TW201710687A - Interposer and vertical probe card assembly using the same - Google Patents

Abstract

An interposer includes at least one guide board, a conductive casing, and a spring pin. The guide board has a through hole. The conductive casing is disposed at the through hole and has an accommodating space. The spring pin is disposed at the accommodating space and slidably contacts the conductive casing. The spring pin is hollow and has a wall thickness, and the wall thickness is 4-15 micrometers.

Description

Interface connecting device and vertical probe card set using same Loading

The present invention relates to an interface connecting device and a vertical probe card assembly using the same.

Figure 11 is a schematic exploded view of a conventional vertical probe card 4. The vertical probe card 4 includes components such as a printed circuit board 40, a conductive film 41, a lower frame plate 42, an electrical connection plate 43, an upper frame plate 44, and a probe 45. The conductive film 41 is electrically connected to the printed circuit board 40. The lower frame plate 42 is locked to the printed circuit board 40 after being aligned, and the electrical connection plate 43 is electrically connected to the conductive film 41. The upper frame plate 44 is also locked after being aligned. In the printed circuit board 40, the probe 45 has a plurality of upright probes, and the probes are arranged according to the object to be tested to electrically connect the electrical connection plates 43.

However, the above-mentioned conductive film 41 has a drawback in that the compressible amount is too small, it is easy to be contacted on one side, but the other side is in a warped state, so that the difference in the distance between the interfaces cannot be absorbed. Further, if the conductive film 41 is partially damaged, the conductive film 41 must be removed from the vertical probe card 4, and a new conductive film 41 needs to be replaced. In addition, there is also a conventional device for replacing the above-mentioned conductive film 41 as a interface by a conventional pogo pin. However, the disadvantage of using a pogo pin is that if at least one end of the spring pin is welded or welded to the metal case at least one end. There are disadvantages that are easily deformed and cannot be used in small pitches.

In view of the above, it is an object of the present invention to provide an interface connecting device that can solve the above problems.

In order to achieve the above object, according to an embodiment of the present invention, an interface connecting device includes at least one guide plate, a conductive outer casing, and a pogo pin. The guide plate has perforations. The conductive outer casing is disposed on the perforation and has a receiving space. The pogo pin is disposed in the accommodating space and slidably contacts the conductive housing. The spring pin is hollow and has a wall thickness of 4 to 15 microns.

The present invention further provides a vertical probe card assembly that solves the above problems. In accordance with an embodiment of the present invention, a vertical probe card assembly includes a circuit board, a space transformer, and the above-described interface connection device. The interface connecting device is disposed between the circuit board and the space converter. The spring pin is electrically connected to the circuit board and the space converter.

The present invention further proposes a vertical probe card assembly that can solve the above problems. In accordance with an embodiment of the present invention, a vertical probe card assembly includes a circuit board, an interface connection device, and a securing member. The interface connection device is detachably coupled to the circuit board. The interface connecting device includes at least one guide plate, a conductive outer casing, and a pogo pin. The guide plate has perforations. The conductive outer casing is disposed on the perforation and has a receiving space. The pogo pin is disposed in the accommodating space and slidably connected to the conductive housing touch. The spring pin is hollow and has a wall thickness and a wall thickness of 4 to 15 microns. The fixing component is disposed on the circuit board for fixing the guide plate. The conductive outer casing is slidably disposed on the through hole and has an abutting portion for abutting against a surface of the guide plate facing the circuit board. The electrically conductive outer casing has an open end and a closed end. The spring pin is threaded out of the open end to contact the circuit board, and the spring pin is compressed between the circuit board and the closed end.

1‧‧‧Vertical probe card assembly

10‧‧‧ boards

12‧‧‧ Space Converter

14, 34‧‧‧Interface connection device

140‧‧‧ Guide

140a‧‧‧Perforation

142, 342‧‧‧ Conductive housing

144‧‧ ‧ spring needle

144a‧‧‧ tube body

144a1‧‧‧Spring structure

144a2‧‧‧Contact end

144a3‧‧‧Reed structure

144b‧‧‧The first time

342b‧‧‧closed end

342b1‧‧‧Contact endpoint

342c‧‧‧Abutment

36‧‧‧Fixed components

C‧‧‧ center axis

E‧‧‧ oblique end face

P‧‧‧Contact endpoint

S‧‧‧ accommodating space

G‧‧‧ gap

4‧‧‧Vertical probe card

40‧‧‧Printed circuit board

41‧‧‧Conductive film

42‧‧‧ lower frame

144c‧‧‧Second Air Force

15‧‧‧Probe head

16‧‧‧ probe

342a‧‧‧Open end

43‧‧‧Electrical connection plate

44‧‧‧Upper board

45‧‧‧ Probe

The above and other objects, features, advantages and embodiments of the present invention will become more <RTIgt; </ RTI> <RTIgt; </ RTI> <RTIgt; .

2 is a partial cross-sectional view showing the assembly of a vertical probe card according to an embodiment of the present invention.

FIG. 3A is a combination diagram of a conductive outer casing and a pogo pin according to an embodiment of the present invention.

Fig. 3B is an exploded view showing the conductive case and the pogo pin in Fig. 3A.

Fig. 4 is a partial perspective view showing a pogo pin according to an embodiment of the present invention.

Figure 5 is a cross-sectional view showing the pogo pin of Figure 4 in a conductive housing.

Fig. 6 is a partial perspective view showing a pogo pin according to another embodiment of the present invention.

Figure 7 is a cross-sectional view showing the pogo pin of Figure 6 in a conductive housing.

Fig. 8 is a partial perspective view showing a pogo pin according to still another embodiment of the present invention.

Figure 9 is a partial cross-sectional view showing the assembly of a vertical probe card according to another embodiment of the present invention.

Figure 10 is a partial cross-sectional view showing the assembly of a vertical probe card according to still another embodiment of the present invention.

Figure 11 is a schematic exploded view of a conventional vertical probe card.

The embodiments of the present invention are disclosed in the following drawings, and the details of However, it should be understood that these practical details are not intended to limit the invention. That is, in some embodiments of the invention, these practical details are not necessary. In addition, some of the conventional structures and elements are shown in the drawings in a simplified schematic manner in order to simplify the drawings.

Please refer to Figure 1 and Figure 2. FIG. 1 is a schematic view showing a vertical probe card assembly 1 according to an embodiment of the present invention. Fig. 2 is a partial cross-sectional view showing the vertical probe card assembly 1 according to an embodiment of the present invention.

As shown in FIGS. 1 and 2, in the present embodiment, the vertical probe card assembly 1 includes a circuit board 10, a space transformer 12, and a interface connecting device 14. It is to be noted that, further, the vertical probe card assembly 1 includes a plurality of probes 16, which may be one type A forming needle produced by mechanical stamping of a wire, or a vertical bucking probe, or a pogo pin or a micro electro mechanical systems (MEMS) process. Any form of probe such as a MEMS probe produced is not intended to limit the invention. In addition, the probes 16 can be further fixed by a probe head 15. The probe head 15 is a well-known art in the art, and is not described here, nor is it intended to limit the present. invention. The interface connecting device 14 is disposed between the circuit board 10 and the space converter 12. The interface connection device 14 includes a plurality of pogo pins 144. The spring pin 144 is used to directly electrically connect the circuit board 10 and the space converter 12. The probe 16 is disposed on the other side of the space transformer 12 with respect to the interface connecting device 14, and the space transformer 12 is used to electrically connect the spring pins 144 to the probes 16, respectively. Therefore, the vertical probe card assembly 1 can be adapted to the corresponding electrical contacts of the probes 16 corresponding to the device under test (DUT) by the space converter 12, thereby enabling the probes 16 to be Directly electrically connecting the corresponding electrical contacts on the object to be tested.

Please refer to Figure 3A and Figure 3B. FIG. 3A is a combination diagram of the conductive housing 142 and the pogo pin 144 according to an embodiment of the present invention. FIG. 3B is an exploded view showing the conductive housing 142 and the pogo pin 144 in FIG. 3A.

As shown in FIG. 3A and FIG. 3B , and referring to FIG. 2 , in the present embodiment, the interface connecting device 14 further includes a guiding plate 140 and a plurality of conductive outer casings 142 (only one example is shown in FIG. 2 as an example). ). The guide plate 140 has a plurality of perforations 140a (the second figure shows only one as an example). Each of the conductive outer casings 142 is disposed on the corresponding through hole 140a and has an accommodation space S. Each of the pogo pins 144 is disposed in the receiving space S of the corresponding conductive housing 142, and is electrically connected to the conductive housing 142. Sliding contact separately (ie, the two are not fixed to each other). The pogo pin 144 is for contacting the circuit board 10 and the space transformer 12, and further, the length of the conductive housing 142 is less than the length of the pogo pin 144 in an unstressed state (ie, a free state). That is, the total length of the pogo pins 144 is greater than the total length of the conductive outer casing 142 in the unstressed state (i.e., the free state). In particular, the pogo pin 144 is hollow and has a wall thickness of 4 to 15 microns. The advantage of setting the wall thickness to 4 to 15 microns is that sufficient mechanical load can be maintained at the Fine Pitch. In addition, the embodiment adopts the method that the conductive outer casing 142 and the spring pin 144 are not fixed to each other, and the fixing process can be reduced, for example, the assembly cost of the welding and welding process, and the welding or welding is required compared with the conventional spring pin. The process of fixing the two to each other can also solve the disadvantage that the conventional spring pin is easily deformed and the small pitch cannot be achieved.

Specifically, the pogo pin 144 includes a tube body 144a. The tube body 144a has a first hollow portion 144b. The first hollow portion 144b is spirally formed around the central axis C of the pipe body 144a on the pipe body 144a. Also, in the direction of the central axis C, the portion of the tube body 144a located between both ends of the first hollow portion 144b forms a compressible spring structure 144a1. This spring structure 144a1 can provide a spring pin 144 compression stroke and spring force. In addition, the tube body 144a further has two contact ends 144a2 for electrically connecting the circuit board 10 and the space converter 12, respectively. In the present embodiment, each contact end 144a2 has two contact end points P, but the invention is not limited thereto.

Of course, the interface connecting device 14 of the present invention can also be used to electrically connect two circuit boards, and is not used to limit the present invention.

In one or more embodiments of the present invention, the spring structure 144a1 is a laser processing structure. That is, the tube body 144a and the first hollow The portion 144b can be simultaneously fabricated by a laser processing process, and the spring structure 144a1 is a portion of the tube body 144a that has compressibility after laser processing, such as laser exposure or laser engraving. Therefore, it can be seen that the spring pin 144 of the present invention is not only relatively simple in structure but also requires only one work at the same time, compared with the conventional practice of fixing the needle tip and the needle tail to the two ends of the spring respectively to make the spring pin. The two contact ends 144a2 (i.e., the needle tip, the needle tail) of the spring pin 144 are coupled to the spring structure 144a1. Therefore, the spring structure 144a1 itself has no other contact points. In addition, it should be noted that the spring structure 144a1 has a rectangular cross-sectional shape (refer to FIG. 2). Since the interface connecting device 14 of the present invention needs to be in a compressed state for a long time, a spring pin 144 having a rectangular cross-sectional shape is selected. Compared with the conventional spring pin having a circular cross-sectional shape, the spring structure 144a1 having a rectangular cross-sectional shape can store more energy, and the durability life is longer than that of the conventional spring pin having a circular cross-sectional shape.

According to the above configuration, when the pogo pin 144 transmits an electric signal between the circuit board 10 and the space converter 12, since the pogo pin 144 is slidably contacted with the conductive outer casing 142, welding or welding is not required, so the electric signal is The conductive outer casing 142 can be directly removed, so that the spiral path of the long spring structure 144a1 can be avoided, thereby not only shortening the circuit conduction path, but also avoiding the damage of the spring structure 144a1 caused by the excessive electrical signal, for example, burning, so the present invention The interface connection device 14 has a high current withstand capability; in addition, the inductance characteristics of the pure spiral structure as in the conventional spring probe can be prevented from affecting the electrical signal transmission bandwidth.

In one or more embodiments of the present invention, the number of contact end points P at the at least one contact end 144a2 of the tube body 144a is two, and these The contact end points P are arranged in a crown. However, in practical applications, the number of contact terminals P of the contact end 144a2 is not limited thereto, and may be elastically changed according to actual needs.

In one or more embodiments of the present invention, the number of the guide plates 140 may be plural. For example, the interface connecting device 14 may include a plurality of guide plates 140 stacked together, and the through holes 140a on the respective guide plates 140 are aligned with each other for the corresponding conductive outer casing 142.

Please refer to Figure 4 and Figure 5. Fig. 4 is a partial perspective view showing a pogo pin 144 according to an embodiment of the present invention. FIG. 5 is a cross-sectional view showing the pogo pin 144 of FIG. 4 in the conductive housing 142.

As shown in FIGS. 4 and 5, in the present embodiment, at least one contact end 144a2 of the tubular body 144a of the pogo pin 144 has an inclined end surface E. The inclined end face E is inclined from one side of the central axis C of the pipe body 144a to the other side. Further, in the direction of the central axis C, the contact end point P is located on the oblique end surface E farthest from the first hollow portion 144b (see Fig. 3B). In other words, the contact end point P is eccentrically disposed with respect to the central axis C of the tube body 144a. Therefore, as is clear from FIG. 5, when the pogo pin 144 contacts the circuit board 10 or the space transformer 12 with the contact end 144a2, for example, the contact end 144a2 is forced along the direction of the hollow arrow in FIG. 5, the spring The needle 144 is laterally abutted against the inner wall of the conductive outer casing 142 due to uneven force, so that the spring pin 144 and the conductive outer casing 142 can be more reliably electrically contacted, so that the electric signal can directly go to the conductive outer casing 142. The circuit conduction path can be changed and shortened.

Please refer to Figure 6 and Figure 7. Fig. 6 is a partial perspective view showing a pogo pin 144 according to another embodiment of the present invention. FIG. 7 is a cross-sectional view showing the pogo pin 144 of FIG. 6 in the conductive housing 142.

As shown in FIGS. 6 and 7, in the present embodiment, the tubular body 144a of the pogo pin 144 further has a second hollow portion 144c. The pogo pin 144 further includes a reed structure 144a3 located at the second hollow portion 144c and connected to the tube body 144a. The reed structure 144a3 extends away from the central axis C of the tubular body 144a, and the reed structure 144a3 can abut the inner wall of the electrically conductive outer casing 142 when placed in the electrically conductive outer casing 142. By the design of the reed structure 144a3, the spring pin 144 and the conductive outer casing 142 can also be electrically contacted more reliably, so that the electric signal can directly go through the conductive outer casing 142, and the circuit conduction path can be changed and shortened. Of course, the reed structure 144a3 can be disposed on the two contact ends 144a2 (ie, the needle tip, the needle tail) of the pogo pin 144, or alternatively, the invention is not limited thereto.

Please refer to FIG. 8 , which is a partial perspective view of a pogo pin 144 according to still another embodiment of the present invention. As shown in Fig. 8, the difference between the pogo pin 144 of the present embodiment and the pogo pin 144 of the embodiment shown in Fig. 6 is that the reed structure 144a3 of the pogo pin 144 shown in Fig. 6 is substantially The spring pin 144 of the present embodiment extends substantially away from the central axis C of the tubular body 144a. It should be noted that the reed structure of the present invention can be designed according to actual needs, shape, direction and arrangement, as long as the reed structure is used for electrical contact with the conductive outer casing, and is not in the above-mentioned FIG. The reed structure 144a3 of Fig. 8 is limited. It should be noted that the spring structure 144a1 and the reed structure 144a3 are made of the same material and are simultaneously formed by one-time processing, for example, laser exposure or laser engraving. In this way, you can Reduce the application of additional contact contacts, because if there are additional contact contacts, the resistance of the additional contact contacts will be increased.

In one or more embodiments of the present invention, the interface connecting device 14 may further comprise a highly conductive thin film coating (not shown) that may be applied to the conductive housing 142 by known surface treatment techniques. The inner wall, the outer casing of the conductive outer casing 142, and the surface of the pogo pin 144 are used to reduce the resistance value of the conductive outer casing 142 in contact with the pogo pin 144, and to prevent oxidation of the electrically conductive outer casing 142 and the pogo pin 144.

Please refer to FIG. 9 , which is a partial cross-sectional view showing the vertical probe card assembly 1 according to another embodiment of the present invention. As shown in FIG. 9, in the present embodiment, the vertical probe card assembly 1 also includes the circuit board 10, the space converter 12, the interface connecting device 34, and a plurality of probes 16 (refer to FIG. 1 and FIG. 2 in cooperation). Figure). The difference between the vertical probe card assembly 1 of the present embodiment and the vertical probe card assembly 1 of the embodiment shown in FIG. 2 is that the conductive housing 342 of the interface connection device 34 is improved in the present embodiment.

Specifically, the conductive outer casing 342 of the present embodiment has an open end 342a and a closed end 342b. A contact end 144a2 of the spring pin 144 passes through the open end 342a of the conductive housing 342 to contact the circuit board 10, and the other contact end 144a2 of the spring pin 144 is electrically connected to the space converter via the closed end 342b of the conductive housing 342. 12. Further, the vertical probe card assembly 1 of the present embodiment further includes a fixing member 36. The fixing component 36 is disposed on the circuit board 10 for fixing the guide 140 of the interface connecting device 34. The conductive outer casing 342 is slidably disposed on the through hole 140a of the guide plate 140 and has an abutting portion 342c. The abutting portion 342c of the conductive outer casing 342 is for abutting against a surface of the circuit board 10 against the guide plate 140. spring The pin 144 is compressed between the circuit board 10 and the closed end 342b of the conductive housing 342. When the abutting portion 342c of the conductive outer casing 342 abuts against the surface of the guide plate 140 facing the circuit board 10, the closed end 342b of the conductive outer casing 342 protrudes beyond the through hole 140a, and thus can be in contact with the space transformer 12, and one of the spring pins 144 The contact end 144a2 can be electrically connected to the space transformer 12 via the closed end 342b.

According to the above configuration, a gap G can be formed between the guide 140 and the circuit board 10, and when the closed end 342b of the conductive housing 342 contacts the space transformer 12, the conductive housing 342 and the pogo pin 144 are located at the closed end 342b. The other contact end 144a2 can be pushed simultaneously to move toward the gap G described above. In addition, since the conductive outer casing 342 can slide relative to the guide plate 140 and is not fixed to each other, it is possible to more easily disassemble the various components in the interface connecting device 34. For example, when disassembling, the interface connecting device 34 is detached from the fixing component 36, and the guiding plate 140, the conductive outer casing 342 and the spring pin 144 of the interface connecting device 34 can be easily separated, which is beneficial to the maintenance personnel. Repair or replace components. It should be particularly noted that the closed end referred to in the present invention may refer to a closed end that is completely closed (please refer to FIG. 9), or may also refer to a closed end that is not completely closed, that is, as long as The closed end that prevents the corresponding spring pin from penetrating is the closed end referred to in the present invention.

In practical applications, the fastening component 36 can be any component that can be fixed to the circuit board 10, such as a screw, a bolt or a gasket, but the invention is not limited thereto.

In another embodiment, the fastening element 36 can also be placed in the space transformer 12, and the interface connecting device 34 in FIG. 9 can be placed upside down. That is, in the present embodiment, a contact end 144a2 of the pogo pin 144 is threaded out. The open end 342a of the electrical housing 342 contacts the space transformer 12, and the other contact end 144a2 of the spring pin 144 is electrically connected to the circuit board 10 via the closed end 342b of the conductive housing 342, and the same can be achieved by using the interface connecting device 34. The purpose of connecting the circuit board 10 to the space converter 12 is sexually connected.

Of course, the interface connecting device 34 of the present invention can also be used to electrically connect two circuit boards, and is not used to limit the present invention.

Please refer to FIG. 10, which is a partial cross-sectional view showing the vertical probe card assembly 1 according to still another embodiment of the present invention. As shown in FIG. 10, the difference between the vertical probe card assembly 1 of the present embodiment and the vertical probe card assembly 1 of the embodiment shown in FIG. 9 is that the conductive outer casing 342 of the present embodiment is closed. The outer side of the end 342b further includes a plurality of contact terminals 342b1 for electrically contacting the space transformer 12. In the present embodiment, the contact end points 342b1 are crowned, but the invention is not limited thereto. Of course, in another embodiment, the interface connecting device 34 in FIG. 10 can also be inverted upside down, that is, the outer side of the closed end 342b of the conductive housing 342 further includes a plurality of contact terminals 342b1 for The circuit board 10 is in electrical contact.

From the above detailed description of the specific embodiments of the present invention, it can be clearly seen that the pogo pins in the interface connecting device of the present invention are assembled into a conductive housing by a spring pin formed of the same material and simultaneously formed by one-time processing. It can be used as an interface connection between the board and the space converter. In particular, the method of not fixing each other between the conductive outer casing and the pogo pin of the present invention not only reduces the assembly cost, but also requires a conventional spring pin to be fixed to each other by a process such as welding or welding. The conventional spring pin can be easily deformed and the short distance cannot be achieved. Moreover, the pogo pin of the present invention is also transparent The over-eccentric contact end design or the reed structure design ensures that the spring pin can positively contact the inner wall of the conductive housing when it is actuated, so that the electrical signal can directly go out of the conductive outer casing, thereby changing and shortening the circuit conduction path. Moreover, the interface connecting device of the present invention can replace the damaged pogo pin according to actual needs, and does not need to replace a new conductive film as in the conventional conductive film.

The present invention has been disclosed in the above embodiments, and is not intended to limit the scope of the present invention, and the invention may be modified and modified in various ways without departing from the spirit and scope of the invention. The scope is subject to the definition of the scope of the patent application.

142‧‧‧Electrical housing

144‧‧ ‧ spring needle

144a‧‧‧ tube body

144a1‧‧‧Spring structure

144a2‧‧‧Contact end

144b‧‧‧The first time

P‧‧‧Contact endpoint

S‧‧‧ accommodating space

Claims (19)

An interface connecting device comprising: at least one guiding plate having a through hole; a conductive outer casing disposed on the through hole and having an accommodating space; and a pogo pin disposed in the accommodating space and electrically connected to the conductive outer casing The sliding contact is separately separated, wherein the spring pin is hollow and has a wall thickness, and the wall thickness is 4-15 microns. The interface connecting device of claim 1, wherein the pogo pin includes a tube body having a first hollow portion, the first hollow portion spirally surrounding a central axis of the tube body On the tubular body, and in the direction of the central axis, the portion of the tubular body between the ends of the first hollow portion forms a compressible spring structure. The interface connecting device of claim 2, wherein the tubular body further has two contact ends, at least one of the contact ends having at least one contact end. The interface connecting device of claim 3, wherein the number of the at least one contact end points is plural, and the contact end points are arranged in a crown shape. The interface connecting device of claim 3, wherein the tubular body has two contact ends, at least one of the contact ends having an inclined end surface inclined from one side of the central axis to the other side, And on the central axis In the direction, the contact end is located on the inclined end face farthest from the first hollow portion. The interface connecting device of claim 3, wherein the tubular body further has a second hollow portion, the spring pin further comprising a reed structure at the second hollow portion and connecting the tubular body, and the reed The structural system extends away from the central axis and abuts the inner wall of the electrically conductive outer casing. The interface connecting device of claim 6, wherein the spring structure and the reed structure are of the same material and are simultaneously formed by one-time processing. The interface connecting device of claim 2, wherein the spring structure has a rectangular cross-sectional shape. The interface connecting device of claim 1, wherein the length of the conductive housing is less than the length of the spring pin. A vertical probe card assembly, comprising: a circuit board; a space converter; and an interface connecting device according to any one of claims 1 to 9, disposed between the circuit board and the space converter The spring pin is electrically connected to the circuit board and the space converter. The vertical probe card assembly of claim 10, further comprising a plurality of probes located on the other side of the space transformer relative to the interface connecting device, wherein the spring pin is electrically The circuit board, the space converter and the probes are connected. The vertical probe card assembly of claim 10, wherein the total length of the pogo pins is greater than the total length of the conductive housing to contact the circuit board and the space transformer. The vertical probe card assembly of claim 10, wherein the conductive housing has an open end and a closed end, the spring pin passing through the open end to contact the circuit board, and via the closed end The space converter is electrically connected. The vertical probe card assembly of claim 13 further comprising a fastening component disposed on the circuit board for fixing the at least one guide plate, wherein the conductive outer casing is slidable The hole is disposed on the through hole and has an abutting portion for facing a surface of the circuit board facing the circuit board, and the spring pin is compressed between the circuit board and the closed end. The vertical probe card assembly of claim 14, wherein the closed end protrudes beyond the perforation when the abutment abuts the surface of the guide plate facing the circuit board. A vertical probe card assembly that includes: a circuit board; an interface connecting device, detachably connected to the circuit board, wherein the interface connecting device comprises: at least one guiding plate having a through hole; a conductive outer casing disposed on the through hole and having an accommodating space; And a pogo pin disposed in the accommodating space and slidably contacting the conductive housing, wherein the pogo pin is hollow and has a wall thickness, and the wall thickness is 4-15 microns; and a fixing An affixing component is disposed on the circuit board for fixing the at least one guiding plate, wherein the conductive outer casing is slidably disposed on the through hole, and has an abutting portion for abutting against the guiding plate a surface of the circuit board; wherein the conductive housing has an open end and a closed end, the spring pin passes through the open end to contact the circuit board, and the spring pin is compressed on the circuit board and the closed end between. The vertical probe card assembly of claim 16, wherein the closed end protrudes beyond the perforation when the abutting portion abuts the surface of the guide plate facing the circuit board. The vertical probe card assembly of claim 16, further comprising a space converter disposed between the circuit board and the space converter, wherein the spring pin is electrically connected to the circuit Board with the space converter. The vertical probe card assembly of claim 18, further comprising a plurality of probes located on the other side of the space transformer relative to the interface connecting device, wherein the spring pin is electrically The circuit board, the space converter and the probes are connected.