TW201706387A - Composite sheet for forming protective film - Google Patents
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- C09J—ADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
- C09J7/00—Adhesives in the form of films or foils
- C09J7/30—Adhesives in the form of films or foils characterised by the adhesive composition
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- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
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- C09D163/00—Coating compositions based on epoxy resins; Coating compositions based on derivatives of epoxy resins
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- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
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- C09D7/00—Features of coating compositions, not provided for in group C09D5/00; Processes for incorporating ingredients in coating compositions
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- C09J—ADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
- C09J133/00—Adhesives based on homopolymers or copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and at least one being terminated by only one carboxyl radical, or of salts, anhydrides, esters, amides, imides, or nitriles thereof; Adhesives based on derivatives of such polymers
- C09J133/04—Homopolymers or copolymers of esters
- C09J133/06—Homopolymers or copolymers of esters of esters containing only carbon, hydrogen and oxygen, the oxygen atom being present only as part of the carboxyl radical
- C09J133/08—Homopolymers or copolymers of acrylic acid esters
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- C—CHEMISTRY; METALLURGY
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- C09J133/00—Adhesives based on homopolymers or copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and at least one being terminated by only one carboxyl radical, or of salts, anhydrides, esters, amides, imides, or nitriles thereof; Adhesives based on derivatives of such polymers
- C09J133/04—Homopolymers or copolymers of esters
- C09J133/06—Homopolymers or copolymers of esters of esters containing only carbon, hydrogen and oxygen, the oxygen atom being present only as part of the carboxyl radical
- C09J133/10—Homopolymers or copolymers of methacrylic acid esters
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67132—Apparatus for placing on an insulating substrate, e.g. tape
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/6835—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
- H01L21/6836—Wafer tapes, e.g. grinding or dicing support tapes
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- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09J—ADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
- C09J2203/00—Applications of adhesives in processes or use of adhesives in the form of films or foils
- C09J2203/326—Applications of adhesives in processes or use of adhesives in the form of films or foils for bonding electronic components such as wafers, chips or semiconductors
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Abstract
Description
本發明係關於一種保護膜形成用複合片,用於在半導體晶片的背面形成保護膜。 The present invention relates to a composite sheet for forming a protective film for forming a protective film on the back surface of a semiconductor wafer.
本申請案主張基於2015年6月5日在日本提出申請之日本特願2015-114714號的優先權,並將其內容引用至本文中。 Priority is claimed on Japanese Patent Application No. 2015-114714, filed on Jan.
近年來,業界使用稱為所謂的倒裝(face down)方式之安裝方法製造半導體裝置。倒裝方式中,使用電路面上具有凸塊(bump)等電極之半導體晶片,將前述電極與基板接合。因此,存在晶片之電路面的相反側之背面裸露之情況。 In recent years, the industry has manufactured semiconductor devices using a mounting method called a so-called face down method. In the flip-chip method, a semiconductor wafer having electrodes such as bumps on a circuit surface is used, and the electrodes are bonded to the substrate. Therefore, there is a case where the back side of the opposite side of the circuit surface of the wafer is exposed.
有時於該裸露之晶片背面形成有由有機材料構成之樹脂膜作為保護膜,形成為附有保護膜之半導體晶片後組合至半導體裝置中。利用保護膜之目的在於:防止於切割(dicing)步驟或封裝(packaging)之後晶片產生龜裂,或者用於將所獲得之晶片接著至晶粒座(die pad)部或其他半導體 晶片等其他構件上。 A resin film made of an organic material is formed as a protective film on the back surface of the bare wafer, and is formed into a semiconductor wafer with a protective film and then incorporated into a semiconductor device. The purpose of using the protective film is to prevent cracking of the wafer after the dicing step or packaging, or to transfer the obtained wafer to a die pad portion or other semiconductor. On other components such as wafers.
另一方面,使用如下所述之保護膜形成用複合片來形成此種保護膜,亦即,上述保護膜形成用複合片係於基材上具備黏著劑層,且於前述黏著劑層上具備保護膜形成用膜。前述保護膜形成用複合片中,保護膜形成用膜具有形成保護膜之功能,並且基材及黏著劑層之積層結構體發揮作為切割片(dicing sheet)之功能,可謂為保護膜形成用膜與切割片形成為一體之保護膜形成用複合片。 On the other hand, the protective film is formed by using a composite sheet for forming a protective film, that is, the composite sheet for forming a protective film has an adhesive layer on a substrate, and is provided on the adhesive layer. A film for forming a protective film. In the composite sheet for forming a protective film, the film for forming a protective film has a function of forming a protective film, and the laminated structure of the substrate and the adhesive layer functions as a dicing sheet, and can be said as a film for forming a protective film. A composite sheet for forming a protective film which is formed integrally with a dicing sheet.
此種保護膜形成用複合片例如以如下之方式使用。亦即,將保護膜形成用複合片藉由其保護膜形成用膜而貼附於半導體晶圓的背面(與電極形成面為相反側之面)之後,將半導體晶圓切割成半導體晶片。接著,照射活性能量線使黏著劑層硬化,將半導體晶片自黏著劑層剝離,拾取(pickup)半導體晶片。另一方面,保護膜形成用膜係與半導體晶片一起被拾取,最後以硬化之保護膜之狀態存在於半導體晶片的背面。作為此種保護膜形成用複合片,揭示有一種以如下方式使用之保護膜形成用複合片:拾取半導體晶片時,使保護膜形成用膜成為未硬化或部分硬化之狀態,於將半導體晶片接合(bonding)且以密封材料固化(cure)之時,同時使該未硬化或部分硬化之保護膜形成用膜成為完全或大致完全硬化之狀態(參照專利文獻1)。 Such a composite sheet for forming a protective film is used, for example, in the following manner. In other words, the composite film for forming a protective film is attached to the back surface of the semiconductor wafer (the surface opposite to the electrode forming surface) by the film for forming a protective film, and then the semiconductor wafer is diced into a semiconductor wafer. Next, the active energy ray is irradiated to harden the adhesive layer, the semiconductor wafer is peeled off from the adhesive layer, and the semiconductor wafer is picked up. On the other hand, the film for forming a protective film is picked up together with the semiconductor wafer, and finally exists on the back surface of the semiconductor wafer in a state of being cured. In the composite sheet for forming a protective film, a composite sheet for forming a protective film which is used in the following manner is disclosed in which a film for forming a protective film is uncured or partially cured, and a semiconductor wafer is bonded. When the sealing material is cured, the uncured or partially cured film for forming a protective film is simultaneously or substantially completely cured (see Patent Document 1).
[先前技術文獻] [Previous Technical Literature]
[專利文獻] [Patent Literature]
專利文獻1:日本特開2011-228450號公報。 Patent Document 1: Japanese Laid-Open Patent Publication No. 2011-228450.
但是,如專利文獻1中所揭示之先前的保護膜形成用複合片存在下述問題:於某些使用條件下,尤其是在黏著劑層硬化之後,黏著劑層與保護膜形成用膜之剝離力過大,拾取半導體晶片時晶片產生裂痕或缺口。 However, the conventional composite sheet for forming a protective film disclosed in Patent Document 1 has a problem in that, under certain conditions of use, especially after the adhesive layer is cured, the adhesive layer and the film for forming a protective film are peeled off. If the force is too large, the wafer may be cracked or chipped when the semiconductor wafer is picked up.
本發明係鑒於上述情況而成,本發明之課題在於提供一種保護膜形成用複合片,用於在半導體晶片的背面形成保護膜,且於基材上具備黏著劑層,於前述黏著劑層上具備保護膜形成用膜,黏著劑層與保護膜形成用膜或該保護膜形成用膜硬化後的保護膜之剝離力,在黏著劑層硬化之前足夠大,而可穩定地進行切割,在黏著劑層硬化之後足夠小,而可穩定地拾取半導體晶片。 The present invention has been made in view of the above circumstances, and an object of the present invention is to provide a composite sheet for forming a protective film for forming a protective film on a back surface of a semiconductor wafer and having an adhesive layer on the substrate, on the adhesive layer. The film for forming a protective film, the peeling force of the adhesive film and the protective film forming film or the protective film after the protective film forming film is sufficiently large before the adhesive layer is cured, and can be stably cut and adhered The hardener layer is sufficiently small after hardening to stably pick up the semiconductor wafer.
為了解決上述課題,本發明提供一種保護膜形成用複合片,係於基材上具備黏著劑層,於前述黏著劑層上具備保護膜形成用膜,前述黏著劑層具有活性能量線硬化性,前述保護膜形成用膜具有熱硬化性;前述保護膜形成用複 合片用於製造附有保護膜之半導體晶片,將該保護膜形成用複合片藉由前述保護膜形成用膜貼附於半導體晶圓的背面之後,藉由加熱使前述保護膜形成用膜硬化而形成保護膜,接著切割前述半導體晶圓而形成半導體晶片之後,藉由照射活性能量線而使前述黏著劑層硬化,然後將前述半導體晶片連同貼附於前述半導體晶片的背面之前述保護膜一起拾取,藉此製造附有保護膜之半導體晶片;前述黏著劑層在至少與前述保護膜形成用膜接觸之層中含有(甲基)丙烯酸烷基酯共聚物,前述(甲基)丙烯酸烷基酯共聚物具有由構成烷基酯之烷基的碳數為8以上之(甲基)丙烯酸烷基酯衍生之結構單元。 In order to solve the problem, the present invention provides a composite sheet for forming a protective film, comprising an adhesive layer on a substrate, a film for forming a protective film on the adhesive layer, and the adhesive layer having active energy ray curability. The film for forming a protective film has thermosetting property; The conjugated sheet is used to produce a semiconductor wafer with a protective film, and the composite film for forming a protective film is attached to the back surface of the semiconductor wafer by the film for forming a protective film, and then the film for forming the protective film is cured by heating. After the protective film is formed, and then the semiconductor wafer is diced to form a semiconductor wafer, the adhesive layer is cured by irradiating the active energy ray, and then the semiconductor wafer is attached together with the protective film attached to the back surface of the semiconductor wafer. Picking up, thereby producing a semiconductor wafer with a protective film; the adhesive layer containing an alkyl (meth) acrylate copolymer, the aforementioned alkyl (meth) acrylate in at least a layer in contact with the film for forming a protective film The ester copolymer has a structural unit derived from an alkyl (meth)acrylate having a carbon number of 8 or more constituting the alkyl group of the alkyl ester.
本發明之保護膜形成用複合片較佳為,前述保護膜形成用膜含有環氧樹脂、熱硬化劑及咪唑類,前述熱硬化劑藉由加熱而溶解且對前述環氧樹脂顯示硬化活性。 In the composite sheet for forming a protective film of the present invention, the film for forming a protective film preferably contains an epoxy resin, a thermosetting agent, and an imidazole, and the thermosetting agent is dissolved by heating and exhibits curing activity to the epoxy resin.
本發明之保護膜形成用複合片較佳為,構成前述烷基酯之烷基的碳數為11至18。 In the composite sheet for forming a protective film of the present invention, it is preferred that the alkyl group constituting the alkyl ester has a carbon number of 11 to 18.
亦即,本發明包含以下態樣。 That is, the present invention encompasses the following aspects.
[1]一種保護膜形成用複合片,係於基材上具備黏著劑層,於前述黏著劑層上具備保護膜形成用膜,前述黏著劑層具有活性能量線硬化性,前述保護膜形成用膜具有熱硬化性;前述保護膜形成用複合片用於製造附有保護膜之半導體晶片,藉由前述保護膜形成用膜將前述保護膜形成用複合片貼附於半導體晶圓的背面之後,藉由加熱使前述保 護膜形成用膜硬化而形成保護膜,接著切割前述半導體晶圓而形成半導體晶片之後,藉由照射活性能量線而使前述黏著劑層硬化,然後將前述半導體晶片連同貼附於前述半導體晶片的背面之前述保護膜一起拾取,藉此製造附有保護膜之半導體晶片;前述黏著劑層在至少與前述保護膜形成用膜接觸之層中含有(甲基)丙烯酸烷基酯共聚物;前述(甲基)丙烯酸烷基酯共聚物具有由構成烷基酯之烷基的碳數為8以上之(甲基)丙烯酸烷基酯衍生之結構單元。 [1] A composite sheet for forming a protective film, comprising an adhesive layer on a substrate, a film for forming a protective film on the adhesive layer, the adhesive layer having active energy ray curability, and the protective film forming layer The film has a thermosetting property, and the composite film for forming a protective film is used for producing a semiconductor wafer with a protective film, and the protective film forming film is attached to the back surface of the semiconductor wafer by the protective film forming film. By heating to protect the aforementioned Forming a film for curing a film to form a protective film, and then cutting the semiconductor wafer to form a semiconductor wafer, and then curing the adhesive layer by irradiating an active energy ray, and then attaching the semiconductor wafer to the semiconductor wafer The protective film on the back surface is picked up together, thereby producing a semiconductor wafer with a protective film; the adhesive layer contains an alkyl (meth)acrylate copolymer in at least a layer in contact with the film for forming a protective film; The alkyl (meth) acrylate copolymer has a structural unit derived from an alkyl (meth) acrylate having 8 or more carbon atoms constituting the alkyl group of the alkyl ester.
[2]如[1]所述之保護膜形成用複合片,其中,前述保護膜形成用膜含有環氧樹脂、熱硬化劑及咪唑類,前述熱硬化劑藉由加熱而溶解且對前述環氧樹脂顯示硬化活性。 [2] The composite sheet for forming a protective film according to the above aspect, wherein the film for forming a protective film contains an epoxy resin, a thermosetting agent, and an imidazole, and the thermosetting agent is dissolved by heating and is attached to the ring. The oxygen resin shows hardening activity.
[3]如[1]或[2]所述之保護膜形成用複合片,其中,構成前述烷基酯之烷基的碳數為11至18。 [3] The composite sheet for forming a protective film according to [1], wherein the alkyl group constituting the alkyl ester has a carbon number of 11 to 18.
根據本發明,提供一種保護膜形成用複合片,用於在半導體晶片的背面形成保護膜,且於基材上具備黏著劑層,於前述黏著劑層上具備保護膜形成用膜,前述黏著劑層與前述保護膜形成用膜或前述保護膜形成用膜硬化後的保護膜(亦即,作為前述保護膜形成用膜的硬化物之保護膜)之剝離力,在前述黏著劑層硬化之前足夠大,而可穩定地進行切割,在前述黏著劑層硬化之後足夠小,而可穩定地拾取前述半導體晶片。 According to the present invention, there is provided a composite sheet for forming a protective film, comprising: a protective film formed on a back surface of a semiconductor wafer; and an adhesive layer on the substrate; and a film for forming a protective film on the adhesive layer, the adhesive; The peeling force of the layer and the protective film forming film or the protective film after the film for forming a protective film (that is, the protective film of the cured film for forming the protective film) is sufficient before the adhesive layer is cured. It is large, and the cutting can be performed stably, and after the aforementioned adhesive layer is hardened, it is small enough to stably pick up the aforementioned semiconductor wafer.
1、2、3、4‧‧‧保護膜形成用複合片 1, 2, 3, 4‧‧‧ Composite film for protective film formation
10‧‧‧支持片 10‧‧‧Support tablets
11‧‧‧基材 11‧‧‧Substrate
11a‧‧‧基材的表面 11a‧‧‧ Surface of the substrate
12、32、42‧‧‧黏著劑層 12, 32, 42‧‧‧ adhesive layer
12a、32a、42a‧‧‧黏著劑層的表面 12a, 32a, 42a‧‧‧ Surface of the adhesive layer
120a‧‧‧保護膜形成用膜側之區域 120a‧‧‧A film-side area for protective film formation
13、23‧‧‧保護膜形成用膜 13, 23‧‧‧film for protective film formation
13a、23a‧‧‧保護膜形成用膜的表面 13a, 23a‧‧‧ Surface of film for protective film formation
130a‧‧‧黏著劑層側之區域 130a‧‧‧A region on the adhesive layer side
14‧‧‧剝離膜 14‧‧‧Release film
15‧‧‧夾具用接著劑層 15‧‧‧Binder layer for fixtures
15a‧‧‧夾具用接著劑層的表面 15a‧‧‧ Surface of the adhesive layer for the fixture
150a‧‧‧保護膜形成用膜側之區域 150a‧‧‧A film-side area for protective film formation
230a‧‧‧夾具用接著劑層側之區域 230a‧‧‧A zone for the adhesive layer side of the fixture
321、421‧‧‧第1黏著劑層 321, 421‧‧‧1st adhesive layer
322、422‧‧‧第2黏著劑層 322, 422‧‧‧2nd adhesive layer
322a、422a‧‧‧第2黏著劑層的表面 322a, 422a‧‧‧ surface of the second adhesive layer
圖1係以示意方式表示本發明之保護膜形成用複合片的一實施形態之剖面圖。 Fig. 1 is a cross-sectional view showing an embodiment of a composite sheet for forming a protective film of the present invention.
圖2係以示意方式表示本發明之保護膜形成用複合片的另一實施形態之剖面圖。 Fig. 2 is a cross-sectional view showing another embodiment of the composite sheet for forming a protective film of the present invention.
圖3係以示意方式表示本發明之保護膜形成用複合片的又一實施形態之剖面圖。 Fig. 3 is a cross-sectional view showing still another embodiment of the composite sheet for forming a protective film of the present invention.
圖4係以示意方式表示本發明之保護膜形成用複合片的又一實施形態之剖面圖。 Fig. 4 is a cross-sectional view showing still another embodiment of the composite sheet for forming a protective film of the present invention.
《保護膜形成用複合片》 "Composite sheet for protective film formation"
本發明之保護膜形成用複合片係於基材上具備黏著劑層,於前述黏著劑層上具備保護膜形成用膜,前述黏著劑層具有活性能量線硬化性,前述保護膜形成用膜具有熱硬化性;前述保護膜形成用複合片用於製造附有保護膜之半導體晶片,藉由前述保護膜形成用膜將前述保護膜形成用複合片貼附於半導體晶圓的背面之後,藉由加熱使前述保護膜形成用膜硬化而作為保護膜,接著切割前述半導體晶圓而形成半導體晶片之後,藉由照射活性能量線而使前述黏著劑層硬化,然後將前述半導體晶片連同貼附於前述半導體晶片的背面之前述保護膜一起拾取,藉此製造附有保護膜之半導體晶片;前述黏著劑層在至少與前述保護膜形成用膜接觸之層中含有(甲基)丙烯酸烷基酯共聚物,前 述(甲基)丙烯酸烷基酯共聚物具有由構成烷基酯之烷基的碳數為8以上之(甲基)丙烯酸烷基酯衍生之結構單元。 The composite sheet for forming a protective film of the present invention comprises an adhesive layer on a substrate, a film for forming a protective film on the adhesive layer, the adhesive layer having active energy ray curability, and the film for forming a protective film. The composite film for forming a protective film is used for producing a semiconductor wafer with a protective film, and the protective film forming film is attached to the back surface of the semiconductor wafer by the film for forming a protective film. Heating the film for forming a protective film as a protective film, and then cutting the semiconductor wafer to form a semiconductor wafer, and then curing the adhesive layer by irradiating an active energy ray, and then attaching the semiconductor wafer to the foregoing The protective film on the back surface of the semiconductor wafer is picked up together, thereby manufacturing a semiconductor wafer with a protective film; the adhesive layer contains an alkyl (meth) acrylate copolymer in at least a layer in contact with the film for forming a protective film. ,before The (meth)acrylic acid alkyl ester copolymer has a structural unit derived from an alkyl (meth)acrylate having a carbon number of 8 or more constituting an alkyl group of the alkyl ester.
亦即,本發明之保護膜形成用複合片的一實施形態係包含基材、黏著劑層、及保護膜形成用膜;前述黏著劑層積層於前述基材上,前述保護膜形成用膜積層於前述黏著劑層上;前述黏著劑層具有活性能量線硬化性,且在至少與前述保護膜形成用膜接觸之層中含有(甲基)丙烯酸烷基酯共聚物;前述(甲基)丙烯酸烷基酯共聚物係具有由構成烷基酯之烷基的碳數為8以上之(甲基)丙烯酸烷基酯衍生之結構單元之共聚物;前述保護膜形成用膜具有熱硬化性;前述保護膜形成用複合片係用於製造附有保護膜之半導體晶片,包含以下步驟:藉由前述保護膜形成用膜將前述保護膜形成用複合片貼附於半導體晶圓的背面;藉由加熱使貼附之前述保護膜形成用複合片中的前述保護膜形成用膜硬化而形成保護膜;切割形成有前述保護膜之半導體晶圓而形成半導體晶片;及藉由照射活性能量線而使前述黏著劑層硬化,然後將前述半導體晶片連同貼附於前述半導體晶片的背面之前述保護膜一起拾取。再者,本說明書中,有時將基材及黏著劑層之積層結構體稱為「支持片」。另外,關於前述保護膜形成用複合片,只要維持為前述基材、黏著劑層或其硬化物、及保護膜之積層結構,藉由加熱使前述保護膜形成用膜硬化而形成為保護膜之複合片、或藉由照射活性能量線而使前述黏著劑層硬化後的複合片亦稱為保護膜形成用複合片。 In one embodiment of the composite sheet for forming a protective film of the present invention, the substrate, the adhesive layer, and the film for forming a protective film are provided, and the adhesive layer is laminated on the substrate, and the protective film is formed. The adhesive layer has active energy ray curability, and contains at least a (meth)acrylic acid alkyl ester copolymer in a layer in contact with the protective film forming film; the (meth)acrylic acid The alkyl ester copolymer is a copolymer having a structural unit derived from an alkyl (meth)acrylate having 8 or more carbon atoms of an alkyl group constituting an alkyl ester; the film for forming a protective film has thermosetting property; A composite sheet for forming a protective film for producing a semiconductor wafer with a protective film, comprising the steps of: attaching the composite sheet for forming a protective film to a back surface of a semiconductor wafer by the film for forming a protective film; The protective film forming film in the composite sheet for forming a protective film to be attached is cured to form a protective film; the semiconductor wafer on which the protective film is formed is cut to form a semiconductor wafer; The adhesive layer is cured by irradiating an active energy ray, and then the semiconductor wafer is picked up together with the aforementioned protective film attached to the back surface of the semiconductor wafer. In the present specification, the laminated structure of the substrate and the adhesive layer may be referred to as a "support sheet". In addition, the composite sheet for forming a protective film is formed into a protective film by curing the film for forming a protective film by heating while maintaining the laminated structure of the base material, the adhesive layer or a cured product thereof, and the protective film. The composite sheet or the composite sheet obtained by curing the adhesive layer by irradiation of an active energy ray is also referred to as a composite sheet for forming a protective film.
本發明之保護膜形成用複合片中,黏著劑層中的與前述保護膜形成用膜接觸之層含有如上所述之特定範圍的(甲基)丙烯酸烷基酯共聚物,藉此,在黏著劑層硬化之前,黏著劑層與硬化後的保護膜形成用膜(即保護膜)之剝離力足夠大,可牢固且穩定地固定半導體晶圓,故切割半導體晶圓時晶片飛濺等得到抑制,可穩定地進行切割。 In the composite sheet for forming a protective film of the present invention, the layer in contact with the film for forming a protective film in the adhesive layer contains a specific range of (meth)acrylic acid alkyl ester copolymer as described above, whereby the adhesive layer is adhered thereto. Before the layer of the protective layer is cured, the peeling force of the film for forming the protective film (ie, the protective film) after curing is sufficiently large, and the semiconductor wafer can be firmly and stably fixed, so that the wafer splash or the like is suppressed when the semiconductor wafer is diced. Cutting can be performed stably.
另外,使用前述保護膜形成用複合片時,有時會於半導體晶圓的背面貼附有保護膜之狀態下,在切割半導體晶圓之前,自前述保護膜形成用複合片的基材側對保護膜照射雷射光束,而於保護膜的表面進行印刷(以下,有時稱為「雷射印刷」)。此時,伴隨著雷射印刷,自保護膜的雷射光束照射部位因保護膜分解而產生氣體,但由於如上所述般黏著劑層與保護膜之剝離力足夠大,故即便受到所產生之氣體的壓力,黏著劑層與保護膜之剝離亦得到抑制,且產生氣體積留之情況得到抑制。其結果,不僅如上所述般可穩定地進行切割,並且亦可隔著前述基材及黏著劑層清楚地目視辨識施於保護膜上之印刷。 In addition, when the composite sheet for forming a protective film is used, the base material side of the composite sheet for forming a protective film may be formed before the semiconductor wafer is diced in a state in which a protective film is attached to the back surface of the semiconductor wafer. The protective film irradiates the laser beam and prints on the surface of the protective film (hereinafter sometimes referred to as "laser printing"). At this time, with the laser printing, the laser beam from the protective film is decomposed by the protective film to generate gas, but since the peeling force of the adhesive layer and the protective film is sufficiently large as described above, even if it is subjected to the generation The pressure of the gas, the peeling of the adhesive layer and the protective film are also suppressed, and the generation of the gas volume is suppressed. As a result, not only the dicing can be stably performed as described above, but also the printing applied to the protective film can be clearly visually recognized through the substrate and the adhesive layer.
另一方面,本發明之保護膜形成用複合片中,黏著劑層中的與前述保護膜形成用膜接觸之層含有如上所述之特定範圍的(甲基)丙烯酸烷基酯共聚物,藉此,在黏著劑層硬化之後,該黏著劑層的硬化物與保護膜之剝離力足夠 小,可穩定且容易地拾取附有保護膜之半導體晶片,且拾取時晶片產生裂痕或缺口之情況得到抑制。 On the other hand, in the composite sheet for forming a protective film of the present invention, the layer in contact with the film for forming a protective film in the adhesive layer contains a specific range of (meth)acrylic acid alkyl ester copolymer as described above. Therefore, after the adhesive layer is hardened, the peeling force of the cured product of the adhesive layer and the protective film is sufficient Small, the semiconductor wafer with the protective film can be picked up stably and easily, and the crack or the chip is cracked at the time of picking up.
以下,詳細地說明本發明之保護膜形成用複合片的各構成。 Hereinafter, each configuration of the composite sheet for forming a protective film of the present invention will be described in detail.
<基材> <Substrate>
基材的材質較佳為各種樹脂,作為其具體例,可列舉:聚乙烯(低密度聚乙烯(有時簡稱為LDPE)、直鏈低密度聚乙烯(有時簡稱為LLDPE)、高密度聚乙烯(有時簡稱為HDPE等))、聚丙烯、乙烯-丙烯共聚物、聚丁烯、聚丁二烯、聚甲基戊烯、聚氯乙烯膜、氯乙烯共聚物、聚對苯二甲酸乙二酯、聚萘二甲酸乙二酯、聚對苯二甲酸丁二酯、聚胺甲酸酯、聚丙烯酸胺甲酸酯、聚醯亞胺、乙烯-乙酸乙烯酯共聚物、離子聚合物樹脂、乙烯-(甲基)丙烯酸共聚物、乙烯-(甲基)丙烯酸酯共聚物、聚苯乙烯、聚碳酸酯、氟樹脂、該等任一樹脂之氫化物、改質物、交聯物或共聚物等。 The material of the substrate is preferably various resins, and specific examples thereof include polyethylene (low density polyethylene (sometimes abbreviated as LDPE), linear low density polyethylene (sometimes abbreviated as LLDPE), and high density poly Ethylene (sometimes referred to as HDPE, etc.), polypropylene, ethylene-propylene copolymer, polybutene, polybutadiene, polymethylpentene, polyvinyl chloride film, vinyl chloride copolymer, polyterephthalic acid Ethylene glycol, polyethylene naphthalate, polybutylene terephthalate, polyurethane, polyacrylic acid amide, polyimine, ethylene-vinyl acetate copolymer, ionic polymer Resin, ethylene-(meth)acrylic acid copolymer, ethylene-(meth)acrylate copolymer, polystyrene, polycarbonate, fluororesin, hydride, modification, cross-linking of any of these resins or Copolymers, etc.
再者,本說明書中,「(甲基)丙烯酸」的概念係包括「丙烯酸」及「甲基丙烯酸」兩者。 Further, in the present specification, the concept of "(meth)acrylic acid" includes both "acrylic acid" and "methacrylic acid".
基材的厚度可根據目的適宜選擇,較佳為50μm至300μm,更佳為60μm至100μm。藉由使基材的厚度在上述範圍內,前述保護膜形成用複合片的可撓性、及對半導體晶圓或半導體晶片之貼附性進一步提高。 The thickness of the substrate can be appropriately selected depending on the purpose, and is preferably from 50 μm to 300 μm, more preferably from 60 μm to 100 μm. When the thickness of the substrate is within the above range, the flexibility of the composite sheet for forming a protective film and the adhesion to a semiconductor wafer or a semiconductor wafer are further improved.
本說明書中的「厚度」可藉由JIS K 7130:1999(ISO 4593:1993)中所規定之方法求出。 The "thickness" in the present specification can be obtained by a method specified in JIS K 7130:1999 (ISO 4593:1993).
基材可由1層(單層)構成,亦可由2層以上之複數層構成。基材由複數層構成時,這些複數層相互可相同亦可不同。亦即,可全部層皆相同,亦可全部層皆不同,還可僅一部分層相同。另外,複數層相互不同時,這些複數層之組合並無特別限定。此處,所謂複數層相互不同,表示各層的材質及厚度的至少一者相互不同。 The substrate may be composed of one layer (single layer) or may be composed of a plurality of layers of two or more layers. When the substrate is composed of a plurality of layers, the plurality of layers may be the same or different from each other. That is, all layers may be the same, or all layers may be different, and only a part of the layers may be the same. Further, when the plural layers are different from each other, the combination of these plural layers is not particularly limited. Here, the plural layers are different from each other, and at least one of the material and the thickness of each layer is different from each other.
再者,基材由複數層構成時,使各層的合計厚度為上述較佳的基材厚度即可。 Further, when the substrate is composed of a plurality of layers, the total thickness of each layer may be the above-mentioned preferred substrate thickness.
基材的表面亦可經實施以下處理以提高與設置於基材上之黏著劑層之接著性:藉由噴砂處理、溶劑處理等實施之凹凸化處理;電暈放電處理、電子束照射處理、電漿處理、臭氧/紫外線照射處理、火焰處理、鉻酸處理、熱風處理等氧化處理等。另外,基材的表面亦可經實施底塗(primer)處理。 The surface of the substrate may be subjected to the following treatment to improve the adhesion to the adhesive layer provided on the substrate: roughening treatment by sand blasting, solvent treatment, etc.; corona discharge treatment, electron beam irradiation treatment, Oxidation treatment such as plasma treatment, ozone/ultraviolet irradiation treatment, flame treatment, chromic acid treatment, hot air treatment, and the like. Alternatively, the surface of the substrate may be subjected to a primer treatment.
<黏著劑層> <Adhesive layer>
前述黏著劑層具有活性能量線硬化性,並且在至少與前述保護膜形成用膜接觸之層中含有(甲基)丙烯酸烷基酯共聚物。其中,前述(甲基)丙烯酸烷基酯共聚物具有由構成烷基酯之烷基的碳數為8以上之(甲基)丙烯酸烷基酯 衍生之結構單元。 The pressure-sensitive adhesive layer has active energy ray curability and contains an alkyl (meth) acrylate copolymer in at least the layer in contact with the film for forming a protective film. Wherein the (meth)acrylic acid alkyl ester copolymer has an alkyl (meth)acrylate having a carbon number of 8 or more from an alkyl group constituting the alkyl ester Derived structural unit.
所謂「衍生」係指因聚合而化學結構產生變化。 By "derived" is meant a change in the chemical structure due to polymerization.
再者,本說明書中,所謂「活性能量線」係表示電磁波或帶電粒子束中具有能量量子者,作為其示例,可列舉紫外線、電子束等。 In the present specification, the "active energy ray" means an energy quantum in an electromagnetic wave or a charged particle beam, and examples thereof include ultraviolet rays, electron beams, and the like.
紫外線例如可使用高壓水銀燈、融合(Fusion)H型燈或氙氣燈等作為紫外線源進行照射。電子束可照射利用電子束加速器等產生之電子束。 For example, a high-pressure mercury lamp, a Fusion H-type lamp, a xenon lamp, or the like can be used as the ultraviolet source. The electron beam can illuminate an electron beam generated by an electron beam accelerator or the like.
黏著劑層的厚度可根據目的適宜選擇,較佳為1μm至100μm,更佳為1μm至60μm,特佳為1μm至30μm。 The thickness of the adhesive layer can be appropriately selected depending on the purpose, and is preferably from 1 μm to 100 μm, more preferably from 1 μm to 60 μm, particularly preferably from 1 μm to 30 μm.
黏著劑層由含有前述(甲基)丙烯酸烷基酯共聚物等之黏著劑組成物形成。黏著劑組成物中的常溫下不會氣化的成分彼此的含量比率,通常與黏著劑層中的前述成分彼此的含量比率相同。再者,本說明書中,所謂「常溫」係指不特別冷或特別熱的溫度,亦即平常的溫度,例如可列舉15℃至25℃之溫度等。 The adhesive layer is formed of an adhesive composition containing the aforementioned (meth)acrylic acid alkyl ester copolymer or the like. The content ratio of the components which are not vaporized at normal temperature in the adhesive composition is usually the same as the content ratio of the aforementioned components in the adhesive layer. In the present specification, the term "normal temperature" means a temperature which is not particularly cold or particularly hot, that is, a normal temperature, and examples thereof include a temperature of 15 ° C to 25 ° C.
其次,對含有前述(甲基)丙烯酸烷基酯共聚物之前述黏著劑組成物、以及前述黏著劑組成物及黏著劑所含之成分進行說明。 Next, the above-described adhesive composition containing the alkyl (meth)acrylate copolymer, and the components of the adhesive composition and the adhesive will be described.
[黏著劑組成物] [Adhesive composition]
((甲基)丙烯酸烷基酯共聚物) (alkyl (meth) acrylate copolymer)
前述(甲基)丙烯酸烷基酯共聚物具有由構成烷基酯之烷基的碳數為8以上之(甲基)丙烯酸烷基酯衍生之結構單元。再者,本說明書中,只要無特別說明,簡記為「(甲基)丙烯酸烷基酯」時皆係指上述之「構成烷基酯之烷基的碳數為8以上之(甲基)丙烯酸烷基酯」。 The alkyl (meth)acrylate copolymer has a structural unit derived from an alkyl (meth)acrylate having a carbon number of 8 or more constituting an alkyl group of the alkyl ester. In the present specification, unless otherwise specified, the term "alkyl (meth)acrylate" as used herein means "the number of carbon atoms of the alkyl group constituting the alkyl ester of 8 or more (meth)acrylic acid. Alkyl ester".
前述(甲基)丙烯酸烷基酯的碳數為8以上之烷基可為直鏈狀、支鏈狀及環狀之任一種,為環狀時,可為單環狀及多環狀之任一種,但較佳為直鏈狀或支鏈狀。 The alkyl group having 8 or more carbon atoms of the alkyl (meth)acrylate may be linear, branched or cyclic, and when it is cyclic, it may be monocyclic or polycyclic. One, but preferably linear or branched.
構成前述烷基酯之烷基的碳數為8以上即可,例如可為11以上等。另外,構成前述烷基酯之烷基的碳數較佳為18以下。亦即,構成前述烷基酯之烷基的碳數中,較佳的範圍可列舉8至18,作為一例可列舉11至18。構成烷基酯之烷基的碳數為19以上之(甲基)丙烯酸烷基酯存在溶解性低等問題而難以操作。亦即,若構成烷基酯之烷基的碳數為18以下,則溶解性良好,容易操作。 The number of carbon atoms of the alkyl group constituting the alkyl ester may be 8 or more, and may be, for example, 11 or more. Further, the number of carbon atoms of the alkyl group constituting the alkyl ester is preferably 18 or less. In other words, the carbon number of the alkyl group constituting the alkyl ester is preferably in the range of 8 to 18, and examples thereof are 11 to 18. The (meth)acrylic acid alkyl ester having 19 or more carbon atoms of the alkyl group constituting the alkyl ester has problems such as low solubility and is difficult to handle. In other words, when the number of carbon atoms of the alkyl group constituting the alkyl ester is 18 or less, the solubility is good and handling is easy.
另外,藉由使用構成烷基酯之烷基的碳數為8以上之前述(甲基)丙烯酸烷基酯共聚物,與使用前述碳數未達7之(甲基)丙烯酸烷基酯共聚物之情形相比,黏著劑層的極性低。因此,例如當保護膜形成用膜含有環氧樹脂等高極性材料時,可抑制於保護膜形成用複合片中該高極性材料自保護膜形成用膜向黏著劑層轉移。其結果,可有效地抑 制保護膜形成用膜的熱硬化性降低。另外,保護膜形成用膜藉由加熱而硬化之熱硬化度提高,故後述之附有保護膜之半導體晶片的拾取性提升。 Further, by using the above-mentioned (meth)acrylic acid alkyl ester copolymer having 8 or more carbon atoms of the alkyl group constituting the alkyl ester, and using the aforementioned (meth)acrylic acid alkyl ester copolymer having a carbon number of less than 7 In contrast, the adhesive layer has a low polarity. Therefore, when the film for forming a protective film contains a highly polar material such as an epoxy resin, it is possible to prevent the high-polarity material from being transferred from the film for protective film formation to the adhesive layer in the composite sheet for forming a protective film. The result can be effectively suppressed The thermosetting property of the film for forming a protective film is lowered. In addition, since the thermal curing degree of the film for forming a protective film is hardened by heating, the pick-up property of the semiconductor wafer with a protective film mentioned later is improved.
前述烷基的碳數為8以上之(甲基)丙烯酸烷基酯中,較佳者例如可列舉:(甲基)丙烯酸正辛酯、(甲基)丙烯酸異辛酯、(甲基)丙烯酸-2-乙基己酯、(甲基)丙烯酸正壬酯、(甲基)丙烯酸異壬酯、(甲基)丙烯酸癸酯、(甲基)丙烯酸十一烷基酯、(甲基)丙烯酸十二烷基酯(亦稱為(甲基)丙烯酸月桂酯)、(甲基)丙烯酸十三烷基酯、(甲基)丙烯酸十四烷基酯(亦稱為(甲基)丙烯酸肉豆蔻酯)、(甲基)丙烯酸十五烷基酯、(甲基)丙烯酸十六烷基酯(亦稱為(甲基)丙烯酸棕櫚酯)、(甲基)丙烯酸十七烷基酯、(甲基)丙烯酸十八烷基酯(亦稱為(甲基)丙烯酸硬脂基酯)、(甲基)丙烯酸異十八烷基酯(亦稱為(甲基)丙烯酸異硬脂基酯)等前述烷基為鏈狀之(甲基)丙烯酸烷基酯;(甲基)丙烯酸異冰片酯、(甲基)丙烯酸二環戊酯等(甲基)丙烯酸環烷基酯等。 In the alkyl (meth)acrylate having 8 or more carbon atoms of the alkyl group, preferred examples thereof include n-octyl (meth)acrylate, isooctyl (meth)acrylate, and (meth)acrylic acid. 2-ethylhexyl ester, n-decyl (meth)acrylate, isodecyl (meth)acrylate, decyl (meth)acrylate, undecyl (meth)acrylate, (meth)acrylic acid Dodecyl ester (also known as lauryl (meth)acrylate), tridecyl (meth)acrylate, tetradecyl (meth)acrylate (also known as (meth)acrylic acid nutmeg) Ester), pentadecyl (meth)acrylate, cetyl (meth)acrylate (also known as palmityl (meth)acrylate), heptadecyl (meth)acrylate, (a) Octadecyl acrylate (also known as stearyl (meth) acrylate), isostearyl (meth) acrylate (also known as isostearyl (meth) acrylate), etc. The alkyl group is a chain alkyl (meth)acrylate; an isobornyl (meth)acrylate; a cycloalkyl (meth)acrylate such as dicyclopentanyl (meth)acrylate; and the like.
上述之中,較佳為(甲基)丙烯酸-2-乙基己酯、(甲基)丙烯酸月桂酯、(甲基)丙烯酸異硬脂基酯。 Among the above, 2-ethylhexyl (meth)acrylate, lauryl (meth)acrylate, and isostearyl (meth)acrylate are preferred.
作為前述(甲基)丙烯酸烷基酯共聚物,可列舉藉由照射活性能量線而進行聚合之活性能量線聚合性共聚物。此種共聚物中,較佳者例如可列舉:具有羥基且側鏈具有聚合性基(例如可列舉(甲基)丙烯醯基、乙烯基(ethenyl group)、烯丙基(2-丙烯基)等,較佳為(甲基)丙烯醯基)之共聚物;該等之中,更佳為具有羥基且經由胺甲酸酯鍵而於側鏈具有聚合性基之共聚物。此種(甲基)丙烯酸烷基酯共聚物例如藉由使其所具有之羥基與後述之異氰酸酯系交聯劑中的異氰酸酯基進行反應而產生交聯。另外,此種(甲基)丙烯酸烷基酯共聚物藉由於側鏈具有聚合性基,則例如與另外使用低分子量的活性能量線聚合性化合物,且藉由照射活性能量線而進行聚合反應之情形相比,可不另外使用此種化合物而進行聚合反應,藉此,聚合反應後的黏著劑層因黏著性降低而自保護膜剝離之剝離性提升,可容易地拾取附有保護膜之半導體晶片之拾取性提升。另外,由於無須另外使用低分子量的活性能量線聚合性化合物,因此可抑制此種低分子量的活性能量線聚合性化合物自黏著劑層向保護膜形成用膜轉移,可抑制保護膜形成用膜的特性產生變化。 The (meth)acrylic acid alkyl ester copolymer may, for example, be an active energy ray-polymerizable copolymer which is polymerized by irradiation with an active energy ray. Preferred examples of such a copolymer include a hydroxyl group and a side chain having a polymerizable group (for example, (meth)acrylonitrile group or vinyl group (ethenyl) a copolymer of allyl (2-propenyl) or the like, preferably a (meth) acrylonitrile group; among these, more preferably having a hydroxyl group and being bonded to the side chain via a urethane bond A copolymer having a polymerizable group. Such an alkyl (meth)acrylate copolymer is crosslinked by, for example, reacting a hydroxyl group thereof with an isocyanate group in an isocyanate crosslinking agent to be described later. Further, such a (meth)acrylic acid alkyl ester copolymer has a polymerizable group in the side chain, and, for example, a low molecular weight active energy ray polymerizable compound is additionally used, and polymerization is carried out by irradiating an active energy ray. In contrast, the polymerization reaction can be carried out without using such a compound, whereby the adhesive layer after the polymerization is improved in peeling property from the protective film due to a decrease in adhesiveness, and the semiconductor wafer with the protective film can be easily picked up. The picking performance is improved. In addition, since it is not necessary to separately use a low molecular weight active energy ray-polymerizable compound, it is possible to suppress the transfer of such a low molecular weight active energy ray-polymerizable compound from the adhesive layer to the film for forming a protective film, and to suppress the film for forming a protective film. The characteristics change.
上述較佳的(甲基)丙烯酸烷基酯共聚物例如藉由下述方式而獲得:使用包含(甲基)丙烯酸烷基酯及含羥基的單體之組成物,使這些單體聚合而獲得共聚物(以下,有時稱為「預共聚物」)後,使該共聚物(預共聚物)所具有的羥基,與具有異氰酸酯基及聚合性基之化合物的異氰酸酯基進行反應。 The above preferred alkyl (meth) acrylate copolymer is obtained, for example, by polymerizing these monomers using a composition comprising an alkyl (meth) acrylate and a hydroxyl group-containing monomer. After the copolymer (hereinafter sometimes referred to as "pre-copolymer"), the hydroxyl group of the copolymer (prepolymer) is reacted with an isocyanate group of a compound having an isocyanate group and a polymerizable group.
前述(甲基)丙烯酸烷基酯共聚物之中,更佳者例如可 列舉藉由下述方式獲得之共聚物:以前述(甲基)丙烯酸烷基酯及含羥基的(甲基)丙烯酸酯作為必需的單體,且使這些單體經共聚合而獲得之預共聚物的羥基,與具有異氰酸酯基及聚合性基之化合物的異氰酸酯基進行反應。 Among the aforementioned (meth)acrylic acid alkyl ester copolymers, more preferably, for example, The copolymer obtained by the following method: pre-copolymerization obtained by copolymerizing the above-mentioned (meth)acrylic acid alkyl ester and hydroxyl group-containing (meth) acrylate as essential monomers and copolymerizing these monomers The hydroxyl group of the substance reacts with an isocyanate group of a compound having an isocyanate group and a polymerizable group.
作為前述含羥基的(甲基)丙烯酸酯,例如可列舉:(甲基)丙烯酸羥甲酯、(甲基)丙烯酸-2-羥乙酯、(甲基)丙烯酸-2-羥丙酯等。 Examples of the hydroxyl group-containing (meth) acrylate include hydroxymethyl (meth)acrylate, 2-hydroxyethyl (meth)acrylate, and 2-hydroxypropyl (meth)acrylate.
作為前述具有異氰酸酯基及聚合性基之化合物,例如可列舉:2-(甲基)丙烯醯氧基乙基異氰酸酯、間異丙烯基-α,α-二甲基苄基異氰酸酯、甲基丙烯醯基異氰酸酯、烯丙基異氰酸酯等異氰酸酯化合物;該等之中,較佳為2-甲基丙烯醯氧基乙基異氰酸酯。 Examples of the compound having an isocyanate group and a polymerizable group include 2-(meth)acryloxyethyl isocyanate, m-isopropenyl-α, α-dimethylbenzyl isocyanate, and methacrylium. An isocyanate compound such as a isocyanate or an allyl isocyanate; among these, 2-methylpropenyloxyethyl isocyanate is preferred.
上述較佳的(甲基)丙烯酸烷基酯共聚物亦可為除了上述必需的單體及化合物以外,亦有其他任意的化合物進行反應而成者,前述任意的化合物例如可為單體,亦可為單體共聚合而成之化合物。作為前述任意的化合物的單體例如可列舉:不符合前述(甲基)丙烯酸烷基酯且不含羥基的(甲基)丙烯酸酯、(甲基)丙烯酸、衣康酸、非(甲基)丙烯酸系單體等。 The above preferred alkyl (meth) acrylate copolymer may be obtained by reacting any of the above-mentioned necessary monomers and compounds with any other compound, and any of the above compounds may be, for example, a monomer. It can be a compound obtained by copolymerizing monomers. Examples of the monomer of any of the above-mentioned compounds include (meth) acrylate, (meth)acrylic acid, itaconic acid, and non-(methyl) which do not satisfy the alkyl (meth) acrylate and do not contain a hydroxyl group. Acrylic monomer and the like.
作為前述不含羥基的(甲基)丙烯酸酯,例如可列舉:( 甲基)丙烯酸甲酯、(甲基)丙烯酸乙酯、(甲基)丙烯酸丙酯、(甲基)丙烯酸丁酯、(甲基)丙烯酸戊酯、(甲基)丙烯酸己酯、(甲基)丙烯酸庚酯等(甲基)丙烯酸烷基酯,這些(甲基)丙烯酸烷基酯中構成烷基酯之烷基為直鏈狀或支鏈狀且碳數為1至7;(甲基)丙烯酸苄酯等(甲基)丙烯酸芳烷基酯;(甲基)丙烯酸二環戊烯酯等(甲基)丙烯酸環烯基酯;(甲基)丙烯酸二環戊烯氧基乙酯等(甲基)丙烯酸環烯氧基烷基酯;(甲基)丙烯醯亞胺;(甲基)丙烯酸縮水甘油酯等含縮水甘油基的(甲基)丙烯酸酯等。 Examples of the hydroxyl group-free (meth) acrylate include, for example: Methyl)methyl acrylate, ethyl (meth) acrylate, propyl (meth) acrylate, butyl (meth) acrylate, amyl (meth) acrylate, hexyl (meth) acrylate, (methyl) An alkyl (meth)acrylate such as heptyl acrylate, wherein the alkyl group constituting the alkyl ester in the alkyl (meth) acrylate is linear or branched and has a carbon number of 1 to 7; Arylalkyl (meth)acrylate such as benzyl acrylate; cycloalkenyl (meth) acrylate such as dicyclopentenyl (meth)acrylate; dicyclopentenyloxyethyl (meth)acrylate (meth)acrylic cycloalkenyloxyalkyl ester; (meth)acrylonitrile imine; glycidyl group-containing (meth)acrylate such as glycidyl (meth)acrylate.
作為前述非(甲基)丙烯酸系單體,例如可列舉:乙酸乙烯酯、丙烯腈、苯乙烯、N-羥甲基丙烯醯胺等。 Examples of the non-(meth)acrylic monomer include vinyl acetate, acrylonitrile, styrene, and N-methylol acrylamide.
前述(甲基)丙烯酸烷基酯、含羥基的(甲基)丙烯酸酯、具有異氰酸酯基及聚合性基之化合物、及前述任意的化合物等用於製備前述(甲基)丙烯酸烷基酯共聚物之成分(亦即,前述共聚物的構成成分),任一者皆既可僅為1種,亦可為2種以上。 The (meth)acrylic acid alkyl ester, the hydroxyl group-containing (meth) acrylate, the compound having an isocyanate group and a polymerizable group, and any of the foregoing compounds, etc., are used for preparing the aforementioned (meth)acrylic acid alkyl ester copolymer The components (that is, the constituent components of the copolymer) may be used alone or in combination of two or more.
上述烷基的碳數為8以上之(甲基)丙烯酸烷基酯的比例如下:相對於製備前述(甲基)丙烯酸烷基酯共聚物所使用之全部單體的總質量,較佳為30質量%以上,更佳為35質量%以上。 The proportion of the alkyl (meth) acrylate having a carbon number of 8 or more is as follows: preferably 30% based on the total mass of all monomers used for preparing the alkyl (meth) acrylate copolymer. The mass% or more is more preferably 35% by mass or more.
換言之,由上述烷基的碳數為8以上之(甲基)丙烯酸烷 基酯衍生之結構單元的含量如下:相對於構成前述(甲基)丙烯酸烷基酯共聚物之全部結構單元的總質量,較佳為30質量%以上,更佳為35質量%以上。 In other words, the (meth)acrylic acid having a carbon number of 8 or more from the above alkyl group The content of the structural unit derived from the ester is preferably 30% by mass or more, and more preferably 35% by mass or more based on the total mass of all the structural units constituting the alkyl (meth) acrylate copolymer.
另一方面,由上述烷基的碳數為8以上之(甲基)丙烯酸烷基酯衍生之結構單元的含量的上限值並無特別限定,相對於構成前述(甲基)丙烯酸烷基酯共聚物之全部結構單元的總質量,可自例如85質量%、90質量%及95質量%等中選擇任一含量,亦可為100質量%。 On the other hand, the upper limit of the content of the structural unit derived from the alkyl (meth)acrylate having 8 or more carbon atoms of the alkyl group is not particularly limited, and the alkyl (meth)acrylate is formed. The total mass of all the structural units of the copolymer may be selected from any of, for example, 85% by mass, 90% by mass, and 95% by mass, or may be 100% by mass.
亦即,上述烷基的碳數為8以上之(甲基)丙烯酸烷基酯的比例如下:相對於製備前述(甲基)丙烯酸烷基酯共聚物所使用之全部單體的總質量,為30質量%以上100質量%以下即可,亦可為30質量%以上95質量%以下,亦可為30質量%以上90質量%以下,亦可為30質量%以上85質量%以下。 That is, the ratio of the alkyl (meth) acrylate having a carbon number of 8 or more is as follows: relative to the total mass of all monomers used for preparing the alkyl (meth) acrylate copolymer 30% by mass or more and 100% by mass or less may be 30% by mass or more and 95% by mass or less, and may be 30% by mass or more and 90% by mass or less, and may be 30% by mass or more and 85% by mass or less.
作為另一方面,上述含量亦可為35質量%以上100質量%以下,亦可為35質量%以上95質量%以下,亦可為35質量%以上90質量%以下,亦可為35質量%以上85質量%以下。 On the other hand, the content may be 35 mass% or more and 100 mass% or less, may be 35 mass% or more and 95 mass% or less, may be 35 mass% or more and 90 mass% or less, or may be 35 mass% or more. 85 mass% or less.
作為又一方面,上述含量亦可為40質量%以上80質量%以下。 In still another aspect, the content may be 40% by mass or more and 80% by mass or less.
作為又一方面,由上述烷基的碳數為8以上之(甲基)丙烯酸烷基酯衍生之結構單元的含量如下:相對於構成前述(甲基)丙烯酸烷基酯共聚物之全部結構單元的總質量,為30質量%以上100質量%以下即可,亦可為30質量%以 上95質量%以下,亦可為30質量%以上90質量%以下,亦可為30質量%以上85質量%以下。 In still another aspect, the content of the structural unit derived from the alkyl (meth) acrylate having 8 or more carbon atoms of the alkyl group is as follows: relative to all structural units constituting the alkyl (meth) acrylate copolymer The total mass may be 30% by mass or more and 100% by mass or less, or may be 30% by mass or less. The upper portion is 95% by mass or less, and may be 30% by mass or more and 90% by mass or less, and may be 30% by mass or more and 85% by mass or less.
作為又一方面,上述含量亦可為35質量%以上100質量%以下,亦可為35質量%以上95質量%以下,亦可為35質量%以上90質量%以下,亦可為35質量%以上85質量%以下。 In another aspect, the content may be 35 mass% or more and 100 mass% or less, may be 35 mass% or more and 95 mass% or less, may be 35 mass% or more and 90 mass% or less, or may be 35 mass% or more. 85 mass% or less.
作為又一方面,上述含量亦可為40質量%以上80質量%以下。 In still another aspect, the content may be 40% by mass or more and 80% by mass or less.
黏著劑層所含的前述(甲基)丙烯酸烷基酯共聚物可僅為1種,亦可為2種以上。 The alkyl (meth) acrylate copolymer contained in the pressure-sensitive adhesive layer may be used alone or in combination of two or more.
前述(甲基)丙烯酸烷基酯共聚物的含量相對於黏著劑層的總質量,較佳為75質量%以上,更佳為80質量%以上。另外,為了形成此種黏著劑層,前述黏著劑組成物中的前述(甲基)丙烯酸烷基酯共聚物的含量相對於前述黏著劑組成物中的除了溶劑以外的全部成分的總質量,較佳為75質量%以上,更佳為80質量%以上。 The content of the (meth)acrylic acid alkyl ester copolymer is preferably 75% by mass or more, and more preferably 80% by mass or more based on the total mass of the pressure-sensitive adhesive layer. Further, in order to form such an adhesive layer, the content of the aforementioned (meth)acrylic acid alkyl ester copolymer in the above-mentioned adhesive composition is higher than the total mass of all components except the solvent in the above-mentioned adhesive composition. Preferably, it is 75 mass% or more, more preferably 80 mass% or more.
另一方面,黏著劑層的前述(甲基)丙烯酸烷基酯共聚物的含量的上限值並無特別限定,相對於黏著劑層的總質量,亦可為100質量%,但考慮到如後文中所述般同時使用其他成分,上述上限值較佳為97質量%,更佳為95質量%。 On the other hand, the upper limit of the content of the (meth)acrylic acid alkyl ester copolymer in the pressure-sensitive adhesive layer is not particularly limited, and may be 100% by mass based on the total mass of the pressure-sensitive adhesive layer, but it is considered as The other components are used in the same manner as described later, and the above upper limit is preferably 97% by mass, more preferably 95% by mass.
亦即,前述(甲基)丙烯酸烷基酯共聚物的含量相對於 黏著劑層的總質量,為75質量%以上100質量%以下即可,較佳為75質量%以上97質量%以下,更佳為80質量%以上95質量%以下。 That is, the content of the aforementioned alkyl (meth) acrylate copolymer is relative to The total mass of the pressure-sensitive adhesive layer may be 75 mass% or more and 100 mass% or less, preferably 75 mass% or more and 97 mass% or less, more preferably 80 mass% or more and 95 mass% or less.
作為另一方面,前述黏著劑組成物中的(甲基)丙烯酸烷基酯共聚物的含量相對於前述黏著劑組成物中的除了溶劑以外的全部成分的總質量,為75質量%以上100質量%以下即可,較佳為75質量%以上97質量%以下,更佳為80質量%以上95質量%以下。 In another aspect, the content of the (meth)acrylic acid alkyl ester copolymer in the adhesive composition is 75% by mass or more and 100% by mass based on the total mass of all components other than the solvent in the adhesive composition. The content may be at most or less, preferably from 75% by mass to 97% by mass, more preferably from 80% by mass to 95% by mass.
前述(甲基)丙烯酸烷基酯共聚物具有羥基,且進一步於側鏈具有聚合性基時,前述黏著劑組成物中的較佳者例如可列舉:除了前述(甲基)丙烯酸烷基酯共聚物以外,進一步含有異氰酸酯系交聯劑及光聚合起始劑之組成物。 When the (meth)acrylic acid alkyl ester copolymer has a hydroxyl group and further has a polymerizable group in the side chain, preferred examples of the above-mentioned adhesive composition include, in addition to the aforementioned (meth)acrylic acid alkyl ester copolymerization. In addition to the material, a composition of an isocyanate crosslinking agent and a photopolymerization initiator is further contained.
(異氰酸酯系交聯劑) (isocyanate crosslinking agent)
前述異氰酸酯系交聯劑只要是具有異氰酸酯基(-N=C=O)之交聯劑則無特別限定,較佳者例如可列舉:2,4-甲苯二異氰酸酯;2,6-甲苯二異氰酸酯;1,3-苯二甲基二異氰酸酯;1,4-二甲苯二異氰酸酯;二苯基甲烷-4,4'-二異氰酸酯;二苯基甲烷-2,4'-二異氰酸酯;3-甲基二苯基甲烷二異氰酸酯;六亞甲基二異氰酸酯;異佛爾酮二異氰酸酯;二環己基甲烷-4,4'-二異氰酸酯;二環己基甲烷-2,4'-二異氰酸酯;對三羥甲基丙烷等多元醇的全部或一部分羥基,加成甲苯二異氰酸酯、六亞甲基二異氰酸酯及苯二甲基 二異氰酸酯的至少1種所成之化合物;離胺酸二異氰酸酯等。 The isocyanate crosslinking agent is not particularly limited as long as it is a crosslinking agent having an isocyanate group (-N=C=O), and preferably, for example, 2,4-toluene diisocyanate; 2,6-toluene diisocyanate ; 1,3-benzenedimethyl diisocyanate; 1,4-dimethylbenzene diisocyanate; diphenylmethane-4,4'-diisocyanate; diphenylmethane-2,4'-diisocyanate; 3-methyl Diphenylmethane diisocyanate; hexamethylene diisocyanate; isophorone diisocyanate; dicyclohexylmethane-4,4'-diisocyanate; dicyclohexylmethane-2,4'-diisocyanate; Add all or part of the hydroxyl groups of a polyol such as methylolpropane to toluene diisocyanate, hexamethylene diisocyanate and benzene dimethyl A compound of at least one of a diisocyanate; an isocyanate diisocyanate or the like.
前述黏著劑組成物所含的異氰酸酯系交聯劑可僅為1種,亦可為2種以上。 The isocyanate crosslinking agent contained in the adhesive composition may be one type or two or more types.
前述黏著劑組成物中的異氰酸酯系交聯劑的含量如下:將前述(甲基)丙烯酸烷基酯共聚物的含量設為100質量份時,上述異氰酸酯系交聯劑的含量較佳為0.01質量份至20質量份,更佳為0.1質量份至10質量份。 The content of the isocyanate crosslinking agent in the adhesive composition is preferably such that the content of the isocyanate crosslinking agent is 0.01 by mass when the content of the alkyl (meth)acrylate copolymer is 100 parts by mass. The amount is from 20 parts by mass, more preferably from 0.1 part by mass to 10 parts by mass.
(光聚合起始劑) (photopolymerization initiator)
前述光聚合起始劑可為公知的光聚合起始劑,具體而言,例如可列舉:4-(2-羥基乙氧基)-苯基-(2-羥基-2-丙基)酮、α-羥基-α,α'-二甲基苯乙酮、2-甲基-2-羥基苯丙酮、1-羥基環己基苯基酮、2-羥基-1-{4-[4-(2-羥基-2-甲基-丙醯基)-苄基]苯基}-2-甲基-丙烷-1-酮等α-酮醇系化合物;甲氧基苯乙酮、2,2-二甲氧基-2-苯基苯乙酮、2,2-二乙氧基苯乙酮、2-甲基-1-[4-(甲硫基)苯基]-2-嗎啉基丙烷-1-酮等苯乙酮系化合物;安息香乙醚、安息香異丙醚、大茴香偶姻甲醚等安息香醚系化合物;苯偶醯二甲基縮酮等縮酮系化合物;2-萘磺醯氯等芳香族磺醯氯系化合物;1-苯酮-1,1-丙二酮-2-(鄰乙氧基羰基)肟等光活性肟系化合物;二苯基酮、苯甲醯苯甲酸、3,3'-二甲基-4-甲氧基二苯基 酮等二苯基酮系化合物;噻噸酮(thioxanthone)、2-氯噻噸酮、2-甲基噻噸酮、2,4-二甲基噻噸酮、異丙基噻噸酮、2,4-二氯噻噸酮、2,4-二乙基噻噸酮、2,4-二異丙基噻噸酮等噻噸酮系化合物;樟腦醌;鹵代酮;醯基氧化膦;醯基膦酸鹽/酯等。 The photopolymerization initiator may be a known photopolymerization initiator, and specific examples thereof include 4-(2-hydroxyethoxy)-phenyl-(2-hydroxy-2-propyl) ketone. --hydroxy-α,α'-dimethylacetophenone, 2-methyl-2-hydroxypropiophenone, 1-hydroxycyclohexyl phenyl ketone, 2-hydroxy-1-{4-[4-(2 Α-keto alcohol compound such as -hydroxy-2-methyl-propenyl)-benzyl]phenyl}-2-methyl-propan-1-one; methoxyacetophenone, 2,2-di Methoxy-2-phenylacetophenone, 2,2-diethoxyacetophenone, 2-methyl-1-[4-(methylthio)phenyl]-2-morpholinylpropane- An acetophenone compound such as 1-ketone; a benzoin ether compound such as benzoin ethyl ether, benzoin isopropyl ether, aniseed methoxyether; a ketal compound such as benzoin dimethyl ketal; 2-naphthalene sulfonium chloride An aromatic sulfonium chloride compound; a photoactive lanthanide compound such as 1-benzophenone-1,1-propanedione-2-(o-ethoxycarbonyl)anthracene; diphenyl ketone or benzamidine benzoic acid; 3,3'-dimethyl-4-methoxydiphenyl Diphenyl ketone compound such as ketone; thioxanthone, 2-chlorothioxanthone, 2-methylthioxanthone, 2,4-dimethylthioxanthone, isopropylthioxanthone, 2 a thioxanthone compound such as 4-dichlorothioxanthone, 2,4-diethylthioxanthone or 2,4-diisopropylthioxanthone; camphorquinone; halogenated ketone; fluorenylphosphine oxide; Mercaptophosphonate and the like.
前述黏著劑組成物中的光聚合起始劑的含量如下:將前述(甲基)丙烯酸烷基酯共聚物的含量設為100質量份時,較佳為0.05質量份至20質量份。 The content of the photopolymerization initiator in the above-mentioned adhesive composition is preferably from 0.05 parts by mass to 20 parts by mass, based on 100 parts by mass of the alkyl (meth)acrylate copolymer.
(溶劑) (solvent)
前述黏著劑組成物較佳為除了前述(甲基)丙烯酸烷基酯共聚物以外,進一步含有溶劑。 The adhesive composition preferably further contains a solvent in addition to the alkyl (meth)acrylate copolymer.
前述溶劑並無特別限定,較佳的溶劑例如可列舉:甲苯、二甲苯等碳數7至9之烴;甲醇、乙醇、2-丙醇、異丁醇(亦稱為2-甲基丙烷-1-醇)、1-丁醇等碳數1至6之醇;乙酸乙酯等酯;丙酮、甲基乙基酮等酮;四氫呋喃等醚;二甲基甲醯胺、N-甲基吡咯啶酮等醯胺(亦即,具有醯胺鍵之化合物)等。 The solvent is not particularly limited, and examples of preferred solvents include hydrocarbons having 7 to 9 carbon atoms such as toluene and xylene; methanol, ethanol, 2-propanol, and isobutanol (also known as 2-methylpropane). 1 to 6 alcohols such as 1-alcohol) and 1-butanol; esters such as ethyl acetate; ketones such as acetone and methyl ethyl ketone; ethers such as tetrahydrofuran; dimethylformamide and N-methylpyrrole A guanamine such as a ketene (that is, a compound having a guanamine bond) or the like.
上述之中,較佳為甲基乙基酮、甲苯、乙酸乙酯。 Among the above, methyl ethyl ketone, toluene, and ethyl acetate are preferred.
前述黏著劑組成物所含的溶劑可僅為1種,亦可為2種以上。 The solvent contained in the adhesive composition may be one type or two or more types.
前述黏著劑組成物含有溶劑時之溶劑的含量較佳為 :使前述組成物的固形物成分濃度相對於前述組成物的總質量為10質量%至50質量%之量。 The content of the solvent when the adhesive composition contains a solvent is preferably The concentration of the solid content of the composition is from 10% by mass to 50% by mass based on the total mass of the composition.
(其他成分) (other ingredients)
前述黏著劑組成物中,除了前述(甲基)丙烯酸烷基酯共聚物以外,亦可在不損害本發明的效果之範圍內,含有不屬於前述異氰酸酯系交聯劑、光聚合起始劑及溶劑之任一者的其他成分。 In addition to the alkyl (meth)acrylate copolymer, the above-mentioned adhesive composition may contain an isocyanate-based crosslinking agent, a photopolymerization initiator, and the like without departing from the effects of the present invention. Other ingredients of any of the solvents.
前述其他成分可為公知的成分,可根據目的任意選擇而並無特別限定,較佳者例如可列舉:染料、顏料、防劣化劑、抗靜電劑、阻燃劑、聚矽氧化合物、鏈轉移劑等各種添加劑。 The other components may be any known components, and may be arbitrarily selected according to the purpose, and are not particularly limited. Preferred examples thereof include dyes, pigments, anti-deterioration agents, antistatic agents, flame retardants, polyoxyxides, and chain transfer. Various additives such as agents.
前述黏著劑層可由1層(單層)構成,亦可由2層以上之複數層構成。黏著劑層由複數層構成時,這些複數層相互可相同亦可不同。亦即,可全部層相同,亦可全部層皆不同,還可僅一部分層相同。另外,複數層相互不同時,這些複數層之組合並無特別限定。此處,所謂的「複數層相互不同」,含義與上述基材相同。 The pressure-sensitive adhesive layer may be composed of one layer (single layer) or a plurality of layers of two or more layers. When the adhesive layer is composed of a plurality of layers, the plurality of layers may be the same or different from each other. That is, all layers may be the same, or all layers may be different, and only a part of the layers may be the same. Further, when the plural layers are different from each other, the combination of these plural layers is not particularly limited. Here, the phrase "the plural layers are different from each other" has the same meaning as the above substrate.
其中,黏著劑層由1層(單層)構成之情形時,該黏著劑層一定為使用上述黏著劑組成物而獲得之含有前述(甲基)丙烯酸烷基酯共聚物之層。另外,黏著劑層由複數層構成時,這些複數層中,至少與前述保護膜形成用膜接觸之 層(亦即,黏著劑層的厚度方向上距離基材最遠之層,下文中有時稱為最上層)一定為使用上述黏著劑組成物而獲得之含有前述(甲基)丙烯酸烷基酯共聚物之層。黏著劑層由複數層構成時,與保護膜形成用膜接觸之層以外的一層以上之層可全部為含有前述(甲基)丙烯酸烷基酯共聚物之層,亦可全部為不含前述(甲基)丙烯酸烷基酯共聚物之層,亦可僅一部分為含有前述(甲基)丙烯酸烷基酯共聚物之層。 In the case where the adhesive layer is composed of one layer (single layer), the adhesive layer must be a layer containing the alkyl (meth) acrylate copolymer obtained by using the above adhesive composition. Further, when the adhesive layer is composed of a plurality of layers, at least the film for forming a protective film is in contact with the plurality of layers. The layer (that is, the layer farthest from the substrate in the thickness direction of the adhesive layer, hereinafter sometimes referred to as the uppermost layer) must be obtained by using the above-mentioned adhesive composition to contain the aforementioned alkyl (meth)acrylate. a layer of copolymer. When the pressure-sensitive adhesive layer is composed of a plurality of layers, one or more layers other than the layer in contact with the film for forming a protective film may be all layers containing the alkyl (meth) acrylate copolymer, or all of them may be excluded ( The layer of the alkyl (meth) acrylate copolymer may be a part of the layer containing the alkyl (meth) acrylate copolymer.
前述黏著劑層由單層構成時,前述保護膜形成用複合片的構成簡單化,故具有可廉價地製造之優點。 When the pressure-sensitive adhesive layer is composed of a single layer, the configuration of the composite sheet for forming a protective film is simplified, and therefore it is advantageous in that it can be produced at low cost.
另一方面,前述黏著劑層由複數層構成時,如上所述般,藉由使這些複數層中與保護膜形成用膜接觸之層(即最上層)為含有前述(甲基)丙烯酸烷基酯共聚物之層,而獲得本發明的效果。進而,藉由使這些複數層中與前述基材接觸之層(亦即,黏著劑層的厚度方向上與基材相鄰之層,下文中有時稱為最下層)例如為與基材之密接性特別高的層,前述保護膜形成用複合片使用時的穩定性進一步提高。如此般,藉由使前述黏著劑層為由複數層構成之積層體,具有可將黏著劑層調節為整體具有兩種以上特性之層之優點。 On the other hand, when the pressure-sensitive adhesive layer is composed of a plurality of layers, the layer (ie, the uppermost layer) in contact with the film for forming a protective film in the plurality of layers is contained in the above-mentioned (meth)acrylic acid alkyl group. The layer of the ester copolymer is obtained to obtain the effects of the present invention. Further, a layer in contact with the substrate in the plurality of layers (that is, a layer adjacent to the substrate in the thickness direction of the adhesive layer, hereinafter sometimes referred to as a lowermost layer) is, for example, a substrate The layer having particularly high adhesion is further improved in stability when the composite sheet for forming a protective film is used. In the same manner, the adhesive layer is a laminate composed of a plurality of layers, and has an advantage that the adhesive layer can be adjusted to have a layer having two or more characteristics as a whole.
黏著劑層由複數層構成時,不含前述(甲基)丙烯酸烷基酯共聚物之黏著劑層例如可為與先前的黏著劑層相同 之層。 When the adhesive layer is composed of a plurality of layers, the adhesive layer not containing the aforementioned alkyl (meth) acrylate copolymer may be, for example, the same as the previous adhesive layer Layer.
黏著劑層由複數層構成時,使各層的合計厚度為上述較佳的黏著劑層的厚度即可。 When the adhesive layer is composed of a plurality of layers, the total thickness of each layer may be the thickness of the above preferred adhesive layer.
<保護膜形成用膜> <film for forming a protective film>
前述保護膜形成用膜具有熱硬化性,亦可具有感壓接著性,亦可為藉由加熱使之軟化而能貼附至各種被黏著體。保護膜形成用膜經熱硬化後,最後變成耐衝擊性高的保護膜,該保護膜在抗剪強度方面優異,且即便於嚴酷的高溫、高濕度條件下亦可保持充分的接著特性。 The film for forming a protective film may have thermosetting properties, may have pressure-sensitive adhesive properties, or may be softened by heating to be attached to various adherends. After the film for forming a protective film is thermally cured, it finally becomes a protective film having high impact resistance. The protective film is excellent in shear strength and can maintain sufficient adhesive properties even under severe high temperature and high humidity conditions.
保護膜形成用膜的厚度並無特別限定,較佳為1μm至100μm,更佳為5μm至75μm,特佳為5μm至50μm。藉由使保護膜形成用膜的厚度為前述下限值以上,對於被黏著體即半導體晶圓及半導體晶片之接著力變得更大。另外,藉由使保護膜形成用膜的厚度為前述上限值以下,拾取半導體晶片時,利用剪力可更容易地切斷作為硬化物之保護膜。 The thickness of the film for forming a protective film is not particularly limited, but is preferably 1 μm to 100 μm, more preferably 5 μm to 75 μm, and particularly preferably 5 μm to 50 μm. When the thickness of the film for forming a protective film is not less than the above lower limit value, the adhesion force to the semiconductor wafer and the semiconductor wafer which is an adherend becomes larger. In addition, when the thickness of the film for forming a protective film is equal to or less than the above upper limit value, when the semiconductor wafer is picked up, the protective film as a cured product can be more easily cut by the shear force.
保護膜形成用膜只要是具有熱硬化性之膜則無特別限定。 The film for forming a protective film is not particularly limited as long as it is a film having thermosetting properties.
作為較佳的保護膜形成用膜,例如可列舉:含有聚合物成分(A)及熱硬化性成分(B)之膜。聚合物成分(A)係可視 作是聚合性化合物進行聚合反應而形成之成分。 As a film for forming a protective film, a film containing a polymer component (A) and a thermosetting component (B) is mentioned, for example. Polymer component (A) is visible It is a component formed by the polymerization reaction of a polymeric compound.
另外,熱硬化性成分(B)係藉由熱可進行硬化(聚合)反應之成分。再者,本發明中的聚合反應亦包含聚縮反應。 Further, the thermosetting component (B) is a component which can be subjected to a curing (polymerization) reaction by heat. Further, the polymerization reaction in the present invention also includes a polycondensation reaction.
[保護膜形成用組成物] [Composition for forming a protective film]
保護膜形成用膜可由含有用以構成該保護膜形成用膜之成分之保護膜形成用組成物形成。保護膜形成用組成物中的常溫下不會氣化之成分彼此的含量比率,通常與保護膜形成用膜的前述成分彼此的含量比率相同。 The film for forming a protective film can be formed of a composition for forming a protective film containing a component constituting the film for forming a protective film. The content ratio of the components which are not vaporized at normal temperature in the composition for forming a protective film is usually the same as the content ratio of the components of the film for forming a protective film.
作為較佳的保護膜形成用組成物,例如可列舉含有聚合物成分(A)及熱硬化性成分(B)之組成物,更佳為含有聚合物成分(A)、熱硬化性成分(B)及硬化促進劑(C)之組成物。以下,對前述保護膜形成用組成物及保護膜形成用膜所含之成分進行說明。 The composition for forming a protective film is preferably a composition containing the polymer component (A) and the thermosetting component (B), and more preferably a polymer component (A) or a thermosetting component (B). And a composition of the hardening accelerator (C). Hereinafter, the components contained in the protective film-forming composition and the protective film-forming film will be described.
(聚合物成分(A)) (polymer component (A))
聚合物成分(A)為用以對保護膜形成用膜賦予成膜性、或可撓性等之聚合物化合物。聚合物成分(A)有時亦屬於熱硬化性成分(B)。 The polymer component (A) is a polymer compound for imparting film formability or flexibility to the film for forming a protective film. The polymer component (A) sometimes also belongs to the thermosetting component (B).
例如,苯氧基樹脂、或側鏈具有環氧基之丙烯酸系樹脂等屬於聚合物成分(A),且有時亦屬於熱硬化性成分(B)。此種成分可作為聚合物成分(A)對待。 For example, a phenoxy resin or an acrylic resin having an epoxy group in a side chain belongs to the polymer component (A) and may also belong to the thermosetting component (B). Such a component can be treated as the polymer component (A).
聚合物成分(A)可單獨使用1種,亦可將2種以上同時使用。 The polymer component (A) may be used alone or in combination of two or more.
作為聚合物成分(A),例如可列舉:丙烯酸系樹脂、聚酯、聚胺甲酸酯、丙烯酸胺甲酸酯樹脂、聚矽氧樹脂、橡膠系聚合物、苯氧基樹脂等;較佳為丙烯酸系樹脂。 Examples of the polymer component (A) include an acrylic resin, a polyester, a polyurethane, an urethane acrylate resin, a polyoxyxylene resin, a rubber-based polymer, a phenoxy resin, and the like; It is an acrylic resin.
作為前述丙烯酸系樹脂,可使用公知的丙烯酸聚合物。 As the acrylic resin, a known acrylic polymer can be used.
丙烯酸系樹脂的重量平均分子量(Mw)較佳為10000至2000000,更佳為100000至1500000。藉由使丙烯酸系樹脂的重量平均分子量為前述下限值以上,後述之保護膜與硬化後的前述黏著劑層之接著力受到抑制,附有保護膜之半導體晶片的拾取性進一步提高。 The weight average molecular weight (Mw) of the acrylic resin is preferably from 10,000 to 2,000,000, more preferably from 100,000 to 1,500,000. When the weight average molecular weight of the acrylic resin is at least the above lower limit value, the adhesion between the protective film described later and the cured adhesive layer is suppressed, and the pick-up property of the semiconductor wafer with the protective film is further improved.
另外,藉由使丙烯酸系樹脂的重量平均分子量為前述上限值以下,保護膜形成用膜容易追隨被黏著體的凹凸面,從而進一步抑制被黏著體與保護膜形成用膜之間產生間隙等。 In addition, when the weight average molecular weight of the acrylic resin is equal to or less than the above-described upper limit, the film for forming a protective film easily follows the uneven surface of the adherend, thereby further suppressing occurrence of a gap between the adherend and the film for forming a protective film. .
再者,本說明書中只要無特別說明,所謂的「重量平均分子量」係指藉由凝膠滲透層析(GPC,Gel Permeation Chromatography)法測定之聚苯乙烯換算值。 In the present specification, the term "weight average molecular weight" means a polystyrene equivalent value measured by a gel permeation chromatography (GPC) method unless otherwise specified.
丙烯酸系樹脂的玻璃轉移溫度(Tg)較佳為-60℃至70℃,更佳為-30℃至50℃。藉由使丙烯酸系樹脂的Tg為前述下限值以上,後述之保護膜與硬化後的前述黏著劑層之剝離力變小,附有保護膜之半導體晶片的拾取性進一步 提高。另外,藉由使丙烯酸系樹脂的Tg為前述上限值以下,保護膜形成用膜與半導體晶圓之接著力變大,可更穩定地固定半導體晶圓。 The glass transition temperature (Tg) of the acrylic resin is preferably from -60 ° C to 70 ° C, more preferably from -30 ° C to 50 ° C. When the Tg of the acrylic resin is at least the above lower limit value, the peeling force of the protective film to be described later and the adhesive layer after curing is reduced, and the pick-up property of the semiconductor wafer with the protective film is further improved. improve. In addition, when the Tg of the acrylic resin is equal to or less than the above upper limit, the adhesion between the film for forming a protective film and the semiconductor wafer is increased, and the semiconductor wafer can be more stably fixed.
作為構成丙烯酸系樹脂之單體,例如可列舉:構成烷基酯之烷基為鏈狀且碳數為1至18之(甲基)丙烯酸烷基酯,(甲基)丙烯酸甲酯、(甲基)丙烯酸乙酯、(甲基)丙烯酸丙酯、(甲基)丙烯酸丁酯、(甲基)丙烯酸-2-乙基己酯、(甲基)丙烯酸異辛酯、(甲基)丙烯酸正辛酯、(甲基)丙烯酸正壬酯、(甲基)丙烯酸異壬酯、(甲基)丙烯酸癸酯、(甲基)丙烯酸十一烷基酯、(甲基)丙烯酸十二烷基酯((甲基)丙烯酸月桂酯)、(甲基)丙烯酸十三烷基酯、(甲基)丙烯酸十四烷基酯((甲基)丙烯酸肉豆蔻酯)、(甲基)丙烯酸十五烷基酯、(甲基)丙烯酸十六烷基酯((甲基)丙烯酸棕櫚酯)、(甲基)丙烯酸十七烷基酯、(甲基)丙烯酸十八烷基酯((甲基)丙烯酸硬脂基酯)等;具有環狀骨架之(甲基)丙烯酸酯,(甲基)丙烯酸環烷基酯、(甲基)丙烯酸苄酯、(甲基)丙烯酸異冰片酯、(甲基)丙烯酸二環戊酯、(甲基)丙烯酸二環戊烯酯、(甲基)丙烯酸二環戊烯氧基乙酯、(甲基)丙烯醯亞胺等;含羥基的(甲基)丙烯酸酯,(甲基)丙烯酸羥甲酯、(甲基)丙烯酸-2-羥乙酯、(甲基)丙烯酸-2-羥丙酯等;含縮水甘油基的(甲基)丙烯酸酯,(甲基)丙烯酸縮水甘油酯等。 Examples of the monomer constituting the acrylic resin include an alkyl (meth)acrylate having an alkyl group constituting an alkyl ester and having a carbon number of 1 to 18, and methyl (meth)acrylate. Ethyl acrylate, propyl (meth) acrylate, butyl (meth) acrylate, 2-ethylhexyl (meth) acrylate, isooctyl (meth) acrylate, (meth) acrylate Octyl ester, n-decyl (meth)acrylate, isodecyl (meth)acrylate, decyl (meth)acrylate, undecyl (meth)acrylate, dodecyl (meth)acrylate (lauryl (meth)acrylate), tridecyl (meth)acrylate, tetradecyl (meth)acrylate (myristyl (meth)acrylate), pentadecyl (meth)acrylate Base ester, cetyl (meth) acrylate (palmityl (meth) acrylate), heptadecyl (meth) acrylate, octadecyl (meth) acrylate ((meth) acrylate (stearyl ester), etc.; (meth) acrylate having a cyclic skeleton, cycloalkyl (meth) acrylate, benzyl (meth) acrylate, isobornyl (meth) acrylate, (methyl) Dicyclopentyl acrylate, (methyl) Dicyclopentenyl enoate, dicyclopentenyloxyethyl (meth)acrylate, (meth) acrylimide, etc.; hydroxyl-containing (meth) acrylate, hydroxymethyl (meth) acrylate And 2-hydroxyethyl (meth)acrylate, 2-hydroxypropyl (meth)acrylate, etc.; glycidyl group-containing (meth)acrylate, glycidyl (meth)acrylate, and the like.
另外,丙烯酸系樹脂亦可為丙烯酸、甲基丙烯酸、衣康酸、乙酸乙烯酯、丙烯腈、苯乙烯、N-羥甲基丙烯醯胺 等單體進行共聚合而成者。 In addition, the acrylic resin may also be acrylic acid, methacrylic acid, itaconic acid, vinyl acetate, acrylonitrile, styrene, N-methylol acrylamide The monomer is copolymerized.
構成丙烯酸系樹脂之單體可僅為1種,亦可為2種以上。 The monomer constituting the acrylic resin may be one type or two or more types.
丙烯酸系樹脂亦可具有乙烯基、(甲基)丙烯醯基、胺基、羥基、羧基、異氰酸酯基等可與其他化合物鍵結之官能基。前述官能基可經由後述之交聯劑(F)與其他化合物鍵結,亦可不經由交聯劑(F)而與其他化合物直接鍵結。藉由使丙烯酸系樹脂利用前述官能基與其他化合物鍵結,有使用保護膜形成用複合片而獲得之半導體裝置的封裝可靠性提升之傾向。 The acrylic resin may have a functional group which may be bonded to another compound such as a vinyl group, a (meth) acrylonitrile group, an amine group, a hydroxyl group, a carboxyl group or an isocyanate group. The functional group may be bonded to another compound via a crosslinking agent (F) to be described later, or may be directly bonded to another compound without passing through the crosslinking agent (F). When the acrylic resin is bonded to another compound by the above functional group, the package reliability of the semiconductor device obtained by using the composite sheet for forming a protective film tends to be improved.
保護膜形成用組成物含有丙烯酸系樹脂作為聚合物成分(A)時,保護膜形成用組成物中的丙烯酸系樹脂的含量,相對於保護膜形成用組成物中的除了溶劑以外的全部成分的總質量較佳為5質量%至50質量%。藉由使丙烯酸系樹脂的前述含量為上述範圍,保護膜與硬化後的前述黏著劑層之剝離力變小,附有保護膜之半導體晶片的拾取性進一步提高。 When the composition for forming a protective film contains an acrylic resin as the polymer component (A), the content of the acrylic resin in the protective film-forming composition is all the components other than the solvent in the protective film-forming composition. The total mass is preferably from 5% by mass to 50% by mass. When the content of the acrylic resin is in the above range, the peeling force of the protective film and the adhesive layer after curing becomes small, and the pick-up property of the semiconductor wafer with the protective film is further improved.
如此般,保護膜形成用膜含有丙烯酸系樹脂作為聚合物成分(A)時,保護膜形成用膜的丙烯酸系樹脂的含量,相對於保護膜形成用膜的總質量較佳為5質量%至50質量%。 When the film for forming a protective film contains the acrylic resin as the polymer component (A), the content of the acrylic resin in the film for forming a protective film is preferably 5% by mass based on the total mass of the film for forming a protective film. 50% by mass.
本發明中,就下述方面,即,藉由降低保護膜與硬化後的前述黏著劑層之接著力(有時稱為剝離力),而使附有保護膜之半導體晶片的拾取性進一步提高,或者使得保護膜形成用膜容易追隨被黏著體的凹凸面,從而進一步抑制被黏著體與保護膜形成用膜之間產生間隙等之方面而言,作為聚合物成分(A),可單獨使用丙烯酸系樹脂以外的熱塑性樹脂(以下,有時簡稱為「熱塑性樹脂」),亦可與丙烯酸系樹脂同時使用。 In the present invention, the pickup property of the semiconductor wafer with the protective film is further improved by reducing the adhesion force (sometimes referred to as a peeling force) of the protective film and the adhesive layer after curing. Or the film for forming a protective film can easily follow the uneven surface of the adherend, and further suppress the occurrence of a gap or the like between the adherend and the film for forming a protective film, and the polymer component (A) can be used alone. A thermoplastic resin other than the acrylic resin (hereinafter sometimes referred to simply as "thermoplastic resin") may be used together with the acrylic resin.
前述熱塑性樹脂的重量平均分子量較佳為1000至100000,更佳為3000至80000。 The weight average molecular weight of the aforementioned thermoplastic resin is preferably from 1,000 to 100,000, more preferably from 3,000 to 80,000.
前述熱塑性樹脂的玻璃轉移溫度(Tg)較佳為-30℃至150℃,更佳為-20℃至120℃。 The glass transition temperature (Tg) of the aforementioned thermoplastic resin is preferably from -30 ° C to 150 ° C, more preferably from -20 ° C to 120 ° C.
作為前述熱塑性樹脂,例如可列舉:聚酯、聚胺甲酸酯、苯氧基樹脂、聚丁烯、聚丁二烯、聚苯乙烯等。 Examples of the thermoplastic resin include polyester, polyurethane, phenoxy resin, polybutene, polybutadiene, and polystyrene.
前述熱塑性樹脂可單獨使用1種,亦可將2種以上同時使用。 The thermoplastic resin may be used singly or in combination of two or more kinds.
(熱硬化性成分(B)) (thermosetting component (B))
熱硬化性成分(B)為用以使保護膜形成用膜硬化,而形成硬質的保護膜之成分。熱硬化性成分(B)有時亦屬於聚 合物成分(A),將此種成分作為聚合物成分(A)對待。 The thermosetting component (B) is a component for forming a hard protective film by curing the film for forming a protective film. The thermosetting component (B) sometimes belongs to the poly The component (A) is treated as a polymer component (A).
熱硬化性成分(B)可單獨使用1種,亦可將2種以上同時使用。 The thermosetting component (B) may be used alone or in combination of two or more.
作為熱硬化性成分(B),例如可列舉:環氧系熱硬化性樹脂、熱硬化性聚醯亞胺樹脂、聚胺甲酸酯、不飽和聚酯、聚矽氧樹脂等;較佳為環氧系熱硬化性樹脂。 Examples of the thermosetting component (B) include an epoxy thermosetting resin, a thermosetting polyimide resin, a polyurethane, an unsaturated polyester, a polyoxy resin, and the like; Epoxy thermosetting resin.
‧環氧系熱硬化性樹脂 ‧Epoxy thermosetting resin
環氧系熱硬化性樹脂由環氧樹脂(B11)及熱硬化劑(B12)構成。 The epoxy thermosetting resin is composed of an epoxy resin (B11) and a thermosetting agent (B12).
環氧系熱硬化性樹脂可單獨使用1種,亦可將2種以上同時使用。 The epoxy-based thermosetting resin may be used singly or in combination of two or more kinds.
作為環氧樹脂(B11),可列舉公知者,例如可列舉以下2官能以上的環氧化合物:多官能系環氧樹脂、聯苯化合物、雙酚A二縮水甘油醚及其氫化物、鄰甲酚酚醛清漆環氧樹脂、二環戊二烯型環氧樹脂、聯苯型環氧樹脂、雙酚A型環氧樹脂、雙酚F型環氧樹脂、伸苯基骨架型環氧樹脂等。上述之中,較佳為雙酚A型環氧樹脂、二環戊二烯型環氧樹脂。 The epoxy resin (B11) is exemplified, and examples thereof include the following bifunctional or higher epoxy compounds: polyfunctional epoxy resin, biphenyl compound, bisphenol A diglycidyl ether and hydrogenated product thereof, and adjacent Phenolic novolac epoxy resin, dicyclopentadiene type epoxy resin, biphenyl type epoxy resin, bisphenol A type epoxy resin, bisphenol F type epoxy resin, phenyl skeleton type epoxy resin, and the like. Among the above, a bisphenol A type epoxy resin and a dicyclopentadiene type epoxy resin are preferable.
環氧樹脂(B11)亦可使用具有不飽和烴基之環氧樹脂。 As the epoxy resin (B11), an epoxy resin having an unsaturated hydrocarbon group can also be used.
作為具有不飽和烴基之環氧樹脂,例如可列舉:多官 能系環氧樹脂的一部分環氧基更換為含不飽和烴基之基而成之化合物。 As the epoxy resin having an unsaturated hydrocarbon group, for example, a plurality of officials A compound in which a part of the epoxy group of the epoxy resin is replaced with a group containing an unsaturated hydrocarbon group.
環氧樹脂(B11)的數目平均分子量並無特別限定,就保護膜形成用膜的硬化性、以及硬化後的保護膜之強度及耐熱性之觀點而言,較佳為100至20000。 The number average molecular weight of the epoxy resin (B11) is not particularly limited, and is preferably from 100 to 20,000 from the viewpoint of the curability of the film for forming a protective film and the strength and heat resistance of the protective film after curing.
此處所言之「數目平均分子量」,為藉由凝膠滲透層析(GPC)法測定之聚苯乙烯換算值。 The "number average molecular weight" as used herein is a polystyrene-converted value measured by a gel permeation chromatography (GPC) method.
環氧樹脂(B11)的環氧當量較佳為100g/eq至1100g/eq,更佳為150g/eq至1000g/eq。 The epoxy equivalent of the epoxy resin (B11) is preferably from 100 g/eq to 1100 g/eq, more preferably from 150 g/eq to 1000 g/eq.
環氧樹脂(B11)可單獨使用1種,亦可將2種以上同時使用。 Epoxy resin (B11) may be used alone or in combination of two or more.
熱硬化劑(B12)發揮針對環氧樹脂(B11)之硬化劑的功能。 The heat hardener (B12) functions as a hardener for the epoxy resin (B11).
作為熱硬化劑(B12),例如可列舉:1分子中具有2個以上可與環氧基反應之官能基之化合物。前述官能基例如可列舉:酚性羥基、醇性羥基、胺基、羧基、酸基經酐化所成之基等;較佳為酚性羥基、胺基、或酸基經酐化所成之基,更佳為酚性羥基或胺基,特佳為胺基。 The thermosetting agent (B12) is, for example, a compound having two or more functional groups reactive with an epoxy group in one molecule. Examples of the functional group include a phenolic hydroxyl group, an alcoholic hydroxyl group, an amine group, a carboxyl group, and a group in which an acid group is formed by an anhydride; and preferably a phenolic hydroxyl group, an amine group, or an acid group is formed by an anhydride. More preferably, it is a phenolic hydroxyl group or an amine group, and particularly preferably an amine group.
熱硬化劑(B12)中,作為具有酚性羥基之酚系硬化劑,例如可列舉:多官能酚樹脂、聯苯酚、酚醛清漆型酚樹脂 、二環戊二烯系酚樹脂、芳烷基酚樹脂等。 In the thermosetting agent (B12), examples of the phenolic curing agent having a phenolic hydroxyl group include a polyfunctional phenol resin, a biphenol, and a novolak type phenol resin. , a dicyclopentadiene phenol resin, an aralkyl phenol resin, and the like.
熱硬化劑(B12)中,作為具有胺基之胺系硬化劑,例如可列舉:二氰二胺(以下,有時簡稱為「DICY」)等。 In the thermosetting agent (B12), examples of the amine-based curing agent having an amine group include dicyandiamide (hereinafter sometimes abbreviated as "DICY").
熱硬化劑(B12)亦可為具有不飽和烴基者。 The heat hardener (B12) may also be one having an unsaturated hydrocarbon group.
作為具有不飽和烴基之熱硬化劑(B12),例如可列舉:酚樹脂的一部分羥基由具有不飽和烴基之基取代而成之化合物;酚樹脂之芳香環上,直接鍵結具有不飽和烴基之基而成之化合物等。 Examples of the thermosetting agent (B12) having an unsaturated hydrocarbon group include a compound in which a part of the hydroxyl group of the phenol resin is substituted with a group having an unsaturated hydrocarbon group; and an aromatic ring of the phenol resin is directly bonded to have an unsaturated hydrocarbon group. a compound such as a base.
熱硬化劑(B12)中的前述不飽和烴基,與上述之具有不飽和烴基之環氧樹脂中的不飽和烴基相同。 The aforementioned unsaturated hydrocarbon group in the heat hardener (B12) is the same as the unsaturated hydrocarbon group in the above epoxy resin having an unsaturated hydrocarbon group.
熱硬化劑(B12)可單獨使用1種,亦可將2種以上同時使用。 The heat curing agent (B12) may be used singly or in combination of two or more.
熱硬化劑(B12)較佳為常溫下為固體,且對環氧樹脂(B11)不顯示硬化活性,另一方面,藉由加熱而溶解,且對環氧樹脂(B11)顯示硬化活性之熱硬化劑(以下,有時簡稱為「固體分散型潛伏性硬化劑」)。亦即,保護膜形成用膜較佳為含有環氧樹脂(B11)、及作為熱硬化劑(B12)之前述固體分散型潛伏性硬化劑。 The heat hardener (B12) is preferably solid at normal temperature, and does not exhibit hardening activity for the epoxy resin (B11), on the other hand, dissolves by heating, and shows heat of hardening activity to the epoxy resin (B11). A curing agent (hereinafter sometimes referred to simply as "solid dispersion type latent curing agent"). In other words, the film for forming a protective film preferably contains the epoxy resin (B11) and the solid dispersion type latent curing agent as the heat curing agent (B12).
前述固體分散型潛伏性硬化劑常溫下在保護膜形成用膜中,穩定地分散在環氧樹脂(B11)中,但藉由加熱與環氧樹脂(B11)相容,且與環氧樹脂(B11)進行反應。藉由 使用前述固體分散型潛伏性硬化劑,前述保護膜形成用複合片的保存穩定性顯著提高。例如,可抑制該硬化劑自保護膜形成用膜向相鄰之前述黏著劑層轉移,可有效地抑制保護膜形成用膜的熱硬化性降低。另外,保護膜形成用膜藉由加熱而硬化之熱硬化度進一步提高,故後述之附有保護膜之半導體晶片的拾取性進一步提高。 The solid dispersion type latent curing agent is stably dispersed in the epoxy resin (B11) in the film for forming a protective film at room temperature, but is compatible with the epoxy resin (B11) by heating, and is epoxy resin ( B11) The reaction is carried out. By The storage stability of the composite sheet for forming a protective film is remarkably improved by using the solid dispersion type latent curing agent. For example, it is possible to suppress the transfer of the curing agent from the film for forming a protective film to the adjacent adhesive layer, and it is possible to effectively suppress the decrease in the thermosetting property of the film for forming a protective film. In addition, the degree of thermal hardening of the film for forming a protective film to be cured by heating is further improved, so that the pick-up property of the semiconductor wafer with a protective film described later is further improved.
作為前述固體分散型潛伏性硬化劑,例如可列舉:鎓鹽、二元酸醯肼、二氰二胺、硬化劑的胺加成物等。 Examples of the solid dispersion type latent curing agent include an onium salt, a dibasic acid hydrazine, a dicyandiamide, and an amine adduct of a curing agent.
保護膜形成用組成物及保護膜形成用膜中的熱硬化劑(B12)的含量如下:將環氧樹脂(B11)的含量設為100質量份時,較佳為0.1質量份至500質量份,更佳為1質量份至200質量份。藉由使熱硬化劑(B12)的前述含量為前述下限值以上,保護膜形成用膜之硬化變得更容易進行。 The content of the thermosetting agent (B12) in the film for forming a protective film and the film for forming a protective film is as follows: when the content of the epoxy resin (B11) is 100 parts by mass, it is preferably from 0.1 part by mass to 500 parts by mass. More preferably, it is 1 part by mass to 200 parts by mass. When the content of the heat curing agent (B12) is at least the above lower limit value, the curing of the film for forming a protective film becomes easier.
另外,藉由使熱硬化劑(B12)的前述含量為前述上限值以下,保護膜形成用膜的吸濕率減低,封裝可靠性進一步提高。 In addition, when the content of the heat curing agent (B12) is at most the above upper limit value, the moisture absorption rate of the film for forming a protective film is lowered, and the package reliability is further improved.
保護膜形成用組成物及保護膜形成用膜中的熱硬化性成分(B)的含量如下:將聚合物成分(A)的含量設為100質量份時,較佳為1質量份至100質量份,更佳為1.5質量份至85質量份,特佳為2質量份至70質量份。藉由使熱硬化性成分(B)的前述含量為上述範圍,保護膜與硬化後的 前述黏著劑層之接著力(剝離力)進一步減小,附有保護膜之半導體晶片的拾取性進一步提高。 The content of the thermosetting component (B) in the film for forming a protective film and the film for forming a protective film is as follows: when the content of the polymer component (A) is 100 parts by mass, it is preferably from 1 part by mass to 100% by mass. The portion is more preferably from 1.5 parts by mass to 85 parts by mass, particularly preferably from 2 parts by mass to 70 parts by mass. By setting the aforementioned content of the thermosetting component (B) to the above range, the protective film and the cured film The adhesion force (peeling force) of the above-mentioned adhesive layer is further reduced, and the pick-up property of the semiconductor wafer with the protective film is further improved.
(硬化促進劑(C)) (hardening accelerator (C))
硬化促進劑(C)為用以調整保護膜形成用組成物的硬化速度之成分。 The hardening accelerator (C) is a component for adjusting the curing rate of the composition for forming a protective film.
作為較佳的硬化促進劑(C),例如可列舉:三乙二胺、苄基二甲胺、三乙醇胺、二甲胺基乙醇、三(二甲胺基甲基)苯酚等三級胺;2-甲基咪唑、2-苯基咪唑、2-苯基-4-甲基咪唑、2-苯基-4,5-二羥甲基咪唑、2-苯基-4-甲基-5-羥甲基咪唑等咪唑類(即至少1個氫原子由氫原子以外的基取代之咪唑);三丁基膦、二苯基膦、三苯基膦等有機膦類(至少1個氫原子由有機基取代之膦);四苯基硼酸四苯基鏻、四苯基硼酸三苯基膦等四苯基硼鹽等。 Examples of preferred curing accelerators (C) include tertiary amines such as triethylenediamine, benzyldimethylamine, triethanolamine, dimethylaminoethanol, and tris(dimethylaminomethyl)phenol; 2-methylimidazole, 2-phenylimidazole, 2-phenyl-4-methylimidazole, 2-phenyl-4,5-dimethylolimidazole, 2-phenyl-4-methyl-5- An imidazole such as hydroxymethylimidazole (i.e., an imidazole in which at least one hydrogen atom is substituted by a group other than a hydrogen atom); an organic phosphine such as tributylphosphine, diphenylphosphine or triphenylphosphine (at least one hydrogen atom) An organic group-substituted phosphine); a tetraphenylboronium salt such as tetraphenylphosphonium tetraphenylborate or triphenylphosphine tetraphenylborate; and the like.
上述之中,較佳為2-苯基-4,5-二羥甲基咪唑。 Among the above, 2-phenyl-4,5-dimethylolimidazole is preferred.
硬化促進劑(C)可單獨使用1種,亦可將2種以上同時使用。 The curing accelerator (C) may be used singly or in combination of two or more.
保護膜形成用組成物尤其是含有作為熱硬化劑(B12)之前述固體分散型潛伏性硬化劑時,較佳為含有前述咪唑類作為硬化促進劑(C)。亦即,保護膜形成用膜較佳為含有環氧樹脂(B11)、作為熱硬化劑(B12)之前述固體分散型潛伏性硬化劑、及作為硬化促進劑(C)之咪唑類。 When the protective film-forming composition contains the solid dispersion type latent curing agent as the heat curing agent (B12), it is preferred to contain the imidazole as the curing accelerator (C). In other words, the film for forming a protective film preferably contains the epoxy resin (B11), the solid dispersion type latent curing agent as the heat curing agent (B12), and the imidazole as the curing accelerator (C).
亦即,保護膜形成用膜的一方面包含聚合物成分(A)、環氧樹脂(B11)、作為熱硬化劑(B12)之前述固體分散型潛伏性硬化劑、及作為硬化促進劑(C)之咪唑類。 In other words, the protective film forming film contains the polymer component (A), the epoxy resin (B11), the above-mentioned solid dispersion type latent curing agent as the heat curing agent (B12), and the curing accelerator (C). The imidazoles.
使用硬化促進劑(C)時,保護膜形成用組成物及保護膜形成用膜中的硬化促進劑(C)的含量如下:將熱硬化性成分(B)的含量設為100質量份時,較佳為0.01質量份至10質量份,更佳為0.1質量份至4質量份。藉由使硬化促進劑(C)的前述含量為上述範圍,保護膜形成用膜即便於高溫、高濕度條件下亦具有優異的接著特性,即便曝露於嚴酷的回流焊條件下時,亦可達成高的封裝可靠性。藉由使硬化促進劑(C)的前述含量為前述下限值以上,可獲得更顯著的由使用硬化促進劑(C)所帶來之效果。另外,雖然硬化促進劑(C)通常具有高極性,但藉由使硬化促進劑(C)的前述含量為前述上限值以下,可抑制於高溫、高濕度條件下,前述硬化促進劑(C)在保護膜形成用膜中的與被黏著體之接著界面析出,藉此,封裝的可靠性提高。 When the curing accelerator (C) is used, the content of the curing accelerator (C) in the protective film-forming composition and the protective film-forming film is as follows: when the content of the thermosetting component (B) is 100 parts by mass, It is preferably from 0.01 part by mass to 10 parts by mass, more preferably from 0.1 part by mass to 4 parts by mass. When the content of the curing accelerator (C) is in the above range, the film for forming a protective film has excellent adhesion characteristics even under high temperature and high humidity conditions, and can be achieved even when exposed to severe reflow conditions. High package reliability. When the content of the curing accelerator (C) is at least the above lower limit value, a more remarkable effect by the use of the curing accelerator (C) can be obtained. In addition, although the curing accelerator (C) usually has a high polarity, the curing accelerator (C) can be suppressed under high temperature and high humidity conditions by setting the content of the curing accelerator (C) to be equal to or less than the above upper limit. In the film for forming a protective film, the interface with the adherend is deposited, whereby the reliability of the package is improved.
為了改善保護膜形成用膜的各種物性,保護膜形成用膜亦可由除了聚合物成分(A)、熱硬化性成分(B)及硬化促進劑(C)以外,進而視需要含有不屬於這些成分之其他成分之保護膜形成用組成物形成。 In order to improve various physical properties of the film for forming a protective film, the film for forming a protective film may be contained in addition to the polymer component (A), the thermosetting component (B), and the curing accelerator (C), and may optionally contain these components. The composition for forming a protective film of the other components is formed.
作為保護膜形成用組成物及保護膜形成用膜所含的前述其他成分,例如可列舉:填充材料(D)、偶合劑(E)、 交聯劑(F)、通用的添加劑(G)等。 Examples of the other components contained in the protective film-forming composition and the protective film-forming film include a filler (D) and a coupling agent (E). Crosslinking agent (F), general additive (G), and the like.
(填充材料(D)) (filling material (D))
通常,藉由含有填充材料(D),調整保護膜形成用組成物的熱膨脹係數變得容易。因此,藉由使用此種保護膜形成用組成物,使硬化後的保護膜的熱膨脹係數對於半導體晶片而言最適宜,可提高封裝可靠性。 In general, it is easy to adjust the thermal expansion coefficient of the composition for forming a protective film by including the filler (D). Therefore, by using such a composition for forming a protective film, the thermal expansion coefficient of the cured protective film is most suitable for the semiconductor wafer, and the package reliability can be improved.
另外,通常,藉由使用含有填充材料(D)之保護膜形成用組成物,亦可降低硬化後的保護膜的吸濕率。 Further, in general, by using the composition for forming a protective film containing the filler (D), the moisture absorption rate of the cured protective film can be lowered.
填充材料(D)可為有機填充材料及無機填充材料之任一者,較佳為無機填充材料。 The filler (D) may be any of an organic filler and an inorganic filler, preferably an inorganic filler.
作為較佳的無機填充材料,例如可列舉:二氧化矽、氧化鋁、滑石、碳酸鈣、鈦白、鐵丹、碳化矽、氮化硼等的粉末;將這些二氧化矽等球形化所成之珠粒;這些二氧化矽等的單晶纖維;玻璃纖維等。 Examples of preferred inorganic fillers include powders of cerium oxide, aluminum oxide, talc, calcium carbonate, titanium white, iron oxide, cerium carbide, and boron nitride; and spheroidization of these cerium oxides and the like Beads; single crystal fibers such as cerium oxide; glass fibers, and the like.
該等之中,無機填充材料較佳為二氧化矽填料或氧化鋁填料。 Among these, the inorganic filler is preferably a cerium oxide filler or an alumina filler.
填充材料(D)可單獨使用1種,亦可將2種以上同時使用。 The filler (D) may be used singly or in combination of two or more.
使用填充材料(D)時,相對於保護膜形成用組成物中除了溶劑以外的成分的總質量,填充材料(D)的含量(即保護 膜形成用膜中的填充材料(D)的含量)較佳為5質量%至80質量%,更佳為7質量%至60質量%。藉由使填充材料(D)的含量為上述範圍,調整上述熱膨脹係數變得更容易。 When the filler (D) is used, the content of the filler (D) (ie, protection) is relative to the total mass of the components other than the solvent in the composition for forming a protective film. The content of the filler (D) in the film for film formation is preferably from 5% by mass to 80% by mass, more preferably from 7% by mass to 60% by mass. By setting the content of the filler (D) to the above range, it is easier to adjust the above thermal expansion coefficient.
(偶合劑(E)) (coupler (E))
藉由使用具有與無機化合物或有機化合物進行反應之官能基之化合物作為偶合劑(E),可提高保護膜形成用膜對於被黏著體之接著性及密接性。另外,藉由含有偶合劑(E),保護膜形成用膜經硬化而獲得之保護膜在不損及耐熱性之情況下抗水性提高。 By using a compound having a functional group reactive with an inorganic compound or an organic compound as the coupling agent (E), the adhesion of the film for forming a protective film to the adherend and the adhesion can be improved. In addition, the protective film obtained by curing the film for forming a protective film containing the coupling agent (E) has improved water resistance without impairing heat resistance.
偶合劑(E)較佳為具有與聚合物成分(A)、熱硬化性成分(B)等所具有的官能基進行反應之官能基之化合物,較理想為矽烷偶合劑。 The coupling agent (E) is preferably a compound having a functional group reactive with a functional group possessed by the polymer component (A) or the thermosetting component (B), and more preferably a decane coupling agent.
作為較佳的前述矽烷偶合劑,例如可列舉:γ-縮水甘油氧基丙基三甲氧基矽烷、γ-縮水甘油氧基丙基甲基二乙氧基矽烷、β-(3,4-環氧環己基)乙基三甲氧基矽烷、γ-(甲基丙烯醯氧基丙基)三甲氧基矽烷、γ-胺丙基三甲氧基矽烷、N-6-(胺乙基)-γ-胺丙基三甲氧基矽烷、N-6-(胺乙基)-γ-胺丙基甲基二乙氧基矽烷、N-苯基-γ-胺丙基三甲氧基矽烷、γ-脲基丙基三乙氧基矽烷、γ-巰基丙基三甲氧基矽烷、γ-巰基丙基甲基二甲氧基矽烷、雙(3-三乙氧基矽烷基丙基)四硫化物、甲基三甲氧基矽烷、甲基三乙氧基矽烷、乙烯基三甲氧基矽烷、乙烯基三乙醯氧基矽烷 、咪唑矽烷等。 Preferred examples of the decane coupling agent include γ-glycidoxypropyltrimethoxydecane, γ-glycidoxypropylmethyldiethoxydecane, and β-(3,4-ring). Oxycyclohexyl)ethyltrimethoxydecane, γ-(methacryloxypropyl)trimethoxynonane, γ-aminopropyltrimethoxydecane, N-6-(aminoethyl)-γ- Aminopropyltrimethoxydecane, N-6-(aminoethyl)-γ-aminopropylmethyldiethoxydecane, N-phenyl-γ-aminopropyltrimethoxydecane, γ-ureido Propyltriethoxydecane, γ-mercaptopropyltrimethoxydecane, γ-mercaptopropylmethyldimethoxydecane, bis(3-triethoxydecylpropyl)tetrasulfide, methyl Trimethoxydecane, methyltriethoxydecane, vinyltrimethoxydecane, vinyltriethoxydecane , imidazolium, and the like.
偶合劑(E)可單獨使用1種,亦可將2種以上同時使用。 The coupling agent (E) may be used singly or in combination of two or more.
使用偶合劑(E)時,保護膜形成用組成物及保護膜形成用膜中的偶合劑(E)的含量如下:將聚合物成分(A)及熱硬化性成分(B)之總含量設為100質量份時,較佳為0.03質量份至20質量份,更佳為0.05質量份至10質量份,特佳為0.1質量份至5質量份。藉由使偶合劑(E)的前述含量為前述下限值以上,可獲得更顯著的由使用偶合劑(E)所帶來之效果,藉由使偶合劑(E)的前述含量為前述上限值以下,可進一步抑制產生逸氣。 When the coupling agent (E) is used, the content of the coupling agent (E) in the protective film-forming composition and the protective film-forming film is as follows: the total content of the polymer component (A) and the thermosetting component (B) is set. When it is 100 parts by mass, it is preferably 0.03 parts by mass to 20 parts by mass, more preferably 0.05 parts by mass to 10 parts by mass, particularly preferably 0.1 part by mass to 5 parts by mass. When the content of the coupling agent (E) is at least the above lower limit value, a more remarkable effect by using the coupling agent (E) can be obtained, and the aforementioned content of the coupling agent (E) is as described above. Below the limit value, generation of outgassing can be further suppressed.
(交聯劑(F)) (crosslinking agent (F))
使用具有可與其他化合物鍵結之官能基,例如乙烯基、(甲基)丙烯醯基、胺基、羥基、羧基、異氰酸酯基等官能基之上述丙烯酸系樹脂作為聚合物成分(A)時,為了使該官能基與其他化合物鍵結而產生交聯,可使用交聯劑(F)。藉由使用交聯劑(F)產生交聯,可調節保護膜形成用膜的初期接著力及凝聚力。 When the above-mentioned acrylic resin having a functional group capable of bonding with another compound, for example, a functional group such as a vinyl group, a (meth) acryl fluorenyl group, an amine group, a hydroxyl group, a carboxyl group or an isocyanate group, is used as the polymer component (A), In order to cause crosslinking of the functional group with other compounds, a crosslinking agent (F) can be used. By using the crosslinking agent (F) to cause crosslinking, the initial adhesion force and cohesive force of the film for forming a protective film can be adjusted.
作為交聯劑(F),例如可列舉:有機多元異氰酸酯化合物、有機多元亞胺化合物等。 Examples of the crosslinking agent (F) include an organic polyvalent isocyanate compound and an organic polyimine compound.
作為前述有機多元異氰酸酯化合物,例如可列舉:芳香族多元異氰酸酯化合物、脂肪族多元異氰酸酯化合物、脂環族多元異氰酸酯化合物及這些化合物的三聚物、異氰脲酸酯體及加成物(與乙二醇、丙二醇、新戊二醇、三羥甲基丙烷或蓖麻油等含低分子活性氫化合物之反應產物,例如三羥甲基丙烷的苯二甲基二異氰酸酯加成物等)、或使有機多元異氰酸酯化合物與多元醇化合物進行反應而獲得之末端異氰酸酯胺甲酸酯預聚物等。 Examples of the organic polyvalent isocyanate compound include an aromatic polyisocyanate compound, an aliphatic polyisocyanate compound, an alicyclic polyisocyanate compound, and terpolymers, isocyanurate bodies, and adducts of these compounds (with B). a reaction product of a low molecular weight active hydrogen compound such as diol, propylene glycol, neopentyl glycol, trimethylolpropane or castor oil, for example, a dimethylated diisocyanate adduct of trimethylolpropane, etc.) A terminal isocyanate urethane prepolymer obtained by reacting an organic polyvalent isocyanate compound with a polyol compound.
作為前述有機多元異氰酸酯化合物,例如可列舉:2,4-甲苯二異氰酸酯;2,6-甲苯二異氰酸酯;1,3-苯二甲基二異氰酸酯;1,4-二甲苯二異氰酸酯;二苯基甲烷-4,4'-二異氰酸酯;二苯基甲烷-2,4'-二異氰酸酯;3-甲基二苯基甲烷二異氰酸酯;六亞甲基二異氰酸酯;異佛爾酮二異氰酸酯;二環己基甲烷-4,4'-二異氰酸酯;二環己基甲烷-2,4'-二異氰酸酯;對三羥甲基丙烷等多元醇的全部或一部分羥基,加成甲苯二異氰酸酯及六亞甲基二異氰酸酯的任一者或兩者所成之化合物;離胺酸二異氰酸酯等。 The organic polyisocyanate compound may, for example, be 2,4-toluene diisocyanate; 2,6-toluene diisocyanate; 1,3-benzenedimethyl diisocyanate; 1,4-xylene diisocyanate; diphenyl group. Methane-4,4'-diisocyanate; diphenylmethane-2,4'-diisocyanate; 3-methyldiphenylmethane diisocyanate; hexamethylene diisocyanate; isophorone diisocyanate; bicyclic Hexylmethane-4,4'-diisocyanate; dicyclohexylmethane-2,4'-diisocyanate; addition of toluene diisocyanate and hexamethylene group to all or a part of hydroxyl groups of polyhydric alcohols such as trimethylolpropane A compound of either or both isocyanates; an isocyanate diisocyanate or the like.
作為前述有機多元亞胺化合物,例如可列舉:N,N'-二苯基甲烷-4,4'-雙(1-氮丙啶甲醯胺)、三羥甲基丙烷-三-β-氮丙啶基丙酸酯、四羥甲基甲烷-三-β-氮丙啶基丙酸酯、N,N'-甲苯-2,4-雙(1-氮丙啶甲醯胺)三伸乙基三聚氰胺等。 The organic polyimine compound may, for example, be N,N'-diphenylmethane-4,4'-bis(1-aziridinecarboxamide) or trimethylolpropane-tri-beta-nitrogen. Propidyl propionate, tetramethylolmethane-tri-β-aziridine propionate, N,N'-toluene-2,4-bis(1-aziridinecarbamamine) Based on melamine and the like.
交聯劑(F)使用異氰酸酯系交聯劑時,作為聚合物成分(A)之前述丙烯酸系樹脂較佳為使用含羥基之聚合物。交聯劑(F)具有異氰酸酯基,且丙烯酸系樹脂具有羥基之情形時,藉由交聯劑(F)與丙烯酸系樹脂之反應,即可簡便地在保護膜形成用膜中導入交聯結構。 When the isocyanate crosslinking agent is used as the crosslinking agent (F), it is preferred to use a hydroxyl group-containing polymer as the acrylic resin as the polymer component (A). When the crosslinking agent (F) has an isocyanate group and the acrylic resin has a hydroxyl group, the crosslinked structure can be easily introduced into the film for forming a protective film by the reaction of the crosslinking agent (F) with the acrylic resin. .
使用交聯劑(F)時,保護膜形成用組成物的交聯劑(F)的含量如下:將聚合物成分(A)的含量設為100質量份時,較佳為0.01質量份至20質量份,更佳為0.1質量份至10質量份,特佳為0.5質量份至5質量份。 When the crosslinking agent (F) is used, the content of the crosslinking agent (F) in the composition for forming a protective film is as follows: when the content of the polymer component (A) is 100 parts by mass, it is preferably 0.01 parts by mass to 20 parts by mass. The parts by mass are more preferably from 0.1 part by mass to 10 parts by mass, particularly preferably from 0.5 part by mass to 5 parts by mass.
(通用的添加劑(G)) (General additive (G))
作為通用的添加劑(G),例如可列舉:公知的塑化劑、抗靜電劑、抗氧化劑、顏料、染料、吸氣劑等。 Examples of the general additive (G) include a known plasticizer, an antistatic agent, an antioxidant, a pigment, a dye, a getter, and the like.
(溶劑) (solvent)
保護膜形成用組成物藉由稀釋而其操作性可提高,因此,較佳為進一步含有溶劑。 Since the composition for forming a protective film can be improved in workability by dilution, it is preferable to further contain a solvent.
保護膜形成用組成物所含的溶劑可與上述黏著劑組成物中的溶劑相同。 The solvent contained in the composition for forming a protective film may be the same as the solvent in the above-mentioned adhesive composition.
保護膜形成用組成物所含的溶劑可僅為1種,亦可為2種以上。 The solvent contained in the composition for forming a protective film may be one type or two or more types.
保護膜形成用組成物含有溶劑時的溶劑含量較佳為 :相對於前述保護膜形成用組成物的總質量,前述保護膜形成用組成物的固形物成分濃度為35質量%至75質量%之量。 The solvent content in the case where the protective film forming composition contains a solvent is preferably The concentration of the solid content of the protective film-forming composition is from 35% by mass to 75% by mass based on the total mass of the protective film-forming composition.
亦即,保護膜形成用組成物的另一方面包含:聚合物成分(A)、熱硬化性成分(B)、硬化促進劑(C)、及視需要選自由溶劑、填充材料(D)、偶合劑(E)、交聯劑(F)及通用的添加劑(G)所組成之群組中的至少一種成分。 In other words, the protective film forming composition includes a polymer component (A), a thermosetting component (B), a curing accelerator (C), and optionally a solvent, a filler (D), and At least one component selected from the group consisting of a coupling agent (E), a crosslinking agent (F), and a general additive (G).
保護膜形成用膜的另一方面包含:聚合物成分(A)、熱硬化性成分(B)、硬化促進劑(C)、及視需要選自由填充材料(D)、偶合劑(E)、交聯劑(F)及通用的添加劑(G)所組成之群組中的至少一種成分。 Another aspect of the film for forming a protective film includes a polymer component (A), a thermosetting component (B), a curing accelerator (C), and optionally, a filler (D), a coupling agent (E), and At least one component selected from the group consisting of a crosslinking agent (F) and a general additive (G).
進而,較佳為前述熱硬化性成分(B)包含環氧樹脂(B11)、作為熱硬化劑(B12)之前述固體分散型潛伏性硬化劑,且前述硬化促進劑(C)包含咪唑類。 Furthermore, it is preferable that the thermosetting component (B) contains the epoxy resin (B11) and the solid dispersion type latent curing agent as the thermal curing agent (B12), and the curing accelerator (C) contains an imidazole.
保護膜形成用組成物可藉由調配用以構成該組成物之上述各成分而獲得,例如,除了調配成分不同之方面以外,可利用與上述黏著劑組成物相同的方法獲得。 The protective film-forming composition can be obtained by blending the above-mentioned respective components for constituting the composition. For example, it can be obtained by the same method as the above-described adhesive composition except for the difference in the formulation components.
使用溶劑之情形時,可將溶劑與溶劑以外的任一種調配成分混合而將該調配成分預先稀釋而使用,亦可將溶劑與這些調配成分混合而使用,而並不預先稀釋溶劑以外的任一種調配成分。 When a solvent is used, the solvent may be mixed with any of the formulation components other than the solvent, and the formulation component may be previously diluted and used, or the solvent may be used in combination with the formulation component without any dilution of the solvent. Formulation ingredients.
前述保護膜形成用複合片例如亦可於保護膜形成用膜的表面或黏著劑層的表面等露出面上具備剝離膜。在使用保護膜形成用複合片時,將前述剝離膜剝離(去除)即可。 The composite sheet for forming a protective film may have a release film, for example, on the surface of the film for forming a protective film or the surface of the adhesive layer. When the composite sheet for forming a protective film is used, the release film may be peeled off (removed).
圖1係以示意方式表示本發明之保護膜形成用複合片的一實施形態之剖面圖。 Fig. 1 is a cross-sectional view showing an embodiment of a composite sheet for forming a protective film of the present invention.
此處所示之保護膜形成用複合片1係於基材11上具備黏著劑層12,且於黏著劑層12上具備保護膜形成用膜13而成,並且具有於支持片10的黏著劑層12上,具備保護膜形成用膜13之構成。另外,保護膜形成用複合片1進而於保護膜形成用膜13上具備剝離膜14。與保護膜形成用膜13接觸之黏著劑層12係含有前述(甲基)丙烯酸烷基酯共聚物之層,且前述(甲基)丙烯酸烷基酯共聚物具有由構成烷基酯之烷基的碳數為8以上之(甲基)丙烯酸烷基酯衍生之結構單元。 The composite sheet 1 for forming a protective film shown in the present invention has an adhesive layer 12 on a substrate 11 and a film 13 for forming a protective film on the adhesive layer 12, and has an adhesive for the support sheet 10. The layer 12 is provided with a film 13 for forming a protective film. In addition, the protective film forming composite sheet 1 and the protective film forming film 13 are provided with a release film 14 . The adhesive layer 12 which is in contact with the film 13 for forming a protective film contains the layer of the alkyl (meth) acrylate copolymer described above, and the alkyl (meth) acrylate copolymer has an alkyl group constituting the alkyl ester. The structural unit derived from an alkyl (meth)acrylate having a carbon number of 8 or more.
保護膜形成用複合片1中,黏著劑層12積層於基材11的表面11a上,保護膜形成用膜13積層於黏著劑層12的表面12a的一部分。另外,黏著劑層12的表面12a中,未積層有保護膜形成用膜13之露出面、及保護膜形成用膜13的表面13a(上面及側面)上,積層有剝離膜14。 In the composite sheet 1 for forming a protective film, the adhesive layer 12 is laminated on the surface 11a of the substrate 11, and the protective film forming film 13 is laminated on a part of the surface 12a of the adhesive layer 12. In the surface 12a of the adhesive layer 12, the exposed surface of the film for forming a protective film 13 and the surface 13a (upper surface and side surface) of the film 13 for forming a protective film are laminated with a release film 14.
再者,於剝離膜14、與黏著劑層12的表面12a或保護膜形成用膜13的表面13a之間,亦可存在空隙部。例如,保 護膜形成用膜13的表面13a中以符號130a所示之區域(黏著劑層12側之區域)、及黏著劑層12的表面12a中以符號120a所示之區域(保護膜形成用膜13側之區域)與剝離膜14之間容易產生前述空隙部。亦即,位於保護膜形成用膜13與黏著劑層12之分界附近且與剝離膜14相接之區域容易產生空隙部。 Further, a void portion may be present between the release film 14 and the surface 12a of the adhesive layer 12 or the surface 13a of the protective film formation film 13. For example, insurance A region indicated by reference numeral 130a (a region on the side of the adhesive layer 12) and a region indicated by a reference numeral 120a in the surface 12a of the adhesive layer 12 on the surface 13a of the film for forming a film 13 (film for forming a protective film 13) The gap portion is easily formed between the side region and the release film 14. In other words, a region in the vicinity of the boundary between the film for forming the protective film 13 and the adhesive layer 12 and in contact with the release film 14 is likely to generate a void portion.
圖1所示之保護膜形成用複合片1係於剝離膜14經移除之狀態下,將半導體晶圓(圖示省略)的背面貼附於保護膜形成用膜13的表面13a,進一步,將黏著劑層12的表面12a中未積層有保護膜形成用膜13之露出面貼附於環框(ring frame)等夾具上而使用。 In the composite sheet 1 for forming a protective film, the back surface of the semiconductor wafer (not shown) is attached to the surface 13a of the film for protective film formation 13 in a state in which the release film 14 is removed. The exposed surface of the surface 12a of the adhesive layer 12 on which the protective film forming film 13 is not laminated is attached to a jig such as a ring frame.
圖2係以示意方式表示本發明之保護膜形成用複合片的另一實施形態之剖面圖。再者,圖2中,對與圖1所示相同之要素標附與圖1相同之符號,且省略詳細說明。圖3以下之圖中亦同樣如此。 Fig. 2 is a cross-sectional view showing another embodiment of the composite sheet for forming a protective film of the present invention. In FIG. 2, the same components as those in FIG. 1 are denoted by the same reference numerals as in FIG. 1, and detailed description thereof will be omitted. The same is true in the figure below in Figure 3.
此處所示之保護膜形成用複合片2中,於黏著劑層12的表面12a的整個面積層有保護膜形成用膜23,於保護膜形成用膜23的表面23a的一部分積層有夾具用接著劑層15,於保護膜形成用膜23的表面23a中未積層有夾具用接著劑層15之露出面、及夾具用接著劑層15的表面15a(上面及側面)上,積層有剝離膜14,除此之外皆與圖1所示之保護膜形成用複合片1相同。與保護膜形成用膜23接觸之黏著 劑層12含有前述(甲基)丙烯酸烷基酯共聚物,且前述(甲基)丙烯酸烷基酯共聚物具有由構成烷基酯之烷基的碳數為8以上之(甲基)丙烯酸烷基酯衍生之結構單元。 In the composite sheet 2 for forming a protective film, the protective film forming film 23 is formed over the entire surface of the surface 12a of the adhesive layer 12, and a part of the surface 23a of the protective film forming film 23 is laminated with a jig. In the surface layer 23a of the protective film forming film 23, the exposed surface of the adhesive film forming layer 23 and the surface 15a (upper surface and side surface) of the adhesive adhesive layer 15 are laminated on the surface 23a of the protective film forming film 23, and a release film is laminated. 14. Other than this, it is the same as the composite sheet 1 for protective film formation shown in FIG. Adhesion to the film 23 for forming a protective film The agent layer 12 contains the aforementioned alkyl (meth) acrylate copolymer, and the alkyl (meth) acrylate copolymer has an alkyl (meth) acrylate having a carbon number of 8 or more from an alkyl group constituting the alkyl ester. a structural unit derived from a base ester.
亦即,本發明之保護膜形成用複合片的一方面包含基材、黏著劑層、保護膜形成用膜、夾具用接著劑層、及剝離膜;前述黏著劑層積層於前述基材上;於前述黏著劑層的整個表面積層有前述保護膜形成用膜;於前述保護膜形成用膜的表面的一部分積層有前述夾具用接著劑層;於前述保護膜形成用膜的表面中未積層有前述夾具用接著劑層之露出面、及前述夾具用接著劑層的上面及側面上,積層有前述剝離膜;與前述保護膜形成用膜接觸之前述黏著劑層含有前述(甲基)丙烯酸烷基酯共聚物,且前述(甲基)丙烯酸烷基酯共聚物具有由構成烷基酯之烷基的碳數為8以上18以下之(甲基)丙烯酸烷基酯衍生之結構單元。 In one aspect, the composite sheet for forming a protective film of the present invention comprises a substrate, an adhesive layer, a film for forming a protective film, an adhesive layer for a jig, and a release film; and the adhesive layer is laminated on the substrate; The film for forming a protective film is formed on the entire surface layer of the pressure-sensitive adhesive layer; the adhesive layer for a jig is laminated on a part of the surface of the film for forming a protective film; and the surface of the film for forming a protective film is not laminated. The exposed surface of the adhesive layer for a jig and the upper surface and the side surface of the adhesive layer for a jig are laminated with the release film; and the adhesive layer in contact with the film for forming a protective film contains the (meth)acrylic acid. The base ester copolymer, and the alkyl (meth)acrylate copolymer has a structural unit derived from an alkyl (meth)acrylate having a carbon number of 8 or more and 18 or less of an alkyl group constituting the alkyl ester.
夾具用接著劑層15例如可為含有接著劑成分之單層結構,亦可為於作為芯材之片材的兩面積層有含有接著劑成分之層之複數層結構。 The adhesive adhesive layer 15 may be, for example, a single layer structure containing an adhesive component, or may have a plurality of layer structures having a layer containing an adhesive component in a two-layer layer of a core material.
再者,於剝離膜14、與保護膜形成用膜23的表面23a或夾具用接著劑層15的表面15a之間,亦可存在空隙部。例如,夾具用接著劑層15的表面15a中以符號150a所示之區域(保護膜形成用膜23側之區域)、及保護膜形成用膜23的表面23a中以符號230a所示之區域(夾具用接著劑層15側 之區域)與剝離膜14之間,容易產生前述空隙部。 Further, a void portion may be present between the release film 14 and the surface 23a of the protective film forming film 23 or the surface 15a of the adhesive adhesive layer 15. For example, the region indicated by the reference numeral 150a (the region on the side of the protective film forming film 23) of the surface 15a of the adhesive adhesive layer 15 and the region indicated by the symbol 230a in the surface 23a of the protective film forming film 23 ( Binder adhesive layer 15 side The space between the region and the release film 14 is likely to occur.
亦即,位於夾具用接著劑層15與保護膜形成用膜23之分界附近,且與剝離膜14相接之區域容易產生空隙部。 In other words, in the vicinity of the boundary between the adhesive binder layer 15 and the protective film forming film 23, the void portion is likely to be generated in the region in contact with the release film 14.
圖2所示之保護膜形成用複合片2係於剝離膜14經移除之狀態下,將半導體晶圓(圖示省略)的背面貼附於保護膜形成用膜23的表面23a,進一步,將夾具用接著劑層15的表面15a中的上面貼附於環框等夾具上而使用。 In the composite sheet 2 for forming a protective film, the back surface of the semiconductor wafer (not shown) is attached to the surface 23a of the protective film forming film 23, and the composite film 2 is formed. The upper surface of the surface 15a of the adhesive adhesive layer 15 is attached to a jig such as a ring frame and used.
圖3係以示意方式表示本發明之保護膜形成用複合片的又一實施形態之剖面圖。 Fig. 3 is a cross-sectional view showing still another embodiment of the composite sheet for forming a protective film of the present invention.
此處所示之保護膜形成用複合片3具備雙層結構的黏著劑層32代替黏著劑層12,前述雙層結構的黏著劑層32係自基材11側依序積層第1黏著劑層321及第2黏著劑層322而成,除此之外皆與圖1所示之保護膜形成用複合片1相同。 The composite sheet 3 for forming a protective film shown here has a double-layered adhesive layer 32 instead of the adhesive layer 12, and the double-layered adhesive layer 32 sequentially laminates the first adhesive layer from the side of the substrate 11 The 321 and the second adhesive layer 322 are the same as the composite sheet 1 for forming a protective film shown in Fig. 1 .
自上方朝下看而俯視保護膜形成用複合片3時,第2黏著劑層322的面積與保護膜形成用膜13相同,且以周緣部與保護膜形成用膜13重合之方式配置。保護膜形成用膜13設置於黏著劑層32中與基材側為相反側之表面32a(亦即,第2黏著劑層322的表面322a)上。另外,第1黏著劑層321以被覆基材11的表面11a的整個面之方式設置,如上所述般俯視時,第1黏著劑層321的面積大於第2黏著劑層322。 When the composite film 3 for forming a protective film is viewed from the top, the area of the second adhesive layer 322 is the same as that of the film 13 for forming a protective film, and the peripheral portion is placed so as to overlap the film 13 for forming a protective film. The film 13 for forming a protective film is provided on the surface 32a (that is, the surface 322a of the second adhesive layer 322) on the side opposite to the substrate side of the adhesive layer 32. Further, the first adhesive layer 321 is provided so as to cover the entire surface of the surface 11a of the substrate 11, and the area of the first adhesive layer 321 is larger than that of the second adhesive layer 322 when viewed as described above.
保護膜形成用複合片3中,與保護膜形成用膜13接觸之第2黏著劑層322含有前述(甲基)丙烯酸烷基酯共聚物,且前述(甲基)丙烯酸烷基酯共聚物具有由構成烷基酯之烷基的碳數為8以上之(甲基)丙烯酸烷基酯衍生之結構單元。另外,與保護膜形成用膜13不接觸之第1黏著劑層321可含有前述(甲基)丙烯酸烷基酯共聚物,亦可不含前述(甲基)丙烯酸烷基酯共聚物。 In the composite sheet 3 for forming a protective film, the second adhesive layer 322 which is in contact with the film for forming a protective film 13 contains the alkyl (meth) acrylate copolymer, and the alkyl (meth) acrylate copolymer has A structural unit derived from an alkyl (meth)acrylate having a carbon number of 8 or more constituting an alkyl group of an alkyl ester. In addition, the first adhesive layer 321 which is not in contact with the film for forming a protective film 13 may contain the alkyl (meth)acrylate copolymer or may not contain the alkyl (meth)acrylate copolymer.
亦即,本發明之保護膜形成用複合片的一方面包含基材、第1黏著劑層、第2黏著劑層、保護膜形成用膜、夾具用接著劑層、及剝離膜;前述第1黏著劑層以被覆前述基材上面之方式設置於前述基材上;前述第2黏著劑層設置於前述第1黏著劑層上;前述保護膜形成用膜以周緣部與前述第2黏著劑層重合之方式,設置於前述第2黏著劑層上;前述剝離膜積層於前述保護膜形成用膜的上面及側面、前述第2黏著劑層的側面、及前述第1黏著劑層中未積層有前述第2黏著劑層之面上;自上方朝下看而俯視時,前述第2黏著劑層的面積與前述保護膜形成用膜相同,前述第1黏著劑層的面積大於前述第2黏著劑層;前述第2黏著劑層含有前述(甲基)丙烯酸烷基酯共聚物,且前述(甲基)丙烯酸烷基酯共聚物具有由構成烷基酯之烷基的碳數為8以上18以下之(甲基)丙烯酸烷基酯衍生之結構單元。 In other words, the composite sheet for forming a protective film of the present invention comprises a substrate, a first adhesive layer, a second adhesive layer, a film for forming a protective film, an adhesive layer for a jig, and a release film; The adhesive layer is provided on the substrate so as to cover the upper surface of the substrate; the second adhesive layer is provided on the first adhesive layer; and the peripheral film portion and the second adhesive layer are formed on the protective film forming film. The superposition method is provided on the second adhesive layer, and the release film is laminated on the upper surface and the side surface of the protective film formation film, the side surface of the second adhesive layer, and the first adhesive layer. The surface of the second adhesive layer is the same as the film for forming a protective film when viewed from above, and the area of the first adhesive layer is larger than the second adhesive. The second adhesive layer contains the alkyl (meth)acrylate copolymer, and the alkyl (meth)acrylate copolymer has a carbon number of 8 or more and 18 or less from the alkyl group constituting the alkyl ester. Derived from alkyl (meth)acrylate Structural units.
圖4係以示意方式表示本發明之保護膜形成用複合片的又一實施形態之剖面圖。 Fig. 4 is a cross-sectional view showing still another embodiment of the composite sheet for forming a protective film of the present invention.
此處所示之保護膜形成用複合片4具備雙層結構的黏著劑層42代替黏著劑層12,前述雙層結構的黏著劑層42係自基材11側依序積層第1黏著劑層421及第2黏著劑層422而成,除此之外皆與圖2所示之保護膜形成用複合片2相同。 The composite sheet 4 for forming a protective film shown here has a double-layered adhesive layer 42 instead of the adhesive layer 12, and the double-layered adhesive layer 42 sequentially laminates the first adhesive layer from the side of the substrate 11 The 421 and the second adhesive layer 422 are the same as the composite sheet 2 for forming a protective film shown in Fig. 2 .
自上方朝下看而俯視保護膜形成用複合片4時,第1黏著劑層421及第2黏著劑層422的任一者的面積皆與保護膜形成用膜23相同。 When the composite sheet 4 for forming a protective film is viewed from above, the area of either the first adhesive layer 421 and the second adhesive layer 422 is the same as that of the protective film forming film 23.
保護膜形成用膜23設置於黏著劑層42的表面42a(即第2黏著劑層422的表面422a)上。 The film 23 for forming a protective film is provided on the surface 42a of the adhesive layer 42 (that is, the surface 422a of the second adhesive layer 422).
保護膜形成用複合片4中,與保護膜形成用膜23接觸之第2黏著劑層422含有前述(甲基)丙烯酸烷基酯共聚物,且前述(甲基)丙烯酸烷基酯共聚物具有由構成烷基酯之烷基的碳數為8以上之(甲基)丙烯酸烷基酯衍生之結構單元。另外,與保護膜形成用膜23不接觸之第1黏著劑層421可含有前述(甲基)丙烯酸烷基酯共聚物,亦可不含前述(甲基)丙烯酸烷基酯共聚物。 In the composite sheet 4 for forming a protective film, the second adhesive layer 422 which is in contact with the film for forming a protective film 23 contains the alkyl (meth) acrylate copolymer, and the alkyl (meth) acrylate copolymer has A structural unit derived from an alkyl (meth)acrylate having a carbon number of 8 or more constituting an alkyl group of an alkyl ester. In addition, the first adhesive layer 421 which is not in contact with the film for forming a protective film 23 may contain the alkyl (meth)acrylate copolymer or may not contain the alkyl (meth)acrylate copolymer.
亦即,本發明之保護膜形成用複合片的一方面包含基材、第1黏著劑層、第2黏著劑層、保護膜形成用膜、夾具用接著劑層、及剝離膜;前述第1黏著劑層積層於前述基材上;前述第2黏著劑層積層於前述第1黏著劑層上;於前述第2黏著劑層上積層有前述保護膜形成用膜;於前述保護膜形成用膜的表面的一部分積層有前述夾具用接著劑 層;於前述保護膜形成用膜的表面中未積層有前述夾具用接著劑層之露出面、及前述夾具用接著劑層的上面及側面上,積層有前述剝離膜;自上方朝下看而俯視時,前述第1黏著劑層、前述第2黏著劑層422、及前述保護膜形成用膜23的面積相同;與前述保護膜形成用膜接觸之前述第2黏著劑層含有前述(甲基)丙烯酸烷基酯共聚物,且前述(甲基)丙烯酸烷基酯共聚物具有由構成烷基酯之烷基的碳數為8以上18以下之(甲基)丙烯酸烷基酯衍生之結構單元。 In other words, the composite sheet for forming a protective film of the present invention comprises a substrate, a first adhesive layer, a second adhesive layer, a film for forming a protective film, an adhesive layer for a jig, and a release film; The adhesive layer is laminated on the substrate; the second adhesive layer is laminated on the first adhesive layer; the protective film forming film is laminated on the second adhesive layer; and the protective film forming film is formed. Part of the surface is laminated with the aforementioned adhesive for the jig In the surface of the film for forming a protective film, the exposed surface of the adhesive layer for the jig and the upper surface and the side surface of the adhesive layer for the jig are laminated, and the release film is laminated; The first adhesive layer, the second adhesive layer 422, and the protective film forming film 23 have the same area in plan view, and the second adhesive layer that is in contact with the protective film forming film contains the above (methyl An alkyl acrylate copolymer, wherein the alkyl (meth) acrylate copolymer has a structural unit derived from an alkyl (meth) acrylate having a carbon number of 8 or more and 18 or less constituting an alkyl group of the alkyl ester; .
本發明之保護膜形成用複合片並不限定於圖1至圖4所示者,亦可為在不損害本發明的效果之範圍內,將圖1至圖4所示之保護膜形成用複合片的一部分構成變更或刪減所成者、或對以上所說明之保護膜形成用複合片進一步追加其他構成所成者。 The composite sheet for forming a protective film of the present invention is not limited to those shown in Figs. 1 to 4, and may be a composite for forming a protective film shown in Figs. 1 to 4 within a range not impairing the effects of the present invention. A part of the sheet is composed of a modification or a deletion, or a composite sheet for forming a protective film described above is further added to another composition.
例如,圖3所示之保護膜形成用複合片3中,自上方朝下看而俯視前述保護膜形成用複合片3時,第2黏著劑層322的面積與保護膜形成用膜13相同,且小於第1黏著劑層321的面積,但第2黏著劑層322的面積亦可與保護膜形成用膜13不同,例如,可大於保護膜形成用膜13的面積,此時,第2黏著劑層322的面積可與第1黏著劑層321相同。 For example, in the composite sheet 3 for forming a protective film shown in FIG. 3, when the composite sheet 3 for forming a protective film is viewed in plan as viewed from above, the area of the second adhesive layer 322 is the same as that of the film 13 for forming a protective film. The area of the second adhesive layer 322 is smaller than the area of the protective film forming film 13, and may be larger than the area of the protective film forming film 13, for example, the second adhesive layer. The area of the agent layer 322 may be the same as that of the first adhesive layer 321.
另外,圖3所示之保護膜形成用複合片3、及圖4所示之保護膜形成用複合片4中,黏著劑層皆為雙層結構,但 黏著劑層亦可為三層以上的積層結構。此時,三層以上的黏著劑層中,與保護膜形成用膜接觸之層(亦即,黏著劑層的厚度方向上距離基材最遠之最上層)含有前述(甲基)丙烯酸烷基酯共聚物,其他層可含有前述(甲基)丙烯酸烷基酯共聚物,亦可不含前述(甲基)丙烯酸烷基酯共聚物。 In addition, in the composite sheet 3 for forming a protective film shown in FIG. 3 and the composite sheet 4 for forming a protective film shown in FIG. 4, the adhesive layers are both in a two-layer structure, but The adhesive layer may also be a laminated structure of three or more layers. In this case, among the three or more adhesive layers, the layer in contact with the film for forming a protective film (that is, the uppermost layer farthest from the substrate in the thickness direction of the adhesive layer) contains the aforementioned (meth)acrylic acid alkyl group. The ester copolymer may have the above-mentioned (meth)acrylic acid alkyl ester copolymer or may not contain the aforementioned alkyl (meth)acrylate copolymer.
如下述實施例中所記載般,對大小為25mm×150mm之前述保護膜形成用複合片,以將硬化前的黏著劑層以剝離角度180°、溫度23℃、拉伸速度300mm/min之條件自保護膜剝離時的荷重之形式所測定之剝離力(以下,有時稱為「黏著劑層硬化前剝離力」)較佳為2000mN/25mm以上,更佳為2200mN/25mm以上。 As described in the following examples, the composite sheet for forming a protective film having a size of 25 mm × 150 mm has a peeling angle of 180°, a temperature of 23° C., and a tensile speed of 300 mm/min. The peeling force measured by the form of the load at the time of peeling from the protective film (hereinafter, referred to as "the peeling force before the adhesive layer is cured") is preferably 2000 mN/25 mm or more, and more preferably 2200 mN/25 mm or more.
同樣地,如下述實施例中所記載般,對大小為25mm×150mm之前述保護膜形成用複合片,以將硬化後的黏著劑層以剝離角度180°、溫度23℃、拉伸速度300mm/min之條件自保護膜剝離時的荷重之形式所測定之剝離力(以下,有時稱為「黏著劑層硬化後剝離力」)較佳為變成2000mN/25mm以下,例如亦可為1700mN/25mm以下、1200mN/25mm以下、700mN/25mm以下等。 Similarly, as described in the following examples, the composite sheet for forming a protective film having a size of 25 mm × 150 mm has a peeling angle of 180°, a temperature of 23° C., and a stretching speed of 300 mm/. The peeling force measured by the form of the load at the time of the peeling of the protective film (hereinafter, referred to as "the peeling force after the adhesive layer is cured") is preferably 2000 mN/25 mm or less, and may be, for example, 1700 mN/25 mm. Hereinafter, it is 1200 mN/25 mm or less, 700 mN/25 mm or less.
本發明中,關於上述大小為25mm×150mm之前述保護膜形成用複合片,前述黏著層硬化前剝離力相對於前述黏著層硬化後剝離力之比([黏著劑層硬化前剝離力]/[黏著 劑層硬化後剝離力])較佳為1.5以上,例如亦可為3以上、6以上、12以上等。 In the present invention, the composite sheet for forming a protective film having a size of 25 mm × 150 mm is a ratio of the peeling force before curing of the adhesive layer to the peeling force after curing of the adhesive layer ([peeling force before curing of the adhesive layer]/[ Adhesive The peeling force after curing of the agent layer is preferably 1.5 or more, and may be, for example, 3 or more, 6 or more, 12 or more.
<保護膜形成用複合片之製造方法> <Method for Producing Composite Sheet for Forming Protective Film>
本發明之保護膜形成用複合片可藉由例如下述方式製造:於基材上由前述黏著劑組成物形成黏著劑層,且於前述黏著劑層上由前述保護膜形成用組成物形成保護膜形成用膜。 The composite sheet for forming a protective film of the present invention can be produced, for example, by forming an adhesive layer on the substrate from the above-mentioned adhesive composition, and forming a protective layer on the adhesive layer by the protective film forming composition. A film for film formation.
黏著劑層可藉由於基材的表面(圖1及2中的基材11的表面11a)塗佈黏著劑組成物,且進行乾燥而形成。此時,視需要亦可對所塗佈之黏著劑組成物進行加熱,藉此產生交聯。加熱條件例如較佳為以100℃至130℃進行1分鐘至5分鐘,但並不限定於此。另外,亦可藉由下述方式形成黏著劑層:將於剝離材料的剝離層表面塗佈黏著劑組成物且乾燥而形成之黏著劑層貼合至基材的表面,然後移除前述剝離材料。 The adhesive layer can be formed by applying an adhesive composition to the surface of the substrate (the surface 11a of the substrate 11 in FIGS. 1 and 2) and drying. At this time, the applied adhesive composition may be heated as needed, thereby causing cross-linking. The heating conditions are preferably, for example, from 100 ° C to 130 ° C for from 1 minute to 5 minutes, but are not limited thereto. Alternatively, the adhesive layer may be formed by applying an adhesive composition to the surface of the release layer of the release material and drying the adhesive layer to the surface of the substrate, and then removing the aforementioned release material. .
藉由公知的方法,向基材的表面或剝離材料的剝離層表面塗佈黏著劑組成物即可,例如可列舉使用以下各種塗佈機之方法:氣刀塗佈機、刮刀塗佈機、棒式塗佈機、凹版塗佈機、輥塗機、輥刀塗佈機、簾幕式塗佈機、模塗機、刀式塗佈機、絲網塗佈機、Meyer棒式塗佈機、接觸式塗佈機等。 The adhesive composition may be applied to the surface of the substrate or the surface of the release layer of the release material by a known method, and examples thereof include the following various coaters: an air knife coater and a knife coater. Bar coater, gravure coater, roll coater, roll coater, curtain coater, die coater, knife coater, screen coater, Meyer bar coater , contact coater, etc.
保護膜形成用膜可由保護膜形成用組成物,利用與如上所述之於基材上形成黏著劑層同樣的方法形成,但通常難以在黏著劑層上直接塗佈保護膜形成用組成物。因此,較佳為先以其他方式形成保護膜形成用膜,將該保護膜形成用膜貼合至黏著劑層的表面之方法,例如將於剝離材料的剝離層表面塗佈保護膜形成用組成物且乾燥而形成之保護膜形成用膜,貼合至黏著劑層的表面,然後移除前述剝離材料等方法。 The film for forming a protective film can be formed by a method similar to the method of forming an adhesive layer on a substrate as described above, but it is generally difficult to directly apply a composition for forming a protective film on the adhesive layer. Therefore, it is preferable to form a film for forming a protective film by another method, and to bond the film for forming a protective film to the surface of the adhesive layer, for example, a protective film forming composition is applied to the surface of the release layer of the release material. The film for forming a protective film formed by drying and adhering to the surface of the adhesive layer, and then removing the above-mentioned release material or the like.
另外,除了上述方法以外,亦可藉由例如下述方式形成本發明之保護膜形成用複合片:由前述黏著劑組成物形成黏著劑層,且由前述保護膜形成用組成物形成保護膜形成用膜之後,將這些黏著劑層及保護膜形成用膜重疊而形成積層體,且於該積層體的前述黏著劑層的表面(黏著劑層的未設置有保護膜形成用膜之面)貼合基材。 In addition, the composite sheet for forming a protective film of the present invention may be formed by forming an adhesive layer from the adhesive composition and forming a protective film from the protective film forming composition, for example, in the following manner. After the film is applied, the pressure-sensitive adhesive layer and the film for forming a protective film are laminated to form a laminate, and the surface of the pressure-sensitive adhesive layer of the laminate (the surface of the pressure-sensitive adhesive layer on which the film for forming a protective film is not provided) is attached. Combined with the substrate.
此時,黏著劑層及保護膜形成用膜的形成條件與上述方法相同。 At this time, the conditions for forming the adhesive layer and the film for forming a protective film are the same as those of the above method.
例如,製造如圖1所示般,自上方朝下看而俯視保護膜形成用複合片時,保護膜形成用膜的表面積小於黏著劑層之保護膜形成用複合片之情形時,於上述製造方法中,只要將預先切割成特定大小及形狀之保護膜形成用膜設置於黏著劑層上即可。 For example, when the composite film for forming a protective film is viewed from above when viewed from above, when the surface area of the film for forming a protective film is smaller than that of the composite film for forming a protective film of the adhesive layer, the above-mentioned manufacturing is carried out. In the method, a film for forming a protective film which is previously cut into a specific size and shape may be provided on the adhesive layer.
<保護膜形成用複合片的使用方法> <How to use a composite sheet for forming a protective film>
本發明之保護膜形成用複合片的使用方法如以下所示。 The method of using the composite sheet for forming a protective film of the present invention is as follows.
亦即,首先,於保護膜形成用複合片的保護膜形成用膜上貼附半導體晶圓的背面,並且將保護膜形成用複合片固定於切割裝置中。 In other words, the back surface of the semiconductor wafer is attached to the film for forming a protective film of the composite sheet for forming a protective film, and the composite sheet for forming a protective film is fixed to the dicing apparatus.
接著,藉由將保護膜形成用膜加熱(例如,以130℃加熱2小時)使之硬化而形成保護膜。半導體晶圓的表面(電極形成面)貼附有背面研磨帶之情形時,通常是將該背面研磨帶自半導體晶圓移除之後形成保護膜。 Next, a film for forming a protective film is heated (for example, heated at 130 ° C for 2 hours) to be cured to form a protective film. In the case where the surface of the semiconductor wafer (electrode forming surface) is attached with a backside polishing tape, the back surface polishing tape is usually removed from the semiconductor wafer to form a protective film.
接著,切割半導體晶圓而形成半導體晶片。形成保護膜之後至進行切割期間,亦可自保護膜形成用複合片的基材側對保護膜照射雷射光束,而於保護膜的表面進行印刷。此時,如以上所說明般,由於硬化前的黏著劑層與保護膜之剝離力足夠大,故即便因雷射印刷而產生氣體,黏著劑層與保護膜之剝離亦得到抑制,且產生氣體積留之情況得到抑制。另外,由於可將半導體晶圓牢固且穩定地固定於保護膜形成用複合片上,故切割時晶片飛濺等得到抑制,可穩定地進行切割。再者,進行雷射印刷之情形時,由於如上所述般黏著劑層與保護膜之剝離得到抑制,且產生氣體積留之情況亦得到抑制,故隔著前述基材及黏著劑層可清楚地目視辨識施於保護膜上之印刷。 Next, the semiconductor wafer is diced to form a semiconductor wafer. During the formation of the protective film and during the dicing, the protective film may be irradiated with a laser beam from the substrate side of the composite sheet for forming a protective film, and printed on the surface of the protective film. At this time, as described above, since the peeling force of the adhesive layer and the protective film before curing is sufficiently large, even if gas is generated by laser printing, peeling of the adhesive layer and the protective film is suppressed, and gas is generated. The accumulation is suppressed. In addition, since the semiconductor wafer can be firmly and stably fixed to the composite sheet for forming a protective film, sputtering of the wafer or the like during dicing can be suppressed, and dicing can be performed stably. Further, in the case of performing laser printing, since the peeling of the adhesive layer and the protective film is suppressed as described above, and the generation of the gas volume is suppressed, the substrate and the adhesive layer can be clearly separated. The printing applied to the protective film was visually recognized.
接著,藉由照射活性能量線(例如,紫外線、電子束等)使黏著劑層硬化,自該硬化後的黏著劑層,將半導體晶片連同貼附於半導體晶片的背面之保護膜一起剝離而拾取,藉此,獲得附有保護膜之半導體晶片。此時,由於硬化後的黏著劑層與保護膜之剝離力足夠小,故可穩定且容易地拾取附有保護膜之半導體晶片,且拾取時晶片產生裂痕或缺口之情況得到抑制。 Next, the adhesive layer is cured by irradiation with an active energy ray (for example, ultraviolet rays, electron beams, etc.), and the semiconductor wafer is peeled off together with the protective film attached to the back surface of the semiconductor wafer from the cured adhesive layer to be picked up. Thereby, a semiconductor wafer with a protective film is obtained. At this time, since the peeling force of the adhesive layer and the protective film after hardening is sufficiently small, the semiconductor wafer with the protective film can be picked up stably and easily, and cracking or chipping of the wafer at the time of picking up is suppressed.
例如,使用圖1所示之保護膜形成用複合片1時,於保護膜形成用複合片1的保護膜形成用膜13上貼附半導體晶圓的背面,並且將露出之黏著劑層12貼附至環框等切割用夾具(圖示省略)上,將保護膜形成用複合片1固定於切割裝置中。接著,使保護膜形成用膜13硬化而形成保護膜之後,進行切割,然後藉由照射活性能量線而使黏著劑層12的除了貼附至前述夾具之部位以外的區域硬化,拾取附有保護膜之半導體晶片即可。如此般,使用保護膜形成用複合片1時,需要進行調節使黏著劑層12的特定區域不硬化,以避免前述保護膜形成用複合片1自前述夾具剝離。另一方面,使用保護膜形成用複合片1時,無須另外設置用以將前述保護膜形成用複合片1貼附至前述夾具之構成。 For example, when the composite sheet 1 for forming a protective film shown in Fig. 1 is used, the back surface of the semiconductor wafer is attached to the film 13 for forming a protective film of the composite sheet 1 for forming a protective film, and the exposed adhesive layer 12 is attached. The composite sheet 1 for forming a protective film is attached to a cutting device by attaching it to a cutting jig (not shown) such as a ring frame. Then, after the protective film forming film 13 is cured to form a protective film, the film is cut, and then the active energy ray is irradiated to harden the region of the adhesive layer 12 other than the portion attached to the jig, and the pick-up is protected. The semiconductor wafer of the film can be used. When the composite sheet 1 for forming a protective film is used in this manner, it is necessary to adjust so that the specific region of the adhesive layer 12 is not cured, so that the composite sheet 1 for forming a protective film is prevented from being peeled off from the jig. On the other hand, when the composite sheet 1 for forming a protective film is used, it is not necessary to separately provide a structure for attaching the composite sheet 1 for forming a protective film to the jig.
另一方面,使用圖2所示之保護膜形成用複合片2時,於保護膜形成用複合片2的保護膜形成用膜23上貼附半導 體晶圓的背面,並且將夾具用接著劑層15貼附至環框等切割用夾具(圖示省略)上,將保護膜形成用複合片2固定於切割裝置中。接著,使保護膜形成用膜23硬化而形成保護膜之後,進行切割,藉由照射活性能量線而使黏著劑層12硬化,拾取附有保護膜之半導體晶片即可。如此般,使用保護膜形成用複合片2時,與使用保護膜形成用複合片1時不同,無須進行調節使黏著劑層23的特定區域不硬化。另一方面,與保護膜形成用複合片1不同,保護膜形成用複合片2必須具備夾具用接著劑層15。藉由具備夾具用接著劑層15,黏著劑層12可根據目的自廣泛的組成之層中選擇。 On the other hand, when the composite sheet 2 for forming a protective film shown in Fig. 2 is used, a semi-conductive film is attached to the film 23 for forming a protective film of the composite sheet 2 for forming a protective film. The back surface of the bulk wafer is attached to a cutting jig (not shown) such as a ring frame by the adhesive layer 15 for the jig, and the composite film 2 for forming a protective film is fixed to the cutting device. Then, after the protective film forming film 23 is cured to form a protective film, the film is cut, and the adhesive layer 12 is cured by irradiating the active energy ray to pick up the semiconductor wafer with the protective film. When the composite sheet 2 for forming a protective film is used in this manner, unlike the case of using the composite sheet 1 for forming a protective film, it is not necessary to adjust so that the specific region of the adhesive layer 23 is not cured. On the other hand, unlike the composite sheet 1 for forming a protective film, the composite sheet 2 for forming a protective film must have the adhesive layer 15 for a jig. By providing the adhesive layer 15 for a jig, the adhesive layer 12 can be selected from a wide range of layers depending on the purpose.
如上所述,本發明之保護膜形成用複合片係適合於使保護膜形成用膜硬化而形成保護膜後,進行黏著劑層的硬化之情形之片材,切割半導體晶圓及拾取半導體晶片時,保護膜形成用膜完全或大致完全硬化。另外,本發明之保護膜形成用複合片發揮以下效果:黏著劑層硬化前後,黏著劑層與保護膜之剝離力顯著變化。該效果係由於黏著劑層含有特定範圍的(甲基)丙烯酸烷基酯共聚物作為必需成分而引起。 As described above, the composite sheet for forming a protective film of the present invention is suitable for a sheet obtained by curing a film for forming a protective film to form a protective film, and then curing the adhesive layer, cutting the semiconductor wafer, and picking up the semiconductor wafer. The film for forming a protective film is completely or substantially completely cured. Further, the composite sheet for forming a protective film of the present invention exhibits an effect that the peeling force of the adhesive layer and the protective film remarkably changes before and after the adhesive layer is cured. This effect is caused by the fact that the adhesive layer contains a specific range of alkyl (meth) acrylate copolymer as an essential component.
相對於此,例如以上所說明之文獻「日本特開2011-228450號公報」(專利文獻1)中所記載之先前的保護膜形成用複合片,在拾取半導體晶片時,保護膜形成用膜停止於未硬化或部分硬化之狀態,將半導體晶片接合且以 密封材料進行固化之時,同時使該未硬化或部分硬化之保護膜形成用膜完全或大致完全硬化。亦即,使用該先前的保護膜形成用複合片時,於切割半導體晶圓及拾取半導體晶片之階段,貼附於這些晶圓及晶片的背面之膜(film)的特性,與本發明中的該膜完全不同。另外,該文獻中,關於適合於在切割之前進行保護膜形成用膜的硬化之情形之黏著劑層及保護膜形成用膜的組成未做任何揭示。 In the above-mentioned composite film for forming a protective film described in the above-mentioned Japanese Patent Publication No. 2011-228450 (Patent Document 1), when the semiconductor wafer is picked up, the film for forming a protective film is stopped. Bonding the semiconductor wafer in an unhardened or partially hardened state When the sealing material is cured, the unhardened or partially hardened film for forming a protective film is simultaneously completely or substantially completely cured. That is, when the conventional composite film for forming a protective film is used, the characteristics of a film attached to the back surface of the wafer and the wafer at the stage of cutting the semiconductor wafer and picking up the semiconductor wafer are the same as those in the present invention. The film is completely different. Further, in this document, the composition of the adhesive layer and the film for forming a protective film which are suitable for curing the film for forming a protective film before cutting is not disclosed.
本發明之保護膜形成用複合片的另一方面包含基材、黏著劑層、及保護膜形成用膜;前述黏著劑層積層於前述基材上,前述保護膜形成用膜積層於前述黏著劑層上;前述黏著劑層具有活性能量線硬化性,且在至少與前述保護膜形成用膜接觸之層中含有(甲基)丙烯酸烷基酯共聚物;前述(甲基)丙烯酸烷基酯共聚物係具有由構成烷基酯之烷基的碳數為8以上18以下之(甲基)丙烯酸烷基酯衍生之結構單元之共聚物;前述保護膜形成用膜具有熱硬化性;將前述保護膜形成用複合片切斷成25mm×150mm之大小後,於70℃貼附至矽晶圓上,接著,將前述保護膜形成用複合片以130℃加熱2小時,使前述保護膜形成用膜硬化而形成保護膜時,於剝離角度180°、測定溫度23℃、拉伸速度300mm/min之條件下,硬化前的前述黏著劑層與前述保護膜之剝離力(黏著劑層硬化前剝離力)為2000mN/25mm以上,較佳為2300mN/25mm以上、6300mN/25mm以下。 Another aspect of the composite sheet for forming a protective film of the present invention comprises a substrate, an adhesive layer, and a film for forming a protective film; the adhesive layer is laminated on the substrate, and the film for forming a protective film is laminated on the adhesive. The adhesive layer has active energy ray-curing property, and contains at least a (meth)acrylic acid alkyl ester copolymer in a layer in contact with the film for forming a protective film; the aforementioned (meth)acrylic acid alkyl ester copolymer The system has a copolymer of a structural unit derived from an alkyl (meth)acrylate having a carbon number of 8 or more and 18 or less, which constitutes an alkyl group of an alkyl ester; the film for forming a protective film has thermosetting property; The film-forming composite sheet was cut into a size of 25 mm × 150 mm, and then attached to a ruthenium wafer at 70 ° C. Then, the composite sheet for forming a protective film was heated at 130 ° C for 2 hours to form a film for forming a protective film. When the protective film is formed by curing, the peeling force of the adhesive layer before curing and the protective film at a peeling angle of 180°, a measurement temperature of 23° C., and a tensile speed of 300 mm/min (peeling force before curing of the adhesive layer) ) is 2000mN/2 5 mm or more, preferably 2300 mN/25 mm or more and 6300 mN/25 mm or less.
進而,關於前述保護膜形成用複合片,以照度 220mW/cm2、光量190mJ/cm2之條件,對前述保護膜形成用複合片照射紫外線而使前述黏著劑層硬化時,於剝離角度180°、測定溫度23℃、拉伸速度300mm/min之條件下,硬化後的前述黏著劑層與前述保護膜之剝離力(黏著劑層硬化後剝離力)為2000mN/25mm以下,較佳可為500mN/25mm以上、1500mN/25mm以下。 Furthermore, in the composite sheet for forming a protective film, when the composite sheet for forming a protective film is irradiated with ultraviolet rays under the conditions of an illuminance of 220 mW/cm 2 and a light amount of 190 mJ/cm 2 to cure the adhesive layer, the peeling angle is 180°. The peeling force of the adhesive layer after the curing and the protective film (the peeling force after the adhesive layer is cured) is 2000 mN/25 mm or less, preferably 500 mN, under the conditions of a temperature of 23 ° C and a tensile speed of 300 mm/min. /25mm or more, 1500mN/25mm or less.
本發明之保護膜形成用複合片的另一方面包含基材、黏著劑層、及保護膜形成用膜;前述黏著劑層積層於前述基材上,前述保護膜形成用膜積層於前述黏著劑層上;前述黏著劑層具有活性能量線硬化性,且至少與前述保護膜形成用膜接觸之層含有(甲基)丙烯酸烷基酯共聚物,該(甲基)丙烯酸烷基酯共聚物包含(甲基)丙烯酸烷基酯共聚物、異氰酸酯系交聯劑、光聚合起始劑、溶劑、及視需要之其他成分;前述(甲基)丙烯酸烷基酯共聚物係具有由構成烷基酯之烷基的碳數為8以上18以下之(甲基)丙烯酸烷基酯衍生之結構單元之共聚物,較佳為選自由丙烯酸-2-乙基己酯、甲基丙烯酸月桂酯及丙烯酸異硬脂基酯所組成之群組中的至少一者;由前述烷基的碳數為8以上之(甲基)丙烯酸烷基酯衍生之結構單元的含量相對於構成前述(甲基)丙烯酸烷基酯共聚物之全部結構單元的總質量,為30質量%以上100質量%以下,較佳為35質量%至85質量%以下,更佳為40質量%至80質量%以下;前述保護膜形成用膜具有熱硬化性,且包含聚合物成分(A)、熱硬化性成 分(B)、硬化促進劑(C)、及視需要選自由溶劑、填充材料(D)、偶合劑(E)、交聯劑(F)及通用的添加劑(G)所組成之群組中的至少一者;聚合物成分(A)較佳為選自由丙烯酸系樹脂、聚酯、聚胺甲酸酯、丙烯酸胺甲酸酯樹脂、聚矽氧樹脂、橡膠系聚合物、及苯氧基樹脂所組成之群組中的至少一者,更佳為丙烯酸系聚合物;熱硬化性成分(B)較佳為環氧樹脂(B11)及熱硬化劑(B12),更佳為選自由多官能系環氧樹脂、聯苯化合物、雙酚A二縮水甘油醚及其氫化物、鄰甲酚酚醛清漆環氧樹脂、二環戊二烯型環氧樹脂、聯苯型環氧樹脂、雙酚A型環氧樹脂、雙酚F型環氧樹脂、伸苯基骨架型環氧樹脂、及2官能以上的環氧化合物所組成之群組中的至少一者,及選自由鎓鹽、二元酸醯肼、二氰二胺、及硬化劑的胺加成物所組成之群組中的至少一者,進而更佳為選自由雙酚A型環氧樹脂及二環戊二烯型環氧樹脂所組成之群組中的至少一者,及二氰二胺;硬化促進劑(C)較佳為2-苯基-4,5-二羥甲基咪唑;將前述保護膜形成用複合片切斷成25mm×150mm之大小後,於70℃貼附至矽晶圓上,接著,將前述保護膜形成用複合片以130℃加熱2小時,使前述保護膜形成用膜硬化而形成保護膜時,於剝離角度180°、測定溫度23℃、拉伸速度300mm/min之條件下,硬化前的前述黏著劑層與前述保護膜之剝離力(黏著劑層硬化前剝離力)為2000mN/25mm以上,較佳為2300mN/25mm以上、6300mN/25mm以下。 Another aspect of the composite sheet for forming a protective film of the present invention comprises a substrate, an adhesive layer, and a film for forming a protective film; the adhesive layer is laminated on the substrate, and the film for forming a protective film is laminated on the adhesive. The layer of the adhesive layer has active energy ray-curing property, and at least the layer in contact with the film for forming a protective film contains an alkyl (meth) acrylate copolymer, and the alkyl (meth) acrylate copolymer contains a (meth)acrylic acid alkyl ester copolymer, an isocyanate crosslinking agent, a photopolymerization initiator, a solvent, and other components as needed; the aforementioned (meth)acrylic acid alkyl ester copolymer has a constituent alkyl ester a copolymer of a structural unit derived from an alkyl (meth)acrylate having a carbon number of 8 or more and 18 or less, preferably selected from the group consisting of 2-ethylhexyl acrylate, lauryl methacrylate, and acrylic acid. At least one of the group consisting of stearyl esters; the content of the structural unit derived from the alkyl (meth) acrylate having a carbon number of 8 or more of the alkyl group described above relative to the constituting the aforementioned (meth) acrylate The entire structure of the base copolymer The total mass of the film is 30% by mass or more and 100% by mass or less, preferably 35% by mass to 85% by mass or less, more preferably 40% by mass to 80% by mass or less, and the film for forming a protective film has thermosetting property. And contains polymer component (A), thermosetting a component (B), a hardening accelerator (C), and optionally selected from the group consisting of a solvent, a filler (D), a coupling agent (E), a crosslinking agent (F), and a general additive (G). At least one of the polymer components (A) is preferably selected from the group consisting of acrylic resins, polyesters, polyurethanes, urethane acrylate resins, polyoxyxylene resins, rubber-based polymers, and phenoxy groups. At least one of the group consisting of resins is more preferably an acrylic polymer; the thermosetting component (B) is preferably an epoxy resin (B11) and a heat hardener (B12), more preferably selected from the group consisting of Functional epoxy resin, biphenyl compound, bisphenol A diglycidyl ether and its hydride, o-cresol novolac epoxy resin, dicyclopentadiene epoxy resin, biphenyl epoxy resin, bisphenol At least one selected from the group consisting of a type A epoxy resin, a bisphenol F type epoxy resin, a phenylene skeleton type epoxy resin, and a bifunctional or higher epoxy compound, and is selected from the group consisting of strontium salts and binary At least one of the group consisting of acid oxime, dicyandiamide, and an amine adduct of a hardener, and more preferably selected from the group consisting of bisphenol A type epoxy trees And at least one of the group consisting of dicyclopentadiene type epoxy resins, and dicyandiamide; the hardening accelerator (C) is preferably 2-phenyl-4,5-dihydroxymethylimidazole After the composite sheet for forming a protective film was cut into a size of 25 mm × 150 mm, it was attached to a ruthenium wafer at 70 ° C, and then the composite sheet for forming a protective film was heated at 130 ° C for 2 hours to protect the above. When the film for film formation is cured to form a protective film, the peeling force of the adhesive layer before the curing and the protective film (adhesive layer) at a peeling angle of 180°, a measurement temperature of 23° C., and a tensile speed of 300 mm/min The peeling force before hardening is 2000 mN/25 mm or more, preferably 2300 mN/25 mm or more and 6300 mN/25 mm or less.
進而,關於前述保護膜形成用複合片,以照度 220mW/cm2、光量190mJ/cm2之條件,對前述保護膜形成用複合片照射紫外線而使前述黏著劑層硬化時,於剝離角度180°、測定溫度23℃、拉伸速度300mm/min之條件下,硬化後的前述黏著劑層與前述保護膜之剝離力(黏著劑層硬化後剝離力)為2000mN/25mm以下,較佳可為500mN/25mm以上、1500mN/25mm以下。 Furthermore, in the composite sheet for forming a protective film, when the composite sheet for forming a protective film is irradiated with ultraviolet rays under the conditions of an illuminance of 220 mW/cm 2 and a light amount of 190 mJ/cm 2 to cure the adhesive layer, the peeling angle is 180°. The peeling force of the adhesive layer after the curing and the protective film (the peeling force after the adhesive layer is cured) is 2000 mN/25 mm or less, preferably 500 mN, under the conditions of a temperature of 23 ° C and a tensile speed of 300 mm/min. /25mm or more, 1500mN/25mm or less.
本發明的另一方面係一種如前述保護膜形成用複合片之用途,用於製造附有保護膜之半導體晶片;前述保護膜形成用複合片包含基材、黏著劑層、及保護膜形成用膜;前述黏著劑層積層於前述基材上,前述保護膜形成用膜積層於前述黏著劑層上;前述黏著劑層具有活性能量線硬化性,且在至少與前述保護膜形成用膜接觸之層中含有(甲基)丙烯酸烷基酯共聚物;前述(甲基)丙烯酸烷基酯共聚物係具有由構成烷基酯之烷基的碳數為8以上18以下之(甲基)丙烯酸烷基酯衍生之結構單元之共聚物;前述保護膜形成用膜具有熱硬化性;將前述保護膜形成用複合片切斷成25mm×150mm之大小後,於70℃貼附至矽晶圓上,接著,將前述保護膜形成用複合片以130℃加熱2小時,使前述保護膜形成用膜硬化而形成保護膜時,於剝離角度180°、測定溫度23℃、拉伸速度300mm/min之條件下,硬化前的前述黏著劑層與前述保護膜之剝離力(黏著劑層硬化前剝離力)為2000mN/25mm以上,較佳為2300mN/25mm以上、6300mN/25mm以下。 Another aspect of the present invention is the use of the composite sheet for forming a protective film for producing a semiconductor wafer with a protective film; the composite sheet for forming a protective film comprising a substrate, an adhesive layer, and a protective film. a film; the adhesive layer is laminated on the substrate; the protective film forming film is laminated on the adhesive layer; and the adhesive layer has active energy ray curability and is in contact with at least the protective film forming film. The layer contains an alkyl (meth)acrylate copolymer; the alkyl (meth)acrylate copolymer has an alkyl (meth)acrylate having a carbon number of 8 or more and 18 or less from an alkyl group constituting the alkyl ester. a copolymer of a structural unit derived from a base; the film for forming a protective film has thermosetting property; and the composite sheet for forming a protective film is cut into a size of 25 mm × 150 mm, and then attached to a silicon wafer at 70 ° C, Then, the composite sheet for forming a protective film was heated at 130 ° C for 2 hours, and when the film for forming a protective film was cured to form a protective film, the peeling angle was 180°, the measurement temperature was 23° C., and the stretching speed was 300 mm/min. , The adhesive force of the peeling layer and the protective film prior to curing (hardening adhesive agent layer before the peeling force) of 2000mN / 25mm or more, preferably 2300mN / 25mm or more, 6300mN / 25mm or less.
進而,關於前述保護膜形成用複合片,以照度220mW/cm2、光量190mJ/cm2之條件,對前述保護膜形成用複合片照射紫外線而使前述黏著劑層硬化時,於剝離角度180°、測定溫度23℃、拉伸速度300mm/min之條件下,硬化後的前述黏著劑層與前述保護膜之剝離力(黏著劑層硬化後剝離力)為2000mN/25mm以下,較佳可為500mN/25mm以上、1500mN/25mm以下。 Furthermore, in the composite sheet for forming a protective film, when the composite sheet for forming a protective film is irradiated with ultraviolet rays under the conditions of an illuminance of 220 mW/cm 2 and a light amount of 190 mJ/cm 2 to cure the adhesive layer, the peeling angle is 180°. The peeling force of the adhesive layer after the curing and the protective film (the peeling force after the adhesive layer is cured) is 2000 mN/25 mm or less, preferably 500 mN, under the conditions of a temperature of 23 ° C and a tensile speed of 300 mm/min. /25mm or more, 1500mN/25mm or less.
一種附有保護膜之半導體晶片之製造方法,前述製造方法包含下述步驟:藉由保護膜形成用膜將保護膜形成用複合片貼附於半導體晶圓的背面;藉由加熱使前述貼附之保護膜形成用複合片中的前述保護膜形成用膜硬化而形成保護膜;切割形成有前述保護膜之半導體晶圓而形成半導體晶片;及藉由照射活性能量線而使前述保護膜形成用複合片中的黏著劑層硬化,然後將前述半導體晶片連同貼附於前述半導體晶片的背面之前述保護膜一起拾取;並且,且前述保護膜形成用複合片包含基材、前述黏著劑層、及前述保護膜形成用膜,前述黏著劑層積層於前述基材上,前述保護膜形成用膜積層於前述黏著劑層上;前述黏著劑層具有活性能量線硬化性,且在至少與前述保護膜形成用膜接觸之層中含有(甲基)丙烯酸烷基酯共聚物;前述(甲基)丙烯酸烷基酯共聚物係具有由構成烷基酯之烷基的碳數為8以上18以下之(甲基)丙烯酸烷基酯衍生之結構單元之共聚物;前述保護膜形成用膜具有熱硬化性。 A method of manufacturing a semiconductor wafer with a protective film, comprising the steps of: attaching a protective film forming composite sheet to a back surface of a semiconductor wafer by a film for forming a protective film; and attaching the foregoing by heating The protective film forming film in the composite sheet for forming a protective film is cured to form a protective film; the semiconductor wafer on which the protective film is formed is cut to form a semiconductor wafer; and the protective film is formed by irradiating an active energy ray. The adhesive layer in the composite sheet is hardened, and then the semiconductor wafer is picked up together with the protective film attached to the back surface of the semiconductor wafer; and the composite sheet for forming a protective film comprises a substrate, the adhesive layer, and In the film for forming a protective film, the adhesive layer is laminated on the substrate, the film for forming a protective film is laminated on the adhesive layer, and the adhesive layer has active energy ray curability and at least the protective film. The layer formed in contact with the film contains an alkyl (meth)acrylate copolymer; the aforementioned alkyl (meth)acrylate copolymer A copolymer having a structural unit derived from an alkyl (meth)acrylate having an alkyl group of an alkyl ester of 8 or more and 18 or less; and the film for forming a protective film has thermosetting property.
[實施例] [Examples]
以下,藉由具體的實施例更詳細地說明本發明。但是,本發明並不受以下所示之實施例的任何限定。 Hereinafter, the present invention will be described in more detail by way of specific examples. However, the present invention is not limited by the examples shown below.
[實施例1] [Example 1]
<保護膜形成用複合片之製造> <Manufacture of composite sheet for forming a protective film>
製造圖1所示之構成之保護膜形成用複合片。更具體而言,如以下所述。 A composite sheet for forming a protective film having the structure shown in Fig. 1 was produced. More specifically, it is as follows.
[支持片之製造(黏著劑層之形成)] [Production of support sheet (formation of adhesive layer)]
於作為基材之聚丙烯膜(厚度80μm,三菱樹脂公司製造)的一表面上塗佈黏著劑組成物且乾燥,形成紫外線硬化型的黏著劑層(厚度10μm),獲得支持片。前述黏著劑組成物為下述組成物:含有(甲基)丙烯酸烷基酯共聚物100質量份(固形物成分)、3官能苯二甲基二異氰酸酯系交聯劑(Mitsui Takeda Chemicals,Inc.製造之「Takenate D110N」)6.6質量份(固形物成分)、及光聚合起始劑(BASF公司製造之「Irgacure 127」)3.0質量份(固形物成分),且使用甲基乙基酮、甲苯及乙酸乙酯之混合溶劑將固形物成分濃度調節為30質量%之組成物。另外,前述(甲基)丙烯酸烷基酯共聚物為藉由下述方式獲得之重量平均分子量1100000之紫外線硬化型丙烯酸系共聚物:使將丙烯酸-2-乙基己酯(以下,有時簡稱為「2EHA」)80質量份、丙烯酸-2-羥 乙酯(以下,有時簡稱為「HEA」)20質量份共聚合而獲得之預共聚物,進一步與2-甲基丙烯醯氧基乙基異氰酸酯(甲基丙烯酸-2-異氰氧基乙酯,以下,有時簡稱為「MOI」)21.4質量份(2-甲基丙烯醯氧基乙基異氰酸酯中的異氰酸酯基的總莫耳數為HEA中的羥基的總莫耳數之0.8倍之量)進行反應。製造(甲基)丙烯酸烷基酯共聚物時之單體成分的調配量示於表1。再者,表1中,單體成分一欄中記載為「-」,表示未調配該單體成分。 The adhesive composition was applied onto one surface of a polypropylene film (thickness: 80 μm, manufactured by Mitsubishi Plastics Co., Ltd.) as a substrate and dried to form an ultraviolet curable adhesive layer (thickness: 10 μm) to obtain a support sheet. The above-mentioned adhesive composition is a composition containing 100 parts by mass of a (meth)acrylic acid alkyl ester copolymer (solid content) and a trifunctional phthalic diisocyanate crosslinking agent (Mitsui Takeda Chemicals, Inc.). Manufactured "Takenate D110N") 6.6 parts by mass (solid content) and photopolymerization initiator ("Irgacure 127" manufactured by BASF Corporation) 3.0 parts by mass (solid content), and methyl ethyl ketone, toluene was used. A mixed solvent of ethyl acetate and a composition in which the solid content concentration was adjusted to 30% by mass. Further, the alkyl (meth) acrylate copolymer is an ultraviolet curable acrylic copolymer having a weight average molecular weight of 1,100,000 obtained by the following method: 2-ethylhexyl acrylate (hereinafter sometimes referred to as a short name) "2EHA") 80 parts by mass, acrylic acid-2-hydroxy Ethyl ester (hereinafter sometimes abbreviated as "HEA") 20 parts by mass of a prepolymer obtained by copolymerization, further with 2-methylpropenyloxyethyl isocyanate (-2-isocyanatoethyl methacrylate) 21.4 parts by mass of the ester (hereinafter, abbreviated as "MOI") (the total number of moles of the isocyanate group in the 2-methacryloxyethyl isocyanate is 0.8 times the total number of moles of the hydroxyl group in the HEA. The amount is carried out. The amount of the monomer component when the (meth)acrylic acid alkyl ester copolymer was produced is shown in Table 1. In addition, in Table 1, the column of a monomer component is described as "-", and it shows that this monomer component was not mix|blended.
[保護膜形成用複合片之製造(保護膜形成用膜之形成)] [Manufacture of Composite Sheet for Forming Protective Film (Formation of Film for Forming Protective Film)]
於將聚對苯二甲酸乙二酯製膜的單面藉由聚矽氧處理而進行剝離處理後之剝離膜(Lintec Corporation製造之「SP-PET381031」,厚度38μm)的前述剝離處理面塗佈保護膜形成用組成物且乾燥,形成保護膜形成用膜(厚度25μm)。前述保護膜形成用組成物為下述組成物:以表2所示之量(固形物成分)調配下述各成分,且使用甲基乙基酮、甲苯及乙酸乙酯之混合溶劑將固形物成分濃度調節為55質量%之組成物。 The release treatment surface coating of a release film ("SP-PET381031" manufactured by Lintec Corporation, thickness: 38 μm) which was subjected to a release treatment by polyfluorination treatment on one side of a polyethylene terephthalate film was coated. The composition for forming a protective film was dried and formed into a film for forming a protective film (thickness: 25 μm). The protective film-forming composition is a composition obtained by mixing the following components in an amount (solid content) shown in Table 2, and using a mixed solvent of methyl ethyl ketone, toluene, and ethyl acetate to form a solid matter. The composition whose concentration of the component was adjusted to 55% by mass.
接著,將該保護膜形成用膜貼合至上述中所獲得之支持片的黏著劑層的表面上,藉此獲得保護膜形成用複合片,該保護膜形成用複合片於保護膜形成用膜的與設置黏著劑層之側為相反側之表面具備前述剝離膜。 Then, the film for forming a protective film is bonded to the surface of the adhesive layer of the support sheet obtained above to obtain a composite sheet for forming a protective film, and the composite sheet for forming a protective film is formed into a film for forming a protective film. The surface opposite to the side on which the adhesive layer is provided is provided with the above-mentioned release film.
(聚合物成分(A)) (polymer component (A))
(A)-1:使丙烯酸甲酯85質量份、及丙烯酸-2-羥乙酯15質量份進行共聚合而成之丙烯酸系聚合物(重量平均分子量370000,玻璃轉移溫度6℃) (A)-1: an acrylic polymer obtained by copolymerizing 85 parts by mass of methyl acrylate and 15 parts by mass of 2-hydroxyethyl acrylate (weight average molecular weight: 370,000, glass transition temperature: 6 ° C)
(熱硬化性成分(B)) (thermosetting component (B))
‧環氧樹脂(B11) ‧Epoxy resin (B11)
(B11)-1:雙酚A型環氧樹脂(三菱化學公司製造之「jER828」,環氧當量184g/eq至194g/eq) (B11)-1: Bisphenol A type epoxy resin ("jER828" manufactured by Mitsubishi Chemical Corporation, epoxy equivalent 184g/eq to 194g/eq)
(B11)-2:雙酚A型環氧樹脂(三菱化學公司製造之「jER1055」,環氧當量800g/eq至900g/eq) (B11)-2: Bisphenol A type epoxy resin ("jER1055" manufactured by Mitsubishi Chemical Corporation, epoxy equivalent 800g/eq to 900g/eq)
(B11)-3:二環戊二烯型環氧樹脂(DIC公司製造之「Epiclon HP-7200HH」,環氧當量255g/eq至260g/eq) (B11)-3: Dicyclopentadiene type epoxy resin ("Epiclon HP-7200HH" manufactured by DIC Corporation, epoxy equivalent 255g/eq to 260g/eq)
‧熱硬化劑(B12) ‧Hot hardener (B12)
(B12)-1:二氰二胺(固體分散型潛伏性硬化劑,ADEKA公司製造之「Adeka Hardener EH-3636AS」,活性氫量21g/eq) (B12)-1: dicyandiamide (solid dispersion type latent curing agent, "Adeka Hardener EH-3636AS" manufactured by ADEKA Corporation, active hydrogen amount 21 g/eq)
(硬化促進劑(C)) (hardening accelerator (C))
(C)-1:2-苯基-4,5-二羥甲基咪唑(四國化成工業公司製造之「Curezol 2PHZ」) (C)-1: 2-phenyl-4,5-dihydroxymethylimidazole ("Curezol 2PHZ" manufactured by Shikoku Kasei Kogyo Co., Ltd.)
(填充材料(D)) (filling material (D))
(D)-1:二氧化矽填料(Admatechs公司之「SC2050MA」,平均粒徑0.5μm) (D)-1: cerium oxide filler ("SC2050MA" of Admatechs, average particle size 0.5 μm)
(偶合劑(E)) (coupler (E))
(E)-1:矽烷偶合劑(日本Uny公司製造之「A-1110」) (E)-1: decane coupling agent ("A-1110" manufactured by Uny Corporation of Japan)
(通用的添加劑(G)) (General additive (G))
(G)-1:碳黑(著色劑,三菱化學公司製造之「#MA650」,平均粒徑28nm) (G)-1: carbon black (colorant, "#MA650" manufactured by Mitsubishi Chemical Corporation, average particle size 28 nm)
<保護膜形成用複合片之評價> <Evaluation of composite sheet for forming a protective film>
[切割時之晶片飛濺之抑制] [Suppression of wafer spatter during cutting]
自上述中所獲得之保護膜形成用複合片去除剝離膜後,將露出之保護膜形成用膜於70℃貼附至矽晶圓(直徑6吋、厚度100μm)的乾式拋光研磨面,並且將露出之黏著劑層貼附至環框,靜置30分鐘。 After removing the release film from the composite sheet for forming a protective film obtained as described above, the exposed film for forming a protective film is attached to a dry polishing surface of a silicon wafer (diameter: 6 Å, thickness: 100 μm) at 70 ° C, and The exposed adhesive layer was attached to the ring frame and allowed to stand for 30 minutes.
接著,將保護膜形成用複合片以130℃加熱2小時,使保護膜形成用膜硬化而形成保護膜。 Then, the composite sheet for forming a protective film was heated at 130 ° C for 2 hours to cure the film for forming a protective film to form a protective film.
接著,使用切割裝置,將矽晶圓切割成5mm×5mm之大小,獲得晶片。此時,目視確認是否有晶片飛濺,將無1個晶片飛濺之情形評價為「A」,有1個以上晶片飛濺之情形評價為「B」。結果示於表3。 Next, using a dicing apparatus, the ruthenium wafer was cut into a size of 5 mm × 5 mm to obtain a wafer. At this time, it was visually confirmed whether or not the wafer was splashed, and the case where no wafer was splashed was evaluated as "A", and the case where one or more wafers were splashed was evaluated as "B". The results are shown in Table 3.
[拾取性] [pickup]
自上述中所獲得之保護膜形成用複合片去除剝離膜後,將所露出之保護膜形成用膜於70℃貼附至矽晶圓(直徑6吋、厚度100μm)的乾式拋光研磨面,並且將露出之黏著劑層貼附至環框,靜置30分鐘。 After removing the release film from the composite sheet for forming a protective film obtained as described above, the exposed film for forming a protective film was attached to a dry polishing surface of a tantalum wafer (diameter: 6 Å, thickness: 100 μm) at 70 ° C, and The exposed adhesive layer was attached to the ring frame and allowed to stand for 30 minutes.
接著,將保護膜形成用複合片以130℃加熱2小時,使保護膜形成用膜硬化而形成保護膜。 Then, the composite sheet for forming a protective film was heated at 130 ° C for 2 hours to cure the film for forming a protective film to form a protective film.
接著,使用切割裝置,將矽晶圓切割成5mm×5mm之大小,獲得晶片。然後,使用紫外線照射裝置(Lintec Corporation製造之「RAD2000m/8」),以照度220mW/cm2、光量190mJ/cm2之條件,以高壓水銀燈作為光源自基材側對保護膜形成用複合片照射紫外線而使黏著劑層硬化。 Next, using a dicing apparatus, the ruthenium wafer was cut into a size of 5 mm × 5 mm to obtain a wafer. Then, using an ultraviolet irradiation apparatus (manufactured by the Lintec Corporation "RAD2000m / 8"), at / cm illumination conditions 220mW / cm 2, light quantity of 190mJ 2 with a high pressure mercury lamp using the composite sheet is irradiated on the protective film is formed as from the substrate side of the light source Ultraviolet rays harden the adhesive layer.
接著,使用黏晶機(Canon Machinery Inc.製造之「BESTEM-D02」)拾取20個晶片,將無1個晶片產生裂痕或缺口之情形評價為「A」,將有1個以上晶片產生裂痕或缺口之情形評價為「B」。結果示於表3。 Next, 20 wafers were picked up using a die bonder ("BESTEM-D02" manufactured by Canon Machinery Inc.), and the case where no wafer was cracked or notched was evaluated as "A", and more than one wafer was cracked or The case of the gap was evaluated as "B". The results are shown in Table 3.
[硬化前的黏著劑層與保護膜之剝離力] [Removal force of adhesive layer and protective film before hardening]
將上述中所獲得之保護膜形成用複合片切斷成25mm×150mm之大小後,去除剝離膜,使用貼合機(Fuji公司製造之「LAMIPACKER LPD3214」),將所露出之保護膜形成用膜於70℃貼附至矽晶圓(直徑6吋、厚度500μm)的乾式拋光研磨面。 After the composite sheet for forming a protective film obtained in the above-mentioned manner was cut into a size of 25 mm × 150 mm, the release film was removed, and the exposed film for forming a protective film was formed using a laminator ("LAMIPACKER LPD3214" manufactured by Fuji Co., Ltd.). It is attached to a dry polished surface of a silicon wafer (6 直径 in diameter and 500 μm in thickness) at 70 °C.
接著,將保護膜形成用複合片以130℃加熱2小時,使保護膜形成用膜硬化而形成保護膜,製作試片(1)。 Then, the composite sheet for forming a protective film was heated at 130 ° C for 2 hours to cure the film for forming a protective film to form a protective film, thereby preparing a test piece (1).
對該試片(1),使用精密萬能試驗機(島津製作所製造之「Autograph AG-IS),以剝離角度180°、測定溫度23℃、拉伸速度300mm/min之條件進行拉伸試驗,即將支持片(硬化前的黏著劑層與基材之積層體)自保護膜剝離,且測定此時之荷重,作為硬化前的黏著劑層與保護膜之剝離力(硬化前黏著劑層剝離力)。再者,作為前述荷重之測定值 ,係採用將支持片剝離長度100mm時的測定值中,將最初剝離長度10mm時、及最後剝離長度10mm時的各測定值自有效值中除外之值。 The test piece (1) was subjected to a tensile test using a precision universal testing machine ("Autograph AG-IS" manufactured by Shimadzu Corporation) at a peeling angle of 180°, a measuring temperature of 23° C., and a tensile speed of 300 mm/min. The support sheet (the layer of the adhesive layer before curing and the substrate) is peeled off from the protective film, and the load at this time is measured, and the peeling force of the adhesive layer and the protective film before curing (adhesive layer peeling force before curing) Furthermore, as the measured value of the aforementioned load In the measured values when the support sheet was peeled by 100 mm, the measured values excluding the effective values were excluded from the initial peeling length of 10 mm and the final peeling length of 10 mm.
結果示於表3。表3中的「剝離力(mN/25mm)」一欄中的「黏著劑層硬化前」之數值即為對應的結果。 The results are shown in Table 3. The value of "Before the adhesive layer is hardened" in the column of "peeling force (mN/25mm)" in Table 3 is the corresponding result.
[硬化後的黏著劑層與保護膜之剝離力] [Removal force of adhesive layer and protective film after hardening]
製作與上述相同之試片(1)。 A test piece (1) identical to the above was produced.
接著,使用紫外線照射裝置(Lintec Corporation製造之「RAD2000m/8」),以照度220mW/cm2、光量190mJ/cm2之條件,以高壓水銀燈作為光源自基材側對保護膜形成用複合片照射紫外線使黏著劑層硬化,製作試片(2)。 Next, an ultraviolet irradiation device (manufactured by the Lintec Corporation "RAD2000m / 8"), at / cm illumination conditions 220mW / cm 2, light quantity of 190mJ 2 with a high pressure mercury lamp using the composite sheet is irradiated on the protective film is formed as from the substrate side of the light source Ultraviolet rays harden the adhesive layer to prepare a test piece (2).
對該試片(2),以與上述試片(1)相同之方法進行拉伸試驗,即將支持片(硬化後的黏著劑層與基材之積層體)自保護膜剝離,作為硬化後的黏著劑層與保護膜之剝離力(硬化後黏著劑層剝離力)。結果示於表3。表3中的「剝離力(mN/25mm)」一欄中的「黏著劑層硬化後」之數值即為對應的結果。 The test piece (2) was subjected to a tensile test in the same manner as in the above test piece (1), that is, the support sheet (the layered body of the adhesive layer after curing and the substrate) was peeled off from the protective film as a cured film. The peeling force of the adhesive layer and the protective film (adhesive layer peeling force after hardening). The results are shown in Table 3. The value of "after the adhesive layer is hardened" in the column of "peeling force (mN/25mm)" in Table 3 is the corresponding result.
<保護膜形成用複合片之製造及評價> <Manufacture and Evaluation of Composite Sheet for Forming Protective Film>
[實施例2] [Embodiment 2]
形成黏著劑層時,使用重量平均分子量500000之紫外線硬化型丙烯酸系共聚物代替上述的重量平均分子量1100000者作為(甲基)丙烯酸烷基酯共聚物,除此之外,以 與實施例1相同之方法製造及評價保護膜形成用複合片,其中,該重量平均分子量500000之紫外線硬化型丙烯酸系共聚物係以如下方式獲得:如表1所示,使將2EHA 40質量份、乙酸乙烯酯(以下,有時簡稱為「VAc」)40質量份、及HEA 20質量份共聚合而獲得之預共聚物,進一步與MOI 21.4質量份(MOI中的異氰酸酯基的總莫耳數為HEA中的羥基的總莫耳數之0.8倍之量)進行反應。結果示於表3。 When the adhesive layer is formed, an ultraviolet curable acrylic copolymer having a weight average molecular weight of 500,000 is used instead of the above-mentioned weight average molecular weight of 1,100,000 as an alkyl (meth)acrylate copolymer, and A composite sheet for forming a protective film was produced and evaluated in the same manner as in Example 1, wherein the ultraviolet curable acrylic copolymer having a weight average molecular weight of 500,000 was obtained in the following manner: as shown in Table 1, 40 parts by mass of 2EHA was used. 40 parts by mass of vinyl acetate (hereinafter sometimes abbreviated as "VAc"), and a prepolymer obtained by copolymerization of 20 parts by mass of HEA, further 21.4 parts by mass with MOI (total molar number of isocyanate groups in MOI) The reaction was carried out in an amount of 0.8 times the total number of moles of the hydroxyl group in the HEA. The results are shown in Table 3.
[實施例3] [Example 3]
形成黏著劑層時,使用重量平均分子量600000之紫外線硬化型丙烯酸系共聚物代替上述的重量平均分子量1100000者作為(甲基)丙烯酸烷基酯共聚物,除此之外,以與實施例1相同之方法製造及評價保護膜形成用複合片,其中,該重量平均分子量600000之紫外線硬化型丙烯酸系共聚物係以如下方式獲得:如表1所示,使將甲基丙烯酸月桂酯(以下,有時簡稱為「LMA」)80質量份、及HEA 20質量份共聚合而獲得之預共聚物,進一步與MOI 21.4質量份(MOI中的異氰酸酯基的總莫耳數為HEA中的羥基的總莫耳數之0.8倍之量)進行反應。結果示於表3。 When the adhesive layer is formed, the ultraviolet curable acrylic copolymer having a weight average molecular weight of 600,000 is used in place of the above-mentioned weight average molecular weight of 1,100,000 as the alkyl (meth)acrylate copolymer, and otherwise the same as in the first embodiment. In the method of producing and evaluating a composite sheet for forming a protective film, the ultraviolet curable acrylic copolymer having a weight average molecular weight of 600,000 is obtained as follows: as shown in Table 1, a lauryl methacrylate is used (hereinafter, For example, "LMA" is 80 parts by mass, and 20 parts by mass of HEA is copolymerized to obtain a pre-copolymer, further 21.4 parts by mass with MOI (the total number of moles of isocyanate groups in MOI is the total number of hydroxyl groups in HEA) The reaction was carried out in an amount of 0.8 times the number of ears. The results are shown in Table 3.
[實施例4] [Example 4]
形成黏著劑層時,使用重量平均分子量600000之紫外線硬化型丙烯酸系共聚物代替上述的重量平均分子量1100000者作為(甲基)丙烯酸烷基酯共聚物,除此之外,以 與實施例1相同之方法製造及評價保護膜形成用複合片,其中,該重量平均分子量600000之紫外線硬化型丙烯酸系共聚物係以如下方式獲得:如表1所示,使將丙烯酸異硬脂基酯(以下,有時簡稱為「ISTA」)80質量份、及HEA 20質量份共聚合而獲得之預共聚物,進一步與MOI 21.4質量份(MOI中的異氰酸酯基的總莫耳數為HEA中的羥基的總莫耳數之0.8倍之量)進行反應。結果示於表3。 When the adhesive layer is formed, an ultraviolet curable acrylic copolymer having a weight average molecular weight of 600,000 is used instead of the above-mentioned weight average molecular weight of 1,100,000 as the alkyl (meth)acrylate copolymer, and A composite sheet for forming a protective film was produced and evaluated in the same manner as in Example 1, wherein the ultraviolet curable acrylic copolymer having a weight average molecular weight of 600,000 was obtained in the following manner: as shown in Table 1, an isostearyl acrylate was used. 80 parts by mass of a base ester (hereinafter sometimes abbreviated as "ISTA") and a prepolymer obtained by copolymerization of 20 parts by mass of HEA, further 21.4 parts by mass with MOI (the total number of moles of isocyanate groups in MOI is HEA) The reaction is carried out in an amount of 0.8 times the total number of moles of the hydroxyl group in the medium. The results are shown in Table 3.
[比較例1] [Comparative Example 1]
形成黏著劑層時,使用重量平均分子量600000之紫外線硬化型丙烯酸系共聚物代替上述的重量平均分子量1100000者作為(甲基)丙烯酸烷基酯共聚物,除此之外,以與實施例1相同之方法製造及評價保護膜形成用複合片,其中,該重量平均分子量600000之紫外線硬化型丙烯酸系共聚物係以如下方式獲得:如表1所示,使將丙烯酸丁酯(以下,有時簡稱為「BA」)40質量份、VAc 40質量份、及HEA 20質量份共聚合而獲得之預共聚物,進一步與MOI 21.4質量份(MOI中的異氰酸酯基的總莫耳數為HEA中的羥基的總莫耳數之0.8倍之量)進行反應。結果示於表3。 When the adhesive layer is formed, the ultraviolet curable acrylic copolymer having a weight average molecular weight of 600,000 is used in place of the above-mentioned weight average molecular weight of 1,100,000 as the alkyl (meth)acrylate copolymer, and otherwise the same as in the first embodiment. In the method of producing and evaluating a composite sheet for forming a protective film, the ultraviolet curable acrylic copolymer having a weight average molecular weight of 600,000 is obtained as follows: as shown in Table 1, butyl acrylate (hereinafter sometimes referred to as a short name) is used. 40 parts by mass of "BA"), 40 parts by mass of VAc, and 20 parts by mass of HEA, and further obtained with 21.4 parts by mass of MOI (the total number of moles of isocyanate groups in MOI is hydroxyl group in HEA) The reaction was carried out in an amount of 0.8 times the total molar amount. The results are shown in Table 3.
[比較例2] [Comparative Example 2]
形成黏著劑層時,使用重量平均分子量600000之紫外線硬化型丙烯酸系共聚物代替上述的重量平均分子量1100000者作為(甲基)丙烯酸烷基酯共聚物,除此之外,以 與實施例1相同之方法製造及評價保護膜形成用複合片,其中,該重量平均分子量600000之紫外線硬化型丙烯酸系共聚物係以如下方式獲得:如表1所示,使將BA 40質量份、甲基丙烯酸甲酯(以下,有時簡稱為「MMA」)40質量份、及HEA 20質量份共聚合而獲得之預共聚物,進一步與MOI 21.4質量份(MOI中的異氰酸酯基的總莫耳數為HEA中的羥基的總莫耳數之0.8倍之量)進行反應。結果示於表3。 When the adhesive layer is formed, an ultraviolet curable acrylic copolymer having a weight average molecular weight of 600,000 is used instead of the above-mentioned weight average molecular weight of 1,100,000 as the alkyl (meth)acrylate copolymer, and A composite sheet for forming a protective film was produced and evaluated in the same manner as in Example 1, wherein the ultraviolet curable acrylic copolymer having a weight average molecular weight of 600,000 was obtained in the following manner: as shown in Table 1, 40 parts by mass of BA was used. 40 parts by mass of methyl methacrylate (hereinafter sometimes abbreviated as "MMA"), and a prepolymer obtained by copolymerization of 20 parts by mass of HEA, further 21.4 parts by mass with MOI (the total amount of isocyanate groups in MOI) The reaction was carried out in an amount in which the number of ears was 0.8 times the total number of moles of the hydroxyl group in the HEA. The results are shown in Table 3.
[表2]
使用實施例1至實施例4的保護膜形成用複合片時,該片材中,(甲基)丙烯酸烷基酯共聚物具有由構成烷基酯之烷基的碳數為8以上之(甲基)丙烯酸烷基酯衍生之結構單元,藉此,硬化前的黏著劑層與保護膜之剝離力足夠大,可穩定地進行切割,並且硬化後的黏著劑層與保護膜之剝 離力足夠小,而可穩定地拾取半導體晶片。 When the composite sheet for forming a protective film of Examples 1 to 4 is used, in the sheet, the alkyl (meth)acrylate copolymer has a carbon number of 8 or more from the alkyl group constituting the alkyl ester (A) a structural unit derived from an alkyl acrylate, whereby the peeling force of the adhesive layer and the protective film before hardening is sufficiently large, the cutting can be performed stably, and the adhesive layer and the protective film are peeled off after hardening. The force is small enough to pick up the semiconductor wafer stably.
關於黏著劑層硬化前後之剝離力的比([黏著劑層硬化前剝離力]/[黏著劑層硬化後剝離力]),實施例1中為4.6,實施例2中為4.2,實施例3中為14.3,實施例4中為1.8,實施例1至實施例3中特別大,其中實施例3中明顯較大,暗示出當構成前述烷基酯之烷基的碳數為12及12左右之值時,本發明的效果特別高。 The ratio of the peeling force before and after curing of the adhesive layer ([peeling force before curing of the adhesive layer] / [peeling force after curing of the adhesive layer]) is 4.6 in the first embodiment and 4.2 in the second embodiment, and the third embodiment It is 14.3 in the middle, 1.8 in the embodiment 4, and particularly large in the examples 1 to 3. In the embodiment 3, it is obviously larger, and it is indicated that the carbon number of the alkyl group constituting the alkyl ester is about 12 and 12 or so. The value of the present invention is particularly high.
相對於此,使用比較例1至比較例2的保護膜形成用複合片時,該片材中,(甲基)丙烯酸烷基酯共聚物不具有由構成烷基酯之烷基的碳數為8以上之(甲基)丙烯酸烷基酯衍生之結構單元,藉此,硬化前的黏著劑層與保護膜之剝離力足夠大,可穩定地進行切割,但硬化後的黏著劑層與保護膜之剝離力未變得足夠小,不能穩定地拾取半導體晶片。 On the other hand, when the composite sheet for forming a protective film of Comparative Example 1 to Comparative Example 2 is used, the alkyl (meth) acrylate copolymer does not have the carbon number of the alkyl group constituting the alkyl ester. a structural unit derived from an alkyl (meth) acrylate of 8 or more, whereby the peeling force of the adhesive layer and the protective film before curing is sufficiently large to stably perform cutting, but the adhesive layer and the protective film after curing The peeling force does not become sufficiently small to stably pick up the semiconductor wafer.
(產業可利用性) (industry availability)
本發明可利用於製造背面由保護膜保護之半導體晶片等,因此於產業上極為有用。 The present invention can be utilized in the manufacture of a semiconductor wafer or the like protected by a protective film on the back surface, and thus is extremely useful industrially.
1‧‧‧保護膜形成用複合片 1‧‧‧Composite film for protective film formation
10‧‧‧支持片 10‧‧‧Support tablets
11‧‧‧基材 11‧‧‧Substrate
11a‧‧‧基材的表面 11a‧‧‧ Surface of the substrate
12‧‧‧黏著劑層 12‧‧‧Adhesive layer
12a‧‧‧黏著劑層的表面 12a‧‧‧ Surface of the adhesive layer
120a‧‧‧保護膜形成用膜側之區域 120a‧‧‧A film-side area for protective film formation
13‧‧‧保護膜形成用膜 13‧‧‧film for protective film formation
13a‧‧‧保護膜形成用膜的表面 13a‧‧‧Surface of film for protective film formation
130a‧‧‧黏著劑層側之區域 130a‧‧‧A region on the adhesive layer side
14‧‧‧剝離膜 14‧‧‧Release film
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TW109127845A TWI745029B (en) | 2015-06-05 | 2016-06-03 | Composite sheet for forming protective film and method for making semiconductor wafer with protective film |
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JP (2) | JP6630956B2 (en) |
KR (1) | KR102509165B1 (en) |
CN (1) | CN107615454B (en) |
SG (1) | SG11201709978PA (en) |
TW (2) | TWI705116B (en) |
WO (1) | WO2016195071A1 (en) |
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CN109789666A (en) * | 2017-03-30 | 2019-05-21 | 琳得科株式会社 | Composite sheet is used in protective film formation |
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TWI641494B (en) * | 2015-11-04 | 2018-11-21 | 日商琳得科股份有限公司 | Sheet for forming first protective film, method for forming first protective film and method for manufacturing semiconductor chip |
CN112154536B (en) * | 2018-09-11 | 2024-09-17 | 琳得科株式会社 | Film for forming protective film, composite sheet for forming protective film, inspection method, and recognition method |
JP7500169B2 (en) * | 2019-08-30 | 2024-06-17 | リンテック株式会社 | Composite sheet for forming protective film |
JP7312679B2 (en) * | 2019-11-19 | 2023-07-21 | 日東電工株式会社 | OPTICAL FILM WITH ADHESIVE AND METHOD FOR MANUFACTURING THE SAME |
JP7534944B2 (en) | 2020-12-10 | 2024-08-15 | リンテック株式会社 | Manufacturing method of workpiece with protective film and manufacturing method of workpiece with protective film forming film |
JP2023053919A (en) | 2021-10-01 | 2023-04-13 | 日東電工株式会社 | Backgrinding tape |
JP2023053920A (en) | 2021-10-01 | 2023-04-13 | 日東電工株式会社 | Sticker composition used for sticky tape for semiconductor processing, and sticky tape using the sticker composition |
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MY138566A (en) * | 2004-03-15 | 2009-06-30 | Hitachi Chemical Co Ltd | Dicing/die bonding sheet |
JP4493643B2 (en) * | 2006-12-06 | 2010-06-30 | 日東電工株式会社 | Re-peelable pressure-sensitive adhesive composition, and pressure-sensitive adhesive tape or sheet |
JP4994429B2 (en) * | 2008-08-04 | 2012-08-08 | 日東電工株式会社 | Dicing die bond film |
JP5681374B2 (en) * | 2010-04-19 | 2015-03-04 | 日東電工株式会社 | Dicing tape integrated semiconductor backside film |
JP5210346B2 (en) * | 2010-04-19 | 2013-06-12 | 電気化学工業株式会社 | Method for manufacturing adhesive sheet and electronic component |
KR101311647B1 (en) * | 2010-07-07 | 2013-09-25 | 후루카와 덴키 고교 가부시키가이샤 | Wafer processing tape and method of processing semiconductor therewith |
EP2602814A1 (en) * | 2010-08-06 | 2013-06-12 | Nitto Denko Corporation | Electronic component manufacturing method |
JP5781302B2 (en) * | 2010-12-28 | 2015-09-16 | 日東電工株式会社 | Radiation curable pressure-sensitive adhesive composition and pressure-sensitive adhesive sheet |
JP5961610B2 (en) * | 2011-05-27 | 2016-08-02 | デンカ株式会社 | Adhesive sheet |
WO2014030699A1 (en) * | 2012-08-23 | 2014-02-27 | リンテック株式会社 | Dicing sheet with protective film formation layer and method for producing chip |
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JP6180139B2 (en) * | 2013-03-11 | 2017-08-16 | リンテック株式会社 | Protective film-forming composite sheet and method for producing protective film-forming chip with film |
JP6262717B2 (en) * | 2013-03-13 | 2018-01-17 | リンテック株式会社 | Method for manufacturing chip with protective film |
CN105074878B (en) * | 2013-03-27 | 2017-08-04 | 琳得科株式会社 | Diaphragm formation composite sheet |
EP2979864B1 (en) * | 2013-03-28 | 2020-10-14 | LINTEC Corporation | Protective film formation composite sheet and method for fabricating a chip equipped with a protective film |
JP6360829B2 (en) * | 2013-06-14 | 2018-07-18 | デンカ株式会社 | Heat resistant adhesive sheet for semiconductor inspection |
JP5950869B2 (en) * | 2013-06-20 | 2016-07-13 | 古河電気工業株式会社 | Adhesive tape for semiconductor wafer surface protection |
US20160185089A1 (en) * | 2013-08-01 | 2016-06-30 | Lintec Corporation | Protective Film Formation-Use Composite Sheet |
-
2016
- 2016-06-03 SG SG11201709978PA patent/SG11201709978PA/en unknown
- 2016-06-03 TW TW105117577A patent/TWI705116B/en active
- 2016-06-03 CN CN201680032214.4A patent/CN107615454B/en active Active
- 2016-06-03 TW TW109127845A patent/TWI745029B/en active
- 2016-06-03 JP JP2017522277A patent/JP6630956B2/en active Active
- 2016-06-03 KR KR1020177036132A patent/KR102509165B1/en active IP Right Grant
- 2016-06-03 WO PCT/JP2016/066588 patent/WO2016195071A1/en active Application Filing
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Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN109789666A (en) * | 2017-03-30 | 2019-05-21 | 琳得科株式会社 | Composite sheet is used in protective film formation |
CN109789666B (en) * | 2017-03-30 | 2024-06-04 | 琳得科株式会社 | Composite sheet for forming protective film |
Also Published As
Publication number | Publication date |
---|---|
CN107615454B (en) | 2020-12-18 |
JP6630956B2 (en) | 2020-01-15 |
WO2016195071A1 (en) | 2016-12-08 |
TWI705116B (en) | 2020-09-21 |
CN107615454A (en) | 2018-01-19 |
JP2020017758A (en) | 2020-01-30 |
TW202043416A (en) | 2020-12-01 |
KR20180016411A (en) | 2018-02-14 |
JP6924243B2 (en) | 2021-08-25 |
KR102509165B1 (en) | 2023-03-10 |
JPWO2016195071A1 (en) | 2018-03-22 |
SG11201709978PA (en) | 2017-12-28 |
TWI745029B (en) | 2021-11-01 |
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