form an aluminum shell. In this regard, the present invention makes full use of the above-mentioned innovative technology. When used, as shown in FIG. 1C, a mixture of the aluminum powder 1 and the glass frit 2 is mixed with an adhesive 3 to be printed thereon. After the substrate is sintered, the adhesive 3 is burned off and the glass frit 2 is softened into the liquid glass frit 2, and the surface alumina 13 is broken and the glass powder 2 is used to inhibit the exposure of the exposed liquid metal aluminum 12 to the air. Further, the adjacent bare liquid metal aluminum 12 is brought into contact with each other to form a conductive path. Therefore, the present invention utilizes a thick film conductive aluminum paste which can achieve high conductivity, low cost and can be sintered in air by increasing the solid content. In view of the above-mentioned aluminum powder particle size effect, the present invention firstly uses thermogravimetric analysis to observe the degree of oxidation of large particle size and small particle size aluminum powder and contrasts with Scanning Electron Microscopy (SEM), such as 2A, 2B. As shown in the figure, it can be seen that the large-diameter aluminum powder has a relatively large amount of oxidation at 600-700 ° C and the temperature-holding phase, while the small-diameter aluminum powder does not undergo a large amount of oxidation after oxidation at 500-600 ° C. According to the SEM of FIG. 2B, it can be seen that there is a bulge on the surface of the large-diameter aluminum powder, and the ridge is a phenomenon in which the surface alumina is ruptured after the sintering exceeds the melting point of the aluminum, and the internal liquid metal aluminum flows out and is oxidized, and the small particle diameter is formed. No obvious bumps are produced; this result represents that the aluminum powder with a small particle size of aluminum powder is easily broken. Accordingly, the present invention contemplates that the surface alumina is broken so that the internal metal aluminum is interconnected. Therefore, it is chosen to use large-size aluminum powder as the main material, and small-diameter aluminum powder as the supplement to achieve the purpose of forming the passage and densification. Fig. 3 is a cross-sectional microstructure of the invention for increasing the stacking density of the aluminum film by using the ratio of the size of the aluminum powder of 1:0, 1:1, 4:1, and 0:1, and it is apparent that the small-sized aluminum powder is After the sintering, the surface aluminum oxide layer is not broken, and a conductive path cannot be formed, resulting in high electrical resistivity. However, the large-diameter aluminum powder is ruptured by the oxide layer to cause the adjacent exposed liquid metal aluminum to contact to form a conductive path, thereby obtaining a lower resistivity. Therefore, according to the electrical properties and the degree of compactness of the stack, the optimum ratio of the large particle size to the small particle size aluminum powder is 4:1. After the alumina is broken, it is necessary to have enough liquid glass powder to cover the cracked surface to inhibit its oxidation, and to increase the chance of liquid metal aluminum contact by liquid phase sintering. In this regard, the present invention attempts to add different amounts of glass to 0%, 3%, 7.5%, and 10%, respectively, and uses a thermogravimetric analyzer to observe the relationship between the amount of glass powder added and oxidation as shown in FIG. 4A, and Use the cross-section of Figure 4B to observe the effect of the amount of glass powder added on the microstructure. It can be observed from the thermogravimetric analyzer that the degree of oxidation increases with the addition amount of the glass frit, and there is almost no significant oxidation after the addition to 7.5% of the glass frit. With the cross-section microstructure, it can be found that the addition of glass powder is too small to effectively cover all the aluminum powder and cause the liquid metal aluminum to flow out to produce aluminum shell; adding excessive glass powder will block the contact area of liquid metal aluminum due to resistance and contact. The area is proportional to the high resistivity; thus, it can be seen that the proper addition of the glass powder can not only inhibit oxidation but also increase the chance of contact with the liquid metal aluminum, thereby greatly reducing the resistivity. Therefore, the optimum glass frit addition amount of the present invention is 7.5%, and the ratio of the aluminum powder to the glass frit is 10:1. The present invention utilizes the above results to increase the solids content. Table 1 shows the formulation, electrical properties, and sintering temperature of each aluminum paste. The results are shown in Figure 5. Figure (a) shows that the aluminum powder does not match the proportion of glass powder (25:1). The resistance of the content sheet decreased from 13.59mΩ/sq to 9.51mΩ/sq, which was only about 30% lower; and the resistance of the (a) aluminum powder to the glass powder matched (10:1) increased the solid content sheet resistance from 10.87. The mΩ/sq is greatly reduced to 4.53mΩ/sq, effectively reducing the sheet resistance of about 60%. This result also shows the importance of the ratio of aluminum powder to glass powder, and the cross-section microstructure of Figure 5 can also be seen to match. The ratio of the aluminum powder to the glass powder can effectively increase the conductive path and achieve a dense structure, thereby realizing a high-conductivity, low-cost and thick film conductive aluminum paste which can be sintered in the air. Table I In Fig. 6, (a) is a conventional aluminum paste and (b) is a cross-sectional microstructure of the novel aluminum paste of the present invention, and the difference between the conventional aluminum paste and the novel aluminum paste microstructure of the present invention can be seen that the novel aluminum paste aluminum of the present invention can be seen. Conductive paths are clearly formed between the particles, and the degree of stack compactness is significantly improved. Table 2 compares the characteristics of the novel aluminum paste with various thick film conductors. As can be seen from the comparison results, the present invention can improve the low conductivity of the conventional aluminum paste, provide a low cost, high electrical conductivity, and can be sintered in air. The conductive aluminum paste can widely replace the high-cost conductive silver paste and the conductive copper paste which needs to be sintered under a reducing atmosphere. Table II The invention provides a low-cost, high-conductivity thick-film conductive aluminum paste which can be sintered in air, which can greatly reduce the production cost of producing thick film resistors. When used in a specific embodiment of a thick film resistor terminal electrode, the vulcanization test conditions are: a temperature of 105 ± 2 ° C, a time of 1000 hours, and a saturated sulfur vapor (δR / R < 1%). The 1000-hour reliability vulcanization test shown in Figure 7 shows that the traditional silver-end electrode reacts with sulfur to form silver sulfide, which causes the resistance value to be undetectable or severely drifted after 1000 hours of testing. Conversely, the present invention uses a high conductivity aluminum paste. The application of the thick-film resistor aluminum terminal electrode for 1000 hours vulcanization reliability test results interface is very clean, which means that sulfur and aluminum will not react, so the resistance is very stable after the test. Figure 8 (a) shows the method for filling and metallizing the LED ceramic substrate 5 by using the high-conductivity aluminum paste 4 without shrinking. The result of the figure (b) shows that the conductive aluminum paste 4 of the present invention has printing. The advantages of post-sintering and post-sintering dimensions are completely unchanged. It is apparent that the present invention is particularly helpful for filling or metallized electrodes requiring high precision variations. Therefore, as shown in the above-mentioned sixth to eighth figures, the present invention uses the innovative technology to thoroughly improve the defects such as the porous hole and the aluminum hollow shell, and can greatly improve the electrical conductivity, realize a high electrical conductivity, low cost, and can be sintered in the air. Membrane conductive aluminum paste, and can be applied to thick film resistor terminal electrode, LED ceramic substrate filling and metallization process, internal electrode and terminal electrode of passive component, back conductor paste of solar cell, printed circuit board (PCB) Electrode wafer. Therefore, the present invention has the following technical characteristics and advantages: 1. The object of the present invention is to improve the low conductivity of a conventional aluminum paste, to provide a low-cost, high-conductivity thick-film conductive aluminum paste which can be sintered in air. And can widely replace the existing high-cost conductive silver paste and the application of conductive copper paste to be sintered under a reducing atmosphere. 2. The invention utilizes a wide particle size distribution and a high solid content to solve the problem of the porous hole, and fully utilizes the alumina rupture mechanism to match enough liquid glass powder to promote the internal liquid metal aluminum to contact each other to form a conductive path. Thoroughly improve the low conductivity of aluminum paste. 3. According to the above experiment, it is found that the large-diameter aluminum powder is easy to be broken and forms a conductive path. The small-diameter aluminum powder is not easy to be broken, and it is easy to fill the hole. Therefore, the large particle size is the main method, and the small particle size is supplemented to obtain a stack dense. The electrical size is preferably 4:1. 4. After the alumina is ruptured, the liquid crystal powder must be sufficient to wet all the aluminum powder, thereby inhibiting the exposure of the exposed liquid metal aluminum to the oxidation and increasing the conductivity of the liquid metal aluminum. It is best to suppress the oxidation effect by adding 7.5% glass powder by thermogravimetric analysis, and the ratio of aluminum powder to glass powder is 10:1. 5. After obtaining the optimal size-to-size ratio and the ratio of the best aluminum powder to the glass powder, the solid content is increased in proportion, and the sheet resistance is 4.53 mΩ/sq which is close to the silver paste and the copper paste. In summary, the present invention is a method for manufacturing a high-conductivity thick-film aluminum paste, which can effectively improve various disadvantages of low conductivity of defects such as porous holes and aluminum shells of conventional aluminum paste, and can greatly improve conductivity and realize one. A low-film, high-conductivity, thick-film conductive aluminum paste that can be sintered in air, and can widely replace the existing high-cost conductive silver paste and the conductive copper paste to be sintered under a reducing atmosphere, thereby enabling the present invention The production can be more progressive, more practical, and more in line with the needs of the user. It has indeed met the requirements of the invention patent application, and has filed a patent application according to law. However, the above is only the preferred embodiment of the present invention, and the scope of the present invention is not limited thereto; therefore, the simple equivalent changes and modifications made in accordance with the scope of the present invention and the contents of the invention are modified. All should remain within the scope of the invention patent.

1‧‧‧鋁粉
11‧‧‧固態金屬鋁
12‧‧‧液態金屬鋁
13‧‧‧表面氧化鋁
14‧‧‧導電通路
2‧‧‧玻璃粉
3‧‧‧黏著劑
4‧‧‧鋁膏
5‧‧‧陶瓷基板
1‧‧‧Aluminum powder 11‧‧‧Solid metal aluminum 12‧‧‧Liquid metal aluminum 13‧‧‧Surface alumina 14‧‧‧Electrical path 2‧‧‧Glass powder 3‧‧‧Adhesive 4‧‧‧Aluminum Paste 5‧‧‧ceramic substrate

第1A圖,係本發明之製造流程示意圖。 第1B圖,係本發明之氧化鋁破裂機制示意圖。 第1C圖,係本發明之使用態樣示意圖。 第2A圖,係本發明大小鋁粉顆粒之熱重分析示意圖。 第2B圖,係本發明大小鋁粉顆粒之表面微結構示意圖。 第3圖,係本發明使用不同比例之大小粒徑鋁粉之微結構示意圖。 第4A圖,係本發明添加不同玻璃量之熱重分析示意圖。 第4B圖,係本發明添加不同比例玻璃之微結構示意圖。 第5圖,係本發明鋁粉與玻璃粉匹配與不匹配情況之微結構示意圖 第6圖,係本發明新型鋁膏與傳統鋁膏之微結構示意圖。 第7圖,係本發明高導電率厚膜鋁膏應用厚膜電阻器端電極之可靠 度硫化測試結果示意圖。 第8圖,係本發明應用於LED陶瓷基板填孔與金屬化製程之結構示意圖。 第9圖,係傳統厚膜鋁膏燒結後微結構示意圖Fig. 1A is a schematic view showing the manufacturing process of the present invention. Figure 1B is a schematic view of the alumina rupture mechanism of the present invention. Fig. 1C is a schematic view showing the use of the present invention. Fig. 2A is a schematic diagram showing the thermogravimetric analysis of the sized aluminum powder particles of the present invention. Fig. 2B is a schematic view showing the surface microstructure of the sized aluminum powder particles of the present invention. Fig. 3 is a schematic view showing the microstructure of aluminum powder of different sizes and sizes in the present invention. Figure 4A is a schematic diagram of thermogravimetric analysis of the present invention with different amounts of glass added. Figure 4B is a schematic view showing the microstructure of the present invention in which different proportions of glass are added. Fig. 5 is a schematic view showing the microstructure of the aluminum powder and the glass powder of the present invention. Fig. 6 is a schematic view showing the microstructure of the novel aluminum paste and the conventional aluminum paste of the present invention. Fig. 7 is a schematic view showing the results of reliability vulcanization test of a thick film resistor terminal electrode of a high conductivity thick film aluminum paste of the present invention. Figure 8 is a schematic view showing the structure of the present invention applied to the hole filling and metallization process of the LED ceramic substrate. Figure 9, is a schematic diagram of the microstructure of a conventional thick film aluminum paste after sintering

1‧‧‧鋁粉 1‧‧‧Aluminum powder

11‧‧‧固態金屬鋁 11‧‧‧Solid metal aluminum

12‧‧‧液態金屬鋁 12‧‧‧Liquid metal aluminum

13‧‧‧表面氧化鋁 13‧‧‧ surface alumina

14‧‧‧導電通路 14‧‧‧Electrical path

2‧‧‧玻璃粉 2‧‧‧Glass powder

Claims (3)

一種高導電率厚膜鋁膏之製造方法,其至少包含下列步驟: (A)提供一含不同粒徑之鋁粉,且該鋁粉之大小粒徑比例為4±50%:1±50%; (B)將該鋁粉與一玻璃粉混合,其中該玻璃粉之固體含量為7.5wt%±50%,且該鋁粉與該玻璃粉總固體含量比例為10:1;以及 (C)將該鋁粉與該玻璃粉之混合物在至少500°C以上燒結溫度下進行液相燒結,此燒結溫度係可使該混合物中鋁粉利用表面氧化鋁破裂機制搭配液相玻璃粉包覆住所有鋁粉破裂的表面以抑制裸露之液態金屬鋁接觸空氣而氧化,並促使相鄰裸露之液態金屬鋁互相接觸而形成導電通路,得到一緻密且無收縮之厚膜導電鋁膏。The invention relates to a method for manufacturing a high conductivity thick film aluminum paste, which comprises at least the following steps: (A) providing an aluminum powder having different particle diameters, and the size ratio of the aluminum powder is 4±50%: 1±50% (B) mixing the aluminum powder with a glass frit, wherein the glass frit has a solid content of 7.5 wt% ± 50%, and the ratio of the aluminum powder to the glass frit total solid content is 10:1; and (C) The aluminum powder and the glass powder mixture are subjected to liquid phase sintering at a sintering temperature of at least 500 ° C or higher, and the sintering temperature is such that the aluminum powder in the mixture can be covered with the surface alumina cracking mechanism and the liquid glass powder. The ruptured surface of the aluminum powder oxidizes by inhibiting the exposed liquid metal aluminum from contacting the air, and causes adjacent bare liquid metal aluminum to contact each other to form a conductive path, thereby obtaining a dense and non-shrinking thick film conductive aluminum paste. 依申請專利範圍第1項所述之高導電率厚膜鋁膏之製造方法,其 中,該厚膜導電鋁膏之片電阻值小於5mΩ/sq。The method for producing a high-conductivity thick-film aluminum paste according to claim 1, wherein the thick-film conductive aluminum paste has a sheet resistance of less than 5 mΩ/sq. 依申請專利範圍第1項所述之高導電率厚膜鋁膏之製造方法,其 中,該鋁粉大粒徑控制在4~6μm,小粒徑控制在1~3μm。The method for producing a high-conductivity thick-film aluminum paste according to the first aspect of the invention, wherein the aluminum powder has a large particle size of 4 to 6 μm and a small particle size of 1 to 3 μm.
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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI823518B (en) * 2022-06-14 2023-11-21 國立成功大學 Method for sintering base metal electrodes or alloys at high temperature in air

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI823518B (en) * 2022-06-14 2023-11-21 國立成功大學 Method for sintering base metal electrodes or alloys at high temperature in air

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