TW201632903A - Apparatus for testing TV smart card module and testing method - Google Patents

Abstract

A testing apparatus, applying to a smart card module of TV system, comprises a control unit, a first interface, a second interface, a signal line set, a switching module, and an impedance adjusting module. The testing apparatus is coupled to the smart card via the first interface and coupled to the TV system via the second interface. The control unit is used for generating a switching signal, an impedance adjusting signal, and an operation signal. The switching signal is used for controlling the switching module to switch conduct status of the signal line set. The impedance adjusting signal is used for controlling the impedance adjusting module to adjust impedances each signal line of the signal line set. The operation signal is transmitted to the TV system via the second interface. Therefore, the testing apparatus is arranged to enable the TV system to access the smart card through the testing apparatus and fulfill related smart card testing items.

Description

Test device and method for TV smart card module

The present invention relates to testing techniques and, more particularly, to testing techniques for smart card modules for digital television.

In most multimedia systems, the most important hardware device is an image display device. How to ensure that the product is functioning properly at the factory and conforms to the functional specifications of various sales regions has always been an issue of concern for image display device manufacturers. The smart card can be used for the conditional access module of the digital TV. It is a system control center for digital TV, multimedia service, value-added service, premium entertainment, etc., and is further used in the television system through the key and identity information on the smart card. Charging mechanism. Since the policy specifications for digital TVs vary from region to region, and the policy specifications for smart cards are different from those adopted, digital TVs must ensure that the digital TVs produced are correctly accessed in the corresponding sales regions before leaving the factory. Take the module specifications.

TV system test items usually include information to determine whether the TV system can properly connect with the smart card and obtain corresponding information. The current test method is usually that the tester manually inserts the smart card into the television system and further operates the television system to determine whether the access is normal. On the other hand, common test items also include determining whether the TV system is still functioning after the smart card has been plugged and unplugged multiple times. The current test method is also the manual insertion and removal of the TV system by the tester. Wisdom card module, and visually observe whether the TV system can respond accordingly. Limited to the current test method, if the testman can not afford a large amount of test manpower, the manufacturer of the TV system usually only randomly samples a small number of products, and after the testers have a large number of plug-in operations for the smart card module, the smart card used as the test will be inevitable. Physical wear and tear, resulting in unnecessary testing costs.

In order to solve the above problems, the present invention provides a test apparatus and a test method applied to a television system. By automating the process of plugging and unplugging the smart card, the test device and the test method according to the present invention can save a lot of labor costs and avoid physical wear and tear, thereby improving the overall test efficiency.

According to an embodiment of the present invention, a test device for a television system is coupled to a smart card, the test device includes a control unit, a first interface, a second interface, a signal line group, and a Switching module and an impedance adjusting module. The control unit is configured to generate a switching signal, an impedance adjustment signal, and an operation signal. The first interface is used to connect the smart card. The second interface is for connecting to the television system. The signal line group is configured to electrically connect the first interface and the second interface. The switching module controls the conduction state of the at least one signal line of the signal line group according to the switching signal. The impedance adjustment module adjusts an impedance of the at least one signal line of the signal line group according to the impedance adjustment signal. The operational signal is transmitted to the television system via the second interface.

According to another embodiment of the present invention, a test method is applied to a test device, and the test device is coupled to a television system. The test method includes the following steps: a. inserting a smart card into the test The device generates an operation signal transmitted to the television system through the test device, so that the television system executes a smart card detection program; c. confirms the electricity Whether the smart card detection program of the system correctly detects the specification of the smart card; d. changing the operation signal through the testing device, so that the television system detects that the smart card has been removed.

The advantages and spirit of the present invention will be further understood from the following detailed description of the invention.

The components included in the diagram of this case are listed as follows:

10‧‧‧Smart Card

20‧‧‧TV system

100, 600‧‧‧ test equipment

101‧‧‧Control unit

102‧‧‧ first interface

103‧‧‧Second interface

104‧‧‧Switching module

105‧‧‧Impedance adjustment module

106‧‧‧buffer module

400‧‧‧Impedance adjustment unit

410‧‧ ‧ multiplexer

420‧‧‧Multiplexer

CD1, CD2‧‧‧ smart card detection signal

ICS‧‧‧ impedance adjustment signal

ICS1, ICS2, ICS3...ICSn‧‧‧Sub-impedance adjustment signal

ICU1, ICU2, ICU3...ICUn‧‧‧Impedance adjustment unit

OPS‧‧‧ operation signal

S1, S1_1...S1_m‧‧‧The first set of signal lines

S2, S2_1...S2_n‧‧‧Second group of signal lines

SS‧‧‧Switch signal

SS11, SS12, SS13...SS1m...SS2n‧‧‧ sub-switching signals

SW11, SW12, SW13...SW1m..., SW2n‧‧‧ switching unit

Rn1, Rn2, Rn3...Rnx‧‧‧resistors

The first figure is a block diagram of one embodiment of a test apparatus of the present invention.

The second figure is a schematic diagram of a switching module of one of the testing devices of the present invention.

The third figure is a schematic diagram of an impedance adjustment module of one of the test devices of the present invention.

The fourth figure is a schematic diagram of an impedance adjusting unit of one of the testing devices of the present invention.

The fifth figure is a timing diagram of an operation signal of one of the test devices of the present invention.

Figure 6 is a schematic illustration of another embodiment of the test device of the present invention.

The first figure shows a block diagram of an embodiment of a test apparatus 100 of the present invention. The test device 100 of the present invention includes a control unit 101, a first interface 102, a second interface 103, a signal line group including a first group of signal lines S1 and a second group of signal lines S2, a switching module 104 and an impedance adjustment module 105. . The first interface 102 and the second interface 103 are respectively used to connect the smart card 10 and the television system 20, which are compatible with a common interface or compatible with the specification of the Personal Computer Memory Card Association (PCMCIA). Interface, the type of interface signal must include at least the address signal type, data signal type and command signal type.

The control unit 101 in this embodiment is mainly used as the core of the control and management of the test apparatus 100, and can be implemented by a microprocessor or a programmable logic gate array (FPGA). As shown in the first figure The control unit 101 is coupled to the switching module 104, the impedance adjusting module 105, and the second interface 103, and controls the operation mechanism of each component through the control signals generated thereby. In practice, the user can update the test item code associated with the control unit 101 through a test machine, and the control module 101 can control the switching module 104 to change the signal line group to the conductive state through the control signals generated by the control unit 101. Or the non-conduction state, the control impedance adjustment module 105 adjusts the line impedance of the signal line group, and transmits the notification signal and the timing signal to the television system 20 through the second interface 103. The present invention is changed and combined by the foregoing various control mechanisms. The test device 100 can then complete the test items related to the smart card 10.

In this embodiment, the operation of a test device 100 having a first signal line S1 for transmitting a general signal and a second group of signal lines S2 for transmitting a high-speed signal is used to simulate the operation of plugging and unplugging the smart card 10 The test is taken as an example to further describe the connection relationship of the components in the test device 100. The second group of signal lines S2 can transmit the high-speed signals of the address signal type or the data signal type. The switching module 104 switches the first group of signal lines S1 and the second group of signal lines S2 to be in a conducting state or a non-conducting state according to the switching signal SS generated by the control unit 101, so that each signal line is turned on or off. For the test item corresponding to the state, the switching module can be implemented by, for example, a plurality of button elements or a transistor switching element. The impedance adjustment module 105 adjusts the line impedance of the second group of signal lines S2 according to the impedance adjustment signal ICS generated by the control unit 101, and is used between the signal lines of the second group of signal lines S2 for transmitting the high-speed signals. The transmission timings match each other. And in the second interface 103, an operation signal OPS as the notification of the smart card 10 is inserted and removed by the television system 20 to simulate the smart card 10 to perform a physical insertion and removal operation. That is, the smart card 10 connected to the first interface 102 can be read by the television system 20 connected to the second interface 103 to read the relevant smart card data by appropriately configuring the control unit to generate the control signal of the relevant component. The following is more The steps explain the detailed connection relationship of each component.

Please refer to the second figure, which is a schematic diagram of a switching module 104 of the testing device 100 of the present invention. The switching module 104 is mainly used as a switching state of each signal line of the first group of signal lines S1 and the second group of signal lines S2 or The non-conducting state can be achieved by, for example, a plurality of button elements or transistor switching elements. The switching signal SS generated by the control unit 101 may include m+n sub-switching signals SS11, SS12, SS13, ..., SS1m...SS21, SS22, SS23, ..., SS2n, which are respectively input to at least the switching module 104. m+n switching units SW11, SW12, SW13...SW1m...SW21, SW22, SW23...SW2n, for respectively switching each of the first group of signal lines S1 and the second group of signal lines S2 The conduction state or the non-conduction state of the line, and the test item corresponding to the signal line conduction state or the non-conduction state is performed.

For example, the switching unit SW13 of the signal line S1_3 can be implemented by an N-type metal oxide semiconductor (NMOS), and the source (Source) and the drain (Drain) of the NMOS are respectively coupled to the signal line S1_3. One end of the interface 102 is adjacent to one end of the second interface 103, and is coupled to the gate through the sub-switching signal SS13. When the user wants to perform a test item of a separate conduction state for the signal line S1_3 of the signal line group S1, The user can appropriately generate the appropriate sub-switching signal SS13 to turn on the switching unit SW13 to generate a high voltage level, for example, 3.3 volts for the N-type MOS. Further, for the convenience and cost consideration of the test operation, the first group of signal lines S1 can be designed to be manually operated through a unified button element, and the second group of signal lines S2 belonging to the high-speed signal are respectively transmitted through the transistor. The switching elements are individually turned on to balance the design of the test apparatus 100 with the testing requirements of high speed signal lines. Similarly, in the design considerations, the complex signal lines are switched through the unified switching unit or the switching state of each signal line is switched through a single switching unit. It is not limited to the above, and can be adjusted according to actual needs.

Please refer to the third figure, which is a schematic diagram of an impedance adjustment module 105 of the test device 100 of the present invention. The impedance adjustment module 105 of the present embodiment is mainly used as a line impedance adjustment and matching of the second group of signal lines S2 of the high speed signal. For example, a plurality of resistors, a demultiplexer, and a multiplexer may be disposed on each of the second signal lines S2 to select an appropriate resistor for line impedance matching. The impedance adjustment signal ICS generated by the control unit 101 includes n sub-impedance adjustment signals ICS1, ICS2, ICS3, ... ICSn, which are respectively input to the n impedance adjustment units ICU1, ICU2, ICU3 included in the impedance adjustment module 105. ICUn, correspondingly controlling each impedance adjusting unit to select an appropriate resistor to adjust the impedance of each signal line in the second group of signal lines S2 to match each other, so that the second group of signal lines S2 can be matched with an appropriate impedance. Next, carry out the corresponding test project.

For example, when the line impedances of the eight signal lines of the second group of signal lines S2 are 61, 62, 63, 64, 65, 66, 67, 68 ohms, respectively, and the impedance adjustment range of each impedance adjusting unit is 0~ When 10 ohms, the user can appropriately generate the sub-impedance adjustment signals ICS1, ICS2, ..., ICS8 of the impedance adjustment signal ICS through the appropriate settings to respectively set the resistances of the impedance adjustment units ICU1 to ICU8 to 9, 8, 7, 6, 5, 4, 3, 2 ohms, so that the impedance of each line of the second group of signal lines S2 can be adjusted to 70 ohms. When the user firstly operates an intelligent card of unknown specification and connects to the first interface 102 for testing, since the matching state between the corresponding second group of signal lines S2 is unknown, the amount of the test instrument can only be passed. When measuring the line impedances of the second group of signal lines S2 and the line impedances of the equivalent measurement results are respectively as described above for the eight different impedances, the user can only redesign and manufacture a new test device 100 based on the measurement results. And redesigning on the hardware trace of the corresponding second set of signal lines S2, that is, On the board trace, the S2_1 signal line is approximately extended by an equivalent line length of 9 ohms, and so on for the signal line extension of S2_2 to S2_8. However, the test apparatus 100 of the present invention can perform the aforementioned impedance adjustment through the impedance adjustment module 105 to perform impedance matching without wasting design resources and without redesigning related hardware, thereby greatly reducing design time and design cost.

As shown in the third figure, the impedance adjustment module 105 includes n impedance adjustment units ICU to correspondingly adjust the line impedance of each of the second signal lines S2. Please refer to the fourth figure, which is a schematic diagram of an impedance adjustment unit 400 of the impedance adjustment module 105. Each impedance adjustment unit 400 includes x resistors Rn1, Rn2, Rn3, ..., Rnx, and a demultiplexer. 410 and a multiplexer 420. According to the corresponding impedance adjustment signal ICSn, the demultiplexer 410 and the multiplexer 420 select the path of the corresponding first interface end and the path of the second interface end respectively, from the resistors Rn1, Rn2, Rn3, ..., Rnx. Select a specific resistor to achieve the purpose of adjusting the line impedance of the signal line.

For example, when the measured line impedance of the second group of signal lines S2 is 61 ohms, the line impedance target to be adjusted is 70 ohms, and the impedance adjusting unit 400 includes 10 resistors, and the resistors Rn1, Rn2. ...to the resistance value of Rn10 is 1 ohm, 2 ohm, ..., to 10 ohm, respectively, through appropriate settings, the control unit 101 can correspondingly generate the sub-impedance adjustment signal ICSn of the impedance adjustment signal ICS, so that the multiplex The processor 410 and the multiplexer 420 select the path of the corresponding resistor Rn9, and the corresponding line impedance will be adjusted to 70 ohms. According to the above description, the second group of signal lines S2 for transmitting the high-speed signal can be transmitted through the plurality of impedance adjusting units 400 to adjust the line impedance of each line of the second group of signal lines S2 to 70 ohms without wasting resources. Redesigning related hardware significantly reduces design time and design costs. Please note that in the above description, when the designed impedance range is large, such as between 0 and 100 ohms, and is set to be less than 1 ohm. With the same resistance value, the adjustment flexibility of the impedance matching can be greater. For example, when the impedance of each line is 30 ohms...120 ohms, the line impedance difference between the signal lines is up to 90 ohms. Set the line impedance matching target of each signal line to 120 ohms, which means that as long as the line impedance difference between the lines is between the lower limit and the upper limit of the adjusted impedance range, the corresponding resistor can be selected appropriately. The effect of impedance matching is achieved. And wherein each of the resistors can be realized by a resistance element having a fixed single resistance value or a variable resistance element having a variable resistance value, or other equivalent resistance element.

Referring to the first figure, the control unit 101 in the present embodiment transmits an operation signal OPS as a notification signal and transmits it to the television system 20 through the second interface 103, that is, as the card detection signals CD1 and CD2 in the common interface. After being transmitted to the television system 20, the television system 20 executes a smart card detection procedure after detecting the operation signal, for detecting the action of inserting the smart card 10 and confirming the specification of the smart card. Please refer to the fifth figure, which is a timing diagram of an operation signal OPS generated by the control unit 101 of the test apparatus 100 of the present invention to further explain the time relationship between the operation signal OPS and other signals. As described above, the operation signal OPS is used to simulate the plugging and unplugging action of the smart card 10, and when the control unit 101 generates the operation signal OPS to the television system 20 to cause the television system 20 to execute the smart card detection program, as shown in the fifth figure. After the CD1 and CD2 are upgraded from the low level to the high level, and at least a certain time T is maintained, so that the television system 20 can correctly detect the smart card specification corresponding to the smart card 10, the television system 20 can be correct. After the initialization, the subsequent smart card operation is performed. The control unit 101 determines whether the smart card 10 is correctly detected by the television system 20 after the smart card detection process is executed by the television system 20, and is not limited to the above embodiment, for example, it can also be disposed on the television system 20. The firmware is tested to detect the smart card 10 by the user manually checking whether the television system 20 is correct. When the television system 20 performs the specification detection of the smart card 10, if none If the method correctly detects the corresponding smart card specification, the television system 20 will perform the power-off operation through the second interface 103. Therefore, the control unit 101 of the present invention maintains the operation signal OPS within a certain time T of the high level. The other control signals of the test device 100, such as the SS or the ICS, must also maintain a configuration that enables the smart card to be accessed normally, so as to avoid affecting the television system 20 for the smart card detection process, and the television system 20 completes the smart card detection process. After that, the control unit 101 can change the switching signal SS, the impedance adjustment signal ICS, and the operation signal OPS to perform other smart card operations.

For example, when the insertion and removal of the smart card 10 is to be continuously simulated, the operation signal OPS is appropriately maintained for a specific time T to simulate the insertion of the smart card 10, and the test device 100 must also be adjusted through the impedance. The configuration of the signal ICS adjusts the line impedance of the second group of signal lines S2 to match a specific line impedance, such as 90 ohms, so that the television system 20 can correctly detect the smart card specifications and confirm the correct insertion of the simulation. action. After that, the operation signal OPS is again lowered from the high level to the low level to simulate the action of the smart card 10 being removed. The operation signal OPS is again raised to a high level and another specific time T is maintained to simulate the action of the smart card 10 being reinserted. By analogy, by repeating the level of the above-mentioned conversion operation signal OPS, it is possible to simulate the continuous insertion and removal of the smart card 10 for continuous insertion and extraction of test items. Please note that when the test item of the smart card 10 is continuously inserted and removed, the user can also make the test device 100 correctly insert the smart card 10 after the detection is completed, and perform the insertion of the smart card 10. The test item corresponding to the state; and after the test apparatus 100 correctly completes the removal of the smart card 10, the test item corresponding to the state in which the smart card 10 is removed is performed. In this way, other smart card test items can be performed while performing continuous plug-in testing to save overall test cost and test resources.

Please refer to the sixth figure for another embodiment of the testing device 600 of the present invention. Figure. The buffer module 106 is disposed between the first interface 102 and the switching module 104. The buffer module can be coupled to another active power source Vdd different from the power supply of the testing device 100. In order to improve the signal thrust on the corresponding signal line, and improve the signal integrity of the relevant signal, avoid the power ground noise caused by the common power supply, and improve the test stability of the test device, wherein The buffer module can be implemented by providing two inverters at both ends of a signal line, but not limited thereto. The test device 100 described in the first figure first provides the required power via the television system 20 through the second interface, and since the test device 100 is connected to the first interface 102 connecting the smart card 10 and the second connected to the television system 20 A plurality of components are disposed between the interfaces 103, thus potentially having a negative influence on the thrust of the signals transmitted by the first group of signal lines S1 and the second group of signal lines S2, and may further cause the television system 20 to be incorrectly configured by the second interface. The accessing operation is performed on the smart card 10 connected to the first interface 102. In the testing device 600 of the embodiment, the buffer module 106 can be coupled to another active power source Vdd different from the power supply of the testing device 100. To avoid the above negative effects. Please note that, as described above, the buffer module 106 can be implemented by providing two inverters at both ends of a signal line, so that the buffer module 106 correspondingly increases the line impedance of the buffered signal line, for example, Add 8 ohms due to the addition of two inverters. Therefore, in implementing the buffer module 106 of the present invention, the design configuration of the impedance adjustment module 105 must be considered correspondingly to perform the aforementioned line impedance matching correspondingly. The buffer module 106 of the present embodiment is disposed between the first interface 102 and the switching module 104, but is not limited to the above, and can be adjusted according to actual needs, for example, because the circuit board of the test device is set. The size of the area is correspondingly set between the impedance adjustment module 105 and the second interface 103, and only the second group of signal lines S2 of the high speed signal is buffered.

Since the ordinary knowledge in the technical field can be revealed by the second figure to the fifth figure The details of the content of the first and sixth embodiments can be understood by those skilled in the art, and some or all of the technical features of any embodiment can be selectively implemented according to the disclosure of the present invention and the requirements of the present invention. Alternatively, a combination of some or all of the technical features of the plurality of embodiments can be selectively implemented, thereby enabling automated testing to save significant labor costs and avoid physical wear and tear, and significantly reduce design time and design cost. Although the embodiments of the present invention are described above, the embodiments are not intended to limit the present invention, and those skilled in the art can change the technical features of the present invention according to the explicit or implicit contents of the present invention. Such variations are all within the scope of patent protection sought by the present invention. In other words, the scope of patent protection of the present invention is defined by the scope of the patent application of the specification.

10‧‧‧Smart Card

20‧‧‧TV system

100‧‧‧Testing device

101‧‧‧Control unit

102‧‧‧ first interface

103‧‧‧Second interface

104‧‧‧Switching module

105‧‧‧Impedance adjustment module

S1‧‧‧ first group of signal lines

S2‧‧‧Second group signal line

SS‧‧‧Switch signal

ICS‧‧‧ impedance adjustment signal

OPS‧‧‧ operation signal

Claims (14)

A test device for a television system is coupled to a smart card. The test device includes: a control unit for generating a switching signal, an impedance adjustment signal and an operation signal; and a first interface for connecting a smart card; a second interface for connecting to the television system; a signal line group for electrically connecting the first interface and the second interface; and a switching module for switching the signal line according to the switching signal At least one signal line of the group is one of a conducting state and a non-conducting state; and an impedance adjusting module adjusts an impedance of the at least one signal line of the signal line group according to the impedance adjusting signal; wherein the control unit generates The operation signal is transmitted to the television system through the second interface. The test device of claim 1, wherein the signal line group includes a first group of signal lines and a second group of signal lines, and the impedance adjustment module is configured to adjust the second group of signal lines. The impedance of at least one signal line. The test device of claim 2, wherein the first interface and the second interface are compatible with a common interface, and the second set of signal lines is used to transmit one of the address signals of the common interface and Data signal. The testing device of claim 2, wherein the impedance adjusting module comprises a plurality of impedance adjusting units corresponding to the second group of signal lines, each of the impedance adjusting units comprising a plurality of resistors. The test device of claim 4, wherein the impedance adjustment module adjusts the signal according to the impedance, so that each of the impedance adjustment units individually selects one of its plurality of resistors to match the second The impedance of the group signal line. The testing device of claim 2, wherein the impedance adjusting module comprises a plurality of impedance adjusting units corresponding to the second group of signal lines, each of the impedance adjusting units comprising a variable resistor. The test device of claim 6, wherein the impedance adjustment module adjusts the resistance value of the impedance adjustment unit according to the impedance adjustment signal to match the impedance of the second group of signal signals. The test device of claim 1, wherein the operation signal causes the television system to detect the specification of the smart card within a predetermined time. The test device of claim 8, wherein the switching signal and the impedance adjustment signal remain unchanged for the predetermined time. The test device of claim 2, further comprising a buffer module disposed between the first interface and the second interface for buffering the signal of the signal line group. The test device of claim 10, wherein the buffer module is coupled to a power source different from the test device. A test method is applied to a test device coupled to a television system, the test method comprising: a. inserting a smart card into the test device; b. the test device generates an operation signal to the television system, causing the television system to execute a smart card detection program; c. confirming the smart card detection program of the television system Whether the smart card is correctly detected; and d. when the smart card is continuously inserted into the test device, the television system detects that the smart card has been removed by changing the operation signal. The test method of claim 12, wherein steps b to d are repeated multiple times. The test method of claim 12, wherein the test device comprises a signal line group for data transmission between the smart card and the television system, and the test method further comprises: separately adjusting the signal line group The impedance of each signal line.