CN106034234A - Testing apparatus and method of intelligent card module for television - Google Patents
Testing apparatus and method of intelligent card module for television Download PDFInfo
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- CN106034234A CN106034234A CN201510106119.1A CN201510106119A CN106034234A CN 106034234 A CN106034234 A CN 106034234A CN 201510106119 A CN201510106119 A CN 201510106119A CN 106034234 A CN106034234 A CN 106034234A
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Abstract
The invention provides a testing apparatus of an intelligent card module for a television system. The testing apparatus is composed of a control unit, a first interface, a second interface, a signal line group, a switching module and an impedance adjusting module. The apparatus is connected with an intelligent card by the first interface and is connected with a television system by the second interface. The control unit is used for generating a switching signal, an impedance adjusting signal, and an operating signal; the switching signal is used for controlling the switching module to control a signal line conduction state of the signal line group; the impedance adjusting signal is used for controlling the impedance adjusting module to adjust the impedances of the signal lines in the signal line group; and the operating signal is transmitted to the television system by the second interface. Therefore, the television system can use the testing apparatus to carry out data access on the intelligent card, thereby completing correlated testing items of the intelligent card.
Description
Technical field
Present disclosure generally relates to measuring technology be correlated with, and espespecially with the survey of the smart card module being applied to DTV
Examination technology is correlated with.
Background technology
In most multimedia systems, most important hardware unit just belongs to display device.How to guarantee to produce
Function when product dispatch from the factory all goes well, and meets the functional specification of various sales territory, is always image display
The subject under discussion that device manufacturers is paid close attention to.Smart card can be used for the condition of DTV and accesses module, for DTV
At the system control maincenter of multimedia service, value added service, charge amusement etc., through the gold on smart card
Key and status information, be further used for the charging mechanism of television system.Owing to each region is for DTV
Policy regulation is different, and different for the policy regulation of smart card and the specification of employing, and therefore DTV exists
Produced DTV is have to ensure that, it is possible to the condition of the corresponding sales territory of correct access connects before dispatching from the factory
Delivery block specifications.
The test event of television system would generally comprise and judges whether television system can correctly be connected with smart card
And obtain the information of correspondence.Existing test mode is typically manually smart card to be inserted TV by tester
System, single stepping television system of going forward side by side is the most normal to judge access.On the other hand, common test item
Mesh also comprises and judges whether television system remains to normal operation after smart card is repeatedly plugged.Existing test
Mode is also the most repeatedly to be plugged the smart card module of television system by tester, and with perusal TV
Whether system can action accordingly.It is limited to existing test mode, tests manpower in a large number if cannot bear, electricity
The maker of viewing system is generally only capable of inspecting minority product at random by random samples, and through tester for intelligence snap gauge
Block plug operation in a large number, as test use smart card will inevitably produce physical wear, and then
Cause unnecessary testing cost.
Summary of the invention
For solving the problems referred to above, the present invention proposes a kind of test device being applied to television system and test side
Method.By the automatic programming by plug smart card, compared to prior art, fill according to the test of the present invention
Put and method of testing can be saved a large amount of human cost and avoid physical wear, and then promote integrated testability efficiency.
A specific embodiment according to the present invention is a kind of test device being applied to a television system, is coupled to
One smart card, this test device comprises a control unit, a first interface, one second interface, a holding wire
Group, a handover module and an impedance adjusting module.This control unit is in order to produce a switching signal, an impedance
Adjust signal and an operation signal.This first interface is in order to connect this smart card.This second interface is in order to connect
This television system.This signal line group is for electrically connecting to this first interface and this second interface.This handover module
According to this switching signal, control the conducting state of at least one holding wire of this signal line group.This impedance adjusts mould
Block, according to this impedance adjustment signal, adjusts the impedance of at least one holding wire of this signal line group.This operation signal
System is sent to this television system by this second interface.
Another specific embodiment according to the present invention is a kind of method of testing, and this method of testing is applied to a test
Device, and this test device is coupled to a television system, this method of testing comprises the steps of a. by an intelligence
This test device can be inserted by card；B. produce an operation signal through this test device to transmit to this television system,
So that this television system performs a smart card detection process；C. this smart card detecting journey of this television system is confirmed
Sequence the most correctly detects the specification of this smart card；D. this operation signal is changed through this test device, so that should
Television system detects this smart card and removes.
Can obtain further by following detailed Description Of The Invention and institute's accompanying drawings about the advantages and spirit of the present invention
Understanding.
Accompanying drawing explanation
Fig. 1 system present invention tests the block schematic diagram of an embodiment of device.
Fig. 2 system present invention tests the schematic diagram of a handover module of device.
Fig. 3 system present invention tests the schematic diagram of an impedance adjusting module of device.
Fig. 4 system present invention tests the schematic diagram of an impedance adjusting unit of device.
Fig. 5 system present invention tests the sequential chart of an operation signal of device.
Fig. 6 system present invention tests the schematic diagram of another embodiment of device.
Symbol description
10 smart cards
20 television systems
100,600 test device
101 control units
102 first interfaces
103 second interfaces
104 handover modules
105 impedance adjusting modules
106 buffer modules
400 impedance adjusting unit
410 de-multiplexers
420 multiplexers
CD1, CD2 smart card detection signal
ICS impedance adjustment signal
The sub-impedance adjustment signal of ICS1, ICS2, ICS3...ICSn
ICU1, ICU2, ICU3...ICUn impedance adjusting unit
OPS operates signal
First group of holding wire of S1, S1_1...S1_m
Second group of holding wire of S2, S2_1...S2_n
SS switching signal
The sub-switching signal of SS11, SS12, SS13...SS1m...SS2n
SW11, SW12, SW13...SW1m..., SW2n switch unit
Rn1, Rn2, Rn3...Rnx resistance
Detailed description of the invention
Fig. 1 show the block schematic diagram of an embodiment of the test device 100 of the present invention.The survey of the present invention
Electricity testing device 100 comprises control unit 101, first interface the 102, second interface 103, comprises first group of signal
Line S1 and the signal line group of second group of holding wire S2, handover module 104 and impedance adjusting module 105.The
One interface 102 is with the second interface 103 respectively in order to be connected smart card 10 and television system 20, and it is one
It is compatible with generic interface (common interface) or is compatible with Personal Computer Memory Card International Association
(PCMCIA) coffret of institute's specification, the type of interface signal at least needs to comprise address signal type, number
According to signal type and command signal type etc..
Control unit 101 in the present embodiment controls and the core of management mainly as test device 100, can
With with microprocessor or can planning logic gate array (FPGA) realize.As it is shown in figure 1, control unit 101
It is respectively coupled to handover module 104, impedance adjusting module 105 and the second interface 103, is produced through it
Each control signal to control the motion mechanism of each element accordingly.In enforcement, user can pass through a survey
The relevant test event program code of control unit 101 is updated by test-run a machine platform, and through control unit
Each control signal produced by 101, can control handover module 104 change signal line group be conducting state or
Not on-state, control impedance adjusting module 105 to adjust the line impedance of signal line group and through the
Two interface 103 transmission notice signals and clock signal are to television system 20, by aforementioned various control mechanisms
Change and combination, the test device 100 of the present invention can complete the relevant test event of smart card 10 accordingly.
The present embodiment hereby has m bar with operation one and transmits first group of holding wire S1 and a tool of general signal
Having the test device 100 of second group of holding wire S2 of n bar transmission high speed signal, simulation smart card 10 plugs
Operation and test as a example by, further illustrate the annexation of each element in test device 100, wherein second
Group holding wire S2 can transmit address signal type or the high speed signal of data signal type.Handover module 104
System, according to switching signal SS produced by control unit 101, switches first group of holding wire S1 and the accordingly
Two groups of holding wire S2 are conducting state or not on-state, to carry out each holding wire conducting state or to be not turned on
Test event corresponding to state, handover module can pass through the most multiple button member or transistor switch
Element realizes.Impedance adjusting module 105 according to impedance adjustment signal ICS produced by control unit 101,
Adjust the line impedance of second group of holding wire S2 accordingly, to be used in second group of letter of transmission high speed signal
In number line S2, the transmission time sequence between each holding wire matches each other.And transmit a work at the second interface 103
Plug the operation signal OPS of smart card 10 notice for television system 20, carry out thing simulating smart card 10
The plug operation of rationality.It is to say, through appropriately configured control unit to produce the control letter of related elements
Number, the smart card 10 being connected to first interface 102 can be connected to the television system of the second interface 103
20 read relevant intelligent card data.The detailed annexation of each element is described further below.
Refer to Fig. 2, it tests the schematic diagram of a handover module 104 of device 100, switching for the present invention
Module 104 is mainly as each holding wire switched conductive of first group of holding wire S1 and second group of holding wire S2
State or not on-state, can realize through the most multiple button member or transistor switching element.Control
Switching signal SS produced by unit 101 processed can comprise m+n sub-switching signal SS11, SS12,
SS13...SS1m ... SS21, SS22, SS23...SS2n, is separately input into handover module 104 institute at least
M+n switch unit SW11 comprising, SW12, SW13...SW1m...SW21, SW22,
SW23...SW2n, every to switch the most respectively in first group of holding wire S1 and second group of holding wire S2
The conducting state of one holding wire or not on-state, and carry out this holding wire conducting state or not on-state institute
Corresponding test event.
For example, the switch unit SW13 of holding wire S1_3 can be with N-type metal-oxide-semiconductor (MOS) (NMOS)
Realizing, the source electrode (Source) through NMOS is respectively coupled to holding wire S1_3's with drain electrode (Drain)
One end near first interface 102 and the one end near the second interface 103, and through sub-switching signal SS13
It is coupled to grid (Gate), when user is intended to individually turn on for the holding wire S1_3 of signal line group S1
During the test event of state, user can pass through suitable setting, makes control unit 101 produce accordingly suitable
When sub-switching signal SS13, to turn on switch unit SW13, be for N-type metal-oxide-semiconductor (MOS)
Produce a high voltage level, such as 3.3 volts.Furthermore, it is understood that for the facility of test operation and cost
Consider, also can design and make first group of holding wire S1 be operated manually through a unified button member,
The second group of holding wire S2 belonging to high speed signal individually turns on through transistor switching element the most respectively
Control, to take into account the testing requirement of the design and the HW High Way that simplify test device 100.Same,
On design considers, multiple holding wires carry out the switching of conducting state or each letter through unified switch unit
The switching that number line carries out conducting state through single switch unit is not limited with above-mentioned, can be according to actual demand
And make corresponding adjustment.
Refer to Fig. 3, it tests the schematic diagram of an impedance adjusting module 105 of device 100 for the present invention,
Impedance adjusting module 105 in the present embodiment is mainly as the circuit of second group of holding wire S2 of high speed signal
Impedance adjusts and mates, and can pass through such as each holding wire at second group of holding wire S2 and arrange multiple electricity
Resistance, a de-multiplexer and a multiplexer, therefrom to select suitable resistance, carry out line impedance coupling.Control
Impedance adjustment signal ICS produced by unit 101 processed comprise n sub-impedance adjustment signal ICS1, ICS2,
ICS3...ICSn, be separately input into n impedance adjusting unit ICU1 that impedance adjusting module 105 comprised,
ICU2, ICU3...ICUn, the resistance suitable to control the selection of each impedance adjusting unit accordingly, to adjust
The impedance of each holding wire in whole second group of holding wire S2 so that it is match each other, and make second group of holding wire
S2 can carry out corresponding test event under suitable impedance matching.
For example, when the line impedance of 8 signal line of second group of holding wire S2 be respectively 61,62,
63,64,65,66,67,68 ohm, and the adjustment impedance ranges of each impedance adjusting unit is 0～10
During ohm, user can pass through suitable setting, makes control unit 101 produce impedance adjustment signal accordingly
The sub-impedance adjustment signal ICS1 of ICS, ICS2 ..., ICS8, to set impedance adjusting unit respectively
The resistance of ICU1～ICU8 is 9,8,7,6,5,4,3,2 ohm, can make second group of holding wire S2
Each line impedance all adjust to 70 ohm.When user is in the smart card of the unknown specification of first actuation one
And when being connected to first interface 102 to test, between second group of holding wire S2 of its correspondence
Matching status cannot be learnt, therefore can only measure each circuit resistance of second group of holding wire S2 through test instrunment
Anti-, when line impedance 8 kinds of different impedances as the aforementioned respectively of measurement, traditionally, user is only
Can redesign and manufacture a new test device 100 according to measurement, and at second group of corresponding letter
The hardware of number line S2 is walked and is redesigned online, this means, walks to make online S2_1 holding wire about at circuit board
Slightly extend the substitutional connection length of 9 ohm, about S2_2 to S2_8 holding wire extension by that analogy.
But, the present invention tests device 100 and i.e. can pass through aforesaid impedance adjusting module 105 and carry out aforesaid impedance
Adjust to carry out impedance matching, and without waste design resource and without redesigning relevant hardware, significantly
Reduce design time and design cost.
As it is shown on figure 3, impedance adjusting module 105 comprises n impedance adjusting unit ICU, to adjust accordingly
The line impedance of each holding wire of whole second group of holding wire S2.Refer to Fig. 4, it adjusts mould for impedance
The schematic diagram of one impedance adjusting unit 400 of block 105, in each impedance adjusting unit 400, includes x
Individual resistance Rn1, Rn2, Rn3...Rnx, de-multiplexer 410 and a multiplexer 420.According to correspondence
Impedance adjustment signal ICSn, de-multiplexer 410 is to choose corresponding first interface respectively with multiplexer 420
The path of end and the path of the second interface end, to select a spy in self-resistance Rn1, Rn2, Rn3...Rnx
Fixed resistance, and then reach to adjust the purpose of the line impedance of this holding wire.
For example, when a certain line impedance being measured second group of holding wire S2 is 61 ohm, it is intended to adjust
The line impedance target of coupling is 70 ohm, and impedance adjusting unit 400 comprises 10 resistance, each resistance
Rn1, the resistance value of Rn2 ... to Rn10 be respectively 1 ohm, 2 ohm ..., to 10 ohm, thoroughly
Crossing suitable setting, control unit 101 can produce the sub-impedance of impedance adjustment signal ICS accordingly and adjust letter
Number ICSn, makes de-multiplexer 410 choose the path of corresponding resistance Rn9 with multiplexer 420, then corresponding
Line impedance will be adjusted to 70 ohm.According to described above, the second of transmission high speed signal can be made
Between group holding wire S2, through multiple impedance adjusting unit 400 to adjust second group of each line of holding wire S2
The line impedance on road is to 70 ohm, and redesigns relevant hardware without wasting resource, is greatly decreased and sets
Between timing and design cost.Note that in the foregoing, work as designed adjustment impedance ranges relatively greatly,
Between 0～100 ohm, and the resistance that different resistance values is set for gap with every 1 ohm, then can reach
Bigger to the adjustment elasticity of impedance matching, such as it is respectively 30 ohm when each line impedance ... 120 ohm,
Wherein the line impedance gap between holding wire is up to 90 ohm, then can be hindered by the circuit of each holding wire
Anti-coupling goal setting is 120 ohm, as long as the line impedance gap implied that between each circuit is adjusting impedance
Between lower limit and the higher limit of scope, through the suitable resistance choosing correspondence, all can reach impedance matching
Effect.And the most each resistance can be realized by the resistive element with fixed single resistance value or have
The variable resistor element having variable resistance realizes, or other equivalent resistance element realizes.
Refer to Fig. 1, the control unit 101 in the present embodiment is through producing an operation signal OPS as logical
Know signal and transmit to television system 20 by the second interface 103, implying that and detect as the card in generic interface
Signal CD1 Yu CD2 is to transmit to television system 20, and television system 20 after receiving this operation signal is
Perform a smart card detection process, in order to detect the action that smart card 10 inserts and the specification confirming smart card.
Refer to Fig. 5, it tests an operation signal OPS produced by the control unit 101 of device 100 for the present invention
Sequential chart, to further illustrate the time relationship of operation signal OPS and other signal.From the above,
Signal OPS is in order to simulate the Plug Action of smart card 10 in operation, and when control unit 101 produces operation letter
Number OPS is to television system 20, during to promote television system 20 to perform smart card detection process, such as Fig. 5 institute
CD1 Yu CD2 shown, after low level rises to high levle, at least maintains regular hour T so that TV system
System 20 can correctly detect the Smart Card specification corresponding to smart card 10, then television system 20 can be in just
After really initializing, carry out follow-up smart card operation.Control unit 101 ties up to television system 20 and performs
Carry out confirming whether television system 20 has after complete smart card detection process and correctly detect smart card 10, and
It is not limited with above-mentioned embodiment, the most also can pass through the test firmware being arranged at television system 20, with thoroughly
Cross user and manually inspect whether this television system 20 has correctness to detect smart card 10.Work as television system
After the 20 specification detectings carrying out smart card 10, if the Smart Card specification of correspondence cannot correctly be detected, then electricity
Viewing system 20 will transmit through this second interface 103 and carries out the action of power-off, therefore in the control unit of the present invention
101 maintain operation signal OPS within the certain time interval T of high levle, and other of test device 100 controls
Signal such as SS or ICS also must maintain a configuration that smart card can be made normally to access, to avoid affecting TV system
System 20 carries out smart card detection process, after television system 20 completes smart card detection process, and control unit
101 just can change switching signal SS, impedance adjustment signal ICS and operation signal OPS to carry out other
Smart card operation.
For example, when being intended to the Plug Action of continuous analog smart card 10, believe through the suitable operation that makes
Number OPS maintains a specific time T, to simulate the action that smart card 10 inserts, now tests device 100
Also must be transmitted through the configuration of impedance adjustment signal ICS, adjust the line impedance of second group of holding wire S2, with
It is matched to a specific line impedance, such as 90 ohm, so that television system 20 can correctly detect smart card
Specification, confirms that is simulated is correctly inserted into action.Afterwards, signal OPS will the most again be operated from high levle
It is down to low level, to simulate the action that smart card 10 is pulled out.And again operation signal OPS is promoted paramount
Level and maintain another specific time T, with simulate smart card 10 again insertable into action.By that analogy,
By repeating the level of above-mentioned map function signal OPS, can thereby simulate smart card 10 insert continually with
The action pulled out, with the test event carrying out insert continually with pull out.Note that when carrying out smart card 10
When insert continually and the test event pulled out, user can also make test device 100 through suitable setting
It is being properly completed after smart card 10 inserts detecting, and carry out need to be corresponding under smart card 10 insert state
Test event；And it is properly completed after smart card 10 pulls out at test device 100, carrying out need to be in intelligence
10 can be blocked and pull out test event corresponding under state.So, the same of test can plugged continuously
Time, carry out other smart card test event, to save integrated testability cost and test resource.
Refer to Fig. 6 is the schematic diagram that the present invention tests another embodiment of device 600.Wherein with test dress
Put the difference of 100 to be, a buffer module 106 be set between first interface 102 and handover module 104,
Buffer module can be coupled to be different from another active power source Vdd of the supply power supply of test device 100, with
Corresponding signal is online with promotion signal thrust, and can improve the signal integrity degree (signal of coherent signal
Integrity), avoid electric disturbance over the ground (power ground noise) that common-battery source caused and improve test dress
The stable testing degree put, wherein buffer module can pass through and arranges two reversers in the two ends of a holding wire in fact
Existing, but be not limited.It is via TV system through the second interface at the test device 100 described in front Fig. 1
Power supply needed for system 20 offer, and owing to test device 100 ties up to connect the first interface of smart card 10
Numerous elements it is provided with, therefore to first group between 102 and the second interface 103 being connected television system 20
The thrust of holding wire S1 and second group of transmitted signal of holding wire S2 has potential negative effect, and may enter
One step causes the television system 20 cannot be correctly by second interface 103 intelligence to being connected to first interface 102
10 can be blocked and carry out accessing operation, and in the test device 600 of the present embodiment, owing to buffer module 106 can
It is coupled to be different from another active power source Vdd of the supply power supply of test device 100, can avoid above-mentioned
Negative effect.Note that as it was previously stated, buffer module 106 can pass through arranges two in the two ends of a holding wire
Individual reverser realizes, and therefore buffer module 106 increases the circuit resistance of its holding wire buffered the most accordingly
Anti-, such as increase by 8 ohm due to two reversers setting up.Therefore, at the buffering mould implementing the present invention
During block 106, it is necessary to consider the design configuration of impedance adjusting module 105 accordingly, aforementioned to carry out accordingly
Line impedance coupling.And though the buffer module 106 of the present embodiment is arranged at first interface 102 and switching
Between module 104, but be not limited with above-mentioned, can make corresponding adjustment according to actual demand, such as because
Consider to arrange the board area size of test device, and be arranged in correspondence with buffer module 106 and adjust in impedance
Between module 105 and the second interface 103, and only provide letter to second group of holding wire S2 of high speed signal
Number buffering.
Due to the art, tool usually intellectual can understand by the details of Fig. 2 to Fig. 5 disclosure
The embodiment of Fig. 1 and Fig. 6 and change, the art personage can disclosure under this invention and self
Demand, optionally implements the part or all of technical characteristic of any embodiment, or optionally implements many
The combination of the part or all of technical characteristic of individual embodiment, thereby realizes automatic test to save a large amount of manpowers
Cost with avoid physical wear, and design time and design cost are greatly decreased.Although the enforcement of the present invention
Such as going up described, but those embodiments are not used for limiting the present invention, the art has usual knowledge
Person can impose change according to the content expressed or imply of the present invention to the technical characteristic of the present invention, all this kind
Change all may belong to the patent protection category sought by the present invention, in other words, the patent protection model of the present invention
Enclose and must be as the criterion depending on the as defined in claim of this specification.
Claims (14)
1. it is applied to a test device for a television system, is coupled to a smart card, this test device bag
Contain:
One control unit, in order to produce a switching signal, an impedance adjustment signal and an operation signal；
One first interface, in order to connect this smart card；
One second interface, in order to connect this television system；
One signal line group, is for electrically connecting to this first interface and this second interface；
One handover module, according to this switching signal, at least one holding wire switching this signal line group is conducting shape
One in state and not on-state；And
One impedance adjusting module, according to this impedance adjustment signal, adjusts at least one holding wire of this signal line group
Impedance；
Wherein this control unit this operation signal produced is sent to this television system by this second interface.
Test device the most as claimed in claim 1, it is characterised in that this signal line group comprises one first
Group holding wire and one second group of holding wire, this impedance adjusting module is in order to adjust this second group of holding wire
The impedance of at least one holding wire.
Test device the most as claimed in claim 2, it is characterised in that this first interface second connects with this
Mouth is compatible with a generic interface, and this second group of holding wire in order to transmit this generic interface an address signal and
One data signal.
Test device the most as claimed in claim 2, it is characterised in that it is right that this impedance adjusting module comprises
Should multiple impedance adjusting unit of second group of holding wire, each of such impedance adjusting unit comprises multiple
Resistance.
Test device the most as claimed in claim 4, it is characterised in that this impedance adjusting module is according to being somebody's turn to do
Impedance adjustment signal, makes each of such impedance adjusting unit each select the one of its multiple resistance, with
Mate the impedance of this second group of holding wire.
Test device the most as claimed in claim 2, it is characterised in that it is right that this impedance adjusting module comprises
Should multiple impedance adjusting unit of second group of holding wire, each of such impedance adjusting unit comprises one can
Power transformation hinders.
Test device the most as claimed in claim 6, it is characterised in that this impedance adjusting module is according to being somebody's turn to do
Impedance adjustment signal, adjusts the resistance value of such impedance adjusting unit, to mate the resistance of this second group of signal number
Anti-.
Test device the most as claimed in claim 1, it is characterised in that this operation signal makes this TV system
System, within a scheduled time, detects the specification of this smart card.
Test device the most as claimed in claim 8, it is characterised in that this switching signal and this impedance are adjusted
Entire signal remained unchanged within this scheduled time.
Test device the most as claimed in claim 2, it is characterised in that additionally comprise a buffer module, if
It is placed between this first interface and this second interface, in order to buffer the signal of this signal line group.
11. test device as claimed in claim 10, it is characterised in that this buffer module is coupled to one
It is different from the power supply of this test device.
12. 1 kinds of method of testings, are applied to a test device, and this test device is coupled to a television system,
This method of testing comprises:
A. a smart card is inserted this test device；
B. this test device generation one operation signal is to this television system, makes this television system perform a smart card
Detection process；
C. confirm that this smart card detection process of this television system the most correctly detects the specification of this smart card；With
And
D., when this smart card persistently inserts in this test device, through changing this operation signal, this TV system is made
System detects this smart card for remove.
13. method of testings as claimed in claim 12, it is characterised in that step b to d repeats
Repeatedly.
14. method of testings as claimed in claim 12, it is characterised in that this test device comprises a letter
Number line group, transmits for the data between this smart card and this television system, and this method of testing further includes:
Adjust the impedance of each holding wire of this signal line group respectively.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510106119.1A CN106034234B (en) | 2015-03-11 | 2015-03-11 | The test device and method of television set intelligently card module |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510106119.1A CN106034234B (en) | 2015-03-11 | 2015-03-11 | The test device and method of television set intelligently card module |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN106034234A true CN106034234A (en) | 2016-10-19 |
| CN106034234B CN106034234B (en) | 2018-03-23 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN201510106119.1A Expired - Fee Related CN106034234B (en) | 2015-03-11 | 2015-03-11 | The test device and method of television set intelligently card module |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN106771738A (en) * | 2016-12-14 | 2017-05-31 | 新智数字科技有限公司 | A kind of equipment for testing electronic card performance |
| CN108288979A (en) * | 2018-01-26 | 2018-07-17 | 武汉电信器件有限公司 | A kind of high speed signal test system |
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| CN103179429A (en) * | 2011-12-20 | 2013-06-26 | 晨星软件研发(深圳)有限公司 | Test method and device for television system |
| CN103997666A (en) * | 2014-05-28 | 2014-08-20 | Tcl集团股份有限公司 | Boot-up authentication method and device for modular TV and modular TV |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106771738A (en) * | 2016-12-14 | 2017-05-31 | 新智数字科技有限公司 | A kind of equipment for testing electronic card performance |
| CN108288979A (en) * | 2018-01-26 | 2018-07-17 | 武汉电信器件有限公司 | A kind of high speed signal test system |
| CN108288979B (en) * | 2018-01-26 | 2022-01-14 | 武汉电信器件有限公司 | High-speed signal test system |
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