TW201643435A - Contact unit and inspection jig - Google Patents

Abstract

A block has a planar portion abutting a back side of a contact region of a flexible substrate, and a recess that is concave with respect to the planar portion. An electronic component mounted on the flexible substrate is located within the recess. When viewed from a direction perpendicular to the planar portion, the recess is located at a position near a power supply bump, except at a position overlapping the power supply bump, or the recess is filled with a filler. The planar portion of the block abuts only the back side of the power supply bump.

Description

Contact unit and inspection fixture

The present invention relates to an inspection jig such as a contact unit and a probe card used for inspection of electrical characteristics of a semiconductor integrated circuit.

In general, an inspection jig such as a probe card used for electrical characteristic inspection of a semiconductor integrated circuit includes a flexible substrate on which an electrode for contact with an inspection object (for example, a wafer) is formed. Contact part. A compact for pressing the flexible substrate toward the object to be inspected is provided on the back side of the contact portion of the flexible substrate. In the compact, the potential energy is applied to the object to be inspected by a potential energy applying means such as a spring, and the force of contact with the object to be inspected is applied to the flexible substrate.

When the electrical characteristics are checked, the high-frequency electrical signals are transmitted between the inspection jig and the inspection device (tester) by means of a coaxial cable. The inspection fixture is provided with a coaxial connector for freely attaching and detaching the coaxial cable extending from the tester. The coaxial connector is electrically connected to the flexible substrate by soldering or the like. The electrical connection between the contact portion of the flexible substrate and the coaxial connector is performed by a conductive pattern on the flexible substrate.

[Previous Technical Literature] [Patent Literature]

[Patent Document 1] Japanese Patent Laid-Open Publication No. 2006-177971

The conductive pattern drawn from the contact portion on the flexible substrate is provided with an inductance. However, in recent years, the signal used for the measurement of the inspection jig has been developed in a high-speed (high-frequency) development due to the inductance of the conductive pattern. The impact of the news has caused problems. In terms of noise countermeasures, bypass capacitors can be considered. Although the bypass capacitor is disposed closer to the contact portion, the noise removal effect is higher. However, in order to avoid interference with the inspection object during measurement, the bypass capacitor must be disposed at a position separated from the contact portion by a certain distance or more. In the case of a high-speed signal of several GHz or more, if the bypass capacitor leaves the contact portion, it is difficult to perform accurate measurement due to the influence of noise of the conductive pattern attached between the bypass capacitor and the contact portion.

The present invention has been made in view of such circumstances, and an object thereof is to provide a contact unit and an inspection jig that can perform accurate measurement even for a high-frequency signal.

One aspect of the present invention is a contact unit detachably attached to a body of an inspection jig, comprising: a flexible substrate having a contact portion in contact with the inspection object on one surface thereof; and a support member supporting the flexible substrate And the compact is disposed on the other surface side of the flexible substrate, and the compact has a flat portion that abuts against a back surface of the contact portion of the flexible substrate, and a concave portion that is recessed from the planar portion , The other surface of the flexible substrate is provided with an electronic component electrically connected to one of the contact portions, and the electronic component is located in the recess of the compact.

Another aspect of the invention is an inspection fixture. The inspection jig includes a flexible substrate having a contact portion that contacts the inspection object on one surface, a support member that supports the flexible substrate, and a compact that is provided on the other surface side of the flexible substrate The compact has a flat portion that abuts against a back surface of the contact portion of the flexible substrate, and a recess that is recessed from the flat portion, and the other surface of the flexible substrate is provided with one of the contacts The electronic component is electrically connected to the electronic component, and the electronic component is located in the recess of the compact.

The concave portion is provided at a position that is not overlapped with the contact portion that is electrically connected to the electronic component and that is close to the contact portion when viewed in a direction perpendicular to the planar portion of the compact.

The other surface of the flexible substrate is provided with a conductive pattern electrically connected to the contact portion and a ground pattern, and the electronic component may be spanned over the conductive pattern and the ground pattern.

The recesses may also be filled with an insulating filler.

The contact portion electrically connected to the electronic component may be a contact portion for power supply.

A potential energy imparting means for applying a potential energy to the object to be inspected by the compact may be provided.

Further, any combination of the above constituent elements or a form obtained by converting the expression of the present invention between a method or a system is still an effective aspect of the present invention.

According to the present invention, it is possible to provide a contact unit and an inspection jig which can be accurately measured even for a high frequency signal.

1‧‧‧Check fixture (probe card)

10‧‧‧Main substrate

11‧‧‧Contact hole for contact

15‧‧‧through hole

16‧‧‧Connector through hole for the foot

17, 18‧‧‧through holes for screwing

20‧‧‧ Keep board

21‧‧‧Contact hole for contact

22‧‧‧Base for the block

27, 28‧‧‧ screw holes

30‧‧‧Contact unit

40‧‧‧Flexible substrate

41‧‧‧Contact area

41a‧‧‧High-speed signal bumps

41b‧‧‧Bumps for low speed signals

41c‧‧‧Power supply bumps

41d‧‧‧ Grounding bumps

42a‧‧‧High-speed signal pattern

42b‧‧‧ Low-speed signal pattern

42c‧‧‧Power supply pattern

42d‧‧‧Electronic parts mounting mat

42e‧‧‧No patterned area

43a, 43b‧‧‧ grounding pattern

44‧‧‧Electronic parts

45a‧‧‧ Grounding through hole

45b‧‧‧Power supply through hole

45c‧‧‧through hole

46‧‧‧Connector through hole for the foot

47, 48‧‧‧through holes for screwing

49‧‧‧Positioning through holes

50‧‧‧ coaxial connector

51‧‧‧ Body Department

51a‧‧‧Front Department

52‧‧‧ Signal foot

53‧‧‧ Grounding feet

60‧‧‧Sub Substrate (Support Substrate)

61‧‧‧Central through hole

62‧‧‧Connector terminal area for fixing

66‧‧‧through hole for connector foot

67‧‧‧through hole for screwing

69‧‧‧Positioning through holes

70‧‧‧Clamps

71‧‧‧Front taper

72‧‧‧foot

73‧‧‧Parallel adjustment screw

74‧‧‧Flat Department

75‧‧‧ recess

75a‧‧‧Out of the hole

76‧‧‧Filling agent

90‧‧‧Unit pressing member

91‧‧‧ Spring (potential means)

92‧‧‧Flexible components

93, 94‧‧‧ Positioning through holes

95‧‧‧through hole for connector body

96‧‧‧Spring recess

103, 104‧‧‧ Positioning pins

106 to 108‧‧‧ screws (locking tools)

109‧‧‧ Positioning pins

Fig. 1 is an exploded perspective view showing the contact unit 30 according to Embodiment 1 of the present invention.

2 is an exploded top perspective view of the contact unit 30.

Fig. 3 is a bottom exploded perspective view of the inspection jig 1 according to the first embodiment of the present invention.

4 is an exploded perspective view of the upper side of the inspection jig 1.

FIG. 5 is a bottom perspective view of the unit jig 90 in which the inspection jig 1 has been omitted.

FIG. 6 is a top perspective view of the unit jig 90 in which the inspection jig 1 has been omitted.

FIG. 7 is an enlarged view of a central portion of the surface (underside) of the inspection tool 1 on the inspection object side of the flexible substrate 40.

Fig. 8 is an enlarged view of a central portion of the surface (upper surface) of the flexible substrate 40 on the side of the tester.

Fig. 9 is an enlarged cross-sectional view taken along line 7A-A of the state in which the compact 70 is combined.

Figure 10 is an enlarged view of the electronic component 44 of Figure 9 and the periphery thereof.

Fig. 11 is an enlarged plan view showing the center portion of Fig. 7 in an enlarged manner.

Figure 12 is a cross-sectional view taken along line B-B of Figure 11;

Fig. 13 is an enlarged cross-sectional view showing the essential part of the inspection jig according to the second embodiment of the present invention.

Figure 14 is a view in the direction of arrows of the clamp 70 of Figure 13 as viewed from the direction C of the Figure.

Fig. 15 shows assuming that the electronic component 44 is a wafer type capacitor, the object to be inspected is an amplifier of 2.5 GHz, and the position of the electronic component 44 is converted, and the power passing characteristics of the amplifier from the input to the output are measured at 2 GHz to 3 GHz, respectively (S parameter Characteristic diagram of the result of S21).

[Formation of the Invention]

Hereinafter, preferred embodiments of the present invention will be described in detail with reference to the accompanying drawings. In the drawings, the same or equivalent constituent elements, members, and the like are denoted by the same reference numerals, and the repeated description is omitted as appropriate. Furthermore, the embodiments are illustrative and not limiting as to the scope of the invention, and all features or combinations thereof recited in the embodiments are not necessarily essential to the invention.

Embodiment 1

Fig. 1 is an exploded perspective view of the contact unit 30 according to the embodiment of the present invention. 2 is an exploded top perspective view of the contact unit. Fig. 3 is a bottom exploded perspective view of the inspection jig 1 according to the embodiment of the present invention. 4 is an exploded perspective view of the upper side of the inspection jig 1. Fig. 5 is a bottom perspective view in which the unit pressing member 90 is omitted in the inspection jig 1, and Fig. 6 is an upper perspective view thereof. FIG. 7 is an enlarged view of a central portion of the surface (underside) of the inspection tool 1 on the inspection object side of the flexible substrate 40. In Fig. 7, the recess 75 of the compact 70 shown in Fig. 1 is Shown in dotted lines. Fig. 8 is an enlarged view of a central portion of the surface (upper surface) of the flexible substrate 40 on the side of the tester. Fig. 9 is an enlarged cross-sectional view taken along line 7A-A of the state in which the pressure block 70 is combined. Figure 10 is an enlarged view of the electronic component 44 of Figure 9 and its periphery. Figure 11 is an enlarged plan view showing the center portion of Figure 7 in an enlarged manner. In Fig. 11, as in Fig. 7, the concave portion 75 of the compact 70 is indicated by a broken line. Fig. 12 is a sectional view taken along line B-B of Fig. 11;

The contact unit 30 is a replacement contact unit for an inspection jig such as a probe card, and is fixed to the main substrate 10 of the inspection jig 1 as shown in FIGS. 3 and 4 and the like. The contact unit 30 includes: a flexible substrate 40; four coaxial connectors 50 such as an SMA connector; a sub-substrate 60 made of a hard substrate such as a glass epoxy substrate as a supporting member; and molded by, for example, a resin The compact 70 formed by the body. In order to maintain the contact state between the flexible substrate 40 and the inspection object, the pressure block 70 is required to reliably press the flexible substrate 40 against the inspection object when the flexible substrate 40 is pressed against the inspection object. Since the crucible is supported so that the flexible substrate 40 does not move, the compact 70 must be a hard material, and since the recess 75 for the electronic component 44 is to be formed, it must be a material having high workability. Materials such as polyimine or polyamidamine are preferred.

The flexible substrate 40 is provided in contact with an inspection object such as a wafer. The flexible substrate 40 is located at a central portion of the lower surface of the cross section (the surface opposite to the sub-substrate 60) of the flexible substrate 40 on one surface (lower surface) side of the sub-substrate 60, and is formed as a wafer or the like as shown in FIG. The contact portion region 41 where the object is in contact is inspected. Each of the bump portions 41 is provided with bumps (contact portions) as shown in FIGS. 7 and 11 , and specifically, a high-speed signal bump 41 a , a low-speed signal bump 41 b , a power supply bump 41 c , And grounding bumps 41d.

A conductive pattern for signal transmission is pulled out from each of the bumps other than the ground bumps 41d. Specifically, the high-speed signal pattern 42a is pulled out from each of the high-speed signal bumps 41a, and is directly electrically connected to the signal foot portion 52 of the coaxial connector 50 or the like by soldering or the like. The ground pattern 43a is disposed close to both sides of the high-speed signal pattern 42a. The ground pattern 43a is provided from the ground pattern (not shown) around the coaxial connector 50 to the vicinity of the high-speed signal bump 41a so as to form a coplanar line with the high-speed signal pattern 42a interposed therebetween. Each of the ground patterns 43a is electrically connected to the ground pattern 43b on the back surface of the flexible substrate 40 by a ground via 45a. The grounding bump 41d is electrically connected to the ground pattern 43b on the back surface of the flexible substrate 40 by a through hole provided at the same position as itself.

The low-speed signal pattern 42b is pulled out from each of the low-speed signal bumps 41b. The power supply pattern 42c is pulled out from the power supply bump 41c. The low-speed signal pattern 42b and the power supply pattern 42c are electrically connected to any one of the through holes 45c (FIG. 2 and the like) provided at the end portion of the cross portion of the flexible substrate 40. The through hole 45c is provided to be electrically connected to the main substrate 10.

As shown in FIG. 12, the power supply pattern 42c is electrically connected to the electronic component mounting pad 42d on the opposite side of the flexible substrate 40 by the power supply through hole 45b. When viewed from a direction perpendicular to the flat portion 74 of the compact 70 (the flexible substrate 40 is viewed from the flat portion 74 of the compact 70), the power supply through hole 45b is provided at a position different from the power supply bump 41c, and It is a position close to the power supply bump 41c. By forming the power supply bump 41c and the power supply through hole 45b at the same position, the electronic component 44 can be disposed closest to each other, but there is a contact with the inspection object. When the force is applied to the power supply bump 41c, a force is applied to the power supply through hole 45b to apply force to the electronic component 44, and the electronic component 44 and the flexible substrate 40 may be separated. Therefore, the power supply bump 41c and the power supply through hole 45b are disposed at different positions.

As shown in FIG. 8, on the upper surface (surface on the tester side) of the flexible substrate 40, in addition to the electronic component mounting pad 42d and the non-patterning region 42e, a ground pattern 43b is provided in a comprehensive manner. The electronic component mounting pad 42d is insulated from the ground pattern 43b by the non-patterning region 42e. The electronic component 44 is placed over the electronic component mounting pad 42d and the ground pattern 43b, and one terminal electrode is electrically connected to the electronic component mounting pad 42d by soldering or the like, and the other terminal electrode is soldered and the ground pattern 43b. Isoelectric connection. The electronic component 44 is a wafer type capacitor that functions as a bypass capacitor, for example, to remove noise attached to the power supply pattern 42c (to cause noise to flow to the ground pattern 43b) to prevent noise from flowing to the power supply bump 41c. side).

As shown in FIGS. 1 and 2, the flexible substrate 40 is also provided with a connector leg through hole 46, a screwing through hole (47, 48), and a positioning through hole 49. The connector leg through hole 46 is provided to pass through the signal leg portion 52 and the grounding leg portion 53 of the coaxial connector 50. The through hole 47 for screwing is provided to pass the screw (locking member) 107 for fixing the contact unit 30 to the main substrate 10 of the inspection jig 1 . Further, the screw 107 shown in FIGS. 1 and 2 is not an essential component of the contact unit 30. The through-hole 48 for screwing is provided so that the unit pressing member 90 of the inspection jig 1 shown in FIGS. 3 and 4 is fixed to the screw (locking member) 108 for the main substrate 10. Screw through holes 48 are respectively provided in Both sides of the through hole 45c. The positioning through hole 49 is provided so that the positioning pin 109 (FIG. 4) that positions the contact unit 30 on the main substrate 10 passes. The positioning through hole 49 is provided on the side of the screwing through hole 48. When the contact unit 30 is attached to the inspection jig 1, the flexible substrate 40 is not joined to the main substrate 10 to be described later by soldering or the like.

The four coaxial connectors 50 are directly electrically connected to the flexible substrate 40 at a position surrounding the contact portion region 41 of the flexible substrate 40, and a coaxial cable extending from an inspection device (tester) not shown can be used. Connected by free loading and unloading. The coaxial connector 50 includes a main body portion 51, a signal leg portion 52, and four grounding leg portions 53. The other end of the coaxial cable connected to the inspection device at one end is detachably connected (mounted) to the body portion 51. The body portion 51 is located on the other (upper) side of the sub-substrate 60. The flange portion 51a of the main body portion 51 is fixed to a connector fixing terminal region (not shown) of the sub-substrate 60 by welding or the like. The signal leg portion 52 and the grounding leg portion 53 extend from the main body portion 51 and penetrate the through hole 66 for the connector leg portion of the sub-substrate 60 and the through hole 46 for the connector leg portion of the flexible substrate 40, and Soldering or the like is directly electrically connected to the surface on the opposite side of the sub-substrate 60 of the flexible substrate 40. Specifically, the signal leg portion 52 is directly electrically connected to the high-speed signal pattern 42a of the flexible substrate 40, and the grounding leg portion 53 is directly electrically connected to the ground pattern 43a of the flexible substrate 40. When the contact unit 30 is attached to the inspection jig 1, the coaxial connector 50 is not joined to the main substrate 10 to be described later by welding or the like.

The sub-substrate 60 as a supporting member (supporting substrate) is provided for the purpose of preventing a large load from being applied to the bonding of the flexible substrate 40 and the coaxial connector 50 when the coaxial cable is attached or detached to the coaxial connector 50. Department (welding part). The sub-substrate 60 is provided with a central through hole 61, a connector leg through hole 66, a screwing through hole 67, and a positioning through hole 69. The central through hole 61 is a space for arranging the compact 70. The connector leg through hole 66 is provided to pass through the signal leg portion 52 and the grounding leg portion 53 of the coaxial connector 50. The through hole 67 for screwing is provided so that the screw 107 for fixing the contact unit 30 to the main substrate 10 of the inspection jig 1 passes. The positioning through hole 69 is provided so that the positioning pin 109 (FIG. 4) that positions the contact unit 30 on the main substrate 10 passes.

In the state in which the inspection jig 1 is combined, the compact 70 is biased downward by the spring 91, and the flexible substrate 40 is held in a state in which the contact portion region 41 protrudes downward from the lower surface of the main substrate 10. The press block 70 has four leg portions 72 around the center truncated pyramid portion 71 that protrudes downward. A parallelism adjusting screw 73 is attached to each leg portion 72 of the pressure block 70. The front end of the parallelism adjusting screw 73 is in contact with the block base portion 22 of the holding plate 20 to be described later. The press block 70 that imparts potential energy by the spring 91 is in contact with the block base portion 22 of the holding plate 20 through the tip end of the parallelism adjusting screw 73 to determine the position in the vertical direction. The pressing block 70 holds two positioning pins 103 projecting upward. The positioning pin 103 has a function of positioning a unit pressing member 90 to be described later on the contact unit 30. In addition, in FIG. 2, although the spring 91 is shown in the press block 70, the spring 91 may be supported by the unit press member 90 of the inspection jig by adhesion or the like, and it is not necessary to consider it as a component of the contact unit 30. The pressure block 70 has a flat portion 74 at the top of the truncated pyramid portion 71. The flat portion 74 is in contact with the back surface of the contact portion region 41 of the flexible substrate 40. The compact 70 also has a recess 75 that is recessed from the planar portion 74. The electronic component 44 mounted on the flexible substrate 40 is located in the recess 75. View from the direction of the flat face of the peace 74 The recessed portion 75 is provided at a position that is not overlapped with the power supply bump 41c (the bump (contact portion) electrically connected to the electronic component 44) and is close to the power supply bump 41c. Therefore, as shown in FIG. 12, the flat portion 74 of the compact 70 abuts against the front and back surfaces of the power supply bump 41c.

The inspection jig 1 is, for example, a probe card, and is used for electrical characteristic inspection of a semiconductor integrated circuit in a wafer state. The inspection jig 1 includes: a main substrate 10 made of, for example, a glass epoxy substrate; a holding plate 20 made of, for example, stainless steel metal; the aforementioned contact unit 30; and a unit pressing member made of, for example, a resin molded body 90.

As shown in FIG. 4, the main substrate 10 is provided with a through hole 11 for a contact, a through hole 15, a through hole 16 for a connector leg, and through holes 17 and 18 for screwing. The purpose of the contact through-holes 11 is to project the contact portion region 41 of the flexible substrate 40 downward. The through hole 15 is provided for electrical connection between the flexible substrate 40 and the through hole 45c. The connector leg through hole 16 is provided to allow the signal leg portion 52 and the grounding leg portion 53 of the coaxial connector 50 to escape. The through hole 17 for screwing is provided to allow the screw 107 for fixing the contact unit 30 to the main substrate 10 to pass therethrough. The through hole 18 for screwing is provided to allow the screw 108 for fixing the unit pressing member 90 to the main substrate 10 to pass therethrough. A ground pattern (not shown) is provided around the through hole 16 for the connector leg portion and the through hole 17 for screwing on the upper surface of the main substrate 10 (the opposing surface of the flexible substrate 40). The ground pattern of the main substrate 10 and the ground pattern of the flexible substrate 40 are brought into surface contact with each other by the locking of the screw 107. Since the two ground patterns extend around the through holes 17 and 47 for screwing, they can be particularly strongly contacted around the fixed portion where the screw 107 is formed.

As shown in FIG. 4, the holding plate 20 is made of, for example, a thin metal plate, and has a function of restricting the amount by which the contact unit 30 protrudes downward from the main substrate 10. The holding plate 20 is attached (fixed) to the lower surface of the main substrate 10 with screws (locking tools) 106. The holding plate 20 is provided with a cross-shaped contact through hole 21 and screw holes 27 and 28. The periphery of the contact through hole 21 serves as a base portion 22 for the press block (Fig. 4). The contact through hole 21 is provided to protrude the contact portion region 41 of the flexible substrate 40 downward. The screw hole 27 is provided to be screwed with a screw 107 for fixing the contact unit 30 to the main substrate 10 of the inspection jig 1 . The screw hole 28 is provided to be screwed with a screw 108 for fixing the unit pressing member 90 to the main substrate 10. The press block base portions 22 are respectively located below the leg portions 72 of the press block 70 and are attached to the respective leg portions 72 to receive (support) the distal ends of the parallelism adjusting screws 73 extending downward from the respective leg portions 72. The holding plate 20 is provided with positioning pins 104 and 109 that protrude upward from the upper surface of the main substrate 10. The positioning pin 104 has a function of positioning the unit pressing member 90 on the main substrate 10. The positioning pin 109 has a function of positioning the contact unit 30 on the main substrate 10. The main substrate 10 and the holding plate 20 serve as the main body of the inspection jig 1.

The unit pressing member 90 is a member that presses the contact unit 30 from above. As shown in FIG. 4, the unit pressing member 90 is provided with positioning through holes (93, 94), a connector body through hole 95, and a spring recess 96 (FIG. 3). The positioning through hole 93 is provided for the positioning pin 103 that positions the unit pressing member 90 in the contact unit 30 to pass through. The positioning through hole 94 is provided for the positioning pin 104 that positions the unit pressing member 90 on the main substrate 10 to pass through. The connector body through hole 95 is provided to protrude the body portion 51 of the coaxial connector 50 upward. Spring recess 96 It is provided to support one end of the spring 91 shown in FIG. When the unit pressing member 90 is fixed to the main substrate 10 by the screw 108, the spring 91 applies the potential energy downward to the pressing block 70 (that is, the potential energy is applied downward to the contact portion region 41 of the flexible substrate 40). On the other hand, the contact portion region 41 of the flexible substrate 40 is given a force to contact an object to be inspected such as a wafer. On the lower surface of the unit pressing member 90 (opposite to the flexible substrate 40), two rope-like (linear) elastic members 92 (Fig. 3) formed of fluorenone rubber or the like are held. The elastic member 92 is disposed at a position directly above the through hole 45c of the flexible substrate 40 and the through hole 15 of the main substrate 10, and the flexible substrate is placed in a state where the unit pressing member 90 is fixed to the main substrate 10 by the screw 108. The through hole 45c of 40 is pressed toward the through hole 15 of the main substrate 10. Since the screw 108 is fixed to the main substrate 10 by the unit pressing members 90 on both sides of the elastic member 92, the pressing effect of the elastic member 92 can be improved. The through holes 15, 45c are crimped and electrically connected to each other by the elastic member 92.

Hereinafter, the assembly flow of the inspection jig 1 will be described.

First, the contact unit 30 is first assembled for use. Specifically, the following steps are performed. The signal leg portion 52 and the grounding leg portion 53 of the coaxial connector 50 are passed through the connector leg through hole 66 of the sub-substrate 60, and the flange portion 51a of the coaxial connector 50 is fixed to the sub-substrate 60 by soldering or the like. The unillustrated connector is fixed on the terminal area. Then, the signal leg portion 52 and the grounding leg portion 53 of the coaxial connector 50 are passed through the through hole 46 for the connector leg portion of the flexible substrate 40 on which the electronic component 44 is attached and to which the compact 70 is bonded. The flexible substrate 40 is placed on the lower surface of the sub-substrate 60 (the surface opposite to the fixing surface of the main body portion 51 of the coaxial connector 50). Next, the signal foot portion 52 and the grounding leg portion 53 of the coaxial connector 50 are used. The lower surface of the flexible substrate 40 (the surface opposite to the sub-substrate 60) is directly electrically connected by soldering or the like. Alternatively, the signal leg portion 52 and the grounding leg portion 53 of the coaxial connector 50 may be electrically connected to the lower surface of the flexible substrate 40, and then the flange portion 51a of the coaxial connector 50 may be fixed to the sub-substrate 60. Above. The flexible substrate 40 is indirectly fixed to the sub-substrate 60 by solder bonding to the signal leg portion 52 and the grounding leg portion 53 of the coaxial connector 50 fixed to the sub-substrate 60. By the above process, the combination of the contact units 30 is completed. Alternatively, the compact 70 may be fixed to the back surface of the contact portion region 41 of the flexible substrate 40 via the central through hole 61 of the sub-substrate 60 by means of an adhesive means.

Next, the contact unit 30 is mounted (fixed) to the main substrate 10 by screws 107. Specifically, the four positioning pins 109 protruding from the main substrate 10 are respectively passed through the positioning through-holes 49 of the flexible substrate 40 and the positioning through-holes 69 of the sub-substrate 60, and the four screws 107 are respectively worn. The through hole 67 for screwing of the sub-substrate 60, the through hole 47 for screwing of the flexible substrate 40, and the through hole 17 for screwing of the main substrate 10 are screwed to the holding fixed to the lower surface of the main substrate 10 in advance. Screw hole 27 of the plate 20. In this way, the flexible substrate 40 can be sandwiched between the main substrate 10 and the sub-substrate 60.

Next, the unit pressing member 90 is fixed to the main substrate 10 by screws 108. Specifically, the two positioning pins 103 projecting upward from the pressing block 70 and the two positioning pins 104 projecting upward from the main substrate 10 pass through the positioning through holes 93 and 94 of the unit pressing member 90, respectively. The four screws 108 are passed through the through holes of the unit pressing member 90, the screwing through holes 48 of the flexible substrate 40, and the screwing through holes 18 of the main substrate 10, and screwed into the screw holes of the holding plate 20. 28. Contact portion of the flexible substrate 40 The parallelism of the field 41 is adjusted by turning the parallelism adjustment screw 73 as needed. By the above steps, the assembly of the jig 1 is completed. Further, the operation of detaching the contact unit 30 from the main substrate 10 may be performed by reversing the mounting process.

The characteristic diagram of Fig. 15 shows that the electronic component 44 is a wafer type capacitor, and the object to be inspected is an amplifier of 2.5 GHz, and the position of the electronic component 44 is changed, and the power passing characteristics of the amplifier from the input to the output are measured at 2 GHz to 3 GHz, respectively. S21) results of S parameters. The three characteristics shown in FIG. 15 respectively show the measured value of the evaluation substrate, the distance between the electrode of the electronic component 44 (electrode on the power supply pattern 42c) and the power supply bump 41c in the configuration (power supply). The analog value when the length of the pattern is set to 0.4 mm and the analog value when the distance between the electrode of the electronic component 44 and the power supply supply bump 41c in the comparative example configuration is 5 mm. Here, the evaluation substrate includes a power supply supply bump and a power supply supply pattern, and an electrode (a voltage on the power supply pattern) of the wafer type capacitor provided on the power supply pattern extending from the power supply supply bump and The distance between the power supply bumps was set to 0.5 mm. Further, in the configuration of the comparative example, the concave portion 75 is removed from the compact 70 of the embodiment, and the electronic component 44 is provided on the same side as the contact portion region 41 of the flexible substrate 40, and in order to avoid interference during measurement. The object to be inspected is placed at a position on the side of the truncated pyramid portion 71 of the compact 70. The distance of 5 mm is the shortest distance between the electronic component 44 and the power supply bump 41c in the comparative example configuration by avoiding interference with the inspection object during measurement. As is apparent from Fig. 15, according to the configuration of the embodiment, the characteristics of the measured value of the evaluation substrate as a reference can be obtained as compared with the configuration of the comparative example. In addition The electronic component 44 can also be equipped with an integrated circuit.

According to this embodiment, the following effects can be achieved.

(1) Since the pressing block 70 is provided with the concave portion 75 recessed from the flat portion 74, the electronic component 44 provided on the back surface of the contact portion region 41 of the flexible substrate 40 is placed in the concave portion 75 as compared with the case of avoiding measurement When the electronic component 44 is placed on the same side as the contact portion region 41 of the flexible substrate 40 and is located on the side surface of the truncated pyramid portion 71 of the compact 70, the electronic component 44 can be placed at the time of measurement. The object to be inspected is prevented from interfering with, and is disposed close to the contact portion (here, the power supply supply bump 41c). Therefore, noise of the conductive pattern attached between the electronic component 44 and the power supply bump 41c can be reduced, and even in the case where the measurement target is a high-speed signal (high-frequency signal) of several GHz or more, accurate measurement can be performed ( Determination of real device characteristics with less error).

(2) Since the recessed portion 75 is provided at a position different from the power supply bump 41c electrically connected to the electronic component 44, and the flat portion 74 of the compact 70 abuts against the front and back surfaces of the power supply bump 41c, even if it is provided In the recessed portion 75, the power supply supply bump 41c can be reliably pressed against the inspection object by the pressure block 70.

Embodiment 2

Fig. 13 is an enlarged cross-sectional view showing the essential part of the inspection jig according to the second embodiment of the present invention. The cross section of Fig. 13 is similar to Fig. 12 in the cross section of the power supply supply bump 41c. Fig. 14 is a view in the direction of arrows in the block 70 of Fig. 13 as seen from the direction C of the figure. The inspection jig of the present embodiment differs from the first embodiment in that the power supply through hole 45b and the concave portion 75 of the compact 70 are present at the same position as the power supply projection 41c, and are filled with insulation. The filling portion 76 fills the concave portion 75 and the bottom portion of the bottom surface of the concave portion 75 is provided with an escape hole 75a at substantially the center portion, and the remaining points are the same. The filler 76 is, for example, an insulating resin, and is solidified (solidified) in a state where the electronic component 44 is located in the concave portion 75. The escape hole 75a is provided by cutting or the like, and penetrates through the compact 70, and has a function of inserting the electronic component 44 into the concave portion 75 when the compact 70 is adhered to the flexible substrate 40 on which the electronic component 44 is mounted. The effect of the filler 76 escaping. According to the present embodiment, even when the electronic component 44 is placed on the front and back surfaces of the power supply bump 41c due to physical restrictions, the filler 76 is filled in the recess 75, so that the power supply can be supplied. 41c does give the contact force required for the assay.

In the above, the present invention will be described by taking an embodiment as an example. However, in the respective constituent elements or processing programs of the embodiment, various modifications can be made within the scope of the claims, and this fact should be The industry understands. The following is a description of the variations.

The electronic component 44 may be another type of electronic component other than a capacitor such as a bypass capacitor. The electronic component 44 may be provided as a signal transmission bump (contact portion) other than the power supply bump 41c.

The inspection jig can also check the electrical characteristics of the semiconductor integrated circuit for dividing into individual product states. The inspection jig may be provided without the sub-substrate 60, and the flexible substrate 40 may be directly fixed to the main substrate 10 by soldering or the like. In other respects, parameters such as the number of coaxial connectors 50, the number of through holes, the number of screws used for fixing each portion, and the number of pins for positioning are not limited to the specific number exemplified in the embodiment, and may be The required performance or design convenience is arbitrarily determined.

40‧‧‧Flexible substrate

41c‧‧‧Power supply bumps

42c‧‧‧Power supply pattern

42d‧‧‧Electronic parts mounting mat

42e‧‧‧No patterned area

43b‧‧‧ Grounding pattern

44‧‧‧Electronic parts

45b‧‧‧Power supply through hole

70‧‧‧Clamps

74‧‧‧Flat Department

75‧‧‧ recess

Claims (7)

A contact unit detachably attached to the body of the inspection jig, comprising: a flexible substrate having a contact portion in contact with the inspection object on one surface; a support member supporting the flexible substrate; and a pressing block disposed on the In the other surface side of the flexible substrate, the compact has a flat portion that abuts against a back surface of the contact portion of the flexible substrate, and a concave portion that is recessed from the flat portion, and the flexible substrate is further An electronic component electrically connected to one of the contact portions is provided on one side, and the electronic component is located in the recess of the compact. An inspection jig comprising: a flexible substrate having a contact portion in contact with an inspection object on one surface; a support member supporting the flexible substrate; and a press block disposed on the other side of the flexible substrate The compact has a flat portion that abuts against a back surface of the contact portion of the flexible substrate, and a concave portion that is recessed from the flat portion, and the other surface of the flexible substrate is provided with one of the contact portions The electrically connected electronic component is located in the recess of the compact. The inspection jig according to claim 2, wherein the concave portion is not overlapped with the contact portion electrically connected to the electronic component, and the contact portion is viewed from a direction perpendicular to the planar portion of the compact Close location. The inspection jig according to claim 2 or 3, wherein the other surface of the flexible substrate is provided with a conductive pattern electrically connected to the contact portion and a ground pattern, and the electronic component is spanned over the conductive pattern And the aforementioned ground pattern. The inspection jig according to any one of claims 2 to 4, wherein the recess is filled with an insulating filler. The inspection jig according to any one of claims 2 to 5, wherein the contact portion electrically connected to the electronic component is a power supply contact portion. The inspection jig according to any one of the items 2 to 6, further comprising a potential energy imparting means for applying a potential energy to the object to be inspected on the object to be inspected.